A simulation test method, device, system and storage medium for integrated circuit

Abstract

The present invention provides a simulation test method and device, system, and storage medium for an integrated circuit. The method includes obtaining a test parameter table for the integrated circuit, generating an experimental design table based on the test parameter table, wherein the experimental design table includes a plurality of test experiments, and each group of test experiments specifies the values ​​of all test parameters; obtaining a netlist template for the integrated circuit, wherein the netlist template includes variable parameters, and the variable parameters correspond one-to-one with the test parameters; assigning values ​​to corresponding variable parameters in the netlist template based on the values ​​of all test parameters in each group of test experiments, thereby obtaining a netlist corresponding to the test experiment; and obtaining a simulation result of the integrated circuit under the netlist, which is recorded as the simulation result of the test experiment. The present invention can automatically generate a test experiment and a corresponding netlist based on the test parameter table and the netlist template, and automatically collect the simulation results after the simulation is completed, thereby improving the automation level of the test process and the efficiency of simulation testing of the integrated circuit.

Description

Technical Field

[0001] The present invention relates to the technical field of EDA software, and in particular to a simulation test method and device, system, and storage medium for integrated circuits. Background Art

[0002] SPICE (Simulation Program with Integrated Circuit Emphasis) is a general-purpose software tool for simulating and analyzing the behavior of electronic circuits. It is widely used in circuit design, verification, and optimization.

[0003] Currently, there are the following problems when performing SPICE simulation on integrated circuits:

[0004] The values ​​of the parameters to be tested in the SPICE netlist need to be manually modified for each test to generate the corresponding netlist file. For example, 100 experiments require 100 modifications. Simulation results (such as the eye height and width of the eye diagram) must be manually filtered from the SPICE output file or calculated using relevant software. The results are then manually entered into a table. This process is prone to missing key data or input errors. The entire process requires a lot of manual work and has a low degree of automation. Non-professionals or those unfamiliar with the operating procedures are prone to errors. Summary of the Invention

[0005] One of the purposes of the present invention is to provide a simulation test method and device, system, and storage medium for an integrated circuit in order to address at least some of the problems existing in the prior art.

[0006] The technical solutions provided by the present invention are as follows:

[0007] A simulation test method for an integrated circuit, comprising:

[0008] Obtaining a test parameter table of the integrated circuit, the test parameter table including all test parameters and their values ​​used for simulation testing;

[0009] Generate an experimental design table for the integrated circuit according to the test parameter table. The experimental design table includes a number of test experiments. Each group of test experiments specifies the values ​​of all test parameters.

[0010] Obtaining a netlist template of an integrated circuit, the netlist template including variable parameters, the variable parameters corresponding one-to-one to the test parameters;

[0011] Assigning values ​​to the variable parameters of the netlist template according to the values ​​of all test parameters in each group of test experiments to obtain a netlist corresponding to the test experiments;

[0012] The simulation results of the integrated circuit under the netlist are obtained and recorded as the simulation results of the test experiment.

[0013] In some embodiments, a test report of the integrated circuit is generated based on all test experiments and simulation results thereof.

[0014] The present invention also provides a simulation test method for an integrated circuit, comprising:

[0015] Obtaining a test parameter table of the integrated circuit, the test parameter table including a plurality of primary parameters and their attributes, secondary parameters contained in the primary parameters, and secondary parameters corresponding to the attributes of the primary parameters for obtaining values ​​for simulation testing;

[0016] Generate an experimental design table for the integrated circuit according to the primary parameters and their properties in the test parameter table, wherein the experimental design table includes a plurality of test experiments, and each group of test experiments specifies the properties of all the primary parameters;

[0017] Obtaining a netlist template of an integrated circuit, the netlist template including variable parameters, the variable parameters corresponding one-to-one to the secondary parameters;

[0018] Determine the values ​​of all secondary parameters corresponding to each test experiment based on the attributes of all primary parameters in each test experiment;

[0019] Assign values ​​to the variable parameters of the netlist template according to the values ​​of all secondary parameters corresponding to the test experiment to obtain a netlist corresponding to the test experiment;

[0020] The simulation results of the integrated circuit under the netlist are obtained and recorded as the simulation results of the test experiment.

[0021] In some embodiments, a test report of the integrated circuit is generated based on all test experiments and simulation results thereof.

[0022] In some embodiments, obtaining a test parameter table of an integrated circuit includes:

[0023] Obtain primary parameters and their attributes, secondary parameters and their values ​​through the graphical interactive interface.

[0024] In some embodiments, generating an experimental design table for an integrated circuit based on the primary parameters and their attributes in the test parameter table includes:

[0025] The first-level parameters are used as factors in the experimental design. According to the possible values ​​of the factors, the randomly generated combinations of all factor values ​​are used as a set of test experiments.

[0026] In some embodiments, determining the values ​​of all secondary parameters corresponding to each test experiment based on the attributes of all primary parameters in each test experiment includes:

[0027] Get the properties of the first-level parameters of the test experiment;

[0028] According to the test parameter table, determine the value of the secondary parameter associated with the attribute of the primary parameter;

[0029] Assign values ​​to the variable parameters of the netlist template according to the values ​​of all secondary parameters corresponding to the test experiment, including:

[0030] Finding the variable parameters of the netlist template by identifying a specific symbol used to mark the variable parameters in the netlist template;

[0031] Obtaining the value of the secondary parameter corresponding to the variable parameter from the values ​​of all secondary parameters corresponding to the test experiment;

[0032] Assign the variable parameter with the value of the secondary parameter corresponding to the variable parameter.

[0033] The present invention also provides a simulation test device for an integrated circuit, comprising: a memory for storing a computer program;

[0034] A processor is configured to implement any of the aforementioned integrated circuit simulation testing methods when running the computer program.

[0035] The present invention further provides a simulation test system for an integrated circuit, comprising the simulation test device for an integrated circuit described in the foregoing embodiment.

[0036] The present invention also provides a computer storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of any of the above-mentioned integrated circuit simulation test methods.

[0037] The integrated circuit simulation test method, device, system, and storage medium provided by the present invention can at least bring the following beneficial effects:

[0038] 1. The present invention automatically designs a test experiment according to a test parameter table, and then automatically generates a netlist corresponding to the test experiment in combination with a netlist template. After the simulation is completed, the simulation results are automatically collected, thereby improving the automation level of the test process and thus improving the simulation test efficiency of the integrated circuit.

[0039] 2. The present invention categorizes the parameters to be tested in the integrated circuit, uses the corresponding categories as primary parameters, and then uses the primary parameters as factors of the test experiment, thereby simplifying the design of the test experiment, reasonably reducing the number of test experiments, thereby reducing the number of simulations, and improving the efficiency of simulation testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] The preferred implementation scheme will be described below in a clear and understandable manner with reference to the accompanying drawings, further illustrating the above-mentioned characteristics, technical features, advantages and implementation methods of a simulation test method and device, system, and storage medium for an integrated circuit.

[0041] Figure 1 is a flow chart of an embodiment of a simulation test method for an integrated circuit of the present invention;

[0042] Figure 2 is a flow chart of another embodiment of the integrated circuit simulation test method of the present invention;

[0043] Figure 3 It is a structural diagram of an embodiment of a simulation test device for integrated circuits of the present invention;

[0044] Figure 4 It is a structural diagram of an embodiment of a simulation test system for integrated circuits of the present invention;

[0045] Figure 5 This is an example of a parameter definition table of another embodiment of the integrated circuit simulation test method of the present invention. DETAILED DESCRIPTION

[0046] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the specific embodiments of the present invention will be described below with reference to the accompanying drawings. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings and other embodiments can be obtained based on these drawings without inventive work.

[0047] To simplify the drawings, only the parts relevant to the present invention are schematically depicted in each figure. These parts do not represent the actual structure of the product. Furthermore, to simplify the drawings and facilitate understanding, in some figures, only one component with the same structure or function is schematically depicted or labeled. As used herein, "one" not only means "only one" but also "more than one."

[0048] One embodiment of the present invention, as Figure 1 As shown, a simulation test method for an integrated circuit includes:

[0049] Step S100 obtains a test parameter table of the integrated circuit, where the test parameter table includes all test parameters and their values ​​used for simulation testing.

[0050] Step S200 generates an experimental design table for the integrated circuit according to the test parameters and their values ​​in the test parameter table. The experimental design table includes a number of test experiments, and each group of test experiments specifies the values ​​of all test parameters.

[0051] Step S300 obtains a netlist template of the integrated circuit, where the netlist template contains variable parameters, and the variable parameters correspond one-to-one to the test parameters.

[0052] Step S400 assigns values ​​to corresponding variable parameters in the netlist template according to the values ​​of all test parameters in each group of test experiments, so as to obtain a netlist corresponding to the test experiments.

[0053] Step S500 obtains the simulation result of the integrated circuit under the netlist, which is recorded as the simulation result of the test experiment.

[0054] Step S600 generates a test report for the integrated circuit based on all test experiments and simulation results.

[0055] Specifically, to perform a simulation test on an integrated circuit, the test parameters and their values ​​that need to be used in the simulation test must first be determined. For example, the resistance of a resistor has a significant impact on the function of the integrated circuit, so the resistance of the resistor is used as a test parameter. Since we only need to observe the impact of its maximum and minimum values ​​on the integrated circuit, we can only take two values ​​(maximum and minimum).

[0056] Engineers can determine test parameters and their values ​​based on test requirements or test objectives. There may be multiple test parameters and multiple values. For example, some test parameters require testing of both maximum and minimum values, while others require testing of maximum, minimum, and typical values.

[0057] All test parameters and their values ​​constitute a test parameter table. The test parameter table of an integrated circuit can be obtained in a variety of ways, such as by inputting a format file to obtain the test parameter table, or by inputting all test parameters and their values ​​through a graphical interactive interface.

[0058] Experiments are designed based on test parameters and their values. Test parameters serve as factors in the experimental design. A combination of all factor values ​​at once constitutes a test experiment. Several designed test experiments form an experimental design table. For example, a test parameter table includes four test parameters, each with three values ​​(maximum, minimum, and typical). Given an experimental design with four factors and three values ​​for each factor, using a full factorial experiment yields 81 (3*3*3*3) combinations, each corresponding to a set of test experiments. These 81 sets of test experiments constitute the experimental design table. In practice, there are often many test parameters, and using a full factorial experiment yields too many combinations. To solve this problem, you can first determine the number of runs and then select appropriate combinations based on the number of runs. Alternatively, you can use other methods to combine factors. For example, randomly generate a set of all factor values ​​at once as a set of test experiments. Repeat this process until you obtain a set of test experiments that meets the required number of runs.

[0059] A netlist template is a template file that defines the properties and connections of components in a netlist using parameters. Some of these parameters are variable. By modifying the values ​​of these parameters, you can quickly generate different circuit configurations without having to manually modify every detail in the netlist. Variable parameters in a netlist template can be marked with specific symbols.

[0060] Obtain a netlist template for the integrated circuit. The variable parameters of this netlist template correspond one-to-one with the test parameters. Obtain the value of each test parameter based on the test experiment and use this value to assign the corresponding variable parameter in the netlist template. Once all the variable parameters in the netlist template have been assigned, a netlist corresponding to the test experiment is obtained. Repeat the above process for all test experiments in the experimental design table to obtain netlists for all test experiments.

[0061] By simulating the integrated circuit according to the netlists of all test experiments, the simulation results of each test experiment can be obtained. In one embodiment, the simulation results are the eye height and / or eye width of the eye diagram.

[0062] Combining all test experiments and their simulation results together can produce a test report for the integrated circuit.

[0063] In this embodiment, a test experiment is automatically designed according to a test parameter table, and a netlist corresponding to the test experiment is automatically generated in combination with a netlist template. After the simulation is completed, the simulation results are automatically collected, thereby improving the automation level of the test process and thus improving the simulation test efficiency of the integrated circuit.

[0064] One embodiment of the present invention, as Figure 2 As shown, a simulation test method for an integrated circuit includes:

[0065] Step S110 obtains a test parameter table of the integrated circuit, the test parameter table includes several primary parameters and their attributes, the secondary parameters included in the primary parameters and the secondary parameters corresponding to the attributes of the primary parameters are used for taking values ​​of the simulation test.

[0066] Step S210 generates an experiment design table according to the primary parameters and their attributes in the test parameter table. The experiment design table includes a number of test experiments, and each group of test experiments specifies the attributes of all primary parameters.

[0067] Step S310 obtains a netlist template of the integrated circuit, where the netlist template includes variable parameters, and the variable parameters correspond one-to-one to the secondary parameters.

[0068] Step S410 determines the values ​​of all secondary parameters corresponding to the test experiment according to the attributes of all primary parameters in each group of test experiments.

[0069] Step S420 assigns values ​​to corresponding variable parameters in the netlist template according to the values ​​of the secondary parameters corresponding to the test experiment, thereby obtaining a netlist corresponding to the test experiment.

[0070] Step S510 obtains the simulation result of the integrated circuit under the netlist, which is recorded as the simulation result of the test experiment.

[0071] Step S610 generates a test report for the integrated circuit based on all test experiments and simulation results.

[0072] The basic steps of this embodiment are the same as those of the above embodiment, so the differences are mainly described here, and the same parts can be found in the description of the above embodiment.

[0073] Given that in actual situations, there are many parameters to be tested (i.e., test parameters) for integrated circuits, the number of test experiments constructed based on the parameters to be tested will also be very large. In order to effectively reduce the number of test experiments, we classify the parameters to be tested, treat the parameters to be tested as secondary parameters, and the class to which the secondary parameters belong as primary parameters. The secondary parameters contained in the primary parameters are specific objects under the same class, and attributes are defined in the class. For each attribute, the specific object has a specific value.

[0074] For example, a device has two parameters to be tested: length and width, as shown in Table 1. The device size to be tested is 10 5, 12 8. Which of the two situations is better? As can be seen from the test scenario, there is a correlation between length and width. When length is at its minimum value, width also takes its minimum value; when length is at its maximum value, width also takes its maximum value, indicating that the two parameters have consistent value behavior in the test scenario. Therefore, length and width can be treated as secondary parameters and attributed to the primary parameter size, with size having two attributes (minimum value and maximum value). In the design of test experiments, it is entirely possible to design based on the attributes of the primary parameter. For example, in the above example, the test experiments can be designed based on the attributes of the primary parameter size. One is for the case where size takes its minimum value, and the other is for the case where size takes its maximum value.

[0075] Table 1

[0076]

[0077] A primary parameter may have only one secondary parameter or multiple secondary parameters. Using primary parameters as factors in designing test experiments can reduce the number of test experiment factors compared to using secondary parameters as factors in test experiments. This reduces the complexity of designing test experiments and the number of test experiments, which is equivalent to reducing the number of simulation tests.

[0078] When multiple parameters to be tested in an integrated circuit have consistent values ​​when constructing a test scenario, these parameters can be grouped into the same category, with the category serving as the corresponding first-level parameter. Alternatively, a parameter to be tested can be grouped into a separate category, meaning that the corresponding first-level parameter has only one second-level parameter.

[0079] Since the test experiment is constructed based on primary parameters, and the variable parameters in the netlist template correspond one-to-one with the secondary parameters, when generating the netlist corresponding to the test experiment, it is necessary to first determine the values ​​of the corresponding secondary parameters based on the properties of the primary parameters in the test experiment, and then use the values ​​of the secondary parameters to assign values ​​to the corresponding variable parameters in the netlist template. When all the variable parameters in the netlist template are assigned values, the netlist corresponding to the test experiment is obtained.

[0080] For example, the attribute of the first-level parameter size of Test Experiment 1 is the minimum value. Therefore, the value of the second-level parameter length of Test Experiment 1 is determined to be 10, and the value of width is determined to be 5. Assume that the netlist template uses %parameter name% to represent variable parameters. The netlist template has two variable parameters, %length% and %width%. The values ​​of the second-level parameters of Test Experiment 1 are used to assign values ​​to the variable parameters of the netlist template, that is, assign 10 to %length% and 5 to %width%. The resulting netlist is the netlist corresponding to Test Experiment 1.

[0081] Using the above method, we can generate netlists corresponding to all test experiments. These netlists are then fed into an integrated circuit simulation tool, such as SPICE, for simulation to obtain simulation results for the test experiments. By integrating all the test experiments and their simulation results, we can generate an integrated circuit test report.

[0082] In this embodiment, by classifying the parameters to be tested in the integrated circuit, using the corresponding classes as primary parameters, and then using the primary parameters as factors of the test experiment, the design of the test experiment can be simplified, the number of test experiments can be reasonably reduced, thereby reducing the number of simulations and improving the efficiency of simulation testing.

[0083] In one embodiment, step S110 of obtaining the test parameter table of the integrated circuit includes: obtaining primary parameters and their attributes, secondary parameters and their values ​​through a graphical interactive interface.

[0084] In one embodiment, determining the value of the secondary parameter corresponding to the test experiment according to the attribute of the primary parameter of the test experiment in step S410 includes:

[0085] Obtain the properties of the primary parameters of the test experiment; and determine the values ​​of the secondary parameters associated with the properties of the primary parameters according to the test parameter table.

[0086] In step S420, the variable parameters of the netlist template are assigned values ​​according to the values ​​of the secondary parameters corresponding to the test experiment, including:

[0087] Step S421 finds the variable parameters of the netlist template by identifying the specific symbols used to mark the variable parameters in the netlist template;

[0088] Step S422: obtaining the value of the secondary parameter corresponding to the variable parameter from the values ​​of all secondary parameters corresponding to the test experiment;

[0089] Step S423 uses the value to assign a variable parameter.

[0090] One embodiment of the present invention, as Figure 3 As shown, a simulation test device 100 for an integrated circuit includes:

[0091] a memory 110 for storing a computer program 120;

[0092] The processor 130 is configured to implement the integrated circuit simulation test method described in any one of the aforementioned embodiments when running the computer program 120 .

[0093] The memory 110 may be any internal storage unit and / or external storage device capable of storing data and programs, for example, a plug-in hard disk, a smart memory card (SMC), a secure digital (SD) card, or a flash memory card.

[0094] As needed, the processor 130 can be a central processing unit (CPU), a graphics processing unit (GPU), a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA), a general-purpose processor or other logic devices, etc.

[0095] One embodiment of the present invention, as Figure 4 As shown, a simulation test system for an integrated circuit includes: the simulation test device 100 for the integrated circuit and the integrated circuit simulation tool 200 described in the above embodiments.

[0096] The integrated circuit simulation tool may be a general-purpose simulation tool, such as SPICE or a device similar to SPICE.

[0097] The simulation test apparatus 100 designs a test experiment based on the parameters of the integrated circuit to be tested, generates a netlist corresponding to the test experiment, inputs the netlist into the integrated circuit simulation tool 200 for simulation, and extracts the simulation results of the test experiment from the output of the simulation tool 200.

[0098] In some embodiments, the simulation test device 100 further generates a test report for the integrated circuit based on all test experiments and their simulation results.

[0099] The present invention also provides a specific application embodiment, a simulation test method for an integrated circuit, comprising the following steps:

[0100] (1) Read in the parameter definition table (i.e. test parameter table, such as Figure 5 ). The parameter definition table uses Definition to identify a definition. Each definition includes a first-level parameter and at least one second-level parameter. The first-level parameter includes the parameter name and attributes. The first column is the parameter name, and the following columns are attributes (which are also the values ​​of the first-level parameters); the second-level parameter includes the parameter name and value. The first column is the parameter name, and the following columns are values. Below the first-level parameter, the box symbols [,] are used to identify the second-level parameters it contains. The values ​​of the second-level parameters and the attributes of the first-level parameters form a corresponding relationship by column. For example, Definition 1 contains a first-level parameter cio and a second-level parameter cio1. cio has 3 attributes, namely min, typ, and max. cio contains a second-level parameter cio1. cio1 has 3 values, namely 0.2, 0.6, and 1. The value of cio1 of 0.2 means that the min attribute (i.e., the minimum value) of cio1 is 0.2, and the others are similar.

[0101] Read in the parameter definition table and parse it. You can use an array to store each Definition, including the name and attributes of the first-level parameters, and the name and value of the second-level parameters.

[0102] (2) Conduct the experimental design using the primary parameters as the factors. Based on the recommended minimum number of experiments or manually set number of experiments and the possible values ​​of the factors, randomly generate a combination of factor values ​​for each experiment to obtain an experimental design table. Each row of the experimental design table represents an experiment, and the row data is the corresponding value of the primary parameter.

[0103] (3) After generating the experimental design table, obtain the SPICE netlist template of the integrated circuit to be tested, where the variable parameters in the template are marked with "% parameter name %", where the parameter name is the secondary parameter in the parameter definition table.

[0104] (4) According to the attributes of the first-level parameters defined in each row (representing an experiment) in the experimental design table (i.e., the values ​​of the first-level parameters), the corresponding values ​​of all associated second-level parameters are obtained, that is, the values ​​of the first-level parameters of an experiment are converted into the values ​​of the second-level parameters, and then the parameters marked by "% parameter name %" in the netlist template are replaced according to the values ​​of the second-level parameters of the experiment (for example, check whether the name of the second-level parameter is in the netlist template, and if so, replace it with the corresponding value of the second-level parameter), and obtain the netlist of the experiment.

[0105] (5) After generating the netlists for all experiments, input the netlists one by one and perform SPICE simulation. After the simulation is completed, the simulation results (such as the eye height and eye width of the eye diagram) are automatically collected and the simulation results and experimental tables are integrated together to form a table containing the experimental data and simulation results.

[0106] In this embodiment, the experimental design table can be automatically generated by importing the parameter definition table, and multiple netlists can be generated in combination with the netlist template for SPICE simulation. After the simulation is completed, the results are automatically collected and written into the table, avoiding manual operations such as experimental table design, netlist modification, and simulation result collection, thereby improving the simulation test efficiency.

[0107] One embodiment of the present invention is a computer storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the integrated circuit simulation test method described in the above embodiment are implemented.

[0108] It should be noted that the above embodiments can be freely combined as needed. The above are only preferred embodiments of the present invention. It should be noted that those skilled in the art can make several improvements and modifications without departing from the principles of the present invention, and such improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A simulation test method for an integrated circuit, characterized in that: include: Taking the parameters of the integrated circuit to be tested as the secondary parameters and the class to which the secondary parameters belong as the primary parameters; Obtaining a test parameter table for the integrated circuit, the test parameter table including the plurality of primary parameters and their attributes, secondary parameters included in the primary parameters, and values ​​of the secondary parameters corresponding to the attributes of the primary parameters for simulation testing; Using the primary parameters as factors for experimental design, generating an experimental design table for the integrated circuit according to the primary parameters and their attributes in the test parameter table, wherein the experimental design table includes a plurality of test experiments, and each group of test experiments specifies the attributes of all the primary parameters; Obtaining a netlist template of the integrated circuit, wherein the netlist template includes variable parameters, and the variable parameters correspond one-to-one to the secondary parameters; Determining the values ​​of all secondary parameters corresponding to each test experiment based on the attributes of all primary parameters in the test experiment; Assigning values ​​to the variable parameters of the netlist template according to the values ​​of all secondary parameters corresponding to the test experiment to obtain a netlist corresponding to the test experiment; A simulation result of the integrated circuit under the netlist is obtained and recorded as a simulation result of the test experiment.

2. The simulation test method for an integrated circuit according to claim 1, wherein: A test report of the integrated circuit is generated based on all test experiments and simulation results.

3. The simulation test method for an integrated circuit according to claim 1, wherein: Obtaining a test parameter table of the integrated circuit includes: The first-level parameters and their attributes, and the second-level parameters and their values ​​are obtained through a graphical interactive interface.

4. The simulation test method for an integrated circuit according to claim 1, wherein: The first-level parameters are used as factors of experimental design, and an experimental design table for the integrated circuit is generated according to the first-level parameters and attributes of the test parameter table, including: According to the possible values ​​of the factors, the randomly generated combinations of all factor values ​​are used as a set of test experiments.

5. The simulation test method for an integrated circuit according to claim 1, wherein: Determining the values ​​of all secondary parameters corresponding to each test experiment according to the attributes of all primary parameters in each test experiment includes: Obtaining properties of the primary parameters of the test experiment; Determining, according to the test parameter table, a value of a secondary parameter associated with an attribute of the primary parameter; Assigning values ​​to the variable parameters of the netlist template according to the values ​​of all secondary parameters corresponding to the test experiment, including: Finding the variable parameters of the netlist template by identifying a specific symbol used to mark the variable parameters in the netlist template; Obtaining the value of the secondary parameter corresponding to the variable parameter from the values ​​of all secondary parameters corresponding to the test experiment; The variable parameter is assigned a value using the value.

6. A simulation test device for an integrated circuit, characterized in that: include: memory for storing computer programs; A processor, configured to implement the simulation test method for an integrated circuit as claimed in any one of claims 1 to 5 when running the computer program.

7. A simulation test system for an integrated circuit, characterized in that: A simulation test device comprising the integrated circuit according to claim 6.

8. A computer storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the integrated circuit simulation test method according to any one of claims 1 to 5 are implemented.

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