Power supply testing device and control method thereof
By designing a power supply test device for electronic products, the problem of low testing efficiency in some power supply outputs in electronic products requires additional control, and the function of simultaneous testing of multiple power supply networks is realized, and the testing efficiency is improved.
Patent Information
- Application Number
- CN202510328898.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-19
- Publication Date
- 2025-06-13
AI Technical Summary
During the multiple power supply tests of electronic products, some power outputs are generated once powered on, which requires additional enable control, resulting in low test efficiency.
A power supply testing device is designed, including a test vehicle and a test control component. The test control component is electrically connected to the test vehicle, and is used to establish a communication connection with the product to be tested, and to control multiple power output terminals of the product to be tested to output the voltage to be tested, collect and compare these voltages.
Through this device, there is no need to wait for some power networks to enable operations, and the power supply voltage output by multiple power networks in the product to be tested can be tested at the same time, improving the testing efficiency.
Smart Images
Figure CN120142995A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the technical field of power supply testing and detection, and particularly relates to a power supply testing device and a control method thereof. Background Art
[0002] For the actual situation of electronic products, the design quality of the power supply tree therein has a great impact on the power consumption and performance of the products. At the factory end, the reliability testing of multiple power supplies in electronic products is extremely important. However, in actual situations, the output of some power supplies in electronic products is not generated immediately when powered on, and additional enabling control is required. For example, some power supplies need the user to operate a certain triggering component to enter the output state. That is to say, during the testing process, it is often impossible to test the outputs of all power supplies in an electronic product at one time, resulting in low efficiency. Summary of the Invention
[0003] The main purpose of this application is to provide a power supply testing device and a control method thereof, aiming to improve the efficiency of testing multiple power supply networks in products.
[0004] To achieve the above purpose, this application proposes a power supply testing device, and the power supply testing device includes:
[0005] A test carrier, which is provided with a test position for placing a product to be tested;
[0006] A test control component, which is electrically connected to the test carrier;
[0007] The test control component is used to establish a communication connection with the product to be tested in the test position, and is also used to connect to multiple power output terminals in the product to be tested through the test position;
[0008] Among them, the test control component is further used to control the enabling of at least one power supply in the product to be tested in the test position, so that the product to be tested outputs multiple voltages to be tested respectively through its own multiple power output terminals;
[0009] The test control component is further used to collect multiple voltages to be tested and compare the voltages to be tested with a preset voltage.
[0010] Optionally, a plurality of conductive contacts are arranged in the test position, and the plurality of conductive contacts are electrically connected to the test control component;
[0011] When the product to be tested is placed in the test position, the multiple power output terminals of the product to be tested are electrically connected to the plurality of conductive contacts one by one, and the test control component is used to collect multiple voltages to be tested through the plurality of conductive contacts in the test position;
[0012] The test vehicle further includes: a first communication module, which is electrically connected to the test control component; the first communication module is used to establish a communication connection with the product under test in the test position;
[0013] The test control component is used to control at least one power enable in the product under test in the test position via the first communication module.
[0014] Optionally, the power test device further includes: a connection component, which is electrically connected to the plurality of conductive contacts and the test control component respectively;
[0015] The test control component is used to collect a plurality of the voltages to be measured via the connection component and the plurality of conductive contacts in the test position.
[0016] Optionally, the test control component includes:
[0017] A control circuit;
[0018] A sampling circuit, and a plurality of sampling terminals of the sampling circuit are respectively connected in one-to-one correspondence with a plurality of power output terminals of the product under test via the test position, and an output terminal of the sampling circuit is electrically connected to the control circuit;
[0019] Wherein, the control circuit is used to control at least one power enable in the product under test in the test position, so that the product under test respectively outputs a plurality of the voltages to be measured via its own plurality of power output terminals;
[0020] The control circuit is further used to collect a plurality of the voltages to be measured via the sampling circuit, and compare the voltages to be measured with a preset voltage.
[0021] Optionally, the sampling circuit includes: a plurality of analog-to-digital conversion circuits, and input ends of the plurality of analog-to-digital conversion circuits are respectively connected in one-to-one correspondence with a plurality of power output terminals of the product under test via the test position, and output ends of the plurality of analog-to-digital conversion circuits are respectively electrically connected to the control circuit;
[0022] The analog-to-digital conversion circuit is used to perform analog-to-digital conversion on the voltage to be measured input to its input end and then output it to the control circuit.
[0023] Optionally, the test control component further includes: a second communication module, which is electrically connected to the control circuit; the second communication module is used to establish a communication connection with an external terminal;
[0024] The control circuit is further configured to, when a test instruction sent by an external terminal is obtained through the second communication module, control at least one power supply of the product under test in the test position to be enabled, so that the product under test outputs a plurality of voltages to be measured respectively through its multiple power output terminals.
[0025] Optionally, the test control component further includes: an indicating component, and the indicating component is electrically connected to the control circuit;
[0026] The control circuit is further configured to control the indicating component to indicate the comparison result between the voltage to be measured and a preset voltage.
[0027] Optionally, the test vehicle further includes: a plurality of the test positions and a switching component;
[0028] The switching component is electrically connected to the plurality of test positions and the test control component respectively;
[0029] The switching component is configured to conduct an electrical connection path between any one of the test positions and the test control component.
[0030] The present application also provides a control method for a power supply test device. Based on the power supply test device described in any one of the above, the method includes:
[0031] The test control component controls at least one power supply of the product under test in the test position to be enabled, so that the product under test outputs a plurality of voltages to be measured respectively through its multiple power output terminals;
[0032] The test control component obtains the plurality of voltages to be measured, compares the voltages to be measured with a preset voltage, and indicates the comparison result.
[0033] Optionally, the test vehicle further includes: a plurality of the test positions and a switching component; the method further includes: the test control component controls the switching component to conduct an electrical connection path between any one of the test positions and the test control component.
[0034] In summary, the power supply testing device of the present application includes a testing carrier and a testing control component. Among them, the testing control component is electrically connected to the testing carrier, and the testing carrier is provided with a testing position for placing the product to be tested; the testing control component is used to establish a communication connection with the product to be tested in the testing position, and is also used to connect to multiple power output terminals in the product to be tested through the testing position; it is also used to control at least one power supply in the product to be tested in the testing position to be enabled, so that the product to be tested outputs multiple voltages to be tested respectively through its own multiple power output terminals; it is also used to collect multiple voltages to be tested and compare the voltages to be tested with a preset voltage. In this way, during the actual testing process of multiple power supply networks of the product to be tested, there is no need to wait for the process of enabling some power supply networks, so that the power supply testing device can simultaneously test the power supply voltages output by multiple power supply networks in the product to be tested, effectively improving the testing efficiency of multiple power supply networks in electronic products. BRIEF DESCRIPTION OF THE DRAWINGS
[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on the structures shown in these drawings.
[0036] Figure 1 Schematic diagram of the circuit module of an embodiment of the power supply testing device of the present application;
[0037] Figure 2 Schematic diagram of the circuit module of another embodiment of the power supply testing device of the present application;
[0038] Figure 3 Schematic diagram of the circuit module of yet another embodiment of the power supply testing device of the present application;
[0039] Figure 4 Schematic diagram of the circuit module of still another embodiment of the power supply testing device of the present application;
[0040] Figure 5 Schematic diagram of the circuit module of yet another embodiment of the power supply testing device of the present application;
[0041] Figure 6 Schematic diagram of the circuit module of another embodiment of the power supply testing device of the present application;
[0042] Figure 7 Schematic diagram of the process flow of an embodiment of the control method of the power supply testing device of the present application.
[0043] Explanation of the reference numerals in the drawings:
[0044] 10 Test vehicle 11 Test position 20 Test control component 12 Conductive contact 13 First communication module 30 Connection component 21 Sampling circuit 22 Control circuit 24 Indicator component 23 Second communication module 40 Switching component
[0045] The realization, functional features and advantages of the present application will be further described in conjunction with the embodiments with reference to the accompanying drawings. Detailed implementation manners
[0046] Next, the technical solutions in the embodiments of the present application will be clearly and completely described with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.
[0047] It should be noted that if there are directional indications (such as up, down, left, right, front, back...) involved in the embodiments of the present application, the directional indications are only used to explain the relative positional relationship and movement conditions between components in a specific posture. If the specific posture changes, the directional indications will also change accordingly.
[0048] In addition, if there are descriptions such as "first", "second", etc. involved in the embodiments of the present application, the descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one such feature. In addition, if "and / or" or "and / or" appears throughout the text, its meaning includes three parallel solutions. Taking "A and / or B" as an example, it includes solution A, solution B, or a solution that satisfies both A and B at the same time. In addition, the technical solutions between the embodiments can be combined with each other, but it must be based on the fact that those of ordinary skill in the art can implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the protection scope required by the present application.
[0049] For the actual situation of electronic products, the design quality of the power tree therein has a great impact on the product power consumption and performance. At the factory end, the reliability test of multiple power supplies in electronic products is extremely important. However, in actual situations, the output of some power supplies in electronic products is not generated immediately when powered on, and additional enabling control is required. For example, some power supplies need the user to operate a certain trigger component to enter the output state. That is to say, during the test process, it is often impossible to measure the output of all the power supplies in an electronic product at one time, and the efficiency is relatively low.
[0050] Therefore, referring to Figure 1 , the present application proposes a power supply test device, and the power supply test device includes:
[0051] Test vehicle 10, the test vehicle 10 is provided with a test position 11 for placing a product to be tested;
[0052] Test control component 20, the test control component 20 is electrically connected to the test vehicle 10;
[0053] The test control component 20 is used to establish a communication connection with the product to be tested in the test position 11, and is also used to connect to a plurality of power output terminals in the product to be tested through the test position 11;
[0054] Wherein, the test control component 20 is further used to control at least one power supply in the product to be tested in the test position 11 to be enabled, so that the product to be tested outputs a plurality of voltages to be tested respectively through its own plurality of power output terminals;
[0055] The test control component 20 is further used to collect a plurality of the voltages to be tested and compare the voltages to be tested with a preset voltage.
[0056] In this embodiment, the test vehicle 10 can be implemented by a test rack or a test mechanism such as a test rack for loading the product to be tested. Optionally, a test interface can be provided in the test position 11. When the product to be tested is placed in the test position 11, a specially provided test end thereon will access the test interface, so as to establish an electrical connection path between a plurality of power output terminals in the product to be tested through the test position 11 and the test control component 20. Optionally, in order to reduce the structural complexity and reduce the number and volume of devices for testing on the product to be tested, refer to Figure 2 , in one embodiment, a plurality of conductive contacts are provided in the test position 11, and the plurality of conductive contacts are electrically connected to the test control component 20; when the product to be tested is placed in the test position 11, a plurality of power output terminals of the product to be tested are electrically connected to the plurality of conductive contacts one by one, and the test control component 20 is used to collect a plurality of the voltages to be tested through the plurality of conductive contacts in the test position 11. In this embodiment, the conductive contacts can be implemented by devices such as conductive probes and conductive electrodes. It can be understood that during the design process of the R & D personnel for the circuit board of the product to be tested, a plurality of test pads can be provided on the board, and the plurality of test pads are electrically connected to the plurality of power output terminals one by one. At the same time, a plurality of conductive contacts are provided at positions corresponding to the plurality of test pads in the test position 11, so that when the product to be tested is placed in the test position 11, the plurality of test pads thereon will directly establish an electrical connection with the plurality of conductive contacts and establish an electrical connection path with the test control component 20 through the plurality of conductive contacts.
[0057] Optionally, in one embodiment, the test control component 20 can be electrically connected to at least one power enable terminal on the test control component 20 through the test bit 11 to establish communication. For example, at least one communication conductive contact correspondingly set in the above test bit 11 is electrically connected to at least one enable terminal to achieve communication. During the test, the test control component 20 can directly output corresponding at least one enable signal, such as a high-level signal corresponding to a high-level enable terminal, a low-level signal corresponding to a low-level enable terminal, etc., so as to force the product under test to output multiple voltages to be measured from its multiple power output terminals respectively.
[0058] Optionally, in another embodiment, refer to Figure 2 , the test vehicle 10 further includes: a first communication module, the first communication module is electrically connected to the test control component 20; the first communication module is used to establish a communication connection with the product under test in the test bit 11; the test control component 20 is used to control at least one power enable in the product under test in the test bit 11 through the first communication module.
[0059] In this embodiment, the first communication module can be implemented by a wired communication module, such as a USART communication module, a CAN communication module, an RS485 communication module, etc., or a wireless communication module, such as a Bluetooth communication module, a 4G / 5G communication module, etc. The control circuit 22 can establish a communication connection with the product under test through the first communication module. In this way, the product under test can control at least one of its own power enables by itself. Compared with the method of forcibly setting the voltage signal of at least one power enable terminal of the product under test in the above embodiment, the safety of the product under test is effectively guaranteed, and the situation of damage to the product under test caused by testing is reduced.
[0060] Optionally, in one embodiment, the power test device further includes: a connection component 30, the connection component 30 is electrically connected to the plurality of conductive contacts and the test control component 20 respectively; the test control component is used to collect the plurality of voltages to be measured through the connection component 30 and the plurality of conductive contacts in the test bit 11. In this embodiment, the connection component 30 can be implemented by a straight-through connector, a flexible cable, etc. The plurality of conductive contacts will establish an electrical connection path with the test control component 20 through the connection component 30, so as to output the plurality of voltages to be measured to the test control component 20. In this way, during the actual test, as a tester, only need to connect one end of a straight-through connector to the test vehicle 10 and the other end to the test control component 20, without the need to plug and unplug multiple wires, which improves the convenience of the test.
[0061] In this embodiment, the test control component 20 can be implemented by a control component with a main controller as the core. When the test control component 20 receives a test instruction sent by an external terminal or a test instruction sent by a trigger component triggered by a user, it will start to execute the test work, and through the test bit 11, at least one power supply in the product under test in the test bit 11 is enabled, so that the product under test outputs multiple voltages to be measured through its own multiple power output terminals respectively. In this way, during the test of the product under test, all the power supply networks on it will output voltages simultaneously, and there will be no situation where some power supply networks are delayed in output due to power enabling. Then, the test control component 20 will collect all the voltages to be measured, and then compare each voltage to be measured with the corresponding preset voltage (preset by R & D personnel). It can be understood that the number of preset voltages can be one, or multiple preset voltages with different voltage values. The preset voltage can be pre-stored in the test control component 20 by R & D personnel in advance, or can be temporarily assigned by an external terminal. During the test of any voltage to be measured, the test control component 20 will compare it with the corresponding preset voltage according to the preset comparison logic. For example, if the difference between the voltage to be measured and the preset voltage reaches the preset percentage of the preset voltage, such as ±5%, then the test control component 20 will determine that the current voltage to be measured is abnormal. Similarly, if it does not reach the preset percentage, then the test control component will determine that the current test voltage is normal. In this way, through the above settings, during the actual test of multiple power supply networks of the product under test, there is no need to wait for the process of enabling some power supply networks, so that the power test device can simultaneously test the power supply voltages output by multiple power supply networks in the product under test, effectively improving the efficiency of testing multiple power supply networks in electronic products.
[0062] Reference Figure 4 , in an embodiment of the present application, the test control component 20 includes:
[0063] A control circuit 22;
[0064] A sampling circuit 21, multiple sampling terminals of the sampling circuit 21 are respectively connected in one-to-one correspondence with multiple power output terminals of the product under test through the test bit 11, and an output terminal of the sampling circuit 21 is electrically connected to the control circuit 22;
[0065] Among them, the control circuit 22 is used to control at least one power supply in the product under test in the test bit 11 to be enabled, so that the product under test outputs multiple voltages to be measured through its own multiple power output terminals respectively;
[0066] The control circuit 22 is further used to collect multiple voltages to be measured through the sampling circuit 21 and compare the voltages to be measured with the preset voltage.
[0067] In this embodiment, optionally, the control circuit 22 can be implemented by a main controller, such as an MCU, a DSP (Digital Signal Process), an FPGA (Field Programmable Gate Array), a PLC, a SOC (System On Chip), etc.
[0068] Optionally, the sampling circuit 21 can be implemented by a voltage sampling chip, or the sampling circuit 21 can further include multiple analog-to-digital conversion circuits. The input ends of the multiple analog-to-digital conversion circuits are respectively and correspondingly connected to multiple power output ends of the product under test through the test bit 11, and the output ends of the multiple analog-to-digital conversion circuits are electrically connected to the control circuit 22; the analog-to-digital conversion circuit is used for performing analog-to-digital conversion on the voltage under test connected to its input end and then outputting it to the control circuit 22. Further, the analog-to-digital conversion circuit and the control circuit 22 can also be integrated and arranged in the same integrated chip to reduce the volume of the circuit.
[0069] Among them, when starting the test, the control circuit 22 will control the product under test through the first communication module electrically connected to it to control at least one of its power supplies to be enabled, so that the product under test starts to output multiple voltages under test through its own multiple power output ends respectively. Then each analog-to-digital conversion circuit will perform analog-to-digital conversion on the voltage under test it receives, that is, the voltage signal, into a digital signal and then output it to the control circuit 22 for the control circuit 22 to identify. Subsequently, the control circuit 22 will compare the identified multiple voltages under test with their corresponding multiple preset voltages to confirm the comparison result.
[0070] Further, referring to Figure 5 , in another embodiment of the present application, the test control component 20 further includes: an indication component 24, and the indication component 24 is electrically connected to the control circuit 22;
[0071] The control circuit 22 is further used to control the indication component 24 to indicate the comparison result between the voltage under test and the preset voltage.
[0072] In this embodiment, the indication component 24 can be implemented by a sound indication component 24, a display indication component 24, etc. After the control circuit 22 compares the multiple voltages under test with their respective corresponding preset voltages, it can indicate the comparison result through the indication component 24, so as to facilitate the tester or the R & D personnel to determine the current test result, thereby effectively improving the convenience of the test.
[0073] Further, referring to Figure 5, in an embodiment of the present application, the test control component 20 further includes: a second communication module 23, and the second communication module 23 is electrically connected to the control circuit 22; the second communication module 23 is used to establish a communication connection with an external terminal;
[0074] The control circuit 22 is further configured to, when obtaining a test instruction sent by an external terminal via the second communication module 23, control at least one power supply in the product under test in the test position 11 to be enabled, so that the product under test outputs a plurality of voltages to be measured respectively through its multiple power output terminals.
[0075] In this embodiment, the second communication module 23 can be implemented by the same embodiment as the above-mentioned first communication module. For example, the second communication module 23 is implemented by a wired gateway communication component, or a wireless Bluetooth, 4G / 5G communication component. The control circuit 22 can receive test instructions from an external terminal, such as a host computer, a cloud server, and a production line test terminal, via the second communication module 23, and perform the above-mentioned power supply test action on the product under test when the test instructions are received. Optionally, in an embodiment, when the external terminal outputs a test instruction, it can also output at least one preset voltage of the current product under test to the control circuit 22 and save it. Optionally, in another embodiment, during the process of performing the above-mentioned voltage comparison, the control circuit 22 can transmit the results of multiple voltage comparisons back to the external terminal via the second communication module 23 for protection by the external terminal and / or monitoring by testers and R & D personnel on the external terminal side.
[0076] Through the above settings, when testing a large number of electronic products, testers can issue test instructions to multiple power supply test devices simultaneously at the external terminal through multiple second communication modules 23, so that the multiple power supply test devices perform the power supply test work on the products under test, and receive the test results fed back by all power supply test devices at the external terminal, effectively improving the convenience of large-scale testing at the factory end.
[0077] It should be understood that during the actual testing process, generally a large number of electronic products need to be tested, so as to improve the testing efficiency.
[0078] Reference Figure 6 , in an implementation of the present application, the test carrier 10 further includes: a plurality of the test positions 11 and a switching component 40;
[0079] The switching component 40 is electrically connected to the plurality of test positions 11 and the test control component 20 respectively;
[0080] The switching component 40 is used to conduct the electrical connection path between any one of the test positions 11 and the test control component 20.
[0081] In this embodiment, the switching component 40 can be implemented by a switching circuit composed of multiple switching tubes, such as IGBT tubes, switching tubes, MOS tubes, and silicon carbide switching tubes, or by a switching array composed of multiple switching devices, such as relays and contactors, or directly by a switching switch device with a switching function, such as an electronic switch chip.
[0082] Based on the content of the above embodiment, when the product to be tested is placed at the test position 11, the power supply terminals of multiple products to be tested are electrically connected to the switching component 40 through the conductive contacts on the test position 11 respectively. The switching component 40 can conduct the path between any multiple conductive contacts on the test position 11 and the test control component 20.
[0083] Optionally, the switching component 40 can be controlled by the test control component 20. The test control component 20 will control the switching component 40 to switch according to a preset test sequence. After the test control component 20 finishes detecting the product to be tested for power supply test and indicates the result, it can switch the switching component 40 to the product to be tested on the next test position 11 after receiving a signal from an external terminal to switch to the next unit for testing or autonomously according to the preset test sequence. For example, if there are three current test positions 11, the paths between the three test positions 11 and the switching component 40 are Channel 1, Channel 2, and Channel 3 respectively. At the beginning of the test, the test control component 20 will control the switching component 40 to switch to conduct Channel 1 with itself to test the product to be tested corresponding to Channel 1. After the test is completed, it will then control the test control component 20 to switch to conduct Channel 2 with itself to test the product to be tested corresponding to Channel 2, and so on, thereby effectively improving the efficiency of testing a large number of electronic products and reducing the number of times of re-placing the products to be tested on the test position 11.
[0084] Optionally, the switching component 40 can also be manually triggered by the user. After the test control component 20 displays the current test result, the tester can trigger the switching component 40 to switch and conduct the path between the test position 11 required by the user and the test control component 20.
[0085] It can be understood that, optionally, in one embodiment, for the products under test in the multiple test bits 11, all of them will establish a communication connection with the first communication module (or there are multiple first communication modules, and multiple first communication modules establish communication connections with multiple products under test one by one), so that when the power supply test device starts testing, the power enables of all products under test will be controlled by the test control component 20 through the first communication module. With such a setting, when switching to any test bit 11 to establish an electrical connection path with the test control component 20, there is no need to perform an additional power enable control process, and multiple voltages under test can be directly tested, further improving the test efficiency.
[0086] Optionally, in another embodiment, in order to reduce the interface quantity pressure on the first communication module or reduce the number of first communication modules. The first communication module can also be electrically connected to the switching component 40, and conductive contacts for accessing the communication pins of the products under test can also be provided on the test bit 11. The conductive contacts are simultaneously electrically connected to the switching component 40. While the test bit 11 establishes an electrical connection path with the test control component 20 through the switching component 40, the product under test on the test bit 11 will also establish a communication connection with the first communication module through the conductive contacts and the switching component 40, so that the test control component 20 can establish a communication connection with the product under test that needs to be tested currently through the first communication module.
[0087] Reference Figure 7 , this application also proposes a control method for a power supply test device. Based on the power supply test device described in any one of the above, the method includes:
[0088] Step S100, the test control component controls the power enable of at least one of the products under test in the test bit, so that the products under test respectively output multiple voltages under test through their own multiple power output terminals;
[0089] Step S200, the test control component acquires the multiple voltages under test, compares the voltages under test with a preset voltage, and indicates the comparison result.
[0090] It should be noted that since the control method for the power supply test device in this application is based on the above power supply test device. Therefore, the control method for the power supply test device in this application also has all the technical effects brought by different technical solutions in the power supply test device, which will not be elaborated one by one here.
[0091] In this embodiment, the test control component can be implemented by a control component with a main controller as the core. When the test control component receives a test instruction sent by an external terminal or a test instruction transmitted by a trigger component triggered by a user, it will start to execute the test work, and based on the method of the above embodiment, at least one power supply of the product under test in the test position is enabled through test position control, so that the product under test outputs multiple voltages to be measured through its multiple power output terminals respectively. In this way, during the test of the product under test, all the power supply networks on it will output voltages simultaneously, and there will be no situation where some power supply networks are delayed in output due to power enabling.
[0092] Then, the test control component will collect all the voltages to be measured, and then compare each voltage to be measured with the corresponding preset voltage (preset by R & D personnel). It can be understood that the number of preset voltages can be one, or multiple preset voltages with different voltage values. The preset voltage can be pre-stored in the test control component by R & D personnel in advance, or temporarily assigned by an external terminal. During the test of any voltage to be measured, the test control component will compare it with the corresponding preset voltage according to the preset comparison logic. For example, if the difference between the voltage to be measured and the preset voltage reaches a preset percentage of the preset voltage, such as ±5%, then the test control component will determine that the current voltage to be measured is abnormal. Similarly, if it does not reach the preset percentage, then the test control component will determine that the current test voltage is normal. In this way, through the above settings, during the actual test of multiple power supply networks of the product under test, there is no need to wait for the process of enabling some power supply networks, and it is possible to simultaneously test the power supply voltages output by multiple power supply networks in the product under test, effectively improving the efficiency of testing multiple power supply networks in electronic products.
[0093] Furthermore, in another embodiment, the test carrier further includes: a plurality of the test positions and a switching component; the method further includes: the test control component controls the switching component to conduct the electrical connection path between any one of the test positions and the test control component.
[0094] In this embodiment, the switching component can be implemented by the above-mentioned multiple embodiments, which will not be elaborated here. After the test control component has completed the detection of the product under test that is currently undergoing a power test and indicated the result, it can control the switching component to switch to the product under test at the next test position after receiving a command from an external terminal to switch to the next unit for testing or autonomously according to a preset test sequence. For example, if there are three test positions currently, the paths between the three test positions and the switching component are Channel 1, Channel 2, and Channel 3 respectively. At the beginning of the test, the test control component will control the switching component to connect Channel 1 to itself to test the product under test corresponding to Channel 1. After the test is completed, it will then control the switching component to connect Channel 2 to itself to test the product under test corresponding to Channel 2, and so on, thereby effectively improving the efficiency of testing a large number of electronic products and reducing the number of times of repositioning the products under test on the test positions.
[0095] The above description is only an exemplary embodiment of the present application, and does not limit the patent scope of the present application. Any equivalent structural transformation made under the technical concept of the present application by using the content of the specification and drawings of the present application, or any direct / indirect application in other related technical fields, is included in the patent protection scope of the present application.
Claims
1. A power supply testing device, characterized in that: The power supply testing device comprises: A test carrier, wherein the test carrier is provided with a test position for placing a product to be tested; a test control component, the test control component being electrically connected to the test carrier; The test control component is used to establish a communication connection with the product to be tested in the test position, and is also used to connect to multiple power output terminals in the product to be tested through the test position; The test control component is further used to control at least one power supply of the product to be tested in the test position to enable, so that the product to be tested outputs a plurality of voltages to be tested through its own plurality of power supply output terminals; The test control component is also used to collect a plurality of the voltages to be tested and compare the voltages to be tested with a preset voltage.
2. The power supply testing device according to claim 1, characterized in that: A plurality of conductive contacts are provided in the test position, and the plurality of conductive contacts are electrically connected to the test control component; When the product to be tested is placed in the test position, multiple power output terminals of the product to be tested are electrically connected to the multiple conductive contacts in a one-to-one correspondence, and the test control component is used to collect the multiple voltages to be tested through the multiple conductive contacts of the test position; The test carrier further comprises: a first communication module, the first communication module being electrically connected to the test control component; the first communication module being used to establish a communication connection with the product to be tested in the test position; The test control component is used to control at least one power supply of the product to be tested in the test position to enable via the first communication module.
3. The power supply testing device according to claim 2, characterized in that: The power supply test device further comprises: a connection component, the connection component being electrically connected to the plurality of the conductive contacts and the test control component respectively; The test control component is used to collect the multiple voltages to be tested via the connection component and the multiple conductive contacts of the test position.
4. The power supply testing device according to claim 1, characterized in that: The test control component includes: Control circuit; A sampling circuit, wherein a plurality of sampling terminals of the sampling circuit are connected to a plurality of power supply output terminals of the product to be tested in a one-to-one correspondence via the test position, and an output terminal of the sampling circuit is electrically connected to the control circuit; Wherein, the control circuit is used to control at least one power supply of the product to be tested in the test position to enable, so that the product to be tested outputs a plurality of the voltages to be tested respectively through its own plurality of power supply output terminals; The control circuit is further used for collecting a plurality of the voltages to be measured via the sampling circuit, and comparing the voltages to be measured with a preset voltage.
5. The power supply testing device according to claim 4, characterized in that: The sampling circuit comprises: a plurality of analog-to-digital conversion circuits, the input ends of the plurality of analog-to-digital conversion circuits are respectively connected to a plurality of power supply output ends of the product to be tested via the test bits in a one-to-one correspondence, and the output ends of the plurality of analog-to-digital conversion circuits are respectively electrically connected to the control circuit; The analog-to-digital conversion circuit is used to perform analog-to-digital conversion on the voltage to be measured connected to its input terminal and then output the converted voltage to the control circuit.
6. The power supply testing device according to claim 4, characterized in that: The test control component further includes: a second communication module, the second communication module being electrically connected to the control circuit; the second communication module being used to establish a communication connection with an external terminal; The control circuit is also used to control at least one power supply in the product under test in the test position to enable, when a test instruction sent from an external terminal is obtained via the second communication module, so that the product under test outputs multiple voltages to be tested through its own multiple power output terminals.
7. The power supply testing device according to claim 4, characterized in that: The test control component further comprises: an indication component, the indication component being electrically connected to the control circuit; The control circuit is further used to control the indicating component to indicate the comparison result between the voltage to be measured and the preset voltage.
8. The power supply testing device according to any one of claims 1 to 7, characterized in that: The test carrier also includes: a plurality of the test positions and a switching component; The switching component is electrically connected to a plurality of test positions and the test control component respectively; The switching component is used to conduct the electrical connection path between any of the test positions and the test control component.
9. A power supply test device control method, characterized in that: Based on the power supply testing device according to any one of claims 1 to 8, the method comprises: The test control component controls at least one power supply of the product to be tested in the test position to enable, so that the product to be tested outputs a plurality of voltages to be tested through its own plurality of power supply output terminals respectively; The test control component obtains a plurality of the voltages to be tested, compares the voltages to be tested with a preset voltage and indicates a comparison result.
10. The power supply test device control method according to claim 9, characterized in that: The test carrier also includes: a plurality of the test positions and a switching component; the method also includes: a test control component controlling the switching component to conduct an electrical connection path between any of the test positions and the test control component.