Temperature automatic calibration method for temperature measuring device

Abstract

The present application relates to the technical field of temperature automatic calibration, and relates to a temperature automatic calibration method for a temperature measuring device.The method comprises the following steps: S1, collecting historical temperature calibration records and setting a temperature floating threshold for each type of measured object; S2, using a NTC group to measure the temperature value of the object, and simultaneously performing stable detection on the temperature value combined with the temperature floating threshold, and then measuring the resistance value of the NTC group whose temperature value is stable; S3, obtaining standard resistance specification information of the NTC group, and then calculating the deviation between the real-time resistance value and the standard resistance value; the present application solves the temperature measurement difference problem caused by the B, R value precision specification of the NTC element by using the segmented compensation resistance method, constructs a deviation array by measuring the deviation between the NTC resistance value and the standard resistance value at different temperature points, and imports the temperature calculation program, so that the measurement error caused by the element difference is effectively compensated, and the measurement result is closer to the real temperature.

Description

Technical Field

[0001] This invention relates to the field of automatic temperature calibration technology, and more specifically, to an automatic temperature calibration method for temperature measuring equipment. Background Technology

[0002] Temperature measurement equipment is a key tool for acquiring temperature data. Its measurement accuracy directly affects production quality, experimental results, and the reliability of medical diagnosis. In the field of industrial temperature measurement, NTC is commonly used as a temperature sensor. Temperature control is a key factor in ensuring product quality.

[0003] However, taking the most widely used NTC thermistor as an example, its B and R values ​​have an accuracy error of ±1%. The characteristic differences between different NTC components will lead to deviations in the measurement results. This results in inconsistent temperature measurement differences between different NTC components, which may exceed the product technical requirements and specifications, making it difficult to meet the high-precision measurement requirements. Therefore, an automatic temperature calibration method for temperature measuring equipment is proposed. Summary of the Invention

[0004] The purpose of this invention is to provide an automatic temperature calibration method for temperature measuring equipment to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, an automatic temperature calibration method for a temperature measuring device is provided, comprising the following steps:

[0006] S1. Collect historical temperature calibration records and set temperature fluctuation thresholds for each type of object being measured.

[0007] S2. Use NTC groups to measure the temperature of the object, and at the same time, combine multiple temperature groups with the temperature fluctuation threshold to perform stability detection. Then, measure the resistance of the NTC groups with stable temperature values.

[0008] S3. Obtain the standard resistor specification information of the NTC group, then calculate the deviation between the real-time resistance value and the standard resistance value to obtain the deviation array, and then calculate the temperature offset compensation value by combining the deviation array with the resistance value and temperature value, and correct the temperature value.

[0009] S4. Based on historical temperature calibration records, combined with the current temperature value and temperature offset compensation value, predict the temperature trend of the measured object, and then compare the predicted temperature trend with the latest temperature calibration record for deviation values.

[0010] S5. When the numerical comparison in S4 shows a value greater than the deviation, the representative temperature value is extracted based on the NTC characteristics and the temperature calibration record of the measured object, and the extracted representative temperature value is sent to S2.

[0011] As a further improvement to this technical solution, S1 records the temperature calibration of each NTC group and obtains the measurement object type for each NTC group, and then marks the temperature calibration record in conjunction with the measurement object type.

[0012] As a further improvement to this technical solution, step S1 is as follows:

[0013] S1.1 Collect historical temperature calibration records, perform temperature fluctuation analysis on each record based on the historical temperature calibration records, and obtain the temperature fluctuation value corresponding to each temperature calibration record based on the results;

[0014] S1.2. Combine the analysis based on the object type and the corresponding temperature fluctuation value to obtain the average temperature fluctuation value for each object type. Then, obtain the object type of the object being measured and extract the average temperature fluctuation value as the temperature fluctuation threshold based on the obtained object type.

[0015] As a further improvement to this technical solution, step S2 is as follows:

[0016] S2.1. Use the NTC group to measure the temperature value of the object, and combine the measured temperature values ​​with the temperature fluctuation threshold for stable comparison. If the fluctuation value between the temperature values ​​is greater than the temperature fluctuation threshold, continue the measurement. Conversely, if the fluctuation value between the temperature values ​​is less than the temperature fluctuation threshold, it is determined that the temperature of the object being measured is stable.

[0017] S2.2 After the temperature of the object being measured stabilizes as fed back in S2.1, the resistance of the NTC is collected using a resistance measuring instrument to obtain the real-time resistance value of the NTC during the temperature feedback process.

[0018] As a further improvement to this technical solution, step S3 is as follows:

[0019] S3.1 Obtain the standard resistor specification information according to the NTC model used, then extract the standard resistor value at the corresponding temperature point from the standard resistor specification information according to the temperature value, and calculate the deviation by combining the standard resistor value with the real-time resistance value. Obtain the resistance deviation based on the calculation result. Then, calculate the resistance deviation for each different set of multiple temperature values ​​to obtain the deviation value.

[0020] S3.2. Combine the deviation array with the resistance value and temperature value to calculate the temperature offset compensation value, and correct the temperature value.

[0021] As a further improvement to this technical solution, the step of S3 for calculating the temperature offset compensation value is as follows:

[0022] ;

[0023] Where T is the temperature value, K is the proportionality coefficient, R is the resistance value, b is the temperature offset compensation value, and f[T] is the temperature value calculated based on the resistance value;

[0024] ;

[0025] Among them, R t The standard resistance value is the one specified in the standard resistance specification information. ADC is the analog-to-digital conversion value acquired in real time by the measurement system. 4096 is the maximum value of the 12-bit ADC conversion. R s The sampling resistor is used for the measurement circuit;

[0026] ;

[0027] Where R[n] is the resistance value after calibration deviation compensation, and Array[n] is the deviation array, which is obtained by measuring the deviation between the NTC resistance value and the standard resistance value at the corresponding temperature point;

[0028] ;

[0029] Where K is the proportionality coefficient between temperature and resistance, B is the material constant of the NTC thermistor, a and c are coefficients, and b is the temperature offset compensation value.

[0030] As a further improvement to this technical solution, step S4 is as follows:

[0031] S4.1. Based on historical temperature calibration records, combined with the current temperature value and temperature offset compensation value, predict the temperature trend of the measured object and obtain the predicted temperature trend of the measured object.

[0032] S4.2. Set a deviation threshold based on the object type and temperature value of the object being measured. Then compare the predicted temperature trend with the latest temperature calibration record using the deviation threshold. If the deviation between the predicted temperature trend and the latest temperature calibration record is greater than the deviation threshold, proceed to step S5.

[0033] Continue monitoring as long as the deviation between the predicted temperature trend and the latest temperature calibration record is less than the deviation threshold.

[0034] As a further improvement to this technical solution, the latest temperature calibration record in S4 is a record file established based on the object under test. The latest temperature calibration record contains all the temperature values ​​of the object under test after calibration. When the temperature calibration of the object under test is stopped, the latest temperature calibration record is adjusted to the historical temperature calibration record.

[0035] As a further improvement to this technical solution, step S5 is as follows:

[0036] S5.1, Accept the trigger notification from S4.2;

[0037] S5.2. Based on the NTC characteristics and the temperature calibration record of the measured object, a representative temperature value is extracted and sent to S2 to replace the temperature value obtained by S2 and generate a new deviation value.

[0038] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0039] 1. In this automatic temperature calibration method for a temperature measuring device, the method addresses the temperature measurement difference caused by the accuracy specifications of the B and R values ​​of NTC components. It utilizes a segmented compensation resistor method, by measuring the deviation between the NTC resistance value and the standard resistance value at different temperature points, constructing a deviation array, and importing it into the temperature calculation program. This effectively compensates for the measurement error caused by component differences, making the measurement results closer to the true temperature.

[0040] 2. In this automatic temperature calibration method for a temperature measuring device, key parameters such as temperature fluctuation threshold and deviation threshold are continuously adjusted based on historical temperature calibration records and real-time measurement data. During the measurement process, appropriate temperature fluctuation thresholds are set according to the temperature fluctuation characteristics of different object types to ensure that resistance measurement is performed when the temperature is stable. By comparing the predicted temperature trend with the latest calibration record, the calibration strategy is dynamically adjusted to further improve the measurement accuracy.

[0041] 3. In this automatic temperature calibration method for temperature measuring equipment, temperature calibration can be performed on different types of objects being measured. By setting exclusive temperature fluctuation thresholds and deviation thresholds for each type of object, it adapts to the differences in temperature stability and allowable deviation range of different objects, improving the versatility of the equipment in various industrial scenarios and application fields. At the same time, in actual use, the performance of NTC components may change due to environmental factors or aging. Through continuous monitoring and periodic recalibration, these changes can be detected and compensated in a timely manner, ensuring long-term stable operation of the equipment and reducing measurement errors caused by changes in component performance. Attached Figure Description

[0042] Figure 1 This is an overall flowchart of the present invention;

[0043] Figure 2 A flowchart illustrating the process of collecting historical temperature calibration records for this invention;

[0044] Figure 3 This is a flowchart illustrating the process of measuring the temperature of an object according to the present invention.

[0045] Figure 4 This is a flowchart illustrating the calculation of temperature offset compensation values ​​in this invention.

[0046] Figure 5This is a flowchart illustrating the process of obtaining the predicted temperature trend of the measured object according to the present invention.

[0047] Figure 6 This is a flowchart illustrating the process of regenerating deviation values ​​in this invention.

[0048] Figure 7 Historical temperature calibration records collected for this invention. Detailed Implementation

[0049] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0050] Please see Figure 1 - Figure 7 As shown, the purpose of this embodiment is to provide an automatic temperature calibration method for a temperature measuring device, including the following steps:

[0051] S1. Collect historical temperature calibration records and set temperature fluctuation thresholds for each type of object being measured.

[0052] S1 records the temperature calibration for each NTC group and obtains the measurement object type for each NTC group, then marks the temperature calibration record in conjunction with the measurement object type.

[0053] Before starting the measurement, each NTC group is numbered, such as NTC group 1, NTC group 2, etc. At the same time, the NTC group is connected to the corresponding measuring device to ensure that the device is operating normally and that the NTC group can accurately measure the temperature. Meanwhile, the type of object to be measured by each NTC group is determined through manual input and automatic device recognition (such as using sensors to identify the material, shape and other characteristics of the object being measured, and then matching the corresponding object type).

[0054] During the temperature measurement of objects by the NTC group, temperature values ​​are recorded at certain time intervals, and the collected temperature calibration records are classified and labeled according to the object type.

[0055] The steps in S1 are as follows:

[0056] S1.1, such as Figure 7 As shown, historical temperature calibration records are collected, and temperature fluctuation analysis is performed on each record based on the historical temperature calibration records. The temperature fluctuation value corresponding to each temperature calibration record is obtained based on the results.

[0057] S1.2. Based on the analysis of the object type and the corresponding temperature fluctuation value, obtain the average temperature fluctuation value for each object type. Then, obtain the object type of the object being measured, and extract the average temperature fluctuation value as the temperature fluctuation threshold based on the obtained object type. The specific steps are as follows:

[0058] Collect historical temperature calibration records: Retrieve all data related to object type, measurement time, and measurement temperature value from the database storing historical temperature calibration records;

[0059] Temperature fluctuation analysis and acquisition of temperature fluctuation values: The acquired data are grouped according to the type of the object being measured to ensure that the data of different types of objects are independent of each other. Within each group, the data are sorted according to the order of measurement time. For each group of data after sorting, the absolute value of the difference between two adjacent measured temperature values ​​is calculated in turn.

[0060] To obtain the average temperature fluctuation for each object type: Collect the temperature fluctuation values ​​calculated for each object type separately, and for each object type, sum the temperature fluctuation values ​​and divide by the number of temperature fluctuation values.

[0061] Determine the temperature fluctuation threshold: Determine the type of object being measured. Among the calculated average temperature fluctuation values ​​for each object type, find the corresponding average value. This average value is the temperature fluctuation threshold for this measurement.

[0062] S2. Use NTC groups to measure the temperature of the object, and at the same time, combine multiple temperature groups with the temperature fluctuation threshold to perform stability detection. Then, measure the resistance of the NTC groups with stable temperature values.

[0063] The steps in S2 are as follows:

[0064] S2.1. Use an NTC array to measure the temperature of the object. Simultaneously, combine multiple sets of measured temperature values ​​and compare them with a temperature fluctuation threshold. If the fluctuation between temperature values ​​is greater than the temperature fluctuation threshold, continue measuring. Conversely, if the fluctuation between temperature values ​​is less than the temperature fluctuation threshold, the temperature of the object being measured is determined to be stable. The specific steps are as follows:

[0065] Temperature measurement: The NTC array is used to measure the temperature of the object, and the temperature values ​​are recorded at certain time intervals to form a temperature value sequence;

[0066] Stable comparison: Select two adjacent temperature values ​​from the measured temperature value sequence, calculate the temperature fluctuation value between them, and then compare the calculated temperature fluctuation value with the temperature fluctuation threshold.

[0067] When the temperature fluctuation exceeds the temperature fluctuation threshold, continue to measure at the set time interval to obtain new temperature values ​​and update the temperature value sequence.

[0068] When the temperature fluctuation is less than the temperature fluctuation threshold, it indicates that the temperature is relatively stable. Stop the measurement and confirm that the temperature of the object being measured is stable.

[0069] S2.2 After the temperature of the measured object stabilizes as reported in S2.1, the resistance of the NTC is acquired using a resistance measuring instrument to obtain the real-time resistance value of the NTC during the temperature feedback process. The specific steps are as follows:

[0070] Waiting for temperature stabilization signal: Continuously receive temperature stability information from S.2. This information is based on comparing multiple sets of measured temperature values ​​with the temperature fluctuation threshold. Once a feedback signal indicating that the temperature of the object under test has stabilized is received, proceed to the next step.

[0071] In a specific embodiment, such as Figure 7 As shown, a constant temperature environment was simulated by setting up a water tank. The liquid in the water tank was kept at a preset temperature by an external device. The experiment was conducted in 7 groups: 25℃, 30℃, 36℃, 37℃, 38℃, 40℃ and 42℃. The water tank temperature was measured by an NTC device. A total of 45 data points were obtained for each group, and the average value of each group was calculated. As can be seen from the figure, the temperature fluctuation at 36℃ was the smallest, about 0.047℃, which can be considered as the temperature of the tested object being stable.

[0072] Prepare the resistance measuring instrument: Confirm that the resistance measuring instrument (such as a bridge) is turned on and in normal working condition. Check whether the instrument's range is suitable for measuring the resistance value of the NTC. At the same time, perform necessary calibration and zeroing operations on the instrument to ensure the accuracy of the measurement results.

[0073] Connecting the NTC to the resistance measuring instrument: Connect the NTC group correctly to the resistance measuring instrument;

[0074] Acquire real-time resistance value: Start the resistance measuring instrument to measure, read and record the resistance value displayed by the instrument. This resistance value is the real-time resistance value of the NTC during the temperature feedback process.

[0075] S3. Obtain the standard resistor specification information of the NTC group, then calculate the deviation between the real-time resistance value and the standard resistance value to obtain the deviation array, and then calculate the temperature offset compensation value by combining the deviation array with the resistance value and temperature value, and correct the temperature value.

[0076] The steps in S3 are as follows:

[0077] S3.1 Obtain the standard resistor specification information according to the NTC model used, then extract the standard resistor value at the corresponding temperature point from the standard resistor specification information according to the temperature value, and calculate the deviation by combining the standard resistor value with the real-time resistance value. Obtain the resistance deviation based on the calculation result. Then, calculate the resistance deviation for each different set of multiple temperature values ​​to obtain the deviation value.

[0078] NTC group will prioritize NTC with product model XWB70;

[0079] S3.2. Combine the deviation array with the resistance value and temperature value to calculate the temperature offset compensation value, and correct the temperature value.

[0080] The steps for calculating the temperature offset compensation value in S3 are as follows:

[0081] A linear functional model of the relationship between temperature and resistance:

[0082] ;

[0083] Where T is the temperature value, K is the proportionality coefficient of the linear function, R is the resistance value, b is the temperature offset compensation value, and f[T] is the temperature value calculated based on the resistance value, which is a function of temperature;

[0084] Calculate R t :

[0085] ;

[0086] Among them, R t The standard resistance value is the one specified in the standard resistor specification information. ADC is the analog-to-digital conversion value acquired in real time by the measurement system. 4096 is the maximum value of the 12-bit ADC conversion. The resolution is 3.3V / 4096 at a reference voltage of 3.3V. R s The sampling resistor is used for the measurement circuit;

[0087] Calculate the resistance value:

[0088] ;

[0089] Where R[n] is the resistance value after calibration deviation compensation, and Array[n] is the deviation array, which is obtained by measuring the deviation between the NTC resistance value and the standard resistance value at the corresponding temperature point;

[0090] Regarding the relationship between K and B values:

[0091] ;

[0092] Where K is the proportionality coefficient in the linear function relationship model between temperature and resistance, B is the material constant of the NTC thermistor, a and c are coefficients, and b is the temperature offset compensation value. Typically, a=0.1, b=0.5, and c=B. The temperature offset compensation value is usually taken as 0.1℃ and is used to determine the specific functional relationship between the values. By adjusting these coefficients, the calculation of the K value can be optimized.

[0093] NTC's B and R values ​​have accuracy specifications, typically + / -1%. Based on these known parameters, R / T data and curves can be calculated using standard formulas. Then, several points are selected to verify the deviation between the calculated and measured values. Finally, multiple NTC measurements will reveal the deviation from the calculated NTC performance, indicating whether the deviation is biased towards the upper or lower limit. Furthermore, when the measured object does not change significantly, the regional temperature curve can be obtained with higher accuracy. The B value is usually the ratio of R25 / R50, which must be measured in practice. The B value can be recalculated based on the actual measurements, and then a temperature curve can be plotted using the B value obtained from the actual measurements, thus reducing the error. This method can be summarized as the segmented compensation resistance method.

[0094] S4. Based on historical temperature calibration records, combined with the current temperature value and temperature offset compensation value, predict the temperature trend of the measured object, and then compare the predicted temperature trend with the latest temperature calibration record for deviation values.

[0095] The steps in S4 are as follows:

[0096] S4.1. Based on historical temperature calibration records, combined with the current temperature value and temperature offset compensation value, predict the temperature trend of the measured object and obtain the predicted temperature trend of the measured object.

[0097] Organize historical temperature calibration records, which should include information such as the temperature value of the measured object at different time points and the measurement time. Using the historical temperature calibration records, combined with the current temperature value and the temperature offset compensation value, select the linear regression method to obtain the predicted temperature trend of the measured object, and predict the temperature trend in the future period based on the current time and the equation.

[0098] S4.2. Set a deviation threshold based on the object type and temperature value of the object being measured. Then compare the predicted temperature trend with the latest temperature calibration record using the deviation threshold. If the deviation between the predicted temperature trend and the latest temperature calibration record is greater than the deviation threshold, proceed to step S5.

[0099] When the deviation between the predicted temperature trend and the latest temperature calibration record is less than the deviation threshold, continue monitoring, and follow the specific steps below:

[0100] Setting a deviation threshold: Based on the type of object being measured and the current temperature value, a deviation threshold is set using experimental data or rules of thumb. Different types of objects have different allowable deviation ranges at different temperatures.

[0101] Numerical Comparison: Obtain the latest temperature calibration record, which is usually the most recent measured and calibrated temperature value, and calculate the deviation between the predicted temperature trend and the latest temperature calibration record:

[0102] When the deviation between the predicted temperature trend and the latest temperature calibration record is greater than the deviation threshold, it indicates that the predicted temperature trend deviates significantly from the latest actual measurement result, triggering step S5.

[0103] When the deviation between the predicted temperature trend and the latest temperature calibration record is less than the deviation threshold, it indicates that the prediction result is close to the actual situation. Continue monitoring, return to the temperature measurement stage, and continue to collect new temperature data.

[0104] The latest temperature calibration record in S4 is a record file established based on the object under test. The latest temperature calibration record contains all the temperature values ​​of the object under test after calibration. When the temperature calibration of the object under test is stopped, the latest temperature calibration record is adjusted to the historical temperature calibration record.

[0105] S5. When the numerical comparison in S4 shows a value greater than the deviation, the representative temperature value is extracted based on the NTC characteristics and the temperature calibration record of the measured object, and the extracted representative temperature value is sent to S2.

[0106] The steps in S5 are as follows:

[0107] S5.1, Accept the trigger notification from S4.2;

[0108] S5.2. Based on the NTC characteristics and the temperature calibration record of the measured object, a representative temperature value is extracted and sent to S2 to replace the temperature value obtained by S2 and regenerate the deviation value. The specific steps are as follows:

[0109] Data preparation: Obtain the characteristic parameters of the NTC used, and organize the temperature calibration records of the test object accumulated previously. The records should include information such as measurement time, measurement temperature value, and corresponding resistance value.

[0110] Temperature value extraction: The temperature calibration records are grouped according to the measurement time, NTC characteristics, and temperature calibration records of the measured object. Then, different weights are assigned to each temperature value according to the proximity of the measurement time or the reliability of the measurement. Finally, the weighted average is calculated as the representative temperature value.

[0111] Regenerate the deviation value: Send the extracted representative temperature value to the formula previously used for temperature value compensation, replacing the original temperature value. Using the replaced temperature value, combined with the real-time resistance value of the NTC and the standard resistance specification information, recalculate the resistance deviation and temperature offset compensation value to generate a new deviation value. The specific calculation process is the same as the deviation calculation method in the previous temperature calibration steps.

[0112] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. A method for automatic temperature calibration of a temperature measuring device, characterized in that Includes the following steps: S1. Collect historical temperature calibration records and set temperature fluctuation thresholds for each type of object being measured. S2. Use NTC groups to measure the temperature of the object, and at the same time, combine multiple temperature groups with the temperature fluctuation threshold to perform stability detection. Then, measure the resistance of the NTC groups with stable temperature values. S3. Obtain the standard resistor specification information of the NTC group, then calculate the deviation between the real-time resistance value and the standard resistance value to obtain the deviation array, and then calculate the temperature offset compensation value by combining the deviation array with the resistance value and temperature value, and correct the temperature value. S4. Based on historical temperature calibration records, combined with corrected temperature values ​​and temperature offset compensation values, predict the temperature trend of the measured object, and then compare the predicted temperature trend with the latest temperature calibration records to determine the deviation value. S5. When the value comparison of S4 shows that it is greater than the deviation, the temperature value is extracted representatively based on the NTC characteristics and the temperature calibration record of the test object, and the extracted representative temperature value is sent to S2 to replace the temperature value obtained by S2 and regenerate the deviation value. The steps of S3 for calculating the temperature offset compensation value and correcting the temperature value are as follows: ； Where T is the temperature value, K is the proportionality coefficient, R[n] is the resistance value after calibration deviation compensation, b is the temperature offset compensation value, and f[T] is the temperature value calculated based on the resistance value; ； Among them, R t The standard resistance value is the one specified in the standard resistance specification information. ADC is the analog-to-digital conversion value acquired in real time by the measurement system. 4096 is the maximum value of the 12-bit ADC conversion. R s The sampling resistor is used for the measurement circuit; ； Wherein, Array[n] is the deviation array, which is obtained by measuring the deviation between the NTC resistance value and the standard resistance value at the corresponding temperature point; ； Where B is the material constant of the NTC thermistor, a and c are coefficients, and b is the temperature offset compensation value.

2. The method of claim 1, wherein: S1 records the temperature calibration for each NTC group and obtains the measurement object type for each NTC group, then marks the temperature calibration record in conjunction with the measurement object type.

3. The method of claim 1, wherein: The steps in S1 are as follows: S1.1 Collect historical temperature calibration records, perform temperature fluctuation analysis on each record based on the historical temperature calibration records, and obtain the temperature fluctuation value corresponding to each temperature calibration record based on the results; S1.

2. Combine the analysis based on the object type and the corresponding temperature fluctuation value to obtain the average temperature fluctuation value for each object type. Then, obtain the object type of the object being measured and extract the average temperature fluctuation value as the temperature fluctuation threshold based on the obtained object type.

4. The method of claim 1, wherein: The steps in S2 are as follows: S2.

1. Use the NTC group to measure the temperature value of the object, and combine the measured temperature values ​​with the temperature fluctuation threshold for stable comparison. If the fluctuation value between the temperature values ​​is greater than the temperature fluctuation threshold, continue the measurement. Conversely, if the fluctuation value between the temperature values ​​is less than the temperature fluctuation threshold, it is determined that the temperature of the object being measured is stable. S2.2 After the temperature of the object being measured stabilizes as fed back in S2.1, the resistance of the NTC is collected using a resistance measuring instrument to obtain the real-time resistance value of the NTC during the temperature feedback process.

5. The method of claim 1, wherein: The steps in S3 are as follows: S3.1 Obtain the standard resistor specification information according to the NTC model used, then extract the standard resistor value at the corresponding temperature point from the standard resistor specification information according to the temperature value, and calculate the deviation by combining the standard resistor value with the real-time resistance value. Obtain the resistance deviation based on the calculation result. Then, calculate the resistance deviation for each different set of multiple temperature values ​​to obtain the deviation value. S3.

2. Combine the deviation array with the resistance value and temperature value to calculate the temperature offset compensation value, and correct the temperature value.

6. The method of claim 1, wherein: The steps in S4 are as follows: S4.

1. Based on historical temperature calibration records, combined with the current temperature value and temperature offset compensation value, predict the temperature trend of the measured object and obtain the predicted temperature trend of the measured object. S4.

2. Set a deviation threshold based on the object type and temperature value of the object being measured. Then compare the predicted temperature trend with the latest temperature calibration record using the deviation threshold. If the deviation between the predicted temperature trend and the latest temperature calibration record is greater than the deviation threshold, proceed to step S5. Continue monitoring as long as the deviation between the predicted temperature trend and the latest temperature calibration record is less than the deviation threshold.

7. The method of claim 1, wherein: The latest temperature calibration record in S4 is a record file established based on the object under test. The latest temperature calibration record contains all the temperature values ​​of the object under test after calibration. When the temperature calibration of the object under test is stopped, the latest temperature calibration record is adjusted to the historical temperature calibration record.

8. The method of claim 6, wherein: The steps in S5 are as follows: S5.1, Accept the trigger notification from S4.2; S5.

2. Based on the NTC characteristics and the temperature calibration record of the measured object, a representative temperature value is extracted and sent to S2 to replace the temperature value obtained by S2 and generate a new deviation value.

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