Multi-factor collaborative test method and system for evaluating irradiation effect of electronic component

Abstract

The invention belongs to the field of electronic component irradiation, and discloses a multi-factor collaborative test method and system for electronic component irradiation effect evaluation, and the method comprises the steps: setting irradiation test factors and dosage levels based on an orthogonal test theory; carrying out an irradiation test, and recording the change condition of all-parameter damage data of the electronic component; according to the irradiation test data, performing model fitting on the multiple parameter damage degradation data of the electronic component and the test condition data, and determining an optimal model; establishing a regression equation between the electrical parameter damage of the electronic component and each irradiation test condition factor; drawing a three-dimensional response surface diagram or calculating a maximum value point, obtaining the influence degree of each factor on a response variable, and determining an optimal level combination of each factor; and according to the optimal level combination, carrying out a multi-factor collaborative irradiation test, and verifying a theoretical prediction result. The problem that in the prior art, test design is not scientific and reasonable enough is solved.

Description

Technical Field

[0001] The present invention belongs to, but is not limited to, the technical field of irradiation of electronic components, and particularly relates to a multi-factor collaborative test method and system for evaluating the irradiation effect of electronic components. Background Art

[0002] With the increasing frequency of global nuclear-related activities in recent years, nuclear accidents occur from time to time. The contaminated environment caused by nuclear leakage is a comprehensive radiation environment with multiple particles coexisting, which will cause collaborative irradiation damage effects to the electronic devices, electronic systems and their electronic components working therein. In the early stage, a large number of studies have been carried out on the single-factor irradiation damage effect, and relatively rich results have been obtained. However, there are few studies on the multi-factor collaborative irradiation effect of electronic components, especially the research results on collaborative tests are even rarer.

[0003] In view of the above analysis, the technical problems urgently to be solved in the prior art are as follows:

[0004] In order to better evaluate the multi-factor collaborative irradiation damage effect and reinforcement technology of electronic components, it is urgent to carry out relevant research and propose reasonable and feasible test methods and evaluation schemes. Summary of the Invention

[0005] Aiming at the problems existing in the prior art, the present invention provides a multi-factor collaborative test method and system for evaluating the irradiation effect of electronic components.

[0006] The present invention is implemented as follows. A multi-factor collaborative test method for evaluating the irradiation effect of electronic components, the multi-factor collaborative test method for evaluating the irradiation effect of electronic components, the method specifically includes:

[0007] S1: Based on the orthogonal test theory, set the irradiation test factors and dose levels;

[0008] S2: Implement the irradiation test and record the change of the full-parameter damage data of the electronic components;

[0009] S3: According to the irradiation test data, fit the multiple parameter damage degradation data and test condition data of the electronic components with a linear model, a quadratic model or a higher-order model, and determine the optimal model through model significance detection, lack-of-fit item detection and correlation test;

[0010] S4: Further analyze the data and establish a regression equation between the electrical parameter damage of the electronic components and each irradiation test condition factor;

[0011] S5: Through the regression equation, draw a three-dimensional response surface diagram or calculate the maximum point to obtain the influence degree of each factor on the response variable, and determine the optimal level combination of each factor according to the response surface diagram;

[0012] S6: Conduct a multi-factor collaborative irradiation experiment based on the optimal level combination obtained in step S5 to verify the theoretical prediction results.

[0013] Further, for S1, scientific research usually refers to design methods such as Box-Behnken Design (BBD) or Central Composite Design (CCD).

[0014] Further, for S2, irradiate the test electronic components with each factor X1, X2, X3,..., Xn respectively to determine the damage degradation law of the factor to the selected electronic components, and determine the inflection point total dose and dose rate when the irradiation effect of the factor deteriorates rapidly.

[0015] Further, for S6, consider the influence of the damage effect caused by the irradiation sequence and conduct a control experiment as appropriate.

[0016] Another object of the present invention is to provide a multi-factor collaborative test design system for evaluating the irradiation effect of electronic components, which specifically includes:

[0017] An irradiation test module for conducting irradiation tests;

[0018] A model fitting module for fitting a model to the damage degradation data of multiple parameters of electronic components and the test condition data;

[0019] A data analysis module for analyzing data and establishing a regression equation between the electrical parameter damage of electronic components and each irradiation test condition factor;

[0020] A calculation module for determining the optimal level combination of each factor to achieve the optimal value of the response variable;

[0021] A verification module for conducting a multi-factor collaborative irradiation experiment based on the optimal level combination to verify the theoretical prediction results.

[0022] Combined with the above technical solutions and the solved technical problems, the advantages and positive effects of the technical solution to be protected by the present invention are:

[0023] First, the present invention provides a collaborative irradiation test method and system for electronic components under the collaboration of multiple factors such as ionization radiation, neutron displacement damage, thermal stress, proton irradiation, and irradiation sequence, which is used to solve the problem of unscientific and unreasonable test design in the prior art.

[0024] The technical solution of the present invention uses a multi-factor collaborative test design method for evaluating the effect of electronic components under irradiation conditions, and significantly solves the following problems in the prior art:

[0025] 1. Low efficiency of experimental design: Traditional irradiation effect evaluations usually adopt single-factor or incomplete multi-factor experimental designs, which often consume a large amount of time and resources and are difficult to comprehensively reveal the synergistic effects of various irradiation factors. Based on the orthogonal experiment theory, the present invention combines multiple factors such as irradiation dose, time, and irradiation type, thereby obtaining the optimal level combination with fewer experimental times and greatly improving the efficiency of experimental design.

[0026] 2. Insufficient accuracy of parameter degradation evaluation: Existing methods mostly use simple regression models or empirical methods to analyze the irradiation effects of components, and do not fully consider the complex multi-factor degradation relationships of electronic components. Through the method of the present invention, a multi-parameter regression model and response surface analysis are established, effectively revealing the non-linear relationship between the performance degradation of electronic components and irradiation factors, making the evaluation of parameter degradation more scientific and accurate.

[0027] 3. Lack of effective optimization strategies: In the prior art, it is difficult to accurately determine the optimal combination of irradiation test conditions. Through regression analysis and the drawing of response surface diagrams, the present invention visually shows the influence of each factor on the response of components and can calculate the extreme points, thereby determining the optimal irradiation level combination. This optimization strategy effectively improves the accuracy of the experimental scheme and makes the evaluation process more economical and efficient.

[0028] 4. Low predictability and reliability of experimental results: By constructing a multi-factor regression model and conducting significance tests and lack-of-fit tests, the present invention ensures the accuracy and reliability of the model. The finally generated regression equation can be used to predict the damage conditions of components under different irradiation conditions, providing reliable data support for the use safety of electronic components in extreme environments.

[0029] The technical solution of the present invention not only improves the efficiency and accuracy of the irradiation effect evaluation of electronic components, but also provides a reliable basis for formulating strategies to enhance the irradiation resistance of components, showing significant technological progress and broad application prospects in industrial applications.

[0030] Second, (1) The expected benefits and commercial value after the transformation of the technical solution of the present invention:

[0031] The technological innovation of the multi-factor collaborative experimental design system of the present invention in the field of irradiation effect evaluation of electronic components can bring significant commercial value and economic benefits. Its expected benefits and commercial value are reflected in the following aspects:

[0032] Improving the radiation tolerance of electronic components: By optimizing the radiation test conditions and parameters, this system can significantly enhance the performance of electronic components in high-radiation environments, enabling them to have higher reliability and safety in high-risk fields such as aerospace, nuclear energy, and military industries, meeting the requirements of these industries for highly reliable electronic equipment, and thus promoting the technological development and application of related industries.

[0033] Optimizing product design: Through multi-factor collaborative experiments and data analysis, this invention can help manufacturers optimize the design and material selection of electronic components, thereby improving the radiation resistance of components at the design stage, reducing later modifications and rework, and lowering production and R & D costs.

[0034] Reducing R & D costs and cycle: Traditional radiation effect evaluations usually require a large amount of experimental data and repeated tests. However, this invention, through intelligent multi-factor collaborative test design, can quickly identify key factors and optimize the test process, shorten the R & D cycle, improve the accuracy of testing, reduce unnecessary experimental steps and time, and thus lower R & D costs.

[0035] Market expansion and technological leadership: The precise evaluation platform provided by this invention fills the technical gap in the evaluation field of electronic components in high-radiation environments, can help domestic and foreign scientific research and industrial institutions improve their technical levels, enhance their competitiveness in the international market, and promote the development and technological innovation of related industries.

[0036] (2) The technical solution of this invention solves the technical problems that people have always been eager to solve but have never succeeded in:

[0037] This invention solves the problems of damage and degradation evaluation of electronic components in radiation environments, especially the synergistic effects under various complex radiation test conditions. Most traditional radiation effect evaluation methods rely on single-factor tests, which cannot comprehensively consider the combined effects of different factors on the damage and degradation of electronic components, resulting in insufficient accuracy and practicality of evaluation results. On the other hand, due to the lack of efficient model fitting and data analysis techniques, existing technologies often cannot achieve precise damage prediction and optimal design.

[0038] This invention has successfully solved these problems through the following technological innovations:

[0039] Multi-factor collaborative test design: This invention combines the influences of multiple factors. By optimizing the experimental design, it effectively improves the comprehensiveness and scientific nature of radiation tests, ensures the accuracy and reliability of experimental results, fully considers the interactions of different radiation conditions, and makes the radiation effect evaluation of electronic components more comprehensive.

[0040] Model fitting and regression analysis: Through the precise fitting of experimental data, the present invention establishes a regression equation between the electrical parameter damage of electronic components and the irradiation test conditions, providing a theoretical basis for subsequent design optimization. This process effectively solves the technical problem in the prior art of being unable to accurately predict irradiation effects.

[0041] Optimization design and verification: The present invention determines the optimal level combination through a calculation module and conducts multi-factor collaborative experiments to ensure that the theoretical prediction is consistent with the actual effect, providing a practical optimization scheme for the irradiation resistance of electronic components. This comprehensive method combining optimization design and experimental verification is a breakthrough in traditional test methods.

[0042] Therefore, the technical solution of the present invention not only solves the key technical problems in the evaluation of the irradiation effects of electronic components, but also promotes the innovation of technologies in the field of irradiation effect evaluation, providing reliable technical support for the application of electronic components in high-irradiation environments. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 is a flowchart of a multi-factor collaborative test method for evaluating the irradiation effects of electronic components provided by an embodiment of the present invention;

[0044] Figure 2 is a module diagram of a multi-factor collaborative test design for evaluating the irradiation effects of electronic components provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0045] In order to make the objectives, technical solutions and advantages of the present invention clearer and more understandable, the present invention will be further described in detail below with reference to embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0046] As Figure 1 shown, an embodiment of the present invention provides a multi-factor collaborative test method for evaluating the irradiation effects of electronic components, which specifically includes:

[0047] S1: Based on the orthogonal test theory, set the irradiation test factors and dose levels;

[0048] S2: Conduct the irradiation test and record the changes in the full-parameter damage data of the electronic components;

[0049] S3: According to the irradiation test data, perform linear model, quadratic model or higher-order model fitting on the damage degradation data of multiple parameters of the electronic components and the test condition data, and determine the optimal model through model significance detection, lack-of-fit item detection and correlation test;

[0050] S4: Further analyze the data and establish a regression equation between the electrical parameter damage of electronic components and various factors of the irradiation test conditions;

[0051] S5: Through the regression equation, plot a three-dimensional response surface graph or calculate the maximum point to obtain the influence degree of each factor on the response variable. According to the response surface graph, determine the optimal level combination of each factor to achieve the optimal value of the response variable;

[0052] S6: According to the optimal level combination obtained in step S5, conduct a multi-factor collaborative irradiation test to verify the theoretical prediction results.

[0053] The working principle of the present invention is as follows:

[0054] Set test factors and dose levels:

[0055] The first step of the method of the present invention is based on the orthogonal test theory, and reasonably sets various factors (such as irradiation intensity, irradiation time, temperature, etc.) of the irradiation test and the dose levels of each factor. The orthogonal test design can effectively balance each variable in the test, thereby reducing the number of experiments and resource waste, and at the same time ensuring accurate experimental data can be obtained. This stage provides a scientific design basis for subsequent test implementation and data analysis.

[0056] Implement irradiation test and data recording: After determining the test factors and dose levels, conduct the irradiation test and record the change of the full parameter damage data of the electronic components in real time during the test. The damage data includes, but is not limited to, the changes in electrical parameters such as resistance, voltage, and capacitance. By monitoring these data changes in real time, the performance degradation process of the electronic components under different irradiation conditions can be comprehensively understood. These data provide a basis for subsequent model fitting and analysis.

[0057] Data fitting and optimal model determination: The irradiation test data collected will be used to fit the damage degradation data of the electronic components and the test condition data. Use a linear model, a quadratic model or a higher-order polynomial model to fit the data. The selection of the model is based on the significance test of the model, the lack-of-fit test and the correlation test. Through these detection methods, ensure that the selected model can accurately describe the relationship between the damage of the electronic components and the irradiation conditions, so as to determine the optimal regression model for subsequent analysis and prediction.

[0058] Regression analysis and determination of optimal level combination: After data fitting, further data analysis is carried out to establish a regression equation between the electrical parameter damage of electronic components and various irradiation test condition factors. Through the regression equation, a three-dimensional response surface graph can be plotted, and the influence degree of each factor on the response variable (i.e., the damage of electronic components) can be calculated. According to the response surface graph, the optimal level combination of each factor is determined, and then the optimal value of the response variable is obtained. Finally, based on this optimal level combination, a multi-factor collaborative irradiation test is carried out to verify the accuracy of the theoretical prediction results and ensure the reliability and practicability of this method in practical applications.

[0059] For S1, generally, design methods such as Box-Behnken Design (BBD) or Central Composite Design (CCD) are referred to in scientific research.

[0060] For S2, each factor X1, X2, X3,..., Xn is used to irradiate the test electronic components respectively to determine the damage degradation law of this factor to the selected electronic components, and to determine the inflection point total dose and dose rate when the irradiation effect of this factor deteriorates rapidly.

[0061] For S6, considering the influence of the damage effect caused by the irradiation sequence, a control test can be carried out as appropriate.

[0062] This method first sets the key factors and dose levels of the irradiation test through the orthogonal test theory (step S1). Orthogonal test design is a systematic and efficient method. By arranging the level combinations of different factors, it can minimize the number of tests to the greatest extent while ensuring a comprehensive investigation of the synergistic effects between different factors. For the evaluation of the irradiation effect of electronic components, this step can systematically explore the influence of each factor on the performance degradation of the components by setting different irradiation doses and irradiation conditions.

[0063] After the test design is completed, it enters step S2 to implement the irradiation test and collect the full-parameter damage data of each electronic component. These data usually include the changes in the key electrical parameters (such as current gain, leakage current, capacitance, etc.) of the components under different irradiation dose conditions. By monitoring the changes in these electrical parameters, the degradation effect of irradiation on the component performance can be quantified, providing data support for subsequent modeling and regression analysis.

[0064] Based on the collected test data, step S3 constructs different mathematical models to simulate the relationship between component parameter degradation and irradiation conditions. Usually, linear models, quadratic models or higher-order models are adopted, and significance tests, lack-of-fit tests and correlation tests are carried out on the models. Finally, a model that can best explain the data changes is selected. This step ensures the accurate description of the component irradiation effect by the model and lays a foundation for establishing the regression equation in the next step.

[0065] After determining the optimal model, step S4 is entered. Further use this model to deeply analyze the irradiation test data and establish a regression equation between parameter degradation and various irradiation condition factors. This regression equation clearly reflects the influence relationship of each factor on the parameter degradation of electronic components, providing a basic basis for optimizing the irradiation test.

[0066] Through step S5, use the regression equation to draw a three-dimensional response surface diagram or calculate the maximum point to visually display the influence degree of each factor on the response variable (parameter degradation). The response surface diagram presents the effects under different factors and their combinations in a visual form, facilitating the determination of the optimal combination of each irradiation factor and maximizing the control or optimization of the irradiation effect evaluation of electronic components.

[0067] Finally, in step S6, based on the determined optimal level combination, a confirmatory test is carried out, and a multi-factor collaborative irradiation test is further carried out. Through this process, verify whether the optimal conditions predicted by the regression equation and response surface analysis are effective in actual tests, thereby verifying the reliability of the theoretical model and providing scientific support for the irradiation effect evaluation and improvement of components.

[0068] As Figure 2 shown, a multi-factor collaborative test design system for irradiating effect evaluation of electronic components provided by an embodiment of the present invention specifically includes:

[0069] An irradiation test module for carrying out an irradiation test;

[0070] A model fitting module for fitting a model to multiple parameter damage degradation data and test condition data of electronic components;

[0071] A data analysis module for analyzing data and establishing a regression equation between the electrical parameter damage of electronic components and various irradiation test condition factors;

[0072] A calculation module for determining the optimal level combination of each factor to achieve the optimal value of the response variable;

[0073] A verification module for carrying out a multi-factor collaborative irradiation test according to the optimal level combination and verifying the theoretical prediction result.

[0074] The working principle of the present invention is as follows:

[0075] Irradiation Test Module: The workflow of the present invention is first initiated by the irradiation test module, which is responsible for conducting irradiation tests on electronic components in a controlled environment. By selecting appropriate irradiation doses and irradiation times, the irradiation effects of electronic components in the actual use environment are simulated. These test conditions and environmental factors provide basic data for subsequent data analysis and model fitting, ensuring the authenticity and representativeness of the test results.

[0076] Model Fitting Module: The damage degradation data of electronic components under different irradiation conditions collected by the irradiation test module will be input into the model fitting module. In this module, the relationships between multiple irradiation test condition data (such as irradiation intensity, time, temperature, etc.) and the electrical parameter damage of electronic components (such as resistance change, capacitance change, etc.) are fitted through mathematical models. In this way, the influence laws of different parameters on the damage of electronic components can be extracted, providing theoretical support for establishing regression equations.

[0077] Data Analysis Module and Regression Equation Establishment: After model fitting, the data analysis module will further process these results, conduct multi-factor analysis, and find out the main influencing factors of each irradiation condition factor on the electrical parameter damage of electronic components. The module conducts regression analysis on these data to establish a regression equation between each irradiation condition factor and the electrical parameter damage of electronic components. This regression equation can be used to predict the damage situation of electronic components under specific irradiation conditions, providing a scientific basis for the design optimization of components.

[0078] Calculation and Verification Module: After determining the regression equation and influencing factors, the calculation module uses these data and the regression equation to calculate the optimal combination of each irradiation condition, aiming to achieve the optimal performance and irradiation resistance of electronic components. Through simulation and theoretical calculation, the optimal combination of irradiation conditions is determined, and an actual multi-factor collaborative irradiation test is carried out in the verification module to verify the accuracy of these theoretical prediction results. Finally, the verification module ensures the accuracy and effectiveness of the calculation model by comparing with experimental data, and then provides reliable guiding opinions for the design and optimization of electronic components.

[0079] I. Specific Application Areas or Related Products of the Present Invention:

[0080] The multi-factor collaborative test design system provided by the present invention is mainly applied to the performance evaluation and optimization of electronic components in an irradiation environment, and is widely used in the irradiation effect evaluation of electronic components in fields such as aerospace, nuclear energy, electric power, and national defense. With the continuous development of technology, electronic components are widely used in various high-radiation environments. Therefore, how to effectively evaluate and optimize the performance of these components under irradiation conditions to ensure their long-term stable operation has become an important problem to be solved urgently.

[0081] Related products of this system include:

[0082] Irradiation effect evaluation system: used for the irradiation effect test and evaluation of electronic components in high-radiation environments such as aerospace and nuclear energy.

[0083] Optimization tool for irradiation damage model of electronic components: used to help enterprises and research institutions optimize component design through multi-factor collaborative experiments and improve their irradiation resistance.

[0084] Irradiation test instrument: a device designed specifically for irradiation tests, capable of precisely controlling irradiation environment parameters and collecting and analyzing experimental data.

[0085] Through these products, it is possible to help enterprises and research institutions in related fields systematically evaluate the irradiation resistance of electronic components and improve their reliability and service life in high-radiation environments through optimized design.

[0086] II. Evidence related to the technical effects obtained in the embodiments of the present invention:

[0087] Improve the accuracy of irradiation evaluation of electronic components: The present invention, through a multi-factor collaborative test design system, combined with modules such as irradiation tests, model fitting, and data analysis, can effectively evaluate the damage and degradation of electronic components under different irradiation conditions. Different from traditional single-factor tests, the present invention can establish a more accurate regression model by comprehensively considering multiple factors, thereby improving the accuracy of irradiation effect evaluation and helping researchers deeply understand the comprehensive impact of different irradiation conditions on the performance of electronic components.

[0088] Optimize the design of electronic components: Through the calculation module and verification module, the system of the present invention can help researchers determine the optimal condition combination in irradiation tests and verify the theoretical prediction results. This process optimizes the irradiation resistance of electronic components, providing theoretical support and experimental basis for the design of high-irradiation-tolerant electronic components. This technical effect can significantly improve the reliability of electronic components in extreme environments.

[0089] Improve the efficiency of irradiation tests: The multi-factor collaborative test design system of the present invention can reduce redundant experiments through reasonable test conditions and optimized models, saving a large amount of time and resources. Through the data analysis module, researchers can quickly screen out factors that have a significant impact on irradiation effects, avoiding a large number of unnecessary experiments in traditional tests and improving the test efficiency.

[0090] Applicable to multiple high-irradiation environments: This system is applicable not only to fields such as aerospace and nuclear energy, but also to the performance evaluation of electronic components in other high-irradiation environments. For example, in nuclear power plants or space exploration missions, the system can accurately evaluate the long-term stability and reliability of electronic components according to different irradiation conditions, ensuring the safe operation of equipment in harsh environments.

[0091] Through these technical effects, the present invention provides a comprehensive, accurate, and optimized evaluation platform for the irradiation effect evaluation of electronic components, providing strong support for technological innovation and product optimization in related fields.

[0092] It should be noted that the embodiments of the present invention can be implemented through hardware, software, or a combination of software and hardware. The hardware part can be implemented using dedicated logic; the software part can be stored in a memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated design hardware. Those of ordinary skill in the art can understand that the above devices and methods can be implemented using computer-executable instructions and / or included in processor control code, for example, such code is provided on a carrier medium such as a disk, CD, or DVD-ROM, a programmable memory such as read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The devices and modules of the present invention can be implemented by hardware circuits of programmable hardware devices such as very large scale integrated circuits or gate arrays, semiconductors such as logic chips and transistors, or programmable logic devices such as field programmable gate arrays, and can also be implemented by software executed by various types of processors, or can be implemented by a combination of the above hardware circuits and software, such as firmware.

[0093] The above is only the specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention by those skilled in the art within the technical scope disclosed by the present invention shall be covered by the protection scope of the present invention.

Claims

1. A multi-factor collaborative test method for evaluating radiation effects of electronic components, characterized in that: The method specifically includes: S1: Based on orthogonal test theory, set irradiation test factors and dose levels; S2: Carry out irradiation test and record the changes of all parameter damage data of electronic components; S3: Based on the irradiation test data, linear models, quadratic models or higher-order models are fitted to the damage and degradation data of multiple parameters of electronic components and the test condition data, and the optimal model is determined through model significance detection, lack-of-fit item detection and correlation test; S4: Further analyze the data and establish a regression equation between the damage of the electrical parameters of electronic components and the factors of various irradiation test conditions; S5: Draw a three-dimensional response surface diagram or calculate the maximum value point through the regression equation to obtain the influence of each factor on the response variable, and determine the optimal level combination of each factor based on the response surface diagram; S6: Based on the optimal level combination obtained in step S5, a multi-factor coordinated irradiation test is carried out to verify the theoretical prediction results.

2. The multi-factor collaborative test method for evaluating radiation effects of electronic components as claimed in claim 1, characterized in that: The S1 is usually referred to in scientific research as Box-Behnken Design (BBD) or Central Composite Design (CCD) and other design methods.

3. The multi-factor collaborative test method for evaluating radiation effects of electronic components as claimed in claim 1, characterized in that: The S2 uses each factor X1, X2, X3, ..., Xn to perform irradiation tests on the tested electronic components, determine the damage degradation law of the factor on the selected electronic components, and determine the inflection point total dose and dose rate when the irradiation effect of the factor deteriorates sharply.

4. The multi-factor collaborative test method for evaluating radiation effects of electronic components as claimed in claim 1, characterized in that: The above S6 takes into account the damage effect caused by the irradiation sequence and conducts control tests as appropriate.

5. A multi-factor collaborative test design system for evaluating radiation effects of electronic components based on claims 1-4, characterized in that: The system specifically includes: Experimental design module, which is used to set the multiple factors and dose levels of irradiation test based on orthogonal experimental theory, and can choose Box-Behnken Design (BBD) or Central Composite Design (CCD) as the design method; Irradiation implementation module, used to implement irradiation test and record the changes of all parameter damage data of electronic components; The data fitting module is used to perform model fitting on the damage and degradation data of electronic components and the test condition data according to the irradiation test data, including linear model, quadratic model or higher-order model fitting, and perform significance detection, lack-of-fit item detection and correlation test on the model to determine the optimal model; Regression analysis module, used to establish the regression equation between the damage of the electrical parameters of electronic components and the factors of various irradiation test conditions based on the optimal model; The response optimization module is used to draw a three-dimensional response surface diagram or calculate the maximum point through the regression equation, obtain the influence of each factor on the response variable, and determine the optimal level combination of each factor.

6. The multi-factor collaborative test system for evaluating radiation effects of electronic components as claimed in claim 5, characterized in that: The test design module is further used to test each test factor separately at different dose levels to determine the influence of each factor on the damage and degradation of electronic components, and obtain the inflection point total dose and dose rate.

7. The multi-factor collaborative test system for evaluating radiation effects of electronic components as claimed in claim 5, characterized in that: The data fitting module generates a multi-factor regression equation through regression analysis, and determines the best factor combination according to the surface diagram or response surface diagram obtained by the regression analysis, thereby optimizing the radiation tolerance design of electronic components.

8. The multi-factor collaborative test system for evaluating radiation effects of electronic components as claimed in claim 5, characterized in that: The response optimization module also includes a calculation module for calculating the maximum point of the factor response, which uses the optimization result of the regression equation to further verify the accuracy and reliability of the optimal test condition combination.

9. The multi-factor collaborative test system for evaluating radiation effects of electronic components as claimed in claim 5, characterized in that: The system includes a control test module, which is used to carry out control tests as appropriate to ensure the validity of test data and the accuracy of evaluation results when the irradiation sequence affects the damage effect of electronic components.

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