A method for detecting the contour of large-aperture reflectors

Abstract

The present invention relates to the technical field of reflector profile detection, and specifically provides a method for detecting the profile of a large-aperture reflector. A one-dimensional or two-dimensional scanning sensor is arranged in a non-contact point displacement sensor array to form a profile detection device, which promotes a line laser scanning sensor to traverse the reflector. During the traversal process, the one-dimensional or two-dimensional scanning sensor and the non-contact point displacement sensor array periodically collect distance data of the reflector. The one-dimensional or two-dimensional scanning sensor obtains distance data of high-density sampling points on the reflector; the non-contact point displacement sensor array obtains distance data of low-density sampling points on the reflector. After the low-density sampling points are corrected, the high-density sampling point distance data is fitted with the low-density profile surface shape to generate a high-density profile surface shape of the reflector. The present invention combines the advantages of non-contact point displacement sensors and laser scanning sensors, ensuring detection accuracy while improving data point density.

Description

Technical Field

[0001] The present invention belongs to the technical field of reflector profile detection, and in particular relates to a large-aperture reflector profile detection method. Background Art

[0002] Large-aperture mirrors play a vital role in numerous fields. For example, in astronomy, large telescopes require large-aperture mirrors to collect more light for observing distant galaxies and celestial bodies, thereby advancing humanity's exploration and understanding of the universe. In laser technology, large-aperture mirrors are used in high-power laser systems to effectively guide and focus laser beams, enabling applications such as laser processing and laser communications. Furthermore, in fields such as aerospace, large-aperture mirrors are also key components, playing an indispensable role in improving system performance and functionality.

[0003] In optical processing, the accuracy and efficiency of the mirror profile detection process directly impact the quality and efficiency of optical processing. Traditional methods for detecting mirror profiles often rely on contact measurement, such as with coordinate measuring machines. While these methods can achieve high measurement accuracy, they present numerous challenges when measuring large-diameter mirrors. For example, contact measurement can scratch or damage the mirror surface, affecting its optical performance. Furthermore, the measurement process is complex and inefficient, making it difficult to meet the dual requirements of detection efficiency and accuracy in modern optical processing. Furthermore, contact measurement can create difficult-to-reach areas for mirrors with unusual shapes, resulting in incomplete measurements.

[0004] In addition, some other detection methods have been proposed, as follows:

[0005] For example, the Chinese invention patent, CN116295108A, published on June 23, 2023, and titled "A Matrix-Type Profile Measurement Method and Apparatus," uses a matrix arrangement of multiple high-precision displacement sensors to measure the profile of a reflector. This solution corresponds to a high-precision displacement sensor for each data point, requiring a large number of these sensors, resulting in high costs. Furthermore, due to installation space and principle constraints, the interval between data points is greater than 10 mm, making it impossible to achieve high-density profile data collection.

[0006] For example, the Chinese invention patent with publication number CN115164773A and publication date October 11, 2022, titled "A method and device for contour detection of a large-aperture plane mirror", uses three probes to realize the contour detection of the plane mirror, and can only collect the height values of three points at the same time. The efficiency of data collection is limited, and there is a large cumulative error, and the accuracy of contour measurement is limited.

[0007] In summary, existing large-aperture reflector profile detection technologies suffer from limited detection accuracy, low detection efficiency, high cost, and low data point density. Therefore, it is urgent to design a large-aperture reflector profile detection device and method that can effectively overcome the above-mentioned problems. Summary of the Invention

[0008] In view of this, the present invention aims to provide a large-aperture reflector profile detection method that uses a non-contact point displacement sensor array and a one-dimensional or two-dimensional scanning sensor to detect the large-aperture reflector profile. The non-contact point displacement sensor has higher measurement accuracy but a lower sampling point density. The one-dimensional or two-dimensional scanning sensor is used to obtain high-density sampling point data. The high-density sampling point data is fused with the low-density sampling point data. The one-dimensional or two-dimensional scanning sensor increases the data point density, thereby achieving high-precision and high-data-density profile measurement.

[0009] To achieve the above object, the technical solution created by the present invention is implemented as follows:

[0010] The present invention provides a large-aperture reflector profile detection method, comprising:

[0011] Constructing a non-contact point displacement sensor array, comprising a plurality of equidistant non-contact point displacement sensors disposed in the same plane, replacing at least one non-contact point displacement sensor in the non-contact point displacement sensor array with a one-dimensional or two-dimensional scanning sensor, or disposing one of the one-dimensional or two-dimensional scanning sensors between any two non-contact point displacement sensors in the non-contact point displacement sensor array;

[0012] The line laser scanning sensor is caused to traverse the reflector. During the traversal process, a one-dimensional or two-dimensional scanning sensor and a non-contact point displacement sensor array periodically collect distance data from the reflector, and the sampling points of two adjacent samplings by the non-contact point displacement sensor array partially overlap. Distance data of high-density sampling points on the reflector are obtained by the one-dimensional or two-dimensional scanning sensor. Distance data of low-density sampling points on the reflector are obtained by the non-contact point displacement sensor array, and the distance data of each low-density sampling point includes distance data collected by multiple different non-contact point displacement sensors.

[0013] Based on the principle that the distances collected by the non-contact displacement sensors at different low-density sampling points are equal, the distance data of the low-density sampling points are corrected, and the high-precision low-density profile of the reflector is obtained by fitting using the corrected distance data of all low-density sampling points.

[0014] The high-density sampling point distance data obtained by the one-dimensional or two-dimensional scanning sensor and the high-precision low-density contour surface are fused to generate the high-precision high-density contour surface of the reflector.

[0015] Preferably, the one-dimensional or two-dimensional scanning sensor is a line laser scanning sensor or a surface displacement sensor.

[0016] Preferably, the length of a single-cycle detection range of the one-dimensional or two-dimensional scanning sensor is an integer multiple of the spacing between adjacent non-contact point displacement sensors.

[0017] Preferably, before the line laser scanning sensor traverses the reflector, the method further comprises: calibrating the one-dimensional or two-dimensional scanning sensor and the non-contact point displacement sensor using a standard plane or a standard sphere.

[0018] Preferably, a relative motion path between the non-contact point displacement sensor array, the one-dimensional or two-dimensional scanning sensor and the reflector is preset;

[0019] driving the non-contact point displacement sensor array and the one-dimensional or two-dimensional scanning sensor to move along a relative motion path;

[0020] Alternatively, the reflector is controlled to move according to the relative motion path.

[0021] Preferably, the traversal mode of the line laser scanning sensor traversing the reflector is a polar coordinate rotation mode or an XY axis grating traversal mode.

[0022] Preferably, the sampling time of the one-dimensional or two-dimensional scanning sensor and the non-contact point displacement sensor array is the same.

[0023] Preferably, based on the principle that the distances collected by different non-contact point displacement sensors at the same low-density sampling point are equal, the distance data of the low-density sampling point is corrected, including:

[0024] For any n+1th sampling period, the low-density sampling points of the non-contact point displacement sensor array partially overlap with the low-density sampling points of the nth sampling period. The distance data of the low-density sampling points in the overlapping part are aligned, and the distance data of the low-density sampling points in the non-overlapping part are added to the aligned distance data. In this way, the distance data of the low-density sampling points of all sampling periods are iteratively corrected.

[0025] Preferably, the alignment method is: using the distance data of the low-density sampling points in the nth sampling period as a standard, compensating and correcting the distance data of all low-density sampling points in the (n+1)th sampling period so that the distance data of the overlapping low-density sampling points are equal.

[0026] Preferably, it also includes: calibrating the relative motion error between the non-contact point displacement sensor array and the one-dimensional or two-dimensional scanning sensor and the reflector during the process of the line laser scanning sensor traversing the reflector, and performing motion error compensation on the distance data of high-density sampling points and low-density sampling points.

[0027] Compared with the prior art, the present invention can achieve the following beneficial effects:

[0028] Compared with the traditional three-coordinate contour detection scheme, the present invention combines a non-contact point displacement sensor array with a laser scanning sensor. The non-contact point displacement sensor array ensures the contour detection accuracy, and the laser scanning sensor is used to increase the data point density, thus solving the problem of low data point density due to space limitation. In addition, this combination method also effectively improves the measurement efficiency and realizes the contour measurement of large-aperture reflectors with high precision and high data density.

[0029] The present invention controls different non-contact point displacement sensors in a non-contact point displacement sensor array to perform multiple measurements on the same sampling point, and based on the principle that the sampling data of the same sampling point in different sampling periods are equal, performs data correction and alignment in an iterative manner, effectively reducing the influence of the motion device error on the sampling results, and reducing the motion accuracy requirements of the non-contact point displacement sensor array and the laser scanning sensor on the motion device. It can be directly integrated into equipment such as CNC machine tools or robotic arms, thereby improving the convenience of reflector profile detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The accompanying drawings, which constitute part of the present invention, are intended to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are intended to explain the present invention and do not constitute an undue limitation of the present invention. In the accompanying drawings:

[0031] Figure 1 is a schematic diagram of a measuring device provided according to an embodiment of the present invention;

[0032] Figure 2 is a schematic diagram of calibrating a measuring device using a standard component according to an embodiment of the present invention;

[0033] Figure 3 is a schematic diagram of performing contour detection on a reflector according to an embodiment of the present invention;

[0034] Figure 4 is a schematic diagram of a motion path for performing mirror scanning in a polar coordinate rotation manner according to an embodiment of the present invention;

[0035] Figure 5 2. A schematic diagram of a motion path for performing mirror scanning in an XY-axis raster traversal manner according to an embodiment of the present invention;

[0036] Figure 6 3 is a schematic diagram of periodic collection of low-density sampling points and high-density sampling points provided according to an embodiment of the present invention.

[0037] Reference numerals include:

[0038] Non-contact point displacement sensor 1, one-dimensional or two-dimensional scanning sensor 2, standard component 3, and reflector 4. DETAILED DESCRIPTION

[0039] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and do not constitute a limitation to the present invention. Similar elements in different embodiments use associated similar element numbers. In the following embodiments, many detailed descriptions are intended to enable the present invention to be better understood. However, those skilled in the art can easily recognize that some of the features can be omitted in different situations, or can be replaced by other elements, materials, or methods. In some cases, some operations related to the present invention are not shown or described in the specification. This is to avoid the core part of the present invention being overwhelmed by too much description. For those skilled in the art, it is not necessary to describe these related operations in detail. They can fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0040] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments of the present invention can be combined with each other to form various implementation methods. At the same time, the steps or actions in the method description can also be interchanged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the various orders in the description and the drawings are only for the purpose of clearly describing a certain embodiment and are not intended to be a required order, unless otherwise specified that a certain order must be followed.

[0041] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0042] In the description of the present invention, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal connections between two components. Those skilled in the art can understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0043] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.

[0044] In one embodiment of the present invention, a method for detecting the contour of a large-aperture reflector is provided. By combining a non-contact point displacement sensor array with a laser scanning sensor, the method combines the high sampling accuracy of the non-contact point displacement sensor array with the high sampling density of the laser scanning sensor. This method achieves high-precision and high-data-density contour detection of large-aperture reflectors, resolving the problem of traditional contour detection methods that suffer from spatial limitations and limited data density. Specifically, the process for detecting the contour of a large-aperture reflector is as follows:

[0045] S1: If Figure 1 As shown, a non-contact point displacement sensor array is constructed, and the non-contact point displacement sensor array includes M×N non-contact point displacement sensors 1. Generally, an N×N sensor array is preferred. All non-contact point displacement sensors 1 in the non-contact point displacement sensor array are in the same plane, and the distances between adjacent non-contact point displacement sensors 1 are equal. Then, at least one non-contact point displacement sensor 1 in the non-contact point displacement sensor array is replaced with a one-dimensional or two-dimensional scanning sensor 2. Generally, a non-contact point displacement sensor 1 at the center of the non-contact point displacement sensor array is replaced with a one-dimensional or two-dimensional scanning sensor 2. The one-dimensional or two-dimensional scanning sensor 2 can specifically be a one-dimensional line laser scanning sensor or a two-dimensional surface displacement sensor. The line laser scanning sensor can simultaneously realize linear multi-point detection, and the surface displacement sensor can simultaneously realize multi-point effective detection in the positive direction area. When a line laser scanning sensor is selected, the single-cycle detection length of the line laser scanning sensor is an integer multiple of the spacing between adjacent non-contact point displacement sensors 1, and preferably, the single-cycle detection length is equal to the spacing between adjacent non-contact point displacement sensors 1; when a surface displacement sensor is selected, the effective detection range of the surface displacement sensor is set to a square, and the side length of the single-cycle effective detection range of the surface displacement sensor is an integer multiple of the spacing between adjacent non-contact point displacement sensors 1, and preferably, the side length of the single-cycle effective detection range is equal to the spacing between adjacent non-contact point displacement sensors 1.

[0046] In addition, a one-dimensional or two-dimensional scanning sensor 2 may be inserted into the gap between any two non-contact point displacement sensors 1 in the non-contact point displacement sensor array.

[0047] After all non-contact point displacement sensors 1 and one-dimensional or two-dimensional scanning sensors 2 are selected and designed, they can be fixed together to form a reflector profile measurement device. Typically, depending on actual needs, these can be fixed using a connecting bracket, or further fixed to equipment such as a CNC machine tool or a robotic arm to facilitate subsequent control of the measurement device's movement.

[0048] The non-contact point displacement sensor 1 has a large scale and high precision. Therefore, although it can achieve high-precision detection, the limited space results in a low density of data sampling points. By using a non-contact point displacement sensor array to perform equally spaced displacement measurements on the reflector surface at a distance from the non-contact point displacement sensor 1, the information from multiple measurements of the same position point can be used to calculate the overall surface shape of the reflector with high precision. The measurement accuracy of the one-dimensional or two-dimensional distance sensor 2 is not as good as that of the non-contact point displacement sensor 1, but it has a very high data density. Combined with the low-density surface shape obtained by the non-contact point displacement sensor 1, a high-precision, high-data-point-density contour of the reflector can be obtained.

[0049] like Figure 2 As shown, after the non-contact point displacement sensor array and the one-dimensional or two-dimensional scanning sensor 2 are fixed, they need to be calibrated using a standard component 3. Specifically, the standard component 3 can be a standard plane or a standard sphere with a shape close to the reflector surface to be detected. The distance data collected by the non-contact point displacement sensor 1 and the one-dimensional or two-dimensional scanning sensor 2 are used to fine-tune the position of the non-contact point displacement sensor 1 and the one-dimensional or two-dimensional scanning sensor 2, compensating for the measurement errors of the non-contact point displacement sensor 1 and the one-dimensional or two-dimensional scanning sensor 2 and the errors during the fixing process. When measuring the standard plane, the sampled data of all non-contact point displacement sensors 1 and the one-dimensional or two-dimensional scanning sensor 2 are adjusted to be equal. When measuring the standard sphere, the surface shape obtained by fitting the sampled data of all non-contact point displacement sensors 1 and the one-dimensional or two-dimensional scanning sensor 2 is adjusted to be the same as the standard sphere. This process effectively eliminates the position fixing errors and measurement errors of all non-contact point displacement sensors 1 and the one-dimensional or two-dimensional scanning sensor 2.

[0050] S2: If Figure 3As shown, based on the single detection range of the measuring device composed of the non-contact point displacement sensor 1 and the one-dimensional or two-dimensional scanning sensor 2 and the size of the reflector 4, a relative motion path is designed, and the measuring device and the reflector 4 are controlled to move relative to each other along the preset relative motion path, so that the line laser scanning sensor 2 traverses the reflector 4.

[0051] During the relative motion control process, first, the measuring device composed of the non-contact point displacement sensor 1 and the one-dimensional or two-dimensional scanning sensor 2 can be driven to move along the relative motion path, while the reflector 4 remains stationary, thereby realizing ergodic sampling. Second, the reflector 4 can be driven to move along the relative motion path, while the measuring device composed of the non-contact point displacement sensor 1 and the one-dimensional or two-dimensional scanning sensor 2 remains stationary, thereby realizing ergodic sampling. Third, the measuring device and the reflector 4 can be driven to move at the same time to realize ergodic sampling. Generally, the first or second method is usually selected for motion control. These two methods are simpler to control and introduce smaller motion errors.

[0052] Accordingly, during the relative motion, the traversal method of the line laser scanning sensor 2 to traverse the reflector 4 can generally be as follows: Figure 4 Polar coordinate rotation as shown or as Figure 5 The two XY-axis raster traversal methods shown in the figure correspond to different relative motion paths. The polar coordinate rotation method has higher detection efficiency but is more difficult to control. The XY-axis raster traversal method has relatively lower detection efficiency, but is easy to control and has high detection accuracy.

[0053] As the one-dimensional or two-dimensional scanning sensor 2 and the non-contact point displacement sensor array traverse the reflector 4, all non-contact point displacement sensors 1 and one-dimensional or two-dimensional scanning sensors 2 periodically collect the distance to the reflector at the same sampling period. During each sampling period, the displacements of the non-contact point displacement sensors 1 and one-dimensional or two-dimensional scanning sensors 2 are the same, meaning the sampling points on the reflector are evenly distributed. The sampling points of two adjacent samplings by the non-contact point displacement sensor array will partially overlap. Distance data for high-density sampling points on the reflector 4 is obtained by the one-dimensional or two-dimensional scanning sensor 2; distance data for low-density sampling points on the reflector 4 is obtained by the non-contact point displacement sensor array. The distance data for each low-density sampling point includes distance data collected by multiple different non-contact point displacement sensors 1.

[0054] Specifically, such as Figure 6As shown, taking a one-dimensional or two-dimensional scanning sensor 2 as an area displacement sensor and an N×N distribution of non-contact point displacement sensors as an example, for any n+1 sampling period, the sampling points of the first row of non-contact point displacement sensors 1 in the non-contact point displacement sensor array in the direction of motion are new sampling points, while the sampling points of the remaining rows of non-contact point displacement sensors 1 are all the sampling points of the first N-1 rows of non-contact point displacement sensors 1 in the n sampling period, thus achieving repeated sampling of the distance data of these N-1 rows of low-density sampling points. In the figure, D1 is the sampling point of a non-contact point displacement sensor 1 in the first row of the non-contact point displacement sensor array in the direction of motion in the n sampling period, and D2 is the sampling point of the same non-contact point displacement sensor 1 in the n+1 sampling period. Similarly, for the area displacement sensor, H1 is a high-density sampling point in the square detection area of the area displacement sensor in the n sampling period, and H2 is another high-density sampling point at the same sampling position in the n+1 sampling period.

[0055] After obtaining the distance data of high-density sampling points on the reflector 4 through the one-dimensional or two-dimensional scanning sensor 2 and the distance data of low-density sampling points on the reflector 4 through the non-contact point displacement sensor array, it is necessary to use the distance data of the low-density sampling points to perform low-frequency surface shape solution of the reflector 4. Specifically, based on the principle that the distances collected by different non-contact point displacement sensors at the same low-density sampling point are equal, the distance data of the low-density sampling points are corrected. For any n+1 sampling period, the low-density sampling points of the non-contact point displacement sensor array partially overlap with the low-density sampling points of the n sampling period, and the distance data of the overlapping low-density sampling points are aligned. The alignment method is: using the distance data of the low-density sampling points of the n sampling period as a standard, the distance data of all low-density sampling points in the n+1 sampling period are compensated and corrected to make the distance data of the overlapping low-density sampling points equal. That is, if the distance data of the same sampling point in the n+1 sampling period is different from the distance data of the sampling point in the n sampling period, the distance data of the n+1 sampling period is compensated for the distance data difference. For low-density sampling points in non-overlapping areas, the distance data from these low-density sampling points is added to the aligned distance data. In this way, the distance data of low-density sampling points in all sampling periods is iteratively corrected. The above iterative alignment method is conventional technology, and other conventional data processing techniques can also be used.

[0056] After the distance data of all low-density sampling points are corrected, the corrected distance data of all high-precision low-density sampling points are used to fit the high-precision low-density contour of the reflector. After obtaining the high-precision low-density contour, the distance data of the high-density sampling points on the reflector 4 obtained by the one-dimensional or two-dimensional scanning sensor 2 are fused with the high-precision low-density contour. The specific fusion method can be to use the high-precision low-density contour as a standard, use a data fusion algorithm to correct the distance data of the high-density sampling points, and fit it to the high-precision low-density contour to obtain high-precision and high-data-density contour data.

[0057] As an optional embodiment, since motion errors may be introduced when the robotic arm or CNC machine tool drives the measuring device or the reflector 4 to move, the relative motion errors between the non-contact point displacement sensor array and the one-dimensional or two-dimensional scanning sensor 2 and the reflector can be calibrated during the process of the online laser scanning sensor 2 traversing the reflector 4, and motion error compensation can be performed on the distance data of the high-density sampling points and the low-density sampling points.

[0058] As an optional embodiment, the method of the present invention is not only applicable to the measurement of reflectors, but can also be used for the profile measurement of other complex curved surfaces with small curvature changes.

[0059] In short, the above description is only a preferred embodiment of this specification and is not intended to limit the scope of protection of this specification. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of this specification shall be included in the scope of protection of this specification.

[0060] The systems, devices, modules, or units described in one or more of the above embodiments may be implemented by a computer chip or entity, or by a product having a certain function. A typical implementation device is a computer. Specifically, the computer may be, for example, a personal computer, a laptop computer, a cellular phone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.

[0061] It should also be noted that the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, commodity, or apparatus that includes a series of elements includes not only those elements but also other elements not explicitly listed, or includes elements inherent to such process, method, commodity, or apparatus. In the absence of further limitations, an element defined by the phrase "comprises a ..." does not exclude the presence of other identical elements in the process, method, commodity, or apparatus that includes the element.

[0062] The various embodiments in this specification are described in a progressive manner. Similar parts between the various embodiments can be referred to in conjunction with each other. Each embodiment focuses on the differences between the other embodiments. In particular, the system embodiments are generally similar to the method embodiments, so the description is relatively simple. For relevant parts, refer to the description of the method embodiments.

[0063] The foregoing description of this specification describes specific embodiments. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims can be performed in an order different from that described in the embodiments and still achieve the desired results. Furthermore, the processes depicted in the accompanying drawings do not necessarily require the specific order shown or the sequential order to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

Claims

1. A method for detecting the contour of a large-aperture reflector, characterized in that: include: Constructing a non-contact point displacement sensor array, comprising a plurality of equidistant non-contact point displacement sensors disposed in the same plane, replacing at least one non-contact point displacement sensor in the non-contact point displacement sensor array with a one-dimensional or two-dimensional scanning sensor, or disposing one of the one-dimensional or two-dimensional scanning sensors between any two non-contact point displacement sensors in the non-contact point displacement sensor array; The line laser scanning sensor is caused to traverse the reflector, and during the traversal process, the one-dimensional or two-dimensional scanning sensor and the non-contact point displacement sensor array periodically collect distance data from the reflector, wherein the sampling points of two adjacent samplings of the non-contact point displacement sensor array partially overlap; the distance data of high-density sampling points on the reflector are obtained by the one-dimensional or two-dimensional scanning sensor; and the distance data of low-density sampling points on the reflector are obtained by the non-contact point displacement sensor array, wherein the distance data of each low-density sampling point includes distance data collected by multiple different non-contact point displacement sensors; Based on the principle that the distances collected by the non-contact displacement sensors at different low-density sampling points are equal, the distance data of the low-density sampling points are corrected, and the high-precision low-density profile of the reflector is obtained by fitting using the corrected distance data of all low-density sampling points. The high-density sampling point distance data obtained by the one-dimensional or two-dimensional scanning sensor and the high-precision low-density contour surface are fused to generate the high-precision high-density contour surface of the reflector.

2. The method for detecting the contour of a large-aperture reflector according to claim 1, wherein: The one-dimensional or two-dimensional scanning sensor is a line laser scanning sensor or a surface displacement sensor.

3. The method for detecting the contour of a large-aperture reflector according to claim 1, wherein: The length of a single-cycle detection range of the one-dimensional or two-dimensional scanning sensor is an integer multiple of the spacing between adjacent non-contact point displacement sensors.

4. The method for detecting the contour of a large-aperture reflector according to claim 1, wherein: Before the line laser scanning sensor traverses the reflector, the method further includes: calibrating the one-dimensional or two-dimensional scanning sensor and the non-contact point displacement sensor using a standard plane or a standard sphere.

5. The method for detecting the contour of a large-aperture reflector according to claim 1, wherein: Presetting the relative motion path between the non-contact point displacement sensor array, the one-dimensional or two-dimensional scanning sensor and the reflector; driving the non-contact point displacement sensor array and the one-dimensional or two-dimensional scanning sensor to move along a relative motion path; Alternatively, the reflector is controlled to move according to the relative motion path.

6. The method for detecting the contour of a large-aperture reflector according to claim 1, wherein: The traversal mode of the line laser scanning sensor traversing the reflector is a polar coordinate rotation mode or an XY axis grating traversal mode.

7. The method for detecting the contour of a large-aperture reflector according to claim 1, wherein: The sampling time of the one-dimensional or two-dimensional scanning sensor and the non-contact point displacement sensor array is the same.

8. The method for detecting the contour of a large-aperture reflector according to claim 1, wherein: The distance data of the low-density sampling point is corrected based on the principle that the distances collected by the displacement sensors at different non-contact points at the same low-density sampling point are equal, including: For any n+1th sampling period, the low-density sampling points of the non-contact point displacement sensor array partially overlap with the low-density sampling points of the nth sampling period, the distance data of the low-density sampling points in the overlapping part are aligned, and the distance data of the low-density sampling points in the non-overlapping part are added to the aligned distance data. In this way, the distance data of the low-density sampling points of all sampling periods are iteratively corrected.

9. The method for detecting the contour of a large-aperture reflector according to claim 8, wherein: The alignment method is: using the distance data of the low-density sampling points in the nth sampling period as a standard, compensating and correcting the distance data of all low-density sampling points in the (n+1)th sampling period so that the distance data of the overlapping low-density sampling points are equal.

10. The method for detecting the contour of a large-aperture reflector according to claim 5, wherein: Also includes: The relative motion errors between the non-contact point displacement sensor array and the one-dimensional or two-dimensional scanning sensor and the reflector during the process of the line laser scanning sensor traversing the reflector are calibrated, and motion error compensation is performed on the distance data of high-density sampling points and low-density sampling points.

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