Method and system for detecting spectral attenuation consistency of anti-blue light film layer on lenses

Abstract

The present invention relates to the technical field of spectral attenuation detection, and discloses a method and system for detecting the spectral attenuation consistency of an anti-blue light film layer on a lens. The method comprises: performing a gradient operation on the anti-blue light film layer of an anti-blue light lens to obtain a local angle of incidence of the anti-blue light film layer; collecting a refractive index-radial coordinate data set of the anti-blue light film layer, and performing nonlinear fitting on the refractive index-radial coordinate data set to obtain a refractive index fitting function of the anti-blue light film layer; and calculating the total optical thickness of the anti-blue light film layer using an optical thickness calculation formula based on a thickness matrix of all levels in the anti-blue light film layer and a dependent variable of the refractive index fitting function. The present invention can achieve accurate detection and evaluation of the spectral attenuation consistency of the anti-blue light film layer.

Description

Technical Field

[0001] The present invention relates to the technical field of spectral attenuation detection, and in particular to a method and system for detecting the consistency of spectral attenuation of an anti-blue light film layer on a lens. Background Art

[0002] Traditional methods for measuring spectral attenuation of blue light-blocking films utilize an interferometric calculation model with a fixed incident angle and a standard refractive index. This is an optical analysis framework based on idealized assumptions. This interferometric calculation model assumes that the incident light strikes the film surface at a constant angle, disregarding local variations in the incident angle caused by the film's actual topography and using a preset angle for calculation. Furthermore, the film is treated as a medium with a uniform refractive index, using the material's nominal single refractive index value and ignoring any radial refractive index gradients or differences in the film's multilayer structure.

[0003] The existing technology does not fully consider the gradient characteristics of the thickness distribution of the anti-blue light film and the dynamic changes in the refraction angle of the actual incident light caused by the differences in the surface morphology of the film. It is difficult to accurately describe the differences in optical properties of different regions of the film under non-orthogonal incidence conditions, resulting in a large deviation between theoretical calculations and actual spectral attenuation characteristics, making it difficult to effectively achieve accurate detection and evaluation of the spectral attenuation consistency of the anti-blue light film. Summary of the Invention

[0004] The present invention provides a method and system for detecting the spectral attenuation consistency of an anti-blue light film layer on a lens. The main purpose of the method and system is to solve the problem that the existing technology is difficult to effectively achieve accurate detection and evaluation of the spectral attenuation consistency of an anti-blue light film layer.

[0005] To achieve the above objectives, the present invention provides a method for detecting the spectral attenuation consistency of a lens anti-blue light film, comprising:

[0006] S1. Performing a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain a local incident angle of the anti-blue light film layer;

[0007] S2. Collecting a refractive index-radial coordinate data set of the anti-blue light film layer, performing nonlinear fitting on the refractive index-radial coordinate data set to obtain a refractive index fitting function of the anti-blue light film layer;

[0008] S3. Calculating the total optical thickness of the anti-blue light film layer using an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function;

[0009] S4. Calculating the equivalent refractive index of the anti-blue light film layer according to the total optical thickness and the thickness matrix, and calculating the refractive angle of the anti-blue light film layer using Snell's law according to the local incident angle and the equivalent refractive index;

[0010] S5. Performing thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain a theoretical transmission center wavelength of the anti-blue light film layer, and obtaining a measured transmission center wavelength of the anti-blue light film layer;

[0011] S6. Generate a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determine the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value.

[0012] Optionally, performing a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain a local incident angle of the anti-blue light film layer includes:

[0013] Acquire the topography data of the anti-blue light film layer, and construct a three-dimensional height model of the anti-blue light film layer according to the topography data;

[0014] Discretize the three-dimensional height model into two-dimensional grid data of the anti-blue light film layer, and calculate the partial derivatives of the grid points in the two-dimensional grid data;

[0015] forming a gradient vector field of the three-dimensional height model according to the partial derivatives;

[0016] Determine the normal vector of each surface point of the anti-blue light film layer based on the gradient vector field;

[0017] Performing a vector dot product on the normal vector and the incident light direction vector of the surface point to obtain an angle;

[0018] The cosine value of the angle is determined as the local incident angle of the anti-blue light film layer.

[0019] Optionally, collecting the refractive index-radial coordinate data set of the anti-blue light film layer includes:

[0020] Collecting the effective refractive index of multiple feature points on the anti-blue light film layer;

[0021] Calculate the distance between the feature point and the center of the anti-blue light lens according to the Euclidean distance formula to obtain a characteristic distance between the feature point and the center of the anti-blue light lens;

[0022] determining the radial coordinates of the feature point according to the feature distance;

[0023] Performing data matching on the effective refractive index and the radial coordinate to obtain a refractive index-radial coordinate data pair of the feature point;

[0024] The refractive index-radial coordinate data pairs are collected to form a refractive index-radial coordinate data set of the anti-blue light film layer.

[0025] Optionally, performing nonlinear fitting on the refractive index-radial coordinate data set to obtain a refractive index fitting function of the anti-blue light film layer includes:

[0026] Selecting a fitting model for the refractive index fitting function;

[0027] Constructing a fitting equation group of the fitting model;

[0028] Solving the fitting equations to obtain fitting parameters of the fitting model, wherein the fitting parameters include the central refractive index and the refractive index gradient coefficient of the lens;

[0029] Substitute the fitting parameters into the refractive index fitting function to obtain the refractive index value of the radial coordinate, wherein the refractive index fitting function is as follows:

[0030]

[0031] Where, Indicates that the radial coordinate is The refractive index value, represents the central refractive index of the lens, represents the refractive index gradient coefficient, represents the radial coordinate.

[0032] Optionally, the total optical thickness of the anti-blue light film layer is calculated by an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function, including:

[0033] Performing hierarchical segmentation on the anti-blue light film layer to obtain multiple levels of the anti-blue light film layer;

[0034] Taking the center of the blue light protection lens as the center of the coordinate system, and constructing the plane coordinate system of the hierarchy;

[0035] collecting thickness values ​​of each grid point in the layer in the horizontal and vertical directions of the plane coordinate system at fixed intervals;

[0036] Sort the thickness values ​​according to the positions of the grid points to obtain a thickness matrix of the layer;

[0037] Mapping the dependent variable of the refractive index fitting function to the plane coordinate system to obtain the refractive index distribution value of the level in the plane coordinate system;

[0038] The thickness matrix and the refractive index distribution value are used to perform optical thickness calculation to obtain the total optical thickness of the anti-blue light film layer, wherein the optical thickness calculation formula is as follows:

[0039]

[0040] Where, represents the total optical depth, an identifier representing the level in question, represents the total number of said levels, Indicates the The refractive index distribution value of the level, Indicates the the thickness matrix of the layers, Represents the two-dimensional coordinates of the plane coordinate system.

[0041] Optionally, the calculation formula of the equivalent refractive index is as follows:

[0042]

[0043] Where, represents the equivalent refractive index, represents the total optical depth, an identifier representing the level in question, represents the total number of said levels, Indicates the the thickness matrix of the layers, represents the two-dimensional coordinates of the plane coordinate system, Represents the sum of thicknesses of all layers.

[0044] Specifically, Snell's law originally requires a medium with uniform refractive index to be applicable, but in optical coating layers, there are gradient changes (such as the non-uniformity of the refractive index along the radial distribution and the spatial fluctuation of the film thickness).

[0045] In general, the present invention solves this contradiction by establishing a "gradient-equivalent homogeneous" conversion mechanism: the equivalent refractive index is used as the core bridging variable and is calculated and generated based on the gradient information in the optical total thickness and thickness matrix.

[0046] Specifically, these matrices record the thickness distribution and refractive index gradient effect of each layer of the film at different radial coordinate points, which is equivalent to compressing the complex gradient structure into a single equivalent value.

[0047] In general, after incorporating the equivalent refractive index into the Snell's law formula, the physical model originally designed for homogeneous media is extended to gradient scenarios. At this time, the calculation result of the refractive angle already implicitly includes the dynamic response caused by the film gradient.

[0048] In general, although Snell's law does not explicitly involve gradient parameters in form, it actually indirectly integrates the inhomogeneous characteristics through the gradient derivative of the equivalent refractive index.

[0049] In general, this not only conforms to the principle of optical equivalent medium, but also achieves seamless connection between gradient changes and classical refraction law, solving the problem of optical path calculation deviation caused by ignoring gradients in traditional methods.

[0050] Optionally, calculating the refraction angle of the anti-blue light film layer according to the local incident angle and the equivalent refractive index by Snell's law includes:

[0051] Determining the refractive index of the incident medium on the incident side of the anti-blue light film layer;

[0052] The refractive index of the incident medium, the local incident angle, and the equivalent refractive index are substituted into Snell's law to calculate the refractive angle of the anti-blue light film layer, wherein Snell's law is as follows:

[0053]

[0054] Where, represents the refractive index of the incident medium, represents the sine of the local incident angle, represents the local incident angle, represents the equivalent refractive index, represents the two-dimensional coordinates of the plane coordinate system, represents the sine of the refraction angle, represents the refraction angle.

[0055] Optionally, performing thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain the theoretical transmission center wavelength of the anti-blue light film layer includes:

[0056] Multiplying the total optical thickness by the cosine value of the refraction angle to obtain the optical path difference of the anti-blue light film layer;

[0057] According to the relationship between the optical path difference and the integer multiples of the wavelength in thin film optics theory, an interference condition formula of the optical path difference and the theoretical transmission center wavelength of the anti-blue light film layer is constructed;

[0058] Correcting the refractive index of the film layer in the interference condition formula to obtain a nonlinear equation for the anti-blue light film layer;

[0059] The nonlinear equation is iteratively solved to obtain the theoretical transmission center wavelength.

[0060] Specifically, the theoretical transmission center wavelength represents a baseline value for optical performance after incorporating the film's gradient characteristics. It is essentially a quantitative reference standard generated by accurately modeling the film's physical properties. Existing technologies fail to accurately reflect regional optical variations in the film because they ignore the film's thickness gradient distribution and the dynamic changes in refraction angle caused by surface topography differences (as discussed in the background).

[0061] In detail, the local incident angle of the film layer is derived to capture the spatial differences in the incident light caused by surface fluctuations.

[0062] In detail, a gradient refractive index function is constructed through nonlinear fitting to break through the uniform refractive index assumption.

[0063] In detail, the equivalent refractive index is calculated in combination with the layer thickness matrix, and the multilayer inhomogeneous structure is equivalent to a homogeneous medium.

[0064] In detail, the corrected optical path difference is finally used as input, and the optimized theoretical transmission center wavelength is obtained through thin film interference theory.

[0065] In general, its core value lies in: providing a comparative reference for the measured transmission center wavelength, and directly reflecting the degree of fit between the manufacturing process and the theoretical design.

[0066] Specifically, the smaller the deviation value, the more accurately the film manufacturing process reproduces the optical behavior of the theoretical model.

[0067] In general, the theoretical deviation of the traditional fixed incident angle model is overcome, and a spatially refined evaluation of spectral attenuation consistency is achieved.

[0068] In general, the scientific significance of this parameter stems from its integration of non-ideal factors such as gradient effect, dynamic refraction and multi-layer interference, making it a core indicator connecting theoretical design with actual product performance.

[0069] Optionally, generating a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determining a spectral attenuation consistency level of the anti-blue light film layer based on the deviation value includes:

[0070] The difference between the measured transmission center wavelength and the theoretical transmission center wavelength is calculated to obtain the deviation value. ;

[0071] Comprehensively evaluate the material structure and manufacturing process error of the anti-blue light film layer to obtain the deviation threshold between the measured transmission center wavelength and the theoretical transmission center wavelength ;

[0072] judge and Size:

[0073] when When , the spectral attenuation consistency level is determined to be unqualified;

[0074] when When , the spectral attenuation consistency level is determined to be qualified;

[0075] when When , the spectral attenuation consistency level is determined to be excellent.

[0076] In order to solve the above problems, the present invention also provides a spectral attenuation consistency detection system for a lens anti-blue light film layer, the system comprising:

[0077] A local incident angle calculation module performs a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain a local incident angle of the anti-blue light film layer;

[0078] a refractive index fitting function generating module, which collects a refractive index-radial coordinate data set of the anti-blue light film layer, performs nonlinear fitting on the refractive index-radial coordinate data set, and obtains a refractive index fitting function of the anti-blue light film layer;

[0079] A total optical thickness calculation module calculates the total optical thickness of the anti-blue light film layer using an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function;

[0080] a refraction angle calculation module, which calculates the equivalent refractive index of the anti-blue light film layer according to the total optical thickness and the thickness matrix, and calculates the refraction angle of the anti-blue light film layer according to the local incident angle and the equivalent refractive index using Snell's law;

[0081] a wavelength generation module, performing thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain a theoretical transmission center wavelength of the anti-blue light film layer and obtain a measured transmission center wavelength of the anti-blue light film layer;

[0082] The judgment module generates a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determines the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value.

[0083] Compared with the prior art, the present invention has the following beneficial effects:

[0084] 1. By performing gradient calculations on the anti-blue light film layer to construct a three-dimensional height model, the angle between the normal vector of each surface point and the direction vector of the incident light is calculated. This results in a dynamically changing local angle of incidence, rather than a fixed angle of incidence, to reflect the dynamic response of the refraction angle caused by differences in the film's surface topography.

[0085] 2. This invention collects a dataset of film refractive index and radial coordinates and performs nonlinear fitting to obtain a gradient refractive index fitting function. This nonlinear fitting captures the gradual change of refractive index with radial coordinates, breaking the traditional assumption of uniform refractive index. Furthermore, a thickness matrix is ​​used to record the thickness distribution of each layer in a plane coordinate system, enabling the calculation of total optical thickness to reflect the product and accumulation effect of refractive index and thickness at different locations and levels.

[0086] 3. The present invention calculates the equivalent refractive index of the anti-blue light film layer based on the total optical thickness and the thickness matrix. The equivalent refractive index calculated in this way can make the multi-layer non-uniform structure equivalent to a locally homogeneous medium. Combined with the dynamic local incident angle obtained by gradient calculation, the refraction angle is calculated by region using Snell's law. Finally, the refractive index wavelength correlation correction is introduced into the thin film interference solution to achieve accurate calculation of the optical path difference and theoretical transmission center wavelength of each region under non-orthogonal incidence, so that the theoretical calculation can truly reflect the differences in optical properties of different regions of the film layer, thereby reducing the deviation between theory and measurement, and achieving accurate evaluation of spectral attenuation consistency. BRIEF DESCRIPTION OF THE DRAWINGS

[0087] Figure 1 A schematic flow chart of a method for detecting the spectral attenuation consistency of a lens anti-blue light film layer provided by one embodiment of the present invention;

[0088] Figure 2 This is a functional module diagram of a system for detecting the spectral attenuation consistency of an anti-blue light film layer on a lens provided by one embodiment of the present invention;

[0089] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0090] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0091] The embodiment of the present application provides a method for detecting the consistency of spectral attenuation of an anti-blue light film layer on a lens. The execution subject of the method for detecting the consistency of spectral attenuation of an anti-blue light film layer on a lens includes but is not limited to at least one of the electronic devices such as a server and a terminal that can be configured to execute the method provided by the embodiment of the present application. In other words, the method for detecting the consistency of spectral attenuation of an anti-blue light film layer on a lens can be executed by software or hardware installed on a terminal device or a server device. The server includes but is not limited to: a single server, a server cluster, a cloud server or a cloud server cluster, etc. The server can be an independent server, or it can be a cloud server that provides basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communications, middleware services, domain name services, security services, content delivery networks (CDNs), and big data and artificial intelligence platforms.

[0092] Reference Figure 1 FIG. 1 is a flow chart of a method for detecting the spectral attenuation consistency of a lens anti-blue light film layer according to an embodiment of the present invention. In this embodiment, the method for detecting the spectral attenuation consistency of a lens anti-blue light film layer includes:

[0093] S1. Performing a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain a local incident angle of the anti-blue light film layer;

[0094] In an embodiment of the present invention, performing a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain the local incident angle of the anti-blue light film layer includes:

[0095] Scan the surface of the anti-blue light film layer using an optical 3D profilometer to obtain topographic data of the anti-blue light film layer, and construct a 3D height model of the anti-blue light film layer based on the topographic data. The topographic data represents the coordinates (x, y) and height information h(x, y) of the 3D profile of the surface of the anti-blue light film layer, reflecting the microscopic undulations of the film layer surface. The 3D height model is a mathematical model that uses a 2D plane coordinate system as an independent variable and the film layer surface height as a dependent variable, and is used to describe the spatial morphology of the film layer surface.

[0096] Discretize the three-dimensional height model into two-dimensional grid data of the anti-blue light film layer, and use the central difference method to calculate the partial derivatives of the grid points in the two-dimensional grid data to obtain two components of the gradient vector, wherein the two-dimensional grid data represents dividing the continuous three-dimensional height model into a regular grid, and each grid point corresponds to a coordinate and a height value to form a two-dimensional array. The partial derivative represents the first-order derivative of the three-dimensional height model with respect to x or y, describing the rate of change of the height in the x or y direction;

[0097] The gradient vector field of the three-dimensional height model is formed according to the partial derivatives, wherein the gradient vector field is a set of vectors consisting of the partial derivatives of all grid points, each vector is , indicates the direction and rate of the fastest altitude change;

[0098] Determine the normal vector of each surface point of the anti-blue light film layer based on the gradient vector field;

[0099] In detail, according to the relationship between the surface normal vector and the gradient vector in three-dimensional space, the gradient vector is expanded into a three-dimensional form , and normalize it to obtain a unit normal vector, which is the normal vector of the corresponding point on the surface of the anti-blue light film layer.

[0100] performing a vector dot product between the normal vector and the incident light direction vector of the surface point to obtain an angle, wherein the incident light direction vector represents a unit vector of the incident direction of the light, which is usually assumed to be perpendicular to the center surface of the lens;

[0101] The cosine value of the angle is determined as the local incident angle of the anti-blue light film layer, wherein the local incident angle represents the angle between the incident light and the normal vector of the film layer surface.

[0102] In general: by constructing a three-dimensional height model of the film layer and discretizing it into two-dimensional grid data, the partial derivatives of each grid point are calculated to form a gradient vector field, and then the surface point normal vector is determined. Combined with the direction vector of the incident light, the true local incident angle is obtained through dot product operation. This method breaks the traditional idealized assumption of a fixed incident angle, and can capture the spatial differences in incident angles caused by microscopic undulations or curvature changes on the film surface (such as different incident angles in the edge area and the center area). This allows the subsequent refraction angle calculated based on Snell's law to truly reflect the light deflection characteristics under non-orthogonal incidence conditions, avoiding the optical path calculation deviation caused by the assumption of a fixed incident angle, and laying the foundation for accurately establishing a regional interference condition model and improving the accuracy of spectral attenuation consistency detection.

[0103] S2. Collecting a refractive index-radial coordinate data set of the anti-blue light film layer, performing nonlinear fitting on the refractive index-radial coordinate data set to obtain a refractive index fitting function of the anti-blue light film layer;

[0104] In an embodiment of the present invention, collecting the refractive index-radial coordinate data set of the anti-blue light film layer includes:

[0105] Collecting the effective refractive index of multiple feature points on the anti-blue light film layer;

[0106] In detail, multiple feature points are selected on the surface of the anti-blue light film layer according to certain rules (such as equally spaced grids, circular arrays, etc.), and then a high-precision ellipsometer is used with its probe aligned with the feature points. The measurement parameters (such as wavelength range, angle of incidence, etc.) are set according to the instrument operating specifications. The ellipsometer is used to measure the reflection or transmission characteristics of the film layer at the feature points for light in different polarization states. The measured data is processed according to optical principles to calculate the effective refractive index of each feature point, and records are kept to provide basic data for subsequent data matching and analysis.

[0107] Calculate the distance between the feature point and the center of the anti-blue light lens according to the Euclidean distance formula to obtain a characteristic distance between the feature point and the center of the anti-blue light lens;

[0108] determining the radial coordinates of the feature point according to the feature distance;

[0109] In detail, the distance from the feature point to the center of the anti-blue light lens is the measurement of its radial coordinate, so the calculated feature distance is directly used as the radial coordinate of the feature point, thereby completing the determination process from the feature distance to the radial coordinate.

[0110] Performing data matching on the effective refractive index and the radial coordinate to obtain a refractive index-radial coordinate data pair of the feature point;

[0111] In detail, ensure that the effective refractive index value and the corresponding radial coordinate value of each feature point have been accurately obtained, establish a data storage structure, and for each feature point, use its radial coordinate as the index and its effective refractive index value as the corresponding data. Store them in the order of the feature points, thereby forming a one-to-one corresponding refractive index-radial coordinate data pair, which is convenient for subsequent data analysis and processing.

[0112] The refractive index-radial coordinate data pairs are collected to form a refractive index-radial coordinate data set of the anti-blue light film layer.

[0113] In an embodiment of the present invention, performing nonlinear fitting on the refractive index-radial coordinate data set to obtain a refractive index fitting function of the anti-blue light film layer includes:

[0114] Selecting a gradient refractive index model as a fitting model of the refractive index fitting function of the anti-blue light film layer;

[0115] In detail, based on the characteristic that the refractive index of the anti-blue light film may change in the radial direction, a gradient refractive index model is selected from a variety of refractive index models. This model assumes that the refractive index of the film changes gradually in the radial direction, which is consistent with the actual possible refractive index distribution of the film and can better describe the changing trend of the refractive index of the film with the radial coordinate.

[0116] Constructing a fitting equation group of the fitting model using the least squares method;

[0117] In detail, the goal is to make the gap between the predicted value of the gradient refractive index model and the actual collected refractive index data as small as possible, and to find the partial derivative coefficients of the two key parameters in the gradient refractive index model, that is, the central refractive index of the lens and the refractive index gradient coefficient, that is, to find the rate of change of the sum of the gaps with respect to these two parameters. When the rate of change is 0, it means that the state of the minimum total gap has been reached. Listing the conditions for these two rates of change to 0 forms a set of equations, which is the fitting equations we are going to use.

[0118] Solving the fitting equations using a matrix inversion method to obtain fitting parameters of the fitting model, wherein the fitting parameters include the central refractive index and the refractive index gradient coefficient of the lens;

[0119] In detail, the fitting equations are organized into matrix form ,in is the coefficient matrix, is the parameter vector to be solved (i.e., fitting parameters), is a constant term vector, for the form The linear equations, when the coefficient matrix When reversible, the solution is , so by calculating the coefficient matrix The inverse matrix of , and with the vector Multiply them to get the fitting parameters.

[0120] Substitute the fitting parameters into the refractive index fitting function to obtain the refractive index value of the radial coordinate, wherein the refractive index fitting function is as follows:

[0121]

[0122] Where, Indicates that the radial coordinate is The refractive index value, represents the central refractive index of the lens, represents the refractive index gradient coefficient, represents the radial coordinate.

[0123] In detail, after obtaining the specific values ​​of the central refractive index and the refractive index gradient coefficient of the lens, substitute them into the gradient refractive index model , for any given radial coordinate , the corresponding refractive index value can be calculated by this function , thereby completely determining the refractive index fitting function of the anti-blue light film layer, which can describe the refractive index of the film layer at different radial positions.

[0124] In general, by obtaining the effective refractive index and its corresponding radial coordinates at multiple characteristic points on the film surface, a mathematical model reflecting the spatial distribution of the refractive index is constructed. This model breaks through the traditional assumption of uniform refractive index and accurately describes the gradual change of the film's refractive index with radial position (such as the attenuation characteristics from the center to the edge). This fitting function provides the refractive index distribution values ​​at each coordinate point for the subsequent calculation of total optical thickness. Combined with the thickness matrix, it enables refined modeling of the optical properties of each region of the film. This ensures that the calculation of the equivalent refractive index, refraction angle, and theoretical transmission center wavelength truly reflects the actual optical behavior of the film. This solves the problem of theoretical and measured discrepancies caused by existing technologies that ignore the spatial variation of refractive index, and improves the accuracy of spectral attenuation consistency testing.

[0125] S3. Calculating the total optical thickness of the anti-blue light film layer using an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function;

[0126] In an embodiment of the present invention, the total optical thickness of the anti-blue light film layer is calculated by an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function, including:

[0127] Segmenting the anti-blue light film layer by layers according to the difference in material refractive index to obtain multiple layers of the anti-blue light film layer;

[0128] In detail, different materials have different refractive indices. High-precision optical measuring equipment such as spectroscopic ellipsometers are used to measure the refractive index of the anti-blue light film layer point by point. Based on the changes in the measured refractive index values, areas with similar refractive indices are divided into the same level, thereby dividing the entire anti-blue light film layer into multiple different levels.

[0129] Taking the center of the blue light protection lens as the center of the coordinate system, and constructing the plane coordinate system of the hierarchy;

[0130] Specifically, determine the physical center position of the anti-blue light lens and use it as the origin (0,0) of the plane rectangular coordinate system. According to the actual shape of the film layer and the measurement requirements, determine the positive direction of the x-axis and y-axis to establish the plane rectangular coordinate system. Each point on the film layer can be expressed as a two-dimensional coordinate system. To express.

[0131] collecting thickness values ​​of each grid point in the layer in the horizontal and vertical directions of the plane coordinate system at fixed intervals;

[0132] In detail, in the constructed plane coordinate system, the layer surface is gridded at a pre-set fixed spacing in the horizontal direction (x-axis direction) and the vertical direction (y-axis direction) to form a regular grid array. A high-precision thickness measuring instrument is used to measure the thickness of the film layer at each grid intersection (i.e., grid point), and the thickness value corresponding to each grid point is recorded.

[0133] Sort the thickness values ​​according to the positions of the grid points to obtain a thickness matrix of the layer;

[0134] In detail, the coordinates of each grid point The corresponding thickness value Associating, arrange the thickness values ​​of all grid points in sequence according to the row and column order of the grid points in the plane coordinate system to form a two-dimensional array. This two-dimensional array is the thickness matrix of this level. The rows and columns in the thickness matrix correspond to the x-axis and y-axis directions in the plane coordinate system, respectively. The value of the matrix element is the thickness of the corresponding grid point.

[0135] Mapping the dependent variable of the refractive index fitting function to the plane coordinate system to obtain the refractive index distribution value of the level in the plane coordinate system;

[0136] In detail, the refractive index fitting function is known to be , for each coordinate point in the plane coordinate system , substitute its coordinates into the refractive index fitting function and calculate the refractive index value corresponding to the coordinate point By calculating all the coordinate points in the plane coordinate system, the refractive index distribution value of the entire level in the plane coordinate system is obtained.

[0137] The thickness matrix and the refractive index distribution value are used to perform optical thickness calculation to obtain the total optical thickness of the anti-blue light film layer, wherein the optical thickness calculation formula is as follows:

[0138]

[0139] Where, represents the total optical depth, an identifier representing the level in question, represents the total number of said levels, Indicates the The refractive index distribution value of the level, Indicates the the thickness matrix of the layers, Represents the two-dimensional coordinates of the plane coordinate system.

[0140] In detail, according to the optical thickness calculation formula, for each coordinate point in the plane coordinate system , get each level from the thickness matrix The thickness value at this coordinate point , get each level from the refractive index distribution value The refractive index value at this coordinate point , multiply the refractive index value and thickness value of the corresponding level, and then sum the product results of all levels to get the coordinate point Total optical depth at , repeat this process for all coordinate points that need to be calculated in the plane coordinate system, and finally obtain the total optical thickness distribution of the entire anti-blue light film layer.

[0141] S4. Calculating the equivalent refractive index of the anti-blue light film layer according to the total optical thickness and the thickness matrix, and calculating the refractive angle of the anti-blue light film layer using Snell's law according to the local incident angle and the equivalent refractive index;

[0142] In detail, the refraction angle of the anti-blue light film layer is obtained by substituting the total optical thickness and the thickness matrix into the calculation formula of the equivalent refractive index.

[0143] In an embodiment of the present invention, the calculation formula of the equivalent refractive index is as follows:

[0144]

[0145] Where, represents the equivalent refractive index, represents the total optical depth, an identifier representing the level in question, represents the total number of said levels, Indicates the the thickness matrix of the layers, represents the two-dimensional coordinates of the plane coordinate system, Represents the sum of thicknesses of all layers.

[0146] In detail, the equivalent refractive index is the refractive index corresponding to when the multi-layer complex structure film layer is regarded as a whole homogeneous medium. It is hoped to find a single refractive index value that can represent the comprehensive effect of the entire film layer on light propagation. The total optical thickness reflects the total phase shift of the light beam through the actual film layer, and this phase shift is determined by the equivalent refractive index under the condition of assuming that the material is uniform. The "equivalent refractive index" deduced from this is the refractive index of the virtual homogeneous material that makes the phase shift of the two equal. After substituting this refractive index into the law of refraction, the derived refraction angle is the overall deflection effect of the light beam through the multi-layer film. Its mechanical connotation is to ensure the consistency of the phase evolution of light when it propagates in the actual gradient structure and the equivalent homogeneous medium.

[0147] In an embodiment of the present invention, the refraction angle of the anti-blue light film layer is calculated according to the local incident angle and the equivalent refractive index by using Snell's law, including:

[0148] Determining the refractive index of the incident medium on the incident side of the anti-blue light film layer;

[0149] The refractive index of the incident medium, the local incident angle, and the equivalent refractive index are substituted into Snell's law to calculate the refractive angle of the anti-blue light film layer, wherein Snell's law is as follows:

[0150]

[0151] Where, represents the refractive index of the incident medium, represents the sine of the local incident angle, represents the local incident angle, represents the equivalent refractive index, represents the two-dimensional coordinates of the plane coordinate system, represents the sine of the refraction angle, represents the refraction angle.

[0152] In detail, we must first clarify what medium the light passes through when it enters the anti-blue light film layer. If the light enters the film layer from the air, then according to known physical common sense, the refractive index of the air is Approximately 1; if light enters the film from other specific media, it is necessary to consult relevant data or use special measuring instruments to obtain the accurate refractive index value of the medium. Use the inverse sine function , calculate the refraction angle of the anti-blue light film layer .

[0153] In general: the thickness distribution of each layer in the plane coordinate system is recorded through the thickness matrix, so that the total optical thickness calculation can reflect the multiplication and accumulation effect of the refractive index and thickness at different positions and levels; the equivalent refractive index calculated on this basis can make the multi-layer non-uniform structure equivalent to a local homogeneous medium. Combined with the dynamic local incident angle obtained by gradient calculation, the refraction angle is calculated by region using Snell's law. Finally, the refractive index wavelength correlation correction is introduced into the thin film interference solution to achieve accurate calculation of the optical path difference and theoretical transmission center wavelength of each region under non-orthogonal incidence, so that the theoretical calculation can truly reflect the differences in optical properties of different regions of the film layer, thereby reducing the deviation between theory and measurement and achieving accurate evaluation of spectral attenuation consistency.

[0154] S5. Performing thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain a theoretical transmission center wavelength of the anti-blue light film layer, and obtaining a measured transmission center wavelength of the anti-blue light film layer;

[0155] In an embodiment of the present invention, performing thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain the theoretical transmission center wavelength of the anti-blue light film layer includes:

[0156] Multiplying the total optical thickness by the cosine value of the refraction angle to obtain the optical path difference of the anti-blue light film layer;

[0157] In detail, the total optical thickness of the blue light protection film layer is known to be and the refraction angle , first calculate the cosine of the refraction angle , and then the total optical thickness and Multiply, that is The result is the optical path difference of the anti-blue light film. The optical path of light propagating in the film is related to the refraction angle. This calculation method can determine the optical path difference caused by the path and medium characteristics when light propagates in the film.

[0158] According to the relationship between the optical path difference and the integer multiples of the wavelength in thin film optics theory, an interference condition formula of the optical path difference and the theoretical transmission center wavelength of the anti-blue light film layer is constructed;

[0159] In detail, according to the thin film optical theory, when light interferes in a thin film, the optical path difference is an integer multiple of the wavelength. Let the optical path difference be , the theoretical transmission center wavelength is , integer Represents the interference order, and the formula is constructed based on this relationship .

[0160] The refractive index of the film layer in the interference condition formula is corrected by the Cauchy formula to obtain a nonlinear equation for the anti-blue light film layer;

[0161] In detail, in the above interference condition formula middle, Related to the refractive index of the film layer, taking into account the possible nonlinear changes in the refractive index of the film layer (such as the refractive index distribution obtained by fitting the gradient refractive index model before), the refractive index of the film layer in the interference condition formula needs to be corrected. The Cauchy formula describes the refractive index as a function related to the wavelength. Substituting this function into the interference condition formula, the originally relatively simple linear relationship will be broken due to the introduction of wavelength-related terms, forming an equation with complex forms such as different powers of wavelength. Since the relationship between the wavelengths in the equation is no longer a simple linear equation, the nonlinear equation of the anti-blue light film layer is obtained, which can be more accurately used for subsequent calculations and analysis such as the theoretical transmission center wavelength.

[0162] The nonlinear equation is iteratively solved using the Newton-Raphson iteration method to obtain the theoretical transmission center wavelength.

[0163] In detail, for the nonlinear equation of the anti-blue light film layer, first set an initial value close to the true solution, substituted it into the nonlinear equation and its derivative expression, and updated the approximate solution by calculating the function value and derivative value of the equation at this point, and used a specific iterative formula to obtain the next value closer to the true solution. Repeat this substitution, calculation, and update process continuously. Each iteration makes the approximate solution closer to the true solution until the pre-set convergence condition is met (for example, the difference between the results of two adjacent iterations is less than a certain minimum value). The value obtained at this time is the theoretical transmission center wavelength of the anti-blue light film layer.

[0164] In detail, a spectral imaging device is used to scan the characteristic area of ​​the anti-blue light film layer to obtain the transmittance data of each pixel at different wavelengths, that is, each pixel corresponds to a set of transmittance-wavelength curves, and for the protection target of the anti-blue light film layer (such as the 400-480nm blue light band), the transmittance data of each pixel in the three-dimensional data within the band is extracted; the valley position of each transmittance curve is identified through data analysis algorithms (such as peak detection and derivative method), and the wavelength corresponding to the valley is the measured transmission center wavelength of the pixel in the blue light band.

[0165] In general, the optical path difference is calculated by multiplying the total optical thickness by the cosine of the refraction angle. Based on thin film optics theory, the relationship between the optical path difference and integer multiples of the wavelength is established. The Cauchy formula is introduced to correct the wavelength dependence of the refractive index, and the nonlinear optical properties of the film are incorporated into the theoretical model. The nonlinear equation is solved using the Newton-Raphson iteration method to obtain the theoretical transmission center wavelength. Simultaneously, spectral imaging equipment is used to collect three-dimensional spectral data of the characteristic area, and the wavelength of the transmittance valley in the blue light band of each pixel is extracted as the measured value. This method fully incorporates the characteristics of the film layer, such as the thickness distribution gradient, spatial variation of the refractive index, and dynamic response of the refraction angle, into the theoretical calculation, and is verified by measured data. This solves the problem of the disconnect between theoretical models and actual optical behavior in existing technologies, and can accurately quantify the peak position and spatial consistency of the film layer's attenuation of blue light, providing a scientific and reliable basis for determining the level of spectral attenuation consistency.

[0166] S6. Generate a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determine the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value.

[0167] In an embodiment of the present invention, generating a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determining the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value includes:

[0168] The difference between the measured transmission center wavelength and the theoretical transmission center wavelength is calculated to obtain the deviation value. ;

[0169] Comprehensively evaluate the material structure and manufacturing process error of the anti-blue light film layer to obtain the deviation threshold between the measured transmission center wavelength and the theoretical transmission center wavelength ;

[0170] In detail, by analyzing the material structure of the film layer, including the number of film layers, the refractive index of each layer, the uniformity of the material and other factors, because different material properties and structures will have different effects on the propagation of light, thereby affecting the wavelength deviation. At the same time, carefully consider the manufacturing process errors, such as the thickness control accuracy during the coating process, the fitting accuracy between the layers, etc. These errors will directly or indirectly cause the actual film layer to differ from the theoretical design. Through experimental testing, a large amount of data related to material structure and manufacturing process is collected, and statistical methods are used to process and analyze these data to determine a reasonable deviation threshold. This threshold can reflect the acceptable deviation range between the measured transmission center wavelength and the theoretical transmission center wavelength under the current material structure and manufacturing process level.

[0171] judge and Size:

[0172] when When , the spectral attenuation consistency level is determined to be unqualified;

[0173] when When , the spectral attenuation consistency level is determined to be qualified;

[0174] when When , the spectral attenuation consistency level is determined to be excellent.

[0175] In detail, It is the difference between the measured transmission center wavelength and the theoretical transmission center wavelength, which reflects the degree of deviation between the actual measurement results and the theoretical expectations; The acceptable deviation range is determined after comprehensive consideration of material structure and manufacturing process errors. When , it means that the deviation between the actual and theoretical values ​​exceeds twice the acceptable range, indicating that the spectral attenuation characteristics of the film layer are significantly different from the theoretical design and it is likely that the film cannot meet the performance requirements of blue light protection, so it is judged as unqualified. When the deviation value Although the deviation threshold is exceeded , but has not yet reached the twice threshold, which shows that the actual spectral attenuation characteristics of the film layer have some deviations from the theoretical design, but are still within a relatively acceptable range. Its performance can basically meet the requirements of blue light protection, so it is judged to be qualified. When , it means that the deviation between the measured transmission center wavelength and the theoretical transmission center wavelength is very small, within the pre-set acceptable deviation range, which means that the actual spectral attenuation characteristics of the film layer are highly consistent with the theoretical design, and the anti-blue light performance is excellent, so it is judged to be excellent.

[0176] like Figure 2 , which is a functional module diagram of a system for detecting the spectral attenuation consistency of an anti-blue light film layer on a lens provided by one embodiment of the present invention.

[0177] The spectral attenuation consistency detection system 100 for lens anti-blue light coatings described herein can be installed in an electronic device. Depending on the functionality implemented, the system 100 can include a local incident angle calculation module 101, a refractive index fitting function generation module 102, a total optical thickness calculation module 103, a refraction angle calculation module 104, a wavelength generation module 105, and a determination module 106. A module, also referred to as a unit, is a series of computer program segments that can be executed by an electronic device processor and perform a fixed function. These modules are stored in the electronic device's memory.

[0178] In this embodiment, the functions of each module / unit are as follows:

[0179] The local incident angle calculation module 101 performs a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain the local incident angle of the anti-blue light film layer;

[0180] A refractive index fitting function generating module 102 collects a refractive index-radial coordinate data set of the anti-blue light film layer, performs nonlinear fitting on the refractive index-radial coordinate data set, and obtains a refractive index fitting function of the anti-blue light film layer;

[0181] A total optical thickness calculation module 103 calculates the total optical thickness of the anti-blue light film layer using an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function;

[0182] a refraction angle calculation module 104 for calculating an equivalent refractive index of the anti-blue light film layer according to the total optical thickness and the thickness matrix, and calculating a refraction angle of the anti-blue light film layer according to the local incident angle and the equivalent refractive index using Snell's law;

[0183] The wavelength generation module 105 performs thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain the theoretical transmission center wavelength of the anti-blue light film layer and the measured transmission center wavelength of the anti-blue light film layer;

[0184] The judgment module 106 generates a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determines the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value.

[0185] In the several embodiments provided by the present invention, it should be understood that the disclosed methods and systems can be implemented in other ways. For example, the system embodiments described above are merely illustrative. For example, the module division is merely a logical function division, and other division methods may be used in actual implementation.

[0186] The modules described as separate components may or may not be physically separate, and the components shown as modules may or may not be physical units, that is, they may be located in one place or distributed across multiple network elements. Some or all of the modules may be selected to achieve the purpose of the solution of this embodiment according to actual needs.

[0187] In addition, the functional modules in various embodiments of the present invention may be integrated into a single processing unit, each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or hardware plus software functional modules.

[0188] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention.

[0189] The embodiments of the present application can acquire and process relevant data based on artificial intelligence technology. Artificial intelligence refers to the theories, methods, technologies, and application systems that use digital computers or machines controlled by digital computers to simulate, extend, and expand human intelligence, perceive the environment, acquire knowledge, and use knowledge to achieve optimal results.

[0190] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not limiting. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention.

Claims

1. A method for detecting the spectral attenuation consistency of a lens's anti-blue light film, characterized in that: The method comprises: S1. Performing a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain a local incident angle of the anti-blue light film layer; Acquire the topography data of the anti-blue light film layer, and construct a three-dimensional height model of the anti-blue light film layer according to the topography data; Discretize the three-dimensional height model into two-dimensional grid data of the anti-blue light film layer, and calculate the partial derivatives of the grid points in the two-dimensional grid data; forming a gradient vector field of the three-dimensional height model according to the partial derivatives; Determine the normal vector of each surface point of the anti-blue light film layer based on the gradient vector field; Performing a vector dot product on the normal vector and the incident light direction vector of the surface point to obtain an angle; Determine the cosine value of the angle as the local incident angle of the anti-blue light film layer; S2. Collecting a refractive index-radial coordinate data set of the anti-blue light film layer, performing nonlinear fitting on the refractive index-radial coordinate data set to obtain a refractive index fitting function of the anti-blue light film layer; S3. Calculating the total optical thickness of the anti-blue light film layer using an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function; Performing hierarchical segmentation on the anti-blue light film layer to obtain multiple levels of the anti-blue light film layer; Taking the center of the blue light protection lens as the center of the coordinate system, and constructing the plane coordinate system of the hierarchy; collecting thickness values ​​of each grid point in the layer in the horizontal and vertical directions of the plane coordinate system at fixed intervals; Sort the thickness values ​​according to the positions of the grid points to obtain a thickness matrix of the layer; Mapping the dependent variable of the refractive index fitting function to the plane coordinate system to obtain the refractive index distribution value of the level in the plane coordinate system; The thickness matrix and the refractive index distribution value are used to perform optical thickness calculation to obtain the total optical thickness of the anti-blue light film layer, wherein the optical thickness calculation formula is as follows: ； Where, represents the total optical depth, an identifier representing the level in question, represents the total number of said levels, Indicates the The refractive index distribution value of the level, Indicates the the thickness matrix of the layers, represents the two-dimensional coordinates of the plane coordinate system; S4. Calculating the equivalent refractive index of the anti-blue light film layer according to the total optical thickness and the thickness matrix, and calculating the refractive angle of the anti-blue light film layer using Snell's law according to the local incident angle and the equivalent refractive index; S5. Performing thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain a theoretical transmission center wavelength of the anti-blue light film layer; Multiplying the total optical thickness by the cosine value of the refraction angle to obtain the optical path difference of the anti-blue light film layer; According to the relationship between the optical path difference and the integer multiples of the wavelength in thin film optics theory, an interference condition formula of the optical path difference and the theoretical transmission center wavelength of the anti-blue light film layer is constructed; Correcting the refractive index of the film layer in the interference condition formula to obtain a nonlinear equation for the anti-blue light film layer; Iteratively solving the nonlinear equation to obtain the theoretical transmission center wavelength; Obtaining the measured transmission center wavelength of the anti-blue light film layer; S6. Generate a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determine the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value.

2. The method for detecting the spectral attenuation consistency of the anti-blue light film layer of a lens according to claim 1, characterized in that: The collecting of the refractive index-radial coordinate data set of the anti-blue light film layer includes: Collecting the effective refractive index of multiple feature points on the anti-blue light film layer; Calculate the distance between the feature point and the center of the anti-blue light lens according to the Euclidean distance formula to obtain a characteristic distance between the feature point and the center of the anti-blue light lens; determining the radial coordinates of the feature point according to the feature distance; Performing data matching on the effective refractive index and the radial coordinate to obtain a refractive index-radial coordinate data pair of the feature point; The refractive index-radial coordinate data pairs are collected to form a refractive index-radial coordinate data set of the anti-blue light film layer.

3. The method for detecting the spectral attenuation consistency of the blue light protection film layer of a lens according to claim 2, wherein: The performing nonlinear fitting on the refractive index-radial coordinate data set to obtain a refractive index fitting function of the anti-blue light film layer includes: Selecting a fitting model for the refractive index fitting function; Constructing a fitting equation group of the fitting model; Solving the fitting equations to obtain fitting parameters of the fitting model, wherein the fitting parameters include the central refractive index and the refractive index gradient coefficient of the lens; Substitute the fitting parameters into the refractive index fitting function to obtain the refractive index value of the radial coordinate, wherein the refractive index fitting function is as follows: ； Where, Indicates that the radial coordinate is The refractive index value, represents the central refractive index of the lens, represents the refractive index gradient coefficient, represents the radial coordinate.

4. The method for detecting the spectral attenuation consistency of the blue light protection film layer of a lens according to claim 1, wherein: The calculation formula of the equivalent refractive index is as follows: ； Where, represents the equivalent refractive index, represents the total optical depth, an identifier representing the level in question, represents the total number of said levels, Indicates the the thickness matrix of the layers, represents the two-dimensional coordinates of the plane coordinate system, Represents the sum of thicknesses of all layers.

5. The method for detecting the spectral attenuation consistency of the anti-blue light film layer of a lens according to claim 4, characterized in that: Calculating the refraction angle of the anti-blue light film layer according to the local incident angle and the equivalent refractive index using Snell's law includes: Determining the refractive index of the incident medium on the incident side of the anti-blue light film layer; The refractive index of the incident medium, the local incident angle, and the equivalent refractive index are substituted into Snell's law to calculate the refractive angle of the anti-blue light film layer, wherein Snell's law is as follows: ； Where, represents the refractive index of the incident medium, represents the sine of the local incident angle, represents the local incident angle, represents the equivalent refractive index, represents the two-dimensional coordinates of the plane coordinate system, represents the sine of the refraction angle, represents the refraction angle.

6. The method for detecting the spectral attenuation consistency of the blue light protection film layer of a lens according to claim 1, wherein: Generating a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determining the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value, includes: The difference between the measured transmission center wavelength and the theoretical transmission center wavelength is calculated to obtain the deviation value. ; Comprehensively evaluate the material structure and manufacturing process error of the anti-blue light film layer to obtain the deviation threshold between the measured transmission center wavelength and the theoretical transmission center wavelength ; judge and Size: when When , the spectral attenuation consistency level is determined to be unqualified; when When , the spectral attenuation consistency level is determined to be qualified; when When , the spectral attenuation consistency level is determined to be excellent.

7. A system for detecting the spectral attenuation consistency of a lens anti-blue light film layer, for implementing the method for detecting the spectral attenuation consistency of a lens anti-blue light film layer according to claim 1, the system comprising: A local incident angle calculation module is used to perform a gradient calculation on the anti-blue light film layer of the anti-blue light lens to obtain the local incident angle of the anti-blue light film layer; a refractive index fitting function generating module, configured to collect a refractive index-radial coordinate data set of the anti-blue light film layer, perform nonlinear fitting on the refractive index-radial coordinate data set, and obtain a refractive index fitting function of the anti-blue light film layer; A total optical thickness calculation module is used to calculate the total optical thickness of the anti-blue light film layer using an optical thickness calculation formula based on the thickness matrix of all layers in the anti-blue light film layer and the dependent variable of the refractive index fitting function; a refraction angle calculation module, configured to calculate the equivalent refractive index of the anti-blue light film layer according to the total optical thickness and the thickness matrix, and calculate the refraction angle of the anti-blue light film layer using Snell's law according to the local incident angle and the equivalent refractive index; a wavelength generation module, configured to perform thin film interference calculation on the total optical thickness and the cosine value of the refraction angle to obtain a theoretical transmission center wavelength of the anti-blue light film layer and obtain a measured transmission center wavelength of the anti-blue light film layer; A judgment module is used to generate a deviation value between the measured transmission center wavelength and the theoretical transmission center wavelength, and determine the spectral attenuation consistency level of the anti-blue light film layer based on the deviation value.

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