Transient small current grounding line selection device tester
By designing a portable transient small current grounding wire selection device tester, the problem that existing testers cannot effectively test the small current grounding wire selection device is solved, convenient connection and efficient fault analysis are achieved, and detailed test reports are generated.
Patent Information
- Application Number
- CN202311722178.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-14
- Publication Date
- 2025-07-11
AI Technical Summary
Existing relay protection testers cannot effectively test small current grounding wire selection devices, especially in complex grounding types, which cannot meet the functional testing requirements.
A transient small current grounding wire selection device tester with small size, simple operation and wide detection range is designed, including an outer shell, test terminal, support, handle, heat dissipation unit, built-in DSP module, processor module and upper computer module, which is connected to the device to be tested through the test terminal, and the signal data is processed by the DSP module and processor module, and a test report is generated.
It realizes convenient connection and fast testing, improves testing efficiency and reliability, and can generate detailed test reports, suitable for fault analysis of complex grounding types.
Smart Images
Figure CN120294648A_ABST
Abstract
Description
Technical Field
[0001] The present invention mainly relates to the field of testing current grounding line selection devices, and particularly relates to a transient small current grounding line selection device tester. Background Art
[0002] Most of the neutral points of medium voltage distribution networks in China adopt small current grounding methods, including neutral point non-grounding systems and neutral point grounded through arc suppression coils. In the distribution network, the single-phase grounding fault rate is the highest. When a single-phase grounding fault occurs in this system, a short-circuit loop is not formed, but only a small current path is formed through the capacitance to the ground. The fault current at the grounding point is small, and the fault signal is weak. At the same time, due to the complex fault conditions and diverse system operation modes, etc., the problem of grounding line selection has become a difficult point in the small current grounding method.
[0003] Currently, when debugging and testing the small current grounding line selection device, a general relay protection tester is used to apply power frequency voltage and current signals to the small current grounding line selection device for testing. However, the electrical quantities required by the small current grounding line selection device come from multiple intervals, and in addition to the parameters of the electrical quantity amplitude and phase angle of a single interval, there are also relationships between electrical quantities. This makes it impossible to truly perform functional testing on small current grounding line selection devices with diverse line selection principles when using traditional relay protection testers, that is, it is impossible to test for complex grounding types. Therefore, it is particularly necessary to provide a portable testing tool dedicated to small current grounding line selection devices. Summary of the Invention
[0004] The technical problem to be solved by the present invention lies in: aiming at the technical problems existing in the prior art, the present invention provides a transient small current grounding line selection device tester with a small volume, simple operation, and wide detection range.
[0005] To solve the above technical problem, the technical solution proposed by the present invention is: A transient small current grounding line selection device tester, comprising: an outer casing, a plurality of test terminals, a plurality of support parts, a handle part, a display part, and a plurality of heat dissipation parts; The plurality of test terminals are arranged on the front surface of the outer casing; The plurality of support parts are arranged at the lower bottom of the outer casing to support the outer casing; The handle part includes connection ends arranged on the left and right sides of the outer casing and a hand-held end connected to the connection ends. One end of the hand-held end is rotationally connected to the outer casing through a fixing member; The plurality of heat dissipation parts are heat dissipation holes arranged on the back surface of the outer casing, used for timely dissipating the heat generated during operation.
[0006] As a further improvement of the above technical solution: The transient small current grounding line selection device tester further includes a first port and / or a second port provided on the front of the outer housing; The first port is a USB port, and the second port is a network port.
[0007] The present invention also provides a transient small current grounding line selection device test system, including: the above transient small current grounding line selection device tester, a test line, a transient small current grounding line selection device to be tested, and a terminal management device; The transient small current grounding line selection device tester is internally provided with a DSP module, a processor module, and a host computer module. The DSP module is connected to the processor module, and the host computer module is communicatively connected to the DSP module and the processor module through a communication protocol; The test line connects the test terminals of the transient small current grounding line selection device tester and the input / output terminals of the transient small current grounding line selection device; The terminal management device is communicatively connected to the host computer module through a communication protocol.
[0008] As a further improvement of the above technical solution: The models of the DSP module and the processor module are OMAP-L138 C6-Integra DSP+ARM processors.
[0009] The present invention also provides a test method for the above transient small current grounding line selection device test system, including the steps of: S101, connecting multiple test terminals of the transient small current grounding line selection device tester to multiple input / output terminals of the transient small current grounding line selection device to be tested through a test line; S102, selecting waveform data to be tested in the transient small current grounding line selection device tester and starting the test to transmit the waveform data to be tested to the transient small current grounding line selection device; S103, the transient small current grounding line selection device selects a line according to the waveform data to be tested, and returns the line selection result to the transient small current grounding line selection device tester in the form of feedback signal data through the test line; S104, the transient small current grounding line selection device tester receives the feedback signal data and generates a corresponding test report according to the feedback signal data.
[0010] As a further improvement of the above technical solution: Step S102 includes: S1021, selecting one or more groups of waveform data stored in the test waveform database in the host computer module of the transient small current grounding line selection device tester as the waveform data to be tested; S1022, the host computer module reads the file directory where the selected waveform data to be measured is located, and sends the waveform data to be measured to the processor module of the transient small current grounding line selection device tester through the UDP protocol; S1023, the processor module stores the waveform data to be measured in the RAM, and the DSP module of the transient small current grounding line selection device tester reads the waveform data to be measured in the RAM, and converts the waveform data to be measured into analog signal data through the digital-to-analog conversion module; S1024, the analog signal data is amplified through the power amplifier module, and the analog signal data is transmitted to the transient small current grounding line selection device through the test line via the I / O port.
[0011] Step S104 includes: S1041, the I / O port of the transient small current grounding line selection device tester receives the feedback signal data from the transient small current grounding line selection device and stores it in the DSP module; S1042, the processor module reads the feedback signal data and stores it in the RAM, and sends the feedback signal data to the host computer module through the UDP protocol; S1043, the host computer module reads the feedback signal data, and judges whether the transient small current grounding line selection device responds correctly according to the trip action switch signal, trip branch number, fault time and trip time in the feedback signal data, and generates a corresponding test report.
[0012] In step S102, the output of the waveform data to be measured includes: No-output standby stage, at this time the waveform data to be measured is being stored in the RAM. After confirming that all the waveform data to be measured is stored in the RAM and the I / O port is normal, enter the next stage; Normal waveform data sending stage, at this time the normal waveform data in the waveform data to be measured starts to be sent; Fault waveform data sending stage, at this time the fault waveform data in the waveform data to be measured starts to be sent; After a preset time when the fault waveform data starts to be sent, enter the no-output standby stage, clear the waveform data to be measured stored in the RAM, and wait for new waveform data to be measured to be stored.
[0013] In step S104, corresponding operations are performed according to the trip action switch signal in the received feedback signal data: If the I / O port receives the correct trip action switch signal, the branch corresponding to the trip action switch signal is in a normal state, and the waveform data is no longer sent to this branch; If the I / O port receives an incorrect tripping action digital signal, the branch corresponding to the tripping action digital signal is in an abnormal state, and subsequently, the fault waveform data in the waveform data to be measured continues to be sent to this branch. If the I / O port does not receive the tripping action digital signal, there is a wiring error, and the transmission of the current waveform data is stopped.
[0014] The fault waveform data in the waveform data to be measured includes: single-phase grounding fault waveform data, false grounding fault waveform data, and special grounding fault waveform data. The single-phase grounding fault waveform data includes: metallic grounding, high-resistance grounding, arcing grounding, intermittent grounding, momentary grounding, and permanent grounding fault waveform data. The false grounding fault waveform data includes: ferroresonance, series resonance, and PT disconnection fault waveform data. The special grounding fault waveform data includes: grounding faults of the same phase of different lines, grounding faults of different phases of a line, and complex fault waveform data composed of more than two simple faults.
[0015] Compared with the prior art, the advantages of the present invention are as follows: 1. The transient small-current grounding line selection device tester of the present invention has the characteristics of small volume, light weight, simple wiring, and easy portability compared with the traditional relay protection tester, and can meet the needs of testing the transient small-current grounding line selection device. 2. In the transient small-current grounding line selection device test system of the present invention, the transient small-current grounding line selection device tester can be quickly connected to the transient small-current grounding line selection device through the test terminals and test wires, and the preparation work before testing is convenient to operate, further improving the test efficiency. 3. In the test method of the transient small-current grounding line selection device test system of the present invention, the selected waveform data to be measured is transmitted to the transient small-current grounding line selection device through the test wire for testing, and the corresponding test report can be generated according to the test results of the feedback signal data returned by the test. The overall test steps are simple, the test reliability is strong, and the degree of automation is high. Description of the Drawings
[0016] Figure 1 It is the front view of the transient small-current grounding line selection device tester provided by the present invention.
[0017] Figure 2 It is the schematic diagram of the transient small-current grounding line selection device test system provided by the present invention.
[0018] Figure 3 It is the schematic diagram of the internal structure and logic processing of the transient small-current grounding line selection device tester provided by the present invention.
[0019] Figure 4 Flow chart of the test method for the transient small current grounding line selection device test system provided by the present invention.
[0020] Figure 5 Output flow chart of the transient small current grounding line selection device test system provided by the present invention.
[0021] Legend: 1. Outer housing; 2. Test terminal; 3. Support part; 4. Handle part; 41. Connection end; 42. Hand-held end; 5. Display part; 6. First port; 7. Second port. Detailed implementation mode
[0022] In order to better understand the above technical solutions, the above technical solutions will be described in detail below in conjunction with the specification drawings and specific implementation modes.
[0023] Embodiment 1 As Figure 1 shown, this embodiment provides a transient small current grounding line selection device tester, including: an outer housing 1, a plurality of test terminals 2, a plurality of support parts 3, a handle part 4, a display part 5 and a plurality of heat dissipation parts; A plurality of test terminals 2 are arranged on the front of the outer housing 1; A plurality of support parts 3 are arranged at the lower bottom of the outer housing 1 to support the outer housing 1; The handle part 4 includes a connection end 41 arranged on the left and right sides of the outer housing and a hand-held end 42 connected to the connection end 41. One end of the hand-held end 42 is rotationally connected to the outer housing 1 through a fixing member; the rotation angle of the handle part 4 is 180 degrees; The plurality of heat dissipation parts are heat dissipation holes arranged on the back of the outer housing 1 for dissipating the heat generated during operation in time.
[0024] In this embodiment, the transient small current grounding line selection device tester further includes a first port 6 and / or a second port 7 arranged on the front of the outer housing 1; The first port 6 is a USB port, and the second port 7 is a network port.
[0025] It can be understood that the transient small current grounding line selection device tester in this embodiment has the characteristics of small volume, light weight, simple wiring and easy to carry compared with the traditional relay protection tester, and can meet the needs of testing the transient small current grounding line selection device; by setting the USB port and / or the network port, the expandability and flexibility of the tester are further improved.
[0026] In a specific application embodiment, the device performance and parameters of the transient small current grounding line selection device tester are shown in Table 1.
[0027]
[0028] Table 1 Example 2 As Figure 2 and Figure 3 shown, this embodiment provides a test system for a transient small current grounding line selection device, including: the transient small current grounding line selection device tester of Example 1, test lines, the transient small current grounding line selection device to be tested, and a terminal management device; The transient small current grounding line selection device tester is provided with a DSP module, a processor module, and a host computer module. The DSP module is connected to the processor module, and the host computer module is communicatively connected to the DSP module and the processor module through a communication protocol; The test lines are connected to the test terminals of the transient small current grounding line selection device tester and the input / output terminals of the transient small current grounding line selection device; The terminal management device is communicatively connected to the host computer module through a communication protocol.
[0029] It can be understood that for the test system of the transient small current grounding line selection device in this embodiment, the transient small current grounding line selection device tester can be quickly connected to the transient small current grounding line selection device through the test terminals and test lines, and the preparation work before testing is convenient to operate, further improving the test efficiency.
[0030] Specifically, some test terminals of the transient small current grounding line selection device tester are connected to several input terminals of the transient small current grounding line selection device through several test lines. Here, the test lines play a role of outputting the analog signals (voltage, current) of the transient small current grounding line selection device tester to the transient small current grounding line selection device; some output terminals of the transient small current grounding line selection device are connected to some test terminals of the transient small current grounding line selection device tester through several test lines. Here, the test lines play a role of feeding back the signal data of the transient small current grounding line selection device to the transient small current grounding line selection device tester.
[0031] In this embodiment, the models of the DSP module and the processor module are OMAP-L138 C6-Integra DSP+ARM processors. The OMAPL138 C6-Integra DSP+ARM processor is a low-power application processor. The power consumed by this processor is much lower than that of DSP products on other platforms. It combines the advantages of DSP and reduced instruction set computer (RISC) technologies and includes a rich set of peripherals to provide the ability to control peripheral devices and communicate with external processors.
[0032] Example 3 As Figure 3 and Figure 4 shown, this embodiment provides a test method for the test system of the transient small current grounding line selection device of Example 2, including the steps: S101. Connect multiple test terminals of the transient small current grounding line selection device tester to multiple input / output terminals of the transient small current grounding line selection device to be tested through a test line; S102. Select the waveform data to be tested in the transient small current grounding line selection device tester and start the test to transmit the waveform data to be tested to the transient small current grounding line selection device; S103. The transient small current grounding line selection device selects a line according to the waveform data to be tested and returns the line selection result to the transient small current grounding line selection device tester in the form of feedback signal data through the test line; S104. The transient small current grounding line selection device tester receives the feedback signal data and generates a corresponding test report according to the feedback signal data.
[0033] It can be understood that in the test method of the transient small current grounding line selection device test system of this embodiment, the selected waveform data to be tested is transmitted to the transient small current grounding line selection device through the test line for testing, and a corresponding test report can be generated according to the test result of the feedback signal data returned by the test. The overall test steps are simple, the test reliability is strong, and the degree of automation is high.
[0034] In this embodiment, step S102 includes: S1021. Select one or more groups of waveform data in the test waveform database stored in the upper computer module of the transient small current grounding line selection device tester as the waveform data to be tested; S1022. The upper computer module reads the file directory where the selected waveform data to be tested is located and sends the waveform data to be tested to the processor module of the transient small current grounding line selection device tester through the UDP protocol; S1023. The processor module stores the waveform data to be tested in the RAM, and the DSP module of the transient small current grounding line selection device tester reads the waveform data to be tested in the RAM and converts the waveform data to be tested into analog signal data through the digital-to-analog conversion module; S1024. Amplify the analog signal data through the power amplifier module and transmit the analog signal data to the transient small current grounding line selection device through the I / O port via the test line.
[0035] In this embodiment, step S104 includes: S1041. The I / O port of the transient small current grounding line selection device tester receives the feedback signal data from the transient small current grounding line selection device and stores it in the DSP module; S1042. The processor module reads the feedback signal data and stores it in the RAM, and sends the feedback signal data to the upper computer module through the UDP protocol; In S1043, the host computer module reads the feedback signal data, determines whether the transient small current grounding line selection device responds correctly according to the trip action digital signal, trip branch number, fault time and trip time in the feedback signal data, and generates a corresponding test report.
[0036] In this embodiment, in step S102, the output of the waveform data to be measured includes: No-output standby stage, at this time the waveform data to be measured is being stored in the RAM. After confirming that all the waveform data to be measured is stored in the RAM and the I / O port is normal, enter the next stage; Normal waveform data sending stage, at this time the normal waveform data in the waveform data to be measured starts to be sent; Fault waveform data sending stage, at this time the fault waveform data in the waveform data to be measured starts to be sent; After a preset time when the fault waveform data starts to be sent, enter the no-output standby stage, clear the waveform data to be measured stored in the RAM, and wait for new waveform data to be measured to be stored.
[0037] In this embodiment, in step S104, corresponding operations are performed according to the trip action digital signal in the received feedback signal data: If the I / O port receives a correct trip action digital signal, the branch corresponding to the trip action digital signal is in a normal state, and the waveform data sending to this branch is stopped; If the I / O port receives an incorrect trip action digital signal, the branch corresponding to the trip action digital signal is in an abnormal state, and the fault waveform data in the waveform data to be measured is continuously sent to this branch in the future; If the I / O port does not receive the trip action digital signal, the wiring is incorrect, and the current waveform data sending is stopped.
[0038] In this embodiment, the fault waveform data in the waveform data to be measured includes: single-phase grounding fault waveform data, false grounding fault waveform data and special grounding fault waveform data; The single-phase grounding fault waveform data includes: metallic grounding, high-resistance grounding, arcing grounding, intermittent grounding, momentary grounding and permanent grounding fault waveform data; The false grounding fault waveform data includes: ferroresonance, series resonance and PT disconnection fault waveform data; The special grounding fault waveform data includes: grounding faults of the same phase of different lines, grounding faults of different phases of the line, and complex fault waveform data composed of two or more simple faults combined.
[0039] It can be understood that the transient small current grounding line selection device tester in this embodiment processes a number of stored test data into analog signals through the DSP module for testing the transient small current grounding line selection device, and processes the result of the tripping switch signal returned by the test into a digital signal through the DSP module. Then, the upper computer module generates a corresponding test report according to the test result. The overall test steps of the tester are simple, and it can better test different types of test data in the form of analog signals, with strong test reliability and high automation; In this embodiment, through the signal power amplifier, the test data (such as fault waveform data) converted by the digital-to-analog converter can be amplified, so that the analog signal test data reaching the transient small current grounding line selection device through the external test line still maintains a certain signal strength, thus ensuring the accuracy of the subsequent line selection test; In order to fully test the performance and reliability of the transient small current grounding line selection device, it is necessary to simulate various common fault types and input them into the line selection device, and judge its performance according to the feedback result of the line selection device. In this embodiment, various types of fault waveform data are pre-stored in the memory of the upper computer module, so that they can be input into the line selection device one by one in sequence during the test and the feedback result can be obtained. The entire test process has a high degree of automation and does not require manual participation; moreover, the fault waveform data can be easily queried, retrieved, exported, added, deleted, etc., with a high degree of customization; after the test is completed, a corresponding test report can be generated to achieve the standardization of the test and improve the test efficiency.
[0040] In a specific application embodiment, in combination with Figure 2 、 Figure 3 and Figure 4 illustrate the test method of this embodiment and the flow steps inside the transient small current grounding line selection device tester.
[0041] Step 1: Connect the test terminals of the transient small current grounding line selection device tester (hereinafter referred to as the tester) to the input / output terminals of the transient small current grounding line selection device (hereinafter referred to as the line selection device) through a dedicated test line; Step 2: Turn on the power button on the tester to make the tester in the standby state. The CPU ( Figure 3 the ARM processor in it) of the tester waits for instructions. At the same time, the DSP module monitors the status of the I / O port ( Figure 3 the GPIO in it). If there is an abnormality, it will feedback and send the fault information to the CPU; Step 3: Operate through the touch screen to select several groups of waveforms (including normal waveforms and fault waveforms) in the waveform database of the tester as the waveform data to be tested and start the test; Optionally, test directory files and / or waveform data in the waveform database can also be added or deleted through the USB port, or optionally, waveform data in the waveform database can also be added or deleted from an external terminal (such as a PC terminal for managing waveform files) through the TCP / IP protocol; Step 4: The upper computer of the tester reads the directory file of the selected waveform data to be tested and sends the waveform data to be tested to the ARM processor through the UDP protocol. The ARM processor stores the received waveform data to be tested in the RAM; Optionally, the waveform data to be tested can be displayed on the touch screen for easy viewing; Step 5: The DSP module reads the waveform data to be tested in the RAM and converts the waveform data to be tested into analog signal data through D / A conversion; Step 6: The power amplifier amplifies the analog signal data and transmits the amplified analog signal data to the line selection device through a dedicated test line via the I / O port; Step 7: The line selection device selects a line based on the transmitted analog signal data and returns the line selection result to the tester in the form of feedback signal data (including tripping action switch signal, tripping branch number, fault time, and tripping time) through the dedicated test line and DIO hard contact signal; Step 8: The tester receives the feedback signal data through the I / O port and stores it in the RAM; Step 9: The ARM processor determines whether the tripping action switch signal in the feedback signal data received by the I / O port is normal. If the correct tripping action switch signal is received, jump to Step 10; if the incorrect tripping action switch signal is received, jump to Step 11; if the tripping action switch signal is not received, jump to Step 12; (The output flow chart of the test system is as shown in Figure 5 shown, where the solid line is the normal waveform output process and the dashed line is the fault waveform output process) Step 10: The correct tripping action switch signal is received by the I / O port, indicating that the line selection device responds correctly and the branch corresponding to the tripping action switch signal is in a normal state. Stop sending waveform data to this branch; Step 11: The incorrect tripping action switch signal is received by the I / O port, indicating that the line selection device does not respond correctly and the branch corresponding to the tripping action switch signal is in an abnormal state. Subsequently, continue to send the fault waveform data in the waveform data to be tested to this branch until it is determined that the received tripping action switch is correct and then stop sending waveform data to this branch; Step 12: If the I / O port does not receive the trip action digital signal, it indicates a wiring error (because the line corresponding to the fault waveform is specified, and the received signal of the tester must match to meet the logic). At this time, stop the currently output fault waveform and continue to output other lines; Step 13: The ARM processor reads the feedback signal data stored in the RAM and sends it to the host computer through the UDP protocol; Step 14: The host computer generates a corresponding test report based on the received feedback signal data for storage. Optionally, the test report can be output or printed through the USB port, or the test report can be output to an external PC terminal through the TCP / IP protocol.
[0042] The above is only the preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above embodiments. All technical solutions falling within the idea of the present invention belong to the protection scope of the present invention. It should be noted that for those of ordinary skill in the art, several improvements and refinements made without departing from the principle of the present invention should be regarded as within the protection scope of the present invention.
Claims
1. A transient small current grounding line selection device tester, characterized in that, Comprising: A housing (1), a plurality of test terminals (2), a plurality of support parts (3), a handle part (4), a display part (5) and a plurality of heat dissipation parts; A plurality of the test terminals (2) are arranged on the front surface of the housing (1); A plurality of the support parts (3) are arranged at the lower bottom of the housing (1) to support the housing (1); The handle part (4) includes connection ends (41) arranged on the left and right sides of the housing and a handle end (42) connected to the connection ends (41), and one end of the handle end (42) is rotatably connected to the housing (1) through a fixing member; A plurality of the heat dissipation parts are heat dissipation holes arranged on the back surface of the housing (1) for timely dissipating the heat generated during operation.
2. The transient small current grounding line selection device tester according to claim 1, characterized in that The transient small current grounding line selection device tester further includes a first port (6) and / or a second port (7) arranged on the front surface of the housing (1); The first port (6) is a USB port, and the second port (7) is a network port.
3. A test system for a transient small current grounding line selection device, characterized in that, Comprising: The transient small current grounding line selection device tester according to claim 1 or 2, a test line, a transient small current grounding line selection device to be tested, and a terminal management device; A DSP module, a processor module and a host computer module are provided in the transient small current grounding line selection device tester, the DSP module is connected to the processor module, and the host computer module is communicatively connected to the DSP module and the processor module through a communication protocol; The test line connects the test terminals (2) of the transient small current grounding line selection device tester and the input / output terminals of the transient small current grounding line selection device to be tested; The terminal management device is communicatively connected to the host computer module through a communication protocol.
4. The transient small current grounding line selection device testing system according to claim 3, characterized in that, The models of the DSP module and the processor module are OMAP-L138 C6-Integra DSP + ARM processors.
5. A test method for a test system of a transient small current grounding line selection device according to claim 3 or 4, characterized in that, Comprising steps: S101, connecting a plurality of test terminals of the transient small current grounding line selection device tester to a plurality of input / output terminals of the transient small current grounding line selection device to be tested through a test line; S102, selecting waveform data to be tested in the transient small current grounding line selection device tester and starting the test to transmit the waveform data to be tested to the transient small current grounding line selection device; S103, the transient small current grounding line selection device selects a line according to the waveform data to be tested and returns the line selection result to the transient small current grounding line selection device tester in the form of feedback signal data through the test line; S104, the transient small current grounding line selection device tester receives the feedback signal data and generates a corresponding test report according to the feedback signal data.
6. The test method according to claim 5, wherein Step S102 includes: S1021, selecting one or more groups of waveform data in the test waveform database stored in the host computer module of the transient small current grounding line selection device tester as the waveform data to be tested; S1022, the host computer module reads the file directory where the selected waveform data to be tested is located and sends the waveform data to be tested to the processor module of the transient small current grounding line selection device tester through the UDP protocol; In S1023, the processor module stores the waveform data to be measured into the RAM, and the DSP module of the transient small current grounding line selection device tester reads the waveform data to be measured in the RAM and converts the waveform data to be measured into analog signal data through the digital-to-analog conversion module; In S1024, the analog signal data is amplified through the power amplifier module, and the analog signal data is transmitted to the transient small current grounding line selection device through the test line via the I / O port.
7. The testing method according to claim 6, wherein Step S104 includes: In S1041, the I / O port of the transient small current grounding line selection device tester receives the feedback signal data from the transient small current grounding line selection device and stores it in the DSP module; In S1042, the processor module reads the feedback signal data and stores it in the RAM, and sends the feedback signal data to the host computer module through the UDP protocol; In S1043, the host computer module reads the feedback signal data, determines whether the transient small current grounding line selection device responds correctly according to the trip action digital signal, trip branch number, fault time and trip time in the feedback signal data, and generates a corresponding test report.
8. The test method according to claim 6, characterized in that In step S102, the output of the waveform data to be measured includes: No-output standby stage, at this time the waveform data to be measured is being stored in the RAM. After confirming that all the waveform data to be measured is stored in the RAM and the I / O port is normal, it enters the next stage; Normal waveform data sending stage, at this time the normal waveform data in the waveform data to be measured starts to be sent; Fault waveform data sending stage, at this time the fault waveform data in the waveform data to be measured starts to be sent; After a preset time when the fault waveform data starts to be sent, it enters the no-output standby stage, clears the waveform data to be measured stored in the RAM, and waits for new waveform data to be measured to be stored.
9. The test method according to claim 7, characterized in that In step S104, corresponding operations are performed according to the trip action digital signal in the received feedback signal data: If the I / O port receives a correct trip action digital signal, the branch corresponding to the trip action digital signal is in a normal state, and the waveform data sending to this branch is stopped; If the I / O port receives an incorrect trip action digital signal, the branch corresponding to the trip action digital signal is in an abnormal state, and the fault waveform data in the waveform data to be measured is continuously sent to this branch subsequently; If the I / O port does not receive the trip action digital signal, the wiring is incorrect, and the current waveform data sending is stopped.
10. The testing method according to any one of claims 5-9, characterized in that The fault waveform data in the waveform data to be measured includes: single-phase grounding fault waveform data, phantom grounding fault waveform data and special grounding fault waveform data; The single-phase grounding fault waveform data includes: metallic grounding, high-resistance grounding, arcing grounding, intermittent grounding, momentary grounding and permanent grounding fault waveform data; The phantom grounding fault waveform data includes: ferroresonance, series resonance and PT disconnection fault waveform data; The special grounding fault waveform data includes: grounding faults of the same phase of different lines, grounding faults of different phases of a line, and complex fault waveform data composed of more than two simple faults.