Particulate matter detection device and equipment for pipeline gas

Abstract

The invention discloses a particulate matter detection device and equipment for pipeline gas, which is applied to the technical field of detection equipment, and comprises a processor, a laser constant current source, a laser emitter, a spectroscope, a first light intensity acquisition circuit and a second light intensity acquisition circuit, laser emitted by the laser emitter is transmitted through the spectroscope to form first laser which is emitted into a detected gas cavity, scattered light scattered by particulate matter in the cavity is detected by the first light intensity acquisition circuit to form a first detection signal which is transmitted to the processor, and the processor determines the concentration of the particulate matter according to the first detection signal. Laser emitted by the laser emitter is reflected by the spectroscope to form second laser, the second laser is detected by the second light intensity acquisition circuit to form a second detection signal, and the processor adjusts the magnitude of current output by the laser constant current source according to the change condition of the laser intensity of the second laser relative to the preset reflected light intensity. The light intensity of the second laser is kept unchanged, so that the stability of the laser emitted into the gas is improved, and the particulate matter detection accuracy is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of detection equipment, and particularly to a particulate matter detection device and equipment for pipeline gas. Background Art

[0002] High-temperature and high-pressure gas is widely used in the rail transit industry. During the process of generating gas, air purification is carried out on the gas, such as adopting measures such as cyclone separators, filters, electrostatic precipitators, bag filters, etc. for air purification. However, there will still be a certain degree of solid particulate matter residue in the gas. Therefore, real-time and effective detection of particulate matter parameters in the gas is crucial for controlling product quality, production efficiency, and environmental protection emissions, etc.

[0003] In the related art, the light scattering method is used to detect particulate matter in gas. The light scattering method can be applied to the detection of particulate matter with different particle sizes, shapes, and properties. However, the currently adopted detection device is constant current control. When detecting particulate matter in pipeline gas, as the working time increases, the temperature of the laser emitter will rise. Under the condition of constant current control, the laser light intensity emitted by the laser emitter at different temperatures is different. Therefore, the laser light intensity of the laser emitter changes with the temperature change, resulting in drift of the measurement laser and unstable and inaccurate measurement results.

[0004] In view of this, how to improve the detection accuracy and stability of particulate matter in pipeline gas has become a problem that needs to be solved by those skilled in the art. Summary of the Invention

[0005] The purpose of the embodiments of the present invention is to provide a particulate matter detection device and equipment for pipeline gas, which can improve the stability of the measurement laser and is beneficial to improving the detection accuracy of particulate matter.

[0006] To solve the above technical problems, the embodiments of the present invention provide the following technical solutions:

[0007] On the one hand, the present invention provides a particulate matter detection device for pipeline gas, including: a processor, a laser constant current source, a laser emitter, a beam splitter, a first light intensity acquisition circuit, and a second light intensity acquisition circuit; wherein:

[0008] The input end of the laser constant current source is connected to the first output end of the processor, and is used to output a current of a corresponding magnitude according to the adjustment signal sent by the processor;

[0009] The input end of the laser emitter is connected to the output end of the laser constant current source, and is used to emit laser light corresponding to the magnitude of the current output by the laser constant current source and transmit it to the beam splitter;

[0010] The beam splitter is used to reflect and transmit the laser to obtain the first transmitted laser and the second reflected laser; the first laser is incident into the measured gas cavity and is scattered by the particulate matter in the measured gas cavity to form scattered light.

[0011] The output end of the first light intensity acquisition circuit is connected to the first input end of the processor and is used to detect the first detection signal of the scattered light.

[0012] The output end of the second light intensity acquisition circuit is connected to the second input end of the processor and is used to detect the second detection signal of the second laser.

[0013] The processor is used to generate the adjustment signal according to the second detection signal and the preset reflected light intensity so that the light intensity of the second laser reflected by the beam splitter remains unchanged; and determine the concentration of the particulate matter according to the first detection signal.

[0014] In one embodiment, the first light intensity acquisition circuit includes:

[0015] A first light intensity sensor for obtaining the first light intensity information of the scattered light.

[0016] A first sampling circuit with an input end connected to the output end of the first light intensity sensor and an output end connected to the first input end of the processor, which is used to convert the first light intensity information into a first detection signal.

[0017] The second light intensity acquisition circuit includes:

[0018] A second light intensity sensor for obtaining the second light intensity information of the second laser.

[0019] A second sampling circuit with an input end connected to the output end of the second light intensity sensor and an output end connected to the second input end of the processor, which is used to convert the second light intensity information into a second detection signal.

[0020] In one embodiment, a collimating mirror and a Fourier lens are further included, wherein:

[0021] The first laser transmitted by the beam splitter is incident into the measured gas cavity through the collimating mirror.

[0022] The Fourier lens is used to condense and emit the scattered light scattered by the particulate matter in the measured gas cavity.

[0023] In one embodiment, a movable platform, a third light intensity sensor disposed at the bottom of the movable platform, and a third sampling circuit with an input end connected to the output end of the third light intensity sensor and an output end connected to the third input end of the processor are further included, wherein:

[0024] The movable platform is used to drive the third light intensity sensor to move in the vertical direction;

[0025] The third light intensity sensor is used to obtain the third light intensity information of the scattered light at different vertical positions;

[0026] The third sampling circuit is used to convert the third light intensity information into a third detection signal;

[0027] The processor is further used to determine the size of the particulate matter according to the second detection signal and the third detection signal.

[0028] In one embodiment, the movable platform is a piezoelectric ceramic nano-platform, and the device further includes a piezoelectric ceramic driver. The input end of the piezoelectric ceramic nano-platform is connected to the second output end of the processor through the piezoelectric ceramic driver;

[0029] The processor is further used to drive the piezoelectric ceramic nano-platform to generate a corresponding deformation through the piezoelectric ceramic driver;

[0030] The third light intensity sensor is arranged at the bottom of the piezoelectric ceramic nano-platform and can move in the vertical direction along with the deformation of the piezoelectric ceramic nano-platform.

[0031] In one embodiment, the processor is further used to drive the bottom of the piezoelectric ceramic nano-platform to generate a deformation amount in the vertical direction through the piezoelectric ceramic driver, and the deformation amount enables the third light intensity sensor to move within the vertical range of the projection of the laser beam transmitted through the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located.

[0032] In one embodiment, the processor is further used to drive the bottom of the piezoelectric ceramic nano-platform to generate a deformation amount in the vertical direction through the piezoelectric ceramic driver, and the deformation amount enables the third light intensity sensor to move within the vertical range from the upper boundary of the projection of the laser beam transmitted through the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located to the position corresponding to the midpoint of the Fourier lens.

[0033] In one embodiment, it further includes a first solenoid valve disposed at the first end of the measured gas cavity, a first solenoid valve driver connected to the control end of the first solenoid valve, a second solenoid valve disposed at the second end of the measured gas cavity, a second solenoid valve driver connected to the control end of the second solenoid valve, a vacuum pump disposed on the side wall of the measured gas cavity and extending into the cavity, and a vacuum pump driver connected to the control end of the vacuum pump. The input end of the first solenoid valve driver is connected to the third output end of the processor, the input end of the second solenoid valve driver is connected to the fourth output end of the processor, and the input end of the vacuum pump driver is connected to the fifth output end of the processor;

[0034] The processor is further configured to control the corresponding first solenoid valve and second solenoid valve to close through the first solenoid valve driver and the second solenoid valve driver respectively according to the device calibration instruction to seal the measured gas cavity, and control the vacuum pump to start through the vacuum pump driver so as to evacuate the sealed measured gas cavity to a vacuum state.

[0035] In one embodiment, it further includes an ultraviolet lamp electron gun and an irradiation driver connected to the control end of the ultraviolet lamp electron gun. The input end of the irradiation driver is connected to the sixth output end of the processor;

[0036] The processor is further configured to control the ultraviolet lamp electron gun to start through the irradiation driver during the operation of the vacuum pump so as to irradiate the gas in the measured gas cavity.

[0037] On the other hand, the present invention provides a particulate matter detection device for pipeline gas, including the particulate matter detection device for pipeline gas as described above.

[0038] From the above technical solutions, it can be seen that the embodiments of the present invention have the following advantages:

[0039] In an embodiment of the present invention, a particulate matter detection device for pipeline gas is provided, including: a processor, a laser constant current source, a laser emitter, a beam splitter, a first light intensity acquisition circuit, and a second light intensity acquisition circuit; wherein: the input end of the laser constant current source is connected to the first output end of the processor, and is used to output a current of a corresponding magnitude according to an adjustment signal sent by the processor; the input end of the laser emitter is connected to the output end of the laser constant current source, and is used to emit a laser with an intensity corresponding to the magnitude of the current output by the laser constant current source and transmit it to the beam splitter; the beam splitter is used to reflect and transmit the laser to obtain a first transmitted laser and a second reflected laser; the first laser enters the measured gas cavity and is scattered by the particulate matter in the measured gas cavity to form scattered light. The output end of the first light intensity acquisition circuit is connected to the first input end of the processor, and is used to detect a first detection signal of the scattered light; the output end of the second light intensity acquisition circuit is connected to the second input end of the processor, and is used to detect a second detection signal of the second laser; the processor is used to generate an adjustment signal according to the second detection signal and a preset reflected light intensity, so that the intensity of the second laser reflected by the beam splitter remains unchanged; and determine the concentration of the particulate matter according to the first detection signal.

[0040] It can be seen that in an embodiment of the present invention, a part of the laser emitted by the laser emitter is transmitted through the beam splitter to form a first laser, which enters the measured gas cavity and is scattered by the particulate matter in the cavity to form scattered light. The scattered light is detected by the first light intensity acquisition circuit to form a first detection signal. The first light intensity acquisition circuit transmits the first detection signal to the processor, and the processor can determine the concentration of the particulate matter in the cavity according to the first detection signal. Another part of the laser emitted by the laser emitter is reflected by the beam splitter to form a second laser, and the second laser is detected by the second light intensity acquisition circuit to form a second detection signal. In this application, in order to make the intensity of the laser incident on the measured gas cavity more stable, the processor can adjust the magnitude of the current output by the laser constant current source according to the change of the laser intensity of the second laser relative to the preset reflected light intensity, so as to keep the intensity of the second laser unchanged, thereby making the intensity of the first laser unchanged, improving the stability of the laser incident on the gas, and being beneficial to improving the accuracy of particulate matter detection.

[0041] In addition, the present invention also provides a particulate matter detection device for pipeline gas, which has corresponding advantages. Description of the Drawings

[0042] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for the prior art and the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0043] Figure 1Schematic diagram of the structure of a particulate matter detection device for pipeline gas provided by an embodiment of the present invention;

[0044] Figure 2 Optical path diagram of a particulate matter detection device for pipeline gas provided by an embodiment of the present invention;

[0045] Figure 3 Schematic diagram of the structure of another particulate matter detection device for pipeline gas provided by an embodiment of the present invention;

[0046] Figure 4 Schematic diagram of the calibration structure of a particulate matter detection device for pipeline gas provided by an embodiment of the present invention. Detailed implementation manners

[0047] The embodiment of the present invention provides a particulate matter detection device and equipment for pipeline gas, which can improve the stability of the measurement laser and is beneficial to improving the accuracy of particulate matter detection.

[0048] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0049] Please refer to Figure 1 , Figure 1 Schematic diagram of the structure of a particulate matter detection device for pipeline gas provided by an embodiment of the present invention. The particulate matter detection device for pipeline gas includes: a processor 1, a laser constant current source 2, a laser emitter 3, a beam splitter 4, a first light intensity acquisition circuit 5, and a second light intensity acquisition circuit 6; where:

[0050] The input end of the laser constant current source 2 is connected to the first output end of the processor 1, and is used to output a current of a corresponding magnitude according to the adjustment signal sent by the processor 1;

[0051] The input end of the laser emitter 3 is connected to the output end of the laser constant current source 2, and is used to emit laser light corresponding to the magnitude of the current output by the laser constant current source 2 and transmit it to the beam splitter 4;

[0052] The beam splitter 4 is used to reflect and transmit the laser light to obtain transmitted first laser light and reflected second laser light; the first laser light is incident into the measured gas cavity A and is scattered by the particulate matter B in the measured gas cavity to form scattered light,

[0053] The output end of the first light intensity acquisition circuit 5 is connected to the first input end of the processor, and is used to detect the first detection signal of the scattered light;

[0054] The output end of the second light intensity acquisition circuit 6 is connected to the second input end of the processor, and is used to detect the second detection signal of the second laser;

[0055] The processor 1 is used to generate an adjustment signal according to the second detection signal and the preset reflected light intensity, so as to keep the light intensity of the second laser reflected by the beam splitter 4 unchanged; and determine the concentration of particulate matter according to the first detection signal.

[0056] It should be noted that when detecting particulate matter in the gas to be detected in the embodiment of the present invention, the gas to be detected can be introduced into the gas chamber to be measured, such as Figure 1 As shown, the laser constant current source 2 outputs a corresponding current to the laser emitter 3 according to the adjustment signal output by the processor 1. The laser emitter 3 emits a laser with a corresponding intensity to the current. The laser is incident on the beam splitter 4, and two beams of laser are formed through the transmission and reflection of the beam splitter 4. Most of the laser forms the first laser through the transmission of the beam splitter, and the other part of the laser is reflected to form the second laser. The transmitted first laser is directly incident into the gas chamber A to be measured. When the first laser irradiates the particulate matter B in the gas chamber A to be measured, the light will be scattered to form scattered light. The scattered light can be detected by the first light intensity acquisition circuit 5 and a first detection signal is generated and sent to the processor 1. The processor 1 can analyze the first detection signal to determine the concentration of particulate matter in the gas. The other second laser obtained by reflection through the beam splitter is detected by the second light intensity acquisition circuit 6, and a second detection signal is generated and sent to the processor 1. The processor 1 can determine the light intensity of the reflected second laser according to the second detection signal, and compare the light intensity of the second laser with the preset reflected light intensity. When the light intensity of the second laser is different from the preset reflected light intensity, a corresponding adjustment signal will be generated. Specifically, the adjustment signal can be sent to the PID adjustment module, and the PID adjustment module is used to adjust the magnitude of the current output by the laser constant current source, so as to adjust the intensity of the laser output by the laser emitter, so that the light intensity of the reflected second laser remains unchanged. When the light intensity of the second laser can remain unchanged, the light intensity of the first laser transmitted through the beam splitter 4 will also remain unchanged, making the light intensity of the first laser incident on the gas chamber A to be measured more stable. The embodiment of the present invention can adjust the light intensity of the laser emitted by the laser emitter according to the light intensity of the reflected second laser, so as to maintain the stability of the light intensity of the first laser incident on the gas chamber A to be measured, which is beneficial to improving the accuracy of particulate matter detection.

[0057] In practical applications, after the processor 1 determines the light intensity of the second laser according to the second detection signal, it can compare the light intensity of the second laser with the magnitude of the preset reflected light intensity. If the light intensity of the second laser is less than the preset reflected light intensity, an adjustment signal for increasing the current can be generated. Specifically, the increase amplitude of the current can be determined according to the absolute value of the difference between the light intensity of the second laser and the preset reflected light intensity, or the increased current can be determined according to a preset step size. Correspondingly, if the light intensity of the second laser is greater than the preset reflected light intensity, an adjustment signal for decreasing the current can be generated. Specifically, the decrease amplitude of the current can be determined according to the absolute value of the difference between the light intensity of the second laser and the preset reflected light intensity, or the decreased current can be determined according to a preset step size. Which specific method is used to implement the current adjustment can be determined according to actual needs, and the embodiments of the present invention do not make special limitations in this regard.

[0058] In one implementation manner, the first light intensity acquisition circuit 5 includes:

[0059] A first light intensity sensor 51 for obtaining the first light intensity information of the scattered light;

[0060] A first sampling circuit 52 with its input end connected to the output end of the first light intensity sensor 51 and its output end connected to the first input end of the processor, for converting the first light intensity information into a first detection signal;

[0061] The second light intensity acquisition circuit 6 includes:

[0062] A second light intensity sensor 61 for obtaining the second light intensity information of the second laser;

[0063] A second sampling circuit 62 with its input end connected to the output end of the second light intensity sensor and its output end connected to the second input end of the processor, for converting the second light intensity information into a second detection signal.

[0064] It can be understood that, for the convenience of implementation and to ensure the accuracy and timeliness of data acquisition, the first light intensity sensor 51 and the first sampling circuit 52 can be used to form the first light intensity acquisition circuit 5, and the second light intensity sensor 61 and the second sampling circuit 62 can be used to form the second light intensity acquisition circuit 6. The first light intensity information of the scattered light can be collected by the first light intensity sensor 51, and then the first light intensity information is sent to the first sampling circuit 52 to obtain the corresponding first detection signal, that is, converting the first light intensity information of the analog signal into the first detection signal of the analog signal. The second light intensity information of the second laser can be collected by the second light intensity sensor 61, and then the second light intensity information is sent to the second sampling circuit 62 to obtain the corresponding first detection signal, that is, converting the first light intensity information of the analog signal into the first detection signal of the analog signal.

[0065] In one implementation manner, such as Figure 2As shown, the device may further include a collimating mirror 7 and a Fourier lens 8, where:

[0066] The first laser transmitted by the beam splitter 4 enters the measured gas cavity A through the collimating mirror 7.

[0067] The Fourier lens 8 is used to condense the scattered light scattered by the particulate matter in the measured gas cavity A and then emit it.

[0068] It can be understood that in the embodiment of the present invention, in order to improve the detection effect, the first laser transmitted by the beam splitter 4 can be collimated by the collimating mirror 7 and then better incident into the measured gas cavity A, which can not only reduce the light energy loss, but also enable the particulate matter to scatter the collimated first laser better. Since the Fourier lens 8 has a light condensing effect and can narrow the light channel, the scattered light after scattering can be better detected by the second light intensity acquisition circuit 6 through the Fourier lens 8, thereby ensuring the accuracy of the particulate matter concentration detection.

[0069] It should also be noted that the collimating mirror 7 and the Fourier lens 8 in the embodiment of the present invention are coaxial with the beam splitter and the laser emitter, and the second light intensity sensor 61 in the second light intensity acquisition circuit 6 can also be located on the central axis of the Fourier lens 8 to obtain the light intensity information of the main scattered light, so as to more accurately determine the particulate matter concentration.

[0070] In one embodiment, please refer to Figure 2 and Figure 3 , the device may further include a movable platform 9, a third light intensity sensor 10 disposed at the bottom of the movable platform 9, and a third sampling circuit 11 with an input end connected to the output end of the third light intensity sensor 10 and an output end connected to the third input end of the processor 1, where:

[0071] The movable platform 9 is used to drive the third light intensity sensor 10 to move in the vertical direction.

[0072] The third light intensity sensor 10 is used to obtain the third light intensity information of the scattered light at different vertical positions.

[0073] The third sampling circuit 11 is used to convert the third light intensity information into a third detection signal.

[0074] The processor 1 is further used to determine the size of the particulate matter according to the second detection signal and the third detection signal.

[0075] It should be noted that according to the size of the solid particles in the gas chamber A to be measured, the intensity of the scattered light is closely related to the number, size and distribution of the particles. Therefore, the scattered light after passing through the gas chamber to be measured will have a lateral situation, that is, it will spread within a certain range to both sides centered on the central axis of the Fourier lens 8. Therefore, in the embodiment of the present invention, in order to detect the sizes of different particles, a third light intensity sensor 10 can be set to detect the lateral scattered light. However, since the angles between the scattered light after the first laser scattering by particles of different sizes and the optical axes of the collimating mirror 7 and the Fourier lens 8 are different, in order to measure particles of different sizes with one third light intensity sensor 10, in the embodiment of the present invention, a movable platform 9 is set, the third light intensity sensor 10 is arranged at the bottom of the movable platform 9, and the movable platform 9 drives the third light intensity sensor 10 to move in the vertical direction, that is, drives the third light intensity sensor 10 to move in a direction perpendicular to the optical axes of the collimating mirror 7 and the Fourier lens 8, so that the third light intensity sensor 10 can collect the third light intensity information at different positions in the vertical direction, and the third sampling circuit 11 converts the third light intensity information into a third detection signal of an electrical signal and sends it to the processor 1. The processor 1 can determine the corresponding particle concentration and particle size distribution according to the third detection signals at different positions and the second detection signal.

[0076] It can be understood that the embodiment of the present invention can not only realize the detection of the size of particles in the gas, but also realize the detection of particles of different sizes by setting a third light intensity sensor. It can not only reduce the number of photoinductive detectors, but also reduce the device cost because its mechanical components and controllers are extremely cost-effective, and can also realize stepless adjustment, greatly increasing the measurement range.

[0077] In practical applications, in order to ensure that more particles can be detected, in the embodiment of the present invention, considering that the accuracy of the piezoelectric ceramic nano-platform is relatively high, the movable platform 9 in the embodiment of the present invention can adopt a piezoelectric ceramic nano-platform. The device also includes a piezoelectric ceramic driver (as Figure 3 shown), and the input end of the piezoelectric ceramic nano-platform is connected to the second output end of the processor 1 through the piezoelectric ceramic driver;

[0078] The processor 1 is also used to drive the piezoelectric ceramic nano-platform to generate corresponding deformation through the piezoelectric ceramic driver;

[0079] The third light intensity sensor 10 is arranged at the bottom of the piezoelectric ceramic nano-platform and can move in the vertical direction along with the deformation of the piezoelectric ceramic nano-platform.

[0080] That is, in the embodiments of the present invention, the processor 1 can generate a driving signal value for the piezoelectric ceramic driver to drive the piezoelectric ceramic nano-platform to generate a corresponding deformation. Specifically, the driving signals corresponding to different deformation thicknesses of different piezoelectric ceramic nano-platforms can be set, so that the processor 1 outputs corresponding driving signals in sequence according to the driving signals corresponding to different deformation thicknesses of different piezoelectric ceramic nano-platforms, and drives the piezoelectric ceramic nano-platform to generate a deformation with a corresponding thickness through the piezoelectric ceramic driver, thereby moving the third light intensity sensor 9 to the corresponding position in the vertical direction and collecting the third light intensity information at this position.

[0081] It can be understood that the processor 1 can also be used to drive the bottom of the piezoelectric ceramic nano-platform to generate a deformation amount in the vertical direction through the piezoelectric ceramic driver, and the deformation amount enables the third light intensity sensor to move within the vertical range of the projection of the laser beam transmitted through the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located. Or, the processor 1 is further used to drive the bottom of the piezoelectric ceramic nano-platform to generate a deformation amount in the vertical direction through the piezoelectric ceramic driver, and the deformation amount enables the third light intensity sensor to move within the vertical range from the upper boundary of the projection of the laser beam transmitted through the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located to the position corresponding to the midpoint of the Fourier lens.

[0082] It can be understood that in the embodiments of the present invention, in order to ensure that as many particulate matters with different particle sizes in the gas can be detected as possible, the processor 1 can control the bottom of the piezoelectric ceramic nano-platform to generate a deformation amount within a certain range in the vertical direction through the piezoelectric ceramic driver, and this range can be the vertical range of the projection of the laser beam transmitted through the Fourier lens 8 on the vertical plane where the piezoelectric ceramic nano-platform is located (the dotted range C to D shown in the figure). Since the scattered light of particulate matters with the same particle size has the same angle, that is, within the vertical range of the projection of the laser beam transmitted through the Fourier lens 8 on the vertical plane where the piezoelectric ceramic nano-platform is located, it is symmetric about the optical axis of the Fourier lens 8. Therefore, in order to reduce the repeated acquisition of data and improve the detection efficiency, the processor 1 can control the bottom of the piezoelectric ceramic nano-platform to generate a deformation amount in the vertical direction through the piezoelectric ceramic driver, so that the third light intensity sensor moves within the vertical range from the upper boundary of the projection of the laser beam transmitted through the Fourier lens to the position corresponding to the midpoint of the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located (the dotted range C to O shown in the figure), or the bottom of the piezoelectric ceramic nano-platform generates a deformation amount in the vertical direction, so that the third light intensity sensor moves within the vertical range from the position corresponding to the midpoint of the Fourier lens to the lower boundary of the projection of the laser beam transmitted through the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located (the dotted range O to D shown in the figure).

[0083] In one implementation manner, please refer to Figure 3and Figure 4 The device may further include a first solenoid valve 12 disposed at the first end of the measured gas chamber A, a first solenoid valve driver connected to the control end of the first solenoid valve 12, a second solenoid valve 13 disposed at the second end of the measured gas chamber, a second solenoid valve driver connected to the control end of the second solenoid valve 13, a vacuum pump 14 disposed on the side wall of the measured gas chamber and extending into the chamber, and a vacuum pump driver connected to the control end of the vacuum pump 14. The input end of the first solenoid valve driver is connected to the third output end of the processor 1, the input end of the second solenoid valve driver is connected to the fourth output end of the processor 1, and the input end of the vacuum pump driver is connected to the fifth output end of the processor 1;

[0084] The processor 1 is further configured to control the corresponding first solenoid valve 12 and second solenoid valve 13 to close respectively through the first solenoid valve driver and the second solenoid valve driver according to the device calibration instruction to seal the measured gas chamber A, and control the vacuum pump 14 to start through the vacuum pump driver so as to evacuate the sealed measured gas chamber into a vacuum state.

[0085] It should be noted that before detecting the particulate matter in the measured gas, in order to ensure the accuracy of the detection device and the stability of the measurement, the detection device needs to be calibrated, such as calibrating the processor, the first light intensity sensor, the second light intensity sensor, and the third light intensity sensor. For this, in the embodiment of the present invention, a first solenoid valve and a second solenoid valve may be respectively disposed at both ends of the measured gas chamber A. When it is necessary to calibrate the processor, the first light intensity sensor, the second light intensity sensor, and the third light intensity sensor in the detection device, the processor 1 can control the first solenoid valve to close through the first solenoid valve driver, and control the second solenoid valve to close through the second solenoid valve driver, so that the measured gas chamber A is in a sealed state to ensure no air leakage. Then, the processor 1 controls the vacuum pump to work through the vacuum pump driver, and the vacuum pump 14 evacuates the air in the measured gas chamber A through the pipeline E to reach a vacuum state. In the vacuum state, the calibration of the detection instrument in the vacuum state can be realized.

[0086] In one embodiment, the device may further include an ultraviolet lamp electron gun and an irradiation driver connected to the control end of the ultraviolet lamp electron gun. The input end of the irradiation driver is connected to the sixth output end of the processor;

[0087] The processor 1 is further configured to control the ultraviolet lamp electron gun to start through the irradiation driver during the operation of the vacuum pump so as to irradiate the gas in the measured gas chamber.

[0088] It should also be noted that in order to achieve the gas cleanliness as much as possible, the processor 1 in the embodiment of the present invention may also control the irradiation device F including the ultraviolet lamp - electron gun (such as Figure 4Start as shown in the figure to irradiate the particulate matter in the gas chamber to be measured, generate a charging effect with opposite polarities on the particulate matter, and use the electric field force to overcome the adhesion force between the particles and the adhesion material, so as to better remove the particulate matter, ensure air cleanliness, thereby realizing particle-free calibration and improving calibration accuracy.

[0089] It can be seen that in the embodiment of the present invention, a part of the laser emitted by the laser emitter is transmitted through the beam splitter to form the first laser, which is incident into the gas chamber to be measured and scattered by the particulate matter in the chamber to form scattered light. The scattered light is detected by the first light intensity acquisition circuit to form a first detection signal. The first light intensity acquisition circuit transmits the first detection signal to the processor. The processor can determine the concentration of particulate matter in the chamber according to the first detection signal. Another part of the laser emitted by the laser emitter is reflected by the beam splitter to form the second laser. The second laser is detected by the second light intensity acquisition circuit to form a second detection signal. In this application, in order to make the laser intensity incident into the gas chamber to be measured more stable, the processor can adjust the magnitude of the current output by the laser constant current source according to the change of the laser intensity of the second laser relative to the preset reflected light intensity, so as to keep the light intensity of the second laser unchanged, thereby making the light intensity of the first laser unchanged, improving the stability of the laser incident on the gas, and being beneficial to improving the detection accuracy of particulate matter.

[0090] On the basis of the above embodiment, on the other hand, the present invention provides a particulate matter detection device for pipeline gas, including the particulate matter detection device for pipeline gas as described above.

[0091] It should be noted that the particulate matter detection device for pipeline gas in the embodiment of the present invention has the same beneficial effects as the particulate matter detection device for pipeline gas in the above embodiment. For the specific introduction of the particulate matter detection device for pipeline gas involved in the embodiment of the present invention, please refer to the above embodiment, and the present application will not repeat it here.

[0092] In this specification, each embodiment is described in a progressive manner. The key point of each embodiment is to illustrate the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the description of the method part.

[0093] It should also be noted that in this specification, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements but also includes other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the presence of additional identical elements in the process, method, article or device comprising the said element.

[0094] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A pipeline gas particle detection device, characterized in that: include: Processor, laser constant current source, laser transmitter, spectroscope, first light intensity collection circuit and second light intensity collection circuit; wherein: The input end of the laser constant current source is connected to the first output end of the processor, and is used to output a current of a corresponding magnitude according to the adjustment signal sent by the processor; The input end of the laser transmitter is connected to the output end of the laser constant current source, and is used to transmit a laser having a light intensity corresponding to the current output by the laser constant current source to the beam splitter; The spectroscope is used to reflect and transmit the laser to obtain a transmitted first laser and a reflected second laser; the first laser is emitted into the measured gas cavity and is scattered by particles in the measured gas cavity to form scattered light, The output end of the first light intensity collection circuit is connected to the first input end of the processor, and is used to detect a first detection signal of the scattered light; The output end of the second light intensity collection circuit is connected to the second input end of the processor, and is used to detect a second detection signal of the second laser; The processor is used to generate the adjustment signal according to the second detection signal and the preset reflected light intensity so as to keep the light intensity of the second laser reflected by the spectroscope unchanged; and determine the concentration of the particulate matter according to the first detection signal.

2. The pipeline gas particle detection device according to claim 1, characterized in that: The first light intensity collection circuit comprises: A first light intensity sensor, used to obtain first light intensity information of the scattered light; A first sampling circuit having an input end connected to the output end of the first light intensity sensor and an output end connected to the first input end of the processor, and used for converting the first light intensity information into a first detection signal; The second light intensity collection circuit comprises: A second light intensity sensor, used for acquiring second light intensity information of the second laser; A second sampling circuit whose input end is connected to the output end of the second light intensity sensor and whose output end is connected to the second input end of the processor is used to convert the second light intensity information into a second detection signal.

3. The pipeline gas particle detection device according to claim 1, characterized in that: It also includes a collimator and a Fourier lens, where: The first laser transmitted by the beam splitter is emitted into the measured gas cavity through the collimator; The Fourier lens is used to focus the scattered light scattered by the particles in the measured gas cavity and then emit it.

4. The pipeline gas particle detection device according to claim 3, characterized in that: It also includes a movable platform, a third light intensity sensor disposed at the bottom of the movable platform, and a third sampling circuit whose input end is connected to the output end of the third light intensity sensor and whose output end is connected to the third input end of the processor, wherein: The movable platform is used to drive the third light intensity sensor to move in the vertical direction; The third light intensity sensor is used to obtain third light intensity information of scattered light at different vertical positions; The third sampling circuit is used to convert the third light intensity information into a third detection signal; The processor is further configured to determine the size of the particle according to the second detection signal and the third detection signal.

5. The pipeline gas particle detection device according to claim 4, characterized in that: The movable platform is a piezoelectric ceramic nano-platform, and the device further comprises a piezoelectric ceramic driver, wherein the input end of the piezoelectric ceramic nano-platform is connected to the second output end of the processor via the piezoelectric ceramic driver; The processor is further used to drive the piezoelectric ceramic nano-platform to generate corresponding deformation through the piezoelectric ceramic driver; The third light intensity sensor is disposed at the bottom of the piezoelectric ceramic nano-platform and can move along the vertical direction along with the deformation of the piezoelectric ceramic nano-platform.

6. The pipeline gas particle detection device according to claim 5, characterized in that: The processor is also used to drive the bottom of the piezoelectric ceramic nano-platform to generate a deformation in the vertical direction through the piezoelectric ceramic driver, and the deformation causes the third light intensity sensor to move within the vertical range of the projection of the laser beam transmitted by the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located.

7. The pipeline gas particle detection device according to claim 5, characterized in that: The processor is also used to drive the bottom of the piezoelectric ceramic nano-platform to generate a deformation in the vertical direction through the piezoelectric ceramic driver, and the deformation causes the third light intensity sensor to move within a vertical range from the upper boundary of the projection of the laser beam transmitted through the Fourier lens on the vertical plane where the piezoelectric ceramic nano-platform is located to a position corresponding to the midpoint of the Fourier lens.

8. The pipeline gas particle detection device according to any one of claims 1 to 7, characterized in that: It also includes a first solenoid valve disposed at the first end of the measured gas cavity, a first solenoid valve driver connected to the control end of the first solenoid valve, a second solenoid valve disposed at the second end of the measured gas cavity, a second solenoid valve driver connected to the control end of the second solenoid valve, a vacuum pump disposed on the side wall of the measured gas cavity and extending into the cavity, and a vacuum pump driver connected to the control end of the vacuum pump, the input end of the first solenoid valve driver is connected to the third output end of the processor, the input end of the second solenoid valve driver is connected to the fourth output end of the processor, and the input end of the vacuum pump driver is connected to the fifth output end of the processor; The processor is also used to control the corresponding first solenoid valve and second solenoid valve to be closed through the first solenoid valve driver and the second solenoid valve driver respectively according to the equipment calibration instruction to seal the measured gas cavity, and control the vacuum pump to start through the vacuum pump driver so as to draw the sealed measured gas cavity into a vacuum state.

9. The pipeline gas particle detection device according to claim 8, characterized in that: It also includes an ultraviolet lamp electron gun and an irradiation driver connected to the control end of the ultraviolet lamp electron gun, wherein the input end of the irradiation driver is connected to the sixth output end of the processor; The processor is also used to control the UV lamp electron gun to start up through the irradiation driver during the operation of the vacuum pump, so as to irradiate the gas in the measured gas cavity.

10. A pipeline gas particle detection device, characterized in that: A pipeline gas particle detection device comprising the device as claimed in any one of claims 1 to 9.

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