Test program generation method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention discloses a test program generation method and device, electronic equipment and a storage medium. The method comprises the steps that a minimum repeatable test unit of a test process and multiple groups of expansion conditions of the minimum repeatable test unit are acquired, and the minimum repeatable test unit meets predefined conditions of minimum, repeatability and complexity; expanding the corresponding minimum repeatable test unit into a plurality of test examples according to the obtained multiple groups of expansion conditions; and integrating the plurality of test examples obtained by expansion to generate a complete test program. The technical scheme provided by the embodiment of the invention can be suitable for a semiconductor chip test scene, the development efficiency and quality of a test program can be improved, manual errors are reduced, and the expandability and consistency of the test program are enhanced.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and particularly to a method, device, electronic device, and storage medium for generating test programs. Background Art

[0002] With the rapid development of large-scale integrated circuit technology, the development and debugging of chip test programs have become particularly important. The core purpose of chip testing is to ensure that the quality and performance of the chip can meet the expected standards, so as to meet a wide range of application requirements.

[0003] However, there are some significant problems in the current methods for developing chip test programs. A common approach is to create a new test program from scratch, which results in high labor costs, complex development and debugging processes, and since there is a lack of unified data formats and naming rules, the quality of the test program largely depends on the individual capabilities and experience levels of the developers. Another approach is to generate a new test program by copying and modifying an existing reference test program. Although this method can speed up the development to a certain extent, it also faces some problems, such as poor scalability, lack of support for automated expansion, prone to errors during manual modification, and inconsistent data formats and naming rules making it difficult to perform effective data comparison between multiple projects.

[0004] In summary, the problems existing in the prior art in the development of chip test programs seriously restrict the efficiency and quality of chip testing, and there is an urgent need to seek improvement solutions to address this challenge. Summary of the Invention

[0005] In view of this, embodiments of the present invention provide a method, device, electronic device, and storage medium for generating test programs to improve the development efficiency of test programs and enhance the consistency of test programs.

[0006] In a first aspect, embodiments of the present invention provide a method for generating a test program, including: Obtaining the minimum repeatable test unit of a test process and multiple sets of extension conditions, where the minimum repeatable test unit meets predefined minimum, repeatable, and complexity conditions; According to the obtained multiple sets of extension conditions, expanding the corresponding minimum repeatable test unit into multiple test instances; Integrating the multiple test instances obtained by expansion to generate a complete test program.

[0007] Further, the step of expanding the corresponding minimum repeatable test unit into multiple test instances according to the obtained multiple sets of extension conditions includes: Reading the minimum repeatable test unit and a set of extension conditions; Instantiate the minimum repeatable test unit according to the read expansion conditions to expand it into a test instance corresponding to the set of expansion conditions.

[0008] Furthermore, the file format of the minimum repeatable test unit is the format supported by the existing test process integration tool of the test platform. Integrate the multiple test instances obtained by the integration expansion to generate a complete test program, including: reuse the existing test process integration tool of the test platform to integrate the multiple test instances obtained by the integration expansion to generate a complete test program.

[0009] Furthermore, expanding the corresponding minimum repeatable test unit into multiple test instances and integrating the multiple test instances obtained by the integration expansion to generate a complete test program includes: calling the pre-created development program automatic generation tool to expand the minimum repeatable test unit into multiple test instances and integrate them in the same interface and format as the test item to generate a complete test program.

[0010] Furthermore, the test process includes testing multiple low dropout regulators in the system-on-chip.

[0011] In a second aspect, an embodiment of the present invention provides a test program generation device, including: An acquisition module, configured to acquire the minimum repeatable test unit of the test process and its multiple sets of expansion conditions, where the minimum repeatable test unit satisfies the predefined minimum, repeatable, and complexity conditions; An expansion module, configured to expand the corresponding minimum repeatable test unit into multiple test instances according to the acquired multiple sets of expansion conditions; An integration module, configured to integrate the multiple test instances obtained by the expansion to generate a complete test program.

[0012] Furthermore, the expansion module is specifically configured to: read the minimum repeatable test unit and a set of expansion conditions; instantiate the minimum repeatable test unit according to the read expansion conditions to expand it into a test instance corresponding to the set of expansion conditions.

[0013] Furthermore, the file format of the minimum repeatable test unit is the format supported by the existing test process integration tool of the test platform. The integration module is specifically configured to: reuse the existing test process integration tool of the test platform to integrate the multiple test instances obtained by the expansion to generate a complete test program.

[0014] Furthermore, the expansion module is specifically configured to: call the pre-created development program automatic generation tool to expand the minimum repeatable test unit into multiple test instances in the same interface and format as the test item; The integration module is specifically configured to: call a pre-created development program automatic generation tool to integrate multiple test instances obtained by extension in the same interface and format as the test items, so as to generate a complete test program.

[0015] Further, the test process includes testing multiple low-dropout linear regulators in a system-on-chip.

[0016] In a third aspect, an embodiment of the present invention provides an electronic device, which includes: a housing, a processor, a memory, a circuit board, and a power supply circuit. Wherein, the circuit board is arranged inside the space surrounded by the housing, and the processor and the memory are arranged on the circuit board; the power supply circuit is used to supply power to each circuit or device of the above-mentioned electronic device; the memory is used to store executable program codes; the processor runs a program corresponding to the executable program codes by reading the executable program codes stored in the memory, and is used to execute the test program generation method described in the first aspect above.

[0017] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, which stores one or more programs, and the one or more programs can be executed by one or more central processing units to implement the test program generation method described in the first aspect above.

[0018] The technical solution provided by the embodiment of the present invention abstracts the smallest repeatable test unit from the test process, and uses multiple sets of extension conditions to automatically extend such units to obtain a series of test instances, and finally integrates them into a complete test program, which can effectively reduce the time for creating the test program and improve the consistency of the test program. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0020] Figure 1 It is a schematic flowchart of the test program generation method provided in Embodiment 1 of the present invention; Figure 2 It is a design schematic diagram of the test program generation method provided in Embodiment 2 of the present invention; Figure 3 It is a schematic diagram of the LDO test process provided in Embodiment 2 of the present invention; Figure 4 It is a schematic structural diagram of the test program generation device provided in Embodiment 3 of the present invention; Figure 5 Schematic diagram of the structure of the electronic device provided by the embodiment of the present invention. Detailed implementation manners

[0021] The embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0022] It should be clear that the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts belong to the scope of protection of the present invention.

[0023] Next, the technical solutions of the present invention will be introduced in detail through various embodiments.

[0024] Embodiment 1 This embodiment provides a method for generating a test program. This method can be executed by a corresponding test program generation device, and this device can be integrated on a test platform. Refer to Figure 1 , and this method specifically includes the following steps 101-103.

[0025] Step 101: Obtain the minimum repeatable test unit of the test process and multiple sets of extended conditions thereof.

[0026] In this step, the test process can include the tests of the same product at different test sites or stages, or the tests of the same functional modules in different products. The minimum repeatable test unit is a test program construction unit for a specific functional module in the test process, and needs to meet the predefined minimum, repeatable and complex conditions. Among them: The minimum means that the minimum repeatable test unit is concise, complete and effective, and is a basic test unit that can be executed independently and ensure the correctness of the function to be tested; Repeatability means that by inputting different extended conditions, the same test unit can be extended into multiple test instances applicable to multiple similar functional modules, so that the test unit can be executed multiple times in different situations to verify its consistency; Complexity is reflected in that the test unit includes multi-step operations to implement the test of complex functional modules. This test usually has tests with judgment branches, or requires the measurement of parameters under multiple conditions, etc., and cannot be completed by a simple test item.

[0027] It should be noted that there are essential differences between the minimum repeatable test unit and the test item, which can be specifically reflected in the following aspects: Complexity: The test item is usually a test of a single function point or a group of related function points, while the minimum repeatable test unit has a higher complexity, usually includes multiple test items, and can include logical control structures such as conditional judgments and loops; Scalability: The scalability of test items is low. Usually, different test items need to be created for different test scenarios. While the minimum repeatable test unit can be easily extended to different test scenarios by changing parameters. Application scenarios: Test items are suitable for simple function verification, while the minimum repeatable test unit is suitable for situations that require complex test processes, especially when testing multiple functional modules with similar characteristics.

[0028] The following is an example for illustration. Test item: To test the ability of a GPIO (General-Purpose Input / Output) pin of a SOC (System on Chip) to switch between high and low levels, a simple test item program can be written to complete it. Minimum repeatable test unit: For the LDO (Low Dropout Regulator) test process, since there may be multiple LDOs in a SOC and the characteristics of each LDO may be different, a series of complex tests need to be carried out, including measuring output voltage, current, etc. under different conditions. These tests can be organized into a minimum repeatable test unit and tested for different LDOs by changing input parameters (such as LDO name, output voltage signal name, etc.). The design of the minimum repeatable test unit is to meet more complex test requirements and achieve better scalability through parameterization. The extension conditions refer to the specific parameters that need to be input during the instantiation process of the minimum repeatable test unit, and this parameter determines the characteristics of the test instance. Different groups of extension conditions correspond to different specific parameters. For example, in the LDO test process, the extension conditions can include frequency, voltage, current, signal name, test vector name, input parameters of the test method, etc.

[0029] By changing the extension conditions, corresponding test instances can be generated for each LDO instance, thus realizing efficient and consistent test program development and maintenance.

[0030] In specific implementation, those skilled in the art can abstract the smallest repeatable test unit and its multiple sets of extended conditions from the test process in advance and write them into a configuration file, and then obtain this information by accessing the configuration file. Or, automatically generate the smallest repeatable test unit and its multiple sets of extended conditions, which may specifically include the following operations: parse the test process document to determine different functional modules in the test process; analyze each functional module to extract the test key points that can verify its correctness; analyze all test key points with a test complexity higher than the set threshold, and identify multiple test key points with similar test functions; determine the different input parameters and common test logic required for multiple test key points with similar test functions; obtain different sets of extended conditions according to the determined different input parameters; obtain the smallest repeatable test unit according to the determined common test logic.

[0031] Step 102: According to the multiple sets of extended conditions obtained, expand the corresponding smallest repeatable test unit into multiple test instances.

[0032] In this step, for each set of extended conditions, it can be applied to the smallest repeatable test unit to create a new test instance. Specifically, the smallest repeatable test unit and a set of extended conditions can be read; according to the read extended conditions, the smallest repeatable test unit is instantiated to be expanded into a test instance corresponding to this set of extended conditions. In this way, each test instance contains the test parameters of the smallest repeatable test unit under the function instance to be tested.

[0033] Step 103: Integrate the multiple test instances obtained by expansion to generate a complete test program.

[0034] After generating multiple test instances using multiple sets of extended conditions, these test instances need to be integrated into an ordered test process. It should be noted that in a complete test process, in addition to the test instances based on the smallest repeatable test unit, there may also be other types of test operations, such as specific test items, etc. Therefore, during the integration process, not only should the different test instances be arranged in the correct order, but also these test instances need to be integrated with other test operations such as test items to construct a complete and ordered test program. The integration in this embodiment has no fixed pattern and can be flexibly set according to specific situations.

[0035] Preferably, the file format of the minimum repeatable test unit adopts the format supported by the existing test process integration tool of the test platform. Multiple test instances also adopt this format, where the test instances can be expanded from the minimum repeatable test unit based on multiple sets of extended conditions by using an editing tool. Furthermore, the existing test process integration tool of the test platform is reused to integrate the multiple expanded test instances into a complete test program. This preferred method can make full use of the existing software resources of the test platform to efficiently integrate test instances.

[0036] Based on the above solution, a pre-created development program automatic generation tool can be called to expand and integrate the minimum repeatable test unit into multiple test instances in the same interface and format as the test items, so as to generate a complete test program. Test items are a well-known concept to test engineers and usually form the basis of the test process. The expansion of the minimum repeatable test unit and the integration of the multiple expanded test instances in this embodiment can be unified with the expansion and integration methods of test items to improve the program development efficiency. In this way, regardless of whether a complete test process includes test items, the created development program automatic generation tool can expand the test items and / or the minimum repeatable test unit in a unified manner, and then integrate the expansion results to obtain a complete test program.

[0037] Embodiment 2 This embodiment is based on the above embodiment and provides a preferred embodiment. Refer to Figure 2 , a test program generation method includes the following steps: Obtain the minimum repeatable test unit of the test process for each LDO inside the SOC and its multiple sets of extended conditions, such as the extended condition group A, extended condition group B, and extended condition group C in the figure; Use an editing tool to expand the corresponding minimum repeatable test unit into multiple test instances according to the obtained multiple sets of extended conditions. The examples in the figure are test instance a, test instance b, and test instance c; Reuse the existing test process integration tool of the test platform to integrate the multiple expanded test instances to generate a complete test program.

[0038] In this embodiment, multiple LDOs are integrated inside the SOC to supply power to different modules inside the SOC. During the SOC testing process, it is necessary to test each of the internally integrated LDOs. As the chip integration complexity increases, the number of LDOs inside the SOC also increases, from several to more than a dozen or even more. Each LDO is affected by the manufacturing process and has different linear parameters, and these parameters need to be fitted and calculated during the LDO test, and the corresponding Dacoffset (Digital-to-Analog Converter Offset) value when the output voltage is the target voltage value is recorded.

[0039] See Figure 3 , the test process for a single LDO includes: (1) Parameter initialization: Prepare for subsequent test steps; (2) Calibration of the on-chip voltage measurement module: Calibrate the on-chip voltage measurement module to ensure the accuracy of measurement; (3) LDO output voltage measurement @Dacoffset0: Call the on-chip voltage measurement module to measure the output voltage of the LDO when the Dacoffset value is the set first value; (4) LDO output voltage measurement @Dacoffset1: Call the on-chip voltage measurement module to measure the output voltage of the LDO when the Dacoffset value is the set second value; (5) LDO output voltage measurement @Dacoffset2: Call the on-chip voltage measurement module to measure the output voltage of the LDO when the Dacoffset value is the set third value; (6) Calculate the parameters of the LDO linear fitting curve: Use the linear regression method to fit the output voltage measurement data in the previous (3)-(5) to obtain the LDO linear fitting curve, and calculate the parameters of the LDO linear fitting curve; Among them, the LDO linear fitting curve describes the relationship between the LDO output voltage and the input conditions; this curve can be used to predict the LDO output voltage under other input conditions; the parameters of the curve can include the slope and / or intercept; the slope represents the rate of change of the output voltage with the input conditions, and the intercept represents the output voltage when the input conditions are zero; through these parameters, the performance and characteristics of the LDO can be understood; (7) Record the parameters: Record the parameters of the calculated LDO linear fitting curve; (8) Parameters meet expectations: Check whether the parameters of the calculated LDO linear fitting curve meet expectations; if they meet expectations (P), then proceed to the next step; if they do not meet expectations (F), then record the failure (Fail) information; (9) Calculate the Dacoffset value corresponding to the target voltage: If the parameters meet the expectations, based on the obtained LDO linear fitting curve, calculate the Dacoffset value corresponding to the target voltage; (10) Record the obtained Dacoffset value and write it into the configuration memory (Fuse): Record the Dacoffset value calculated in the above (9) and write it into the Fuse.

[0040] The above LDO test process has the following characteristics: It is streamlined to the minimum; it is repeatable, and each LDO test process is consistent; it is complex and cannot be completed in one test item. Therefore, for each LDO test process inside the SOC, a minimum repeatable test unit and multiple sets of extended conditions can be abstracted. The minimum repeatable test unit is used to provide basic function tests for the LDO, and its file format is the format supported by the existing test process integration tool of the test platform, such as.tf. The test instance obtained according to a set of extended conditions and the minimum repeatable test unit is used to provide a specific test process for an LDO. Among them, the extended conditions can be the following information of the LDO: LDO name: Used to identify each LDO instance; LDO output voltage signal name: Specify the signal name of the LDO output voltage; LDO test vector name: Determine the signal sequence used for testing.

[0041] Embodiment III This embodiment provides a test program generation device, which can be used to execute the test program generation method described in the embodiments of the present invention, and this device can be integrated on a test platform. See Figure 4 , and this device specifically includes the following modules: Acquisition module 401, used to acquire the minimum repeatable test unit of the test process and multiple sets of extended conditions, where the minimum repeatable test unit meets the predefined minimum, repeatable, and complex conditions; Expansion module 402, used to expand the corresponding minimum repeatable test unit into multiple test instances according to the acquired multiple sets of extended conditions; Integration module 403, used to integrate the multiple expanded test instances to generate a complete test program.

[0042] Specifically in implementation, the expansion module 402 can specifically be used to: read the minimum repeatable test unit and a set of extended conditions; according to the read extended conditions, instantiate the minimum repeatable test unit to expand it into a test instance corresponding to this set of extended conditions.

[0043] Preferably, the file format of the minimum repeatable test unit is a format supported by the existing test process integration tool of the test platform; The integration module 403 may be specifically configured to: reuse the existing test process integration tool of the test platform to integrate multiple test instances obtained by extension to generate a complete test program.

[0044] As a specific implementation manner, the extension module 402 may be specifically configured to: call a pre-created development program automatic generation tool to extend the minimum repeatable test unit to obtain multiple test instances in a unified interface and format with the test items; The integration module 403 may be specifically configured to: call a pre-created development program automatic generation tool to integrate multiple test instances obtained by extension in a unified interface and format with the test items to generate a complete test program.

[0045] Typically, the test process includes testing multiple low-dropout linear regulators in the SOC.

[0046] The test program generation device provided in this embodiment belongs to the same inventive concept as the foregoing method embodiment. For technical details not described in this embodiment, reference may be made to the relevant descriptions in the foregoing method embodiment, which will not be elaborated herein.

[0047] Figure 5 FIG. is a schematic structural diagram of an embodiment of an electronic device according to the present invention, which can implement the process of the method embodiment of the present invention. As Figure 5 shown, the above-mentioned electronic device may include: a housing 51, a processor 52, a memory 53, a circuit board 54, and a power supply circuit 55. Among them, the circuit board 54 is disposed inside the space surrounded by the housing 51, and the processor 52 and the memory 53 are disposed on the circuit board 54; the power supply circuit 55 is used to supply power to each circuit or device of the above-mentioned electronic device; the memory 53 is used to store executable program codes; the processor 52 runs a program corresponding to the executable program code by reading the executable program code stored in the memory 53, and is used to execute the test program generation method described in any of the foregoing embodiments.

[0048] For the specific execution process of the above steps by the processor 52 and the further steps executed by the processor 52 by running the executable program code, reference may be made to the description of the method embodiment of the present invention, which will not be elaborated herein.

[0049] This electronic device exists in various forms, including but not limited to: (1) Ultra-mobile personal computer devices: Such devices belong to the category of personal computers, have computing and processing functions, and generally also have the characteristics of mobile Internet access; such terminals include: PDA, MID, and UMPC devices, etc., such as iPad; (2) Server: A device that provides computing services. The server consists of a processor, hard disk, memory, system bus, etc. The server is similar to a general computer architecture, but due to the need to provide highly reliable services, it has higher requirements in terms of processing power, stability, reliability, security, scalability, manageability, etc.; (3) Other electronic devices with data processing and interaction functions.

[0050] Furthermore, an embodiment of the present invention also provides a computer-readable storage medium, which stores one or more programs, and the one or more programs can be executed by one or more central processing units to implement the test program generation method described in the foregoing embodiments.

[0051] In summary, the technical solution provided in this embodiment has the following advantages: By modularizing complex test processes, the scalability of the system is achieved, and errors and omissions that may be caused by manual operations are effectively avoided; Supports the creation of automated test processes, significantly reducing the time required for manually writing test programs; Enhances the consistency of test processes, ensuring that test programs for the same product are consistent among different sites, and at the same time ensuring the consistency of test programs for the same functional modules among different products.

[0052] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variation thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the element.

[0053] The term "and / or" in the embodiments of the present invention describes the association relationship of associated objects and indicates that three relationships may exist. For example, A and / or B may represent: A exists alone, A and B exist simultaneously, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects before and after.

[0054] Each embodiment in this specification is described in a related manner. For the same or similar parts among the embodiments, reference can be made to each other. The key point of each embodiment is to illustrate the differences from other embodiments.

[0055] In particular, for the apparatus embodiments, since they are basically similar to the method embodiments, the description is relatively simple. For the relevant parts, reference can be made to the partial description of the method embodiments.

[0056] For the convenience of description, the above-mentioned apparatus is described by dividing its functions into various units / modules. Of course, when implementing the present invention, the functions of each unit / module can be realized in the same or multiple software and / or hardware.

[0057] Those of ordinary skill in the art can understand that all or part of the processes in the above method embodiments can be completed by instructing relevant hardware through a computer program. The program can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the above method embodiments. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), a random access memory (RAM), or the like.

[0058] As mentioned above, the above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed by the present invention should be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. A test program generation method, characterized in that: The method comprises: Obtaining a minimum repeatable test unit of a test process and multiple sets of expansion conditions thereof, wherein the minimum repeatable test unit satisfies predefined minimum, repeatability and complexity conditions; According to the obtained multiple groups of expansion conditions, the corresponding minimum repeatable test unit is expanded into multiple test instances; Combine multiple test cases obtained through expansion to generate a complete test program.

2. The method according to claim 1, characterized in that The method further comprises: expanding the corresponding minimum repeatable test unit into multiple test instances according to the obtained multiple groups of expansion conditions, including: Read the minimum repeatable test unit and a set of extended conditions; According to the read extended conditions, the minimum repeatable test unit is instantiated to be extended into a test instance corresponding to the set of extended conditions.

3. The method according to claim 1, characterized in that The file format of the minimum repeatable test unit is a format supported by the existing test process integration tool of the test platform; The multiple test instances obtained by integration and expansion are used to generate a complete test program, including: reusing an existing test process integration tool of the test platform, integrating the multiple test instances obtained by integration and expansion, to generate a complete test program.

4. The method according to claim 1, characterized in that The corresponding minimum repeatable test unit is expanded into multiple test instances, and the multiple expanded test instances are integrated to generate a complete test program, including: Call the pre-created development program automatic generation tool, with a unified interface and format with the test items, to expand the minimum repeatable test unit to obtain multiple test instances and integrate them to generate a complete test program.

5. The method according to any one of claims 1 to 4, characterized in that: The test process includes testing a plurality of low voltage dropout linear regulators in a system-level chip.

6. A test program generating device, characterized in that: The device comprises: An acquisition module, used for acquiring a minimum repeatable test unit of a test process and a plurality of groups of extension conditions thereof, wherein the minimum repeatable test unit satisfies predefined minimum, repeatability and complexity conditions; An extension module is used to expand the corresponding minimum repeatable test unit into multiple test instances according to the obtained multiple groups of extension conditions; The integration module is used to integrate multiple test instances obtained through expansion to generate a complete test program.

7. The device according to claim 6, characterized in that The expansion module is specifically used for: Read the minimum repeatable test unit and a set of extended conditions; According to the read extended conditions, the minimum repeatable test unit is instantiated to be extended into a test instance corresponding to the set of extended conditions.

8. The device according to claim 6, characterized in that The file format of the minimum repeatable test unit is a format supported by the existing test process integration tool of the test platform; The integration module is specifically used to reuse the existing test process integration tool of the test platform, integrate and expand multiple test instances, and generate a complete test program.

9. The device according to claim 6, characterized in that The extension module is specifically used to: call a pre-created development program automatic generation tool to expand the minimum repeatable test unit to obtain multiple test instances with a unified interface and format with the test items; The integration module is specifically used to call a pre-created development program automatic generation tool to integrate multiple test instances obtained through expansion in an interface and format that is unified with the test items, so as to generate a complete test program.

10. The device according to any one of claims 6 to 9, characterized in that: The test process includes testing a plurality of low voltage dropout linear regulators in a system-level chip.

11. An electronic device, characterized in that: The electronic device comprises: a shell, a processor, a memory, a circuit board and a power supply circuit, wherein the circuit board is placed inside the space enclosed by the shell, and the processor and the memory are arranged on the circuit board; the power supply circuit is used to supply power to various circuits or devices of the above-mentioned electronic device; the memory is used to store executable program code; the processor runs the program corresponding to the executable program code by reading the executable program code stored in the memory, so as to execute the test program generation method described in any one of the preceding claims 1-5.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores one or more programs, and the one or more programs can be executed by one or more central processing units to implement the test program generation method described in any one of claims 1-5 above.

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