Device and method for testing electrical performance of electromagnetic function structure under force thermal load

Abstract

The invention discloses an electrical performance testing device and method for an electromagnetic function structure under a force thermal load, and relates to the technical field of microwave testing. The device is applied to microwave material testing and comprises a rotating support, the top of the rotating support is rotationally connected with a rotating disc, the top of the rotating disc is detachably provided with a force loading support, the top of the force loading support is provided with a first fixing arm and a second fixing arm, and the first fixing arm and the second fixing arm are arranged in the length direction of the second fixing arm. Mounting grooves are formed in the opposite side walls of the second fixing arm and the first fixing arm. Based on a free space method, through innovative design of the testing system, the testing system can be used for measuring electrical performance parameters of a microwave material under a force-heat coupling condition and a condition of electromagnetic wave incidence at different angles; by adopting the device and the method, the electrical property test of the microwave material plate under the conditions that the electromagnetic wave incident angle is 0-60 degrees, the room temperature is 1000 DEG C and the maximum deformation is 50mm can be realized.

Description

Technical Field

[0001] The invention relates to the field of microwave testing technology, and in particular to an electrical performance testing device for an electromagnetic functional structure under mechanical and thermal loads. Background Art

[0002] Microwave materials not only play an important role in the communication, aerospace and military industries, but also play a vital role in ensuring the normal transmission of electromagnetic waves and reducing interference. Especially in high-tech systems such as satellite communications, radar navigation and electronic countermeasures, it is particularly important to accurately and quickly measure the electrical performance parameters of dielectric materials. For high-speed aircraft, the absorbing materials on their surfaces will encounter a complex environment of extreme temperature, deformation and high incident angle under supersonic flight conditions. In this case, the dielectric properties of the absorbing materials may change significantly due to changing environmental conditions (such as temperature) and deformation, which puts higher requirements on maintaining the absorbing efficiency of the materials and their electromagnetic compatibility.

[0003] At present, the free-space method for testing the electrical properties of microwave materials is commonly used in low temperature fields and only for electrical properties testing at high temperatures with vertical incidence. The prior art discloses "THz complex dielectric constant free-space method testing technology", author Zhang Na, which uses the free-space method to design a variable temperature test scheme for microwave materials, and uses an ellipsoidal reflector, a feed antenna, a copper heating ring, and a temperature control box to achieve microwave material electrical properties testing from room temperature to 400°C, but the maximum temperature measured is low, making it difficult to simulate the electrical performance parameter changes in a high-temperature environment of 1000°C when the aircraft is flying at high speed; and the existing literature "Research on Microwave Parameter Testing Methods for Dielectric Materials under High Temperature Conditions", author Jiang Yu, uses the free-space method to achieve microwave material electrical properties testing at a maximum of 1200°C through a rectangular waveguide and a microwave heating furnace, but fails to simulate different incident angles. At the same time, Martin S's paper "W-Band Comp l ex Permittivity Measurements at High Temperature Using Free-Space Methods》also used a tubular heating furnace and a waveguide to test the electrical properties of microwave materials at high temperatures, but only achieved room temperature to 600°C, and did not simulate high temperatures at different incident angles. The above methods are difficult to simultaneously meet the mechanical and thermal load conditions and different electromagnetic wave incident angles to measure the electrical performance parameters of microwave materials. For this reason, we propose an electrical performance test device and method for electromagnetic functional structures under mechanical and thermal loads. Summary of the invention

[0004] The purpose of the present invention is to provide an electrical performance testing device and method for electromagnetic functional structures under mechanical and thermal loads, which can realize the measurement of electrical performance parameters of microwave materials under different electromagnetic wave oblique incident angles and mechanical and thermal load conditions.

[0005] According to a first aspect of the present invention, in order to achieve the above-mentioned purpose, the present invention provides the following technical solutions: an electrical performance testing device of an electromagnetic functional structure under force and heat load, applied to microwave material testing, comprising a rotating bracket, the top of the rotating bracket is rotatably connected to a rotating disk, the top of the rotating disk is detachably mounted with a force loading support, the top of the force loading support is mounted with a fixed arm 1 and a fixed arm 2, along the length direction of the fixed arm 2, the side walls of the fixed arm 2 and the fixed arm 1 facing each other are provided with mounting grooves, a clamping block is detachably mounted in the mounting groove of the fixed arm 1, and a wave-transmitting material plate is mounted through the clamping block;

[0006] A plurality of extrusion screws are threadedly connected to the side wall of the second fixed arm, and ends of the plurality of extrusion screws abut against the side wall of the wave-transmitting material plate;

[0007] Both sides of the rotating disk are detachably mounted with connecting cantilevers, and the ends of the connecting cantilevers are detachably mounted with high-temperature loading brackets, and a quartz lamp array heating furnace is mounted on the top of the high-temperature loading bracket. When the rotating disk rotates, the quartz lamp array heating furnace and the wave-transmitting material plate remain relatively still;

[0008] Transceiver antennas are installed on both sides of the wave-transmitting material plate, and the transceiver antennas are connected to a vector network analyzer via a coaxial cable.

[0009] Furthermore, the rotating bracket is rotatably connected to the rotating disk via a bearing.

[0010] Furthermore, a rectangular groove matched with the force loading support is opened on the top of the rotating disk, and the rotating disk is detachably installed in the rectangular groove by bolts.

[0011] Furthermore, the side walls of the clamping block and the first fixing arm are provided with corresponding screw holes, and the clamping block is detachably mounted on the first fixing arm through the screw holes.

[0012] Furthermore, the thickness of the wave-transmitting material plate is less than half of the working wavelength.

[0013] Furthermore, the number of the quartz lamp array heating furnaces is two, and the two quartz lamp array heating furnaces are arranged mirror-symmetrically on both sides of the wave-transmitting material plate, and the size of the quartz lamp array heating furnace is larger than the wave-transmitting material plate;

[0014] The top of the high-temperature loading bracket is fixedly connected with a slide rail, and the quartz lamp array heating furnace is slidably connected to the slide rail.

[0015] Furthermore, the center of the transceiver antenna is maintained at the same height as the wave-transmitting material plate.

[0016] According to a second aspect of the present invention, the present invention provides a method for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads, using the above-mentioned device for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads, comprising the following steps:

[0017] S1. Measure the length, width and thickness of the wave-transmitting material plate, fix one side of the wave-transmitting material plate between the clamp block and the fixed arm 1 with bolts, and rotate the extrusion screw on the fixed arm 2 to extrude the wave-transmitting material plate to complete stress loading;

[0018] S2. Debug the test system;

[0019] S3. Rotate the rotating disk to move the wave-transmitting material plate to a specified angle, and adjust the position of the quartz lamp array heating furnace to maintain an appropriate distance from the wave-transmitting material plate;

[0020] S4. Heat the wave-transmitting material plate using a quartz lamp array heating furnace, and evacuate the experimental site through the horizontal side after heating;

[0021] S5. Record the data exported by the vector network analyzer, and calculate the corresponding complex relative permittivity and complex relative magnetic permeability based on the exported data.

[0022] Furthermore, the test equipment is debugged in S2, and the specific steps are as follows:

[0023] (1) Preheat the vector network analyzer;

[0024] (2) Set the starting frequency, ending frequency, measurement frequency points and intermediate frequency bandwidth of the vector network analyzer;

[0025] (3) Perform through, reflection, and transmission line calibration on the test system, namely, TRL calibration.

[0026] Furthermore, the vector network analyzer export data is recorded in S5, and the corresponding complex relative permittivity and complex relative permeability are calculated according to the export data, as follows:

[0027]

[0028] In the formula, S 11 is the input return loss, S 21 is the forward transmission coefficient, Γ is the reflection coefficient at the incident interface when the material is infinitely long, T is the transmission coefficient in the finite length material, γ is the wave propagation constant in the medium, γ 0 represents the propagation constant of free space, d is the thickness of the measured object, ε r and μ rThat is the required complex permittivity and complex permeability;

[0029] The phase ambiguity problem caused by T being a complex number in formula (3) is solved by the following method:

[0030]

[0031] The determination of the phase is the determination of the n value. The test system is subjected to frequency sweeping, and the corresponding imaginary part is calculated for each frequency. m+1 )) <imag(γ(f m )), then for time m+1, replace n with n+1 to obtain the phase at this frequency, and by increasing n with a step interval of 1 at each step frequency, determine the unique propagation constant at each frequency.

[0032] The present invention has at least the following beneficial effects:

[0033] 1. The present invention can measure the electrical performance parameters of microwave materials under different electromagnetic wave oblique incident angles and mechanical and thermal load conditions by means of the rotating bracket, fixed arm 1, fixed arm 2 and quartz lamp array heating furnace.

[0034] 2. The present invention is based on the free space method. Through the innovative design of the test system, it is able to measure the electrical performance parameters of microwave materials under the conditions of mechanical and thermal coupling and electromagnetic wave incidence at different angles. The present invention can realize the electrical performance test of microwave material plates under the conditions of electromagnetic wave incident angle of 0-60°, room temperature to 1000°C and maximum deformation of 50mm.

[0035] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 It is a three-dimensional schematic diagram of the overall structure of the present invention;

[0037] Figure 2 is a three-dimensional schematic diagram of the clamp of the present invention;

[0038] Figure 3 It is a three-dimensional schematic diagram of the intermediate turntable of the present invention;

[0039] Figure 4 It is a three-dimensional schematic diagram of the quartz lamp array and its bracket of the present invention;

[0040] Reference numerals:

[0041] 1. Rotating bracket; 2. Rotating disk; 3. Force loading support; 4. Fixed arm 1; 5. Fixed arm 2; 6. Mounting slot; 7. Clamp; 8. Wave-transmitting material plate; 9. Extrusion screw; 10. Connecting cantilever; 11. High-temperature loading bracket; 12. Quartz lamp array heating furnace; 13. Transceiver antenna; 14. Vector network analyzer; 15. Rectangular slot. DETAILED DESCRIPTION

[0042] The following will be combined with the drawings in the embodiments of the present disclosure to clearly and completely describe the technical solutions in the embodiments of the present disclosure. Obviously, the described embodiments are only part of the embodiments of the present disclosure, rather than all the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present disclosure.

[0043] Embodiment 1:

[0044] See also Figure 1 The present invention provides a technical solution: an electrical performance testing device for an electromagnetic functional structure under force and heat loads, which is applied to microwave material testing, comprises a rotating bracket, the top of which is rotatably connected to a rotating disk, a force loading support is detachably installed on the top of the rotating disk, a fixed arm 1 and a fixed arm 2 are installed on the top of the force loading support, and along the length direction of the fixed arm 2, the side walls of the fixed arm 2 and the fixed arm 1 facing each other are provided with mounting grooves, a clamping block is detachably installed in the mounting groove of the fixed arm 1, and a wave-transmitting material plate is installed through the clamping block;

[0045] See also Figure 2 , a plurality of extrusion screws are threadedly connected to the side wall of the second fixed arm, and the ends of the plurality of extrusion screws abut against the side wall of the wave-transmitting material plate;

[0046] See also Figure 4 , connecting cantilevers are detachably installed on both sides of the rotating disk, and a high-temperature loading bracket is detachably installed on the end of the connecting cantilever. A quartz lamp array heating furnace is installed on the top of the high-temperature loading bracket. When the rotating disk rotates, the quartz lamp array heating furnace and the wave-transmitting material plate remain relatively still;

[0047] Transceiver antennas are installed on both sides of the wave-transmitting material plate, and the transceiver antennas are connected to a vector network analyzer through a coaxial cable.

[0048] See also Figure 3 According to the technical solution of this embodiment, the rotating bracket is rotatably connected to the rotating disk through a bearing. By rotating the rotating disk, the wave-transmitting material plate is driven to rotate accordingly, so as to adjust the incident angle of the electromagnetic wave. Under mechanical and thermal loads, the electrical performance parameters of the wave-transmitting material plate are detected. It should be noted that a scale is also provided on the outer wall of the rotating bracket to facilitate adjusting the rotation angle of the rotating disk corresponding to the scale.

[0049] Furthermore, a rectangular groove matched with the force loading support is opened on the top of the rotating disk, and the rotating disk is detachably installed in the rectangular groove by bolts, so that the force loading support and the wave-transmitting material plate can be easily disassembled and installed.

[0050] Furthermore, corresponding screw holes are provided on the side walls of the clamp block and the fixing arm 1, and the clamp block is detachably mounted on the fixing arm 1 through the screw holes. In this way, it is convenient to clamp and fix one side of the wave-transmitting material plate, and by rotating the extrusion screw to squeeze the side wall on the other side of the wave-transmitting material plate, the wave-transmitting material plate can be deflected and deformed to achieve stress loading, and by controlling the feed amount of the extrusion screw, the stress loading intensity can also be controlled. It should be noted that the clamp material can be set to quartz ceramic or ceramic zirconia material, which is not specifically limited in this embodiment and can be selected according to actual needs.

[0051] According to the technical solution of this embodiment, the thickness of the wave-transmitting material plate is less than half of the working wavelength to avoid the thickness resonance problem.

[0052] According to the technical solution of this embodiment, there are two quartz lamp array heating furnaces, which are arranged on both sides of the wave-transmitting material plate in a mirror-symmetrical manner, and the size of the quartz lamp array heating furnace is larger than the wave-transmitting material plate, so that the heat loading is uniform, and after the high-temperature loading bracket is fixed on the connecting cantilever, the rotating disk is rotated, and the quartz lamp array heating furnace will also rotate with the rotating disk. At this time, the heating plane of the quartz lamp array heating furnace is always facing the plane of the wave-transmitting material plate, so that parallel and uniform heating can be achieved even when the incident angle is large.

[0053] Furthermore, a slide rail is fixedly connected to the top of the high-temperature loading bracket, and the quartz lamp array heating furnace is slidably connected to the slide rail. By moving the quartz lamp array heating furnace to make it slide on the slide rail, the heating distance between the quartz lamp array heating furnace and the wave-transmitting material plate can also be adjusted.

[0054] Specifically, when it is necessary to apply mechanical and thermal loads to the wave-transmitting material plate, first install the force-loading support in the installation slot of the rotating disk, then use bolts to fix one side of the wave-transmitting material plate between the clamp block and the fixed arm one, and rotate the extrusion screw on the fixed arm two to extrude the wave-transmitting material plate to complete the stress loading, then rotate the rotating disk to a specified angle according to the corresponding scale on the rotating disk, and then adjust the position of the quartz lamp array heating furnace to keep an appropriate distance from the wave-transmitting material plate, and then use the quartz lamp array heating furnace to perform thermal loading on the wave-transmitting material plate. After the mechanical and thermal loading is completed, the electrical performance parameters of the wave-transmitting material plate under different oblique incident angles of electromagnetic waves in a high temperature environment can be collected by a vector network analyzer.

[0055] Embodiment 2:

[0056] The present invention provides a method for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads, using the above-mentioned device for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads, comprising the following steps:

[0057] S1. Measure the length, width and thickness of the wave-transmitting material plate, fix one side of the wave-transmitting material plate between the clamp block and the fixed arm 1 with bolts, and rotate the extrusion screw on the fixed arm 2 to extrude the wave-transmitting material plate to complete stress loading;

[0058] S2. Debug the test system;

[0059] S3. Rotate the rotating disk to move the wave-transmitting material plate to a specified angle, and adjust the position of the quartz lamp array heating furnace to maintain an appropriate distance from the wave-transmitting material plate;

[0060] S4. Heat the wave-transmitting material plate using a quartz lamp array heating furnace, and evacuate the experimental site through the horizontal side after heating;

[0061] S5. Record the data exported by the vector network analyzer, and calculate the corresponding complex relative permittivity and complex relative magnetic permeability based on the exported data.

[0062] Furthermore, the test equipment is debugged in S2, and the specific steps are as follows:

[0063] (1) Preheat the vector network analyzer;

[0064] (2) Set the starting frequency, ending frequency, measurement frequency points and intermediate frequency bandwidth of the vector network analyzer;

[0065] (3) Perform through, reflection, and transmission line calibration on the test system, namely, TRL calibration.

[0066] Furthermore, the vector network analyzer export data is recorded in S5, and the corresponding complex relative permittivity and complex relative permeability are calculated according to the export data, as follows:

[0067]

[0068] In the formula, S 11 is the input return loss, S 21 is the forward transmission coefficient, Γ is the reflection coefficient at the incident interface when the material is infinitely long, T is the transmission coefficient in the finite length material, γ is the wave propagation constant in the medium, γ 0 represents the propagation constant of free space, d is the thickness of the measured object, ε r and μ r That is the required complex permittivity and complex permeability;

[0069] In formula (3),T The following method is used to solve the phase ambiguity problem caused by complex numbers:

[0070]

[0071] The determination of the phase is the determination of the n value. According to the law that the imaginary part of the propagation constant increases linearly with the increase of frequency, the test system is subjected to frequency sweeping, and the corresponding imaginary part is calculated for each frequency. m+1 )) <imag(γ(f m )), then for time m+1, replace n with n+1 to obtain the phase at this frequency, and by increasing n with a step interval of 1 at each step frequency, determine the unique propagation constant at each frequency.

[0072] In summary, the present invention is based on the free space method and, through the innovative design of the test system, enables it to measure the electrical performance parameters of microwave materials under conditions of mechanical and thermal coupling and electromagnetic wave incidence at different angles. The present invention can realize electrical performance testing of microwave material plates under conditions of electromagnetic wave incident angles of 0-60°, room temperature to 1000°C, and a maximum deformation of 50mm.

[0073] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0074] For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances. When an element is referred to as being "assembled on", "installed on", "fixed on" or "set on" another element, it can be directly on the other element or there can also be a centered element. When an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be a centered element at the same time. The terms "vertical", "horizontal", "up", "down", "left", "right" and similar expressions used herein are only for illustrative purposes and are not intended to be the only implementation method.

[0075] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

[0076] In the description of this specification, the description with reference to the terms "one embodiment", "example", "specific example", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present disclosure. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

Claims

1. An electrical performance testing device for electromagnetic functional structures under mechanical and thermal loads, applied to microwave material testing, characterized in that: It comprises a rotating bracket, the top of which is rotatably connected to a rotating disk, the top of which is detachably mounted with a force loading support, the top of which is mounted with a fixed arm 1 and a fixed arm 2, along the length direction of the fixed arm 2, the side walls of the fixed arm 2 and the fixed arm 1 facing each other are provided with mounting grooves, a clamping block is detachably mounted in the mounting groove of the fixed arm 1, and a wave-transmitting material plate is mounted through the clamping block; A plurality of extrusion screws are threadedly connected to the side wall of the second fixed arm, and the ends of the plurality of extrusion screws abut against the side wall of the wave-transmitting material plate; Both sides of the rotating disk are detachably mounted with connecting cantilevers, and the ends of the connecting cantilevers are detachably mounted with high-temperature loading brackets, and a quartz lamp array heating furnace is mounted on the top of the high-temperature loading bracket. When the rotating disk rotates, the quartz lamp array heating furnace and the wave-transmitting material plate remain relatively still; Transceiver antennas are installed on both sides of the wave-transmitting material plate, and the transceiver antennas are connected to a vector network analyzer via a coaxial cable.

2. The electrical performance testing device of an electromagnetic functional structure under mechanical and thermal loads according to claim 1, characterized in that: The rotating bracket is rotatably connected to the rotating disk via a bearing.

3. The electrical performance testing device of an electromagnetic functional structure under mechanical and thermal loads according to claim 2, characterized in that: A rectangular groove matched with the force loading support is opened on the top of the rotating disk, and the rotating disk is detachably installed in the rectangular groove by bolts.

4. The electrical performance testing device of an electromagnetic functional structure under mechanical and thermal loads according to claim 3 is characterized in that: The side walls of the clamping block and the first fixing arm are provided with screw holes corresponding to each other, and the clamping block is detachably mounted on the first fixing arm through the screw holes.

5. The electrical performance testing device of an electromagnetic functional structure under mechanical and thermal loads according to claim 3 is characterized in that: The thickness of the wave-transmitting material plate is less than half of the working wavelength.

6. The electrical performance testing device of an electromagnetic functional structure under mechanical and thermal loads according to claim 5, characterized in that: The number of the quartz lamp array heating furnaces is two, and the two quartz lamp array heating furnaces are arranged mirror-symmetrically on both sides of the wave-transmitting material plate, and the size of the quartz lamp array heating furnace is larger than the wave-transmitting material plate; The top of the high-temperature loading bracket is fixedly connected with a slide rail, and the quartz lamp array heating furnace is slidably connected to the slide rail.

7. The electrical performance testing device of an electromagnetic functional structure under mechanical and thermal loads according to claim 6, characterized in that: The center of the transceiver antenna is kept at the same height as the wave-transmitting material plate.

8. A method for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads, using a device for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads as claimed in any one of claims 1 to 7, characterized in that: The following steps are involved: S1. Measure the length, width and thickness of the wave-transmitting material plate, fix one side of the wave-transmitting material plate between the clamp block and the fixed arm 1 with bolts, and rotate the extrusion screw on the fixed arm 2 to extrude the wave-transmitting material plate to complete stress loading; S2. Debug the test system; S3. Rotate the rotating disk to move the wave-transmitting material plate to a specified angle, and adjust the position of the quartz lamp array heating furnace to maintain an appropriate distance from the wave-transmitting material plate; S4. Heat the wave-transmitting material plate using a quartz lamp array heating furnace, and evacuate the experimental site through the horizontal side after heating; S5. Record the data exported by the vector network analyzer, and calculate the corresponding complex relative permittivity and complex relative magnetic permeability based on the exported data.

9. The method for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads according to claim 8, characterized in that: In S2, the test equipment is debugged. The specific steps are as follows: (1) Preheat the vector network analyzer; (2) Set the starting frequency, ending frequency, measurement frequency points and intermediate frequency bandwidth of the vector network analyzer; (3) Perform through, reflection, and transmission line calibration on the test system, namely, TRL calibration.

10. The method for testing the electrical properties of an electromagnetic functional structure under mechanical and thermal loads according to claim 8, characterized in that: S5 records the data exported by the vector network analyzer, and calculates the corresponding complex relative permittivity and complex relative permeability based on the exported data, as follows: In the formula, S 11 is the input return loss, S 21 is the forward transmission coefficient, Γ is the reflection coefficient at the incident interface when the material is infinitely long, T is the transmission coefficient in a finite-length material, γ is the propagation constant of the wave in the medium, γ0 represents the propagation constant of free space, d is the thickness of the measured object, and ε r and μ r That is the required complex permittivity and complex permeability; The phase ambiguity problem caused by T being a complex number in formula (3) is solved by the following method: The determination of the phase is the determination of the n value. The test system is subjected to frequency sweeping, and the corresponding imaginary part is calculated for each frequency. m+1 )) <imag(γ(f m )), then for time m+1, replace n with n+1 to obtain the phase at this frequency, and by increasing n with a step interval of 1 at each step frequency, determine the unique propagation constant at each frequency.

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