Flash memory chip test method, device and system, electronic equipment and storage medium

Abstract

The embodiment of the invention discloses a test method, device and system of a flash memory chip, electronic equipment and a storage medium, the test method, device and system are applied to the electronic equipment, the electronic equipment comprises the flash memory chip, and the method comprises the following steps: determining a first test mode of the flash memory chip; acquiring a reference test environment parameter and a reference test standard parameter corresponding to the first test mode; determining a first test environment parameter of the flash memory chip; determining a first deviation degree between the reference test environment parameter and the first test environment parameter; adjusting the reference test standard parameter according to the first deviation degree to obtain a target test standard parameter; and testing the flash memory chip according to the target test standard parameter and the first test mode. By adopting the embodiment of the invention, the test intelligence of the flash memory chip can be improved, and the performance of the flash memory chip is further improved.

Description

Technical Field

[0001] This application relates to the field of electronic technologies, and particularly to a method, apparatus, system, electronic device, and storage medium for testing a flash memory chip. Background Art

[0002] With the rapid development of electronic technologies, the use of flash memory chips has become increasingly popular. In the actual use process, the requirements for flash memory chips have also become higher. To a certain extent, the depth of the test requirements for flash memory chips determines the performance height of flash memory chips. Therefore, the problem of how to improve the intelligence of flash memory chip testing and further improve the performance of flash memory chips needs to be solved urgently. Summary of the Invention

[0003] Embodiments of this application provide a method, apparatus, system, electronic device, and storage medium for testing a flash memory chip, which can improve the intelligence of flash memory chip testing and further improve the performance of flash memory chips.

[0004] In a first aspect, an embodiment of this application provides a method for testing a flash memory chip, which is applied to an electronic device. The electronic device includes a flash memory chip. The method includes:

[0005] Determine a first test mode of the flash memory chip;

[0006] Obtain reference test environment parameters and reference test standard parameters corresponding to the first test mode;

[0007] Determine first test environment parameters of the flash memory chip;

[0008] Determine a first deviation degree between the reference test environment parameters and the first test environment parameters;

[0009] Adjust the reference test standard parameters according to the first deviation degree to obtain target test standard parameters;

[0010] Test the flash memory chip according to the target test standard parameters and the first test mode.

[0011] In a second aspect, an embodiment of this application provides a device for testing a flash memory chip, which is applied to an electronic device. The electronic device includes a flash memory chip. The device includes: a determination unit, an acquisition unit, an adjustment unit, and a test unit, where

[0012] The determination unit is configured to determine a first test mode of the flash memory chip;

[0013] The acquisition unit is configured to obtain reference test environment parameters and reference test standard parameters corresponding to the first test mode;

[0014] The determining unit is further configured to determine first test environment parameters of the flash memory chip; and determine a first deviation degree between the reference test environment parameters and the first test environment parameters.

[0015] The adjusting unit is configured to adjust the reference test standard parameters according to the first deviation degree to obtain target test standard parameters.

[0016] The testing unit is configured to test the flash memory chip according to the target test standard parameters and the first test mode.

[0017] In a third aspect, an embodiment of the present application provides a testing system for a flash memory chip. The testing system for the flash memory chip includes the testing device for the flash memory chip described in the second aspect.

[0018] In a fourth aspect, an embodiment of the present application provides an electronic device, including a processor, a memory, a communication interface, and one or more programs. Wherein, the above one or more programs are stored in the above memory and are configured to be executed by the above processor. The above programs include instructions for executing the steps in the first aspect of the embodiments of the present application.

[0019] In a fifth aspect, an embodiment of the present application provides a computer-readable storage medium. Wherein, the computer-readable storage medium stores a computer program for electronic data exchange. Wherein, the computer program enables a computer to execute some or all of the steps described in the first aspect of the embodiments of the present application.

[0020] In a sixth aspect, an embodiment of the present application provides a computer program product. Wherein, the computer program product includes a non-transitory computer-readable storage medium storing a computer program. The computer program is operable to enable a computer to execute some or all of the steps described in the first aspect of the embodiments of the present application. The computer program product may be a software installation package.

[0021] Implementing the embodiments of the present application has the following beneficial effects:

[0022] It can be seen that the test method, device, system, electronic device and storage medium of the flash memory chip described in the embodiments of the present application are applied to an electronic device. The electronic device includes a flash memory chip. Determine the first test mode of the flash memory chip, obtain the reference test environment parameters and reference test standard parameters corresponding to the first test mode, determine the first test environment parameters of the flash memory chip, determine the first deviation degree between the reference test environment parameters and the first test environment parameters, adjust the reference test standard parameters according to the first deviation degree to obtain the target test standard parameters, and test the flash memory chip according to the target test standard parameters and the first test mode. On the one hand, the first test mode reflects the required test content, and the corresponding standard test environment and standard test parameters can be determined based on the required test content. On the other hand, that is, the difference degree between the actual test environment and the standard test environment dynamically adjusts the test standard parameters in the standard situation, which helps to ensure the accuracy of the test results. Therefore, the intelligence of the flash memory chip test can be improved, and the performance of the flash memory chip can be further improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0024] Figure 1 is a flowchart of a test method for a flash memory chip provided by an embodiment of the present application;

[0025] Figure 2 is a schematic structural diagram of an electronic device provided by an embodiment of the present application;

[0026] Figure 3 is a schematic structural diagram of another electronic device provided by an embodiment of the present application;

[0027] Figure 4 is a block diagram of the functional units of a test device for a flash memory chip provided by an embodiment of the present application;

[0028] Figure 5 is a schematic structural diagram of a test system for a flash memory chip provided by an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0029] To enable those skilled in the art to better understand the solution of this application, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in this application without creative efforts shall fall within the protection scope of this application.

[0030] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally further include steps or units not listed, or may optionally further include other steps or units inherent to these processes, methods, products or devices.

[0031] Referring to "embodiment" herein means that a specific feature, structure or characteristic described in connection with the embodiment may be included in at least one embodiment of this application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein may be combined with other embodiments.

[0032] In the embodiments of this application, the electronic device involved may be a device with communication capabilities. The electronic device may include various handheld devices with wireless communication functions, vehicle-mounted devices (such as dash cams, in-vehicle cameras, car speakers, etc.), smart home devices, wearable devices (such as smart glasses, smart bracelets, Internet of Things devices (such as smart refrigerators, smart washing machines, smart TVs), smart watches, etc.), computing devices or other processing devices connected to a wireless modem, as well as various forms of user equipment (User Equipment, UE), mobile station (Mobile Station, MS), terminal device, etc.

[0033] In specific implementation, the electronic device may further include a flash chip, and the electronic device can be understood as a test device for testing the flash chip.

[0034] The embodiments of this application will be introduced in detail below.

[0035] Please refer to Figure 1 , Figure 1It is a schematic flowchart of a method for testing a flash memory chip provided by an embodiment of the present application. As shown in the figure, it is applied to an electronic device, and the electronic device includes a flash memory chip. The method for testing a flash memory chip includes:

[0036] 101. Determine a first test mode of the flash memory chip.

[0037] In specific implementation, as Figure 2 shown, the electronic device may include a flash memory chip.

[0038] In an embodiment of the present application, the flash memory chip may have at least one test mode, and different test modes have different test environments and corresponding test standards. The first test mode reflects the required test content.

[0039] In specific implementation, a first test case may be obtained, and first attribute information of the first test case may be obtained, and a first test mode corresponding to the first attribute information may be determined. The first attribute information may include at least one of the following: the name of the test case, the case identifier of the test case, the test purpose of the test case, the test requirements of the test case, the test resource requirement parameters of the test case, etc., which are not limited herein.

[0040] 102. Obtain reference test environment parameters and reference test standard parameters corresponding to the first test mode.

[0041] In specific implementation, a mapping relationship between a preset test mode and test environment parameters may be stored in advance. Furthermore, based on this mapping relationship, reference test environment parameters corresponding to the first test mode may be determined, that is, the corresponding standard test environment and standard test parameters may be determined based on the required test content.

[0042] Correspondingly, a mapping relationship between a preset test mode and test standard parameters may also be stored in advance. Furthermore, based on this mapping relationship, parameter test standard parameters corresponding to the first test mode may be determined.

[0043] Among them, the reference test environment parameters may include at least one of the following: reference hardware environment parameters, reference software environment parameters, reference physical environment parameters, etc., which are not limited herein. The reference hardware environment parameters may include at least one of the following: test voltage, test current, circuit structure parameters, test power, test load level, hardware configuration parameters, etc., which are not limited herein. The reference software environment parameters may include at least one of the following: operating system, network bandwidth, cache size, etc., which are not limited herein. The reference physical environment parameters may include at least one of the following: ambient temperature, ambient humidity, atmospheric pressure, etc., which are not limited herein.

[0044] Among them, the reference test standard parameters can be understood as a range parameter. For example, if the test result is within the preset range, it indicates that the flash memory chip is normal; otherwise, if the test result is not within the preset range, it indicates that the flash memory chip is abnormal.

[0045] 103. Determine the first test environment parameters of the flash memory chip.

[0046] In specific implementation, the first test environment parameters may include at least one of the following: the first hardware environment parameters, the first software environment parameters, the first physical environment parameters, etc., which are not limited herein. The first hardware environment parameters may include at least one of the following: test voltage, test current, circuit structure parameters, test power, test load level, hardware configuration parameters, etc., which are not limited herein. The first software environment parameters may include at least one of the following: operating system, network bandwidth, cache size, etc., which are not limited herein. The first physical environment parameters may include at least one of the following: ambient temperature, ambient humidity, atmospheric pressure, etc., which are not limited herein.

[0047] In specific implementation, detection can be performed at preset time intervals to determine the first test environment parameters of the flash memory chip. The preset time interval can be set in advance or be the system default.

[0048] 104. Determine the first deviation degree between the reference test environment parameters and the first test environment parameters.

[0049] In specific implementation, the first deviation degree = (the first test environment parameter - the reference test environment parameter) / the reference test environment parameter. When the reference test environment parameter is a single test environment parameter, the corresponding first deviation degree can be determined based on this first deviation degree calculation formula. When the reference test environment parameter is multiple test environment parameters, the first deviation degrees corresponding to the multiple test environment parameters can be determined based on this first deviation degree calculation formula, and then these first deviation degrees are weighted and calculated to obtain the final first deviation degree. The weights corresponding to the first deviation degrees of the multiple test environment parameters can be set in advance or be the system default. The weights of the first deviation degrees corresponding to the multiple test environment parameters can be related to their test influence degrees on the flash memory chip in the first test mode.

[0050] Among them, the first deviation degree reflects the difference degree between the actual test environment and the standard test environment.

[0051] Optionally, the reference test environment parameters include reference hardware environment parameters, reference software environment parameters, and reference physical environment parameters; the first test environment parameters include: the first hardware environment parameters, the first software environment parameters, and the first physical environment parameters;

[0052] In step 104 above, to determine the first deviation degree between the reference test environment parameters and the first test environment parameters, it can be implemented in the following manner:

[0053] Determine a reference operation state evaluation value according to the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters;

[0054] Determine a target operation state evaluation value according to the first hardware environment parameters, the first software environment parameters, and the first physical environment parameters;

[0055] Determine the first deviation degree according to the reference operation state evaluation value and the target operation state evaluation value.

[0056] In specific implementation, the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters can reflect the situation of the standard test environment. Furthermore, a reference operation state evaluation value can be determined according to the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters. The reference operation state evaluation value is an overall evaluation of the standard test environment.

[0057] Correspondingly, the first hardware environment parameters, the first software environment parameters, and the first physical environment parameters can reflect the situation of the actual test environment. Furthermore, a target operation state evaluation value can be determined according to the first hardware environment parameters, the first software environment parameters, and the first physical environment parameters. The target operation state evaluation value is an overall evaluation of the actual test environment.

[0058] Furthermore, the first deviation degree can be determined according to the reference operation state evaluation value and the target operation state evaluation value. For example, the first deviation degree = (target operation state evaluation value - reference operation state evaluation value) / reference operation state evaluation value. In this way, on the one hand, the overall evaluation of the standard test environment can be carried out from three dimensions of hardware, software, and physical environment, and the overall evaluation of the actual test environment can be carried out from three dimensions of hardware, software, and physical environment. On the other hand, the first deviation degree can be determined based on the difference between the overall evaluation of the standard test environment and the overall evaluation of the actual test environment, which helps to dynamically adjust the test standard parameters in the standard situation based on the difference degree between the actual test environment and the standard test environment, and is more helpful to ensure the accuracy of the test results. Thus, the intelligence of flash memory chip testing can be improved, and the performance of flash memory chips can be further improved.

[0059] Optionally, for the above step of determining a reference operation state evaluation value according to the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters, it can be implemented in the following manner:

[0060] Determine a first reference operation state evaluation value according to the reference hardware environment parameters;

[0061] Determine the second reference running state evaluation value according to the reference software environment parameters;

[0062] Obtain the first weight pair corresponding to the reference physical environment parameters;

[0063] Perform a weighted operation according to the first reference running state evaluation value, the second reference running state evaluation value, and the first weight pair to obtain the reference running state evaluation value.

[0064] In specific implementation, the mapping relationship between the preset hardware environment parameters and the running state evaluation value can be stored in advance. Furthermore, based on this mapping relationship, the first reference running state evaluation value corresponding to the reference hardware environment parameters can be determined. The mapping relationship between the preset software environment parameters and the running state evaluation value can also be stored in advance. Furthermore, based on this mapping relationship, the second reference running state evaluation value corresponding to the reference software environment parameters can be determined. The mapping relationship between the preset physical environment parameters and the weight pair can also be stored in advance. Furthermore, based on this mapping relationship, the first weight pair corresponding to the reference physical environment parameters can be obtained. The weight pair can include two weights, and the sum of the two weights is 1.

[0065] Next, a weighted operation can be performed according to the first reference running state evaluation value, the second reference running state evaluation value, and the first weight pair to obtain the reference running state evaluation value. In this way, the overall evaluation of the standard test environment can be carried out from three dimensions of hardware, software, and physical environment.

[0066] Optionally, for the above step of obtaining the first weight pair corresponding to the reference physical environment parameters, it can be implemented in the following manner:

[0067] Determine the absolute value of the difference between the first reference running state evaluation value and the second reference running state evaluation value to obtain the first absolute value;

[0068] Determine the reference weight pair corresponding to the first absolute value. The reference weight pair includes a first weight and a second weight;

[0069] Determine the first adjustment factor corresponding to the reference physical environment parameters;

[0070] Adjust the first weight according to the first adjustment factor to obtain the target first weight;

[0071] Determine the target second weight according to the target first weight;

[0072] Determine the first weight pair according to the target first weight and the target second weight.

[0073] In specific implementation, the absolute value of the difference between the first reference operating state evaluation value and the second reference operating state evaluation value can be determined to obtain a first absolute value. Also, the mapping relationship between the preset absolute value and the weight pair can be stored in advance. Furthermore, based on this mapping relationship, the reference weight pair corresponding to the first absolute value can be determined. The reference weight pair includes a first weight and a second weight. Also, the mapping relationship between the preset physical environment parameters and the adjustment factor can be stored in advance. Furthermore, based on this mapping relationship, the first adjustment factor corresponding to the reference physical environment parameters can be determined. Then, the first weight is adjusted according to the first adjustment factor to obtain the target first weight, where the target first weight = (1 + the first adjustment factor) * the first weight. Next, the target second weight is determined according to the target first weight, where the target second weight = 1 - the target first weight. Finally, the first weight pair can be determined according to the target first weight and the target second weight, that is, the target first weight pair includes the target first weight and the target second weight. That is, on the one hand, the corresponding weight pair can be determined based on the differences between the hardware and software test environments, and the weight pair can be dynamically optimized based on the influence of the physical environment parameters, so that the overall evaluation depth of the final standard test environment conforms to the actual situation.

[0074] Optionally, for the above steps, to determine the target operating state evaluation value according to the first hardware environment parameter, the first software environment parameter, and the first physical environment parameter, it can be implemented in the following manner:

[0075] Determine the first operating state evaluation value according to the first hardware environment parameter;

[0076] Determine the second operating state evaluation value according to the first software environment parameter;

[0077] Determine the second weight pair corresponding to the first physical environment parameter;

[0078] Perform a weighted operation according to the first operating state evaluation value, the second operating state evaluation value, and the second weight pair to obtain the target operating state evaluation value.

[0079] In specific implementation, the mapping relationship between the preset hardware environment parameters and the operating state evaluation value can be stored in advance. Furthermore, based on this mapping relationship, the first operating state evaluation value corresponding to the first hardware environment parameter can be determined. Also, the mapping relationship between the preset software environment parameters and the operating state evaluation value can be stored in advance. Furthermore, based on this mapping relationship, the second operating state evaluation value corresponding to the first software environment parameter can be determined. Also, the mapping relationship between the preset physical environment parameters and the weight pair can be stored in advance. Furthermore, based on this mapping relationship, the second weight pair corresponding to the first physical environment parameter can be obtained. The weight pair can include two weights, and the sum of the two weights is 1.

[0080] Next, the target operating state evaluation value can be obtained through weighted calculation based on the first operating state evaluation value, the second operating state evaluation value, and the second weight pair. In this way, the overall evaluation of the actual test environment can be carried out from three dimensions: hardware, software, and physical environment.

[0081] 105. Adjust the reference test standard parameters according to the first deviation degree to obtain the target test standard parameters.

[0082] In specific implementation, the reference test standard parameters can be adjusted according to the first deviation degree to obtain the target test standard parameters, that is, the test standard parameters in the standard situation are dynamically adjusted according to the difference degree between the actual test environment and the standard test environment, which helps to ensure the accuracy of the test results. Thus, the intelligence of the flash memory chip test can be improved, and the performance of the flash memory chip can be further improved.

[0083] Optionally, when the reference test standard parameters include a first upper limit threshold and a first lower limit threshold, step 105 above, adjusting the reference test standard parameters according to the first deviation degree to obtain the target test standard parameters, can be implemented as follows:

[0084] Determine the first optimization parameter corresponding to the first deviation degree;

[0085] Adjust the first upper limit threshold according to the first optimization parameter to obtain the target first upper limit threshold;

[0086] Determine the second optimization parameter corresponding to the first deviation degree;

[0087] Adjust the first lower limit threshold according to the second optimization parameter to obtain the target first lower limit threshold;

[0088] Determine the target test standard parameters according to the target first upper limit threshold and the target first lower limit threshold.

[0089] Among them, the reference test standard parameters can include a first upper limit threshold and a first lower limit threshold. The first lower limit threshold is less than the first upper limit threshold.

[0090] In specific implementation, the first mapping relationship between the preset deviation degree and the optimization parameter can be stored in advance. Furthermore, the first optimization parameter corresponding to the first deviation degree can be determined based on this first mapping relationship, and then the first upper limit threshold is adjusted according to the first optimization parameter to obtain the target first upper limit threshold, and the target first upper limit threshold = (1 + first optimization parameter) * first upper limit threshold.

[0091] Correspondingly, a second mapping relationship between a preset deviation degree and optimization parameters can also be pre-stored. Furthermore, the second optimization parameter corresponding to the first deviation degree can be determined based on the second mapping relationship, and then the first lower threshold can be adjusted according to the second optimization parameter to obtain the target first lower threshold, where the target first lower threshold = (1 + the second optimization parameter) * the first lower threshold.

[0092] Finally, the target test standard parameter can be determined according to the target first upper threshold and the target first lower threshold, that is, the test standard parameter in the standard case can be dynamically adjusted based on the difference degree between the actual test environment and the standard test environment, which helps to ensure the accuracy of the test result. Thus, the test intelligence of the flash memory chip can be improved, and further the performance of the flash memory chip can be enhanced.

[0093] 106. Test the flash memory chip according to the target test standard parameter and the first test mode.

[0094] In specific implementation, since the target test standard parameter is the test standard parameter after dynamically adjusting the test standard parameter in the standard case based on the difference degree between the actual test environment and the standard test environment, it is equivalent to calibrating the reference test standard parameter based on the difference between the actual environment and the standard environment, which helps to ensure the accuracy of the test result. Thus, the test intelligence of the flash memory chip can be improved, and further the performance of the flash memory chip can be enhanced.

[0095] It can be seen that the test method of the flash memory chip described in the embodiments of the present application is applied to an electronic device, the electronic device includes a flash memory chip, the first test mode of the flash memory chip is determined, the reference test environment parameter and the reference test standard parameter corresponding to the first test mode are obtained, the first test environment parameter of the flash memory chip is determined, the first deviation degree between the reference test environment parameter and the first test environment parameter is determined, the reference test standard parameter is adjusted according to the first deviation degree to obtain the target test standard parameter, and the flash memory chip is tested according to the target test standard parameter and the first test mode. On the one hand, the first test mode reflects the required test content, and the corresponding standard test environment and standard test parameters can be determined based on the required test content. On the other hand, that is, the test standard parameter in the standard case is dynamically adjusted based on the difference degree between the actual test environment and the standard test environment, which helps to ensure the accuracy of the test result. Thus, the test intelligence of the flash memory chip can be improved, and further the performance of the flash memory chip can be enhanced.

[0096] Consistent with the above embodiments, please refer to Figure 3 , Figure 3The following is a schematic structural diagram of an electronic device provided by an embodiment of the present application. As shown in the figure, the electronic device includes a processor, a memory, a communication interface, and one or more programs. The above one or more programs are stored in the above memory and are configured to be executed by the above processor. In the embodiment of the present application, the electronic device includes a flash memory chip, and the above program includes instructions for performing the following steps:

[0097] Determine a first test mode of the flash memory chip;

[0098] Obtain reference test environment parameters and reference test standard parameters corresponding to the first test mode;

[0099] Determine first test environment parameters of the flash memory chip;

[0100] Determine a first deviation degree between the reference test environment parameters and the first test environment parameters;

[0101] Adjust the reference test standard parameters according to the first deviation degree to obtain target test standard parameters;

[0102] Test the flash memory chip according to the target test standard parameters and the first test mode.

[0103] Optionally, the reference test environment parameters include reference hardware environment parameters, reference software environment parameters, and reference physical environment parameters; the first test environment parameters include: first hardware environment parameters, first software environment parameters, and first physical environment parameters;

[0104] In terms of determining the first deviation degree between the reference test environment parameters and the first test environment parameters, the above program includes instructions for performing the following steps:

[0105] Determine a reference operation state evaluation value according to the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters;

[0106] Determine a target operation state evaluation value according to the first hardware environment parameters, the first software environment parameters, and the first physical environment parameters;

[0107] Determine the first deviation degree according to the reference operation state evaluation value and the target operation state evaluation value.

[0108] Optionally, in terms of determining the reference operation state evaluation value according to the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters, the above program includes instructions for performing the following steps:

[0109] Determine the first reference running state evaluation value according to the reference hardware environment parameters;

[0110] Determine the second reference running state evaluation value according to the reference software environment parameters;

[0111] Obtain the first weight pair corresponding to the reference physical environment parameters;

[0112] Perform a weighted operation according to the first reference running state evaluation value, the second reference running state evaluation value, and the first weight pair to obtain the reference running state evaluation value.

[0113] Optionally, in the aspect of determining the target running state evaluation value according to the first hardware environment parameter, the first software environment parameter, and the first physical environment parameter, the above program includes instructions for performing the following steps:

[0114] Determine the first running state evaluation value according to the first hardware environment parameter;

[0115] Determine the second running state evaluation value according to the first software environment parameter;

[0116] Determine the second weight pair corresponding to the first physical environment parameter;

[0117] Perform a weighted operation according to the first running state evaluation value, the second running state evaluation value, and the second weight pair to obtain the target running state evaluation value.

[0118] Optionally, when the reference test standard parameter includes a first upper limit threshold and a first lower limit threshold, in the aspect of adjusting the reference test standard parameter according to the first deviation degree to obtain the target test standard parameter, the above program includes instructions for performing the following steps:

[0119] Determine the first optimization parameter corresponding to the first deviation degree;

[0120] Adjust the first upper limit threshold according to the first optimization parameter to obtain the target first upper limit threshold;

[0121] Determine the second optimization parameter corresponding to the first deviation degree;

[0122] Adjust the first lower limit threshold according to the second optimization parameter to obtain the target first lower limit threshold;

[0123] Determine the target test standard parameter according to the target first upper limit threshold and the target first lower limit threshold.

[0124] It can be seen that for the electronic device described in the embodiments of the present application, the electronic device includes a flash memory chip. Determine the first test mode of the flash memory chip, obtain the reference test environment parameters and reference test standard parameters corresponding to the first test mode, determine the first test environment parameters of the flash memory chip, determine the first deviation degree between the reference test environment parameters and the first test environment parameters, adjust the reference test standard parameters according to the first deviation degree to obtain the target test standard parameters, and test the flash memory chip according to the target test standard parameters and the first test mode. On the one hand, the first test mode reflects the required test content, and the corresponding standard test environment and standard test parameters can be determined based on the required test content. On the other hand, that is, the difference degree between the actual test environment and the standard test environment dynamically adjusts the test standard parameters in the standard situation, which helps to ensure the accuracy of the test results. Therefore, the intelligence of the flash memory chip test can be improved, and further the performance of the flash memory chip can be improved.

[0125] Figure 4 It is a functional unit composition block diagram of a test device 400 for a flash memory chip involved in the embodiments of the present application. The test device 400 for the flash memory chip is applied to an electronic device. The electronic device includes a flash memory chip. The test device 400 for the flash memory chip includes: a determination unit 401, an acquisition unit 402, an adjustment unit 403, and a test unit 404. Among them,

[0126] The determination unit 401 is configured to determine the first test mode of the flash memory chip;

[0127] The acquisition unit 402 is configured to acquire the reference test environment parameters and reference test standard parameters corresponding to the first test mode;

[0128] The determination unit 401 is further configured to determine the first test environment parameters of the flash memory chip; determine the first deviation degree between the reference test environment parameters and the first test environment parameters;

[0129] The adjustment unit 403 is configured to adjust the reference test standard parameters according to the first deviation degree to obtain the target test standard parameters;

[0130] The test unit 404 is configured to test the flash memory chip according to the target test standard parameters and the first test mode.

[0131] Optionally, the reference test environment parameters include reference hardware environment parameters, reference software environment parameters, and reference physical environment parameters; the first test environment parameters include: first hardware environment parameters, first software environment parameters, and first physical environment parameters;

[0132] In terms of determining the first deviation degree between the reference test environment parameters and the first test environment parameters, the determining unit 401 is specifically configured to:

[0133] Determine a reference operation state evaluation value according to the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters;

[0134] Determine a target operation state evaluation value according to the first hardware environment parameters, the first software environment parameters, and the first physical environment parameters;

[0135] Determine the first deviation degree according to the reference operation state evaluation value and the target operation state evaluation value.

[0136] Optionally, in terms of determining the reference operation state evaluation value according to the reference hardware environment parameters, the reference software environment parameters, and the reference physical environment parameters, the determining unit 401 is specifically configured to:

[0137] Determine a first reference operation state evaluation value according to the reference hardware environment parameters;

[0138] Determine a second reference operation state evaluation value according to the reference software environment parameters;

[0139] Obtain a first weight pair corresponding to the reference physical environment parameters;

[0140] Perform a weighted operation according to the first reference operation state evaluation value, the second reference operation state evaluation value, and the first weight pair to obtain the reference operation state evaluation value.

[0141] Optionally, in terms of determining the target operation state evaluation value according to the first hardware environment parameters, the first software environment parameters, and the first physical environment parameters, the determining unit 401 is specifically configured to:

[0142] Determine a first operation state evaluation value according to the first hardware environment parameters;

[0143] Determine a second operation state evaluation value according to the first software environment parameters;

[0144] Determine a second weight pair corresponding to the first physical environment parameters;

[0145] Perform a weighted operation according to the first operation state evaluation value, the second operation state evaluation value, and the second weight pair to obtain the target operation state evaluation value.

[0146] Optionally, when the reference test standard parameters include a first upper threshold and a first lower threshold, in terms of adjusting the reference test standard parameters according to the first deviation degree to obtain target test standard parameters, the determining unit 401 is specifically configured to:

[0147] Determine a first optimization parameter corresponding to the first deviation degree;

[0148] Adjust the first upper threshold according to the first optimization parameter to obtain a target first upper threshold;

[0149] Determine a second optimization parameter corresponding to the first deviation degree;

[0150] Adjust the first lower threshold according to the second optimization parameter to obtain a target first lower threshold;

[0151] Determine the target test standard parameters according to the target first upper threshold and the target first lower threshold.

[0152] It can be seen that the test device for a flash memory chip described in the embodiments of the present application is applied to an electronic device. The electronic device includes a flash memory chip. Determine the first test mode of the flash memory chip, obtain the reference test environment parameters and reference test standard parameters corresponding to the first test mode, determine the first test environment parameters of the flash memory chip, determine the first deviation degree between the reference test environment parameters and the first test environment parameters, adjust the reference test standard parameters according to the first deviation degree to obtain target test standard parameters, and test the flash memory chip according to the target test standard parameters and the first test mode. On the one hand, the first test mode reflects the test content required, and the corresponding standard test environment and standard test parameters can be determined based on the required test content. On the other hand, that is, dynamically adjust the test standard parameters in the standard situation according to the difference degree between the actual test environment and the standard test environment, which helps to ensure the accuracy of the test results. Thus, the intelligence of the flash memory chip test can be improved, and further the performance of the flash memory chip can be improved.

[0153] It can be understood that the functions of the respective program modules of the test device for the flash memory chip in this embodiment can be specifically implemented according to the methods in the above method embodiments, and the specific implementation process can refer to the relevant descriptions of the above method embodiments, which will not be elaborated here.

[0154] Figure 5 This is a test system for a flash memory chip involved in the embodiments of the present application. The test system for the flash memory chip includes a Figure 4 test device for a flash memory chip as shown. The test system for the flash memory chip can be used to implement any function of the test device for the flash memory chip, and can also implement any of the above test methods for the flash memory chip.

[0155] An embodiment of the present application also provides a computer storage medium. The computer storage medium stores a computer program for electronic data exchange, and the computer program causes the computer to execute some or all of the steps of any one of the methods described in the foregoing method embodiments.

[0156] An embodiment of the present application also provides a computer program product. The computer program product includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to cause the computer to execute some or all of the steps of any one of the methods described in the foregoing method embodiments. The computer program product can be a software installation package.

[0157] It should be noted that, for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present application is not limited by the described action sequence, because according to the present application, some steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to the present application.

[0158] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0159] In several embodiments provided by the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the above division of units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed mutual coupling or direct coupling or communication connection can be through some interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical or other form.

[0160] The units described as separate components above may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or they can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0161] In addition, in each embodiment of the present application, each functional unit may be integrated into a processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above integrated unit may be implemented in the form of hardware or in the form of a software functional unit.

[0162] If the above integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it may be stored in a computer-readable memory. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, may be embodied in the form of a software product. The computer software product is stored in a memory and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the above methods in each embodiment of the present application. The aforementioned memory includes: various media such as USB flash drives, read-only memories (ROMs), random access memories (RAMs), mobile hard disks, magnetic disks, or optical discs that can store program codes.

[0163] Those of ordinary skill in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing relevant hardware through a program. The program can be stored in a computer-readable memory, and the memory can include: flash drives, read-only memories (abbreviated as ROMs in English), random access memories (abbreviated as RAMs in English), magnetic disks, or optical discs, etc.

[0164] The above has introduced the embodiments of the present application in detail. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application; at the same time, for those of ordinary skill in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A method for testing a flash memory chip, characterized in that: Applied to an electronic device, the electronic device includes a flash memory chip, and the method includes: Determining a first test mode of the flash memory chip; Acquire reference test environment parameters and reference test standard parameters corresponding to the first test mode; Determining a first test environment parameter of the flash memory chip; determining a first degree of deviation between the reference test environment parameter and the first test environment parameter; Adjusting the reference test standard parameters according to the first deviation degree to obtain target test standard parameters; The flash memory chip is tested according to the target test standard parameters and the first test mode.

2. The method according to claim 1, characterized in that The reference test environment parameters include reference hardware environment parameters, reference software environment parameters and reference physical environment parameters; the first test environment parameters include: first hardware environment parameters, first software environment parameters and first physical environment parameters; The determining a first deviation degree between the reference test environment parameter and the first test environment parameter comprises: Determine a reference operating state evaluation value according to the reference hardware environment parameter, the reference software environment parameter and the reference physical environment parameter; Determine a target operating state evaluation value according to the first hardware environment parameter, the first software environment parameter and the first physical environment parameter; The first deviation degree is determined according to the reference operating state evaluation value and the target operating state evaluation value.

3. The method according to claim 2, characterized in that The determining of the reference operating state evaluation value according to the reference hardware environment parameter, the reference software environment parameter and the reference physical environment parameter comprises: Determine a first reference operating state evaluation value according to the reference hardware environment parameter; Determine a second reference operating state evaluation value according to the reference software environment parameter; Acquire a first weight pair corresponding to the reference physical environment parameter; A weighted operation is performed on the first reference operating state evaluation value, the second reference operating state evaluation value, and the first weight to obtain the reference operating state evaluation value.

4. The method according to claim 2, characterized in that: The determining the target operating state evaluation value according to the first hardware environment parameter, the first software environment parameter and the first physical environment parameter includes: Determine a first operating status evaluation value according to the first hardware environment parameter; Determine a second operating status evaluation value according to the first software environment parameter; determining a second weight pair corresponding to the first physical environment parameter; A weighted operation is performed on the first operating state evaluation value, the second operating state evaluation value and the second weight to obtain the target operating state evaluation value.

5. The method according to any one of claims 1 to 4, characterized in that: When the reference test standard parameter includes a first upper threshold and a first lower threshold, adjusting the reference test standard parameter according to the first deviation degree to obtain a target test standard parameter includes: determining a first optimization parameter corresponding to the first degree of deviation; Adjusting the first upper limit threshold according to the first optimization parameter to obtain a target first upper limit threshold; determining a second optimization parameter corresponding to the first deviation degree; Adjusting the first lower threshold according to the second optimization parameter to obtain a target first lower threshold; The target test standard parameter is determined according to the target first upper threshold value and the target first lower threshold value.

6. A flash memory chip testing device, characterized in that: Applied to electronic equipment, the electronic equipment includes a flash memory chip, the device includes: a determination unit, an acquisition unit, an adjustment unit and a test unit, wherein: The determining unit is used to determine a first test mode of the flash memory chip; The acquisition unit is used to acquire reference test environment parameters and reference test standard parameters corresponding to the first test mode; The determining unit is further used to determine a first test environment parameter of the flash memory chip; determine a first deviation degree between the reference test environment parameter and the first test environment parameter; The adjustment unit is used to adjust the reference test standard parameter according to the first deviation degree to obtain a target test standard parameter; The testing unit is used to test the flash memory chip according to the target testing standard parameters and the first testing mode.

7. The device according to claim 6, characterized in that The reference test environment parameters include reference hardware environment parameters, reference software environment parameters and reference physical environment parameters; the first test environment parameters include: first hardware environment parameters, first software environment parameters and first physical environment parameters; In determining the first degree of deviation between the reference test environment parameter and the first test environment parameter, the determining unit is specifically configured to: Determine a reference operating state evaluation value according to the reference hardware environment parameter, the reference software environment parameter and the reference physical environment parameter; Determine a target operating state evaluation value according to the first hardware environment parameter, the first software environment parameter and the first physical environment parameter; The first deviation degree is determined according to the reference operating state evaluation value and the target operating state evaluation value.

8. A flash memory chip testing system, characterized in that: The flash memory chip testing system comprises the flash memory chip testing device as claimed in claim 6 or 7.

9. An electronic device, characterized in that: The method comprises a processor, a memory, a communication interface, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the processor, and the programs include instructions for executing the steps in the method according to any one of claims 1 to 5.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and the computer program is executed by a processor to implement the method according to any one of claims 1 to 5.

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