Automatic test system and test method for ferroelectric hysteresis loop

Abstract

The invention belongs to the field of ferroelectric hysteresis loop testing, and particularly relates to a ferroelectric hysteresis loop automatic testing system and a testing method.The system comprises a sample table, a feeding device and a testing device; the sample table is used for storing a plurality of dielectric materials to be tested; the feeding device is used for transferring a dielectric material to be tested on a sample table to the testing device; the testing device comprises a testing power supply, a bracket, and a sample table mechanism, a probe mechanism, a scraper mechanism and an insulating liquid tank which are arranged on the bracket, the scraper mechanism comprises a scraper moving frame and a scraper arranged at the output end of the scraper moving frame, and the scraper moving frame is used for driving the scraper to move along the plane of the sample bearing plate. According to the automatic test system for the ferroelectric hysteresis loop, automatic test of the dielectric material can be achieved through the arrangement of the sample table, the feeding device and the test device, the insulating liquid tank and the scraper can be used for collecting the tested dielectric material, and it is guaranteed that the test environment keeps consistent and safe.

Description

Technical Field

[0001] The present invention belongs to the field of ferroelectric hysteresis loop testing, and particularly relates to an automatic ferroelectric hysteresis loop testing system and a testing method. Background Art

[0002] The testing method for the ferroelectric hysteresis loop of ceramic materials usually adopts GB / T 6426-1999 "Quasi-Static Testing Method for Ferroelectric Hysteresis Loops of Ferroelectric Ceramic Materials". The standard stipulates that the specimen is an unpolarized thin sheet with a thickness not greater than 1 mm, and both main surfaces are completely coated with metal layers as electrodes. Currently, the ferroelectric hysteresis loop of the material to be tested is directly measured by a ferroelectric hysteresis loop measuring instrument. The working electric field of the pulse capacitor using nonlinear dielectric materials is relatively high, about several tens of kV / mm or even higher. When measuring the ferroelectric hysteresis loop, the applied electric field intensity should be at least greater than the working electric field. Therefore, the applied field intensity also needs to reach several tens of kV / mm, and the corresponding test voltage also needs to reach several thousand volts.

[0003] The current ferroelectric hysteresis loop testing system for ceramic materials still has the following problems: 1. The degree of automation is low, manual intervention is required, and it is difficult to support large-scale testing; 2. The test voltage is high, posing a safety hazard; 3. It is difficult to collect thin slices of the nodal material, wasting manpower and time. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide an efficient and safe automatic ferroelectric hysteresis loop testing system and a testing method.

[0005] The present invention provides an automatic ferroelectric hysteresis loop testing system, including a sample stage, a feeding device, and a testing device; The sample stage is used to store a plurality of dielectric materials to be tested; The feeding device is used to transfer the dielectric materials to be tested on the sample stage to the testing device; The testing device includes a test power supply, a bracket, and a sample stage mechanism, a probe mechanism, a scraper mechanism, and an insulating liquid tank arranged on the bracket; The sample stage mechanism includes a sample stage moving frame and a sample carrier plate arranged at the output end of the sample stage moving frame. The sample stage moving frame is used to drive the sample carrier plate to enter or leave the insulating liquid tank; The probe mechanism includes a probe moving frame and a probe arranged at the output end of the probe moving frame. The probe moving frame is used to drive the probe to contact or leave the dielectric material to be tested on the plane of the sample carrier plate; The test power supply, the probe, the dielectric material on the plane of the sample carrier plate, and the sample carrier stage form a test circuit; The scraper mechanism includes a scraper moving frame and a scraper arranged at the output end of the scraper moving frame. The scraper moving frame is used to drive the scraper to move along the plane of the sample carrier plate.

[0006] Further, there are two sets of the sample stage mechanism and the insulating liquid tank arranged in parallel. The probe moving bracket can be used to drive the probe to move between the planes of the two sample carrier plates.

[0007] Further, there are two sets of the scraping mechanism corresponding to the two sample carrier plates, or the scraping moving bracket is used to drive the scraper to move along between the two sample carrier plates.

[0008] Further, at least one side of the sample carrier plate has a gap with at least the corresponding side of the insulating liquid tank. When the scraper moves along the plane of the sample carrier plate, the dielectric material on the sample carrier plate falls into the insulating liquid tank from the gap.

[0009] Further, the probe is an elastic probe.

[0010] Further, the position of the bracket for mounting the insulating liquid tank is provided with a fitting hole, and the insulating liquid tank is detachably placed on the fitting hole.

[0011] Further, the sample carrier plate is a strip-shaped plate, and a plurality of dielectric materials can be arranged at intervals along the length direction of the strip-shaped plate.

[0012] Further, the bracket includes an operation panel, a device accommodation cavity I arranged below the operation panel, and a device accommodation cavity II arranged on one side of the operation panel; The scraper and the insulating liquid tank are arranged on the operation panel; The sample stage moving bracket is a lifting mechanism arranged in the device accommodation cavity I, and the output end of the lifting mechanism passes through the operation panel to above the operation panel; The scraping moving bracket is a linear reciprocating driving mechanism arranged in the device accommodation cavity I, and the output end of the linear reciprocating driving mechanism passes through the operation panel to above the operation panel; The probe moving bracket is an XYZ three-axis moving mechanism arranged in the device accommodation cavity II, and the output end of the XYZ three-axis moving mechanism extends out of the side wall of the device accommodation cavity II to above the operation panel.

[0013] Further, the bracket further includes a protective door mechanism; The protective door mechanism includes an arc-shaped door and an arc-shaped door driving mechanism, and the arc-shaped door driving mechanism is used to drive the arc-shaped door to block or open the space above the operation panel and the side wall of the device accommodation cavity II.

[0014] The present invention also provides a ferroelectric hysteresis loop testing method, using the above ferroelectric hysteresis loop testing device, including the following steps: S1, the sample stage moving frame drives the sample carrier plate to move above the insulating liquid tank, and the feeding device transfers the dielectric materials to be measured on several sample stages to the upper surface of the sample carrier plate; S2, the sample stage moving frame drives the sample carrier plate to move into the insulating liquid tank, and the sample carrier plate and the dielectric materials are immersed in the insulating liquid; S3, the probe moving frame drives the probe to abut against the dielectric material to be measured on the sample carrier plate, and turns on the test power supply to conduct a test; When there are multiple test points on the dielectric material, after one test point is tested, the probe moving frame drives the probe to abut against the other test point on the dielectric material for testing until all test points are tested; When there are multiple dielectric materials, after one dielectric material is tested, the probe moving frame drives the probe to abut against another dielectric material for testing until all dielectric materials are tested; The test power supply is turned off; S4, the scraper moving frame drives the scraper to move along one side of the plane of the sample carrier plate to the other side, and scrapes the tested dielectric materials into the insulating liquid tank; After or before the scraper moving frame works, the probe moving frame drives the probe to leave the insulating liquid tank, and the sample stage moving frame drives the sample carrier plate to move above the insulating liquid tank; S5, re-enter step S1 to perform cyclic automatic testing.

[0015] The beneficial effects of the present invention are as follows. The provided ferroelectric hysteresis loop automatic testing system, through the settings of the sample stage, feeding device, and testing device, completely replaces manual labor, can achieve continuous automatic testing for 24 hours, and the automated testing is efficient and accurate, which can ensure the testing quality. Through the setting of the probe mechanism, the automated testing of dielectric materials can be realized. Through the setting of the scraping mechanism, the automatic blanking of the tested dielectric materials can be achieved. And in cooperation with the mechanical feeding device, the automatic feeding of the dielectric materials to be tested can be realized. Furthermore, the entire ferroelectric hysteresis loop testing requires no manual intervention, realizes continuous testing for 24 hours and high-precision testing, supports large-batch testing, and reduces labor costs. The setting of the insulating liquid tank, on the one hand, can provide a highly insulating testing environment for the dielectric materials, greatly ensuring the safety during the testing process. On the other hand, the wrapping of the insulating liquid can also keep the testing environment consistent and reduce the influence of the external environment on the testing process, such as electrostatic interference, which can improve the testing stability and accuracy. On the third hand, it can also be used for the collection of the tested dielectric materials. Since the insulating liquid tank is filled with insulating liquid, the tested dielectric materials falling into the insulating liquid can avoid the problem of being easily moved due to their small mass, improving the collection stability of the tested dielectric materials. In addition, since the scraping mechanism scrapes the tested dielectric materials from the side of the sample carrier plate into the insulating liquid tank, the tested dielectric materials will fall to the side bottom of the insulating liquid tank and will not affect the testing of the dielectric materials to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Appendix Figure 1 is a schematic structural diagram of the above ferroelectric hysteresis loop testing device of the present invention; Appendix Figure 2 is Figure 1 a partial enlarged view of part A in the appendix; Appendix Figure 3 is a schematic structural diagram of the first angle of the present invention with some brackets hidden; Appendix Figure 4 is a schematic structural diagram of the second angle of the present invention with some brackets hidden.

[0017] In the figure, 1 - sample stage mechanism; 11 - sample stage moving frame; 12 - sample carrier plate; 2 - probe mechanism; 21 - probe moving frame; 22 - probe; 3 - scraping mechanism; 31 - scraping moving frame; 32 - scraper; 4 - insulating liquid tank; 5 - bracket; 51 - operation panel; 511 - fitting hole; 52 - equipment accommodating cavity I; 53 - equipment accommodating cavity II; 54 - protective door mechanism; 541 - arc door; 542 - arc door driving mechanism. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0018] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0019] It should be noted that all directional indications (such as up, down, left, right, front, back,...) in the embodiments of the present invention are only used to explain the relative positional relationship and movement conditions between components in a specific posture (as shown in the accompanying drawings). If this specific posture changes, the directional indications will also change accordingly.

[0020] In addition, in the present invention, descriptions such as "first" and "second" are only for descriptive purposes, and cannot be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0021] In the present invention, unless otherwise clearly specified and limited, terms such as "connection" and "fixation" should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection, an electrical connection, a physical connection or a wireless communication connection; it can be directly connected, or indirectly connected through an intermediate medium, and can be the communication inside two components or the interaction relationship between two components, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0022] In addition, the technical solutions between various embodiments of the present invention can be combined with each other, but it must be based on the fact that those of ordinary skill in the art can implement it. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the protection scope required by the present invention.

[0023] As shown in the attached Figure 1 - attached Figure 4 As shown in the figure, the present invention provides an automatic ferroelectric hysteresis loop testing system for testing the ferroelectric hysteresis loop parameters of dielectric materials and detecting the ferroelectric properties of dielectric materials, including a sample stage, a feeding device, and a testing device; The sample stage is used to store a plurality of dielectric materials to be tested. Preferably, the dielectric materials to be tested are arranged in a rectangular array on the platform of the sample stage to facilitate extraction by the feeding device; The feeding device is used to transfer the dielectric material to be tested on the sample stage to the testing device. Preferably, a manipulator is adopted for the feeding device, and the output end of the manipulator is a suction cup structure that can be used to pick up and put down the dielectric material to be tested. The testing device includes a testing power supply, a bracket 5, and a sample stage mechanism 1, a probe mechanism 2, a scraper mechanism 3, and an insulating liquid tank 4 arranged on the bracket 5. The sample stage mechanism 1 includes a sample stage moving frame 11 and a sample bearing plate 12 arranged at the output end of the sample stage moving frame 11. The sample bearing plate 12 is used to bear the dielectric material to be tested, such as a ceramic film. The sample stage moving frame 11 is used to drive the sample bearing plate 12 to enter or leave the insulating liquid tank 4. When the dielectric material is borne on the sample bearing plate 12 and ready for the ferroelectric hysteresis loop test, the sample bearing plate 12 and the dielectric material are driven into the insulating liquid tank 4, so that the dielectric material, the probe 22 of the probe mechanism 2, and the sample bearing plate 12 are tested under the wrapping of the insulating liquid, eliminating the arc phenomenon that may be caused by high-voltage testing, and preventing the surroundings of the testing environment, the bracket 5 or other components from being electrified, greatly improving the testing safety. The probe mechanism 2 includes a probe moving frame 21 and a probe 22 arranged at the output end of the probe moving frame 21. The probe moving frame 21 is used to drive the probe 22 to contact or leave the plane of the sample bearing plate 12, specifically to drive the probe 22 to contact or leave the dielectric material on the sample bearing plate 12. The testing power supply, the probe 22, the dielectric material on the plane of the sample bearing plate 12, and the sample bearing stage 12 form a testing circuit, that is, the sample bearing plate 12 is made of a conductor material, and then the ferroelectric hysteresis loop performance of the dielectric material is tested. The scraper mechanism 3 includes a scraper moving frame 31 and a scraper 32 arranged at the output end of the scraper moving frame 31. The scraper moving frame 31 is used to drive the scraper 32 to move along the plane of the sample bearing plate 12. At this time, the scraper mechanism 3 can collect the dielectric material that has been tested on the sample bearing plate 12, and the insulating liquid tank 4 is used as a collection tank for the tested samples.

[0024] That is, the hysteresis loop automatic test system provided by the present invention can completely replace manual work through the setting of the sample stage, the loading device and the testing device, and can realize 24-hour continuous automatic testing. Moreover, the automatic testing is efficient and accurate, and the test quality can be guaranteed. Through the setting of the probe mechanism 2, the automatic testing of the dielectric material can be realized. Through the setting of the scraper mechanism 3, the automatic unloading of the tested dielectric material can be realized. In combination with the mechanical loading device (for example, the manipulator loads the dielectric material to be tested onto the sample supporting plate 12), the automatic loading of the dielectric material to be tested can be realized, so that the entire hysteresis loop test does not require manual intervention, and realizes 24-hour continuous testing and high-precision testing, supports large-scale testing, and reduces labor costs. The setting of the insulating liquid tank 4 can, on the one hand, A highly insulating test environment is provided for the dielectric material, which greatly ensures the safety during the test. On the other hand, the wrapping of the insulating liquid can also keep the test environment consistent, reduce the impact of the external environment on the test process, such as electrostatic interference, and improve the test stability and accuracy. On the other hand, it can also be used to collect the measured dielectric materials. Since the insulating liquid tank 4 contains insulating liquid, the measured dielectric material falls into the insulating liquid to avoid the problem of easy movement due to its small mass, thereby improving the collection stability of the measured dielectric material. In addition, since the scraper mechanism 3 scrapes the measured dielectric material into the insulating liquid tank 4 from the side of the sample carrier plate 12, the measured dielectric material will fall into the bottom of the side of the insulating liquid tank 4, which will not affect the test of the dielectric material to be tested.

[0025] In one embodiment, the sample stage mechanism 1 and the insulating liquid tank 4 are arranged in parallel in two groups; The probe moving frame 21 can be used to drive the probe 22 to move between the planes of two sample supporting plates 12 .

[0026] In this embodiment, when a dielectric material to be tested is carried on one of the sample supporting plates 12 for testing, the dielectric material that has been tested carried on the other sample supporting plate 12 can be collected, thereby ensuring the test performance of the probe 22, ensuring the continuity of the test, and avoiding the scraper mechanism 3 collecting the dielectric material that has been tested into the insulating liquid tank 4, causing the probe 22 to be unable to perform the test.

[0027] In one embodiment, the scraper mechanism 3 is provided with two groups corresponding to the two sample supporting plates 12, that is, one scraper mechanism 3 corresponds to one sample supporting plate 12, so as to ensure the independence of material unloading of the two sample supporting plates 12, or the scraper moving frame 31 is used to drive the scraper 32 to move between the two sample supporting plates 12. Such a setting can reduce the number of scraper moving frames 31 and simplify the structure.

[0028] In one embodiment, at least one side of the sample carrier plate 12 has a gap with at least the corresponding side of the insulating liquid tank 4. Preferably, the four sides of the sample carrier plate 12 are all smaller than the four sides of the insulating liquid tank 4, that is, there are gaps between the four sides of the sample carrier plate 12 and the four sides of the insulating liquid tank 4; When the squeegee 32 moves along the plane of the sample carrier plate 12, the dielectric material on the sample carrier plate 12 falls into the insulating liquid tank 4 from the gap. With such a setting, it can be ensured that the squeegee 32 will scrape the measured dielectric material on the sample carrier plate 12 into the insulating liquid tank 4, rather than hanging it on the bracket 5, thereby improving its collection stability.

[0029] In one embodiment, the probe 22 is an elastic probe, that is, the elastic probe has a certain elastic contraction amount, which can ensure that when the probe 22 makes reliable contact with the dielectric material, the dielectric material will not be crushed.

[0030] In one embodiment, the bracket 5 is provided with a fitting hole 511 at the position where the insulating liquid tank 4 is installed, and the insulating liquid tank 4 is detachably placed on the fitting hole 511. With such a setting, it is convenient to replace the insulating liquid in the insulating liquid tank 4 and transfer the measured dielectric material collected in the insulating liquid tank 4.

[0031] In one embodiment, the sample carrier plate 12 is a strip-shaped plate, and a plurality of dielectric materials can be arranged at intervals along the length direction of the strip-shaped plate. With such a setting, multiple dielectric materials can be tested at one time, further improving the test efficiency. In addition, multiple test points can be set for a single dielectric material to ensure the test accuracy of the dielectric material.

[0032] In one embodiment, the bracket 5 includes an operation panel surface 51, an equipment accommodation cavity I 52 provided below the operation panel 51, and an equipment accommodation cavity II 53 provided on one side of the operation panel 51; The squeegee 32 and the insulating liquid tank 4 are arranged on the operation panel surface 51, and the operation panel surface 51 is the main test area. In the embodiment where the insulating liquid tank 4 is detachably placed on the fitting hole 511, the fitting hole 511 is arranged on the operation panel surface 51; The sample stage moving frame 11 is a lifting mechanism arranged in the equipment accommodation cavity I 52, and the output end of the lifting mechanism passes through the operation panel surface 51 to above the operation panel surface 51. The lifting mechanism can be a cylinder, a hydraulic cylinder or a linear module. Preferably, a linear module is adopted to ensure the moving progress. The lifting mechanism is used to drive the sample carrier plate 12 to enter or leave the insulating liquid tank 4 along the vertical direction; The squeegee moving frame 31 is a linear reciprocating drive mechanism arranged in the equipment accommodating cavity I 52. The output end of the linear reciprocating drive mechanism passes through the operation panel 51 to the upper part of the operation panel 51. The linear reciprocating drive mechanism can also adopt a cylinder, a hydraulic cylinder or a linear module. Preferably, the linear reciprocating drive mechanism adopts a combination of a synchronous belt assembly and a guide rail slider. The guide rail is arranged on the operation panel 51. One end of the slider is used to install the squeegee 32, and the other end is connected to the synchronous belt to achieve linear reciprocating movement; The probe moving frame 21 is an XYZ three-axis moving mechanism arranged in the equipment accommodating cavity II 53. The output end of the XYZ three-axis moving mechanism extends out of the side wall of the equipment accommodating cavity II 53 to the upper part of the operation panel 51. The XYZ three-axis moving mechanism can drive the probe 22 to move to any point above the operation panel 51, so as to realize the contact test between the probe 22 and the dielectric material to be measured. Preferably, the ferroelectric hysteresis loop automatic test system further includes a vision recognition module. The vision recognition module is used to recognize the position of the dielectric material to be measured, so as to provide data support for the movement of the XYZ three-axis moving mechanism, and ensure that the XYZ three-axis moving mechanism can drive the probe 22 to contact the dielectric material to be measured with high precision.

[0033] In one embodiment, the bracket 5 further includes a protective door mechanism 54; The protective door mechanism 54 includes an arc door 541 and an arc door drive mechanism 542. The arc door drive mechanism 542 is used to drive the arc door 541 to block or open the space above the operation panel 51 and the side wall of the equipment accommodating cavity II 53. The arc door drive mechanism 542 includes an arc gear arranged on the arc door 541 and a drive motor arranged in the equipment accommodating cavity I 52. A driving gear meshing with the arc gear is arranged on the output shaft of the drive motor. By driving the drive motor to drive the driving gear to rotate, the arc door 541 is further driven to open and close, so that the high-voltage test environment can be further isolated from the outside and the safety can be improved.

[0034] The present invention also provides a ferroelectric hysteresis loop test method, using the above ferroelectric hysteresis loop test device, including the following steps: S1, the sample stage moving frame 11 drives the sample carrier plate 12 to move above the insulating liquid tank 4, and the feeding device transfers the dielectric materials on several sample stages to the upper surface of the sample carrier plate 12. At this time, the feeding device extracts the dielectric materials at the parking positions on the sample stages, further improving the test automation. The number of dielectric materials at the parking positions to be measured can be set according to needs; S2, the sample stage moving frame 11 drives the sample carrier plate 12 to move into the insulating liquid tank 4, and the sample carrier plate 12 and the dielectric materials are immersed in the insulating liquid; S3, the probe moving bracket 21 drives the probe 22 to abut against the dielectric material to be tested on the sample carrier plate 12, and turns on the test power supply to conduct the test; When there are multiple test points on the dielectric material, after the test at one test point is completed, the probe moving bracket 21 drives the probe 22 to abut against the other test point on the dielectric material to conduct the test until all test points are tested; When there are multiple dielectric materials, after the test of one dielectric material is completed, the probe moving bracket 21 drives the probe 22 to abut against another dielectric material to conduct the test until all dielectric materials are tested; The test power supply is turned off, and the test system automatically collects the test data and saves it; S4, the scraper moving bracket 31 drives the scraper 32 to move from one side to the other side along the plane of the sample carrier plate 12, and scrapes the tested dielectric material into the insulating liquid tank 4; Before or after the scraper moving bracket 31 works, the probe moving bracket 21 drives the probe 22 to leave the insulating liquid tank 4, and the sample stage moving bracket 11 drives the sample carrier plate 12 to move above the insulating liquid tank 4.

[0035] Preferably, before the scraper moving bracket 31 works, the probe moving bracket 21 drives the probe 22 to leave the insulating liquid tank 4, and the sample stage moving bracket 11 drives the sample carrier plate 12 to move above the insulating liquid tank 4. After the sample carrier plate 12 moves above the insulating liquid tank 4, the scraper moving bracket 31 drives the scraper 32 to move from one side to the other side along the plane of the sample carrier plate 12, and scrapes the tested dielectric material into the insulating liquid tank 4 to avoid the scraper 32 stirring the insulating liquid.

[0036] S5, re-enter step S1 to conduct cyclic automatic testing.

[0037] As described above, this is only an embodiment and does not impose any limitation on the present invention. Any person skilled in the art can, without departing from the scope of the technical solution of the present invention, make many possible changes, modifications or equivalents to the technical solution of the present invention using the technical content disclosed above. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present invention without departing from the content of the technical solution of the present invention shall fall within the scope of protection of the technical solution of the present invention.

Claims

1. An automatic testing system for ferroelectric hysteresis loops, characterized in that, It includes a sample stage, a loading device, and a testing device; The sample stage is used to store a number of dielectric materials to be tested; The loading device is used to transfer the dielectric materials to be tested on the sample stage to the testing device; The testing device includes a testing power supply, a bracket (5), and a sample stage mechanism (1), a probe mechanism (2), a scraper mechanism (3), and an insulating liquid tank (4) provided on the bracket (5); The sample stage mechanism (1) includes a sample stage moving frame (11) and a sample bearing plate (12) provided at the output end of the sample stage moving frame (11). The sample stage moving frame (11) is used to drive the sample bearing plate (12) to enter or leave the insulating liquid tank (4); The probe mechanism (2) includes a probe moving frame (21) and a probe (22) provided at the output end of the probe moving frame (21). The probe moving frame (21) is used to drive the probe (22) to contact or leave the dielectric material to be tested on the plane of the sample bearing plate (12); The testing power supply, the probe (22), the dielectric material on the plane of the sample bearing plate (12), and the sample bearing stage (12) form a testing circuit; The scraper mechanism (3) includes a scraper moving frame (31) and a scraper (32) provided at the output end of the scraper moving frame (31). The scraper moving frame (31) is used to drive the scraper (32) to move along the plane of the sample bearing plate (12).

2. The ferroelectric hysteresis loop automatic test system according to claim 1, characterized in that, There are two groups of the sample stage mechanism (1) and the insulating liquid tank (4) arranged in parallel; The probe moving frame (21) can be used to drive the probe (22) to move between the planes of the two sample bearing plates (12).

3. The ferroelectric hysteresis loop automatic test system according to claim 2, characterized in that, There are two groups of the scraper mechanisms (3) corresponding to the two sample bearing plates (12), or the scraper moving frame (31) is used to drive the scraper (32) to move between the two sample bearing plates (12).

4. The ferroelectric hysteresis loop automatic test system according to claim 1, characterized in that, At least one side of the sample bearing plate (12) has a gap with at least the corresponding side of the insulating liquid tank (4); When the scraper (32) moves along the plane of the sample bearing plate (12), the dielectric material on the sample bearing plate (12) falls into the insulating liquid tank (4) from the gap.

5. The ferroelectric hysteresis loop automatic test system according to claim 1, characterized in that, The probe (22) is an elastic probe.

6. The ferroelectric hysteresis loop automatic test system according to claim 1, characterized in that A fitting hole (511) is provided at the position where the bracket (5) installs the insulating liquid tank (4), and the insulating liquid tank (4) is detachably placed on the fitting hole (511).

7. The ferroelectric hysteresis loop automatic test system according to claim 1, characterized in that, The sample bearing plate (12) is a strip-shaped plate, and a plurality of dielectric materials can be arranged at intervals along the length direction of the strip-shaped plate.

8. The ferroelectric hysteresis loop automatic test system according to any one of claims 1-7, characterized in that, The bracket (5) includes an operation panel surface (51), an equipment accommodation cavity I (52) provided below the operation panel (51), and an equipment accommodation cavity II (53) provided on one side of the operation panel (51); The scraper (32) and the insulating liquid tank (4) are provided on the operation panel surface (51); The sample stage moving frame (11) is a lifting mechanism provided in the equipment accommodation cavity I (52), and the output end of the lifting mechanism passes through the operation panel surface (51) to above the operation panel surface (51); The squeegee moving frame (31) is a linear reciprocating drive mechanism arranged in the equipment accommodating cavity I (52), and the output end of the linear reciprocating drive mechanism passes through the operation panel (51) to the upper part of the operation panel (51); The probe moving frame (21) is an XYZ three-axis moving mechanism arranged in the equipment accommodating cavity II (53), and the output end of the XYZ three-axis moving mechanism extends out of the side wall of the equipment accommodating cavity II (53) to the upper part of the operation panel (51).

9. The ferroelectric hysteresis loop automatic test system according to claim 8, characterized in that, The bracket (5) further includes a protective door mechanism (54); The protective door mechanism (54) includes an arc door (541) and an arc door drive mechanism (542), and the arc door drive mechanism (542) is used to drive the arc door (541) to block or open the space above the operation panel (51) and the side wall of the equipment accommodating cavity II (53).

10. A ferroelectric hysteresis loop testing method, characterized in that, Using the ferroelectric hysteresis loop test device according to any one of claims 1-9, comprising the following steps: S1, the sample stage moving frame (11) drives the sample carrier plate (12) to move above the insulating liquid tank (4), and the feeding device transfers the dielectric materials to be tested on several sample stages to the upper surface of the sample carrier plate (12); S2, the sample stage moving frame (11) drives the sample carrier plate (12) to move into the insulating liquid tank (4), and the sample carrier plate (12) and the dielectric materials are immersed in the insulating liquid; S3, the probe moving frame (21) drives the probe (22) to abut against the dielectric material to be tested on the sample carrier plate (12), and turns on the test power supply to conduct a test; When there are multiple test points on the dielectric material, after testing at one test point, the probe moving frame (21) drives the probe (22) to abut against the other test point on the dielectric material for testing until all test points are tested; When there are multiple dielectric materials, after testing one dielectric material, the probe moving frame (21) drives the probe (22) to abut against another dielectric material for testing until all dielectric materials are tested; The test power supply is turned off; S4, the squeegee moving frame (31) drives the squeegee (32) to move along one side of the plane of the sample carrier plate (12) to the other side, and scrapes the tested dielectric materials into the insulating liquid tank (4); After or before the squeegee moving frame (31) works, the probe moving frame (21) drives the probe (22) to leave the insulating liquid tank (4), and the sample stage moving frame (11) drives the sample carrier plate (12) to move above the insulating liquid tank (4); S5, re-enter step S1 to perform cyclic automatic testing.

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