Tool for measuring liquid level of substrate glass and use method of tool

Abstract

The invention discloses a tool for measuring the liquid level of substrate glass and a using method of the tool, and belongs to the technical field of substrate glass manufacturing. According to the tool for measuring the liquid level of the substrate glass, the problem that the moving stability of the probe is insufficient when the liquid level of the substrate glass is measured is solved. The tool for measuring the liquid level of the substrate glass comprises the supporting device, the sleeve and the probe, the sliding way is arranged on the sleeve, the outer diameter of the sleeve is smaller than the diameter of the liquid level measuring hole of the substrate glass, the probe is tightly attached to the sliding way when moving, a path is planned for movement of the probe, shaking of the probe in the moving process can be effectively avoided, and the measuring accuracy is improved. The probe is prevented from mistakenly touching the wall of the glass liquid level measuring hole of the substrate during moving, so that the moving stability of the probe is ensured, and the measuring quality is ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of substrate glass manufacturing, and particularly relates to a tool for measuring the liquid level of substrate glass and a using method thereof. Background Art

[0002] In the production of substrate glass with a large drawing volume, the stability of the glass liquid level is a key factor in ensuring product quality and production efficiency. From the moment the glass liquid melted in the tank furnace enters the platinum channel, every link needs to be strictly controlled to ensure the uniform flow and stable transmission of the glass liquid. Fluctuations in the liquid level may lead to uneven glass liquid flow rates, which in turn affect the glass thickness, surface quality, and overall product performance in subsequent process steps. Therefore, the measurement of the glass liquid level height, i.e., the liquid level, is particularly important. Since the liquid level of the glass liquid flowing through the pipeline cannot be directly observed, a hand-held liquid level gauge is usually used. By inserting the liquid level gauge at the substrate glass liquid level measurement hole of the platinum channel, it directly contacts the glass liquid surface at high temperature, and then the actual liquid level is calculated based on the size of the part of the liquid level gauge inserted into the glass liquid surface.

[0003] However, in practical applications, the use of this hand-held liquid level gauge faces various challenges. Due to the limitations of manual operation, the hand-held stability is poor in a high-temperature environment. When the probe of the liquid level gauge moves, it is prone to shaking or deviation, so that it accidentally touches the wall of the substrate glass liquid level measurement hole and drops residues into the tank furnace, which will directly affect the purity and quality of the substrate glass product. Especially in occasions with extremely high requirements for the surface quality of the substrate glass product, such as high-end display panels, optical glass and other fields, any tiny impurities may cause the product to be scrapped, bringing huge economic losses to the enterprise.

[0004] Therefore, how to improve the stability during the movement of the probe has become an urgent problem to be solved in the glass manufacturing industry. Summary of the Invention

[0005] The purpose of the present invention is to provide a tool for measuring the liquid level of substrate glass and a using method thereof to overcome the problem of insufficient stability during the movement of the probe when measuring the liquid level of substrate glass.

[0006] The present invention solves the above technical problems through the following technical solutions: A tool for measuring the liquid level of substrate glass includes a support device, a sleeve, and a probe. The support device is a frame structure with a through hole. The sleeve is fixed in the through hole, and a slideway is provided on one side of the sleeve. When the probe moves, it closely adheres to the slideway; When the probe measures the liquid level of the substrate glass, the support device is fixed on the insulating brick provided with the substrate glass liquid level measurement hole; The outer diameter of the sleeve is smaller than the diameter of the substrate glass liquid level measurement hole.

[0007] A further improvement of the present invention lies in that: the center of the sleeve is vertically arranged with the center of the liquid level measurement hole of the substrate glass.

[0008] A further improvement of the present invention lies in that: the probe is of a T-shaped structure, and the length of the horizontal part of the probe is greater than the diameter of the through hole; when the probe moves, the vertical part of the probe closely adheres to the slideway.

[0009] A further improvement of the present invention lies in that: the end of the sleeve is higher than the bottom of the through hole.

[0010] A further improvement of the present invention lies in that: a clamping block is arranged on the first side of the probe, the sleeve is a structure with an unclosed circumference, the unclosed side of the circumference of the sleeve is the slideway, and a clamping groove is arranged on the closed side of the circumference of the sleeve; When the probe needs to be fixed, the second side of the probe is far away from the slideway, and the clamping block and the clamping groove are in a connected state; when the probe needs to move, the second side of the probe closely adheres to the slideway, and the clamping block and the clamping groove are in a separated state.

[0011] A further improvement of the present invention lies in that: the width of the clamping block is 1.5 to 2 times the diameter of the probe.

[0012] A further improvement of the present invention lies in that: the minimum outer diameter of the sleeve is at least 0.2 times greater than the liquid level measurement hole of the substrate glass.

[0013] A further improvement of the present invention lies in that: the area of the upper surface of the support device is smaller than the area of the lower surface.

[0014] The present invention also provides a working method for measuring the liquid level of substrate glass, using the working device for measuring the liquid level of substrate glass as described above, including the following steps: Step 1: Fix the support device on the insulating brick provided with the liquid level measurement hole of the substrate glass; Step 2: Move the probe downward closely along the slideway until the length of the probe does not support further downward movement. After the probe is static, move the probe upward closely along the slideway. Through the frame structure of the support device, observe and judge whether the end of the probe is adhered with the substrate glass liquid. If the judgment is yes, move the probe upward closely along the slideway and take out the probe, measure and calculate the liquid level of the substrate glass; if the judgment is no, execute Step 3; Step 3: Move the probe upward closely along the slideway and take out the probe, replace the probe with a probe having a length longer than the current probe, and execute Step 2.

[0015] A further improvement of the present invention lies in that: measuring and calculating the liquid level of the substrate glass includes the following steps: measuring the length D1 of the probe without being adhered with the substrate glass liquid, and calculating the liquid level D of the substrate glass in combination with the height H1 of the insulating brick and the height H2 of the support device. Specifically: D = H1 + H2 - D1.

[0016] Compared with the prior art, the positive and progressive effects of the present invention are as follows: The tooling for measuring the liquid level of substrate glass provided by the present invention solves the problem of insufficient stability of the probe movement during the measurement of the liquid level of substrate glass. This tooling includes a support device, a sleeve, and a probe. By setting a slideway on the sleeve and making the outer diameter of the sleeve smaller than the diameter of the liquid level measurement hole of the substrate glass, the probe closely adheres to the slideway when moving, planning a path for the probe movement, which can effectively avoid the shaking of the probe during movement and prevent the probe from accidentally touching the wall of the liquid level measurement hole of the substrate glass, thereby ensuring the stability of the probe movement and guaranteeing the measurement quality.

[0017] Furthermore, the center of the sleeve is vertically arranged with the center of the liquid level measurement hole of the substrate glass, ensuring that the probe does not touch the periphery of the hole wall of the liquid level measurement hole and avoiding the risk of scraping.

[0018] Furthermore, the probe is designed as a T-shaped structure, and its vertical part is inserted into the support device for measurement work. By setting the horizontal part of the probe to be larger than the diameter of the through hole and combining with the supporting force provided by the support device, on the one hand, it can effectively avoid the shaking of the probe during the measurement operation and ensure the stability during the measurement process; on the other hand, it can avoid the scalding that may be caused by the measurement personnel's long-term contact with the high-temperature environment and improve safety.

[0019] Furthermore, by setting the end of the sleeve to be higher than the bottom of the through hole, a buffer area is provided for the probe adhered with glass liquid. The probe can confirm the effectiveness of the measurement in the buffer area and allow the glass liquid to dry naturally. When the glass liquid solidifies in the buffer area, its tendency to adhere to the inner wall of the sleeve is further reduced, thereby ensuring the quality of substrate glass manufacturing.

[0020] Furthermore, before the test, through the cooperation of the probe chuck and the card slot on the sleeve, it can be avoided that the probe accidentally touches the wall of the liquid level measurement hole of the substrate glass, ensuring the safety of the probe; at the same time, the design of the probe chuck and the sleeve card slot is also conducive to lifting the entire tooling after the measurement is completed, preventing the glass liquid residue from falling into the tank furnace and ensuring the high quality of substrate glass manufacturing; and by drying the glass liquid adhered to the probe through the cooperation of the probe chuck and the card slot on the sleeve, it can not only avoid the measurement personnel from holding it for a long time and improve the safety of the test personnel; but also prevent the glass liquid from adhering to the support device, thereby keeping the tooling clean and providing convenience for subsequent measurement work.

[0021] Furthermore, the area of the upper surface of the support device is smaller than the area of the lower surface, making the center of gravity of the tooling more biased towards the bottom, thereby enhancing the overall stability. Description of the Drawings

[0022] The schematic drawings in the specification are used to provide a further understanding of the present invention and constitute a part of the present invention. The schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation to the present invention.

[0023] Figure 1 The front view of the tooling for measuring the liquid level of substrate glass in the present invention; Figure 2 The top view of the tooling for measuring the liquid level of substrate glass in the present invention; Figure 3 The detailed schematic diagram of the sleeve in the present invention; Figure 4 The top view of the sleeve in the present invention; Figure 5 The detailed schematic diagram of the probe in the present invention; Figure 6 The schematic diagram of the usage state of the tooling for measuring the liquid level of substrate glass in the present invention.

[0024] Among them, 1 is the support device; 1-1 is the through hole; 2 is the sleeve; 2-1 is the unclosed side of the circumference; 2-2 is the closed side of the circumference; 2-3 is the slideway; 3 is the probe; 3-1 is the horizontal part; 3-2 is the vertical part; 3-21 is the first side; 3-22 is the second side; 4 is the clamping block; 5 is the clamping groove; 6 is the insulating brick; 6-1 is the measuring hole for the liquid level of substrate glass. Detailed implementation manners

[0025] To make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some but not all of the embodiments of the present invention. Generally, the components of the embodiments of the present invention described and shown in the accompanying drawings here can be arranged and designed in various different configurations.

[0026] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed present invention, but merely represents selected embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts fall within the scope of protection of the present invention.

[0027] It should be noted that: similar reference numerals and letters denote similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.

[0028] In the description of the embodiments of the present invention, it should be noted that if terms such as "upper", "lower", "horizontal", "inner", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the invention product is usually placed during use, it is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention. In addition, terms such as "first", "second", etc. are only used for distinguishing descriptions and cannot be understood as indicating or implying relative importance.

[0029] In addition, it should also be noted that unless otherwise clearly specified and limited, if terms such as "set", "installed", "connected", "connected" are understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0030] The following further describes the present invention in detail with reference to the drawings and specific embodiments, which is an explanation rather than a limitation of the present invention.

[0031] See Figure 1 and Figure 2 , a tool for measuring the liquid level of substrate glass, including a support device 1, a sleeve 2 and a probe 3. The support device 1 is a frame structure with a through hole 1-1. The sleeve 2 is fixed in the through hole 1-1. A slideway 2-3 is provided on one side of the sleeve 2. When the probe 3 moves, it closely adheres to the slideway 2-3; When the probe 3 measures the liquid level of the substrate glass, the support device 1 is fixed on the insulating brick 6 provided with the substrate glass liquid level measuring hole 6-1; The outer diameter of the sleeve 2 is smaller than the diameter of the substrate glass liquid level measuring hole 6-1.

[0032] The tool for measuring the liquid level of substrate glass provided by the present invention solves the problem of insufficient stability of the probe movement during the measurement of the liquid level of substrate glass. This tool includes a support device, a sleeve and a probe. By providing a slideway on the sleeve and the outer diameter of the sleeve being smaller than the diameter of the substrate glass liquid level measuring hole, the probe closely adheres to the slideway when moving, planning a path for the probe movement, which can effectively avoid the shaking of the probe during movement and prevent the probe from accidentally touching the wall of the substrate glass liquid level measuring hole during movement, thereby ensuring the stability of the probe movement and guaranteeing the measurement quality.

[0033] Specifically, the center of the sleeve 2 is vertically arranged with the center of the substrate glass liquid level measuring hole 6-1.

[0034] The center of the sleeve is vertically arranged with the center of the liquid level measurement hole of the substrate glass, ensuring that the probe does not contact the hole wall around the liquid level measurement hole and avoiding the risk of scraping.

[0035] See Figure 5 , specifically, the probe 3 is of a T-shaped structure, and the length of the horizontal part 3-1 of the probe is greater than the diameter of the through hole 1-1; when the probe 3 moves, the vertical part 3-2 of the probe closely adheres to the slideway 2-3.

[0036] The probe is designed as a T-shaped structure, with its vertical part inserted into the support device for measurement work. By setting the horizontal part of the probe to be greater than the diameter of the through hole and combining with the support force provided by the support device, on the one hand, it can effectively avoid the shaking of the probe during the measurement operation and ensure the stability during the measurement process; on the other hand, it can avoid the scalding that may be caused by the measurement personnel's long-term contact with the high-temperature environment and improve safety.

[0037] Specifically, the end of the sleeve 2 is higher than the bottom of the through hole 1-1.

[0038] By setting the end of the sleeve to be higher than the bottom of the through hole, a buffer area is provided for the probe adhered with glass liquid. The probe can confirm the effectiveness of the measurement in the buffer area and allow the glass liquid to dry naturally. When the glass liquid solidifies in the buffer area, its tendency to adhere to the inner wall of the sleeve is further reduced, thus ensuring the quality of the substrate glass manufacturing.

[0039] See Figure 3 and Figure 4 , specifically, a clamping block 4 is arranged on the first side 3-21 of the probe. The sleeve 2 is a structure with an unclosed circumference. The unclosed side 2-1 of the sleeve circumference is the slideway 2-3, and a clamping groove 5 is arranged on the closed side 2-2 of the sleeve circumference; When the probe needs to be fixed, the second side 3-22 of the probe is far from the slideway 2-3, and the clamping block 4 and the clamping groove 5 are in a connected state; when the probe needs to move, the second side 3-22 of the probe closely adheres to the slideway 2-3, and the clamping block 4 and the clamping groove 5 are in a separated state.

[0040] Before testing, through the cooperation of the probe clamping block and the clamping groove on the sleeve, it can avoid the probe from accidentally touching the hole wall of the substrate glass liquid level measurement hole and ensure the safety of the probe; at the same time, the design of the probe clamping block and the sleeve clamping groove is also beneficial to lifting the entire tooling after the measurement is completed, preventing the glass liquid residue from falling into the furnace and ensuring the high quality of the substrate glass manufacturing; and by drying the glass liquid adhered to the probe through the cooperation of the probe clamping block and the clamping groove on the sleeve, it can not only avoid the measurement personnel from holding it for a long time and improve the safety of the test personnel; but also prevent the glass liquid from adhering to the support device, thus keeping the tooling clean and providing convenience for subsequent measurement work.

[0041] Specifically, the width of the clamping block 4 is 1.5 to 2 times the diameter of the probe 3.

[0042] Specifically, the minimum outer diameter of the sleeve 2 is at least 0.2 times greater than that of the liquid level measurement hole 6-1 of the substrate glass.

[0043] Specifically, the area of the upper surface of the support device 1 is smaller than that of the lower surface.

[0044] The area of the upper surface of the support device is smaller than that of the lower surface, making the center of gravity of the tooling more biased towards the bottom, thereby enhancing the overall stability.

[0045] Based on the same inventive concept, the present invention also provides a method for using a tooling for measuring the liquid level of substrate glass. Using the tooling for measuring the liquid level of substrate glass as described above, it includes the following steps: See Figure 6 , Step 1: Fix the support device 1 on the insulating brick 6 provided with the liquid level measurement hole 6-1 of the substrate glass; Step 2: Move the probe 3 downward closely along the slideway 2-3 until the length of the probe 3 does not support further downward movement. After the probe 3 is stationary, move the probe 3 upward closely along the slideway 2-3. Through the frame structure of the support device 1, observe and judge whether the end of the probe 3 is adhered with the substrate glass liquid. If the judgment is yes, move the probe 3 upward closely along the slideway 2-3 and take out the probe 3, measure and calculate the liquid level of the substrate glass; if the judgment is no, execute Step 3; Step 3: Move the probe 3 upward closely along the slideway 2-3 and take out the probe 3, replace the probe 3 with a probe 3 having a length longer than the current probe 3, and execute Step 2.

[0046] Specifically, measuring and calculating the liquid level of the substrate glass includes the following steps: Measure the length D1 of the probe 3 that is not adhered with the substrate glass liquid, and calculate the liquid level D of the substrate glass in combination with the height H1 of the insulating brick 6 and the height H2 of the support device 1. Specifically: D = H1 + H2 - D1.

[0047] Embodiment 1 A tooling for measuring the liquid level of substrate glass includes a support device 1, a sleeve 2 and a probe 3. The support device 1 is a frame structure with a through hole 1-1. The sleeve 2 is fixed in the through hole 1-1. One side of the sleeve 2 is provided with a slideway 2-3. When the probe 3 moves, it closely adheres to the slideway 2-3; When the probe 3 measures the liquid level of the substrate glass, the support device 1 is fixed on the insulating brick 6 provided with the liquid level measurement hole 6-1 of the substrate glass; The outer diameter of the sleeve 2 is smaller than the diameter of the liquid level measurement hole 6-1 of the substrate glass; the center of the sleeve 2 is vertically arranged with the center of the liquid level measurement hole 6-1 of the substrate glass.

[0048] Embodiment 2 A method for using a tool for measuring the liquid level of substrate glass, which uses the tool for measuring the liquid level of substrate glass as described in Embodiment 1, includes the following steps: Step 1: Fix the support device 1 on the insulating brick 6 provided with the substrate glass liquid level measuring hole 6-1; Step 2: Move the probe 3 downward closely along the slideway 2-3 until the length of the probe 3 does not support further downward movement. After the probe 3 is stationary, move the probe 3 upward closely along the slideway 2-3. Through the frame structure of the support device 1, observe and judge whether the end of the probe 3 is adhered with substrate glass liquid. If the judgment is yes, move the probe 3 upward closely along the slideway 2-3 to take out the probe 3, measure and calculate the substrate glass liquid level; if the judgment is no, execute Step 3; Step 3: Move the probe 3 upward closely along the slideway 2-3 to take out the probe 3, replace the probe 3 with a probe 3 having a length longer than the current probe 3, and execute Step 2.

[0049] Among them, measuring and calculating the substrate glass liquid level includes the following steps: Measure the length D1 of the probe 3 that is not adhered with substrate glass liquid, and calculate the substrate glass liquid level D in combination with the height H1 of the insulating brick 6 and the height H2 of the support device 1. Specifically: D = H1 + H2 - D1.

[0050] Embodiment 3 A tool for measuring the liquid level of substrate glass includes a support device 1, a sleeve 2 and a probe 3 for measuring the liquid level of substrate glass. The support device 1 is a frame structure with a through hole 1-1; the sleeve 2 is fixed in the through hole 1-1, and the end of the sleeve 2 is higher than the bottom of the through hole 1-1; the probe 3 is a T-shaped structure, the horizontal part 3-1 of the probe is larger than the diameter of the through hole 1-1 for fixing the probe 3, and a clamping block 4 is arranged on the first side 3-21 of the vertical part 3-2 of the probe; the sleeve 2 is a circumferentially unclosed structure, the circumferentially unclosed side 2-1 of the sleeve is a slideway 2-3, and a clamping groove 5 is arranged on the circumferentially closed side 2-2 of the sleeve; When the tool is in use, the support device 1 is fixed on the insulating brick 6 provided with the substrate glass liquid level measuring hole 6-1; when not measuring, the second side 3-22 of the vertical part is away from the slideway 2-3, and the clamping block 4 and the clamping groove 5 are in a connected state; when measuring, the second side 3-22 of the vertical part is closely attached to the slideway 2-3, and the clamping block 4 and the clamping groove 5 are in a separated state.

[0051] Embodiment 4 A method for using a tool for measuring the liquid level of substrate glass, which uses the tool for measuring the liquid level of substrate glass as described in Embodiment 3, includes the following steps: Step 1: Assemble the clamping block 4 on the probe 3 with the clamping groove 5 of the sleeve, and fix the support device 1 of the assembled tool on the insulating brick 6 provided with the substrate glass liquid level measuring hole 6-1; Step 2: Separate the clamping block 4 from the clamping groove 5, move the probe 3 downward closely along the slideway 2-3 until the horizontal part 3-1 of the probe is placed on the upper surface of the supporting device 1; after the probe 3 is stationary, move the probe 3 upward closely along the slideway 2-3 until the clamping block 4 is flush with the clamping groove 5; Step 3: Observe and judge whether the end of the probe 3 is adhered with the substrate glass liquid. If the judgment is yes, place the clamping block 4 on the clamping groove 5, fix the probe 3, air-dry the substrate glass liquid at the end of the probe 3. After drying, take out the probe 3, measure and calculate the level of the substrate glass liquid; if the judgment is no, execute Step 4; Step 4: Take out the probe 3, replace the probe 3 with a probe 3 having a length longer than the current probe 3, and execute Step 2.

[0052] In a specific embodiment of the present invention, the supporting device 1 and the sleeve 2 are made of stainless steel material.

[0053] In a specific embodiment of the present invention, the supporting device 1 and the sleeve 2 are of an integrally formed structure.

[0054] In a specific embodiment of the present invention, the probe 3 is made of platinum material.

[0055] In a specific embodiment of the present invention, the supporting device 1 is a frustum-shaped frame structure. A frame structure of a concentric ring is respectively arranged at the upper part and the middle part of the frustum-shaped frame structure. The diameter of the outer ring of the upper concentric ring is smaller than the diameter of the outer ring of the middle concentric ring, and the diameter of the inner ring of the upper concentric ring is equal to the diameter of the inner ring of the middle concentric ring; wherein, the inner ring is fixedly arranged with the outer ring through a fixing frame.

[0056] Finally, it should be noted that: The above-listed embodiments exist only as one or more specific manifestation forms of the technical solution of the present invention. Their purpose is to clearly elaborate the concept, principle and application mode of the present invention through specific examples, rather than intending to limit the protection scope of the present invention to these specific embodiments. In fact, the real value of the present invention lies in the proposed technical idea and innovation point, rather than its manifestation form or implementation means.

[0057] For those of ordinary skill in the art, after thoroughly reading and understanding the technical solution of the present invention, they are fully capable of making various forms of changes, modifications or equivalent replacements to the specific implementation manners of the invention based on their own professional knowledge and skills. These changes may include, but are not limited to: adjusting the value range of technical parameters, optimizing the algorithm process to improve efficiency, replacing some technical components to achieve better compatibility or reduce costs, etc. As long as the changed technical solution still substantially maintains the technical features required to be protected by the original invention, that is, it can still achieve the core functions and effects of the present invention, then these changes should be regarded as falling within the protection scope of the claims pending for the present invention.

[0058] In addition, with the continuous progress and development of technology, new technical means and methods are emerging continuously, which also provides broad space for the further improvement and perfection of the present invention. Therefore, the protection scope of the present invention should also include those reasonably foreseeable improvements and expansions based on the prior art. As long as these improvements and expansions do not depart from the basic principles and core concepts of the present invention, they should be regarded as equivalents of the present invention and are equally protected by the patent right.

Claims

1. A tool for measuring the liquid level of substrate glass, characterized in that: The invention comprises a supporting device (1), a sleeve (2) and a probe (3); the supporting device (1) is a frame structure with a through hole (1-1); the sleeve (2) is fixed in the through hole (1-1); a slideway (2-3) is arranged on one side of the sleeve (2); and when the probe (3) moves, it is closely attached to the slideway (2-3); When the probe (3) measures the substrate glass liquid level, the support device (1) is fixed on an insulation brick (6) provided with a substrate glass liquid level measurement hole (6-1); The outer diameter of the sleeve (2) is smaller than the diameter of the substrate glass liquid level measuring hole (6-1).

2. The tooling for measuring the liquid level of substrate glass according to claim 1, characterized in that: The center of the sleeve (2) is arranged perpendicularly to the center of the substrate glass liquid level measuring hole (6-1).

3. The tooling for measuring the liquid level of substrate glass according to claim 1, characterized in that: The probe (3) is a T-shaped structure, and the length of the horizontal portion (3-1) of the probe is greater than the diameter of the through hole (1-1); when the probe (3) moves, the vertical portion (3-2) of the probe is in close contact with the slideway (2-3).

4. The tooling for measuring the liquid level of substrate glass according to claim 1, characterized in that: The end of the sleeve (2) is higher than the bottom of the through hole (1-1).

5. The tooling for measuring the liquid level of substrate glass according to claim 1, characterized in that: A clamping block (4) is provided on the first side (3-21) of the probe, the sleeve (2) is a circumferentially unclosed structure, the circumferentially unclosed side (2-1) of the sleeve is a slideway (2-3), and the circumferentially closed side (2-2) of the sleeve is provided with a clamping groove (5); When the probe needs to be fixed, the second side (3-22) of the probe is away from the slideway (2-3), and the clamping block (4) and the clamping slot (5) are in a connected state; when the probe needs to be moved, the second side (3-22) of the probe is closely attached to the slideway (2-3), and the clamping block (4) and the clamping slot (5) are in a separated state.

6. The tooling for measuring the liquid level of substrate glass according to claim 5, characterized in that: The width of the block (4) is 1.5 to 2 times the diameter of the probe (3).

7. The tooling for measuring the liquid level of substrate glass according to claim 1, characterized in that: The minimum outer diameter of the sleeve (2) is at least 0.2 times greater than the substrate glass liquid level measurement hole (6-1).

8. The tooling for measuring the liquid level of substrate glass according to claim 1, characterized in that: The area of ​​the upper surface of the supporting device (1) is smaller than the area of ​​the lower surface.

9. A method for using a tool for measuring the liquid level of substrate glass, characterized in that: The tooling for measuring the glass liquid level of a substrate as claimed in any one of claims 1 to 8 comprises the following steps: Step 1: fix the support device (1) on the insulation brick (6) provided with the substrate glass liquid level measurement hole (6-1); Step 2, move the probe (3) downwards close to the slideway (2-3) until the length of the probe (3) does not support further downward movement, and after the probe (3) is stationary, move the probe (3) upwards close to the slideway (2-3), and observe and determine whether the substrate glass liquid is adhered to the end of the probe (3) through the frame structure of the support device (1). If it is determined to be yes, move the probe (3) upwards close to the slideway (2-3) to remove it, and measure and calculate the substrate glass liquid level; if it is determined to be no, execute step 3; Step 3: Move upwards along the slideway (2-3) to remove the probe (3), replace the probe (3) with a probe (3) longer than the current probe (3), and execute step 2.

10. A method for using a tool for measuring the liquid level of substrate glass according to claim 9, characterized in that: Measuring and calculating the substrate glass liquid level comprises the following steps: measuring the length D1 of the probe (3) where the substrate glass liquid is not adhered, and calculating the substrate glass liquid level D in combination with the height H1 of the insulation brick (6) and the height H2 of the support device (1), specifically: D=H1+H2-D1.

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