Temperature shock test device and method

Abstract

The invention provides a temperature impact test device. The temperature impact test device comprises a high-temperature test box and a low-temperature test box which are arranged side by side, the high-temperature test box is communicated with the low-temperature test box through a hole; conveying devices are arranged in the high-temperature test box and the low-temperature test box, the conveying devices are used for bearing and conveying the to-be-tested product, and the to-be-tested product moves between the high-temperature test box and the low-temperature test box under the conveying action of the conveying devices; the hole is provided with an electric control blocking door, and the electric control blocking door is used for removing blocking when the product to be tested needs to penetrate through the hole and blocking the hole when the product to be tested does not need to penetrate through the hole. According to the invention, the efficiency, safety and precision of the temperature impact test of the to-be-tested product can be significantly improved.

Description

Technical Field

[0001] The present application relates to the technical field of test devices, and in particular to a temperature shock test device and method. Background Art

[0002] At present, when conducting temperature shock tests on slender and large-sized products, two independent large temperature chambers are generally used (one large temperature chamber maintains the target low temperature, and the other large temperature chamber maintains the target high temperature). The product is kept in the low (high) temperature chamber for a long enough time, and then the doors of the two large temperature chambers are opened, and the product is transferred from the low (high) temperature chamber to the high (low) temperature chamber by a forklift, and then the temperature chamber doors are closed. When the temperature in the temperature chamber reaches the target value again, the conversion process of the temperature shock test is completed.

[0003] The test requires the use of a forklift to transfer the product, resulting in lower safety and reliability; the transfer operation process is cumbersome, resulting in a longer transfer time, affecting the test efficiency; and the test chamber door needs to be opened during the transfer process, resulting in a large temperature loss, affecting the test accuracy. Summary of the invention

[0004] In view of this, the purpose of this application is to propose a temperature shock test device and method to solve all or part of the technical problems involved in the background technology.

[0005] Based on the above purpose, the present application provides a temperature shock test device, including a high temperature test chamber and a low temperature test chamber arranged side by side;

[0006] The high temperature test chamber and the low temperature test chamber are connected through a hole;

[0007] The high temperature test chamber and the low temperature test chamber are both provided with a conveying device, and the conveying device is used to carry and convey the product to be tested, and the product to be tested moves between the high temperature test chamber and the low temperature test chamber under the conveying action of the conveying device;

[0008] An electrically controlled blocking door is provided on the hole, and the electrically controlled blocking door is used to release the blockage when the product to be tested needs to pass through the hole, and to block the hole when the product to be tested does not need to pass through the hole.

[0009] Furthermore, the electrically controlled blocking door comprises a vertical heat insulation board, a first transverse heat insulation board and a second transverse heat insulation board, the vertical heat insulation board is vertically slidably connected to the hole, the first transverse heat insulation board and the second transverse heat insulation board are arranged side by side and are both transversely slidably connected to the hole, the area of ​​the vertical heat insulation board is adapted to the size of the hole, and the sum of the areas of the first transverse heat insulation board and the second transverse heat insulation board is adapted to the size of the hole;

[0010] When the electrically controlled blocking door is used to block the hole, the vertical heat insulation board moves vertically to be arranged opposite to the hole, and the first transverse heat insulation board and the second transverse heat insulation board move closer to each other to be arranged opposite to the hole, so as to block the hole together;

[0011] When the electrically controlled blocking door is used to unblock the hole, the vertical insulation board moves toward the top or bottom of the hole, and the first transverse insulation board and the second transverse insulation board move away from each other toward the two sides of the hole.

[0012] Furthermore, the electrically controlled blocking door also includes a first driving member, a second driving member and a third driving member, the first driving member is connected to the vertical insulation board, the second driving member is connected to the first transverse insulation board, and the third driving member is connected to the second transverse insulation board.

[0013] Furthermore, the hole includes a first surface and a second surface that are arranged opposite to each other, the vertical insulation board is arranged close to the first surface, and the first transverse insulation board and the second transverse insulation board are arranged close to the second surface and are arranged equidistantly from the vertical insulation board.

[0014] Further, the device also includes a moving component, which is located on the conveying device to move under the conveying action of the conveying device;

[0015] The moving assembly is used to connect with the product to be tested, and drive the product to be tested to move between the high temperature test chamber and the low temperature test chamber.

[0016] Furthermore, the moving assembly includes a moving pallet and a snap ring, the moving pallet is located on the conveying device, the snap ring is connected to a side of the moving pallet away from the conveying device, and the snap ring is used to be detachably connected to the product to be tested.

[0017] Furthermore, the mobile pallet truck comprises a U-shaped plate body, a connecting rod and a sliding member, wherein the U-shaped plate body is covered on the top of the conveying device, and the connecting rod and the sliding member are located on the U-shaped plate body;

[0018] The sliding member is used to abut against the side surface of the conveying device, and the connecting rod is used to abut against the top surface of the conveying device. The conveying device drives the U-shaped plate and the sliding member to move through the connecting rod.

[0019] Further, the device further includes a normal temperature test chamber, which is arranged side by side with the high temperature test chamber and the low temperature test chamber and is located between the high temperature test chamber and the low temperature test chamber. The high temperature test chamber is communicated with the normal temperature test chamber through a first hole, and the normal temperature test chamber is communicated with the low temperature test chamber through a second hole. Electrically controlled blocking doors are provided on both the first hole and the second hole.

[0020] Further, a conveying device is provided in the normal temperature test chamber, and both ends of the conveying device are oppositely arranged with the first hole and the second hole respectively.

[0021] Further, both the high temperature test chamber and the low temperature test chamber include a first space and a second space. A partition door is provided between the first space and the second space. When the partition door is opened, the first space and the second space are communicated; when the partition door is closed, the first space and the second space are separated.

[0022] Based on the same inventive concept, the present application further provides a method for controlling the temperature shock test device as described in any one of the above, including:

[0023] Obtain the real-time temperature in the test chamber where the product to be tested is located;

[0024] In response to determining that the real-time temperature is the same as the target test temperature of the test chamber and the continuous duration is a preset duration, determine the target test chamber for the product to be tested based on the test chamber;

[0025] Start the conveying device and the electrically controlled blocking door based on the target test chamber;

[0026] In response to determining that the test chamber where the product to be tested is located is the target test chamber, close the conveying device and the electrically controlled blocking door.

[0027] Further, the method further includes:

[0028] In response to determining that the product to be tested and the hole are in a gradually approaching state and the distance between the hole and the product to be tested is less than or equal to the target distance, start the electrically controlled blocking door corresponding to the hole;

[0029] In response to determining that the distance between the product to be tested and the hole is in a gradually moving away state, close the electrically controlled blocking door corresponding to the hole.

[0030] Further, the starting the conveying device based on the target test chamber includes:

[0031] Determine the moving direction of the product to be tested based on the target test chamber;

[0032] Determine the conveying direction of the conveying device based on the moving direction;

[0033] Start the conveying device based on the conveying direction.

[0034] Further, the starting the conveying device based on the conveying direction includes:

[0035] Start the conveying device in the test chamber where the product to be tested is located based on the conveying direction;

[0036] In response to determining that the electric control plugging door is opened, determine the test chamber close to the electric control plugging door in the conveying direction, and start the conveying device in this test chamber based on the conveying direction;

[0037] In response to determining that the electric control plugging door is closed, determine the test chamber far from the electric control plugging door in the conveying direction, and close the conveying device in this test chamber.

[0038] Further, the starting the electric control plugging door corresponding to the hole includes:

[0039] Obtain the maximum cross-sectional area of the product to be tested;

[0040] Determine the opening area of the electric control plugging door based on the maximum cross-sectional area;

[0041] Start the electric control plugging door based on the opening area.

[0042] Based on the same inventive concept, the present disclosure also provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable by the processor. When the processor executes the computer program, the method described above is implemented.

[0043] From the above, it can be seen that the temperature shock test device and method provided by the present application, wherein the temperature shock test device connects or disconnects the high-temperature test chamber and the low-temperature test chamber by setting holes and electrically controlled blocking doors, and sets a conveying device to transfer the product to be tested between the high-temperature test chamber and the low-temperature test chamber, thereby realizing the transfer of the product to be tested between the high-temperature test chamber and the low-temperature test chamber to complete the temperature shock test; the setting of the conveying device can greatly improve the convenience and stability of the transfer of the product to be tested, thereby shortening the transfer efficiency of the product to be tested between the high-temperature test chamber and the low-temperature test chamber, and can greatly improve the test efficiency and transfer safety and reliability of the temperature shock test device; and, the setting of the conveying device and the electrically controlled blocking door can realize the automation of the test process of the test device, reduce the test cost, and is conducive to promotion and application; the setting of the electrically controlled blocking door can reduce the opening area of ​​the high-temperature test chamber or the low-temperature test chamber, thereby reducing the temperature loss of the high-temperature test chamber and the temperature test chamber during the transfer of the product to be tested, which is conducive to improving the test accuracy of the test device. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the technical solutions in the present application or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0045] Figure 1 This is a schematic diagram of the main structure of the temperature shock test device of the embodiment of the present application;

[0046] Figure 2 This is a schematic diagram of the main structure of the electric-controlled blocking door according to an embodiment of the present application;

[0047] Figure 3 It is a schematic diagram of the three-dimensional structure of the conveying device and the moving assembly (without the clamp ring) according to the embodiment of the present application;

[0048] Figure 4 This is a schematic diagram of the three-dimensional structure of the mobile pallet truck according to an embodiment of the present application;

[0049] Figure 5 A schematic diagram of the flow structure of a method for controlling a temperature shock test device according to an embodiment of the present application;

[0050] Figure 6 This is a schematic diagram of the structure of a device according to an embodiment of the present application;

[0051] Figure 7 This is a schematic diagram of the structure of an electronic device according to an embodiment of the present application.

[0052] In the figure: 100, high-temperature test chamber; 200, low-temperature test chamber; 300, hole; 400, conveying device; 500, electric control plugging door; 510, vertical heat insulation plate; 520, first horizontal heat insulation plate; 530, second horizontal heat insulation plate; 600, moving assembly; 610, moving trolley; 611, ∠-shaped plate body; 612, connecting rod; 613, sliding member; 700, normal-temperature test chamber. Detailed implementation manners

[0053] To make the objectives, technical solutions, and advantages of the present application clearer and more understandable, the following further elaborates on the present application in detail in combination with specific embodiments and with reference to the accompanying drawings.

[0054] It should be noted that unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present application should have the ordinary meanings understood by those with ordinary skills in the field to which the present application belongs. The "first", "second", and similar terms used in the embodiments of the present application do not indicate any order, quantity, or importance, but are only used to distinguish different components. The terms such as "including" or "comprising" mean that the elements or objects appearing before this word cover the elements or objects listed after this word and their equivalents, without excluding other elements or objects. The terms such as "connected" or "coupled" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The terms such as "upper", "lower", "left", and "right" are only used to represent relative positional relationships, and when the absolute position of the object being described changes, the relative positional relationship may also change accordingly.

[0055] As described in the background art, currently, when conducting a temperature shock test on an elongated large-size product, generally two mutually independent large temperature chambers are used (one large temperature chamber maintains the target low temperature, and the other large temperature chamber maintains the target high temperature). When moving the elongated large-size product between the high-temperature chamber and the low-temperature chamber, a forklift is required for transportation, resulting in relatively low safety and reliability, which not only affects the test efficiency but also causes temperature loss in the two temperature chambers, affecting the test accuracy.

[0056] Therefore, the present application proposes a temperature shock test device and method. By providing a high-temperature test chamber and a low-temperature test chamber connected through a hole and arranging a conveying device therein to play the role of carrying and conveying the product to be tested, it can not only reduce the temperature loss in the high-temperature test chamber and the low-temperature test chamber during the conveying process, but also greatly improve the conveying efficiency on the basis of reducing labor costs, thereby improving the test efficiency.

[0057] The following further elaborates on the embodiments of the present application with reference to the accompanying drawings.

[0058] In some embodiments, a temperature shock test device, as Figure 1As shown, it includes a high temperature test box 100 and a low temperature test box 200 arranged side by side;

[0059] The high temperature test box 100 and the low temperature test box 200 are connected through a hole 300;

[0060] The high temperature test chamber 100 and the low temperature test chamber 200 are both provided with a conveying device 400, and the conveying device 400 is used to carry and convey the product to be tested, and the product to be tested moves between the high temperature test chamber 100 and the low temperature test chamber 200 under the conveying action of the conveying device 400;

[0061] The hole 300 is provided with an electrically controlled blocking door 500 , and the electrically controlled blocking door 500 is used to release the blockage when the product to be tested needs to pass through the hole 300 , and to block the hole 300 when the product to be tested does not need to pass through the hole 300 .

[0062] Specifically, the high temperature test chamber 100 and the low temperature test chamber 200 are of the same size and can both accommodate the product to be tested. Accordingly, the conveying devices 400 in the high temperature test chamber 100 and the low temperature test chamber 200 are of the same size and can both carry the product to be tested. The hole 300 is used to install the electrically controlled blocking door 500. When the electrically controlled blocking door 500 is opened, the product to be tested can pass through so that the product to be tested can move between the high temperature test chamber 100 and the low temperature test chamber 200. When the electrically controlled blocking door 500 is closed, the high temperature test chamber 100 and the low temperature test chamber 200 are separated so that the high temperature test chamber 100 and the low temperature test chamber 200 can respectively perform temperature shock tests on the product to be tested. The product to be tested is a slender and large-sized structure. Therefore, the electrically controlled blocking door 500 is used to install the electrically controlled blocking door 500. The opening area of ​​the electrically controlled blocking door 500 is adapted to the "fine" size of the product to be tested, that is, the electrically controlled blocking door 500 is minimized. When the product to be tested moves between the high temperature test box 100 and the low temperature test box 200, the temperature loss in the high temperature test box 100 and the low temperature test box 200 is reduced through the electrically controlled blocking door 500 without affecting the movement of the product to be tested, thereby minimizing the influence of the movement of the product to be tested on the test accuracy, which is beneficial to improving the test accuracy of the device.

[0063] In addition, in order to further reduce the temperature loss of the high-temperature test chamber 100 and the low-temperature test chamber 200 during the movement of the product to be tested, on the basis of minimizing the opening area of the electric control blocking door 500, the opening time of the electric control blocking door 500 is minimized: First, on the basis of ensuring the transmission stability of the product to be tested, the transmission speed of the transmission device 400 is increased, which can not only reduce the temperature loss of the high-temperature test chamber 100 and the low-temperature test chamber 200, but also further improve the transmission efficiency of the product to be tested, and thus is beneficial to improving the test efficiency of the device; Second, the electric control blocking door 500 is started to open only when the product to be tested approaches the electric control blocking door 500, which can avoid the electric control blocking door 500 from opening when the product to be tested has not yet approached the electric control blocking door 500, resulting in temperature loss in the high-temperature test chamber 100 and the low-temperature test chamber 200, and is beneficial to improving the test accuracy of the test device.

[0064] Specifically, the size of the electric control blocking door 500 is adapted to the size of the hole 300 to block the hole 300 and avoid problems such as poor sealing or poor heat preservation in the high-temperature test chamber 100 or the low-temperature test chamber 200. Therefore, the electric control blocking door 500 is hermetically connected to the hole 300, and the material of the electric control blocking door 500 is a heat-insulating material.

[0065] Finally, the transmission devices 400 in the high-temperature test chamber 100 and the low-temperature test chamber 200 are set at the same height and are at the same height as the bottom surface of the hole 300. The end of the transmission device 400 is close to the hole 300, and the transmission direction of the transmission device 400 is perpendicular to the hole 300, so that when the transmission device 400 transmits the product to be tested, the product to be tested can pass through the hole 300 under the transmission action of the transmission device 400 and be located on the transmission device 400 in another test chamber.

[0066] It should be noted that the transmission device 400 can be any one of a linear transmission roller and a linear conveyor belt, and the transmission device 400 is stably located in the high-temperature test chamber 100 and the low-temperature test chamber 200 through a bracket.

[0067] In this embodiment, by providing the holes 300 and the electrically controlled blocking doors 500 to connect or separate the high-temperature test chamber 100 and the low-temperature test chamber 200, and providing the transfer device 400 to transfer the product to be tested between the high-temperature test chamber 100 and the low-temperature test chamber 200, the transfer of the product to be tested between the high-temperature test chamber 100 and the low-temperature test chamber 200 is realized to complete the thermal shock test; the setting of the transfer device 400 can greatly improve the transfer simplicity and transfer stability of the product to be tested, thereby shortening the transfer efficiency of the product to be tested between the high-temperature test chamber 100 and the low-temperature test chamber 200, and can greatly improve the test efficiency and transfer safety and reliability of the thermal shock test device; moreover, the setting of the transfer device 400 and the electrically controlled blocking doors 500 can realize the automation of the test process of the test device, reduce the test cost, and is beneficial to popularization and application; the setting of the electrically controlled blocking doors 500 can reduce the opening area of the high-temperature test chamber 100 or the low-temperature test chamber 200, thereby reducing the temperature loss of the high-temperature test chamber 100 and the temperature test chamber 200 during the transfer of the product to be tested, which is beneficial to improving the test accuracy of the test device.

[0068] In some embodiments, as Figure 2 shown, the electrically controlled blocking door 500 includes a vertical heat insulation plate 510, a first horizontal heat insulation plate 520, and a second horizontal heat insulation plate 530. The vertical heat insulation plate 510 is vertically slidably connected to the hole 300. The first horizontal heat insulation plate 520 and the second horizontal heat insulation plate 530 are arranged side by side and are both horizontally slidably connected to the hole 300. The area of the vertical heat insulation plate 510 is adapted to the size of the hole 300, and the sum of the areas of the first horizontal heat insulation plate 520 and the second horizontal heat insulation plate 530 is adapted to the size of the hole 300;

[0069] When the electrically controlled blocking door 500 is used to block the hole 300, the vertical heat insulation plate 510 vertically moves to be opposite to the hole 300, and the first horizontal heat insulation plate 520 and the second horizontal heat insulation plate 530 move closer to each other to be opposite to the hole 300 to jointly block the hole 300;

[0070] When the electrically controlled blocking door 500 is used to release the blockage of the hole 300, the vertical heat insulation plate 510 moves towards the top or bottom of the hole 300, and the first horizontal heat insulation plate 520 and the second horizontal heat insulation plate 530 move away from each other towards the two sides of the hole 300 respectively.

[0071] Specifically, the first horizontal heat insulation plate 520 and the second horizontal heat insulation plate 530 are arranged side by side and are both horizontally slidably connected to the hole 300. When they are in contact with each other side by side, they jointly block the hole 300. When they are separated from each other side by side and are respectively located on both sides of the hole 300, the blocking of the hole 300 is released; the vertical heat insulation plate 510 slides vertically to block or release the blocking of the hole 300. The vertical heat insulation plate 510, the first horizontal heat insulation plate 520, and the second horizontal heat insulation plate 530 move synchronously, which can not only avoid the instability of the blocking state or the released blocking state of the hole 300 caused by sequential operation, but also simplify the structure of the electric control blocking door 500, facilitating the installation and control of the electric control blocking door 500.

[0072] In this embodiment, the vertical heat insulation plate 510, the first horizontal heat insulation plate 520, and the second horizontal heat insulation plate 530 achieve double-layer blocking of the hole 300, which can improve the heat insulation and sealing effects of the electric control blocking door 500. Moreover, the vertical heat insulation plate 510, the first horizontal heat insulation plate 520, and the second horizontal heat insulation plate 530 can achieve synchronous blocking and release of the blocking, so that when the electric control blocking door 500 releases the blocking of the hole 300, the area of the released blocking is controllable. Furthermore, the released blocking area of the electric control blocking door 500 can be adjusted according to the cross-sectional area of the product to be tested, which can avoid excessive heat loss in the high-temperature test chamber 100 and the low-temperature test chamber 200 due to the over-large released blocking area of the electric control blocking door 500, and is beneficial to improving the test accuracy of the device.

[0073] In some embodiments, the electric control blocking door 500 further includes a first driving member, a second driving member, and a third driving member. The first driving member is connected to the vertical heat insulation plate 510, the second driving member is connected to the first horizontal heat insulation plate 520, and the third driving member is connected to the second horizontal heat insulation plate 530.

[0074] Specifically, the first driving member is used to drive the vertical heat insulation board 510 to move vertically, the second driving member is used to drive the first transverse heat insulation board 520 to move transversely, and the third driving member is used to drive the second transverse heat insulation board 530 to move transversely. The driving directions of the second driving member and the third driving member are opposite, that is, when the second driving member drives the first transverse heat insulation board 520 to move toward the first direction, the third driving member drives the second transverse heat insulation board 530 to move toward the second direction, and the second direction is opposite to the first direction. The driving action of the first driving member, the second driving member, and the third driving member is synchronous, because the vertical heat insulation board 510 and the first transverse heat insulation board 520 and the second transverse heat insulation board 530 have different moving distances, the speed of the first driving member is greater than that of the second driving member and the third driving member, and when the first transverse heat insulation board 520 and the second transverse heat insulation board 530 are symmetrically arranged relative to the center line of the hole 300, the speed of the second driving member and the third driving member is the same, so as to achieve the synchronization of the first driving member, the second driving member, and the third driving member.

[0075] Exemplarily, the first driving member, the second driving member, and the third driving member may be one or more of a linear motor, a linear motor, a linear motor, a linear motor, and a push rod motor.

[0076] Exemplarily, when the moving direction of the first driving member is X, in order to drive the vertical heat insulation board 510 to release the blockage of the hole 300, the direction Y is opposite to X; when the moving direction of the second driving member is N, in order to drive the first transverse heat insulation board 520 to release the blockage of the hole 300, the direction S is opposite to N. Correspondingly, when the moving direction of the third driving member is S, in order to drive the second transverse heat insulation board 530 to release the blockage of the hole 300. When the electrically controlled blocking door 500 releases the blockage of the hole 300, the first driving member drives the vertical heat insulation board 510 to move toward the X direction, the second driving member drives the first transverse heat insulation board 520 to move toward the N direction, and the third driving member drives the second transverse heat insulation board 530 to move toward the S direction.

[0077] In this embodiment, the first driving member, the second driving member and the third driving member respectively drive the vertical insulation board 510, the first transverse insulation board 520 and the second transverse insulation board 530 to move so as to block or unblock the hole 300. The arrangement of the first driving member, the second driving member and the third driving member enables the vertical insulation board 510, the first transverse insulation board 520 and the second transverse insulation board 530 to operate independently, and has a simple structure, which is easy to install and reduces the cost of the device.

[0078] In some embodiments, the hole 300 includes a first surface and a second surface disposed opposite to each other. The vertical heat insulation plate 510 is disposed close to the first surface, and the first horizontal heat insulation plate 520 and the second horizontal heat insulation plate 530 are disposed close to the second surface and are equidistant from the vertical heat insulation plate 510.

[0079] Specifically, the vertical heat insulation plate 510, the first horizontal heat insulation plate 520, and the second horizontal heat insulation plate 530 are all located between the first surface and the second surface to improve the sealing performance of the hole 300. The first horizontal heat insulation plate 520 and the second horizontal heat insulation plate 530 are spaced from the vertical heat insulation plate 510, which can enhance the heat insulation performance of the electric control plugging door 500 and improve the practicality of the electric control plugging door 500.

[0080] In some embodiments, as Figure 3 shown, the device further includes a moving assembly 600. The moving assembly 600 is located on the conveying device 400 and moves under the conveying action of the conveying device 400;

[0081] The moving assembly 600 is used to connect with the product to be tested and drive the product to be tested to move between the high-temperature test chamber 100 and the low-temperature test chamber 200.

[0082] Specifically, the moving assembly 600 is connected to the conveying device 400 to move under the conveying action of the conveying device 400, and the product to be tested is connected to the moving assembly 600 to move with the moving assembly 600. The setting of the moving assembly 600 makes the connection between the product to be tested and the conveying device 400 more stable, which is beneficial to enhancing the practicality of the device.

[0083] In some embodiments, as Figure 4 shown, the moving assembly 600 includes a moving trolley 610 and a snap ring. The moving trolley 610 is located on the conveying device 400, and the snap ring is connected to a side of the moving trolley 610 away from the conveying device 400. The snap ring is used to detachably connect with the product to be tested.

[0084] Specifically, the moving trolley 610 is used to connect with the conveying device 400 to move under the conveying action of the conveying device 400. The snap ring is disposed away from the conveying device 400 and is fixedly connected to the moving trolley 610. The snap ring is used to clamp and fix the product to be tested, so that the product to be tested moves with the moving trolley 610 under the conveying action of the conveying device 400. The snap ring is detachably connected to the product to be tested, which can facilitate the removal of the product to be tested from the moving assembly 600 and is beneficial to the recycling of the moving assembly 600.

[0085] It should be noted that the inner circumference of the snap ring is adapted to the radial outer circumference of the product to be tested, so that the product to be tested is stably arranged relative to the moving trolley 610 under the clamping action of the snap ring. In addition, a plurality of the snap rings are uniformly arranged on the moving trolley 610 to further enhance the connection stability between the product to be tested and the moving trolley 610.

[0086] In this embodiment, the product to be tested is located on the moving trolley 610 and is fixedly connected to the moving trolley 610 through the snap ring. The product to be tested moves with the conveying device 400 through the moving trolley 610, which can avoid the situation that the product to be tested directly contacts the conveying device 400 and causes wear, effectively avoiding the non-test loading damage of the product to be tested and being beneficial to improving the test accuracy of the product to be tested.

[0087] In some embodiments, as Figure 4 shown, the moving trolley 610 includes a U-shaped plate body 611, a connecting rod 612 and a sliding member 613. The U-shaped plate body 611 is disposed to cover the top of the conveying device 400, and the connecting rod 612 and the sliding member 613 are located on the U-shaped plate body 611;

[0088] Wherein, the sliding member 613 is used to abut against the side surface of the conveying device 400, and the connecting rod 612 is used to abut against the top surface of the conveying device 400. The conveying device 400 drives the U-shaped plate body 611 and the sliding member 613 to move through the connecting rod 612.

[0089] Specifically, the length direction of the moving trolley 610 is the same as the conveying direction of the conveying device 400, that is, the length direction of the moving trolley 610 is the moving direction of the moving trolley 610. The cross section of the moving trolley 610 is U-shaped (i.e., the U-shaped plate body 611). The U-shaped plate body 611 covers the top of the conveying device 400, and its opposite side walls are respectively located on both sides of the conveying device 400, and its top is oppositely arranged with the top of the conveying device 400. The U-shaped plate body 611 enables the moving trolley 610 to be stably arranged on the conveying device 400.

[0090] The connecting rod 612 is located on the top surface of the U-shaped plate body 611 close to the conveying device 400 and is used to abut against the conveying device 400 to receive the conveying action of the conveying device 400 and move under this conveying action, thereby driving the U-shaped plate body 611 to move.

[0091] The sliding member 613 is located on the side of the U-shaped plate body 611 close to the conveying device 400, and is used to contact the side wall of the conveying device 400, so that when the U-shaped plate body 611 moves relative to the side wall of the conveying device 400, the sliding member 613 slides on the side wall of the conveying device 400 to reduce the friction between the moving cart 610 and the conveying device 400.

[0092] In this embodiment, the two side walls of the U-shaped plate body 611 can radially limit and guide the moving cart 610 (perpendicular to the moving direction of the moving cart 610), so that the moving cart 610 is stably arranged on the conveying device 400 and the moving direction is fixed, avoiding the situation that when the moving cart 610 passes through the hole 300, it cannot be connected to the conveying device 400 in another test chamber due to the unfixed moving direction, which is beneficial to improving the practicability of the device.

[0093] In some embodiments, as Figure 1 shown, the device further includes a normal temperature test chamber 700, which is arranged side by side with the high temperature test chamber 100 and the low temperature test chamber 200 and is located between the high temperature test chamber 100 and the low temperature test chamber 200. The high temperature test chamber 100 is communicated with the normal temperature test chamber 700 through a first hole 300, the normal temperature test chamber 700 is communicated with the low temperature test chamber 200 through a second hole 300, and electric control blocking doors 500 are arranged on both the first hole 300 and the second hole 300.

[0094] Specifically, when the product to be tested moves between the high temperature test chamber 100 and the low temperature test chamber 200 and passes through the normal temperature test chamber 700, the reliability of the test process of the product to be tested can be ensured, which is beneficial to improving the practicability of the test device.

[0095] In addition, the normal temperature test chamber 700 is also used to accommodate the motor, control cabinet, power distribution cabinet, etc. of the device, so as to avoid the extreme environmental temperature of the high temperature test chamber 100 or the low temperature test chamber 200 affecting their normal functions, and also to avoid the situation that placing the motor, control cabinet, power distribution cabinet, etc. of the device outside the device (i.e., the high temperature test chamber 100, the low temperature test chamber 200 and the normal temperature test chamber 700) affects its sealing performance and then affects the test accuracy.

[0096] In some embodiments, a conveying device 400 is arranged in the normal temperature test chamber 700, and the two ends of the conveying device 400 are respectively arranged opposite to the first hole 300 and the second hole 300.

[0097] Specifically, the conveying device 400 can not only play a role in conveying and transitioning, but also carry the product to be tested, so that the device can conduct a reliability test on the product to be tested at room temperature, which is beneficial to improving the practicability of the device.

[0098] In addition, when the device is used to conduct a thermal shock test on an elongated large-sized product (i.e., the product to be tested), in the case where the length of the normal temperature test chamber 700 is not sufficient to accommodate the product to be tested, the conveying device 400 may not be provided in the normal temperature test chamber 700. In the case where the length of the normal temperature test chamber 700 is sufficient to accommodate the product to be tested, the conveying device 400 must be provided in the normal temperature test chamber 700 to ensure the conveying stability of the product to be tested between the high temperature test chamber 100 and the low temperature test chamber 200.

[0099] It should be noted that the conveying device 400 is the same as the conveying devices 400 in the high temperature test chamber 100 and the low temperature test chamber 200, and the only difference lies in the test chambers where they are located. The conveying device 400 can be a linear conveyor belt, a linear conveyor roller, etc.

[0100] Exemplarily, the conveying devices 400 in the high temperature test chamber 100, the low temperature test chamber 200, and the normal temperature test chamber 700 are all conveyor rollers with brackets. The heads and tails of the three conveying devices 400 are arranged in sequence and are on the same straight line as the first hole 300 and the second hole 300, so as to facilitate the movement of the product to be tested in the three test chambers.

[0101] In some embodiments, both the high temperature test chamber 100 and the low temperature test chamber 200 include a first space and a second space. A partition door is provided between the first space and the second space. When the partition door is opened, the first space and the second space are connected; when the partition door is closed, the first space and the second space are separated.

[0102] Specifically, both the high-temperature test chamber 100 and the low-temperature test chamber 200 can individually accommodate the product to be tested. When the product to be tested is a long and large-sized product, the high-temperature test chamber 100 and the low-temperature test chamber 200 are relatively long and occupy a large area. When the temperature shock test of the long and large-sized product is not carried out, the test chambers are left idle. When the temperature test of other products is carried out, small-sized temperature chambers are needed, resulting in an increase in the number of temperature chambers and an increase in the test cost. Based on this, the high-temperature test chamber 100 and the low-temperature test chamber 200 of the device are configured to have a structure with the first space and the second space. Both the first space and the second space are independent temperature chambers and can independently conduct high and low temperature tests. Furthermore, the high-temperature test chamber 100 and the low-temperature test chamber 200 can adjust the connection state of the first space and the second space according to their test requirements, improving the practicability and applicability of the high-temperature test chamber 100 and the low-temperature test chamber 200.

[0103] It should be noted that the high-temperature test chamber 100 and the low-temperature test chamber 200 can also be divided into multiple spaces according to requirements, and only a partition door needs to be provided between two adjacent spaces.

[0104] In summary, the high-temperature test chamber 100, the normal-temperature test chamber 700, and the low-temperature test chamber 200 are of an integrated structure, having good sealing performance and heat insulation effect, greatly improving the test accuracy of the device. To facilitate the entry of the product to be tested into the device, the top of the high-temperature test chamber 100, the normal-temperature test chamber 700, and the low-temperature test chamber 200 is provided with an opposing top-opening door and a top movable cover plate, wherein the top movable cover plate is made of heat-insulating material. The partition door is connected to the inner top of the device through a top movable threshold and to the inner bottom of the device through a bottom movable threshold to enhance the sealing performance and heat insulation effect of the partition door. When the partition door is opened to connect the first space and the second space, the partition door can be opened by removing the top movable threshold and the bottom movable threshold. Correspondingly, when closing the partition door, the top movable threshold and the bottom movable threshold need to be installed first, and then the partition door is rotated to be connected to the top movable threshold and the bottom movable threshold so that the partition door separates the first space and the second space.

[0105] In addition, the high-temperature test chamber 100 and the normal-temperature test chamber 700, as well as the normal-temperature test chamber 700 and the low-temperature test chamber 200, are also separated by the partition door. Different from the above-mentioned partition door, holes 300 and electrically controlled blocking doors 500 are provided on the partition doors between the high-temperature test chamber 100 and the normal-temperature test chamber 700, and between the normal-temperature test chamber 700 and the low-temperature test chamber 200, so as to facilitate the connection or separation of the high-temperature test chamber 100 and the normal-temperature test chamber 700, and the normal-temperature test chamber 700 and the low-temperature test chamber 200 by controlling the opening and closing of the electrically controlled blocking doors 500.

[0106] Based on the same inventive concept, the present application also provides a method for controlling the temperature shock test device as described in any one of the above, as Figure 5 shown, including:

[0107] Step S100, obtaining the real-time temperature in the test chamber where the product to be tested is located;

[0108] Specifically, the method is applied to a controller, which is connected to the transfer device 400, the electrically controlled blocking door 500, the high-temperature test chamber 100, the low-temperature test chamber 200, etc. of the device. The controller determines the test chamber where the product to be tested is located based on a video sensor or a laser sensor, and obtains the real-time temperature in the test chamber where the product to be tested is located through temperature sensors located in the high-temperature test chamber 100 and the low-temperature test chamber 200.

[0109] Step S200, in response to determining that the real-time temperature is the same as the target test temperature of this test chamber and the duration is a preset duration, determining the target test chamber of the product to be tested based on this test chamber;

[0110] Specifically, the target test temperature is set by the staff before the device conducts a temperature shock test. In the case where the staff does not set it, the controller will control the device to conduct a temperature shock test based on the default target test temperature; when the controller obtains the real-time temperature in the test chamber where the product to be tested is located, it compares it with the target test temperature of this test chamber. When the real-time temperature in this test chamber is equal to the target test temperature, timing is started. When the duration reaches the preset duration, it is determined that the other test chamber is the target test chamber of the product to be tested, that is, the test chamber to be moved to.

[0111] Exemplarily, if the test chamber where the product to be tested is located is the high-temperature test chamber 100, then the target test chamber is determined to be the low-temperature test chamber 200; if the test chamber where the product to be tested is located is the low-temperature test chamber 200, then the target test chamber is determined to be the high-temperature test chamber 100.

[0112] It should be noted that the target test temperature of the high-temperature test chamber 100 is different from the target test temperature of the low-temperature test chamber 200.

[0113] Exemplarily, the target test temperature of the high-temperature test chamber 100 is 70 °C, and the target test temperature of the low-temperature test chamber 200 is -40 °C.

[0114] Step S300, start the conveying device 400 and the electric control plugging door 500 based on the target test chamber;

[0115] Specifically, control the conveying device 400 to start, and the conveying direction is towards the target test chamber, and open the electric control plugging door 500 so that the product to be tested can pass through the hole 300 and enter the target test chamber.

[0116] Step S400, in response to determining that the test chamber where the product to be tested is located is the target test chamber, close the conveying device 400 and the electric control plugging door 500.

[0117] Specifically, the controller monitors the location of the product to be tested. When it is determined that the test chamber where the product to be tested is located is the target test chamber, the conveying device 400 and the electric control plugging door 500 are closed to test the product to be tested in the target test chamber, and the above steps S100 to S400 are repeated.

[0118] It should be noted that the temperature shock test performed by the device needs to repeatedly execute the above steps. The specific number of repetitions is set according to different test products. Therefore, before the device performs the test, the number of repetitions is preset by the tester so that when the controller determines that the number of repetitions reaches the preset number, it reminds the staff that the temperature shock test has been completed.

[0119] In addition, the target test temperatures of the high-temperature test chamber 100 and the low-temperature test chamber 200 are also preset by the staff, and the specific values are determined according to different test products.

[0120] In this embodiment, by determining the test chamber where the product to be tested is located and monitoring the real-time temperature of the test chamber to determine whether the product to be tested needs to be moved to another test chamber, when it is determined to move, the conveying device 400 and the electric control plugging door 500 are started so that the product to be tested can pass through the hole 300 where the electric control plugging door 500 is located under the conveying action of the conveying device 400 and move between the high-temperature test chamber 100 and the low-temperature test chamber 200, and cycle to the preset number of times to complete the temperature shock test, realizing the automation of the device, and greatly improving the test accuracy and test efficiency of the device on the basis of reducing the labor cost.

[0121] In some embodiments, the method further includes:

[0122] Step S500, in response to determining that the product to be tested and the hole 300 are in a gradually approaching state, and the distance between the hole 300 and the product to be tested is less than or equal to the target distance, the electric control blocking door 500 corresponding to the hole 300 is activated;

[0123] Specifically, a laser sensor (or other structure capable of monitoring distance and speed) is provided on the hole 300, which can sense and measure the distance and speed between the product to be tested and it. The controller controls the opening and closing of the electric control blocking door 500 on the hole 300 based on the sensing information of the laser sensor.

[0124] It should be noted that laser sensors are provided on both sides of the hole 300, and both laser sensors are connected to the controller. The controller associates the two laser sensors with the electric control blocking door 500 on the hole 300, that is, the sensing information of any one of the two laser sensors is related to the opening and closing of the electric control blocking door 500.

[0125] In addition, the target distance is preset, and the target distance is related to the conveying speed of the conveying device 400 and the opening time of the electric control blocking door 500. Through reasonable calculation, when the conveying device 400 conveys the target distance, the electric control blocking door 500 is just fully opened, which can avoid the situation that the electric control blocking door 500 is fully opened when the product to be tested has not reached the hole 300, resulting in temperature loss, and is beneficial to improving the test accuracy of the device.

[0126] Exemplarily, if the conveying speed of the conveying device 400 is 1 meter per minute and the opening time of the electric control blocking door 500 is 1 minute, the target distance can be set to 1 meter.

[0127] Step S600, in response to determining that the distance between the product to be tested and the hole 300 is in a gradually moving away state, the electric control blocking door 500 corresponding to the hole 300 is closed.

[0128] Specifically, when the controller monitors through the laser sensor that the product to be tested is gradually moving away, it controls the electric control blocking door 500 corresponding to the hole 300 to close, so as to avoid temperature loss in the high-temperature test chamber 100 or the low-temperature test chamber 200, and also has the effect of energy saving.

[0129] It should be noted that when the article to be tested is located on the moving component 600, the laser controller sends the running state and distance of the moving component 600 to the controller, so that the controller controls the opening and closing of the electric control blocking door 500 according to the state of the moving component 600.

[0130] In this embodiment, by monitoring the running state and distance of the article to be tested, the opening and closing state of the electric control blocking door 500 is flexibly controlled, thereby avoiding the unnecessary opening of the electric control blocking door 500 for a long time, resulting in temperature loss in the high-temperature test chamber 100 and the low-temperature test chamber 200. This is beneficial to improving the test accuracy of the device and can also avoid the high-temperature test chamber 100 and the low-temperature test chamber 200 consuming more energy to reach their corresponding target test temperatures due to temperature loss. Therefore, it has an energy-saving effect.

[0131] In some embodiments, step S300: Starting the conveying device 400 based on the target test chamber includes:

[0132] Step S301, determining the moving direction of the article to be tested based on the target test chamber;

[0133] Specifically, when the target test chamber is the low-temperature test chamber 200, the moving direction of the article to be tested is from the high-temperature test chamber 100 to the low-temperature test chamber 200. When the target test chamber is the high-temperature test chamber 100, the moving direction of the article to be tested is from the low-temperature test chamber 200 to the high-temperature test chamber 100.

[0134] Step S302, determining the conveying direction of the conveying device 400 based on the moving direction;

[0135] Specifically, the conveying device 400 has two conveying directions. One conveying direction is Z: from the high-temperature test chamber 100 to the low-temperature test chamber 200; the other conveying direction is Z': from the low-temperature test chamber 200 to the high-temperature test chamber 100. The conveying direction = the moving direction. Therefore, the conveying direction can be determined based on the moving direction.

[0136] Exemplarily, when the conveying device 400 is a linear conveyor belt or a linear conveyor roller, its two conveying directions can be described as clockwise and counterclockwise. Among them, the clockwise direction is to the right, the counterclockwise direction is to the left. From the high-temperature test chamber 100 to the low-temperature test chamber 200 is clockwise, and from the low-temperature test chamber 200 to the high-temperature test chamber 100 is counterclockwise. Then, based on this corresponding relationship and the moving direction, the conveying direction can also be quickly determined.

[0137] Step S303, starting the conveying device 400 based on the conveying direction.

[0138] Specifically, after determining the conveying direction of the conveying device 400, the controller starts the conveying device 400 to make it run in the conveying direction.

[0139] Exemplarily, if the conveying device 400 is a conveying roller and the conveying direction is clockwise, the controller controls the conveying roller to rotate clockwise; if the conveying direction is counterclockwise, the controller controls the conveying roller to rotate counterclockwise.

[0140] In this embodiment, the conveying direction of the conveying device 400 is determined according to the target test chamber and the conveying device 400 is started for specific description, clarifying that the conveying device 400 has two conveying directions to drive the product to be tested to move back and forth between the high-temperature test chamber 100 and the low-temperature test chamber 200, realizing the automatic operation of the device and improving the test efficiency of the device.

[0141] In some embodiments, step S303: Starting the conveying device 400 based on the conveying direction includes:

[0142] Step S303-1, starting the conveying device 400 in the test chamber where the product to be tested is located based on the conveying direction;

[0143] Specifically, the controller preferentially starts the conveying device 400 in the test chamber where the product to be tested is located to move the product to be tested out of its test chamber.

[0144] Step S303-2, in response to determining that the electric control blocking door 500 is opened, determining the test chamber close to the electric control blocking door 500 in the conveying direction and starting the conveying device 400 in this test chamber based on the conveying direction;

[0145] Specifically, when the conveying device 400 conveys the product to be tested, the electric control blocking door 500 is opened for the product to be tested to pass through the hole 300 where the electric control blocking door 500 is located. In order to ensure that the product to be tested can still receive the same conveying effect and improve its conveying speed after passing through the hole 300, when the electric control blocking door 500 is opened, the conveying device 400 in another test chamber adjacent to the electric control blocking door 500 is started to achieve a smooth handover between the two conveying devices 400.

[0146] Step S303-3, in response to determining that the electric control blocking door 500 is closed, determining the test chamber far from the electric control blocking door 500 in the conveying direction and closing the conveying device 400 in this test chamber.

[0147] Specifically, when the electric control plugging door 500 is closed, it is determined that the product to be tested has successfully passed through the hole 300 corresponding to the electric control plugging door 500. The product to be tested is located in the test chamber closer to the electric control plugging door 500 in the conveying direction, and the product to be tested will not enter the test chamber farther from the electric control plugging door 500 in the conveying direction for the time being. Therefore, the conveying device 400 inside it is closed to avoid waste of resources. At the same time, it is also convenient to switch the conveying direction of the conveying device 400 when the product to be tested is moved back into the test chamber later.

[0148] In this embodiment, the starting moments of the conveying devices 400 in different test chambers are different, which can avoid unnecessary waste of resources, achieve the effect of energy saving, and at the same time, it is also convenient for the conveying device 400 to switch its conveying direction, which is beneficial to improving the practicality of the device.

[0149] In some embodiments, in step S500: starting the electric control plugging door 500 corresponding to the hole 300 includes:

[0150] Step S501, obtaining the maximum cross-sectional area of the product to be tested;

[0151] Specifically, a laser scanning sensor (or other sensor capable of measuring the cross-sectional area) is provided on the electric control plugging door 500 to measure the cross-sectional area of the product to be tested. Since one end of the product to be tested is arranged opposite to the electric control plugging door 500, this sensor can detect the cross-sectional area of the product to be tested. To ensure the freedom of movement of the product to be tested between the high-temperature test chamber 100 and the low-temperature test chamber 200, this sensor obtains the maximum cross-sectional area of the product to be tested, so as to start the electric control plugging door 500 according to this maximum cross-sectional area, and further facilitate the product to be tested to pass through.

[0152] It should be noted that, to simplify the layout of the test device, the sensor for measuring the distance between the product to be tested and the electric control plugging door 500 (or the hole 300) and the sensor for measuring the maximum cross-sectional area of the product to be tested can be the same, that is, this sensor can both measure the distance and the cross-sectional area.

[0153] Exemplarily, this sensor is a laser scanning sensor that measures the size and shape of an object by emitting a laser beam and receiving the reflected light. By scanning the surface of the object, the laser scanning sensor can accurately measure the cross-sectional area of the object.

[0154] Step S502, determining the opening area of the electric control plugging door 500 based on the maximum cross-sectional area;

[0155] Specifically, after determining the maximum cross-sectional area of the product to be tested, control the opening area of the electric control plugging door 500 to be the maximum cross-sectional area. With such a setting, it can not only ensure that the product to be tested shuttles between the high-temperature test chamber 100 and the low-temperature test chamber 200 (or moves between two adjacent test chambers), but also avoid an excessive opening area of the electric control plugging door 500, which may lead to an increase in temperature loss in the high-temperature test chamber 100 or the low-temperature test chamber 200 and affect the test efficiency of the test device.

[0156] Step S503, start the electric control plugging door 500 based on the opening area.

[0157] Specifically, based on the opening area, respectively determine the moving distances of the vertical heat insulation plate 510 and the horizontal heat insulation plate of the electric control plugging door 500, and respectively control the vertical heat insulation plate 510 and the horizontal heat insulation plate to move according to the determined moving distances so that the product to be tested can pass through.

[0158] Exemplarily, if the opening area is 2*2, then determine the moving distance of the vertical heat insulation plate 510 to be 2 and the moving distance of the horizontal heat insulation plate to be 1. In this way, the two horizontal heat insulation plates each move 1, and the moving distance of the vertical heat insulation plate 510 is 2, which can form an opening area of 2*2 for the product to be tested to pass through.

[0159] In this embodiment, based on the maximum cross-sectional area of the product to be tested, start the electric control plugging door 500 so that the opening area of the electric control plugging door 500 is adapted to the maximum cross-sectional area, which can avoid a large opening area of the electric control plugging door 500, resulting in temperature loss in the high-temperature test chamber 100 or the low-temperature test chamber 200, and thus is beneficial to improving the test accuracy.

[0160] It should be noted that the method of the embodiment of the present application can be executed by a single device, such as a computer or a server. The method of this embodiment can also be applied to a distributed scenario and be completed by multiple devices cooperating with each other. In such a distributed scenario, one of the multiple devices can only execute one or more steps of the method of the embodiment of the present application, and these multiple devices will interact with each other to complete the described method.

[0161] It should be noted that some embodiments of the present application have been described above. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the above embodiments and still achieve the desired results. Additionally, the processes depicted in the figures do not necessarily require the particular order or sequential order shown to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0162] Based on the same inventive concept, corresponding to the method of any of the above embodiments, the present application further provides an apparatus.

[0163] Referring to Figure 6 , the apparatus includes:

[0164] An acquisition module 100, configured to acquire the real-time temperature inside the test chamber where the product to be tested is located;

[0165] A determination module 200, configured to, in response to determining that the real-time temperature is the same as the target test temperature of the test chamber and the duration is a preset duration, determine the target test chamber for the product to be tested based on the test chamber;

[0166] A start module 300, configured to start the conveying device and the electric control plugging door based on the target test chamber;

[0167] A closing module 400, configured to, in response to determining that the test chamber where the product to be tested is located is the target test chamber, close the conveying device and the electric control plugging door.

[0168] For convenience of description, when describing the above apparatus, it is divided into various modules according to functions and described separately. Of course, when implementing the present application, the functions of each module can be implemented in one or more software and / or hardware.

[0169] The apparatus of the above embodiment is used to implement the corresponding method in any of the foregoing embodiments and has the beneficial effects of the corresponding method embodiments, which will not be elaborated herein.

[0170] Based on the same inventive concept, corresponding to the method of any of the above embodiments, the present application further provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor implements the method described in any of the above embodiments when executing the program.

[0171] Figure 7FIG. 0 shows a more specific schematic diagram of the hardware structure of the electronic device provided in this embodiment. The device may include: a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. Among them, the processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040 are communicatively connected to each other inside the device through the bus 1050.

[0172] The processor 1010 may be implemented in the form of a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, etc., and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.

[0173] The memory 1020 may be implemented in the form of a ROM (Read Only Memory), a RAM (Random Access Memory), a static storage device, a dynamic storage device, etc. The memory 1020 may store an operating system and other application programs. When implementing the technical solutions provided in the embodiments of this specification through software or firmware, the relevant program codes are stored in the memory 1020 and are called and executed by the processor 1010.

[0174] The input / output interface 1030 is used to connect to an input / output module to implement information input and output. The input / output module may be configured as a component in the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Among them, the input device may include a keyboard, a mouse, a touch screen, a microphone, various sensors, etc., and the output device may include a display, a speaker, a vibrator, an indicator light, etc.

[0175] The communication interface 1040 is used to connect to a communication module (not shown in the figure) to implement communication interaction between this device and other devices. Among them, the communication module may implement communication in a wired manner (such as USB, network cable, etc.) or in a wireless manner (such as mobile network, WIFI, Bluetooth, etc.).

[0176] The bus 1050 includes a path for transmitting information between various components of the device (such as the processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040).

[0177] It should be noted that although the above device only shows the processor 1010, the memory 1020, the input / output interface 1030, the communication interface 1040, and the bus 1050, in the specific implementation process, the device may also include other components necessary for normal operation. In addition, those skilled in the art can understand that the above device may also only include the components necessary to implement the solution of the embodiments of this specification, and does not necessarily include all the components shown in the figure.

[0178] The electronic device of the above embodiment is used to implement the corresponding method in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be elaborated here.

[0179] Based on the same inventive concept, corresponding to the method of any of the above embodiments, the present application also provides a non-transitory computer-readable storage medium storing computer instructions for causing the computer to execute the method described in any of the foregoing embodiments.

[0180] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. The information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassette tapes, magnetic disk storage or other magnetic storage devices, or any other non-transmission media that can be used to store information accessible by a computing device.

[0181] The computer instructions stored in the storage medium of the above embodiment are used to cause the computer to execute the method described in any of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be elaborated here.

[0182] Based on the same concept, corresponding to the method of any of the above embodiments, the present application also provides a computer program product including computer program instructions, which when run on a computer, cause the computer to execute the method described in any of the foregoing embodiments and have the beneficial effects of the corresponding method embodiments, which will not be elaborated here.

[0183] It is understandable that before using the technical solutions of the various embodiments of the present disclosure, the types, usage scopes, usage scenarios, etc. of the personal information involved will be informed to the user in an appropriate manner, and the user's authorization will be obtained.

[0184] For example, when responding to receiving an active request from the user, a prompt message is sent to the user to clearly prompt the user that the operation requested by the user will require obtaining and using the user's personal information. Thus, the user can autonomously choose whether to provide personal information to software or hardware such as an electronic device, an application program, a server, or a storage medium that performs the operations of the technical solutions of the present disclosure according to the prompt message.

[0185] As an optional but non-limiting implementation manner, the manner of sending a prompt message to the user in response to receiving an active request from the user can be, for example, in the form of a pop-up window. The prompt message can be presented in text in the pop-up window. In addition, the pop-up window can also carry a selection control for the user to choose "agree" or "disagree" to provide personal information to the electronic device.

[0186] It is understandable that the above process of notifying and obtaining the user's authorization is only illustrative and does not constitute a limitation on the implementation manner of the present disclosure. Other manners that meet the relevant laws and regulations can also be applied to the implementation manner of the present disclosure.

[0187] Those of ordinary skill in the art should understand that the discussion of any of the above embodiments is only exemplary and is not intended to imply that the scope of the present application is limited to these examples; under the concept of the present application, the technical features between the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations in different aspects of the embodiments of the present application as described above, and they are not provided in detail for the sake of brevity.

[0188] In addition, for the sake of simplicity of description and discussion, and in order not to make the embodiments of the present application difficult to understand, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. In addition, the device can be shown in the form of a block diagram to avoid making the embodiments of the present application difficult to understand, and this also takes into account the fact that the details of the implementation manner of these block diagram devices are highly dependent on the platform on which the embodiments of the present application will be implemented (that is, these details should be completely within the understanding of those skilled in the art). In the case where specific details (such as circuits) are set forth to describe the exemplary embodiments of the present application, it will be apparent to those skilled in the art that the embodiments of the present application can be implemented without these specific details or with variations of these specific details. Therefore, these descriptions should be considered illustrative rather than restrictive.

[0189] Although the present application has been described in connection with specific embodiments thereof, many alternatives, modifications, and variations of these embodiments will be apparent to those of ordinary skill in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.

[0190] Embodiments of the present application are intended to cover all such alternatives, modifications, and variations that fall within the broad scope of the claims of the present application. Accordingly, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the embodiments of the present application shall be included within the protection scope of the present application.

Claims

1. A temperature shock test device, characterized in that, It includes a high-temperature test chamber and a low-temperature test chamber arranged side by side; The high-temperature test chamber and the low-temperature test chamber are connected through a hole; Conveying devices are provided in both the high-temperature test chamber and the low-temperature test chamber. The conveying devices are used to carry and convey the products to be tested. The products to be tested move between the high-temperature test chamber and the low-temperature test chamber under the conveying action of the conveying devices; An electrically controlled sealing door is provided on the hole. The electrically controlled sealing door is used to remove the seal when the product to be tested needs to pass through the hole and seal the hole when the product to be tested does not need to pass through the hole.

2. The temperature shock test device according to claim 1, wherein The electrically controlled sealing door includes a vertical heat insulation plate, a first horizontal heat insulation plate and a second horizontal heat insulation plate. The vertical heat insulation plate is vertically slidably connected to the hole. The first horizontal heat insulation plate and the second horizontal heat insulation plate are arranged side by side and are both horizontally slidably connected to the hole. The area of the vertical heat insulation plate is adapted to the size of the hole, and the sum of the areas of the first horizontal heat insulation plate and the second horizontal heat insulation plate is adapted to the size of the hole; When the electrically controlled sealing door is used to seal the hole, the vertical heat insulation plate moves vertically to be opposite to the hole, and the first horizontal heat insulation plate and the second horizontal heat insulation plate move closer to each other to be opposite to the hole to jointly seal the hole; When the electrically controlled sealing door is used to remove the seal of the hole, the vertical heat insulation plate moves towards the top or bottom of the hole, and the first horizontal heat insulation plate and the second horizontal heat insulation plate move away from each other towards the two sides of the hole respectively.

3. The temperature shock test device according to claim 2, characterized in that, The electrically controlled sealing door further includes a first driving member, a second driving member and a third driving member. The first driving member is connected to the vertical heat insulation plate, the second driving member is connected to the first horizontal heat insulation plate, and the third driving member is connected to the second horizontal heat insulation plate.

4. The temperature shock test device according to claim 3, characterized in that, The hole includes a first surface and a second surface arranged opposite to each other. The vertical heat insulation plate is arranged close to the first surface, and the first horizontal heat insulation plate and the second horizontal heat insulation plate are arranged close to the second surface and are equidistant from the vertical heat insulation plate.

5. The temperature shock test device according to claim 1, characterized in that, It further includes a moving assembly. The moving assembly is located on the conveying device and moves under the conveying action of the conveying device; The moving assembly is used to connect with the product to be tested and drive the product to be tested to move between the high-temperature test chamber and the low-temperature test chamber.

6. The temperature shock test device according to claim 5, characterized in that, The moving assembly includes a moving trolley and a clamping ring. The moving trolley is located on the conveying device, and the clamping ring is connected to the side of the moving trolley away from the conveying device. The clamping ring is used to detachably connect with the product to be tested.

7. The temperature shock test device according to claim 6, wherein, The moving trolley includes a U-shaped plate body, a connecting rod and a sliding member. The U-shaped plate body covers the top of the conveying device, and the connecting rod and the sliding member are located on the U-shaped plate body; Wherein, the sliding member is used to abut against the side surface of the conveying device, the connecting rod is used to abut against the top surface of the conveying device, and the conveying device drives the U-shaped plate body and the sliding member to move through the connecting rod.

8. The temperature shock test device according to claim 1, wherein, It further includes a normal temperature test chamber, which is arranged side by side with the high temperature test chamber and the low temperature test chamber and is located between the high temperature test chamber and the low temperature test chamber. The high temperature test chamber is communicated with the normal temperature test chamber through a first hole, and the normal temperature test chamber is communicated with the low temperature test chamber through a second hole. Electrically controlled blocking doors are provided on both the first hole and the second hole.

9. The temperature shock test device according to claim 8, characterized in that, A conveying device is provided in the normal temperature test chamber, and both ends of the conveying device are oppositely arranged with the first hole and the second hole respectively.

10. The temperature shock test device according to claim 1, characterized in that, Both the high temperature test chamber and the low temperature test chamber include a first space and a second space. A partition door is provided between the first space and the second space. When the partition door is opened, the first space and the second space are communicated; when the partition door is closed, the first space and the second space are separated.

11. A method for controlling a temperature shock test device as claimed in any one of claims 1 to 10, characterized in that, It includes: Obtain the real-time temperature in the test chamber where the product to be tested is located; In response to determining that the real-time temperature is the same as the target test temperature of this test chamber and the continuous duration is a preset duration, then determine the target test chamber for the product to be tested based on this test chamber; Start the conveying device and the electrically controlled blocking door based on the target test chamber; In response to determining that the test chamber where the product to be tested is located is the target test chamber, then close the conveying device and the electrically controlled blocking door.

12. The method according to claim 11, wherein It further includes: In response to determining that the product to be tested and the hole are in a gradually approaching state and the distance between the hole and the product to be tested is less than or equal to the target distance, then start the electrically controlled blocking door corresponding to this hole; In response to determining that the distance between the product to be tested and the hole is in a gradually moving away state, then close the electrically controlled blocking door corresponding to this hole.

13. The method according to claim 11, characterized in that The starting the conveying device based on the target test chamber includes: Determine the moving direction of the product to be tested based on the target test chamber; Determine the conveying direction of the conveying device based on the moving direction; Start the conveying device based on the conveying direction.

14. The method according to claim 13, wherein The starting the conveying device based on the conveying direction includes: Start the conveying device in the test chamber where the product to be tested is located based on the conveying direction; In response to determining that the electrically controlled blocking door is opened, then determine the test chamber close to the electrically controlled blocking door in the conveying direction and start the conveying device in this test chamber based on the conveying direction; In response to determining that the electrically controlled blocking door is closed, then determine the test chamber far from the electrically controlled blocking door in the conveying direction and close the conveying device in this test chamber.

15. The method according to claim 12, wherein The starting the electrically controlled blocking door corresponding to this hole includes: Obtain the maximum cross-sectional area of the product to be tested; Determine the opening area of the electrically controlled blocking door based on the maximum cross-sectional area; Start the electrically controlled blocking door based on the opening area.

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