Method for detecting thickness of lamellar structure of titanium alloy

CN120101658APending Publication Date: 2025-06-06AVIC BEIJING INST OF AERONAUTICAL MATERIALS
View PDF 2 Cites 0 Cited by

Patent Information

Application Number
CN202510178047.5
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-18
Publication Date
2025-06-06

AI Technical Summary

Technical Problem

In the prior art, when detecting the tissue thickness of titanium alloy sheets, there are problems such as limited measurement accuracy, complex sample preparation and high cost, and there is a lack of suitable quantitative detection methods.

Method used

Using scanning electron microscope (SEM) combined with image analysis software Image-Pro Plus, the thickness of the sheets of each phase of the titanium alloy sheet was calculated and fitted by corrosion and observation of titanium alloy samples.

Benefits of technology

The accurate analysis of the thickness of the titanium alloy sheet layer is achieved, the detection accuracy and data analysis are improved, and it is suitable for thickness measurement of different sheet layer tissues.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure HDA0005276158290000011
    Figure HDA0005276158290000011
  • Figure HDA0005276158290000012
    Figure HDA0005276158290000012
  • Figure HDA0005276158290000021
    Figure HDA0005276158290000021
Patent Text Reader

Abstract

The invention provides a titanium alloy lamellar structure thickness detection method. According to the method, the SEM method is combined with image analysis software Image-Pro Plus to research the titanium alloy lamellar thickness detection method, accurate analysis of the lamellar thickness is achieved, the method is suitable for thickness measurement of different lamellar structures of titanium alloy, the testing process is detailed, and the testing result is high in accuracy. According to the method for detecting the thickness of the titanium alloy lamellar structure, the detailed detection process of the lamellar structure can be defined, the accuracy and accuracy of data analysis can be effectively improved, and the method can also be suitable for thickness measurement and analysis of other materials with the lamellar structure.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The invention belongs to the technical field of titanium alloy lamella tissue thickness measurement and relates to a method for detecting the titanium alloy lamella tissue thickness. Background Art

[0002] Titanium alloy has shown its unique advantages in many fields with its excellent performance. It has the characteristics of high strength and low density, making it a key material for reducing structural weight and improving fuel efficiency in the aerospace field. It is widely used in aircraft structural parts and engine components. The thickness of the lamellar structure of titanium alloy has a significant effect on its mechanical properties. The measurement of the thickness of the lamellar structure of titanium alloy is crucial to understanding and controlling the mechanical properties of the alloy. According to research, titanium alloys with lamellar structure can obtain excellent fracture toughness and crack growth resistance after proper heat treatment. For example, the equiaxed or bimodal structure obtained by TC4 titanium alloy after solution treatment in the two-phase region has good room temperature tensile properties, while the lamellar structure obtained by solution treatment in the β phase region shows better fracture toughness. By controlling the cooling rate during solution treatment in the β phase region and the temperature and cooling rate during the second heat treatment, α lamellar structures of different thicknesses can be obtained, thereby improving the fracture toughness of the alloy. In addition, the study of TA32 titanium alloy thick plate also shows that microstructure and texture have a significant effect on tensile properties. The tensile strength and plasticity of the plate are lower than those in other directions, which is mainly related to the directionality of the microstructure. After the plate is rolled, the lath α phase will show directionality, that is, the lath α phase or α sheet bundle will be distributed along a specific direction, thus affecting the mechanical properties of the material. Therefore, how to correctly detect the thickness of the titanium alloy lamellar structure has important engineering significance and economic value.

[0003] There are many methods for detecting the thickness of titanium alloy lamellar tissue at present, and each method has its own advantages and limitations. For example, the metallographic microscope method prepares metallographic samples and uses a metallographic microscope to observe and measure the lamellar tissue. This method is intuitive and low-cost, but the measurement accuracy is limited by the operator's experience and the resolution of the microscope. Transmission electron microscopy (TEM) can provide atomic-level resolution and is suitable for observing nano-level lamellar tissue, but the sample preparation process of TEM is very complicated, costly, and has strict requirements on the thickness of the sample. The prior art also discloses some corresponding technical solutions, such as the Chinese patent with publication number CN109207893 discloses a heat treatment method for obtaining different lamellar thicknesses of TC21 titanium alloy, and obtains different lamellar thicknesses of TC21 titanium alloy by adjusting the cooling rate, but does not involve quantitative detection of lamellar thickness. The Chinese patent with publication number CN109504875 discloses a heat treatment method for obtaining different levels of high-performance titanium alloy tissue, heating the TC4 titanium alloy to a temperature above the β phase transition point, and obtaining different lamellar thickness α tissues at 10 cooling rates, but does not involve a detailed lamellar thickness detection method. Chinese patent with publication number CN117418125 discloses a titanium alloy with fine lamellar structure and its powder metallurgy process. The fine lamellar structure is obtained by adjusting and optimizing the composition and its process, but no detailed description is given on how to detect the thickness of the lamellar structure. Chinese patent with publication number CN102156184 discloses a method for predicting the lamellar spacing of eutectic structure of aluminum-silicon alloy. The numerical simulation method is used to predict the lamellar spacing of eutectic structure of aluminum-silicon alloy, but the actual measurement of lamellar thickness is not involved. Chinese patent with publication number CN108893692 discloses a hot deformation method for obtaining equiaxed structure by controlling the initial lamellar phase thickness of titanium alloy. The lamellar phase thickness of titanium alloy at different cooling rates is measured by optical microscope, but the method for measuring lamellar thickness is not detailed.

[0004] Therefore, how to find a more suitable detection method to solve the above-mentioned defects of the existing detection methods has important engineering significance and economic value, and is also one of the focuses of widespread attention of researchers in the industry. Summary of the invention

[0005] In view of this, the technical problem to be solved by the present invention is to provide a method for detecting the thickness of titanium alloy lamellae. The present invention uses the SEM method combined with the image analysis software Image-Pro Plus to study the method for detecting the thickness of titanium alloy lamellae, and realizes the accurate analysis of the lamellae thickness. The method is suitable for measuring the thickness of different lamellae of titanium alloy, the test process is relatively detailed, and the test results are highly accurate.

[0006] The present invention provides a method for detecting the thickness of a titanium alloy sheet structure, comprising the following steps:

[0007] 1) After the titanium alloy sample to be tested is corroded, it is observed to obtain the macroscopic structure morphology of the sample to be tested;

[0008] The macroscopic structure morphology includes grains, grain boundaries and lamellar structures;

[0009] 2) Fixing the sample to be tested obtained in the above steps on a sample holder, and observing the lamellar structure and grains of the sample to be tested using a scanning electron microscope in a secondary electron imaging mode;

[0010] The observation of the lamellae tissue comprises observing the lamellae tissue at multiple times;

[0011] The observation of the crystal grains comprises observing the crystal grains in at least 50 different observation fields to obtain at least 50 SEM images;

[0012] 3) Combined with the observation of the lamellar structure, the lamellar thickness statistics are performed on the SEM images obtained in the above steps, and the lamellar thickness of each phase of the titanium alloy lamellar is obtained after calculation and fitting by software.

[0013] Preferably, the titanium alloy sample to be tested is a titanium alloy sample whose surface has been ground and polished;

[0014] The state of the titanium alloy includes a cast state or a hot isostatic pressing state.

[0015] Preferably, the corroding comprises etching with a corrosive agent;

[0016] The corrosion time is 5 to 20 seconds.

[0017] Preferably, the observation in step 1) is performed using a stereo microscope;

[0018] The step 1) also includes a step of counting the number of grains in the observation area.

[0019] Preferably, the specific steps of observing the lamellae tissue include:

[0020] Use secondary electron imaging mode for observation, adjust the acceleration voltage and beam spot value, and adjust the object probe distance. First observe the overall morphology of the entire sample at a low magnification, and then gradually increase the magnification according to the area to be observed to observe the fine structure morphology.

[0021] Preferably, the lamellar structure of the sample to be tested includes the microscopic morphology of the lamellar structure components of each phase of the sample to be tested.

[0022] Preferably, the observation of the grains is specifically to observe each grain in combination with the macroscopic structure morphology in step 1);

[0023] The crystal grains are observed at a magnification of 1000 to 2000 times.

[0024] Preferably, performing lamella thickness statistics on the SEM images includes, for each SEM image, using Image-Pro Plus software to perform statistics on the lamella thickness of each observation field;

[0025] The fixing method includes fixing the sample to be tested on the sample holder by using a conductive adhesive material.

[0026] Preferably, the software performs calculations in a specific manner including: drawing a straight line in the vertical direction of the same lamella orientation, testing at least 10 positions of different thicknesses on each SEM image until all lamellae are included, and then measuring the thickness of the α-phase and β-phase lamellae on each line respectively by using Image-Pro Plus software;

[0027] The fitting method is a mean value fit.

[0028] Preferably, after obtaining the lamella thickness of each phase of the titanium alloy lamella, the method further includes a step of analyzing the statistical results to obtain one or more of the distribution range, average thickness and lamella thickness distribution diagram of each phase.

[0029] The present invention provides a method for detecting the thickness of titanium alloy lamellar tissue, comprising the following steps: first, corroding the titanium alloy sample to be tested, and then observing it to obtain the macroscopic tissue morphology of the sample to be tested; the macroscopic tissue morphology includes grains, grain boundaries and lamellar tissue; then fixing the sample to be tested obtained in the above steps on a sample holder, using a scanning electron microscope, using a secondary electron image mode, to observe the lamellar tissue and grains of the sample to be tested; the observation of the lamellar tissue includes observing the lamellar tissue at multiple times; the observation of the grains includes observing the grains in at least 50 different observation fields, and obtaining at least 50 SEM images; finally, combined with the observation of the lamellar tissue, the SEM images obtained in the above steps are statistically analyzed for the lamellar thickness, and the lamellar thickness of each phase of the titanium alloy lamellar is obtained after calculation and fitting by software. Compared with the prior art, the present invention believes that compared with the above detection method disclosed in the prior art, the scanning electron microscope (SEM) can provide higher resolution and depth field, which is suitable for observing and measuring the details of the lamellar tissue. Therefore, it is a more effective research direction to invent and study a detailed detection method based on SEM technology to conduct statistics and analysis on the lamellar structure of titanium alloy materials.

[0030] Based on this, the present invention particularly designs a method for detecting the thickness of titanium alloy lamellae with specific steps and methods. The present invention uses the SEM method in combination with the image analysis software Image-Pro Plus to study the method for detecting the thickness of titanium alloy lamellae, and realizes the accurate analysis of the lamellae thickness. The method is suitable for measuring the thickness of different lamellae of titanium alloy, the test process is relatively detailed, and the test results are highly accurate.

[0031] The method for detecting the thickness of titanium alloy lamellar structure provided by the present invention can clarify the detailed detection process of the lamellar structure, and can also effectively improve the precision and accuracy of data analysis, and the method can also be applied to the thickness measurement and analysis of other materials with lamellar structure. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 A macroscopic microstructure image of the cast TC4 titanium alloy provided in Example 1 of the present invention;

[0033] Figure 2 This is a SEM morphology image of the cast TC4 titanium alloy provided in Example 1 of the present invention;

[0034] Figure 3 A schematic diagram of a method for testing the thickness of a cast TC4 titanium alloy sheet provided in Example 1 of the present invention;

[0035] Figure 4 The thickness distribution diagram of the α-phase layer of the cast TC4 titanium alloy provided in Example 1 of the present invention;

[0036] Figure 5 The thickness distribution diagram of the β-phase layer of the cast TC4 titanium alloy provided in Example 1 of the present invention;

[0037] Figure 6 A macroscopic microstructure image of the hot isostatically pressed TC4 titanium alloy provided in Example 2 of the present invention;

[0038] Figure 7 This is a thickness distribution diagram of the α-phase sheet layer of the hot isostatically pressed TC4 titanium alloy provided in Example 2 of the present invention;

[0039] Figure 8 This is a thickness distribution diagram of the β phase layer of the hot isostatically pressed TC4 titanium alloy provided in Example 2 of the present invention. DETAILED DESCRIPTION

[0040] In order to further understand the present invention, preferred embodiments of the present invention are described below in conjunction with examples, but it should be understood that these descriptions are only for further illustrating the features and advantages of the present invention rather than limiting the patent claims of the present invention.

[0041] All noun expressions and abbreviations in the present invention are conventional noun expressions and abbreviations in the field. Each noun expression and abbreviation is clear and unambiguous in its relevant application field. Those skilled in the art can clearly, accurately and uniquely understand them based on the noun expressions and abbreviations.

[0042] The present invention provides a method for detecting the thickness of a titanium alloy sheet structure, comprising the following steps:

[0043] 1) After the titanium alloy sample to be tested is corroded, it is observed to obtain the macroscopic structure morphology of the sample to be tested;

[0044] The macroscopic structure morphology includes grains, grain boundaries and lamellar structures;

[0045] 2) Fixing the sample to be tested obtained in the above steps on a sample holder, and observing the lamellar structure and grains of the sample to be tested using a scanning electron microscope in a secondary electron imaging mode;

[0046] The observation of the lamellae tissue comprises observing the lamellae tissue at multiple times;

[0047] The observation of the crystal grains comprises observing the crystal grains in at least 50 different observation fields to obtain at least 50 SEM images;

[0048] 3) Combined with the observation of the lamellar structure, the lamellar thickness statistics are performed on the SEM images obtained in the above steps, and the lamellar thickness of each phase of the titanium alloy lamellar is obtained after calculation and fitting by software.

[0049] The present invention first corrodes the titanium alloy sample to be tested, and then observes it to obtain the macroscopic structure morphology of the sample to be tested;

[0050] The macroscopic structure morphology includes grains, grain boundaries and lamellar structures.

[0051] In the present invention, the titanium alloy sample to be tested is preferably a titanium alloy sample whose surface has been ground and polished.

[0052] In the present invention, the state of the titanium alloy preferably includes a cast state or a hot isostatic pressing state.

[0053] In the present invention, the etching preferably includes etching with a corrosive agent.

[0054] In the present invention, the corrosion time is preferably 5 to 20 seconds, more preferably 8 to 17 seconds, and more preferably 11 to 14 seconds.

[0055] In the present invention, the observation in step 1) is preferably performed using a stereo microscope.

[0056] In the present invention, the step 1) preferably further includes a step of counting the number of grains in the observation area.

[0057] In the present invention, the specific steps of observing the lamellae tissue preferably include:

[0058] Use secondary electron imaging mode for observation, adjust the acceleration voltage and beam spot value, and adjust the object probe distance. First observe the overall morphology of the entire sample at a low magnification, and then gradually increase the magnification according to the area to be observed to observe the fine structure morphology.

[0059] In the present invention, the lamellar structure of the sample to be tested preferably includes the microscopic morphology of the lamellar structure components of each phase of the sample to be tested.

[0060] The present invention then fixes the sample to be tested obtained in the above steps on a sample holder, and uses a scanning electron microscope and a secondary electron imaging mode to observe the lamellae and grains of the sample to be tested;

[0061] The observation of the lamellae tissue comprises observing the lamellae tissue at multiple times;

[0062] The observation of the crystal grains includes observing the crystal grains in at least 50 different observation fields to obtain at least 50 SEM images.

[0063] In the present invention, the observation of the crystal grains is preferably performed by observing each crystal grain in combination with the macroscopic structural morphology in step 1).

[0064] In the present invention, the crystal grains are observed at a magnification of preferably 1000 to 2000 times, more preferably 1200 to 1800 times, and even more preferably 1400 to 1600 times.

[0065] Finally, the present invention combines the observation of the lamella structure, performs lamella thickness statistics on the SEM images obtained in the above steps, and obtains the lamella thickness of each phase of the titanium alloy lamella after calculation and fitting by software.

[0066] In the present invention, performing lamella thickness statistics on the SEM images preferably includes, for each SEM image, using Image-Pro Plus software to perform lamella thickness statistics on each observation field.

[0067] In the present invention, the fixing method preferably includes fixing the sample to be tested on the sample holder using a conductive adhesive material.

[0068] In the present invention, the specific method of the software for calculation preferably includes: drawing a straight line in the vertical direction of the same lamella orientation, testing at least 10 positions of different thicknesses on each SEM image until all lamella tissues are included, and then measuring the thickness of the α-phase and β-phase lamellae on each line respectively by Image-Pro Plus software.

[0069] In the present invention, the fitting method is preferably average value fitting.

[0070] In the present invention, after obtaining the lamella thickness of each phase of the titanium alloy lamella, the method preferably further includes a step of analyzing the statistical results to obtain the distribution range and average thickness of the lamella thickness of each phase.

[0071] In the present invention, after obtaining the lamella thickness of each phase of the titanium alloy lamella, it is preferred to further include a step of analyzing the statistical results to obtain one or more of the distribution range, average thickness and lamella thickness distribution diagram of each phase.

[0072] The present invention is to complete and refine the overall detection method, better realize the effective detection and accurate analysis of the thickness of the titanium alloy lamellar tissue, and further improve the accuracy and stability of the detection method. The above-mentioned detection method of the thickness of the titanium alloy lamellar tissue can specifically include the following contents:

[0073] A method for detecting the thickness of a titanium alloy sheet mainly comprises the following steps:

[0074] 1. Perform electric spark wire cutting on titanium alloy samples of the same state to obtain samples of specified size.

[0075] 2. The titanium alloy sample to be tested is subjected to grinding and polishing and then corrosion. After corrosion, the macroscopic morphology of the sample to be tested is observed using a stereo microscope.

[0076] 3. Fix the sample to be tested on a special stage and place it in the SEM to observe the microstructure between different grains.

[0077] 4. Set the acceleration voltage and beam spot value, use the secondary electron imaging mode for observation, and observe the slice tissue in different areas at different magnifications.

[0078] 5. Observe each grain of each sample, and select at least 50 different observation fields for each grain (at least 50 2000X SEM images).

[0079] 6. Perform lamella thickness statistics on each SEM image. Draw a straight line in the vertical direction of the same lamella orientation. Test at least 10 positions of different thicknesses on each SEM image until all lamellae are included. Use Image-Pro Plus software to measure the thickness of the α-phase and β-phase lamellae on each line, and then take the average value.

[0080] 7. Analyze the statistical results, determine the distribution range and average thickness of the α-phase and β-phase lamellae thickness, and obtain the lamellae thickness distribution map.

[0081] The above content of the present invention provides a method for detecting the thickness of titanium alloy lamellar tissue. The present invention uses the SEM method combined with the image analysis software Image-Pro Plus to study the detection method of titanium alloy lamellar thickness, and realizes the accurate analysis of lamellar thickness. The method is suitable for measuring the thickness of different lamellar tissues of titanium alloy, the test process is relatively detailed, and the test result is highly accurate.

[0082] The method for detecting the thickness of titanium alloy lamellar structure provided by the present invention can clarify the detailed detection process of the lamellar structure, and can also effectively improve the precision and accuracy of data analysis, and the method can also be applied to the thickness measurement and analysis of other materials with lamellar structure.

[0083] In order to further illustrate the present invention, a method for detecting the thickness of a titanium alloy lamellar structure provided by the present invention is described in detail below in combination with embodiments. However, it should be understood that these embodiments are implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are given only to further illustrate the features and advantages of the present invention, rather than to limit the claims of the present invention. The protection scope of the present invention is not limited to the following embodiments.

[0084] Example 1

[0085] The method for detecting the thickness of the gold α / β phase layer of the cast TC4 titanium alloy comprises the following steps:

[0086] (1) The original cast TC4 titanium alloy plate was cut by electric spark wire cutting to obtain a sample with a size of 7 mm × 8 mm × 10 mm. During the cutting process, care should be taken to avoid overheating and prevent contamination of the sample.

[0087] (2) The surface of the sample in (1) was ground using 240# to 3000# sandpaper and polished using a polishing agent with a particle size of 1.5 μm to make the surface of the sample smooth and meet the corrosion requirements.

[0088] (3) The sample in (2) was corroded, and the composition of the corrosive agent was HF:HNO 3 :H2 O=2:3:95, the etching method is immersion, the etching time is 5 to 20s, clamp the sample with a clamp, with the polished surface facing up, immerse it in the corrosive agent, and gently shake the sample until the surface of the sample changes color, take out the sample, rinse it under running water for 30 to 60s, rinse it with alcohol and blow dry it with an electric hair dryer to eliminate the corrosion tendency of residual acid on the microscope lens.

[0089] (4) After the corrosion test, there should be no sample processing stress, strain and water marks in the observed area of ​​the sample surface. The microstructure is clear. The macroscopic structure of the sample is observed using a stereo microscope. It can be clearly seen that the macroscopic structure of the sample is composed of different grains, grain boundaries and lamellar structures. The number of grains in the observed area is counted. The results are as follows: Figure 1 As shown, Figure 1 This is a low-magnification microstructure image of the cast TC4 titanium alloy provided in Example 1 of the present invention.

[0090] (5) Use SEM to observe the microscopic morphology of the sample. During the observation process, use conductive glue to fix the sample on the sample holder to ensure that the sample has a good conductive state. Use secondary electron imaging mode for observation, adjust the acceleration voltage and beam spot value appropriately, and adjust the object probe distance. Observe the overall morphology of the entire sample at a lower magnification, and then gradually increase the magnification according to the area to be observed, and carefully observe the fine structure morphology. SEM microstructure such as Figure 2 As shown, Figure 2 This is the SEM morphology of the cast TC4 titanium alloy provided in Example 1 of the present invention. Figure 2 In the figure, the microstructure of the cast TC4 titanium alloy is mainly composed of alternating α-phase and β-phase lamellae, in which the gray is the α-phase and the white is the β-phase.

[0091] (6) Based on the observation results of (4), each grain was observed using SEM. The magnification of the SEM was set to 2000X, and then different areas of the same grain were observed. At least 50 different observation fields (at least 50 2000X SEM images) were selected for each grain, and the thickness of the lamellae in each field was counted using Image-Pro Plus software.

[0092] (7) When calculating the thickness of the lamellae, draw a straight line in the vertical direction of the same lamella orientation. Test at least 10 positions of different thicknesses on each SEM image until all lamellae are included. Then, use Image-Pro Plus software to measure the thickness of the α-phase and β-phase lamellae on each line, and then take the average value. The lamella thickness test method is shown in Figure 3 , Figure 3 Schematic diagram of the method for testing the thickness of cast TC4 titanium alloy sheets provided in Example 1 of the present invention.

[0093] (8) The statistical results were analyzed to determine the distribution range and average thickness of the α-phase and β-phase sheets. The test results of the α-phase sheet thickness are shown in Figure 4 , the thickness of the β-phase layer is shown in Figure 5 . Figure 4 This is a thickness distribution diagram of the α phase layer of the cast TC4 titanium alloy provided in Example 1 of the present invention. Figure 5 This is a thickness distribution diagram of the β phase layer of the cast TC4 titanium alloy provided in Example 1 of the present invention.

[0094] Example 2

[0095] The method for detecting the thickness of the gold sheet layer of the hot isostatically pressed TC4 titanium alloy is the same as that of Example 1, and the test results are as follows:

[0096] Low magnification microscopy of hot isostatically pressed TC4 titanium alloy Figure 6 , Figure 6 This is a macroscopic microstructure image of the hot isostatically pressed TC4 titanium alloy provided in Example 2 of the present invention. The test results of the α-phase layer thickness are shown in Figure 7 , Figure 7 This is the thickness distribution diagram of the α-phase layer of the hot isostatically pressed TC4 titanium alloy provided in Example 2 of the present invention. Figure 7 It can be seen that in this state, the thickness of the α phase layer is distributed between 0 and 20 μm, most of which are within 5 μm, and the fraction within the range of 0 to 0.5 μm is 44.3%, with a final average thickness of 2.97 μm.

[0097] The thickness of the β-phase layer is shown in Figure 8 , Figure 8 This is a thickness distribution diagram of the β phase layer of the hot isostatically pressed TC4 titanium alloy provided in Example 2 of the present invention. Figure 8 In the experiment, the thickness of the β-phase layer is distributed between 0 and 5 μm, most of which is within 1 μm, the fraction within the range of 0 to 0.5 μm is 52.1%, and the final average thickness is 0.694 μm.

[0098] The above is a detailed introduction to a method for detecting the thickness of a titanium alloy lamellar structure provided by the present invention. The principles and implementation methods of the present invention are described in this article using specific examples. The description of the above embodiments is only used to help understand the method of the present invention and its core ideas, including the best mode, and also enables any technician in the field to practice the present invention, including manufacturing and using any device or system, and implementing any combined method. It should be pointed out that for ordinary technicians in this technical field, without departing from the principle of the present invention, the present invention can also be improved and modified in several ways, and these improvements and modifications also fall within the scope of protection of the claims of the present invention. The scope of patent protection of the present invention is defined by the claims and may include other embodiments that can be thought of by those skilled in the art. If these other embodiments have structural elements that are not different from the textual expression of the claims, or if they include equivalent structural elements that are not substantially different from the textual expression of the claims, then these other embodiments should also be included in the scope of the claims.

Claims

1. A method for detecting the thickness of titanium alloy lamellar tissue, characterized in that: The following steps are involved: 1) After the titanium alloy sample to be tested is corroded, it is observed to obtain the macroscopic structure morphology of the sample to be tested; The macroscopic structure morphology includes grains, grain boundaries and lamellar structures; 2) Fixing the sample to be tested obtained in the above steps on a sample holder, and observing the lamellar structure and grains of the sample to be tested using a scanning electron microscope in a secondary electron imaging mode; The observation of the lamellae tissue comprises observing the lamellae tissue at multiple times; The observation of the crystal grains comprises observing the crystal grains in at least 50 different observation fields to obtain at least 50 SEM images; 3) Combined with the observation of the lamellar structure, the lamellar thickness statistics are performed on the SEM images obtained in the above steps, and the lamellar thickness of each phase of the titanium alloy lamellar is obtained after calculation and fitting by software.

2. The detection method according to claim 1, characterized in that: The titanium alloy sample to be tested is specifically a titanium alloy sample whose surface has been ground and polished; The state of the titanium alloy includes a cast state or a hot isostatic pressing state.

3. The detection method according to claim 1, characterized in that: The corrosion includes etching with a corrosive agent; The corrosion time is 5 to 20 seconds.

4. The detection method according to claim 1, characterized in that: The observation in step 1) is specifically performed using a stereo microscope; The step 1) also includes a step of counting the number of grains in the observation area.

5. The detection method according to claim 1, characterized in that: The specific steps of observing the sheet tissue include: Use secondary electron imaging mode for observation, adjust the acceleration voltage and beam spot value, and adjust the object probe distance. First observe the overall morphology of the entire sample at a low magnification, and then gradually increase the magnification according to the area to be observed to observe the fine structure morphology.

6. The detection method according to claim 1, characterized in that: The lamellar structure of the sample to be tested includes the microscopic morphology of the lamellar structure of each phase of the sample to be tested.

7. The detection method according to claim 1, characterized in that: The observation of the crystal grains is specifically to observe each crystal grain in combination with the macroscopic structure morphology in step 1); The crystal grains are observed at a magnification of 1000 to 2000 times.

8. The detection method according to claim 1, characterized in that: The lamella thickness statistics of the SEM images include, for each SEM image, using Image-Pro Plus software to count the lamella thickness of each observation field; The fixing method includes fixing the sample to be tested on the sample holder by using a conductive adhesive material.

9. The detection method according to claim 1, characterized in that: The specific method of calculation by the software includes: drawing a straight line in the vertical direction of the same lamella orientation, testing at least 10 positions of different thicknesses on each SEM image until all lamella tissues are included, and then measuring the thickness of the α-phase and β-phase lamellae on each line respectively by Image-Pro Plus software; The fitting method is a mean value fit.

10. The detection method according to claim 1, characterized in that: After obtaining the lamella thickness of each phase of the titanium alloy lamella, the method further includes analyzing the statistical results to obtain one or more of the distribution range, average thickness and lamella thickness distribution diagram of each phase.

Citation Information

Patent Citations

  • Quantitative analysis method for martensitic structure in S30432 boiler tube

    CN107290379A

  • Method for measuring beta-phase transition temperature in titanium alloy by adopting scanning electron microscope

    CN117451773A