Integrated circuit industry comprehensive development level assessment method and system based on big data

Abstract

The invention discloses an integrated circuit industry comprehensive development level evaluation method based on big data, and the method comprises the steps: taking an integrated circuit industry as an evaluation target, and collecting and obtaining multi-dimensional industry data related to the evaluation target; constructing an integrated circuit industry comprehensive evaluation index system; calculating each index in the comprehensive evaluation index system by using the collected data to obtain a single index result; carrying out dimensionless standardization processing on a single index result; determining the maximum value of each index, and performing linear regression analysis to obtain an index weight; and carrying out weighted summation on single index results to obtain an integrated circuit industry comprehensive evaluation result. According to the method, the integrated circuit industry is evaluated through multi-dimensional integrated circuit industry data collection, a comprehensive evaluation index system is constructed and technologies such as heterogeneous data fusion and quantitative analysis are combined, so that the efficiency and accuracy of the integrated circuit industry evaluation are improved; and a reference basis is provided for scientifically evaluating the industrial development level of the integrated circuit and improving the industrial development quality.

Description

Technical Field

[0001] The present invention relates to the field of integrated circuit industry comprehensive development level assessment and big data technology, and more specifically to a method and system for integrated circuit industry comprehensive development level assessment based on big data. Background Art

[0002] As the foundation of the digital economy, the resilience and security of the integrated circuit industry chain are crucial to economic security and national security. In the context of the accelerated intelligent technology revolution and digital industry transformation, countries are competing to strengthen their control over the integrated circuit industry chain. The global integrated circuit industry competition continues to intensify and trigger new risks. To this end, it is of great significance to pay attention to the new trend of the resilience and security of the integrated circuit industry chain under the new situation, comprehensively and comprehensively analyze the development of the integrated circuit industry in key cities and regions, and timely and effectively respond to the risks of the industry chain and concentrate superior resources to improve the competitiveness of the industry chain. However, the integrated circuit industry has its own uniqueness, which makes it difficult to comprehensively and accurately evaluate it using traditional industry evaluation methods. First, the supply chain is complex and the integrated circuit industry chain is long, involving multiple links such as design, manufacturing, packaging and testing, and each link is highly dependent on each other. The evaluation method needs to consider the integrity, stability and flexibility of the supply chain. Second, the technology intensity is high. The integrated circuit industry is a highly technology-intensive industry with extremely high requirements for technological innovation and R&D capabilities. The evaluation method needs to pay special attention to indicators such as the company's R&D investment, technological innovation results, and the number of patents. Third, the integrated circuit industry is greatly affected by the international political and economic environment, such as trade wars and technological blockades. The evaluation method needs to consider the impact of the international environment on the local industry chain.

[0003] These differences make the evaluation method of the integrated circuit industry unique, and it is necessary to comprehensively consider multiple factors such as technology, industry, market, environment, etc. Therefore, it is necessary to establish a comprehensive and accurate evaluation method for the comprehensive development level of the integrated circuit industry to provide a reference for timely warning of industry chain risks and improving the quality of industrial development. Summary of the invention

[0004] In view of this, the present invention provides a method and system for evaluating the comprehensive development level of the integrated circuit industry based on big data, which at least solves some of the above-mentioned technical problems. By collecting big data, building a comprehensive evaluation index system, and combining heterogeneous data fusion and quantitative analysis technologies to conduct a comprehensive evaluation of the integrated circuit industry chain, it helps to improve the efficiency and accuracy of industry evaluation, so as to provide a reference for scientifically evaluating the comprehensive development level of the integrated circuit industry and improving the quality of industrial development.

[0005] To achieve the above object, the technical solution adopted by the present invention is:

[0006] In a first aspect, an embodiment of the present invention provides a city-level integrated circuit industry evaluation method based on big data, the method comprising the following steps:

[0007] S1. Taking the integrated circuit industry as the evaluation target, collect and obtain multi-dimensional integrated circuit industry data related to the evaluation target;

[0008] S2. Construct a comprehensive evaluation index system for the integrated circuit industry;

[0009] S3. Calculate each indicator in the comprehensive evaluation indicator system using the collected data to obtain a single indicator result;

[0010] S4. Perform dimensionless standardization on the individual indicator results;

[0011] S5. Determine the maximum value of each indicator in the city, perform linear regression analysis, and obtain the indicator weight;

[0012] S6. Perform weighted summation on the results of the individual indicators to obtain a comprehensive evaluation result of the city-level integrated circuit industry.

[0013] Preferably, in step S1, multi-dimensional integrated circuit industry data of N cities are collected, where N>50.

[0014] Preferably, in step S1, the multi-dimensional integrated circuit industry data includes but is not limited to: the total number of market entities, industry output value, the number of listed companies, the number of unicorn companies, the number of gazelle companies, the number of high-tech enterprises, the total amount of financing, the total market value of listed companies, the number of intellectual property rights, the number of industry standards, the number of technical personnel of listed companies, the number of universities offering relevant majors, the number of industry-related laws and regulations, the number of industry-related policies, the number of industry associations, the number of industry alliances, the degree of control of domestic capital over invention patents, the degree of control of domestic capital over R&D investment costs, the self-sufficiency rate of chip products, the self-sufficiency rate of material products, the self-sufficiency rate of equipment, etc.

[0015] Preferably, in step S2, the comprehensive industry evaluation index system includes five first-level indicators: industry level, industry innovation, industry environment, situation of leading enterprises, and security of industrial chain, wherein the industry level includes two second-level indicators, namely, industry scale and industry quality; industry innovation includes two second-level indicators, namely, intellectual property rights and innovative talents; the industrial environment includes two second-level indicators, namely, policy environment and service environment; the situation of leading enterprises includes four second-level indicators, namely, listed companies, unicorn companies, gazelle companies, and high-tech companies; and the security of industrial chain includes four second-level indicators, namely, external dependence, resource security, supply chain security, and core technology security.

[0016] Preferably, in step S4, dimensionless normalization is performed on each indicator result to unify the dimension to [0,1], where:

[0017] The standardized processing formula for positive indicators is:

[0018]

[0019] The standardized processing formula for negative indicators is:

[0020]

[0021] Among them, x i represents the original data, x i ′ represents the data after standardization, and i represents the number of indicators.

[0022] Preferably, in step S5, the maximum city value d of each indicator is determined max , each dimension indicator d i ; Use d max -d i As the dependent variable, a linear regression analysis was conducted with the city name as the independent variable, and the regression coefficient was determined as the indicator weight.

[0023] In a second aspect, an embodiment of the present invention further provides an integrated circuit industry comprehensive development level assessment system based on big data, which applies the above-mentioned integrated circuit industry comprehensive development level assessment method based on big data to conduct integrated circuit industry comprehensive development level assessment, and the system includes:

[0024] A data collection module, used to collect and obtain integrated circuit industry data related to the evaluation target;

[0025] Index system construction module, used to build a comprehensive evaluation index system for the integrated circuit industry;

[0026] A calculation module, used to calculate each indicator in the comprehensive evaluation indicator system using the collected data to obtain a single indicator result;

[0027] The weight acquisition module is used to determine the maximum value of each indicator in the city, perform linear regression analysis, and obtain the indicator weight;

[0028] The evaluation result output module is used to perform weighted summation on the results of the individual indicators to obtain the evaluation result of the comprehensive development level of the city-level integrated circuit industry.

[0029] Compared with the prior art, the present invention has at least the following beneficial effects:

[0030] In view of the problems that integrated circuit industry evaluation is unsystematic, difficult to quantify and difficult to compare, the present invention provides a method and system for evaluating the comprehensive development level of the integrated circuit industry based on big data. The present invention collects multi-dimensional industrial data, builds a comprehensive evaluation index system, and combines heterogeneous data fusion and quantitative analysis to conduct city-level multi-dimensional industrial evaluation, which helps to improve the efficiency and accuracy of industrial evaluation, so as to provide a reference for scientifically evaluating the level of industrial development and analyzing the reasons.

[0031] Other features and advantages of the present invention will be described in the following description, and partly become apparent from the description, or understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structures particularly pointed out in the written description and the accompanying drawings.

[0032] The technical solution of the present invention is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0034] The accompanying drawings are used to provide further understanding of the present invention and constitute a part of the specification. They are used to explain the present invention together with the embodiments of the present invention and do not constitute a limitation of the present invention.

[0035] Figure 1 A schematic flow chart of a method for evaluating the comprehensive development level of the integrated circuit industry based on big data provided in an embodiment of the present invention.

[0036] Figure 2 A schematic diagram of an industry comprehensive evaluation index system provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0037] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. In addition, various serial numbers are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0038] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0039] Reference Figure 1 As shown, the present invention provides a method for evaluating the comprehensive development level of the integrated circuit industry based on big data, and the method mainly includes the following steps:

[0040] S1. Taking the integrated circuit industry as the evaluation target, collect and obtain integrated circuit industry data related to the evaluation target;

[0041] S2. Construct a comprehensive evaluation index system for the integrated circuit industry;

[0042] S3. Use the collected data to calculate each indicator in the comprehensive evaluation indicator system to obtain the results of individual indicators;

[0043] S4. Perform dimensionless standardization on the results of individual indicators;

[0044] S5. Determine the maximum value of each indicator in the city, perform linear regression analysis, and obtain the indicator weight;

[0045] S6. Perform weighted summation on the results of the individual indicators to obtain a comprehensive evaluation result of the city-level integrated circuit industry.

[0046] The following is a detailed description of each of the above steps:

[0047] In a specific embodiment, in the above step S1, the integrated circuit industry is taken as the evaluation target, and big data collection is performed for the evaluation target; preferably, multi-dimensional industrial data of more than 50 cities are collected, and the analysis dimensions include but are not limited to industry level, industrial innovation, industrial environment, situation of leading enterprises, and industrial chain security.

[0048] More specifically, the multi-dimensional industry data include: the total number of market entities, industry output value, the number of listed companies, the number of unicorn companies, the number of gazelle companies, the number of high-tech enterprises, the total amount of financing, the total market value of listed companies, the number of intellectual property rights, the number of industry standards, the number of technical personnel of listed companies, the number of universities offering relevant majors, the number of industry-related laws and regulations, the number of industry-related policies, the number of industry associations, the number of industry alliances, the degree of control of domestic capital over invention patents, the degree of control of domestic capital over R&D investment expenses, the self-sufficiency rate of chip products, the self-sufficiency rate of material products, the self-sufficiency rate of equipment, etc.

[0049] In a specific embodiment, in the above step S2, if Figure 2As shown in the figure, the integrated circuit industry comprehensive evaluation index system includes: industry level, technological innovation, industrial environment, leading enterprise situation, and industrial chain security; among them:

[0050] The level of industrial development mainly evaluates the scale, quality and efficiency of the integrated circuit industry. The scale of the industry is evaluated using indicators such as industrial output value and the number of market entities, while the quality of the industry is evaluated using indicators such as the market value of listed companies and domestic and foreign market share.

[0051] The industry's innovation capability is mainly evaluated by the support of technological research results and innovative talents for industrial development. Research results include patents, software copyrights and other intellectual property rights, as well as the number of industry standards. Innovative talents include the number of technical personnel from listed companies and the number of universities or research institutions offering related majors.

[0052] The degree of industrial environment optimization mainly evaluates the legal environment, policy environment, business environment, and service environment for the development of the integrated circuit industry, and is evaluated by the number of laws and regulations, policies, industry associations, and industrial technology alliances that support the industry.

[0053] The leading enterprises selected representative benchmark enterprises in each link of the industrial chain, and evaluated their development level in terms of operating conditions, total assets, R&D investment, market share, number of authorized patents, etc.

[0054] The security of the industrial chain mainly evaluates the security resilience of the industrial chain supply chain, and is evaluated by the domestic self-sufficiency rate of chip products, materials (including raw materials), equipment and core technical services.

[0055] In a specific embodiment, in the above step S4, dimensionless normalization is performed on the single indicator to unify the dimension to [0,1], where:

[0056] The standardized processing formula for positive indicators is:

[0057]

[0058] The standardized processing formula for negative indicators is:

[0059]

[0060] Among them, x i represents the original data, x i ′ represents the data after standardization, and i represents the number of indicators.

[0061] In a specific embodiment, in the above step S5, the maximum city value d of each indicator is determined. max , each dimension indicator d i ; Use d max -d iAs the dependent variable, a linear regression analysis was conducted with the city name as the independent variable, and the regression coefficient was determined as the indicator weight.

[0062] Finally, the results of individual indicators are weighted and summed to obtain a multi-dimensional comprehensive evaluation result of the industry.

[0063] From the description of the above embodiments, those skilled in the art can know that the present invention provides a method for evaluating the comprehensive development level of integrated circuits based on big data, aiming at the problems that the existing observation of the situation of the integrated circuit industry is not systematic, difficult to quantify, and difficult to compare. The method of the present invention collects multi-dimensional industry data, builds a comprehensive evaluation index system, and combines heterogeneous data fusion and quantitative analysis to perform city-level multi-dimensional industry evaluation; the method of the present invention has the following advantages:

[0064] ① The industry evaluation is comprehensive, with a multi-dimensional comprehensive evaluation of the industry development level, technological innovation capabilities, industrial development environment, the situation of leading enterprises, and supply chain security.

[0065] ②Industry problems can be quantitatively attributed to analysis. If data anomalies are found, the various factors affecting the industry can be analyzed to find the key influencing factors and provide a basis for the introduction of relevant regulatory policies.

[0066] ③ Cities can be compared with each other and the comparison standards are unified. Different regions and cities in the same industry can be compared overall or on a single indicator basis, which is convenient for summarizing and learning from development experiences.

[0067] Furthermore, the present invention also provides an integrated circuit industry comprehensive development level assessment system based on big data, which uses an integrated circuit industry comprehensive development level assessment method based on big data in the above embodiment to conduct integrated circuit industry assessment, and the system includes:

[0068] The data collection module is used to collect and obtain multi-dimensional industry data related to the evaluation target by taking the integrated circuit industry as the evaluation target;

[0069] Index system construction module, used to build a comprehensive evaluation index system for the integrated circuit industry;

[0070] The calculation module is used to calculate each indicator in the comprehensive evaluation indicator system using the collected data to obtain the results of the single indicator;

[0071] The weight acquisition module is used to determine the maximum value of each indicator in the city, perform linear regression analysis, and obtain the indicator weight;

[0072] The evaluation result output module is used to perform weighted summation on the results of individual indicators to obtain the comprehensive evaluation results of the city-level industries.

[0073] The implementation principle and technical effects of the system provided in the embodiment of the present invention are the same as those of the aforementioned method embodiment. For the sake of brief description, for matters not mentioned in the system embodiment, reference can be made to the corresponding contents in the aforementioned method embodiment, which will not be repeated here.

[0074] In addition, an embodiment of the present invention also provides a storage medium on which one or more programs readable by a computing device are stored, and the one or more programs include instructions. When the instructions are executed by the computing device, the computing device executes a city-level multi-dimensional industry assessment method based on big data in the above-mentioned embodiment.

[0075] In the embodiment of the present invention, the storage medium may be, for example, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination thereof. More specific examples of storage media (a non-exhaustive list) include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disk read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, and any suitable combination thereof.

[0076] It should be understood by those skilled in the art that the embodiments of the present invention may be provided as methods, systems or computer program products, etc. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0077] It should be noted that the word "comprising" does not exclude the presence of components or steps not listed in the claims. The word "a" or "an" preceding a component does not exclude the presence of a plurality of such components. The invention can be implemented by means of hardware comprising several distinct components, and by means of a suitably programmed computer.

[0078] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0079] The above description of the disclosed embodiments enables one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for evaluating the comprehensive development level of the integrated circuit industry based on big data, characterized in that: The method comprises the following steps: S1. Taking the integrated circuit industry as the evaluation target, collect and obtain multi-dimensional industry data related to the evaluation target; S2. Construct a comprehensive evaluation index system for the integrated circuit industry; S3. Calculate each indicator in the comprehensive evaluation indicator system using the collected data to obtain a single indicator result; S4. Perform dimensionless standardization on the individual indicator results; S5. Determine the maximum value of each indicator, perform linear regression analysis, and obtain the indicator weight; S6. Perform weighted summation on the results of the individual indicators to obtain a comprehensive evaluation result of the integrated circuit industry.

2. According to the big data-based integrated circuit industry comprehensive development level evaluation method of claim 1, it is characterized in that: A comprehensive analysis of the industry is conducted through a multi-dimensional and quantifiable evaluation indicator system.

3. The method for evaluating the comprehensive development level of the integrated circuit industry based on big data according to claim 1 or 2, characterized in that: In step S2, the multi-dimensional industry comprehensive evaluation index system includes two categories of first-level indicators, namely general indicators and special indicators. Among them, general indicators include indicators such as industry level, industry innovation, industry environment, and leading enterprise conditions, and special indicators include industry chain security indicators.

4. The method for evaluating the comprehensive development level of the integrated circuit industry based on big data according to claim 1, characterized in that: In step S2, the first-level indicators of industrial level include two second-level indicators of industrial scale and industrial quality; the first-level indicators of industrial innovation include two second-level indicators of intellectual property rights and innovative talents; the industrial environment includes two second-level indicators of policy environment and service environment; the situation of leading enterprises includes four second-level indicators of listed companies, unicorn companies, gazelle companies, and high-tech enterprises; the first-level indicators of industrial chain security include four second-level indicators of external dependence, resource security, supply chain security, and core technology security.

5. The method for evaluating the comprehensive development level of the integrated circuit industry based on big data according to claim 1, characterized in that: In step S4, dimensionless normalization is performed on each indicator result to unify the dimension to [0,1], where: The standardized processing formula for positive indicators is: The standardized processing formula for negative indicators is: Among them, x i represents the original data, x i ′ represents the data after standardization, and i represents the number of indicators.

6. The method for evaluating the comprehensive development level of the integrated circuit industry based on big data according to claim 5, characterized in that: In step S5, the maximum city value d of each indicator is determined. max , each dimension indicator d i ; Use d max -d i As the dependent variable, a linear regression analysis was conducted with the city name as the independent variable, and the regression coefficient was determined as the indicator weight.

7. A system for evaluating the comprehensive development level of the integrated circuit industry based on big data, characterized in that: The method for evaluating the comprehensive development level of the integrated circuit industry based on big data as described in any one of claims 1 to 6 is applied, and the system comprises: Data collection module, used to collect and obtain multi-dimensional integrated circuit industry data related to the evaluation target; Index system construction module, used to build a comprehensive evaluation index system for the integrated circuit industry; A calculation module, used to calculate each indicator in the comprehensive evaluation indicator system using the collected data to obtain a single indicator result; The weight acquisition module is used to determine the maximum value of each indicator in the city, perform linear regression analysis, and obtain the indicator weight; The evaluation result output module is used to perform weighted summation on the results of the individual indicators to obtain a comprehensive evaluation result of the city-level integrated circuit industry.

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