Device and method for testing electrical performance of electronic equipment based on voltage signal processing

Abstract

The present application relates to the technical field of electrical variable measurement, and specifically to an electronic equipment electrical performance testing device and method based on voltage signal processing. The method includes: collecting eye diagrams; processing the eye diagrams to obtain a signal connectivity domain, obtaining jitter conditions and eye opening based on the signal connectivity domain and the central opening area of the eye diagram; obtaining circuits in the circuit diagram, obtaining circuit complexity based on the circuit area and the edge, constructing a curve for the eye diagram features, determining the cumulative residual value based on the difference between the curve and the fitted straight line; and obtaining the change trend based on this; then screening standard points, obtaining the instability coefficient based on the difference in the change trend of parameter iteration and the difference in the eye diagram features to screen the optimal oscilloscope parameters; and performing performance testing using the optimal oscilloscope parameters. The present application avoids problems with the electrical performance of the device due to problems with the oscilloscope parameter settings during electrical performance testing.

Description

Technical Field

[0001] The present application relates to the technical field of electrical variable measurement, and in particular to a device and method for testing the electrical performance of electronic equipment based on voltage signal processing. Background Art

[0002] Electrical performance testing involves using an oscilloscope to examine the signal quality of a PCB during signal transmission. An oscilloscope is used to observe and measure the waveform of electrical signals, displaying information such as amplitude, frequency, and phase. By analyzing these characteristics, the electrical performance of the PCB can be tested. This signal quality analysis utilizes eye diagrams, which are the cumulative display of a series of digital signals on an oscilloscope. Therefore, eye diagram analysis is central to signal integrity analysis in high-speed interconnect systems.

[0003] When testing the PCB board obtained above, it is necessary to touch the oscilloscope to a specific point on the PCB board. The probe transmits an electrical signal waveform, and the other probe receives the electrical signal to determine the signal transmission status of the PCB board. However, during the test, the parameters in the oscilloscope need to be adjusted to ensure that the eye diagram generated during the test is not due to unreasonable parameter settings, which may mistakenly indicate a problem with the device's electrical performance. When automatically adjusting parameters, it is necessary to analyze the parameter adjustment through the eye diagram. The eye diagram analysis after the probe moves through the PCB circuit can determine whether the problem is the device's electrical performance or a parameter setting error. Summary of the Invention

[0004] In order to solve the technical problem of inaccurate electrical performance testing due to parameter setting errors, this application provides an electronic device electrical performance testing device and method based on voltage signal processing. The technical solutions adopted are as follows:

[0005] In a first aspect, the present application proposes a method for testing the electrical performance of an electronic device based on voltage signal processing, the method comprising the following steps:

[0006] Obtain a circuit diagram, and collect an eye diagram of a voltage signal in the circuit diagram using a probe;

[0007] The background area of the eye diagram is removed to obtain the signal connectivity domain and the maximum width of the signal connectivity domain; the jitter of the signal connectivity domain is calculated based on the number of pixels, grayscale value and maximum width of the signal connectivity domain; the eye openness is obtained based on the maximum vertical and horizontal distances and area of the central opening area in the eye diagram;

[0008] By moving the probe in the circuit diagram, multiple lines are acquired, the oscilloscope parameters are iterated, and the eye diagram under the oscilloscope parameters is acquired; the point acquired by the probe is recorded as the target point, and the circuit complexity is acquired based on the area and edge length of the line around the target point; the jitter condition and eye opening degree are recorded as eye diagram features, and a characteristic curve is acquired for each eye diagram feature of each line; a straight line is fitted to the characteristic curve, and the cumulative residual value of each characteristic curve in each line is acquired based on the difference between the fitted straight line and the characteristic curve and the circuit complexity of the target point; the change trend of the corresponding eye diagram feature is acquired based on the cumulative residual value and the slope of the fitted straight line; the standard point is selected based on the difference between the target point and the fitted straight line point and the circuit complexity; the instability coefficient is acquired based on the difference in the change trend of the oscilloscope parameters corresponding to adjacent iterations and the difference in the eye diagram features of the standard point; the instability coefficient is compared with the preset threshold to select the optimal oscilloscope parameters;

[0009] The eye diagram is obtained by optimizing the oscilloscope parameters, and the performance test is performed by comparing the jitter and eye opening of the eye diagram with the preset threshold.

[0010] In the above scheme, the advantage of the present application over the prior art is that the parameter adjustment situation is quantified by the feature differences at different positions under the same parameters and the feature change differences at the same position under different parameters, and the optimal situation under each parameter change is quantified by the change curve of the constructed eye diagram feature. The oscilloscope parameters can be selected according to the parameter adjustment situation to improve the robustness of the equipment during detection, and avoid directly judging that there is a problem with the electrical performance of the equipment obtained by capturing anomalies in the acquired eye diagram during electrical performance testing. At the same time, the direction of moving the probe can not only determine the optimal parameters but also locate the area in the PCB board where the problem occurs.

[0011] In one embodiment, the jitter of the signal connectivity domain is positively correlated with the number of pixels in the signal connectivity domain and the maximum width of the signal connectivity domain; the jitter of the signal connectivity domain is negatively correlated with the grayscale value of the pixel.

[0012] In one embodiment, the eye opening degree is positively correlated with the maximum longitudinal distance of the central opening area, the maximum transverse distance of the central opening area, and the area of the central opening area.

[0013] In one embodiment, the circuit complexity is obtained by:

[0014] A window is constructed with each target point as the center. The circuit complexity is negatively correlated with the area of the line in the window and positively correlated with the length of the line edge in the window.

[0015] In one embodiment, the horizontal coordinate of the characteristic curve is the target point, and the vertical coordinate is the eye diagram feature.

[0016] In one embodiment, the method for obtaining the cumulative residual value of each characteristic curve in each circuit based on the difference between the fitted straight line and the characteristic curve and the circuit complexity of the target point is:

[0017] The difference in eye opening degree of the same target point on the characteristic curve and the fitting line is taken as the residual of the target point;

[0018] The expression of the cumulative residual value is:

[0019] , represents the residual of the cth target point in the ath line, represents the circuit complexity of the cth target point in the ath line, represents the number of target points in the a-th line, Represents the cumulative residual value of the a-th characteristic curve.

[0020] In one embodiment, the change trend is positively correlated with the cumulative residual value and the slope of the fitting line.

[0021] In one embodiment, the method for screening standard points is:

[0022] Will Compared with the preset threshold, if it is greater than the preset threshold, the target point is recorded as the standard point.

[0023] In one embodiment, the method for obtaining the instability coefficient based on the difference in change trends of oscilloscope parameters corresponding to adjacent iterations and the difference in eye diagram characteristics of standard points is:

[0024] , It represents the difference in the changing trend of the eye opening curves corresponding to the j-th iteration and the j-1-th iteration of the a-th line. Indicates the difference in the changing trend of the jitter curve corresponding to the j-th iteration and the j-1-th iteration of the a-th line. It represents the difference in jitter between the jth iteration and the j-1th iteration for the rth standard point of the ath line. represents the difference in eye opening between the jth iteration and the j-1th iteration of the rth standard point on the ath line, M represents the number of standard points, It represents the instability coefficient of the a-th line at the j-th iteration. The eye opening curve and the jitter curve are collectively referred to as characteristic curves.

[0025] Secondly, the test device includes a probe, a holding tool, a servo, a connecting wire, a display, an external button, a probe housing, a data processing center, and an oscilloscope.

[0026] The beneficial effects of this application are:

[0027] The advantage of the present application over the prior art is that the parameter adjustment situation is quantified by the feature differences at different positions under the same parameters and the feature change differences at the same position under different parameters, and the optimal situation under each parameter change is quantified by the change curve of the constructed eye diagram feature. The oscilloscope parameters can be selected according to the parameter adjustment situation to improve the robustness of the device during detection, and avoid problems with the electrical performance of the device due to problems with the oscilloscope parameter settings during electrical performance testing. At the same time, the direction of moving the probe can not only determine the optimal parameters but also locate the area in the PCB board where the problem occurs. The test accuracy can be improved by optimizing the parameters. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present application or the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0029] Figure 1 A flow chart of a method for testing the electrical performance of an electronic device based on voltage signal processing provided in one embodiment of the present application;

[0030] Figure 2 Schematic diagram of the test device. DETAILED DESCRIPTION

[0031] To further illustrate the technical means and effects employed by this application to achieve the intended invention objectives, the following, in conjunction with the accompanying drawings and preferred embodiments, describes in detail the specific implementation, structure, features, and effects of an electronic device electrical performance testing device and method based on voltage signal processing proposed in this application. In the following description, different references to "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. Furthermore, specific features, structures, or characteristics of one or more embodiments may be combined in any suitable manner.

[0032] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0033] An embodiment of an electronic device electrical performance testing device and method based on voltage signal processing:

[0034] The following describes in detail a specific solution of an electronic device electrical performance testing device and method based on voltage signal processing provided by the present application with reference to the accompanying drawings.

[0035] See also Figure 1 , which shows a flow chart of a method for testing the electrical performance of an electronic device based on voltage signal processing provided by one embodiment of the present application, the method comprising the following steps:

[0036] Step S001: Create a circuit diagram and control the probe to collect an eye diagram.

[0037] The Jialichuang platform constructs a circuit diagram for the PCB board. Based on the obtained PCB circuit diagram, a servo-controlled probe can be used to slide the probe through the PCB circuit. The probe collects corresponding electrical signals, which are then transmitted to a data processing center via connecting wires. Directly analyzing the waveform of the electrical signal cannot determine the quality of information processing in the circuit. Therefore, after normalizing the electrical signal, the unit interval (UI) is determined using a phase-locked loop (PLL) or zero-crossing detection. UI alignment involves segmenting the data based on the trigger edge or clock signal, and superimposing the segmented waveform data to form an eye diagram, which is then displayed on a monitor. In this application, electrical signals are represented by voltage.

[0038] At this point, the eye diagram data is acquired.

[0039] Step S002 : Process the eye diagram to obtain a signal connectivity domain, and obtain jitter conditions and eye opening based on the signal connectivity domain and the center opening area of the eye diagram.

[0040] Eye diagram data represents the waveform of a processed electrical signal. The features within the eye diagram data can be used to analyze the quality of the acquired signal. Significant issues with the acquired signal quality can arise from two possible causes: improper oscilloscope parameter settings or issues with the acquired device's electrical performance. Subsequent electrical performance testing requires ensuring that the acquired parameters are appropriate. During parameter adjustments, it's necessary to extract changes in the eye diagram's features and conduct analysis based on the eye diagram.

[0041] The acquired eye diagram is formed by superimposing waveform data from multiple time periods to form a large curve. The greater the number of superimposed areas, the greater the grayscale value represented, while the smaller the number of superimposed areas, the smaller the grayscale value. A threshold is set in the eye diagram, and points with grayscale values less than the threshold are considered background points. All background points in the eye diagram are removed, thereby removing the background area and retaining the signal connectivity domain. In this embodiment, the acquired eye diagram is processed using the Otsu thresholding method to obtain a threshold.

[0042] If there is crosstalk, jitter will appear in the signal part of the eye diagram, which is reflected in the signal connectivity domain as an increase in the area of the signal connectivity domain, while the total number of signals is fixed. When crosstalk occurs, the superimposed grayscale value will also be smaller. Therefore, the smaller the grayscale value of each pixel, the greater the number of pixels, and the more severe the jitter. In addition, a vertical straight line is drawn for the signal connectivity domain, and the part of the vertical straight line passing through the connectivity domain is recorded as the width to obtain the maximum width of the signal connectivity domain. If there is no crosstalk, the width is smaller, and if there is crosstalk, the width is larger. Therefore, the larger the maximum width, the more severe the jitter. Therefore, the jitter of the signal connectivity domain is calculated based on the number of pixels in the signal connectivity domain, the grayscale value, and the maximum width of the signal connectivity domain.

[0043] The jitter of the signal connectivity domain is positively correlated with the number of pixels in the signal connectivity domain and the maximum width of the signal connectivity domain; the jitter of the signal connectivity domain is negatively correlated with the grayscale value of the pixel.

[0044] It should be noted that positive correlation means that when one variable increases, the other variable also increases, and the two variables change in the same direction. When one variable changes from large to small or from small to large, the other variable also changes from large to small or from small to large; the specific relationship is determined by actual application and this application does not impose any special restrictions.

[0045] It should be noted that negative correlation means that when one variable increases, the other variable decreases accordingly, and the two variables change in opposite directions. When one variable changes from large to small or from small to large, the other variable also changes from small to large or from large to small. The specific relationship is determined by actual application and this application does not impose any special restrictions.

[0046] Preferably, in this embodiment, the expression for the jitter condition of the signal connectivity domain is:

[0047] , Indicates the maximum width of the signal connectivity domain, Represents the gray value of the z-th pixel in the signal connectivity domain, Represents the number of pixels in the signal connectivity domain, Indicates the jitter of the signal connectivity domain. The jitter of the signal connectivity domain is the jitter of the eye diagram.

[0048] In the eye diagram, eye opening is associated with jitter and bit error rate (BER). Eye opening is measured in terms of vertical height, horizontal width, and eye opening area. The vertical height is the maximum vertical distance of the central opening area, the horizontal width is the maximum horizontal distance of the central opening area, and the eye opening area is the area of the central opening area. Eye opening is positively correlated with the vertical height, horizontal width, and eye opening area.

[0049] Preferably, in this embodiment, the expression of eye opening degree is: , Indicates the maximum horizontal distance of the eye diagram center opening area. Indicates the maximum vertical distance of the eye diagram center opening area. Indicates the area of the central opening of the eye diagram; Indicates the eye opening in the eye diagram.

[0050] At this point, the eye opening and jitter of the eye diagram are obtained.

[0051] Step S003, obtain the circuit in the circuit diagram, obtain the circuit complexity based on the circuit area and edge, construct a curve for the eye diagram characteristics, determine the cumulative residual value based on the difference between the curve and the fitted straight line; and obtain the change trend based on this; then select the standard points, and obtain the instability coefficient based on the difference in the change trend of parameter iteration and the difference in eye diagram characteristics to select the optimal oscilloscope parameters.

[0052] According to the above operations, the features of the eye diagram data can be constructed. The electrical performance of the PCB obtained by directly determining the constructed features has certain interference. What needs to be considered is the change of the above constructed features. For example, when the probe slides on the PCB board, the electrical performance of the circuit on the PCB board is different due to the different electronic components connected to the circuit. At the same time, the corresponding impedance (circuit) requires different oscilloscope adjustment parameters. Therefore, when testing the electrical performance of the PCB board, it is necessary to consider the complexity of the circuit where the probe point is located. For the detection data in the area with dense circuit distribution, the acquired data is more susceptible to external interference. For the area with complex circuits, the situation is more complicated when the electrical performance problems occur, and the corresponding abnormal conditions are also more obvious. For the circuits in complex areas, the oscilloscope parameters are not significantly affected. Although they will be interfered by the multipath effect in complex circuits, the corresponding impact itself is not obvious as long as the parameters are set reasonably.

[0053] By moving the probe across the PCB surface, the PCB can be divided into multiple circuits. Initial oscilloscope parameters are set, and the probe is used to move along each circuit. A circuit is a connection between electronic components. In a circuit diagram, an electrical signal is collected every 10 pixels moved.

[0054] The complexity of the circuit refers to the dense layout of the circuits in the PCB board. The area of the corresponding circuit connection domain is larger under the dense distribution. At the same time, the thickness of the circuit must also be considered. For example, the distribution connection domain area of multiple thin circuits and one thick circuit is the same, but the thin circuit is more complex.

[0055] Based on the above analysis, the circuit complexity is calculated. First, the pixel points where the probe collects electrical signals are marked as target points. A window is constructed with each target point as the center. The circuit complexity corresponding to each target point is calculated based on the area of the circuit within the window and the length of the circuit edge in the window. The edge is obtained by applying an edge detection algorithm to the circuit diagram.

[0056] Circuit complexity is negatively correlated with the area of the line in the window and positively correlated with the length of the line edge in the window;

[0057] Preferably, the window size constructed in this embodiment is 10*10, and the expression of circuit complexity is:

[0058] , Indicates the length of the line edge in the window corresponding to the c-th target point, represents the area of the line in the window corresponding to the c-th target point, Indicates the circuit complexity corresponding to the c-th target point.

[0059] The larger the area of the line in the window, the larger the area of the line connectivity domain in the window, the denser the lines, and the denser the lines, the fewer the lines and the less complex the lines. In addition, the longer the edge length of the line, the more lines there are and the more complex the lines.

[0060] Since the eye opening degree and eye jitter of the eye diagram are the features extracted from each target point, the features of all target points on a line are constructed into two curves, with the order of the target points as the horizontal coordinate, and the eye opening degree and eye jitter of the eye diagram as the vertical coordinates to obtain the opening curve and jitter curve respectively.

[0061] Analyze the changes in the eye diagram characteristics of the two obtained curves, and obtain the stability of the eye diagram characteristics at different target points. The target point needs to consider the complexity of the circuit obtained above. For example, the eye diagram characteristics obtained at some target points may change unstably. This may be due to unreasonable setting parameters or problems with the circuit design of the PCB board in the current area.

[0062] To perform the above differentiation operations, the oscilloscope parameters for the same circuit must be adjusted, and the curves constructed for the same circuit are obtained through iterative adjustment. The oscilloscope parameters are iterated from small to large, increasing by 1 unit with each iteration. This yields multiple aperture curves and jitter curves, each obtained under different oscilloscope parameters. In this embodiment, the number of iterations is 10.

[0063] The eye opening curve and jitter curve are recorded as characteristic curves. For each characteristic curve, a linear fit is performed on the characteristic curve to obtain a fitted line. The difference in eye opening degree between the characteristic curve and the fitted line for the same target point is taken as the residual of the target point. Based on the difference between the fitted line and the characteristic curve and the circuit complexity of the target point, the cumulative residual value of each characteristic curve in each circuit is obtained. In this embodiment, the linear fit method is the least squares method.

[0064] Preferably, in this embodiment, the expression of the cumulative residual value is:

[0065] , represents the residual of the cth target point in the ath line, represents the circuit complexity of the cth target point in the ath line, represents the number of target points in the a-th line, Represents the cumulative residual value of the a-th characteristic curve.

[0066] The change trend of the corresponding eye diagram feature is obtained based on the cumulative residual value and the slope of the fitting line; the change trend is positively correlated with the cumulative residual value and the slope of the fitting line.

[0067] The expression of the changing trend is:

[0068] , represents the cumulative residual value of the characteristic curve of the a-th line, It represents the slope of the fitting line of line a. Indicates the changing trend of the characteristic curve of line a.

[0069] Since there are two types of characteristic curves, namely, an opening curve and a jitter curve, the change trends obtained by calculation are the change trends of the opening curve and the change trends of the jitter curve.

[0070] The greater the change trend, the more obvious the impact of the target point change on it, and the more likely there is a problem with the current electrical performance.

[0071] Will If the residual is greater than the preset threshold, the target point is recorded as the standard point. The purpose is to determine whether the current fluctuation area is due to a PCB design problem or improper parameter settings due to the dense circuitry in this area. A large residual indicates that the current location does not meet the consistency judgment. If it is not caused by complex circuits, it is more likely to be due to electrical performance issues or improper parameter settings at the current location. In this embodiment, the preset threshold is 0.8.

[0072] For different iterative oscilloscope parameters, the eye diagram data obtained after each iteration is analyzed to determine which parameter is more suitable for testing electrical performance under the current circuit. When the obtained parameters are relatively reasonable, they tend to be consistent when changing in complex circuit areas and simple circuit areas.

[0073] For each oscilloscope parameter, the instability coefficient is obtained by comparing the change trend difference between the parameter and the previous oscilloscope parameter and the eye diagram characteristic difference.

[0074] Preferably, in this embodiment, the expression of the instability coefficient is:

[0075] , It represents the difference in the changing trend of the eye opening curves corresponding to the j-th iteration and the j-1-th iteration of the a-th line. Indicates the difference in the changing trend of the jitter curve corresponding to the j-th iteration and the j-1-th iteration of the a-th line. It represents the difference in jitter between the jth iteration and the j-1th iteration for the rth standard point of the ath line. represents the difference in eye opening between the jth iteration and the j-1th iteration of the rth standard point on the ath line, M represents the number of standard points, It represents the instability coefficient of the a-th line at the j-th iteration.

[0076] The more changes in the eye diagram characteristics, the more obvious the impact of the device parameters on the current position may be, and the more unreasonable the set parameters are.

[0077] The instability coefficient is compared with a preset threshold. If the instability coefficient is less than the preset threshold, it indicates that the change is more stable. At this time, the current oscilloscope parameter settings are relatively reasonable and subsequent electrical performance testing can be performed. The oscilloscope parameters at this time are recorded as the optimal oscilloscope parameters. In this embodiment, the preset threshold is 0.3.

[0078] At this point, the optimal oscilloscope parameters are obtained.

[0079] Step S004: screening the eye diagram by using the optimal oscilloscope parameters to perform performance testing.

[0080] The above operations allow for the acquisition of optimal oscilloscope parameters for each circuit. Eye diagram data for different PCB locations can then be acquired using these optimal oscilloscope parameters. The jitter and eye opening values are then re-obtained using the optimized oscilloscope. The jitter and eye opening values are then normalized and compared to a preset threshold. If the jitter exceeds the threshold or the eye opening is less than the threshold, it indicates a problem with the PCB's electrical performance and requires adjustment of the PCB circuitry. In this embodiment, the threshold is 0.6.

[0081] The device for testing electrical performance includes: probe, holding tool, servo, connecting wire, display, external button, probe housing, data processing center, and oscilloscope.

[0082] The function of the probe is to contact a specific point on the PCB to obtain an electrical signal; the function of the probe housing is to support the movement of the probe; the function of the holding tool is to fix the PCB to facilitate subsequent probe positioning; the function of the connecting line is to transmit the electrical signal obtained by the probe back to the data processing center of the oscilloscope; the function of the display is to display the actual waveform and eye diagram of the oscilloscope; the function of the external button is to adjust the parameters of the oscilloscope; the function of the data processing center is to denoise the electrical signal obtained by the probe, automatically adjust the equipment parameters, control the movement of the servo, etc. Devices for testing electrical performance such as Figure 2 As shown, Figure 2 1 is the probe, 2 is the clamping tool, 3 is the servo, 4 is the connecting line, 5 is the display, 6 is the external button, 7 is the probe housing, 8 is the data processing center, and 9 is the oscilloscope, which includes a display 5, an external button 6, and a data processing center 8.

[0083] It should be noted that the above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application, and should all be included in the scope of protection of the present application.

[0084] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments.

Claims

1. A method for testing the electrical performance of an electronic device based on voltage signal processing, characterized in that: The method comprises the following steps: Obtain a circuit diagram, and collect an eye diagram of a voltage signal in the circuit diagram using a probe; The background area of the eye diagram is removed to obtain the signal connectivity domain and the maximum width of the signal connectivity domain; the jitter of the signal connectivity domain is calculated based on the number of pixels, grayscale value and maximum width of the signal connectivity domain; the eye openness is obtained based on the maximum vertical and horizontal distances and area of the central opening area in the eye diagram; By moving the probe in the circuit diagram, multiple lines are acquired, the oscilloscope parameters are iterated, and the eye diagram under the oscilloscope parameters is acquired; the point acquired by the probe is recorded as the target point, and the circuit complexity is acquired based on the area and edge length of the line around the target point; the jitter condition and eye opening degree are recorded as eye diagram features, and the quantitative parameters are adjusted through the feature differences at different positions under the same parameters and the feature change differences at the same position under different parameters; a characteristic curve is acquired for each eye diagram feature of each line; a straight line is fitted to the characteristic curve, and the cumulative residual value of each characteristic curve in each line is acquired based on the difference between the fitted straight line and the characteristic curve and the circuit complexity of the target point; the change trend of the corresponding eye diagram feature is acquired based on the cumulative residual value and the slope of the fitted straight line; the standard point is selected based on the difference between the target point and the fitted straight line point and the circuit complexity; the instability coefficient is acquired based on the difference in the change trend of the oscilloscope parameters corresponding to adjacent iterations and the difference in the eye diagram features of the standard point; the instability coefficient is compared with the preset threshold to select the optimal oscilloscope parameters; Obtain an eye diagram using optimal oscilloscope parameters, and perform performance testing based on the jitter and eye opening of the eye diagram compared with preset thresholds. The method for obtaining the circuit complexity is: A window is constructed with each target point as the center. The circuit complexity is negatively correlated with the area of the circuit in the window and positively correlated with the length of the circuit edge in the window. The horizontal coordinate of the characteristic curve is the target point, and the vertical coordinate is the eye diagram feature; The method for obtaining the cumulative residual value of each characteristic curve in each circuit based on the difference between the fitting straight line and the characteristic curve and the circuit complexity of the target point is: The difference in eye opening degree of the same target point on the characteristic curve and the fitting line is taken as the residual of the target point; The expression of the cumulative residual value is: , represents the residual of the cth target point in the ath line, represents the circuit complexity of the cth target point in the ath line, represents the number of target points in the a-th line, Represents the cumulative residual value of the a-th characteristic curve; The method for screening standard points is: Will Compared with the preset threshold, if it is greater than the preset threshold, the target point is recorded as a standard point.

2. The method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, wherein: The jitter of the signal connectivity domain is positively correlated with the number of pixels in the signal connectivity domain and the maximum width of the signal connectivity domain; the jitter of the signal connectivity domain is negatively correlated with the grayscale value of the pixel.

3. The method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, wherein: The eye opening degree is positively correlated with the maximum longitudinal distance of the central opening area, the maximum transverse distance of the central opening area, and the area of the central opening area.

4. The method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, wherein: The change trend is positively correlated with the cumulative residual value and the slope of the fitting line.

5. A testing device applied to the method according to any one of claims 1 to 4, characterized in that: The test device includes a probe, a holding tool, a servo, a connecting line, a display, an external button, a probe housing, a data processing center, and an oscilloscope.

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