Defect display method and system and computer program product

Abstract

The invention provides a defect display method and system on a photovoltaic module and a computer program product, and relates to the field of photovoltaic technology. The defect display method provided by the invention comprises the following steps: acquiring defect positions of defect areas on each battery piece in a battery piece group string according to an EL image of the battery piece group string; dividing each battery piece on the photovoltaic module in the same mode to obtain a plurality of display blocks; acquiring defect statistics corresponding to each display block according to the defect position on each battery piece; and displaying the defect statistics of each display block in the plurality of display blocks through the display interface.

Description

Technical Field

[0001] This specification relates to the technical field of photovoltaic module cell detection, and particularly relates to a method, a system, and a computer program product for defect display of cells on a photovoltaic module. Background Art

[0002] A defect of a cell can be detected by an electroluminescence detection device, and the cause of a welding problem can be investigated based on the defect of the cell. However, the electroluminescence detection device can only process and analyze the electroluminescence EL image of a single cell each time, and cannot perform defect statistics on a batch of cell samples and analyze based on the statistical results. Since the defects of single cells are somewhat accidental, the defect analysis for a single cell may have limitations or biases in the analysis results. On the other hand, there may also be problems in the image processing and analysis of the electroluminescence detection device, such as the position of a defective solder joint being inaccurate and difficult to identify.

[0003] Therefore, some embodiments of this specification provide a method and a system that can perform defect statistics on the defects of multiple cells and display the results of the defect statistics. Summary of the Invention

[0004] One or more embodiments of this specification provide a method for displaying defects of a cell string on a photovoltaic module, including: obtaining the defect positions of the defect regions on each cell in the cell string according to the electroluminescence EL image of the cell string; dividing each cell on the photovoltaic module in the same manner to obtain a plurality of display blocks; obtaining the defect statistics corresponding to each display block according to the defect positions on each cell; and displaying the defect statistics of each display block among the plurality of display blocks through a display interface.

[0005] According to the method for displaying defects of a cell string on a photovoltaic module provided by one or more embodiments of this specification, dividing each cell on the photovoltaic module in the same manner to obtain a plurality of display blocks includes: obtaining the defect categories of the defect regions on each cell in the cell string according to the electroluminescence EL image of the cell string, where the defect categories include a first defect category and a second defect category; for the first defect category, dividing each cell on the photovoltaic module in the same first manner to obtain a plurality of first-type display blocks; for the second defect category, dividing each cell on the photovoltaic module in the same second manner to obtain a plurality of second-type display blocks; and displaying the defect statistics of each display block among the plurality of display blocks through a display interface includes: simultaneously displaying the defect statistics of each first-type display block among the plurality of first-type display blocks through the display interface, and displaying the defect statistics of each second-type display block among the plurality of second-type display blocks.

[0006] A method for displaying defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification. The first defect category includes false soldering or over soldering, and each first type of display block includes a solder joint; alternatively, the second defect category includes external force defects caused by external force application, and the multiple second type of display blocks are respectively 9 grids in a 3*3 divided nine-square grid.

[0007] A method for displaying defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification. Obtaining the defect positions of the defect areas on each cell in the cell string according to the electroluminescence (EL) image of the cell string includes: when it is determined that the defect category includes false soldering or over soldering, obtaining the center point and size of the defect area; obtaining the cell grid corresponding to the cell where the defect area is located, and the cell grid is multiple grids divided based on the solder joints of the cell; determining the grid positions of the defective solder joints included in the defect area according to the cell grid and the center point and size of the defect area.

[0008] A method for displaying defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification. Determining the grid positions of the defective solder joints included in the defect area according to the cell grid and the center point and size of the defect area includes: determining the grid positions of at least one solder joint whose distance from the center point of the defect area is less than a preset threshold and is covered by the defect area as the grid positions of the defective solder joints.

[0009] A method for displaying defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification. The preset threshold is not greater than the distance between adjacent two solder joints in the cell grid.

[0010] A method for displaying defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification. Wherein, the center point of the defect area is the center point of the minimum circumscribed rectangle of the defect area.

[0011] A method for displaying defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification. Wherein, obtaining the cell grid corresponding to the cell where the defect area is located includes: selecting the corresponding cell grid from the cell grid library according to the type of the cell where the defect area is located.

[0012] A method for displaying defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification. Obtaining the defect positions of the defect areas on each cell in the cell string according to the electroluminescence (EL) image of the cell string includes: when it is determined that the defect category is an external force defect caused by external force application, the defect position of the defect area is one of the grids in a 3*3 divided nine-square grid of the cell.

[0013] The method for displaying defects in a cell string of a photovoltaic module provided according to one or more embodiments of this specification displays the defect statistics of each of a plurality of display blocks through a display interface, including: displaying the total number of defects that occur on each of the plurality of display blocks through the display interface, or displaying the proportion of the number of defects that occur on each of the plurality of display blocks through the display interface.

[0014] The method for displaying defects in a cell string of a photovoltaic module provided according to one or more embodiments of this specification displays display blocks with different total numbers of defects or different proportions of the number of defects in different colors.

[0015] The method for displaying defects in a cell string of a photovoltaic module provided according to one or more embodiments of this specification further includes: when the defect statistics corresponding to one of the display blocks exceed a first preset value, sending an alarm message to the user; or calculating the total number of defects in a specific area of a cell based on the defect positions on each cell, and when the total number of defects in the specific area exceeds a second preset value, sending an alarm message to the user.

[0016] The method for displaying defects in a cell string of a photovoltaic module provided according to one or more embodiments of this specification, when the defect area is open circuit soldering or over soldering, the specific area is each main grid line on a single cell, or the same row on a single cell, or the entire cell; or, when the defect area is an external force defect caused by external force application, the specific area is a partial area on a single cell, or the entire cell.

[0017] The method for displaying defects in a cell string of a photovoltaic module provided according to one or more embodiments of this specification further includes: obtaining the defect causes of the defects on at least one display block; displaying the defect causes of at least one display block through the display interface.

[0018] One or more embodiments of this specification also provide a system for displaying defects in a cell string of a photovoltaic module, including: a first acquisition module for obtaining the defect positions of the defect areas on each cell in the cell string according to the electroluminescence (EL) image of the cell string; a division module for dividing each cell on the photovoltaic module in the same way to obtain a plurality of display blocks; a second acquisition module for obtaining the defect statistics corresponding to each display block according to the defect positions on each cell; a display module for displaying the defect statistics of each of the plurality of display blocks.

[0019] One or more embodiments of this specification also provide a computer program product, characterized by including a computer program, and when at least a part of the computer program is executed by a processor, it implements the method in any one of the above.

[0020] One or more embodiments of this specification provide a method for detecting defects in a cell string on a photovoltaic module, which includes: identifying a defect area on an electroluminescence (EL) image of the cell string; determining the defect category based on the defect area, and when it is determined that the defect category includes virtual soldering or over-soldering, obtaining the center point and size of the defect area; obtaining the cell grid corresponding to the cell where the defect area is located, and the cell grid is a plurality of grids divided based on the solder joints on the cell; determining the grid positions of the defective solder joints included in the defect area according to the cell grid and the center point and size of the defect area.

[0021] According to the method for detecting defects in a cell string on a photovoltaic module provided by one or more embodiments of this specification, where determining the grid positions of the defective solder joints included in the defect area according to the cell grid and the center point and size of the defect area includes: determining the grid positions of at least one solder joint whose distance from the center point of the defect area is less than a preset threshold and is covered by the defect area as the grid positions of the defective solder joints.

[0022] According to the method for detecting defects in a cell string on a photovoltaic module provided by one or more embodiments of this specification, where the preset threshold is not greater than the distance between adjacent solder joints in the cell grid.

[0023] According to the method for detecting defects in a cell string on a photovoltaic module provided by one or more embodiments of this specification, where the center point of the defect area is the center point of the minimum circumscribed rectangle of the defect area.

[0024] According to the method for detecting defects in a cell string on a photovoltaic module provided by one or more embodiments of this specification, where the method further includes: when it is determined that the defect category is an external force defect caused by external force application, obtaining the regional position of the external force defect on the cell, and the region is one of the grids in the nine-square grid obtained by dividing the cell where the defect area is located into 3*3.

[0025] According to the method for detecting defects in a cell string on a photovoltaic module provided by one or more embodiments of this specification, where before obtaining the cell grid corresponding to the cell where the defect area is located, it further includes: selecting the corresponding cell grid from the cell grid library according to the type of the cell where the defect area is located.

[0026] According to the method for detecting defects in a cell string on a photovoltaic module provided by one or more embodiments of this specification, where the method further includes: displaying the defect distribution of multiple cells through a display interface.

[0027] A method for detecting defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification, wherein each cell on the photovoltaic module is divided in the same manner to obtain a plurality of display blocks; the method further includes: obtaining defect statistics of multiple cells on each display block; and displaying the defect distribution of each cell through a display interface, including: displaying the defect statistics of multiple cells on each display block through the display interface.

[0028] A method for detecting defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification, wherein each display block includes at least one solder joint, or each display block is a region.

[0029] A method for detecting defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification, wherein each cell on the photovoltaic module is divided in the same first manner to obtain a plurality of first - type display blocks, and each cell on the photovoltaic module is divided in the same second manner to obtain a plurality of second - type display blocks; each first - type display block includes at least one solder joint, each second - type display block is a region; displaying the defect distribution of each cell through a display interface, including: simultaneously displaying the defect statistics of multiple cells in multiple first - type display blocks and the defect statistics in multiple second - type display blocks through the display interface.

[0030] A method for detecting defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification, wherein displaying the defect statistics of multiple cells on each display block through the display interface includes: displaying the total number of defects of multiple cells on each display block through the display interface, or displaying the proportion of the number of defects of multiple cells on each display block through the display interface.

[0031] A method for detecting defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification, wherein display blocks with different total numbers of defects or different proportions of defect numbers are displayed in different colors.

[0032] A method for detecting defects in a cell string on a photovoltaic module provided according to one or more embodiments of this specification, wherein the method further includes: obtaining the defect causes of defects on at least one display block; and displaying the defect causes of at least one display block through the display interface. Brief Description of the Drawings

[0033] This specification will be further described by way of exemplary embodiments, and these exemplary embodiments will be described in detail through the drawings. The same numbers in the drawings represent the same structures or steps.

[0034] Figure 1It is a schematic diagram of the application scenario of the method for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0035] Figure 2 It is a schematic flowchart of the method for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0036] Figure 3 It is a schematic flowchart of the method for obtaining a defect area of the method for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0037] Figure 4 It is a schematic diagram of defects of the first defect category of the method for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0038] Figure 5 It is a schematic diagram of the first type of display block of the method for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0039] Figure 6 It is a schematic diagram of defects of the second defect category of the method for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0040] Figure 7 It is a schematic diagram of the second type of display block of the method for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0041] Figure 8 It is a schematic flowchart of the method for displaying defects in a cell string on a photovoltaic module as shown in some other embodiments of this specification.

[0042] Figure 9 It is a schematic flowchart of the method for detecting defects in a cell string on a photovoltaic module as shown in some embodiments of this specification.

[0043] Figure 10 It is a schematic diagram of the structure of the system for displaying defects in a cell string on a photovoltaic module as shown in some embodiments of this specification. Detailed implementation manners

[0044] To more clearly illustrate the technical solutions of the embodiments of this specification, the embodiments will be introduced in detail below with reference to the accompanying drawings. Obviously, the content described below is some examples or embodiments of this specification. For those of ordinary skill in the art, without creative efforts, the technical solutions or means disclosed in this specification can also be applied to other scenarios according to these technical contents.

[0045] It should be understood that the "system", "device", "unit" and / or "module" used in this specification is a way to distinguish different components, elements, parts, sections or assemblies at different levels. However, if other words can achieve the same purpose, the said words can be replaced by other expressions.

[0046] Unless otherwise specified, the technical terms describing components, elements, etc. in this specification do not specifically refer to the singular number and may also include the plural. Generally speaking, terms such as "include" and "comprise" only imply the inclusion of the clearly identified steps, elements or components, and these steps, elements and components do not constitute an exclusive list. For example, the described method or device may also include other steps or components.

[0047] Flowcharts are used in this specification to illustrate the operation steps performed by the device or system of the relevant embodiments. However, unless otherwise specified, the order adopted when describing these steps should not be construed as a limitation on the order of step execution. A person of ordinary skill in the art can adjust the order of execution of these steps according to the knowledge and information conveyed by the embodiments of this specification. The said adjustments include, but are not limited to, swapping the sequence, merging multiple steps and splitting a certain step.

[0048] A photovoltaic cell is a thin photovoltaic semiconductor sheet that can directly generate electricity using sunlight. When it is irradiated by light that meets certain illumination conditions, it can output a voltage and generate a current in the presence of a circuit. In some embodiments, the photovoltaic cell may include a silicon wafer and metal grid lines. Among them, the metal grid lines may include main grids and fine grids (or called secondary grids). In some embodiments, when light irradiates the photovoltaic cell, photons are absorbed by the silicon wafer and generate photo-generated carriers (such as electron-hole pairs). The fine grids can collect the photo-generated carriers, and the main grids can collect the current of the fine grids and export the current from the photovoltaic cell for use by an external circuit.

[0049] In some embodiments, the voltage of a single photovoltaic cell is 0.4V - 0.7V, for example, about 0.5V. Since the voltage and current of a single cell are small, in some embodiments, multiple photovoltaic cells can be connected in series by a string welding machine to meet the actual application requirements. Exemplarily, a photovoltaic module can be connected in series with 36 / 54 / 60 / 72 / 96 cells, and correspondingly, the voltage can be about 18 / 27 / 30 / 36 / 48V.

[0050] With the improvement of the screen printing technology for photovoltaic cells, the number of main grids is also gradually increasing. In some embodiments, the number of main grids of multi-main-grid cells has iterated from 5 grids to 16 grids, effectively shortening the flow distance of current from the fine grid to the main grid, reducing power loss, and improving the power generation efficiency of photovoltaic modules. Correspondingly, when the string welding machine welds multi-main-grid cells, the welding mechanism in the internal solder tape area of the string welding machine (such as the mechanism for realizing the welding of the main grid and the fine grid) also increases with the increase in the number of main grids, which means an increase in the difficulty of troubleshooting welding problems. In some embodiments, during the welding process of multi-main-grid cells, each main grid of the cell can have up to 5 to 8 solder joints, and different abnormalities in the welding mechanism may lead to different defects and non-uniform distributions of the cell wafers.

[0051] In some embodiments, the defects of the cell wafers can be detected by an electroluminescence (EL) detection device, and the causes of welding problems can be investigated based on the defects of the cell wafers. In some embodiments, the EL detection device applies a forward current equal to or slightly higher than its short-circuit current (Isc) to the photovoltaic module or the photovoltaic cell wafer. This current will excite the electrons inside the cell wafer, causing them to jump to a higher energy level state and emit infrared light. In some embodiments, the EL detection device can be equipped with an image acquisition device for capturing this infrared light. Since different defect types will affect the intensity and pattern of the light emission, the electroluminescence EL image formed by capturing this infrared light can display the internal structure and defects of the cell wafer. In some embodiments, image processing and analysis techniques can be further used to process and analyze the electroluminescence EL image, so as to identify defects such as virtual soldering, over-soldering, broken wafers, hidden cracks, and scratches in the cell wafers.

[0052] However, in some related embodiments, the EL detection device can only process and analyze the electroluminescence EL image of a single cell wafer each time, and cannot perform defect statistics on a batch of cell wafer samples and analyze based on the statistical results. Due to the occasional nature of the defects in a single cell wafer, the defect analysis for a single cell wafer may have limitations or biases in the analysis results. On the other hand, in some related embodiments, there may also be problems with the inaccurate position and difficulty in identifying defective solder joints in the image processing and analysis of the EL detection device.

[0053] Therefore, some embodiments of this specification provide a method for displaying defects in a string of cell wafers on a photovoltaic module. In some examples, the defect display method of this specification shows the defect distribution law of multiple cell wafers by statistically analyzing the defects on the display blocks at the same position of multiple cell wafers, facilitating users to summarize problems and analyze reasons. In some examples, this specification also provides a more accurate method for identifying the positions of defective solder joints.

[0054] Figure 1 It is a schematic diagram of an application scenario of a method for displaying defects of a cell string on a photovoltaic module as shown in some embodiments of this specification. Figure 1 The cell string defect display system 100 on the photovoltaic module shown may include: an electroluminescence detection device 110, an EL image acquisition device 120, a processor 130, and a display device 140.

[0055] In some embodiments, the electroluminescence detection device 110 is used to perform electroluminescence detection on the cells 150 in the photovoltaic module or the cells 150 in the cell string. In some embodiments, the photovoltaic module may include a cell string. In some embodiments, the cell string may include cells 150 connected in series by welding or other means. In some embodiments, the electroluminescence detection device 110 can provide current to the cells 150 to excite the electrons inside the cells 150, causing them to jump to a high-energy state and emit infrared light. In some embodiments, the EL image acquisition device 120 is used to capture the infrared light, thereby obtaining the EL image corresponding to the cells 150. In some embodiments, the EL image can indicate defects of the cells 150 in the form of shadows, gray dots or blocks of different grayscales, black dots or blocks, etc. In some embodiments, the processor 130 processes and analyzes the EL image. In some embodiments, the display device 140 is used to display the processing results and analysis results of the processor 130. In some embodiments, the display device 140 may belong to the same device as the processor 130, or may be an external device separated from the processor 130.

[0056] In some embodiments, Figure 1 Data can be transmitted between the devices in the cell string defect display system 100 on the photovoltaic module shown through a wired or wireless network, specifically through one or more of the following networks: cable network, fiber optic network, telecommunications network, Internet, local area network (LAN), wide area network (WAN), wireless local area network (WLAN), metropolitan area network (MAN), public switched telephone network (PSTN), Bluetooth network, ZigBee network, near field communication (NFC), in-device bus, in-device line, cable connection, etc.

[0057] Figure 2 It is a schematic flowchart of a method for displaying defects of a cell string on a photovoltaic module as shown in some embodiments of this specification. In some embodiments, Figure 2 The flowchart 200 shown can be executed by a processing device, for example, can be implemented by the cell string defect display system 1000 deployed on the processing device. In some embodiments, the processing device can be a server device or a cloud device, for example Figure 1The processor 130 and / or the display device 140 shown. Refer to Figure 2 As shown, in some embodiments, process 200 may include the following steps.

[0058] Step 210, obtaining the defect positions of the defect regions on each cell in the cell string according to the electroluminescence (EL) image of the cell string. In some embodiments, step 210 may be implemented by the first acquisition module 1010.

[0059] In some embodiments, the photovoltaic module may include a cell string. In some embodiments, the cell string may include cells connected in series by welding or other means. In some embodiments, the electroluminescence (EL) image of the cell string may be an EL image obtained by performing electroluminescence detection on a plurality of cells 150 in the cell string by the electroluminescence detection device 110 and the EL image acquisition device 120.

[0060] In some embodiments, the defect region may be a region in the EL image that can prompt a worker that there is a defect somewhere on the cell. In some embodiments, the defect region may be a region in the EL image that does not match the EL image of a normal cell. Exemplarily, the defect region may be an abnormal shadow region, gray region, and / or black region, etc. in the EL image. Exemplarily, due to an abnormal increase in resistance that may be caused by a welding defect, the defect region with a welding defect may be displayed as a shadow region or a gray region in the EL image. Exemplarily, due to an open circuit that may be caused by external force damage, the defect region with an external force defect may be displayed as a black region in the EL image.

[0061] In some embodiments, the defect position may be the position where the defect region is located. In some embodiments, the defect position may be the defect feature coordinates corresponding to the defect region. In some embodiments, the defect feature coordinates may include the binary pixel coordinates of the defect contour. In some embodiments, the defect feature coordinates may further include the binary coordinates of the defect center point, etc.

[0062] In some embodiments, the EL image of the cell string may include the EL image of each cell in the cell string. In some embodiments, the defect positions of the defect regions on each cell are obtained according to the EL image of the cell string. Exemplarily, the defect position may be obtained based on the EL image by AI vision detection, for example, the defect feature coordinates based on the resolution of the EL image are output by AI vision detection.

[0063] In some related embodiments, the image analysis of the electroluminescence (EL) image of a battery string (hereinafter simply referred to as the EL image) can only tell the staff which battery cells in the battery string have defects, but cannot indicate which positions on the same battery cell have defects, nor can it prompt the number or size of the defects. The staff needs to observe the defective battery cells to determine the defect positions and defect categories, and rely on the personal experience of the staff to judge the defect causes that lead to such defects (for example, defects that may be caused by process problems, material problems, and / or equipment problems). Therefore, in some related embodiments, the image analysis of the EL image lacks guiding significance for the staff to judge and troubleshoot the defect causes.

[0064] During the production process, different technical problems and / or process problems correspondingly produce different defects, and the same technical problem or process problem often may produce the same or similar defects at the same position or adjacent positions of multiple battery cells. In order to understand the defect categories on each battery cell in the battery string and facilitate the staff to judge and troubleshoot the defect causes, the defect positions on multiple battery cells can be obtained and the defect positions can be statistically analyzed.

[0065] Figure 3 It is a schematic flowchart of a method for obtaining a defect area of a method for displaying defects in a battery string on a photovoltaic module according to some embodiments of this specification. In some embodiments, Figure 2 Step 210 in Figure 3 can be implemented according to the process 300 in

[0066] Step 310, when it is determined that the defect category includes open solder or over-solder, obtain the center point and size of the defect area.

[0067] In one or more embodiments of this specification, the defect area may be an area that shows a difference from the normal image in the EL image of the solder joint where defects such as open solder or over-solder occur. In some embodiments, open solder will produce, for example, the gray shadow shown in Figure 4 above, and the defect area may be the area where the gray shadow is located. In some embodiments, the existence of an open solder problem at a certain solder joint may cause the resistance at that solder joint to increase, resulting in a decrease in the current flux, thus showing the characteristic of a shadow in the electroluminescence (EL) image.

[0068] In some embodiments, the defective region can be of various shapes. In some embodiments, the defective region can also have an irregular boundary. In some embodiments, the defective region has a center point and a size. In some embodiments, the center point of the defective region can be the midpoint of a regular shape (such as the diagonal focus of a rectangle or an approximately rectangular shape, the center of a circle or an approximately circular shape, etc.) or the fitting center of an irregular shape. In some embodiments, the size of the defective region can be the area of the defective region, the contour line of the defective region, or the coverage range of the defective region.

[0069] Step 320, obtain the cell stencil corresponding to the cell where the defective region is located.

[0070] In some embodiments, according to the specifications, uses, and manufacturing processes of the cells, the cells can have different numbers of main grids and fine grids, and thus have different solder joint positions and numbers of solder joints. In some embodiments, a cell stencil library is established for each type of cell to store the cell stencil corresponding to that type of cell.

[0071] In some embodiments, obtaining the cell stencil corresponding to the cell where the defective region is located may include: selecting the corresponding cell stencil from the cell stencil library according to the type of the cell where the defective region is located.

[0072] In some embodiments, the cell stencil is a plurality of grids divided based on the solder joints of the cell. In some embodiments, the cell stencil has stencil information, and the stencil information includes all the solder joint positions corresponding to a certain type of cell. In some embodiments, the cell stencil of a certain type of cell includes a total of N solder joints from the first solder joint to the Nth solder joint, and the stencil information of this cell stencil can include all the x-axis coordinates and the corresponding y-axis coordinates of the first solder joint to the Nth solder joint.

[0073] In some embodiments, obtain the cell stencil corresponding to the cell where the defective region is located, for example, select the corresponding cell stencil from the cell stencil library according to the cell, so as to determine the grid position of the defective solder joint based on the coordinates of the solder joints included in the cell stencil, the center point coordinates of the defective region, and the size of the defective region (such as the coordinate point set of the contour of the defective region, etc.).

[0074] In some embodiments, before the production of a new work order, manually configure or automatically obtain the type of cell produced by the series EL deployment line body (such as a production line with cell EL detection) through an interface with an information system related to the work order such as the shop floor MES (Manufacturing Execution System), so as to apply the corresponding cell stencil based on the cell type.

[0075] Step 330, determine the grid position of the defective solder joints included in the defective region according to the cell stencil and the center point and size of the defective region.

[0076] In one or more embodiments of the present specification, the center point of the defective area provides the main location where the defect occurs, and the center point of the defective area may be related to the location of the defective solder joint with a defect. In some embodiments, the solder joint closest to the center point of the defective area may be the defective solder joint.

[0077] In some embodiments, the size of the defective area may reflect the number of solder joints with defects (i.e., defective solder joints). In some embodiments, the defective area may cover one or more solder joints. In some embodiments, based on the size of the defective area, it can be determined that one of the solder joints covered by the defective area may be a defective solder joint, or multiple solder joints covered by the defective area are defective solder joints, or all the solder joints covered by the defective area are defective solder joints.

[0078] In some embodiments, the defective solder joints among several solder joints of the cell stencil can be obtained based on the coordinates of the solder joints provided by the cell stencil, the center point of the defective area, and the size of the defective area. In some embodiments, the grid position corresponding to the defective solder joint can be obtained based on the coordinates of the defective solder joint, and then displayed through a corresponding display block (such as a first type of display block).

[0079] In one or more embodiments of the present specification, determining the grid position of the defective solder joint included in the defective area according to the cell stencil and the center point and size of the defective area may include: determining the grid position of at least one solder joint whose distance from the center point of the defective area is less than a preset threshold and is covered by the defective area as the grid position of the defective solder joint.

[0080] In some embodiments, the center point of the defective area indicates the possible defective solder joints among multiple solder joints of a certain cell. In some embodiments, defects such as shadows generated by the defective solder joints in the EL image extend outward around the defective solder joints. In some embodiments, in an ideal state, the center point of the defective area may coincide with the defective solder joint. In some embodiments, in an actual state, the defective area may be an irregular shape, and there may be a spacing between the center point of the defective area and the position of the defective solder joint. In some embodiments, in an actual state, there may also be multiple adjacent defective solder joints, resulting in the shadows formed by the multiple defective solder joints on the EL image being connected to form a larger defective area, that is, there is a situation where one defective area covers multiple solder joints.

[0081] In some embodiments, solder joints that are less than a preset threshold from the center point of the defective area and are covered by the defective area are determined as defective solder joints, and the grid position of this solder joint is determined as the grid position of the defective solder joint. In some embodiments, the defective area may cover multiple solder joints. The solder joints among the multiple solder joints that are less than the preset threshold from the center point of the defective area are determined as defective solder joints, and the grid position of this solder joint is determined as the grid position of the defective solder joint. Exemplarily, the defective area covers solder joint a1, solder joint a2, and solder joint a3. Among them, the distance between solder joint a1 and the center point of the defective area is less than the preset threshold, the distance between solder joint a2 and the center point of the defective area is less than the preset threshold, and the distance between solder joint a3 and the center point of the defective area is greater than the preset threshold. Then, solder joint a1 and solder joint a2 are determined as defective solder joints, and the grid positions of solder joint a1 and solder joint a2 are determined as the grid positions of the defective solder joints, and are subsequently displayed through corresponding display blocks.

[0082] In some embodiments, the preset threshold is not greater than the spacing between two adjacent solder joints in the cell screen printing stencil. Exemplarily, the solder joint spacing of a certain N-type TOPCon cell can be 1.5 - 2 mm, and the preset threshold can be a value less than 1.5 mm, such as 1 - 1.45 mm. Exemplarily, the solder joint spacing of a certain high-efficiency PERC cell (a cell with a specification of 156 mm × 156 mm) can be 2.5 - 3.5 mm, and the value range of the preset threshold can be 2.2 - 2.5 mm.

[0083] In some embodiments, the center point of the defective area can be the center point of the minimum circumscribed rectangle of the defective area. In some embodiments, the center point of the defective area can be the center point of the rectangle that contains or covers the defective area and has the smallest area, such as the intersection point of the diagonals of this rectangle.

[0084] In one or more embodiments of this specification, determining the grid position of the defective solder joints included in the defective area according to the cell screen printing stencil and the center point and size of the defective area may include: when the size of the defective area is less than the preset defective area size, determining the grid position of the solder joint that is closest to the center point of the defective area and is covered by the defective area as the grid position of the defective solder joint.

[0085] In some embodiments, taking the size of the first defective area being less than the preset defective area size as an example (for example, the area of the first defective area is less than the preset defective area area, or the area of the minimum circumscribed rectangle of the first defective area is less than the preset minimum circumscribed rectangle area, etc.), it can be considered that a single solder joint may be defective. Then, it is determined that the solder joint closest to the center point of the defective area may have a soldering defect problem. This solder joint is determined as the defective solder joint, and the grid position corresponding to this solder joint is determined as the grid position of the defective solder joint, and is subsequently displayed through the corresponding first type of display block.

[0086] In one or more embodiments of the present specification, determining the grid positions of defective solder joints included in a defective area based on the cell stencil, and the center point and size of the defective area may include: when the size of the defective area is greater than a preset defective area size, based on the size of the defective area, determining the grid positions of a plurality of solder joints that are close to the center point of the defective area and covered by the defective area as the grid positions of the defective solder joints.

[0087] In some embodiments, taking the size of the second defective area being greater than the preset defective area size as an example, it can be considered that more than one solder joint may be defective. For example, if the second defective area covers two solder joints, it is determined that these two solder joints may be defective, these two solder joints are determined as defective solder joints, and the grid positions corresponding to these two solder joints are determined as the grid positions of the defective solder joints, and subsequently, they are correspondingly displayed through two first - type display blocks corresponding to the two solder joints.

[0088] In some embodiments, taking the size of the third defective area being greater than the preset defective area size and less than twice the preset defective area size as an example, it can be considered that no more than two solder joints may be defective. For example, if the third defective area covers three solder joints, it is determined that the two solder joints closest and next - closest to the center point of the third defective area may be defective, these two solder joints are determined as defective solder joints, and the grid positions corresponding to these two solder joints are determined as the grid positions of the defective solder joints, and subsequently, they are correspondingly displayed through two first - type display blocks corresponding to the two solder joints.

[0089] Step 220: Divide each cell on the photovoltaic module in the same way to obtain a plurality of display blocks. In some embodiments, step 220 may be implemented by the dividing module 1020.

[0090] In some embodiments, a photovoltaic module may include a plurality of cells, and each of the cells is divided in the same manner to obtain one or more display blocks. In some embodiments, a display block may refer to one or more regions obtained by dividing a cell. In some embodiments, the cell may be meshed to obtain one or more display blocks, so as to identify and count the defect positions based on the grid formed by the display blocks, and further facilitate the user to judge the cause of the corresponding defect according to the occurrence frequency of the defect positions of multiple cells. In some embodiments, the manner of dividing the cell may be based on the defect category. In some embodiments, the defect category may include welding defects and external force defects. In some embodiments, the defect category may also include other defects other than welding defects and external force defects. In some embodiments, welding defects may include insufficient soldering, over-soldering, etc. In some embodiments, external force defects may be caused by external force damage, such as broken pieces, hidden cracks, scratches, etc. Exemplarily, the number and size of the display blocks formed by dividing the cell may be adjusted based on the defect category, so as to obtain a grid size suitable for this type of defect category. In some embodiments, the number of display blocks may be multiple. In other embodiments, the number of display blocks may also be one.

[0091] In one or more embodiments of this specification, dividing each of the cells on the photovoltaic module in the same manner to obtain a plurality of display blocks may include: obtaining the defect category of the defect area on each cell in the cell string according to the electroluminescence (EL) image of the cell string, and the defect category may include a first defect category. For the first defect category, each of the cells on the photovoltaic module is divided in the same first manner to obtain a plurality of first-type display blocks.

[0092] In one or more embodiments of this specification, the first defect category may include insufficient soldering or over-soldering. In some embodiments, the first defect category may be related to the soldering state of the solder joints. In some embodiments, each first-type display block may include one solder joint, so that each first-type display block can display the state of its corresponding solder joint, such as whether there is a defect in a certain solder joint on the cell corresponding to the first-type display block. Exemplarily, it may display yes or no, or it may also display 0 or 1, etc. In some embodiments, each first-type display block may include a plurality of solder joints, so that each first-type display block can display the state of its corresponding plurality of solder joints, such as whether there are defects in a plurality of solder joints in a certain area on the cell corresponding to the first-type display block or the number of existing defects. Exemplarily, it may display yes or no, or it may also display a specific defect quantity value such as 0, 2, 3, 5, etc.

[0093] Figure 4It is a schematic diagram of defects of the first defect category of the method for displaying cell string defects on a photovoltaic module shown in some embodiments of this specification. In some embodiments, a virtual solder joint appears as a gray shadow in the electroluminescence (EL) image of the cell string. Refer to Figure 4 as shown in Figure 4 The shaded part in

[0094] shows multiple solder joints where virtual soldering problems may exist. In one or more embodiments of this specification, for the first defect category (such as virtual soldering or over-soldering), each cell on the photovoltaic module is divided in the same first manner to obtain multiple first-type display blocks. In some embodiments, the first manner may include having each first-type display block cover one solder joint, so that a certain first-type display block can display whether there is a defect in its corresponding solder joint.

[0095] In one or more embodiments of this specification, dividing each cell on the photovoltaic module in the same manner to obtain multiple display blocks may include: obtaining the defect category of the defect area on each cell in the cell string according to the electroluminescence (EL) image of the cell string. The defect category may include a second defect category. For the second defect category, each cell on the photovoltaic module is divided in the same second manner to obtain multiple second-type display blocks.

[0096] In one or more embodiments of this specification, the second defect category may include external force defects caused by external force application, such as broken pieces, hidden cracks, scratches, etc.

[0097] Figure 6 It is a schematic diagram of defects of the second defect category of the method for displaying cell string defects on a photovoltaic module shown in some embodiments of this specification. Refer to Figure 6 as shown in Figure 6 The vertical shaded part in

[0098] shows multiple areas where scratching problems may exist. In some embodiments, for the second defect category, each cell on the photovoltaic module is divided in the same second manner to obtain multiple second-type display blocks. In some embodiments, the second defect category may be related to the device action area or collision area of the relevant device on the cell during the production, detection, and transportation of the cell, such as related to the clamping position of the fixture or the suction position of the suction cup. In some embodiments, the second manner may include having each second-type display block cover one device action area.

[0099] Exemplarily, when a four-suction-cup transfer device is used to transfer the cells, each cell can be divided into four areas in the same manner, and each area corresponds to the position of one suction cup respectively.

[0100] Exemplarily, considering the possibility of edge collision of the battery cells, in the embodiment of transporting the battery cells by the four-suction-cup transfer device, each battery cell can be further divided into four central regions and several regions on the edge surrounding the four regions.

[0101] Exemplarily, each battery cell can be divided into 9 grids in a 3*3 grid obtained in the same manner. Figure 7 It is a schematic diagram of the second type of display block of the method for displaying defects in a battery cell string on a photovoltaic module according to some embodiments of this specification. Refer to Figure 7 As shown, in some embodiments, multiple second type of display blocks can be respectively 9 grids in a 3*3 grid obtained by division.

[0102] Step 230, obtain the defect statistics corresponding to each display block according to the defect positions on each battery cell. In some embodiments, step 230 can be implemented by the second acquisition module 1030.

[0103] In some embodiments, defect statistics are performed based on the divided display blocks. In some embodiments, defect statistics can include, among multiple battery cells, counting the number of defects generated in the divided regions of the battery cells corresponding to each display block (for example, counting the data in an accumulative manner). Exemplarily, a series of battery cells (for example, multiple battery cells required in a certain photovoltaic module or multiple battery cells involved in a certain battery cell string) can be divided into four display blocks (for example, the first display block, the second display block, the third display block, and the fourth display block). In some embodiments, for example, if there are defects in the regions corresponding to the first display block and the third display block of the first battery cell, the defect statistics count of the first display block is 1, and the defect statistics count of the third display block is 1; for example, if there are defects in the regions corresponding to the first display block and the third display block of the first battery cell and there are defects in the regions corresponding to the first display block and the second display block of the second battery cell, the defect statistics count of the first display block is 2, the defect statistics count of the second display block is 1, and the defect statistics count of the third display block is 1; for example, if there are defects in the regions corresponding to the first display block and the third display block of the first battery cell, there are defects in the regions corresponding to the first display block and the second display block of the second battery cell, and at the same time, there are defects in the regions corresponding to the first display block, the third display block, and the fourth display block of the third battery cell, the defect statistics count of the first display block is 3, the defect statistics count of the second display block is 1, the defect statistics count of the third display block is 2, and the defect statistics count of the fourth display block is 1. In some embodiments, the defect positions are identified based on the EL image, the defect positions are corresponded to the display blocks, and data statistics are performed.

[0104] In some embodiments, through defect statistics, the frequency of the defect positions of multiple solar cells with defects can be provided to the staff, that is, the number of defects occurring at a certain position of the solar cell, thereby helping the staff to judge the cause of the defects. Exemplarily, if there are defects at the same position in multiple solar cells, the staff can judge that there may be abnormalities in the relevant equipment (such as the welding equipment at this position or the transfer equipment contacting this position, etc.) during the production of the solar cell.

[0105] Step 240, display the defect statistics of each of the multiple display blocks through the display interface. In some embodiments, step 240 can be implemented by the display module 1040.

[0106] In some embodiments, the display interface can display the positions of the display blocks containing defects in a single solar cell. In some embodiments, the display interface can display the positions of the display blocks containing defects in multiple solar cells and the number of solar cells with defects at the corresponding positions. In some embodiments, the display interface can also display the total number of defective display blocks in a certain row and / or a certain column among the divided multiple display blocks.

[0107] Figure 5 is a schematic diagram of the first type of display blocks of the method for displaying defects in a solar cell string on a photovoltaic module shown in some embodiments of the present specification. Refer to Figure 5 as shown, Figure 5 the display blocks in the second column to the seventh column from the left in are the first type of display blocks, which are used to display the states of the multiple first type of display blocks obtained by dividing a certain solar cell with the first type of defect category in a first manner. In Figure 5 the first type of display blocks shown in, the light-colored display blocks without digital marks are the first type of display blocks with no defects at the corresponding solder joints; the dark-colored display blocks with digital marks (such as the digital mark 1 in the figure) are the first type of display blocks with the first type of defects at the corresponding solder joints.

[0108] In one or more embodiments of the present specification, displaying the defect statistics of each of the multiple display blocks through the display interface may include: simultaneously displaying the defect statistics of each of the multiple first type of display blocks through the display interface.

[0109] In some embodiments, the display interface can simultaneously show multiple first type of display blocks of a solar cell. In some embodiments, the defect statistics of the corresponding positions can be shown on the first type of display blocks shown in the display interface in the form of digital marks. In some embodiments, the display interface can also provide one or more statistical display blocks for statistically accumulating the data of the defects in a certain row or a certain column.

[0110] Refer to Figure 5 as shown, Figure 5The display block in the leftmost first column in [description] is a statistical display block. In some embodiments, the statistical display block can be used to display the cumulative data of the first type of defects existing in the first type of display blocks in the same row of multiple solar cells, so as to help the user judge the possible equipment reasons for the defects. Exemplarily, Figure 5 The statistical display block in the eighth row in [description] shows that the cumulative data is 60, that is, the total number of the first type of defects appearing in all solder joints in the eighth row of multiple solar cells is 60. Exemplarily, Figure 5 The statistical display block in the eleventh row in [description] shows that the cumulative data is 24, that is, the total number of the first type of defects appearing in all solder joints in the eleventh row of multiple solar cells is 24.

[0111] In one or more embodiments of this specification, obtaining the defect positions of the defect areas on each solar cell in a solar cell string according to the electroluminescence (EL) image of the solar cell string may include: when it is determined that the defect category is an external force defect caused by external force application, the defect position of the defect area may be one of the grids in the nine-square grid obtained by dividing the solar cell into 3*3.

[0112] In one or more embodiments of this specification, displaying the defect statistics of each display block in multiple display blocks through a display interface may include: simultaneously displaying the defect statistics of each second type of display block in multiple second type of display blocks through the display interface.

[0113] In some embodiments, the display interface can simultaneously show multiple second type of display blocks of a solar cell. In some embodiments, the defect statistics corresponding to the positions can be displayed in the form of numerical marks on the second type of display blocks shown on the display interface. In some embodiments, the defect statistics may include displaying the cumulative data of the defects occurring at the corresponding positions on the corresponding second type of display blocks.

[0114] Exemplarily, Figure 7 The cumulative data of the second type of defects shown in the second type of display block in the first row and the first column from the left in [description] is 1, and the cumulative data of the second type of defects shown in the second type of display block in the third row and the first column from the left is 1. In some embodiments, a relatively small cumulative data quantity can guide the user or the AI model to judge that the defect is an occasional defect. Exemplarily, Figure 6 There is no data statistics for the second type of display block in the second row and the first column from the left in [description], and it can be considered that no defects such as hidden cracks and scratches occur at this position in multiple solar cells, and the equipment debugging situation at the relevant position is better. Exemplarily, Figure 6The cumulative data of the second type of defects shown in the second display block in the first row from the left is 60, and the cumulative data of the second type of defects shown in the second display block in the third row from the left is 60. In some embodiments, a relatively large cumulative data can guide a user or an AI model to determine that the defect is a permanent defect rather than an occasional defect. To overcome this permanent defect, it is necessary to adjust the equipment at relevant positions (such as suction cups at the positions of the second column in the first row and the second column in the third row) so that the subsequent produced battery wafers may no longer have this defect.

[0115] In one or more embodiments of this specification, presenting the defect statistics of each of the multiple display blocks through a display interface may include: presenting the defect statistics of each of the multiple first-type display blocks through the display interface simultaneously, and presenting the defect statistics of each of the multiple second-type display blocks through the display interface simultaneously.

[0116] In some embodiments, the display interface may simultaneously display two or more types of display blocks. In some embodiments, different types of display blocks may be displayed in partitions. In some embodiments, the display interface may include a first area for displaying multiple first-type display blocks and a second area for displaying second-type display blocks.

[0117] In one or more embodiments of this specification, presenting the defect statistics of each of the multiple display blocks through a display interface may include: presenting, through the display interface, the total number of defects that occur on each of the multiple display blocks (such as the cumulative data of the aforementioned defects), or presenting, through the display interface, the proportion of the number of defects that occur on each of the multiple display blocks (such as the ratio of the cumulative data of the defects to the total number of battery wafers).

[0118] In some embodiments, display blocks with different total numbers of defects or different proportions of the number of defects may be displayed in different colors.

[0119] In some embodiments, the magnitude of the total number of defects or the magnitude of the ratio of the number of defects may be related to the shade of the color of the display block. Exemplarily, display blocks with a total number of defects or a ratio of the number of defects less than a first preset value may be displayed in light yellow, display blocks with a total number of defects or a ratio of the number of defects greater than the first preset value and less than a second preset value may be displayed in bright yellow, and display blocks with a total number of defects or a ratio of the number of defects greater than the second preset value may be displayed in dark yellow.

[0120] In some embodiments, the magnitude of the total number of defects or the magnitude of the defect quantity ratio may be related to the color temperature of the color of the display block. Exemplarily, a smaller total number of defects or a smaller defect quantity ratio may be displayed with a higher color temperature value (e.g., bluish), and a larger total number of defects or a larger defect quantity ratio may be displayed with a lower color temperature value (e.g., reddish).

[0121] In some embodiments, the magnitude of the total number of defects or the magnitude of the defect quantity ratio may be related to the hue of the color of the display block. Exemplarily, a smaller total number of defects or a smaller defect quantity ratio may be displayed with a cool hue, and a larger total number of defects or a larger defect quantity ratio may be displayed with a warm hue.

[0122] In one or more embodiments of the present specification, in steps 220 to 240, each cell in the photovoltaic module or the cell string is divided in the same manner to obtain one or more display blocks, various defect statistics corresponding to each display block are obtained according to the defect positions on each cell, and the various defect statistics of each display block among the multiple display blocks are displayed through a display interface.

[0123] Exemplarily, the cells in the photovoltaic module or the cell string are divided according to the solder joint positions of the cells to obtain multiple display blocks, where each display block may include one solder joint. Defect statistics of welding defects (such as poor soldering, over-soldering, etc.) corresponding to each display block are obtained according to the defect positions on the cells, and defect statistics of external force defects (such as broken pieces, hidden cracks, scratches, etc.) corresponding to each display block are obtained according to the defect positions on the cells. The defect statistics of the welding defects and the external force defects of each display block among the multiple display blocks are displayed through a display interface. In some embodiments, the first data and the second data are displayed in each display block through the display interface, where the first data is the defect statistics of the welding defects and the second data is the defect statistics of the external force defects. In some embodiments, the third data is displayed in each display block through the display interface, where the third data is the sum of the defect statistics of the welding defects and the defect statistics of the external force defects.

[0124] Exemplarily, the cells in the photovoltaic module or the cell string are divided into multiple display blocks with a 12*16 division. Defect statistics of welding defects corresponding to each display block are obtained according to the defect positions on the cells, and defect statistics of external force defects corresponding to each display block are obtained according to the defect positions on the cells. The defect statistics of the welding defects and the external force defects of each display block among the multiple display blocks are displayed through a display interface.

[0125] In one or more embodiments of the present specification, in steps 220 to 240, each cell in the photovoltaic module or the cell string is divided in the same manner to obtain one or more display blocks. According to the defect positions on each cell, the defect statistics corresponding to a certain type of defect for each display block are obtained, and the defect statistics of a certain type of defect for each display block among the multiple display blocks are displayed through a display interface.

[0126] Exemplarily, the cell is divided to obtain multiple display blocks. According to the defect positions on the cell, the defect statistics of the welding defects corresponding to each display block are obtained, and the defect statistics of the welding defects of each display block among the multiple display blocks are displayed through a display interface. Or, the cell is divided to obtain multiple display blocks. According to the defect positions on the cell, the defect statistics of the external force defects corresponding to each display block are obtained, and the defect statistics of the external force defects of each display block among the multiple display blocks are displayed through a display interface.

[0127] In one or more embodiments of the present specification, in steps 220 to 240, each cell in the photovoltaic module or the cell string is divided in the same manner to obtain one or more display blocks; according to the defect positions on each cell, the defect statistics corresponding to one or more types of defects are obtained for each display block, where the types of defects may include welding defects and external force defects, and may also include other types of defects; and the total defect statistics corresponding to each display block among the multiple display blocks are displayed through a display interface, or the defect statistics corresponding to each display block among the multiple display blocks are displayed through the display interface based on the user's selection.

[0128] In some embodiments, dividing each cell in the photovoltaic module or the cell string in the same manner to obtain one or more display blocks may include: dividing each cell in the photovoltaic module or the cell string in the same manner based on the user's selection (for example, based on the type of defect to be displayed selected by the user) to obtain one or more display blocks.

[0129] In some embodiments, displaying the defect statistics corresponding to each display block among the multiple display blocks through the display interface based on the user's selection may include: displaying the total defect statistics corresponding to each display block through the display interface based on the user's selection.

[0130] In some embodiments, displaying the defect statistics corresponding to each display block among the multiple display blocks through the display interface based on the user's selection may include: displaying the defect statistics of one or several types of defects selected by the user corresponding to each display block through the display based on the user's selection.

[0131] Figure 8 It is a schematic flowchart of a method for displaying defects in a cell string on a photovoltaic module shown in some other embodiments of the present specification. Refer toFigure 8 As shown, in one or more embodiments of this specification, process 800 may include the following steps.

[0132] Step 810: Obtain the defect positions of the defect areas on each cell in the cell string according to the electroluminescence (EL) image of the cell string.

[0133] Step 820: Divide each cell on the photovoltaic module in the same way to obtain a plurality of display blocks.

[0134] Step 830: Obtain the defect statistics corresponding to each display block according to the defect positions on each cell.

[0135] Step 840: Display the defect statistics of each display block among the plurality of display blocks through a display interface.

[0136] In some embodiments, the detailed descriptions of steps 810, 820, 830, and 840 can be found in the related descriptions of steps 210, 220, 230, and 240, and will not be elaborated here.

[0137] Step 850: When the defect statistics corresponding to one of the display blocks exceed a first preset value, send an alarm message to the user. In some embodiments, step 850 is an optional step.

[0138] In some production scenarios, cells are continuously produced on a production line, and during the continuous production process, the processing actions of each cell are the same. In some cases, there may be a small number of cells (e.g., 2 cells) with the same type of defect (e.g., there is a problem of false soldering) among a large number of cells (e.g., 1000 cells). In this case, the problem of false soldering may be caused by accidental reasons, is not representative, and it is difficult to solve the problem through one investigation. In some cases, there may be multiple cells (more than the first preset value, or not exceeding the first preset value but continuously having problems) among a large number of cells with the same type of defect (e.g., there is a problem of false soldering at a certain position). In this case, the defects may be homogenized, and an alarm message is sent to the user to prompt the user to conduct an investigation to solve the problem. In some cases, when the defective ratio of the cells (e.g., the ratio of the number of defects) exceeds a preset value of the defective ratio (e.g., 8% to 12%), the high defective ratio indicates that the defects may be homogenized, and an alarm message is sent to the user to prompt the user to conduct an investigation to solve the problem.

[0139] Step 860: Calculate the total number of defects in a specific area of the cell according to the defect positions on each cell. When the total number of defects in the specific area exceeds a second preset value, send an alarm message to the user. In some embodiments, step 860 is an optional step.

[0140] In some embodiments, a specific area may include multiple display blocks. When the sum of the defect statistics corresponding to the multiple display blocks exceeds a second preset value, an alarm message is sent to the user.

[0141] In some embodiments, when the defective area is a solder joint void or over-soldering, the specific area may be each main grid line on a single solar cell, or the same row on a single solar cell, or the entire solar cell.

[0142] In some embodiments, when the defective area is an external force defect caused by the application of an external force, the specific area may be a partial area on a single solar cell, or the entire solar cell.

[0143] Step 870, obtain the defect cause of the defect on at least one display block. In some embodiments, step 870 is an optional step.

[0144] In some embodiments, obtaining the defect cause of the defect on at least one display block may include: obtaining the defect cause of the defect on the one display block based on the defect statistics corresponding to the one display block. For example, obtaining the defect cause of the defect on display block A based on the defect statistics corresponding to display block A.

[0145] In some embodiments, obtaining the defect cause of the defect on at least one display block may include: obtaining the defect cause of the defect on one of the multiple display blocks based on the defect statistics corresponding to multiple display blocks (such as one display block and several display blocks around the one display block). For example, obtaining the defect cause of the defect on display block B based on the defect statistics corresponding to display block B and the eight display blocks around display block B, or for example, obtaining the defect cause of the defect on display block C based on the defect statistics corresponding to display block C and the display blocks in the same row and / or the same column as display block C.

[0146] In some embodiments, obtaining the defect cause of the defect on at least one display block may include: obtaining the defect cause of the defect on one display block based on the defect statistics, the size of the defect, the location of the defect, and / or the morphology of the defect corresponding to one or more display blocks.

[0147] In some embodiments, based on Figure 2The defect statistics corresponding to each display block obtained in step 230 can be used as the input of the attribution module of the PV module string soldering knowledge base. In some embodiments, the PV module string soldering knowledge base may include the relevant abnormal data of the defect area shown in the EL image and the defect names corresponding to the relevant abnormal data, so as to obtain the defect names based on data such as the size, position, and shape of the defects shown in the EL image. In some embodiments, the PV module string soldering knowledge base may further include one or more defect causes associated with the defect names. In some embodiments, the PV module string soldering knowledge base may further include one or more defect handling methods corresponding to the defect causes. In some embodiments, the attribution module is used to obtain possible defect names based on the defect statistics and defect-related information (such as data on the size, position, shape, etc. of the defects). In some embodiments, the attribution module may further obtain the defect causes associated with the defect names and the corresponding defect handling methods based on the defect names. In some embodiments, the eligible defect names and the possible causes of such defects are screened and matched by the attribution module of the PV module string soldering knowledge base.

[0148] In some embodiments, taking the case of a loose solder joint at the starting point of soldering as an example, the causes of the defect that all the starting points of the main grids of the cell have loose solder joints and the defect that the starting point of a single main grid of the cell has a loose solder joint are different. In some embodiments, the cause of the defect that the starting point of the main grid at the relatively middle position of the cell has a loose solder joint has additional causes compared to the defect that the starting point of the main grid closer to the edge of the cell has a loose solder joint. Exemplarily, the causes of the defect that the starting point of the main grid at the relatively middle position of the cell has a loose solder joint may include cause a and cause b, while the causes of the defect that the starting point of the main grid closer to the edge of the cell has a loose solder joint may include cause a, cause b, and cause c. In some embodiments, the attribution module of the PV module string soldering knowledge base can obtain the defect causes corresponding to the defects and adjust the weight changes of the defect causes according to the workshop historical data or the single-machine historical data. In some embodiments, the workshop historical data may be the historical data of all devices (such as string soldering machines, detection devices, transfer devices, etc.) in multiple production lines included in the entire workshop. In some embodiments, the single-machine historical data may be the historical data of a certain device (such as a certain string soldering machine) in a certain production line. In some embodiments, the historical data may include the location, cause, repair records, etc. of the corresponding device when a failure occurs.

[0149] Step 880, display the defect causes of at least one display block through a display interface. In some embodiments, step 880 is an optional step.

[0150] In some embodiments, the display interface may display the defect causes of one or more display blocks. In some embodiments, the display interface may further display the weights corresponding to the defect causes. In some embodiments, the display interface may display the defect names of one or more display blocks and the defect causes corresponding to the defect names.

[0151] Exemplarily, the display interface may display that the defect name of a certain display block is: overall solder joint of starting soldering point is not welded firmly. Exemplarily, the display interface may display that the defect causes corresponding to the defect name include: abnormal placement position of the tooling, insufficient concentration of the soldering flux, failure of the first row of lamp tubes, long downtime, insufficient temperature of the lamp box, the traction being impacted, exactly the head being offset, when the traction releases the soldering tape, the lower position is too much and rubs against the soldering tape, resulting in the soldering tape being placed offset, etc.

[0152] Exemplarily, the display interface may further display the defect causes and the corresponding weights as follows.

[0153] a. Abnormal placement position of the tooling - probability 70%.

[0154] b. Insufficient concentration of the soldering flux - probability 15%.

[0155] c. Failure of the first row of lamp tubes (remaining 20% of the lamp tube service life) - probability 10%.

[0156] d. Long downtime, insufficient temperature of the lamp box - probability 7% (not long downtime).

[0157] e. The traction being impacted, exactly the head being offset (triggered by continuous N defective pieces) - probability 1.5%.

[0158] f. When the traction releases the soldering tape, the lower position is too much and rubs against the soldering tape, resulting in the soldering tape being placed offset (triggered by continuous N defective pieces) - probability 1.5%.

[0159] Figure 9 is a schematic flow diagram of a method for detecting defects in a battery string on a photovoltaic module according to some embodiments of the present specification. The method for detecting defects in a battery string on a photovoltaic module can obtain the defect positions, and further obtain the above-mentioned defect statistics. Refer to Figure 9 As shown, in one or more embodiments of the present specification, process 900 may include the following steps.

[0160] Step 910, identify the defect area on the EL image according to the electroluminescence EL image of the battery string.

[0161] In some embodiments, Figure 9 step 910 in Figure 2 is similar to step 210 in

[0162] Step 920: Determine the defect category based on the defect area. When it is determined that the defect category includes solder joint voids or over-soldering, obtain the center point and size of the defect area.

[0163] In some embodiments, Figure 9 Step 920 in Figure 3 is similar to Step 310 in

[0164] and will not be elaborated here.

[0165] In some embodiments, Figure 9 Step 930 in Figure 3 is similar to Step 320 in

[0166] and will not be elaborated here.

[0167] In some embodiments, Figure 9 Step 940 in Figure 3 is similar to Step 330 in

[0168] Figure 10 is a schematic structural diagram of a cell string defect display system on a photovoltaic module according to some embodiments of the present specification. Refer to Figure 10 As shown, the cell string defect display system 1000 on the photovoltaic module may include: a first acquisition module 1010, a division module 1020, a second acquisition module 1030, and a display module 1040.

[0169] In some embodiments, the first acquisition module 1010 is configured to obtain the defect positions of the defect areas on each cell in the cell string according to the electroluminescence (EL) image of the cell string.

[0170] In some embodiments, the division module 1020 is configured to divide each cell on the photovoltaic module into a plurality of display blocks in the same manner.

[0171] In some embodiments, the second acquisition module 1030 is configured to obtain the defect statistics corresponding to each display block according to the defect positions on each cell.

[0172] In some embodiments, the display module 1040 is configured to display the defect statistics of each display block among the plurality of display blocks.

[0173] For more content about each module, reference can be made to Figure 2 and Figure 9 the relevant descriptions thereof, which will not be elaborated here. It should be understood thatFigure 10 The system and its modules shown can be implemented in various ways.

[0174] For example, in some embodiments, the system and its modules can be implemented by hardware, software, or a combination of software and hardware. Among them, the hardware part can be implemented using dedicated logic; the software part can be stored in a memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated designed hardware. Those skilled in the art can understand that the above methods and systems can be implemented using computer-executable instructions and / or control codes included in a processor. For example, such codes are provided in carrier media such as magnetic disks, CDs, or DVD-ROMs, or in the memories of programmable devices. The systems and modules of this specification can be implemented not only by hardware circuits such as very large scale integrated circuits or gate arrays, semiconductors such as logic chips and transistors, or programmable hardware devices such as field programmable gate arrays and programmable logic devices, but also by software executed by various types of processors, or by a combination of the above hardware circuits and software (e.g., firmware).

[0175] It should be noted that the above description of the system and its modules is only for convenience of description and does not limit this specification within the scope of the exemplified embodiments. It can be understood that for those skilled in the art, after understanding the principle of the system, they may, without departing from this principle, arbitrarily combine the various modules to form a subsystem connected to other modules. Or split some modules to obtain more modules or multiple units under that module. Such deformations are all within the scope disclosed in this specification.

[0176] In one or more embodiments of this specification, a computer program product is also provided, including computer instructions or computer code. When at least part of the computer instructions or computer code is executed by a processor, it can implement the above-described method for displaying defects in a battery cell string. In some embodiments, the computer program product may only involve computer instructions or computer code, which can be carried by a storage medium or a processing device. In other embodiments, the computer program product may be a storage medium or a processing device containing the aforementioned computer instructions or computer code. The processing device may include one or more processors and a storage medium.

[0177] In some embodiments, the processor may be a combination of one or more of the following processors: central processing unit (CPU), application specific integrated circuit (ASIC), application specific instruction set processor (ASIP), graphics processing unit (GPU), physics processing unit (PPU), digital signal processor (DSP), field programmable gate array (FPGA), programmable logic device (PLD), programmable logic controller (PLC), reduced instruction set computer (RISC), microprocessor.

[0178] In some embodiments, the storage medium may include a combination of one or more of the following: mass storage, removable storage, volatile read / write memory, read only memory (ROM). Exemplary mass storage may include magnetic disks, optical disks, solid state disks, etc. Exemplary removable storage may include flash drives, floppy disks, optical disks, memory cards, zip drives, magnetic tapes, etc. Exemplary volatile read / write memory may include random access memory (RAM). Exemplary random access memory may include dynamic random access memory (DRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), static random access memory (SRAM), thyristor random access memory (T-RAM), and zero capacitor random access memory (Z-RAM), etc. Exemplary read only memory may include masked read only memory (MROM), programmable read only memory (PROM), erasable programmable read only memory (EPROM), electrically erasable programmable read only memory (EEPROM), compact disk read only memory (CD-ROM), and digital versatile disk read only memory, etc.

[0179] The beneficial effects that the embodiments of this specification may bring include but are not limited to: (1) dividing the cells of a photovoltaic module into multiple display blocks, and based on the display blocks, displaying the defective areas of the cells and the defect statistics, which is convenient for users to analyze the causes of the defects and adjust the equipment to eliminate the defects; (2) dividing the cells into display blocks based on the defect categories, which can divide the cells into grid precisions that are intuitive and suitable for users to analyze the causes of the defects in the later stage; (3) dividing the cells into multiple first-class display blocks based on the solder joints, so that each first-class display block contains a solder joint, thereby accurately determining whether there are first-class defects such as solder joint voids or over-soldering in each solder joint; (4) dividing the cells into 3×3 second-class display blocks based on the position where the production equipment acts on the cells and the edges of the cells, so that each second-class display block contains the edge area of the cells or the area where the production equipment acts, thereby accurately determining whether there are second-class defects such as scratches, hidden cracks, or broken pieces in each area; (5) accurately obtaining the positions and quantities of the defective solder joints with defects according to the center points and sizes of the defective areas; (6) displaying the defect statistics or the proportion of the number of defects through a display interface to prompt the user to check the corresponding defective positions; (7) alarming the user to prompt for inspection when the defect statistics of a single display block exceed a preset value; (8) alarming the user to prompt for inspection when the total number of defect statistics in an area including multiple display blocks exceeds a preset value; (9) being able to provide the user with possible defect causes for generating the defect based on the defect statistics. It should be noted that the beneficial effects that different embodiments may bring are different. In different embodiments, the possible beneficial effects may be any one or several combinations of the above, or any other beneficial effects that may be obtained.

[0180] The basic concepts have been described above. Obviously, for those skilled in the art, the above detailed disclosure is only an example and does not constitute a limitation to this specification. Although not explicitly stated here, those skilled in the art may make various modifications, improvements, and corrections to this specification. Such modifications, improvements, and corrections are taught in this specification, so such modifications, improvements, and corrections still belong to the spirit and scope of the exemplary embodiments of this specification.

Claims

1. A method for displaying defects of a cell string on a photovoltaic module, comprising: Obtaining the defect position of the defect area on each cell in the cell string according to the electroluminescent EL image of the cell string; Dividing each cell on the photovoltaic module in the same manner to obtain a plurality of display blocks; Obtaining defect statistics corresponding to each of the display blocks according to defect positions on each of the battery cells; The defect statistics of each display block in the plurality of display blocks are displayed through a display interface.

2. The method according to claim 1, characterized in that The step of dividing each cell on the photovoltaic module in the same manner to obtain a plurality of display blocks comprises: Acquire a defect category of a defect area on each cell in the cell string according to the electroluminescent EL image of the cell string, wherein the defect category includes a first defect category and a second defect category; For the first defect category, each cell on the photovoltaic module is divided in the same first manner to obtain a plurality of first-category display blocks; For the second defect category, each cell on the photovoltaic module is divided in the same second manner to obtain a plurality of second-category display blocks; The displaying of the defect statistics of each display block in the plurality of display blocks through a display interface includes: The display interface simultaneously displays the defect statistics of each of the plurality of first-category display blocks and displays the defect statistics of each of the plurality of second-category display blocks.

3. The method according to claim 2, characterized in that The first defect category includes cold solder joint or over solder joint, and each of the first defect category display blocks includes a solder joint; or The second defect category includes external force defects caused by external force, and the plurality of second-category display blocks are 9 grids in a nine-grid divided by 3*3.

4. The method according to claim 2, characterized in that: The step of obtaining the defect position of the defect area on each cell in the cell string according to the electroluminescent EL image of the cell string includes: When it is determined that the defect category includes cold soldering or over soldering, obtaining the center point and size of the defect area; Obtaining a cell mesh corresponding to the cell where the defective area is located, wherein the cell mesh is a plurality of grids obtained by dividing the cells based on the welding points of the cells; The grid positions of the defective welding points contained in the defective area are determined according to the center points and sizes of the battery sheet mesh and the defective area.

5. The method according to claim 4, characterized in that The step of determining the grid position of the defective welding point contained in the defective area according to the center point and size of the battery sheet mesh and the defective area includes: The grid position of at least one of the welding points whose distance from the center point of the defective area is less than a preset threshold and which is covered by the defective area is determined as the grid position of the defective welding point.

6. The method according to claim 5, characterized in that The preset threshold is not greater than the distance between two adjacent welding points in the battery sheet mesh.

7. The method according to claim 4, characterized in that The center point of the defect area is the center point of the minimum circumscribed rectangle of the defect area.

8. The method according to claim 4, characterized in that The step of obtaining a cell grid corresponding to the cell where the defective area is located includes: A corresponding battery cell mesh is selected from a battery cell mesh library according to the type of the battery cell where the defective area is located.

9. The method according to claim 2, characterized in that: The step of obtaining the defect position of the defect area on each cell in the cell string according to the electroluminescent EL image of the cell string includes: When it is determined that the defect type is an external force defect caused by the application of external force, the defect position of the defect area is one of the grids in the nine-square grid obtained by dividing the battery cell into 3*3.

10. The method according to claim 1, characterized in that The displaying of the defect statistics of each display block in the plurality of display blocks through a display interface includes: The total number of defects occurring on each of the multiple display blocks is displayed through the display interface, or the proportion of the number of defects occurring on each of the multiple display blocks is displayed through the display interface.

11. The method according to claim 10, characterized in that Display blocks with different total defect quantities or different defect quantity ratios are displayed in different colors.

12. The method according to claim 1, characterized in that The method further comprises: When the defect statistics corresponding to one of the display blocks exceeds a first preset value, an alarm message is sent to the user; or, The total number of defects in a specific area of ​​the battery cell is calculated according to the defect position on each battery cell, and when the total number of defects in the specific area exceeds a second preset value, an alarm message is sent to the user.

13. The method according to claim 12, characterized in that When the defective area is a cold solder joint or an over solder joint, the specific area is each main grid on a single cell, or the same row on a single cell, or the entire cell; or, When the defective area is an external force defect caused by the application of external force, the specific area is a partial area on a single battery, or the entire battery cell.

14. The method according to claim 1, characterized in that The method further comprises: Obtaining a defect cause of a defect on at least one display block; The defect cause of the at least one display block is displayed through the display interface.

15. A cell string defect display system on a photovoltaic module, comprising: A first acquisition module is used to acquire the defect position of the defect area on each cell in the cell string according to the electroluminescent EL image of the cell string; A division module, used for dividing each cell on the photovoltaic module in the same way to obtain a plurality of display blocks; A second acquisition module, configured to acquire defect statistics corresponding to each of the display blocks according to defect positions on the battery cells; A display module is used to display the defect statistics of each display block in the multiple display blocks.

16. A computer program product, characterized in that The invention comprises a computer program, and when at least a part of the computer program is executed by a processor, the method according to any one of claims 1 to 14 can be implemented.

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