Apparatus and automated method for deleting data

By using automated equipment of X-ray source and control unit, combined with identification and protection measures, the automation problem of non-volatile memory data erasure of electronic equipment in the prior art is solved, and fast and reliable data erasure is achieved, equipment damage is avoided, and hardware and software compatibility is adapted to various devices.

CN120266208APending Publication Date: 2025-07-04L·乌赞
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Patent Information

Application Number
CN202380081668.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2023-05-03
Filing Date
2023-12-19
Publication Date
2025-07-04

AI Technical Summary

Technical Problem

The prior art is difficult to automatically erase nonvolatile memory data in electronic devices without damaging the device, and conventional methods have economic and ecological problems.

Method used

Using an automated device including a radiation chamber and a control unit of an X-ray source, the radiation parameters of the X-ray source are controlled to achieve reliable and fast data erasing, including preheating and protection masks to protect device components.

Benefits of technology

Fast and reliable data erasing is achieved, unnecessary damage to the device is avoided, and hardware and software compatibility is adapted to various electronic devices, saving time and cost.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to an automation device and a method for erasing data stored in a non-volatile memory (M) of an electronic device (A), such as a smartphone or tablet. The method is characterized in that a radiation chamber (1) is used, comprising at least one X-ray source (S) confined in an X-ray sealed housing, capable of receiving a plurality of electronic devices (A) that can be brought into the radiation chamber (1) by means of a transmitter (2). A control unit (CU) controls the transmitter (2) and the X-ray source (S) to radiate each electronic device (A) with controlled power and duration for erasing data stored in the non-volatile memory (M) of the electronic device (A).
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Description

[0001] The present invention relates to the field of electronic devices (such as computers, smartphones, tablets or any type of device incorporating such memories) incorporating non-volatile memories (NAND or NOR). The invention specifically relates to the erasure of data contained in such memories.

[0002] In fact, the problems in this field relate to the erasure of data contained in these memories, specifically in the case of refreshing or recycling these devices, to ensure that the user's data cannot be retrieved by a third party without their consent. Conventionally, to erase data in this type of memory, bits are reset by accessing the memory via a computer device using logic gates, which is cumbersome and requires the device to be at least partially functional to be started. For example, when the device no longer functions to the extent that the motherboard and / or main components have to be repaired to initiate a software erase command, the current preferred solution is to degrade the device by grinding and / or melting for destruction, which presents significant waste in many respects (with significant economic and ecological problems). In addition, when these devices remain sufficiently functional for software access, recurring problems relate to the fact that many devices on the market have very different connection means and operating systems, which requires a wide variety of connectors and data access software. Therefore, the time required for data erasure is substantial and problematic. Thus, it is difficult to envisage automating data erasure in the current state of the prior art. On the other hand, the types of memories incorporated in these devices have various hardware architectures, more or less performant and resistant, which also complicates data erasure. It is also known in the prior art to use ionizing radiation to erase memory data, in particular from patent applications US4393479 and JPS5975496. However, these solutions are deployed during the manufacture before a specific and unique type of memory is integrated into the device and are only intended to provide a completely blank memory. Therefore, these solutions do not address the problem of erasing data from the device while maintaining its functionality (both hardware and / or software aspects).

[0003] In this context, the present application proposes a device that allows reliable and rapid data erasure, avoiding as much as possible unnecessary destruction of the device and preferably in a manner compatible with the automation of data erasure for various electronic devices.

[0004] This object is achieved by an automated device for erasing data stored in the non-volatile memory of an electronic device (such as a wearable device such as a smart phone or a tablet), characterized in that the automated device comprises: a radiation chamber, the radiation chamber comprising at least one X-ray source confined in a housing hermetically sealed to X-rays and capable of continuously receiving a plurality of electronic devices that can be brought into the chamber by a conveyor; means for identifying each of said devices to identify the type of device and / or memory to be irradiated; a control unit that controls the conveyor and said X-ray source to irradiate each of the electronic devices with a controlled power and duration according to radiation parameters corresponding to the device identified by the identification means, for erasing the data contained in the non-volatile memory of said electronic device.

[0005] According to another feature, the control unit determines, by means of the identification means, the position and type of the memory of the device to be irradiated, and controls the conveyor and the X-ray source according to the determined position and type of the memory.

[0006] According to another feature, the source generates an X-ray beam that irradiates the device along a main axis that is inclined or capable of being inclined with respect to the plane of the conveyor, the angle of this main axis being determined by the control unit by means of the identification means.

[0007] According to another feature, the control unit controls the X-ray source by controlling the power and duration based on the type of memory contained in the electronic device.

[0008] According to another feature, the control unit can be configured to deliver a first type of radiation with parameters providing a dose less than 100 m 2 .s- 2 (i.e., gray or joule / kg) in order to limit the risk of damaging device components, while allowing incomplete but sufficient erasure of the data in the device memory to impose a device reset at the next start-up of the device, which involves a new installation of the operating system and a complete erasure.

[0009] According to another feature, the control unit can be configured to deliver a second type of radiation with parameters providing a dose between 200 m 2 .s- 2 (i.e., gray or joule / kg) and 1000 m 2 .s- 2 in order to enable complete erasure of the data in the device memory that requires reprogramming of the memory, while limiting the risk of damaging device components.

[0010] According to another feature, the identification device comprises at least one computer file in which the serial number or model number of each of the consecutive devices arranged on the conveyor is listed, and the control unit determines the parameters to be used for each of the devices from this file and from a database storing the characteristics of the device.

[0011] According to another feature, the identification means comprise a code reader mounted on the device.

[0012] According to another feature, the identification means comprise means for identifying the components of the device and their arrangement from at least one image of the device obtained by an imaging process using radiation at a dose lower than that used to erase data in the memory.

[0013] According to another feature, the device comprises a preheating chamber for preheating the reservoir before it passes in front of the source.

[0014] According to another feature, the device comprises a heating chamber located at the exit of the radiation chamber to improve the condition of some device components after radiation.

[0015] According to another feature, the device comprises positioning means capable of placing each of the successive devices in a position in three-dimensional space determined as a function of the identification of that device.

[0016] According to another feature, the device comprises at least one protective mask positionable between the source and the device to protect certain components of the device during exposure of the reservoir to the radiation source.

[0017] According to another feature, the control unit controls the radiation power by controlling the supply voltage of the X-ray source between 175 kV and 300 kV and the target intensity of the X-ray source between 250 microamperes and 100 milliamperes, preferably 20 milliamperes.

[0018] According to another feature, the X-ray source has a target made of tungsten or molybdenum.

[0019] According to another feature, the X-ray source has a window made of beryllium or aluminum.

[0020] According to another feature, the distance between the source and the conveyor carrying the device is between 1 cm and 20 cm, preferably between 2.5 cm and 4 cm.

[0021] Another object of the present application is to provide a reliable and fast data erasure method that avoids unnecessary damage to the device as much as possible and is preferably compatible with the automation of electronic device data erasure.

[0022] This object is achieved by a method for erasing data stored in a non - volatile memory of an electronic device (such as a portable device such as a smart phone or a tablet), characterized in that the method comprises

[0023] - identifying each of the devices in the device to identify the type of device and / or memory to be irradiated,

[0024] - determining, by a control unit, radiation parameters corresponding to the device identified by the identification means,

[0025] - irradiating the electronic device with at least one X - ray source, the at least one X - ray source being confined in an X - ray - sealed housing of a radiation chamber, the radiation chamber being capable of continuously receiving a plurality of electronic devices that can be brought into the chamber by a conveyor, the conveyor and the X - ray source being controlled by the control unit according to the radiation parameters, the radiation parameters including the power and duration of the radiation for erasing data contained in the non - volatile memory of the electronic device.

[0026] According to another feature, the radiation parameters include the main axis of the X - ray beam generated by the source, this axis being inclined or capable of being inclined with respect to the plane of the conveyor, and the angle of this main axis being determined by the control unit by means of the identification means.

[0027] According to another feature, the identification includes determining, by means of the identification means, the location and type of the memory of the device to be irradiated, and the control unit drives the conveyor and the X - ray source according to this location and type of the memory determined during the radiation.

[0028] According to another characteristic, the control unit drives the X - ray source by controlling the power and duration according to the type of memory contained in the electronic device.

[0029] According to another feature, the irradiation involves adjusting the position of each of the successive devices relative to the source according to the components of the device.

[0030] According to another feature, the process involves positioning at least one protective mask between the source and the device to protect certain components of the device during the exposure of the memory to the radiation source.

[0031] Other features and advantages of the present invention will become more apparent by reading the following description of various embodiments with reference to the accompanying drawings, in which:

[0032] Figure 1 Figure 1 A schematic side view of an automated data erasure device according to various embodiments is depicted;

[0033] Figure 2 ​​​​Figure 2 Depicts a schematic side view of an automated data erasure device according to various embodiments including a tiltable X-ray beam.

[0034] Figure 3 Figure 3 Shows a schematic side view of an automated data erasure device in various embodiments including a tiltable X-ray beam and a device positioning base;

[0035] Figure 4 Figure 4 Shows a schematic side view of an automated data erasure device in various embodiments including means for identifying a device by imaging and means for positioning the device;

[0036] Figure 5 Figure 5 Shows a schematic side view of an automated data erasure device in various embodiments including device positioning means and a protective mask;

[0037] Figure 6 Figure 6 Shows a schematic side view of an automated data erasure device in various embodiments including device positioning means and a protective mask;

[0038] ​​​​​​​​The present application relates to an automated device for erasing data stored in a non-volatile memory (M) of an electronic device (A), such as a portable device like a laptop smartphone or a tablet, as well as a solid-state drive (SSD) or any type of electronic device or data storage device incorporating a non-volatile memory such as a memory of the "flash" type. The term "non-volatile memory" encompasses, for example, NAND or NOR type memories (i.e., flash memory and / or EEPROM) based on semiconductor technology (MOS, "metal oxide semiconductor") using floating gate transistors, which trap one or more electrons in a charge trap (or cell) (techniques known under the abbreviations SLC, MLC or TLC), the charge trap (or cell) being configured in the form of a floating gate arranged in one or more layers (3D NAND technology), each electron corresponding to a data bit that can be recorded and erased at will. Conventionally, in order to erase data in this type of memory, the bits are reset by accessing the memory via a computer device using logic gates, while the present application proposes to erase data more quickly without computer access to this type of memory by using X-rays calibrated to expel the trapped electrons in the charge traps. To this end, the present invention proposes to consider the calibration of the radiation of the architecture of the non-volatile memory. The present invention allows, for example, the rapid erasure of personal data stored in the memory of an electronic device, such as a portable device like a smartphone or a tablet or any other device incorporating this type of memory (e.g., a portable memory). In particular, when the user's device or appliance is intended to be repaired or recycled, the erasure of the data is particularly important with regard to protecting the confidentiality of the user's personal data (e.g., in the context of the GDPR). Data erasure is usually cumbersome, while the present invention allows easy and rapid data erasure, thus providing advantages in terms of time and cost, regardless of the fate of the device in which the data stored in its non-volatile memory needs to be erased. Moreover, for example, in the case of repair, this data erasure should preferably avoid damaging other components of the device, and various embodiments of the present invention are capable of solving this problem.

[0039] In addition, according to requirements (user wishes and / or necessities, etc.), various embodiments of the present invention provide several “levels” (or “types”) of data erasure. In fact, different from the solutions known in the prior art for erasing data by radiation, which aim to completely (possibly irreversibly) erase the memory, the present invention proposes to meet the need to prevent access to the data while protecting the memory containing them and other components of the device in which they are present. To this end, some embodiments of the present invention propose to consider not only the nature of the memory to be erased but also the attributes (hardware and software) of these devices. In fact, in addition to taking preventive measures to avoid physically damaging the device components, it is advantageous to consider the software aspects of the device to be irradiated. For example, the first “level” of radiation is designed to achieve a partial erasure of the memory such that it is impossible to access the data they contain without changing the software recovery capabilities built into the device. In fact, devices (such as smartphones or tablets) integrate an operating system (software, e.g., iOS or Android) that manages the interoperability of the various components of the device. Therefore, some embodiments of the present invention propose to partially erase only the data of the device such that the operating system remains operational and requires the device to be reinitialized the next time it is started, which will result in the complete erasure of the data. In such cases of partial deletion, the device detects an anomaly and requests the reinstallation of the operating system (OS). Generally speaking, such reinstallation will require changing the encryption key used to encrypt the data such that it is impossible to read the previously recorded data using the newly installed version. Thus, instead of having to access the software of the device to completely erase the data (which would be expensive, especially if it does not work), the automated partial erasure by radiation ensures complete erasure before the device can be immediately reused, remaining able to start and only requiring a full reinitialization. A second “level” is also planned to irradiate the device in a stronger way such that a complete erasure is achieved to the extent of wiping out some of the data required to run the operating system of the device. This second level currently results in the device being unable to start and requires a complete reprogramming of the memory, not only because in the case of 100% memory erasure (NAND), the operating system is erased 100%, but also the microcontroller firmware on the memory chip itself. Depending on the need, the user can choose between these two erasure levels.

[0040] Thus, in some embodiments, the control unit (CU) is capable of being configured to provide less than 100m 2 .s- 2(i.e., gray or joule / kg) to deliver a first type (or level) of radiation so as to limit the risk of damaging the components (A) of the device while allowing the data erasure in the memory (M) of the device to be partial but sufficient to cause the device (A) to enter a recovery mode upon its next startup. Electronic devices such as smartphones or tablets incorporate, for example, firmware (or embedded software), which is an integrated computer program that enables them to operate and evolve (via installation of updates). When the device is erased partially in this way, it automatically starts in a recovery or restore mode, or in a device firmware update (DFU) mode, depending on the case (the main difference lies in the bootloader). Such device boot modes require reinstalling a new OS, which in turn means installing new encryption keys, making it impossible to read the data previously stored in the memory cells without damaging the device. Preferably, in such an embodiment, the control unit (CU) drives the X-ray source to deliver the radiation for a duration between 1 minute and 8 minutes, preferably between 2 minutes and 5 minutes. In this way, without risking damaging the memory and protecting the device functions, the dose received by the memory is sufficient to erase a part of the data.

[0041] On the other hand, in some embodiments, the control unit (CU) is capable of being configured to provide 200m 2 .s- 2 (i.e., gray or joule / kg) to 1000m 2 .s- 2 to deliver a second type of radiation so as to enable complete erasure of the data in the memory (M) of the device that needs to reprogram the memory (M) while limiting the risk of damaging the device components (A). Preferably, in such an embodiment, the control unit (CU) drives the X-ray source to deliver the radiation for a period between 10 minutes and 40 minutes, preferably between 20 minutes and 30 minutes. Then, the device is no longer started even in the recovery mode or an equivalent mode and requires complete reprogramming (e.g., "from the factory"), but the integrity of the memory is still retained and the device can operate normally after reprogramming.

[0042] It can be clearly seen from the above that the radiation dose can be adjusted according to the device not only at the hardware level but also at the software level. At the hardware level, the sensitivity of the device depends on the memory and other components being irradiated, and the sensitivity of this memory depends on its architecture and composition (in terms of the materials used), and all these aspects can be considered in the present invention.

[0043] An automated data erasure device according to various preferred embodiments of the present invention is characterized by a radiation chamber (1) (or "cabin"), which includes at least one X-ray source (S) confined in a housing that is airtight to X-rays (or "X-ray sealed housing") and is capable of continuously receiving a plurality of electronic devices (A) that can be brought into the chamber (1) by a conveyor (2). Such an X-ray-impermeable chamber (1) is known in the art and is necessary to protect users, especially due to the radiation power used for the implementation of the present invention. The conveyor (2) can be, for example, a conveyor belt, and the devices (A) to be irradiated are continuously arranged on the conveyor belt, for example, after their identification, as detailed below. On the other hand, the device includes a control unit (CU), which controls the conveyor (2) and the X-ray source (S) to irradiate each of the electronic devices (A) with a controlled power and duration for erasing the data contained in the non-volatile memory (M) of the electronic devices (A). Thus, the chamber (1) has an airtight X-ray housing (i.e., an X-ray sealed housing), and the devices (A) enter the airtight X-ray housing through the conveyor and through at least one door (for example, a single door if the conveyor passes back and forth through a single inlet-outlet of the chamber, or two doors if the conveyor straddles the chamber, such doors can slide, for example, perpendicular to the plane of the conveyor, such as vertically), preferably preventing any escape of radiation from the chamber (1). These doors are controlled by the control unit (CU) when the device (A) moves in front of the X-ray source (S). Thus, the opening and closing of the doors will be controlled according to the radiation time of the devices (A) in the chamber (1), either one by one or in batches for several devices simultaneously. Regarding the radiation and control of the source (S), the applicant has observed that, due to the nature of the memory (M) and / or other components they contain, it is necessary to control the power and duration of the radiation of various devices (A), as detailed below. It should be understood from this application and from the drawings that the source can irradiate the devices from above (for example, as in Figure 1 and Figure 2 ), or from below (for example, as in Figure 3 , Figure 4 , Figure 5 and Figure 6 ), and various configurations of the chamber or channel and the conveyor with heating means and / or image and / or position capture means (for tracking and / or aligning the devices in their path during processing) are possible, and the heating means and / or image and / or position capture means are adapted to the control performed by the control unit, as detailed in this application. For example, Figure 4 illustrates heating chambers (H) upstream and downstream of the radiation chamber (1) and shows a preliminary view of the upstream heating chamber (H) for device identification, but those skilled in the art will understand that many variations are possible, and these figures only represent illustrative and non-limiting examples.

[0044] In various preferred embodiments of the present invention, the control unit (CU) drives the X-ray source by controlling power and duration based on the type of memory (M) included in the electronic device (A). In fact, depending on the type of memory (M) and their architecture, the applicant of the present application has observed that it is necessary to adjust the duration and power of the radiation to ensure data erasure. For example, "cheap" or "low-end" memories are generally more sensitive than higher-quality memories. On the other hand, certain memories (M) are designed to be protected from radiation, especially when the electronic device (A) passes through an airport scanner. Therefore, these memories require more power and duration than unprotected memories. In addition, the location of the memory (M) in the electronic device (A) varies greatly, to the extent that some memories (M) are intentionally or accidentally protected by the presence of other components in the device (A). Finally, there are three-dimensional structured memories, such as those using technologies known as 3D NAND or vertical NAND (V-NAND), which are non-volatile memories in which the cells are stacked vertically to increase the storage density. This type of memory requires more radiation and / or more refined radiation (e.g., specific) than single-layer memories. From all these aspects, depending on the model of the electronic device (A) in which data erasure is desired, it is necessary to know the type and location of the memory to control the radiation and adjust the power and duration, which affects the speed of the conveyor (2) that brings successive devices (A) into the chamber (1) and involves adjusting the power and / or duration of the radiation especially according to the desired "level" (or type) of erasure. Therefore, it is necessary for the control unit (CU) to be able to control these parameters due to knowing the type of the device (A) and / or memory (M) to be irradiated, for example by means of the serial number of the device (A). Therefore, device identification means are provided so that the control unit can manage the operations required for each successive device (e.g., device rhythm, radiation power, beam and / or device tilt, etc.). This identification (i.e., knowledge) can be provided by the user inputting parameters used by the control unit or by selecting the parameters to be used from a plurality of parameters stored in the memory of the control unit (CU). Preferably, various devices (A) of the same type will be prepared in advance to be successively conveyed so that the parameters and speed are constant, but the present invention provides for their variation depending on the type of device (A) prepared on the conveyor. In certain embodiments, means for identifying the electronic device (A) will be provided for automatically identifying the device (A) and for the control unit to adjust the radiation parameters using a memory that stores the corresponding parameters for the identified device (A). In certain embodiments, an illustrative and non-limiting example of which is shown in Figure 2Among them, a human-machine interface (HMI) is provided to allow a user to control the radiation parameters (using an input or selection device) and / or monitor its progress (using an image capture device in the chamber, which displays the radiation area and the device being irradiated). In some embodiments, the identification means includes at least one computer file in which the technical characteristics of each of the successive devices placed on the conveyor (2) are listed, for example via a serial number or model number, and the control unit determines the parameters to be used for each of these devices based on this file and a database storing device characteristics (A). Such a database can be stored locally or remotely and can be enriched with each new device encountered.

[0045] In some embodiments, the identification means includes a reader capable of reading a code previously attached to the device (A). Such a code can be a barcode or a QR code or any other means that can be easily read by the reader and enables the identification of the device being processed by the device. Preferably, when a device is handled by the device or process of the present application, this code is used to track each of these devices, preferably verified at each stage, so that a certificate of erasure can be issued when leaving the device (at the end of the method). In some embodiments, the device identification code can be generated from a command given by a user who wishes to erase his or her data. When the device is received, the generated code is attached to the device and identifies it until a certificate of erasure is issued.

[0046] The device according to one of the preceding claims, characterized in that the identification means includes means for identifying the components of the device and their arrangement from at least one image of the device, the at least one image being obtained by an imaging process using a dose of radiation lower than the dose used to erase the data in the memory (M). In fact, it is possible to use low-power radiation (much lower than the radiation used for erasure and, for example, of the order used in security gates, especially at airports) to obtain an image of the device and determine what its components are, or even, for example, use artificial intelligence trained on a large amount of data from known electronic devices and programmed on a set of references to identify the model of the device, for example to extract criteria related to the positioning and identification of the components to be erased and protected. Such radiation can be implemented by the source (S) used for erasure, but it is generally preferably to use another source upstream of the erasure chamber (for example, as Figure 4As shown). Due to such imaging of the device components, the device can adjust the radiation parameters (beam and / or device tilt, power, duration, position of the area to be irradiated and / or area to be protected, e.g., by a mask). For example, a camera in the heating channel upstream of the chamber will be used to identify the device. The camera provides information about the characteristics of the device, which is then identified by the AI, which in turn provides information about the aiming and radiation intensity for the radiation chamber.

[0047] Figure 1 A schematic diagram of an automated data erasure device according to various preferred embodiments is shown. In some of these embodiments, the X-ray source includes a tungsten or molybdenum target (CX). This type of target has proven particularly advantageous for delivering an effective X-ray beam for erasing data in the memory (M) of electronic devices (A) on the market. In addition, the applicant of the present application has observed that among the important parameters for irradiating the memory (M) to erase data, the power supply voltage of the source and the target intensity of the source are important. Therefore, the selection of voltage, target, and target intensity is necessary to obtain the desired result.

[0048] In some of these embodiments, the X-ray source includes a beryllium window (F). This type of window has the advantage of filtering out high-energy rays and allowing low-energy rays to pass through. The use of a low-thickness beryllium window has been shown to be particularly advantageous for obtaining effective radiation for data erasure. Aluminum is also a favorable material for the window, especially because it filters low-energy photons. Various types of sources and windows are also possible.

[0049] Aluminum windows with different parameters can also be used. In fact, depending on the material used for the target and / or window, the voltage and intensity must be adjusted, and the target intensity can vary depending on the situation. Similarly, depending on the distance between the source (S) and the device to be irradiated, the parameters (especially the intensity) vary, and due to the explanations provided in the present application, those skilled in the art can adjust the parameters according to the type of configuration selected, especially in terms of the material and the distance between the target and the device, to obtain effective radiation. For example, in the case of a beryllium window, some embodiments provide that the control unit (CU) controls the radiation power by controlling the supply voltage of the X-ray source between 175 (one hundred and seventy-five) kV and 300 (three hundred) kV and the target X-ray source intensity between several hundred microamps and several tens of milliamps (e.g., between 250 microamps and 100 milliamps, preferably on the order of 20 milliamps). On the other hand, the radiation time greatly depends on the type of memory (M) present in the device (A) to be irradiated. Therefore, the control unit (CU) controls the X-ray source to deliver radiation for a duration in the range of one minute to eight minutes, preferably two minutes to five minutes.

[0050] On the other hand, for example, in some embodiments, the distance between the source (S) and the device or the conveyor that conveys the device is between one centimeter and twenty centimeters, which depends in particular on the type of device, where a computer generally requires a different distance from a smartphone. However, in many cases, this distance will preferably be from 2.5 centimeters to 4 centimeters (two point five centimeters to four centimeters). In fact, the applicant of the present application has observed that erasure is most effective when the memory to be erased is separated from the source (S) by only 2 centimeters to 3 centimeters. However, a greater distance may be possible, especially with higher intensities and / or depending on the type of window used.

[0051] On the other hand, it has been observed that if the memories have been preheated, they are less likely to be damaged by ionizing radiation. Thus, various embodiments provide preheating of the device upstream of the erasure chamber, preferably below a limiting temperature of about 50 °C, to protect the components of the device and especially their batteries and / or screens. In addition to this, in some embodiments, device heating is provided at the exit of the erasure chamber (regardless of whether there is a preheating chamber upstream). For example, a heating channel may also be provided at the exit of the radiation chamber so that heat can fill any holes caused by the radiation, especially on other components such as microcontrollers. In the case of a device without thermosensitive components (e.g., an SSD), the temperature at the exit of the heat channel can reach a temperature of about 120 ° to reduce the post-treatment time.

[0052] Generally speaking, device identification enables the adjustment of various radiation parameters to achieve a first level or a second level of erasure without damaging the memory and other device components. Such adjustment typically involves restricting and targeting the area to be irradiated by controlling the relative position and orientation (e.g., tilt) of the source with respect to the device, using a positioning device (P) and / or protecting certain areas with a protective mask. In some embodiments, the source (S) generates an X-ray beam that irradiates the device (A) along a main axis (AF) that is inclined or capable of being inclined with respect to the conveyor plane. In fact, the applicant of the present application has observed that in some cases, irradiation of the conveyor plane by a non-vertical beam allows for facilitating data erasure, especially in the case of memories with a three-dimensional structure. Moreover, such an inclined beam generally allows avoiding damaging other components of the electronic device (A) whose memory content is to be erased, or at least limiting the risk of damage. Figure 2Illustrative and non-limiting examples of such embodiments are shown with an inclined main axis (AF) of the X-ray beam. The control unit (CU) is then configured to control the beam inclination according to the identification of the device (A) to be irradiated, for example under the control of a user using a human-machine interface (HMI) or under the control of parameters pre-recorded in a memory. It is not necessary here to describe in more detail the control of the inclination of the X-ray beam, which is known to those skilled in the art. According to the present application, it should be understood that the inclination can be a fixed angle determined based on a preferred angle of most known devices (A), or it can be variable and adjustable by the control unit (CU) that controls the motor that tilts the source and its beam, for example depending on the identification of the successive devices (A) brought into the chamber (1). In some embodiments, the control unit (CU) also controls the inclination of the main axis of the beam according to the type of device present in the chamber (1). Thus, the main axis can be inclined at various angles relative to the conveyor plane so that the X-ray beam can be optimally aimed at the memory (M) according to the architecture of the memory (M) and / or the positioning of the memory (M) relative to other components of the device (A) containing the memory (M). Thus, the source (S) can be mounted on at least one motor configured for the displacement of the source (S) relative to the conveyor. Thus, this displacement can be controlled by the control unit (CU), which determines the focus at which the X-ray beam should be centered within the device being aimed at at each moment. Such an inclination of the ionizing radiation beam is particularly advantageous in the case of memories having a fine three-dimensional structure, such as the 3D-NAND mentioned earlier in this specification. As an alternative to or in combination with such beam inclination, various embodiments of the present invention also provide that the device (A) itself is inclined so that the memory contained in the device can be optimally irradiated for data erasure, but also to protect other components of the device, some of which may be particularly sensitive to ionizing radiation, such as an OLED type display, for example this implies preferably irradiating the device from the "edges" (i.e., lateral edges) of the device. In fact, the present application provides not only beam inclination but also device inclination to optimize their positioning relative to the beam. The device according to one of the preceding claims, characterized in that the device comprises positioning means (P) capable of placing each of the successive devices in a position in three-dimensional space, which position is determined according to the identification of the device (A). Such positioning means can include, for example, a container or a base or a mold (possibly fitted with a protective mask) configured to accommodate the device in an arrangement (orientation and position) optimized for the pre-protection of the components of the device during irradiation. Figure 3Non-limiting examples of such bases for positioning devices (combined with tilting of the ionizing radiation beam) are illustrated. Such positioning means may also include device holding means (e.g., an articulated arm equipped with a suction cup or a gripper for holding the device) configured to arrange them in a suitable manner determined by their identification. Figure 4 and Figure 5 An example of such a positioning device is illustrated in a non-limiting manner and includes an articulated clamping device that enables, for example, the devices to be arranged as desired ( Figure 4 An example is represented in which the device is arranged perpendicular to the plane of the transmitter in order to irradiate the device without damaging its screen, in particular a screen of OLED type.

[0053] In addition to this positioning and aiming of the beam on the memory to be erased, it may be useful, or even necessary, to provide protection for certain components by means of a material capable of blocking radiation (such as a lead plate or other suitable material known to have such properties). Therefore, in some embodiments, the device includes at least one protective mask (MP) that can be positioned between the source and the device to protect certain components of the device (A) during exposure of the memory (M) to the radiation source. Such masks can be obtained in a variety of ways within the technical scope of those skilled in the art. The following are only a few illustrative and non-limiting examples. For example, a cylinder can be assembled to the source, including a plurality of masks having radiation sealing areas. It should be understood that such enclosed areas can be made of various materials of different thicknesses, depending on the power of the radiation (according to the absorption coefficient). Alternatively, it is possible to provide radiation sealing plates having a shape and size suitable for at least one type of device, and to change these plates according to continuous devices. Figure 6 Non-limiting examples of such masks are provided, which may be fed perpendicular to the axis of a conveyor that brings the device into the chamber so that a mask determined based on the identification of the device is interpolated between the source and the device.

[0054] It should be understood that the present invention also relates to a reliable and fast method for data erasure, avoiding as much as possible unnecessary damage to the equipment and preferably compatible with the automation of electronic data erasure. In fact, thanks to the configuration and / or identification parameters proposed by the applicant of the present application, the present invention also provides an effective data erasure method that allows saving time and better protecting the materials and components of the equipment (A) that are the main source of contamination when destroyed.

[0055] Accordingly, the present invention relates to a method for erasing data stored in a non-volatile memory (M) of an electronic device (A) (such as a portable device such as a smartphone or a tablet), characterized in that the method comprises irradiating the electronic device (A) with at least one X-ray source (S) confined in an X-ray sealed housing (or "housing hermetically sealed to X-rays") of a radiation chamber (1), the radiation chamber being capable of continuously receiving a plurality of electronic devices (A) that can be brought into the chamber by a conveyor (2), the conveyor (2) and the X-ray source (S) being controlled by a control unit (CU), the control unit controlling the power and duration of the radiation for erasing the data contained in the non-volatile memory (M) of the electronic device (A). The various embodiments of the devices described in the present application are also applicable to methods that can include various steps and use various parameters according to the functions described in the present application. For example, the method may include tilting the X-ray beam adjusted by the control unit according to the architecture of the device to be irradiated (e.g., the position of the memory relative to other components).

[0056] The present application describes various technical features and advantages with reference to the accompanying drawings and / or various embodiments. Those skilled in the art will understand that, unless explicitly stated to the contrary, the technical features of a given embodiment can actually be combined with the features of another embodiment, or clearly these features are incompatible, or the combination does not provide a solution to at least one of the technical problems mentioned in the present application. In addition, unless explicitly stated to the contrary, the technical features described in a given embodiment can be isolated from the other features of this embodiment.

[0057] Detailed list of references in the drawings :

[0058] M: Non-volatile memory

[0059] A: Electronic device

[0060] 1: Chamber

[0061] S: X-ray source

[0062] 2: Conveyor

[0063] CU: Control unit

[0064] AF: Main axis of the X-ray beam

[0065] CX: Target of the X-ray source

[0066] F: Window of the X-ray source

[0067] IHM: Human-machine interface

[0068] P: Positioning device

[0069] MP: Protection mask

[0070] H: Heating chamber

Claims

1. An automated device for erasing data stored in a non-volatile memory (M) of an electronic device (A), such as a portable device such as a smart phone or a tablet computer, the automated device further comprising: A radiation chamber (1), said radiation chamber comprising at least one X-ray source (S) confined within an X-ray sealed housing and capable of continuously receiving a plurality of electronic devices (A) to be brought into said chamber (1) by a conveyor (2); means for identifying each of said devices (A) to identify the type of device (A) and / or memory (M) to be irradiated; a control unit (CU), said control unit controlling said conveyor (2) and said X-ray source (S) to irradiate each of said electronic devices (A) with a controlled power and duration according to radiation parameters corresponding to said device (A) identified by the identification means, for erasing data contained in said non-volatile memory (M) of said electronic device (A).

2. The device according to claim 1, wherein said control unit (CU) determines, by means of said identification means, the location and type of the memory (M) of the device (A) to be irradiated, and controls said conveyor (2) and said X-ray source (S) according to the determined location and type of the memory (M).

3. The device according to claim 2, wherein said source (S) generates an X-ray beam which irradiates said device (A) along a main axis (AF) inclined or capable of being inclined with respect to the plane of said conveyor, the angle of said main axis (AF) being determined by said control unit (CU) by means of said identification means.

4. The device according to claim 1, wherein said control unit (CU) controls said X-ray source by monitoring said power and duration according to the type of the memory (M) contained in said electronic device (A).

5. The device according to claim 1, wherein the control unit (CU) is configurable to deliver a first type of radiation with a parameter providing a dose of less than 100 m 2 .s- 2 (i.e., gray or joule / kg) in order to limit the risk of damaging components of the device (A), while enabling data erasure in the memory (M) of the device, which data erasure is partial but sufficient to force a reset of the device (A) upon its next startup, which implies a new installation of the operating system and a complete erasure.

6. The device according to claim 1, wherein the control unit (CU) is configurable to deliver a second type of radiation with a parameter of a dose between 200 m 2 .s- 2 (i.e., gray or joule / kg) and 1000 m 2 .s- 2 to allow complete erasure of data in the memory (M) of the device that needs to reprogram the memory (M), while limiting the risk of damaging components of the device (A).

7. The device according to claim 1, wherein said identification means comprises at least one computer file in which the serial number or model number of each of the successive devices arranged on said conveyor (2) is listed, and said guiding unit determines the parameters to be used for each of said devices from said file and from a database storing the characteristics of said device (A).

8. The device according to claim 1, wherein said identification means comprises a code reader attached to said device (A).

9. The device according to claim 1, wherein said identification means comprises means for identifying the components of said device and their arrangement from at least one image of said device, said at least one image being obtained by an imaging process due to irradiation with a dose lower than the dose for erasing the data in said memory (M).

10. The device according to claim 1, said device further comprising a preheating chamber for preparing said memory before said memory passes in front of said source (S).

11. The device according to claim 1, said device further comprising a heating chamber located at the exit of said radiation chamber to improve the condition of certain components of said device after irradiation.

12. The device according to claim 1, further comprising a positioning device (P) capable of placing each of the successive devices in a position in three-dimensional space, the position being determined according to the identification of the device (A).

13. The device according to claim 1, further comprising at least one protective mask (MP) capable of being positioned between the source and the device to protect certain components of the device (A) during exposure of the memory (M) to the radiation source.

14. The device according to claim 1, wherein the control unit (CU) controls the radiation power by controlling the supply voltage of the X-ray source between 175 kV and 300 kV and the target intensity of the X-ray source between 250 μA and 100 mA, preferably 20 mA.

15. The device according to any one of claims 1, wherein the X-ray source comprises a target (CX) made of tungsten or molybdenum.

16. The device according to any one of claims 1, wherein the X-ray source comprises a window (F) made of beryllium or aluminum.

17. The device according to any one of claims 1, wherein the distance between the source (S) and the conveyor transporting the device is between 1 cm and 20 cm, preferably between 2.5 cm and 4 cm.

18. A method for erasing data stored in a non-volatile memory (M) of an electronic device (A), such as a mobile device such as a smartphone or a tablet, the method comprising: i. identifying each of the devices (A) to identify the type of device (A) and / or memory (M) to be irradiated, ii. determining, by a control unit (CU), radiation parameters corresponding to the device (A) identified by the identification means, iii. irradiating the electronic device (A) with at least one X-ray source (S), the at least one X-ray source being confined in an X-ray sealed housing of a radiation chamber (1) capable of successively receiving a plurality of electronic devices (A) to be brought into the chamber by a conveyor (2), the conveyor (2) and the X-ray source (S) being controlled by the control unit (CU) according to the radiation parameters, the radiation parameters including the power and duration of the radiation for erasing the data contained in the non-volatile memory (M) of the electronic device (A).

19. The method according to claim 18, wherein the radiation parameters include the main axis (AF) of the X-ray beam generated by the source, the axis (AF) being inclined or capable of being inclined with respect to the conveyor plane, and the angle of the main axis (AF) being determined by the control unit (CU) by means of the identification means.

20. The method according to claim 18, wherein the identification comprises determining, by means of the identification means, the position and type of the memory (M) of the device (A) to be irradiated, and the control unit guides the conveyor (2) and the X-ray source (S) according to the position and type of the memory (M) determined during the irradiation.

21. The method according to one of claims 18, wherein the control unit (CU) drives the X-ray source by controlling the power and duration according to the type of the memory (M) included in the electronic device (A).

22. The method according to one of claims 18, wherein the radiation includes adjusting the position of each of the continuous devices relative to the source according to the components of the device (A).

23. The method according to one of claims 18, the method further comprising positioning at least one protective mask (MP) between the source and the device to protect certain components of the device (A) during exposure of the memory (M) to the radiation source.

Citation Information

Patent Citations

  • Method for erasing data of a non-volatile semiconductor memory integrated circuit

    US4393479A