Processing method and device based on current density, storage medium and electronic equipment

By collecting magnetic field data of crimped IGBT devices, reconstructing the current density using Ampere law, drawing the current distribution image, solving the problem of non-destructive measurement of current distribution in the prior art, and achieving convenient and efficient current distribution detection.

CN120294524APending Publication Date: 2025-07-11STATE GRID BEIJING ELECTRIC POWER CO +3
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Patent Information

Application Number
CN202510376299.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-27
Publication Date
2025-07-11

AI Technical Summary

Technical Problem

In the prior art, the current distribution of crimped IGBT devices cannot be directly measured, and conventional methods require damage to the device, resulting in high destructive detection.

Method used

By collecting the magnetic field data of the target device, reconstructing the current density using Ampere's law, analyzing the current distribution data, drawing the current density image, and achieving non-destructive detection.

Benefits of technology

It realizes convenient detection of current distribution of crimped IGBT devices, protects the device structure, improves the convenience and accuracy of detection, and reduces maintenance costs.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses a processing method and device based on current density, a storage medium and electronic equipment. Relates to the field of electronic information, and the method comprises the steps: collecting the magnetic field data of a target device, and the target device comprises a crimping type device; based on the Ampere's law, reconstructing the magnetic field data to obtain the current density of the target device; and analyzing the current density to obtain current distribution data of the target device. According to the invention, the technical problem that the damage degree of the crimping type IGBT device is high because the current distribution data can be measured only by destroying the tube shell of the crimping type IGBT device in the prior art is solved.
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Description

Technical Field

[0001] The present invention relates to the field of electronic information, and in particular, to a processing method, device, storage medium and electronic device based on current density. Background Art

[0002] The flexible DC converter valve and the DC circuit breaker are two key components in the DC power transmission system. The insulated gate bipolar transistor (IGBT), due to the characteristics of its fully controlled device, has become the core device of flexible DC power transmission. Combined with the modular multilevel converter (MMC) technology, it undertakes the task of sub-module switching control in the flexible DC converter valve to achieve the functions of regulating the voltage amplitude and phase angle and regulating the system power flow, while in the circuit breaker, it undertakes the function of quickly cutting off the fault current during a fault. In order to meet the requirements of increasingly high transmission power, various press-pack devices led by high-power press-pack IGBTs, due to their unique device structures, have advantages such as double-sided heat dissipation, high reliability, failure short circuit, and large current capacity, and occupy an important position in the field of high-voltage DC power transmission.

[0003] The press-pack IGBT device connects a large number of chips in parallel to achieve a higher power limit by increasing the current-carrying area during operation. However, due to problems such as uneven external mechanical pressure, device heating deformation, and manufacturing process errors, there is usually a parameter imbalance between different regions in the device, which will ultimately result in uneven current distribution in the device, affecting the current-carrying limit and service life of the device. However, due to the sealed package of the press-pack device and its internal compact structure, conventional current measurement methods cannot directly obtain its current distribution state. For example, the related technology intervention method requires destroying the device shell for detection, which causes a high degree of damage to the device and is not suitable for engineering applications.

[0004] In view of the above problems, no effective solution has been proposed yet. Summary of the Invention

[0005] Embodiments of the present invention provide a processing method, device, storage medium and electronic device based on current density, so as to at least solve the technical problem in the related art that it is necessary to destroy the shell of the press-pack IGBT device to measure the current distribution data, resulting in a high degree of damage to the press-pack IGBT device.

[0006] According to one aspect of an embodiment of the present invention, a processing method based on current density is provided, including: collecting magnetic field data of a target device, where the target device includes: a crimp-type device; reconstructing the magnetic field data based on Ampere's law to obtain the current density of the target device; analyzing the current density to obtain current distribution data of the target device.

[0007] Further, collecting magnetic field data of the target device includes: controlling a fluxgate current sensor to move along a preset collection path to collect the magnetic flux density in three dimensions of the target device, so as to obtain the magnetic field data.

[0008] Further, reconstructing the magnetic field data based on Ampere's law to obtain the current density of the target device includes: calculating the magnetic field gradient of the magnetic field data based on the preset collection path to obtain a target magnetic field gradient; determining the current density based on the target magnetic field gradient and Ampere's law.

[0009] Further, the magnetic field data includes: an initial magnetic flux density and a target magnetic flux density, where the initial magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at an initial position in the preset collection path, and the target magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at a termination position in the preset collection path; calculating the magnetic field gradient of the magnetic field data based on the preset collection path to obtain a target magnetic field gradient includes: determining the moving distance of the fluxgate current sensor based on the preset collection path; determining the target magnetic field gradient based on the moving distance, the initial magnetic flux density, and the target magnetic flux density.

[0010] Further, analyzing the current density to obtain the current distribution data of the target device includes: determining the magnitude of the current density; determining the divergence of the current density based on a first calculation strategy and the current density; determining the curl of the current density based on a second calculation strategy and the current density; obtaining the current distribution data based on the magnitude of the current density, the divergence of the current density, and the curl of the current density.

[0011] Further, after analyzing the current density to obtain the current distribution data of the target device, it further includes: drawing an image of the current distribution data to obtain a target image set, where the target image set includes at least one of the following: an image drawn based on the magnitude of the current density, an image drawn based on the curl of the current density, and an image drawn based on the divergence of the current density.

[0012] Further, after drawing an image of the current distribution data to obtain a target image set, the method further includes: obtaining a preset image set, where the preset image set includes an image representing the current distribution of the target device in a normal state; performing a comparative analysis on the preset image set and the target image set to obtain an analysis result, where the analysis result is used to indicate whether the target device has a fault; and in the case where the analysis result indicates that the target device has a fault, determining the area where the target device has a fault.

[0013] According to another aspect of the embodiments of the present invention, there is also provided a processing device based on current density, including: an acquisition unit configured to acquire magnetic field data of a target device, where the target device includes a crimp type device; a reconstruction unit configured to reconstruct the magnetic field data based on Ampere's law to obtain the current density of the target device; and an analysis unit configured to analyze the current density to obtain the current distribution data of the target device.

[0014] Further, the acquisition unit includes: a control subunit configured to control a fluxgate current sensor to move along a preset acquisition path to acquire the magnetic flux density in three-dimensional directions of the target device, so as to obtain the magnetic field data.

[0015] Further, the reconstruction unit includes: a calculation subunit configured to calculate a magnetic field gradient of the magnetic field data based on the preset acquisition path to obtain a target magnetic field gradient; and a first determination subunit configured to determine the current density based on the target magnetic field gradient and Ampere's law.

[0016] Further, the magnetic field data includes an initial magnetic flux density and a target magnetic flux density, where the initial magnetic flux density includes the magnetic flux density acquired by the fluxgate current sensor at an initial position in the preset acquisition path, and the target magnetic flux density includes the magnetic flux density acquired by the fluxgate current sensor at a termination position in the preset acquisition path; the calculation subunit includes: a first determination module configured to determine a moving distance of the fluxgate current sensor based on the preset acquisition path; and a second determination module configured to determine the target magnetic field gradient based on the moving distance, the initial magnetic flux density, and the target magnetic flux density.

[0017] Further, the analysis unit includes: an analysis subunit configured to determine the magnitude of the current density; a second determination subunit configured to determine the divergence of the current density based on a first calculation strategy and the current density; a third determination subunit configured to determine the curl of the current density based on a second calculation strategy and the current density; and a fourth determination subunit configured to obtain the current distribution data based on the magnitude of the current density, the divergence of the current density, and the curl of the current density.

[0018] Further, the processing device based on current density further includes: a drawing unit, configured to draw an image of the current distribution data after analyzing the current density to obtain the current distribution data of the target device, so as to obtain a target image set, where the target image set includes at least one of the following: an image drawn based on the magnitude of the current density, an image drawn based on the curl of the current density, and an image drawn based on the divergence of the current density.

[0019] Further, the processing device based on current density further includes: an obtaining unit, configured to obtain a preset image set after drawing an image of the current distribution data to obtain a target image set, where the preset image set includes: an image representing the current distribution of the target device in a normal state; a comparison unit, configured to perform a comparative analysis on the preset image set and the target image set to obtain an analysis result, where the analysis result is used to indicate whether the target device has a fault; and a determination unit, configured to determine the area where the target device has a fault when the analysis result indicates that the target device has a fault.

[0020] According to another aspect of the embodiments of the present invention, there is also provided an electronic device, including: a processor; and a memory, configured to store executable instructions of the processor; wherein the processor is configured to execute the method for processing based on current density according to any one of the above via executing the executable instructions.

[0021] According to another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium storing a computer program, where when the computer program runs, it controls the device where the computer-readable storage medium is located to execute the method for processing based on current density according to any one of the above.

[0022] In the present invention, magnetic field data of a target device is collected, where the target device includes: a press-fit type device; based on Ampere's law, the magnetic field data is reconstructed to obtain the current density of the target device; and the current density is analyzed to obtain the current distribution data of the target device. Thus, the technical problem in the related art that the housing of a press-fit type IGBT device needs to be damaged to measure the current distribution data, resulting in a high degree of damage to the press-fit type IGBT device, is solved. In the present invention, by collecting the magnetic field data around the target device and analyzing the current distribution of the target device according to the magnetic field data, the convenience of detecting the current distribution data and the technical effect of protecting the structure of the target device are achieved when it is not necessary to damage the target device to measure the current distribution data. Description of the Drawings

[0023] The accompanying drawings described herein are used to provide a further understanding of the present invention and form a part of this application. The schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation to the present invention. In the drawings:

[0024] Figure 1 is a flowchart of an optional current density-based processing method according to an embodiment of the present invention;

[0025] Figure 2 is a flowchart of an optional processing procedure of current density according to an embodiment of the present invention;

[0026] Figure 3 is a schematic diagram of an optional magnetic field measurement according to an embodiment of the present invention;

[0027] Figure 4 is a schematic diagram of an optional current density-based processing device according to an embodiment of the present invention;

[0028] Figure 5 is a schematic diagram of an electronic device according to an embodiment of the present invention. Detailed Embodiments

[0029] In order to enable those skilled in the art of the present technology to better understand the present invention solution, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0030] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above accompanying drawings are used to distinguish similar objects and do not necessarily need to be used to describe a specific order or sequence. It should be understood that such used data can be interchanged under appropriate circumstances so that the embodiments of the present invention described here can be implemented in an order other than those illustrated or described here. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device including a series of steps or units does not necessarily have to be limited to those clearly listed steps or units, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0031] It should be noted that the user information involved in this application (including but not limited to user device information, user personal information, etc.), the collected information and data (including but not limited to data for analysis, stored data, displayed data, etc.) are all information and data that have been authorized by the user or fully authorized by all parties. Moreover, the processing of relevant data such as collection, storage, use, processing, transmission, provision, disclosure, and application complies with the relevant laws, regulations, and standards of the relevant regions, takes necessary confidentiality measures, does not violate public order and good customs, and provides corresponding operation entrances for users to choose to authorize or refuse.

[0032] Embodiment 1

[0033] According to an embodiment of the present invention, there is provided an optional method embodiment of a processing method based on current density. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. And although the logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in a different order than here.

[0034] Figure 1 is a flowchart of an optional processing method based on current density according to an embodiment of the present invention, as Figure 1 shown, the method includes the following steps:

[0035] Step S101, collect magnetic field data of a target device, where the target device includes: a crimp-type device.

[0036] The above-mentioned target device includes: a crimp-type device, and the crimp-type device can be a crimp-type device with irreversible encapsulation characteristics. For example, a crimp-type IGBT device. The magnetic field data of the above-mentioned target device can include: three-dimensional magnetic field data of the target device, and the magnetic field data can be magnetic flux density.

[0037] In this embodiment, a fluxgate current sensor can be used to collect three-dimensional magnetic field data of the target device, so as to

[0038] Step S102, based on Ampere's law, reconstruct the magnetic field data to obtain the current density of the target device.

[0039] In this embodiment, Ampere's law can be used to convert the magnetic flux density (B ρ ) into current density (J), and the formula is:

[0040]

[0041] where μ0 = 4π×10 -7 , is the vacuum permeability, and ▽ can represent the Hamiltonian operator, B ρis the magnetic flux density in three-dimensional directions (B x , B y , B z ), and i, j, k are the unit vectors of the Cartesian coordinate system.

[0042] In this embodiment, the magnetic field data measured by the fluxgate current sensor can be substituted into Equation (1), and the vector current density components J (J x , J y , J z ) in three directions at the measurement point (i.e., the current density of the target device) can be obtained.

[0043] Step S103: Analyze the current density to obtain the current distribution data of the target device.

[0044] The above-mentioned current distribution data may include but are not limited to: the magnitude, divergence, and curl of the current density, etc.

[0045] In this embodiment, after obtaining the three components (J x , J y , J z ) of the current density, the information of the current density can be further analyzed through vector analysis, including calculating the magnitude, direction, curl, and divergence of the current density, so as to identify the current path and possible abnormal current distributions.

[0046] In an alternative example, the calculated current distribution data can also be converted into an image form. For example, the data can be mapped into a spatial coordinate system that matches the device size and structure, and then an image of the current density distribution can be generated using image processing techniques, so as to intuitively display the current distribution in the device. Specifically, potential fault points can be detected by analyzing the current distribution image, such as overheating areas, current path blockages, or short circuits, and the performance and lifespan of the device can be analyzed.

[0047] Optionally, collect the magnetic field data of the target device, including: controlling the fluxgate current sensor to move along a preset collection path to collect the magnetic flux density in three-dimensional directions of the target device to obtain the magnetic field data.

[0048] The above-mentioned fluxgate current sensor can be a high-precision magnetic field sensor, which works based on the fluxgate effect and can provide accurate measurement of the magnetic induction intensity (magnetic flux density) within a wide range of magnetic field intensities. By collecting magnetic field data with the fluxgate current sensor, subtle magnetic field changes around the target device can be captured, which is crucial for accurately analyzing the internal current distribution.

[0049] To comprehensively collect magnetic field data around a target device (such as a press-fit IGBT), one or more preset collection paths can be designed in advance. These paths should cover the entire outer surface of the device or at least the key areas where current flows. The collection paths can be designed in advance based on the size, shape of the target device, and the possible distribution patterns of the current, ensuring that the sensor can perform effective measurements from various angles and positions. In an optional example, a robotic arm, a mobile platform, or other automated devices can be used to precisely control the movement of the fluxgate current sensor along the preset path. The sensor can maintain a preset distance from the target device to avoid direct contact or affecting the measurement results. At the same time, the moving speed can be kept uniform and controllable to ensure the consistency and accuracy of data collection. During the movement of the sensor, the measured magnetic flux density values at each position point can be recorded in real time. Since the magnetic field data has directionality, the components of the magnetic induction intensity in three orthogonal directions (x, y, z) can be recorded, thereby obtaining three-dimensional magnetic field data for subsequent analysis, achieving the technical effect of accurately collecting the magnetic field data of the target device.

[0050] Through the above steps, in this embodiment, by collecting the magnetic field data around the target device and analyzing the current distribution of the target device based on the magnetic field data, the convenience of detecting the current distribution data and the technical effect of protecting the structure of the target device are achieved without the need to damage the target device to measure the current distribution data.

[0051] Figure 2 is a flowchart of an optional processing procedure of current density according to an embodiment of the present invention, as Figure 2 shown, including: collecting three-dimensional magnetic field data of a press-fit IGBT device through a fluxgate current sensor, reconstructing the three-dimensional magnetic field data based on Ampere's law to obtain a vector current density, generating a current density image according to the vector current density, and analyzing the current density image to determine the type of device damage and perform fault location.

[0052] Optionally, based on Ampere's law, reconstructing the magnetic field data to obtain the current density of the target device includes: calculating the magnetic field gradient of the magnetic field data based on a preset collection path to obtain a target magnetic field gradient; determining the current density based on the target magnetic field gradient and Ampere's law.

[0053] In this embodiment, based on the preset collection path, the moving distance of the fluxgate current sensor can be determined, and then based on the moving distance, the magnetic field gradient of the magnetic field data can be calculated. According to the magnetic field gradient and Ampere's law, the current density of the target device can be determined.

[0054] Specifically, using the magnetic field gradient expression ((i can be in the x, y, z directions, and j can be in the x, y, z directions) to simplify formula (1), the following can be obtained:

[0055]

[0056] Therefore, in this embodiment, after obtaining the target magnetic field gradient, the target magnetic field gradient can be substituted into formula (2) to obtain the current density.

[0057] Figure 3 is a schematic diagram of an optional magnetic field measurement according to an embodiment of the present invention, as Figure 3 shown, Figure 3 the lower half in is the actually operating press-pack IGBT (including current-carrying busbars), Figure 3 and the upper half is a fluxgate current sensor. Among them, the solid line part is the original position of the fluxgate sensor, and the dashed line part is the position after the sensor moves. Li represents the displacement. It should be noted that the busbar structure configured up and down for the press-pack IGBT is mainly used to construct a current transmission channel. Among them, the upper busbar is connected to a positive voltage, and the lower busbar is connected to a negative voltage. Through this bipolar power supply configuration, a standard current direction as Figure 3 shown can be established.

[0058] Optionally, the magnetic field data includes: an initial magnetic flux density and a target magnetic flux density. The initial magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the initial position in a preset acquisition path, and the target magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the termination position in a preset acquisition path; based on the preset acquisition path, calculating the magnetic field gradient of the magnetic field data to obtain the target magnetic field gradient, including: determining the moving distance of the fluxgate current sensor based on the preset acquisition path; determining the target magnetic field gradient based on the moving distance, the initial magnetic flux density, and the target magnetic flux density.

[0059] The above-mentioned magnetic field data may include: an initial magnetic flux density and a target magnetic flux density. The initial magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the initial position in a preset acquisition path, and the target magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the termination position in a preset acquisition path. In this embodiment, the target magnetic tape gradient can be determined based on the moving distance of the fluxgate current sensor, the initial magnetic flux density, and the target magnetic flux density. The calculation formula is as formula (3). Using formula (3), the magnetic field gradient values in three directions can be obtained.

[0060]

[0061] where B iA is the magnetic field strength in the i direction (i can be the x, y, z directions) of the sensor at the initial position, and B iB is the magnetic field strength in the j direction (j can be the x, y, z directions and i is in the same direction as j) of the sensor after the position movement, and Lj is the distance of displacement along this direction.

[0062] Optionally, analyze the current density to obtain the current distribution data of the target device, including: determining the magnitude of the current density; determining the divergence of the current density based on the first calculation strategy and the current density; determining the curl of the current density based on the second calculation strategy and the current density; and obtaining the current distribution data based on the magnitude of the current density, the divergence of the current density, and the curl of the current density.

[0063] In this embodiment, the current density can be analyzed through the first calculation strategy (e.g., formula (4)) to obtain its magnitude, through the second calculation strategy (e.g., formula (5)) to obtain the curl of the current density, and through the third calculation strategy (e.g., formula (6)) to obtain the divergence and direction of the current density. Combining these physical quantities with the spatial distribution can describe the characteristic quantities of the measured target. The direction of J can reflect the path of the current, and |J| reflects the magnitude of the current density; for a given current, the smaller the cross-sectional area perpendicular to the current direction, the greater the current density. The value (the curl of the current density) can reflect the presence of eddy currents, and its magnitude is related to the conduction current generating the eddy currents and the material of the eddy current region. The direction rotates around the direction of the conduction current and follows the right-hand rule. It can be used as an indicator for locating electromagnetic compatibility interference sources. (The divergence of the current density) indicates the points where the current diverges and converges. Under normal circumstances, the divergence distribution follows the law of conservation of current, and the values in most regions are zero. By analyzing the data of the current density to obtain the magnitude of the current density, the curl of the current density, and the divergence of the current density, it is convenient to accurately judge the type of fault that occurs in the target device and achieve fault location.

[0064]

[0065]

[0066] By substituting the target tape gradient into formula (2), the current density components in three directions at each measurement point (corresponding to the current density) can be obtained. By substituting the current density into formulas (4), (5), and (6), the magnitude of the current density, the curl of the current density, and the divergence of the current density can be obtained. Then, through magnetic field imaging, visual images of the magnitude of the current density, the curl of the current density, and the divergence of the current density can be obtained, and thus the current distribution state of the press-fit IGBT can be visually viewed, and then the health state of the chips inside the device can be inferred.

[0067] Optionally, after analyzing the current density to obtain the current distribution data of the target device, it further includes: plotting an image of the current distribution data to obtain a target image set, where the target image set includes at least one of the following: an image plotted based on the magnitude of the current density, an image plotted based on the curl of the current density, and an image plotted based on the divergence of the current density.

[0068] Plotting an image based on the magnitude of the current density may include: dividing the interior of the target device into a three-dimensional grid, with each grid point corresponding to a value of the current density magnitude; visualizing it using a color coding scheme according to the magnitude of the current density, where high current density regions are usually represented by brighter or warmer colors (such as red), while low current density regions are represented by darker or colder colors (such as blue); then, an image processing software or algorithm can be used to plot the current density magnitude values at the grid points as an image, forming an image based on the magnitude of the current density, to visually display the distribution of the current density within the device and help identify possible overheating regions or current concentration points.

[0069] Plotting an image based on the curl of the current density may include: determining the curl of the current density at each grid point; converting the calculated curl magnitude and direction into visual elements on the image, such as colors and arrows. Larger curl values are represented by brighter colors, and the direction is shown by the direction of the arrow. Plotting the curl data as an image forms an image based on the curl of the current density, which helps identify the rotational characteristics of the current and whether there are abnormal current eddy phenomena.

[0070] Plotting an image based on the divergence of the current density: determining the divergence of the current density at each grid point, that is, mapping the divergence value to the color of the image, where positive divergence values (current sources) and negative divergence values (current sinks) are represented by different colors, while divergence values close to zero are represented by another color or grayscale. Visualizing the divergence data as an image forms an image based on the divergence of the current density, which can reveal whether the current is concentrated or diverging at specific points and help locate possible current leakage or local current overload.

[0071] Optionally, after plotting the image of the current distribution data to obtain the target image set, it further includes: obtaining a preset image set, where the preset image set includes: an image representing the current distribution when the target device is in a normal state; performing a comparative analysis on the preset image set and the target image set to obtain an analysis result, where the analysis result is used to indicate whether the target device has a fault; in the case where the analysis result indicates that the target device has a fault, determining the area where the target device has a fault.

[0072] The preset image set refers to a series of images drawn by the same drawing method as the target image set under the normal operating conditions of the device, including the current density magnitude image, the current density curl image, and the current density divergence image. The preset image set provides a benchmark for the current distribution under the normal state of the target device. The preset image set can also be obtained through experiments, simulations, or theoretical calculations. The establishment of the preset image set can be carried out under various typical working conditions to cover the normal operating range of the device.

[0073] The magnitude of the current density can help diagnose circuit anomalies by comparing it with the normal state; the magnitude and direction of the current density curl can describe the rate and direction of the rotation or circulation of the vector current density, which is useful for indicating magnetic induction eddy currents; the current density divergence can indicate abnormal current convergence or leakage caused by various types of short circuits.

[0074] In this embodiment, first, the scanning path is specified to obtain magnetic field data, and then the data is converted into three feature images: the magnetic field intensity magnitude, divergence, and curl. Then, these three feature images (the target image set) are compared and analyzed with the preset standard images (the preset image set). Whether there is a short circuit fault is identified through the image differences, and the fault degree parameter is calculated. Finally, the fault location is located according to the abnormal area of the feature image.

[0075] Specifically, after obtaining the target image set (i.e., the current distribution image of the device in the current state), these images can be compared and analyzed with the preset image set. Specifically, numerical comparison: Using image processing and analysis software, calculate the differences between the two sets of images at each grid point to form a difference image for quantifying the change in the device state. Feature extraction and pattern recognition: Apply machine learning or deep learning algorithms to extract the key features of the images (such as the current density distribution pattern, abnormal values of curl and divergence, etc.), and based on these features, identify whether the device deviates from the normal state and obtain the analysis results.

[0076] The above analysis results will indicate whether there is a fault in the target device. If significant differences are found in the comparative analysis, it indicates that the current distribution of the target device deviates from the normal state, which may indicate that there are faults or potential problems in the device. The analysis results are usually presented in the form of reports or visualizations for easy understanding and interpretation by engineers.

[0077] In the case where the analysis results indicate the existence of a fault, by observing the difference image or specific current distribution images (such as divergence or curl images), the area where the fault occurs can be accurately located. The abnormal points or areas on the image will directly point to the parts inside the device that may be damaged or have degraded performance. Through this embodiment, not only can faults be detected, but also the fault area can be located, which is of great significance for real-time monitoring of ICBT devices to ensure system stability and security.

[0078] In this embodiment, through the divergence and curl analysis of the vector current density, not only the existence of the fault can be detected, but also the fault type can be distinguished. The comprehensive fault diagnosis capability greatly improves the efficiency and accuracy of fault handling; in this embodiment, it is possible to allow testing without damaging the IGBT module, which means that regular monitoring can be performed without affecting the normal operation of the equipment, thereby reducing maintenance costs and improving the availability of the equipment; by utilizing the second-order magnetic field gradient information, the impact of environmental noise is significantly reduced and the imaging quality is improved. This makes it possible to obtain a clear current density image even in an industrial environment with a lot of electromagnetic interference; through this embodiment, not only can the fault be located, but also quantitative information about the degree of the fault can be provided, which is crucial for formulating maintenance strategies and predicting the life of the equipment; by converting complex current distribution data into intuitive images, non-professional technicians can also understand and analyze the working status of the IGBT module, which improves the convenience of fault analysis.

[0079] Embodiment 2

[0080] The second embodiment of the present invention provides an optional current density-based processing device, and each implementation unit in the processing device corresponds to each implementation step in the first embodiment.

[0081] Figure 4 is a schematic diagram of an optional current density-based processing device according to an embodiment of the present invention, such as Figure 4 As shown, it includes: a collection unit 41, a reconstruction unit 42 and an analysis unit 43.

[0082] Wherein, the acquisition unit 41 is used to acquire magnetic field data of a target device, wherein the target device includes: a crimping type device;

[0083] A reconstruction unit 42, used to reconstruct the magnetic field data based on Ampere's law to obtain the current density of the target device;

[0084] The analysis unit 43 is used to analyze the current density to obtain the current distribution data of the target device.

[0085] In the processing device based on current density provided in the second embodiment of the present invention, the magnetic field data of the target device can be collected by the collection unit 41, where the target device includes: a crimp type device. Then, the reconstruction unit 42 reconstructs the magnetic field data based on Ampere's law to obtain the current density of the target device. Then, the analysis unit 43 analyzes the current density to obtain the current distribution data of the target device. Furthermore, it solves the technical problem in the related art that it is necessary to damage the shell of the crimp type IGBT device to measure the current distribution data, and the damage degree to the crimp type IGBT device is high. In this embodiment, by collecting the magnetic field data around the target device and analyzing the current distribution of the target device according to the magnetic field data, the convenience of detecting the current distribution data and the technical effect of protecting the structure of the target device are achieved when it is necessary to damage the target device to measure the current distribution data.

[0086] Optionally, in the processing device based on current density provided in the second embodiment of the present invention, the collection unit includes: a control sub-unit, configured to control the fluxgate current sensor to move along a preset collection path to collect the magnetic flux density in three-dimensional directions of the target device, so as to obtain the magnetic field data.

[0087] Optionally, in the processing device based on current density provided in the second embodiment of the present invention, the reconstruction unit includes: a calculation sub-unit, configured to calculate the magnetic field gradient of the magnetic field data based on the preset collection path to obtain the target magnetic field gradient; a first determination sub-unit, configured to determine the current density based on the target magnetic field gradient and Ampere's law.

[0088] Optionally, in the processing device based on current density provided in the second embodiment of the present invention, the magnetic field data includes: an initial magnetic flux density, a target magnetic flux density. The initial magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the initial position in the preset collection path, and the target magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the termination position in the preset collection path; the calculation sub-unit includes: a first determination module, configured to determine the moving distance of the fluxgate current sensor based on the preset collection path; a second determination module, configured to determine the target magnetic field gradient based on the moving distance, the initial magnetic flux density, and the target magnetic flux density.

[0089] Optionally, in the processing device based on current density provided in the second embodiment of the present invention, the analysis unit includes: an analysis sub-unit, configured to determine the magnitude of the current density; a second determination sub-unit, configured to determine the divergence of the current density based on the first calculation strategy and the current density; a third determination sub-unit, configured to determine the curl of the current density based on the second calculation strategy and the current density; a fourth determination sub-unit, configured to obtain the current distribution data based on the magnitude of the current density, the divergence of the current density, and the curl of the current density.

[0090] Optionally, in the current density-based processing device provided in the second embodiment of the present invention, the current density-based processing device further includes: a drawing unit, configured to draw an image of the current distribution data after analyzing the current density to obtain the current distribution data of the target device, so as to obtain a target image set, where the target image set includes at least one of the following: an image drawn based on the magnitude of the current density, an image drawn based on the curl of the current density, and an image drawn based on the divergence of the current density.

[0091] Optionally, in the current density-based processing device provided in the second embodiment of the present invention, the current density-based processing device further includes: an acquisition unit, configured to acquire a preset image set after drawing an image of the current distribution data to obtain a target image set, where the preset image set includes: an image representing the current distribution of the target device in a normal state; a comparison unit, configured to perform a comparative analysis on the preset image set and the target image set to obtain an analysis result, where the analysis result is used to indicate whether the target device has a fault; a determination unit, configured to determine the area where the target device has a fault when the analysis result indicates that the target device has a fault.

[0092] The above-mentioned current density-based processing device may further include a processor and a memory. The above-mentioned acquisition unit 41, reconstruction unit 42, analysis unit 43, etc. are all stored in the memory as program units, and the corresponding functions are implemented by the processor executing the above program units stored in the memory.

[0093] The above-mentioned processor includes a kernel, and the kernel retrieves the corresponding program unit from the memory. One or more kernels can be set. By adjusting the kernel parameters, the magnetic field data around the target device is collected, and the current distribution of the target device is analyzed according to the magnetic field data, avoiding the situation where the current distribution data can only be measured by damaging the target device, thereby achieving the technical effects of facilitating the detection of current distribution data and protecting the structure of the target device.

[0094] The above-mentioned memory may include non-permanent memory in a computer-readable medium, forms such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash memory (flash RAM), and the memory includes at least one memory chip.

[0095] According to another aspect of the embodiments of the present invention, an electronic device is further provided, including: a processor; and a memory for storing executable instructions of the processor; wherein, the processor is configured to execute the current density-based processing method of any one of the above via executing the executable instructions.

[0096] According to another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium storing a computer program, wherein when the computer program runs, it controls the device where the computer-readable storage medium is located to execute the above-mentioned current density-based processing method according to any one of the above.

[0097] Figure 5 is a schematic diagram of an electronic device according to an embodiment of the present invention, as Figure 5 shown, an embodiment of the present invention provides an electronic device 50, which includes a processor, a memory, and a program stored in the memory and executable on the processor. When the processor executes the program, it implements the above-mentioned current density-based processing method according to any one of the above.

[0098] The above serial numbers of the embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0099] In the above embodiments of the present invention, the descriptions of the respective embodiments have their own emphases. For parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0100] In several embodiments provided by the present application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only illustrative. For example, the division of the units can be a logical function division. In actual implementation, there can be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of the units or modules can be in electrical or other forms.

[0101] The units described as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they can be located in one place or distributed to multiple units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0102] In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

[0103] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The foregoing storage medium includes: various media that can store program codes, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disc.

[0104] The foregoing are only the preferred embodiments of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and refinements can be made, and these improvements and refinements should also be regarded as the protection scope of the present invention.

Claims

1. A processing method based on current density, characterized in that, Including: Collecting magnetic field data of a target device, where the target device includes: a crimp-type device; Reconstructing the magnetic field data based on Ampere's law to obtain the current density of the target device; Analyzing the current density to obtain the current distribution data of the target device.

2. The processing method according to claim 1, characterized in that, Collecting magnetic field data of a target device, including: Controlling a fluxgate current sensor to move along a preset acquisition path to collect the magnetic flux density in three dimensions of the target device, thereby obtaining the magnetic field data.

3. The processing method according to claim 2, wherein Reconstructing the magnetic field data based on Ampere's law to obtain the current density of the target device, including: Calculating the magnetic field gradient of the magnetic field data based on the preset acquisition path to obtain a target magnetic field gradient; Determining the current density based on the target magnetic field gradient and Ampere's law.

4. The processing method according to claim 3, characterized in that, The magnetic field data includes: an initial magnetic flux density and a target magnetic flux density. The initial magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the initial position in the preset acquisition path, and the target magnetic flux density includes: the magnetic flux density collected by the fluxgate current sensor at the termination position in the preset acquisition path; calculating the magnetic field gradient of the magnetic field data based on the preset acquisition path to obtain a target magnetic field gradient, including: Determining the moving distance of the fluxgate current sensor based on the preset acquisition path; Determining the target magnetic field gradient based on the moving distance, the initial magnetic flux density, and the target magnetic flux density.

5. The processing method according to claim 1, characterized in that Analyzing the current density to obtain the current distribution data of the target device, including: Determining the magnitude of the current density; Determining the divergence of the current density based on a first calculation strategy and the current density; Determining the curl of the current density based on a second calculation strategy and the current density; Obtaining the current distribution data based on the magnitude of the current density, the divergence of the current density, and the curl of the current density.

6. The processing method according to claim 5, characterized in that After analyzing the current density to obtain the current distribution data of the target device, it further includes: Drawing an image of the current distribution data to obtain a target image set, where the target image set includes at least one of the following: an image drawn based on the magnitude of the current density, an image drawn based on the curl of the current density, and an image drawn based on the divergence of the current density.

7. The processing method according to claim 6, wherein After drawing an image of the current distribution data to obtain a target image set, it further includes: Obtaining a preset image set, where the preset image set includes: an image representing the current distribution when the target device is in a normal state; Performing a comparative analysis on the preset image set and the target image set to obtain an analysis result, where the analysis result is used to indicate whether the target device has a fault; Determining the area where the target device has a fault when the analysis result indicates that the target device has a fault.

8. A processing device based on current density, characterized in that, Including: An acquisition unit for collecting magnetic field data of a target device, where the target device includes: a crimp-type device; A reconstruction unit for reconstructing the magnetic field data based on Ampere's law to obtain the current density of the target device; An analysis unit for analyzing the current density to obtain current distribution data of the target device.

9. A computer-readable storage medium, characterized in that, A computer program is stored in the computer-readable storage medium, wherein when the computer program runs, it controls the device where the computer-readable storage medium is located to execute the current density-based processing method according to any one of claims 1 to 7.

10. An electronic device, characterized in that, It includes one or more processors and a memory, and the memory is used to store one or more programs. When the one or more programs are executed by the one or more processors, the one or more processors implement the current density-based processing method according to any one of claims 1 to 7.

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