Signal acquisition circuit of lightning protection module of track circuit, monitoring method and related equipment

Abstract

The invention relates to the technical field of track traffic, in particular to a track circuit lightning protection module signal acquisition circuit, a monitoring method and related equipment, and the track circuit lightning protection module signal acquisition circuit comprises an MCU, a dynamic acquisition module and a direct acquisition module; the dynamic acquisition module is used for dynamically acquiring a switching signal of a degradation state node and feeding back the switching signal to the MCU; the direct acquisition module is used for directly acquiring a switching signal of a degradation state node and feeding back the switching signal to the MCU; and the MCU is used for judging the degradation state of the track circuit lightning protection module according to the feedback of the dynamic acquisition module and the direct acquisition module. According to the invention, dynamic acquisition and direct acquisition are combined, so that the problems of wrong acquisition of the degradation state of the lightning protection module and invalidation of the acquisition function when the pins of the MCU have a normally high or normally low single fault can be effectively prevented, and the degradation state of the lightning protection module of the track circuit can be better acquired and monitored.

Description

Technical Field

[0001] The present invention relates to the technical field of rail transit, and in particular to a signal acquisition circuit, a monitoring method and related equipment for a lightning protection module of a track circuit. Background Art

[0002] The statements in this part only provide background technical information related to the present invention, and do not necessarily constitute prior art.

[0003] In a track circuit, the monitoring of the deterioration state of the lightning protection module is achieved by monitoring the physical switch state of the monitoring base of the lightning protection module. The usual test method is to output a high / low level signal and then perform a feedback check. The deterioration state of the lightning protection module is a digital quantity, and the normal state is a closed node. The MCU outputs a high / low level, and the input is also a high / low level. When a constant high or constant low fault occurs at the IO pin of the detection chip, the monitoring will fail. For example, when a constant high state occurs at the receiving pin of the MCU, after the lightning protection module deteriorates, the MCU outputs a high level, and the received level is still high, so the deteriorated state of the lightning protection cannot be detected, resulting in the failure of the monitoring function.

[0004] After the lightning protection module deteriorates, due to the failure of the monitoring function, real-time monitoring cannot be performed, which will further lead to untimely replacement of the lightning protection module and increase the risk of the main equipment being damaged by lightning strikes. Summary of the Invention

[0005] In order to overcome the deficiencies of the background art, the present invention provides a signal acquisition circuit, a monitoring method and related equipment for a lightning protection module of a track circuit. By combining dynamic acquisition and direct acquisition, the deteriorated state of the lightning protection module of the track circuit can be better acquired and monitored.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] In a first aspect, a signal acquisition circuit for a lightning protection module of a track circuit is provided. The lightning protection module of the track circuit includes a deterioration state node. The acquisition circuit includes an MCU, a dynamic acquisition module, and a direct acquisition module;

[0008] The dynamic acquisition module is configured to dynamically acquire the switch signal of the deterioration state node and feedback it to the MCU;

[0009] The direct acquisition module is configured to directly acquire the switch signal of the deterioration state node and feedback it to the MCU;

[0010] The MCU is configured to judge the deterioration state of the lightning protection module of the track circuit according to the feedback of the dynamic acquisition module and the direct acquisition module.

[0011] Further,

[0012] The dynamic acquisition module performs IO dynamic acquisition through an output pin and an input pin of the MCU, and isolates signals through an optocoupler;

[0013] The direct acquisition module performs direct acquisition through an input pin of the MCU, and isolates signals through an optocoupler.

[0014] Further,

[0015] The dynamic acquisition module includes a first optocoupler, a second optocoupler, a first resistor, a second resistor, and a third resistor;

[0016] The control input terminal of the first optocoupler is electrically connected to one end of the first resistor, the other end of the first resistor is electrically connected to the power supply VCC, the control loop terminal of the first optocoupler is electrically connected to an output pin of the MCU, the positive power supply terminal of the first optocoupler is electrically connected to the power supply VCCA, and the output terminal of the first optocoupler is electrically connected to one end of the second resistor;

[0017] The other end of the second resistor is electrically connected to the control input terminal of the second optocoupler, the control loop terminal of the second optocoupler is electrically connected to one end of the deterioration state node, the other end of the deterioration state node is electrically connected to the reference ground AGND, the positive power supply terminal of the second optocoupler is electrically connected to one end of the third resistor, the other end of the third resistor is electrically connected to the power supply VCC, the positive power supply terminal of the second optocoupler is also electrically connected to an input pin of the MCU, and the output terminal of the second optocoupler is electrically connected to the reference ground DGND.

[0018] Further,

[0019] The direct acquisition module includes a third optocoupler, a fourth resistor, and a fifth resistor;

[0020] The control input terminal of the third optocoupler is electrically connected to one end of the fourth resistor, the other end of the fourth resistor is electrically connected to the power supply VCCA, the control loop terminal of the third optocoupler is electrically connected to one end of the deterioration state node, the other end of the deterioration state node is electrically connected to the reference ground AGND, the positive power supply terminal of the third optocoupler is electrically connected to the power supply VCC, the output terminal of the third optocoupler is electrically connected to one end of the fifth resistor, the other end of the fifth resistor is electrically connected to the reference ground DGND, and the output terminal of the third optocoupler is also electrically connected to an input pin of the MCU.

[0021] In a second aspect, a method for monitoring the deterioration state of a track circuit lightning protection module is also provided, which is applied to the track circuit lightning protection module signal acquisition circuit described above. The monitoring method includes:

[0022] Dynamically acquire the switch signal of the deterioration state node through the dynamic acquisition module and feedback it to the MCU;

[0023] The switch signals of the deterioration state nodes are directly collected by the direct collection module and fed back to the MCU;

[0024] Based on the feedback from the dynamic collection module and the direct collection module, the MCU judges the deterioration state of the track circuit lightning protection module.

[0025] Furthermore,

[0026] The monitoring method further includes:

[0027] A square wave signal is output to the dynamic collection module through an output pin of the MCU, and the level signal fed back by the dynamic collection module is input through an input pin of the MCU;

[0028] The level signal fed back by the direct collection module is input through another input pin of the MCU;

[0029] The MCU judges the deterioration state of the track circuit lightning protection module based on the level signals input through the two input pins respectively.

[0030] In a third aspect, a collection extension is further provided, and the collection extension includes the aforementioned track circuit lightning protection module signal collection circuit.

[0031] Furthermore,

[0032] The collection extension further includes:

[0033] The first current collection module is used to collect the traction side current signal of the track circuit and feed it back to the MCU;

[0034] The second current collection module is used to collect the signal side current signal of the track circuit and feed it back to the MCU;

[0035] The voltage collection module is used to collect the voltage signal of the track circuit and feed it back to the MCU;

[0036] The temperature and humidity collection module is used to collect the temperature and humidity inside the equipment and feed it back to the MCU.

[0037] In a fourth aspect, an outdoor transmission system is further provided, and the outdoor transmission system includes a plurality of integrated outdoor transmission units. The outdoor transmission unit includes a box body and outdoor transmission equipment and outdoor monitoring equipment arranged inside the box body. An internal partition structure for separating the outdoor transmission equipment and the outdoor monitoring equipment is arranged inside the box body, and the outdoor monitoring equipment includes the aforementioned collection extension.

[0038] Based on the same inventive concept, the present invention also provides a computer-readable storage medium storing one or more programs, which, when executed, can implement the foregoing method for monitoring the deterioration state of the track circuit lightning protection module.

[0039] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0040] By combining dynamic acquisition with direct acquisition, it can effectively prevent the problem of incorrect acquisition of the deterioration state of the lightning protection module and the failure of the acquisition function when a single fault of constant high or constant low occurs at the MCU pin. Therefore, it can better collect and monitor the deterioration state of the track circuit lightning protection module.

[0041] Other features and advantages of the present invention will be described in the following specification, and, in part, will be obvious from the specification, or will be understood by implementing the present invention. The objectives and other advantages of the present invention can be realized and obtained by the structures pointed out in the specification, claims, and drawings.

[0042] The following further describes the present invention with reference to the accompanying drawings. Description of the Drawings

[0043] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0044] Figure 1 It is a topological schematic diagram of the signal acquisition circuit of the track circuit lightning protection module according to an embodiment of the present invention;

[0045] Figure 2 It is a pin schematic diagram of an optocoupler according to an embodiment of the present invention;

[0046] Figure 3 It is a waveform schematic diagram of the dynamic acquisition process according to an embodiment of the present invention;

[0047] Figure 4 It is a flow schematic diagram of the method for monitoring the deterioration state of the track circuit lightning protection module according to an embodiment of the present invention;

[0048] Figure 5 It is a structural block diagram of an acquisition substation according to an embodiment of the present invention;

[0049] Figure 6 It is a structural block diagram of an outdoor transmission system according to an embodiment of the present invention. Detailed Embodiments

[0050] To make the objectives, technical solutions and advantages of the present invention more clear, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part rather than all of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts belong to the scope of protection of the present invention.

[0051] As Figure 1 shown, the first embodiment of the present invention provides a signal acquisition circuit for a track circuit lightning protection module. The track circuit lightning protection module includes a deterioration state node. The acquisition circuit includes an MCU, a dynamic acquisition module, and a direct acquisition module;

[0052] The dynamic acquisition module is used to dynamically acquire the switch signal of the deterioration state node and feedback it to the MCU;

[0053] The direct acquisition module is used to directly acquire the switch signal of the deterioration state node and feedback it to the MCU;

[0054] The MCU is used to judge the deterioration state of the track circuit lightning protection module according to the feedback of the dynamic acquisition module and the direct acquisition module.

[0055] The above technical solution adopts a dynamic acquisition module and a direct acquisition module, combines dynamic acquisition with direct acquisition, can better acquire and monitor the deterioration state of the track circuit lightning protection module, and can effectively prevent the problem of incorrect acquisition of the deterioration state of the lightning protection module and the failure of the acquisition function when the MCU pin has a single fault of constant high or constant low.

[0056] Among them, the deterioration state node of the track circuit lightning protection module can reflect the deterioration state of the lightning protection module. The deterioration state node is in a closed state under normal circumstances and in an open state under deteriorated circumstances. Therefore, the acquisition signal of the deterioration state of the lightning protection module is a switch signal.

[0057] As a preferred technical solution, the dynamic acquisition module performs IO dynamic acquisition through one output pin and one input pin of the MCU, and performs signal isolation through an optocoupler; the direct acquisition module performs direct acquisition through one input pin of the MCU and performs signal isolation through an optocoupler.

[0058] In this embodiment, the dynamic acquisition module performs IO dynamic acquisition through one output pin 0 and one input pin I2 of the MCU, and performs signal isolation through optocouplers U1 and U2; the direct acquisition module performs direct acquisition through one input pin I1 of the MCU and performs signal isolation through optocoupler U3.

[0059] As a preferred technical solution, the dynamic acquisition module includes a first optocoupler U1, a second optocoupler U2, a first resistor R1, a second resistor R2, and a third resistor R3; the control input terminal of the first optocoupler U1 is electrically connected to one end of the first resistor R1, the other end of the first resistor R1 is electrically connected to the power supply VCC, the control loop terminal of the first optocoupler U1 is electrically connected to an output pin 0 of the MCU, the positive power supply terminal of the first optocoupler U1 is electrically connected to the power supply VCCA, and the output terminal of the first optocoupler U1 is electrically connected to one end of the second resistor R2; the other end of the second resistor R2 is electrically connected to the control input terminal of the second optocoupler U2, the control loop terminal of the second optocoupler U2 is electrically connected to one end of the deterioration state node, the other end of the deterioration state node is electrically connected to the reference ground AGND, the positive power supply terminal of the second optocoupler U2 is electrically connected to one end of the third resistor R3, the other end of the third resistor R3 is electrically connected to the power supply VCC, the positive power supply terminal of the second optocoupler U2 is also electrically connected to an input pin I2 of the MCU, and the output terminal of the second optocoupler U2 is electrically connected to the reference ground DGND.

[0060] In this embodiment, the resistors R1 to R3 are all load resistors, mainly for current limiting; the optocouplers U1 and U2 are mainly used for signal isolation; the power supply VCCA and the reference ground AGND are the acquisition power supply and the acquisition reference ground respectively, and the power supply VCC and the reference ground DGND are the digital power supply and the reference ground used by the MCU respectively; the 0 pin of the MCU is an output pin for outputting a square wave signal; the I2 pin of the MCU is an input pin for inputting the level signal feedback by the dynamic acquisition. For the load resistors used for current limiting, the general values are 4.7k, 5.1k or 10k, and the specific resistance value needs to be determined according to the optocoupler models of the optocouplers U1 and U2. The power supply VCCA and the power supply VCC represent two different power supplies, because there must be two power supplies at both ends of the isolation, otherwise the isolation effect cannot be achieved; the reference ground AGND and the reference ground DGND are the ground references of different power supplies.

[0061] There are mainly two functions for adding optocouplers for isolation in this embodiment: one is to facilitate the construction of dynamic acquisition conversion; the other is to protect the MCU circuit and prevent the MCU and its peripheral circuits from being damaged by lightning interference at the lightning protection state node. The basic requirement for the optocoupler in this embodiment is to support 3.3V power supply.

[0062] A schematic diagram of the pins of the optocoupler in this embodiment is as Figure 2 shown, Figure 2 in which, pin 1 represents the control input, pin 3 represents the control loop terminal, pin 4 represents the optocoupler working ground reference ( Figure 1 not marked in the figure), pin 5 represents the output terminal, and pin 6 represents the positive optocoupler working power supply (i.e., the positive power supply terminal).

[0063] The dynamic acquisition process is as follows: The MCU outputs a square wave signal through one 0-pin, and the frequency is arbitrarily selected according to the optocoupler conversion rate. When the 0-pin outputs a low level (a signal below 0.8V), U1 conducts, and VCCA supplies power to the input terminal of U2 through R2. The lightning protection node (i.e., the deterioration state node, the same below) is in a normal state (closed), U2 conducts, and I2 inputs a low level. When the 0-pin outputs a high level (a signal above 2V), U1 cuts off, U2 cuts off, and I2 inputs a high level.

[0064] During specific implementation, the ranges of the high and low levels are related to the MCU input. In the embodiment of the present invention, the low level range is 0V to 0.8V, and the high level range is 2V to 3.3V.

[0065] The above dynamic acquisition adopts the method of dynamically outputting a square wave. Here, taking the 0-pin outputting a 50% duty cycle 100Hz waveform as an example, the example diagram is as Figure 3 shown. The signal output from the 0-pin of the MCU and the signal input to the I2-pin are square waves with the same frequency and the same duty cycle.

[0066] In this embodiment, the square wave frequency of the square wave signal output from the 0-pin can be arbitrarily selected within 10 to 1kHz. The selection of the square wave frequency depends on the data transfer rate of the optocoupler. In this embodiment, an optocoupler with a conversion rate greater than 1kbps can be used. The duty cycle of the square wave signal output from the 0-pin in this embodiment can be arbitrarily selected within 30% to 70%.

[0067] As a preferred technical solution, the direct acquisition module includes a third optocoupler U3, a fourth resistor R4, and a fifth resistor R5; one end of the control input terminal of the third optocoupler U3 is electrically connected to one end of the fourth resistor R4, the other end of the fourth resistor R4 is electrically connected to the power supply VCCA, one end of the control return line terminal of the third optocoupler U3 is electrically connected to one end of the deterioration state node, the other end of the deterioration state node is electrically connected to the reference ground AGND, the positive power supply of the third optocoupler U3 is electrically connected to the power supply VCC, the output terminal of the third optocoupler U3 is electrically connected to one end of the fifth resistor R5, the other end of the fifth resistor R5 is electrically connected to the reference ground DGND, and the output terminal of the third optocoupler U3 is also electrically connected to an input pin I1 of the MCU.

[0068] In this embodiment, both the resistors R4 and R5 are load resistors, mainly playing a role in current limiting; the optocoupler U3 is mainly used for signal isolation; the power supply VCCA and the reference ground AGND are the acquisition power supply and the acquisition reference ground respectively, and the power supply VCC and the reference ground DGND are the digital power supply and the reference ground used by the MCU respectively; the I1 pin of the MCU is an input pin, used for inputting the level signal fed back by the direct acquisition.

[0069] The direct acquisition process is as follows: when the lightning protection node is in a normal state (closed), U3 is conducting, I1 inputs a high level; when the lightning protection node is in an abnormal state (open), U3 is cut off, and I1 inputs a low level.

[0070] As Figure 4 shown, the second embodiment of the present invention further provides a method for monitoring the deterioration state of a track circuit lightning protection module, which is applied to the aforementioned track circuit lightning protection module signal acquisition circuit. The monitoring method includes:

[0071] Dynamically acquire the switch signal of the deterioration state node through the dynamic acquisition module and feedback it to the MCU;

[0072] Directly acquire the switch signal of the deterioration state node through the direct acquisition module and feedback it to the MCU;

[0073] According to the feedback from the dynamic acquisition module and the direct acquisition module, the MCU judges the deterioration state of the track circuit lightning protection module.

[0074] Further, in the above monitoring method:

[0075] Output a square wave signal to the dynamic acquisition module through an output pin 0 of the MCU, and input the level signal feedback by the dynamic acquisition module through an input pin I2 of the MCU;

[0076] Input the level signal feedback by the direct acquisition module through another input pin I1 of the MCU;

[0077] The MCU judges the deterioration state of the track circuit lightning protection module through the level signals input through the two input pins respectively.

[0078] The above monitoring method will be further described below from two aspects: normal MCU pins and abnormal MCU pins.

[0079] 1. Normal MCU pins

[0080] In this embodiment, normal MCU pins mean that the MCU pins (including pin 0, pin I1, and pin I2) do not have single-faults of constant high or constant low. In the case of normal MCU pins:

[0081] When the lightning protection deterioration node is normally closed (normal state), Figure 1 the optocoupler U3 is in a conducting state, I1 inputs a constant high level, I2 inputs a dynamic square wave with the same frequency and the same duty cycle as pin 0, and the MCU determines that the lightning protection node is in a normal state;

[0082] When the lightning protection deterioration node is normally open (deteriorated state), Figure 1 both optocouplers U2 and U3 are in an open state, I1 inputs a constant low level, I2 input changes from a dynamic square wave to a constant high level, and the MCU determines that the lightning protection node is in an abnormal state.

[0083] 2. Abnormal MCU pins

[0084] The abnormal MCU pins in this embodiment include single - item faults such as the output of pin 0 being constantly high or low, the input of pin I1 being constantly high or low, and the input of pin I2 being constantly high or low. Specific descriptions will be given separately below.

[0085] (1) The output of pin O is constantly high or low

[0086] When a constant - low fault occurs at the MCU output pin 0, pin 0 outputs a low level. If the lightning - protection degradation node is normally closed (normal state), Figure 1 both optocouplers U2 and U3 are in the conducting state, the input of I1 is constantly high, the input of I2 is constantly low, and the MCU determines that the lightning - protection node is normal while the output pin 0 is abnormal;

[0087] When a constant - low fault occurs at the MCU output pin 0, pin 0 outputs a low level. If the lightning - protection degradation node is open (abnormal state), Figure 1 both optocouplers U2 and U3 are in the open state, the input of I1 is constantly low, the input of I2 is constantly high, and the MCU determines that the lightning - protection node is abnormal while the output pin 0 is abnormal;

[0088] When a constant - high fault occurs at the MCU output pin 0, pin 0 outputs a high level. If the lightning - protection node is normally closed (normal state), Figure 1 opto - coupler U2 is in the open state, opto - coupler U3 is in the conducting state, the input of I1 is constantly high, the input of I2 is constantly high, and the MCU determines that the lightning - protection node is normal while the output pin 0 is abnormal;

[0089] When a constant - high fault occurs at the MCU output pin 0, pin 0 outputs a high level. If the lightning - protection node is normally open (degraded state), Figure 1 both optocouplers U2 and U3 are in the open state, the input of I1 is constantly low, the input of I2 is constantly high, and the MCU determines that the lightning - protection node is abnormal while the output pin 0 is abnormal.

[0090] (2) The input of pin I1 is constantly high or low

[0091] When a constant - low fault occurs at the MCU input pin I1, pin I1 inputs a low level. If the lightning - protection degradation node is normally closed (normal state), the output pin 0 outputs a dynamic square - wave signal, the input of I1 is constantly low, and the input of I2 is a dynamic square - wave with the same frequency and duty cycle as pin 0. The MCU determines that the lightning - protection node is normal while the input pin I1 is abnormal;

[0092] When a constant - low fault occurs at the MCU input pin I1, pin I1 inputs a low level. If the lightning - protection degradation node is normally open (degraded state), the output pin 0 outputs a dynamic square - wave signal, the input of I1 is constantly low, and the input of I2 changes from a dynamic square - wave to constantly high. The MCU determines that the lightning - protection node is abnormal while the input pin I1 is abnormal.

[0093] When a constant high fault occurs at the MCU input pin I1, the pin I1 inputs a high level. If the lightning protection degradation node is normally closed (normal state), the output pin 0 outputs a dynamic square wave signal. With I1 input at a constant high level and I2 input a dynamic square wave with the same frequency and duty cycle as that of pin 0, the MCU determines that the lightning protection node is normal.

[0094] When a constant high fault occurs at the MCU input pin I1, the pin I1 inputs a high level. If the lightning protection degradation node is normally open (degraded state), the output pin 0 outputs a dynamic square wave signal. With I1 input at a constant high level and I2 input changing from a dynamic square wave to a constant high level, the MCU determines that the lightning protection node is abnormal.

[0095] (3) The I2 pin inputs a constant high or constant low level

[0096] When a constant low fault occurs at the MCU input pin I2, the pin I2 inputs a low level. If the lightning protection degradation node is normally closed (normal state), the output pin O outputs a dynamic square wave signal. With I1 input at a high level and I2 input changing from a dynamic square wave to a constant low level, the MCU determines that the lightning protection node is normal while the input 12 pin is abnormal.

[0097] When a constant low fault occurs at the MCU input pin I2, the pin I2 inputs a low level. If the lightning protection degradation node is normally open (degraded state), the output pin O outputs a dynamic square wave signal. With I1 input at a low level and I2 input changing from a dynamic square wave to a constant low level, the MCU determines that the lightning protection node is abnormal and the input I2 pin is abnormal.

[0098] When a constant high fault occurs at the MCU input pin I2, the pin I2 inputs a high level. If the lightning protection degradation node is normally closed (normal state), the output pin 0 outputs a dynamic square wave signal. With I1 input at a high level and I2 input changing from a dynamic square wave to a constant high level, the MCU determines that the lightning protection node is normal while the input I2 pin is abnormal.

[0099] When a constant high fault occurs at the MCU input pin I2, the pin inputs a high level. If the lightning protection degradation node is normally open (degraded state), the output pin 0 outputs a dynamic square wave signal. With I1 input at a low level and 12 input changing from a dynamic square wave to a constant high level, the MCU determines that the lightning protection node is abnormal and the input I2 pin is abnormal.

[0100] It can be seen that by combining dynamic acquisition and direct acquisition, the above monitoring method can effectively prevent the problems of misacquiring the degradation state of the lightning protection module and the failure of the acquisition function when a constant high or constant low single fault occurs at the MCU pin, thus better acquiring and monitoring the degradation state of the track circuit lightning protection module.

[0101] The third embodiment of the present invention also provides a collection extension, which includes the aforementioned track circuit lightning protection module signal acquisition circuit. Since the collection extension of this embodiment adopts the aforementioned track circuit lightning protection module signal acquisition circuit, it can effectively collect and monitor the deterioration state of the track circuit lightning protection module.

[0102] As a preferred technical solution, the collection extension further includes:

[0103] A first current acquisition module, configured to acquire the traction side current signal of the track circuit and feedback it to the MCU;

[0104] In this embodiment, the first current acquisition module includes a sampling and amplifying circuit, a filtering circuit, and an amplifying circuit. Specifically, in this embodiment, the traction side current acquisition signal directly enters the ADC through one path of the sampling and amplifying circuit to acquire the 50Hz traction current signal, and enters the ADC after passing through the filtering circuit and the amplifying circuit through the other path to acquire the 1.7kHz - 2.6kHz frequency shift signal.

[0105] Among them, the sampling and amplifying circuit includes sampling and amplification. Sampling is to obtain the signal collected from the front side current, and through the subtraction and amplification circuit, the small signal is converted into a large signal based on the reference voltage.

[0106] The filtering circuit filters out the 50Hz traction current signal in the input signal, and then through voltage amplification, a 1.7kHz - 2.6kHz frequency shift signal without other interference signals is obtained.

[0107] A second current acquisition module, configured to acquire the signal side current signal of the track circuit and feedback it to the MCU;

[0108] In this embodiment, the second current acquisition module includes a sampling and amplifying circuit and a filtering circuit. Specifically, in this embodiment, the 50Hz traction current signal does not need to be collected on the signal side, so it enters the ADC after passing through the sampling and amplification and the RC low-pass filtering circuit. The structure of the sampling and amplifying circuit is the same as that on the traction side, but the parameters are different.

[0109] A voltage acquisition module, configured to acquire the voltage signal of the track circuit and feedback it to the MCU;

[0110] In this embodiment, the voltage acquisition module includes two amplifying circuits, a differential circuit, and a filtering circuit. Specifically, in this embodiment, the voltage acquisition signal is obtained through a non-contact electric field induction sensor, and the two paths of signals enter the ADC through the amplifying circuit, the differential circuit, and the filtering circuit, and the digital signal of the voltage is obtained through ADC analog-to-digital conversion.

[0111] Among them, the amplification circuit uses an inverting amplifier circuit to amplify the single-channel voltage acquisition signal. Through a differential circuit, the two single-channel voltage signals are amplified and processed, and then enter the ADC through an RC filter circuit.

[0112] The temperature and humidity acquisition module is used to acquire the temperature and humidity inside the device and feedback them to the MCU.

[0113] In this embodiment, the temperature and humidity acquisition module mainly uses an isolation circuit. Specifically, in this embodiment, the temperature and humidity acquisition signal is directly connected to the MCU circuit through the interface supported by the temperature and humidity sensor module and through the isolation circuit. The MCU reads and analyzes the temperature and humidity values through the set interface protocol.

[0114] During specific implementation, the acquisition extender also reserves optical fiber interfaces and wireless interfaces, and can support optical fiber communication and wireless communication.

[0115] In the acquisition extender of this embodiment, signals such as current, voltage, and temperature and humidity use different signal acquisition circuits, which can make the acquisition circuits independent of each other. When problems occur, the fault conditions can be identified more accurately.

[0116] As can be seen from the above, the acquisition extender of this embodiment can simultaneously acquire the shunting frequency signal and traction current signal of outdoor equipment, and can also acquire voltage signals, lightning protection module remote signaling terminal node signals (i.e., switch signals of deterioration state nodes), and temperature and humidity information. All kinds of acquired signals are sent to the acquisition extender for processing. The structural block diagram of the acquisition extender in this embodiment is as Figure 5 shown.

[0117] The fourth embodiment of the present invention also provides an outdoor transmission system. The outdoor transmission system includes a plurality of integrated outdoor transmission units. The outdoor transmission unit includes a box body (in this embodiment, the box body directly uses a choke transformer box body) and outdoor transmission equipment and outdoor monitoring equipment arranged in the box body. An internal partition structure for separating the outdoor transmission equipment and the outdoor monitoring equipment is arranged in the box body. The outdoor monitoring equipment includes the aforementioned acquisition extender.

[0118] The existing outdoor transmission unit uses a choke transformer box. Due to the fixed internal structure, there is no reserved installation and acquisition position for the acquisition system (i.e., monitoring equipment), and the acquisition system can only be installed in a split manner. When using the split installation, the current transformers used by the acquisition system are placed outside the equipment to be acquired, which is greatly affected by the external environment and has a high failure rate. In this embodiment, the outdoor transmission unit adopts an integrated design. The outdoor transmission unit effectively utilizes the structure of the choke transformer box, combines the outdoor transmission equipment of the track circuit and the outdoor monitoring equipment into one, and through internal structure separation, all acquisition devices are arranged inside the box. Through the protection level of the box, the service life of the acquisition devices is improved, the degree of equipment integration is improved, and at the same time, the monitoring equipment will not affect or reduce the normal operation and safety level of the outdoor transmission equipment.

[0119] The structural block diagram of the outdoor transmission system in this embodiment is as Figure 6 shown, in Figure 6 :

[0120] The main equipment area is the area where the outdoor transmission equipment is placed. Among them, T1 is the choke transformer coil, and 4 - 9 are signal coils, and different transformation ratios can be adjusted according to requirements. C1 and C2 are DC-blocking capacitors, mainly to prevent the DC component from the traction coil from affecting the indoor equipment. C1 and C2 are redundantly connected. After passing through C1 and C2, it reaches E1 and E2. The E1 and E2 ends are signal interface ends, and are connected to the indoor equipment through cables.

[0121] 1 - 3 are traction side coils. The 1 and 2 ends are signal interface ends, which are connected to the outdoor rail through the rail lead wire. 3 is the center connection point, which is connected to the adjacent outdoor transmission equipment through the connecting plate. The outdoor transmission equipment presents a low impedance to the power frequency signal of the traction current, realizing the conduction and balance of the traction return current at both ends of the mechanical insulation joint rail; at the same time, it presents a high impedance to 1.7 kHz - 2.6 kHz, separating the signal currents in the adjacent track circuits, and at the same time not losing the frequency shift signal of this section.

[0122] The monitoring area is the area where the outdoor monitoring equipment is placed. Among them, A1 - A3 are current acquisition current transformers, all of which are non-contact through-core current transformers. A1 acquires the frequency shift and traction current signals of the left traction coil; A2 acquires the frequency shift and traction current signals of the right traction coil; A3 acquires the frequency shift current of the signal coil;

[0123] V1 - V5 are non-contact voltage transformers, which adopt the principle of electric field induction. According to the potential difference formed by the interaction between charges, the measurement of the electric field strength is realized by measuring the capacitance between the electrodes, and the measurement signal enters the acquisition submachine for calculation and processing. V1 and V2 measure the voltages of the left and right coils on the traction side; V3 and V4 measure the voltages at both ends of the DC-blocking capacitors C1 and C2; V4 and V5 measure the voltages at both ends of the signal coils E1 and E2.

[0124] The deterioration state node is set on the lightning protection module base and is equipped with a telecontrol terminal. The deterioration state of the lightning protection module can be collected through the IO.

[0125] The temperature and humidity sensor is fixed inside the outdoor transmission device, and the temperature and humidity inside the device can be collected in real time.

[0126] Based on the same inventive concept, the present invention also provides a computer-readable storage medium storing one or more programs, which can implement the foregoing method for monitoring the deterioration state of the track circuit lightning protection module when the one or more programs are executed.

[0127] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0128] The parts not involved in the above embodiments are the same as or can be implemented by the prior art, and will not be further described herein.

[0129] Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A track circuit lightning protection module signal acquisition circuit, the track circuit lightning protection module includes a degradation state node, characterized in that: The acquisition circuit includes an MCU, a dynamic acquisition module and a direct acquisition module; The dynamic acquisition module is used to dynamically acquire the switch signal of the node in the degradation state and feed it back to the MCU; The direct acquisition module is used to directly acquire the switch signal of the node in the degradation state and feed it back to the MCU; The MCU is used to determine the degradation state of the track circuit lightning protection module according to the feedback from the dynamic acquisition module and the direct acquisition module.

2. A track circuit lightning protection module signal acquisition circuit according to claim 1, characterized in that: The dynamic acquisition module performs IO dynamic acquisition through one output pin and one input pin of the MCU, and performs signal isolation through an optical coupler; The direct acquisition module performs direct acquisition through an input pin of the MCU and performs signal isolation through an optical coupler.

3. A track circuit lightning protection module signal acquisition circuit according to claim 2, characterized in that: The dynamic acquisition module includes a first optical coupler, a second optical coupler, a first resistor, a second resistor and a third resistor; The control input end of the first optical coupler is electrically connected to one end of the first resistor, the other end of the first resistor is electrically connected to the power supply VCC, the control return end of the first optical coupler is electrically connected to an output pin of the MCU, the positive power supply of the first optical coupler is electrically connected to the power supply VCCA, and the output end of the first optical coupler is electrically connected to one end of the second resistor; The other end of the second resistor is electrically connected to the control input end of the second optocoupler, the control return end of the second optocoupler is electrically connected to one end of the degradation state node, the other end of the degradation state node is electrically connected to the reference ground AGND, the positive power supply of the second optocoupler is electrically connected to one end of the third resistor, the other end of the third resistor is electrically connected to the power supply VCC, the positive power supply of the second optocoupler is also electrically connected to an input pin of the MCU, and the output end of the second optocoupler is electrically connected to the reference ground DGND.

4. A track circuit lightning protection module signal acquisition circuit according to claim 2, characterized in that: The direct acquisition module includes a third optical coupler, a fourth resistor and a fifth resistor; The control input end of the third optocoupler is electrically connected to one end of the fourth resistor, and the other end of the fourth resistor is electrically connected to the power supply VCCA. The control return line end of the third optocoupler is electrically connected to one end of the degradation state node, and the other end of the degradation state node is electrically connected to the reference ground AGND. The positive power supply of the third optocoupler is electrically connected to the power supply VCC. The output end of the third optocoupler is electrically connected to one end of the fifth resistor, and the other end of the fifth resistor is electrically connected to the reference ground DGND. The output end of the third optocoupler is also electrically connected to an input pin of the MCU.

5. A method for monitoring the degradation state of a track circuit lightning protection module, applied to the track circuit lightning protection module signal acquisition circuit according to any one of claims 1 to 4, characterized in that: The monitoring method comprises: The switch signals of the nodes in the degraded state are dynamically collected through the dynamic collection module and fed back to the MCU; The switch signal of the node in the degraded state is directly collected through the direct acquisition module and fed back to the MCU; According to the feedback from the dynamic acquisition module and the direct acquisition module, the degradation status of the track circuit lightning protection module is judged through the MCU.

6. A method for monitoring the degradation state of a track circuit lightning protection module according to claim 5, characterized in that: The monitoring method further comprises: Outputting a square wave signal to the dynamic acquisition module through one output pin of the MCU, and inputting a level signal fed back by the dynamic acquisition module through one input pin of the MCU; The level signal fed back by the direct acquisition module is inputted through another input pin of the MCU; The MCU determines the degradation status of the track circuit lightning protection module through the level signals input from the two input pins.

7. A data collection extension, characterized in that: The acquisition extension includes the track circuit lightning protection module signal acquisition circuit as described in any one of claims 1-4.

8. A data collection extension according to claim 7, characterized in that: The collection extension also includes: A first current acquisition module is used to collect the traction side current signal of the track circuit and feed it back to the MCU; A second current acquisition module is used to collect the signal side current signal of the track circuit and feed it back to the MCU; A voltage acquisition module is used to collect the voltage signal of the track circuit and feed it back to the MCU; The temperature and humidity acquisition module is used to collect the temperature and humidity inside the device and feed it back to the MCU.

9. An outdoor transmission system, characterized in that: The outdoor transmission system includes a plurality of integrated outdoor transmission units, each of which includes a box and outdoor transmission equipment and outdoor monitoring equipment arranged in the box. An internal partition structure for separating the outdoor transmission equipment and the outdoor monitoring equipment is arranged in the box, and the outdoor monitoring equipment includes the collection extension described in claim 7 or 8.

10. A computer-readable storage medium storing one or more programs, characterized in that: When the one or more programs are executed, the method for monitoring the degradation status of the track circuit lightning protection module described in claim 5 or 6 can be implemented.

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