A CT automatic short-circuit and open-circuit prevention contact structure, socket and plug
By optimizing the timing design of the CT automatic short-circuit anti-open circuit contact structure and the spring force arm fulcrum design, the CT open circuit phenomenon is solved, the stability and safety of the test device are improved, the operational flexibility and efficiency are optimized, and the product life is extended.
Patent Information
- Application Number
- CN202510177802.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-18
- Publication Date
- 2025-09-12
- Estimated Expiration
- 2045-02-18
AI Technical Summary
The existing CT automatic short-circuiting device is prone to CT open circuit during the test process, resulting in safety hazards and operational inflexibility. In addition, various restrictions in the existing design reduce the efficiency and stability of the test device.
The CT automatic short-circuit and open-circuit prevention contact structure is adopted. By optimizing the timing design of the contacts, the time for the short-circuit of the secondary side of the CT circuit and the closure of the elastic contacts of the equipment circuit are advanced to before the short-circuit of the secondary side of the CT circuit is cancelled. The extension design is used to avoid bouncing open circuit, and the contact structure is optimized through the design of the spring arm fulcrum and static contact to reduce bouncing and wear.
It improves the stability and safety of the test device, reduces the risk of overvoltage, optimizes operational flexibility and work efficiency, extends product service life, and reduces the risk of failure.
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Figure CN120073364B_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of power systems, and in particular to a CT automatic short-circuit and open-circuit prevention contact structure, a socket, and a plug. Background Art
[0002] In the power industry, testing relay protection circuits requires isolating the current on the primary transformer side from the secondary protection device before testing the secondary equipment and circuit using specialized testing instruments. As we all know, the secondary side of the current transformer cannot be open-circuited, as this will generate high voltage and could burn out the transformer, causing personal injury or economic loss.
[0003] The traditional operation scheme requires manual short-circuiting of the circuit with a jumper, and then disconnecting the connection between the circuits to be tested before testing can be carried out. This is inefficient and can easily lead to safety accidents due to operational errors. In recent years, due to technological advances and the increasing emphasis on safety and reliability, a test device with built-in resilient breakable contacts has appeared on the market. When used with a dedicated test plug, it can conveniently disconnect and isolate the circuit to be tested during testing, and reliably short-circuit the CT circuit.
[0004] In previous field applications, this automatic shorting technology has also exposed some flaws. For example, after a test is completed and the plug is removed, the spring contacts of the test circuit first conduct electricity through the connected metal parts of the test plug, restoring the isolated circuit. The shorting mechanism then disengages as the plug is removed, and the spring contacts finally separate from the test plug, closing. At this point, the closed spring contacts inevitably bounce, and the primary and secondary circuits no longer have shorting protection, effectively causing the CT to open.
[0005] Therefore, most existing products have strict restrictions on usage conditions. Some of these restrictions prohibit plugging or unplugging the test handle while power is on; some impose strict restrictions on the speed of unplugging; and some implement additional mechanical restrictions on the test handle, such as adding a pause limit between the closed and shorted positions of the circuit-breaking spring contacts to prevent the short circuit from being disconnected during the bounce process.
[0006] With respect to the above-mentioned related technologies, these strict operating conditions and additional mechanical restriction devices in the existing designs have greatly reduced the operational flexibility, stability and working efficiency of the testing device. Summary of the Invention
[0007] In order to avoid CT open circuit when using a test device to test the relay protection circuit, improve the stability and safety of the test device, and improve the operational flexibility and work efficiency of the test device, the present application provides a CT automatic short-circuiting and anti-open circuit contact structure, socket and plug.
[0008] The present application provides a CT automatic short-circuit and open-circuit prevention contact structure that adopts the following technical solutions:
[0009] A CT automatic short-circuit and open-circuit prevention contact structure includes a first spring, a second spring, and a third spring, wherein the first spring includes a first contact portion, the second spring includes a second contact portion, an extension portion, and a third contact portion, and the third spring includes a fourth contact portion, wherein the third contact portion is arranged closer to a test socket than the second contact portion, and the fourth contact portion is arranged closer to the test socket than the third contact portion, and the fourth contact portion and the third contact portion are arranged on the same side;
[0010] The first contact portion and the second contact portion are arranged in contact with each other and can be isolated by a test plug;
[0011] The third contact portion and the fourth contact portion are used to contact the short-circuit contact piece of the test plug;
[0012] There are at least two groups of the combination of the first reed, the second reed and the third reed, and adjacent third reeds are connected by a connecting member.
[0013] By adopting the above technical solution, the first reed is connected to the current transformer, and the second reed is connected to the equipment. When performing a test operation, a test plug is inserted into a socket equipped with the contact structure. The shorting contact piece of the test plug first contacts the third contact part and the fourth contact part to achieve short circuit of the secondary side of the CT circuit.
[0014] The test plug then continues to extend into the socket. During the insertion process, the third and fourth contacts always maintain contact with the test plug (i.e., the secondary side of the CT circuit is kept short-circuited). At the same time, the test plug isolates the first and second contacts (i.e., disconnects the connection circuit of the device). At this time, the circuit and secondary device can be tested separately.
[0015] After the test is completed, the test plug is pulled out of the socket. The test plug first leaves the first contact part and the second contact part, and the first contact part and the second contact part are restored to be closed. The first contact part and the second contact part have a bouncing action when restoring to be closed (that is, the first contact part and the second contact part have not reached a stable closed state). However, in the process of directly pulling out the test plug, due to the design of the extension part, after the test plug is separated from the first contact part and the second contact part, it takes a period of pulling out time for the test plug to be separated from the third contact part (that is, the short circuit on the secondary side of the CT circuit is cancelled), and this pulling out time is longer than the time required for the first contact part and the second contact part to return to a stable closed state.
[0016] By optimizing the timing structure between the short-circuit of the secondary side of the CT circuit and the closure of the elastic contacts of the equipment circuit, the closing and stabilization time of the elastic contacts of the equipment circuit is advanced to before the short-circuit of the secondary side of the CT circuit is removed. Since the circuit has short-circuit protection when the bounce occurs, the CT secondary circuit will not generate risks such as overvoltage or transformer burning due to the bounce open circuit at the moment of contact closure, and the CT open circuit will not occur, thereby improving the stability and safety of the test device; and the test plug can be pulled out directly without the need for multiple conditions to restrict the operation process, which optimizes the user experience and improves the operational flexibility and work efficiency of the test device.
[0017] Optionally, the first contact portion includes a first protrusion segment, a first straight arm segment and a first bent segment, the first protrusion is connected to the first straight arm segment, the first straight arm segment is connected to the first bent segment, and the first bent segment is used to contact the second contact portion.
[0018] By adopting the above technical solution, the first raised section and the first straight arm section are designed in combination, the first raised section serves as the force arm fulcrum, and the first support arm section serves as the force arm, thereby reducing the deformation amplitude and recovery time of the first bent section when closing, so that the first bent section can return to its closed state more quickly, reducing the bouncing phenomenon during the contact closing process, and ensuring that the first bent section returns to a stable contact state in a short time.
[0019] Optionally, the second contact portion includes a second protruding section, the extension portion includes a second straight arm section, the third contact portion includes a second bent section, the second protruding section is connected to the second straight arm section, the second straight arm section is connected to the second bent section, the second protruding section is used to contact the first contact portion, and the second bent section is used to contact the short-circuit contact piece of the test plug.
[0020] By adopting the above technical solution, the second raised section is used as the fulcrum of the force arm, and the second straight arm section is used as the force arm. The cooperation between the second raised section and the second straight arm section can enable the second bent section to stably contact the test plug, thereby improving the service life of the socket, reducing the situation of poor contact caused by the second bent section not returning to its original position during the test process, and reducing the risk of open circuit.
[0021] The second raised section also serves as a static contact for connecting the device circuit, while the second straight arm section optimizes the timing between shorting the secondary side of the CT circuit and closing the elastic contact of the device circuit. This dual function effectively reduces the overall length and complexity of the contact structure, making the contact system more compact, reducing the risk of failure, and minimizing potential wear and fatigue points during use, thereby extending the overall product lifespan and improving its functional stability.
[0022] Optionally, the fourth contact portion includes a third bending section, which is used to contact the short-circuit contact piece of the test plug. The contact point of the second bending section is arranged through the center line of the test socket insertion direction, and the third bending section is arranged adjacent to the center line of the test socket insertion direction.
[0023] By adopting the above technical solution, different contacts carry different currents. Since the second bent section needs to bear a larger carrying current, the design of the second bent section can improve the tightness between the second bent section and the plug, reduce contact resistance, and improve the current carrying capacity of the contact.
[0024] The third bending section only needs to carry a smaller carrying current, so the design of the third bending section can reduce the degree of contact between the third bending section and the plug, while ensuring the reliability of current transmission and contact stability, optimizing the plugging and unplugging force, allowing users to operate more smoothly, and avoiding excessive wear of the reed.
[0025] Optionally, a connecting port is formed on the third spring, and the connecting member includes a shorting plug, which passes through two adjacent connecting ports and is tightly fitted.
[0026] By adopting the above technical solution, the design of the short-circuit plug can replace a third reed separately without replacing the third reeds of other groups, which is easy to install and disassemble and suitable for occasions requiring flexible adjustment, convenient maintenance and replacement.
[0027] Optionally, the connecting member includes a connecting piece, and the connecting piece is integrally formed with two adjacent third spring pieces.
[0028] By adopting the above technical solution, the overall structure of the one-piece design is more compact, the number of connection points is reduced, the connection reliability is increased, the risk of poor contact is reduced, and the durability is improved. It is suitable for occasions with high requirements for stability and long-term durability.
[0029] This application also provides a socket that adopts the following technical solution:
[0030] A socket for installing the above-mentioned CT automatic short-circuit and open-circuit prevention contact structure, comprising a housing and an upper cover, wherein the upper cover and the housing are detachably connected, the first reed, the second reed, and the third reed are all installed in the housing, the connecting member can be inserted into the housing, one end of the housing is provided with an insertion port for inserting a test plug, and the other end of the housing is provided with a connecting groove for exposing the first reed and the second reed, the housing is provided with a fastening bolt for tightening the exposed portions of the first reed and the second reed, and the upper cover is provided with a positioning protrusion.
[0031] By adopting the above technical solution, the design of the fastening bolt is used to strengthen the fixation of the first reed and the second reed, while allowing the first reed and the second reed to maintain a stable connection with the electrical equipment. The setting of the positioning protrusion can play a guiding role, making it easier for the socket to be inserted into the detection device.
[0032] Optionally, the shell is provided with a first observation port, a second observation port and a third observation port, the first observation port is arranged opposite to the contact point of the first contact part and the second contact part, the second observation port is arranged opposite to the contact point of the third contact part and the short-circuit contact piece of the test plug, and the third observation port is arranged opposite to the third spring.
[0033] By adopting the above technical solution, when using the socket, the first observation port, the second observation port and the third observation port can be used to observe in advance to ensure the contact status of each key point before use, so as to avoid the open circuit during the test operation due to improper installation of the reed.
[0034] This application also provides a plug that adopts the following technical solution:
[0035] A plug, applied to the above-mentioned CT automatic short-circuit and open-circuit prevention contact structure, includes an insulating base, a first conductive contact piece, and a second conductive contact piece. The first conductive contact piece and the second conductive contact piece are each installed on one side of the insulating base. When the insulating base is inserted into place, the first conductive contact piece contacts the first contact portion, the second contact portion contacts the side of the insulating base facing away from the first conductive contact piece, the third contact portion and the fourth contact portion both contact the second conductive contact piece, and the first conductive contact piece and the second conductive contact piece are both connected to a test plug.
[0036] By adopting the above technical solution, after each set of first reeds, second reeds and third reeds are connected to the plug, it is only necessary to connect the test plug connected to the first conductive contact piece to a power source to detect whether there is a problem with the circuit equipment, and connect the test plug connected to the second conductive contact piece to a detection instrument to detect whether there is a problem with the circuit route.
[0037] Optionally, the end of the first conductive contact is bent and wrapped around the side of the insulating base to install the second conductive contact. A space is left between the bent end of the first conductive contact and the second conductive contact for the second contact portion to contact the insulating base. An identification protrusion is provided at the top of the device external connection end of the insulating base, and the two side surfaces of the insertion end of the insulating base are inclined in a direction close to each other.
[0038] By adopting the above technical solution, the design of the first conductive contact and the second conductive metal sheet ensures that signal transmission is maintained before disconnecting the main circuit during plug insertion or removal, avoiding sudden signal interruptions, unnecessary current surges, or signal loss, and improving system reliability. The identification protrusion makes it easy to determine whether the plug is facing forward or backward, avoiding operational errors. The tilted end of the insulating base provides a guide, facilitating plug insertion and removal and reducing wear.
[0039] In summary, this application includes at least one of the following beneficial technical effects:
[0040] 1. By optimizing the timing structure between the short-circuit of the CT circuit secondary side and the closure of the device circuit elastic contacts, the closure and stabilization time of the device circuit elastic contacts is advanced to before the short-circuit of the CT circuit secondary side is removed. Since the circuit is short-circuited when a bounce occurs, the CT secondary circuit will not generate overvoltage or transformer burnout due to the bounce opening at the moment of contact closure, and the CT open circuit will not occur, thereby improving the stability and safety of the test device. In addition, the test plug can be unplugged directly without the need for multiple conditions to restrict the operation process, which optimizes the user experience and improves the operational flexibility and work efficiency of the test device.
[0041] 2. The second raised section and the second straight arm section have dual functions. The second raised section serves as both a force arm fulcrum and a static contact for connecting the equipment circuit. The second straight arm section serves as both a force arm and optimizes the timing structure between the short circuit of the secondary side of the CT circuit and the closure of the elastic contact of the equipment circuit. This effectively reduces the total length and complexity of the contact structure, making the contact system more compact, reducing the risk of failure, and reducing possible wear and fatigue points during use, which is conducive to extending the overall service life of the product and improving the functional stability of the product. BRIEF DESCRIPTION OF THE DRAWINGS
[0042] Figure 1 It is a schematic diagram of the overall structure of the contact structure used in the embodiment of the present application.
[0043] Figure 2 It is a schematic structural diagram of the embodiment of the present application for reflecting the connecting member and the third reed.
[0044] Figure 3 This is a schematic diagram of the structure of the connecting member and the third reed used in an embodiment of the present application.
[0045] Figure 4 This is a schematic diagram of the overall structure of the plug used in an embodiment of the present application.
[0046] Figure 5 It is a structural diagram of the embodiment of the present application used to reflect the structure of the plug inserted into the contact.
[0047] Figure 6 This is a structural diagram of an embodiment of the present application used to illustrate the plug being pulled out from the contact structure.
[0048] Figure 7 This is a schematic diagram of the overall structure of the socket used in an embodiment of the present application.
[0049] Figure 8 This is a structural diagram of the embodiment of the present application for illustrating the first observation port, the second observation port, and the third observation port.
[0050] Explanation of reference numerals: 1. first spring piece; 11. first contact portion; 111. first protruding section; 112. first straight arm section; 113. first bending section; 12. first connecting portion; 2. second spring piece; 21. second contact portion; 211. second protruding section; 22. second connecting portion; 23. extension portion; 231. second straight arm section; 24. third contact portion; 241. second bending section; 3. third spring piece; 31. fourth contact portion; 311. third bending section; 32. third connecting portion; 33. connecting port; 4. Connector; 41. Shorting plug; 42. Connecting piece; 51. Insulating base; 52. First conductive contact; 53. Second conductive contact; 54. Identification protrusion; 55. Test plug; 61. First contact; 62. Second contact; 63. Third contact; 64. Fourth contact; 7. Housing; 71. Plug port; 72. Connecting slot; 73. Fastening bolt; 74. Positioning protrusion; 75. First observation port; 76. Second observation port; 77. Third observation port; 78. Opening; 8. Upper cover; 81. Fourth observation port. DETAILED DESCRIPTION
[0051] The following is combined with Figure 1-8 This application is described in further detail.
[0052] The embodiment of the present application discloses a contact structure for automatically short-circuiting a CT to prevent an open circuit.
[0053] like Figure 1 The contact structure of the CT automatic short-circuit anti-open circuit includes a first reed 1, a second reed 2 and a third reed 3. There are at least two groups of combinations of the first reed 1, the second reed 2 and the third reed 3. In the embodiment of the present application, there are two groups of combinations of the first reed 1, the second reed 2 and the third reed 3.
[0054] The first reed 1 and the second reed 2 are arranged opposite to each other. The first reed 1 includes a first contact portion 11 and a first connecting portion 12. The first contact portion 11 is located at one end of the first reed 1, and the first connecting portion 12 is located at the other end of the first reed 1.
[0055] The second spring piece 2 includes a second contact portion 21, a second connecting portion 22, an extension portion 23, and a third contact portion 24. The third contact portion 24 is located at one end of the second spring piece 2, and the second connecting portion 22 is located at the other end of the second spring piece 2. The third contact portion 24 is connected to the extension portion 23, and the extension portion 23 is connected to the second contact portion 21.
[0056] The third reed 3 includes a fourth contact portion 31 and a third connecting portion 32 . The fourth contact portion 31 is located at one end of the third reed 3 , and the third connecting portion 32 is located at the other end of the third reed 3 .
[0057] The first connection portion 12 is used to connect to an electrical device, and the second connection portion 22 is used to connect to a current transformer. The first contact portion 11 and the second contact portion 21 are in contact with each other in a natural state. The first contact portion 11 and the second contact portion 21 can be isolated from each other by a test plug.
[0058] The third contact portion 24 is disposed closer to the test socket than the second contact portion 21 , and the fourth contact portion 31 is disposed closer to the test socket than the third contact portion 24 , and the fourth contact portion 31 and the third contact portion 24 are disposed on the same side;
[0059] The third contact portion 24 can contact the short-circuit contact piece of the test plug, the fourth contact portion 31 can contact the short-circuit contact piece of the test plug, and the third connecting portions 32 of the two third springs 3 are connected through the connecting piece 4 .
[0060] In order to ensure smooth connection and disconnection of each contact portion, after the first reed 1, the second reed 2, and the third reed 3 are installed in the test socket, when the first reed 1, the second reed 2, and the third reed 3 are in a natural state, the first reed 1 is located on one side of the center line of the insertion direction of the test socket, and the second reed 2 and the third reed 3 are located on the other side of the center line of the insertion direction of the test socket;
[0061] Furthermore, the centerline of the test socket's insertion direction passes through the contact portion of the first contact portion 11 and the second contact portion 21, and the third contact portion 24 crosses the centerline of the test socket's insertion direction. That is, the contact point of the third contact portion 24 and the first spring piece 1 are located on one side of the centerline of the test socket's insertion direction, while the contact point of the fourth contact portion 31 and the second spring piece 2 and the third spring piece 3 are located on the other side of the centerline of the test socket's insertion direction, and the contact point of the fourth contact portion 31 is located adjacent to the centerline of the test socket's insertion direction.
[0062] When performing a test operation, a test plug is inserted into a socket equipped with the contact structure. The shorting contact piece of the test plug first contacts the third contact portion 24 and the fourth contact portion 31 to achieve short circuit of the secondary side of the CT circuit.
[0063] The test plug then continues to extend into the socket. During the insertion process, the third contact portion 24 and the fourth contact portion 31 always maintain contact with the test plug (i.e., the secondary side of the CT circuit is kept short-circuited). At the same time, the test plug isolates the first contact portion 11 and the second contact portion 21 (i.e., disconnects the connection circuit of the device). At this time, the circuit and secondary device can be tested separately.
[0064] After the test is completed, the test plug is pulled out of the socket. The test plug first leaves the first contact portion 11 and the second contact portion 21, and the first contact portion 11 and the second contact portion 21 are restored to a closed state. The first contact portion 11 and the second contact portion 21 have a bouncing action when restoring the closed state (i.e., the first contact portion 11 and the second contact portion 21 have not reached a stable closed state). However, during the process of directly pulling out the test plug, due to the design of the extension portion 23, after the test plug is separated from the first contact portion 11 and the second contact portion 21, it takes a period of time for the test plug to be separated from the third contact portion 24 (i.e., the short circuit on the secondary side of the CT circuit is released). This period of time is longer than the time required for the first contact portion 11 and the second contact portion 21 to return to a stable closed state.
[0065] By optimizing the timing structure between the short-circuit of the secondary side of the CT circuit and the closure of the elastic contacts of the equipment circuit, the closing and stabilization time of the elastic contacts of the equipment circuit is advanced to before the short-circuit of the secondary side of the CT circuit is removed. Since the circuit has short-circuit protection when the bounce occurs, the CT secondary circuit will not generate risks such as overvoltage or transformer burning due to the bounce open circuit at the moment of contact closure, and the CT open circuit will not occur, thereby improving the stability and safety of the test device; and the test plug can be pulled out directly without the need for multiple conditions to restrict the operation process, which optimizes the user experience and improves the operational flexibility and work efficiency of the test device.
[0066] like Figure 1 The first contact portion 11 includes a first protruding section 111, a first straight arm section 112 and a first bent section 113. The first bent section 113 is located at the end of the first spring piece 1. The first bent section 113 is connected to the first straight arm section 112, and the first straight arm section 112 is connected to the first protruding section 111.
[0067] The second contact portion 21 includes a second protruding section 211, the extending portion 23 includes a second straight arm section 231, and the third contact portion 24 includes a second bent section 241. The second protruding section 211 is connected to the second straight arm section 231, and the second straight arm section 231 is connected to the second bent section 241. The second bent section 241 is located at one end of the second reed 2.
[0068] The fourth contact portion 31 includes a third bent section 311, and the third bent section 311 is used to contact the shorting contact piece of the test plug;
[0069] The second protruding section 211 contacts the first bent section 113, and the second bent section 241 contacts the shorting contact piece of the test plug. Therefore, in the embodiment of the present application, the second bent section 241 crosses the center line of the insertion direction of the test socket, that is, the contact point of the second bent section 241 and the first spring 1 are both located on one side of the center line of the insertion direction of the test socket;
[0070] The third bent section 311 contacts the shorting contact piece of the test plug. Therefore, in the embodiment of the present application, the contact point of the third bent section 311 is located adjacent to the center line of the insertion direction of the test socket.
[0071] The first raised section 111 and the first straight arm section 112 are designed in combination. The first raised section 111 serves as the fulcrum of the force arm, and the first straight arm section 112 serves as the force arm. This reduces the deformation amplitude and recovery time of the first bent section 113 during closing, thereby enabling the first bent section 113 to return to its closed state more quickly, reducing the bouncing phenomenon during the contact closing process, and ensuring that the first bent section 113 returns to a stable contact state in a short time.
[0072] The second raised section 211 is used as the lever arm fulcrum, and the second straight arm section 231 is used as the lever arm. The cooperation between the second raised section 211 and the second straight arm section 231 can ensure that the second bent section 241 is in stable contact with the test plug, thereby improving the service life of the socket, reducing the possibility of poor contact caused by the second bent section 241 not returning to its original position during testing, and reducing the risk of open circuit.
[0073] The second raised section 211 also serves as a static contact for connecting the device circuit, while the second straight arm section 231 optimizes the timing between shorting the secondary side of the CT circuit and closing the device circuit's elastic contacts. This dual function of the second raised section 211 and the second straight arm section 231 effectively reduces the overall length and complexity of the contact structure, making the contact system more compact, reducing the risk of failure, and minimizing potential wear and fatigue points during use, thereby extending the overall product lifespan and improving its functional stability.
[0074] In other embodiments, the first contact portion 11 may be a separate contact protrusion on the first reed 1 or may have only the first bent section 113 . The second contact portion 21 may be a separate contact protrusion on the second reed 2 . The extension 23 may be a curved segment having other signal transmission functions. The third contact portion 24 may be a separate contact protrusion on the third reed 3 .
[0075] like Figure 2 In one embodiment, a connection port 33 is formed on the third spring 3, and the connector 4 includes a shorting plug 41, which passes through two adjacent connection ports 33 and fits tightly;
[0076] like Figure 3 In another embodiment, the connecting member 4 includes a connecting piece 42 , and the connecting piece 42 is integrally formed with the two adjacent third springs 3 .
[0077] The embodiment of the present application discloses a plug for use with the CT automatic short-circuit and open-circuit prevention contact structure of the embodiment of the present application.
[0078] like Figure 4 and Figure 5 The plug includes an insulating base 51, a first conductive contact 52, and a second conductive contact 53. The insulating base 51 is T-shaped, with the two side surfaces of the insertion end of the insulating base 51 tilted toward each other to form a pointed shape. The first conductive contact 52 and the second conductive contact 53 are each mounted on one side of the insulating base 51. The first conductive contact 52 is longer than the second conductive contact 53. One end of the first conductive contact 52 is bent and wrapped around the side of the insulating base 51 where the second conductive contact 53 is mounted. A space is left between the bent end of the first conductive contact 52 and the second conductive contact 53 for the second contact portion 21 to contact the insulating base 51. An identification protrusion 54 is provided on the top of the device external connection end of the insulating base 51. Both the first conductive contact 52 and the second conductive contact 53 are connected to a test plug 55.
[0079] like Figure 5 When the plug is not inserted into the CT automatic short-circuit anti-opening contact structure, the first bent section 113 contacts the second raised section 211 to form the first contact 61;
[0080] When the plug is inserted into the CT, the first stage of the contact structure for automatic short-circuit prevention is as follows: the first bent section 113 contacts the second raised section 211 to form the first contact 61, the second conductive contact piece 53 contacts the second bent section 241 to form the second contact 62, and the second conductive contact piece 53 contacts the third bent section 311 to form the third contact 63.
[0081] During the second phase of the plug's automatic shorting and open-circuit prevention contact structure during insertion into the CT, the second and third contacts 62 and 63 are maintained, while the first bent section 113 and the second raised section 211 are disconnected. This disconnects the first contact 61, and the first conductive contact 52 contacts the first bent section 113, forming the fourth contact 64. Furthermore, depending on actual usage needs, when the plug is fully inserted, the second raised section 211 may contact the second conductive contact 53, and the second raised section 211 may also contact the insulating base 51.
[0082] After the insertion is completed, the test plugs 55 of the two first conductive contacts 52 can be connected to an external test power supply to form a complete test circuit for determining whether there is a problem with the equipment; the test plugs 55 of the two second conductive contacts 53 can be connected to an external detection instrument, which is equivalent to connecting a detection instrument in parallel to the short-circuit circuit, so as to determine whether there is a problem with the CT circuit.
[0083] like Figure 6 When the plug is not unplugged from the CT automatic short-circuit protection contact structure, the second contact 62, the third contact 63 and the fourth contact 64 are maintained in their respective states;
[0084] The first stage of the contact structure for automatically short-circuiting and preventing open circuit when the plug is unplugged is that the fourth contact 64 is disconnected, the first bent section 113 returns to its natural state, and the first bent section 113 contacts the second raised section 211 to form the first contact 61. Before the first contact 61 is stably formed, the second contact 62 and the third contact 63 are maintained in their respective states even during the plug removal process.
[0085] The second stage of the contact structure of the CT automatically short-circuiting to prevent open circuit when the plug is pulled out is that the plug is completely pulled out, the second contact 62 and the third contact 63 are cancelled, and the circuit resumes normal operation.
[0086] like Figure 7 The embodiment of the present application also discloses a socket for installing the CT automatic short-circuit and anti-open circuit contact structure of the embodiment of the present application, and can be inserted and matched with the plug of the embodiment of the present application.
[0087] The socket includes a shell 7 and an upper cover 8. The upper cover 8 and the shell 7 are connected by a snap-fit structure. The first reed 1, the second reed 2 and the third reed 3 are all installed in the shell 7. The shell 7 and the upper cover 8 are jointly provided with an opening 78 for inserting the shorting plug 41. A plug interface 71 for inserting the plug is provided at one end of the shell 7. The opening 78 and the plug interface 71 are arranged on the same side. A connecting groove 72 for exposing the first reed 1 and the second reed 2 is provided at the other end of the shell 7. The upper cover 8 also has a groove that cooperates with the connecting groove 72. The connecting groove 72 and the groove cooperate to form an interface. The shell 7 is provided with a fastening bolt 73 for tightening the exposed parts of the first reed 1 and the second reed 2, and the upper cover 8 is provided with a positioning protrusion 74.
[0088] The shell 7 is provided with a first observation port 75, a second observation port 76 and a third observation port 77. The first observation port 75 is arranged opposite the contact point of the first bent section 113 and the second raised section 211, the second observation port 76 is arranged opposite the contact point of the second bent section 241 and the second conductive contact piece 53, and the third observation port 77 is arranged opposite the third connecting portion 32 of the third spring piece 3. The upper cover 8 is provided with a fourth observation port 81 corresponding to the third observation port 77, which facilitates the connecting piece 42 to extend into the adjacent shell 7.
[0089] When using the socket, the first observation port 75, the second observation port 76 and the third observation port 77 can be used to observe in advance to ensure the contact conditions of each key point before use, so as to avoid open circuits during testing due to improper installation of the spring.
[0090] The above are all preferred embodiments of the present application, and are not intended to limit the scope of protection of the present application. Therefore, any equivalent changes made based on the structure, shape, and principle of the present application should be included in the scope of protection of the present application.
Claims
1. A CT automatic short-circuit and open-circuit prevention contact structure, characterized by: The invention comprises a first reed (1), a second reed (2) and a third reed (3), wherein the first reed (1) comprises a first contact portion (11), the second reed (2) comprises a second contact portion (21), an extension portion (23) and a third contact portion (24), and the third reed (3) comprises a fourth contact portion (31), the third contact portion (24) being arranged adjacent to a test socket relative to the second contact portion (21), the fourth contact portion (31) being arranged adjacent to the test socket relative to the third contact portion (24), and the fourth contact portion (31) and the third contact portion (24) being arranged on the same side; The first contact portion (11) and the second contact portion (21) are arranged in contact with each other and can be isolated by a test plug; The third contact portion (24) and the fourth contact portion (31) are used to contact the short-circuit contact piece of the test plug; At least two groups of the first reed (1), the second reed (2) and the third reed (3) are provided, and adjacent third reeds (3) are connected via a connecting member (4); The first contact portion (11) comprises a first protruding section (111), a first straight arm section (112) and a first bent section (113); the first protruding section is connected to the first straight arm section (112); the first straight arm section (112) is connected to the first bent section (113); and the first bent section (113) is used to contact the second contact portion (21).
2. The CT automatic short-circuit and open-circuit prevention contact structure according to claim 1, characterized in that: The second contact portion (21) includes a second protruding section (211), the extending portion (23) includes a second straight arm section (231), and the third contact portion (24) includes a second bent section (241). The second protruding section (211) is connected to the second straight arm section (231), and the second straight arm section (231) is connected to the second bent section (241). The second protruding section (211) is used to contact the first contact portion (11), and the second bent section (241) is used to contact the short-circuit contact piece of the test plug.
3. The CT automatic short-circuit and open-circuit prevention contact structure according to claim 2, characterized in that: The fourth contact portion (31) includes a third bent section (311), the third bent section (311) is used to contact the short-circuit contact piece of the test plug, the contact point of the second bent section (241) is arranged through the center line of the test socket insertion direction, and the third bent section (311) is arranged adjacent to the center line of the test socket insertion direction.
4. The CT automatic short-circuit and open-circuit prevention contact structure according to claim 1, characterized in that: The third spring (3) is provided with a connection port (33), and the connecting member (4) includes a short-circuit plug (41). The short-circuit plug (41) passes through two adjacent connection ports (33) and is tightly fitted.
5. The CT automatic short-circuit and open-circuit prevention contact structure according to claim 1, characterized in that: The connecting member (4) comprises a connecting piece (42), and the connecting piece (42) is integrally formed with the two adjacent third spring pieces (3).
6. A socket for mounting the CT automatic short-circuit and open-circuit prevention contact structure according to any one of claims 1 to 5, characterized in that: The invention comprises a shell (7) and an upper cover (8), wherein the upper cover (8) and the shell (7) are detachably connected, the first spring (1), the second spring (2) and the third spring (3) are all installed in the shell (7), the connecting member (4) can be inserted into the shell (7), one end of the shell (7) is provided with an insertion port (71) for inserting a test plug, the other end of the shell (7) is provided with a connecting groove (72) for exposing the first spring (1) and the second spring (2), the shell (7) is provided with a fastening bolt (73) for tightening the exposed parts of the first spring (1) and the second spring (2), and the upper cover (8) is provided with a positioning protrusion (74).
7. The socket according to claim 6, characterized in that: The housing (7) is provided with a first observation port (75), a second observation port (76) and a third observation port (77); the first observation port (75) is arranged opposite to the contact point of the first contact portion (11) and the second contact portion (21); the second observation port (76) is arranged opposite to the contact point of the third contact portion (24) and the short-circuit contact piece of the test plug; and the third observation port (77) is arranged opposite to the third spring (3).
8. A plug, applied to the CT automatic short-circuit and open-circuit prevention contact structure according to any one of claims 1 to 5, characterized in that: The invention comprises an insulating base (51), a first conductive contact piece (52) and a second conductive contact piece (53), wherein the first conductive contact piece (52) and the second conductive contact piece (53) are respectively installed on both sides of the insulating base (51); when the insulating base (51) is inserted into place, the first conductive contact piece (52) contacts the first contact portion (11), the second contact portion (21) contacts the side of the insulating base (51) facing away from the first conductive contact piece (52), the third contact portion (24) and the fourth contact portion (31) both contact the second conductive contact piece (53), and the first conductive contact piece (52) and the second conductive contact piece (53) are both connected to a test plug (55).
9. The plug according to claim 8, characterized in that: The end of the first conductive contact piece (52) is bent and wound around the side of the insulating base (51) to install the second conductive contact piece (53). A space for the second contact portion (21) to contact the insulating base (51) is reserved between the bent end of the first conductive contact piece (52) and the second conductive contact piece (53). An identification protrusion (54) is provided on the top of the device external connection end of the insulating base (51), and the two side surfaces of the insertion end of the insulating base (51) are inclined in a direction close to each other.
Citation Information
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