Aging test control system and aging test system

Abstract

The present application discloses an aging test control system and an aging test system, which relate to the field of server testing technology. The system includes a power supply, an induction switch, and a signal trigger. After the induction switch senses that the plug of the aging rack has left the power socket of the aging chamber, it connects the circuit where the power supply and the signal trigger are located. The signal trigger is then powered on and triggered to send a transfer signal to a transfer vehicle, so that the transfer vehicle can transfer the aging rack in time after the aging test of the server is completed, so that other servers can be subjected to aging tests subsequently, thereby improving the efficiency of aging tests on the servers.

Description

Technical Field

[0001] The present application relates to the technical field of server testing, and in particular to an aging test control system and an aging test system. Background Art

[0002] Servers are essential, critical equipment for information technology. To ensure their quality, they are typically subjected to aging tests. This typically involves placing the server on a dedicated aging rack. A transfer vehicle then transports the rack to a aging room for testing. After the aging test is complete, the transfer vehicle then transports the rack out of the aging room.

[0003] In related technologies, after the burn-in rack enters the burn-in chamber, staff typically connect the rack's plug to the chamber's power supply. After the burn-in test is complete, staff disconnect the power and control a transfer vehicle to transport the rack out of the chamber. This manual process can lead to delays in controlling the transfer vehicle, preventing the rack from being transported out of the chamber in a timely manner. This can easily cause significant delays, hindering the progress of subsequent burn-in tests on other servers and leading to inefficient server burn-in testing. Summary of the Invention

[0004] The present application provides an aging test control system and an aging test system to at least solve the problem of low efficiency in performing aging tests on servers in the related art.

[0005] The present application provides an aging test control system, comprising: a power supply (U1), an inductive switch (K1), and a signal trigger (D), wherein one end of the power supply (U1) is electrically connected to one end of the signal trigger (D), and the other end of the signal trigger (D) is electrically connected to one end of a power socket (104) of an aging chamber through a conductive path;

[0006] The other end of the power supply (U1) is electrically connected to the other end of the power socket (104) of the aging chamber through a conductive path;

[0007] An induction switch (K1) is provided at the joint between either end of the power socket (104) of the aging chamber and the conductive path;

[0008] The induction switch (K1) is used to disconnect the electrical connection of the corresponding conductive path when sensing that the plug (103) of the aging rack (102) is inserted into the power socket (104) of the aging chamber; and to connect the electrical connection of the corresponding conductive path when sensing that the plug (103) of the aging rack (102) is removed from the power socket (104) of the aging chamber, so that the signal trigger (D) is powered on and outputs a transport signal to the transport vehicle so that the transport vehicle transports the aging rack (102).

[0009] The present application also provides an aging test system, comprising: an aging test control system as provided above, and an aging rack (102);

[0010] When the plug (103) of the aging rack (102) is inserted into the aging chamber power socket (104) or leaves the aging chamber power socket (104), the induction switch of the aging test control system is triggered to be disconnected or turned on.

[0011] Through the aging test control system and aging test system provided by the present application, since the induction switch can sense whether the plug of the aging rack is inserted into the power socket of the aging room, or whether it leaves the power socket of the aging room, the induction switch will conduct the power supply and the circuit where the signal trigger is located after sensing that the plug of the aging rack has left the power socket of the aging room, that is, after the aging test of the server is completed. The signal trigger is then powered on and triggered to send a transfer signal to the transfer vehicle, so that the transfer vehicle can transfer the aging rack in time after the aging test of the server is completed, so that other servers can undergo aging tests subsequently, thereby improving the efficiency of aging testing on the server. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0013] Figure 1 The usage scenarios provided for the embodiments of this application;

[0014] Figure 2 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 1 ;

[0015] Figure 3 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 2 ;

[0016] Figure 4 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 3 ;

[0017] Figure 5 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 4 ;

[0018] Figure 6 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 5 ;

[0019] Figure 7 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 6 ;

[0020] Figure 8 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 7 ;

[0021] Figure 9 Schematic diagram of the structure of the aging test system provided in the embodiment of the present application Figure 1 ;

[0022] Figure 10 Schematic diagram of the structure of the aging test system provided in the embodiment of the present application Figure 2 ;

[0023] Figure 11 Schematic diagram of the structure of the aging test system provided in the embodiment of the present application Figure 3 .

[0024] The above drawings include the following reference numerals:

[0025] 101: server;

[0026] 102: aging rack;

[0027] 103: plug;

[0028] 1031: first end switch contact;

[0029] 1032: second end switch contact;

[0030] 104: Aging room power socket;

[0031] 105: transfer vehicle;

[0032] 106: detection module;

[0033] 107: lock control mechanism;

[0034] U0: Aging chamber power supply;

[0035] U1: power supply;

[0036] D: signal trigger;

[0037] K1: induction switch;

[0038] K2: Control switch. DETAILED DESCRIPTION

[0039] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0040] It should be noted that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "upper," "lower," "front," "back," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like, indicating positions or relationships, are based on the positions or relationships shown in the accompanying drawings and are intended solely for ease of description and simplification of the present application. They are not intended to indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation, and therefore should not be construed as limiting the present application. The terms "mounted," "connected," and "connected" should be interpreted broadly, and may include, for example, fixed, removable, or integral connections; mechanical or electrical connections; direct or indirect connections through an intermediary; and internal communication between two components. The terms "parallel," "perpendicular," and "equal" encompass the described conditions and conditions similar to the described conditions, provided that the range of the similar conditions is within an acceptable range of deviation, as determined by a person of ordinary skill in the art taking into account the measurement in question and the errors associated with the measurement of the particular quantity (i.e., the limitations of the measurement system). For example, "parallel" includes both absolute parallelism and approximate parallelism, where the acceptable deviation range for approximate parallelism may be, for example, within 5°; "perpendicular" includes both absolute perpendicularity and approximate perpendicularity, where the acceptable deviation range for approximate perpendicularity may also be, for example, within 5°. "Equal" includes both absolute equality and approximate equality, where the acceptable deviation range for approximate equality may be, for example, that the difference between the two is less than or equal to 5% of either. Those skilled in the art will understand the specific meanings of the above terms in this application based on the specific circumstances.

[0041] Figure 1In the use scenario provided by the embodiment of the present application, the aging rack 102 is used to place the server 101 to be aged. The transfer vehicle 105 transfers the aging rack 102 to the aging room. The aging room has an aging room power supply U0, which is connected to the aging room power socket 104. When the plug 103 of the aging rack 102 is inserted into the aging room power socket 104, the aging rack is powered on and the aging test can be performed on the server 101. When the plug 103 of the aging rack 102 is removed from the aging room power socket 104, the aging rack is powered off, and the transfer vehicle 105 then transports the aging rack 102 out of the aging room.

[0042] In the related art, a staff member generally inserts the plug 103 of the aging rack 102 into the power socket 104 of the aging chamber. After the aging test is completed, the staff member unplugs the plug 103 of the aging rack 102 from the power socket 104 of the aging chamber, and controls the transfer vehicle 105 to transport the aging rack 102 out of the aging chamber. Due to the problem of untimely operation of the transfer vehicle 105 in the manual handling method, the aging rack 102 cannot be transported out of the aging chamber in a timely manner, which easily causes a long delay, delaying the progress of subsequent aging tests on other servers, and thus resulting in low efficiency of the server aging test.

[0043] The embodiment of the present application adds an induction switch, a power supply and a signal trigger. The induction switch is used to sense whether the plug 103 of the aging rack 102 is inserted into the power socket of the aging chamber, or whether it leaves the power socket 104 of the aging chamber. After the induction switch senses that the plug 103 of the aging rack 102 leaves the power socket 104 of the aging chamber, that is, after the aging test of the server 101 is completed, the circuit where the power supply and the signal trigger are located is turned on and triggered. At this time, the signal trigger is powered on and triggers to send a transfer signal to the transfer vehicle 105, so that the transfer vehicle 105 can transfer the aging rack 102 in time after the aging test of the server 101 is completed, so that other servers can undergo aging tests subsequently, thereby improving the efficiency of aging testing on the servers.

[0044] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0045] Figure 2 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 1 ,like Figure 2 As shown, it includes: a power supply (U1), an induction switch (K1), and a signal trigger (D), one end of the power supply (U1) is electrically connected to one end of the signal trigger (D), and the other end of the signal trigger (D) is electrically connected to one end of the power socket (104) of the aging chamber through a conductive path;

[0046] The other end of the power supply (U1) is electrically connected to the other end of the power socket (104) of the aging chamber through a conductive path;

[0047] An induction switch (K1) is provided at the joint between either end of the power socket (104) of the aging chamber and the conductive path;

[0048] The induction switch (K1) is used to disconnect the electrical connection of the corresponding conductive path when sensing that the plug (103) of the aging rack is inserted into the power socket (104) of the aging chamber; and to connect the electrical connection of the corresponding conductive path when sensing that the plug (103) of the aging rack is removed from the power socket (104) of the aging chamber, so that the signal trigger (D) is powered on and outputs a transport signal to the transport vehicle so that the transport vehicle transports the aging rack (102).

[0049] In combination with the scenario example, the power supply U1 can be direct current, one end of the power supply U1 can be the negative pole, and the other end of the power supply U1 can be the positive pole, that is, the positive pole of the power supply U1 is electrically connected to the other end of the aging chamber power socket 104 through a conductive path, and the negative pole of the power supply U1 is electrically connected to one end of the signal trigger D. The conductive path is a path formed by the power supply U1, the signal trigger D and the inductive switch K1, wherein the inductive switch K1 is arranged at the joint of the conductive path, that is, the inductive switch K1 is respectively connected to the other end of the signal trigger D and the positive pole of the power supply U1, and can be used to sense whether the plug 103 of the aging rack 102 is inserted into the aging chamber power socket 104. The server 101 to be aging tested is placed on the aging rack 102. When the inductive switch K1 senses that the plug 103 of the aging rack 102 is inserted into the aging chamber power socket 104, the inductive switch K1 disconnects the conductive path formed by the power supply U1, the signal trigger D and the inductive switch K1, so that the power supply U1 cannot provide electrical energy, and the signal trigger D cannot send any signal. When the induction switch K1 senses that the plug 103 of the aging rack 102 has left the power socket 104 of the aging chamber, the induction switch K1 connects the conductive path formed by the power supply U1, the signal trigger D, and the induction switch K1, so that the power supply U1 is turned on to provide electrical energy, so that the signal trigger D responds to the power-on trigger and sends a transfer signal to the transfer vehicle. The transfer vehicle is equipped with a signal receiver, which receives the transfer signal sent by the signal trigger D through the signal receiver and then transfers the aging rack 102 out of the aging chamber.

[0050] Based on the aging test control system provided in this example, the induction switch can monitor whether the plug of the aging rack is connected to the power socket of the aging room. When the plug of the aging rack is connected to the power socket of the aging room, the conductive path is disconnected so that the signal trigger cannot send a signal, so that the transfer vehicle will not transfer the aging rack out of the aging room, thereby ensuring the smooth progress of the server aging test. When the plug of the aging rack is disconnected from the power socket of the aging room, the conductive path is connected so that the signal trigger sends a transfer signal to the transfer vehicle, so that the transfer vehicle transfers the aging rack out of the aging room in time, ensuring the smooth progress of subsequent aging tests of other servers, and thus improving the efficiency of server aging tests.

[0051] Optional, Figure 3 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 2 ,like Figure 3 As shown, the inductive switch (K1) comprises: a spring device and a connecting device;

[0052] One end of the connecting device is connected to one end of the aging chamber power socket (104); when the plug (103) of the aging rack (102) is inserted into the aging chamber power socket (104), the other end of the connecting device is disconnected from the other end of the aging chamber power socket (104) by the thrust of the plug (103); when the plug (103) of the aging rack (102) leaves the aging chamber power socket (104), the other end of the connecting device is connected to the other end of the aging chamber power socket (104) by the elastic force of the spring.

[0053] Combined with scenario examples, such as Figure 3 As shown, the inductive switch K1 can be an elastic switch, including a connecting device of the main body and a spring device, and the spring device can be set at a relevant position at one end of the connecting device. When the plug 103 of the aging rack is inserted into the aging chamber power socket 104, the other end of the connecting device is disconnected from the other end of the aging chamber power socket 104 by the thrust of the plug 103, and the spring is pressed down to apply pressure to the spring. When the plug 103 of the aging rack leaves the aging chamber power socket 104, the thrust of the plug 103 on the other end of the connecting device disappears, and then it is restored to its original position by the elastic force of the spring rebound, and then reconnected to the other end of the aging chamber power socket 104.

[0054] Based on the aging test control system provided in this example, the purpose of disconnecting the conductive path when the plug of the aging rack and the power socket of the aging chamber are connected, and connecting the conductive path when the plug of the aging rack and the power socket of the aging chamber are disconnected can be achieved through the cooperation of the spring device and the connecting device.

[0055] Optionally, the signal trigger is at least one of a photoelectric signal trigger, a laser signal trigger or a wireless radio frequency signal trigger.

[0056] In this scenario, opting for an Omron E2E series photoelectric trigger is a good option, while the signal receiver on the transfer vehicle used with it can be a Siemens Profinet receiver module. Opting for a laser signal trigger involves either a gate trigger or a trigger trigger. Both triggering methods are achieved by controlling the laser's light frequency and number of outputs. The signal receiver on the transfer vehicle can be a laser receiving system including a photodetector or amplifier. Signal interaction between the trigger and the transfer vehicle's receiver can also be achieved through wireless radio frequency technology.

[0057] Based on the aging test control system provided in this example, signal interaction between the signal trigger and the signal receiver can be realized to ensure that the transfer vehicle smoothly receives the transfer signal sent by the signal trigger and transfers the aging rack out of the aging room in time, thereby improving the efficiency of aging testing of the server.

[0058] Optional, Figure 4 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 3 ,like Figure 4 As shown, the aging test control system also includes an aging rack locking control module;

[0059] The aging rack locking control module includes: a detection module (106), a control switch (K2) and a lock control mechanism (107);

[0060] A detection module (106) is provided at a position corresponding to the plug (103) of the aging rack (102), and is used to detect whether the plug (103) of the aging rack (102) is powered on to output a detection signal;

[0061] A lock control mechanism (107) is provided at a position corresponding to the roller of the aging rack (102);

[0062] A control switch (K2) is electrically connected to the detection module (106) and is used to start or shut down according to a detection signal; when the detection signal is energized, the control switch (K2) controls the lock control mechanism (107) to lock the roller of the aging rack (102); when the detection signal is not energized, the control switch (K2) controls the lock control mechanism (107) to unlock the roller of the aging rack (102).

[0063] In conjunction with the scenario example, the detection module 106 is set at the position corresponding to the plug 103. The specific position can be determined according to the specific type of the detection module 106. The detection module 106 is mainly used to detect whether the plug 103 of the aging rack is powered. If the detection module 106 detects that the plug 103 of the aging rack is powered, it can be determined that the plug 103 of the aging rack is connected to the power socket 104 of the aging chamber. At this time, a monitoring signal indicating that the plug 103 is powered can be output to the control switch K2. If the detection module 106 detects that the plug 103 of the aging rack 102 is not powered, it can be determined that the plug 103 of the aging rack is not connected to the power socket 104 of the aging chamber. At this time, a monitoring signal indicating that the plug 103 is not powered can be output to the control switch K2. Rollers can be provided at the bottom of the aging rack to facilitate the transfer vehicle to move the aging rack 102. The lock control mechanism 107 can be provided at the position corresponding to the roller of the aging rack 102. The specific position can be determined according to actual conditions. The lock control mechanism 107 is mainly controlled by the control switch K2 to lock the roller. The control switch K2 can determine whether to control the lock control mechanism 107 to lock the rollers of the aging rack 102 by responding to the detection signal. Specifically, after the control switch K2 receives the monitoring signal indicating that the plug 103 is powered on, the control switch K2 controls the lock control mechanism 107 to lock the rollers of the aging rack 102, so that the aging rack 102 cannot move when powered on, so as to ensure the smooth progress of the server aging test. After the control switch K2 receives the monitoring signal indicating that the plug 103 is not powered on, the control switch K2 controls the lock control mechanism 107 to unlock the rollers of the aging rack 102, so that the aging rack 102 can move after power is off, so as to ensure that after the aging test of the server is completed, the transfer vehicle will transport the aging rack out of the aging room in time, so as to improve the efficiency of the server aging test.

[0064] Optional, Figure 5 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 4 ,like Figure 5 As shown, the plug (103) of the aging rack (102) includes a first-end switch contact (1031) and a second-end switch contact (1032);

[0065] The detection module (106) is a voltage sensor, wherein a first input end of the voltage sensor is connected to a first end switch contact (1031), and a second input end of the voltage sensor is connected to a second end switch contact (1032), and is used to detect a voltage signal inside the plug (103) of the aging rack (102);

[0066] The control switch (K2) is an electric control switch, which is set at a preset position on the ground, and the preset position is located below the roller of the aging rack (102);

[0067] The lock control mechanism (107) is a baffle device, which is located above the electric control switch and in the middle of the roller of the aging rack (102);

[0068] The input end of the electric control switch is connected to the first output end of the voltage sensor, and the output end of the electric control switch is connected to the second output end of the voltage sensor, for receiving a voltage signal inside the plug (103) detected by the voltage sensor;

[0069] The electric control switch is electrically connected to the baffle device when receiving a voltage signal to control the baffle device to bulge upward to lock the roller of the aging rack (102); and is also used to disconnect the electric connection with the baffle device when not receiving a voltage signal to control the baffle device to retract to unlock the roller of the aging rack (102).

[0070] In conjunction with the scenario example, the plug 103 of the aging rack is connected to the aging chamber power socket 104 through the switch contact, and the voltage sensor is connected between the two switch contacts to detect whether there is voltage inside the plug 103. When the voltage sensor detects the presence of voltage inside the plug 103, it can be determined that the plug 103 is connected to the aging chamber power socket 104. At this time, the detected voltage signal inside the plug 103 can be transmitted to the control switch K2. When the voltage sensor does not detect the presence of voltage inside the plug 103, it can be determined that the plug 103 is not connected to the aging chamber power socket 104. At this time, the voltage sensor cannot detect the voltage signal inside the plug 103.

[0071] The control switch K2 may be an electrical control switch, such as a relay control switch. The relay control switch and the voltage sensor may be electrically connected, and the voltage sensor transmits the voltage signal inside the plug 103 to the relay control switch via the electrical connection between the voltage sensor and the relay control switch. Alternatively, the voltage sensor may transmit the voltage signal inside the plug 103 to the relay control switch via wireless radio frequency technology. Figure 5As shown, the relay control switch and the lock control mechanism 107 can be set at a preset position on the floor of the aging chamber. When the transfer vehicle transports the aging rack 102 to the aging chamber, the aging rack 102 can be placed above the preset position so that the lock control mechanism 107 is located between the rollers of the aging rack 102. The lock control mechanism 107 can be a baffle device. When the relay control switch receives the voltage signal sent by the voltage sensor, it is electrically connected to the baffle device and can control the baffle device to protrude upward so that the baffle device locks the rollers of the aging rack 102, so that the aging rack 102 cannot move when powered on, thereby ensuring the smooth progress of the server aging test. When the relay control switch does not receive the voltage signal sent by the voltage sensor, it is electrically disconnected from the baffle device. The baffle device is affected by its own gravity and returns to its initial position to release the lock on the rollers of the aging rack 102. This allows the transfer vehicle to move the aging rack 102 after the server aging test is completed.

[0072] Based on the aging test control system provided in this example, the aging rack can be locked when the server is undergoing aging test to ensure the smooth progress of the server aging test. After the server aging test is completed, the aging rack will be unlocked so that the transfer vehicle can transport the server out of the aging room in time, thereby improving the efficiency of the server aging test.

[0073] Optional, Figure 6 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 5 ,like Figure 6 As shown, the plug (103) of the aging rack (102) includes a first-end switch contact (1031) and a second-end switch contact (1032);

[0074] The detection module (106) is a voltage sensor, which is arranged in the plug (103) of the aging rack (102) and connected between the first end switch contact (1031) and the second end switch contact (1032);

[0075] The control switch (K2) is an electric control switch, and the electric control switch is arranged on the aging rack (102);

[0076] The lock control mechanism (107) is a brake device, which is arranged at the connection between the roller of the aging rack (102) and the aging rack body.

[0077] In combination with the scenario example, the plug 103 of the aging rack is connected to the aging room power socket 104 through the switch contact, and the voltage sensor is connected between the two switch contacts. Specifically, Figure 6As shown, the first input terminal of the voltage sensor is connected to the first end switch contact 1031, and the second input terminal of the voltage sensor is connected to the second end switch contact 1032, for detecting whether there is voltage inside the plug 103. When the voltage sensor detects the presence of voltage inside the plug 103, it can determine that the plug 103 is connected to the aging chamber power socket 104. In this case, the detected voltage signal inside the plug 103 can be transmitted to the control switch K2. When the voltage sensor does not detect the presence of voltage inside the plug 103, it can determine that the plug 103 is not connected to the aging chamber power socket 104. In this case, the voltage sensor cannot detect the voltage signal inside the plug 103.

[0078] The control switch K2 may be an electrical control switch, such as a relay control switch. The relay control switch and the voltage sensor may be electrically connected, for example, Figure 6 As shown, the input end of the relay control switch is connected to the first output end of the voltage sensor, and the output end of the relay control switch is connected to the second output end of the voltage sensor, for receiving the voltage signal inside the plug 103 detected by the voltage sensor. The voltage sensor sends the voltage signal inside the plug 103 to the relay control switch through the electrical connection between the relay control switch, or the voltage sensor can also send the voltage signal inside the plug 103 to the relay control switch through wireless radio frequency technology. The relay control switch and the lock control mechanism 107 can be arranged on the aging rack 102, and the lock control mechanism can be a brake device, which can be specifically arranged between the aging rack body and the roller, and the brake device can directly lock the roller. When the relay control switch receives the voltage signal sent by the voltage sensor, it is electrically connected to the brake device and can control the brake device to lock the roller of the aging rack 102 so that the aging rack 102 cannot move when powered on, to ensure the smooth progress of the server aging test. When the relay control switch does not receive the voltage signal sent by the voltage sensor, it controls the brake device to unlock the rollers of the aging rack 102 so that the transfer vehicle can move the aging rack 102 after the server aging test is completed.

[0079] Based on the aging test control system provided in this example, the aging rack can be locked when the server is undergoing aging test to ensure the smooth progress of the server aging test. After the server aging test is completed, the aging rack will be unlocked so that the transfer vehicle can transport the server out of the aging room in time, thereby improving the efficiency of the server aging test.

[0080] Optional, Figure 7 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 6 ,like Figure 7As shown, the detection module (106) is a current sensor, which is arranged in the aging chamber power socket (104) and connected between the first end and the second end of the aging chamber power socket (104);

[0081] The control switch (K2) is an electric control switch, and the electric control switch is arranged on the aging rack (102);

[0082] The lock control mechanism (107) is a brake device, which is arranged at the connection between the roller of the aging rack (102) and the aging rack body.

[0083] In combination with the scenario example, the current sensor is connected to the power socket 104 of the aging chamber, specifically, as shown in FIG. Figure 7 As shown, a first input terminal of the current sensor is connected to a first terminal of the aging chamber power socket 104, and a second input terminal of the current sensor is connected to a second terminal of the aging chamber power socket 104, for detecting whether there is current in the aging chamber power socket 104. When the current sensor detects the presence of current in the aging chamber power socket 104, it can determine that the plug 103 is connected to the aging chamber power socket 104, and can transmit the detected current signal in the aging chamber power socket 104 to the control switch K2. When the current sensor does not detect the presence of current in the aging chamber power socket 104, it can determine that the plug 103 is not connected to the aging chamber power socket 104, and the current sensor cannot detect the current signal in the aging chamber power socket 104.

[0084] The control switch K2 may be an electrical control switch, such as a relay control switch. The relay control switch and the current sensor may be electrically connected, for example, Figure 7As shown, the input end of the relay control switch is connected to the first output end of the current sensor, and the output end of the relay control switch is connected to the second output end of the current sensor, for receiving the current signal inside the aging chamber power socket 104 detected by the current sensor. The current sensor sends the current signal inside the aging chamber power socket 104 to the relay control switch through the electrical connection between the current sensor and the relay control switch. Alternatively, the current sensor can also send the current signal inside the aging chamber power socket 104 to the relay control switch through wireless radio frequency technology. The relay control switch and the lock control mechanism 107 can be arranged on the aging rack 102. The lock control mechanism can be a brake device, which can be specifically arranged between the aging rack body and the roller, and the brake device can directly lock the roller. When the relay control switch receives the current signal sent by the current sensor, it is electrically connected to the brake device and can control the brake device to lock the roller of the aging rack 102 so that the aging rack 102 cannot move when powered on, to ensure the smooth progress of the server aging test. When the relay control switch does not receive the current signal sent by the current sensor, it controls the brake device to unlock the rollers of the aging rack 102 so that the transfer vehicle can move the aging rack 102 after the server aging test is completed.

[0085] Based on the aging test control system provided in this example, the aging rack can be locked when the server is undergoing aging test to ensure the smooth progress of the server aging test. After the server aging test is completed, the aging rack will be unlocked so that the transfer vehicle can transport the server out of the aging room in time, thereby improving the efficiency of the server aging test.

[0086] Optional, Figure 8 Schematic diagram of the structure of the aging test control system provided in the embodiment of the present application Figure 7 ,like Figure 8 As shown, the detection module (106) is a current sensor, which is arranged in the aging chamber power socket (104) and connected between the first end and the second end of the aging chamber power socket (104);

[0087] The control switch (K2) is an electric control switch, which is set at a preset position on the ground, and the preset position is located below the roller of the aging rack (102);

[0088] The lock control mechanism (107) is a baffle device, which is located above the electric control switch and in the middle of the roller of the aging rack (102).

[0089] In combination with the scenario example, the current sensor is connected to the power socket 104 of the aging chamber, specifically, as shown in FIG. Figure 8As shown, a first input terminal of the current sensor is connected to a first terminal of the aging chamber power socket 104, and a second input terminal of the current sensor is connected to a second terminal of the aging chamber power socket 104, for detecting whether there is current in the aging chamber power socket 104. When the current sensor detects the presence of current in the aging chamber power socket 104, it can determine that the plug 103 is connected to the aging chamber power socket 104, and can transmit the detected current signal in the aging chamber power socket 104 to the control switch K2. When the current sensor does not detect the presence of current in the aging chamber power socket 104, it can determine that the plug 103 is not connected to the aging chamber power socket 104, and the current sensor cannot detect the current signal in the aging chamber power socket 104.

[0090] The control switch K2 may be an electrical control switch, such as a relay control switch. The relay control switch and the current sensor may be electrically connected, for example, Figure 8 As shown, the input end of the relay control switch is connected to the first output end of the current sensor, and the output end of the relay control switch is connected to the second output end of the current sensor, for receiving the current signal inside the aging chamber power socket 104 detected by the current sensor. The current sensor transmits the current signal inside the aging chamber power socket 104 to the relay control switch via an electrical connection between the current sensor and the relay control switch. Alternatively, the current sensor may also transmit the current signal inside the aging chamber power socket 104 to the relay control switch via wireless radio frequency technology.

[0091] like Figure 8 As shown, the relay control switch and the lock control mechanism 107 can be set at a preset position on the floor of the aging room. When the transfer vehicle transports the aging rack 102 to the aging room, the aging rack 102 can be placed above the preset position so that the lock control mechanism 107 is in the middle of the rollers of the aging rack 102. The lock control mechanism 107 can be a baffle device. When the relay control switch receives the current signal sent by the current sensor, it is electrically connected to the baffle device and can control the baffle device to bulge upward so that the baffle device locks the rollers of the aging rack 102, so that the aging rack 102 cannot move when powered on, thereby ensuring the smooth progress of the server aging test. When the relay control switch does not receive the current signal sent by the current sensor, it is electrically disconnected from the baffle device. The baffle device is affected by its own gravity and returns to its initial position to release the lock on the rollers of the aging rack 102. This allows the transfer vehicle to move the aging rack 102 after the server aging test is completed.

[0092] Based on the aging test control system provided in this example, the aging rack can be locked when the server is undergoing aging test to ensure the smooth progress of the server aging test. After the server aging test is completed, the aging rack will be unlocked so that the transfer vehicle can transport the server out of the aging room in time, thereby improving the efficiency of the server aging test.

[0093] Optional, Figure 9 Schematic diagram of the structure of the aging test system provided in the embodiment of the present application Figure 1 ,like Figure 9 As shown, it includes: an aging test control system, and an aging rack (102);

[0094] When the plug (103) of the aging rack (102) is inserted into the aging chamber power socket (104) or leaves the aging chamber power socket (104), the induction switch of the aging test control system is triggered to be disconnected or turned on.

[0095] In combination with the scenario example, the structure of the aging test control system can refer to the above embodiment, and its implementation principle and technical effects are similar, so this embodiment will not be described in detail here.

[0096] The aging test control system includes a conductive path formed by a power supply U1, a signal trigger D, and an inductive switch K1. The inductive switch K1 is used to sense whether the plug 103 of the aging rack is inserted into the power socket 104 of the aging chamber. When the inductive switch K1 senses that the plug 103 of the aging rack is inserted into the power socket 104 of the aging chamber, the conductive path formed by the power supply U1, the signal trigger D, and the inductive switch K1 is disconnected, so that the power supply U1 cannot provide electrical energy, and the signal trigger D cannot send any signal. When the inductive switch K1 senses that the plug 103 of the aging rack is removed from the power socket 104 of the aging chamber, the conductive path formed by the power supply U1, the signal trigger D, and the inductive switch K1 is connected, so that the power supply U1 is turned on to provide electrical energy, so that the signal trigger D responds to the power-on trigger and sends a transfer signal.

[0097] Optional, Figure 10 Schematic diagram of the structure of the aging test system provided in the embodiment of the present application Figure 2 ,like Figure 10 As shown, the aging test system further includes: a transfer vehicle (105);

[0098] The transfer vehicle (105) is used to receive a transfer signal output by a signal trigger and transfer the corresponding aging rack (102) according to the transfer signal.

[0099] In combination with the scenario example, when the induction switch K1 senses that the plug 103 of the aging rack has left the power socket 104 of the aging chamber, the conductive path formed by the power supply U1, the signal trigger D and the induction switch K1 is turned on, so that the power supply U1 is turned on to provide electrical energy, so that the signal trigger D responds to the power-on trigger and sends a transfer signal to the transfer vehicle 105. The transfer vehicle 105 is equipped with a signal receiver, which receives the transfer signal sent by the signal trigger D through the signal receiver, and then transfers the aging rack 102 out of the aging chamber.

[0100] Optional, Figure 11 Schematic diagram of the structure of the aging test system provided in the embodiment of the present application Figure 3 ,like Figure 11 As shown, the aging test system also includes: aging chamber power supply (U0);

[0101] The aging chamber power supply (U0) is connected to the aging chamber power socket (104) and is used to provide power to the aging test control system.

[0102] In the scenario example, the aging chamber power supply U0 provides power to the aging test control system to ensure that the aging test control system can operate normally.

[0103] Based on the burn-in test system provided by this embodiment, when the burn-in rack's plug is connected to the burn-in chamber power socket, the induction switch disconnects the conductive path to prevent the signal trigger from sending a signal, preventing the transfer vehicle from transporting the burn-in rack out of the burn-in chamber, thereby ensuring the smooth progress of the server burn-in test. Furthermore, when the burn-in rack's plug is disconnected from the burn-in chamber power socket, the conductive path is connected to enable the signal trigger to send a transfer signal to the transfer vehicle, allowing the transfer vehicle to promptly transport the burn-in rack out of the burn-in chamber, ensuring the smooth progress of subsequent burn-in tests on other servers and improving the efficiency of server burn-in tests.

[0104] The above is a detailed introduction to an aging test control system and an aging test system provided by the present application. This article uses specific examples to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the claims of the present application.

Claims

1. An aging test control system, characterized in that: include: A power supply (U1), an inductive switch (K1), and a signal trigger (D), wherein one end of the power supply (U1) is electrically connected to one end of the signal trigger (D), and the other end of the signal trigger (D) is electrically connected to one end of a power socket (104) of the aging chamber via a conductive path; The other end of the power supply (U1) is electrically connected to the other end of the power socket (104) of the aging chamber through a conductive path; The induction switch (K1) is provided at the joint between either end of the aging chamber power socket (104) and the conductive path; The inductive switch (K1) is used to disconnect the electrical connection of the corresponding conductive path when sensing that the plug (103) of the aging rack (102) is inserted into the power socket (104) of the aging chamber; and to connect the electrical connection of the corresponding conductive path when sensing that the plug (103) of the aging rack (102) is removed from the power socket (104) of the aging chamber, so that the signal trigger (D) is powered on and outputs a transport signal to the transport vehicle so that the transport vehicle transports the aging rack (102); The inductive switch (K1) comprises: a spring device and a connecting device; One end of the connecting device is connected to one end of the aging chamber power socket (104); when the plug (103) of the aging rack (102) is inserted into the aging chamber power socket (104), the other end of the connecting device is disconnected from the other end of the aging chamber power socket (104) by the thrust of the plug (103); when the plug (103) of the aging rack (102) leaves the aging chamber power socket (104), the other end of the connecting device is connected to the other end of the aging chamber power socket (104) by the spring force.

2. The aging test control system according to claim 1, characterized in that: The signal trigger is at least one of a photoelectric signal trigger, a laser signal trigger or a wireless radio frequency signal trigger.

3. The aging test control system according to claim 1, characterized in that: Also included is a aging rack lock control module; The aging rack locking control module comprises: a detection module (106), a control switch (K2) and a lock control mechanism (107); The detection module (106) is arranged at a position corresponding to the plug (103) of the aging rack (102), and is used to detect whether the plug (103) of the aging rack (102) is powered on to output a detection signal; The lock control mechanism (107) is arranged at a position corresponding to the roller of the aging rack (102); The control switch (K2) is electrically connected to the detection module (106) and is used to start or shut down according to the detection signal; when the detection signal is powered on, the control switch (K2) controls the lock control mechanism (107) to lock the roller of the aging rack (102); when the detection signal is not powered on, the control switch (K2) controls the lock control mechanism (107) to unlock the roller of the aging rack (102).

4. The aging test control system according to claim 3, characterized in that: The plug (103) of the aging rack (102) comprises a first-end switch contact (1031) and a second-end switch contact (1032); The detection module (106) is a voltage sensor, wherein a first input end of the voltage sensor is connected to the first end switch contact (1031), and a second input end of the voltage sensor is connected to the second end switch contact (1032), and is used to detect a voltage signal inside the plug (103) of the aging rack (102); The control switch (K2) is an electric control switch, and the electric control switch is arranged at a preset position on the ground, and the preset position is located below the roller of the aging rack (102); The lock control mechanism (107) is a baffle device, which is located above the electric control switch and in the middle of the roller of the aging rack (102); The input end of the electric control switch is connected to the first output end of the voltage sensor, and the output end of the electric control switch is connected to the second output end of the voltage sensor, for receiving a voltage signal inside the plug (103) detected by the voltage sensor; The electric control switch is electrically connected to the baffle device when receiving a voltage signal to control the baffle device to bulge upward to lock the roller of the aging rack (102); and is also used to disconnect the electric connection with the baffle device when not receiving a voltage signal to control the baffle device to retract to unlock the roller of the aging rack (102).

5. The aging test control system according to claim 3, characterized in that: The plug (103) of the aging rack (102) comprises a first-end switch contact (1031) and a second-end switch contact (1032); The detection module (106) is a voltage sensor, which is arranged in the plug (103) of the aging rack (102) and connected between the first-end switch contact (1031) and the second-end switch contact (1032); The control switch (K2) is an electric control switch, and the electric control switch is arranged on the aging rack (102); The lock control mechanism (107) is a brake device, and the brake device is arranged at the connection between the roller of the aging rack (102) and the aging rack body.

6. The aging test control system according to claim 3, characterized in that: The detection module (106) is a current sensor, which is arranged in the aging chamber power socket (104) and connected between the first end and the second end of the aging chamber power socket (104); The control switch (K2) is an electric control switch, and the electric control switch is arranged on the aging rack (102); The lock control mechanism (107) is a brake device, and the brake device is arranged at the connection between the roller of the aging rack (102) and the aging rack body.

7. The aging test control system according to claim 3, characterized in that: The detection module (106) is a current sensor, which is arranged in the aging chamber power socket (104) and connected between the first end and the second end of the aging chamber power socket (104); The control switch (K2) is an electric control switch, and the electric control switch is arranged at a preset position on the ground, and the preset position is located below the roller of the aging rack (102); The lock control mechanism (107) is a baffle device, which is located above the electric control switch and in the middle of the roller of the aging rack (102).

8. An aging test system, characterized in that: include: The aging test control system according to any one of claims 1 to 7, and the aging rack (102); When the plug (103) of the aging rack (102) is inserted into or removed from the aging chamber power socket (104), the induction switch of the aging test control system is triggered to be disconnected or connected.

9. The aging test system according to claim 8, characterized in that: Also includes: A transfer vehicle (105); the transfer vehicle (105) is used to receive a transfer signal output by a signal trigger and transfer the corresponding aging rack (102) according to the transfer signal.

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