Rapid determination method for rare earth metal in alloy

Abstract

The invention relates to the technical field of testing or analyzing materials, in particular to a rapid determination method for rare earth metal in alloy, which comprises the following steps: acquiring each spectral line of alloy to be detected, and acquiring each spectral line of each preset metal; determining a metal feature expression factor of each to-be-detected spectral line to each reference spectral line; determining the single metal possibility corresponding to the to-be-detected spectral line; screening out a multi-metal combined spectral line and a single-metal spectral line, and determining the existence possibility of each preset metal in each multi-metal combined spectral line according to the metal feature expression factor and wavelength of the multi-metal combined spectral line to a reference spectral line corresponding to the preset metal; determining a target existence possible index of each preset metal in each multi-metal combined spectral line; and metal element components contained in the to-be-detected alloy are judged, so that rapid determination of the rare earth metal in the alloy is realized. According to the invention, through material analysis test, the accuracy of rare earth metal element detection is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of testing or analyzing materials, and particularly relates to a rapid determination method for rare earth metals in an alloy. Background Art

[0002] Alloys containing different metal element components often have different functional uses. For example, due to the characteristics of titanium alloys such as low density, corrosion resistance, good low-temperature biocompatibility, etc., they are widely used in the fields of aerospace, medical devices, chemical industry, automotive industry, and military construction. Different application scenarios often have different requirements for the metal element components of titanium alloys. Therefore, it is crucial to detect the metal element components of alloys. Currently, when detecting the metal elements of alloys, the commonly used method is: if the spectral line range of a metal exists within the spectral line range of the alloy, it is determined that the metal exists in the alloy.

[0003] However, if it is determined that a rare earth metal exists in the alloy when the spectral line range of the rare earth metal exists within the spectral line range of the alloy, the following technical problems often occur: Since there may be multiple metal elements showing similar element spectral lines, that is, there may be multiple elements corresponding to the same spectral line, when directly detecting rare earth metal elements in an alloy based on the spectral line range of the metal, it may lead to misjudgment of rare earth metal elements in the alloy, resulting in poor accuracy of detecting rare earth metal elements in the alloy. Summary of the Invention

[0004] In order to solve the technical problem of poor accuracy in detecting rare earth metal elements in an alloy, the present invention proposes a rapid determination method for rare earth metals in an alloy.

[0005] In a first aspect, the present invention provides a rapid determination method for rare earth metals in an alloy, the method comprising: Obtaining each spectral line of the alloy to be detected as the spectral line to be detected, and obtaining each spectral line of each preset metal as the reference spectral line; Determining the metal characteristic performance factor of each spectral line to be detected with respect to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line; Determining the single metal possibility corresponding to each spectral line to be detected according to the metal characteristic performance factors of each spectral line to be detected with respect to all reference spectral lines, and the widths on the left and right sides of each spectral line to be detected; Screening out multi-metal combined spectral lines and single-metal spectral lines from all spectral lines to be detected according to all single metal possibilities, and determining the existence possibility of each preset metal in each multi-metal combined spectral line according to the metal characteristic performance factors and wavelengths of each multi-metal combined spectral line with respect to all reference spectral lines corresponding to each preset metal; Determine the target presence probability index of each preset metal in each multi-metal combined spectral line according to the presence probability of each preset metal in each multi-metal combined spectral line and the metal characteristic performance factor of each multi-metal combined spectral line with respect to the reference spectral line corresponding to each preset metal; Judge the metal element composition contained in the alloy to be detected based on all the target presence probability indices and all single-metal spectral lines.

[0006] Combined with the above first aspect, in a possible implementation manner, the determining the metal characteristic performance factor of each to-be-detected spectral line with respect to each reference spectral line according to the wavelengths corresponding to each to-be-detected spectral line and each reference spectral line includes: Determine any one to-be-detected spectral line as the marked to-be-detected spectral line, and determine any one reference spectral line as the marked reference spectral line; If the total width wavelength range corresponding to the marked reference spectral line is within the total width wavelength range corresponding to the marked to-be-detected spectral line, determine the metal characteristic performance factor of the marked to-be-detected spectral line with respect to the marked reference spectral line according to the total width wavelength range corresponding to the marked reference spectral line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked to-be-detected spectral line, where the total width wavelength range corresponding to the spectral line is the wavelength range where the widths on the left and right sides of the spectral line are located; If the total width wavelength range corresponding to the marked reference spectral line is not within the total width wavelength range corresponding to the marked to-be-detected spectral line, determine a preset value as the metal characteristic performance factor of the marked to-be-detected spectral line with respect to the marked reference spectral line.

[0007] Combined with the above first aspect, in a possible implementation manner, the determining the metal characteristic performance factor of the marked to-be-detected spectral line with respect to the marked reference spectral line according to the total width wavelength range corresponding to the marked reference spectral line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked to-be-detected spectral line includes: Determine the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked reference spectral line as the target wavelength corresponding to the marked reference spectral line, and determine the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked to-be-detected spectral line as the target wavelength corresponding to the marked to-be-detected spectral line; Determine the absolute value of the difference between the target wavelength corresponding to the marked reference spectral line and the target wavelength corresponding to the marked to-be-detected spectral line as the target wavelength difference between the marked reference spectral line and the marked to-be-detected spectral line; Determine the metal characteristic performance factor of the marked to-be-detected spectral line with respect to the marked reference spectral line according to the target wavelength difference between the marked reference spectral line and the marked to-be-detected spectral line, where the target wavelength difference is negatively correlated with the metal characteristic performance factor.

[0008] Combined with the above first aspect, in a possible implementation manner, determining the single-metal possibility corresponding to each detected spectral line based on the metal characteristic performance factors of all reference spectral lines for each detected spectral line and the widths on both the left and right sides of each detected spectral line includes: Determine any one detected spectral line as the marked detected spectral line, and screen out the reference spectral lines from all reference spectral lines whose corresponding total-width wavelength range is within the total-width wavelength range corresponding to the marked detected spectral line as candidate spectral lines, so as to obtain the candidate spectral line set corresponding to the marked detected spectral line; Screen out the two largest metal characteristic performance factors from the metal characteristic performance factors of all candidate spectral lines in the candidate spectral line set corresponding to the marked detected spectral line, and determine the difference between the two screened metal characteristic performance factors as the initial single-possible factor corresponding to the marked detected spectral line; Determine the absolute value of the difference between the left width and the right width corresponding to the marked detected spectral line as the target width difference corresponding to the marked detected spectral line; Determine the single-metal possibility corresponding to the marked detected spectral line according to the initial single-possible factor and the target width difference corresponding to the marked detected spectral line, where the initial single-possible factor is positively correlated with the single-metal possibility, and the target width difference is negatively correlated with the single-metal possibility.

[0009] Combined with the above first aspect, in a possible implementation manner, screening out multi-metal combination spectral lines and single-metal spectral lines from all detected spectral lines according to all single-metal possibilities includes: If the single-metal possibility corresponding to a detected spectral line is greater than the preset single-metal threshold, then determine the detected spectral line as a single-metal spectral line; If the single-metal possibility corresponding to a detected spectral line is less than or equal to the preset single-metal threshold, then determine the detected spectral line as a multi-metal combination spectral line.

[0010] Combined with the above first aspect, in a possible implementation manner, determining the presence possibility of each preset metal in each multi-metal combination spectral line according to the metal characteristic performance factors and wavelengths of all reference spectral lines corresponding to each preset metal for each multi-metal combination spectral line includes: Determine any one multi-metal combination spectral line as the marked combination spectral line, and screen out the preset metals from all preset metals that have reference spectral lines whose corresponding total-width wavelength range belongs to the total-width wavelength range corresponding to the marked combination spectral line as candidate metals, determine the preset metals other than the candidate metals among all preset metals as reference metals, and determine any one candidate metal as the marked metal; According to the spectral line intensities corresponding to all the reference spectral lines of the marked metal, the intensities are sorted in ascending order to obtain a reference spectral line sequence corresponding to the marked metal; Determine the spectral line coincidence factor between the marked combined spectral line and the marked metal according to the serial numbers and metal characteristic expression factors of all reference spectral lines in the reference spectral line sequence of the marked combined spectral line, wherein the serial numbers and metal characteristic expression factors of the reference spectral lines are positively correlated with the spectral line coincidence factor; Filter out from the reference spectral line sequence a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marked combination spectral line as a target spectral line between the marked combination spectral line and the marked metal; Determine the metal characteristic expression factor of the marked combination spectrum line to the target spectrum line as the metal representative expression factor of the marked combination spectrum line to the marked metal; Determine the possibility of the presence of the marked metal in the marked combined spectrum line according to the sequence number of the target spectrum line in the reference spectrum line sequence, the spectrum line coincidence factor between the marked combined spectrum line and the marked metal, and the metal representative performance factor of the marked combined spectrum line to the marked metal; The preset value is determined as the possibility of the presence of the reference metal in the marker combination spectrum line.

[0011] In combination with the first aspect above, in a possible implementation, the formula corresponding to the possibility of the presence of the marked metal in the marked combination spectrum line is: ; ;in, is the possibility of the presence of the marker metal in the marker combination spectrum; is the normalization function; It is the metal representative performance factor of the metal marked by the marked combination spectral line pair; It is the serial number of the target spectral line between the marked combination spectral line and the marked metal in the sequence of reference spectral lines to which it belongs; is the spectral line coincidence factor between the marked combination spectral line and the marked metal; is the number of reference spectral lines in the reference spectral line sequence corresponding to the marked metal; is the serial number of the reference spectral line in the reference spectral line sequence corresponding to the marked metal; It is the first in the reference spectral line sequence corresponding to the marked metal of the marked combination spectral line. The metal characteristic expression factor of the reference spectral line.

[0012] Combined with the above first aspect, in a possible implementation, determining the target existence probability index of each preset metal in each multi-metal combined spectral line according to the existence probability of each preset metal in each multi-metal combined spectral line and the metal characteristic performance factor of each multi-metal combined spectral line with respect to the reference spectral line corresponding to each preset metal includes: Determine any one multi-metal combined spectral line as the marked combined spectral line, and screen out from all preset metals the preset metals whose corresponding total width wavelength ranges of existence belong to the total width wavelength range corresponding to the marked combined spectral line as candidate metals, determine the preset metals other than the candidate metals among all preset metals as reference metals, and determine any one candidate metal as the marked metal; Sort the spectral line intensities corresponding to all reference spectral lines of the marked metal in ascending order to obtain the reference spectral line sequence corresponding to the marked metal; Screen out from the reference spectral line sequence the reference spectral lines whose corresponding total width wavelength ranges are within the total width wavelength range corresponding to the marked combined spectral line as the target spectral lines between the marked combined spectral line and the marked metal; Determine the metal characteristic performance factor of the marked combined spectral line with respect to the target spectral line as the metal representative performance factor of the marked combined spectral line with respect to the marked metal; Determine the target existence probability index of the marked metal in the marked combined spectral line according to the metal representative performance factor of the marked combined spectral line with respect to the marked metal and the existence probability of the marked metal in the marked combined spectral line, where both the metal representative performance factor and the existence probability are positively correlated with the target existence probability index; Determine the preset value as the target existence probability index of the reference metal in the marked combined spectral line.

[0013] Combined with the above first aspect, in a possible implementation, judging the metal element composition included in the alloy to be detected according to all the target existence probability indices and all single-metal spectral lines includes: Determine the preset metal characterized by the reference spectral line with the maximum metal characteristic performance factor corresponding to each single-metal spectral line as the target metal corresponding to each single-metal spectral line; Determine any one multi-metal combined spectral line as the marked combined spectral line, and respectively screen out from all preset metals the preset metals with the maximum and minimum target existence probability indices in the marked combined spectral line as the first metal and the second metal in sequence; Cluster all the preset metals according to the possible target presence indicators in the combined spectral lines of the markers. During the clustering process, use the first metal and the second metal as two initial clustering centers respectively, and form the set of undetermined metals corresponding to the combined spectral lines of the markers with all the preset metals in the clustering cluster with the largest possible target presence indicator. Obtain the metal element components contained in the alloy to be detected according to the target metals corresponding to all the single-metal spectral lines and the set of undetermined metals corresponding to all the multi-metal combined spectral lines.

[0014] In a second aspect, the present invention provides a rapid determination system for rare earth metals in an alloy. The system includes: A spectral line acquisition module, configured to acquire each spectral line of the alloy to be detected as the spectral line to be detected, and acquire each spectral line of each preset metal as the reference spectral line. A factor determination module, configured to determine the metal characteristic performance factor of each spectral line to be detected with respect to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line. A metal possibility determination module, configured to determine the single-metal possibility corresponding to each spectral line to be detected according to the metal characteristic performance factors of each spectral line to be detected with respect to all the reference spectral lines and the widths on both sides of each spectral line to be detected. An existence possibility determination module, configured to screen out the multi-metal combined spectral lines and single-metal spectral lines from all the spectral lines to be detected according to all the single-metal possibilities, and determine the existence possibility of each preset metal in each multi-metal combined spectral line according to the metal characteristic performance factors and wavelengths of each multi-metal combined spectral line with respect to all the reference spectral lines corresponding to each preset metal. A possible indicator determination module, configured to determine the target existence possible indicator of each preset metal in each multi-metal combined spectral line according to the existence possibility of each preset metal in each multi-metal combined spectral line and the metal characteristic performance factors of each multi-metal combined spectral line with respect to the reference spectral lines corresponding to each preset metal. A metal element component judgment module, configured to judge the metal element components contained in the alloy to be detected according to all the target existence possible indicators and all the single-metal spectral lines.

[0015] In a third aspect, a server is provided, including a memory and a processor. The memory is used to store executable program code, and the processor is used to call and run the executable program code from the memory, so that the device executes the method in the first aspect or any possible implementation manner of the first aspect.

[0016] Fourthly, a computer program product is provided, which includes computer program code that, when running on a computer, causes the computer to execute the method in the first aspect or any possible implementation manner of the first aspect described above.

[0017] Fifthly, a computer-readable storage medium is provided, which stores computer program code that, when running on a computer, causes the computer to execute the method in the first aspect or any possible implementation manner of the first aspect described above.

[0018] The present invention has the following beneficial effects: In a method for rapid determination of rare earth metals in an alloy of the present invention, through material analysis and testing, the detection of metal element components of titanium alloy is realized, solving the technical problem of poor accuracy in detecting metal elements of titanium alloy, and improving the accuracy of detecting metal elements of titanium alloy. Compared with directly detecting metal elements of titanium alloy based on the spectral line range of metals, the present invention quantifies the possibility of a single metal corresponding to each spectral line to be detected. The larger the value, the more likely it indicates that the metal element represented by the spectral line to be detected is single, and the more likely it indicates that there are less likely to be multiple metal elements manifested as the spectral line to be detected, thereby avoiding misjudgment of metal elements with spectral lines of similar elements to a certain extent. Secondly, the present invention analyzes multi-metal combination spectral lines with manifestations of multiple metal elements, and quantifies the target existence probability index of each preset metal in each multi-metal combination spectral line. The larger the value, the more likely it indicates that the multi-metal combination spectral line range is likely to include the spectral line range of the preset metal, and the more likely it indicates that the preset metal is likely to exist in the alloy to be detected, thereby improving the accuracy of detecting metal elements of the alloy to be detected. And if the preset metal is a rare earth metal, rapid determination of rare earth metals in the alloy can be achieved. Description of the Drawings

[0019] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for describing the embodiments or the prior art will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0020] Figure 1 It is a flowchart of a method for rapid determination of rare earth metals in an alloy of the present invention; Figure 2 It is a schematic composition structure diagram of a system for rapid determination of rare earth metals in an alloy of the present invention; Figure 3 It is a schematic structure diagram of a computer device of the present invention. Detailed implementation manners

[0021] To further elaborate on the technical means and effects adopted by the present invention to achieve the intended invention purpose, the following, in conjunction with the accompanying drawings and preferred embodiments, details the specific implementation manners, structures, features and effects of the technical solutions proposed according to the present invention. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures or characteristics in one or more embodiments can be combined in any suitable form.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present invention belongs.

[0023] Reference Figure 1 , shows the flow of some embodiments of a method for rapid determination of rare earth metals in an alloy of the present invention. The method for rapid determination of rare earth metals in the alloy includes the following steps: Step S1, obtain each spectral line of the alloy to be detected as the spectral line to be detected, and obtain each spectral line of each preset metal as the reference spectral line.

[0024] Among them, the alloy to be detected can be a titanium alloy to be detected for the metal element composition. The spectral line, also simply referred to as the spectral line, can be characterized by the wavelength. The preset metal can be a metal that is usually used to form a titanium alloy and is preset. For example, the preset metal can be but is not limited to: aluminum, vanadium, chromium, magnesium and manganese. When it is necessary to detect rare earth metals in a titanium alloy, the preset metal can include rare earth metals. For example, the preset metal can also be but is not limited to: cerium, lanthanum, yttrium, praseodymium, europium, gadolinium, terbium and holmium.

[0025] As an example, the alloy to be detected can be detected by LIBS (Laser-Induced Breakdown Spectroscopy) technology. At this time, the obtained spectral line can be recorded as the spectral line to be detected. And the preset metal can be detected by LIBS technology. At this time, the obtained spectral line can be recorded as the reference spectral line.

[0026] Step S2, determine the metal characteristic performance factor of each spectral line to be detected with respect to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line.

[0027] As an example, this step can include the following steps: The first step is to determine any one spectral line to be detected as the marked spectral line to be detected, and determine any one reference spectral line as the marked reference spectral line.

[0028] Second step, if the total width wavelength range corresponding to the above-mentioned marked reference spectral line is within the total width wavelength range corresponding to the above-mentioned marked spectral line to be detected, then determine the metal characteristic performance factor of the above-mentioned marked spectral line to be detected with respect to the above-mentioned marked reference spectral line according to the total width wavelength range corresponding to the above-mentioned marked reference spectral line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the above-mentioned marked spectral line to be detected.

[0029] Among them, the total width wavelength range corresponding to the spectral line can be the wavelength range where the widths on the left and right sides of the spectral line are located, that is, the spectral line range. In actual situations, the spectral line can often expand to form Doppler broadening on both sides of the center, so that the widths on the left and right sides of the spectral line can be obtained.

[0030] For example, determining the metal characteristic performance factor can specifically include the following sub-steps: First sub-step, determine the wavelength corresponding to the peak within the total width wavelength range corresponding to the above-mentioned marked reference spectral line as the target wavelength corresponding to the above-mentioned marked reference spectral line, and determine the wavelength corresponding to the peak within the total width wavelength range corresponding to the above-mentioned marked spectral line to be detected as the target wavelength corresponding to the above-mentioned marked spectral line to be detected.

[0031] Among them, the wavelength corresponding to the peak within the total width wavelength range corresponding to the spectral line is often the wavelength represented by the spectral line.

[0032] Second sub-step, determine the absolute value of the difference between the target wavelength corresponding to the above-mentioned marked reference spectral line and the target wavelength corresponding to the above-mentioned marked spectral line to be detected as the target wavelength difference between the above-mentioned marked reference spectral line and the above-mentioned marked spectral line to be detected.

[0033] Third sub-step, determine the metal characteristic performance factor of the above-mentioned marked spectral line to be detected with respect to the above-mentioned marked reference spectral line according to the target wavelength difference between the above-mentioned marked reference spectral line and the above-mentioned marked spectral line to be detected.

[0034] Among them, the target wavelength difference can be negatively correlated with the metal characteristic performance factor.

[0035] For example, if the marked reference spectral line is within the marked spectral line to be detected, the formula for determining the metal characteristic performance factor of the marked spectral line to be detected with respect to the marked reference spectral line can be: ; among them, is the metal characteristic performance factor of the marked spectral line to be detected with respect to the marked reference spectral line. is the natural exponential function. is the absolute value function. is the target wavelength corresponding to the marked spectral line to be detected, which can be represented by the wavelength represented by the marked spectral line to be detected. is the target wavelength corresponding to the marked reference spectral line, which can be represented by the wavelength characterized by the marked reference spectral line. Characterize the difference in target wavelengths.

[0036] It should be noted that when is smaller, it often indicates that the wavelength difference between the marked spectral line to be detected and the marked reference spectral line is smaller, and it often indicates that the metal element characterized by the marked spectral line to be detected may be closer to the metal element characterized by the marked reference spectral line. Therefore, when is larger, it often indicates that the metal element characterized by the marked spectral line to be detected may be closer to the metal element characterized by the marked reference spectral line.

[0037] In the third step, if the total width wavelength range corresponding to the above-mentioned marked reference spectral line is not within the total width wavelength range corresponding to the above-mentioned marked spectral line to be detected, then the preset value is determined as the metal characteristic performance factor of the above-mentioned marked spectral line to be detected with respect to the above-mentioned marked reference spectral line.

[0038] Among them, the preset value can be a pre-set value, and its value can be 0.

[0039] Step S3, according to the metal characteristic performance factors of each spectral line to be detected with respect to all reference spectral lines, and the widths on the left and right sides of each spectral line to be detected, determine the single metal possibility corresponding to each spectral line to be detected.

[0040] As an example, this step may include the following steps: In the first step, any one spectral line to be detected is determined as the marked spectral line to be detected, and the reference spectral lines whose corresponding total width wavelength ranges are within the total width wavelength range corresponding to the above-mentioned marked spectral line to be detected are screened out from all reference spectral lines as candidate spectral lines, and the candidate spectral line set corresponding to the above-mentioned marked spectral line to be detected is obtained.

[0041] In the second step, the two largest metal characteristic performance factors are screened out from the metal characteristic performance factors of all candidate spectral lines in the candidate spectral line set corresponding to the above-mentioned marked spectral line to be detected, and the difference between the two screened metal characteristic performance factors is determined as the initial single possible factor corresponding to the above-mentioned marked spectral line to be detected.

[0042] In the third step, the absolute value of the difference between the left width and the right width corresponding to the above-mentioned marked spectral line to be detected is determined as the target width difference corresponding to the above-mentioned marked spectral line to be detected.

[0043] In the fourth step, according to the initial single possible factor and the target width difference corresponding to the above-mentioned marked spectral line to be detected, determine the single metal possibility corresponding to the above-mentioned marked spectral line to be detected.

[0044] Among them, the initial single possible factor can be positively correlated with the single metal possibility. The target width difference can be negatively correlated with the single metal possibility.

[0045] For example, the formula for determining the single metal possibility corresponding to the marked spectral line to be detected can be: ; where is the single metal possibility corresponding to the marked spectral line to be detected. is the normalization function. is the maximum value among the metal characteristic performance factors of all candidate spectral lines corresponding to the marked spectral line to be detected. is the second largest metal characteristic performance factor among the metal characteristic performance factors of all candidate spectral lines corresponding to the marked spectral line to be detected. represents the initial single possible factor. is the absolute value function. is the left width corresponding to the marked spectral line to be detected. is the right width corresponding to the marked spectral line to be detected. characterizes the target width difference. is a factor greater than 0 set in advance, mainly used to prevent the denominator from being 0. For example, can be 0.001.

[0046] It should be noted that since metal atoms often cause symmetric expansion on both sides of the spectral line center to form Doppler broadening, resulting in the consistency of the widths on the left and right sides of the spectral line. The stronger the consistency, the more likely the spectral line is to exhibit a single metal component. On the contrary, if there are multiple metal elements in the spectral line range, it may cause spectral line overlap. The wavelength corresponding to the peak in the spectral line range may be interfered by the spectral lines of multiple metal elements, resulting in it not being at the center position of the spectral line range, thereby causing the spectral line not to be at the center position and further causing the symmetry to be broken. Therefore, when is smaller, it often indicates that the widths on the left and right sides of the marked spectral line to be detected are closer, often indicating that the widths on the left and right sides of the marked spectral line to be detected are more consistent, and often indicating that the marked spectral line is more likely to characterize a single metal element. When is larger, it often indicates that there is more likely to be a metal characteristic performance factor in the metal characteristic performance factors of all candidate spectral lines corresponding to the marked spectral line to be detected that is much larger than other metal characteristic performance factors, and often indicates that the marked spectral line is more likely to characterize a single metal element. Therefore, when is larger, it often indicates that the marked spectral line is more likely to characterize a single metal element.

[0047] Step S4: According to all single-metal possibilities, filter out multi-metal combination spectral lines and single-metal spectral lines from all spectral lines to be detected, and determine the possibility of each preset metal existing in each multi-metal combination spectral line based on the metal characteristic performance factors and wavelengths of all reference spectral lines corresponding to each preset metal for each multi-metal combination spectral line.

[0048] As an example, this step may include the following steps: The first step: If the single-metal possibility corresponding to the spectral line to be detected is greater than the preset single-metal threshold, then determine the spectral line to be detected as a single-metal spectral line.

[0049] Among them, the preset single-metal threshold can be a threshold set in advance. For example, the preset single-metal threshold can be 0.5.

[0050] The second step: If the single-metal possibility corresponding to the spectral line to be detected is less than or equal to the preset single-metal threshold, then determine the spectral line to be detected as a multi-metal combination spectral line.

[0051] The third step: Determine any multi-metal combination spectral line as the marked combination spectral line, and screen out the preset metals among all preset metals for which there are reference spectral lines whose corresponding total-width wavelength ranges belong to the total-width wavelength range corresponding to the marked combination spectral line as candidate metals, determine the preset metals other than the candidate metals among all preset metals as reference metals, and determine any one of the candidate metals as the marked metal.

[0052] For example, if there is a reference spectral line among the multiple reference spectral lines corresponding to a certain preset metal whose corresponding total-width wavelength range is within the total-width wavelength range corresponding to the marked combination spectral line, then this preset metal can be determined as a candidate metal.

[0053] It should be noted that among the multiple reference spectral lines corresponding to a metal, there is usually at most one reference spectral line whose corresponding total-width wavelength range is within the total-width wavelength range corresponding to the spectral line to be detected.

[0054] The fourth step: Sort the spectral line intensities corresponding to all reference spectral lines of the above-mentioned marked metal in ascending order to obtain the reference spectral line sequence corresponding to the above-mentioned marked metal.

[0055] Among them, the spectral line intensity generally refers to the degree of increase or decrease of the light intensity at a certain wavelength relative to the baseline. The calculation of this intensity can depend on different spectroscopic techniques and applications. For example, the measurement of the spectral line intensity can be achieved by the height of the spectral line peak or the maximum value on the spectrogram.

[0056] The fifth step is to determine the spectral line overlap factor between the above-mentioned marked combination spectral line and the above-mentioned marked metal according to the serial numbers of all reference spectral lines in the above-mentioned reference spectral line sequence and the metal characteristic expression factors of the above-mentioned marked combination spectral line.

[0057] Among them, the reference spectral line number and the metal characteristic expression factor can be positively correlated with the spectral line coincidence factor.

[0058] The sixth step is to select from the reference spectral line sequence a reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marked combination spectral line as a target spectral line between the marked combination spectral line and the marked metal.

[0059] It should be noted that among the multiple reference spectral lines corresponding to a metal, there is often at most one reference spectral line whose corresponding total width wavelength range is within the total width wavelength range corresponding to the spectral line to be detected. Therefore, there is often only one target spectral line between the marked combination spectral line and the marked metal.

[0060] The seventh step is to determine the metal characteristic expression factor of the above-mentioned marked combination spectrum line to the above-mentioned target spectrum line as the metal representative expression factor of the above-mentioned marked combination spectrum line to the above-mentioned marked metal.

[0061] The eighth step is to determine the possibility of the existence of the above-mentioned marked metal in the above-mentioned marked combination spectrum line based on the serial number of the above-mentioned target spectrum line in the above-mentioned reference spectrum line sequence, the spectrum line overlap factor between the above-mentioned marked combination spectrum line and the above-mentioned marked metal, and the metal representative expression factor of the above-mentioned marked combination spectrum line to the above-mentioned marked metal.

[0062] For example, the formula corresponding to determining the possibility of the presence of the marker metal in the marker combination spectrum line can be: ; ;in, is the possibility of the presence of the labeled metal in the labeled combination spectral lines. is a normalization function. It is the metal representative performance factor of the metal marked by the marked combination spectral line pair. It is the serial number of the target spectral line between the marked combination spectral line and the marked metal in the reference spectral line sequence to which it belongs. It is the spectral line coincidence factor between the marked combination spectral lines and the marked metal. is the number of reference spectral lines in the reference spectral line sequence corresponding to the marked metal. It is the serial number of the reference spectral line in the reference spectral line sequence corresponding to the marked metal. It is the first in the reference spectral line sequence corresponding to the marked metal of the marked combination spectral line. The metal characteristic expression factor of the reference spectral line.

[0063] It should be noted that when is larger, it often indicates that the intensity of the reference spectral line is higher, and it often indicates that the reference spectral line may be more important. When is larger, it often indicates that the th metal element characterized by the reference spectral line may be closer to the metal element characterized by the marker combination spectral line. Therefore, when is larger, it often indicates that the th reference spectral line and the marker combination spectral line may have a higher degree of coincidence. Therefore, can characterize the average degree of coincidence between the marker combination spectral line and the reference spectral line sequence corresponding to the marker metal. The larger its value, the more likely it is that the metal element composition characterized by the marker combination spectral line contains the marker metal. When is larger, it often indicates that the intensity of the target spectral line between the marker combination spectral line and the marker metal is higher, and it often indicates that the target spectral line between the marker combination spectral line and the marker metal may be more important. When is larger, it often indicates that the metal element composition characterized by the marker combination spectral line is more likely to contain the marker metal. Therefore, when is larger, it often indicates that the metal element composition characterized by the marker combination spectral line is more likely to contain the marker metal.

[0064] Step 9, determine the possibility of the reference metal existing in the above marker combination spectral line as a preset value.

[0065] Among them, the preset value can be a pre-set value, and its value can be 0.

[0066] Step S5, according to the possibility of each preset metal existing in each multi-metal combination spectral line, and the metal characteristic performance factor of each multi-metal combination spectral line for the reference spectral line corresponding to each preset metal, determine the target existence possible index of each preset metal in each multi-metal combination spectral line.

[0067] As an example, this step may include the following steps: First step, determine any multi-metal combination spectral line as the marker combination spectral line, and screen out the preset metals from all preset metals whose total width wavelength range corresponding to the reference spectral line belongs to the total width wavelength range corresponding to the marker combination spectral line as candidate metals, determine the preset metals other than the candidate metals among all preset metals as reference metals, and determine any candidate metal as the marker metal.

[0068] Second step, sort the spectral line intensities corresponding to all reference spectral lines of the above marker metal in ascending order to obtain the reference spectral line sequence corresponding to the above marker metal; Step 3: Screen out the reference spectral lines from the above reference spectral line sequence whose corresponding total width wavelength range is within the total width wavelength range of the above marked combined spectral lines as the target spectral lines between the above marked combined spectral lines and the above marked metal.

[0069] Step 4: Determine the metal characteristic performance factor of the above marked combined spectral lines with respect to the above target spectral lines as the metal representative performance factor of the above marked combined spectral lines with respect to the above marked metal.

[0070] Step 5: Determine the target existence probability index of the above marked metal in the above marked combined spectral lines according to the metal representative performance factor of the above marked combined spectral lines with respect to the above marked metal and the existence probability of the above marked metal in the above marked combined spectral lines.

[0071] Among them, both the metal representative performance factor and the existence probability can be positively correlated with the target existence probability index.

[0072] For example, the formula for determining the target existence probability index of the marked metal in the marked combined spectral lines can be: ; where is the target existence probability index of the marked metal in the marked combined spectral lines. is the metal representative performance factor of the marked combined spectral lines with respect to the marked metal. is the existence probability of the marked metal in the marked combined spectral lines.

[0073] It should be noted that when is larger, it often indicates that the metal element composition represented by the marked combined spectral lines is more likely to contain the marked metal. When is larger, it often indicates that the metal element composition represented by the marked combined spectral lines is more likely to contain the marked metal. Therefore, when is larger, it often indicates that the metal element composition represented by the marked combined spectral lines is more likely to contain the marked metal.

[0074] Step 6: Determine the preset value as the target existence probability index of the reference metal in the above marked combined spectral lines.

[0075] Among them, the preset value can be a pre-set value, and its value can be 0.

[0076] Step S6: Judge the metal element composition contained in the alloy to be detected according to all the target existence probability indexes and all the single metal spectral lines.

[0077] As an example, this step may include the following steps: In the first step, the preset metal characterized by the reference spectrum of the maximum metal characteristic performance factor corresponding to each single metal spectrum is determined as the target metal corresponding to each single metal spectrum.

[0078] Among them, the maximum metal characteristic performance factor corresponding to a single metal spectrum is the maximum value among the metal characteristic performance factors of all reference spectra for this single metal spectrum. The target metal corresponding to a single metal spectrum is the metal characterized by this single metal spectrum.

[0079] In the second step, any multi-metal combined spectrum is determined as the marked combined spectrum, and the preset metals with the largest and smallest possible target presence indicators in the above marked combined spectrum are respectively screened out from all preset metals, and are used as the first metal and the second metal in sequence.

[0080] In the third step, according to the possible target presence indicators of all preset metals in the above marked combined spectrum, all preset metals are clustered. During the clustering process, the first metal and the second metal are used as two initial clustering centers respectively, and all preset metals in the clustering cluster with the largest possible target presence indicator are used to form the set of undetermined metals corresponding to the above marked combined spectrum.

[0081] In the fourth step, according to the target metals corresponding to all single metal spectra and the set of undetermined metals corresponding to all multi-metal combined spectra, the metal element components contained in the alloy to be detected are obtained.

[0082] For example, the metal elements characterized by the target metals corresponding to all single metal spectra and the metal elements characterized by all preset metals in the set of undetermined metals corresponding to all multi-metal combined spectra can be used to form the metal element components contained in the alloy to be detected.

[0083] Optionally, the present invention can also use content detection to complete the composition detection of the alloy. Specifically, a content detection algorithm for the sample metal composition can be constructed based on the existing metal components, such as a spectral analysis algorithm, to obtain the content of the metal components, so as to complete the composition analysis of the titanium alloy. The specific steps are as follows: In the first step, model selection: Select a suitable model to establish the relationship between spectral data and metal component content. Common models include linear regression, principal component analysis (PCA), partial least squares regression (PLSR), etc.

[0084] In the second step, algorithm training: Use the extracted features and known metal component content data to train the model. This process may require the use of techniques such as cross-validation to optimize the model parameters.

[0085] In the third step, model evaluation: Evaluate the prediction ability of the model, usually using indicators such as mean square error (MSE), coefficient of determination (R²), etc.

[0086] Step 4, Algorithm Optimization: Optimize the algorithm based on the results of model evaluation, which may include adjusting feature extraction methods, improving model structures or parameters, etc.

[0087] Step 5, Algorithm Verification: Use an independent validation set to test the accuracy and generalization ability of the algorithm.

[0088] Step 6, Algorithm Application: Apply the trained algorithm to the actual detection of metal component content.

[0089] Reference Figure 2 , based on the same inventive concept as the above method embodiment, the present invention provides a rapid determination system for rare earth metals in an alloy. The system includes a memory, a processor, and a computer program stored on the memory and executable on the processor. When the above computer program is executed by the processor, it implements the steps of a rapid determination method for rare earth metals in an alloy, which may specifically include: A spectral line acquisition module 201, configured to acquire each spectral line of the alloy to be detected as the spectral line to be detected, and acquire each spectral line of each preset metal as the reference spectral line; A factor determination module 202, configured to determine the metal characteristic performance factor of each spectral line to be detected with respect to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line; A single metal possibility determination module 203, configured to determine the single metal possibility corresponding to each spectral line to be detected according to the metal characteristic performance factors of each spectral line to be detected with respect to all reference spectral lines and the widths on both sides of each spectral line to be detected; An existence possibility determination module 204, configured to screen out multi-metal combination spectral lines and single metal spectral lines from all spectral lines to be detected according to all single metal possibilities, and determine the existence possibility of each preset metal in each multi-metal combination spectral line according to the metal characteristic performance factors and wavelengths of each multi-metal combination spectral line with respect to all reference spectral lines corresponding to each preset metal; A possible index determination module 205, configured to determine the target existence possible index of each preset metal in each multi-metal combination spectral line according to the existence possibility of each preset metal in each multi-metal combination spectral line and the metal characteristic performance factors of each multi-metal combination spectral line with respect to the reference spectral lines corresponding to each preset metal; A metal element composition judgment module 206, configured to judge the metal element composition included in the alloy to be detected according to all target existence possible indexes and all single metal spectral lines.

[0090] Figure 3 is a schematic structural diagram of a computer device provided by an embodiment of the present invention. Exemplarily, as Figure 3As shown in the figure, the computer device 300 includes: a memory 301, a processor 302, and a computer program 303 stored in the memory 301 and running on the processor 302. When the processor 302 executes the computer program 303, the computer device can execute any of the rapid determination methods of rare earth metals in the alloys introduced above.

[0091] Based on the same inventive concept as the above method embodiments, the present invention provides a server, including a memory and a processor. The memory is used to store executable program codes, and the processor is used to call and run the executable program codes from the memory, so that the device executes any of the rapid determination methods of rare earth metals in the alloys above.

[0092] Based on the same inventive concept as the above method embodiments, the present invention provides a computer program product, which includes: computer program codes. When the computer program codes run on a computer, the computer is enabled to execute any of the rapid determination methods of rare earth metals in the alloys above.

[0093] Based on the same inventive concept as the above method embodiments, the present invention provides a computer-readable storage medium, which stores computer program codes. When the computer program codes run on a computer, the computer is enabled to execute any of the rapid determination methods of rare earth metals in the alloys above.

[0094] In summary, compared with directly detecting titanium alloy metal elements based on the spectral line range of metals, the present invention quantifies the possibility of a single metal corresponding to each spectral line to be detected. The larger the value, the more likely it indicates that the metal element represented by the spectral line to be detected is single, and the more likely it indicates that there are no multiple metal elements showing as the spectral line to be detected. Thus, it can avoid misjudgment of metal elements with spectral lines of similar elements to a certain extent. Secondly, the present invention analyzes the multi-metal combination spectral lines with multiple metal elements, and quantifies the target existence probability index of each preset metal in each multi-metal combination spectral line. The larger the value, the more likely it indicates that the multi-metal combination spectral line range is more likely to contain the spectral line range of the preset metal, and the more likely it indicates that the preset metal is more likely to exist in the alloy to be detected. Therefore, the accuracy of detecting metal elements in the alloy to be detected is improved.

[0095] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present invention, and all should be included in the protection scope of the present invention.

Claims

1. A rapid determination method for rare earth metals in an alloy, characterized in that, Including the following steps: Obtain each spectral line of the alloy to be detected as the spectral line to be detected, and obtain each spectral line of each preset metal as the reference spectral line; Determine the metal characteristic performance factor of each spectral line to be detected with respect to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line; Determine the possibility of a single metal corresponding to each spectral line to be detected according to the metal characteristic performance factors of each spectral line to be detected with respect to all reference spectral lines and the widths on both sides of each spectral line to be detected; Screen out the multi-metal combination spectral lines and single-metal spectral lines from all spectral lines to be detected according to all single-metal possibilities, and determine the possibility of existence of each preset metal in each multi-metal combination spectral line according to the metal characteristic performance factors and wavelengths of all reference spectral lines corresponding to each preset metal for each multi-metal combination spectral line; Determine the target possible existence index of each preset metal in each multi-metal combination spectral line according to the possibility of existence of each preset metal in each multi-metal combination spectral line and the metal characteristic performance factors of the reference spectral lines corresponding to each preset metal for each multi-metal combination spectral line; Judge the metal element composition contained in the alloy to be detected according to all target possible existence indexes and all single-metal spectral lines; Among them, the method for obtaining the target possible existence index is: Determine any multi-metal combination spectral line as the marked combination spectral line, and screen out the preset metals whose corresponding total width wavelength ranges of the reference spectral lines belong to the total width wavelength range corresponding to the marked combination spectral line from all preset metals as candidate metals, determine the preset metals other than the candidate metals among all preset metals as reference metals, and determine any one of the candidate metals as the marked metal; Sort the spectral line intensities corresponding to all reference spectral lines of the marked metal in ascending order to obtain the reference spectral line sequence corresponding to the marked metal; Screen out the reference spectral lines whose corresponding total width wavelength ranges are within the total width wavelength range corresponding to the marked combination spectral line from the reference spectral line sequence as the target spectral lines between the marked combination spectral line and the marked metal; Determine the metal characteristic performance factor of the marked combination spectral line with respect to the target spectral line as the metal representative performance factor of the marked combination spectral line with respect to the marked metal; Determine the target possible existence index of the marked metal in the marked combination spectral line according to the metal representative performance factor of the marked combination spectral line with respect to the marked metal and the possibility of existence of the marked metal in the marked combination spectral line, where both the metal representative performance factor and the possibility of existence are positively correlated with the target possible existence index; Determine the preset value as the target possible existence index of the reference metal in the marked combination spectral line.

2. The rapid determination method of rare earth metals in an alloy according to claim 1, characterized in that, The determining the metal characteristic performance factor of each spectral line to be detected with respect to each reference spectral line according to the wavelengths corresponding to each spectral line to be detected and each reference spectral line includes: Determine any spectral line to be detected as the marked spectral line to be detected, and determine any reference spectral line as the marked reference spectral line; If the total width wavelength range corresponding to the marked reference spectral line is within the total width wavelength range corresponding to the marked spectral line to be detected, then, based on the total width wavelength range corresponding to the marked reference spectral line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked spectral line to be detected, determine the metal characteristic performance factor of the marked spectral line to be detected with respect to the marked reference spectral line, where the total width wavelength range corresponding to a spectral line is the wavelength range where the widths on the left and right sides of the spectral line are located; If the total width wavelength range corresponding to the marked reference spectral line is not within the total width wavelength range corresponding to the marked spectral line to be detected, then determine a preset value as the metal characteristic performance factor of the marked spectral line to be detected with respect to the marked reference spectral line.

3. The rapid determination method of rare earth metals in an alloy according to claim 2, characterized in that, The determining the metal characteristic performance factor of the marked spectral line to be detected with respect to the marked reference spectral line based on the total width wavelength range corresponding to the marked reference spectral line and the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked spectral line to be detected includes: Determine the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked reference spectral line as the target wavelength corresponding to the marked reference spectral line, and determine the wavelength corresponding to the peak within the total width wavelength range corresponding to the marked spectral line to be detected as the target wavelength corresponding to the marked spectral line to be detected; Determine the absolute value of the difference between the target wavelength corresponding to the marked reference spectral line and the target wavelength corresponding to the marked spectral line to be detected as the target wavelength difference between the marked reference spectral line and the marked spectral line to be detected; Based on the target wavelength difference between the marked reference spectral line and the marked spectral line to be detected, determine the metal characteristic performance factor of the marked spectral line to be detected with respect to the marked reference spectral line, where the target wavelength difference is negatively correlated with the metal characteristic performance factor.

4. A rapid determination method for rare earth metals in an alloy according to claim 1, characterized in that, The determining the single metal possibility corresponding to each spectral line to be detected based on the metal characteristic performance factors of each spectral line to be detected with respect to all reference spectral lines and the widths on the left and right sides of each spectral line to be detected includes: Determine any spectral line to be detected as the marked spectral line to be detected, and screen out the reference spectral lines whose corresponding total width wavelength ranges are within the total width wavelength range corresponding to the marked spectral line to be detected from all reference spectral lines as candidate spectral lines, to obtain the candidate spectral line set corresponding to the marked spectral line to be detected; Screen out the two largest metal characteristic performance factors from the metal characteristic performance factors of all candidate spectral lines in the candidate spectral line set corresponding to the marked spectral line to be detected, and determine the difference between the two screened metal characteristic performance factors as the initial single possible factor corresponding to the marked spectral line to be detected; Determine the absolute value of the difference between the left width and the right width corresponding to the marked spectral line to be detected as the target width difference corresponding to the marked spectral line to be detected; Based on the initial single possible factor and the target width difference corresponding to the marked spectral line to be detected, determine the single metal possibility corresponding to the marked spectral line to be detected, where the initial single possible factor is positively correlated with the single metal possibility, and the target width difference is negatively correlated with the single metal possibility.

5. A rapid determination method for rare earth metals in an alloy according to claim 1, characterized in that, Screening out multi-metal combined spectral lines and single-metal spectral lines from all spectral lines to be detected according to all single-metal possibilities, including: If the single-metal possibility corresponding to the spectral line to be detected is greater than the preset single-metal threshold, the spectral line to be detected is determined as a single-metal spectral line; If the single-metal possibility corresponding to the spectral line to be detected is less than or equal to the preset single-metal threshold, the spectral line to be detected is determined as a multi-metal combined spectral line.

6. The rapid determination method of rare earth metals in an alloy according to claim 1, characterized in that, Determining the presence possibility of each preset metal in each multi-metal combined spectral line according to the metal characteristic performance factors and wavelengths of all reference spectral lines corresponding to each preset metal for each multi-metal combined spectral line, including: Determine any multi-metal combined spectral line as a marked combined spectral line, and screen out the preset metals from all preset metals whose total width wavelength range corresponding to the reference spectral lines exists within the total width wavelength range corresponding to the marked combined spectral line as candidate metals, determine the preset metals other than the candidate metals among all preset metals as reference metals, and determine any one of the candidate metals as a marked metal; Sort the spectral line intensities corresponding to all reference spectral lines of the marked metal in ascending order to obtain the reference spectral line sequence corresponding to the marked metal; Determine the spectral line coincidence factor between the marked combined spectral line and the marked metal according to the serial numbers and metal characteristic performance factors of all reference spectral lines in the reference spectral line sequence by the marked combined spectral line, wherein the serial number and metal characteristic performance factor of the reference spectral line are both positively correlated with the spectral line coincidence factor; Screen out the reference spectral lines whose corresponding total width wavelength range is within the total width wavelength range corresponding to the marked combined spectral line from the reference spectral line sequence as the target spectral lines between the marked combined spectral line and the marked metal; Determine the metal characteristic performance factor of the marked combined spectral line for the target spectral line as the metal representative performance factor of the marked combined spectral line for the marked metal; Determine the presence possibility of the marked metal in the marked combined spectral line according to the serial number of the target spectral line in the reference spectral line sequence, the spectral line coincidence factor between the marked combined spectral line and the marked metal, and the metal representative performance factor of the marked combined spectral line for the marked metal; Determine the preset value as the presence possibility of the reference metal in the marked combined spectral line.

7. The rapid determination method of rare earth metals in an alloy according to claim 6, characterized in that The formula for the presence possibility of the marked metal in the marked combined spectral line is: ； ; wherein, is the possibility of the presence of the labeled metal in the combined labeled spectral lines; is a normalization function; is the metal representative performance factor of the combined labeled spectral lines for the labeled metal; is the serial number of the target spectral line between the combined labeled spectral lines and the labeled metal in the reference spectral line sequence to which it belongs; is the spectral line coincidence factor between the combined labeled spectral lines and the labeled metal; is the number of reference spectral lines in the reference spectral line sequence corresponding to the labeled metal; is the serial number of the reference spectral line in the reference spectral line sequence corresponding to the labeled metal; is the metal characteristic performance factor of the combined labeled spectral lines for the th reference spectral line in the reference spectral line sequence corresponding to the labeled metal.

8. A rapid determination method for rare earth metals in an alloy according to claim 1, characterized in that, Judging the metal element components contained in the alloy to be detected according to all target presence possible indicators and all single-metal spectral lines, including: Determine the preset metal characterized by the reference spectral line with the maximum metal characteristic performance factor corresponding to each single-metal spectral line as the target metal corresponding to each single-metal spectral line; Determine any multi-metal combined spectral line as a marked combined spectral line, and screen out the preset metals with the maximum and minimum target presence possible indicators in the marked combined spectral line from all preset metals as the first metal and the second metal in sequence; Cluster all the preset metals according to the possible target presence indicators in the combined marker spectrum. During the clustering process, use the first metal and the second metal as two initial clustering centers respectively, and form the set of undetermined metals corresponding to the combined marker spectrum by including all the preset metals in the clustering cluster with the largest possible target presence indicator. Obtain the metal element composition contained in the alloy to be detected based on the target metals corresponding to all single-metal spectra and the set of undetermined metals corresponding to all multi-metal combined spectra.

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