Method for monitoring signal state of port of equipment to be tested, test accompanying device and control device

Abstract

The invention provides a method for monitoring a signal state of a port of a tested device, the tested device and a test accompanying device, and the method comprises the steps that the test accompanying device sends test data to the tested device in each preset period; after receiving the test data, the tested equipment returns the test data to the test accompanying device; the EMC equipment sends an interference signal to a connecting line between the tested equipment and the test accompanying device; the test accompanying device receives the test data and compares the sent test data with the received test data; when the sent test data is inconsistent with the received test data, the test accompanying device sends abnormal information to the control device; and the control device receives and displays the abnormal information. According to the method provided by the embodiment of the invention, in the EMC test process, the change of the signal state on the port of the tested equipment can be monitored in real time, and the circuit with weak anti-interference capability can be accurately positioned.

Description

Technical Field

[0001] The present invention relates to the technical field of EMC testing, and particularly to a method, a companion testing device and a control device for monitoring the signal status of ports of a device under test. Background Art

[0002] With the continuous development of industrial control systems, various power electronic devices are widely used, and the electromagnetic interference (EMI) of the system is becoming increasingly serious. The corresponding anti-interference design technology of frequency converters also needs to be improved accordingly. Common control signals vulnerable to interference play a crucial role in on-site application control. For example, weak electrical signals connected by long cables such as DI, DO, AI, AO, and communication buses. Therefore, it is necessary to strengthen the testing of the electromagnetic susceptibility (EMS) of frequency converters in the design stage to expose the design risks of electromagnetic compatibility (EMC) in advance.

[0003] In the selection of previous EMC companion testing equipment, lamp boards, relay boards, etc. are usually temporarily selected to build circuits for visually and auditorily accompanying the testing of signal ports. Such non-standard wiring and connection methods and the wiring loops of long cables will seriously affect the accuracy of test results. Summary of the Invention

[0004] The present invention provides a method, a companion testing device and a control device for monitoring the signal status of ports of a device under test. During the EMC test process, it can monitor the change of the signal status on the ports of the device under test in real time and accurately locate the circuits with weak anti-interference ability.

[0005] According to the first aspect of the embodiments of the present invention, a method for monitoring the signal status of ports of a device under test is provided. The method is applied to a system for monitoring the signal status of ports of a device under test. The system includes a device under test, a companion testing device, a control device and an EMC device. Some ports of the companion testing device are connected to the ports of the device under test through connection lines, and some ports are connected to the control device. The method includes:

[0006] The companion testing device sends test data to the device under test in each preset period;

[0007] After receiving the test data, the device under test returns the test data to the companion testing device;

[0008] The EMC device sends interference signals to the connection lines between the device under test and the companion testing device;

[0009] The co - testing device receives test data and compares the sent test data with the received test data; it is also used to send an exception message to the control device when the sent test data is inconsistent with the received test data;

[0010] The control device receives and displays the exception message.

[0011] In a possible implementation, the method further includes:

[0012] The control device receives a connection instruction input by the user and establishes a communication connection with the co - testing device;

[0013] The control device receives a configuration instruction from the user and configures the communication configuration between the co - testing device and the device under test;

[0014] The control device receives a start - test instruction input by the user, and the control device controls the co - testing device to start testing;

[0015] After initializing the storage module, the co - testing device starts to send test data to the device under test in each preset period;

[0016] After receiving the test data, the device under test returns the test data to the co - testing device;

[0017] The co - testing device stores the received test data into the storage module;

[0018] The control device reads the data in the storage module and displays a waveform diagram based on the read data;

[0019] The EMC device receives the user's operation instruction and starts to send interference signals to the connection line between the device under test and the co - testing device.

[0020] In a possible implementation, the storage module is a DB, including at least two arrays. The co - testing device stores the received test data into the storage module, including:

[0021] Storing the received test data into the first array, where the first array is any one of the arrays in the DB;

[0022] When the first array is full, setting the storage flag of the first array to 1;

[0023] Clearing the storage flag of the second array, where the second array is any one of the arrays in the DB other than the first array;

[0024] Storing the received test data into the second array.

[0025] In a possible implementation, the method further includes:

[0026] The control device:

[0027] Reads the storage flags of each array;

[0028] Read the data in the array with the storage flag being 1;

[0029] Store the read data;

[0030] Based on the read data, display the waveform.

[0031] According to the second aspect of the embodiments of the present invention, a co-testing device is provided. Some ports of the co-testing device are connected to the ports of the device under test through connection lines, and some ports are connected to the control device. The co-testing device at least includes:

[0032] A Programmable Logic Controller (PLC) module, configured to send test data to the ports of the device under test through ports in each preset cycle; also configured to receive test data; also configured to compare the sent test data with the received test data; and also configured to, when the sent test data is inconsistent with the received test data, the co-testing device sends an exception message to the control device.

[0033] In a possible implementation manner, the PLC module includes a control port and a communication port, and the device under test includes a control port and a communication port; the control port of the PLC module is connected to the control port of the device under test through a connection line, and the communication port of the PLC module is connected to the communication port of the device under test through a communication line. The test data includes status test data and communication test data. The PLC module is specifically configured to:

[0034] In each preset cycle, send status test data to the device under test through the control port, and send communication test data to the device under test through the communication port;

[0035] Receive the status test data returned by the control port of the device under test through the control port, and receive the communication test data returned by the communication port of the device under test through the communication port.

[0036] In a possible implementation manner, both the control port of the PLC module and the control port of the device under test include Digital Input (DI), Digital Output (DO), Analog Input (AI), and Analog Output (AO) ports, and the communication unit of the PLC module and the communication port of the device under test support at least one communication protocol among Modbus RTU, CANOpen, Profibus DP, ProfiNET, Modbus TCP, EtherNET IP, and EtherCAT.

[0037] In a possible implementation manner, the co-testing device further includes:

[0038] A storage module for storing the received test data.

[0039] In a possible implementation, the storage module is a data block (DB), including at least two arrays; specifically, the storage module is configured to:

[0040] Store the received test data into the first array, where the first array is any one of the arrays in the DB;

[0041] When the first array is full, set the storage flag of the first array to 1;

[0042] Clear the storage flag of the second array, where the second array is any one of the arrays in the DB other than the first array;

[0043] Store the received test data into the second array.

[0044] According to the third aspect of the embodiments of the present invention, a control device is provided. The control device is connected to the co-testing device, and the control device at least includes:

[0045] A receiving module for receiving a connection instruction input by a user;

[0046] A response module for responding to the connection instruction and establishing a communication connection with the co-testing device;

[0047] The receiving module is further configured to receive a configuration instruction input by the user;

[0048] The response module is further configured to respond to the configuration instruction and configure the communication configuration between the co-testing device and the device under test;

[0049] The receiving module is further configured to receive a start test instruction input by the user;

[0050] The response module is further configured to respond to the start test instruction and control the co-testing device to start testing;

[0051] The receiving module is further configured to receive exception information;

[0052] A display module for displaying the exception information.

[0053] In a possible implementation, the control device further includes:

[0054] A reading module for periodically reading the storage flags of each array in the storage module; and further for reading the data in the array with the storage flag being 1;

[0055] A storage module for storing the read data;

[0056] The display module is further configured to display a waveform based on the read data.

[0057] A system, a co-test device and a control device for monitoring the signal status of a port of a device under test can, during the EMC test process, monitor in real time the change of the signal status on the port of the device under test and accurately locate the circuit with weak anti-interference ability.

[0058] An embodiment of the present invention provides a method, a co-test device and a control device for monitoring the signal status of a port of a device under test. During the EMC test process, it can monitor in real time the change of the signal on the port of the device under test. When the co-test device finds that the test data sent to the device under test is inconsistent with the received test data, it indicates that the anti-interference ability of the corresponding port of the device under test is weak. The abnormal information that occurs is handed over to the control device for display, and the user can accurately locate the circuit with weak anti-interference ability by viewing the control device. Description of the Drawings

[0059] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained according to the provided drawings.

[0060] Figure 1 It is a schematic structural diagram of a system for monitoring the signal status of a port of a device under test provided by an embodiment of the present invention;

[0061] Figure 2 It is a schematic wiring diagram of a device under test and a co-test device provided by an embodiment of the present invention;

[0062] Figure 3 It is a schematic diagram of a data buffer area of a storage module provided by an embodiment of the present invention. Detailed Embodiments

[0063] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0064] A co-test device is a tool used in the product R & D process and is usually used to test the functions and performance of products. The main function of this device is to test the product during the product development stage to find problems, fix errors, and ensure that the quality and reliability of the product meet the standards. The advantage of the co-test device is that it can simulate a large amount of data and complex scenarios, enabling testers to better discover problems and errors.

[0065] Embodiment 1

[0066] An embodiment of the present invention provides a system for monitoring the signal status of ports of a device under test. The structure of the system is as Figure 1 shown, including a device under test, a companion device, a control device, and an EMC device. Some ports of the companion device are connected to the ports of the device under test through connection lines, and some other ports of the companion device are connected to the control device.

[0067] The control device can be a device such as a computer that has a display function and a user interaction function.

[0068] The companion device is communicatively connected to the control device through a network cable.

[0069] The companion device may include a PLC module. The PLC module includes DI, DO, AI, and AO ports, as well as a communication unit and a communication port.

[0070] The device under test can be a device such as an inverter or a current converter. The device under test includes a control port and a communication port. The control port includes DI, DO, AI, and AO ports.

[0071] As Figure 2 , the DI, DO, AI, and AO of the PLC module in the companion device are respectively connected to the DO, DI, AO, and AI of the device under test through connection lines. The connection lines can be twisted pairs with a shielding layer. The communication port of the PLC module is connected to the communication port of the device under test through a connection line. The connection line is a dedicated communication cable. The communication port of the PLC module and the communication port of the device under test support at least one communication protocol among ModbusRTU, CANOpen, Profibus DP, ProfiNET, ModbusTCP, EtherNET IP, and EtherCAT. The connection line uses a dedicated communication cable. The companion device also includes a power supply that powers the PLC module and can be a 24V power supply. The grounding terminals of the companion device, the device under test, the EMC test device, and the power supply are all connected to the ground terminal of the test site. At the same time, the shielding layer of the twisted pair between the companion device and the device under test and the shielding layer of the communication cable are connected to the ground terminal of the test site.

[0072] In one embodiment, the companion device does not include a power supply, and an external power supply is used to power the PLC.

[0073] The grounding methods and wire usage situations of all devices during the test process are standardized in the above system, ensuring that problems can be accurately reproduced and located subsequently.

[0074] Based on the above system, an embodiment of the present invention provides a method for monitoring the signal status of ports of a device under test. The method flow for monitoring the signal status of ports of a device under test is as follows:

[0075] S1. The control device receives a connection instruction input by the user and establishes a communication connection with the co-testing device.

[0076] The display interface of the control device at least includes a control for indicating the function of establishing a communication connection with the co-testing device, a parameter editing area for indicating the function of configuring the communication configuration between the co-testing device and the device under test, a control for controlling the co-testing device to start and stop the test, and an abnormal information display area.

[0077] The user inputs a connection instruction through the display interface of the control device by clicking the control for indicating the function of establishing a communication connection with the co-testing device. The control device responds to the connection instruction and establishes a communication connection with the co-testing device.

[0078] S2. The control device receives a configuration instruction from the user and configures the communication configuration between the co-testing device and the device under test.

[0079] The user inputs parameters related to the communication configuration in the parameter editing area through the display interface of the control device. The control device configures the communication configuration between the co-testing device and the device under test based on the parameters input by the user.

[0080] In the parameter editing area, the user can manually change the internal register of the co-testing device and flexibly configure the parameter addresses of different models of devices under test, so as to reduce the number of changes to the co-testing device program and be compatible with more test models.

[0081] S3. The control device receives a start test instruction input by the user, and the control device controls the co-testing device to start the test.

[0082] The user inputs a start test instruction through the display interface of the control device by clicking the control for controlling the co-testing device to start the test. The control device responds to the start test instruction and controls the co-testing device to start the test.

[0083] S4. After initializing the storage module, the co-testing device starts to send test data to the device under test at each preset cycle.

[0084] The co-testing device includes a storage module for storing the data returned by the device under test. The co-testing device first initializes the storage module and then starts to send test data to the device under test at each preset cycle.

[0085] Among them, the storage module can be a DB or an M memory.

[0086] S5. After receiving the test data, the device under test returns the test data to the co-testing device.

[0087] After receiving the test data, the device under test directly returns it to the co-testing device.

[0088] S6, the co - testing device stores the received test data into the storage module.

[0089] S7, the control device reads the data in the storage module and displays a waveform diagram based on the read data.

[0090] The control device can also store the read data for subsequent use by the user.

[0091] S8, the user observes the waveform diagram displayed by the control device. If the waveform diagram is normal, the control device controls the EMC equipment to apply interference.

[0092] S9, the EMC equipment receives the user's operation instruction and starts to send interference signals to the connection line between the device under test and the co - testing device.

[0093] The user presses the button to start the operation of the EMC equipment to input the operation instruction. The EMC equipment receives the user's operation instruction and starts to send interference signals to the connection line between the device under test and the co - testing device.

[0094] The EMC equipment conducts Electrical Fast Transient (EFT) immunity test and Conducted Susceptibility (CS) test on the connection line.

[0095] S10, the co - testing device receives the test data returned by the device under test and compares the sent test data with the received test data.

[0096] S11, when the sent test data is inconsistent with the received test data, the co - testing device sends an exception message to the control device.

[0097] The exception message can include the exception type. When the co - testing device fails to receive the test data returned by the device under test, the exception type is communication interruption exception; when the sent test data is not exactly the same as the received test data, the exception type is data error exception. At this time, the exception message also includes the port name of the device under test where the data error occurs.

[0098] S12, the control device receives and displays the exception message.

[0099] S13, the control device receives the end - test instruction input by the user, and the control device controls the co - testing device to end the test.

[0100] The user clicks on the control class on the display interface of the control device that can control the co - testing device to stop the test to input the stop - test instruction. The control device responds to the stop - test instruction and controls the co - testing device to stop the test.

[0101] S14. The EMC device receives the shutdown instruction from the user and stops sending interference signals to the connection line between the device under test and the accompanying test device.

[0102] The user presses the button to control the stop of the EMC device to input the shutdown instruction. The EMC device receives the shutdown instruction from the user and stops sending interference signals to the connection line between the device under test and the accompanying test device.

[0103] In an example, the control device is a computer including a host, a display, and a mouse. The controls displayed on the display interface of the display include at least "Connect PLC", "Test Start", "Test Stop", and may also include controls such as "Start Oscillograph", "Stop Oscillograph", "Save Waveform Diagram", "Import Waveform Diagram", "Stop Oscillograph", "Start Oscillograph", etc. The display interface also includes a parameter editing area, an abnormal information display area, and a waveform diagram display area. The device under test is an inverter, and the accompanying test device includes a PLC.

[0104] In the computer, the waveform display and saving functions are completed based on the winform Net framework4.8 framework combined with the scottplot control. Using the Sharp7 driver file provided by Siemens PLC, the Ethernet communication connection between the PC and the S7-314C-2PNDP is realized.

[0105] The user operates the mouse to click the "Connect PLC" control on the computer display interface, and the computer establishes a communication connection with the device under test. The user configures 6 DOs through the PLC to output to the DIs of the device under test, and 2 AOs to output a 10V voltage signal to the AI port of the device under test. The device under test configures 2 DOs to output to the DIs of the PLC, and 2 AOs to output a 15mA current to the AI of the PLC. ProfiNet communication is adopted between the device under test and the PLC. The device under test configures a maximum of 64 transceiver words for the PLC, and the control device monitors the first 4 communication words before sending and receiving and displays them as a waveform diagram. The user operates the mouse to click the "Test Start" control on the computer display interface to input the start test instruction, and the computer controls the device under test to start the test. The user also clicks the "Start Oscilloscope" control to control the computer to display a waveform diagram in the waveform display area. The PLC initializes the DB, and then starts to send an incrementing data to the inverter every 1ms, receives the data returned by the inverter, and the computer reads the data in the DB and displays a waveform diagram based on this data in the waveform display area. The user checks whether the waveform diagram is normal. If the waveform diagram is abnormal, it is debugged until the waveform diagram is normal. After confirming that the waveform diagram is normal, press the button to start the operation of the EMC device, and the EMC device starts to send interference signals to the connection line between the device under test and the device under test. The PLC judges whether the communication is interfered by comparing the consistency of the sent and received data, and makes real-time judgments on the data through the PLC program. When abnormal information is found, the abnormal information is sent to the computer, and the abnormal waveform is also displayed in the computer display area. The two test schemes of automatic judgment by the PLC program and real-time display by the computer ensure that EMC test problems can be accurately captured.

[0106] The user can also adjust the waveform details in the waveform display area, with a minimum data interval of 1ms.

[0107] The user operates the mouse to click the "Test Stop" control on the computer display interface to input the stop test instruction, and the computer controls the device under test to stop the test. The user also clicks the "Stop Oscilloscope" control, and the computer stops displaying the waveform. Press the button to stop the operation of the EMC device, and the EMC device stops sending interference signals.

[0108] When the test is stopped, all the process data can be completely displayed in the waveform diagram, and the test data is saved as a TXT text. When analyzing problems later, the data can also be imported into the computer for viewing.

[0109] The method for monitoring the signal status of the ports of a device under test provided by the embodiments of the present invention can, during the EMC test process, monitor in real time the changes in the signals on the ports of the device under test. When the accompanying device finds that the test data sent to the device under test is inconsistent with the received test data, it indicates that the anti-interference ability of the corresponding port of the device under test is weak. The abnormal information that occurs is handed over to the control device for display, and the user can accurately locate the circuit with weak anti-interference ability by checking the control device.

[0110] Embodiment 2

[0111] The storage module is a DB and includes at least two arrays. S6: The accompanying device stores the received test data into the storage module, which may include the following steps:

[0112] S61, store the received test data into the first array.

[0113] The first array is any array in the DB;

[0114] S62, when the first array is full, set the storage flag of the first array to 1.

[0115] S63, clear the storage flag of the second array.

[0116] The second array is any array in the DB other than the first array;

[0117] S64, store the received test data into the second array.

[0118] S7: The control device reads the data in the storage module and displays a waveform diagram based on the read data, which may include the following steps:

[0119] S71, periodically read the storage flags of each array.

[0120] S72, read the data in the array with the storage flag of 1.

[0121] S73, store the read data.

[0122] S74, display a waveform based on the read data.

[0123] In an example, the storage module is a DB, and its buffer area is as Figure 3 shown, including 2 arrays, with 100 elements in each array. The addressing of the arrays in the DB block is completed by using the cross-addressing method in indirect addressing with the STL language in the FC function block. In the 1ms cyclic interrupt block of the PLC, the offset address variable is incremented by 1, and the data is stored in the corresponding offset address. Every 1ms, the data can be written into the array at the corresponding offset address, completing the function of storing 100 data in 100ms.

[0124] After the PLC program starts, the frequency converter data will be stored in the DB1 array during the 1ms cyclic interrupt. After all 100 elements of the array are stored, the storage flag will be set to 1, and the storage flag of the DB2 array will be cleared. Then, the storage of the second array will start. During the entire data storage process, the computer reads the storage flag bit of the PLC at 1ms intervals and determines whether it is 1. When it is 1, 100 data in the corresponding array will be read and the waveform will be generated and displayed in the waveform display area.

[0125] This design aims to solve the problem that the computer reads a large amount of PLC data at a rate of 1ms, resulting in too high a utilization rate of the PLC and thus affecting the execution of bus communication. At the same time, the design of the dual data cache structure can solve the data synchronization problem in the asynchronous communication mode, achieving the effect that the computer reads PLC data at 100ms intervals but can reach a sampling rate of 1ms.

[0126] The method provided by the embodiment of the present invention can avoid the problem that the data is misaligned due to the measured device refreshing the cache again during the process of the computer reading the data.

[0127] Embodiment Three

[0128] The embodiment of the present invention also provides a measured device. The port of the measured device is connected to the port of the device under test through a connecting wire and is connected to the control device. The measured device at least includes:

[0129] A PLC module, which is used to send test data to the port of the device under test through the port during each preset cycle; is also used to receive test data; is also used to compare the sent test data with the received test data; and is also used to send an exception message to the control device when the sent test data is inconsistent with the received test data.

[0130] The measured device provided by the embodiment of the present invention can monitor the change of the signal on the port of the device under test in real time during the EMC test. When the measured device finds that the test data sent to the device under test is inconsistent with the received test data, it means that the anti-interference ability of the corresponding port of the device under test is weak, and the generated exception message will be displayed by the control device for the user to view.

[0131] Embodiment Four

[0132] In some embodiments, the PLC module includes a control port and a communication port, and the device under test includes a control port and a communication port; the control port of the PLC module is connected to the control port of the device under test through a connecting wire, and the communication port of the PLC module is connected to the communication port of the device under test through a communication wire. The test data includes status test data and communication test data.

[0133] The control ports of the PLC module and the control ports of the device under test include DI, DO, AI, and AO. The communication ports of the PLC module and the communication ports of the device under test support at least one communication protocol among Modbus RTU, CANOpen, Profibus DP, ProfiNET, Modbus TCP, EtherNET IP, and EtherCAT.

[0134] In one embodiment, the PLC module is specifically configured to:

[0135] In each preset cycle, send status test data to the device under test through the control port, and send communication test data to the device under test through the communication port;

[0136] Receive the status test data returned by the control port of the device under test through the control port, and receive the communication test data returned by the communication port of the device under test through the communication port.

[0137] The accompanying test device provided by the embodiment of the present invention can simultaneously monitor the signals of the control port and the communication port of the device under test during the test process.

[0138] Embodiment Five

[0139] In some embodiments, the accompanying test device further includes at least a storage module for storing the received test data.

[0140] In one embodiment, the storage module is a DB and includes at least two arrays; the storage module is specifically configured to:

[0141] Store the received test data in the first array, and the first array is any array in the DB;

[0142] When the first array is full, set the storage flag of the first array to 1;

[0143] Clear the storage flag of the second array, and the second array is any array in the DB other than the first array;

[0144] Store the received test data in the second array.

[0145] The method provided by the embodiment of the present invention can avoid the problem of data misalignment caused by the accompanying test device refreshing the cache again during the process of the control device reading data.

[0146] Embodiment Six

[0147] The embodiment of the present invention further provides a control device. The control device is connected to the accompanying test device. The control device at least includes:

[0148] A receiving module for receiving a connection instruction input by a user;

[0149] A response module, configured to respond to a connection instruction and establish a communication connection with the co-test device;

[0150] A receiving module, further configured to receive a configuration instruction from a user;

[0151] The response module is further configured to respond to the configuration instruction and configure the communication configuration between the co-test device and the device under test;

[0152] The receiving module is further configured to receive a start test instruction input by the user;

[0153] The response module is further configured to respond to the start test instruction and control the co-test device to start testing;

[0154] The receiving module is further configured to receive exception information;

[0155] A display module, configured to display the exception information.

[0156] The control device provided by the embodiment of the present invention can configure the communication configuration between the co-test device and the device under test. During the EMC test, it can control the co-test device to monitor the signal changes on the ports of the device under test, and can also display the exception information. By viewing the control device, the user can accurately locate the circuit with weak anti-interference ability.

[0157] Embodiment Seven

[0158] In some embodiments, a reading module is configured to periodically read the storage flags of each array in the storage module; and is further configured to read the data in the array with the storage flag being 1;

[0159] A storage module, configured to store the read data;

[0160] The display module is further configured to display a waveform based on the read data.

[0161] The control device provided by the embodiment of the present invention can avoid the problem of data misalignment caused by the co-test device refreshing the cache again during the process of reading the data of the co-test device.

[0162] For the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present invention is not limited by the described action sequence, because according to the present invention, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to the present invention.

[0163] It should be noted that the embodiments in this specification are all described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the similarities between the embodiments, reference can be made to each other. For the device embodiments, since they are basically similar to the method embodiments, the description is relatively simple. For the relevant parts, reference can be made to the corresponding descriptions in the method embodiments.

[0164] The steps in the methods of the embodiments of the present invention can be adjusted, combined, and deleted according to actual needs. The technical features described in each embodiment can be replaced or combined.

[0165] The modules and sub-modules in the devices and terminals in the embodiments of the present invention can be combined, divided, and deleted according to actual needs.

[0166] In several embodiments provided by the present invention, it should be understood that the disclosed terminals, devices, and methods can be implemented in other ways. For example, the terminal embodiments described above are merely illustrative. For example, the division of modules or sub-modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple sub-modules or modules can be combined or integrated into another module, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of devices or modules can be in electrical, mechanical, or other forms.

[0167] The modules or sub-modules described as separate components may or may not be physically separated. The components as modules or sub-modules may or may not be physical modules or sub-modules, that is, they can be located in one place, or distributed to multiple network modules or sub-modules. Some or all of the modules or sub-modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0168] In addition, the functional modules or sub-modules in each embodiment of the present invention can be integrated in a processing module, or each module or sub-module can exist physically alone, or two or more modules or sub-modules can be integrated in one module. The above-mentioned integrated modules or sub-modules can be implemented in the form of hardware or in the form of software functional modules or sub-modules.

[0169] Those skilled in the art may further realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of the two. To clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described according to functions in the above description. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0170] The steps of the methods or algorithms described in combination with the embodiments disclosed herein can be directly implemented by hardware, software units executed by a processor, or a combination of the two. The software units can be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the technical field.

[0171] Finally, it should also be noted that in this document, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the element.

[0172] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but will be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for monitoring the signal status of a port of a device under test, characterized in that: The method is applied to a system for monitoring the signal status of a port of a device under test, the system comprising a device under test, a companion test device, a control device and an electromagnetic compatibility (EMC) device, some ports of the companion test device are connected to ports of the device under test via connecting lines, and some ports are connected to the control device, the method comprising: The accompanying test device sends test data to the device under test in each preset period; After receiving the test data, the device under test returns the test data to the accompanying test device; The EMC device sends an interference signal to the connection line between the device under test and the accompanying test device; The accompanying test device receives the test data and compares the sent test data with the received test data; and is also used for sending abnormal information to the control device when the sent test data is inconsistent with the received test data; The control device receives and displays the abnormal information.

2. The method according to claim 1, characterized in that The method further comprises: The control device receives a connection instruction input by a user and establishes a communication connection with the accompanying test device; The control device receives a configuration instruction from a user and configures the communication configuration between the accompanying test device and the device under test; The control device receives a test start instruction input by a user, and controls the accompanying test device to start the test; After the accompanying test device initializes the storage module, it starts to send test data to the device under test in each preset period; After receiving the test data, the device under test returns the test data to the accompanying test device; The accompanying test device stores the received test data in the storage module; The control device reads the data in the storage module and displays a waveform diagram based on the read data; The EMC device receives the operation instruction from the user and starts to send an interference signal to the connection line between the device under test and the accompanying test device.

3. The method according to claim 2, characterized in that The storage module is a data block including at least two arrays. The accompanying test device stores the received test data in the storage module, including: storing the received test data into a first array, where the first array is any array in the DB; When the first array is full, the storage flag of the first array is set to 1; clearing a storage flag of a second array, where the second array is any array other than the first array in the DB; The received test data is stored in the second array.

4. The system according to claim 3, characterized in that The method further comprises: The control device: Read the storage flags of each array; Read the data in the array whose storage flag is 1; Store the read data; Based on the read data, a waveform is displayed.

5. A test device, characterized in that: The port of the accompanying test device is connected to the port of the device under test through a connecting line, and is connected to the control device, and the accompanying test device at least includes: The programmable logic controller (PLC) module is used to send test data to the port of the device under test through the port in each preset cycle; it is also used to receive test data; it is also used to compare the sent test data with the received test data; and it is also used when the sent test data is inconsistent with the received test data, the accompanying test device sends abnormal information to the control device.

6. The accompanying test device according to claim 5, characterized in that: The PLC module includes a control port and a communication port, and the device under test includes a control port and a communication port; the control port of the PLC module is connected to the control port of the device under test through a connecting line, and the communication port of the PLC module is connected to the communication port of the device under test through a communication line, and the test data includes status test data and communication test data; the PLC module is specifically used for: In each preset cycle, status test data is sent to the device under test through the control port, and communication test data is sent to the device under test through the communication port; The status test data returned by the control port of the device under test is received through the control port, and the communication test data returned by the communication port of the device under test is received through the communication port.

7. The accompanying test device according to claim 6, characterized in that: The control port of the PLC module and the control port of the device under test both include digital input DI, digital output DO, analog input AI and analog output AO ports, and the communication port of the PLC module and the communication port of the device under test support at least one communication protocol among ModbusRTU, CANOpen, ProfibusDP, ProfiNET, ModbusTCP, EtherNET IP and EtherCAT.

8. The accompanying test device according to claim 5, characterized in that: The accompanying test device also includes: The storage module is used to store the received test data.

9. The accompanying test device according to claim 5, characterized in that: The storage module is a data block DB, including at least two arrays; the storage module is specifically used for: storing the received test data into a first array, where the first array is any array in the DB; When the first array is full, the storage flag of the first array is set to 1; clearing a storage flag of a second array, where the second array is any array other than the first array in the DB; The received test data is stored in the second array.

10. A control device, characterized in that: The control device is connected to the accompanying test device, and the control device at least includes: A receiving module, used for receiving a connection instruction input by a user; A response module, used for responding to the connection instruction and establishing a communication connection with the accompanying test device; The receiving module is further used to receive configuration instructions from the user; The response module is further used to respond to the configuration instruction and configure the communication configuration between the accompanying test device and the device under test; The receiving module is further used to receive a start test instruction input by a user; The response module is further used to respond to the start test instruction and control the accompanying test device to start the test; The receiving module is further used to receive abnormal information; The display module is used to display abnormal information.

11. The control device according to claim 10, characterized in that: The control device also includes: A reading module is used to periodically read the storage flags of each array in the storage module; and is also used to read the data in the array whose storage flag is 1; A storage module, used for storing read data; The display module is also used to display a waveform based on the read data.

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