Testing equipment and air curtain structure thereof

Abstract

The invention relates to test equipment, which comprises a cabin body for providing a low-temperature test environment for a to-be-tested element, and an air curtain structure which is annularly arranged around the cabin body and is used for sending dry air towards the cabin body. The air curtain structure comprises a ring body and a plurality of open holes formed in the inner side of the ring body, so that the ring body sends dry air to the cabin body through the plurality of open holes, the environment humidity is reduced, and the problem that the test equipment is damaged due to dripping of dew is avoided.

Description

Technical Field

[0001] The present invention relates to a testing device, and more particularly to a testing device for semiconductor devices and its air curtain structure. Background Art

[0002] Traditional electronic components with multiple contacts need to go through processes such as die bonding, wire bonding, and encapsulation, and then be cut into independent electronic components through a cutting and forming process. In addition, to ensure the quality of electronic components, packaging manufacturers need to perform testing operations on electronic components through testing devices to eliminate defective products.

[0003] In addition, when electronic components are actually used, they may be in an extremely low-temperature environment or a high-temperature environment. Therefore, when the testing device performs electrical tests on electronic components, it must simulate the low-temperature environment or high-temperature environment that the electronic components can actually use in the future for testing.

[0004] For this reason, in order for current mainstream 3C electronic products (such as mobile phones / cameras) to continue to operate in an extremely low-temperature environment, packaging manufacturers must put electronic components into a low-temperature testing machine to simulate / test an ultra-low-temperature environment. For example, they can still operate under a testing standard of minus 55 to 65 degrees. Therefore, the packaging industry has developed a testing machine 1 as shown in Figure 1 The testing machine 1 includes: a chamber 11, a robotic arm 12 for picking up electronic components, a test socket body 13 for testing the electronic components, and a circuit board 14 for receiving test signals.

[0005] However, the aforementioned chamber 11 is a closed space, and the internal temperature needs to simulate an ultra-low temperature state, while the outside of the chamber 11 is at room temperature, and the temperature difference between the two environments is too large. Therefore, condensed water w will form on the bottom surface of the chamber 11. If the condensed water w drips onto the circuit board 14, it will cause the circuit board 14 to short-circuit or even be damaged. Currently, the industry uses manual methods to fix the external temperature of the chamber 11 at a specific operating time (such as 4 hours) to evaporate the condensed water w, and combines manual wiping and other methods to remove the condensed water w.

[0006] However, the aforementioned manual method not only wastes manpower, but also takes time for heating up and removing the condensed water. Moreover, there is still a possibility that the condensed water will drip onto the circuit board due to improper manual operation. Therefore, how to solve the aforementioned problems has actually become a difficult problem that the industry urgently needs to overcome. Summary of the Invention

[0007] In view of the above-mentioned deficiencies of the traditional technologies, the present invention provides a testing device, comprising: a chamber for providing a low-temperature testing environment for a device under test; a pick-and-place device for moving the device under test into the chamber; a testing base connected to the chamber for testing the device under test; an electronic carrier board connected to the testing base for receiving test information; and an air curtain structure disposed around the chamber for outputting a fluid towards the chamber.

[0008] In the above-mentioned testing device, the pick-and-place device is a robotic arm.

[0009] In the above-mentioned testing device, the device under test is an electronic component.

[0010] In the above-mentioned testing device, the air curtain structure is fixed to the side of the testing base or the outer surface of the chamber.

[0011] The present invention further provides an air curtain structure applied to a testing device having a chamber for providing a low-temperature testing environment for a device under test, comprising: a ring disposed around the chamber and being hollow for fluid to flow therethrough; and a plurality of openings disposed inside the ring for the fluid to output from the inside of the ring towards the outside of the chamber.

[0012] In the above-mentioned air curtain structure, a plurality of pipelines are connected to the outer side of the ring to supply fluid from the outside to the ring.

[0013] In the above-mentioned air curtain structure, the directions of the plurality of openings are inclined upward to output the fluid.

[0014] In summary, the testing device of the present invention mainly disposes an air curtain structure around the chamber, so that the air curtain structure blows out dry air from its plurality of openings to reduce the environmental humidity and maintain the surface of the chamber dry without water vapor generation. In this way, not only can the labor and time costs required for the conventional manual method of fixing at a specific operation time for shutdown and external heating of the chamber to evaporate the condensed water be saved, but also the problem of damage to the testing device caused by the dripping of condensed water can be avoided. Description of the Drawings

[0015] Figure 1 Schematic diagram of a conventional testing device.

[0016] Figure 2 Schematic diagram of the testing device of the present invention.

[0017] Figure 3 Schematic diagram of the air curtain structure of the present invention applied to a testing device.

[0018] Description of the Reference Numerals

[0019] 1 Testing machine

[0020] 11 Chamber

[0021] 12 Manipulator arm

[0022] 13 Test socket body

[0023] 14 Circuit board

[0024] 2 Test equipment

[0025] 21 Cabin body

[0026] 22 Pick-and-place device

[0027] 23 Test body

[0028] 24 Electronic carrier board

[0029] 25 Air curtain structure

[0030] 250 Ring body

[0031] 251 Opening

[0032] 252 Pipeline

[0033] t Component to be tested

[0034] w Condensed water Specific implementation manner

[0035] The following illustrates the implementation manner of the present invention through specific specific embodiments. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification.

[0036] It should be noted that the structures, proportions, sizes, etc. shown in the attached drawings of this specification are only used to cooperate with the content disclosed in the specification for the understanding and reading of those skilled in the art, and are not used to limit the limiting conditions under which the present invention can be implemented. Therefore, they do not have a substantial technical meaning. Any modification of the structure, change of the proportional relationship, or adjustment of the size, without affecting the effects that the present invention can produce and the purposes that can be achieved, should still fall within the scope that can be covered by the technical content disclosed in the present invention. At the same time, the terms such as "upper", "first", "second", etc. cited in this specification are only for the convenience of clear narration, and are not used to limit the scope under which the present invention can be implemented. The change or adjustment of their relative relationships, without substantial change in the technical content, should also be regarded as the scope under which the present invention can be implemented.

[0037] Figure 2 It is a schematic diagram of the test equipment 2 of the present invention, which includes a cabin body 21, a pick-and-place device 22, a test body 23, an electronic carrier board 24 and an air curtain structure 25.

[0038] The cabin body 21 is used to provide a low-temperature test environment, for example, from 0 to -65 degrees Celsius.

[0039] The pick-and-place device 22 is, for example, a robotic arm, which is used to move the device under test t into the chamber 21. For example, the device under test t is moved into the chamber 21 by means of picking / adsorbing, etc., so as to perform an electrical test in the set test environment. The device under test t is, for example, an electronic component such as an active component, a passive component or a packaging module.

[0040] The test base 23 is connected to the chamber 21 and is used to place / test the device under test t.

[0041] The electronic carrier board 24 is connected to the test base 23 and is used to receive test information.

[0042] The air curtain structure 25 is disposed around the chamber 21 to output a fluid toward the chamber 21. The air curtain structure 25 can be disposed between the chamber 21 and the electronic carrier board 24. For example, the air curtain structure 25 can be locked to the side of the test base 23 or locked to the outer surface of the chamber 21.

[0043] Please also refer to Figure 3 , the air curtain structure 25 includes a ring body 250 and a plurality of openings 251 provided on the ring body. The ring body 250 is hollow to allow a fluid to flow therethrough. The plurality of openings 251 are provided on the inner side of the ring body 250 to allow the fluid to shoot out from the inside of the ring body 250 to the outside. In addition, a plurality of pipelines 252 are connected to the outer side of the ring body 250 to supply a fluid from the outside to the ring body 250 and shoot it out through the plurality of openings 251.

[0044] In this embodiment, the ring body 250 is rectangular and its overall dimensions (length×width×height) are approximately 30*15*4 cm. The plurality of openings 251 are provided on the inner side of the ring body 250, and the aperture of each opening 251 is approximately 1.5 to 3 mm. In addition, the directions of the plurality of openings 251 can be inclined upward so that the blowing angle of the fluid to the outside is approximately 10 to 45 degrees. In addition, the flow rate of the fluid is approximately 20 to 40 L / min. The foregoing embodiment is only an illustrative example and is not intended to limit the present invention. It needs to be actually adjusted in combination with the on-site environmental temperature and the size of the test equipment.

[0045] In actual application, the pick-and-place device 22 picks up the device under test t into the chamber 21 and places the device under test t on the test base 23 for electrical testing. Since the test temperature in the chamber 21 is dozens of degrees below zero Celsius (for example, -35 to -65 degrees), and the room temperature outside the chamber 21 is approximately 22 to 25 degrees Celsius, therefore, during the test, due to the large temperature difference inside and outside the chamber, condensation water may be generated on the outer wall surface (especially the bottom surface) of the chamber 21. At this time, dry air is blown out from the plurality of openings 251 of the air curtain structure 25 surrounding the chamber 21 to reduce the environmental humidity, maintain the surface of the chamber 21 dry without water vapor generation, and avoid the problem of damage to the equipment caused by the dripping of traditional condensation water droplets.

[0046] In summary, the test equipment of the present invention mainly surrounds the cabin body with an air curtain structure, and the air curtain structure blows out dry air from its multiple openings to reduce the environmental humidity and maintain the surface of the cabin body dry without water vapor generation. In this way, not only can it save the manpower and time required for traditional manual fixing to stop the machine and raise the temperature outside the cabin body at specific operating times to evaporate the condensed water, but it can also avoid the problem of damage to the test equipment caused by the dripping of condensed water droplets.

[0047] The above embodiments are only used to illustrate the principle and its effects of the present invention by way of example, and are not used to limit the present invention. Any person skilled in the art can modify the above embodiments without departing from the spirit and scope of the present invention. Therefore, the scope of the right protection of the present invention should be as listed in the claims.

Claims

1. A testing device, comprising: A chamber for providing a low-temperature testing environment for a device under test; A pick-and-place device for moving the device under test into the chamber; A test base connected to the chamber for testing the device under test; An electronic carrier board connected to the test base for receiving test information; And An air curtain structure disposed around the chamber for outputting a fluid towards the chamber.

2. The test device according to claim 1, wherein The pick-and-place device is a robotic arm.

3. The testing device according to claim 1, wherein The device under test is an electronic component.

4. The test device according to claim 1, wherein, The air curtain structure is fixed to the side of the test base or the outer surface of the chamber.

5. The test device according to claim 1, wherein, The air curtain structure includes a ring body and a plurality of openings provided on the inner side of the ring body, and the ring body is hollow to allow the fluid to output outward from the ring body through the plurality of openings towards the chamber.

6. The testing device according to claim 5, wherein, A plurality of pipelines are connected to the outer side of the ring body to allow an external source to supply the fluid into the ring body.

7. The test device according to claim 5, wherein, The directions of the plurality of openings are inclined upward to output the fluid.

8. An air curtain structure applied to a testing device having a chamber for providing a low-temperature testing environment for a device under test, the air curtain structure comprising: A ring body disposed around the chamber, and the ring body is hollow to allow a fluid to flow therethrough; And A plurality of openings provided on the inner side of the ring body for allowing the fluid to output outward from the ring body towards the chamber.

9. The air curtain structure according to claim 8, wherein, A plurality of pipelines are connected to the outer side of the ring body to allow an external source to supply the fluid into the ring body.

10. The air curtain structure according to claim 8, wherein, The directions of the plurality of openings are inclined upward to output the fluid.

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