A wide-field, wide-band tilt microscopy imaging defocus correction device and method

Abstract

The present invention discloses a wide-field-of-view, wide-band tilt microscopy imaging defocus correction device and method, comprising a light input module, a defocus correction module, a light output module and an image analysis and processing module; the defocus correction module comprises one or two off-axis parabolic mirrors; at least one of the light input module and the light output module is of a tilted imaging configuration, that is, the optical axis of the imaging light path is not perpendicular to the imaging object plane; the imaging defocus problem caused by tilted imaging is corrected by the defocus correction module; the image distortion introduced by the defocus correction module is corrected by the image analysis and processing module; ultimately, a wide-field-of-view, wide-band full-field-of-view and full-band clear and distortion-free imaging effect is achieved.

Description

Technical Field

[0001] The present invention relates to the field of optical imaging technology, and in particular to a wide-field-of-view, wide-band tilt microscopic imaging defocus correction device and method. Background Art

[0002] Optical imaging has become an indispensable technical means and tool in modern industry, life, science and technology. In conventional optical imaging, the imaging object plane is generally perpendicular to the optical axis of the imaging system. However, in some practical applications, such as surface plasmon resonance imaging, total internal reflection imaging, ellipsometry imaging, polarization-dependent imaging and other systems, the optical axis of the imaging system forms an oblique angle with the imaging object plane. At this time, due to the limited depth of field of the imaging lens, when performing wide-field imaging, the object plane will be out of focus, resulting in blurred imaging, and the magnification at different depths of field will be different, causing image distortion. This problem is particularly significant in wide-field microscopic imaging. Since the larger the objective lens magnification, the smaller the depth of field, it is difficult to achieve high-magnification microscopic imaging in an oblique imaging system.

[0003] Currently, it is impossible to achieve good imaging effects in tilted imaging systems using only ordinary imaging lenses. Some existing solutions generally design imaging lenses based on Scham's law to achieve tilted imaging, such as those described in publications CN201477280U, CN112269242A, CN115097605A, and JP201900741. However, this type of method has a complex lens structure design and requires a combination of multiple lenses to achieve relatively good imaging effects. The processing cost is extremely high, making it difficult to promote and use. In addition, most designs are not suitable for microscopic imaging, and the wider the imaging band, the greater the design difficulty.

[0004] Diffraction devices such as gratings can be used to correct the defocus problem of the object plane field of view in tilted imaging based on existing ordinary imaging lenses. However, due to the wavelength dependence of the characteristics of diffraction devices, this solution is only suitable for defocus correction of monochromatic light tilted imaging, and its application in wide-band imaging is limited. In addition, diffraction devices have low diffraction efficiency, which leads to reduced light utilization. Summary of the Invention

[0005] The present invention provides a wide-field-of-view, wide-band tilt microscopic imaging defocus correction device and method, which can achieve a clear and distortion-free imaging effect in the full field of view and full band of the wide field of view and wide band.

[0006] A wide-field, wide-band tilt microscopy imaging defocus correction device, comprising a light input module, a defocus correction module, a light output module, and an image analysis and processing module;

[0007] Among them, the light incident module adopts a common lighting module or an imaging lighting module; when the common lighting module is adopted, the incident imaging light path does not undergo defocus correction; when the imaging lighting module is adopted, the angle between the incident imaging light path and the normal of the imaging object is ,when or When , it is emmetropic imaging and no defocus correction is performed; when and When the imaging is tilted, a first off-axis parabolic mirror is arranged between the light incident module and the imaging object;

[0008] The light emission module includes a beam shaping imaging module and a detector. The angle between the emitted imaging light path and the normal of the imaging object is , and , for oblique imaging, a second off-axis parabolic mirror is set between the imaging object and the light exit module;

[0009] The off-axis angle of the first off-axis parabolic mirror is ,and , the placement direction satisfies that its meridian plane coincides with the light incident plane on the imaging object; the off-axis angle of the second off-axis parabolic mirror is ,and , the placement direction satisfies that its meridian plane coincides with the light exit plane on the imaging object;

[0010] The image analysis and processing module is connected to the detector and is used to correct the image distortion introduced by the output defocus correction module.

[0011] In the present invention, the application scope of the defocus correction module and the image analysis and processing module includes but is not limited to microscopic imaging systems, telescope imaging systems, etc.

[0012] When the light incident module adopts an ordinary lighting module, it includes a light source and a beam shaping module. The beam shaping module is used to adjust the size and shape of the light spot irradiated by the light source onto the imaging object, or the energy distribution and wavelength range of the light spot in the spatial domain, time domain, and frequency domain.

[0013] Light sources include, but are not limited to, self-luminescence of the imaging object, ambient lighting, active and passive lighting, coherent or incoherent light, for example, spontaneous fluorescence of the object, LED lighting, or laser lighting.

[0014] When the light incident module adopts an imaging lighting module, a beam imaging module is added on the basis of the ordinary lighting module, wherein the beam imaging module is used to pattern the amplitude or phase of the illumination light after passing through the beam shaping module and image it onto the imaging object.

[0015] In the light output module, the beam shaping imaging module is used to collect the output light on the imaging object, image the imaging object, magnify or reduce the image during the imaging process, or perform amplitude or phase modulation on the light in the spatial, temporal, and frequency domains on the imaging surface or in the imaging light path.

[0016] In the light emission module, the detector is a photoelectric conversion detector, which is used to receive and collect the outgoing light on the imaging object collected by the beam shaping imaging module.

[0017] The image analysis and processing module includes a distortion correction algorithm, the formula is as follows:

[0018] ;

[0019] Where, Represents the image data of the imaging object obtained directly by the detector or after data processing. The image data is a two-dimensional matrix that includes the image distortion introduced by the defocus correction module; is the total distortion correction matrix, and the formula is:

[0020] ;

[0021] Where, is the oblique projection distortion correction matrix, is the tangential stretch distortion correction matrix, and the formula is as follows:

[0022] ;

[0023] ;

[0024] Where, The defocus correction module deflects the optical axis of the light incident module or the light exit module by an angle. Ideally, the angle is equal to the off-axis angles of the first and second off-axis parabolic mirrors in the light incident and exit directions, respectively. The specific value of the deviation from the ideal condition due to system error is obtained through system calibration. It refers to the dihedral angle formed when the meridian plane of the off-axis parabolic mirror does not completely coincide with the light incident surface or exit surface of the imaging object due to system error. Its specific value is obtained through system calibration.

[0025] When the defocus correction module is debugged to the ideal state, ,at this time After the actual imaging system is built and debugged, there are still errors, which can be calibrated using standard patterns to obtain and The actual value of .

[0026] When using the imaging lighting module, the incident light path in the module is aligned with the imaging object surface. A conjugate relay imaging plane The distance between it and the center of the parabola intercepted by the first off-axis parabola mirror is the image distance , and Satisfying the object-image relationship: ;in, is the focal length of the first off-axis parabolic mirror; Represents the object distance, which is the distance between the center of the field of view on the imaging object and the center of the parabola intercepted by the first off-axis parabola; the imaging magnification introduced by the first off-axis parabola is .

[0027] In the light emitting module, the light path is formed and the imaging object surface A conjugate relay imaging plane The distance between it and the center of the parabola intercepted by the second off-axis parabola mirror is the image distance , and Satisfying the object-image relationship: ;in, is the focal length of the second off-axis parabolic mirror; Represents the object distance, which is the distance between the center of the field of view on the imaging object and the center of the parabola intercepted by the second off-axis parabolic mirror; the imaging magnification introduced by the second off-axis parabolic mirror is .

[0028] A wide-field-of-view, wide-band tilt microscopy defocus correction method, based on the wide-field-of-view, wide-band tilt microscopy defocus correction device, comprises:

[0029] Among the light input module and the light output module, at least the light output module is of an inclined imaging configuration, that is, the optical axis of the imaging light path is not perpendicular to the imaging object plane;

[0030] The imaging defocus problem caused by tilted imaging is corrected by the defocus correction module; the image distortion introduced by the defocus correction module is corrected by the image analysis and processing module; ultimately, a clear and distortion-free imaging effect with a wide field of view, wide band, and full field of view and full band is achieved.

[0031] Compared with the prior art, the present invention has the following beneficial effects:

[0032] 1. The present invention can correct tilt defocus for any tilt imaging angle by designing the off-axis angle of the corresponding off-axis parabolic mirror. The method is simple and very flexible.

[0033] 2. The defocus correction module of the present invention adopts a reflective imaging design, and there is no need to consider the imaging chromatic aberration problem in the structural design, which is very friendly to wide-band imaging.

[0034] 3. This invention achieves clear wide-field imaging by incorporating a defocus correction module into the hardware architecture. This, combined with an algorithmic image analysis and processing module, achieves image dedistortion. The synergistic effect of these hardware improvements and data processing methods significantly reduces the difficulty and cost of solving the defocus problem in wide-field, wide-band oblique imaging. Furthermore, this solution is compatible with existing imaging modules. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 Schematic diagram of the conventional oblique imaging optical path.

[0036] Figure 2 Schematic diagram of the imaging effect using the existing conventional tilt imaging light path.

[0037] Figure 3 This is a schematic diagram of the overall structure of a wide-field, wide-band tilt microscopy defocus correction device according to an embodiment of the present invention.

[0038] Figure 4 Schematic diagram of an optical path in which defocus correction modules are provided for both the incident and outgoing imaging optical paths in an embodiment of the present invention.

[0039] Figure 5 Schematic diagram of the meaning of main parameters of the off-axis parabolic mirror in an embodiment of the present invention.

[0040] Figure 6 Flowchart of the distortion correction algorithm of the image analysis and processing module in an embodiment of the present invention.

[0041] Figure 7 This is a schematic diagram of an optical path in which a defocus correction module is provided only in the outgoing imaging optical path in an embodiment of the present invention.

[0042] Figure 8 is the output image collected by the detector in the embodiment of the present invention.

[0043] Figure 9 Schematic diagram of the effect of distortion correction of the output image after the image analysis and processing module is performed in an embodiment of the present invention. DETAILED DESCRIPTION

[0044] The present invention will be described in further detail below with reference to the accompanying drawings and examples. It should be noted that the following examples are intended to facilitate understanding of the present invention and do not have any limiting effect on the present invention.

[0045] like Figure 1The figure shows a conventional oblique imaging optical path. Light input module 100 is a common illumination module, free of imaging defocus issues, with an incident angle of 25°. It includes light source 101 and a beam shaping module consisting of lenses 102, 103, and 104. Light source 101 is a white LED lamp. Both lenses 102 and 103 are achromatic lenses, used to expand and collimate the output light of light source 101. Lens 103 is also an achromatic lens, used to focus the collimated light beam onto the imaging object.

[0046] The light output module 200 uses an inclined imaging optical path, which may result in defocusing and has an output angle of 25°. It includes a beam shaping imaging module consisting of a microscope objective 201 and a tube lens 202, as well as a detector 203. Both microscope objective 201 and tube lens 202 are achromatic, collecting the emitted light from the imaging object and forming an image of the object with a magnification of 10x. Detector 203 is a grayscale area array CMOS (complementary metal oxide semiconductor) detector for image acquisition.

[0047] The imaging effect of the conventional tilt imaging optical path is as follows: Figure 2 As shown in the figure, when the imaging tilt angle is 25°, within the wide field of view, only the middle area of ​​the image can be clearly imaged, while the left and right areas of the image are blurred due to the defocus problem of tilted imaging, and the spatial resolution is deteriorated.

[0048] like Figure 3 As shown in the embodiment of the present invention, a wide-field, wide-band tilt microscopy imaging defocus correction device mainly includes a light incident module 100, a light output module 200, a defocus correction module 300 and an image analysis and processing module 400. The defocus correction module 300 is provided with two or one off-axis parabolic mirrors according to actual needs, specifically as shown in FIG. Figure 4 and Figure 7 shown.

[0049] like Figure 4 As shown, the defocus correction module 300 is provided with two off-axis parabolic mirrors. The light incident module 100 adopts an imaging illumination module, including a light source 101 and a beam shaping imaging module composed of a beam shaping module and a beam imaging module. The angle between the incident imaging light path and the normal of the imaging object is , and For tilted imaging, a first off-axis parabolic mirror 301 and a reflecting mirror 303 are provided between the light incident module 100 and the imaging object.

[0050] The light source 101 in the light incident module 100 includes, but is not limited to, self-luminescence of the imaging object, ambient lighting, active and passive lighting, coherent or incoherent light, for example, spontaneous fluorescence of the object, LED lighting, or laser lighting.

[0051] The beam shaping and imaging module, comprised of a beam shaping module and a beam imaging module, includes but is not limited to lenses, lens assemblies, reflectors, optical modulators, filters, polarizers, beam splitters, and the like. Its functions include but are not limited to adjusting the size or shape of the light spot irradiated by the light source onto the imaging object, adjusting the energy distribution and wavelength range of the light spot in the spatial, temporal, and frequency domains, or patterning the amplitude or phase of the illumination light and imaging it onto the imaging object. For example, a lens assembly may be used to expand or contract the light spot of the light source; a digital micromirror device (DMD) may be used to modulate the spatial amplitude of light and an imaging lens may be used to image the modulated spatial image onto the imaging object; a spatial light modulator (SLM) may be used to modulate the spatial phase of light and an imaging lens may be used to image the modulated spatial image onto the imaging object.

[0052] The light emission module 200 includes a beam shaping imaging module and a detector 203. The angle between the emitted imaging light path and the normal of the imaging object is , and For tilted imaging, a second axis parabolic mirror 302 and a reflecting mirror 304 are provided between the imaging object and the light exit module.

[0053] The beam shaping and imaging module in the light output module 200 includes, but is not limited to, lenses, lens assemblies, reflectors, optical modulators, filters, polarizers, beam splitters, and the like. Its primary function is to collect the emitted light from the imaging object, image the object, and perform various functions during the imaging process, including, but not limited to, image magnification or reduction, and light amplitude or phase modulation in the spatial, temporal, and frequency domains of the imaging plane or imaging optical path. For example, a 50x microscope objective lens and a tube lens can magnify the object by 50x, a digital micromirror device (DMD) containing an optical modulator can modulate the spatial light amplitude on the image plane, and an imaging lens can image the modulated spatial image onto a detector.

[0054] Detector 203 is a photoelectric conversion detector, including but not limited to single-point, linear, and area array cameras, used to receive and collect the light emitted from the imaging object collected by the beam shaping imaging module. For example, the detector can be an area array black-and-white complementary metal oxide semiconductor (CMOS), an area array color CMOS, an area array black-and-white charge-coupled device (CCD), a single-point photomultiplier tube (PMT), etc.

[0055] like Figure 4 and Figure 5As shown, the first off-axis parabolic mirror 301 is used for defocus correction of the incident tilt imaging light path, and the focal length is ; The off-axis angle of the first off-axis parabolic mirror 301 is ,and The placement direction satisfies that its meridian plane coincides with the light incident plane on the imaging object. The distance between the center of the field of view on the imaging object and the center of the parabola intercepted by the first off-axis parabola mirror 301 is the object distance .

[0056] The second off-axis parabolic mirror 302 is used for defocus correction of the outgoing tilt imaging light path, and its focal length is ; The off-axis angle of the second off-axis parabolic mirror 302 is ,and The placement direction satisfies that its meridian plane coincides with the light exit surface on the imaging object. The distance between the center of the field of view on the imaging object and the center of the parabola intercepted by the second off-axis parabola mirror 302 is the object distance .

[0057] In the light incident module, the incident light path is formed and the imaging object surface A conjugate relay imaging plane The distance between it and the center of the parabola intercepted by the first off-axis parabola mirror 301 is the image distance , and Satisfying the object-image relationship: ; In the incident direction of light, the imaging magnification introduced by the first off-axis parabolic mirror is .

[0058] In the light emitting module, the light path is formed and the imaging object surface A conjugate relay imaging plane The distance between it and the center of the parabola intercepted by the second off-axis parabola mirror 302 is the image distance , and Satisfying the object-image relationship: ; Light emission direction, imaging magnification introduced by the second off-axis parabolic mirror .

[0059] like Figure 6 As shown in the figure, the distortion correction algorithm process of the image analysis and processing module is as follows:

[0060] The input of the image analysis and processing module is the image data of the imaging object collected by the detector, which is a two-dimensional matrix, denoted as , which includes the image distortion introduced by the defocus correction module. Optionally, is the direct output result of the detector, or the two-dimensional image data obtained after the output of the detector is processed. The output of the image analysis and processing module is , is the distortion-free two-dimensional image of the imaging object. The dedistortion processing method is: .

[0061] Among them, the total distortion correction matrix .in, The defocus correction module is used to correct the deflection angle of the optical axis of the incident light path imaging module or the outgoing light path imaging module. The image tilt projection distortion caused by The tangential stretching distortion caused by the non-coplanarity between the meridian plane of the off-axis parabolic mirror and the light incident or exit surface of the imaging object is corrected. The dihedral angle between the meridian plane of the off-axis parabolic mirror and the light incident or exit surface of the imaging object is defined as , then the oblique projection distortion correction matrix and the tangential stretch distortion correction matrix They are:

[0062] ;

[0063] ;

[0064] When the defocus correction module is debugged to the ideal state, ,at this time After the actual imaging system is built and debugged, there are still errors, which can be calibrated using standard patterns to obtain and The actual value of .

[0065] like Figure 7 As shown, in another embodiment of the present invention, the defocus correction module 300 is provided with only one off-axis parabolic mirror. Specifically, a second off-axis parabolic mirror 302 and a reflector 304 are provided between the imaging object and the light exit module. The light input module 100 is a conventional lighting module, free of imaging defocus issues, with an incident angle of 45°. It includes a light source 101 and a beam shaping module consisting of a lens 102, a lens 103, a reflector 105, a reflector 106, and a lens 107.

[0066] Among them, light source 101 is a white light LED lamp; lens 102 and lens 103 are both achromatic lenses, which are used to expand and collimate the output light of light source 101; reflector 105 and reflector 106 are plane reflectors, which are used to change the propagation direction of the light beam; lens 107 is an achromatic lens, which is used to focus the collimated light beam onto the imaging object.

[0067] The outgoing light path is an inclined imaging light path, which has the problem of imaging defocus, and the outgoing angle is 45°.

[0068] The light output module 200 includes a beam shaping imaging module composed of a microscope objective lens 201 and a tube lens 202, and a detector 203. The microscope objective lens 201 and the tube lens 202 both have achromatic functions, which are used to collect the output light on the imaging object and to transmit the light to the relay image plane. Imaging is performed with an imaging magnification of 10 times; the detector 203 is a grayscale array CMOS (complementary metal oxide semiconductor) detector for collecting images.

[0069] In the outgoing light path, a second off-axis parabolic mirror 302 and a reflector 304 are added in front of the light output module 200 to deflect the optical axis of the outgoing light path on the imaging object by 45°, so that the optical axis of the incident light of the light output module 200 is perpendicular to the imaging object surface A, thereby correcting the defocus problem caused by tilted imaging.

[0070] The off-axis angle of the second off-axis parabolic mirror 302 is 45°, which is used to deflect the optical axis of the outgoing light path on the imaging object by 45° and image the imaging object onto the relay image plane. ; The imaging magnification is 1 times; the reflector 304 is a plane reflector used to change the propagation direction of the light beam.

[0071] The detector 203 collects and outputs images such as Figure 8 As shown, when the imaging tilt angle is 45°, after using the defocus correction module 300, all image areas are clear within the wide field of view, indicating that the field of view defocus problem caused by tilted imaging is corrected; however, the second off-axis parabolic mirror 302 in the defocus correction module 300 introduces image distortion.

[0072] The image output is collected and the distortion is corrected by the image analysis and processing module. Figure 9 As shown. The deformed square pattern is corrected by the distortion matrix was restored after treatment.

[0073] Ultimately, a wide field of view, wide band full field of view and clear, distortion-free imaging effects in the full band are achieved.

[0074] The embodiments described above provide a detailed description of the technical solutions and beneficial effects of the present invention. It should be understood that the above are only specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, supplements and equivalent substitutions made within the scope of the principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A wide-field, wide-band tilt microscopy defocus correction device, characterized in that: It includes a light incident module, a defocus correction module, a light output module and an image analysis and processing module; the defocus correction module includes one or two off-axis parabolic mirrors; Among them, the light incident module adopts a common lighting module or an imaging lighting module; when the common lighting module is adopted, the incident imaging light path does not undergo defocus correction; when the imaging lighting module is adopted, the angle between the incident imaging light path and the normal of the imaging object is ,when or When , it is emmetropia imaging and no defocus correction is performed; when and When the imaging is tilted, a first off-axis parabolic mirror is arranged between the light incident module and the imaging object; The light emission module includes a beam shaping imaging module and a detector. The angle between the emitted imaging light path and the normal of the imaging object is , and , for oblique imaging, a second off-axis parabolic mirror is set between the imaging object and the light exit module; The off-axis angle of the first off-axis parabolic mirror is ,and , the placement direction satisfies that its meridian plane coincides with the light incident plane on the imaging object; the off-axis angle of the second off-axis parabolic mirror is ,and , the placement direction satisfies that its meridian plane coincides with the light exit plane on the imaging object; The image analysis and processing module is connected to the detector and is used to correct the image distortion introduced by the defocus correction module. The image analysis and processing module includes a distortion correction algorithm, and the formula is as follows: ； Where, Represents the image data of the imaging object obtained directly by the detector or after data processing. The image data is a two-dimensional matrix that includes the image distortion introduced by the defocus correction module; is the total distortion correction matrix, and the formula is: ； Where, is the oblique projection distortion correction matrix, is the tangential stretch distortion correction matrix, and the formula is as follows: ； ； Where, The angle at which the optical axis of the light incident module or the light output module is deflected by the defocus correction module; It refers to the dihedral angle formed when the meridian plane of the off-axis parabolic mirror does not completely coincide with the light incident plane or light exit plane of the imaging object due to systematic errors.

2. The wide-field, wide-band tilt microscopy defocus correction device according to claim 1, characterized in that: When the light incident module adopts an ordinary lighting module, it includes a light source and a beam shaping module. The beam shaping module is used to adjust the size and shape of the light spot irradiated by the light source onto the imaging object, or the energy distribution and wavelength range of the light spot in the spatial domain, time domain, and frequency domain.

3. The wide-field, wide-band tilt microscopy defocus correction device according to claim 2, characterized in that: When the light incident module adopts an imaging lighting module, a beam imaging module is added on the basis of the ordinary lighting module, wherein the beam imaging module is used to pattern the amplitude or phase of the illumination light after passing through the beam shaping module and image it onto the imaging object.

4. The wide-field, wide-band tilt microscopy defocus correction device according to claim 1, characterized in that: In the light output module, the beam shaping imaging module is used to collect the output light on the imaging object, image the imaging object, magnify or reduce the image during the imaging process, or perform amplitude or phase modulation on the light in the spatial, temporal, and frequency domains on the imaging surface or in the imaging light path.

5. The wide-field, wide-band tilt microscopy defocus correction device according to claim 1, characterized in that: In the light emission module, the detector is a photoelectric conversion detector, which is used to receive and collect the outgoing light on the imaging object collected by the beam shaping imaging module.

6. The wide-field, wide-band tilt microscopy defocus correction device according to claim 1, characterized in that: When using the imaging lighting module, the incident light path in the module is aligned with the imaging object surface. A conjugate relay imaging plane The distance between it and the center of the parabola intercepted by the first off-axis parabola mirror is the image distance , and Satisfying the object-image relationship: ;in, is the focal length of the first off-axis parabolic mirror; Represents the object distance, which is the distance between the center of the field of view on the imaging object and the center of the parabola intercepted by the first off-axis parabola; the imaging magnification introduced by the first off-axis parabola is .

7. The wide-field, wide-band tilt microscopy defocus correction device according to claim 1, characterized in that: In the light emitting module, the light path is formed and the imaging object surface A conjugate relay imaging plane The distance between it and the center of the parabola intercepted by the second off-axis parabola mirror is the image distance , and Satisfying the object-image relationship: ;in, is the focal length of the second off-axis parabolic mirror; Represents the object distance, which is the distance between the center of the field of view on the imaging object and the center of the parabola intercepted by the second off-axis parabolic mirror; the imaging magnification introduced by the second off-axis parabolic mirror is .

8. A method for defocus correction of wide-field, wide-band tilt microscopy imaging, characterized in that: The wide-field, wide-band tilt microscopy defocus correction device according to any one of claims 1 to 7 comprises: Among the light input module and the light output module, at least the light output module is of an inclined imaging configuration, that is, the optical axis of the imaging light path is not perpendicular to the imaging object plane; The imaging defocus problem caused by tilted imaging is corrected by the defocus correction module; the image distortion introduced by the defocus correction module is corrected by the image analysis and processing module; ultimately, a clear and distortion-free imaging effect with a wide field of view, wide band, and full field of view and full band is achieved.

Images