Method and system for testing reliability of optical communication devices

Abstract

The application discloses a reliability test method and system of an optical communication device, and relates to the technical field of optical communication devices.The method comprises the following steps: an integrated test device;scanning the barcode of a target optical communication device, matching a plurality of connection devices for the target optical communication device, and obtaining a plurality of docking test groups; matching a plurality of preset test parameters corresponding to the plurality of docking test groups; the test device sequentially performs insertion loss, return loss and polarization-dependent loss tests according to the plurality of preset test parameters, outputs a plurality of test data sets, compares the plurality of test data sets with a plurality of preset performance thresholds, and obtains performance test results.The technical problem of the prior art that the test program needs to be specifically docked with different elements, thereby increasing test complexity and resulting in insufficient reliability test efficiency and accuracy is solved, and the technical effect of improving the efficiency and accuracy of reliability testing is achieved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of optical communication devices, and particularly relates to a reliability test method and system of an optical communication device. BACKGROUND

[0002] As a core component of an optical communication system, the performance of an optical communication device directly affects the stability and reliability of the entire optical communication system. From the laser and modulator at the sending end, to the optical fiber and optical amplifier in the transmission process, and to the detector at the receiving end, any failure of an optical communication device may cause serious problems such as communication interruption and signal quality degradation. For example, in long-distance optical fiber communication, if the performance of the optical amplifier is unstable, the signal will be severely distorted and attenuated after being amplified by multiple stages, greatly affecting the communication quality. Therefore, strict reliability tests are performed on optical communication devices to ensure the reliable operation of the optical communication system. However, there are many types of optical communication devices, and each device needs to be specially targeted to test different components. For example, optical transmitting devices, optical receiving devices, and various optical passive devices in the optical transmission process each have significantly different test procedures. Test personnel not only need to be familiar with multiple different test procedures, but also need to frequently switch between different test procedures and manually configure various parameters, greatly increasing the complexity of the test process, resulting in low test efficiency and easily introducing human errors during frequent operations, reducing the accuracy of test results.

[0003] Therefore, in the related art, there is a technical problem of needing to specially target different components for test procedures, thereby increasing test complexity and resulting in insufficient reliability test efficiency and accuracy. SUMMARY

[0004] The present application provides a reliability test method and system of an optical communication device, which solves the technical problem of needing to specially target different components for test procedures in the prior art, thereby increasing test complexity and resulting in insufficient reliability test efficiency and accuracy, and achieves the technical effect of improving the efficiency and accuracy of reliability tests.

[0005] The application provides a reliability testing method of an optical communication device, the method comprising: an integrated testing device, the testing device comprising an optical power meter, an optical spectrum analyzer and a polarization controller, the optical power meter, the optical spectrum analyzer and the polarization controller being connected with an upper computer through a control interface; scanning a barcode of a target optical communication device, matching a plurality of connection devices for the target optical communication device, sequentially connecting the target optical communication device with the plurality of connection devices to obtain a plurality of connection testing groups; matching a plurality of preset testing parameters corresponding to the plurality of connection testing groups, the testing device sequentially performing insertion loss, return loss and polarization-dependent loss testing according to the plurality of preset testing parameters, outputting a plurality of testing data sets, comparing the plurality of testing data sets with a plurality of preset performance thresholds, and obtaining performance testing results.

[0006] In a possible implementation, the reliability testing method of the optical communication device further performs the following processing: the testing device performs insertion loss, return loss and polarization-dependent loss testing according to the plurality of preset testing parameters; wherein the optical power meter included in the testing device is used to measure input / output optical power of the target optical communication device to test insertion loss, the optical spectrum analyzer is used to detect reflected spectrum to test return loss, and the polarization controller is used to adjust a polarization state to test polarization-dependent loss; the plurality of preset testing parameters comprise an optical power sample of the optical power meter, a high-power pulse light sample of the optical spectrum analyzer, and a plurality of polarization state samples of the polarization controller.

[0007] In a possible implementation, the reliability testing method of the optical communication device further performs the following processing: generating an optical power sample for emission; when the target optical communication device is sequentially connected for testing according to the plurality of connection testing groups, the optical power meter tests the target optical communication device according to the optical power sample to obtain input optical power and output optical power; calculating insertion loss according to the input optical power and the output optical power, and outputting insertion loss testing data.

[0008] In a possible implementation, the reliability testing method of the optical communication device further performs the following processing: generating a high-power pulse light sample for emission; when the target optical communication device is sequentially connected for testing according to the plurality of connection testing groups, switching the optical spectrum analyzer to an optical reflection measurement mode, and testing the target optical communication device based on the optical reflection measurement mode through the high-power pulse light sample to obtain reflected optical power; calculating return loss according to the reflected optical power, and outputting return loss testing data.

[0009] In a possible implementation, the reliability test method of the optical communication device further performs the following processing: setting a plurality of polarization state samples; when the target optical communication device is tested in turn according to the plurality of docking test groups, the polarization controller tests the target optical communication device according to the plurality of polarization state samples, and records a plurality of output optical powers corresponding to the plurality of polarization state samples; calculating polarization-dependent loss according to the plurality of output optical powers, and outputting polarization-dependent loss test data.

[0010] In a possible implementation, the reliability test method of the optical communication device further performs the following processing: scanning a barcode of a target optical communication device to determine a device type of the target optical communication device; constructing a device connection relationship network by inputting a plurality of optical communication circuits, wherein a node in the device connection relationship network represents each device, and an edge represents a connection cumulative number of two devices; identifying, based on the device type, a plurality of devices with a connection weight greater than a preset connection weight in the device connection relationship network as the plurality of connection devices and outputting the plurality of connection devices.

[0011] In a possible implementation, the reliability test method of the optical communication device further performs the following processing: sorting the plurality of connection devices according to the connection weight, outputting a switching sequence table of the plurality of connection devices, and setting a switching time of adjacent two connection devices in the switching sequence table to be greater than a preset switching time.

[0012] In a possible implementation, the reliability test method of the optical communication device further performs the following processing: comparing the plurality of test data sets with a plurality of preset performance thresholds to obtain a performance test result, wherein the performance test result includes test qualified and test unqualified; if any one of the plurality of test data sets is not in the corresponding preset performance threshold, outputting a test unqualified result; and if all the plurality of test data sets are in the plurality of preset performance thresholds, outputting a test qualified result.

[0013] The application also provides a reliability test system of an optical communication device, comprising: a test device integration module for integrating a test device, wherein the test device comprises an optical power meter, an optical spectrum analyzer and a polarization controller, and the optical power meter, the optical spectrum analyzer and the polarization controller are connected with an upper computer through a control interface; a docking test group obtaining module for scanning a barcode of a target optical communication device, matching a plurality of connection devices for the target optical communication device, and sequentially docking the target optical communication device with the plurality of connection devices to obtain a plurality of docking test groups; and a performance test result obtaining module for matching a plurality of preset test parameters corresponding to the plurality of docking test groups, and sequentially performing insertion loss, return loss and polarization-dependent loss tests by the test device according to the plurality of preset test parameters, outputting a plurality of test data sets, comparing the plurality of test data sets with a plurality of preset performance thresholds, and obtaining a performance test result.

[0014] By means of the reliability test method and system of the optical communication device provided in the application, the test device is integrated; the barcode of the target optical communication device is scanned, a plurality of connection devices are matched for the target optical communication device, and a plurality of docking test groups are obtained; a plurality of preset test parameters corresponding to the plurality of docking test groups are matched, and the test device sequentially performs insertion loss, return loss and polarization-dependent loss tests according to the plurality of preset test parameters, outputs a plurality of test data sets, compares the plurality of test data sets with a plurality of preset performance thresholds, and obtains a performance test result. The technical problem that the test procedure needs to be docked with different elements in the prior art, thereby increasing the test complexity and leading to insufficient reliability test efficiency and accuracy is solved, and the technical effect of improving the efficiency and accuracy of the reliability test is achieved. BRIEF DESCRIPTION OF DRAWINGS

[0015] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings of the embodiments of the present disclosure will be briefly introduced below. In the present application, a flowchart is used to illustrate the operations performed by the system according to the embodiments of the present application. It should be understood that the foregoing or the following operations are not necessarily performed in sequence. On the contrary, according to the needs, various steps can be processed in reverse order or at the same time. At the same time, other operations can be added to these processes, or a step or several steps of operation can be removed from these processes.

[0016] Figure 1 The reliability test method flowchart of the optical communication device provided in the embodiments of the present application.

[0017] Figure 2 The reliability test system structure schematic diagram of the optical communication device provided in the embodiments of the present application.

[0018] Legend: test device integration module 10, docking test group obtaining module 20, performance test result obtaining module 30. DETAILED DESCRIPTION

[0019] The above description is only a summary of the technical solutions of the present application. In order to make the technical means of the present application more clear, the present application can be implemented according to the content of the description, and in order to make the above and other purposes, characteristics and advantages of the present application more obvious and easy to understand, the following specific embodiments of the present application are described.

[0020] In order to make the purposes, technical solutions and advantages of the present application more clear, the following will combine the drawings to make further detailed description of the present application. The described embodiments should not be regarded as limitation of the present application. All other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0021] In the following description, "some embodiments" are related to a subset of all possible embodiments, but it can be understood that "some embodiments" can be the same subset or different subset of all possible embodiments, and can be combined with each other without conflict. The term "first\second" is only to distinguish similar objects, and does not represent the specific order of the objects. The terms "include" and "have" and any variants are intended to cover non-exclusive inclusion, for example, a process, method, system, product or server including a series of steps or units does not have to be limited to those steps or units clearly listed, but can include other steps or modules not clearly listed or inherent to these processes, methods, products or devices. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as understood by those skilled in the art to which the present application belongs. The terms used herein are only for the purpose of describing the embodiments of the present application.

[0022] The embodiments of the present application provide a reliability test method of an optical communication device, as shown in Figure 1 The method comprises the following steps:

[0023] Step S100, an integrated test device, the test device comprises an optical power meter, an optical spectrum analyzer and a polarization controller, the optical power meter, the optical spectrum analyzer and the polarization controller are connected with a host computer through a control interface.

[0024] Preferably, a plurality of test devices with different functions are combined to meet the needs of comprehensive and integrated testing of optical communication devices, to avoid the cumbersome operation problem caused by using multiple independent devices, and to improve the testing efficiency, wherein the test devices include an optical power meter, an optical spectrum analyzer, and a polarization controller. Specifically, the optical power meter is used to accurately measure the power of the optical signal. The optical power parameter in the optical communication system directly affects the transmission distance and quality of the optical signal. For example, in long-distance fiber communication, too weak optical power may cause the signal to attenuate too much during transmission, and the receiving end cannot correctly identify the signal. Too strong optical power may damage the optical communication device. By measuring the optical power at the input and output ends of the optical communication device through the optical power meter, the optical power loss of the device can be evaluated. The optical spectrum analyzer is used to analyze the spectral characteristics of the optical signal, such as wavelength, spectral bandwidth, spectral shape, etc. Different optical communication systems and devices have different requirements for the spectral characteristics of the optical signal. For example, in a wavelength division multiplexing (WDM) system, the wavelength of each channel needs to be accurately controlled to ensure that different channels do not interfere with each other. The optical spectrum analyzer detects whether the spectrum of the optical signal meets the system requirements, and can evaluate the influence of the optical communication device on the spectral characteristics. The optical signal has polarization characteristics, and the performance of the optical communication device will be affected by the polarization state of the optical signal. The role of the polarization controller is to adjust and control the polarization state of the optical signal. By changing the polarization state of the optical signal, the performance of the optical communication device under different polarization conditions can be tested, and the reliability of the device can be more comprehensively evaluated.

[0025] Preferably, the optical power meter, the optical spectrum analyzer and the polarization controller are connected with the host computer through a control interface, wherein the control interface is a bridge for communication and data transmission between the test equipment and the host computer, and common control interfaces include USB, GPIB (General Purpose Interface Bus), Ethernet interface, etc. Different interfaces have different characteristics and application scenarios. For example, the USB interface is convenient to use and has moderate transmission speed, and is suitable for most small test equipment; the GPIB interface has high reliability and transmission accuracy, and is commonly used for test equipment with high data transmission requirements; the Ethernet interface is suitable for scenarios requiring remote control and large data transmission. The host computer generally refers to a computer with strong data processing and control capabilities, which is installed with special test software and can realize device control, data acquisition and processing, test process automation after being connected with the test equipment through the control interface. Specifically, the operator can send various control commands to the test equipment on the software interface of the host computer, such as setting the measurement range of the optical power meter, the scanning wavelength range of the optical spectrum analyzer and the polarization state adjustment of the polarization controller, so as to realize remote control and parameter configuration of the test equipment. The test equipment transmits the measured data to the host computer through the control interface, and the data can be collected, stored and analyzed, for example, the optical power data measured by the optical power meter is statistically analyzed to draw the curve of power change with time; the spectral data collected by the optical spectrum analyzer is processed to calculate the center wavelength, bandwidth and other parameters of the spectrum; the host computer can also automatically control the test equipment to complete each test task in sequence according to the preset test process and parameters, so as to realize the automation of the test process, optimize the complex reliability test process of the optical communication device, and further improve the test efficiency and the accuracy of the test results.

[0026] In step S200, the bar code of the target optical communication device is scanned, a plurality of connection devices are matched for the target optical communication device, the target optical communication device and the plurality of connection devices are sequentially connected, and a plurality of connection test groups are obtained.

[0027] Preferably, in the production process of the optical communication device, each device is assigned a unique barcode, like a "identity card" of the device, containing important information of the device, such as model, specification, production batch, technical parameters, etc. By scanning the barcode on the target optical communication device using a barcode scanning device (such as a code gun), the test equipment can quickly and accurately obtain the detailed information of the device and transmit it to the upper computer to quickly and accurately identify the type and characteristics of the optical communication device. Then, based on the information of the target optical communication device obtained by scanning the barcode, and based on the interface type, optical characteristics, transmission rate and other parameters of the device, a plurality of connection devices suitable for the device are selected from a pre-set database to ensure that the connection devices are compatible with the target optical communication device and can meet the testing requirements. The connection device is a device or component used for connection and test with the target optical communication device, which may include optical fiber jumpers, optical couplers, optical attenuators, etc. Different types of target optical communication devices may require different connection devices to complete the test.

[0028] Preferably, after determining the plurality of connection devices suitable for the target optical communication device, the automated test equipment will physically connect the target optical communication device with each connection device in a pre-set order, and ensure the stability and accuracy of the connection to avoid looseness, misplacement and other situations that may affect the test results. Specifically, after the target optical communication device is successfully connected with a connection device each time, an interface test group is formed, and each interface test group represents a different test scenario. By testing a plurality of interface test groups, the performance and reliability of the target optical communication device under different connection conditions can be comprehensively evaluated. For example, using optical fiber jumpers of different lengths to connect with the target optical communication device can test the performance of the device under different transmission distances; using optical attenuators with different attenuation values to connect with the device can test the performance of the device under different optical power attenuation conditions. The barcode identification realizes the automation and precision of the optical communication device reliability test, can efficiently create multiple different test scenarios for the target optical communication device, thereby more comprehensively and accurately evaluating its performance and reliability and reducing the complexity of the test process, and improving the test efficiency.

[0029] Further, step S200 further comprises step S210 of scanning the barcode of the target optical communication device to determine the device type of the target optical communication device; step S220 of constructing a device connection relationship network by inputting a plurality of optical communication circuits, wherein the nodes in the device connection relationship network represent each device, and the edges represent the connection accumulation times of two devices; and step S230 of identifying a plurality of devices with a connection weight greater than a pre-set connection weight in the device connection relationship network as the plurality of connection devices based on the device type.

[0030] Preferably, a bar code scanning device (such as a code scanning gun) is used to scan the bar code on the target optical communication device, and the scanned information is transmitted to the host computer for information analysis, so as to accurately identify the specific type of the target optical communication device, such as an optical transmitter, an optical receiver, an optical amplifier, or an optical filter; then a plurality of actual optical communication circuit information is collected from the optical communication system design document, the actual running network topology, etc., including each optical communication device contained in the circuit and the connection relationship therebetween, and is input into the test equipment to construct an optical communication device connection relationship network, wherein each optical communication device represents a node, such as an optical transmitter and an optical receiver each corresponding to a node, and the connection relationship between two devices represents an edge, and the weight of the edge is set to the connection cumulative number of the two devices, that is, if two devices are connected together in a plurality of input optical communication circuits, the weight of the edge between them will be greater, thereby constructing a network that can reflect the actual connection frequency between optical communication devices; then according to the determined type of the optical communication device, searching in the device connection relationship network, outputting the optical communication devices with connection weight greater than the preset connection weight as connectors, wherein the preset connection weight is a threshold value set in advance, used to filter the devices that are frequently connected with the target optical communication device and have a relatively close relationship, specifically, finding the edges connected with the target optical communication device in the network, and the weights (i.e. connection cumulative number) of these edges are greater than the preset connection weight, outputting the devices connected by these edges as a plurality of connection devices of the target optical communication device, which are usually used frequently with the target optical communication device in the actual optical communication circuit, and selecting them as connection devices for subsequent docking test, which can more realistically simulate the performance of the target optical communication device in the actual working environment, and thus improve the accuracy and effectiveness of the test.

[0031] Further, step S200 further includes step S240 of sorting according to the connection weight of the plurality of connection devices, and outputting a switching sequence table of the plurality of connection devices; and step S250 of setting the switching time of adjacent two connection devices in the switching sequence table to be greater than a preset switching time.

[0032] Preferably, the greater the connection weight of the connection device, the higher the frequency of the two devices in the actual optical communication circuit connection, the stronger the relevance, and the multiple connection devices matched to the target optical communication device are sorted in descending order of the connection weight between them and the target optical communication device, that is, the connection device with the largest connection weight is placed at the front, and the connection device with the smallest connection weight is placed at the back, and then a list containing all connection devices is generated, called the switching sequence list of the connection device, which specifies the order of the connection device and the target optical communication device when testing the target optical communication device. For example, in a list containing multiple connection devices such as optical transmitters, optical receivers, and optical amplifiers, the optical amplifier has the largest connection weight with the target optical communication device, so the optical amplifier is first connected to the target optical communication device during testing. The preset switching time is a time threshold value preset according to the characteristics of the optical communication device, the response time of the test equipment, and the actual needs of the test operation, etc., which is used to ensure that there is enough time to complete the necessary operations such as device stabilization, data collection and processing during the switching of the connection device. When switching from one connection device to the next, the switching time of the adjacent two connection devices is greater than the preset switching time, that is, a period of time is guaranteed to maintain the recovery of the device, for example, if the preset switching time is 5 seconds, the entire process of disconnecting a connection device from the target optical communication device and connecting the next connection device must take more than 5 seconds to avoid inaccurate test data, device damage, and other problems caused by switching too quickly, ensuring the stability and reliability of the test process.

[0033] Step S300, match the multiple preset test parameters corresponding to the multiple docking test groups, and the test equipment sequentially performs insertion loss, return loss and polarization-dependent loss tests according to the multiple preset test parameters, outputs multiple sets of test data sets, compares the multiple sets of test data sets with multiple preset performance thresholds, and obtains performance test results.

[0034] Preferably, for each interfacing test group, since different test scenarios are formed when the target optical communication device is interfaced with different connection devices, the corresponding preset test parameters (such as the wavelength, power range, polarization state of the test light, etc.) are configured and matched according to the specifications of the devices, test standards, and actual application requirements, etc., to ensure that the performance of the target optical communication device under various connection conditions can be accurately evaluated, and then the test equipment sequentially performs the insertion loss, return loss, and polarization-dependent loss tests according to the multiple preset test parameters. Specifically, the insertion loss test (i.e., the insertion loss test) refers to the test equipment sending an optical signal to the interfacing test group composed of the target optical communication device and the connection device according to the preset test parameters, and then measuring the power reduction of the optical signal after passing through the interfacing system, wherein the power reduction is the insertion loss. Through the insertion loss test, the energy loss of the optical signal during transmission can be understood. The return loss test refers to the test equipment detecting the optical power reflected back from the interfacing test group and comparing it with the incident optical power to obtain the return loss value. The return loss test is used to measure the power loss caused by reflection during the transmission of the optical signal, and further evaluate the impact of reflection on signal transmission in the optical communication system. Excessive return loss may cause signal distortion, reflected noise, and other problems. The polarization state of the optical signal may change in the optical communication system, and the polarization-dependent loss test refers to the test equipment analyzing the power change of the optical signal under different polarization states according to the preset polarization-dependent parameters, i.e., measuring the optical power loss caused by the change in polarization state.

[0035] Preferably, the test equipment performs insertion loss, return loss, and polarization-dependent loss tests for each interfacing test group, respectively, and records the data obtained from each test to form multiple sets of test data sets. Each set of test data set contains the specific values of the insertion loss, return loss, and polarization-dependent loss of the interfacing test group under specific preset test parameters. Then, the values of the insertion loss, return loss, and polarization-dependent loss in each test data set are compared with the corresponding preset performance thresholds, respectively. The preset performance thresholds are standard values developed according to the performance indicators and actual application requirements of the optical communication devices, and there are respective preset performance thresholds for insertion loss, return loss, and polarization-dependent loss. Specifically, if the test data of a certain interfacing test group is within the corresponding preset performance threshold range, it indicates that the combined performance of the target optical communication device and the connection device in the interfacing test group meets the requirements. If any test data exceeds the preset performance threshold, it indicates that there is a problem with the combination. Further, the performance test results of the target optical communication device under different interfacing conditions are comprehensively and accurately obtained.

[0036] Furthermore, step S300 also includes step S310, whereby the testing equipment performs insertion loss, return loss, and polarization-dependent loss tests according to the plurality of preset test parameters; wherein, the testing equipment includes an optical power meter for measuring the input / output optical power of the target optical communicator to test insertion loss, a spectrometer for detecting the reflection spectrum to test return loss, and a polarization controller for adjusting the polarization state to test polarization-dependent loss; the plurality of preset test parameters include optical power samples from the optical power meter, high-power pulsed light samples from the spectrometer, and multiple polarization state samples from the polarization controller.

[0037] Preferably, the testing equipment performs insertion loss, return loss, and polarization-dependent loss tests based on multiple preset test parameters. These preset test parameters include: an optical power sample from an optical power meter, which refers to the optical power reference value set by the optical power meter during measurement. This value is determined according to the specifications of the device under test and the testing requirements. For example, to measure the insertion loss of a device under different input optical powers, a corresponding optical power sample needs to be set; a high-power pulsed light sample from a spectral analyzer, which refers to the preset parameters for the emitted optical signal, including the power magnitude, pulse width, and repetition frequency of the optical pulse. A suitable high-power pulsed light sample can make the detection of the reflection spectrum more accurate; and multiple polarization state samples from a polarization controller, which refers to multiple preset polarization state parameters, such as the angle of the linear polarization state and the axial ratio and rotation direction of the elliptic polarization state, to test optical communication devices under different polarization states.

[0038] Furthermore, step S310 also includes step S311, generating an optical power sample for transmission; step S312, when the target optical communication device is sequentially docked and tested according to the plurality of docking test groups, the optical power meter tests the target optical communication device according to the optical power sample to obtain the input optical power and the output optical power; step S313, calculating the insertion loss according to the input optical power and the output optical power, and outputting the insertion loss test data.

[0039] Preferably, the optical power meter is used to measure the input / output optical power of the target optical communication device to test insertion loss, that is, to measure the power loss of the optical signal when passing through the device under test (DUT). Specifically, it generates an optical power sample for transmission. When the target optical communication device is sequentially tested according to multiple interfacing test groups, the optical power meter tests the target optical communication device based on the optical power sample to obtain the input and output optical power, including connecting the DUT to the optical path, ensuring the fiber end face is clean (using a dust-free wiping paper), turning on the light source to emit stable optical power, and measuring the input optical power P of the target optical communication device. in and output optical power P out Then according to the formula Calculate the insertion loss test data to reflect the degree of energy loss of light during transmission in the device, where TL represents the insertion loss value.

[0040] Further, step S310 further comprises step S314, generating a high-power pulsed light sample for emission; step S315, when the target optical communicator is tested according to the plurality of docking test groups in turn, switching the optical spectrum analyzer to an optical reflection measurement mode, and testing the target optical communicator based on the optical reflection measurement mode by the high-power pulsed light sample to obtain reflected light power; and step S316, calculating return loss according to the reflected light power and outputting return loss test data.

[0041] Preferably, the optical spectrum analyzer is used to detect a reflection spectrum to test return loss, i.e., to measure power loss of an optical signal in a transmission process due to reflection. Specifically, an optical source, a device under test (DUT) and an optical spectrum analyzer are connected in a specific order, appropriate parameters such as a measurement wavelength range (which needs to cover a working wavelength of the device under test), a scanning resolution, a number of averages (which can improve measurement stability) and the like are set on the optical spectrum analyzer, the optical source is turned on to generate a high-power pulsed light sample for emission (i.e., to emit a stable optical signal), the high-power pulsed light sample is injected into the device under test, when the target optical communicator is tested according to the plurality of docking test groups in turn, the optical spectrum analyzer is switched to an optical reflection measurement mode, and the target optical communicator is tested based on the optical reflection measurement mode by the high-power pulsed light sample to obtain reflected light power and analyze a reflection spectrum. The optical spectrum analyzer calculates a ratio of the reflected light power to incident light power according to the detected reflection spectrum data, and calculates return loss according to a return loss calculation formula to calculate return loss test data, where RL is a return loss value, P r is reflected light power, and P i is incident light power.

[0042] Further, step S310 further comprises step S317, setting a plurality of polarization state samples; step S318, when the target optical communicator is tested according to the plurality of docking test groups in turn, the polarization controller tests the target optical communicator according to the plurality of polarization state samples and records a plurality of output light powers corresponding to the plurality of polarization state samples; and step S319, calculating polarization-dependent loss according to the plurality of output light powers and outputting polarization-dependent loss test data.

[0043] Preferably, the polarization controller is used to adjust the polarization state to test the polarization dependent loss, and the devices are connected in the order of light source-polarization controller-device under test (DUT)-optical power meter, the light source is turned on, the output stable optical power and the appropriate wavelength (i.e. multiple polarization state samples) are set, the zero and calibration operations are performed on the optical power meter to ensure the accuracy of the measurement, and the polarization controller is used to test the target optical communication device according to the preset polarization state samples (such as different linear polarization angles, axial ratios and rotation directions of elliptical polarization, etc.) when the target optical communication device is tested according to multiple docking test groups in turn, and the corresponding multiple output optical powers under multiple polarization state samples are recorded, which specifically includes adjusting the polarization state of the optical signal input to the device under test in turn, i.e. the polarization controller (PC) is used to cyclically switch the polarization state (0°, 45°, 90° and 135°), the output optical power after the device under test is measured by the optical power meter and recorded after each polarization state is adjusted, and after all the preset polarization states are tested, the maximum output optical power P max and the minimum output optical power P min are found out, and the polarization dependent loss test data is calculated according to the formula , wherein PDL is the polarization dependent loss value.

[0044] Further, step S300 further includes step S320 of comparing the multiple sets of test data with multiple preset performance thresholds to obtain performance test results, wherein the performance test results include test qualified and test unqualified; step S330 of outputting a test unqualified result if any of the multiple sets of test data is not in the corresponding preset performance threshold; and step S340 of outputting a test qualified result if all the multiple sets of test data are in the multiple preset performance thresholds.

[0045] Preferably, in the reliability testing process of optical communication devices, after completing the insertion loss, return loss, and polarization-dependent loss tests, multiple sets of test datasets are obtained. Each set of datasets corresponds to a docking test group under specific preset test parameters for various test values. The preset performance thresholds are standard values ​​determined based on the quality standards of optical communication devices and actual application requirements. For different test items (insertion loss, return loss, and polarization-dependent loss), there are corresponding preset performance threshold ranges. Specifically, when comparing multiple sets of test datasets with multiple preset performance thresholds, if any test value in any set of test datasets (such as the insertion loss value in a set of datasets) is not within the preset performance threshold range corresponding to that test item, it indicates that the performance of the target optical communication device in this test scenario does not meet the requirements, and thus the test result is output as unqualified. Conversely, if all test values ​​(insertion loss, return loss, and polarization-dependent loss values) in all sets of test datasets are within their respective preset performance threshold ranges, it indicates that the performance of the target optical communication device meets the standards in all test scenarios, and the test result is output as qualified, thus clearly determining whether the optical communication device has passed the reliability test.

[0046] In the above text, refer to Figure 1 A reliability testing method for an optical communication device according to an embodiment of the present invention is described in detail. Next, reference will be made to... Figure 2 A reliability testing system for optical communication devices according to embodiments of the present invention is described.

[0047] The reliability testing system for optical communication devices according to embodiments of the present invention addresses the technical problem in the prior art where specific testing procedures for different components are required, thereby increasing testing complexity and leading to insufficient efficiency and accuracy in reliability testing. The system achieves the technical effect of improving the efficiency and accuracy of reliability testing. Figure 2 As shown, the reliability testing system for optical communication devices includes: a test equipment integration module 10, a docking test group acquisition module 20, and a performance test result acquisition module 30.

[0048] The test equipment integration module 10 is used for integrating test equipment, the test equipment includes an optical power meter, an optical spectrum analyzer and a polarization controller, and the optical power meter, the optical spectrum analyzer and the polarization controller are connected with an upper computer through a control interface; the docking test group obtaining module 20 is used for scanning a barcode of a target optical communication device, matching a plurality of connection devices for the target optical communication device, sequentially docking the target optical communication device and the plurality of connection devices, and obtaining a plurality of docking test groups; the performance test result obtaining module 30 is used for matching a plurality of preset test parameters corresponding to the plurality of docking test groups, and the test equipment sequentially performs insertion loss, return loss and polarization-dependent loss tests according to the plurality of preset test parameters, outputs a plurality of test data sets, compares the plurality of test data sets with a plurality of preset performance thresholds, and obtains performance test results.

[0049] In the following, the specific configuration of the performance test result obtaining module 30 will be described in detail. The performance test result obtaining module 30 further comprises: the test equipment performs insertion loss, return loss and polarization-dependent loss tests according to the plurality of preset test parameters; wherein the optical power meter included in the test equipment is used for measuring input / output optical power of the target optical communication device to test insertion loss, the optical spectrum analyzer is used for detecting reflected spectrum to test return loss, and the polarization controller is used for adjusting a polarization state to test polarization-dependent loss; the plurality of preset test parameters include optical power samples of the optical power meter, high-power pulse light samples of the optical spectrum analyzer, and a plurality of polarization state samples of the polarization controller.

[0050] In the following, the specific configuration of the performance test result obtaining module 30 will be described in detail. The performance test result obtaining module 30 further comprises: generating optical power samples for emission; when the target optical communication device is sequentially docked for testing according to the plurality of docking test groups, the optical power meter tests the target optical communication device according to the optical power samples to obtain input optical power and output optical power; calculating insertion loss according to the input optical power and the output optical power, and outputting insertion loss test data.

[0051] In the following, the specific configuration of the performance test result obtaining module 30 will be described in detail. The performance test result obtaining module 30 further comprises: generating high-power pulse light samples for emission; when the target optical communication device is sequentially docked for testing according to the plurality of docking test groups, the optical spectrum analyzer is switched to an optical reflectance measurement mode, and the target optical communication device is tested based on the high-power pulse light samples in the optical reflectance measurement mode to obtain reflected optical power; calculating return loss according to the reflected optical power, and outputting return loss test data.

[0052] Next, the specific configuration of the performance test result acquisition module 30 will be described in detail. The performance test result acquisition module 30 further comprises: setting a plurality of polarization state samples; when the target optical communication device is tested according to the plurality of docking test groups in turn, the polarization controller tests the target optical communication device according to the plurality of polarization state samples, and records a plurality of output optical powers corresponding to the plurality of polarization state samples; calculating polarization-dependent loss according to the plurality of output optical powers, and outputting polarization-dependent loss test data.

[0053] Next, the specific configuration of the docking test group acquisition module 20 will be described in detail. The docking test group acquisition module 20 further comprises: scanning the barcode of the target optical communication device to determine the device type of the target optical communication device; constructing a device connection relationship network by inputting a plurality of optical communication circuits, wherein the nodes in the device connection relationship network represent each device, and the edges represent the connection cumulative times of two devices; identifying a plurality of devices with connection weights greater than a preset connection weight in the device connection relationship network as the plurality of connection devices based on the device type, and outputting the plurality of connection devices.

[0054] Next, the specific configuration of the docking test group acquisition module 20 will be described in detail. The docking test group acquisition module 20 further comprises: sorting the plurality of connection devices according to the connection weight of the plurality of connection devices, and outputting a switching sequence table of the plurality of connection devices; setting the switching time of the adjacent two connection devices in the switching sequence table to be greater than a preset switching time.

[0055] Next, the specific configuration of the docking test group acquisition module 20 will be described in detail. The docking test group acquisition module 20 further comprises: comparing the plurality of test data sets with a plurality of preset performance thresholds to obtain performance test results, wherein the performance test results include test qualified and test unqualified; if any one of the plurality of test data sets is not in the corresponding preset performance threshold, outputting the result of test unqualified; if the plurality of test data sets are all in the plurality of preset performance thresholds, outputting the result of test qualified.

[0056] The optical communication device reliability test system provided by the embodiments of the present application can perform the optical communication device reliability test method provided by any embodiment of the present application, and has the corresponding function modules and beneficial effects of the execution method.

[0057] Although the present application makes various references to certain modules in the system according to the embodiments of the present application, however, any number of different modules can be used and run on the user terminal and / or the server, the various units and modules included are only divided according to the functional logic, but are not limited to the above division, as long as the corresponding functions can be realized; in addition, the specific name of each functional unit is only for the convenience of mutual differentiation, and is not used to limit the protection scope of the present application.

[0058] The above detailed description does not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A reliability testing method for optical communication devices, characterized in that, The method includes: An integrated testing device, comprising an optical power meter, a spectrometer, and a polarization controller, wherein the optical power meter, the spectrometer, and the polarization controller are connected to a host computer via a control interface; Scan the barcode of the target optical communication device, match multiple connectors for the target optical communication device, and connect the target optical communication device and the multiple connectors in sequence to obtain multiple docking test groups; The test equipment matches the multiple preset test parameters corresponding to the multiple docking test groups, and performs insertion loss, return loss and polarization-related loss tests in sequence according to the multiple preset test parameters, outputs multiple test datasets, and compares the multiple test datasets with multiple preset performance thresholds to obtain performance test results; Scanning the barcode of a target optical communication device and matching multiple connection devices to the target optical communication device, the method includes: Scan the barcode of the target optical communication device to determine the device type of the target optical communication device; The optical communication devices and their connections are collected from the optical communication system design documents and the actual network topology and entered into the test equipment to construct an optical communication device connection network. The nodes in the device connection network represent each device, the connection between two devices represents an edge, and the weight of the edge is set to the cumulative number of connections between the two devices. Based on the device type, multiple devices with connection weights greater than preset connection weights are identified in the device connection relationship network and output as the multiple connection devices.

2. The reliability testing method for optical communication devices as described in claim 1, characterized in that, The testing equipment performs insertion loss, return loss, and polarization-dependent loss tests based on the multiple preset test parameters. The testing equipment includes an optical power meter for measuring the input / output optical power of the target optical communication device to test insertion loss, a spectral analyzer for detecting the reflection spectrum to test return loss, and a polarization controller for adjusting the polarization state to test polarization-dependent loss. The multiple preset test parameters include optical power samples from the optical power meter, high-power pulsed light samples from the spectral analyzer, and multiple polarization state samples from the polarization controller.

3. The reliability testing method for optical communication devices as described in claim 2, characterized in that, The optical power meter is used to measure the input / output optical power of the target optical communication device to test insertion loss, and the method includes: Generate a sample of optical power for emission; When the target optical communication device is connected and tested sequentially according to the plurality of docking test groups, the optical power meter tests the target optical communication device according to the optical power sample to obtain the input optical power and output optical power; Insertion loss is calculated based on the input optical power and the output optical power, and the insertion loss test data is output.

4. The reliability testing method for optical communication devices as described in claim 2, characterized in that, The spectrometer is used to detect reflectance spectra to test return loss, and the method includes: Generate a high-power pulsed light sample for emission; When the target optical communication device is connected and tested sequentially according to the multiple docking test groups, the spectrum analyzer is switched to the light reflection measurement mode, and the target optical communication device is tested through the high-power pulsed light sample under the light reflection measurement mode to obtain the reflected light power; Calculate the return loss based on the reflected light power and output the return loss test data.

5. The reliability testing method for optical communication devices as described in claim 2, characterized in that, The polarization controller is used to adjust the polarization state to test polarization-dependent loss, and the method includes: Set multiple polarization state samples; When the target optical communication device is sequentially docked and tested according to the plurality of docking test groups, the polarization controller tests the target optical communication device according to the plurality of polarization state samples and records the plurality of output optical powers corresponding to the plurality of polarization state samples; The polarization-dependent loss is calculated based on the multiple output optical powers, and the polarization-dependent loss test data is output.

6. The reliability testing method for optical communication devices as described in claim 1, characterized in that, The method for sequentially connecting the target optical communication device to the plurality of connection devices includes: The multiple connection devices are sorted according to their connection weights, and a switching sequence table of the multiple connection devices is output. The switching time between two adjacent connected devices in the switching sequence table is set to be greater than a preset switching time.

7. The reliability testing method for optical communication devices as described in claim 1, characterized in that, The multiple sets of test datasets are compared with multiple preset performance thresholds to obtain performance test results, wherein the performance test results include test pass and test fail. If any of the multiple test datasets is not within the corresponding preset performance threshold, the test result will be output as unqualified. If all the test datasets are within the preset performance thresholds, the test result is output as qualified.

8. A reliability testing system for optical communication devices, characterized in that, The system is used to implement the reliability testing method for optical communication devices according to any one of claims 1 to 7, and the system comprises: The test equipment integration module is used to integrate test equipment, which includes an optical power meter, a spectrometer, and a polarization controller. The optical power meter, spectrometer, and polarization controller are connected to a host computer through a control interface. The docking test group acquisition module is used to scan the barcode of the target optical communication device, match multiple connecting devices for the target optical communication device, and dock the target optical communication device with the multiple connecting devices in sequence to obtain multiple docking test groups; The performance test result acquisition module is used to match multiple preset test parameters corresponding to the multiple docking test groups. The test equipment performs insertion loss, return loss and polarization-related loss tests in sequence according to the multiple preset test parameters, outputs multiple test datasets, and compares the multiple test datasets with multiple preset performance thresholds to obtain performance test results.

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