Board card voltage and current measurement and insulation and voltage resistance test method and board card voltage and current measurement and insulation and voltage resistance test system

Abstract

The invention belongs to the technical field of board card testing, and particularly relates to a board card voltage and current measurement and insulation voltage resistance testing method and system, and the method comprises the steps: starting a testing cabinet of a board card testing system, carrying out the self-inspection, and setting system parameters; a power supply is loaded according to set system parameters, and a load mode is selected according to different product requirements to provide working voltage and current for the board card; after the load mode is confirmed, voltage and current measurement and insulation voltage resistance test are carried out on the board card in a probe contact mode, and test data are transmitted to the data processing and analyzing module in real time; and the data processing module judges according to preset upper and lower limit standards after receiving the measurement and test data, and stores the data and an evaluation result to the storage unit at the same time. Through unified control and data processing, voltage and current measurement and insulation voltage resistance testing of the board card are integrated in one system, automatic board card comprehensive testing is achieved, and the accuracy and efficiency of board card comprehensive testing are improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of board card testing, and particularly relates to a method and system for measuring board card voltage, current, and insulation withstand voltage testing. Background Art

[0002] During the production and maintenance of electronic devices, the performance and safety testing of board cards are crucial. Traditional board card testing usually performs separate tests on voltage, current, and insulation withstand voltage, which not only has low testing efficiency but also generates errors due to factors such as manual operation or equipment switching between different tests. In addition, with the development of the electronic manufacturing industry, the diversification of products and the acceleration of the production rhythm make it difficult for traditional testing methods to meet the high-efficiency testing requirements in the multi-variety and small-batch production mode, and it is also difficult to comprehensively and systematically evaluate the comprehensive performance and potential risks of board cards. Therefore, a more efficient, accurate, and comprehensive evaluation method and system for board card voltage, current, and insulation withstand voltage performance are needed. Summary of the Invention

[0003] In view of the deficiencies of the above-mentioned existing methods, the present invention provides a method and system for measuring board card voltage, current, and insulation withstand voltage, aiming to solve the core problems of low testing efficiency and low accuracy in the existing board card testing technology.

[0004] To achieve the above object, the present invention is realized through the following technical solutions:

[0005] A method for measuring board card voltage, current, and insulation withstand voltage, the method comprising the following steps:

[0006] Step S10: After starting the test cabinet of the board card testing system, set the system parameters and perform self-check to ensure the normal operation of each part of the test cabinet. Connect the pneumatic dropping fixture to the test cabinet through a standard quick interface, install the board card to be tested on the fixture, and perform precise sampling through the probes of the pneumatic dropping fixture to ensure reliable electrical connection between the board card and the system. Set various system parameters required for testing through the control and interaction unit;

[0007] Step S20: The power supply unit loads power to the board card according to the set system parameters, and selects a suitable load mode according to different board card layout requirements to provide multiple sets of working voltages and currents required for the board card;

[0008] Step S30: After providing the working voltage and current to the board card, the board card testing unit performs voltage measurement, current measurement, and insulation withstand voltage testing on the board card, and simultaneously transmits the measurement and test data to the data processing and analysis unit in real time in the background;

[0009] Step S40: After receiving the test data, the data processing and analysis unit makes an accurate determination according to the preset data upper and lower limit standards, outputs the determination result to the display screen of the user terminal through the control and interaction unit, and stores the test data and evaluation result in the storage unit at the same time;

[0010] Among them, in step S10, the board test system adopts the Chroma 8000 architecture, and the set system parameters include multiple output voltages and currents of the power supply, load mode, test voltage and test time of the insulation withstand voltage test, etc.; the pneumatic dropping fixture has two board test positions on the left and right;

[0011] Among them, in step S30, when the board test unit measures the voltage, current and insulation withstand voltage of the board, the measurement is carried out by a wattmeter, an oscilloscope and a high-voltage tester R8000;

[0012] Among them, in step S40, the board data evaluation includes checking whether the board voltage is within the set range, the stability and volatility of the voltage, and whether the frequency and waveform of the voltage meet the requirements.

[0013] Preferably, in step S10, the pneumatic dropping fixture is connected to the test cabinet through a standard quick interface for quick switching and calibration. The steps for switching the pneumatic dropping fixture include:

[0014] Preparation stage: Adjust the board test system to the off state and the pneumatic dropping fixture to the initial position, take out the board, prepare the corresponding fixture according to the board to be tested, and ensure that the interface part of the fixture is clean and undamaged, meeting the connection standard of the quick interface;

[0015] Fixture switching: Carry the prepared fixture to the side of the test equipment, guide it through the standard quick interface, align the connection part of the fixture with the system, push or rotate the fixture to be fully connected with the standard quick interface, ensure that the connection is firm and there is no sign of looseness, and during the connection process, the positioning pins and slots of the interface cooperate accurately to achieve the precise positioning of the fixture. After the connection is completed, check whether the electrical connection between the fixture and the system is normal through the system self-check program to ensure that the test pins on the fixture are connected to the system test circuit and the signal transmission is normal;

[0016] Verification stage: Start the board test system to enter the fixture verification mode, send a series of test signals to the fixture for detection, and the system monitors the feedback signals of the fixture and compares them with the preset standard signals. For example, calibrate the voltage and current measurement channels of the fixture to check whether its measurement accuracy is within the allowable range. When an abnormality occurs during the inspection, the system issues an alarm and prompts the abnormal information, and the operator conducts an abnormal diagnosis. For example, problems such as a damaged sensor or poor interface contact on the fixture need to be repaired or replaced; after the verification passes, the system records the fixture verification result and proceeds to the next round of board testing. Install the board to be tested on the verified fixture and conduct the board test according to the normal test process.

[0017] Preferably, in the step S20, the load modes include constant current mode, constant voltage mode, constant resistance mode, constant power mode, and electronic load mode. Setting multiple load modes is more conducive to the switching and line transfer of different boards, thereby reducing the workload of production process engineers and improving production test efficiency.

[0018] Preferably, when the board test unit tests the board in the step S30, it tests two boards simultaneously through dual-channel switching. The test steps include:

[0019] Installation of the board to be tested: Install the two boards to be tested at the left and right board test positions of the pneumatic drop fixture respectively. The system automatically identifies the access of the left and right board test positions through the electrical connection of the fixture, reads the board information, and assigns independent test channels to each board simultaneously;

[0020] Test parameter setting: According to the specific models and test requirements of the two boards, set the test parameters of each board respectively. The test parameters are of the same type as the parameters set in the above step S10. When the test parameters have commonalities, the board test system can perform batch setting or quick copying to improve the efficiency of parameter setting. At the same time, the board test system will check the rationality of the set parameters to ensure that the parameters are within the test capacity of the equipment and meet the test standards of the board;

[0021] Channel switching control: After starting the test, the board test system first tests the left board, and sequentially conducts voltage test, current test, and insulation withstand voltage test according to the set test process. When all the test items of the left board are completed, the board test system sends a switching instruction to the control circuit of the test cabinet, and the control circuit switches to the test channel of the right board according to the received switching instruction to achieve seamless switching. During the switching process, it is necessary to ensure that there is no signal interference or data loss, and at the same time maintain the stable state of the test equipment.

[0022] Preferably, after receiving the test data, the data processing and analysis unit in step S40 evaluates and analyzes the board data according to a preset evaluation criterion. The steps include:

[0023] Test result determination and recording: When the right board completes the test, the board test system automatically records the test result. For each test index, the test data is compared with the preset upper and lower limit standards and determined. When the test data is within the qualified range, the test result of this item is determined to be PASS, and a green indicator light is lit on the display interface of the board test system. When the test data is not within the qualified range, the test result of this item is determined to be NG, and a red indicator light is lit on the display interface of the board test system. At the same time, the detailed error information is displayed and recorded.

[0024] Dispersion analysis: Conduct statistical analysis on the test data, calculate statistical parameters such as the mean, standard deviation, maximum value, and minimum value of each test index, evaluate the dispersion degree of the board performance through the above parameters. For example, measure the stability of voltage output by the standard deviation of the voltage value, and draw data distribution diagrams such as histograms and scatter plots to visually display the distribution of test data. When abnormal aggregation or dispersion of data is found, further analyze the reasons, such as process problems in the board production process or errors in the test system.

[0025] MES system collaboration: Establish a communication connection with the MES system, adopt standard industrial control protocols such as OPC UA, Modbus-TCP, etc., and perform data interaction configuration between the board test system and the MES system, including defining the transmission format, frequency, and content of the data. After receiving the data, the MES system integrates the data into the entire production management process, for example, associates with information such as production orders and process flows to achieve full-process control of product testing; at the same time, the MES system sends information such as production plans and board process parameters to the board test system to achieve two-way data interaction and collaborative work.

[0026] Product traceability: Generate a unique identification code for each tested board, such as a barcode, QR code, or serial number, and associate and store the identification code with the test data and results. During the entire board production and supply chain process, the test records and test data of the board can be quickly obtained by scanning or querying the identification code to achieve full-process traceability of the product.

[0027] In addition, to achieve the above object, the present invention also proposes a board voltage, current measurement, and insulation withstand voltage test system, and the board voltage, current measurement, and insulation withstand voltage test system includes:

[0028] Test Cabinet and Fixture Module: After starting the test cabinet of the board card test system, set the system parameters and conduct self-checks to ensure the normal operation of all parts of the test cabinet. Connect the pneumatic dropping fixture to the test cabinet through a standard quick interface, and install the board card to be tested on the fixture. Precise sampling is carried out through the probes of the pneumatic dropping fixture to ensure reliable electrical connection between the board card and the system. Set various system parameters required for testing through the control and interaction unit;

[0029] Board Card Test Power Supply Module: Used to load power to the board card according to the set system parameters, and select the load mode according to different board card types to provide working voltage and current for the board card;

[0030] Board Card Measurement and Test Module: After providing working voltage and current for the board card, the board card test measurement unit conducts voltage measurement, current measurement and insulation withstand voltage test on the board card, and at the same time transmits the measurement and test data to data processing and analysis in real time in the background;

[0031] Board Card Test Data Processing and Analysis Module: Used to accurately judge according to the preset data upper and lower limit standards after the data processing and analysis unit receives the test data, output the judgment result to the display screen of the user terminal through the control and interaction unit, and at the same time store the test data and evaluation results in the storage unit;

[0032] In the test cabinet and fixture module, the board card test system adopts the Chroma 8000 architecture. The set system parameters include the output voltage and current of the power supply module, the load mode, the test voltage and test time of the insulation withstand voltage test; the pneumatic dropping fixture has two board card test positions on the left and right;

[0033] In the board card test module, when the board card test unit conducts voltage measurement, current measurement and insulation withstand voltage test on the board card, the measurement is carried out through a power meter, an oscilloscope and a high-voltage tester R8000;

[0034] In the board card test data processing and analysis module, the board card data evaluation includes checking whether the board card voltage is within the set range, the stability and volatility of the voltage, and whether the frequency and waveform of the voltage meet the requirements.

[0035] Preferably, the system also has the function of testing the drive power supply of the TV LED backlight module, used to determine whether the output of the drive power supply of the TV LED backlight module corresponding to the board card meets the current and voltage requirements, including:

[0036] System Preparation and Parameter Setting Unit: Start the board test system, enter the TV LED backlight power supply test mode, and preset the characteristic curve model of the LED backlight particle diode in this mode; according to the specification of the LED backlight particle diode used in the board to be tested, set relevant basic parameters according to the specifications and series-parallel connection methods of the LED backlight particle diodes driven by the board to be tested, including but not limited to key data such as the expected threshold voltage range, normal operating voltage range, and maximum allowable current, providing a judgment standard and control basis for the subsequent test process, and adjust the load mode to the LED load characteristic working mode for subsequent non-linear VA curve simulation;

[0037] Non-linear VA Curve Simulation Unit: According to the preset relevant parameters and algorithms, increase the output voltage in a set gradient, with the starting voltage set to 0.1V. When the oscilloscope monitors an increase in current, set the maximum monitored current as the threshold current and the corresponding voltage as the threshold voltage; after the voltage is greater than the threshold voltage, according to the preset characteristic curve model of the LED backlight particle diode, adjust the rate and gradient of voltage increase to simulate the non-linear process of current increasing with voltage. For example, within a certain range after the voltage exceeds the threshold, control the rising speed of the voltage according to an exponential function or a specific polynomial function relationship, and continuously monitor the current change to ensure that the simulated curve fits the preset characteristic curve of the LED backlight particle diode as closely as possible; and real-time draw the current-voltage curve on the display interface of the board test system;

[0038] Data Acquisition and Test Judgment Unit: The board test system simulates the non-linear VA curve of the TV's LED backlight for testing, obtains the current and voltage data during the test process, uses trend analysis to detect whether there are abnormal current or voltage fluctuations, and conducts abnormal analysis and fault diagnosis when there are abnormalities. Compare with the preset fault case library to give the cause of the fault and the solution, so as to effectively control the product fault points and early failure rate. For example, when it is found that the current suddenly jumps significantly or fluctuates continuously within a certain voltage range and exceeds the normal error range, the system will determine it as a fault point and further analyze the cause of the fault, such as it may be a circuit design problem on the board or a quality defect of the diode itself.

[0039] In addition, to achieve the above object, the present invention also proposes a board voltage, current and insulation withstand voltage test device, which includes: a memory, a processor, and control instructions and other programs stored on the memory and executable on the processor, and the control instruction program is to implement the steps of a board voltage, current measurement and insulation withstand voltage test method as described above.

[0040] In addition, to achieve the above object, the present invention further provides a computer program product, which includes programs such as control instructions. When the control instructions and other programs are executed by a processor, they implement a method for measuring the voltage and current of a board card and performing an insulation withstand voltage test as described above.

[0041] The advantages and effects of the present invention are as follows:

[0042] The present invention provides a method and system for measuring the voltage and current of a board card and performing an insulation withstand voltage test. Through unified control and data processing, automated comprehensive testing of the board card is achieved, with stable system performance, accurate data acquisition, intelligent and rapid determination, and support for test data acquisition management and discreteness analysis, effectively improving the test efficiency and accuracy of the board card. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0044] Figure 1 It is a schematic flowchart of a method for measuring the voltage and current of a board card and performing an insulation withstand voltage test according to the present invention.

[0045] Figure 2 It is a schematic structural diagram of a system for measuring the voltage and current of a board card and performing an insulation withstand voltage test according to the present invention.

[0046] Figure 3 It is a schematic block diagram of the structure of an electronic device for measuring the voltage, current, and insulation withstand voltage of a board card according to the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0047] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0048] The present invention provides a method for measuring the voltage and current of a board card and performing an insulation withstand voltage test. The composition of the method is as Figure 1 shown, and includes the following steps:

[0049] Step S10: After starting the test cabinet of the board test system, set the system parameters and perform self-check to ensure that all parts of the test cabinet are operating normally. Connect the pneumatic dropping fixture to the test cabinet through a standard quick interface, and install the board to be tested on the fixture to ensure reliable electrical connection between the board and the system. Set various system parameters required for testing through the control and interaction unit.

[0050] Among them, in step S10, the board test system adopts the Chroma 8000 architecture, and the set system parameters include multiple sets of output voltages and currents of the power supply, load mode, test voltage and test time of the insulation withstand voltage test, etc.; the pneumatic dropping fixture has two board test positions on the left and right.

[0051] Specifically, in step S10, connect the pneumatic dropping fixture to the test cabinet through a standard quick interface, and perform quick switching and calibration of the product fixture. The steps for switching the fixture include

[0052] Preparation stage: Adjust the board test system to the off state and the pneumatic dropping fixture to the initial position. Remove the board and prepare the corresponding fixture according to the board to be tested. Ensure that the interface part of the fixture is clean and undamaged, and meets the connection standard of the quick interface;

[0053] Fixture switching: Carry the prepared fixture to the side of the test equipment, guide it through the standard quick interface, align the connection part of the fixture with the system, and push or rotate the fixture to fully connect it with the standard quick interface. Ensure that the connection is firm and there is no sign of looseness. During the connection process, the positioning pins and slots of the interface cooperate accurately to achieve precise positioning of the fixture. After the connection is completed, check whether the electrical connection between the fixture and the system is normal through the system self-check program to ensure that the test pins on the fixture are connected to the system test circuit and the signal transmission is normal;

[0054] Calibration stage: Start the board test system to enter the fixture calibration mode, send a series of test signals to the fixture for detection, and the system monitors the feedback signals of the fixture and compares them with the preset standard signals. For example, calibrate the voltage and current measurement channels of the fixture to check whether its measurement accuracy is within the allowable range. When an abnormality is detected during the inspection, the system issues an alarm and prompts the abnormal information, and the operator performs abnormal diagnosis. For example, problems such as a certain sensor on the fixture being damaged or the interface having poor contact need to be repaired or replaced; when the calibration passes, the system records the fixture calibration result and proceeds to the next round of board testing. Install the board to be tested on the fixture that has passed the calibration and perform board testing according to the normal test process.

[0055] Step S20: The power supply unit loads power to the board according to the set system parameters, and selects the appropriate load mode according to different board layout requirements to provide the required multiple sets of working voltages and currents for the board.

[0056] Specifically, the load modes in step S20 include constant current mode, constant voltage mode, constant resistance mode, constant power mode, and electronic load mode. Setting multiple load modes is more conducive to the switching and wire transfer of different boards, thereby reducing the workload of production process engineers and improving production test efficiency.

[0057] Step S30: After providing the working voltage and current to the board, the board test unit measures the voltage, current, and insulation withstand voltage of the board, and transmits the test data to the data processing and analysis unit in real time.

[0058] Among them, in step S30, when the board test unit measures the voltage, current, and insulation withstand voltage of the board, the measurements are carried out through a power meter, an oscilloscope, and a high-voltage tester R8000.

[0059] Specifically, when the board test unit tests the board in step S30, two boards are tested simultaneously through dual-channel switching. The test steps include:

[0060] Installation of the board under test: Install the two boards under test at the left and right board test positions of the pneumatic dropping fixture respectively. The system automatically identifies the access of the left and right board test positions through the electrical connection of the fixture, reads the board information, and assigns independent test channels to each board simultaneously;

[0061] Test parameter setting: According to the specific models and test requirements of the two boards, set the test parameters for each board respectively. The types of test parameters are the same as those set in the above step S10. When the test parameters have commonalities, the board test system can perform batch setting or quick replication to improve the efficiency of parameter setting. At the same time, the board test system will check the rationality of the set parameters to ensure that the parameters are within the test capabilities of the equipment and meet the test standards of the board;

[0062] Channel switching control: After starting the test, the board test system first tests the left board, and sequentially performs voltage test, current test, and insulation withstand voltage test according to the set test process. When all the test items of the left board are completed, the board test system sends a switching instruction to the control circuit of the test cabinet, and the control circuit switches to the test channel of the right board according to the received switching instruction to achieve seamless switching. During the switching process, it is necessary to ensure that there is no signal interference or data loss, and at the same time maintain the stable state of the test equipment.

[0063] Step S40: After receiving the test data, the data processing and analysis unit evaluates and analyzes the board data according to the pre-set evaluation criteria, outputs it to the user end through the control and interaction unit, and stores the test data and evaluation results in the storage unit at the same time.

[0064] Among them, the evaluation of the board card data in step S40 includes checking whether the board card voltage is within the set range, the stability and volatility of the voltage, and whether the frequency and waveform of the voltage meet the requirements.

[0065] Specifically, after receiving the test data, the data processing and analysis unit in step S40 performs evaluation and analysis of the board card data according to the pre-set evaluation criteria. The steps include:

[0066] Judgment and recording of test results: When the right board card completes the test, the board card test system automatically records the test results. For each test index, the test data is compared with the pre-set upper and lower limit standards and judged. When the test data is within the qualified range, the test result of this item is judged as PASS, and a green indicator light is lit on the display interface of the board card test system. When the test data is not within the qualified range, the test result of this item is judged as NG, and a red indicator light is lit on the display interface of the board card test system, and at the same time, the detailed error information is displayed and recorded;

[0067] Analysis of discreteness: Statistically analyze the test data, calculate statistical parameters such as the mean, standard deviation, maximum value, and minimum value of each test index, evaluate the degree of discreteness of the board card performance through the above parameters. For example, measure the stability of the voltage output by the standard deviation of the voltage value, and draw data distribution diagrams such as histograms and scatter plots to visually display the distribution of the test data. When abnormal aggregation or discreteness of the data is found, further analyze the reasons, such as process problems in the board card production process or errors in the test system;

[0068] Collaboration with the MES system: Establish a communication connection with the MES system, adopt standard industrial control protocols such as OPC UA, Modbus-TCP, etc., and perform data interaction configuration between the board card test system and the MES system, including defining the transmission format, frequency, and content of the data. After receiving the data, the MES system integrates the data into the entire production management process, for example, associates with information such as production orders and process flows to achieve full-process control of product testing; at the same time, the MES system sends information such as production plans and board card process parameters to the board card test system to achieve two-way data interaction and collaborative work;

[0069] Product traceability: Generate a unique identification code for each tested board card, such as a barcode, QR code, or serial number, and associate and store the identification code with the test data and results. During the entire board card production and supply chain process, the test records and test data of the board card can be quickly obtained by scanning or querying the identification code to achieve full-process traceability of the product.

[0070] In addition, the present invention also proposes a board card voltage, current measurement and insulation withstand voltage test system. Please refer to Figure 2, the board voltage, current measurement and insulation withstand voltage test system includes:

[0071] Test cabinet and fixture module: After starting the test cabinet of the board test system, set the system parameters and perform self-checks to ensure that all parts of the test cabinet are operating normally. Connect the pneumatic drop fixture to the test cabinet through a standard quick interface, install the board to be tested on the fixture, and perform precise sampling through the probes of the pneumatic drop fixture to ensure reliable electrical connection between the board and the system. Set various system parameters required for testing through the control and interaction unit;

[0072] Board test power supply module: Used to load power to the board according to the set system parameters, and select the load mode according to different board types to provide working voltage and current for the board;

[0073] Board measurement test module: After providing working voltage and current for the board, the board test measurement unit measures the voltage, current and insulation withstand voltage of the board, and at the same time transmits the measurement and test data to data processing and analysis in real time in the background;

[0074] Board test data processing and analysis module: After the data processing and analysis unit receives the test data, it makes precise judgments according to the preset data upper and lower limit standards, outputs the judgment results to the display screen of the user end through the control and interaction unit, and at the same time stores the test data and evaluation results in the storage unit;

[0075] Among them, in the test cabinet and fixture module, the board test system adopts the Chroma 8000 architecture, and the set system parameters include the output voltage and current of the power supply module, the load mode, the test voltage and test time of the insulation withstand voltage test; the pneumatic drop fixture has two board test positions on the left and right;

[0076] Among them, in the board test module, when the board test unit measures the voltage, current and insulation withstand voltage of the board, it is measured by a power meter, an oscilloscope and a high-voltage tester R8000;

[0077] Among them, the board data evaluation in the board test data processing and analysis module includes checking whether the board voltage is within the set range, the stability and volatility of the voltage, and whether the frequency and waveform of the voltage meet the requirements.

[0078] In addition, the system also has the function of testing the drive power supply of the TV LED backlight module, used to determine whether the output of the drive power supply of the TV LED backlight module corresponding to the board meets the current and voltage requirements, including:

[0079] System Preparation and Parameter Setting Unit: Start the board test system, enter the TV LED backlight power supply test mode, and preset the characteristic curve model of the LED backlight diode in this mode; according to the specification of the LED backlight diode used in the board to be tested, set relevant basic parameters according to the specifications and series-parallel connection methods of the LED backlight diodes driven by the board to be tested, including but not limited to key data such as the expected threshold voltage range, normal operating voltage range, and maximum allowable current, etc., to provide a judgment standard and control basis for the subsequent test process, and adjust the load mode to the LED load characteristic working mode for subsequent non-linear VA curve simulation;

[0080] Non-linear VA Curve Simulation Unit: According to the preset relevant parameters and algorithms, increase the output voltage at a set gradient, with the starting voltage set at 0.1V. When the oscilloscope monitors an increase in current, set the maximum monitored current as the threshold current and the corresponding voltage as the threshold voltage; after the voltage is greater than the threshold voltage, according to the preset characteristic curve model of the LED backlight diode, adjust the rate and gradient of voltage increase to simulate the non-linear process of current increasing with voltage. For example, within a certain range after the voltage exceeds the threshold, control the rising speed of the voltage according to the exponential function or a specific polynomial function relationship, and continuously monitor the current change to ensure that the simulated curve fits the preset characteristic curve of the LED backlight diode as closely as possible; and real-time draw the current-voltage curve on the display interface of the board test system;

[0081] Data Acquisition and Test Judgment Unit: The board test system simulates the non-linear VA curve of the TV's LED backlight for testing, obtains the current and voltage data during the test process, uses trend analysis to detect whether there are abnormal current or voltage fluctuations, and conducts abnormal analysis and fault diagnosis when there are abnormalities. Compare with the preset fault case library to give the cause of the fault and the solution, so as to effectively control the product fault points and early failure rate. For example, when it is found that the current suddenly jumps significantly or fluctuates continuously within a certain voltage range and exceeds the normal error range, the system will determine it as a fault point and further analyze the cause of the fault, such as it may be a circuit design problem on the board or a quality defect of the diode itself.

[0082] A system for measuring the voltage, current, and insulation withstand voltage of a board card provided by the present application adopts a method for measuring the voltage, current, and insulation withstand voltage of a board card in the above-mentioned embodiment, and can solve the technical problem of low efficiency of traditional board card testing methods. Compared with the prior art, the beneficial effects of the system for measuring the voltage, current, and insulation withstand voltage of a board card provided by the present application are the same as those of the method for measuring the voltage, current, and insulation withstand voltage of a board card provided by the above-mentioned embodiment, and other technical features in the system for measuring the voltage, current, and insulation withstand voltage of a board card are the same as the features disclosed in the method of the above-mentioned embodiment, and will not be elaborated herein.

[0083] The present application provides a device for testing the voltage, current, and insulation withstand voltage of a board card. The device for testing the voltage, current, and insulation withstand voltage of a board card includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute a method for measuring the voltage, current, and insulation withstand voltage of a board card in the first embodiment above.

[0084] Reference is made below Figure 3 , which shows a schematic structural diagram of a device for testing the voltage, current, and insulation withstand voltage of a board card suitable for implementing the embodiments of the present application. The device for testing the voltage, current, and insulation withstand voltage of a board card in the embodiments of the present application may include, but is not limited to, mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions: tablet computers), PMPs (Portable Media Players), etc., and fixed terminals such as digital TVs, desktop computers, etc. Figure 3 The device for testing the voltage, current, and insulation withstand voltage of a board card shown is merely an example and should not impose any limitation on the functions and usage scope of the embodiments of the present application.

[0085] Figure 3A board voltage, current, and insulation withstand voltage test device as shown may include a processing system 1001 (such as a central processing unit, a graphics processing unit, etc.), which may perform various appropriate actions and processes according to a program stored in a read-only memory (ROM: Read Only Memory) 1002 or a program loaded from a storage system 1003 into a random access memory (RAM: Random Access Memory) 1004. In the RAM 1004, various programs and data required for the operation of a board voltage, current, and insulation withstand voltage test device are also stored. The processing system 1001, the ROM 1002, and the RAM 1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Generally, the following systems may be connected to the I / O interface 1006: an input system 1007 including, for example, a touch screen, a touchpad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; an output system 1008 including, for example, a liquid crystal display (LCD: Liquid Crystal Display), a speaker, a vibrator, etc.; a storage system 1003 including, for example, a magnetic tape, a hard disk, etc.; and a communication system 1009. The communication system 1009 may allow a board voltage, current, and insulation withstand voltage test device to communicate with other devices wirelessly or wiredly to exchange data. Although a board voltage, current, and insulation withstand voltage test device with various systems is shown in the figure, it should be understood that it is not required to implement or have all the shown systems. More or fewer systems may be implemented or had alternatively.

[0086] In particular, according to the embodiments disclosed in the present application, the processes described above with reference to the flowcharts may be implemented as computer software programs. For example, the embodiments disclosed in the present application include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program contains program codes for performing the methods shown in the flowcharts. In such an embodiment, the computer program may be downloaded and installed from a network through the communication system, or installed from the storage system 1003, or installed from the ROM 1002. When the computer program is executed by the processing system 1001, the above functions defined in the methods of the embodiments disclosed in the present application are executed.

[0087] A board voltage, current and insulation withstand voltage test device provided by the present application adopts a board voltage, current measurement and insulation withstand voltage test method in the above-mentioned embodiment, and can solve the technical problem of low efficiency of the traditional board test method. Compared with the prior art, the beneficial effects of a board voltage, current and insulation withstand voltage test device provided by the present application are the same as those of a board voltage, current measurement and insulation withstand voltage test method provided by the above-mentioned embodiment, and other technical features in the board voltage, current and insulation withstand voltage test device are the same as those disclosed in the method of the previous embodiment, and will not be elaborated here.

[0088] Each part disclosed in the present application can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in a suitable manner in any one or more embodiments or examples.

[0089] The present application also provides a computer program product, including a computer program, and the steps of a board voltage, current measurement and insulation withstand voltage test method as described above are implemented when the computer program is executed by a processor.

[0090] The computer program product provided by the present application can solve the technical problem of low efficiency of the traditional board test method. Compared with the prior art, the beneficial effects of the computer program product provided by the present application are the same as those of a board voltage, current measurement and insulation withstand voltage test method provided by the above-mentioned embodiment, and will not be elaborated here.

[0091] The above are only partial embodiments of the present application, and thus do not limit the patent scope of the present application. Any equivalent structural transformation made by using the specification and drawings of the present application under the technical concept of the present application, or direct / indirect application in other related technical fields, is included in the patent protection scope of the present application.

Claims

1. A method for measuring voltage and current of a board and testing insulation withstand voltage, characterized in that: The method comprises the following steps: Step S10: After starting the test cabinet of the board test system, set the system parameters and perform self-test, connect the pneumatic drop fixture to the test cabinet through a standard quick interface, install the board to be tested on the fixture, and perform precise sampling through the probe of the pneumatic drop fixture; Step S20: Loading power to the board according to the set system parameters, and selecting a load mode according to different board types to provide the board with working voltage and current; Step S30: After providing the working voltage and current to the board, the board test unit performs voltage measurement, current measurement and insulation withstand voltage test on the board, and transmits the measurement and test data to the data processing and analysis in real time in the background; Step S40: After receiving the test data, the data processing and analysis unit makes an accurate judgment according to the preset upper and lower limit standards of the data, outputs the judgment result to the display screen of the user end through the control and interaction unit, and stores the test data and the evaluation result in the storage unit; In step S10, the board test system adopts the Chroma 8000 architecture, and the set system parameters include the output voltage and current of the power supply, the load mode, the test voltage and test time of the insulation withstand voltage test; the pneumatic drop fixture has two left and right board test positions; In step S30, the board test unit performs voltage measurement, current measurement and insulation withstand voltage test on the board, and the measurement is performed by a power meter, an oscilloscope and a high-voltage tester R8000; The board data evaluation in step S40 includes checking whether the board voltage is within a set range, the stability and volatility of the voltage, and whether the frequency and waveform of the voltage meet the requirements.

2. A method for measuring board voltage and current and testing insulation withstand voltage according to claim 1, characterized in that: In step S10, the pneumatic drop-type fixture is connected to the test cabinet through a standard quick interface for rapid switching and verification. The steps of switching the pneumatic drop-type fixture include: Preparation stage: adjust the board test system to the closed state and the pneumatic drop fixture to the initial position, take out the board, and prepare the corresponding fixture according to the board to be tested; Fixture switching: Move the prepared fixture to the side of the test equipment, guide it through the standard quick interface, align the connection parts of the fixture and the system, push or rotate the fixture to fully connect with the standard quick interface, and after the connection is completed, check whether the electrical connection between the fixture and the system is normal through the system self-test program; Verification phase: Start the board test system to enter the fixture verification mode, send the test signal to the fixture for detection, the system monitors the feedback signal of the fixture and compares it with the preset standard signal. When the test is abnormal, the system will issue an alarm and prompt the abnormal information, and the operator will perform abnormal diagnosis; when the verification passes, the system will record the fixture verification results and carry out the next round of board test, install the board to be tested on the fixture that has passed the verification, and carry out board test according to the normal test process.

3. A method for measuring board voltage and current and testing insulation withstand voltage according to claim 1, characterized in that: The load modes in step S20 include constant current mode, constant voltage mode, constant resistance mode, constant power mode and electronic load mode.

4. A method for measuring board voltage and current and testing insulation withstand voltage according to claim 1, characterized in that: When the board test unit tests the board in step S30, two boards are tested simultaneously by dual-channel switching. The testing steps include: Installation of the boards to be tested: Install the two boards to be tested at the left and right board test positions of the pneumatic drop fixture. The system automatically identifies the access of the left and right board test positions through the electrical connection of the fixture, reads the board information and allocates an independent test channel to each board at the same time; Test parameter setting: according to the specific models and test requirements of the two boards, set the test parameters of each board respectively, and the test parameters are the same as the parameter types set in the above step S10; Channel switching control: After the test is started, the board test system first tests the board on the left, and performs voltage test, current test and insulation withstand voltage test in sequence according to the set test process. When the board on the left completes all test items, the board test system sends a switching command to the control circuit of the test cabinet. The control circuit switches to the test channel of the board on the right according to the received switching command.

5. A method for measuring board voltage and current and testing insulation withstand voltage according to claim 1, characterized in that: In step S40, after receiving the test data, the data processing and analysis unit performs board data evaluation and analysis according to a preset evaluation standard, and the steps include: Test result determination and recording: When the right board completes the test, the board test system automatically records the test results. For each test indicator, the test data is compared with the preset upper and lower limit standards and determined. When the test data is within the qualified range, the test result is determined to be PASS, and a green indicator light is on the display interface of the board test system. When the test data is not within the qualified range, the test result is determined to be NG, and a red indicator light is on the display interface of the board test system, and the error information is displayed and recorded at the same time; Discreteness analysis: Statistical analysis is performed on the test data to calculate the mean, standard deviation, maximum value and minimum value of each test index. The discreteness of the board performance is evaluated through the above parameters, and data distribution diagrams such as histograms and scatter plots are drawn to intuitively display the distribution of the test data. When abnormal aggregation or discreteness is found in the data, the cause is further analyzed. MES system collaboration: Establish communication connection with the MES system, adopt standard industrial control protocol, and configure data interaction between the board test system and the MES system, including defining the data transmission format, frequency and content. After receiving the data, the MES system integrates the data into the entire production management process; at the same time, the MES system sends the production plan and board process parameter information to the board test system to achieve two-way data interaction and collaborative work; Product traceability: A unique identification code is generated for each tested board and card, and the identification code is associated with the test data and results and stored. During the entire board production and supply chain process, the test records and test data of the board and card can be obtained by scanning or querying the identification code, thus achieving full traceability of the product.

6. A board voltage, current measurement and insulation withstand voltage test system, characterized in that: The board voltage, current measurement and insulation withstand voltage test system comprises: Test cabinet and fixture module: used to start the test cabinet of the board test system, set system parameters and perform self-test, connect the pneumatic drop fixture to the test cabinet through a standard quick interface, install the board to be tested on the fixture, and perform precise sampling through the probe of the pneumatic drop fixture; Board test power supply module: used to load power to the board according to the set system parameters, and select the load mode according to different board types to provide the board with working voltage and current; Board measurement and test module: After providing the working voltage and current to the board, the board test and measurement unit performs voltage measurement, current measurement and insulation withstand voltage test on the board, and transmits the measurement and test data to data processing and analysis in real time in the background; Board test data processing and analysis module: used for the data processing and analysis unit to make accurate judgments according to the preset upper and lower limit standards of the data after receiving the test data, output the judgment results to the display screen of the user end through the control and interaction unit, and store the test data and evaluation results in the storage unit at the same time; The board test system in the test cabinet and fixture module adopts the Chroma 8000 architecture, and the set system parameters include the output voltage and current of the power module, the load mode, the test voltage and test time of the insulation withstand voltage test; the pneumatic drop fixture has two left and right board test positions; The board test unit in the board test module performs voltage measurement, current measurement and insulation withstand voltage test on the board, and the measurement is performed through a power meter, an oscilloscope and a high-voltage tester R8000; The board data evaluation in the board test data processing and analysis module includes checking whether the board voltage is within a set range, the stability and volatility of the voltage, and whether the frequency and waveform of the voltage meet the requirements.

7. A board voltage, current measurement and insulation withstand voltage test system according to claim 7, characterized in that: The system also has the function of testing the driving power supply of the TV LED backlight module, which is used to determine whether the output of the driving power supply of the TV LED backlight module corresponding to the board meets the current and voltage requirements, including: System preparation and parameter setting unit: Start the board test system and enter the TV LED backlight power supply test mode, in which the characteristic curve model of the LED backlight particle diode is preset; set relevant parameters according to the specifications and series-parallel mode of the LED backlight particle diode driven by the board to be tested, including the expected threshold voltage range, normal working voltage range and maximum allowable current, and adjust the load mode to the LED load characteristic working mode for subsequent nonlinear VA curve simulation; Nonlinear VA curve simulation unit: according to the preset relevant parameters and algorithms, the output voltage is increased according to the set gradient, and the starting voltage is set to 0.1V. When the oscilloscope detects the current rising, the maximum value of the monitored current is set as the threshold current, and the corresponding voltage is set as the threshold voltage; when the voltage is greater than the threshold voltage, according to the preset characteristic curve model of the LED backlight particle diode, the rate and gradient of voltage increase are adjusted to simulate the nonlinear process of current increasing with voltage, and the current-voltage curve is drawn in real time on the display interface of the board test system; Data acquisition and test judgment unit: The board test system simulates the nonlinear VA curve of the LED backlight of the TV set for testing, obtains the current and voltage data during the test, uses trend analysis to detect whether there are abnormal current or voltage fluctuations, and performs abnormal analysis and fault diagnosis when there are abnormalities. By comparing with the preset fault case library, the cause of the fault and the solution are given.

8. A board voltage, current measurement and insulation withstand voltage test device, characterized in that: The board voltage, current and insulation withstand voltage test equipment comprises: A memory, a processor, and a program for controlling an injection pump stored in the memory and executable on the processor, wherein when the program for controlling the injection pump is executed by the processor, a method for measuring voltage and current of a board and testing insulation withstand voltage as described in any one of claims 1 to 6 is implemented.

9. A computer program product, characterized in that The computer program product includes a program for controlling an injection pump, and when the program for controlling the injection pump is executed by a processor, a method for measuring voltage and current of a board and testing insulation withstand voltage as described in any one of claims 1 to 6 is implemented.

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