System and method for testing level conversion circuit based on self-adaptive power management

Abstract

The invention discloses a level conversion circuit testing system and method based on adaptive power management, and relates to the technical field of circuit testing, and the method comprises the steps: obtaining the testing content of a current batch of to-be-tested level conversion circuits, and carrying out the static testing and dynamic testing of the current batch of to-be-tested level conversion circuits according to the testing content; constructing a limit test classification model, performing limit test analysis on the to-be-tested level conversion circuit passing the dynamic test, and dividing the to-be-tested level conversion circuit into a qualified level conversion circuit or a pre-estimated unqualified level conversion circuit; and performing a limit test on the pre-estimated unqualified level conversion circuit, and dividing the pre-estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to a limit test result, thereby remarkably improving the accuracy and efficiency of the test of the level conversion circuit.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit testing, and particularly to a level conversion circuit testing system and method based on adaptive power management. Background Art

[0002] In electronic devices, a level conversion circuit is used to convert signals with different level standards to meet the communication and collaborative work requirements between different circuit modules. With the continuous development of electronic technology, the performance requirements for level conversion circuits are also getting higher and higher, including aspects such as conversion accuracy, speed, stability, and power consumption. At the same time, in order to improve the energy utilization efficiency of electronic devices, adaptive power management technology has been widely applied.

[0003] However, the existing level conversion circuit testing methods have certain limitations. On the one hand, traditional testing methods often do not fully consider the impact of adaptive power management on the performance of level conversion circuits, and cannot comprehensively and accurately evaluate the performance of the circuits in actual operation. On the other hand, the existing testing methods also have deficiencies in terms of testing efficiency, testing cost, and adaptability to complex circuits, and it is difficult to meet the requirements of the rapid development of modern electronic devices. Summary of the Invention

[0004] In order to solve the above technical problems, the purpose of the present invention is to provide a level conversion circuit testing method based on adaptive power management, including the following steps: Step S1: Obtain the test content of the level conversion circuits to be tested in the current batch, and perform static testing and dynamic testing on each level conversion circuit to be tested in the current batch according to the test content; Step S2: Construct an extreme test classification model, perform extreme test analysis on the level conversion circuits to be tested that pass the dynamic test, and divide the level conversion circuits to be tested into qualified level conversion circuits or estimated unqualified level conversion circuits; Step S3: Perform extreme testing on the estimated unqualified level conversion circuits, and divide the estimated unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the extreme test results.

[0005] Further, the process of obtaining the test content of the level conversion circuits to be tested in the current batch and performing static testing and dynamic testing on each level conversion circuit to be tested in the current batch according to the test content includes: Obtain the functional characteristics and application scenarios of the level conversion circuits to be tested in the current batch, use data retrieval to obtain the test content of the level conversion circuits to be tested according to the functional characteristics and application scenarios, the test content includes static test content, dynamic test content, and extreme test content, and construct a static test content sequence, a dynamic test content sequence, and an extreme test content sequence according to the test content; Test each level conversion circuit to be tested in the current batch according to the static test content stream program sequence and the dynamic test content stream program sequence.

[0006] Further, the process of testing each level conversion circuit to be tested in the current batch according to the static test content stream program sequence includes: Build a test environment, connect the level conversion circuit to be tested with an adaptive power management module, an oscilloscope, a logic analyzer, and a multimeter, including correctly connecting the level conversion circuit to be tested to a power module with adaptive power management function, an oscilloscope, a logic analyzer, and a multimeter according to the circuit schematic diagram. Connect the oscilloscope to measure the signal waveform, the logic analyzer to analyze the digital signal timing, and the multimeter to measure parameters such as voltage and current. Calibrate the oscilloscope, logic analyzer, and multimeter to ensure the measurement accuracy. Obtain the test indexes of the level conversion circuit to be tested and the corresponding level threshold range according to the static test content stream program sequence. The test indexes include the power supply voltage output by the adaptive power management module to the level conversion circuit and the fixed level signal input to the level conversion circuit to be tested. Test the level conversion circuit according to the test indexes, obtain the output level of the level conversion circuit to be tested, and compare the output level of the level conversion circuit to be tested with the corresponding level threshold range. If the output level is within the level threshold range, test the level conversion circuit to be tested according to the dynamic test content stream program sequence. If the output level is not within the level threshold range, mark the level conversion circuit to be tested as a non - qualified level conversion circuit.

[0007] Further, the process of testing the level conversion circuit to be tested according to the dynamic test content stream program sequence includes: Obtain the conventional threshold interval of the dynamic test indexes of the level conversion circuit to be tested according to the dynamic test content stream program sequence. The dynamic test indexes include the frequency and amplitude of the input signal. Set input signals with different frequencies and amplitudes according to the conventional threshold interval of the dynamic test indexes to perform dynamic tests on the level conversion circuit to be tested. The process of performing dynamic tests includes: According to the design indexes and expected application scenarios of the level conversion circuit, determine the frequency range and amplitude range of the input signal. For example, for a level conversion circuit used for audio signal processing, select different frequency signals covering the audio frequency range (20 Hz - 20 kHz), such as 20 Hz, 1 kHz, 10 kHz, 20 kHz, etc., and use a signal generator to generate periodic signals of these frequencies, such as sine waves, square waves or triangular waves, etc., in order to comprehensively test the response of the circuit at different frequencies; at the same time, set the amplitude of the input signal. Start from a lower amplitude and gradually increase it to the maximum amplitude value specified by the design. Observe the performance changes of the level conversion circuit. For example, first set the input signal amplitude to 0.1 V, and then increase it to 0.5 V, 1 V, 2 V, etc. in sequence. When inputting signals with different frequencies and amplitudes, observe the waveforms of the input and output signals in real time through an oscilloscope, obtain the digital signal timing through a logic analyzer, obtain the output waveforms and digital signal timing of the level conversion circuit to be tested under different frequencies and amplitudes, extract the characteristics of the output waveforms and digital signal timing of the level conversion circuit to be tested under different frequencies and amplitudes, obtain waveform characteristics and digital characteristics. The waveform characteristics include waveform amplitude and waveform frequency, and the digital characteristics include signal delay, setup time, hold time and clock jitter; Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the input signal under different frequencies and amplitudes, compare the waveform features and digital features under different frequencies and amplitudes with the corresponding waveform feature threshold interval and digital feature threshold interval respectively, obtain the first cumulative time when the waveform feature is within the corresponding waveform feature threshold interval and the second cumulative time when the digital feature is within the corresponding digital feature threshold interval, preset the cumulative time threshold, and compare the first cumulative time and the second cumulative time with the cumulative time threshold; If the first cumulative time and the second cumulative time under different frequencies and amplitudes are both less than or equal to the cumulative time threshold, perform the limit test analysis on the level conversion circuit to be tested; If there is a first cumulative time or a second cumulative time greater than the cumulative time threshold, mark the level conversion circuit to be tested as a non - qualified level conversion circuit.

[0008] Furthermore, construct a limit test classification model. The process of performing limit test analysis on the level conversion circuit to be tested that passes the dynamic test and classifying the level conversion circuit to be tested into a qualified level conversion circuit or a predicted non - qualified level conversion circuit includes: Build a limit test classification model based on deep learning. Input the waveform features and digital features of the level conversion circuit to be tested into the limit test classification model. According to the limit test classification model, divide the level conversion circuit to be tested into a qualified level conversion circuit or a predicted unqualified level conversion circuit. If the level conversion circuit to be tested is divided into a predicted unqualified level conversion circuit, then perform a limit test.

[0009] Further, the process of building a limit test classification model based on deep learning includes: Obtain the historical dynamic test records marked as qualified level conversion circuits in the limit test and the historical dynamic test records marked as unqualified level conversion circuits in the limit test. Use the historical dynamic test records of qualified level conversion circuits and the historical dynamic test records of unqualified level conversion circuits as the training set and the test set. Input the training set into the limit test classification model for training until the loss function is trained stably, and save the model parameters. Test the limit test classification model with the test set until it meets the preset requirements, and output the limit test classification model.

[0010] Building a limit test classification model based on deep learning is a complex process that involves multiple steps such as model selection, training, validation, and testing. The following is a detailed supplementary description of this process: Considering the characteristics of waveform features and digital features, the present invention selects a convolutional neural network (CNN) suitable for time series analysis as the deep learning architecture. After determining the model architecture, the next step is to define the loss function. In the present invention, since the goal is to distinguish between qualified and unqualified level conversion circuits, the binary cross-entropy loss is selected as the optimization target. Subsequently, the prepared training set is input into the selected deep learning model to start training. During the training process, the weights are continuously updated through the backpropagation algorithm, making the loss function gradually decrease until it reaches a stable state. During this period, techniques such as early stopping are used to avoid overfitting. In addition to the basic training process, the various parameters of the model are tuned through grid search, and the parameters include the learning rate, batch size, regularization coefficient, etc.

[0011] When the model training is completed and the parameters are adjusted, the final evaluation is performed through the test set to obtain the evaluation results of the model. The evaluation results include classification metrics such as accuracy, recall rate, and F1 score. According to the evaluation results on the test set, determine whether the model meets the expected standards. If the requirements are met, save the model parameters and prepare for deployment; if not, it is necessary to return to a previous stage to re-examine issues such as data quality, model structure, or training strategy.

[0012] Further, the process of performing a limit test on the estimated unqualified level conversion circuit and classifying the estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to the limit test results includes: Obtain the limit values of the dynamic test indexes, perform a limit test on the estimated unqualified level conversion circuit according to the limit values of the dynamic test indexes, adjust the input signal frequency to the limit value and the amplitude to the limit value, observe the performance change of the level conversion circuit, obtain the output waveform and digital signal timing of the estimated unqualified level conversion circuit, extract features from the output waveform and digital signal timing, and obtain waveform features and digital features; Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the preset input signal under the condition that the dynamic test index is the limit value, compare the waveform features and digital features with the corresponding waveform feature threshold interval and digital feature threshold interval respectively, obtain the third cumulative time when the waveform feature is within the corresponding waveform feature threshold interval and the fourth cumulative time when the digital feature is within the corresponding digital feature threshold interval, preset the cumulative time threshold, and compare the third cumulative time and the fourth cumulative time with the cumulative time threshold; If both the third cumulative time and the fourth cumulative time are less than or equal to the cumulative time threshold, mark the estimated unqualified level conversion circuit as a qualified level conversion circuit, and retrain the limit test classification model according to the dynamic test records of the qualified level conversion circuit, where the dynamic test records include waveform features and digital features in the dynamic test; If there is a third cumulative time or a fourth cumulative time greater than the cumulative time threshold, mark the estimated unqualified level conversion circuit as an unqualified level conversion circuit.

[0013] A level conversion circuit test system based on adaptive power management includes a monitoring center, and the monitoring center is communicatively connected with a multi-state test module, a test analysis module, and a limit test module; The multi-state test module is used to obtain the test content of the level conversion circuits to be tested in the current batch, and perform static tests and dynamic tests on each level conversion circuit to be tested in the current batch according to the test content; The test analysis module is used to construct a limit test classification model, perform limit test analysis on the level conversion circuits to be tested that pass the dynamic test, and classify the level conversion circuits to be tested into qualified level conversion circuits or estimated unqualified level conversion circuits; The limit test module is used to perform a limit test on the estimated unqualified level conversion circuit, and classify the estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to the limit test results.

[0014] Compared with the prior art, the beneficial effects of the present invention are: 1. By determining the test content through obtaining the functional characteristics and application scenarios of the level conversion circuit to be tested, the traditional unified test mode is changed. Different level conversion circuits have different performance requirements in different application scenarios. This method can formulate test content according to the specific situation of each batch of circuits, avoiding the omission of testing some special function circuits or over-testing general circuits, and improving the accuracy and efficiency of testing.

[0015] 2. Adopt a phased test process combining static test, dynamic test and extreme test. The static test ensures the normal function of the circuit in the basic state, the dynamic test simulates the signal change situation of the circuit in actual operation, and the extreme test examines the performance of the circuit under extreme conditions. This comprehensive test process can evaluate the level conversion circuit from multiple perspectives, greatly increasing the probability of discovering potential problems and ensuring the quality of the product.

[0016] 3. Construct an extreme test classification model to pre-classify the circuits that pass the dynamic test, which can quickly screen out the circuits that may have problems in a large number of circuits to be tested for key testing. This not only reduces the unnecessary workload of extreme testing, but also can concentrate resources on the circuits that may be unqualified, improving the test efficiency. At the same time, using deep learning technology to construct the classification model can learn and optimize according to historical test data. As the test data continues to accumulate, the accuracy of classification will continue to improve.

[0017] 4. In the dynamic test and extreme test, not only pay attention to the basic characteristics such as the amplitude and frequency of the output waveform, but also extract features such as signal delay, setup time, hold time and clock jitter in the digital signal timing for comprehensive evaluation. These features can more comprehensively reflect the performance of the circuit. Especially in high-speed digital circuits, the accuracy of digital signal timing is crucial for the normal operation of the circuit. Through multi-feature comprehensive evaluation, it can more accurately judge whether the performance of the circuit meets the requirements.

[0018] 5. When the result of the extreme test is inconsistent with the estimated result of the classification model, re-train the extreme test classification model according to the dynamic test records of the qualified circuits. This feedback mechanism enables the classification model to continuously learn new data and features, adapt to the characteristics of different batches of circuits, and improve the accuracy and adaptability of the model. As the test continues, the model will become more and more intelligent and can more accurately classify and screen the circuits. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of a method for testing a level conversion circuit based on adaptive power management according to an embodiment of the present application.

[0020] Figure 2The schematic diagram of a level conversion circuit test system based on adaptive power management according to an embodiment of the present application. Detailed implementation manners

[0021] Next, with reference to the accompanying drawings in the embodiments of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of the present application.

[0022] As Figure 1 shown, a level conversion circuit test method based on adaptive power management includes the following steps: Step S1: Obtain the test content of the level conversion circuits to be tested in the current batch, and perform static tests and dynamic tests on each level conversion circuit to be tested in the current batch according to the test content; Step S2: Construct an extreme test classification model, perform extreme test analysis on the level conversion circuits to be tested that pass the dynamic test, and classify the level conversion circuits to be tested into qualified level conversion circuits or predicted unqualified level conversion circuits; Step S3: Perform extreme tests on the predicted unqualified level conversion circuits, and classify the predicted unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the extreme test results.

[0023] It should be further noted that, in the specific implementation process, the process of obtaining the test content of the level conversion circuits to be tested in the current batch and performing static tests and dynamic tests on each level conversion circuit to be tested in the current batch according to the test content includes: Obtain the functional characteristics and application scenarios of the level conversion circuits to be tested in the current batch, use data retrieval to obtain the test content of the level conversion circuits to be tested according to the functional characteristics and application scenarios, the test content includes static test content, dynamic test content and extreme test content, and construct a static test content flow program sequence, a dynamic test content flow program sequence and an extreme test content flow program sequence according to the test content; Test each level conversion circuit to be tested in the current batch according to the static test content flow program sequence and the dynamic test content flow program sequence.

[0024] It should be further noted that, in the specific implementation process, the process of testing each level conversion circuit to be tested in the current batch according to the static test content flow program sequence includes: Build a test environment and connect the level conversion circuit under test to an adaptive power management module, an oscilloscope, a logic analyzer, and a multimeter. This includes correctly connecting the level conversion circuit under test to a power module with adaptive power management function, an oscilloscope, a logic analyzer, and a multimeter according to the circuit schematic diagram. Connect the oscilloscope to measure the signal waveform, the logic analyzer to analyze the digital signal timing, and the multimeter to measure parameters such as voltage and current. Calibrate the oscilloscope, logic analyzer, and multimeter to ensure measurement accuracy. Obtain the test indicators of the level conversion circuit under test and the corresponding level threshold ranges according to the static test content sequence. The test indicators include the power supply voltage output by the adaptive power management module to the level conversion circuit and the fixed level signal input to the level conversion circuit under test. Test the level conversion circuit according to the test indicators to obtain the output level of the level conversion circuit under test. Compare the output level of the level conversion circuit under test with the corresponding level threshold range. If the output level is within the level threshold range, test the level conversion circuit under test according to the dynamic test content sequence. If the output level is not within the level threshold range, mark the level conversion circuit under test as a non - qualified level conversion circuit.

[0025] It should be further noted that in the specific implementation process, the process of testing the level conversion circuit under test according to the dynamic test content sequence includes: Obtain the conventional threshold interval of the dynamic test indexes of the level conversion circuit to be tested according to the dynamic test content stream program sequence. The dynamic test indexes include the frequency and amplitude of the input signal. Set input signals with different frequencies and amplitudes according to the conventional threshold interval of the dynamic test indexes to conduct dynamic tests on the level conversion circuit to be tested. The process of conducting dynamic tests includes: Determine the frequency range and amplitude range of the input signal according to the design indexes and expected application scenarios of the level conversion circuit. For example, for a level conversion circuit used for audio signal processing, select different frequency signals covering the audio frequency range (20 Hz - 20 kHz), such as 20 Hz, 1 kHz, 10 kHz, 20 kHz, etc., and use a signal generator to generate periodic signals of these frequencies, such as sine waves, square waves or triangular waves, etc., in order to comprehensively test the response of the circuit at different frequencies; At the same time, set the amplitude of the input signal. Start from a lower amplitude and gradually increase it to the maximum amplitude value specified by the design. Observe the performance changes of the level conversion circuit. For example, first set the input signal amplitude to 0.1 V, and then increase it to 0.5 V, 1 V, 2 V, etc. in sequence. When inputting signals with different frequencies and amplitudes, observe the waveforms of the input and output signals in real time through an oscilloscope, obtain the digital signal timing through a logic analyzer, obtain the output waveforms and digital signal timing of the level conversion circuit to be tested under different frequencies and amplitudes, extract the features of the output waveforms and digital signal timing under different frequencies and amplitudes, obtain waveform features and digital features. The waveform features include waveform amplitude and waveform frequency, and the digital features include signal delay, setup time, hold time and clock jitter; Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the input signal under different frequencies and amplitudes. Compare the waveform features and digital features under different frequencies and amplitudes with the corresponding waveform feature threshold interval and digital feature threshold interval respectively, obtain the first cumulative time when the waveform features are within the corresponding waveform feature threshold interval and the second cumulative time when the digital features are within the corresponding digital feature threshold interval. Preset the cumulative time threshold, and compare the first cumulative time and the second cumulative time with the cumulative time threshold; If the first cumulative time and the second cumulative time under different frequencies and amplitudes are both less than or equal to the cumulative time threshold, then conduct the limit test analysis of the level conversion circuit to be tested; If there is a first cumulative time or a second cumulative time greater than the cumulative time threshold, then mark the level conversion circuit to be tested as an unqualified level conversion circuit.

[0026] It should be further noted that in the specific implementation process, the process of constructing a limit test classification model and conducting limit test analysis on the level conversion circuit to be tested that passes the dynamic test and classifying the level conversion circuit to be tested into a qualified level conversion circuit or a predicted unqualified level conversion circuit includes: Based on deep learning, a limit test classification model is constructed. The waveform features and digital features of the level conversion circuit to be tested are input into the limit test classification model. According to the limit test classification model, the level conversion circuit to be tested is classified as a qualified level conversion circuit or a predicted unqualified level conversion circuit. If the level conversion circuit to be tested is classified as a predicted unqualified level conversion circuit, a limit test is performed.

[0027] It should be further noted that in the specific implementation process, the process of constructing a limit test classification model based on deep learning includes: Obtain the historical dynamic test records marked as qualified level conversion circuits in the limit test and the historical dynamic test records marked as unqualified level conversion circuits in the limit test. Use the historical dynamic test records of qualified level conversion circuits and the historical dynamic test records of unqualified level conversion circuits as the training set and the test set. Input the training set into the limit test classification model for training until the loss function is trained stably, and save the model parameters. Test the limit test classification model through the test set until it meets the preset requirements, and output the limit test classification model.

[0028] Constructing a limit test classification model based on deep learning is a complex process that involves multiple steps such as model selection, training, validation, and testing. The following is a detailed supplementary description of this process: Considering the characteristics of waveform features and digital features, the present invention selects a convolutional neural network (CNN) suitable for time series analysis as the deep learning architecture. After determining the model architecture, the next step is to define the loss function. In the present invention, since the goal is to distinguish between qualified and unqualified level conversion circuits, the binary cross-entropy loss is selected as the optimization target. Subsequently, the prepared training set is input into the selected deep learning model for training. During the training process, the weights are continuously updated through the backpropagation algorithm, making the loss function gradually decrease until it reaches a stable state. During this period, techniques such as early stopping are used to avoid overfitting. In addition to the basic training process, the various parameters of the model are tuned through grid search, and the parameters include the learning rate, batch size, regularization coefficient, etc.

[0029] After the model training is completed and the parameters are adjusted, the final evaluation is carried out through the test set to obtain the evaluation results of the model. The evaluation results include classification metrics such as accuracy, recall rate, F1 score, etc. According to the evaluation results on the test set, it is judged whether the model meets the expected standards. If the requirements are met, the model parameters are saved and deployment is prepared; if not, it is necessary to return to a previous stage to re-examine issues such as data quality, model structure, or training strategy.

[0030] It should be further noted that in the specific implementation process, the process of classifying the estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to the extreme test results of the estimated unqualified level conversion circuit includes: Obtain the extreme values of the dynamic test indicators, perform extreme tests on the estimated unqualified level conversion circuit according to the extreme values of the dynamic test indicators, adjust the input signal frequency to the extreme value and the amplitude to the extreme value, observe the performance changes of the level conversion circuit, obtain the output waveform and digital signal timing of the estimated unqualified level conversion circuit, extract features from the output waveform and digital signal timing, and obtain waveform features and digital features; Preset the waveform feature threshold interval and digital feature threshold interval corresponding to the preset input signal under the condition that the dynamic test indicator is at the extreme value, compare the waveform features and digital features with the corresponding waveform feature threshold interval and digital feature threshold interval respectively, obtain the third cumulative time when the waveform feature is within the corresponding waveform feature threshold interval and the fourth cumulative time when the digital feature is within the corresponding digital feature threshold interval, preset the cumulative time threshold, and compare the third cumulative time and the fourth cumulative time with the cumulative time threshold; If both the third cumulative time and the fourth cumulative time are less than or equal to the cumulative time threshold, mark the estimated unqualified level conversion circuit as a qualified level conversion circuit, and retrain the extreme test classification model according to the dynamic test records of the qualified level conversion circuit. The dynamic test records include waveform features and digital features in the dynamic test; If there is a third cumulative time or a fourth cumulative time greater than the cumulative time threshold, mark the estimated unqualified level conversion circuit as an unqualified level conversion circuit.

[0031] As Figure 2 shown, a level conversion circuit test system based on adaptive power management includes a monitoring center, and the monitoring center is communicatively connected with a polymorphic test module, a test analysis module, and an extreme test module; The polymorphic test module is used to obtain the test content of the level conversion circuits to be tested in the current batch, and perform static tests and dynamic tests on each level conversion circuit to be tested in the current batch according to the test content; The test analysis module is used to build an extreme test classification model, perform extreme test analysis on the level conversion circuit to be tested that has passed the dynamic test, and classify the level conversion circuit to be tested into a qualified level conversion circuit or a predicted unqualified level conversion circuit; The extreme test module is used to perform extreme tests on the predicted unqualified level conversion circuits, and classify the predicted unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the extreme test results.

[0032] The above embodiments are only used to illustrate the technical method of the present invention and not to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical method of the present invention can be modified or equivalently replaced without departing from the spirit and scope of the technical method of the present invention.

Claims

1. A level conversion circuit testing method based on adaptive power management, characterized in that: The following steps are involved: Step s1: obtaining the test content of the current batch of level conversion circuits to be tested, and performing static testing and dynamic testing on each level conversion circuit to be tested in the current batch according to the test content; Step s2: constructing a limit test classification model, performing limit test analysis on the level conversion circuit to be tested that has passed the dynamic test, and classifying the level conversion circuit to be tested into a qualified level conversion circuit or an estimated unqualified level conversion circuit; Step s3: performing a limit test on the estimated unqualified level conversion circuits, and dividing the estimated unqualified level conversion circuits into qualified level conversion circuits and unqualified level conversion circuits according to the limit test results.

2. A level conversion circuit testing method based on adaptive power management according to claim 1, characterized in that: The process of obtaining the test content of the current batch of level conversion circuits to be tested includes: Acquire functional characteristics and application scenarios of the current batch of level conversion circuits to be tested, and acquire test contents of the level conversion circuits to be tested by using data retrieval according to the functional characteristics and application scenarios, wherein the test contents include static test contents, dynamic test contents, and extreme test contents, and construct static test content flow sequences, dynamic test content flow sequences, and extreme test content flow sequences according to the test contents; Each level conversion circuit to be tested in the current batch is tested according to the static test content flow sequence and the dynamic test content flow sequence.

3. A level conversion circuit testing method based on adaptive power management according to claim 2, characterized in that: The process of testing each level conversion circuit to be tested in the current batch according to the static test content process sequence includes: Construct a test environment, obtain test indicators and level threshold ranges corresponding to the test indicators according to a static test content process sequence, test the level conversion circuit according to the test indicators, obtain the output level of the level conversion circuit to be tested, and if the output level is within the level threshold range, test the level conversion circuit to be tested according to a dynamic test content process sequence, otherwise mark the level conversion circuit to be tested as an unqualified level conversion circuit.

4. The method for testing a level conversion circuit based on adaptive power management according to claim 3, characterized in that: The process of testing the level conversion circuit to be tested according to the dynamic test content flow sequence includes: Obtaining a conventional threshold interval of a dynamic test indicator according to a dynamic test content process sequence, setting input signals of different frequencies and amplitudes for dynamic testing according to the conventional threshold interval of the dynamic test indicator, obtaining an output waveform and a digital signal timing sequence of a level conversion circuit to be tested under different frequency and amplitude conditions, performing feature extraction on the output waveform and the digital signal timing sequence, and obtaining waveform features and digital features; Preset the waveform characteristic threshold interval and the digital characteristic threshold interval corresponding to the input signal under different frequency and amplitude conditions, obtain the first cumulative time when the waveform characteristic is located in the corresponding waveform characteristic threshold interval and the second cumulative time when the digital characteristic is located in the corresponding digital characteristic threshold interval under different frequency and amplitude conditions, preset the cumulative time threshold, and if the first cumulative time and the second cumulative time under different frequency and amplitude conditions are both less than or equal to the cumulative time threshold, perform a limit test analysis on the level conversion circuit to be tested; If the first accumulated time or the second accumulated time is greater than the accumulated time threshold, the level conversion circuit to be tested is marked as an unqualified level conversion circuit.

5. The method for testing a level conversion circuit based on adaptive power management according to claim 4, characterized in that: The process of performing a stress test analysis on a level-shifting circuit under test that passes the dynamic test includes: A limit test classification model is constructed based on deep learning, and the waveform characteristics and digital characteristics of the level conversion circuit to be tested are input into the limit test classification model. According to the limit test classification model, the level conversion circuit to be tested is divided into a qualified level conversion circuit or an estimated unqualified level conversion circuit. If the level conversion circuit to be tested is divided into an estimated unqualified level conversion circuit, a limit test is performed.

6. A level conversion circuit testing method based on adaptive power management according to claim 5, characterized in that: The process of building a limit test classification model based on deep learning includes: Obtain historical dynamic test records of level conversion circuits that are marked as qualified in limit testing, and historical dynamic test records of level conversion circuits that are marked as unqualified in limit testing, use the historical dynamic test records of qualified level conversion circuits and the historical dynamic test records of unqualified level conversion circuits as training data, and output a trained limit test classification model.

7. A level conversion circuit testing method based on adaptive power management according to claim 6, characterized in that: The process of stress testing a level conversion circuit that is expected to fail includes: Obtaining a limit value of a dynamic test indicator, performing a limit test on an estimated unqualified level conversion circuit according to the limit value of the dynamic test indicator, and obtaining waveform characteristics and digital characteristics; Preset the waveform feature threshold interval and the digital feature threshold interval corresponding to the input signal under the condition that the dynamic test index is the limit value, obtain the third cumulative time when the waveform feature is within the corresponding waveform feature threshold interval and the fourth cumulative time when the digital feature is within the corresponding digital feature threshold interval, if the third cumulative time and the fourth cumulative time are both less than or equal to the cumulative time threshold, mark the estimated unqualified level conversion circuit as a qualified level conversion circuit, and retrain the limit test classification model according to the dynamic test record of the qualified level conversion circuit; If the third accumulated time or the fourth accumulated time is greater than the accumulated time threshold, the estimated unqualified level conversion circuit is marked as an unqualified level conversion circuit.

8. A level conversion circuit test system based on adaptive power management, specifically applied to a level conversion circuit test method based on adaptive power management as claimed in any one of claims 1 to 7, characterized in that: It includes a monitoring center, wherein the monitoring center is communicatively connected to a polymorphic test module, a test analysis module and a limit test module; The polymorphic test module is used to obtain the test content of the current batch of level conversion circuits to be tested, and perform static test and dynamic test on each level conversion circuit to be tested in the current batch according to the test content; The test analysis module is used to construct a limit test classification model, perform limit test analysis on the level conversion circuit to be tested that has passed the dynamic test, and classify the level conversion circuit to be tested into a qualified level conversion circuit or an estimated unqualified level conversion circuit; The limit test module is used to perform a limit test on the estimated unqualified level conversion circuit, and divide the estimated unqualified level conversion circuit into a qualified level conversion circuit and an unqualified level conversion circuit according to the limit test result.

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