Satellite mass production test method, satellite mass production test equipment and computer storage medium

Abstract

The present application provides a satellite mass production test method, a satellite mass production test device and a computer storage medium, relating to the technical field of satellite production testing. By analyzing the first test information, the first technical state change information and the first external factor state change information of the first batch of satellites, the relevant state variables of each test content point under each test item and the influence degree of the relevant state variables of each test content point under each test item on the corresponding test content point are determined, and the first test information is adjusted based on the influence degree to obtain and execute the test content. The redundancy of test items is avoided, and the test efficiency of mass-produced satellites is greatly improved.

Description

Technical Field

[0001] This application relates to the technical field of satellite production and testing, and particularly to a satellite mass production testing method, a satellite mass production testing device, and a computer storage medium. Background Art

[0002] At present, the large-scale production of satellites has become one of the main transformation directions in the aerospace field. The existing test processes for satellites follow traditional engineering experience methods, aiming to test everything possible. The overall idea is that as long as the satellite state conditions and time plans permit, all test items are covered in a comprehensive manner, resulting in problems such as overly redundant test items, excessive test repetition, and low test efficiency.

[0003] It can be seen that the meticulousness and high standards and requirements of traditional aerospace testing work, which aim for absolute safety and reliability, are not applicable to the rapid production and rapid iteration transformation needs of new industrial aerospace. There is an urgent need in the aerospace testing technology field for a fast-paced, high-efficiency, and highly reliable testing method to optimize the existing test process methods so that they can adapt to the production rhythm of new industrial aerospace. Summary of the Invention

[0004] In view of this, this application provides a satellite mass production testing method, a satellite mass production testing device, and a computer storage medium, which reduce the redundancy of test items and improve the testing efficiency of mass-produced satellites.

[0005] In a first aspect, this application provides a satellite mass production testing method, including:

[0006] Determine the first test information, the first technical state change information, and the first external factor state change information of the first batch of satellites according to the design documents corresponding to the first batch of satellites; the first test information includes test items, test item processes, and test content points under the test items;

[0007] Analyze the first technical state change information and the first external factor state change information to obtain a set of state variables, where the set of state variables includes one or more state variables;

[0008] Obtain the relevance between each test content point under each test item and each state variable in the set of state variables;

[0009] Determine the relevant state variables of each test content point under each test item according to the relevance;

[0010] Obtain the influence degree of the relevant state variables of each test content point under each test item on the corresponding test content point;

[0011] Adjust the first test information based on the influence degree to obtain test content;

[0012] Execute the test content.

[0013] In one embodiment, adjusting the first test information based on the influence degree to obtain test content includes:

[0014] Determine the relevant state variables with an influence degree less than the influence degree threshold as low-influence state variables, and determine the test content points corresponding to the low-influence state variables as test content points to be deleted;

[0015] Delete the test content points to be deleted from the first test information to obtain the test content.

[0016] In one embodiment, adjusting the first test information based on the influence degree to obtain test content includes:

[0017] Determine the relevant state variables with an influence degree less than the influence degree threshold as low-influence state variables, and determine the test content points corresponding to the low-influence state variables as test content points to be deleted;

[0018] According to the multi-level mapping relationship between the preset state variables and the preset test content points, determine the associated test content points having a mapping relationship with the test content points to be deleted;

[0019] Delete the test content points to be deleted and the associated test content points from the first test information to obtain the test content.

[0020] In one embodiment, after adjusting the first test information based on the influence degree to obtain the test content, the method further includes:

[0021] Perform a coverage analysis on the test content to obtain a test coverage rate;

[0022] If the test coverage rate does not meet the expected coverage rate condition, determine new test content points and the target test items to which the new test content points are to be added according to the preset priority test information and the test content point addition rule;

[0023] Add the new test content points under the target test items in the test content to obtain new test content that meets the expected coverage rate condition; wherein, executing the test content includes:

[0024] Execute the new test content.

[0025] In one embodiment, the preset priority test information is set with N types of test names in descending order of priority, and each type of test name includes multiple test content points. The test content point addition rule indicates that new test content points are preferentially determined from the test names with high priority, and the target test items to which the addition is preferred are determined in the front-to-back or back-to-front order.

[0026] In one embodiment, the method further includes:

[0027] When the production work of the second batch of satellites starts, determine the second test information, the second technical state change information, and the second external factor state change information of the second batch of satellites according to the design document corresponding to the second batch of satellites;

[0028] Compare the first test information with the second test information, the first technical state change information with the second technical state change information, and the first external factor state change information with the second external factor state change information;

[0029] Determine the test content of the second batch of satellites according to the comparison result;

[0030] Execute the test content of the second batch of satellites.

[0031] In one embodiment, the determining the test content of the second batch of satellites according to the comparison result includes:

[0032] If the comparison result indicates that there is no change in the second batch of satellites compared with the first batch of satellites, determine the test content of the first batch of satellites as the test content of the second batch of satellites.

[0033] In one embodiment, the determining the test content of the second batch of satellites according to the comparison result includes:

[0034] If the comparison result indicates that there are updated test items in the second batch of satellites compared with the first batch of satellites, the test content of the second batch of satellites includes the updated test items and all the test content points corresponding to the updated test items in the second test information.

[0035] In a second aspect, the present application provides a satellite batch production test device, including:

[0036] At least one processor; and

[0037] At least one memory, on which instructions are stored, and when the instructions are executed alone or jointly by the at least one processor, the satellite batch production test device is caused to execute the method as described in the first aspect.

[0038] In a third aspect, the present application provides a computer storage medium, on which instructions are stored, and when the instructions are executed alone or jointly by at least one processor of a satellite batch production test device, the satellite batch production test device is caused to execute the method as described in the first aspect.

[0039] The satellite mass production test method provided by this application determines the relevant state variables of each test content point under each test item, as well as the influence degree of the relevant state variables of each test content point under each test item on the corresponding test content point, by analyzing the first test information, the first technical state change information, and the first external factor state change information of the first batch of satellites. Based on the influence degree, the first test information is adjusted to obtain and execute the test content. The satellite mass production test method provided by this application avoids redundancy of test items and greatly improves the test efficiency of mass-produced satellites. Brief Description of the Drawings

[0040] The inclusion of the drawings is to provide a further understanding of this application. They are incorporated and constitute a part of this application. The drawings illustrate embodiments of this application and, together with this specification, serve to explain the principles of this application. In the drawings:

[0041] Figure 1 is a schematic flowchart of a satellite mass production test method provided by an embodiment of this application;

[0042] Figure 2 is a schematic diagram of a multi-level mapping relationship provided by an embodiment of this application;

[0043] Figure 3 is a schematic flowchart of another satellite mass production test method provided by an embodiment of this application;

[0044] Figure 4 is a block diagram of a satellite mass production test device provided by an embodiment of this application. Detailed Description of the Embodiment

[0045] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some examples or embodiments of this application. For those of ordinary skill in the art, without creative efforts, this application can also be applied to other similar scenarios based on these drawings. Unless obvious from the language context or otherwise stated, the same reference numerals in the drawings represent the same structure or operation.

[0046] As shown in this application, unless the context clearly indicates an exception, words such as "a", "an", "one", and / or "the" are not specifically singular and may also include the plural. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of the clearly identified steps and elements, and these steps and elements do not constitute an exclusive list. The method or device may also include other steps or elements.

[0047] Meanwhile, this application uses specific terms to describe the embodiments of this application. For example, "an embodiment", "one embodiment", and / or "some embodiments" mean a certain feature, structure, or characteristic related to at least one embodiment of this application. Therefore, it should be emphasized and noted that the "one embodiment" or "an embodiment" or "an alternative embodiment" mentioned twice or more at different positions in this specification does not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of this application can be appropriately combined.

[0048] Unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions, and numerical values set forth in these embodiments do not limit the scope of this application. At the same time, it should be understood that, for the sake of convenience of description, the dimensions of the various parts shown in the drawings are not drawn in actual proportional relationship. Technologies, methods, and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the said technologies, methods, and devices should be regarded as part of the specification. In all the examples shown and discussed here, any specific value should be construed as merely exemplary, and not as a limitation. Therefore, other examples of the exemplary embodiments may have different values. It should be noted that like reference numerals and letters denote like items in the following drawings, and thus, once an item is defined in one drawing, further discussion thereof is not required in subsequent drawings.

[0049] In addition, although the terms used in this application are selected from well-known and commonly used terms, some of the terms mentioned in the specification of this application may be selected by the applicant according to his or her judgment, and their detailed meanings are described in the relevant parts of the description herein. In addition, it is required to understand this application not only through the actual terms used, but also through the meaning implied by each term.

[0050] Flowcharts are used in this application to illustrate the operations performed by a device or apparatus according to the embodiments of this application. It should be understood that the operations before or below do not necessarily have to be executed precisely in order. On the contrary, they can be executed in reverse order or simultaneously. At the same time, other operations can be added to these processes, or one or several steps of operations can be removed from these processes.

[0051] In recent years, with the increasing number of satellites under development and the construction requirements of constellation systems, a model of developing a series of satellites in the same or similar states in batches has emerged, which is satellite mass production. During the satellite development process, after the development of component products is completed, they are delivered to the overall system. The overall system assembles and integrates the component products to form a complete satellite, and then conducts various environmental tests at the satellite level. After confirming that the functions and performance of the complete satellite meet the design and user requirements, the overall assembly and testing before satellite delivery are completed according to the launch technical status, and the satellite is transported to the launch site for launch operations. The integrated assembly, testing, and verification of the complete satellite system level carried out from the delivery of satellite single-unit components to the overall system to the launch is AIT (Assembly, Integration, and Test).

[0052] Satellite AIT is the core process of satellite manufacturing, running through the entire development and production cycle of the satellite from components to launch into space. Its purpose is to ensure that all components of the satellite are correctly assembled, the systems work in coordination, and through strict testing, verify the performance and reliability to meet the design requirements and space environmental conditions. The AIT process of a normal complete satellite mainly includes the satellite installation process, thermal test process, mechanical test process, burn-in process, electromagnetic compatibility process, system docking process, factory test process, launch site test process, etc.

[0053] See Figure 1 , this application proposes a satellite mass production test method for the AIT process of mass-produced satellites, and this method includes:

[0054] S100: According to the design documents corresponding to the first batch of satellites, determine the first test information, the first technical status change information, and the first external factor status change information of the first batch of satellites.

[0055] The above design documents can be one or more documents, which record the test items involved in the AIT process of the first batch of satellites, the test procedures for the test items, the test content points under each test item, the changes in satellite technical status (such as the status of single-unit completeness, software version), and the changes in external factor status (such as external transportation status, temperature and humidity, etc.). As a feasible method, keyword positioning (such as test procedures, test content, technical status, external factors, etc.) can be performed on the relevant documents, the text content under the keywords can be identified, and the first test information, the first technical status change information, and the first external factor status change information of the first batch of satellites can be determined according to the identification results.

[0056] Among them, the above first test information includes test items, test item processes, and test content points to be tested under each test item. The first test information basically covers all test items and test content points that can be carried out in the conventional satellite AIT link tests. Exemplarily, the first test information can be as shown in Table 1-1 and Table 1-2. In Table 1-1 and Table 1-2, satellite installation electrical test, pre-thermal test, thermal test, post-thermal test, EMC (Electromagnetic Compatibility Testing) test, mechanical test, post-mechanical test, magnetic test, factory test, and launch site test are test items. The order of the test items represents the test item process. The test item process represented by Table 1-1 and Table 1-2 is: satellite installation electrical test → pre-thermal test → thermal test → post-thermal test → EMC test → mechanical test → post-mechanical test → magnetic test → factory test → launch site test. If any test content point marked under each test item is "test", it means that this test item includes this any test content point, and the test content point marked as "test" needs to be executed under this test item.

[0057] Table 1-1

[0058]

[0059] Table 1-2

[0060]

[0061] S101: Analyze the first technical state change information and the first external factor state change information to obtain a set of state variables, where the set of state variables includes one or more state variables.

[0062] As a feasible implementation method, the first technical state change information and the first external factor state change information can be analyzed from the following multiple dimensions through the fishbone diagram analysis method to output a set of technical state variables: people (technical state variables of the operation specifications of the personnel team), machines (technical state variables of ground test instruments and meters), materials (technical state variables of the single-machine software and hardware states), methods (technical state variables of test methods and means), and environment (technical state variables of the external environment).

[0063] S102: Obtain the correlation degrees between each test content point under each test item and each state variable in the set of state variables.

[0064] As a feasible implementation manner, the relevance between each test content point under each test item and each state variable in the state variable set can be determined by expert scoring. When executing step S102, the expert scoring result can be directly obtained. Exemplarily, part of the scoring result can be shown in Table 2, which represents the relevance between each test content point under the test item "Satellite Installation Electrical Test" and the state variables "Satellite Service Computer Software Version" and "Vibration Quantity".

[0065] Table 2

[0066]

[0067] As another feasible implementation manner, the relevance between each test content point under each test item and each state variable in the state variable set can be determined by weighting the expert scoring and the analysis result of AHP (Analytic Hierarchy Process). The respective weighting coefficients of the expert scoring and AHP can be preset according to experimental data.

[0068] S103: Determine the relevant state variables of each test content point under each test item according to the relevance.

[0069] As a feasible implementation manner, relevant variable division rules are preset, such as: a relevance greater than 0.3 is considered relevant, otherwise it is considered irrelevant and has no impact. As shown in Table 2, the relevant state variable of the test content point "Power CAN Bus Instruction Test" under the test item "Satellite Installation Electrical Test" is "Satellite Service Computer Software Version", and the relevant state variable of the test content point "Clock Crystal Oscillator State" is "Vibration Quantity".

[0070] S104: Obtain the influence degree of the relevant state variables of each test content point under each test item on the corresponding test content point.

[0071] It can be understood that step S103 determines what the relevant state variables of each test content point under each test item are, but relevance does not mean that the relevant state variable has a substantial impact on the corresponding test content point. Taking the state variable "Vibration Quantity" as an example, when the vibration quantity is relatively low, the impact on the corresponding test content point "Clock Crystal Oscillator State" is small. Then, from the perspective of vibration quantity, "Clock Crystal Oscillator State" can be deleted from this test and not tested. However, if the vibration quantity is relatively large, the impact on the corresponding test content point "Clock Crystal Oscillator State" can no longer be ignored. Then, from the perspective of vibration quantity, "Clock Crystal Oscillator State" needs to be retained in this test. Therefore, further execute step S104 to obtain the influence degree of the relevant state variables of each test content point under each test item on the corresponding test content point, and judge whether to retain or delete each test content point under each test item according to the level of the influence degree, so as to complete the adjustment of the test content.

[0072] Among them, the implementation manner of step S104 includes:

[0073] In the first manner, it is determined manually, and when executing step S104, the influence degree directly imported manually can be obtained.

[0074] In the second manner, according to the state variable influence rule, the influence degree of the relevant state variables of each test content point under each test item on the corresponding test content point is determined.

[0075] The above state variable influence rule can stipulate the division conditions corresponding to each state variable and the influence degree corresponding to the numerical conditions. For example, the state variable influence rule stipulates that the division conditions and influence degrees corresponding to the state variable "temperature" are shown in Table 3. The influence degree is divided into 1-3. An influence degree of 1 indicates that the influence of the state variable can be ignored, an influence degree of 2 indicates that the state variable has an influence on the corresponding test content point and the corresponding test content point needs to be tested, and an influence degree of 3 indicates that the influence degree of the state variable is extremely large and an early warning for troubleshooting needs to be triggered.

[0076] Table 3

[0077]

[0078] Suppose that under the test item "test before thermal test", the relevant state variable of the test content point "hardware circuit" is "temperature". When executing step S104, the specific temperature T of the current temperature can be obtained. According to the state variable influence rule, if T < 30°C, the influence degree is determined to be 1; if 30 ≤ T ≥ 70°C, the influence degree is determined to be 2; if T > 70°C, the influence degree is determined to be 3.

[0079] S105: Adjust the first test information based on the influence degree to obtain and execute the test content. Among them, the test content is more concise than the first test information, specifically, there are fewer test content points to be tested under one or more test items. Exemplarily, Table 1-1 and Table 1-2, Table 4-1 and Table 4-2 can respectively represent the first test information and the test content of step 105. Compared with the initial test content represented by Table 1-1 and Table 1-2, there are a large number of test content points to be tested less under multiple test items in the test content of step 105, greatly improving the test efficiency of the first batch of satellites.

[0080] As a feasible implementation manner, the implementation manner of step S105 can be: determining the relevant state variables with an influence degree less than the influence degree threshold as low-influence state variables, and determining the test content points corresponding to the low-influence state variables as the test content points to be deleted; deleting the test content points to be deleted from the first test information to obtain the test content.

[0081] Exemplarily, the influence threshold is set to 2. Assume that under the test item "Pre-thermal test", the relevant state variable of the test content point "Hardware circuit" is "Temperature", and the influence degree of the relevant state variable "Temperature" is 1, which is less than the influence threshold. Then, the state variable "Temperature" is determined as a low-influence state variable, and the corresponding test content point "Hardware circuit" is determined as a test content point to be deleted. Then, the test content point to be deleted can be deleted under the test item "Pre-thermal test" in the first test information. For example, mark "Hardware circuit" under the test item "Pre-thermal test" in Table 1-1 as " / ", indicating that the test of "Hardware circuit" is not performed under the test item "Pre-thermal test". By analogy, the test content points under each test item in the first test information can be adjusted based on the influence degree to obtain the test content, as shown in Tables 4-1 and 4-2.

[0082] Table 4-1

[0083]

[0084] Table 4-2

[0085]

[0086] Alternatively, as another feasible implementation manner, the implementation manner of step S105 may be: determining the relevant state variables with an influence degree less than the influence threshold as low-influence state variables, and determining the test content points corresponding to the low-influence state variables as test content points to be deleted; according to the multi-level mapping relationship between the preset state variables and the preset test content points, determining the associated test content points having a mapping relationship with the test content points to be deleted; and deleting the test content points to be deleted and the associated test content points from the first test information to obtain the test content.

[0087] Among them, the above multi-level mapping relationship means that there is a mapping relationship between the state variables and the test content points, but there are also mapping relationships between the test points and other state variables, and between other state variables and other test content points. Exemplarily, part of the content of this multi-level mapping relationship can be as Figure 2 shown. Assume that under the test item "Pre-thermal test", the state variable "Temperature" is determined as a low-influence state variable, and the corresponding test content point "Hardware circuit" is determined as a test content point to be deleted. After that, based on the indirect mapping relationship between "Hardware circuit" and Figure 2 201, all the test content points in 201 can be determined as associated test content points, and the "Hardware circuit" and all the test content points in 201 under the test item "Pre-thermal test" in the first test information are deleted to obtain the test content.

[0088] It can be understood that a test content point may correspond to multiple state variables, that is, there is a mapping relationship between a test content point and multiple state variables. As another feasible implementation manner, after determining the above-mentioned test content points to be deleted or associated test content points, if it is detected that the influence degree of another state variable on the above-mentioned test content points to be deleted or associated test content points meets the high influence degree threshold condition (for example, the influence degree is 2). Then, although any test content point (the any test content point is any one of the above-mentioned test content points to be deleted and associated test content points) needs to be deleted from the test content from the perspective of the low influence state variable, as long as the influence degree of another state variable on the any test content point meets the high influence degree threshold condition, the any test content point still needs to be added to the test content.

[0089] In one embodiment, after performing step S105 to adjust the first test information based on the influence degree to obtain the test content, there may be a situation where too much of the test content is deleted and the test coverage rate does not meet the standard. To solve this problem, the test content in step S105 can also be analyzed for the coverage rate to obtain the test coverage rate. If the test coverage rate does not meet the expected coverage rate condition, then according to the preset priority test information and the test content point addition rule, new test content points and the target test items for adding the new test content points are determined. Further, the new test content points are added under the target test items in the test content to obtain new test content that meets the expected coverage rate condition, and then the new test content is directly executed subsequently.

[0090] Among them, the above-mentioned preset priority test information is set with N types of test names in descending order of priority, and each type of test name includes multiple test content points. For example, N is 4, and the following four types of test names can be set in descending order of priority: type one test (directly related to hardware), type two test (software related to hardware), type three test (software developed based on hardware), type four test (pure software). Each type of test is pre-configured with a variety of test content points, covering all the test content required for the routine of each type of test.

[0091] The above-mentioned test content point addition rule indicates to preferentially determine new test content points from the test names with high priority, and determine the target test items for preferential addition in the order from front to back or from back to front. Among them, when adding new test content points in the order from front to back, if an abnormal problem occurs in the test, the problem can be exposed earlier and solved earlier. When adding new test content points in the order from back to front, the previous test process can be made more streamlined, and the test efficiency can be improved to a certain extent.

[0092] Exemplarily, assume that the process of the first batch of satellite test items from front to back is: satellite installation electrical test → pre-thermal test → thermal test → post-thermal test → EMC test → mechanical test → post-mechanical test → magnetic test → factory test → launch site test. The expected coverage condition is that the coverage rate needs to reach 85%. After detection, the coverage rate of the test content in step S105 is 50%. Then, it is possible to preferentially query the test content points that are not in the test content from one type of test, and use these test content points as new test content points. Add them to the target test item of "satellite installation electrical test" preferentially in the order from front to back in the test content to obtain new test content. Then, detect again whether the coverage rate of the new test content reaches 85%. If it does not reach, continue to query and add new test content points from the second type of test, and repeat the above process until the coverage rate of the new test content is greater than or equal to 85%.

[0093] Alternatively, after determining the new test content points, they can also be preferentially added to the target test item of "launch site test" in the order from back to front in the test content to obtain new test content. Then, detect again whether the coverage rate of the new test content reaches 85%. If it does not reach, continue to query and add new test content points from the second type of test, and repeat the above process until the coverage rate of the new test content is greater than or equal to 85%.

[0094] In the embodiment of the present application, according to the design document corresponding to the first batch of satellites, the first test information, the first technical state change information, and the first external factor state change information of the first batch of satellites are determined. The first technical state change information and the first external factor state change information are analyzed to obtain a set of state variables. Further, the relevance between each test content point under each test item and each state variable in the set of state variables is obtained, the relevant state variables of each test content point under each test item are determined according to the relevance, and the influence degree of the relevant state variables of each test content point under each test item on the corresponding test content point is obtained. Then, based on the influence degree, the first test information is adjusted to obtain and execute the test content. This makes the final test content more concise than the first test information, greatly improving the test efficiency of the first batch of satellites.

[0095] See Figure 3 , another satellite batch production test method is proposed in the embodiment of the present application. On the basis of the Figure 2 embodiment, the following steps are further included:

[0096] S106: When the production work of the second batch of satellites starts, according to the design document corresponding to the second batch of satellites, determine the second test information, the second technical state change information, and the second external factor state change information of the second batch of satellites. The specific implementation manner of step S106 can refer to the relevant description of S100 above, and will not be elaborated here.

[0097] S107: Compare the first test information with the second test information, the first technical status change information with the second technical status change information, and the first external factor status change information with the second external factor status change information.

[0098] S108: Determine and execute the test content of the second batch of satellites according to the comparison result.

[0099] As a feasible implementation manner, the first test information and the second test information can be in the form of forms respectively, as shown in Table 1-1 and Table 1-2. By comparing the fields in the forms, it can be determined whether there are differences in the test items themselves between the first batch of satellites and the second batch of satellites, and whether there are differences in the sequence of the test item processes. If any one or more test items themselves are changed, then the one or more test items are determined as updated test items. Or, if the test item process is changed, then the test items involved in the changed part of the test item process are also determined as updated test items. For example, if the test item process of the first batch of satellites includes satellite installation electrical measurement → pre-thermal test, and the test item process of the second batch of satellites includes pre-thermal test → satellite installation electrical measurement, then both the pre-thermal test and the satellite installation electrical measurement are determined as updated test items.

[0100] Or, as another feasible implementation manner, if the first test information and the second test information are in the form of text, the comparison can be carried out through the following steps:

[0101] Step 1 Preprocess the text: Necessarily preprocess the two texts (the first test information and the second test information), such as removing punctuation marks, stop words, etc., to reduce noise and improve the accuracy of analysis. Then tokenize the text and perform part-of-speech tagging to better understand the grammar and structure of the text.

[0102] Step 2 Semantic similarity analysis: Use a semantic similarity algorithm to calculate the similarity score of the two texts. Common semantic similarity algorithms include cosine similarity, Jaccard similarity, etc., and a suitable algorithm can be selected according to specific requirements.

[0103] Step 3 Key difference identification: Use a text comparison tool to identify the key differences in the two texts. Include comparisons in aspects such as word selection, sentence structure, and expression. Highlight the differences or use a visualization tool to display these differences to more intuitively understand the differences between them (such as whether there are differences in the test items themselves of the second batch of satellites compared to the first batch of satellites, and whether there are differences in the sequence of the test item processes).

[0104] For the comparison method of the first technical status change information, the second technical status change information, the first external factor status change information, and the second external factor status change information, the processing methods from Step 1 (preprocessing the text) to Step 3 (identifying key differences) can be referred to, which will not be elaborated here. Compare whether the technical status (such as interfaces, power consumption, software versions, etc.) and external factor status (such as temperature, humidity, transportation status, etc.) of the second batch of satellites have changed compared to the first batch of satellites.

[0105] In one embodiment, if the comparison result indicates that there is no change in the second batch of satellites compared to the first batch of satellites (no updated test items, and no changes in both technical status and external factor status), then determine the test content of the first batch of satellites as the test content of the second batch of satellites, and directly execute the test content of the second batch of satellites subsequently, thus completing the test of the second batch of satellites and greatly reducing the test time of the second batch of satellites.

[0106] In another embodiment, if the comparison result indicates that there are updated test items in the second batch of satellites compared to the first batch of satellites, then add the test items corresponding to the updated test items in the second test information, and the test content points under the corresponding test items, to the test content of the second batch of satellites. For example, the second test information of the second batch of satellites is shown in Table 1-1 and Table 1-2. Assume that the updated test item is "electrical measurement during satellite installation", then all the test content points that need to be tested for "electrical measurement during satellite installation" in Table 1-1 should be retained in the test content of the second batch of satellites.

[0107] In yet another embodiment, if the comparison result indicates the existence of changed status variables (such as the existence of changed technical status and / or external factor status), then for the changed status variables, the same implementation principles as in the above steps S102, S103, and S104 can be adopted. First, determine the relevant test content points under each non-updated test item that satisfy the above relevant variable division rules (such as a relevance greater than 0.3 is considered relevant, otherwise it is considered irrelevant and has no impact) with the changed status variables. Then, determine the influence degree of the changed status variables on the relevant test content points. According to the first preset retention rule, retain the relevant test content points with an influence degree of 2 under each non-updated test item in the test content of the second batch of satellites, and delete the relevant test content points with an influence degree of 1.

[0108] Alternatively, as another feasible implementation, if the comparison result indicates the existence of a change status variable, after determining the influence degree of the change status variable on relevant test content points through the above method, the influence degree can also be converted into a first retention degree according to the first preset conversion rule (for example, 30% retention for an influence degree of 1, 60% retention for an influence degree of 2, etc.). In addition, after each batch of satellite testing work is completed, the historical pass rates of each test content point can be statistically analyzed, and the historical pass rates can be converted into a second retention degree through the second preset conversion rule (for example, 20% retention degree for a historical pass rate exceeding 99%, 30% retention degree for a historical pass rate of 95% - 99%, 50% retention degree for a historical pass rate of 90% - 95%). The first retention degree and the second retention degree are weighted and calculated to obtain the target retention degree. According to the second preset retention rule, in the test content of the second batch of satellites, each test content point with a target retention degree < 60% under each non-updated test item is deleted, and the test content points with a target retention degree ≥ 60% are retained.

[0109] And so on, when carrying out the production work of the third batch of satellites, the fourth batch of satellites, and the Mth (M is an integer greater than 4) batch of satellites, the same technical principles of steps S106 to step 108 can be utilized to compare with the previous batch of satellites, and based on the comparison result, the test content of itself can be determined, so as to improve the test efficiency of the current batch of satellites in the production work.

[0110] In the embodiment of the present application, when the production work of the second batch of satellites starts, it is compared whether the test items, test item processes, technical states, and external factor states have changed compared with the first batch of satellites, and the test content of itself is quickly determined according to the comparison result, greatly improving the test efficiency of the second batch of satellites in the production work.

[0111] Figure 4 It is a block diagram of a satellite batch production test device provided by an embodiment of the present application. The satellite batch production test device can run Figure 1 and Figure 3 the satellite batch production test method described above, such as Figure 4As shown, the satellite mass production test equipment includes an internal communication bus 401, a processor 402, a read-only memory (ROM) 403, a random access memory (RAM) 404, and a communication port 405. When applied to a personal computer, the satellite mass production test equipment may further include a hard disk 406. The internal communication bus 401 can enable data communication between components of the satellite mass production test equipment. The processor 402 can make judgments and issue prompts. In some embodiments, the processor 402 may be composed of one or more processors. The communication port 405 can enable data communication between the satellite mass production test equipment and the outside. In some embodiments, the satellite mass production test equipment can send and receive information and data from a network through the communication port 405. The satellite mass production test equipment may further include different forms of program storage units and data storage units, such as the hard disk 406, the read-only memory (ROM) 403, and the random access memory (RAM) 404, which can store various data files used for computer processing and / or communication, as well as possible program instructions executed by the processor 402. The processor 402 executes these instructions to implement the main part of the method. The results processed by the processor 402 are transmitted to the satellite mass production test equipment through the communication port 405 and displayed on the user interface.

[0112] The processor 402 can be of any type suitable for the local technical network and, by way of non-limiting example, may include one or more of the following: a general-purpose computer, a special-purpose computer, a microprocessor, a digital signal processor (DSP), and a processor based on a multi-core processor architecture. The satellite mass production test equipment may have multiple processors, such as an application-specific integrated circuit chip, which is clocked in time to synchronize with the main processor.

[0113] The processor 402 can be used to perform the following steps: determining the first test information, the first technical state change information, and the first external factor state change information of the first batch of satellites according to the design document corresponding to the first batch of satellites; the first test information includes test items, test item processes, and test content points under the test items; analyzing the first technical state change information and the first external factor state change information to obtain a set of state variables, the set of state variables including one or more state variables; obtaining the relevance between each test content point under each test item and each state variable in the set of state variables; determining the relevant state variables corresponding to each test content point under each test item according to the relevance; obtaining the influence degree of the relevant state variables corresponding to each test content point under each test item on the corresponding test content point; adjusting the first test information based on the influence degree to obtain test content; and executing the test content.

[0114] In one embodiment, the processor 402 is specifically configured to determine the relevant state variables with an influence degree less than the influence degree threshold as low-influence state variables, and determine the test content points corresponding to the low-influence state variables as the test content points to be deleted; delete the test content points to be deleted from the first test information to obtain the test content.

[0115] In one embodiment, the processor 402 is further specifically configured to determine the relevant state variables with an influence degree less than the influence degree threshold as low-influence state variables, and determine the test content points corresponding to the low-influence state variables as the test content points to be deleted; determine the associated test content points having a mapping relationship with the test content points to be deleted according to the multi-level mapping relationship between the preset state variables and the preset test content points; delete the test content points to be deleted and the associated test content points from the first test information to obtain the test content.

[0116] In one embodiment, after the processor 402 adjusts the first test information based on the influence degree to obtain the test content, it is further configured to perform a coverage analysis on the test content to obtain a test coverage rate; if the test coverage rate does not meet the expected coverage rate condition, determine new test content points and the target test items to which the new test content points are to be added according to the preset priority test information and the test content point addition rule; add the new test content points under the target test items in the test content to obtain new test content that meets the expected coverage rate condition; wherein, the execution of the test content includes: executing the new test content.

[0117] In one embodiment, the preset priority test information is set with N types of test names in descending order of priority, and each type of test name includes multiple test content points. The test content point addition rule indicates that new test content points are preferentially determined from the test names with higher priorities, and the target test items to which the addition is to be prioritized are determined in the order from front to back or from back to front.

[0118] In one embodiment, the processor 402 is further configured to, when the production work of the second batch of satellites starts, determine the second test information, the second technical state change information, and the second external factor state change information of the second batch of satellites according to the design document corresponding to the second batch of satellites; compare the first test information with the second test information, the first technical state change information with the second technical state change information, and the first external factor state change information with the second external factor state change information; determine the test content of the second batch of satellites according to the comparison result; execute the test content of the second batch of satellites.

[0119] In one embodiment, the processor 402 is further specifically configured to, if the comparison result indicates that there is no change in the second batch of satellites compared to the first batch of satellites, determine the test content of the first batch of satellites as the test content of the second batch of satellites.

[0120] In one embodiment, the processor 402 is further specifically configured to, if the comparison result indicates that there are updated test items in the second batch of satellites compared to the first batch of satellites, the test content of the second batch of satellites includes the updated test items and all test content points corresponding to the updated test items in the second test information.

[0121] The above satellite mass production test method can be implemented as a computer program, stored in the hard disk 406, and can be loaded into the processor 402 for execution to implement the satellite mass production test method of the present application.

[0122] The present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of any one of the foregoing satellite mass production test methods are implemented.

[0123] Among them, for the specific implementation manners and technical effects of the satellite mass production test equipment and the computer-readable storage medium, reference can be made to the embodiments of the satellite mass production test method provided by the present invention above, and details are not described herein again.

[0124] Those skilled in the art will further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the embodiments disclosed herein can be implemented as electronic hardware, computer software, or a combination of the two. To clearly illustrate this interchangeability of hardware and software, the various illustrative components, blocks, modules, circuits, and steps are described above in terms of their functionality. Whether such functionality is implemented as hardware or software depends on the specific application and the design constraints imposed on the overall system. Skilled artisans may implement the described functionality in different ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.

[0125] The various illustrative logical modules and circuits described in connection with the embodiments disclosed herein can be implemented or executed using a general-purpose processor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination thereof designed to perform the functions described herein. The general-purpose processor can be a microprocessor, but in an alternative, the processor can be any conventional processor, controller, microcontroller, or state machine. The processor can also be implemented as a combination of computing devices, such as a combination of a DSP and a microprocessor, multiple microprocessors, one or more microprocessors cooperating with a DSP core, or any other such configuration.

[0126] The steps of the methods or algorithms described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. The software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor such that the processor can read from, and write to, the storage medium. In an alternative, the storage medium may be integrated into the processor. The processor and the storage medium may reside in an ASIC. The ASIC may reside in a user terminal. In an alternative, the processor and the storage medium may reside as discrete components in a user terminal.

[0127] In one or more exemplary embodiments, the described functionality may be implemented in hardware, software, firmware, or any combination thereof. If implemented in software as a computer program product, the functions may be stored on or transmitted via a computer-readable medium as one or more instructions or code. The computer-readable medium includes both computer storage media and communication media including any medium that facilitates transfer of a computer program from one place to another. A storage medium may be any available medium that can be accessed by a computer. By way of example and not limitation, such computer-readable medium can comprise RAM, ROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer. Any connection is properly termed a computer-readable medium. For example, if the software is transmitted from a web site, server, or other remote source using a coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave, then the coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave are included in the definition of medium. As used herein, disk and disc include compact disc (CD), laser disc, optical disc, digital versatile disc (DVD), floppy disk and Blu-ray disc where disks usually reproduce data magnetically, while discs reproduce data optically with lasers. Combinations of the above should also be included within the scope of computer-readable media.

[0128] It will be apparent to those skilled in the art that various modifications and variations can be made to the above-described exemplary embodiments of the present invention without departing from the spirit and scope of the invention.

Claims

1. A satellite mass production test method, characterized in that, The method includes: Determining first test information, first technical status change information, and first external factor status change information of the first batch of satellites according to the design document corresponding to the first batch of satellites; the first test information includes test items, test item processes, and test content points under the test items; Analyzing the first technical status change information and the first external factor status change information to obtain a set of status variables, the set of status variables including one or more status variables; Obtaining the relevance between each test content point under each test item and each status variable in the set of status variables; Determining the relevant status variables corresponding to each test content point under each test item according to the relevance; Obtaining the influence degree of the relevant status variables corresponding to each test content point under each test item on the corresponding test content point; Adjusting the first test information based on the influence degree to obtain test content; Executing the test content.

2. The method according to claim 1, wherein The adjusting the first test information based on the influence degree to obtain test content includes: Determining the relevant status variables with an influence degree less than the influence degree threshold as low-influence status variables, and determining the test content points corresponding to the low-influence status variables as test content points to be deleted; Deleting the test content points to be deleted from the first test information to obtain test content.

3. The method according to claim 1, characterized in that The adjusting the first test information based on the influence degree to obtain test content includes: Determining the relevant status variables with an influence degree less than the influence degree threshold as low-influence status variables, and determining the test content points corresponding to the low-influence status variables as test content points to be deleted; Determining associated test content points having a mapping relationship with the test content points to be deleted according to a multi-level mapping relationship between preset status variables and preset test content points; Deleting the test content points to be deleted and the associated test content points from the first test information to obtain test content.

4. The method according to any one of claims 1 to 3, characterized in that, After the adjusting the first test information based on the influence degree to obtain test content, the method further includes: Performing coverage analysis on the test content to obtain a test coverage rate; If the test coverage rate does not meet the expected coverage rate condition, determining new test content points and target test items to which the new test content points are added according to preset priority test information and test content point addition rules; Adding the new test content points under the target test items in the test content to obtain new test content that meets the expected coverage rate condition; wherein, the executing the test content includes: Executing the new test content.

5. The method according to claim 4, characterized in that The preset priority test information is set with N types of test names in descending order of priority, and each type of test name includes multiple test content points. The test content point addition rule indicates to preferentially determine new test content points from the test names with higher priorities, and determine the target test items to be preferentially added in the order from front to back or from back to front.

6. The method according to claim 1, characterized in that, The method further includes: When the production work of the second batch of satellites starts, determining second test information, second technical status change information, and second external factor status change information of the second batch of satellites according to the design document corresponding to the second batch of satellites; Compare the first test information with the second test information, the first technical status change information with the second technical status change information, and the first external factor status change information with the second external factor status change information; Determine the test content of the second batch of satellites according to the comparison result; Execute the test content of the second batch of satellites.

7. The method according to claim 6, characterized in that The determining of the test content of the second batch of satellites according to the comparison result includes: If the comparison result indicates that there is no change in the second batch of satellites compared to the first batch of satellites, determine the test content of the first batch of satellites as the test content of the second batch of satellites.

8. The method according to claim 6, wherein The determining of the test content of the second batch of satellites according to the comparison result includes: If the comparison result indicates that there are updated test items in the second batch of satellites compared to the first batch of satellites, the test content of the second batch of satellites includes the updated test items and all test content points corresponding to the updated test items in the second test information.

9. A satellite mass production test device, characterized in that, including: at least one processor; and at least one memory storing instructions which, when executed alone or jointly by the at least one processor, cause the satellite mass production test equipment to execute the method according to any one of claims 1-8.

10. A computer storage medium, characterized in that, Instructions are stored on the computer storage medium which, when executed alone or jointly by at least one processor of the satellite mass production test equipment, cause the satellite mass production test equipment to execute the method according to any one of claims 1-8.

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