Anti-interference electrical testing method and system for complex electromagnetic environments

Abstract

The present invention provides an anti-interference electrical test method and system for complex electromagnetic environments, which relates to the field of electrical testing technology. The method includes: obtaining electromagnetic environment parameters of the target conductor; determining a first non-contact electrical test distance and a second non-contact electrical test distance; starting a non-contact electrical test module, performing non-contact test sampling, and generating a first non-contact electrical test signal and a second non-contact electrical test signal; analyzing volatility, obtaining a first signal waveform and a second signal volatility, performing a fluctuation consistency judgment, and obtaining a consistency judgment result; activating a contact verification instruction based on the consistency judgment result, and outputting an electrical test result. The present invention solves the technical problem that the electrical test technology of the prior art mostly relies on traditional signal filtering methods or simple signal analysis means, and is difficult to effectively distinguish interference signals from real signals when faced with complex interference signals, thereby resulting in inaccurate test results.

Description

Technical Field

[0001] The present invention relates to the field of electrical testing technology, and in particular to an anti-interference electrical testing method and system for use in complex electromagnetic environments. Background Art

[0002] With the popularization of smart grid and wireless communication technology, the electromagnetic environment has become increasingly complex, the sources of electromagnetic interference have continued to increase, and electromagnetic waves from various electronic devices, communication facilities, and power equipment have frequently intertwined, forming a changeable and uncertain electromagnetic environment. These complex electromagnetic environments have put forward higher requirements for electrical testing technology.

[0003] In an electromagnetic environment, external interference signals and the target conductor's true signal may have similar frequency, waveform, or amplitude characteristics. Existing electrical testing technologies mostly rely on traditional signal filtering methods or simple signal analysis methods. These methods have difficulty effectively distinguishing interference signals from true signals when faced with complex interference signals. This confusion makes it impossible to identify the true information in the signal, resulting in inaccurate or misjudgment of test results. Summary of the Invention

[0004] This application provides an anti-interference electrical testing method and system for complex electromagnetic environments, aiming to solve the technical problem that most of the existing electrical testing technologies rely on traditional signal filtering methods or simple signal analysis methods, and it is difficult to effectively distinguish interference signals from real signals when faced with complex interference signals, resulting in inaccurate test results.

[0005] The first aspect disclosed in the present application provides an anti-interference electrical test method for a complex electromagnetic environment, the method comprising: obtaining electromagnetic environment parameters in which a target conductor is located; determining a first non-contact electrical test distance and a second non-contact electrical test distance based on the electromagnetic environment parameters, wherein the distance values ​​of the first non-contact electrical test distance and the second non-contact electrical test distance are different; starting a non-contact electrical test module, performing non-contact test sampling on the target conductor at the first non-contact electrical test distance and the second non-contact electrical test distance, and generating a first non-contact electrical test signal and a second non-contact electrical test signal; analyzing the volatility of the first non-contact electrical test signal and the second non-contact electrical test signal to obtain a first signal waveform and a second signal volatility, performing a fluctuation consistency judgment on the first signal waveform and the second signal volatility, and obtaining a consistency judgment result; activating a contact verification instruction according to the consistency judgment result, and outputting the electrical test result of the target conductor.

[0006] According to a second aspect of the present application, an anti-interference electrical test system for a complex electromagnetic environment is provided. The system is used in the above-mentioned anti-interference electrical test method for a complex electromagnetic environment. The system includes: an electromagnetic environment parameter acquisition module for acquiring electromagnetic environment parameters of a target conductor; a non-contact electrical test distance determination module for determining a first non-contact electrical test distance and a second non-contact electrical test distance based on the electromagnetic environment parameters, wherein the first non-contact electrical test distance and the second non-contact electrical test distance have different distance values; a non-contact test sampling module for activating a non-contact electrical test module to perform non-contact test sampling on the target conductor at the first non-contact electrical test distance and the second non-contact electrical test distance to generate a first non-contact electrical test signal and a second non-contact electrical test signal; a fluctuation consistency judgment module for analyzing the fluctuation of the first non-contact electrical test signal and the second non-contact electrical test signal to obtain a first signal waveform and a second signal fluctuation, and performing a fluctuation consistency judgment on the first signal waveform and the second signal fluctuation to obtain a consistency judgment result; and a test result output module for activating a contact verification instruction based on the consistency judgment result and outputting the test result of the target conductor.

[0007] One or more technical solutions provided in this application have at least the following beneficial effects:

[0008] By obtaining the electromagnetic environment parameters of the target conductor, the impact of external electromagnetic interference on the test process can be evaluated in real time, which provides a scientific basis for subsequent distance adjustment and signal analysis, ensuring that the test can adapt to different interference conditions in the actual electromagnetic environment and avoid errors caused by environmental changes; by determining the first non-contact electrical detection distance and the second non-contact electrical detection distance according to the electromagnetic environment parameters, it is ensured that the non-contact electrical detection test can flexibly adjust the test distance under different electromagnetic interference intensities, which helps to avoid interference caused by changes in the electromagnetic environment and improves the stability and accuracy of the test results. The first and second non-contact electrical detection distances are different, which can cover a wider range of electromagnetic environment conditions, avoid the inability to cope with complex electromagnetic interference due to the setting of a single distance, and ensure that effective electrical detection tests can be performed under different interference conditions; by starting the non-contact electrical detection module and conducting tests at two different distances, the first The first and second non-contact electrical test signals can provide data in more dimensions, which is helpful to make more accurate analysis and response to electromagnetic environment interference at different distances. The two sets of signals can reflect the electrical test performance of the target conductor under different electromagnetic interference conditions; by analyzing the volatility of the two sets of non-contact electrical test signals, the stability of the signal can be detected, and the fluctuation consistency judgment can determine whether the two sets of signals show similar fluctuation characteristics in different environments. If the signals remain consistent at different distances, it means that the test system can operate stably in complex electromagnetic environments, ensuring the consistency of test results; according to the judgment results of fluctuation consistency, when the fluctuation consistency does not meet the standards, the contact verification instruction is activated, and finally the electrical test results of the target conductor are output according to the non-contact electrical test results and the contact electrical test results. This process can effectively avoid misjudgment caused by external interference and improve the accuracy and safety of the overall system.

[0009] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 A flow chart of the anti-interference electrical testing method for a complex electromagnetic environment provided in an embodiment of the present application.

[0011] Figure 2 This is a schematic diagram of the structure of an anti-interference electrical testing system for complex electromagnetic environments provided in an embodiment of the present application.

[0012] Description of the accompanying drawings: electromagnetic environment parameter acquisition module 10, non-contact electrical detection distance determination module 20, non-contact test sampling module 30, fluctuation consistency judgment module 40, electrical detection test result output module 50. DETAILED DESCRIPTION

[0013] The embodiments of the present application provide an anti-interference electrical test method and system for complex electromagnetic environments, thereby solving the technical problem that most of the existing electrical test technologies rely on traditional signal filtering methods or simple signal analysis methods, and it is difficult to effectively distinguish interference signals from real signals when faced with complex interference signals, thereby leading to inaccurate test results.

[0014] After introducing the basic principles of this application, various non-limiting embodiments of this application will be specifically described below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to explain this application and are not used to limit this application.

[0015] Example 1, as Figure 1 As shown, the embodiment of the present application provides an anti-interference electrical testing method for a complex electromagnetic environment, the method comprising:

[0016] Obtain the electromagnetic environment parameters of the target conductor.

[0017] Environmental detection sensors are used to obtain the electromagnetic environment parameters around the target conductor. These sensors can measure and collect electromagnetic field information around the target conductor in real time. Common sensors include electric field detectors, magnetic field detectors, and spectrum analyzers. The obtained electromagnetic environment parameters include signal-to-noise ratio change trends, electric field strength, and electromagnetic spectrum distribution, providing a basis for subsequent non-contact electrical test distance calculations.

[0018] A first non-contact electrical test distance and a second non-contact electrical test distance are determined based on the electromagnetic environment parameters, wherein the first non-contact electrical test distance and the second non-contact electrical test distance have different distance values.

[0019] A target signal-to-noise ratio value is set, which is the standard for the system to select the non-contact electrical test distance. The signal-to-noise ratio value is usually determined based on the expected test accuracy or the characteristics of the electromagnetic environment. The purpose of setting the target signal-to-noise ratio value is to ensure that the electrical test distance can achieve a sufficient signal-to-noise ratio in a specific electromagnetic environment, thereby ensuring the effectiveness of the test. The non-contact electrical test module starts and samples according to the set step size, recording the signal-to-noise ratio of each sampling point. As the sampling progresses, the target conductor is gradually approached at different distances, and the signal quality is continuously monitored. The signal-to-noise ratio value of each sampling point is recorded until a distance that meets the set signal-to-noise ratio target value is found. When this signal-to-noise ratio target value is reached, the position is recorded as the first non-contact electrical test distance.

[0020] After obtaining the first non-contact electrical test distance, the waveform curve characteristics of this position are recorded. This waveform characteristic represents the change of the electromagnetic signal at this distance, including the frequency, fluctuation amplitude and other information of the signal. According to the first non-contact electrical test distance, a neighborhood sampling point area is defined. The neighborhood sampling point area includes areas close to and far away from the first non-contact electrical test distance. Further distance optimization is performed through these areas. Specifically, according to the first non-contact electrical test distance and the recorded waveform characteristics, distance optimization is performed in the non-neighborhood sampling point area to find the second non-contact electrical test distance. The waveform curve characteristics at this distance should have a high degree of similarity with the waveform curve characteristics of the first non-contact electrical test distance to ensure that the second non-contact electrical test distance is highly similar to the first non-contact electrical test distance in waveform characteristics.

[0021] The non-contact electrical detection module is started to perform non-contact test sampling on the target conductor at the first non-contact electrical detection distance and the second non-contact electrical detection distance to generate a first non-contact electrical detection test signal and a second non-contact electrical detection test signal.

[0022] Start the non-contact electrical detection module. This module is usually a special device or system that can detect the electrical status of the target conductor in a non-contact manner. Its working principle depends on the changes in the electromagnetic field. For example, the electrical characteristics of the target conductor are judged by measuring the changes in the electric or magnetic field around the conductor. After the non-contact electrical detection module is started, it enters the test mode and prepares to collect data.

[0023] Non-contact test sampling is performed at the first non-contact electrical detection distance. Signals such as changes in electric field strength and voltage fluctuations around the conductor are detected in a contactless manner. During the test, the generated test signals are recorded to obtain the first non-contact electrical detection test signal. This signal represents the electrical data measured at this distance, and usually contains information such as voltage fluctuations and frequency changes.

[0024] At the second non-contact electrical test distance, the device continues the electrical test. This time, the device changes the distance from the target conductor for a second round of sampling. The second non-contact electrical test distance may be relatively long or short, depending on the previous distance optimization result. At this distance, a second non-contact electrical test signal is generated, which also contains the electrical fluctuation characteristics of the conductor. These signals are used to further analyze the electrical condition of the target conductor to determine whether it is in acceptable working condition.

[0025] The first non-contact electrical test signal and the second non-contact electrical test signal are analyzed for fluctuations to obtain a first signal waveform and a second signal fluctuation, and a fluctuation consistency judgment is performed on the first signal waveform and the second signal fluctuation to obtain a consistency judgment result.

[0026] A fluctuation analysis is performed on the first non-contact electrical test signal and the second non-contact electrical test signal. The goal of the fluctuation analysis is to extract the key features of the signal and understand how the signal changes over time. The specific analysis content includes the signal fluctuation mean, the number of peaks, the Fourier transform period, and the rate of change of the frequency amplitude. Based on the above analysis, the waveform of the first signal and the volatility of the second signal are evaluated respectively.

[0027] The waveform of the first signal and the volatility of the second signal are judged for fluctuation consistency. This is done by comparing the similarities of the two signals in terms of waveform, period, peak, frequency, etc. For example, the waveform morphology similarity, period frequency similarity and fluctuation trend similarity of the two signals are calculated. Based on the calculation results of the above similarities, a consistency judgment result is obtained. If the fluctuation consistency of the first signal and the second signal is high, it means that the changing trends and characteristics of the two signals are similar, and the consistency judgment result is passed; if the consistency is low, it means that there are large differences in the fluctuation characteristics of the two signals, and the consistency judgment result is failed.

[0028] The contact verification instruction is activated according to the consistency judgment result, and the electrical test result of the target conductor is output.

[0029] If the consistency judgment result is passed, it means that the consistency between the non-contact electrical test signals is good. It can be considered that the target conductor performs consistently at the two test distances. Therefore, no further contact verification is required and the non-contact electrical test result is directly output.

[0030] If the consistency judgment result is failure, it means that there are large differences between the non-contact test signals, which may be due to external interference, changes in the electromagnetic environment or other factors. Further confirmation through contact testing is required. At this time, activate the contact verification instruction, and perform actual contact testing on the target conductor through the contact voltage detection probe, and record the contact electrical test signals. These signals are used for further analysis to ensure that the electrical status of the target conductor meets the electrical test requirements.

[0031] When the non-contact or contact test is completed, the electrical state of the target conductor is analyzed according to the collected test signal (whether it is a non-contact test signal or a contact test signal), and the electrical test result is output.

[0032] Furthermore, the method of determining whether to activate contact verification or output electrical test results according to the consistency judgment result includes:

[0033] If the consistency judgment result is passed, the non-contact electrical test result of the target conductor is output, wherein the consistency judgment result is determined to be passed when the fluctuation consistency of the first signal waveform and the second signal volatility is greater than a preset threshold; activate the contact verification instruction, and let the contact voltage detection probe perform contact test sampling on the target conductor, obtain the contact electrical test signal, analyze the contact electrical test signal and output the contact electrical test result of the target conductor; output the electrical test result of the target conductor according to the non-contact electrical test result and the contact electrical test result of the target conductor.

[0034] When the consistency judgment result is passed, it means that the fluctuation characteristics of the two signals are highly consistent, indicating that the electrical state of the target conductor is consistent at different non-contact electrical testing distances. Specifically, the fluctuation consistency is calculated by comparing the morphology, frequency, fluctuation amplitude and other characteristics of the two signals. If the consistency is greater than the preset threshold, for example, the correlation coefficient is greater than a set value, the consistency result is judged to be passed. The preset threshold is set according to the actual needs of the system and the electrical testing standards. This threshold reflects the minimum acceptance standard for signal consistency. If the fluctuation consistency is higher than the threshold, the difference between the two signals is considered to be within an acceptable range and the electrical state of the target conductor is stable at the two measurement distances.

[0035] When the consistency judgment is passed, the non-contact electrical test result of the target conductor is output. The result indicates that the target conductor has passed the non-contact electrical test, and the electrical state has not changed significantly at different non-contact electrical test distances, and the signal characteristics are stable.

[0036] When the consistency judgment result is failed, that is, the fluctuation consistency of the non-contact electrical test signal does not reach the preset threshold, the contact verification instruction is automatically activated. This is to further confirm the electrical status of the target conductor through contact testing.

[0037] Based on the contact verification instruction, the contact voltage detection probe is guided to physically contact the target conductor to sample the electrical signal. The contact test is more accurate than the non-contact test because it can eliminate the influence of external electromagnetic interference on the test results by directly contacting the target conductor. During the test, the voltage detection probe collects the electrical signal of the target conductor and records information such as voltage fluctuations and current changes. This information reflects the electrical state of the target conductor, and the collected signal is integrated as the contact electrical test signal.

[0038] Analyze the contact test signal to evaluate the electrical condition of the target conductor. You can determine whether the conductor is in good electrical condition by analyzing the amplitude, frequency, fluctuation, etc. of these signals. If the contact test signal indicates that the target conductor is in a normal state, it can be inferred that the conductor is safe. Otherwise, there may be an electrical fault.

[0039] The above-mentioned non-contact electrical test results and contact electrical test results are combined to output the final electrical test results of the target conductor.

[0040] Furthermore, if the consistency judgment result fails, the contact verification instruction is activated to instruct the contact voltage detection probe to perform contact test sampling on the target conductor, obtain a contact electrical test signal, analyze the contact electrical test signal and output the contact electrical test result of the target conductor; wherein, when the fluctuation consistency of the first signal waveform and the second signal volatility is less than or equal to the preset threshold, the consistency judgment result is determined to be failed; and the contact electrical test result of the target conductor is output as the electrical test result.

[0041] The fluctuation consistency of the waveform of the first signal and the volatility of the second signal is calculated. This consistency is judged by comparing the fluctuation characteristics, periodicity and other signal characteristics of the signals. If the calculated fluctuation consistency is less than or equal to the set preset threshold, for example, the correlation coefficient is lower than a certain set value, or the waveform similarity is insufficient, then the consistency judgment result is judged to be failed. For example, if the correlation coefficient is 0.7 and the preset threshold is 0.8, then the consistency judgment result is considered to be failed. This situation usually indicates that the difference between the signals is large, which may be due to external interference, changes in test position and other factors, resulting in unstable non-contact test results.

[0042] If the consistency check fails, the contact check command is activated. This command instructs the system to perform a contact test on the target conductor using a contact voltage detection probe. Because contact testing directly contacts the conductor, it eliminates the influence of electromagnetic interference or other environmental factors and, in this case, provides more reliable measurement data. The contact voltage detection probe makes physical contact with the target conductor and collects contact voltage test signals. These signals typically contain voltage, current, and other electrical characteristic data, directly reflecting the electrical status of the target conductor. The collected signals are analyzed to further determine whether there are any electrical problems with the target conductor and output the contact voltage test results.

[0043] If the consistency judgment fails, the contact test signal collected by the contact voltage detection probe is used to analyze and determine the contact test result of the target conductor. Contact test results are generally more accurate than non-contact tests. Further analysis of the contact test signal, such as changes in voltage and current, is performed to determine the electrical condition of the target conductor. If the contact test result indicates that the target conductor is in normal working condition, the contact test result is passed; if the test signal is abnormal, it is failed. The contact test result is output as the final test result. This result will indicate whether the electrical condition of the target conductor meets electrical safety standards and can be used for subsequent processing or reporting.

[0044] Furthermore, the method for determining the first non-contact electrical detection distance and the second non-contact electrical detection distance using the electromagnetic environment parameters includes:

[0045] Set a target signal-to-noise ratio value; start the non-contact electrical detection module to sample close to the target conductor with a preset step size, record the signal-to-noise ratio value of each sampling point, until the sampling point position that meets the signal-to-noise ratio target value is obtained and set as the first non-contact electrical detection distance; record the waveform curve characteristics of the first non-contact electrical detection distance; define a neighborhood sampling point area based on the first non-contact electrical detection distance; perform distance optimization in the non-neighborhood sampling point area according to the waveform curve characteristics to obtain a second non-contact electrical detection distance, wherein the similarity between the waveform curve characteristics under the second non-contact electrical detection distance and the waveform curve characteristics of the first non-contact electrical detection distance is greater than a preset similarity threshold.

[0046] The signal-to-noise ratio is an important indicator used to measure signal quality. The higher the signal-to-noise ratio, the better the signal quality and the less noise interference. The signal-to-noise ratio target value is set to ensure that the collected signal has sufficient clarity during non-contact electrical testing and can accurately reflect the electrical state of the target conductor. The signal-to-noise ratio target value can be set according to different application requirements, usually based on the accuracy required by the system and the noise level of the test environment. For example, the signal-to-noise ratio target value can be set to 20dB, 30dB or higher, depending on the required signal quality.

[0047] Start the non-contact electrical detection module, which is a device used to detect the electrical status of the target conductor. It can collect signals by detecting the electromagnetic field around the target conductor without directly contacting the conductor, thereby obtaining the electrical status of the target conductor.

[0048] Sampling is performed by gradually approaching the target conductor with a preset step size, that is, the sampling point interval. The size of the step size determines the degree of sampling precision. A smaller step size can obtain more precise measurement results, but it also requires more time and computing resources. For example, the step size is set to 1cm or 5cm. Each sampling records the signal-to-noise ratio value of the current position. These signal-to-noise ratio values ​​reflect the electromagnetic signal quality of the target conductor at that position. The change in the signal-to-noise ratio value can be used to evaluate whether the electrical state of the target conductor is stable, as well as the signal strength and interference level at different positions.

[0049] Sampling continues until the recorded signal-to-noise ratio value reaches or exceeds the target signal-to-noise ratio value. Once the target signal-to-noise ratio is reached, this position is marked as the first non-contact electrical test distance. This distance is the position where the signal quality is considered high enough for reliable electrical testing during the test process.

[0050] In the previous step, the signal-to-noise ratio data at the first non-contact electrical test distance was obtained through the non-contact electrical test module. At this time, the waveform curve characteristics of the distance are recorded. The waveform curve is a manifestation of the change of the electromagnetic field intensity around the target conductor with time or distance. The waveform curve characteristics include the amplitude of the waveform, the frequency of the waveform, the shape of the waveform, and the periodic characteristics. These waveform curve characteristics are used to judge the electrical state of the target conductor at different distances to ensure that the waveform characteristics measured at other distances are similar to the first non-contact electrical test distance.

[0051] The neighborhood sampling point area is an area defined around the first non-contact electrical test distance. These sampling points are relatively close to the first non-contact electrical test distance. Usually, the neighborhood sampling point area is defined within a certain range before and after the first non-contact electrical test distance. For example, if the first non-contact electrical test distance is 1 meter, the neighborhood sampling point area may be between 0.9 meters and 1.1 meters.

[0052] The non-neighborhood sampling point area refers to other distance positions that are not in the neighborhood area. These positions are farther or closer than the first non-contact electrical detection distance. By analyzing the signals of these points, another distance that meets the requirements can be further found.

[0053] According to the waveform curve characteristics of the first non-contact electrical test distance, the optimal distance in the non-neighborhood sampling point area is calculated. This process relies on the similarity of the waveform curve to determine the optimal non-contact electrical test distance. Specifically, when performing distance optimization, the signals at other distances are analyzed based on the waveform curve characteristics recorded in the first non-contact electrical test distance. Specifically, the similarity between the signal waveform of each non-neighborhood sampling point area and the signal waveform of the first non-contact electrical test distance is calculated. The higher the similarity, the more similar the signal waveform of the distance is to the waveform characteristics of the first non-contact electrical test distance. When the similarity between the waveform curve characteristics of a certain sampling point and the waveform curve characteristics of the first non-contact electrical test distance is greater than the preset similarity threshold, it is considered that this sampling point meets the electrical test requirements and is determined to be the second non-contact electrical test distance.

[0054] Furthermore, based on the first non-contact electrical detection distance, a neighborhood sampling point area is defined, and the method includes:

[0055] A neighborhood distance d is set, and a near neighborhood sampling point area is generated by the neighborhood distance d close to the target conductor using the first non-contact electrical test distance; a far neighborhood sampling point area is generated by the neighborhood distance d far from the target conductor using the first non-contact electrical test distance; and the neighborhood sampling point area is composed of the near neighborhood sampling point area and the far neighborhood sampling point area.

[0056] Set the neighborhood distance d. The neighborhood distance d is a fixed distance value used to define the area from the first non-contact electrical detection distance to the target conductor. This distance d can be set according to the system accuracy requirements or environmental characteristics, such as 0.1 meters, 0.5 meters, etc. The near-neighborhood sampling point area refers to the area defined by the neighborhood distance d extending from the first non-contact electrical detection distance toward the target conductor, that is, in the direction close to the target conductor. This area includes some points relatively close to the first non-contact electrical detection distance, which are used to sample and evaluate the volatility of the signal.

[0057] The distant neighborhood sampling point area starts from the first non-contact electrical test distance and extends in the direction away from the target conductor. Here, the neighborhood distance d is also used to define the area away from the target conductor. This area will cover the part of the first non-contact electrical test distance away from the target conductor, which is at a farther distance. This means that the distant neighborhood sampling point area includes the distance range d behind the first non-contact electrical test distance, which is used to analyze signal changes and electrical status.

[0058] The neighborhood sampling point area is composed of the near neighborhood sampling point area and the far neighborhood sampling point area generated previously. This area covers the area starting from the first non-contact electrical detection distance and extending to both sides of the target conductor. This complete neighborhood sampling point area defines a front-to-back symmetrical sampling interval, allowing signal sampling and analysis to be performed in the neighborhood of the first non-contact electrical detection distance.

[0059] Furthermore, the distance optimization is performed in the non-neighborhood sampling point area according to the waveform curve characteristics, and the method includes:

[0060] Among them, the non-neighborhood sampling point area is the complement area of ​​the neighborhood sampling point area, including the non-neighborhood sampling point area close to the near-neighborhood sampling point area, and the non-neighborhood sampling point area far away from the far-neighborhood sampling point area; when the first non-contact electrical test distance is greater than the preset non-contact electrical test distance, the distance optimization is performed in the non-neighborhood sampling point area close to the near-neighborhood sampling point area to obtain the second non-contact electrical test distance; when the first non-contact electrical test distance is less than the preset non-contact electrical test distance, the distance optimization is performed in the non-neighborhood sampling point area far away from the far-neighborhood sampling point area to obtain the second non-contact electrical test distance.

[0061] The non-neighborhood sampling point area is the complement area of ​​the neighborhood sampling point area, that is, the non-neighborhood sampling point area refers to the area that is not within the scope of the neighborhood sampling point area. The non-neighborhood sampling point area can be divided into two parts: the non-neighborhood sampling point area close to the near-neighborhood sampling point area, this part of the area is located outside the direction of the first non-contact electrical test distance close to the target conductor, and is located outside the near-neighborhood sampling point area. This is a part of the area immediately outside the near-neighborhood sampling point area; the non-neighborhood sampling point area far from the far-neighborhood sampling point area, this part of the area is located outside the direction of the first non-contact electrical test distance far from the target conductor, and is located outside the far-neighborhood sampling point area. This is a part of the area immediately outside the far-neighborhood sampling point area.

[0062] The non-neighborhood sampling point area provides a wider sampling area for subsequent distance optimization. Especially when the first non-contact electrical detection distance has been set, the distance can be optimized and adjusted within this area to find other test distances.

[0063] When the first non-contact electrical test distance is greater than the preset non-contact electrical test distance, the preset non-contact electrical test distance is a standard distance defined based on equipment specifications, test requirements or environmental factors. The first non-contact electrical test distance is adjusted according to the standard to ensure that the optimized test distance can meet the system requirements.

[0064] In this case, the second non-contact electrical detection distance is found by further sampling and signal analysis of the non-neighborhood sampling point area close to the neighborhood sampling point area. This area is the area outside the neighborhood of the first non-contact electrical detection distance. The signal characteristics of different sampling points are evaluated in this area, and the best second non-contact electrical detection distance is found by comparing the similarity of the waveform curves of these sampling points with the waveform curve characteristics of the first non-contact electrical detection distance. The waveform curve characteristics at this distance should be highly similar to the waveform characteristics of the first non-contact electrical detection distance, ensuring that non-contact electrical detection can be performed stably and accurately at the new distance.

[0065] When the first non-contact electrical test distance is less than the preset non-contact electrical test distance, the second non-contact electrical test distance is found by further sampling and signal analysis of the non-neighborhood sampling point area far away from the distant neighborhood sampling point area. This area is the area outside the distant neighborhood of the first non-contact electrical test distance. Similarly, the signal characteristics of different sampling points are evaluated in this area, and the optimal second non-contact electrical test distance is found by comparing the similarity between the waveform curves of these sampling points and the waveform curve characteristics of the first non-contact electrical test distance.

[0066] Furthermore, the electromagnetic environment parameters are acquired through an environment detection sensor, and the electromagnetic environment parameters at least include a signal-to-noise ratio change trend, electric field strength, and electromagnetic spectrum distribution.

[0067] Electromagnetic environment parameters are acquired through environmental detection sensors, such as electric field detectors, spectrum analyzers, and noise detectors. These parameters are used to assess changes in the electromagnetic environment, which affect electromagnetic wave propagation, signal quality, and equipment operation. Electromagnetic environment parameters include at least the signal-to-noise ratio trend, electric field strength, and electromagnetic spectrum distribution.

[0068] Among them, the signal-to-noise ratio is a measure of the ratio between signal strength and noise strength. The higher the signal-to-noise ratio, the clearer the signal is relative to the noise and the better the transmission quality. The signal-to-noise ratio trend refers to the change pattern of the signal-to-noise ratio over time or environmental changes. By monitoring the signal-to-noise ratio changes in real time through detectors, changes in interference or noise sources in the electromagnetic environment can be discovered in a timely manner, and the operating parameters of the system or equipment can be adjusted to ensure signal stability.

[0069] Electric field strength refers to the strength of the electric field or the density of electric power in the electric field. In electromagnetic environment monitoring, electric field strength is a key parameter because changes in electric field strength directly affect the signal quality of wireless communication systems and even affect the normal operation of equipment. In an electromagnetic environment, strong electric fields can cause interference between devices and even generate electromagnetic radiation.

[0070] The electromagnetic spectrum distribution describes the distribution of electromagnetic waves within different frequency ranges. It involves the signal strength within different frequency bandwidths and can help analyze the characteristics and fluctuations of electromagnetic waves. By detecting the electromagnetic spectrum distribution, it is possible to identify whether there is strong signal interference or frequency occupancy within a specific frequency range, and then appropriately adjust the operating frequency band of the equipment to avoid signal overlap or interference.

[0071] Furthermore, the method of analyzing the fluctuation of the first non-contact electrical detection test signal and the second non-contact electrical detection test signal to obtain the first signal waveform and the second signal fluctuation includes:

[0072] Features of the first non-contact electrical detection test signal and the second non-contact electrical detection test signal are calculated, and the features include the signal fluctuation mean, the number of peaks, the Fourier transform period, and the rate of change of the frequency amplitude; based on the signal fluctuation mean, the number of peaks, the Fourier transform period, and the rate of change of the frequency amplitude, the first signal waveform of the first non-contact electrical detection test signal and the second signal fluctuation of the second non-contact electrical detection test signal are analyzed.

[0073] The features of the first non-contact electrical test signal and the second non-contact electrical test signal are calculated. The main purpose is to extract and analyze the key features in the signals for subsequent signal analysis and comparison. The features include signal fluctuation mean, number of peaks, Fourier transform period and rate of change of frequency amplitude. Among them, the signal fluctuation mean is the average value of the fluctuation intensity of the signal in a certain time interval, which reflects the stability of the signal. The smaller the fluctuation mean, the smoother the signal; the number of peaks refers to the number of peaks in the signal waveform. The number of peaks can reflect the periodic changes of the signal. A large number of peaks may indicate a higher frequency of the signal; the Fourier transform period is the frequency domain feature of the signal obtained by Fourier transforming the signal. The periodic changes will be reflected in the periodic components in the frequency domain. The Fourier transform period reflects the periodic characteristics of the signal; the rate of change of frequency amplitude represents the rate of change of the signal frequency, reflecting whether the frequency of the signal has changed within a certain time period and the magnitude of this change.

[0074] Based on the characteristics of the above calculations, the waveform of the first non-contact electrical test signal is analyzed. The waveform reflects the stability and periodicity of the signal. If the number of peaks is large and the frequency amplitude change rate is small, it means that the waveform of the signal is relatively stable and has good periodicity. By calculating the fluctuation mean and the number of peaks, it can be determined whether the waveform of the first signal shows periodic fluctuations and whether it conforms to the expected non-contact electrical test mode.

[0075] Based on the characteristics calculated above, the volatility of the second non-contact electrical test signal is analyzed. Volatility analysis focuses on the dynamic amplitude of the signal, that is, the degree of change in the signal within a certain time interval. If the frequency amplitude change rate of the signal is high, it indicates that the signal has large dynamic changes and strong volatility. Conversely, if the frequency change is small, it indicates that the signal volatility is low and relatively stable. The volatility of the second signal is quantified by the frequency amplitude change rate. This feature can be used to determine whether the second non-contact electrical test signal is stable and whether it has excessive fluctuations or irregular changes.

[0076] Furthermore, the method for determining the consistency of fluctuations of the first signal waveform and the second signal fluctuation includes:

[0077] The Pearson correlation coefficient is used to perform similarity matching on the waveform characteristics of the first signal and the volatility characteristics of the second signal to obtain waveform morphology similarity, periodic frequency similarity, and fluctuation trend similarity; weight calculation is performed based on the waveform morphology similarity, periodic frequency similarity, and fluctuation trend similarity to output the fluctuation consistency of the first signal and the second signal.

[0078] The Pearson correlation coefficient is a commonly used statistical method used to measure the strength of the linear relationship between two variables. The value range is between -1 and +1, where +1 indicates a perfect positive correlation, -1 indicates a perfect negative correlation, and 0 indicates no linear relationship. In this step, the Pearson correlation coefficient is used to measure the characteristic similarity of the waveform of the first signal and the volatility of the second signal.

[0079] By calculating the Pearson correlation coefficient, we can obtain the waveform morphology similarity, period frequency similarity and fluctuation trend similarity. Among them, the waveform morphology similarity measures whether the waveform morphology of the two signals is similar, involving the shape of the peak, the position of the trough, the smoothness of the signal, etc.; the period frequency similarity is to compare whether the periodicity and frequency of the two signals are consistent. By analyzing the frequency characteristics obtained by Fourier transform, we can determine whether the period of the signals is consistent and whether the frequency is similar; the fluctuation trend similarity is to analyze whether the fluctuation trends of the two signals are consistent, specifically whether the fluctuation amplitudes of the signals are similar and whether the change trends are the same.

[0080] For each feature, including waveform shape, cycle frequency, and fluctuation trend, a numerical value is calculated based on the Pearson correlation coefficient to represent the similarity between the two signals in that feature. For example, the waveform similarity between the first and second signals can be calculated by comparing their distribution at peaks and troughs. By calculating the similarity of each feature separately, the three different similarity values ​​mentioned above are obtained: waveform shape similarity, cycle frequency similarity, and fluctuation trend similarity.

[0081] The first three similarities—waveform similarity, cycle frequency similarity, and fluctuation trend similarity—are weighted according to their importance to arrive at the final fluctuation consistency value. The importance of different features may vary, and the weights of these features can be set based on actual needs. For example, if cycle frequency has a greater impact on overall fluctuation consistency, a higher weight can be set for cycle frequency similarity, and the weights for waveform form and fluctuation trend can be set as needed. After weighted calculation, the final fluctuation consistency value can be used to evaluate the fluctuation consistency of the first and second signals. The higher the fluctuation consistency, the more similar the dynamic change characteristics of the two signals, the better the signal stability during the test, and the higher the reliability.

[0082] In summary, the anti-interference electrical testing method for complex electromagnetic environments provided by the embodiments of the present application has the following technical effects:

[0083] By obtaining the electromagnetic environment parameters of the target conductor, the impact of external electromagnetic interference on the test process can be evaluated in real time, which provides a scientific basis for subsequent distance adjustment and signal analysis, ensuring that the test can adapt to different interference conditions in the actual electromagnetic environment and avoid errors caused by environmental changes; by determining the first non-contact electrical detection distance and the second non-contact electrical detection distance according to the electromagnetic environment parameters, it is ensured that the non-contact electrical detection test can flexibly adjust the test distance under different electromagnetic interference intensities, which helps to avoid interference caused by changes in the electromagnetic environment and improves the stability and accuracy of the test results. The first and second non-contact electrical detection distances are different, which can cover a wider range of electromagnetic environment conditions, avoid the inability to cope with complex electromagnetic interference due to the setting of a single distance, and ensure that effective electrical detection tests can be performed under different interference conditions; by starting the non-contact electrical detection module and conducting tests at two different distances, the first The first and second non-contact electrical test signals can provide data in more dimensions, which is helpful to make more accurate analysis and response to electromagnetic environment interference at different distances. The two sets of signals can reflect the electrical test performance of the target conductor under different electromagnetic interference conditions; by analyzing the volatility of the two sets of non-contact electrical test signals, the stability of the signal can be detected, and the fluctuation consistency judgment can determine whether the two sets of signals show similar fluctuation characteristics in different environments. If the signals remain consistent at different distances, it means that the test system can operate stably in complex electromagnetic environments, ensuring the consistency of test results; according to the judgment results of fluctuation consistency, when the fluctuation consistency does not meet the standards, the contact verification instruction is activated, and finally the electrical test results of the target conductor are output according to the non-contact electrical test results and the contact electrical test results. This process can effectively avoid misjudgment caused by external interference and improve the accuracy and safety of the overall system.

[0084] The second embodiment is based on the same inventive concept as the anti-interference electrical test method for complex electromagnetic environments in the previous embodiment. Figure 2 As shown, an embodiment of the present application provides an anti-interference electrical testing system for complex electromagnetic environments, the system comprising:

[0085] The electromagnetic environment parameter acquisition module 10 is used to acquire the electromagnetic environment parameters of the target conductor.

[0086] The non-contact electrical test distance determination module 20 is configured to determine a first non-contact electrical test distance and a second non-contact electrical test distance based on the electromagnetic environment parameters, wherein the first non-contact electrical test distance and the second non-contact electrical test distance have different distance values.

[0087] The non-contact test sampling module 30 is used to start the non-contact electrical detection module, perform non-contact test sampling on the target conductor at the first non-contact electrical detection distance and the second non-contact electrical detection distance, and generate a first non-contact electrical detection test signal and a second non-contact electrical detection test signal.

[0088] The fluctuation consistency judgment module 40 is used to analyze the fluctuation of the first non-contact electrical detection test signal and the second non-contact electrical detection test signal, obtain the first signal waveform and the second signal fluctuation, perform fluctuation consistency judgment on the first signal waveform and the second signal fluctuation, and obtain a consistency judgment result.

[0089] The electrical test result output module 50 is configured to activate a contact verification instruction according to the consistency judgment result and output the electrical test result of the target conductor.

[0090] Furthermore, the electrical test result output module 50 is configured to perform the following operation steps:

[0091] If the consistency judgment result is passed, the non-contact electrical test result of the target conductor is output, wherein the consistency judgment result is determined to be passed when the fluctuation consistency of the first signal waveform and the second signal volatility is greater than a preset threshold; activate the contact verification instruction, and let the contact voltage detection probe perform contact test sampling on the target conductor, obtain the contact electrical test signal, analyze the contact electrical test signal and output the contact electrical test result of the target conductor; output the electrical test result of the target conductor according to the non-contact electrical test result and the contact electrical test result of the target conductor.

[0092] Furthermore, the electrical test result output module 50 is configured to perform the following operation steps:

[0093] If the consistency judgment result fails, activate the contact verification instruction, instruct the contact voltage detection probe to perform contact test sampling on the target conductor, obtain a contact electrical test signal, analyze the contact electrical test signal and output the contact electrical test result of the target conductor; wherein, when the fluctuation consistency of the first signal waveform and the second signal volatility is less than or equal to the preset threshold, the consistency judgment result is determined to be failed; and the contact electrical test result of the target conductor is output as the electrical test result.

[0094] Furthermore, the non-contact electrical distance determination module 20 is configured to perform the following operation steps:

[0095] Set a target signal-to-noise ratio value; start the non-contact electrical detection module to sample close to the target conductor with a preset step size, record the signal-to-noise ratio value of each sampling point, until the sampling point position that meets the signal-to-noise ratio target value is obtained and set as the first non-contact electrical detection distance; record the waveform curve characteristics of the first non-contact electrical detection distance; define a neighborhood sampling point area based on the first non-contact electrical detection distance; perform distance optimization in the non-neighborhood sampling point area according to the waveform curve characteristics to obtain a second non-contact electrical detection distance, wherein the similarity between the waveform curve characteristics under the second non-contact electrical detection distance and the waveform curve characteristics of the first non-contact electrical detection distance is greater than a preset similarity threshold.

[0096] Furthermore, the non-contact electrical distance determination module 20 is configured to perform the following operation steps:

[0097] A neighborhood distance d is set, and a near neighborhood sampling point area is generated by the neighborhood distance d close to the target conductor using the first non-contact electrical test distance; a far neighborhood sampling point area is generated by the neighborhood distance d far from the target conductor using the first non-contact electrical test distance; and the neighborhood sampling point area is composed of the near neighborhood sampling point area and the far neighborhood sampling point area.

[0098] Furthermore, the electrical test result output module 50 is configured to perform the following operation steps:

[0099] Among them, the non-neighborhood sampling point area is the complement area of ​​the neighborhood sampling point area, including the non-neighborhood sampling point area close to the near-neighborhood sampling point area, and the non-neighborhood sampling point area far away from the far-neighborhood sampling point area; when the first non-contact electrical test distance is greater than the preset non-contact electrical test distance, the distance optimization is performed in the non-neighborhood sampling point area close to the near-neighborhood sampling point area to obtain the second non-contact electrical test distance; when the first non-contact electrical test distance is less than the preset non-contact electrical test distance, the distance optimization is performed in the non-neighborhood sampling point area far away from the far-neighborhood sampling point area to obtain the second non-contact electrical test distance.

[0100] Furthermore, the electromagnetic environment parameters are acquired through an environment detection sensor, and the electromagnetic environment parameters at least include a signal-to-noise ratio change trend, electric field strength, and electromagnetic spectrum distribution.

[0101] Furthermore, the fluctuation consistency judgment module 40 is configured to perform the following operation steps:

[0102] Features of the first non-contact electrical detection test signal and the second non-contact electrical detection test signal are calculated, and the features include the signal fluctuation mean, the number of peaks, the Fourier transform period, and the rate of change of the frequency amplitude; based on the signal fluctuation mean, the number of peaks, the Fourier transform period, and the rate of change of the frequency amplitude, the first signal waveform of the first non-contact electrical detection test signal and the second signal fluctuation of the second non-contact electrical detection test signal are analyzed.

[0103] Furthermore, the fluctuation consistency judgment module 40 is configured to perform the following operation steps:

[0104] The Pearson correlation coefficient is used to perform similarity matching on the waveform characteristics of the first signal and the volatility characteristics of the second signal to obtain waveform morphology similarity, periodic frequency similarity, and fluctuation trend similarity; weight calculation is performed based on the waveform morphology similarity, periodic frequency similarity, and fluctuation trend similarity to output the fluctuation consistency of the first signal and the second signal.

[0105] Through the above detailed description of the anti-interference electrical testing method for complex electromagnetic environments in this specification, those skilled in the art can clearly understand the anti-interference electrical testing system for complex electromagnetic environments in this embodiment. Since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part description.

[0106] The above description of the disclosed embodiments is intended to enable one skilled in the art to implement or use the present application. Various modifications to these embodiments will be readily apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application is not limited to the embodiments shown herein, but is intended to conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. Anti-interference electrical test method for complex electromagnetic environment, characterized by: The method comprises: Obtain the electromagnetic environment parameters of the target conductor; Determining a first non-contact electrical test distance and a second non-contact electrical test distance based on the electromagnetic environment parameters, wherein the first non-contact electrical test distance and the second non-contact electrical test distance have different distance values; Starting the non-contact electrical detection module, performing non-contact test sampling on the target conductor at the first non-contact electrical detection distance and the second non-contact electrical detection distance, and generating a first non-contact electrical detection test signal and a second non-contact electrical detection test signal; Analyzing the waveform of the first non-contact electrical test signal and the volatility of the second non-contact electrical test signal to obtain the waveform of the first signal and the volatility of the second signal, performing fluctuation consistency judgment on the waveform of the first signal and the volatility of the second signal, and obtaining a consistency judgment result; activating a contact verification instruction according to the consistency judgment result, and outputting an electrical test result of the target conductor; Determining whether to activate contact verification or output electrical test results based on the consistency judgment result includes: If the consistency judgment result is passed, outputting the non-contact electrical test result of the target conductor, wherein the consistency judgment result is determined to be passed when the fluctuation consistency of the first signal waveform and the second signal fluctuation is greater than a preset threshold; Activate the contact verification instruction, instruct the contact voltage detection probe to perform contact test sampling on the target conductor, obtain a contact voltage detection test signal, analyze the contact voltage detection test signal and output a contact voltage detection result of the target conductor; Outputting an electrical test result of the target conductor according to the non-contact electrical test result and the contact electrical test result of the target conductor; If the consistency judgment result fails, activating the contact verification instruction, instructing the contact voltage detection probe to perform a contact test sampling on the target conductor, obtaining a contact electrical test signal, analyzing the contact electrical test signal and outputting a contact electrical test result of the target conductor; Wherein, when the fluctuation consistency of the first signal waveform and the second signal volatility is less than or equal to the preset threshold, the consistency judgment result is determined to be failed; The contact electrical test result of the target conductor is output as an electrical test result.

2. The method according to claim 1, wherein The method for determining a first non-contact electrical detection distance and a second non-contact electrical detection distance using the electromagnetic environment parameters includes: Set the signal-to-noise ratio target value; Starting the non-contact electrical detection module to sample the target conductor with a preset step length, recording the signal-to-noise ratio value of each sampling point until a sampling point position that meets the target signal-to-noise ratio value is obtained and set as a first non-contact electrical detection distance; Recording the waveform characteristics of the first non-contact electrical test distance; Defining a neighborhood sampling point area according to the first non-contact electrical detection distance; According to the waveform curve characteristics, distance optimization is performed in a non-neighborhood sampling point area to obtain a second non-contact electrical test distance, wherein the waveform curve characteristics under the second non-contact electrical test distance are more similar to the waveform curve characteristics of the first non-contact electrical test distance than a preset similarity threshold.

3. The method according to claim 2, wherein Defining a neighborhood sampling point area according to the first non-contact electrical detection distance includes: Setting a neighborhood distance d, and using the first non-contact electrical detection distance to approach the neighborhood distance d of the target conductor to generate a near neighborhood sampling point area; Generate a distant neighborhood sampling point area at a neighborhood distance d away from the target conductor by the first non-contact electrical detection distance; The neighborhood sampling point area is composed of the near neighborhood sampling point area and the far neighborhood sampling point area.

4. The method according to claim 3, wherein According to the waveform curve characteristics, the distance optimization is performed in the non-neighborhood sampling point area. include: The non-neighborhood sampling point region is a complementary region of the neighborhood sampling point region, including the non-neighborhood sampling point region close to the near-neighborhood sampling point region and the non-neighborhood sampling point region far from the far-neighborhood sampling point region; When the first non-contact electrical test distance is greater than the preset non-contact electrical test distance, performing distance optimization in the non-neighborhood sampling point area close to the near-neighborhood sampling point area to obtain a second non-contact electrical test distance; When the first non-contact electrical test distance is less than the preset non-contact electrical test distance, a distance optimization is performed in the non-neighborhood sampling point area away from the distant neighborhood sampling point area to obtain a second non-contact electrical test distance.

5. The method according to claim 1, wherein The electromagnetic environment parameters are acquired through an environment detection sensor, and the electromagnetic environment parameters at least include a signal-to-noise ratio variation trend, electric field strength, and electromagnetic spectrum distribution.

6. The method according to claim 1, wherein Analyzing the fluctuation of the first non-contact electrical detection test signal and the second non-contact electrical detection test signal to obtain the first signal waveform and the second signal fluctuation, the method includes: Calculating features of the first non-contact electrical detection test signal and the second non-contact electrical detection test signal, the features including signal fluctuation mean, number of peaks, Fourier transform period, and rate of change of frequency amplitude; The first signal waveform of the first non-contact electrical detection test signal and the second signal fluctuation of the second non-contact electrical detection test signal are analyzed according to the signal fluctuation mean, the number of peaks, the Fourier transform period and the change rate of the frequency amplitude.

7. The method according to claim 6, wherein The method for determining the consistency of fluctuation of the first signal waveform and the second signal fluctuation includes: Using the Pearson correlation coefficient, the waveform characteristics of the first signal and the volatility characteristics of the second signal are matched to obtain waveform similarity, cycle frequency similarity, and fluctuation trend similarity; Weight calculation is performed based on the waveform morphology similarity, cycle frequency similarity, and fluctuation trend similarity, and the fluctuation consistency of the first signal and the second signal is output.

8. Anti-interference electrical test system for complex electromagnetic environment, characterized by: The system is used to implement the anti-interference electrical testing method for a complex electromagnetic environment according to any one of claims 1 to 7, comprising: An electromagnetic environment parameter acquisition module is used to obtain the electromagnetic environment parameters of the target conductor; a non-contact electrical test distance determination module, configured to determine a first non-contact electrical test distance and a second non-contact electrical test distance based on the electromagnetic environment parameters, wherein the first non-contact electrical test distance and the second non-contact electrical test distance have different distance values; a non-contact test sampling module, configured to start a non-contact electrical detection module, perform non-contact test sampling on the target conductor at the first non-contact electrical detection distance and the second non-contact electrical detection distance, and generate a first non-contact electrical detection test signal and a second non-contact electrical detection test signal; a fluctuation consistency judgment module, configured to analyze the waveform of the first non-contact electrical detection test signal and the fluctuation of the second non-contact electrical detection test signal, obtain the waveform of the first signal and the fluctuation of the second signal, perform fluctuation consistency judgment on the waveform of the first signal and the fluctuation of the second signal, and obtain a consistency judgment result; An electrical test result output module, configured to activate a contact verification instruction according to the consistency judgment result and output an electrical test result of the target conductor; The electrical test result output module is used to perform the following operation steps: If the consistency judgment result is passed, the non-contact electrical test result of the target conductor is output, wherein the consistency judgment result is determined to be passed when the fluctuation consistency of the first signal waveform and the second signal volatility is greater than a preset threshold; activating a contact verification instruction to instruct the contact voltage detection probe to perform a contact test sampling on the target conductor, obtain a contact electrical test test signal, analyze the contact electrical test signal and output the contact electrical test result of the target conductor; output the electrical test result of the target conductor based on the non-contact electrical test result and the contact electrical test result of the target conductor; If the consistency judgment result fails, activate the contact verification instruction, instruct the contact voltage detection probe to perform contact test sampling on the target conductor, obtain a contact electrical test signal, analyze the contact electrical test signal and output the contact electrical test result of the target conductor; wherein, when the fluctuation consistency of the first signal waveform and the second signal volatility is less than or equal to the preset threshold, the consistency judgment result is determined to be failed; and the contact electrical test result of the target conductor is output as the electrical test result.

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