Solar thin-film cell lineation insulativity detection equipment and detection method

Abstract

The invention relates to a solar thin film cell lineation insulativity detection device and method, and the device comprises a conveying platform, a lifting device, a detection device, a detection starting point sensor, and a detection end point sensor. The detection device comprises a fixed seat, a sliding seat, a conductive contact probe assembly and an insulativity test instrument, the fixed seat is arranged at the tail end of the lifting air cylinder, the sliding seat and the conductive contact probe assembly are arranged on the fixed seat, and the insulativity test instrument is electrically connected with the conductive contact probe assembly; and after the lifting device descends, the conductive contact probe assembly and the insulativity testing instrument carry out insulativity detection on the lineation on the conductive film layer to be detected, and after the lifting device ascends, the insulativity detection is finished. The device is simple in structure, high in reliability and compatibility and capable of meeting insulation detection requirements of lineation at different intervals, and the production cost and the maintenance cost of equipment are reduced.

Description

Technical Field

[0001] The present invention belongs to the technical field of solar thin-film battery detection, and particularly relates to a device and a method for detecting the insulation of scribed lines on a solar thin-film battery. Background Art

[0002] In the production process of solar thin-film batteries, a glass substrate coated with a conductive film layer is required. It is also necessary to scribe and etch the conductive film layer on the glass substrate at a certain line spacing through a laser device, and then detect the insulation of the scribed conductive film layer. The existing insulation detection technology mainly relies on a number of probes to measure the resistance of the conductive film layer. The number of probes is arranged perpendicular to the scribing direction, one probe corresponding to one section of the conductive film layer, and then the insulation between every two adjacent sections of the conductive film layer is detected through a conversion circuit respectively. The circuit part of this detection method is relatively complex and requires the use of a large number of relays or transistors.

[0003] In the small-scale production stage of solar thin-film batteries, the device generally used to detect the insulation of the scribed conductive film layer is a multimeter, and the insulation between two adjacent sections of the conductive film layer is judged through the beep signal of the multimeter. This method is simple and only requires repeated measurement to complete all detections. Its disadvantage is that the efficiency is low, and it is easy to miss detections, which is not suitable for the detection requirements of large-scale production of solar thin-film batteries. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a device and a method for detecting the insulation of scribed lines on a solar thin-film battery, which are provided with a transmission platform, a lifting device and a detection device, and continuously detect the insulation of the scribed lines on the surface conductive film layer of the solar thin-film battery to be detected, meet the detection requirements of large-scale production of solar thin-film batteries, and are convenient for detection.

[0005] The present invention is implemented as follows. A scribing insulation detection device for a solar thin-film battery is provided, which includes a conveying platform, a lifting device, a detection device, a detection start sensor, and a detection end sensor. The conveying platform is used to convey solar thin-film battery wafers and includes conveying rollers and a power device for driving the conveying rollers to operate; the lifting device is fixed above the conveying platform and includes a lifting cylinder and a lifting slide rail; the detection device is used to detect the insulation of the scribing on the conductive film layer on the surface of the solar thin-film battery wafer, and includes a fixed seat, a sliding seat, a conductive contact probe assembly, and an insulation testing instrument. The fixed seat is arranged at the end of the lifting cylinder and moves up and down with the telescopic shaft of the lifting cylinder. The sliding seat and the conductive contact probe assembly are arranged on the fixed seat, and the insulation testing instrument is electrically connected to the conductive contact probe assembly; after the lifting cylinder descends, the conductive contact probe assembly and the insulation testing instrument perform insulation detection on the scribing on the conductive film layer to be detected. After the lifting cylinder ascends, the insulation detection ends; the detection start sensor is used to sense whether the solar thin-film battery wafer to be detected has moved to the detection starting position, and the detection end sensor is used to sense whether the solar thin-film battery wafer being detected has moved to the detection ending position.

[0006] Further, the conductive contact probe assembly includes at least one set of positive probe assemblies and negative probe assemblies. The positive probe assemblies are arranged on the fixed seat, and the negative probe assemblies are arranged on the moving seat. The moving seat is connected to the fixed seat through a smooth rod. A micrometer is arranged on the fixed seat, and the extending rod of the micrometer passes through the fixed seat and is connected to the moving seat. By rotating the micrometer, its extending rod drives the moving seat to reciprocate along the smooth rod to adjust the distance between the positive probe assemblies and the negative probe assemblies.

[0007] Further, the insulation testing instrument is an impedance meter.

[0008] Further, a fixing bolt is arranged at one end of the smooth rod to fix the smooth rod on the moving seat, and a gasket and a circlip are arranged at the other end of the smooth rod.

[0009] Further, the distance is greater than the width of the scribing on the conductive film layer to be measured.

[0010] Further, six positive probe assemblies are arranged in parallel on the fixed seat, and four negative probe assemblies are arranged in parallel on the moving seat. The positive probe assemblies and the negative probe assemblies are arranged at intervals.

[0011] Further, each of the positive probe assemblies and the negative probe assemblies includes a probe sleeve, a probe rod, a probe spring, and a probe head. The probe spring is arranged in the probe sleeve, the probe head is movably connected to the lower end of the probe rod, and the probe rod is sleeved on the probe spring and moves up and down along the probe sleeve. Conductive rubber is arranged on the probe head.

[0012] The present invention is implemented as follows. A method for detecting the insulation of scribed lines on a thin-film solar cell is provided, and the detection device for the insulation of scribed lines on a thin-film solar cell as described above is used. The detection method includes the following steps: Step 1: The thin-film solar cell to be detected is placed on the transfer platform, and the transfer rollers transfer it to the initial detection position. After the detection start sensor senses that the thin-film solar cell to be detected reaches the detection position, the lifting cylinder of the lifting device pushes the detection device to descend along the lifting slide rail, and the conductive contact probe assembly and the insulation testing instrument detect the insulation of the scribed lines on the surface conductive film layer of the thin-film solar cell to be detected; Step 2: The transfer rollers transfer the thin-film solar cell at a constant speed, and the conductive contact probe assembly and the insulation testing instrument continuously detect the insulation of other scribed lines on the conductive film layer until the insulation detection of all scribed lines is completed; Step 3: When the detection end sensor detects that the thin-film solar cell moves to the detection end position, the lifting cylinder of the lifting device drives the detection device to rise along the lifting slide rail, and the insulation detection ends.

[0013] Compared with the prior art, for the detection device and method for the insulation of scribed lines on a thin-film solar cell of the present invention, the detection device for the insulation of scribed lines on a thin-film solar cell includes a transfer platform, a lifting device, a detection device, a detection start sensor, and a detection end sensor. The detection device is used to detect the insulation of scribed lines on the surface conductive film layer of the thin-film solar cell, and includes a fixed seat, a sliding seat, a conductive contact probe assembly, and an insulation testing instrument. After the lifting device descends, the conductive contact probe assembly and the insulation testing instrument detect the insulation of the scribed lines on the conductive film layer to be detected. After the lifting device rises, the insulation detection ends. The present invention has a simple structure, strong reliability and compatibility, can meet the requirements for the insulation detection of scribed lines with different spacings, and reduces the production cost and maintenance cost of the device. Description of the Drawings

[0014] Figure 1 is the main structural view of a preferred embodiment of the detection device for the insulation of scribed lines on a thin-film solar cell of the present invention; Figure 2 is Figure 1 the enlarged schematic view of part M in Figure 3 is Figure 1 the left view of Figure 4 is Figure 1 the top view (rotated counterclockwise by 90°) of the detection device in Detailed Embodiment

[0015] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clear and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0016] Please refer to Figures 1 to 4 As shown, a preferred embodiment of the insulating property detection device for the scribed line of the solar thin-film battery of the present invention includes a conveying platform 1, a lifting device 2, a detection device 3, a detection start sensor 4 and a detection end sensor 5.

[0017] The conveying platform 1 is used to convey the solar thin-film battery chip A, and includes conveying rollers 11 and a power device (not shown in the figure) for driving the conveying rollers 11 to operate. The lifting device 2 is fixed above the conveying platform 1 and includes a lifting cylinder 21 and a lifting slide rail 22.

[0018] The detection device 3 is used to detect the insulating property of the scribed line C on the conductive film layer B on the surface of the solar thin-film battery chip A, and includes a fixed seat 31, a sliding seat 32, a conductive contact probe assembly 33 and an insulating property testing instrument (not shown in the figure). The fixed seat 31 is arranged at the end of the lifting cylinder 21 and moves up and down along with the telescopic shaft of the lifting cylinder 21. The sliding seat 32 and the conductive contact probe assembly 33 are arranged on the fixed seat 31. The insulating property testing instrument is electrically connected to the conductive contact probe assembly 33. After the lifting cylinder 21 descends, the conductive contact probe assembly 33 and the insulating property testing instrument perform an insulating property detection on the scribed line C on the conductive film layer B to be detected; after the lifting cylinder 21 ascends, the insulating property detection ends.

[0019] The detection start sensor 4 is used to sense whether the solar thin-film battery chip A to be detected moves to the detection start position, and the detection end sensor 5 is used to sense whether the solar thin-film battery chip A being detected moves to the detection end position.

[0020] The conductive contact probe assembly 33 includes at least one set of positive probe assembly 34 and negative probe assembly 35. The positive probe assembly 34 is arranged on the fixed seat 31, and the negative probe assembly 35 is arranged on the moving seat 36. The moving seat 36 is connected to the fixed seat 31 through a light rod 37. A micrometer 38 is arranged on the fixed seat 31. The extending rod 381 of the micrometer 38 passes through the fixed seat 31 and is connected to the moving seat 36. By rotating the micrometer 38, its extending rod 381 drives the moving seat 36 to reciprocate along the light rod 37 to adjust the distance between the positive probe assembly 34 and the negative probe assembly 35. The distance is greater than the width of the scribed line C on the conductive film layer B to be measured.

[0021] The insulating property testing instrument is an impedance meter.

[0022] A fixing bolt 39 is provided at one end of the polished rod 37 to fix the polished rod 37 on the moving seat 36, and a gasket 310 and a circlip 311 are provided at the other end of the polished rod 37.

[0023] Six positive probe assemblies 34 are arranged in parallel on the fixed seat 31, and four negative probe assemblies 35 are arranged in parallel on the moving seat 36. The positive probe assemblies 34 and the negative probe assemblies 35 are arranged at intervals and are evenly distributed on both sides of the protruding rod 381 of the micrometer 38.

[0024] Each of the positive probe assemblies 34 and the negative probe assemblies 35 includes a probe sleeve 312, a probe rod 313, a probe spring 314 and a probe head 315. The probe spring 314 is arranged in the probe sleeve 312. The probe head 315 is movably connected to the lower end of the probe rod 313. The probe rod 313 is sleeved on the probe spring 314 and moves up and down along the probe sleeve 312. A conductive rubber 316 is provided on the probe head 315.

[0025] After the lifting cylinder 21 descends, the conductive rubbers 316 on the probe heads 315 of the positive probe assemblies 34 and the negative probe assemblies 35 simultaneously contact the conductive film layer B on the surface of the solar thin-film cell A to be measured, and the impedance meter is used to detect the resistance value between the probe heads 315 of the positive probe assemblies 34 and the negative probe assemblies 35. When the probe heads 315 of the positive probe assemblies 34 and the negative probe assemblies 35 respectively contact the conductive film layers B of two adjacent sub-cell pieces of the solar thin-film cell A to be measured that are cut off by the scribing C, that is, when the probe heads 315 of the positive probe assemblies 34 and the negative probe assemblies 35 are respectively located on both sides of the scribing C, the detected resistance value is large. The insulation performance of the scribing C is judged according to the detected resistance value. If the scribing C completely cuts off the conductive film layer B of the solar thin-film cell A, the detected resistance value is the largest, and the insulation performance of the scribing C is better.

[0026] The purpose of arranging multiple parallel positive probe assemblies 34 and negative probe assemblies 35 is to prevent misjudgment. Because the conductive film layer on the solar thin-film cell itself has a certain resistance value, the detection results of only one pair of positive probe assemblies 34 and negative probe assemblies 35 cannot represent the true situation of the conductive film layers of two adjacent sub-cell pieces. If the test point is on one side of the glass substrate of the solar thin-film cell A and there is a short-circuit position on the other side, the detected resistance value is too large at this time, resulting in no response from the insulation testing instrument, and thus an incorrect result that the scribing insulation is normal is obtained. Arranging multiple parallel positive probe assemblies 34 and negative probe assemblies 35 can increase the contact points with the conductive film layer B and reduce the resistance value between the positive probe assemblies 34 and the negative probe assemblies 35 when conducting.

[0027] The distance between the positive probe assembly 34 and the negative probe assembly 35 is adjusted by a micrometer 38. Rotating the knob of the micrometer 38 enables precise adjustment of the distance between the positive probe assembly 34 and the negative probe assembly 35. The positive probe assembly 34 and the negative probe assembly 35 are staggered and arranged at intervals. After the fixed seat 31 and the moving seat 36 are pressed against each other, the positive probe assembly 34 and the negative probe assembly 35 are on the same straight line, so that the minimum distance between the positive probe assembly 34 and the negative probe assembly 35 is 0.000 mm.

[0028] The present invention also discloses a method for detecting the insulation of scribed lines of a thin-film solar cell, which uses the above-mentioned device for detecting the insulation of scribed lines of a thin-film solar cell. The detection method includes the following steps: Step 1: The thin-film solar cell sheet A to be detected is placed on the conveying platform 1. The conveying rollers 11 convey it to the detection initial position. After the detection start sensor 4 senses that the thin-film solar cell sheet A to be detected reaches the detection position, the lifting cylinder 21 of the lifting device 2 pushes the detection device 3 to descend along the lifting slide rail 22, and the conductive contact probe assembly 33 and the insulation testing instrument perform insulation detection on the scribed line C on the conductive film layer B on the surface of the thin-film solar cell sheet A to be detected.

[0029] Step 2: The conveying rollers 11 convey the thin-film solar cell sheet A at a constant speed, and the conductive contact probe assembly 33 and the insulation testing instrument continuously perform insulation detection on other scribed lines C on the conductive film layer B until the insulation detection of all scribed lines C is completed.

[0030] Step 3: When the detection end sensor 5 detects that the thin-film solar cell sheet A moves to the detection end position, the lifting cylinder 21 of the lifting device 2 drives the detection device 3 to rise along the lifting slide rail 22, and the insulation detection ends.

[0031] Judge the insulation quality of each scribed line C on the conductive film layer B on the surface of the thin-film solar cell sheet A according to the detection results detected by the insulation testing instrument.

[0032] After the device and method for detecting the insulation of scribed lines of the thin-film solar cell of the present invention are applied to the large-scale production line of the thin-film solar cell sheet A, comprehensive detection of the scribed lines C on the conductive film layer B will be realized, avoiding the scrapping of the thin-film solar cell sheet A caused by the glass substrate or the laser process from the source, feeding back the abnormal process in advance, and improving the yield rate of the production line. The structure of the present invention is simple, with strong reliability and compatibility, can adapt to the insulation detection requirements of scribed lines with different spacings, and reduces the production cost and maintenance cost of the equipment.

[0033] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. A scribing insulation detection device for a thin-film solar cell, characterized in that Including: A conveying platform for conveying solar thin-film battery wafers, including conveying rollers and a power device for driving the conveying rollers to operate; A lifting device fixed above the conveying platform, including a lifting cylinder and a lifting slide rail; A detecting device for detecting the insulation of the scribed lines on the conductive film layer on the surface of the solar thin-film battery wafer, including a fixed seat, a sliding seat, a conductive contact probe assembly, and an insulation testing instrument. The fixed seat is arranged at the end of the lifting cylinder and moves up and down along with the telescopic shaft of the lifting cylinder. The sliding seat and the conductive contact probe assembly are arranged on the fixed seat, and the insulation testing instrument is electrically connected to the conductive contact probe assembly. After the lifting cylinder descends, the conductive contact probe assembly and the insulation testing instrument perform insulation detection on the scribed lines on the conductive film layer to be detected. After the lifting cylinder ascends, the insulation detection ends; A detection start sensor for sensing whether the solar thin-film battery wafer to be detected has moved to the detection starting position; A detection end sensor for sensing whether the solar thin-film battery wafer being detected has moved to the detection termination position.

2. The solar thin-film battery scribing insulation detection device according to claim 1, wherein The conductive contact probe assembly includes at least one set of positive probe assembly and negative probe assembly. The positive probe assembly is arranged on the fixed seat, and the negative probe assembly is arranged on the moving seat. The moving seat is connected to the fixed seat through a smooth rod. A micrometer is arranged on the fixed seat, and the extending rod of the micrometer passes through the fixed seat and is connected to the moving seat. By rotating the micrometer, its extending rod drives the moving seat to reciprocate along the smooth rod to adjust the distance between the positive probe assembly and the negative probe assembly.

3. The solar thin-film battery scribing insulation detection device according to claim 2, wherein, The insulation testing instrument is an impedance meter.

4. The solar thin-film battery scribing insulation detection device according to claim 2, characterized in that A fixing bolt is arranged at one end of the smooth rod to fix the smooth rod on the moving seat, and a gasket and a circlip are arranged at the other end of the smooth rod.

5. The solar thin-film battery scribing insulation detection device according to claim 2, wherein, The distance is greater than the width of the scribed lines on the conductive film layer to be measured.

6. The solar thin-film battery scribing insulation detection device according to claim 2, characterized in that, Six positive probe assemblies are arranged in parallel on the fixed seat, and four negative probe assemblies are arranged in parallel on the moving seat. The positive probe assemblies and the negative probe assemblies are arranged at intervals.

7. The solar thin-film battery scribing insulation detection device according to claim 6, wherein, Each positive probe assembly and negative probe assembly respectively includes a probe sleeve, a probe rod, a probe spring, and a probe head. The probe spring is arranged in the probe sleeve. The probe head is movably connected to the lower end of the probe rod. The probe rod is sleeved on the probe spring and moves up and down along the probe sleeve. Conductive rubber is arranged on the probe head.

8. A method for detecting the scribing insulation of a thin-film solar cell, characterized in that, Using the solar thin-film battery scribed line insulation detection device according to any one of claims 1 to 7, the detection method includes the following steps: Step 1: The solar thin-film battery wafer to be detected is placed on the conveying platform. The conveying rollers convey it to the detection initial position. After the detection start sensor senses that the solar thin-film battery wafer to be detected reaches the detection position, the lifting cylinder of the lifting device pushes the detection device to descend along the lifting slide rail, and the conductive contact probe assembly and the insulation testing instrument perform insulation detection on the scribed lines on the surface conductive film layer of the solar thin-film battery wafer to be detected; Step 2: The conveying rollers convey the solar thin-film battery wafer at a constant speed, and the conductive contact probe assembly and the insulation testing instrument continuously perform insulation detection on the other scribed lines on the conductive film layer until the insulation detection of all scribed lines is completed; Step 3: After the detection end sensor detects that the solar thin film cell moves to the detection end position, the lifting cylinder of the lifting device drives the detection device to rise along the lifting slide rail, and the insulation detection ends.

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