Electronic equipment storage room temperature abnormity early warning method and system

Abstract

The invention provides an electronic equipment storage room temperature abnormity early warning method and system. The method comprises the following steps: determining a first target temperature threshold according to attribute information of electronic equipment stored in an electronic equipment storage room; first temperature data of the electronic equipment storage room in the closed state are measured, whether the first temperature data exceed a first target temperature threshold value or not is judged, and if yes, a temperature abnormity early warning signal is generated; measuring second temperature data of the electronic equipment storage room in the doorway area in the open state, and determining a second target temperature threshold according to the second temperature data and the first temperature data; and measuring third temperature data when the electronic equipment storage room recovers to the closed state, judging whether the third temperature data exceeds a second target temperature threshold value or not, and if yes, generating a temperature abnormity early warning signal. The appropriate temperature threshold value can be dynamically determined according to the actual condition of the electronic equipment storage room, and the false alarm rate is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of temperature monitoring, and in particular to a method and system for early warning of abnormal temperature in an electronic equipment storage room. Background Art

[0002] The electronic equipment storage room is a dedicated space for storing various electronic equipment. In order to ensure that the electronic equipment in the electronic equipment storage room is stored in a suitable temperature environment, it is necessary to monitor the temperature in the electronic equipment storage room in real time and issue early warnings for abnormal temperatures.

[0003] Existing methods all identify and alarm temperature anomalies based on fixed temperature thresholds. This method is not flexible enough and does not take into account some actual conditions in electronic equipment storage rooms, resulting in unnecessary temperature anomaly warnings, which needs to be improved. Summary of the invention

[0004] In order to solve the technical problems existing in the above-mentioned background technology, the present invention provides a method, system, electronic equipment, computer storage medium and computer program product for early warning of abnormal temperature in an electronic equipment storage room.

[0005] The present invention provides a method for early warning of abnormal temperature in an electronic equipment storage room, the method comprising the following steps: photographing attribute information of electronic devices stored in the electronic device storage room, determining a plurality of temperature thresholds according to the attribute information, and taking the minimum temperature threshold as a first target temperature threshold; Measuring first temperature data of the electronic equipment storage room in a closed state, determining whether the first temperature data exceeds a first target temperature threshold, and if so, generating a temperature abnormality warning signal; Measuring second temperature data of a door area of ​​the electronic equipment storage room when the room is open, and determining a second target temperature threshold value according to the second temperature data and the first temperature data; The third temperature data of the electronic equipment storage room is measured when the electronic equipment storage room is restored to the closed state, and it is determined whether the third temperature data exceeds the second target temperature threshold. If so, a temperature abnormality warning signal is generated.

[0006] Optionally, photographing attribute information of electronic devices stored in the electronic device storage room, and determining several temperature thresholds according to the attribute information, includes: Using a high-resolution camera to photograph all electronic devices in the electronic device storage room, and extracting key attribute information of each electronic device based on the photographed images, the key attribute information includes device type, model, power, and heat dissipation method; The upper limit and lower limit of the safe operating temperature range of each electronic device are evaluated based on the key attribute information, and the upper limit of the safe operating temperature range is determined as the temperature threshold of the corresponding electronic device.

[0007] Optionally, measuring second temperature data of a door area of ​​the electronic equipment storage room when the electronic equipment storage room is open, and determining a second target temperature threshold according to the second temperature data and the first temperature data, comprises: When it is detected according to the captured image that the electronic equipment storage room is switched to an open state, a temperature measuring device located in the door area is controlled to start to measure the second temperature data; A second target temperature threshold is determined according to a temperature difference between the second temperature data and the first temperature data.

[0008] Optionally, determining the second target temperature threshold according to the temperature difference between the second temperature data and the first temperature data includes: Calculating a temperature difference between the second temperature data and the first temperature data; If the temperature difference is a negative value, setting the second target temperature threshold to the first target temperature threshold; If the temperature difference is a positive value, the second target temperature threshold is set to be the sum of the first target temperature threshold and the temperature adjustment value.

[0009] Optionally, the temperature adjustment value is determined by: The temperature adjustment value is obtained according to the size of the temperature difference and the corresponding positive correlation comparison relationship.

[0010] Optionally, the method further includes: Inputting the working parameters of the temperature control system of the electronic equipment storage room, the second temperature data, and the first temperature data into a temperature control duration prediction model based on a large model, and the temperature control duration prediction model outputs a predicted temperature control duration; When the temperature control time is accumulated after the electronic equipment storage room is switched back to the closed state, the fourth temperature data of the electronic equipment storage room is measured to determine whether the fourth temperature data exceeds the first target temperature threshold. If so, a temperature abnormality warning signal is generated.

[0011] The present invention also provides an abnormal temperature warning system for electronic equipment storage rooms, the system comprising a processing device and a storage device, the processing device calls and runs a computer program in the storage device to implement the following steps; photographing attribute information of electronic devices stored in the electronic device storage room, determining a plurality of temperature thresholds according to the attribute information, and taking the minimum temperature threshold as a first target temperature threshold; Measuring first temperature data of the electronic equipment storage room in a closed state, determining whether the first temperature data exceeds a first target temperature threshold, and if so, generating a temperature abnormality warning signal; Measuring second temperature data of a door area of ​​the electronic equipment storage room when the room is open, and determining a second target temperature threshold value according to the second temperature data and the first temperature data; The third temperature data of the electronic equipment storage room is measured when the electronic equipment storage room is restored to the closed state, and it is determined whether the third temperature data exceeds the second target temperature threshold. If so, a temperature abnormality warning signal is generated.

[0012] The present invention also provides an electronic device, comprising: a memory storing executable program code; a processor coupled to the memory; the processor calls the executable program code stored in the memory to execute any of the methods described above.

[0013] The present invention also provides a computer storage medium, on which a computer program is stored. When the computer program is executed by a processor, any of the above methods is executed.

[0014] The present invention also provides a computer program product, which includes a computer program stored in a computer storage medium, and when the computer program is executed by a processor of an electronic device, it implements any of the methods described above.

[0015] The beneficial effects of the present invention are at least: Compared with the prior art, the solution of the present invention can dynamically determine the appropriate temperature threshold based on the actual situation of the electronic equipment storage room, including the attribute information of the electronic equipment and the opening and closing status of the electronic equipment storage room, thereby achieving more accurate temperature abnormality warning and reducing the false alarm rate. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 The present invention is a schematic diagram of a method for early warning of abnormal temperature in an electronic equipment storage room disclosed in an embodiment of the present invention.

[0018] Figure 2 The present invention is a schematic diagram of an abnormal temperature warning system for an electronic equipment storage room disclosed in an embodiment of the present invention. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0020] The electronic equipment storage room is a dedicated space for storing various electronic equipment. In order to ensure that the electronic equipment in the electronic equipment storage room is stored in a suitable temperature environment, it is necessary to monitor the temperature in the electronic equipment storage room in real time and issue early warnings for abnormal temperatures.

[0021] Existing methods all identify and alarm temperature anomalies based on fixed temperature thresholds. This method is not flexible enough and does not take into account some actual conditions in electronic equipment storage rooms, resulting in unnecessary temperature anomaly warnings, which needs to be improved.

[0022] For the above technical issues, please refer to Figure 1 The embodiment of the present invention discloses a method for early warning of abnormal temperature in an electronic equipment storage room, the method comprising the following steps: photographing attribute information of electronic devices stored in the electronic device storage room, determining a plurality of temperature thresholds according to the attribute information, and taking the minimum temperature threshold as a first target temperature threshold; Measuring first temperature data of the electronic equipment storage room in a closed state, determining whether the first temperature data exceeds a first target temperature threshold, and if so, generating a temperature abnormality warning signal; Measuring second temperature data of a door area of ​​the electronic equipment storage room when the room is open, and determining a second target temperature threshold value according to the second temperature data and the first temperature data; The third temperature data of the electronic equipment storage room is measured when the electronic equipment storage room is restored to the closed state, and it is determined whether the third temperature data exceeds the second target temperature threshold. If so, a temperature abnormality warning signal is generated.

[0023] The present invention includes two parts for identifying and warning of temperature anomalies in electronic equipment storage rooms. Namely, when the electronic equipment storage room is in a closed state, the temperature in the electronic equipment storage room is basically only affected by internal factors, such as the heat emitted by the stored electronic equipment. At this time, it is judged whether there is a temperature anomaly based on the first target temperature threshold; and when the electronic equipment storage room is in an open-closed state, the temperature in the electronic equipment storage room is not only affected by internal factors, but also by the external space of the electronic equipment storage room. For example, the temperature in the external space is higher than the temperature in the electronic equipment storage room. At this time, it is judged whether there is a temperature anomaly based on the second target temperature threshold.

[0024] The second target temperature threshold is determined by measuring second temperature data located at the door area when the electronic equipment storage room enters an open state from a closed state, and determining the second target temperature threshold based on the second temperature data and the first temperature data.

[0025] Compared with the prior art, the solution of the present invention can dynamically determine the appropriate temperature threshold based on the actual situation of the electronic equipment storage room, including the attribute information of the electronic equipment and the opening and closing status of the electronic equipment storage room, thereby achieving more accurate temperature abnormality warning and reducing the false alarm rate.

[0026] Optionally, photographing attribute information of electronic devices stored in the electronic device storage room, and determining several temperature thresholds according to the attribute information, includes: Using a high-resolution camera to photograph all electronic devices in the electronic device storage room, and extracting key attribute information of each electronic device based on the photographed images, the key attribute information includes device type, model, power, and heat dissipation method; The upper limit and lower limit of the safe operating temperature range of each electronic device are evaluated based on the key attribute information, and the upper limit of the safe operating temperature range is determined as the temperature threshold of the corresponding electronic device.

[0027] In this embodiment, a high-resolution camera is provided in the electronic equipment storage room. Based on the images captured by the high-resolution camera, key attribute information of each electronic equipment can be extracted. The key attribute information includes device type, model, power, and heat dissipation method. These key attribute information can reflect the properties of the electronic equipment. These key attribute information are evaluated using a preset evaluation algorithm or evaluation model, that is, the upper and lower limits of the safe operating temperature range of each electronic equipment are obtained, and the upper limit of the safe operating temperature range is determined as the temperature threshold of the corresponding electronic equipment. For example, for devices that are sensitive to temperature and easily damaged, their temperature threshold will be lowered.

[0028] Optionally, measuring second temperature data of a door area of ​​the electronic equipment storage room when the electronic equipment storage room is open, and determining a second target temperature threshold according to the second temperature data and the first temperature data, comprises: When it is detected according to the captured image that the electronic equipment storage room is switched to an open state, a temperature measuring device located in the door area is controlled to start to measure the second temperature data; A second target temperature threshold is determined according to a temperature difference between the second temperature data and the first temperature data.

[0029] In this embodiment, a temperature measuring device is arranged at the door area of ​​the electronic device storage room. When it is detected from the captured image that the electronic device storage room is switched to an open state, the temperature measuring device located at the door area is controlled to start to measure and obtain the second temperature data. The second temperature data can be used to characterize the temperature of the external area of ​​the electronic device storage room. Then, the second target temperature threshold can be determined based on the temperature difference between the second temperature data and the first temperature data.

[0030] Optionally, determining the second target temperature threshold according to the temperature difference between the second temperature data and the first temperature data includes: Calculating a temperature difference between the second temperature data and the first temperature data; If the temperature difference is a negative value, setting the second target temperature threshold to the first target temperature threshold; If the temperature difference is a positive value, the second target temperature threshold is set to be the sum of the first target temperature threshold and the temperature adjustment value.

[0031] In this embodiment, after measuring the second temperature data located at the door area of ​​the electronic equipment storage room, the temperature difference between the second temperature data and the first temperature data can be calculated, and the temperature difference represents the difference between the temperature inside and outside the electronic equipment storage room. If the temperature difference is a negative value, it means that the temperature of the outer area of ​​the electronic equipment storage room is lower than the temperature of the inner area. At this time, the temperature of the outer area will not cause the abnormal increase of the temperature inside the electronic equipment storage room, and the second target temperature threshold is set to the first target temperature threshold accordingly. If the temperature difference is a positive value, it means that the temperature of the outer area of ​​the electronic equipment storage room is higher than the temperature of the inner area, and the "high temperature" of the outer area will cause the temperature inside the electronic equipment storage room to temporarily increase. At this time, the second target temperature threshold is set to the sum of the first target temperature threshold and the temperature adjustment value. Since the increase in the temperature inside the electronic equipment storage room caused by the "high temperature" of the outer area is temporary, the temperature control system in the electronic equipment storage room will quickly lower the temperature inside, so it is necessary to appropriately increase the first target temperature threshold to the second target temperature threshold to reduce unnecessary temperature abnormality warnings during the control period of the temperature control system.

[0032] Optionally, the temperature adjustment value is determined by: The temperature adjustment value is obtained according to the size of the temperature difference and the corresponding positive correlation comparison relationship.

[0033] In this embodiment, the comparison relationship between multiple sets of temperature difference values ​​and temperature adjustment values ​​is determined in advance, that is, the first temperature data is fixed, and multiple higher second temperature data are gradually changed. At this time, the door of the electronic equipment storage room is opened to make it open, and then the door of the electronic equipment storage room is closed to make it closed. At this time, the temperature rise value in the electronic equipment storage room is measured, that is, the temperature adjustment value. Among them, the duration of each opening and closing of the door of the electronic equipment storage room can be a fixed value.

[0034] The above positive correlation comparison relationship can be a comparison table.

[0035] Optionally, the method further includes: Inputting the working parameters of the temperature control system of the electronic equipment storage room, the second temperature data, and the first temperature data into a temperature control duration prediction model based on a large model, and the temperature control duration prediction model outputs a predicted temperature control duration; When the temperature control time is accumulated after the electronic equipment storage room is switched back to the closed state, the fourth temperature data of the electronic equipment storage room is measured to determine whether the fourth temperature data exceeds the first target temperature threshold. If so, a temperature abnormality warning signal is generated.

[0036] In this embodiment, after the electronic equipment storage room is switched to be restored to the closed state, since the temperature in the electronic equipment storage room is increased, the temperature control system configured at this time is started to reduce the temperature of the electronic equipment storage room to a suitable temperature range. Based on this, the present invention is configured to use a large model-based temperature control duration prediction model to extract features and analyze and predict the working parameters, second temperature data, and first temperature data of the temperature control system of the electronic equipment storage room to obtain the temperature control duration. The temperature control duration is the time it takes for the temperature control system configured in the electronic equipment storage room to reduce the temperature in the electronic equipment storage room to a suitable temperature range after it is started.

[0037] Therefore, when the temperature control time is reached, the temperature measuring device can be controlled to measure the fourth temperature data in the electronic equipment storage room, and determine whether the fourth temperature data exceeds the first target temperature threshold. If so, a temperature abnormality warning signal is generated.

[0038] See also Figure 2As shown, an embodiment of the present invention further provides an abnormal temperature warning system for an electronic equipment storage room, the system comprising a processing device and a storage device, the processing device calls and runs a computer program in the storage device to implement the following steps; photographing attribute information of electronic devices stored in the electronic device storage room, determining a plurality of temperature thresholds according to the attribute information, and taking the minimum temperature threshold as a first target temperature threshold; Measuring first temperature data of the electronic equipment storage room in a closed state, determining whether the first temperature data exceeds a first target temperature threshold, and if so, generating a temperature abnormality warning signal; Measuring second temperature data of a door area of ​​the electronic equipment storage room when the room is open, and determining a second target temperature threshold value according to the second temperature data and the first temperature data; The third temperature data of the electronic equipment storage room is measured when the electronic equipment storage room is restored to the closed state, and it is determined whether the third temperature data exceeds the second target temperature threshold. If so, a temperature abnormality warning signal is generated.

[0039] An embodiment of the present invention further provides an electronic device, comprising: a memory storing executable program code; a processor coupled to the memory; the processor calls the executable program code stored in the memory to execute the method described in any of the above embodiments.

[0040] An embodiment of the present invention further provides a computer storage medium, on which a computer program is stored. When the computer program is executed by a processor, the method described in any of the above embodiments is executed.

[0041] An embodiment of the present invention further provides a computer program product, which includes a computer program stored in a computer storage medium, and when the computer program is executed by a processor of an electronic device, the method described in any of the above embodiments is implemented.

[0042] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (apparatus), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0043] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0044] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0045] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed by the present invention should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A method for early warning of abnormal temperature in an electronic equipment storage room, characterized in that: The method comprises the following steps: photographing attribute information of electronic devices stored in the electronic device storage room, determining a number of temperature thresholds based on the attribute information, and taking the minimum temperature threshold as a first target temperature threshold; Measuring first temperature data of the electronic equipment storage room in a closed state, determining whether the first temperature data exceeds a first target temperature threshold, and if so, generating a temperature abnormality warning signal; Measuring second temperature data of a door area of ​​the electronic equipment storage room when the room is open, and determining a second target temperature threshold value according to the second temperature data and the first temperature data; The third temperature data of the electronic equipment storage room is measured when the electronic equipment storage room is restored to the closed state, and it is determined whether the third temperature data exceeds the second target temperature threshold. If so, a temperature abnormality warning signal is generated.

2. The method for early warning of abnormal temperature in an electronic equipment storage room according to claim 1, characterized in that: The capturing of attribute information of the electronic devices stored in the electronic device storage room and determining a plurality of temperature thresholds according to the attribute information include: Using a high-resolution camera to photograph all electronic devices in the electronic device storage room, and extracting key attribute information of each electronic device based on the photographed images, the key attribute information includes device type, model, power, and heat dissipation method; The upper limit and lower limit of the safe operating temperature range of each electronic device are evaluated based on the key attribute information, and the upper limit of the safe operating temperature range is determined as the temperature threshold of the corresponding electronic device.

3. The method for early warning of abnormal temperature in an electronic equipment storage room according to claim 2, characterized in that: Measuring second temperature data of a door area of ​​the electronic equipment storage room when the room is open, and determining a second target temperature threshold according to the second temperature data and the first temperature data, including: When it is detected according to the captured image that the electronic equipment storage room is switched to an open state, a temperature measuring device located in the door area is controlled to start to measure the second temperature data; A second target temperature threshold is determined according to a temperature difference between the second temperature data and the first temperature data.

4. The method for early warning of abnormal temperature in an electronic equipment storage room according to claim 3, characterized in that: The determining a second target temperature threshold according to the temperature difference between the second temperature data and the first temperature data comprises: Calculating a temperature difference between the second temperature data and the first temperature data; If the temperature difference is a negative value, setting the second target temperature threshold to the first target temperature threshold; If the temperature difference is a positive value, the second target temperature threshold is set to be the sum of the first target temperature threshold and the temperature adjustment value.

5. The method for early warning of abnormal temperature in an electronic equipment storage room according to claim 4, characterized in that: The temperature adjustment value is determined by: The temperature adjustment value is obtained according to the size of the temperature difference and the corresponding positive correlation comparison relationship.

6. The method for early warning of abnormal temperature in an electronic equipment storage room according to claim 1, characterized in that: The method further comprises: Inputting the working parameters of the temperature control system of the electronic equipment storage room, the second temperature data, and the first temperature data into a temperature control duration prediction model based on a large model, and the temperature control duration prediction model outputs a predicted temperature control duration; When the temperature control time is accumulated after the electronic equipment storage room is switched back to the closed state, the fourth temperature data of the electronic equipment storage room is measured to determine whether the fourth temperature data exceeds the first target temperature threshold. If so, a temperature abnormality warning signal is generated.

7. An abnormal temperature warning system for electronic equipment storage room, the system comprising a processing device and a storage device, characterized in that: The processing device calls and runs the computer program in the storage device to implement the following steps: photographing attribute information of electronic devices stored in the electronic device storage room, determining a number of temperature thresholds based on the attribute information, and taking the minimum temperature threshold as a first target temperature threshold; Measuring first temperature data of the electronic equipment storage room in a closed state, determining whether the first temperature data exceeds a first target temperature threshold, and if so, generating a temperature abnormality warning signal; Measuring second temperature data of a door area of ​​the electronic equipment storage room when the room is open, and determining a second target temperature threshold value according to the second temperature data and the first temperature data; The third temperature data of the electronic equipment storage room is measured when the electronic equipment storage room is restored to the closed state, and it is determined whether the third temperature data exceeds the second target temperature threshold. If so, a temperature abnormality warning signal is generated.

8. An electronic device comprising: A memory storing executable program code; A processor coupled to the memory; characterized in that: the processor calls the executable program code stored in the memory to execute the method according to any one of claims 1-6.

9. A computer storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 6 is executed.

10. A computer program product, comprising a computer program stored in a computer storage medium, characterized in that: When the computer program is executed by a processor of an electronic device, the method according to any one of claims 1 to 6 is implemented.

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