Fourier infrared gas spectrum analysis device

Abstract

The invention relates to the technical field of gas detection, and particularly discloses a Fourier infrared gas spectrum analysis device, which comprises: a gas cell, which is provided with a light inlet and a light outlet; the reflecting mirror assembly is arranged in the gas pool and is used for reflecting the light entering from the light inlet to the light outlet; and the cleaning module is arranged on the gas pool and is used for cleaning the reflector assembly and the gas pool. When the reflector assembly and the gas pool need to be cleaned, nitrogen can be adopted as cleaning fluid, the interior of the gas pool and the reflector assembly are purged through the cleaning module, impurities attached to the surface of the reflector assembly and the inner wall of the gas pool can be effectively removed, excessive impurities are prevented from being deposited in the gas pool, and the service life of the reflector assembly is prolonged. In addition, the influence of impurities on the mirror surface of the reflector assembly is prevented, the light energy loss is reduced, and the sensitivity of infrared light reflection is ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of gas analysis, and more specifically, to a Fourier transform infrared gas spectroscopy analysis device. Background Art

[0002] In recent years, with the application of technologies such as dynamic collimation, high-sensitivity, high signal-to-noise ratio detectors, and multi-channel gas cells in Fourier transform infrared spectrometers, it has gradually become the mainstream in the field of gas analysis. Each time gas detection and analysis are performed, zero gas (usually nitrogen) needs to be introduced into the gas cell to purge the gas cell and keep it clean; when gas detection is carried out, the gas to be measured is introduced into the gas cell, and the infrared light emitted by the light-emitting unit is reflected multiple times by the spherical mirror in the gas cell and then received by the detection unit. After the infrared light passes through the gas to be measured, the gas to be measured will absorb the corresponding light wavelength, and then the detection unit receives the infrared light and analyzes it; some gases to be measured contain smaller impurity particles that are not easily filtered out or easily attached impurities, which are likely to adhere to the spherical mirror, affecting the reflection of the spherical mirror on the infrared light and thus affecting the final spectral analysis result.

[0003] Therefore, it is necessary to propose a Fourier transform infrared gas spectroscopy analysis device to at least partially solve the problems existing in the prior art. Summary of the Invention

[0004] A series of simplified concepts are introduced in the Summary of the Invention section, which will be further elaborated in the Detailed Description section. The Summary of the Invention section of the present invention does not mean to attempt to define the key features and essential technical features of the claimed technical solution, nor does it mean to attempt to determine the protection scope of the claimed technical solution.

[0005] To at least partially solve the above problems, the present invention provides a Fourier transform infrared gas spectroscopy analysis device, comprising:

[0006] A gas cell, which is provided with a light inlet and a light outlet;

[0007] A mirror assembly, arranged in the gas cell, for reflecting the light entering from the light inlet to the light outlet;

[0008] A cleaning module, arranged on the gas cell, for cleaning the mirror assembly and the gas cell.

[0009] Preferably, the mirror assembly includes:

[0010] A first spherical mirror, arranged on one side of the gas cell, between the light inlet and the light outlet;

[0011] A second spherical mirror, arranged on the other side of the gas cell opposite to the first spherical mirror.

[0012] Preferably, the cleaning module includes:

[0013] At least two nozzles for introducing a cleaning fluid into the gas cell;

[0014] A driving part for driving the nozzles to rotate in multiple directions;

[0015] A control part for controlling the cleaning pressure of the cleaning fluid acting on the mirror assembly so that the cleaning pressure is within a set pressure range.

[0016] Preferably, both the first spherical mirror and the second spherical mirror are connected in the gas cell through a detection assembly;

[0017] The working states of the detection assembly include:

[0018] A first state in which the detection assembly makes the positions of the first spherical mirror and the second spherical mirror in a fixed state;

[0019] A second state in which the detection assembly makes the positions of the first spherical mirror and the second spherical mirror in a movable state, and the detection assembly is used to detect the cleaning pressure of the cleaning fluid acting on the mirror assembly.

[0020] Preferably, the detection assembly includes:

[0021] A fixing part arranged in the gas cell, on which a sliding groove is provided;

[0022] A movable part slidably arranged in the sliding groove, and the first spherical mirror or the second spherical mirror is arranged on the movable part;

[0023] An electromagnet arranged in the sliding groove;

[0024] A permanent magnet corresponding to the electromagnet, arranged on the movable part;

[0025] A pressure sensor arranged on the movable part, a receiving groove is provided in the sliding groove, and an elastic member is provided between the receiving groove and the pressure sensor.

[0026] Preferably, the control part includes:

[0027] An angle control unit for controlling the cleaning angle of the nozzles according to set cleaning data;

[0028] A flow control unit for controlling the flow rate of the cleaning fluid according to set cleaning data;

[0029] Wherein, the set cleaning data includes: multiple set cleaning angles of the nozzles, and multiple set flow rates of the cleaning fluid respectively corresponding to the multiple set cleaning angles.

[0030] Preferably, the control part further includes:

[0031] An acquisition unit for acquiring the real-time cleaning pressure detected by a detection component;

[0032] A judgment unit for judging whether the real-time cleaning pressure is within a set pressure range to obtain a judgment result;

[0033] An adjustment unit for adjusting the flow rate of the cleaning fluid according to the real-time cleaning pressure when the judgment result is that the real-time cleaning pressure is not within the set pressure range.

[0034] Preferably, an exhaust pipe and an intake pipe for introducing a gas to be measured are provided on the gas cell. A filter and a first particulate matter concentration sensor are sequentially provided on the intake pipe along the intake direction, and a second particulate matter concentration sensor is provided on the exhaust pipe.

[0035] Preferably, it further includes:

[0036] A monitoring module for monitoring whether the current cumulative amount of particulate matter deposited in the gas cell is greater than or equal to a set cumulative amount. If so, the cleaning module is started to clean the mirror assembly and the gas cell. If not, the cleaning module does not need to be started.

[0037] Preferably, the monitoring module includes:

[0038] A first monitoring unit for obtaining the content of particulate matter entering the gas cell each time based on the total amount of the gas to be measured introduced and the particulate matter concentration detected by the first particulate matter concentration sensor each time when the gas to be measured is introduced into the intake pipe;

[0039] A second monitoring unit for obtaining the content of particulate matter discharged out of the gas cell each time based on the total amount of the gas discharged and the particulate matter concentration detected by the second particulate matter concentration sensor each time when the gas is discharged from the exhaust port;

[0040] A calculation unit for obtaining the content of particulate matter deposited in the gas cell each time based on the content of particulate matter entering the gas cell each time and the content of particulate matter discharged out of the gas cell each time; then the current cumulative amount of particulate matter deposited in the gas cell is: the sum of the content of particulate matter deposited in the gas cell each time after the last cleaning by the cleaning module.

[0041] Compared with the prior art, the present invention has at least the following beneficial effects:

[0042] For the Fourier transform infrared gas spectral analysis device described in the present invention, when it is necessary to clean the mirror assembly and the gas cell, nitrogen can be used as the cleaning fluid, which passes through the cleaning module to purge the inside of the gas cell and the mirror assembly, effectively removing impurities adhering to the surface of the mirror assembly and the inner wall of the gas cell, preventing excessive impurities from depositing in the gas cell, which may affect the detection and analysis results of the gas to be measured. Moreover, it prevents impurities from affecting the mirror surface of the mirror assembly, reducing light energy loss and ensuring the sensitivity of infrared light reflection.

[0043] For the Fourier transform infrared gas spectral analysis device described in the present invention, other advantages, objectives, and features of the present invention will be partially reflected by the following description and partially understood by those skilled in the art through the research and practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] The drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation to the present invention. In the drawings:

[0045] Figure 1 is a schematic diagram of the internal structure of the gas cell in the Fourier transform infrared gas spectral analysis device described in the present invention;

[0046] Figure 2 is a schematic diagram of the structure of the detection component in the second state in the Fourier transform infrared gas spectral analysis device described in the present invention;

[0047] Figure 3 is a schematic diagram of the structure of the detection component in the first state in the Fourier transform infrared gas spectral analysis device described in the present invention;

[0048] Figure 4 is a block diagram of the control unit in the Fourier transform infrared gas spectral analysis device described in the present invention;

[0049] Figure 5 is a block diagram of the monitoring module in the Fourier transform infrared gas spectral analysis device described in the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0050] The following further describes the present invention in detail with reference to the drawings and embodiments, so that those skilled in the art can implement it according to the description in the specification.

[0051] It should be understood that terms such as "having", "comprising", and "including" as used herein do not exclude the presence or addition of one or more other elements or their combinations.

[0052] As Figure 1 shown, the present invention provides a Fourier transform infrared gas spectral analysis device, including:

[0053] A gas cell 1, with a light inlet 2 and a light outlet 3 provided thereon;

[0054] A mirror assembly, disposed within the gas cell 1, for reflecting the light entering through the light inlet 2 to the light outlet 3;

[0055] A cleaning module, disposed on the gas cell 1, for cleaning the mirror assembly and the gas cell 1.

[0056] The gas to be measured enters the gas cell 1. The infrared light emitted by the light-emitting unit enters through the light inlet 2 and is emitted from the light outlet 3 under the reflection of the mirror assembly, and thus is received by the detection unit. Since the infrared light passes through the gas to be measured when reflecting within the gas cell 1, the gas to be measured absorbs the corresponding light wavelength, and the light intensity decreases accordingly. After performing spectral analysis on the infrared light received by the detection unit, the analysis and detection of the gas can be achieved.

[0057] Before each detection, zero-point setting is required. The setting process is to introduce zero gas into the gas cell 1. For example, when using nitrogen as the zero gas, an oxygen sensor is used to detect the oxygen content of the gas discharged from the exhaust port of the gas cell 1 to determine whether the gas cell 1 is full of nitrogen. After filling with nitrogen, zero-point setting is performed. After the infrared light passes through nitrogen, the analysis and detection result of the infrared light received by the detection unit is the zero point, and then the detection work can be carried out.

[0058] When it is necessary to clean the mirror assembly and the gas cell 1, nitrogen can be used as the cleaning fluid, which is passed through the cleaning module to purge the inside of the gas cell 1 and the mirror assembly, which can effectively remove the impurities attached to the surface of the mirror assembly and the inner wall of the gas cell 1, prevent excessive impurities from depositing in the gas cell 1, which may affect the detection and analysis result of the gas to be measured, and prevent the impurities from affecting the mirror surface of the mirror assembly, reducing the light energy loss and ensuring the sensitivity of the infrared light reflection.

[0059] As Figure 1 shown, in one embodiment, the mirror assembly includes:

[0060] A first spherical mirror 4, disposed on one side of the gas cell 1, between the light inlet 2 and the light outlet 3;

[0061] A second spherical mirror 5, disposed on the other side within the gas cell 1 opposite to the first spherical mirror 4.

[0062] Among them, the second spherical mirror 5 includes: a spherical mirror unit A and a spherical mirror unit B;

[0063] Infrared light enters from the light inlet 2, is reflected by the first spherical mirror 4 to the spherical mirror unit A, then reflected from the spherical mirror unit A to the first spherical mirror 4, then reflected from the first spherical mirror 4 to the spherical mirror unit B, and then reflected from the spherical mirror unit B to the first spherical mirror 4, and finally exits from the light outlet 3, ensuring that the gas to be measured can fully absorb specific wavelengths.

[0064] The cleaning module is used to clean the surfaces of the first spherical mirror 4, the spherical mirror unit A, and the spherical mirror unit B to prevent fine impurities from adhering due to long-term use, which may cause the surface to become rough and result in light energy loss.

[0065] As Figure 1 shown, in one embodiment, the cleaning module includes:

[0066] At least two nozzles 6 for introducing a cleaning fluid into the gas cell 1;

[0067] A driving part 7 for driving the nozzles 6 to rotate in multiple directions;

[0068] A control part for controlling the cleaning pressure of the cleaning fluid acting on the mirror assembly so that the cleaning pressure is within a set pressure range.

[0069] Among them, the driving part 7 can select any mechanism in the prior art that can drive the nozzles 6 to rotate along at least two directions, so that the nozzles 6 can clean every part of the first spherical mirror 4 and the second spherical mirror 5.

[0070] The nozzles 6 can be symmetrically arranged on both sides of the gas cell 1, and the positions of the first spherical mirror 4 and the second spherical mirror 5 are within the rotational jet range of the nozzles 6;

[0071] During cleaning, the nozzles 6 on one side can clean the first spherical mirror 4 and part of the inner wall of the gas cell 1, and the nozzles 6 on the other side can clean the second spherical mirror 5 and the other part of the inner wall of the gas cell 1 to achieve cleaning of the mirror assembly and the gas cell 1;

[0072] In addition, in order to prevent the cleaning fluid ejected from the nozzles 6 from having too high a pressure and damaging the surfaces of the first spherical mirror 4 and the second spherical mirror 5, a control part is provided to control the cleaning pressure of the cleaning fluid acting on the mirror assembly so that it is stable within a set pressure range; among them, the minimum value of the set pressure range is the minimum cleaning pressure capable of cleaning the attached impurities, and the maximum value of the set pressure range is the maximum cleaning pressure that the first spherical mirror 4 and the second spherical mirror 5 can withstand. Stabilizing the cleaning pressure within the set pressure range can achieve effective cleaning of the mirror assembly and prevent damage to the surface of the mirror assembly from increasing its surface roughness.

[0073] In one embodiment, the first spherical mirror 4 and the second spherical mirror 5 are both connected in the gas cell 1 through the detection component 8;

[0074] The working states of the detection component 8 include:

[0075] The first state, where the detection component 8 makes the positions of the first spherical mirror 4 and the second spherical mirror 5 in a fixed state;

[0076] When the gas to be measured is normally introduced and zero setting is performed, the detection component 8 is in the first state, ensuring the stability of the positions of the first spherical mirror 4 and the second spherical mirror 5, thereby ensuring the consistency of the optical path of the infrared light in the gas cell 1;

[0077] The second state, where the detection component 8 makes the positions of the first spherical mirror 4 and the second spherical mirror 5 in a movable state, and the detection component 8 is used to detect the cleaning pressure exerted by the cleaning fluid on the mirror assembly.

[0078] During cleaning, in order to control the cleaning pressure, the detection component 8 is in the second state, that is, it can detect the cleaning pressure exerted on the first spherical mirror 4 and the second spherical mirror 5 in real time, so as to facilitate the control of the cleaning pressure.

[0079] As Figure 2 shown, in one embodiment, the detection component 8 includes:

[0080] A fixed part 81 arranged in the gas cell 1, on which a sliding groove 82 is provided;

[0081] A movable part 83 slidably arranged in the sliding groove 82, and the first spherical mirror 4 or the second spherical mirror 5 is arranged on the movable part 83;

[0082] An electromagnet 84 arranged in the sliding groove 82;

[0083] A permanent magnet 85 corresponding to the electromagnet 84, arranged on the movable part 83;

[0084] A pressure sensor 86 arranged on the movable part 83, a receiving groove 87 is provided in the sliding groove 82, and an elastic member 88 is arranged between the receiving groove 87 and the pressure sensor 86.

[0085] When the detection component 8 is in the first state, as Figure 3 shown, the electromagnet 84 generates an adsorption effect on the permanent magnet 85, causing the movable part 83 to move, compressing the elastic member 88 in the receiving groove 87, and making the electromagnet 84 and the permanent magnet 85 contact, thereby ensuring the fixed state of the positions of the first spherical mirror 4 and the second spherical mirror 5;

[0086] When the detection component 8 is in the second state, as Figure 2As shown, the electromagnet 84 has no effect on the permanent magnet 85. Under the elastic action of the elastic member 88, the movable part 83 extends out of the sliding groove 82, and the electromagnet 84 and the permanent magnet 85 are separated by a certain distance. When cleaning, when the cleaning fluid is sprayed onto the first spherical mirror 4 and the second spherical mirror 5, the acting force on the first spherical mirror 4 and the second spherical mirror 5 causes the movable part 83 to move, thereby compressing the elastic member 88, and the pressure sensor 86 can detect the pressure value, so as to realize the detection of the cleaning pressure.

[0087] As Figure 4 shown, in one embodiment, the control unit includes:

[0088] An angle control unit for controlling the cleaning angle of the nozzle 6 according to the set cleaning data;

[0089] A flow control unit for controlling the flow rate of the cleaning fluid according to the set cleaning data;

[0090] Wherein, the set cleaning data includes: a plurality of set cleaning angles of the nozzle 6, and a plurality of set flow rates of the cleaning fluid corresponding to the plurality of set cleaning angles respectively.

[0091] The set cleaning data further includes: the maximum rotation angle of the nozzle 6 during cleaning. For example, during cleaning, the maximum rotation angle of the nozzle 6 in the vertical direction is 160 degrees, then the angle it turns from the initial position to the end position is 160 degrees, the angle between its axis in the initial position and the horizontal plane is 80 degrees, and the angle between its axis in the end position and the horizontal plane is also 80 degrees, and the two positions are symmetrically arranged; then the maximum rotation angle of the nozzle 6 in the horizontal direction is also 160 degrees;

[0092] During cleaning, when the nozzle 6 turns through a unit angle, it reaches a certain preset set cleaning angle, and there is a corresponding set flow rate of the cleaning fluid. This is because when the nozzle 6 sprays the cleaning fluid at different angles and the same pressure, the normal pressure (the component force in the vertical direction) generated on the first spherical mirror 4 and the second spherical mirror 5 is different. Therefore, the pressure values detected by the pressure sensor 86 are different. Therefore, in order to ensure that the cleaning pressure generated on the first spherical mirror 4 and the second spherical mirror 5 is maintained within the set pressure range, different set flow rates need to be adopted according to the set cleaning angles to prevent damage to the first spherical mirror 4 and the second spherical mirror 5;

[0093] During cleaning, since the nozzle 6 needs to rotate, the first spherical mirror 4 and the second spherical mirror 5 only need to adopt different set flow rates according to the set cleaning angle within only a part of their rotation angle range (the set rotation angle range of the nozzle 6 covering the first spherical mirror 4 and the second spherical mirror 5 can be preset). When the cleaning fluid ejected by the nozzle 6 acts on the inner wall of the gas cell 1 and the rotation angle of the nozzle 6 exceeds the set rotation angle range, the pressure of the cleaning fluid ejected by the nozzle 6 only needs to be maintained at a constant pressure.

[0094] Furthermore, the control unit further includes:

[0095] An acquisition unit for acquiring the real-time cleaning pressure detected by the detection component 8;

[0096] A judgment unit for judging whether the real-time cleaning pressure is within the set pressure range to obtain a judgment result;

[0097] An adjustment unit for adjusting the flow rate of the cleaning fluid according to the real-time cleaning pressure when the judgment result is that the real-time cleaning pressure is not within the set pressure range.

[0098] Since there may be errors in the flow rate control of the nozzle 6 during cleaning, which will cause errors in the cleaning pressure acting on the first spherical mirror 4 and the second spherical mirror 5. Therefore, it is also necessary to acquire the pressure value detected by the pressure sensor 86 in real time, that is, the real-time cleaning pressure, and then use the judgment unit to judge whether the real-time cleaning pressure is within the set pressure range. If so, no adjustment is required, and the cleaning fluid can continue to be controlled according to the set cleaning angle and set flow rate. If not, the flow rate of the cleaning fluid is adaptively adjusted according to the magnitude of the real-time cleaning pressure so that the cleaning pressure is maintained within the set pressure range.

[0099] In one embodiment, an exhaust pipe and an intake pipe for introducing the gas to be measured are provided on the gas cell 1. A filter and a first particulate matter concentration sensor are sequentially provided on the intake pipe along the intake direction, and a second particulate matter concentration sensor is provided on the exhaust pipe.

[0100] Since the gas to be measured usually contains impurity particles, the filter can filter out particles larger than its filter mesh size, and a small number of particles smaller than the filter mesh size of the filter will enter the gas cell 1 and even adhere to its interior. Therefore, the first particulate matter concentration sensor and the second particulate matter concentration sensor are provided to detect the concentration of the above-mentioned particles that can pass through the filter to judge the situation of particulate matter deposition in the gas cell 1.

[0101] In one embodiment, it further includes:

[0102] The monitoring module is used to monitor whether the current cumulative amount of particulate matter deposited in the gas cell 1 is greater than or equal to the set cumulative amount. If so, the cleaning module is started to clean the mirror assembly and the gas cell 1. If not, the cleaning module does not need to be started.

[0103] The monitoring module can monitor the current cumulative amount of particulate matter deposited in the gas cell 1 through the first particulate matter concentration sensor and the second particulate matter concentration sensor, so as to determine whether it is necessary to clean the mirror assembly and the gas cell 1 to ensure the cleanliness of the gas cell 1.

[0104] Such as Figure 5 shown, further, the monitoring module includes:

[0105] The first monitoring unit, when the gas to be measured is introduced into the intake pipe each time, obtains the content of particulate matter entering the gas cell 1 each time according to the total amount of the gas to be measured introduced and the particulate matter concentration detected by the first particulate matter concentration sensor;

[0106] The second monitoring unit, when the gas is discharged from the exhaust port each time, obtains the content of particulate matter discharged outside the gas cell 1 each time according to the total amount of the discharged gas and the particulate matter concentration detected by the second particulate matter concentration sensor;

[0107] The calculation unit obtains the content of particulate matter deposited in the gas cell 1 each time according to the content of particulate matter entering the gas cell 1 each time and the content of particulate matter discharged outside the gas cell 1 each time; then the current cumulative amount of particulate matter deposited in the gas cell 1 is: the sum of the content of particulate matter deposited in the gas cell 1 each time after the last cleaning by the cleaning module.

[0108] When the particulate matter enters the gas cell 1, that is, when the gas to be measured enters the gas cell 1. Therefore, each time the gas to be measured is introduced, the content of particulate matter entering the gas cell 1 is obtained;

[0109] In the non-cleaning case, when the particulate matter is discharged from the gas cell 1, that is, when the gas to be measured is discharged and zero air is introduced, it can take away the particulate matter in the gas cell 1, but there is still a small amount of particulate matter remaining. Therefore, each time the gas is exhausted, the content of particulate matter discharged outside the gas cell 1 is obtained;

[0110] Then, based on the particulate matter content entering and leaving each time, the particulate matter content deposited in the gas cell 1 each time can be obtained. After the last cleaning by the cleaning module, the particulate matter content deposited in the gas cell 1 each time is added up to obtain the current cumulative amount of the particulate matter deposited in the gas cell 1. Then, it is determined whether the current cumulative amount is greater than or equal to the set cumulative amount. If so, it indicates that the current cumulative amount of the particulate matter has affected the analysis and detection of the gas to be measured, and the cleaning module needs to be started to clean the mirror assembly and the gas cell 1. If not, it indicates that the current cumulative amount of the particulate matter is not sufficient to affect the analysis and detection of the gas to be measured, and the cleaning module does not need to be started;

[0111] Through the above design, it is possible to control whether to start the cleaning module based on the judgment of the current cumulative amount of the particulate matter, while ensuring the cleanliness of the gas cell 1 and reducing the cleaning frequency. In addition, when cleaning is not required, zero gas can be introduced into the gas cell 1 through the nozzle 6 of the cleaning module for zero point setting. There is no need to set up a separate zero gas inlet. The zero gas enters through the nozzle 6 and can be sprayed in with a certain pressure, which can better expel other gases quickly.

[0112] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings. They are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation of the present invention.

[0113] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed", etc. should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection, an electrical connection, or communicable with each other; it can be directly connected, or indirectly connected through an intermediate medium, and can be the communication inside two elements or the interaction relationship between two elements, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0114] Although the embodiments of the present invention have been disclosed as above, they are not limited to the applications listed in the specification and embodiments. It can be fully applied to various fields suitable for the present invention. For those skilled in the art, additional modifications can be easily achieved. Therefore, without departing from the general concept defined by the claims and the scope of equivalents, the present invention is not limited to the specific details and the examples shown and described herein.

Claims

1. A Fourier transform infrared gas spectral analysis device, characterized in that, Comprising: A gas cell (1) provided with a light inlet (2) and a light outlet (3); A mirror assembly disposed within the gas cell (1) for reflecting light entering through the light inlet (2) to the light outlet (3); A cleaning module disposed on the gas cell (1) for cleaning the mirror assembly and the gas cell (1).

2. The Fourier transform infrared gas spectroscopy analysis device according to claim 1, wherein The mirror assembly includes: A first spherical mirror (4) disposed on one side of the gas cell (1) between the light inlet (2) and the light outlet (3); A second spherical mirror (5) disposed on the other side within the gas cell (1) opposite to the first spherical mirror (4).

3. The Fourier transform infrared gas spectral analysis device according to claim 2, characterized in that, The cleaning module includes: At least two nozzles (6) for introducing a cleaning fluid into the gas cell (1); A driving part (7) for driving the nozzles (6) to rotate in multiple directions; A control part for controlling the cleaning pressure of the cleaning fluid acting on the mirror assembly so that the cleaning pressure is within a set pressure range.

4. The Fourier transform infrared gas spectral analysis device according to claim 3, characterized in that, Both the first spherical mirror (4) and the second spherical mirror (5) are connected within the gas cell (1) through a detection assembly (8); The working states of the detection assembly (8) include: A first state in which the detection assembly (8) makes the positions of the first spherical mirror (4) and the second spherical mirror (5) in a fixed state; A second state in which the detection assembly (8) makes the positions of the first spherical mirror (4) and the second spherical mirror (5) in a movable state, and the detection assembly (8) is used to detect the cleaning pressure of the cleaning fluid acting on the mirror assembly.

5. The Fourier transform infrared gas spectral analysis device according to claim 4, characterized in that, The detection assembly (8) includes: A fixing part (81) disposed within the gas cell (1) provided with a sliding groove (82); A movable part (83) slidably disposed within the sliding groove (82), and the first spherical mirror (4) or the second spherical mirror (5) is disposed on the movable part (83); An electromagnet (84) disposed within the sliding groove (82); A permanent magnet (85) corresponding to the electromagnet (84) disposed on the movable part (83); A pressure sensor (86) disposed on the movable part (83), and an accommodating groove (87) is provided within the sliding groove (82), and an elastic member (88) is provided between the accommodating groove (87) and the pressure sensor (86).

6. The Fourier transform infrared gas spectroscopy analysis device according to claim 4, wherein The control part includes: An angle control unit for controlling the cleaning angle of the nozzles (6) according to set cleaning data; A flow control unit for controlling the flow rate of the cleaning fluid according to set cleaning data; Wherein the set cleaning data includes: multiple set cleaning angles of the nozzles (6), and multiple set flow rates of the cleaning fluid respectively corresponding to the multiple set cleaning angles.

7. The Fourier transform infrared gas spectral analysis device according to claim 6, characterized in that, The control part further includes: An acquisition unit for acquiring the real-time cleaning pressure detected by the detection assembly (8); A judgment unit for judging whether the real-time cleaning pressure is within the set pressure range to obtain a judgment result; An adjustment unit for adjusting the flow rate of the cleaning fluid according to the real-time cleaning pressure when the judgment result is that the real-time cleaning pressure is not within the set pressure range.

8. The Fourier transform infrared gas spectral analysis device according to claim 1, characterized in that, An exhaust pipe and an intake pipe for introducing the gas to be measured are provided on the gas cell (1). A filter and a first particulate matter concentration sensor are sequentially arranged on the intake pipe along the intake direction. A second particulate matter concentration sensor is provided on the exhaust pipe.

9. The Fourier transform infrared gas spectroscopy analysis device according to claim 8, characterized in that It further includes: A monitoring module, configured to monitor whether the current cumulative amount of the particulate matter deposited in the gas cell (1) is greater than or equal to a set cumulative amount. If so, the cleaning module is activated to clean the mirror assembly and the gas cell (1). If not, the cleaning module does not need to be activated.

10. The Fourier transform infrared gas spectral analysis device according to claim 9, characterized in that, The monitoring module includes: A first monitoring unit, when introducing the gas to be measured into the intake pipe each time, obtaining the content of the particulate matter entering the gas cell (1) each time according to the total amount of the gas to be measured introduced and the particulate matter concentration detected by the first particulate matter concentration sensor; A second monitoring unit, when discharging the gas from the exhaust port each time, obtaining the content of the particulate matter discharged out of the gas cell (1) each time according to the total amount of the discharged gas and the particulate matter concentration detected by the second particulate matter concentration sensor; A calculation unit, obtaining the content of the particulate matter deposited in the gas cell (1) each time according to the content of the particulate matter entering the gas cell (1) each time and the content of the particulate matter discharged out of the gas cell (1) each time. Then, the current cumulative amount of the particulate matter deposited in the gas cell (1) is: the sum of the content of the particulate matter deposited in the gas cell (1) each time after the last cleaning by the cleaning module.

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