Clamping tool for transistor double-pulse test

Abstract

The invention discloses a transistor double-pulse test clamping tool, and relates to the field of transistor electrical performance measurement, the transistor double-pulse test clamping tool comprises a housing, a rotating disc is rotatably connected in the housing, the surface of the rotating disc is annularly connected with clamping boxes at intervals, the clamping boxes are provided with accommodating grooves for accommodating transistors, and the accommodating grooves are used for accommodating the transistors. The device comprises a shell, a containing groove is formed in the shell, a clamping structure used for clamping a transistor is installed in the shell, a test assembly capable of moving relative to the transistor is fixedly installed in the shell, the device further comprises a deflector rod used for pushing the transistor into the containing groove, and the device further comprises a conveying table used for conveying the transistor in the direction of the deflector rod. According to the invention, after the transistor is conveyed onto the turntable through the conveying mechanism, the transistor is detected by the gravity of the transistor and the positioning of the fixing mechanism and by utilizing the contact between the pin and the conducting strip in the rotating process of the turntable, and the detected transistor falls off along with the continuous rotation of the turntable; the double-pulse test of the transistor can be continuously and efficiently carried out.

Description

Technical Field

[0001] The invention relates to the field of transistor electrical performance measurement, in particular to a clamping tool for a transistor double pulse test. Background Art

[0002] Double pulse test is a common test for analyzing the dynamic characteristics of power switching devices. Double pulse test can conveniently evaluate the performance of power devices, obtain the main parameters in steady state and dynamic process, better evaluate device performance, optimize drive design, etc.

[0003] A Chinese patent with relevant announcement number CN212845740U discloses a tool for double pulse testing, including a conductive plate group, a mounting assembly for fixing an insulated gate bipolar transistor, a plurality of electrolytic capacitor assemblies and a position adjustment assembly for fixing the electrolytic capacitor assembly; the electrolytic capacitor assembly includes a plurality of electrolytic capacitors; the conductive plate group includes a first plate member and a second plate member insulated from each other, the first plate member is fixedly connected to the second plate member, the first plate member and the second plate member are respectively provided with a plurality of first fixing positions for electrically connecting to the electrolytic capacitors, the first plate member and the second plate member are respectively provided with a plurality of second fixing positions for electrically connecting to the insulated gate bipolar transistors, the electrolytic capacitors are detachably connected to the first fixing positions, and the insulated gate bipolar transistors are electrically connected to the second fixing positions.

[0004] With respect to the above-mentioned related technologies, the existing tooling for transistor double pulse testing requires that transistors be plugged in and installed into the tooling one by one, and then the transistors are tested uniformly. Plugging in and out transistors one by one often wastes a lot of time. At the same time, when a certain transistor is measured to not meet the quality requirements, the transistors that do not meet the quality requirements need to be pulled out and classified separately. It is easy to misclassify or miss a transistor when selecting unqualified transistors from a row of transistors. In summary, the existing transistor testing tooling is not easy to perform double pulse tests on transistors continuously. Summary of the invention

[0005] Based on this, the purpose of the present invention is to provide a clamping fixture for a transistor double pulse test to solve the technical problem that the existing transistor test fixture is not easy to continuously perform a transistor double pulse test.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a clamping tool for a transistor double pulse test, comprising a shell, a turntable rotatably connected inside the shell, a clamping box connected to the surface of the turntable in an annular interval, a receiving groove for receiving the transistor is provided on the clamping box, and a clamping structure for clamping the transistor is installed inside, a test component capable of relative movement with the transistor is fixedly installed inside the shell, and also includes a lever, which is used to push the transistor into the receiving groove, and also includes a conveying table, which is used to convey the transistor in the direction of the lever, a transfer table is fixed to one side of the shell through a bracket structure, the top surface of the transfer table is flush with the top surface of the conveying table, and when the receiving groove is in a horizontal state, the rotation of the lever can push the transistor at the end of the conveying table into the receiving groove through the transfer table.

[0007] By adopting the above technical solution, after the transistor is sent to the turntable through the conveying mechanism, it is positioned by its own gravity and the fixing mechanism, and the contact between the pins and the conductive sheet is used to detect the transistor during the rotation of the turntable. After the detection, the transistor falls as the turntable continues to rotate, so that the double pulse test of the transistor can be carried out continuously and efficiently.

[0008] The present invention is further configured such that a first annular slide groove is arranged in the clamping box, the first slide groove is coaxial with the turntable, and is slidably connected with an annular sliding column inside, an annular telescopic column is slidably connected inside the sliding column, a compression spring is arranged between the telescopic column and the inner wall of the sliding column, a tension spring is arranged between the end of the first slide groove away from the accommodating groove and the sliding column, before the transistor is tested by the test component, the sliding column can slide toward the direction of the transistor and make the compression spring in a compressed state, and after the transistor is tested by the test component, the sliding column is reset by the tension spring.

[0009] Preferably, the transistor in the accommodating groove is clamped by using the sliding column and the telescopic column in the first sliding groove during the rotation of the turntable.

[0010] The present invention is further configured such that a second annular slide groove is provided on the surface of the clamping box toward the cover body, the end of the sliding column is fixedly connected to a limiting plate, the limiting plate is slidably connected in the second slide groove, and the other end of the sliding column is telescopically connected to a telescopic head toward the direction of the cover body, and a compression spring is also provided between the bottom end of the telescopic head and the inner wall of the sliding column. The cover body is provided with a limiting platform on the movement trajectory of the telescopic head, and the limit platform is provided with an oblique chamfer at one end that first contacts the telescopic head, and an elastic conductive sheet for contacting the transistor pin is fixedly connected in the shell body, and after the telescopic head contacts the limiting platform, the sliding column can move toward the corresponding transistor direction, and the elastic conductive sheet will contact the transistor pin only after the telescopic column contacts the transistor, and when the limiting sheet slides to the end in the second slide groove, the telescopic head can shrink into the sliding column, thereby releasing the limit of the telescopic head by the limiting platform.

[0011] Preferably, the telescopic head can make the sliding post slide toward the transistor before the sliding post is retracted, and cooperate with the inner wall of the accommodating groove to clamp it.

[0012] The present invention is further configured such that the length and width of the receiving groove are respectively greater than the length and width of the transistor.

[0013] As a preferred embodiment, the transistor can enter the receiving groove more smoothly, and the transistor entering the receiving groove is subsequently positioned in the receiving groove by means of the telescopic column and its own gravity.

[0014] The present invention is further configured such that a blocking sheet for blocking the transistor is fixedly connected to the surface of the lever, and the lever and the blocking sheet will not interfere with the cover, the housing and the turntable.

[0015] Preferably, the lever is prevented from being blocked during the rotation process.

[0016] The present invention is further configured such that the shell and the cover are respectively provided with a first offset opening and a second offset opening on the rotation track of the lever, and the rotating disk is provided with through openings at intervals in a ring shape.

[0017] Preferably, when the turntable is rotating and the through opening is aligned with the first offset opening and the second offset opening, the lever can be rotated to pass smoothly.

[0018] The present invention is further configured such that the lever is used to push the transistor in a horizontal state into the receiving groove, and the transistor in the receiving groove will contact the elastic conductive sheet only after being rotated to a vertical state.

[0019] Preferably, the transistor in the vertical state falls due to its own gravity, at which time the transistor is positioned in the vertical direction.

[0020] The present invention is further configured such that the bottom end of the shell is fixedly connected with a discharge channel, the bottom end of the discharge channel is rotatably provided with a guide plate, and the top end of the guide plate can contact two sides of the top end of the discharge channel respectively.

[0021] Preferably, a guide plate is used to separate the two batches of transistors, qualified and unqualified.

[0022] The present invention is further configured such that a dislocation hole for a dislocation telescopic head is provided on one side of the transfer platform close to the turntable.

[0023] Preferably, the offset hole is used to avoid the protruding telescopic head during the rotation of the turntable.

[0024] The present invention is further configured such that a protective edge is provided upwardly on the edge of the top surface of the transfer platform, and the protective edge will not interfere with the rotation of the shifting rod.

[0025] Preferably, the guard edge is used to protect the transistor and prevent the transistor from sliding out of the range of the transfer platform.

[0026] In summary, the present invention mainly has the following beneficial effects:

[0027] 1. The present invention provides a fixing mechanism for automatically fixing transistors during the rotation process on a turntable that rotates in a shell. After the transistor is sent to the turntable via a conveying mechanism, it is positioned by its own gravity and the fixing mechanism. In the process of the rotation of the turntable, the contact between the pins and the conductive sheet is used to detect the transistor. After the detection, the transistor falls as the turntable continues to rotate, so that the double pulse test of the transistor can be carried out continuously and efficiently.

[0028] 2. The present invention arranges a guide plate at the bottom of the housing to sort the different transistors falling from the turntable, so that the transistors with the test results meeting the requirements fall into the qualified product discharge channel, and vice versa, the transistors are discharged from the unqualified product channel;

[0029] 3. The present invention arranges a lever structure at the end of the conveying platform, and uses the lever to push the transistor to the position on the turntable for accommodating the transistor. By controlling the rotation angle of the turntable and the lever, the transistor can be continuously fed into the turntable, and then the double pulse test of the transistor is performed during the rotation of the turntable, and different transistors are classified and discharged;

[0030] 4. The present invention sets a clamping structure in a clamping box along an annular sliding direction. The commutation motion trajectory of the clamping structure is coaxial with the turntable. During the rotation of the turntable, the clamping structure is limited by the upper limit platform on the cover body to clamp the transistor, and automatically releases the clamping of the transistor and resets after sliding to the end of the sliding trajectory. The transistor maintains a rotating state during the clamping process and completes the corresponding double pulse test. When the turntable continues to rotate, the transistor can slide freely from the clamping box due to its own gravity after being released, so that the clamping and unclamping of the transistor are automatically realized, thereby further improving the test efficiency of the transistor. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 A perspective view of the present invention;

[0032] Figure 2 Another perspective view of the present invention;

[0033] Figure 3 A three-dimensional diagram of the cover of the present invention in an open state;

[0034] Figure 4 For the present invention Figure 3 A magnified view of middle;

[0035] Figure 5 An exploded view of the housing and cover of the present invention;

[0036] Figure 6 A three-dimensional diagram of the cover of the present invention;

[0037] Figure 7 A three-dimensional diagram of a turntable of the present invention;

[0038] Figure 8 For the present invention Figure 7 The stereogram of middle B;

[0039] Fig. 9 It is a three-dimensional diagram of the cross-section state of the cover body of the present invention;

[0040] Fig.10 For the present invention Fig. 9 Enlarged view of C in the middle.

[0041] Description of reference numerals:

[0042] 1. Shell; 101. First offset opening; 2. Cover; 201. Second offset opening; 3. Transfer platform; 301. Protective edge; 302. Offset hole; 4. Conveying platform; 5. Push rod; 501. Blocking plate; 6. Turntable; 601. Passing opening; 7. Clamping box; 701. First slide groove; 702. Accommodating groove; 703. Second slide groove; 8. Sliding column; 801. Limiting plate; 9. Telescopic column; 10. Telescopic head; 11. Discharge channel; 12. Guide plate; 13. Elastic conductive sheet; 14. Limiting platform; 15. Conductive ear. DETAILED DESCRIPTION

[0043] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0044] The following describes an embodiment of the present invention based on its overall structure.

[0045] First embodiment:

[0046] A clamping fixture for transistor double pulse test, see Figure 1-10 , including a shell 1, specifically, the shell 1 is in a hollow cylindrical shape, and is provided with an opening on one side and is connected to a disc-shaped cover body 2, a turntable 6 is rotatably connected inside the shell 1, and a clamping box 7 is connected to the surface of the turntable 6 in an annular manner at intervals. Specifically, in this embodiment, the clamping boxes 7 are arranged on the annular surface at an interval of ninety degrees, and a total of four are arranged, and a receiving groove 702 for accommodating a transistor is provided on the clamping box 7, and a clamping structure for clamping the transistor is installed inside, and a test component that can move relative to the transistor is fixedly installed in the shell 1.

[0047] Specifically, an elastic conductive sheet 13 is fixedly installed on the inner wall of the housing 1. The number of the elastic conductive sheets 13 corresponds to the number of transistor pins, and the width of each of the elastic conductive sheets 13 is greater than the width of the transistor pins. After the transistor pins contact the elastic conductive sheets 13, the elastic conductive sheets 13 can produce elastic deformation to ensure that the transistor pins can fully contact the elastic conductive sheets 13 to prevent poor contact. The housing 1 is also provided with conductive ears 15 that connect the various elastic conductive sheets 13. The conductive ears 15 can be connected to the wires when needed.

[0048] It also includes a lever 5, which is used to push the transistor into the accommodating groove 702. Specifically, the lever 5 is rotatably connected to one side of the shell 1, and the axis of the rotating shaft and the axis of the rotating shaft of the turntable 6 are orthogonal to each other when projected to the same plane. Both ends of the lever 5 are fixedly connected with blocking plates 501 for blocking the transistor.

[0049] It also includes a conveyor platform 4, which is used to convey the transistor toward the lever 5. Specifically, a conveyor belt is installed on the conveyor platform 4, and the width of the conveyor belt is the same as the width of the transistor. Protective structures for protecting the transistor are installed on both sides of the conveyor belt to prevent the transistor from falling from the conveyor belt.

[0050] Furthermore, a transfer table 3 is fixed to one side of the shell 1 through a bracket structure. Specifically, the transfer table 3 is a fan-shaped structure, and the top surface of the transfer table 3 is flush with the top surface of the conveying table 4. When the receiving groove 702 is in a horizontal state, the lever 5 can rotate to push the transistor at the end of the conveying table 4 into the receiving groove 702 through the transfer table 3. Another blocking piece 501 on the lever 5 is used to block the next transistor.

[0051] In the above embodiments, please refer to Figure 3-10 A first annular slide groove 701 is provided in the clamping box 7. The first slide groove 701 is coaxial with the turntable 6 and is slidably connected to an annular sliding column 8 inside. An annular telescopic column 9 is slidably connected inside the sliding column 8. The sliding tracks of the sliding column 8 and the telescopic column 9 are both coaxial with the turntable 6.

[0052] Furthermore, a compression spring is arranged between the telescopic column 9 and the inner wall of the sliding column 8, and a tension spring is arranged between the sliding column 8 and the end of the first sliding groove 701 away from the accommodating groove 702. The tension spring is in a stretched state when the sliding column 8 slides toward the transistor. The elastic force of the tension spring is used to reset the sliding column 8. Before the transistor is tested by the test assembly, the sliding column 8 can slide toward the transistor and make the compression spring in a compressed state. Specifically, after the telescopic head 10 is limited by the limit platform 14, the sliding column 8 can be stationary relative to the limit platform 14 and slide in the first sliding groove 701 at the same time.

[0053] Specifically, after the transistor is tested by the test assembly, the telescopic head 10 is retracted, and after the limit platform 14 is released from the limit of the telescopic head 10, the sliding column 8 is reset by the tension spring, and the telescopic column 9 inside the sliding column 8 is also reset. The sliding column 8 and the telescopic column 9 in the first sliding groove 701 are used to clamp the transistor in the accommodating groove 702 during the rotation of the turntable 6.

[0054] In the above embodiments, please refer to Figure 2-3 7-10, a second annular slide groove 703 is provided on the surface of the clamping box 7 toward the cover body 2, the width of the second slide groove 703 is smaller than the first slide groove 701, the end of the sliding column 8 is fixedly connected to a limiting plate 801, and the limiting plate 801 is slidably connected in the second slide groove 703.

[0055] Furthermore, the other end of the sliding column 8 is telescopically connected to a telescopic head 10 in the direction of the cover body 2, the axis of the telescopic head 10 is parallel to the axis of the turntable 6, and a compression spring is also arranged between the bottom end of the telescopic head 10 and the inner wall of the sliding column 8. The cover body 2 is provided with a limit platform 14 on the movement trajectory of the telescopic head 10, and the end of the limit platform 14 that first contacts the telescopic head 10 is provided with an oblique chamfer.

[0056] Specifically, after the telescopic head 10 contacts the limit platform 14, because the turntable 6 is still in a rotating state, the sliding column 8 can move toward the corresponding transistor direction. After the telescopic column 9 contacts the transistor, the elastic conductive sheet 13 will contact the pin of the transistor. The telescopic column 9 pushes the transistor to contact the inner wall of the second slide groove 703, thereby positioning and fixing the transistor.

[0057] As the turntable 6 continues to rotate, after the limiting piece 801 slides to the end in the second slide groove 703, the sliding post 8 cannot continue to slide in the first slide groove 701, but the turntable 6 will still continue to rotate. The telescopic head 10 can now overcome the elastic force of the compression spring, and the telescopic head 10 can retract into the sliding post 8, thereby releasing the limit on the telescopic head 10 by the limiting platform 14. Before the sliding post 8 is retracted, the telescopic head 10 can make the sliding post 8 slide toward the transistor direction and clamp it with the inner wall of the accommodating groove 702. Specifically, in order to achieve that the telescopic head 10 is retracted to the sliding post 8 only after the limiting piece 801 contacts the end of the second slide groove 703, the elastic coefficient of the compression spring corresponding to the telescopic head 10 needs to be large enough to avoid the situation where the telescopic head 10 is retracted before the limiting piece 801 contacts the end of the second slide groove 703.

[0058] In the above embodiments, please refer to Figure 3-8 A blocking sheet 501 for blocking the transistor is fixedly connected to the surface of the lever 5. Specifically, the blocking sheet 501 and the lever 5 are orthogonal to each other. After the lever 5 is rotated to push the transistor into the accommodating groove 702, it can fit the surface of the clamping box 7. The lever 5 and the blocking sheet 501 will not interfere with the cover body 2, the shell 1 and the turntable 6, thereby preventing the lever from being blocked during the rotation process.

[0059] In the above embodiments, please refer to Figure 3-10 The lever 5 is used to push the transistor in a horizontal state into the receiving groove 702. The transistor in the receiving groove 702 will contact the elastic conductive sheet 13 only after it is rotated to a vertical state. The transistor in the vertical state falls due to its own gravity, and the vertical positioning of the transistor is achieved at this time.

[0060] Furthermore, the shell body 1 and the cover body 2 are respectively provided with a first offset opening 101 and a second offset opening 201 on the rotation trajectory of the lever 5, and the turntable 6 is provided with through openings 601 in a ring-shaped interval. When the through opening 601 is aligned with the first offset opening 101 and the second offset opening 201 during the rotation of the turntable 6, the lever 5 can be rotated to pass smoothly. When the turntable 6 rotates to the same horizontal plane as the inner wall of the accommodating groove 702 and the transfer table 3, the rotation will be suspended. At this time, the lever 5 can be rotated to continuously deliver the transistor into the accommodating groove 702 of the clamping box 7.

[0061] Second embodiment:

[0062] A clamping fixture for transistor double pulse test, see Figure 1-10 On the basis of the first embodiment, the difference from the first embodiment is that the length and width of the receiving groove 702 are respectively greater than the length and width of the transistor, so that the transistor can enter the receiving groove 702 more smoothly. The transistor entering the receiving groove 702 is subsequently positioned in the receiving groove 702 by relying on the telescopic column 9 and its own gravity. Specifically, the telescopic column 9 can push the transistor to the inner wall of the receiving groove 702, and cooperate with the inner wall of the receiving groove 702 to fix the transistor.

[0063] In the above embodiments, please refer to Figure 3-10 A dislocation hole 302 for dislocating the telescopic head 10 is provided on one side of the transfer table 3 close to the turntable 6. The dislocation hole 302 is used to avoid the telescopic head 10 protruding during the rotation of the turntable 6. The telescopic head 10 can also pass through the dislocation hole 302 smoothly in the uncontracted state, thereby avoiding the situation where the telescopic head 10 collides with the transfer table 3 when the turntable 6 rotates.

[0064] Furthermore, a protective edge 301 is provided upwardly on the edge of the top surface of the transfer platform 3 . The protective edge 301 will not interfere with the rotation of the lever 5 . The protective edge 301 is used to protect the transistor and prevent the transistor from sliding out of the range of the transfer platform 3 .

[0065] The third embodiment:

[0066] A clamping fixture for transistor double pulse test, see Figure 1-10 On the basis of the second embodiment, the difference from the second embodiment is that the bottom end of the shell 1 is fixedly connected to the discharge channel 11, and the bottom end of the discharge channel 11 is rotatably provided with a guide plate 12, and the top of the guide plate 12 can respectively contact the two sides of the top of the discharge channel 11, and the guide plate 12 is used to separate the qualified and unqualified batches of transistors.

[0067] Specifically, for example, when the transistor obtained from the test is qualified, the guide plate 12 does not rotate, and the transistor falls from the receiving groove 702, slides through the inner wall of the shell 1 to the discharge channel 11, and is discharged from the channel for qualified products. On the contrary, when the transistor is unqualified or there is no accurate test data, the guide plate 12 is in a rotating state during the time period corresponding to the sliding of the transistor. At this time, the top of the guide plate 12 contacts the other end of the top of the discharge channel 11, so that the unqualified transistors or the transistors without accurate experimental data are discharged from the unqualified channel, thereby realizing accurate allocation of the transistors after the double pulse test.

[0068] When the transistor double pulse test clamping tool of the present invention is used, the pins of the transistor face the conveying direction and are conveyed from the conveying platform 4 to the transfer platform 3. After the pins of the transistor are blocked by the blocking sheet 501, the lever 5 rotates to push the transistor into the receiving groove 702, and then the turntable 6 starts to rotate.

[0069] When the through opening 601 is aligned with the first misalignment opening 101 and the second misalignment opening 201, the lever 5 rotates through the housing 1, and the blocking piece 501 at the other end of the lever 5 is in a state of being able to block the transistor;

[0070] When the turntable 6 continues to rotate until the transistor in the receiving groove 702 is in a vertical state, the transistor falls to the bottom of the receiving groove 702 due to its own gravity and contacts the inner wall of the receiving groove 702. During the rotation of the turntable 6, the telescopic head 10 moves relative to the limit platform 14 until it contacts the limit platform 14. At this time, the telescopic head 10 needs to overcome the elastic force of the compression spring to be retracted into the sliding column 8, and the sliding column 8 has a small resistance to sliding in the first sliding groove 701, thereby realizing the sliding of the sliding column 8 toward the transistor. After contacting the transistor, the telescopic column 9 contracts into the sliding column 8. The compression spring matched with the telescopic column 9 is squeezed and generates an elastic force so that the telescopic column 9 can cooperate with the inner wall of the receiving groove 702 to fix the transistor in the receiving groove 702. During the rotation of the turntable 6, the pin of the transistor moves relative to the elastic conductive sheet 13 and contacts it, thereby realizing a double pulse test for the transistor.

[0071] When the limit plate 801 connected to the end of the sliding column 8 slides to the end of the second slide groove 703, as the turntable 6 continues to rotate, the compression spring corresponding to the telescopic head 10 receives sufficient pressure and contracts, and the telescopic head 10 is retracted into the sliding column 8, but the end is still in contact with the surface of the limit platform 14. At this time, the sliding column 8 can be reset in the first slide groove 701 by the tension of the tension spring, thereby releasing the clamping of the transistor. The transistor can slide out of the accommodating groove 702 while the turntable 6 continues to rotate, and the tooling is discharged through the discharge channel 11, thereby realizing an efficient double-pulse test for the transistor.

[0072] Although an embodiment of the present invention has been shown and described, this specific embodiment is merely an explanation of the present invention and is not a limitation of the invention. The specific features, structures, materials or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. After reading this specification, those skilled in the art may make modifications, substitutions and variations to the embodiments without creative contributions as needed without departing from the principles and purpose of the present invention. However, as long as they are within the scope of the claims of the present invention, they are protected by patent law.

Claims

1. A clamping fixture for transistor double pulse test, characterized in that: include: A housing (1), a turntable (6) rotatably connected inside the housing (1), a clamping box (7) connected to the surface of the turntable (6) at annular intervals, the clamping box (7) being provided with a receiving groove (702) for receiving a transistor, and having a clamping structure for clamping the transistor installed inside, and a test component capable of relative movement with the transistor being fixedly installed inside the housing (1); A lever (5), the lever (5) being used to push the transistor into the receiving groove (702); A conveying platform (4) is used to convey transistors in the direction of a lever (5); a transfer platform (3) is fixed to one side of the housing (1) via a bracket structure; the top surface of the transfer platform (3) is flush with the top surface of the conveying platform (4); when the receiving groove (702) is in a horizontal state, the lever (5) can rotate to push the transistor at the end of the conveying platform (4) through the transfer platform (3) into the receiving groove (702).

2. The clamping fixture for transistor double pulse test according to claim 1, characterized in that: The clamping box (7) is provided with an annular first slide groove (701), which is coaxial with the turntable (6) and is slidably connected with an annular sliding column (8) inside. An annular telescopic column (9) is slidably connected inside the sliding column (8), and a compression spring is provided between the inner wall of the telescopic column (9) and the sliding column (8). A tension spring is provided between the end of the first slide groove (701) away from the accommodating groove (702) and the sliding column (8). Before the transistor is tested by the test component, the sliding column (8) can slide toward the transistor and put the compression spring in a compressed state. After the transistor is tested by the test component, the sliding column (8) is reset by the tension spring.

3. The clamping fixture for transistor double pulse test according to claim 2, characterized in that: The surface of the clamping box (7) is provided with an annular second slide groove (703) in the direction of the cover body (2); the end of the sliding column (8) is fixedly connected to a limiting plate (801), and the limiting plate (801) is slidably connected in the second slide groove (703); the other end of the sliding column (8) is telescopically connected to a telescopic head (10) in the direction of the cover body (2); a compression spring is also provided between the bottom end of the telescopic head (10) and the inner wall of the sliding column (8); the cover body (2) is provided with a limiting platform (14) on the movement trajectory of the telescopic head (10), and the limiting platform (14) first contacts the telescopic head One end of the housing (10) is provided with an oblique chamfer, and an elastic conductive sheet (13) for contacting a transistor pin is fixedly connected inside the housing (1); after the telescopic head (10) contacts the limiting platform (14), the sliding column (8) can move toward the corresponding transistor direction; after the telescopic column (9) contacts the transistor, the elastic conductive sheet (13) will contact the transistor pin; when the limiting sheet (801) slides to the end in the second slide groove (703), the telescopic head (10) can be retracted into the sliding column (8), thereby releasing the limiting effect of the limiting platform (14) on the telescopic head (10).

4. The clamping fixture for transistor double pulse test according to claim 1, characterized in that: The length and width of the receiving groove (702) are respectively greater than the length and width of the transistor.

5. The clamping fixture for transistor double pulse test according to claim 1, characterized in that: A blocking sheet (501) for blocking the transistor is fixedly connected to the surface of the lever (5), and the lever (5) and the blocking sheet (501) will not interfere with the cover (2), the housing (1) and the rotating disk (6).

6. The clamping fixture for transistor double pulse test according to claim 5, characterized in that: The housing (1) and the cover (2) are respectively provided with a first offset opening (101) and a second offset opening (201) on the rotation track of the shifting rod (5), and the rotating disk (6) is provided with through openings (601) at intervals in a ring shape.

7. The clamping fixture for transistor double pulse test according to claim 3, characterized in that: The lever (5) is used to push the transistor in a horizontal state into the receiving groove (702), and the transistor in the receiving groove (702) will contact the elastic conductive sheet (13) only after being rotated to a vertical state.

8. The clamping fixture for transistor double pulse test according to claim 1, characterized in that: The bottom end of the housing (1) is fixedly connected to a discharge channel (11), and a guide plate (12) is rotatably provided at the bottom end of the discharge channel (11), and the top end of the guide plate (12) can respectively contact two sides of the top end of the discharge channel (11).

9. The clamping fixture for transistor double pulse test according to claim 3, characterized in that: A dislocation hole (302) for dislocating the telescopic head (10) is provided on one side of the transfer platform (3) close to the turntable (6).

10. The clamping fixture for transistor double pulse test according to claim 3, characterized in that: The edge of the top surface of the transfer platform (3) is provided with a protective edge (301) facing upwards, and the protective edge (301) will not interfere with the rotation of the shifting rod (5).

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