Solid-state drive performance testing methods, devices and storage media

Abstract

This application provides a method, apparatus, and storage medium for testing the performance of a solid-state drive (SSD). The method includes: repeatedly changing the wear value of the SSD under test using a specified accelerated wear intervention strategy to simulate the wear state of the SSD during multiple lifecycle stages throughout its entire lifecycle; the entire lifecycle refers to the lifecycle of the SSD from zero wear to the upper limit of the wear value; different lifecycle stages correspond to different wear value ranges; for a specified performance item, performing performance tests on the SSD under the wear state corresponding to the multiple lifecycle stages to obtain the test values ​​of the specified performance item corresponding to the multiple lifecycle stages; and determining the performance test result of the SSD under test based on the test values ​​of the specified performance item corresponding to the multiple lifecycle stages. This method solves the problem in related technologies where insufficient wear value testing leads to performance degradation of SSDs during use.

Description

Technical Field

[0001] This application relates to the field of computers, and more specifically, to a method, apparatus, and storage medium for testing the performance of a solid-state drive. Background Technology

[0002] Solid-state drives (SSDs) are hard drives that use flash memory chips as their storage medium. Compared to traditional hard disk drives (HDDs), they offer higher read and write speeds, lower power consumption, lighter weight, smaller size, and stronger shock resistance. With technological advancements and market demand, SSDs have become the mainstream product in the computer storage field, widely used in personal computers, servers, data centers, and other areas. SSDs refer to products that comply with the NVMe 4 or NVMe 2.0 protocol, incorporate NAND flash memory, controllers, and other key hardware components, and are available in capacities such as 0.96TB, 1.60TB, 3.2TB, 3.84TB, 6.40TB, and 7.68TB. These products can be inserted into servers for data storage and handling in various business scenarios.

[0003] Although SSD technology is becoming increasingly mature, some problems have still emerged in product launches and practical applications. In particular, the testing methods for data erasure and programmable cycles (PE) are insufficient, leading to unexpected performance degradation or stability issues during customer use. Summary of the Invention

[0004] This application provides a method, apparatus, and storage medium for testing the performance of a solid-state drive (SSD), in order to at least solve the problem in the related art where the performance of SSDs degrades during use due to insufficient wear value testing.

[0005] According to one embodiment of this application, a performance testing method for a solid-state drive (SSD) is provided, comprising: repeatedly changing the wear value of the SSD under test using a specified accelerated wear intervention strategy to simulate the wear state of the SSD under test in multiple lifecycle stages throughout its entire lifecycle; the entire lifecycle refers to the lifecycle of the SSD under test from zero wear to the upper limit of the wear value; different lifecycle stages in the multiple lifecycle stages correspond to different wear value ranges; for a specified performance item, performing performance tests on the SSD under test in the wear state corresponding to the multiple lifecycle stages respectively, to obtain the test value of the specified performance item corresponding to the multiple lifecycle stages; and determining the performance test result of the SSD under test based on the test value of the specified performance item corresponding to the multiple lifecycle stages.

[0006] According to another embodiment of this application, a performance testing device for a solid-state drive (SSD) is provided, comprising: a wear simulation unit, configured to repeatedly change the wear value of the SSD under test using a specified accelerated wear intervention strategy to simulate the wear state of the SSD under test in multiple lifecycle stages throughout its entire lifecycle; the entire lifecycle refers to the lifecycle of the SSD under test from zero wear to the upper limit of the wear value; different lifecycle stages in the multiple lifecycle stages correspond to different wear value ranges; a performance testing unit, configured to perform performance tests on the SSD under test in the wear state corresponding to the multiple lifecycle stages for a specified performance item, and obtain the test value of the specified performance item corresponding to the multiple lifecycle stages; and a result generation unit, configured to determine the performance test result of the SSD under test based on the test value of the specified performance item corresponding to the multiple lifecycle stages.

[0007] According to yet another embodiment of this application, a computer-readable storage medium is also provided, wherein a computer program is stored therein, and the computer program is configured to perform the steps in any of the above method embodiments when it is run.

[0008] According to yet another embodiment of this application, an electronic device is also provided, including a memory and a processor, wherein the memory stores a computer program and the processor is configured to run the computer program to perform the steps in any of the above method embodiments.

[0009] According to yet another embodiment of this application, a computer program product is also provided, including a computer program that, when executed by a processor, implements the steps in any of the above method embodiments.

[0010] This application divides the entire lifecycle of the solid-state drive (SSD) under test into multiple wear stages, each corresponding to a different wear value range. Through a specified accelerated wear intervention strategy, the wear value of the SSD under test is repeatedly changed to simulate the wear state of the SSD at multiple lifecycle stages, accelerating the wear process. This simulates the wear state of the SSD at different stages of its lifecycle in a shorter time, eliminating the need to wait for natural wear, significantly shortening the testing cycle and improving testing efficiency. Under each simulated lifecycle stage, specified performance items are tested on the SSD under test, and the performance test values ​​at different lifecycle stages are recorded. By comparing the test values ​​at different lifecycle stages, the performance trend of the SSD under test throughout its lifecycle can be determined, allowing for early identification of the performance at each stage of the SSD's lifecycle. This assesses the stability and reliability of the SSD, not only improving the coverage of testing scenarios and test surfaces, and the overall quality of the product, but also preventing performance degradation during use. Attached Figure Description

[0011] Figure 1 This is a hardware structure block diagram of an optional computer device according to an embodiment of this application;

[0012] Figure 2 This is a schematic diagram of an optional storage unit according to an embodiment of this application;

[0013] Figure 3 This is a flowchart of an optional solid-state drive performance testing method according to an embodiment of this application;

[0014] Figure 4 This is a flowchart of another optional solid-state drive performance testing method according to an embodiment of this application;

[0015] Figure 5 This is a structural block diagram of an optional solid-state drive performance testing device according to an embodiment of this application;

[0016] Figure 6 This is a schematic diagram of the structure of another optional computer device according to an embodiment of this application. Detailed Implementation

[0017] The embodiments of this application will be described in detail below with reference to the accompanying drawings and examples.

[0018] It should be noted that the terms "first," "second," etc., in the specification, claims, and drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0019] The methods and embodiments provided in this application can be executed in a computer device or similar computing device. Taking running on a computer device as an example, Figure 1 This is a hardware structure block diagram of a computer device for a solid-state drive performance testing method according to an embodiment of this application. Figure 1 As shown, a computer device may include one or more ( Figure 1 Only one is shown. A processor 102 (processor 102 may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data are also shown. The computer device may further include a transmission device 106 for communication functions and an input / output device 108. Those skilled in the art will understand that... Figure 1 The structure shown is for illustrative purposes only and does not limit the structure of the computer device described above. For example, the computer device may also include components that are more... Figure 1 The more or fewer components shown, or having the same Figure 1 The different configurations shown.

[0020] The memory 104 can be used to store computer programs, such as application software programs and modules, like the computer program corresponding to the solid-state drive performance testing method in this embodiment. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, thus implementing the above-described method. The memory 104 may include high-speed random access memory and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor 102, and these remote memories can be connected to computer devices via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0021] The transmission device 106 is used to receive or send data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider for the computer equipment. In one example, the transmission device 106 includes a Network Interface Controller (NIC), which can connect to other network devices via a base station to communicate with the Internet. In another example, the transmission device 106 may be a Radio Frequency (RF) module used for wireless communication with the Internet.

[0022] The terms used in this embodiment are explained as follows:

[0023] SLC: Figure 2This is a schematic diagram of an optional storage unit according to an embodiment of this application, such as... Figure 2 As shown, the earliest SSDs could only store 1 bit of information per cell, meaning there were only two voltage changes: 0 and 1, which could be used to store one bit of binary data. This method has a simple structure and fast voltage control, and its advantages are long lifespan and high performance, with P / E erase cycles between 90,000 and 100,000. However, its disadvantages are low capacity and high cost, since a single cell can only store 1 bit of information. This method is called Single-Level Cell (SLC).

[0024] TLC: such as Figure 2 As shown, over time, Trinary-Level Cell (TLC) technology emerged, which stores 3 bits per cell. It has lower production costs and is cheaper, but its performance is worse and its lifespan is shorter, with approximately 500-1000 P / E erase cycles.

[0025] nvme change: Develop a proprietary nvme CLI command that can modify PE values. The command parameters are nvmechange_pe -d / dev / nvme* -V value.

[0026] Lba: Logical Block Address, system logical address.

[0027] Fio: A flexible I / O testing tool that can perform multi-threaded / process I / O load mode based on user-specified I / O types.

[0028] smart-log: Displays public (viewable by everyone) log information on the health status of NVMe hard drives.

[0029] nvme-vendor-log: Displays private log information (viewable by internal personnel of the manufacturer) showing the health status of NVMe hard drives.

[0030] BS: In the FIO library, the BS (Buffer Size) parameter represents the buffer size, that is, the amount of data the buffer can store during each read / write operation. The BS parameter is an important configuration parameter that directly affects the efficiency of file operations.

[0031] This embodiment provides a method for testing the performance of a solid-state drive. Figure 1 This is a flowchart of an optional solid-state drive performance testing method according to an embodiment of this application, such as... Figure 3 As shown, the process includes the following steps:

[0032] Step S302: By using a specified accelerated wear intervention strategy, the wear value of the solid-state drive under test is changed multiple times to simulate the wear state of the solid-state drive under test in multiple life cycle stages throughout its entire life cycle; the entire life cycle refers to the life cycle of the solid-state drive under test from zero wear to the upper limit of the wear value; different life cycle stages in the multiple life cycle stages correspond to different wear value ranges.

[0033] Accelerated wear intervention strategies are a set of procedures or methods designed to artificially accelerate the wear process of a solid-state drive (SSD) under test, simulating its state after prolonged use in a shorter time. For example, accelerated wear intervention strategies involve increasing the SSD's write frequency and the amount of data written each time to speed up the wear process. This could involve setting a high write frequency, such as writing a certain size of data block per minute, and gradually increasing the amount of data written each time. Another example is selecting specific types of data to write, such as random data, repetitive data, or data with specific patterns, to influence the SSD's wear rate and wear distribution. Finally, accelerating wear intervention strategies involve adjusting the SSD's write and read modes to affect its wear rate and performance. This could involve increasing the proportion of sequential writes or increasing the frequency of read / write operations on small files.

[0034] Wear value refers to the degree of performance and lifespan degradation of the internal storage units (such as flash memory chips) of a solid-state drive (SSD) after frequent read and write operations. The higher the wear value, the closer the SSD under test is to the end of its lifespan. For example, the wear value can be parameters such as data erase and programmable count (PE), total number of bytes written, number of writes per day, and mean time between failures (MTBF) of the SSD under test.

[0035] The entire lifecycle of a solid-state drive (SSD) begins when it is first powered on and used, and continues until it is no longer suitable for continued use or its performance degrades significantly. Lifecycle testing aims to evaluate the performance stability of the SSD under test throughout its entire lifecycle.

[0036] Multiple lifecycle stages refer to dividing the entire lifecycle of the solid-state drive under test into several stages, each corresponding to a different wear value range. Multiple lifecycle stages can be the entire lifecycle or only a portion of it. The wear value range corresponding to the entire lifecycle can be configured according to the different requirements of different platters. Taking the CougarR1 drive as an example, with wear values ​​based on data erases and programmable cycles (PE), the wear value range corresponding to the entire lifecycle should follow the principle of covering the entire lifecycle of the platter, i.e., taking values ​​within the following ranges, and performing latency and bandwidth performance tests within each range: PE < 1000, PE = 3000, PE = 5000, PE = 7000, PE = 9000, PE = 10000.

[0037] Wear and tear refers to the state of a solid-state drive (SSD) after a certain period of use or a certain number of read / write operations, resulting in performance degradation or shortened lifespan due to physical or chemical changes in its internal components (such as flash memory chips and controllers). For example, using wear values ​​in terms of erasure and programmable counts (PEs), for SSDs, wear and tear specifically refers to the range of PE values, reflecting the degree of use and remaining lifespan of the SSD under test. The higher the wear and tear, the closer the SSD is to the end of its lifespan.

[0038] Optionally, the computer equipment determines the upper limit of the wear value of the solid-state drive (SSD) under test. Based on this upper limit, the SSD's entire lifecycle is divided into multiple stages, each corresponding to a specific wear value range. Following a pre-defined accelerated wear intervention strategy, the computer equipment adjusts the wear value of the SSD under test to the wear state corresponding to each of the multiple lifecycle stages, ensuring the SSD's wear value is within different lifecycle stages. Multiple tests are then performed on the SSD with the altered wear value. After each test, the wear value is recorded, and its performance is checked.

[0039] Step S304: For the specified performance item, perform performance tests on the solid-state drive under the wear state corresponding to multiple life cycle stages to obtain the test values ​​of the specified performance item and the multiple life cycle stages.

[0040] The specified performance items refer to pre-selected performance metrics, such as bandwidth, latency, and IOPS (input / output operations per second). These metrics are used to measure the performance of the solid-state drive under test under different workloads. Table 1 provides an example of a test product; as shown in Table 1, the bandwidth and latency performance of the Cougar R1 drive was tested.

[0041] Table 1

[0042]

[0043] When testing the performance of the CougarR1 disk throughout its entire lifecycle, all read and write verification tests performed on the CougarR1 disk should be normal. If any abnormalities are found, it may be a problem with the single disk or the firmware.

[0044] Since different disks have different PE (Pressure Protection) limits, taking the CougarR1 disk as an example, the PE limit of this disk is 10000. When the disk exceeds its lifespan (i.e., PE>10000), performing read, write, power-on, or other operations on a disk with a PE value greater than 10000 cannot guarantee the accuracy of the data. Furthermore, as the PE gradually increases, there is a high probability that the disk will be damaged, and it will be beyond the scope of maintenance and repair beyond its lifespan. Therefore, tests for disks with a PE value exceeding 10000 can be temporarily suspended.

[0045] Test value refers to the actual measurement result obtained for a specified performance item during performance testing.

[0046] The test values ​​corresponding to the specified performance item and multiple lifecycle stages indicate that the performance of a specific performance item of the solid-state drive is tested at different lifecycle stages (i.e., different wear states), and the test values ​​corresponding to each stage are recorded.

[0047] Optionally, once the solid-state drive under test is in a specific wear state, the computer device uses a performance testing tool (such as fio) to test the selected performance items and records the test values ​​under the current wear state.

[0048] Step S306: Determine the performance test results of the solid-state drive under test based on the test values ​​corresponding to the specified performance items and multiple lifecycle stages.

[0049] Optionally, the computer device records the test values ​​under each wear condition to form a dataset. By comparing the test values ​​under different wear conditions, performance test results of the solid-state drive under test are generated to evaluate its performance stability at different stages of its lifecycle.

[0050] Through the above steps, the entire lifecycle of the SSD under test is divided into multiple wear stages, each corresponding to a different wear value range. By employing a specified accelerated wear intervention strategy, the wear value of the SSD under test is repeatedly changed to simulate the wear state of the SSD at multiple lifecycle stages, accelerating the wear process. This simulates the wear state of the SSD at different stages of its lifecycle in a shorter time, eliminating the need to wait for natural wear, significantly shortening the testing cycle and improving testing efficiency. Under each simulated lifecycle stage, specified performance items are tested on the SSD under test, and the performance test values ​​at different lifecycle stages are recorded. By comparing the test values ​​at different lifecycle stages, the performance trend of the SSD under test throughout its lifecycle can be determined, allowing for early identification of the performance at each stage of the SSD's lifecycle. This assesses the stability and reliability of the SSD, not only improving the coverage of the testing scenarios and test surfaces, and the overall quality of the product, but also preventing performance degradation during use.

[0051] In one exemplary embodiment, before repeatedly changing the wear value of the solid-state drive under test through a specified accelerated wear intervention strategy, the solid-state drive performance testing method further includes:

[0052] After the SSD under test is powered on normally, it is formatted according to the specified disk format to obtain the formatted SSD under test.

[0053] Specifying the disk format refers to formatting the SSD under test into a preset Logical Block Address (LBA) format before testing, based on specific testing requirements or standards. This formatting process involves configuring the logical structure of the SSD under test to determine how data is stored in the physical storage units on the SSD. The specified disk format may include block size (e.g., 512 bytes, 4KB), number of sectors, and other parameters related to data access and storage. In practical applications, the 512-byte format is often widely used as the default or standard format because it is compatible with traditional hard drives and has broad applicability in many environments.

[0054] Optionally, Figure 4 This is a flowchart of another optional solid-state drive performance testing method according to an embodiment of this application, such as... Figure 4As shown, after the SSD under test is burned, it is powered on normally and formatted to a specified disk format (such as LBA format), resulting in the formatted SSD under test. Unless otherwise specified, the default format is 512b (this mode is generally the factory default mode for disks, and it is the most commonly used and widely adopted mode in actual applications). The initial wear value of the SSD under test before testing is recorded (denoted as Y). Then, the wear value of the SSD under test is changed multiple times using a specified accelerated wear intervention strategy.

[0055] By formatting the solid-state drive under test to the specified disk format in this embodiment, it is ensured that all tests will start from the same state, eliminating the potential impact of previous data or formatting differences, and providing a clean and consistent environment for subsequent wear tests, making the test results more comparable and reliable.

[0056] In one exemplary embodiment, before repeatedly changing the wear value of the solid-state drive under test through a specified accelerated wear intervention strategy, the solid-state drive performance testing method further includes:

[0057] Obtain the log information of the SSD under test, and determine the current state of the SSD under test based on the log information; if the SSD under test is currently in a normal state, execute the steps of changing the wear value of the SSD under test multiple times through the specified accelerated wear intervention strategy to simulate the wear state of the SSD under test in multiple life cycle stages throughout its entire life cycle.

[0058] Log information refers to the detailed data output by the SSD under test through specific commands (such as nvme smart-log and nvmevendor-log), which provides information about the current health status, performance metrics, and usage of the SSD. The log information contains crucial information for evaluating the key performance of the SSD under test, such as data erase and programmable counts (PE value), error rate, temperature, firmware version, and the total uptime of the SSD. By analyzing this log information, it is possible to determine whether the current operating status of the SSD under test is normal, and its performance at different stages of wear and tear.

[0059] Optionally, such as Figure 4As shown, after ensuring the SSD under test is correctly connected to the test system and the device is powered on and ready, the computer uses the `nvme smart-log` and `nvme vendor-log` commands via the command-line interface to obtain the SSD's log information. The computer analyzes the obtained log information to confirm the SSD's current operating status, including whether it is within the normal temperature range, whether there are any read / write errors, whether the PE value is abnormal, and whether the firmware version is the required version for the test. Based on the key indicators in the log information, the computer determines whether the SSD is in a normal operating state. If any abnormalities are found, such as an excessively high PE value, a temperature exceeding the safe range, or read / write errors, the SSD may be in an abnormal state, and accelerated wear testing is not suitable. If the log information indicates that the SSD is currently in a normal state, the computer continues to execute subsequent accelerated wear intervention strategies.

[0060] In this embodiment, the log information of the solid-state drive under test is obtained, and the current state of the solid-state drive under test is determined based on the log information. Only when the solid-state drive under test is in a normal state is the step of repeatedly changing the wear value of the solid-state drive under test through a specified accelerated wear intervention strategy to simulate the wear state of the solid-state drive under test in multiple life cycle stages throughout its entire life cycle executed. This step ensures that the solid-state drive under test is in a normal and testable state before the test begins, avoiding test result deviations caused by solid-state drive failure or abnormality.

[0061] In one exemplary embodiment, the wear value of the solid-state drive under test is changed multiple times using a specified accelerated wear intervention strategy to simulate the wear state of the solid-state drive under test at multiple lifecycle stages throughout its entire lifecycle, including:

[0062] Each of the multiple lifecycle stages is treated as the current lifecycle stage, and the following first intervention operation is performed to simulate the wear state of the solid-state drive under test in each lifecycle stage. The wear value range corresponding to the current lifecycle stage is the current wear value range: a first instruction is issued to the solid-state drive under test; the first instruction is used to modify the wear value of the solid-state drive under test to a first target wear value, so as to simulate the wear state of the solid-state drive under test in the current lifecycle stage through the first target wear value; the first target wear value is any wear value within the current wear value range.

[0063] The first instruction refers to a proprietary solid-state drive (SSD) controller interface command used to directly modify the internal wear value of the SSD under test. This allows for rapid simulation of the wear state of the SSD at different stages of its lifecycle, without requiring lengthy actual data erasure and rewrite operations. For example, the first instruction could be the `nvme change_pe` command issued by the fio tool, used to modify the PE value (Erase and Programmable Count, or PE value for short) of the SSD under test to a specified wear value range. For instance, to modify the initial wear value Y of the SSD under test to any value from 0 to 1000 (such as 578), the corresponding example of the first instruction would be: `nvme change_pe -d / dev / nvme0n1-v578 (random value)`.

[0064] The first target wear value refers to any target value within the current wear value range at the current stage of the SSD's lifecycle, used to simulate the wear state of the SSD under test at the current stage of its lifecycle. The first target wear value lies within the wear value range of a specific stage in the entire lifecycle of the SSD under test. For example, the PE test value ranges for the SSD under test at different lifecycle stages are: 0-1000, 1001-3000, 3001-5000, 5001-7000, 7001-9000, and 9001-10000. Any wear value selected within these ranges can be used as the first target wear value to simulate the performance of the SSD under test in that wear state.

[0065] Optionally, the computer device selects a stage in the entire lifecycle of the solid-state drive under test as the current test stage. The wear value range corresponding to the current test stage is the current wear value range. Within the current wear value range, the computer device selects a specific value as the first target wear value. The computer device issues a first instruction to the solid-state drive under test via the command-line interface to modify the wear value of the solid-state drive under test to the first target wear value. Once the wear value of the solid-state drive under test has been modified to the first target wear value, fio or other performance testing tools can be used to test the performance of the solid-state drive under test in this wear state, including performance indicators such as read and write speeds and latency.

[0066] For example, if the wear value is the PE value, and the current wear value range is 0-1000, 578 can be selected as the first target wear value. The computer device sends the `nvme change_pe` command to the SSD under test via the command-line interface to modify the SSD's PE value to the first target wear value (e.g., 578). After executing the command, use the `nvme smart-log` or `nvme vendor-log` command to check whether the SSD's wear value has been successfully modified to the first target wear value. This step is crucial to ensure that the intervention is effective and does not introduce additional problems. Once it is confirmed that the PE value has been modified to the first target wear value, `fio` or other performance testing tools can be used to test the SSD's performance under this wear state, including read / write speeds, latency, and other performance metrics.

[0067] This embodiment provides a method for performance testing by modifying wear values. The method sends a first instruction to the solid-state drive (SSD) under test, directly modifying its wear value. This allows for rapid jumps to any wear stage in the SSD's lifecycle, significantly shortening testing time and improving efficiency. The entire lifecycle of the SSD is divided into multiple stages, with a wear value modification performed once in each stage, covering the entire lifespan from new drive to the end of wear. This phased testing method verifies the performance of the SSD throughout its entire lifecycle, ensuring that its performance data is not significantly affected by changes in performance conditions (PE). This provides a rapid testing method for identifying problems during R&D, ensures quality assurance for product launch, reduces the probability of problems occurring after prolonged customer use, and further improves disk quality.

[0068] In one exemplary embodiment, the wear value of the solid-state drive under test is changed multiple times through a specified accelerated wear intervention strategy to simulate the wear state of the solid-state drive under test at multiple lifecycle stages throughout its entire lifecycle, and further includes:

[0069] After obtaining the test value corresponding to the specified performance item and the current life cycle stage, if the current life cycle stage is not the last life cycle stage among multiple life cycle stages, the wear value of the solid-state drive under test is restored from the first target wear value to the specified wear value, so that the next life cycle stage of the current life cycle stage is taken as the new current life cycle stage and the first intervention operation is re-executed.

[0070] The specified wear value refers to a specific wear state value that the SSD under test needs to be restored or reset to before the test begins or after a certain test phase ends. The specified wear value can be the initial wear value of the SSD under test (such as before the test begins), or a baseline value set for subsequent test phases to ensure that the SSD under test is in a certain wear state before the next round of wear testing.

[0071] Optionally, after obtaining the test value corresponding to the specified performance item and the current life cycle stage, if the current life cycle stage is not the last life cycle stage among multiple life cycle stages, the first target wear value is restored to the specified wear value through the first instruction, and the next life cycle stage of the current life cycle stage is taken as the new current life cycle stage to re-execute the first intervention operation until the test value of each life cycle in the entire life cycle of the solid-state drive under test is obtained.

[0072] In some embodiments, after obtaining the test values ​​for each lifecycle of the solid-state drive under test, the first target wear value can be restored to the initial wear value Y by a first instruction. This helps with the reuse test of the solid-state drive under test, ensures that the solid-state drive under test returns to its initial state for a new test cycle, and facilitates the comparison of the original performance differences between different test batches or different solid-state drive models under test.

[0073] In this embodiment, after each test of a lifecycle phase, the wear value of the solid-state drive under test is restored from the first target wear value to the specified wear value, instead of allowing it to wear down naturally to the next phase. This significantly speeds up the testing process and ensures that the test can smoothly transition to the next phase without causing inconsistencies in the test results due to gaps in wear values.

[0074] In one exemplary embodiment, the multiple lifecycle stages include the first lifecycle stage in the entire lifecycle; the wear values ​​corresponding to different lifecycle stages in the entire lifecycle increase sequentially starting from the first lifecycle stage.

[0075] The first lifecycle stage refers to the initial state of the SSD under test, i.e., immediately after manufacturing or initial formatting. At this time, the wear value of the SSD under test is the lowest, and its performance is usually at its optimal state. As each lifecycle stage progresses, the wear value corresponding to different lifecycle stages throughout the entire lifecycle gradually increases according to a preset wear pattern, starting from the first lifecycle stage, until it reaches the wear limit value.

[0076] In one embodiment, by employing a specified accelerated wear intervention strategy, the wear value of the solid-state drive under test is changed multiple times to simulate the wear state of the solid-state drive under test at multiple lifecycle stages throughout its entire lifecycle, including:

[0077] Starting from the first lifecycle phase, each of the multiple lifecycle phases is treated as the current lifecycle phase, and the following second intervention operation is performed. The wear value range corresponding to the current lifecycle phase is the current wear value range:

[0078] A second instruction is continuously sent to the SSD under test to continuously increase its wear value from the initial wear value corresponding to the current lifecycle stage. This second instruction is used to simulate read and write operations on the SSD by configuring its I / O pressure to be greater than a preset pressure. During the continuous sending of the second instruction, a third instruction is used to query the current wear value of the SSD. When the current wear value reaches a second target wear value, the sending of the second instruction to the SSD is stopped, simulating the wear state of the SSD in the current lifecycle stage using the second target wear value. The second target wear value is a pre-specified wear value within the current wear value range. Performance testing of the SSD under the wear state corresponding to the current lifecycle stage for a specified performance item is performed after the sending of the second instruction to the SSD is stopped. The initial wear value corresponding to the first lifecycle stage is zero wear. When the second intervention operation is re-executed with the next lifecycle stage as the new current lifecycle stage, the initial wear value corresponding to the next lifecycle stage is the second target wear value.

[0079] The second instruction refers to the command issued by the performance testing tool (such as fio). It can simulate read and write operations performed on the SSD under test by configuring the I / O pressure of the SSD under test to be greater than the preset pressure, thereby increasing the wear value of the SSD under test.

[0080] The initial wear value refers to the starting point of the wear state of the SSD under test at the beginning of each lifecycle stage. It signifies that the test for each lifecycle stage will continuously increase from the initial wear value corresponding to that stage until it reaches the second target wear value for that stage. For the first lifecycle stage, the initial wear value is zero wear (i.e., a PE value of 0), indicating that the SSD under test is in a brand-new state. For each subsequent lifecycle stage, the initial wear value is equal to the second target wear value at the end of the previous stage, representing the wear state of the SSD before entering the new stage. For example, at the start of the test, the SSD under test is brand new and has not undergone any wear; therefore, the initial wear value for the first lifecycle stage is zero wear (e.g., a PE value of 0). After the first lifecycle stage test is completed and the second target wear value (e.g., a PE value of 1000) is reached, the second lifecycle stage test begins. At this point, the second target wear value (e.g., a PE value of 1000) is the initial wear value corresponding to the second lifecycle stage, and it continuously increases from this initial wear value (e.g., a PE value of 1000).

[0081] The I / O stress of a solid-state drive (SSD) under test refers to the intensity of read and write operations applied to the SSD during testing using fio tools or other performance testing methods. The level of I / O stress directly affects the rate at which the wear value of the SSD increases. The preset stress serves as a benchmark value used to compare and determine the intensity of I / O stress used in the test.

[0082] The third command is used to query the current wear value and health status of the SSD. For example, the third command can be the nvme smart-log or nvme vendor-log command. While continuously issuing the second command (fio command), the third command is used to periodically check the current wear value of the SSD under test to determine whether the current wear value has reached the expected second target wear value, so that the issuance of the second command can be stopped in time.

[0083] The second target wear value refers to a specific wear value within the current wear value range of the current lifecycle stage, pre-set during performance testing of the SSD under test. Generally, the second target wear value is set to the upper limit of the current wear value range corresponding to the current lifecycle stage. The second target wear value simulates the wear state reached by the SSD under test during the current lifecycle stage. During testing, the second target wear value guides when to stop applying additional I / O pressure or wear operations to the SSD under test. When the PE value of the SSD under test reaches the second target wear value, the computer equipment stops using testing tools such as the fio command to prevent the wear value of the SSD under test from exceeding the current wear value range of the current lifecycle stage. For example, the wear value of the SSD under test is the PE value, and its entire lifecycle is divided into multiple lifecycle stages with PE value ranges of 0–1000, 3000, 5000, 7000, 9000, and 10000. Within these PE value ranges, 1000, 3000, 5000, 7000, 9000, and 10000 can all be considered as secondary target wear values, representing the expected wear level of the solid-state drive under test at different stages of its lifecycle. Any value within the wear value range corresponding to each lifecycle stage within these PE value ranges can also be considered as a secondary target wear value.

[0084] Optionally, the computer equipment ensures that the SSD under test is powered on and in normal working condition, and has been formatted according to preset conditions, recording the initial wear value of the SSD at this point (typically zero wear). The computer equipment uses the `fio` command to configure the I / O pressure parameters of the SSD under test to exceed the preset pressure, simulating data read / write operations under high load to accelerate the wear process. The computer equipment continuously issues a second command (the `fio` command) to apply high-load read / write pressure to the SSD under test. This process continues until the wear value of the SSD under test reaches a predetermined second target wear value, i.e., the target wear value for the current lifecycle stage. During the wear increase, the computer equipment periodically uses a third command (the `nvme smart-log` or `nvmevendor-log` command) to query the current wear value of the SSD under test to monitor the wear progress. Once the third command confirms that the wear value of the SSD under test has reached the second target wear value, the computer equipment immediately stops issuing `fio` commands, ensuring that the SSD under test accurately remains at the wear state of the current lifecycle stage, avoiding excessive wear that could lead to uncontrollable test results. After the wear-down process is stopped, the computer equipment uses performance testing tools to test specified performance items of the SSD under test, such as read / write speed, latency, and I / O operations, and records the performance data at the current wear state. The computer equipment then takes the next lifecycle stage as the new current lifecycle stage and uses the second target wear value of the SSD under test in the current lifecycle stage as the initial wear value of the new current lifecycle stage, repeating the second intervention operation until the test values ​​for each lifecycle stage throughout the entire lifecycle have been obtained.

[0085] For example, the SSD under test is in its first lifecycle stage, with an initial wear value of 0. At the start of the test, the SSD has not experienced any wear. Through a second intervention—continuously issuing a second command (such as configuring high-intensity I / O pressure or using the fio tool for read / write operations)—the wear value of the SSD under test is increased from 0 until it reaches a second target wear value (e.g., a PE value of 1000). Once the wear value reaches 1000, the increase stops, and the performance of the SSD under test in this wear state is tested. After completing the performance test for the current lifecycle stage (wear value of 1000), 1000 is used as the initial wear value for the next test stage. The testing team again performs the second intervention, increasing the wear value of the SSD under test from 1000, aiming to reach the second target wear value for the next stage, such as 1100 (this is just an example number; the actual target value may be set according to the characteristics of the SSD under test). The above steps are repeated, continuously increasing the wear value of the SSD under test until the second target wear value for all predefined lifecycle stages is reached. At the end of each phase, performance tests are conducted to comprehensively evaluate how the performance of the tested SSD changes as wear increases.

[0086] This embodiment provides a method to simulate and test the performance of the solid-state drive (SSD) under test under different wear states step by step from the initial stage of the entire life cycle of the SSD under test. This solves the problem of insufficient testing for specific wear values ​​in related testing methods. This method can ensure that the performance of the SSD under test is comprehensively evaluated throughout its entire lifespan. Using a second command, the wear process of the SSD under test can be accelerated to quickly reach the set second target wear value. Compared with natural wear or normal use testing, this significantly shortens the testing cycle and improves testing efficiency, which is especially important for rapid feedback and product iteration in the R&D stage.

[0087] In one exemplary embodiment, two methods were employed: directly modifying the wear value of the solid-state drive under test (SSD) and continuously increasing the wear value by issuing fio commands. The same batch of SSDs under test were tested at the same test point (i.e., the first target wear value and the second target wear value were the same). The test results showed that the performance test results obtained by directly modifying the wear value were essentially the same as those obtained by continuously issuing fio commands to increase the wear value, with no significant difference. Furthermore, the standard performance difference within 7kvslk (comparing 7000 PE cycles and 1000 PE cycles) was very small, with deviations almost all within 5%. The standard performance difference within 10kvslk (comparing 10000 PE cycles and 1000 PE cycles) was also very small, with deviations almost all within 5%. As the PE cycles increased, the drive's performance showed almost no downward trend, indicating that the drive's performance remained stable throughout its lifespan.

[0088] During the test of continuously issuing fio commands to increase the wear value, increasing the PE value is a very long process. According to the maximum pressure of fio usage, it takes at least 1 hour to increase PE. Therefore, 1000 PEs will take 1000 hours (41 days), and 10000 PEs will take at least 10000 hours (410 days).

[0089] Therefore, it can be concluded that "performance testing by directly modifying wear values" can replace "increasing wear values ​​by continuously issuing fio commands." The method of "performance testing by directly modifying wear values" significantly shortens the entire lifecycle performance testing process, achieving the effect and purpose of quickly testing actual performance values ​​throughout the entire lifecycle. This method can provide data support for performance data throughout the entire project lifecycle during the project development phase, offer a rapid testing method for identifying problems during development, and provide quality assurance for product launch.

[0090] In one exemplary embodiment, this embodiment further extends the methods of "performance testing by directly modifying wear values" and "increasing wear values ​​by continuously issuing fio commands" to obtain the following solution:

[0091] The first instruction in the "Performance Testing Method by Directly Modifying Wear Values" directly modifies the wear value of the SSD under test to a first target wear value, quickly covering different stages of the SSD's lifecycle. After verifying successful wear value modification without any anomalies, the "Method of Increasing Wear Values ​​by Continuously Issuing fio Commands" is executed. This involves continuously increasing the wear value from the first target value, using the fio tool to perform long-term read and write operations under specified I / O pressure (e.g., configured bs and iodepth parameters). The natural growth of the first target wear value is monitored until it reaches a second target wear value. Performance testing is then performed using fio, including tests of specified performance items such as read / write bandwidth, latency, and IOPS. For example, the first instruction is used to modify the wear value from 0 to 578, where the first target wear value is 578; 578 is used as the initial wear value corresponding to the first life cycle stage, and the second instruction is continuously sent to the solid-state drive under test to continuously increase the wear value of the solid-state drive under test from the initial wear value (such as 578) corresponding to the current life cycle stage until it increases to the second target wear value (such as 1000); this process is repeated until all preset key wear points are covered, thus completing the performance test of the solid-state drive under test throughout its entire life cycle.

[0092] In this embodiment, the wear value of the SSD under test is directly modified to a preset first target wear value. This operation can be completed in a very short time, effectively avoiding the lengthy process of reaching these wear points through natural use. For example, if natural wear to the 3k PE value takes months or even years, direct modification can be achieved in minutes, thus significantly accelerating the testing cycle. By starting from the preset first target wear value and continuously increasing the wear value using the fio tool, the I / O pressure in a real-world usage environment is simulated. The resulting performance data more realistically reflects the behavior of the SSD under test at different wear stages in actual applications, enhancing the reliability of the test results. In summary, directly modifying the wear value to the first target wear value and then conducting performance tests by simulating actual wear ensures that the test comprehensively covers the entire lifecycle of the SSD under test. At the same time, it reduces the consumption of hardware resources during long-term natural wear testing, achieving rational resource utilization.

[0093] In one exemplary embodiment, for a specified performance item, performance tests are performed on the solid-state drive under test in wear states corresponding to multiple lifecycle stages to obtain test values ​​for the specified performance item and the multiple lifecycle stages, including:

[0094] For the current lifecycle stage, multiple performance test cases are retrieved through the fourth instruction; the fourth instruction is used to filter multiple performance test cases from the test case library; multiple performance test cases are used to test the specific values ​​of specified performance items of the solid-state drive under test in the current lifecycle stage; multiple performance test cases are used to perform performance tests on the solid-state drive under test to obtain the test values ​​of specified performance items corresponding to the current lifecycle stage.

[0095] The fourth instruction refers to the command or operation used to retrieve or filter specific performance test cases from the test case library. In the testing environment of a solid-state drive (SSD), this typically means executing a script or program that can automatically or manually select a series of predefined performance test cases based on the current lifecycle stage to be tested and the wear state of the SSD. These performance test cases may be contained in the test case library of the SSD, which contains various types of test cases designed to cover all aspects of the SSD's performance testing.

[0096] Performance test cases are pre-defined series of operations or scripts used to test the performance metrics of a solid-state drive (SSD) under specific conditions, such as read / write speed, latency, and IOPS (input / output operations per second). These test cases are typically designed to simulate different workloads and usage scenarios to provide a comprehensive understanding of the SSD's performance under various conditions. In the lifecycle testing of an SSD, performance test cases may target different wear ranges to evaluate how the SSD's performance changes over time.

[0097] Optionally, during the current lifecycle stage, the computer device first identifies the specified performance items to be tested, including but not limited to read / write bandwidth, IOPS, and latency. When the wear value of the solid-state drive under test reaches the first or second target wear value, the computer device executes a fourth instruction to select performance test cases from the test case library that match the current lifecycle stage and wear state, and runs the selected performance test cases to perform read / write operations, random access, and sequential read / write tests on the solid-state drive under test to simulate the load in a real-world application environment, thereby obtaining the test values ​​of the specified performance items corresponding to the current lifecycle stage.

[0098] In this embodiment, multiple performance test cases are called from the test case library through the fourth instruction, ensuring that the test plan can fully cover the performance of the solid-state drive under test at different stages of its life cycle, and making up for the lack of testing for specific wear values ​​(PE values) in related test methods.

[0099] In one exemplary embodiment, the performance test result of the solid-state drive under test is determined based on the test values ​​corresponding to specified performance items and multiple lifecycle stages, including:

[0100] If the test values ​​for the specified performance items and multiple lifecycle stages all meet the preset conditions, the performance test result of the solid-state drive under test is determined to be that the solid-state drive under test is normal; if the test values ​​for the specified performance items and at least one lifecycle node in multiple lifecycle stages do not meet the preset conditions, the performance test result of the solid-state drive under test is determined to be abnormal.

[0101] In this context, preset conditions refer to performance thresholds or expected standards set for specific performance indicators at different stages of their lifecycle. These are used to evaluate whether the performance of the SSD under test meets or exceeds expectations under various wear conditions. Preset conditions can be the lower limit of performance (such as minimum bandwidth, minimum IOPS, etc.) to ensure that the SSD under test can maintain a basic performance level even under high wear conditions, or they can be the upper limit of performance to assess whether the performance of the SSD under test has reached or is close to its design peak early in its lifecycle.

[0102] Optionally, the computer equipment predetermines performance test items and preset conditions, performs performance tests on the solid-state drive under test at different wear values ​​throughout its entire lifecycle, obtains the actual test values ​​corresponding to the specified performance items and multiple lifecycle stages, and compares the actual test values ​​of the specified performance items in each lifecycle stage with the preset conditions. If the test values ​​of the specified performance items meet the preset conditions in all stages, then the performance test result of the solid-state drive under test can be determined as "no anomaly," meaning that the solid-state drive under test can maintain good performance throughout its entire lifecycle. If the test value of the specified performance item does not meet the preset conditions in any stage, then the performance test result of the solid-state drive under test can be determined as "abnormal," indicating that the performance of the solid-state drive under test has failed to achieve the expected stability or reliability within a certain wear range.

[0103] In this embodiment, if the test value does not meet the preset conditions at at least one stage of the life cycle, the solid-state drive under test is judged as "abnormal". This allows performance problems to be identified in the early stages of the solid-state drive's life cycle, thus avoiding the exposure of performance problems during customer use.

[0104] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the related technology, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0105] This embodiment also provides a solid-state drive performance testing device, which is used to implement the above embodiments and preferred embodiments; details already described will not be repeated. As used below, the term "module" can be a combination of software and / or hardware that implements a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0106] Figure 5 This is a structural block diagram of a solid-state drive performance testing apparatus according to an embodiment of this application, such as... Figure 2 As shown, the device includes:

[0107] The wear simulation unit 502 is used to change the wear value of the solid-state drive under test multiple times through a specified accelerated wear intervention strategy, so as to simulate the wear state of the solid-state drive under test in multiple life cycle stages throughout its entire life cycle; the entire life cycle refers to the life cycle of the solid-state drive under test from zero wear to the upper limit of the wear value; different life cycle stages in multiple life cycle stages correspond to different wear value ranges.

[0108] The performance testing unit 504 is used to perform performance tests on the solid-state drive under wear conditions corresponding to multiple life cycle stages for specified performance items, and obtain the test values ​​of the specified performance items and multiple life cycle stages.

[0109] The result generation unit 506 is used to determine the performance test results of the solid-state drive under test based on the test values ​​corresponding to the specified performance items and multiple lifecycle stages.

[0110] It should be noted that the wear simulation unit 502 in this embodiment can be used to perform the above step S302, the performance testing unit 504 in this embodiment can be used to perform the above step S304, and the result generation unit 506 in this embodiment can be used to perform the above step S306.

[0111] In one exemplary embodiment, the wear simulation unit 502 is further configured to:

[0112] Before repeatedly altering the wear value of the SSD under test through a specified accelerated wear intervention strategy, the SSD under test is formatted according to a specified disk format after being powered on normally, resulting in a formatted SSD under test.

[0113] In one exemplary embodiment, the wear simulation unit 502 is further configured to:

[0114] Before repeatedly changing the wear value of the SSD under test through the specified accelerated wear intervention strategy, the log information of the SSD under test is obtained, and the current state of the SSD under test is determined based on the log information.

[0115] With the SSD under test currently in a normal state, the steps are performed to repeatedly change the wear value of the SSD under test through a specified accelerated wear intervention strategy, in order to simulate the wear state of the SSD under test in multiple life cycle stages throughout its entire life cycle.

[0116] In an exemplary embodiment, the wear simulation unit 502 is further configured to perform the following first intervention operation on each of the multiple lifecycle stages as the current lifecycle stage, to simulate the wear state of the solid-state drive under test in each lifecycle stage, wherein the wear value range corresponding to the current lifecycle stage is the current wear value range:

[0117] A first instruction is issued to the solid-state drive under test; the first instruction is used to modify the wear value of the solid-state drive under test to a first target wear value, so as to simulate the wear state of the solid-state drive under test in the current life cycle stage through the first target wear value; the first target wear value is any wear value within the current wear value range.

[0118] In an exemplary embodiment, the wear simulation unit 502 is further configured to, after obtaining the test value corresponding to the specified performance item and the current life cycle stage, restore the wear value of the solid-state drive under test from the first target wear value to the specified wear value if the current life cycle stage is not the last life cycle stage among multiple life cycle stages, so as to re-execute the first intervention operation with the next life cycle stage of the current life cycle stage as the new current life cycle stage.

[0119] In one exemplary embodiment, the multiple lifecycle stages include the first lifecycle stage in the entire lifecycle; the wear values ​​corresponding to different lifecycle stages in the entire lifecycle increase sequentially starting from the first lifecycle stage.

[0120] Wear simulation unit 502 is also used to perform the following second intervention operation, starting from the first life cycle stage, sequentially taking each of the multiple life cycle stages as the current life cycle stage, where the wear value range corresponding to the current life cycle stage is the current wear value range:

[0121] The system continuously sends a second instruction to the solid-state drive under test to continuously increase the wear value of the solid-state drive under test from the initial wear value corresponding to the current life cycle stage; the second instruction is used to simulate read and write operations performed on the solid-state drive under test by configuring the I / O pressure of the solid-state drive under test to be greater than the preset pressure.

[0122] During the process of continuously sending the second command to the solid-state drive under test, the current wear value of the solid-state drive under test is queried through the third command; the third command is used to query the current wear value of the solid-state drive under test.

[0123] When the current wear value reaches the second target wear value, stop issuing the second command to the solid-state drive under test, so as to simulate the wear state of the solid-state drive under test in the current life cycle stage through the second target wear value; the second target wear value is a pre-specified wear value within the current wear value range;

[0124] Specifically, the performance test of the solid-state drive under test in the wear state corresponding to the current life cycle stage for the specified performance item is performed after the second instruction is stopped from being sent to the solid-state drive under test;

[0125] The initial wear value corresponding to the first lifecycle stage is zero wear; when the second intervention operation is re-executed with the next lifecycle stage as the new current lifecycle stage, the initial wear value corresponding to the next lifecycle stage is the second target wear value.

[0126] In an exemplary embodiment, the performance testing unit 504 is further configured to retrieve multiple performance test cases for the current lifecycle stage via a fourth instruction; the fourth instruction is configured to filter multiple performance test cases from a test case library; the multiple performance test cases are used to test the specific values ​​of specified performance items of the solid-state drive under test in the current lifecycle stage; and the performance test of the solid-state drive under test is performed using multiple performance test cases to obtain the test values ​​of the specified performance items corresponding to the current lifecycle stage.

[0127] In an exemplary embodiment, the result generation unit 506 is further configured to determine that the performance test result of the solid-state drive under test is that the solid-state drive under test is normal when the test values ​​corresponding to the specified performance item and multiple lifecycle stages all meet the preset conditions; and to determine that the performance test result of the solid-state drive under test is abnormal when the test values ​​corresponding to the specified performance item and at least one lifecycle node in the multiple lifecycle stages do not meet the preset conditions.

[0128] It should be noted that the above modules can be implemented by software or hardware. For the latter, they can be implemented in the following ways, but are not limited to: all the above modules are located in the same processor; or, the above modules are located in different processors in any combination.

[0129] Embodiments of this application also provide a computer-readable storage medium storing a computer program, wherein the computer program is configured to execute the steps in any of the above method embodiments when run.

[0130] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.

[0131] Embodiments of this application also provide an electronic device, including a memory and a processor, wherein the memory stores a computer program and the processor is configured to run the computer program to perform the steps in any of the above method embodiments.

[0132] In one exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor and the input / output device is connected to the processor.

[0133] Embodiments of this application also provide a computer program product, which includes a computer program that, when executed by a processor, implements the steps in any of the above method embodiments.

[0134] Embodiments of this application also provide another computer program product, including a non-volatile computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps in any of the above method embodiments.

[0135] The embodiments described herein also provide a computer program that includes computer instructions stored in a computer-readable storage medium; a processor of a computer device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the computer device to perform the steps in any of the above method embodiments.

[0136] According to another aspect of the embodiments of this application, a computer program product is also provided, which includes a computer program / instructions containing program code for performing the method shown in the flowchart. The computer program product of this embodiment can be applied to, for example... Figure 6 The illustrated electronic device is a computing system. In such an embodiment, the computer program can be downloaded and installed from a network via communication section 609, and / or installed from removable medium 611. When the computer program is executed by central processing unit 601, it performs various functions provided in the embodiments of this application. The above-mentioned embodiment numbers are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0137] like Figure 6 As shown, the computer system 600 includes a central processing unit 601, which can perform various appropriate actions and processes based on programs stored in read-only memory 602 or programs loaded from storage section 608 into random access memory 603. The random access memory 603 also stores various programs and data required for system operation. The central processing unit 601, read-only memory 602, and random access memory 603 are interconnected via a bus 604. An input / output interface 605 is also connected to the bus 604.

[0138] The following components are connected to the input / output interface 605: an input section 606 including a keyboard, mouse, etc.; an output section 607 including a CRT (Cathode Ray Tube), LCD (Liquid Crystal Display), etc., and speakers, etc.; a storage section 608 including a hard disk, etc.; and a communication section 609 including a network interface card such as a LAN card, modem, etc. The communication section 609 performs communication processing via a network such as the Internet. A drive 610 is also connected to the input / output interface 605 as needed. A removable medium 611, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., is installed on the drive 610 as needed so that computer programs read from it can be installed into the storage section 608 as needed.

[0139] Specifically, according to embodiments of this application, the processes described in the various method flowcharts can be implemented as computer software programs. For example, embodiments of this application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via communication section 609, and / or installed from removable medium 611. When the computer program is executed by central processing unit 601, it performs various functions defined in the system of this application.

[0140] It should be noted that, Figure 6 The computer system 600 of the electronic device shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of this application.

[0141] Specific examples in this embodiment can be found in the examples described in the above embodiments and exemplary implementations, and will not be repeated here.

[0142] Obviously, those skilled in the art should understand that the modules or steps of this application described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. They can be implemented using computer-executable program code, and thus can be stored in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those presented here, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, this application is not limited to any particular combination of hardware and software.

[0143] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the principles of this application should be included within the protection scope of this application.

Claims

1. A performance test method of a solid state drive, characterized by, The method comprises: by specifying the accelerated wear intervention strategy, the wear value of the to-be-tested solid state disk is changed multiple times to simulate the wear state of the to-be-tested solid state disk in multiple life cycle stages in the full life cycle of the to-be-tested solid state disk; the full life cycle refers to the life cycle of the to-be-tested solid state disk from zero wear to the upper limit of the wear value; different life cycle stages in the multiple life cycle stages correspond to different wear value ranges; for a specified performance item, the to-be-tested solid state disk in the wear state corresponding to the multiple life cycle stages is respectively tested in performance to obtain test values of the specified performance item corresponding to the multiple life cycle stages; determine the performance test result of the to-be-tested solid state disk according to the test values of the specified performance item corresponding to the multiple life cycle stages; wherein, by specifying the accelerated wear intervention strategy, the wear value of the to-be-tested solid state disk is changed multiple times to simulate the wear state of the to-be-tested solid state disk in multiple life cycle stages in the full life cycle of the to-be-tested solid state disk, comprising: each life cycle stage in the multiple life cycle stages is respectively taken as a current life cycle stage to perform the following first intervention operation to simulate the wear state of the to-be-tested solid state disk in each life cycle stage; the wear value range corresponding to the current life cycle stage is the current wear value range: issue a first instruction to the to-be-tested solid state disk; the first instruction is used to modify the wear value of the to-be-tested solid state disk to a first target wear value, so as to simulate the wear state of the to-be-tested solid state disk in the current life cycle stage through the first target wear value; the first target wear value is any wear value in the current wear value range.

2. The method of claim 1, wherein, before the wear value of the to-be-tested solid state disk is changed multiple times by specifying the accelerated wear intervention strategy, the method further comprises: after the to-be-tested solid state disk is normally powered on, formatting the to-be-tested solid state disk according to a specified disk format to obtain a formatted to-be-tested solid state disk.

3. The method of claim 1, wherein, before the wear value of the to-be-tested solid state disk is changed multiple times by specifying the accelerated wear intervention strategy, the method further comprises: obtain the log information of the to-be-tested solid state disk, and determine the current state of the to-be-tested solid state disk according to the log information of the to-be-tested solid state disk; if the to-be-tested solid state disk is currently in a normal state, perform the step of changing the wear value of the to-be-tested solid state disk multiple times by specifying the accelerated wear intervention strategy to simulate the wear state of the to-be-tested solid state disk in multiple life cycle stages in the full life cycle.

4. The method of claim 1, wherein, the wear value of the to-be-tested solid state disk is changed multiple times by specifying the accelerated wear intervention strategy to simulate the wear state of the to-be-tested solid state disk in multiple life cycle stages in the full life cycle, further comprising: ​ ​ ​ After obtaining the test value of the specified performance item corresponding to the current life cycle stage, if the current life cycle stage is not the last one of the plurality of life cycle stages, the wear value of the solid state disk under test is restored from the first target wear value to a specified wear value, and the first intervention operation is re-executed with the next life cycle stage of the current life cycle stage as the new current life cycle stage.

5. The method of any one of claims 1-3, wherein, the plurality of life cycle stages include a first life cycle stage in the full life cycle; the wear values corresponding to different life cycle stages in the full life cycle increase sequentially from the first life cycle stage; the plurality of life cycle stages include a first life cycle stage in the full life cycle; the wear values corresponding to different life cycle stages in the full life cycle increase sequentially from the first life cycle stage; the second intervention operation includes: continuously issuing a second instruction to the solid state disk under test to continuously increase the wear value of the solid state disk under test from an initial wear value corresponding to the current life cycle stage; the second instruction is used to simulate read-write operations performed on the solid state disk under test by configuring the I / O pressure of the solid state disk under test to be greater than a preset pressure; during the process of continuously issuing the second instruction to the solid state disk under test, querying the current wear value of the solid state disk under test through a third instruction; the third instruction is used to query the current wear value of the solid state disk under test; if the current wear value reaches a second target wear value, stop issuing the second instruction to the solid state disk under test to simulate the wear state of the solid state disk under test in the current life cycle stage through the second target wear value; the second target wear value is a pre-specified wear value in the current wear value range; wherein, for the specified performance item, the performance test of the solid state disk under test in the wear state corresponding to the current life cycle stage is performed after stopping issuing the second instruction to the solid state disk under test; wherein, the initial wear value corresponding to the first life cycle stage is zero wear; when the second intervention operation is re-executed with the next life cycle stage of the current life cycle stage as the new current life cycle stage, the initial wear value corresponding to the next life cycle stage is the second target wear value.

6. The method of claim 5, wherein, the performance test of the solid state disk under test in the wear state corresponding to the plurality of life cycle stages for the specified performance item includes: For the current life cycle stage, a plurality of performance test cases are invoked by a fourth instruction; the fourth instruction is used to screen a plurality of performance test cases from a test case library; the plurality of performance test cases are used to test specific values of the specified performance items of the to-be-tested solid state disk in the current life cycle stage; The plurality of performance test cases are used to perform performance testing on the to-be-tested solid state disk, and test values of the specified performance items corresponding to the current life cycle stage are obtained.

7. The method of claim 1, wherein The performance test result of the to-be-tested solid state disk is determined according to the test values of the specified performance items corresponding to the plurality of life cycle stages, including: In a case where the test values of the specified performance items corresponding to the plurality of life cycle stages all meet preset conditions, it is determined that the performance test result of the to-be-tested solid state disk is that the to-be-tested solid state disk is normal; In a case where the test value of the specified performance item corresponding to at least one of the plurality of life cycle stages does not meet the preset condition, it is determined that the performance test result of the to-be-tested solid state disk is that the to-be-tested solid state disk is abnormal.

8. A performance test device of a solid state drive, characterized by, including: a wear simulation unit configured to change a wear value of a to-be-tested solid state disk multiple times by a specified accelerated wear intervention strategy to simulate wear states of the to-be-tested solid state disk in a plurality of life cycle stages in a full life cycle of the to-be-tested solid state disk; the full life cycle refers to a life cycle of the to-be-tested solid state disk from zero wear to an upper limit of a wear value; different life cycle stages in the plurality of life cycle stages correspond to different ranges of wear values; wherein the wear value of the to-be-tested solid state disk is changed multiple times by the specified accelerated wear intervention strategy to simulate the wear states of the to-be-tested solid state disk in the plurality of life cycle stages in the full life cycle, including: taking each of the plurality of life cycle stages as a current life cycle stage to perform the following first intervention operation to simulate the wear state of the to-be-tested solid state disk in the each of the plurality of life cycle stages; the wear value range corresponding to the current life cycle stage is a current wear value range; a first instruction is issued to the to-be-tested solid state disk; the first instruction is used to modify the wear value of the to-be-tested solid state disk to a first target wear value to simulate the wear state of the to-be-tested solid state disk in the current life cycle stage by the first target wear value; the first target wear value is any wear value in the current wear value range; a performance test unit configured to perform performance testing on the to-be-tested solid state disk in the wear states corresponding to the plurality of life cycle stages for a specified performance item to obtain test values of the specified performance item corresponding to the plurality of life cycle stages; a result generation unit configured to determine a performance test result of the to-be-tested solid state disk according to the test values of the specified performance item corresponding to the plurality of life cycle stages.

9. A computer-readable storage medium, comprising The computer readable storage medium stores a computer program, and the computer program is executed by the processor to implement the steps of the method in any one of claims 1 to 7.

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