Testing equipment and testing method for transient change of voltage

Abstract

The invention discloses a voltage transient change test device and method, the test device comprises an upper computer, a first power supply, a second power supply and an electric control switch, and the electric control switch comprises a first control switch and a second control switch; when the electric control unit carries out a power supply instantaneous drop recovery test, the upper computer controls the first control switch to be rapidly connected with the first power supply and controls the second control switch to be disconnected with the second power supply. Or the upper computer controls the first control switch to be quickly disconnected from the first power supply and controls the second control switch to be connected with the second power supply. According to the invention, the power supply which has a large current output capability but does not have a quick response function is selected, and the transient change of the voltage is controlled based on the electric control switch, so that the transient drop and transient recovery test of the power supply voltage of the electric control unit is met, the automation degree of test equipment is high, and the equipment cost can be greatly saved.

Description

Technical Field

[0001] The present invention relates to the technical field of power supply voltage transient change testing, and particularly to a testing device and method for voltage transient change. Background Art

[0002] In the power supply voltage instantaneous drop and instantaneous recovery test in electronic and electrical tests, it is an immunity test used to test the anti-interference ability of electronic devices. This test is usually used to evaluate the performance of electronic devices when the power supply voltage drops or interrupts instantaneously.

[0003] In the power supply voltage transient change test, the power supply voltage will suddenly drop or interrupt and then return to the normal level within a period of time. This test can help determine whether the device can continue to work properly when the power supply voltage drops or interrupts. In addition, this test can also be used to evaluate the performance of the device under power supply voltage fluctuations, electromagnetic interference and other similar conditions. By conducting this test, it can be ensured that electronic devices can work properly under various different voltage conditions. However, the current devices used for this test require a power supply with fast response and large current output ability. However, a power supply with fast response and large current output ability is a scarce resource in the market and has a high cost, resulting in a high cost for the power supply voltage instantaneous drop and instantaneous recovery test and unable to achieve wide application. Summary of the Invention

[0004] The object of the present invention is to propose a testing device and method for controlling voltage transient change based on an electronic control switch, which can realize the control of voltage transient change to solve the above problems.

[0005] According to the first aspect of the embodiments of the present invention, a testing device for voltage transient change is provided, including:

[0006] A host computer;

[0007] A first power supply, providing a first voltage value;

[0008] A second power supply, providing a second voltage value, and the first voltage value is greater than the first voltage value;

[0009] An electronic control switch, including a first control switch respectively connected to the host computer and the first power supply and a second control switch respectively connected to the host computer and the second power supply;

[0010] Wherein, when the electronic control unit conducts a power supply instantaneous drop and recovery test, the host computer controls the first control switch to be quickly turned on with the first power supply and controls the second control switch to be turned off with the second power supply; or the host computer controls the first control switch to be quickly turned off with the first power supply and controls the second control switch to be turned on with the second power supply.

[0011] A further improvement of the test device of the present invention lies in that both the first control switch and the second control switch are MOSFET components.

[0012] A further improvement of the test device of the present invention lies in that the switching time between the first control switch and the second control switch does not exceed 10 milliseconds.

[0013] A further improvement of the test device of the present invention lies in that the first voltage value is 24V and the second voltage value is 12V.

[0014] A further improvement of the test device of the present invention lies in that a user graphical interface is provided in the host computer; wherein, when the power supply instantaneous drop recovery test is performed on the electronic control unit, the user graphical interface is used to display the output waveform.

[0015] A further improvement of the test device of the present invention lies in that the host computer is further used to read the fault information of the electronic control module according to the protocol signal fed back by the electronic control unit.

[0016] According to the second aspect of the embodiments of the present invention, a test method for voltage transient change is provided, which is applied to the test device for voltage transient change as described in any one of the above, and the test method includes:

[0017] Electrically connect the electronic control unit to be tested to the host computer;

[0018] Select an appropriate test waveform for output according to the attributes of the electronic control unit to be tested;

[0019] According to the control signal of the host computer, quickly switch the first control switch and the second control switch to control the output of the first power supply or the second power supply, so as to perform a power supply instantaneous drop recovery test on the electronic control unit.

[0020] A further improvement of the test method of the present invention lies in that the step of quickly switching the first control switch and the second control switch according to the control signal of the host computer to control the output of the first power supply or the second power supply includes:

[0021] Control the first control switch to conduct with the first power supply and disconnect the second control switch from the second power supply to test the performance of the electronic control unit;

[0022] Control the first control switch to disconnect from the first power supply; and conduct the second control switch with the second power supply to test the performance of the electronic control unit.

[0023] A further improvement of the test method of the present invention lies in that both the first control switch and the second control switch are MOSFET components.

[0024] A further improvement of the test method of the present invention lies in that the switching time between the first control switch and the second control switch does not exceed 10 milliseconds.

[0025] According to the test equipment and test method for voltage transient change provided by the present invention, by selecting a power supply with large current output capacity but without fast response, the requirements for the performance of the power supply can be reduced, and the voltage transient change is controlled based on the electronic control switch to meet the tests of the instantaneous voltage drop and instantaneous recovery of the power supply for the electronic control unit, so that the test equipment has a high degree of automation and can greatly save the equipment cost. Description of the Drawings

[0026] The present invention will be described in detail below with reference to the accompanying drawings via exemplary embodiments, wherein:

[0027] Figure 1 It shows a schematic functional structure diagram of the test equipment for voltage transient change provided by an embodiment of the present invention;

[0028] Figure 2 It shows a schematic waveform diagram output by the test equipment for voltage transient change provided by an embodiment of the present invention;

[0029] Figure 3 It shows a flowchart of the test method for voltage transient change provided by an embodiment of the present invention.

[0030] The drawings are only schematic and not necessarily drawn to scale. In addition, they only show those parts necessary to clarify the present invention, while other parts may be omitted or only briefly mentioned. That is, in addition to the components shown in the drawings, the present invention may also include other components. Detailed Embodiments

[0031] The following specific embodiments illustrate the implementation manners of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. Although the description of the present invention will be introduced in conjunction with the preferred embodiments, this does not mean that the features of this invention are limited to this implementation manner. On the contrary, the purpose of introducing the invention in conjunction with the implementation manner is to cover other alternatives or modifications that may be extended based on the claims of the present invention. In order to provide a deep understanding of the present invention, many specific details will be included in the following description. The present invention can also be implemented without using these details. In addition, in order to avoid confusing or obscuring the key points of the present invention, some specific details will be omitted in the description. It should be noted that, without conflict, the embodiments in the present invention and the features in the embodiments can be combined with each other.

[0032] It should be noted that in this specification, similar reference numerals and letters denote similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.

[0033] In the description of this embodiment, it should be noted that the orientation or positional relationship indicated by terms such as "upper" and "inner" is based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the inventive product is habitually placed during use. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present invention.

[0034] Terms such as "first" and "second" are only used for distinguishing descriptions and should not be construed as indicating or implying relative importance.

[0035] In the description of this embodiment, it should also be noted that unless otherwise clearly specified and limited, the terms "set", "connected", and "coupled" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in this embodiment can be understood according to specific circumstances.

[0036] To make the objectives, technical solutions, and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with the drawings.

[0037] Figure 1 The functional structure diagram of the test device for voltage transient changes provided by an embodiment of the present invention is shown.

[0038] Referring to Figure 1 , the test device for voltage transient changes in the embodiment of the present invention includes: a host computer 10, a first power supply 21, a second power supply 22, and an electric control switch 30. Among them, the host computer 10 is electrically connected to each component through a bus. The first power supply 21 provides a first voltage value, and the second power supply 22 provides a second voltage value, and the first voltage value is greater than the first voltage value. In one example, the first voltage value is 24V and the second voltage value is 12V. Of course, the first voltage value and the second voltage value of the present invention are not limited to the above values, and only indicate that the first power supply 21 and the second power supply 22 of the present application are conventional power supplies. By providing different voltages and quickly switching according to the electric control switch 30, the electric control unit 40 can work properly under different voltage conditions, so that the electric control unit 40 meets the requirements of reliability and stability.

[0039] The electronic control switch 30 includes a first control switch 31 respectively connected to the host computer 10 and the first power supply 21, and a second control switch 32 respectively connected to the host computer 10 and the second power supply 22. Among them, when the electronic control unit 40 performs a power instantaneous drop recovery test, the host computer 10 controls the first control switch 31 to be quickly turned on with the first power supply 21 and controls the second control switch 32 to be turned off with the second power supply 22; or the host computer 10 controls the first control switch 31 to be quickly turned off with the first power supply 21 and controls the second control switch 32 to be turned on with the second power supply 22.

[0040] In the present invention, the electronic control unit 40 can be an electronic controller of an automobile. Of course, the test equipment for the voltage transient change is not limited to using two power supplies. According to actual usage needs, it can also include a third power supply, a fourth power supply, etc., and correspondingly cooperate with a third control switch, a fourth control switch, etc.

[0041] In an embodiment, both the first control switch 31 and the second control switch 32 are MOSFET components. The switching time between the first control switch 31 and the second control switch 32 does not exceed 10 milliseconds. Figure 2 As shown, if a single power supply is used to control the drop from Ua to Uo, it takes tf time, and this tf time is often only a few milliseconds. Most of the power supplies on the market at present are difficult to meet the requirements of this performance. The present invention uses two power supplies for control. The first power supply 21 always supplies power of Ua, and the second power supply 22 always supplies power of Uo. Only the power supply needs to be switched through the electronic control switch 30, so that the test equipment for voltage transient change has a high degree of automation and can greatly save equipment costs.

[0042] Furthermore, a user graphical interface 11 is provided in the host computer 10. Among them, when the electronic control unit 40 performs a power instantaneous drop recovery test, the user graphical interface 11 is used to display the output waveform, and the power output waveform can be customized for customers.

[0043] In addition, the host computer 10 also has a test structure data recording function and a fault diagnosis function. The host computer 10 is used to read the fault information of the electronic control module according to the protocol signal fed back by the electronic control unit 40.

[0044] As Figure 3 shown, according to another aspect of the embodiment of the present invention, a method for testing voltage transient change is further provided. The testing method is applied to any one of the above-mentioned testing equipment for voltage transient change. Among them, the testing method for voltage transient change includes:

[0045] S301. Electrically connect the electronic control unit to be tested to the host computer.

[0046] S302. Select an appropriate test waveform for output according to the attributes of the electronic control unit to be tested.

[0047] S303. According to the control signal of the host computer, control the output of the first power supply or the second power supply by quickly switching the first control switch and the second control switch, so as to perform a power instantaneous drop recovery test on the electronic control unit.

[0048] Further, in S303, controlling the output of the first power supply or the second power supply by quickly switching the first control switch and the second control switch includes: controlling the first control switch to conduct with the first power supply and disconnecting the second control switch from the second power supply to test the performance of the electronic control unit; controlling the first control switch to disconnect from the first power supply; and controlling the second control switch to conduct with the second power supply to test the performance of the electronic control unit.

[0049] In an embodiment, both the first control switch and the second control switch are MOSFET components. The switching time between the first control switch and the second control switch does not exceed 10 milliseconds.

[0050] The test equipment and test method for voltage transient change provided by the present invention can reduce the requirements for the performance of the power supply by selecting a power supply with large current output capacity but without fast response, and control the voltage transient change based on the electronic control switch to meet the tests of instantaneous voltage drop and instantaneous recovery of the power supply of the electronic control unit, so that the test equipment has a high degree of automation and can greatly save the equipment cost.

[0051] Although the present invention has been illustrated and described by referring to some preferred embodiments of the present invention, those of ordinary skill in the art should understand that the above content is a further detailed description of the present invention in combination with specific embodiments, and it cannot be determined that the specific implementation of the present invention is only limited to these descriptions. Those skilled in the art can make various changes in form and details, including making several simple deductions or substitutions, without departing from the spirit and scope of the present invention.

Claims

1. A test device for voltage transient changes, characterized in that, Including: Host computer; First power supply, providing a first voltage value; Second power supply, providing a second voltage value, and the first voltage value is greater than the second voltage value; Electric control switch, including a first control switch respectively connected to the host computer and the first power supply and a second control switch respectively connected to the host computer and the second power supply; Wherein, when the electric control unit conducts a power instantaneous drop recovery test, the host computer controls the first control switch to conduct quickly with the first power supply and controls the second control switch to disconnect from the second power supply; or the host computer controls the first control switch to disconnect quickly from the first power supply and controls the second control switch to conduct with the second power supply.

2. The test device according to claim 1, characterized in that, Both the first control switch and the second control switch are MOSFET components.

3. The testing device according to claim 2, characterized in that, The switching time between the first control switch and the second control switch does not exceed 10 milliseconds.

4. The test device according to claim 1, characterized in that, The first voltage value is 24V and the second voltage value is 12V.

5. The test device according to claim 1, characterized in that, A user graphical interface is set in the host computer; wherein, when the electric control unit conducts a power instantaneous drop recovery test, the user graphical interface is used to display the output waveform.

6. The test device according to claim 1, characterized in that, The host computer is also used to read the fault information of the electric control module according to the protocol signal fed back by the electric control unit.

7. A test method for voltage transient changes, applied to the test device for voltage transient changes as described in any one of claims 1-6, characterized in that, The test method includes: Electrically connecting the to-be-tested electric control unit to the host computer; Selecting an appropriate test waveform for output according to the attributes of the to-be-tested electric control unit; According to the control signal of the host computer, by quickly switching the first control switch and the second control switch, to control the output of the first power supply or the second power supply, so as to conduct a power instantaneous drop recovery test on the electric control unit.

8. The test method according to claim 7, wherein The step of according to the control signal of the host computer, by quickly switching the first control switch and the second control switch, to control the output of the first power supply or the second power supply, includes: Controlling the first control switch to conduct with the first power supply and disconnecting the second control switch from the second power supply to test the performance of the electric control unit; Controlling the first control switch to disconnect from the first power supply; and connecting the second control switch to the second power supply to test the performance of the electric control unit.

9. The test method according to any one of claims 7 or 8, characterized in that, Both the first control switch and the second control switch are MOSFET components.

10. The test method according to claim 9, characterized in that, The switching time between the first control switch and the second control switch does not exceed 10 milliseconds.

Images