Switch cabinet operation reliability evaluation method

Abstract

The invention discloses a switch cabinet operation reliability evaluation method, relates to the field of switch cabinets, and solves the problem of low accuracy of switch cabinet operation reliability evaluation caused by non-targeted test, and the method comprises the following steps: collecting rated voltage values and rated current values of multiple groups of driving plug-ins and power modules in a target switch cabinet; performing an electrical variable protection test on each group of driving plug-ins in the target switch cabinet to obtain an electrical variable protection test result of the corresponding driving plug-ins; performing an over-temperature protection test on each group of power modules in the target switch cabinet to obtain an over-temperature test result of the corresponding power module; performing an open-phase protection test on the target switch cabinet to obtain an open-phase test result corresponding to the target switch cabinet; and integrating all test results corresponding to the target switch cabinet, and evaluating the reliability of the target switch cabinet based on the test results. According to the invention, through targeted testing of different accessories in the switch cabinet, accurate evaluation of the operation reliability of the switch cabinet is realized.

Description

Technical Field

[0001] The present invention belongs to the technical field of switch cabinets, and specifically relates to a method for evaluating the operation reliability of switch cabinets. Background Technique

[0002] Switch cabinets are key devices in the power system for distributing, controlling, protecting, and monitoring electric energy, and are widely used in power plants, substations, industrial and mining enterprises, and building power distribution systems; by integrating various electrical components, they ensure the safety and reliability of power transmission; protective electrical appliances (such as fuses, circuit breakers, etc.) are installed in the switch cabinet, and when the circuit is abnormal, they can quickly cut off the faulty circuit to prevent the expansion of the fault and protect the safety of equipment and personnel; therefore, it is necessary to accurately determine the reliability of the switch cabinet.

[0003] However, at the present stage, when evaluating the reliability of switch cabinets, the overall performance of the switch cabinets is usually tested, rather than conducting detailed tests and evaluations on the drive plugins and power modules in the switch cabinets in sequence, resulting in a low accuracy rate of the evaluation results; Therefore, the present invention proposes a method for evaluating the operation reliability of switch cabinets. Summary of the Invention

[0004] The purpose of the present invention is to propose a method for evaluating the operation reliability of switch cabinets to solve the problems raised in the above background technique.

[0005] To achieve the above purpose, the present invention adopts the following technical solutions: A method for evaluating the operation reliability of switch cabinets, the method includes: Step S1, collecting the rated voltage values and rated current values of multiple groups of drive plugins and power modules in the target switch cabinet; Step S2, performing electrical variable protection tests on each group of drive plugins in the target switch cabinet to obtain the electrical variable protection test results corresponding to the drive plugins; among them, the electrical variable protection test includes overcurrent protection test and overvoltage protection test; Step S3, performing overtemperature protection tests on each group of power modules in the target switch cabinet to obtain the overtemperature test results corresponding to the power modules; Step S4, performing open-phase protection tests on the target switch cabinet to obtain the open-phase test results corresponding to the target switch cabinet; Step S5, comprehensively considering all the test results corresponding to the target switch cabinet, and evaluating the reliability of the target switch cabinet based on the test results.

[0006] Further, the electrical variable protection test includes overcurrent protection test and overvoltage protection test, and the test process of the overcurrent protection test is specifically as follows: Step S211: Select any group of drive plugins and denote it as the test drive plugin, and obtain the rated current value corresponding to the test drive plugin; based on the rated current, set the steady-state overcurrent test current value and the instantaneous overcurrent test current value for the corresponding drive plugin. Step S212: Connect the output terminal of the high-current generator to the load terminal of the test drive plugin, and set the current waveform of the steady-state overcurrent test current value. Step S213: Continuously send an alternating current with a value equal to the steady-state overcurrent test current value to the test drive plugin, and record the corresponding moment as the steady-state test start moment; measure the open-circuit moment of the test drive plugin, and obtain the steady-state test response duration of the corresponding test drive plugin by subtracting the steady-state test start moment from the open-circuit moment. Step S214: Provide an alternating current with a value equal to the instantaneous overcurrent test current value to the test drive plugin through the high-current generator; obtain the instantaneous test response duration by subtracting the current injection moment from the open-circuit moment.

[0007] Furthermore, the test process of the overcurrent protection test further includes: Step S215: Calculate the steady-state test duration threshold WYZ and the instantaneous test duration threshold SYZ of the test drive plugin through a formula. Step S216: Compare the steady-state test response duration of the test drive plugin with the steady-state test duration threshold. If the steady-state test response duration is greater than or equal to the steady-state test duration threshold, generate an abnormal signal; if the steady-state test response duration is less than the steady-state test duration threshold, obtain the steady-state current response difference by subtracting the steady-state test response duration from the steady-state test duration threshold. Step S217: Compare the instantaneous test response duration of the test drive plugin with the instantaneous test duration threshold. If the instantaneous test response duration is greater than or equal to the instantaneous test duration threshold, generate an abnormal signal; if the instantaneous test response duration is less than the instantaneous test duration threshold, obtain the instantaneous current response difference by subtracting the instantaneous test response duration from the instantaneous test duration threshold; Step S218: Calculate the current test score value DLF of the test drive plugin. The specific formula is as follows: DLF = A1×SDL + A2×WDL; where SDL is the instantaneous current response difference, WDL is the steady-state current response difference, and A1 and A2 are weight coefficients with fixed values. Step S219: Similarly obtain the current test score values of all drive plugins.

[0008] Furthermore, the specific formula for calculating the steady-state test duration threshold is as follows: ; where K is the time constant, WDL is the steady-state overcurrent test current value of the test drive plugin, EDL is the rated current value of the test drive plugin, and a is the curve type coefficient. The calculation formula for the instantaneous test duration threshold is as follows: ; where SDL is the instantaneous overcurrent test current value of the test drive plug-in, and b is the curve type coefficient.

[0009] Furthermore, the test process of the overvoltage protection test is as follows: Step S221: Obtain the rated voltage value corresponding to the test drive plug-in, and set the steady-state overvoltage test voltage value and the instantaneous overvoltage test voltage value of the test drive plug-in based on the rated voltage value; at the same time, set the steady-state climbing rate of the steady-state overvoltage test voltage value; Among them, the instantaneous overvoltage test voltage value > the steady-state overvoltage test voltage value > the rated voltage value; Step S222: Connect the input end of the programmable power supply to the test drive plug-in to provide a voltage with a value equal to the rated voltage value for the test drive plug-in; Step S223: The voltage input by the programmable power supply is increased based on the steady-state climbing rate until it reaches the steady-state overvoltage test voltage value, and the moment when the increase starts is recorded as the voltage steady-state initial moment; if the test drive plug-in has not opened the circuit when the steady-state overvoltage test voltage value is reached, an abnormal signal is generated; Step S224: If the test drive plug-in opens the circuit before reaching the steady-state overvoltage test voltage value, record the opening moment, and obtain the voltage change duration by subtracting the voltage steady-state initial moment from the opening moment; the product of the voltage change duration and the steady-state climbing rate plus the rated voltage value gives the actual opening voltage of the test drive plug-in.

[0010] Furthermore, the test process of the overvoltage protection test also includes: Step S225: Compare the actual opening voltage with the preset opening voltage range. If the actual opening voltage is within the preset opening voltage range, calculate the absolute value of the difference between the actual opening voltage and the midpoint of the preset opening voltage range and record it as the steady-state voltage deviation value; if the actual opening voltage is outside the preset opening voltage range, generate an abnormal signal; Step S226: Directly input a voltage with a value equal to the instantaneous overvoltage test voltage value to the test drive plug-in through the programmable power supply, and record the voltage instantaneous response duration from the moment the voltage value is input until the circuit is opened; Step S227: Compare the voltage instantaneous response duration with the voltage instantaneous response duration threshold, If the voltage instantaneous response duration is greater than or equal to the voltage instantaneous response duration threshold, generate an abnormal signal; if the voltage instantaneous response duration is less than the voltage instantaneous response duration threshold, then obtain the voltage instantaneous response deviation value by subtracting the voltage instantaneous response duration from the voltage instantaneous response duration threshold; Step S228: Calculate the voltage test score value DYF of the test drive plug-in. The formula is as follows: DYF = B1×SDY + B2×e / WDY; where SDY is the deviation value of the instantaneous voltage response duration, WDY is the steady-state voltage deviation value, e is the natural constant, and B1 and B2 are weight coefficients with fixed values; Step S229, calculate the voltage test score values of all drive plugins in the same way.

[0011] Furthermore, the test process of the over-temperature protection test is specifically as follows: Step S31, obtain the rated power of multiple groups of power modules, and record any group of power modules as the test power module; Step S32, output current from the test power module at the rated power, and set the steady-state temperature rise rate; Step S33, increase the temperature of the test power module at the steady-state temperature rise rate until the test power module is open-circuited, and record the open-circuit temperature value at the moment of open-circuit; Step S34, compare the open-circuit temperature value with the open-circuit temperature threshold. If the open-circuit temperature value is less than the open-circuit temperature threshold, generate an abnormal signal. If the open-circuit temperature value is greater than or equal to the open-circuit temperature threshold, obtain the open-circuit temperature deviation value by subtracting the open-circuit temperature threshold from the open-circuit temperature value.

[0012] Furthermore, the over-temperature protection test also includes the following sub-steps: Step S35, record the actual current values at all times between the temperature rise moment and the open-circuit moment; where the temperature rise moment is the moment when the test power module starts to increase the temperature at the steady-state temperature rise rate; Step S36, take the absolute value of the difference between the actual current value at any moment and the rated current value of the test power module to obtain the current deviation value at the corresponding moment, and sum up the current deviation values at all times to obtain the total current deviation value of the test power module; Step S37, calculate the over-temperature test score value of the test power module through the formula. The formula is: Over-temperature test score value = open-circuit temperature deviation value ÷ total current deviation value; Step S38, calculate the over-temperature test score values of all power modules in the same way.

[0013] Furthermore, the process of the phase loss protection test is specifically as follows: Step S41, connect the three-phase power supply to the three-phase connection lines of the target switch cabinet, adjust to the test voltage, and record the three-phase power as phase A, phase B, and phase C in sequence; record the real-time voltage value and real-time current value of each phase; Step S42: Calculate the calculated voltage values and calculated current values for three phases A, B, and C; compare the calculated voltage value of each phase with the real-time voltage value, and compare the calculated current value with the real-time current value; if there is any difference in any item, generate an abnormal signal; if each item is the same, proceed to the subsequent steps; Step S42: Disconnect phase A power supply, and record the phase A open-phase reaction duration from the moment when phase A power supply is disconnected to the moment when the target switchgear trips; Step S43: Connect phase A power supply, disconnect phase B power supply, and record the phase B open-phase reaction duration from the moment when phase B power supply is disconnected to the moment when the target switchgear trips; connect phase B power supply, disconnect phase C power supply, and record the phase C open-phase reaction duration from the moment when phase C power supply is disconnected to the moment when the target switchgear trips; Step S44: Compare the maximum value among the phase A open-phase reaction duration, phase B open-phase reaction duration, and phase C open-phase reaction duration with the open-phase reaction duration threshold; if the maximum value is greater than or equal to the open-phase reaction duration threshold, generate an abnormal signal; if the maximum value is less than the open-phase reaction duration threshold, mark the target switchgear as normal for open-phase test.

[0014] Further, the said Step S5 includes the following sub-steps: Step S51: Obtain the open-phase test result, over-temperature test result, over-voltage test result, and over-current test result of the target switchgear; Step S52: Compare the voltage test score values of all drive plugins with the corresponding voltage score thresholds; if the voltage test score value of any drive plugin is less than the voltage score threshold, generate an abnormal signal; If the voltage test score values of all drive plugins are greater than or equal to the voltage score thresholds, mark the target switchgear as normal for over-voltage test; Step S53: Compare the current test score values of all drive plugins with the corresponding current score thresholds; if the current test score value of any drive plugin is less than the current score threshold, generate an abnormal signal; If the current test score values of all drive plugins are greater than or equal to the current score thresholds, mark the target switchgear as normal for over-current test; Step S54: Compare the over-temperature test score values of all power modules with the corresponding over-temperature score thresholds; if the over-temperature test score value of any power module is less than the over-temperature score threshold, generate an abnormal signal; If the over-temperature test score values of all power modules are greater than or equal to the over-temperature score thresholds, mark the target switchgear as normal for over-temperature test; Step S55: If the test result of any item is an abnormal signal, mark the reliability of the target switchgear as abnormal; If all the test results of the target switchgear cabinet are normal, the reliability of the target switchgear cabinet is recorded as normal.

[0015] In summary, due to the adoption of the above technical solutions, the beneficial effects of the present invention are as follows: 1. The present invention first collects the rated voltage values and rated current values of multiple groups of drive plug-ins and power modules in the target switchgear cabinet; then, electrical variable protection tests are performed on each group of drive plug-ins in the target switchgear cabinet to obtain the electrical variable protection test results of the corresponding drive plug-ins; the present invention realizes the electrical performance protection test of the target switchgear cabinet. 2. The present invention performs over-temperature protection tests on each group of power modules in the target switchgear cabinet to obtain the over-temperature test results of the corresponding power modules; then, a phase loss protection test is performed on the target switchgear cabinet to obtain the phase loss test results corresponding to the target switchgear cabinet; finally, based on all the test results corresponding to the target switchgear cabinet, the reliability of the target switchgear cabinet is evaluated based on the test results, and the present invention realizes the accurate evaluation of the operation reliability of the switchgear cabinet. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] For the convenience of those skilled in the art to understand, the present invention will be further described below with reference to the accompanying drawings.

[0017] Figure 1 is the overall method flow chart of the present invention; Figure 2 is the structural schematic diagram of the switchgear cabinet in the present invention; Figure 3 is the schematic diagram of the mechanism of the computer device designed by the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0018] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0019] Embodiment 1, please refer to Figure 1 and Figure 2 As shown, the technical solution provided by the present invention is: a method for evaluating the operation reliability of a switchgear cabinet, which sequentially performs overcurrent protection tests, overvoltage protection tests, over-temperature protection tests, and phase loss protection tests on the target switchgear cabinet, evaluates the ability of the target switchgear cabinet to handle faults based on different test results, and then obtains the reliability level of the target switchgear cabinet. Such as Figure 2As shown, the target switchgear cabinet includes load terminals, signal terminals, multiple groups of power modules, and multiple groups of drive plugs. The power modules supply electrical energy to the drive plugs through the power inlet line. The drive plugs control the operating states such as the start and stop of the power modules according to the signal terminals, and provide stable electrical energy to the outside world based on the load terminals connected to the power modules. Specifically, the main power inlet line uses a three-phase five-wire copper bar inlet line, and the drive plugs use aviation plug structures; the inlet line of the power modules uses a three-phase five-wire copper bar to the power inlet line, and acrylic plates are used to isolate and protect the copper bar.

[0020] In the present invention, the reliability evaluation method is specifically as follows: Step S1, collect the rated voltage values and rated current values of multiple groups of drive plugs and power modules in the target switchgear cabinet.

[0021] Step S2, conduct electrical variable protection tests on each group of drive plugs in the target switchgear cabinet to obtain the electrical variable protection test results of the corresponding drive plugs; Among them, the electrical variable protection test includes overcurrent protection test and overvoltage protection test In this embodiment, the test process of the overcurrent protection test is specifically as follows: Step S211, select any group of drive plugs as the test drive plug, and obtain the rated current value corresponding to the test drive plug; based on the rated current, set the steady-state overcurrent test current value and the instantaneous overcurrent test current value for the corresponding drive plug; Specifically, the steady-state overcurrent test current value can be 1.5 times the rated current value corresponding to the test drive plug, and the instantaneous overcurrent test current value can be 10 times the rated current value corresponding to the test drive plug; Step S212, connect the output end of the large current generator to the load terminal of the test drive plug, and set the current waveform of the steady-state overcurrent test current value (such as a 50Hz sine wave); Step S213, continuously send an alternating current with a value of the steady-state overcurrent test current value to the test drive plug, and record the corresponding moment as the steady-state test start moment; measure the break moment of the test drive plug, and obtain the steady-state test response duration of the corresponding test drive plug by subtracting the steady-state test start moment from the break moment; Among them, the break moment is the moment when the circuit breaker in the target switchgear cabinet starts to work. The circuit breaker is an automatic protection electrical appliance used to cut off the circuit in case of overload in the circuit to prevent equipment damage; Step S214, provide an alternating current with a value of the instantaneous overcurrent test current value to the test drive plug through the large current generator; obtain the instantaneous test response duration by subtracting the current injection moment from the break moment; Step S215, calculate the steady-state test duration threshold WYZ and the instantaneous test duration threshold SYZ of the test drive plug-in through formulas; Among them, the calculation formula of the steady-state test duration threshold is specifically as follows: ; In the formula, K is the time constant, WDL is the steady-state overcurrent test current value of the test drive plug-in, EDL is the rated current value of the test drive plug-in, and a is the curve type coefficient, usually taking the value of 0.02; The calculation formula of the instantaneous test duration threshold is specifically as follows: ; In the formula, SDL is the instantaneous overcurrent test current value of the test drive plug-in, and b is the curve type coefficient, usually taking the value of 1; Step S216, compare the steady-state test response duration of the test drive plug-in with the steady-state test duration threshold. If the steady-state test response duration is greater than or equal to the steady-state test duration threshold, generate an abnormal signal; if the steady-state test response duration is less than the steady-state test duration threshold, obtain the steady-state current response difference by subtracting the steady-state test response duration from the steady-state test duration threshold; the larger the steady-state current response difference, the more effective the test drive plug-in's response to the steady-state overcurrent situation; Step S217, compare the instantaneous test response duration of the test drive plug-in with the instantaneous test duration threshold. If the instantaneous test response duration is greater than or equal to the instantaneous test duration threshold, generate an abnormal signal; if the instantaneous test response duration is less than the instantaneous test duration threshold, obtain the instantaneous current response difference by subtracting the instantaneous test response duration from the instantaneous test duration threshold; the larger the instantaneous current response difference, the more effective the test drive plug-in's response to the instantaneous overcurrent situation; Step S218, calculate the current test score value DLF corresponding to the test drive plug-in. The formula is specifically as follows: DLF = A1×SDL + A2×WDL; In the formula, SDL is the instantaneous current response difference, WDL is the steady-state current response difference, and A1 and A2 are weight coefficients with fixed values; the larger the current test score value, the better the corresponding drive plug-in's response to the overcurrent test; Step S219, similarly obtain the current test score values of all drive plug-ins.

[0022] In this embodiment, the test process of overvoltage protection test is specifically as follows: Step S221, obtain the rated voltage value corresponding to the test drive plug-in, and set the steady-state overvoltage test voltage value and the instantaneous overvoltage test voltage value of the test drive plug-in based on the rated voltage value; at the same time, set the steady-state climb rate of the steady-state overvoltage test voltage value; Among them, the instantaneous overvoltage test voltage value > the steady-state overvoltage test voltage value > the rated voltage value; Step S222: Connect the input terminal of the programmable power supply to the test drive plug-in to provide a voltage with a value equal to the rated voltage value for the test drive plug-in. Step S223: The voltage input by the programmable power supply is increased based on the steady-state climb rate until the steady-state overvoltage test voltage value is reached. Record the moment when the increase starts as the voltage steady-state initial moment. If the test drive plug-in has not opened the circuit when the steady-state overvoltage test voltage value is reached, an abnormal signal is generated. Step S224: If the test drive plug-in opens the circuit before reaching the steady-state overvoltage test voltage value, record the moment of opening the circuit. Subtract the voltage steady-state initial moment from the moment of opening the circuit to obtain the voltage change duration. Multiply the voltage change duration by the steady-state climb rate and then add the rated voltage value to obtain the actual opening voltage of the test drive plug-in. Step S225: Compare the actual opening voltage with the preset opening voltage range. If the actual opening voltage is within the preset opening voltage range, calculate the absolute value of the difference between the actual opening voltage and the midpoint of the preset opening voltage range and record it as the steady-state voltage deviation value. If the actual opening voltage is outside the preset opening voltage range, an abnormal signal is generated. The smaller the steady-state voltage deviation value, the more accurate the response of the test drive plug-in to the steady-state overvoltage situation. Specifically, the left endpoint of the preset opening voltage range can be 0.9 times the preset opening voltage, and the right endpoint of the preset opening voltage range can be 1.1 times the preset opening voltage. The preset opening voltage is a pre-set value. When the voltage of the voltage circuit reaches the corresponding value, the circuit is automatically opened. Step S226: Directly input a voltage with a value equal to the instantaneous overvoltage test voltage value to the test drive plug-in through the programmable power supply, and record the voltage instantaneous response duration from the moment the voltage value is input until the circuit is opened. Step S227: Compare the voltage instantaneous response duration with the voltage instantaneous response duration threshold. If the voltage instantaneous response duration is greater than or equal to the voltage instantaneous response duration threshold, an abnormal signal is generated. If the voltage instantaneous response duration is less than the voltage instantaneous response duration threshold, subtract the voltage instantaneous response duration from the voltage instantaneous response duration threshold to obtain the voltage instantaneous response deviation value. The larger the voltage instantaneous response deviation value, the more timely the test drive plug-in processes the instantaneous overvoltage situation. Among them, the voltage instantaneous response duration threshold is a pre-set parameter, and the common value is 200 milliseconds. Step S228: Calculate the voltage test score value DYF of the test drive plug-in. The specific formula is as follows: DYF = B1×SDY + B2×e / WDY; where SDY is the deviation value of the instantaneous voltage response duration, WDY is the steady-state voltage deviation value, e is the natural constant, and B1 and B2 are weight coefficients with fixed values; the larger the voltage test score value, the better the corresponding drive plug-in responds to overvoltage testing; Step S229, similarly calculate the voltage test score values of all drive plug-ins.

[0023] Step S3, perform over-temperature protection testing on each group of power modules in the target switchgear cabinet to obtain the over-temperature test results of the corresponding power modules; In this embodiment, step S3 includes the following sub-steps: Step S31, obtain the rated power of multiple groups of power modules, and denote any group of power modules as the test power module; Step S32, output current from the test power module at the rated power and set the steady-state heating rate; specifically, the steady-state heating rate can be 1 °C / min; Step S33, increase the temperature of the test power module at the steady-state heating rate until the test power module is open-circuited, and record the open-circuit temperature value at the moment of open-circuit; Step S34, compare the open-circuit temperature value with the open-circuit temperature threshold. If the open-circuit temperature value is less than the open-circuit temperature threshold, generate an abnormal signal. If the open-circuit temperature value is greater than or equal to the open-circuit temperature threshold, obtain the open-circuit temperature deviation value by subtracting the open-circuit temperature threshold from the open-circuit temperature value; the larger the open-circuit temperature deviation value, the better the high-temperature resistance performance of the power module; Step S35, record the actual current values at all times between the heating start time and the open-circuit time; where the heating start time is the time when the test power module starts to increase its temperature at the steady-state heating rate; Step S36, take the absolute value of the difference between the actual current value at any time and the rated current value of the test power module to obtain the current deviation value at the corresponding time, and sum up the current deviation values at all times to obtain the total current deviation value of the test power module; where the larger the total current deviation value, the more unstable the current output by the power module; Step S37, calculate the over-temperature test score value of the test power module through the formula. The formula is: Over-temperature test score value = open-circuit temperature deviation value ÷ total current deviation value; the larger the over-temperature test score value, the better the test strategy module responds to over-temperature testing; Step S38, similarly calculate the over-temperature test score values of all power modules.

[0024] Step S4, perform open-phase protection testing on the target switchgear cabinet to obtain the corresponding open-phase test results of the target switchgear cabinet; In this embodiment, the process of the open-phase protection test is as follows: Step S41: Connect the three-phase power supply to the three-phase connection lines of the target switchgear cabinet, adjust to the test voltage, and sequentially record the three-phase electricity as phase A, phase B, and phase C in order; record the real-time voltage value and real-time current value of each phase. Step S42: Calculate the calculated voltage value and calculated current value of phases A, B, and C; compare the calculated voltage value of each phase with the real-time voltage value, and compare the calculated current value with the real-time current value; if any item is different, generate an abnormal signal; if each item is the same, proceed to the subsequent steps. Among them, the calculation methods of the calculated voltage value and calculated current value of phases A, B, and C depend on the connection method of the three-phase electricity; specifically, if the connection method of the three-phase electricity is star connection, the calculated voltage value of each phase is the line voltage multiplied by the square root of three divided by three; the calculated current value of each phase is the same as the line current. If the connection method of the three-phase electricity is delta connection, the calculated voltage value of each phase is the same as the line voltage, and the calculated current value of each phase is the line current multiplied by the square root of three divided by three. Among them, the line current and line voltage are the current value and voltage value flowing through the power supply inlet wire. Step S42: Disconnect phase A electricity, and record the phase A open-phase reaction duration from the moment when phase A electricity is disconnected to the moment when the target switchgear cabinet is open-circuited. Step S43: Connect phase A electricity, disconnect phase B electricity, and record the phase B open-phase reaction duration from the moment when phase B electricity is disconnected to the moment when the target switchgear cabinet is open-circuited; connect phase B electricity, disconnect phase C electricity, and record the phase C open-phase reaction duration from the moment when phase C electricity is disconnected to the moment when the target switchgear cabinet is open-circuited. Compare the maximum value among the phase A open-phase reaction duration, phase B open-phase reaction duration, and phase C open-phase reaction duration with the open-phase reaction duration threshold; if the maximum value is greater than or equal to the open-phase reaction duration threshold, generate an abnormal signal; if the maximum value is less than the open-phase reaction duration threshold, record the target switchgear cabinet as normal for open-phase test.

[0025] Step S5: Synthesize all the test results corresponding to the target switchgear cabinet, and evaluate the reliability of the target switchgear cabinet based on the test results. In this embodiment, step S5 includes the following sub-steps: Step S51: Obtain the open-phase test result, over-temperature test result, over-voltage test result, and over-current test result of the target switchgear cabinet. Step S52: Compare the voltage test score values of all drive plugins with the corresponding voltage score thresholds. If the voltage test score value of any drive plugin is less than the voltage score threshold, generate an abnormal signal. If the voltage test score values of all drive plugins are greater than or equal to the voltage score threshold, record the target switchgear cabinet as normal for over-voltage test. Step S53: Compare the current test score values of all drive plugins with the corresponding current score thresholds. If the current test score value of any drive plugin is less than the current test score threshold, an abnormal signal is generated. If the current test score values of all drive plugins are greater than or equal to the current test score thresholds, the target switchgear cabinet is marked as normal for overcurrent test. Step S54: Compare the overtemperature test score values of all power modules with the corresponding overtemperature score thresholds. If the overtemperature test score value of any power module is less than the overtemperature test score threshold, an abnormal signal is generated. If the overtemperature test score values of all power modules are greater than or equal to the overtemperature test score thresholds, the target switchgear cabinet is marked as normal for overtemperature test. Step S55: If the test result of any item is an abnormal signal, the reliability of the target switchgear cabinet is marked as abnormal. If all the test results of the target switchgear cabinet are normal for testing, the reliability of the target switchgear cabinet is marked as normal.

[0026] In this application, if there are corresponding calculation formulas, the above calculation formulas are all dimensionless and take their numerical values for calculation. Coefficients such as weight coefficients and proportionality coefficients in the formulas are set to obtain a result value by quantifying each parameter. Regarding the magnitudes of the weight coefficient and the proportionality coefficient, as long as the proportional relationship between the parameters and the result value is not affected.

[0027] Embodiment 2 Figure 3 It is a schematic structural diagram of a computer device, which may include: a processor, a communications interface, a memory, and a communication bus. Among them, the processor, the communications interface, and the memory complete mutual communication through the communication bus. The processor can call the logical instructions in the memory to execute a method for evaluating the operating reliability of a switchgear cabinet, and the method includes: collecting the rated voltage values and rated current values of multiple groups of drive plugins and power modules in the target switchgear cabinet; performing electro-variable protection tests on each group of drive plugins in the target switchgear cabinet to obtain the electro-variable protection test results of the corresponding drive plugins; performing overtemperature protection tests on each group of power modules in the target switchgear cabinet to obtain the overtemperature test results of the corresponding power modules; performing open-phase protection tests on the target switchgear cabinet to obtain the open-phase test results corresponding to the target switchgear cabinet; comprehensively considering all the test results corresponding to the target switchgear cabinet, and evaluating the reliability of the target switchgear cabinet based on the test results.

[0028] In addition, when the logic instructions in the above-mentioned memory can be implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of this application. The foregoing storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), magnetic disks, or optical discs that can store program codes.

[0029] On the other hand, this application also provides a computer program product. The computer program product includes a computer program stored on a computer-readable storage medium. The computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute a method for evaluating the operation reliability of a switchgear cabinet provided by the above-mentioned various methods. The method includes: collecting the rated voltage values and rated current values of multiple groups of drive plugins and power modules in the target switchgear cabinet; performing electrical variable protection tests on each group of drive plugins in the target switchgear cabinet to obtain the electrical variable protection test results of the corresponding drive plugins; performing over-temperature protection tests on each group of power modules in the target switchgear cabinet to obtain the over-temperature test results of the corresponding power modules; performing open-phase protection tests on the target switchgear cabinet to obtain the open-phase test results corresponding to the target switchgear cabinet; and comprehensively considering all the test results corresponding to the target switchgear cabinet and evaluating the reliability of the target switchgear cabinet based on the test results.

[0030] On another aspect, this application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, it is implemented to execute a method for evaluating the operation reliability of a switchgear cabinet provided by the above-mentioned various methods. The method includes: collecting the rated voltage values and rated current values of multiple groups of drive plugins and power modules in the target switchgear cabinet; performing electrical variable protection tests on each group of drive plugins in the target switchgear cabinet to obtain the electrical variable protection test results of the corresponding drive plugins; performing over-temperature protection tests on each group of power modules in the target switchgear cabinet to obtain the over-temperature test results of the corresponding power modules; performing open-phase protection tests on the target switchgear cabinet to obtain the open-phase test results corresponding to the target switchgear cabinet; and comprehensively considering all the test results corresponding to the target switchgear cabinet and evaluating the reliability of the target switchgear cabinet based on the test results.

[0031] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. A person of ordinary skill in the art can understand and implement it without creative labor.

[0032] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus a necessary general hardware platform, and of course, it can also be implemented by hardware. Based on this understanding, the essence of the above technical solution, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0033] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and are not intended to limit them. Although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments or perform equivalent replacements for some of the technical features. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for evaluating the operation reliability of a switchgear, characterized in that, The method includes: Step S1, collecting the rated voltage values and rated current values of multiple groups of drive plugins and power modules in the target switchgear cabinet; Step S2, performing electrical variable protection tests on each group of drive plugins in the target switchgear cabinet to obtain the electrical variable protection test results of the corresponding drive plugins; among them, the electrical variable protection test includes overcurrent protection test and overvoltage protection test; Step S3, performing overtemperature protection tests on each group of power modules in the target switchgear cabinet to obtain the overtemperature test results of the corresponding power modules; Step S4, performing open-phase protection tests on the target switchgear cabinet to obtain the open-phase test results corresponding to the target switchgear cabinet; Step S5, comprehensively considering all the test results corresponding to the target switchgear cabinet, and evaluating the reliability of the target switchgear cabinet based on the test results.

2. The method for evaluating the operating reliability of a switchgear cabinet according to claim 1, wherein The test process of the overcurrent protection test is specifically as follows: Step S211, select any group of drive plugins as the test drive plugin, and obtain the rated current value corresponding to the test drive plugin; based on the rated current, set the steady-state overcurrent test current value and the instantaneous overcurrent test current value of the corresponding drive plugin; Step S212, connect the output terminal of the large current generator to the load terminal of the test drive plugin, and set the current waveform of the steady-state overcurrent test current value; Step S213, continuously send an alternating current with a value of the steady-state overcurrent test current value to the test drive plugin, and record the corresponding moment as the steady-state test start moment; measure the opening moment of the test drive plugin, and obtain the steady-state test response duration of the corresponding test drive plugin by subtracting the steady-state test start moment from the opening moment; Step S214, provide an alternating current with a value of the instantaneous overcurrent test current value to the test drive plugin through the large current generator; obtain the instantaneous test response duration by subtracting the current injection moment from the opening moment.

3. The method for evaluating the operation reliability of a switchgear cabinet according to claim 2, characterized in that, The test process of the overcurrent protection test further includes: Step S215, calculate the steady-state test duration threshold WYZ and the instantaneous test duration threshold SYZ of the test drive plugin through a formula; Step S216, compare the steady-state test response duration of the test drive plugin with the steady-state test duration threshold. If the steady-state test response duration is greater than or equal to the steady-state test duration threshold, generate an abnormal signal; if the steady-state test response duration is less than the steady-state test duration threshold, obtain the steady-state current response difference by subtracting the steady-state test response duration from the steady-state test duration threshold; Step S217, compare the instantaneous test response duration of the test drive plugin with the instantaneous test duration threshold. If the instantaneous test response duration is greater than or equal to the instantaneous test duration threshold, generate an abnormal signal; if the instantaneous test response duration is less than the instantaneous test duration threshold, obtain the instantaneous current response difference by subtracting the instantaneous test response duration from the instantaneous test duration threshold; Step S218, calculate the current test score value DLF corresponding to the test drive plugin. The formula is specifically as follows: DLF = A1×SDL + A2×WDL; where SDL is the instantaneous current response difference, WDL is the steady-state current response difference, and A1 and A2 are weighting coefficients with fixed values; Step S219, similarly obtain the current test score values of all drive plugins.

4. A method for evaluating the operating reliability of a switchgear cabinet according to claim 3, characterized in that, The calculation formula for the steady-state test duration threshold is as follows: ; where K is the time constant, WDL is the steady-state overcurrent test current value of the test drive plug-in, EDL is the rated current value of the test drive plug-in, and a is the curve type coefficient; The calculation formula for the instantaneous test duration threshold is as follows: ; where SDL is the instantaneous overcurrent test current value of the test drive plug-in, and b is the curve type coefficient.

5. The method for evaluating the operating reliability of a switchgear cabinet according to claim 2, characterized in that, The test process of the overvoltage protection test is as follows: Step S221: Obtain the rated voltage value corresponding to the test drive plug-in, and set the steady-state overvoltage test voltage value and the instantaneous overvoltage test voltage value of the test drive plug-in based on the rated voltage value; at the same time, set the steady-state climbing rate of the steady-state overvoltage test voltage value. Among them, the instantaneous overvoltage test voltage value > the steady-state overvoltage test voltage value > the rated voltage value; Step S222: Connect the input end of the programmable power supply to the test drive plug-in to provide a voltage with a value equal to the rated voltage value for the test drive plug-in. Step S223: The voltage input by the programmable power supply is increased based on the steady-state climbing rate until it reaches the steady-state overvoltage test voltage value. Record the moment when the increase starts as the voltage steady-state initial moment; if the test drive plug-in has not opened the circuit when the steady-state overvoltage test voltage value is reached, an abnormal signal is generated. Step S224: If the test drive plug-in opens the circuit before reaching the steady-state overvoltage test voltage value, record the moment of opening the circuit, and obtain the voltage change duration by subtracting the voltage steady-state initial moment from the moment of opening the circuit; the product of the voltage change duration and the steady-state climbing rate plus the rated voltage value gives the actual open-circuit voltage of the test drive plug-in.

6. The method for evaluating the operating reliability of a switchgear cabinet according to claim 5, characterized in that, The test process of the overvoltage protection test also includes: Step S225: Compare the actual open-circuit voltage with the preset open-circuit voltage range. If the actual open-circuit voltage is within the preset open-circuit voltage range, calculate the absolute value of the difference between the actual open-circuit voltage and the midpoint of the preset open-circuit voltage range and record it as the steady-state voltage deviation value; if the actual open-circuit voltage is outside the preset open-circuit voltage range, an abnormal signal is generated. Step S226: Directly input a voltage with a value equal to the instantaneous overvoltage test voltage value to the test drive plug-in through the programmable power supply, and record the voltage instantaneous response duration from the moment the voltage value is input until the circuit is opened. Step S227: Compare the voltage instantaneous response duration with the voltage instantaneous response duration threshold. If the voltage instantaneous response duration is greater than or equal to the voltage instantaneous response duration threshold, an abnormal signal is generated; if the voltage instantaneous response duration is less than the voltage instantaneous response duration threshold, then obtain the voltage instantaneous response deviation value by subtracting the voltage instantaneous response duration from the voltage instantaneous response duration threshold. Step S228: Calculate the voltage test score value DYF of the test drive plug-in. The formula is as follows: DYF = B1×SDY + B2×e / WDY; where SDY is the voltage instantaneous response duration deviation value, WDY is the steady-state voltage deviation value, e is the natural constant, and B1 and B2 are weight coefficients with fixed values. Step S229: Similarly, calculate the voltage test score values of all drive plug-ins.

7. A method for evaluating the operation reliability of a switchgear cabinet according to claim 1, characterized in that, The test process of the overtemperature protection test is as follows: Step S31: Obtain the rated power of multiple groups of power modules, and record any group of power modules as the test power module. Step S32: Output current from the test power module at the rated power and set the steady-state temperature rise rate. Step S33: Increase the temperature of the test power module at the steady-state temperature rise rate until the test power module opens the circuit, and record the open-circuit temperature value at the moment of opening the circuit. Step S34: Compare the open - circuit temperature value with the open - circuit temperature threshold. If the open - circuit temperature value is less than the open - circuit temperature threshold, an abnormal signal is generated. If the open - circuit temperature value is greater than or equal to the open - circuit temperature threshold, the open - circuit temperature deviation value is obtained by subtracting the open - circuit temperature threshold from the open - circuit temperature value.

8. A method for evaluating the operating reliability of a switchgear cabinet according to claim 7, characterized in that The over - temperature protection test further includes the following sub - steps: Step S35: Record the actual current values at all times between the temperature - rising moment and the open - circuit moment; where the temperature - rising moment is the moment when the test power module starts to increase the temperature at a steady - state temperature - rising rate. Step S36: Take the absolute value of the difference between the actual current value at any time and the rated current value of the test power module to obtain the current deviation value at the corresponding time, and sum up the current deviation values at all times to obtain the total current deviation value of the test power module. Step S37: Calculate the over - temperature test score value of the test power module through the formula. The formula is: Over - temperature test score value = open - circuit temperature deviation value÷total current deviation value; Step S38: Similarly, calculate the over - temperature test score values of all power modules.

9. A method for evaluating the operating reliability of a switchgear cabinet according to claim 1, characterized in that, The process of the phase - loss protection test is as follows: Step S41: Connect the three - phase power supply to the three - phase connection lines of the target switchgear cabinet, adjust to the test voltage, and sequentially record the three - phase electricity as phase A, phase B, and phase C; record the real - time voltage value and real - time current value of each phase. Step S42: Calculate the calculated voltage value and calculated current value of phases A, B, and C; compare the calculated voltage value of each phase with the real - time voltage value, and compare the calculated current value with the real - time current value; if there is any difference in any item, an abnormal signal is generated; if each item is the same, proceed to the subsequent steps. Step S42: Disconnect phase A electricity, and record the phase - A phase - loss reaction duration between the moment when phase A electricity is disconnected and the moment when the target switchgear cabinet is open - circuited. Step S43: Connect phase A electricity, disconnect phase B electricity, and record the phase - B phase - loss reaction duration between the moment when phase B electricity is disconnected and the moment when the target switchgear cabinet is open - circuited. Connect phase B electricity, disconnect phase C electricity, and record the phase - C phase - loss reaction duration between the moment when phase C electricity is disconnected and the moment when the target switchgear cabinet is open - circuited. Compare the maximum value among the phase - A phase - loss reaction duration, phase - B phase - loss reaction duration, and phase - C phase - loss reaction duration with the phase - loss reaction duration threshold; if the maximum value is greater than or equal to the phase - loss reaction duration threshold, an abnormal signal is generated; if the maximum value is less than the phase - loss reaction duration threshold, mark the target switchgear cabinet as normal for the phase - loss test.

10. The method for evaluating the operation reliability of a switchgear cabinet according to claim 1, wherein Step S5 includes the following sub - steps: Step S51: Obtain the phase - loss test result, over - temperature test result, over - voltage test result, and over - current test result of the target switchgear cabinet. Step S52: Compare the voltage test score values of all drive plugs with the corresponding voltage score thresholds. If the voltage test score value of any drive plug is less than the voltage test score threshold, an abnormal signal is generated. If the voltage test score values of all drive plugs are greater than or equal to the voltage test score thresholds, mark the target switchgear cabinet as normal for the over - voltage test. Step S53: Compare the current test score values of all drive plugins with the corresponding current score thresholds. If the current test score value of any drive plugin is less than the current test score threshold, an abnormal signal is generated; If the current test score values of all drive plugins are greater than or equal to the current test score threshold, mark the target switchgear cabinet as normal for overcurrent test; Step S54: Compare the overtemperature test score values of all power modules with the corresponding overtemperature score thresholds. If the overtemperature test score value of any power module is less than the overtemperature test score threshold, an abnormal signal is generated; If the overtemperature test score values of all power modules are greater than or equal to the overtemperature test score threshold, mark the target switchgear cabinet as normal for overtemperature test; Step S55: If the test result of any item is an abnormal signal, mark the reliability of the target switchgear cabinet as abnormal; If all the test results of the target switchgear cabinet are normal for the test, mark the reliability of the target switchgear cabinet as normal.

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