Radio frequency resource dynamic allocation test system and method

Abstract

The invention discloses a radio frequency resource dynamic allocation test system and a radio frequency resource dynamic allocation test method, which relate to the field of product measurement and control and are used for improving the utilization rate of test resources and the applicability to different test tasks. A radio frequency signal source on a production line is respectively connected with each station through a first photoelectric link, each station is respectively connected with a frequency spectrograph through a second photoelectric link, an industrial personal computer manages a test task of each station, and a resource control assembly controls the connection and disconnection of the related first photoelectric link and the second photoelectric link according to test resources required by the test tasks. And the industrial personal computer calculates the insertion loss value of the attenuator and the compensation gain of the signal receiving terminal microwave amplifier according to the tolerance of the test task to the test deviation. According to the method, the utilization rate of test resources is greatly improved, the consumption of human resources is reduced, and the method has universality for different test tasks.

Description

Technical Field

[0001] The present invention relates to the technical field of product measurement and control, and in particular to a radio frequency resource dynamic allocation test system and method. Background Art

[0002] With the development of computer technology and test technology, most large-scale electronic products can integrate radio frequency instruments, products under test, and computer resources together through various buses to form a dedicated automatic test system. The computer controls radio frequency instruments (typical instruments such as radio frequency signal sources, spectrum analyzers, etc.) to test various performance indicators of the products under test, thereby saving human resources and ensuring the consistency of test results at the same time.

[0003] Currently, the test process of large-scale electronic products requires test resources such as radio frequency signal sources and spectrum analyzers to test performance indicators. Due to the high procurement cost of such test resources, it is difficult to equip each workbench with dedicated test resources. Especially for some complex performance indicators, multiple radio frequency signal sources need to be occupied to complete the test. In the traditional mode, when testing complex indicators, a single workbench needs to occupy most of the test resources on the production line, and the resource utilization rate is low. Summary of the Invention

[0004] The invention objective of the present invention is: aiming at all or part of the above problems, to provide a radio frequency resource dynamic allocation test system and method, so as to flexibly schedule test resources such as radio frequency signal sources and spectrum analyzers at different workbenches on the production line, improve the utilization rate of production line test resources, save human resources, and to a certain extent improve the applicability to different test tasks.

[0005] The technical solution adopted by the present invention is as follows: A radio frequency resource dynamic allocation test system, which includes a plurality of radio frequency signal sources, each radio frequency signal source is respectively connected to a signal combiner corresponding to each test workbench through a first optoelectronic link; the signal combiner of each test workbench is respectively connected to the test workbench through a first signal receiving terminal, and an attenuator is connected between each of the first signal receiving terminals and the test workbench; each test workbench is respectively connected to a spectrum analyzer through a second optoelectronic link; the resource control component is connected to the industrial control computer, and according to the resource requirements of the test task provided by the industrial control computer, performs switch control on each of the first optoelectronic link and the second optoelectronic link, and respectively controls the power compensation for the first optoelectronic link and the second optoelectronic link; the industrial control computer determines the insertion loss value of the attenuator when carrying out the test task based on the correlation between the measurement deviation and the insertion loss value of the attenuator.

[0006] Further, the first optoelectronic link includes a first signal transmitting terminal and a signal splitter; the radio frequency signal source is connected to the first signal transmitting terminal, the first signal transmitting terminal is connected to the signal splitter, and each output of the signal splitter is respectively connected to a signal combiner corresponding to each test station through a first signal switch; each of the first signal switches is respectively connected to the resource control component.

[0007] Further, the second optoelectronic link includes a second signal transmitting terminal and a second signal receiving terminal, the test station is connected to the second signal transmitting terminal, the second signal transmitting terminal is connected to the second signal receiving terminal through a second signal switch, the second signal receiving terminal is connected to the spectrum analyzer, and the second signal switch is connected to the resource control component.

[0008] Further, the signal transmitting terminal includes a laser and an electro-optic modulator. The output end of the laser is connected to the carrier signal input end of the electro-optic modulator. The modulation signal input end of the electro-optic modulator accesses the signal to be transmitted, and the output end of the electro-optic modulator outputs a modulated laser signal.

[0009] Further, the signal receiving terminal includes a photodetector and a microwave amplifier connected in sequence; the microwave amplifier is connected to the resource control component, and the microwave amplifier performs power compensation in response to the numerical control signal of the resource control component.

[0010] Further, the measurement deviation includes the receiver sensitivity deviation. The method for constructing the correlation relationship between the receiver sensitivity deviation and the insertion loss value of the attenuator includes: Respectively obtain the gain G1 and noise figure NF1 of the first optoelectronic link, the gain G2 and noise figure NF2 of the first signal receiving terminal, the gain G3 and noise figure NF3 of the cable + attenuator, and the noise figure NF4 of the microwave front end of the product under test; Construct the mapping relationship between the receiver sensitivity deviation Err and G3 according to the following method: , In the formula, the function .

[0011] Further, the method for constructing the correlation relationship between the receiver sensitivity deviation and the insertion loss value of the attenuator further includes: Obtain the gain of the cable; According to the gain of the cable and the mapping relationship between Err and G3, calculate the mapping relationship between Err and the insertion loss value of the attenuator.

[0012] On the other hand, the present invention also provides a test method based on the above-mentioned radio frequency resource dynamic allocation test system, and the test method includes: Connect the products to be tested on the target test station to the first signal receiving terminal and the second optical and electrical link respectively; Use the industrial control computer to obtain the insertion loss value of the attenuator corresponding to the target test station based on the correlation between the measurement deviation and the insertion loss value of the attenuator according to the tolerance of the measurement deviation for the test task; Adjust the insertion loss of the attenuator to the said insertion loss value; Operate the resource control component to turn on the first optical and electrical link of the radio frequency signal source required for the test task, and the second optical and electrical link between the target test station and the spectrum analyzer; Operate the resource control component to perform power compensation on the turned-on first optical and electrical link and the second optical and electrical link respectively; Analyze the signal received from the second optical and electrical link by the spectrum analyzer.

[0013] Further, analyzing the signal received from the second optical and electrical link by the spectrum analyzer includes: Analyze at least one of the frequency, power, bandwidth, and modulation parameters of the signal received from the second optical and electrical link by the spectrum analyzer.

[0014] Further, the test method further includes: Obtain the report of the signal analysis received from the second optical and electrical link by the spectrum analyzer.

[0015] In summary, due to the adoption of the above technical solutions, the beneficial effects of the present invention are: The present invention connects the test resources such as radio frequency signal sources and spectrum analyzers at different positions on the production line to each test station respectively, and performs real-time scheduling and on-demand allocation through the resource control component, and realizes the multiplexing of the radio frequency signal source through the signal splitter. It changes the traditional mode that a certain test station occupies the test resources for a long time and the deployment requires manual handling. In the system of the present invention, the radio frequency signal sources on the production line can cover all stations on the production line, and the radio frequency signal sources and spectrum analyzers are deployed through the signal transmission network and the signal control network proposed by the present system, which changes the mode of manual handling of test resources and greatly improves the utilization rate of production line test resources.

[0016] In addition, the present invention also constructs the correlation between the measurement deviation and the insertion loss value of the attenuator, and can determine the actual required insertion loss value of the attenuator according to the tolerance of the measurement deviation for different test tasks (i.e., the allowable measurement deviation range), so as to reduce the measurement deviation introduced by the first optical and electrical link and improve the test accuracy. Description of the Drawings

[0017] The present invention will be described by way of examples with reference to the accompanying drawings, where: Figure 1 It is a schematic diagram of the network structure of a radio frequency resource dynamic allocation test system provided in an embodiment of the present application.

[0018] Figure 2 It is a structural diagram of a signal receiving terminal in an embodiment of the present application.

[0019] Figure 3 It is a structural diagram of a radio frequency resource dynamic allocation test system provided in an embodiment of the present application.

[0020] Figure 4 It is a curve graph of the mapping relationship between the receiver sensitivity and the gain of "cable + attenuator" in an embodiment of the present application.

[0021] Figure 5 It is a flowchart of a test method provided in an embodiment of the present application. Detailed implementation manners

[0022] All features disclosed in this specification, or all steps in the disclosed methods or processes, except for mutually exclusive features and / or steps, can be combined in any way.

[0023] Any feature disclosed in this specification (including any additional claims, abstract) can be replaced by other equivalent or similar-purpose alternative features unless specifically stated. That is, unless specifically stated, each feature is only an example of a series of equivalent or similar features.

[0024] In view of the current situation that when testing large-scale electronic products, it is mainly through manual handling of test instruments such as radio frequency signal sources and spectrum analyzers, resulting in some test resources being occupied for a long time, leading to low utilization rate of test resources and high consumption of human resources, an embodiment of the present application provides a radio frequency resource dynamic allocation test system and method, aiming to improve the utilization rate of production line test resources and at the same time be applicable to different test tasks.

[0025] The radio frequency resource dynamic allocation test system provided in an embodiment of the present application includes multiple radio frequency signal sources, and each radio frequency signal source is respectively connected to a signal combiner corresponding to each test station through a first optoelectronic link. That is, if the production line includes multiple test stations, there will be multiple signal combiners, each test station corresponds to a signal combiner one by one, and each radio frequency signal source is respectively connected to each signal combiner through multiple first optoelectronic links.

[0026] The first optoelectronic link is responsible for converting the radio frequency signal (electrical signal) emitted by the radio frequency signal source into an optical signal and then transmitting it backward (to the signal combiner).

[0027] The signal combiners at each test station are respectively connected to the test station via the first signal receiving terminals. After the first signal receiving terminals convert the optical signals transmitted by the signal combiners into electrical signals, power compensation can be performed through microwave amplifiers, etc., and then transmitted backward (to the test station) through cables. An attenuator is connected between each first signal receiving terminal and the test station. The attenuator has a certain gain, and attenuators with different insertion losses have different gains. Each test station is respectively connected to a spectrum analyzer via a second optoelectronic link. That is, the response signal generated by the product under test at the test station under the excitation of the signal transmitted by the first signal receiving terminal is transmitted to the spectrum analyzer via the second optoelectronic link, and the spectrum analyzer is responsible for testing and analyzing the signals transmitted from the second optoelectronic link. The resource control component is connected to the industrial control computer, and the industrial control computer is responsible for managing the test tasks of each test station. Different test tasks have different requirements for test resources (radio frequency signal sources). The resource control component performs switching control on each first optoelectronic link and the second optoelectronic link according to the resource requirements of the test tasks provided by the industrial control computer, so as to determine which radio frequency signal sources are connected to each test station, and determine which spectrum analyzer the response signal is transmitted to for testing and analysis. In addition, the resource control component also controls the power compensation for the first optoelectronic link and the second optoelectronic link respectively to compensate for the power attenuation caused by the conversion of optical and electrical signals when introducing the optoelectronic link for long-distance signal transmission. The industrial control computer determines the insertion loss value of the attenuator when carrying out the test task based on the correlation between the measurement deviation and the insertion loss value of the attenuator, so as to determine the gain introduced by the attenuator to adapt to the requirements of the test task for the measurement deviation.

[0028] As an optional implementation manner, the first optoelectronic link includes a first signal transmitting terminal and a signal splitter. The first signal transmitting terminal is connected to a radio frequency signal source for converting the radio frequency signal emitted by the radio frequency signal source into an optical signal. The first signal transmitting terminal is connected to the signal splitter for multiplexing the optical signal into multiple paths. Each output path of the signal splitter is respectively connected to the signal combiner corresponding to each test station via a first signal switch. That is, for each radio frequency signal source, it is respectively connected to the signal combiners of each test station through the signal splitter. For each test station, its signal combiner respectively accesses the excitation signals of each radio frequency signal source. The first signal switch is used to control the on-off state between the signal splitter and the signal combiner. Each first signal switch is respectively connected to the resource control component, and the resource control component determines which excitation signals of the radio frequency signal sources need to be accessed by the test station, conducts the first signal switches corresponding to the accessed excitation signals, and turns off the others. The required excitation signals are determined by the test tasks managed in the industrial control computer.

[0029] As an alternative implementation, the second optical and electrical link includes a second signal transmitting terminal and a second signal receiving terminal. The test station is connected to the second signal transmitting terminal, and the second signal transmitting terminal is connected to the second signal receiving terminal via a second signal switch. The second signal transmitting terminal is responsible for converting the response signal generated by the product under test at the test station into an optical signal and then transmitting it backward (to the second signal receiving terminal). The second signal switch is responsible for turning on or off the link between the second signal transmitting terminal and the second signal receiving terminal. The second signal switch is connected to the resource control component, and the switch state is controlled by the resource control component. The second signal receiving terminal is connected to a spectrum analyzer. After converting the optical signal transmitted from the second signal transmitting terminal into an electrical signal, the second signal receiving terminal transmits it to the spectrum analyzer for test and analysis. It should be noted that each test station corresponds to a second signal transmitting terminal. However, the same production line can share a second signal receiving terminal, that is, the second signal receiving terminals in each second optical and electrical link can be the same, and the second signal switch is used to determine which response signal transmitted by the second signal transmitting terminal to receive. Of course, when there is more than one spectrum analyzer, the second signal receiving terminals of some second optical and electrical links can be shared, and this second signal receiving terminal is connected to one spectrum analyzer.

[0030] For example, as Figure 1 shown, there are 4 RF signal sources and 1 spectrum analyzer set on the production line. The 4 RF signal sources are RF signal source A1, RF signal source B1, RF signal source C1, and RF signal source D1 respectively. There are multiple test stations on the production line. Figure 1 Only 1 test station is taken as an example here, and the signal transmission links of other stations are designed similarly.

[0031] The 4 RF signal sources are connected to 4 first signal transmitting terminals one by one, which are first signal transmitting terminal A2, first signal transmitting terminal B2, first signal transmitting terminal C2, and first signal transmitting terminal D2 in sequence. The 4 first signal transmitting terminals are connected to 4 signal splitters one by one, which are signal splitter A3, signal splitter B3, signal splitter C3, and signal splitter D3 in sequence. Taking the Figure 1 test station shown as an example, the 4 signal splitters are respectively connected to a signal combiner via 4 first signal switches. The 4 first signal switches are first signal switch A4, first signal switch B4, first signal switch C4, and first signal switch D4 respectively. The signal combiner is connected to the first signal receiving terminal A5, and this first signal receiving terminal A5 is the first signal receiving terminal corresponding to this test station.

[0032] In addition, as the transmission link of the test signal, the test station is also connected to a second signal transmitting terminal E1, which serves as the second signal transmitting terminal corresponding to this test station. The second signal transmitting terminal E1 is connected to a second signal receiving terminal E3 via a second signal switch E2, and this second signal receiving terminal E3 serves as the second signal receiving terminal. The second signal receiving terminal E3 is connected to a spectrum analyzer.

[0033] The structures of the first signal transmitting terminal and the second signal transmitting terminal are the same. As an alternative implementation, the signal transmitting terminal (the first signal transmitting terminal and the second signal transmitting terminal) includes a laser and an electro-optic modulator, which together serve as an optical transmitter. The laser is connected to the carrier signal input terminal of the electro-optic modulator. The laser generates laser light, which is used as the carrier signal to access the electro-optic modulator. The modulation signal input terminal of the electro-optic modulator is connected to the signal to be transmitted. For example, for the first signal transmitting terminal, the signal to be transmitted is the excitation signal output by the RF signal source. For the second signal transmitting terminal, the signal to be transmitted is the response signal generated by the product under test. The electro-optic modulator modulates the carrier signal using the signal to be transmitted, and finally the modulated laser signal is output from the output terminal and transmitted to the subsequent stage.

[0034] The structures of the first signal receiving terminal and the second signal receiving terminal are also the same. As an alternative implementation, as Figure 2 shown, the signal receiving terminal (the first signal receiving terminal and the second signal receiving terminal) includes a photodetector and a microwave amplifier connected in sequence, which together serve as an optical receiver. The photodetector is responsible for performing optoelectronic conversion on the received optical signal to convert it into an RF signal. The microwave amplifier then amplifies the RF signal and transmits it to the subsequent stage. For the first signal receiving terminal, the optical signal it receives is the excitation signal transmitted by the signal combiner. For the second signal receiving terminal, the optical signal it receives is the response signal of the product under test transmitted by the second signal transmitting terminal.

[0035] The microwave amplifier is connected to the resource control component, and the microwave amplifier performs power compensation in response to the digital control signal of the resource control component. Since the power of the signal will be attenuated after the signal transmission terminal and the signal reception terminal are introduced, in order to prevent the signal power from being too low, in the signal reception terminal, the resource control component controls the microwave amplifier to compensate for the power loss during the conversion of the optical signal and the electrical signal. For the first signal reception terminal, the compensation value Gx of its microwave amplifier is: Gx = F(L1, L2, L3), where L1 is the RF insertion loss from the RF signal source to the first signal transmission terminal, L2 is the RF insertion loss from the first signal reception terminal to the test station, L3 is the insertion loss from the first signal reception terminal to the attenuator of the test station, and F represents the mapping function between the insertion loss and the compensation value, which can be fitted according to the historical test data. For the second signal reception terminal, the compensation value Gy of its microwave amplifier is: Gy = F(L4, L5, L6), where L4 is the RF insertion loss from the test station to the second signal transmission terminal, L5 is the RF insertion loss from the second signal reception terminal to the spectrum analyzer, and L6 is the insertion loss from the second signal reception terminal to the attenuator of the spectrum analyzer.

[0036] It can be seen from Figure 1 the examples that each RF signal source and spectrum analyzer can be set at different positions on the production line respectively. When each test station needs to use the RF signal source, it does not need to be transported to this test station, and the same RF signal source can be connected to different test stations at the same time, which greatly improves the utilization rate of test resources and saves the human resources required for handling equipment.

[0037] In addition, the test system provided by the embodiments of the present application can calculate the required introduced gain according to the allowable range of test deviation for the test tasks arranged for each test station, and change the gain of the RF link by changing the insertion loss of the attenuator or by replacing the attenuator with different insertion losses, so as to reduce the measurement deviation caused by the first optoelectronic link.

[0038] As an optional implementation manner, the measurement deviation includes the receiver sensitivity deviation, that is, the insertion loss value of the attenuator can be determined according to the receiver sensitivity deviation required by the test task.

[0039] As Figure 3 shown in the structural diagram of the RF resource dynamic allocation test system in an optional implementation manner of the present application, it can be seen from this figure that there are multiple sensitivities involved in the test system. In addition to the receiver sensitivity , there is also the sensitivity of System 1 (the part of the excitation link except the first optoelectronic link, which belongs to the facilities included in the traditional test method) , and the sensitivity of System 2 (the entire excitation link including the first optoelectronic link part) of the embodiments of the present application . There is: , , .

[0040] Wherein, NFx, NFy, and NFz respectively represent the noise figure of the corresponding system, B represents the bandwidth of the receiver of the product under test, and SNR represents the signal-to-noise ratio required by the product under test. , , The three corresponding systems have a nested relationship, and the system that finally receives the excitation signal is the corresponding system, that is, the receiver of the product under test. Therefore, the values of B and SNR in the above three formulas are the same, which are determined according to the bandwidth and signal-to-noise ratio of the specific product under test on the test station. Taking the receiver sensitivity as the value to be evaluated, its theoretical calculation method is , and usually in actual testing, its calculation method in the embodiments of the present application is . The calculation results of the two should be the same, and the difference between the two is the receiver sensitivity deviation.

[0041] Based on the above calculation theory, in some feasible implementation manners, the method for constructing the correlation relationship between the receiver sensitivity deviation and the insertion loss value of the attenuator includes: Obtain the gain G1 and noise figure NF1 of the first optoelectronic link, the gain G2 and noise figure NF2 of the first signal receiving terminal, the gain G3 and noise figure NF3 of the cable + attenuator, and the noise figure NF4 of the microwave front end of the product under test, respectively.

[0042] The gain of the first optoelectronic link is the gain of the first signal transmitting terminal + the first signal switch. The gain of the first signal receiving terminal is the gain of the microwave amplifier. The gain of the cable + attenuator is the total gain of the link part between the first signal receiving terminal and the test station. There is an inverse relationship between the noise figure and the gain. The noise figure of the microwave front end of the product under test can be determined after the product under test is determined, and is usually 10 dB.

[0043] Construct the mapping relationship between the receiver sensitivity deviation Err and G3 according to the following method: .

[0044] Wherein, the function represents the original value of the power. The mapping relationship between Err and G3 is as Figure 4 shown.

[0045] It can be found from the above formula that the receiver sensitivity deviation Err mainly depends on the gain G3 of "cable + attenuator" and the microwave front-end noise figure NF4 of the product under test. After the product under test is determined, NF4 becomes a constant. Therefore, the receiver sensitivity deviation Err mainly depends on G3, that is, the gain of "cable + attenuator".

[0046] The above mapping relationship can be used as the correlation between the receiver sensitivity deviation and the insertion loss value of the attenuator. According to this mapping relationship, when the receiver sensitivity deviation required for the test task is determined, the corresponding G3 can be obtained. G3 is the gain of the cable + attenuator. After the system is built, the gain of the cable is determined. Then, through the gain of the cable and the required G3, the insertion loss (i.e., gain) of the attenuator can be obtained.

[0047] Alternatively, based on the mapping relationship between Err and G3, the mapping relationship between the insertion loss value of the attenuator and Err can be further calculated. According to this mapping relationship, after giving Err, the insertion loss value can be directly matched instead of G3, which can further improve the test efficiency. According to this idea, in some alternative embodiments, the method for constructing the correlation between the receiver sensitivity deviation and the insertion loss value of the attenuator further includes: Obtain the gain of the cable; According to the gain of the cable and the mapping relationship between Err and G3, calculate the mapping relationship between Err and the insertion loss value of the attenuator. From the perspective of the function or curve, it is to shift the mapping relationship between Err and G3 to the left by the gain value of the cable.

[0048] Take the mapping relationship between Err and the insertion loss value of the attenuator as the correlation between Err and the insertion loss value of the attenuator. The insertion loss value of the attenuator can be directly matched according to the Err required by the test task (referred to as the tolerance of the receiver sensitivity). Then, adjust the insertion loss of the attenuator to the corresponding value, or replace the attenuator with the corresponding insertion loss value, to meet the requirements of the test task. Thus, the present application can be applied to different test tasks.

[0049] On the other hand, the present application provides a test method based on the radio frequency resource dynamic allocation test system in the above embodiments, as Figure 5 shown, the method includes the following processes: Connect the products under test on the target test station to the first signal receiving terminal and the second optical and electrical link respectively. That is, connect the excitation port of the product under test to the radio frequency signal source, and the output port to the spectrum analyzer.

[0050] The industrial control computer obtains the insertion loss value of the attenuator corresponding to the target test station based on the tolerance of the measurement deviation for the test task and the correlation between the measurement deviation and the insertion loss value of the attenuator. For the implementation where the mapping relationship between Err and G3 is used as the correlation between the receiver sensitivity deviation and the insertion loss value of the attenuator, first match G3 from this mapping relationship, and then calculate the insertion loss value of the attenuator according to the gain of the cable. For the implementation where the mapping relationship between Err and the insertion loss value of the attenuator is used as the correlation between the receiver sensitivity deviation and the insertion loss value of the attenuator, the insertion loss value of the attenuator can be directly matched.

[0051] Adjust the insertion loss of the attenuator to this insertion loss value. It should be noted that when adjusting the insertion loss of the attenuator, in the embodiment using an adjustable attenuator, the insertion loss size of the attenuator can be directly adjusted, while in the embodiment using a fixed-value attenuator, it is replaced with an attenuator with the target insertion loss value.

[0052] The operation resource control component turns on the first optoelectronic link of the RF signal source required for the test task and the second optoelectronic link between the target test station and the spectrum analyzer. Taking Figure 1 the embodiment as an example, assuming that the test tasks of the current test station require the excitation signals of RF signal sources A1, B1, and C1, the resource control component controls the first signal switches A4, B4, and C4 to turn on and the second signal switch E2 to turn on, and controls the first signal switch D4 to turn off.

[0053] The operation resource control component performs power compensation on the turned-on first and second optoelectronic links respectively. Still taking Figure 1 the embodiment as an example, the resource control component controls the power compensated by the microwave amplifiers in the first signal receiving terminal A5 and the second signal receiving terminal E3 respectively. The calculation method of the specific compensation value can be referred to the previous embodiment and will not be elaborated here.

[0054] The spectrum analyzer analyzes the signal received from the second optoelectronic link. In some feasible embodiments, the analysis performed by the spectrum analyzer on the received signal includes analyzing at least one of the frequency, power, bandwidth, and modulation parameters of the received signal. The specific analysis indicators are determined according to the needs of the test task, which is not the improvement of this application, that is, the indicators specifically responsible for test analysis by the spectrum analyzer are still the same as those in the traditional test method.

[0055] As an alternative implementation, the test method further includes: Obtain the report of the spectrum analyzer's analysis of the signal received from the second optoelectronic link. The report is summarized and managed to facilitate the digital management of the production line.

[0056] The present invention is not limited to the foregoing specific embodiments. The present invention extends to any novel feature or any novel combination disclosed in this specification, as well as to any novel combination of steps of any new method or process disclosed.

Claims

1. A radio frequency resource dynamic allocation test system, characterized in that, It includes multiple RF signal sources, each of which is respectively connected to a signal combiner corresponding to each test station via a first optoelectronic link; the signal combiner of each test station is respectively connected to the test station via a first signal receiving terminal, and an attenuator is connected between each of the first signal receiving terminals and the test station; each test station is respectively connected to a spectrum analyzer via a second optoelectronic link; the resource control component is connected to the industrial control computer, and according to the resource requirements of the test task provided by the industrial control computer, it performs switching control on each of the first optoelectronic link and the second optoelectronic link, and respectively controls the power compensation for the first optoelectronic link and the second optoelectronic link; the industrial control computer determines the insertion loss value of the attenuator when carrying out the test task based on the correlation relationship between the measurement deviation and the insertion loss value of the attenuator.

2. The radio frequency resource dynamic allocation test system according to claim 1, characterized in that The first optoelectronic link includes a first signal transmitting terminal and a signal splitter; the RF signal source is connected to the first signal transmitting terminal, the first signal transmitting terminal is connected to the signal splitter, and each output of the signal splitter is respectively connected to the signal combiner corresponding to each test station via a first signal switch; each of the first signal switches is respectively connected to the resource control component.

3. The radio frequency resource dynamic allocation test system according to claim 1, wherein The second optoelectronic link includes a second signal transmitting terminal and a second signal receiving terminal, the test station is connected to the second signal transmitting terminal, the second signal transmitting terminal is connected to the second signal receiving terminal via a second signal switch, the second signal receiving terminal is connected to the spectrum analyzer, and the second signal switch is connected to the resource control component.

4. The radio frequency resource dynamic allocation test system according to claim 2 or 3, characterized in that The signal transmitting terminal includes a laser and an electro-optic modulator, the output end of the laser is connected to the carrier signal input end of the electro-optic modulator, the modulation signal input end of the electro-optic modulator accesses the signal to be transmitted, and the output end of the electro-optic modulator outputs the modulated laser signal.

5. The radio frequency resource dynamic allocation test system according to claim 2 or 3, characterized in that The signal receiving terminal includes a photodetector and a microwave amplifier connected in sequence; the microwave amplifier is connected to the resource control component, and the microwave amplifier performs power compensation in response to the numerical control signal of the resource control component.

6. The radio frequency resource dynamic allocation test system according to claim 1, wherein The measurement deviation includes the receiver sensitivity deviation, and the method for constructing the correlation relationship between the receiver sensitivity deviation and the insertion loss value of the attenuator includes: Respectively obtaining the gain G1 and noise figure NF1 of the first optoelectronic link, the gain G2 and noise figure NF2 of the first signal receiving terminal, the gain G3 and noise figure NF3 of the cable + attenuator, and the noise figure NF4 of the microwave front end of the product under test; Constructing the mapping relationship between the receiver sensitivity deviation Err and G3 according to the following method: ， Wherein, the function .

7. The radio frequency resource dynamic allocation test system according to claim 6, wherein The method for constructing the correlation relationship between the receiver sensitivity deviation and the insertion loss value of the attenuator further includes: Obtaining the gain of the cable; According to the gain of the cable and the mapping relationship between Err and G3, calculating the mapping relationship between Err and the insertion loss value of the attenuator.

8. A test method for a radio frequency resource dynamic allocation test system according to any one of claims 1-7, characterized in that The test method includes: Connecting the product under test on the target test station to the first signal receiving terminal and the second optoelectronic link respectively; The industrial control computer obtains the insertion loss value of the attenuator corresponding to the target test station based on the tolerance of the measurement deviation for the test task and the correlation relationship between the measurement deviation and the insertion loss value of the attenuator. Adjust the insertion loss of the attenuator to the insertion loss value. Operate the resource control component to turn on the first optoelectronic link of the RF signal source required for the test task and the second optoelectronic link between the target test station and the spectrum analyzer. Operate the resource control component to perform power compensation on the turned-on first optoelectronic link and second optoelectronic link respectively. The spectrum analyzer analyzes the signal received from the second optoelectronic link.

9. The test method according to claim 8, characterized in that, The spectrum analyzer analyzes the signal received from the second optoelectronic link, including: The spectrum analyzer analyzes at least one of frequency, power, bandwidth, and modulation parameters of the signal received from the second optoelectronic link.

10. The testing method according to claim 8, characterized in that, The test method further includes: Obtain the report of the spectrum analyzer's analysis of the signal received from the second optoelectronic link.

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