Test probe and manufacturing method for test probe

Abstract

The invention provides a test probe and a manufacturing method for the test probe. The test probe is characterized in that a limiting assembly is fixedly connected to the top end of an outer tube, the limiting assembly is used for fixing a probe tail, the probe tail is installed on the inner surface of the limiting assembly, an adjusting disc is installed on the outer surface of the probe tail, a butt joint bolt is installed at the bottom end of the probe tail through an installation assembly, and the butt joint bolt is connected with the limiting assembly. The mounting assembly comprises a supporting disc, a clamping part and an insertion structure, the supporting disc is used for connecting the clamping part with the needle tail, the clamping part is matched with the insertion structure to be used for enabling the butt joint bolt to be clamped in, and the bottom end of the butt joint bolt is fixedly connected with a testing spring. According to the test probe provided by the invention, through the design, the probes which are convenient to replace and different in model are adopted to replace a probe head to be in contact with a test structure, the damage of the probe head is reduced, the separable outer tube and the connecting assembly are adopted, the internal structure of the outer tube is convenient to replace, and the replacement difficulty after a test spring is damaged in the later period is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of test probes, and in particular, to a test probe and a manufacturing method for a test probe. Background Art

[0002] A test probe is an advanced precision electronic component used to test connectors on PCBA and FPC flexible boards. It is mainly applied to electronic products such as mobile phones and plays a connecting role. In electronic testing, by contacting the test probe with the test point, the performance parameters of PCBA, such as contact resistance, insulation resistance, withstand voltage performance, etc., can be tested.

[0003] In the field of semiconductor testing, test probes also play an important role. They are used in links such as chip design verification, wafer testing, and finished product testing. They are key components for connecting chips, wafers, and test equipment for signal transmission. Semiconductor test probes have advantages such as high current capacity, high-frequency transmission, and high-speed signal transmission, and play an important role in the quality control of semiconductor products. Due to the very fine size of semiconductor products, especially chip products, the requirements for test probes are extremely strict, including very strict standards for the gold plating thickness of the probe outer tube and the probe needle tip, as well as the spring material, etc. A test probe is composed of a gold-plated needle tip, a needle tail, a spring, and an outer tube.

[0004] However, the needle tip and the spring in the existing test probes are prone to damage during use, and the existing outer tube of the test probe is an integral part, which is inconvenient to replace after the needle tip or the spring is damaged, increasing the difficulty of later replacement.

[0005] Therefore, it is necessary to provide a test probe and a manufacturing method for a test probe to solve the above technical problems. Summary of the Invention

[0006] The present invention provides a test probe and a manufacturing method for a test probe, which solves the problems that the needle tip and the spring in the test probe are prone to damage during use and are inconvenient to replace after damage, increasing the replacement difficulty.

[0007] To solve the above technical problems, the test probe provided by the present invention includes: an outer tube;

[0008] Limit component, the limit component is fixedly connected to the top end of the outer tube, the limit component is used to fix the needle tail, the inner surface of the limit component is installed with the needle tail, the outer surface of the needle tail is installed with an adjustment disk, the bottom end of the needle tail is installed with a docking bolt through an installation component, the installation component includes a support disk, a clamping component and an insertion structure, the support disk is used to connect the clamping component and the needle tail, the clamping component and the insertion structure are used to allow the docking bolt to be clamped, the bottom end of the docking bolt is fixedly connected with a test spring, the bottom end of the test spring is installed with a docking component through the docking bolt, the docking component is used for the connection between the needle head and the test spring, the bottom of the docking component is fixedly connected with a needle head, the bottom end of the needle head is provided with a socket, the inside of the socket is installed with a plug, the bottom end of the plug is fixedly connected with an installation disk, and the bottom end of the installation disk is fixedly connected with a contact head through a connecting head;

[0009] Connection port, the connection port is opened at the position of the inner surface of the outer tube near the bottom end, the inner surface of the connection port is provided with a connection component, the connection component includes a docking disk, a docking component, a support component, a rotating component and a limiting component, the docking disk is used to install the docking component and the support component, the docking component is used to install the connection component on the inner surface of the outer tube, the support component is used to support the rotating component, and the rotating component is used to allow the limiting component to rotate inside the outer tube;

[0010] The installation component, the docking bolt and the docking component are made of the same material as the needle head, the needle tail and the test spring. The probe is composed of the plug, the installation disk, the connecting head and the contact head.

[0011] Preferably, a plurality of limiting strips are installed at the position of the inner surface of the outer tube near the top, a plurality of card slots are opened on the outer surface of the adjustment disk, and a partition ring is installed at the bottom end of the adjustment disk;

[0012] The cooperation of the limiting strip and the card slot can prevent the adjustment disk from rotating. The position of the card slot refers to Figure 4 .

[0013] Preferably, a plurality of limiting holes are opened at the top end of the adjustment disk, and through holes are opened at the bottom ends of the adjustment disk and the limiting component;

[0014] The through hole is for the convenience of the needle head to pass through.

[0015] Preferably, a plurality of auxiliary components are installed at the bottom end of the adjustment disk, and the auxiliary components include auxiliary parts and connecting parts;

[0016] The bottom ends of the auxiliary components are connected to the top ends of the limiting components, and the auxiliary components are evenly distributed at the bottom end of the adjustment disk.

[0017] Preferably, the connecting part is used to install the auxiliary part between the adjustment disk and the limiting component, and the auxiliary part is used to assist the expansion and contraction of the test spring;

[0018] The auxiliary component can be a spring or a structure with elastic force.

[0019] Preferably, the limiting component includes a contact component and a fixing component. The contact component is used to sleeve on the outer surface of the needle tail, and the fixing component is installed on the outer surface of the contact component to fix the needle tail in the contact component;

[0020] Both the contact component and the fixing component are made of insulating materials. The fixing component can be a bolt or a bolt, and the contact component can be a ring.

[0021] Preferably, a fixing ring with a plurality of fixing pieces is installed on the outer surface of the outer tube, and mounting holes are provided at the tops of the fixing pieces.

[0022] Preferably, a monitoring component is installed on the outer surface of the needle tail. The monitoring component includes a mounting component and a monitoring component. The mounting component is used to mount the monitoring component on the outer surface of the needle tail, and the monitoring component is a sensor that can monitor the working state of the test probe;

[0023] The monitoring component can be sensors for temperature, voltage, current, and force.

[0024] Preferably, a connector is fixedly connected to the top of the needle tail, and a docking port is provided at the top of the connector.

[0025] A manufacturing method of a test probe includes the following steps:

[0026] The first step: First, select the materials for making the needle tail, test spring, needle tip, and the probe composed of a plug, mounting disc, connector, and contact head, as well as some auxiliary structures according to the usage purpose of the test probe. In this process, select appropriate materials according to the measurement principle. If it is a sensitive element material, corresponding sensitive materials can be selected. For example, when making a thermocouple for a temperature probe, materials such as copper, constantan, nickel-chromium, and nickel-silicon can be selected. When making a piezoresistive element for a pressure probe, semiconductor materials such as single-crystal silicon can be used. If it is a mechanical structure material, materials with good mechanical strength, wear resistance, and corrosion resistance are usually selected, such as stainless steel and aluminum alloy for making the outer shell of the probe, and insulating materials with good insulation performance such as ceramics and polytetrafluoroethylene as insulating components. For the wire and connection materials, copper or silver-plated copper with good electrical conductivity is selected as the wire material, and metal plugs, sockets, etc. can be used as connection components to ensure the reliability of electrical connection;

[0027] Step 2: According to different usage purposes, use 3D software to design the 3D model of the test probe, determine the external dimensions, internal structure layout, connection method, insulation design, etc. of the probe. After the design is completed, only need to use lithography and etching or machining, precision grinding and 3D printing according to the requirements of the prepared materials to make the middle pin tail, test spring, needle tip, and the probe composed of a plug, mounting plate, connector and contact head, as well as the auxiliary structure. In this process, lithography and etching are applicable to the production of sensitive element test probes, while machining, precision grinding and 3D printing are applicable to the processing of mechanical structure test probes;

[0028] Step 3: Gold-plate the made pin tail, test spring, needle tip, the probe composed of a plug, mounting plate, connector and contact head, as well as some auxiliary structures through the decoration process to increase wear resistance and improve electrical conductivity. In this process, it is necessary to conduct a preliminary inspection on the appearance of the pin tail, test spring, needle tip, the probe composed of a plug, mounting plate, connector and contact head, as well as some auxiliary structures;

[0029] Step 4: After completing the preliminary appearance inspection, only need to assemble the pin tail and the adjustment disk, connect the test spring to the pin tail through the mounting component, install the needle tip and the connection component at the same time, so that the needle tip can move up and down in the connection component, and connect the needle tip to the bottom end of the test spring through the docking component. After completion, only need to insert the pin tail into the limit component at the top end of the outer tube, and align the adjustment disk with the limit bar. Then, the connection component can be installed at the bottom end of the outer tube through the connection port. After the connection component is installed, the pin tail can be fixed through the limit component first, connect the corresponding type of probe and the needle tip, and use the test equipment to test the assembled test probe. During the test process, the position of the adjustment disk can be adjusted by loosening the limit component according to the requirements to improve the accuracy of the test data. After adjustment, the test probe can be used normally.

[0030] Compared with the related technology, the test probe and the manufacturing method for the test probe provided by the present invention have the following beneficial effects:

[0031] The present invention provides a test probe. To facilitate the replacement of the needle tip and the test spring in the test probe after damage, a connection port is opened at the bottom end of the inner wall of the outer tube. Then, an adjustment disc is installed inside the outer tube near the top. The adjustment disc is installed on the outer surface of the needle tail. At the same time, the adjustment disc adjusts its position along with the position of the needle tail. And after the needle tail is adjusted to the corresponding position, it is fixed by a limiting component. By adjusting the position of the adjustment disc, the movement range of the test spring can be adjusted. A connection component is installed at the bottom end of the outer tube. After the connection component is removed, it is convenient to replace the internal structure of the outer tube. At the bottom end of the needle tip, a probe composed of a plug, a mounting disc, a connection head, and a contact head is installed through a socket. The probe contacts the test position. If it is damaged, it is convenient to replace. Through this design, probes that are easy to replace and of different models are used to replace the needle tip to contact the test structure, reducing the damage of the needle tip. And the separable outer tube and connection component are adopted, which is convenient to replace the internal structure of the outer tube and reduces the difficulty of replacing the test spring after damage in the later stage. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 FIG. 6 is a schematic structural diagram of a preferred embodiment of the test probe provided by the present invention;

[0033] Figure 2 FIG. 10 is a schematic structural diagram of the auxiliary component provided by the present invention;

[0034] Figure 3 FIG. 14 is a schematic structural diagram of the connection component provided by the present invention;

[0035] Figure 4 FIG. 18 is provided by the present invention Figure 2 The enlarged view of the position A shown in FIG. 20;

[0036] Figure 5 FIG. 24 is provided by the present invention Figure 2 The enlarged view of the position B shown in FIG. 26;

[0037] Figure 6 FIG. 30 is provided by the present invention Figure 2 The enlarged view of the position C shown in FIG. 32.

[0038] Reference numerals in the figure: 1, outer tube; 2, monitoring component; 201, mounting component; 202, monitoring component; 3, connector; 4, mating interface; 5, needle tail; 6, limiting component; 601, contact component; 602, fixing component; 7, fixing ring; 8, mounting hole; 9, fixing piece; 10, needle head; 11, connector; 12, contact head; 13, mounting disc; 14, connecting component; 141, docking disc; 142, docking component; 143, supporting component; 144, rotating component; 145, limiting component; 15, docking component; 16, plug; 17, partition ring; 18, test spring; 19, limiting strip; 20, docking bolt; 21, mounting component; 211, supporting disc; 212, clamping component; 213, inserting structure; 22, auxiliary component; 221, auxiliary component; 222, connecting component; 23, connecting port; 24, socket; 25, through hole; 26, adjusting disc; 27, card slot; 28, limiting hole. Detailed implementation mode

[0039] The present invention will be further described below in conjunction with the accompanying drawings and implementation modes.

[0040] Please refer to Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 and Figure 6 , wherein, Figure 1 is a schematic structural diagram of a preferred embodiment of the test probe provided by the present invention; Figure 2 is a schematic structural diagram of the auxiliary component provided by the present invention; Figure 3 is a schematic structural diagram of the connecting component provided by the present invention; Figure 4 is a magnified view of the place marked A shown in Figure 2 provided by the present invention; Figure 5 is a magnified view of the place marked B shown in Figure 2 provided by the present invention; Figure 6 is a magnified view of the place marked C shown in Figure 2 provided by the present invention. The test probe includes: outer tube 1;

[0041] The limiting component 6 is fixedly connected to the top end of the outer tube 1. The limiting component 6 is used to fix the needle tail 5. The inner surface of the limiting component 6 is provided with the needle tail 5. The outer surface of the needle tail 5 is provided with an adjusting disc 26. The bottom end of the needle tail 5 is provided with a docking bolt 20 through the mounting component 21. The mounting component 21 includes a support disc 211, a clamping component 212 and an insertion structure 213. The support disc 211 is used to connect the clamping component 212 to the needle tail 5. The clamping component 212 and the insertion structure 213 cooperate to allow the docking bolt 20 to be inserted. The bottom end of the docking bolt 20 is fixedly connected to a test spring 18. The bottom end of the test spring 18 is provided with a docking component 15 through the docking bolt 20. The docking component 15 is used for the connection between the needle head 10 and the test spring 18. The bottom of the docking component 15 is fixedly connected to the needle head 10. The bottom end of the needle head 10 is provided with a socket 24. The inside of the socket 24 is provided with a plug 16. The bottom end of the plug 16 is fixedly connected to a mounting disc 13. The bottom end of the mounting disc 13 is fixedly connected to a contact head 12 through a connecting head 11;

[0042] The connection port 23 is opened at the position of the inner surface of the outer tube 1 at the bottom end. The inner surface of the connection port 23 is provided with a connection component 14. The connection component 14 includes a docking disc 141, a docking component 142, a support component 143, a rotating component 144 and a limiting component 145. The docking disc 141 is used to mount the docking component 142 and the support component 143. The docking component 142 is used to mount the connection component 14 on the inner surface of the outer tube 1. The support component 143 is used to support the rotating component 144. The rotating component 144 is used to allow the limiting component 145 to rotate inside the outer tube 1;

[0043] The materials of the mounting component 21, the docking bolt 20 and the docking component 15 are the same as those of the needle head 10, the needle tail 5 and the test spring 18. The probe composed of the plug 16, the mounting disc 13, the connecting head 11 and the contact head 12. The limiting component 145 plays a limiting role on the needle head 10, allowing it to move only up and down, and preventing the top end of the needle head 10 from slipping out of the bottom end of the outer tube 1. The shape of the limiting component 145 is similar to that of the adjusting disc 26. The docking component 142 can be an external threaded tube or a structure convenient for disassembly.

[0044] A plurality of limiting strips 19 are installed at the position of the inner surface of the outer tube 1 near the top. A plurality of card slots 27 are opened on the outer surface of the adjusting disc 26. A partition ring 17 is installed at the bottom end of the adjusting disc 26;

[0045] The cooperation between the limiting strips 19 and the card slots 27 can prevent the adjusting disc 26 from rotating. The position of the card slots 27 refers to Figure 4 , and the partition ring 17 is located between the auxiliary component 221 and the test spring 18. The partition ring 17 plays an anti-interference role.

[0046] A plurality of limiting holes 28 are provided at the top end of the adjusting disc 26, and through holes 25 are provided at the bottom ends of both the adjusting disc 26 and the limiting member 145;

[0047] The through hole 25 facilitates the penetration of the needle 10. The limiting hole 28 penetrates the bottom end of the adjusting disc 26, and limiting holes 28 are also provided at the top of the limiting member 145.

[0048] A plurality of auxiliary components 22 are installed at the bottom end of the adjusting disc 26. The auxiliary components 22 include auxiliary members 221 and connecting members 222;

[0049] The bottom ends of the auxiliary components 22 are connected to the top end of the limiting member 145, and the auxiliary components 22 are evenly distributed at the bottom end of the adjusting disc 26.

[0050] The connecting member 222 is used to install the auxiliary member 221 between the adjusting disc 26 and the limiting member 145, and the auxiliary member 221 is used to assist the expansion and contraction of the test spring 18;

[0051] The auxiliary member 221 can be a spring or a structure with elasticity, and the connecting member 222 is snapped into the limiting hole 28.

[0052] The limiting component 6 includes a contact member 601 and a fixing member 602. The contact member 601 is used to sleeve the outer surface of the needle tail 5, and the fixing member 602 is installed on the outer surface of the contact member 601 to fix the needle tail 5 in the contact member 601;

[0053] Both the contact member 601 and the fixing member 602 are made of insulating materials. The fixing member 602 can be a bolt or a clip, and the contact member 601 can be a ring.

[0054] A fixing ring 7 with a plurality of fixing pieces 9 is installed on the outer surface of the outer tube 1, and mounting holes 8 are provided at the top ends of the fixing pieces 9;

[0055] The fixing pieces 9 and the fixing ring 7 facilitate fixing the outer tube 1 in the corresponding position.

[0056] A monitoring component 2 is installed on the outer surface of the needle tail 5. The monitoring component 2 includes a mounting component 201 and a monitoring component 202. The mounting component 201 is used to install the monitoring component 202 on the outer surface of the needle tail 5, and the monitoring component 202 is a sensor that can monitor the working state of the test probe;

[0057] The monitoring component 202 can be sensors for temperature, voltage, current, and force.

[0058] The top end of the needle tail 5 is fixedly connected to a connecting head 3, and a docking port 4 is provided at the top end of the connecting head 3;

[0059] It facilitates the connection of the needle tail 5 and the circuit of the corresponding device to the interface 4 and the connector 3.

[0060] A manufacturing method of a test probe includes the following steps:

[0061] The first step: First, select the materials for making the needle tail 5, the test spring 18, the needle tip 10, the probe composed of the plug 16, the mounting disc 13, the connector 11 and the contact head 12, and some auxiliary structures according to the usage purpose of the test probe. In this process, select the appropriate materials according to the measurement principle. If it is a sensitive element material, the corresponding sensitive materials can be selected. For example, when making a thermocouple for a temperature probe, materials such as copper, constantan, nickel-chromium, and nickel-silicon can be selected. When making a piezoresistive element for a pressure probe, semiconductor materials such as single-crystal silicon can be used. If it is a mechanical structure material, materials with good mechanical strength, wear resistance and corrosion resistance are usually selected, such as stainless steel and aluminum alloy for making the outer shell of the probe, and materials with good insulation performance such as ceramics and polytetrafluoroethylene are used as insulation components. For the wire and connection materials, copper or silver-plated copper with good electrical conductivity is selected as the wire material, and the connection components can use metal plugs, sockets, etc. to ensure the reliability of the electrical connection;

[0062] The second step: According to different usage purposes, use 3D software to design the 3D model of the test probe, determine the outer dimensions, internal structure layout, connection method, insulation design, etc. of the probe. After the design is completed, only need to use photolithography and etching or cutting processing, precision grinding and 3D printing methods to make the needle tail 5, the test spring 18, the needle tip 10, the probe composed of the plug 16, the mounting disc 13, the connector 11 and the contact head 12, and the auxiliary structures according to the requirements. In this process, photolithography and etching are suitable for the production of sensitive element test probes, while cutting processing, precision grinding and 3D printing are suitable for the processing of mechanical structure test probes;

[0063] The third step: Gold-plate the made needle tail 5, the test spring 18, the needle tip 10, the probe composed of the plug 16, the mounting disc 13, the connector 11 and the contact head 12, and some auxiliary structures through a decoration process to increase wear resistance and improve electrical conductivity. In this process, it is necessary to conduct a preliminary inspection on the appearance of the needle tail 5, the test spring 18, the needle tip 10, the probe composed of the plug 16, the mounting disc 13, the connector 11 and the contact head 12, and some auxiliary structures;

[0064] Step 4: After completing the preliminary visual inspection, only assemble the needle tail 5 with the adjustment disc 26, connect the test spring 18 to the needle tail 5 through the mounting component 21, and at the same time install the needle tip 10 with the connecting component 14 so that the needle tip 10 can move up and down in the connecting component 14. Then connect the needle tip 10 to the bottom end of the test spring 18 through the docking component 15. After completion, just insert the needle tail 5 into the limiting component 6 at the top end of the outer tube 1 and align the adjustment disc 26 with the limiting strip 19. Then the connecting component 14 can be installed at the bottom end of the outer tube 1 through the connection port 23. After the connecting component 14 is installed, the needle tail 5 can be fixed by the limiting component 6 first, and the probe of the corresponding model is connected to the needle tip 10. Then use the test equipment to test the assembled test probe. During the test, the position of the adjustment disc 26 can be adjusted by loosening the limiting component 6 according to the needs to improve the accuracy of the test data. The test probe after adjustment can be used normally.

[0065] The working principles of the test probe provided by the present invention and the manufacturing method for the test probe are as follows:

[0066] A connection port 23 is opened at the bottom end of the inner wall of the outer tube 1, and then the adjustment disc 26 is installed inside the outer tube 1 near the top. The adjustment disc 26 is installed on the outer surface of the needle tail 5. At the same time, the adjustment disc 26 adjusts its position along with the position of the needle tail 5. After the needle tail 5 is adjusted to the corresponding position, it is fixed by the limiting component 6. By adjusting the position of the adjustment disc 26, the movement range of the test spring 18 can be adjusted. A connecting component 14 is installed at the bottom end of the outer tube 1. After the connecting component 14 is removed, it is convenient to replace the internal structure of the outer tube 1. At the bottom end of the needle tip 10, a probe composed of a plug 16, a mounting disc 13, a connecting head 11, and a contact head 12 is installed through a socket 24. When the probe contacts the test position, it is convenient to replace if damaged. During actual use, if the probe is damaged or other models of probes need to be replaced, just pull out the plug 16 to separate the needle tip 10 from the probe, and then insert the plug 16 on the new probe into the socket 24 again to complete the replacement. When the test spring 18 needs to be replaced due to insufficient springback, just remove the connecting component 14 to separate the docking component 15 on the needle tip 10 from the docking bolt 20 at the bottom end of the test spring 18. Then loosen the limiting component 6, and the adjustment disc 26 and the structure at the bottom of the needle tail 5 can be removed from the outer tube 1. After taking out, just separate the test spring 18 from the bottom of the mounting component 21 to replace the new test spring 18. Then for the installation and disassembly steps, first fix the needle tail 5, then connect the needle tip 10 on the connecting component 14 with the docking component 15 at the bottom end of the test spring 18, and connect the connecting component 14 with the bottom end of the outer tube 1 to complete the replacement.

[0067] Compared with the related technologies, the test probe and the manufacturing method thereof provided by the present invention have the following beneficial effects:

[0068] In order to facilitate the replacement of the needle head 10 and the test spring 18 in the test probe after damage, a connection port 23 is provided at the bottom end of the inner wall of the outer tube 1. Then, the adjustment disc 26 is installed at a position near the top inside the outer tube 1, and the adjustment disc 26 is installed on the outer surface of the needle tail 5. At the same time, the adjustment disc 26 adjusts its position along with the position of the needle tail 5, and the needle tail 5 is fixed by the limiting component 6 after adjusting to the corresponding position. By adjusting the position of the adjustment disc 26, the moving range of the test spring 18 can be adjusted. A connection component 14 is installed at the bottom end of the outer tube 1. After the connection component 14 is removed, it is convenient to replace the internal structure of the outer tube 1. A probe composed of a plug 16, a mounting disc 13, a connection head 11, and a contact head 12 is installed at the bottom end of the needle head 10 through a socket 24. By contacting the test position with the probe, it is convenient to replace in case of damage. Through this design, probes that are easy to replace and of different models are used to replace the needle head 10 to contact the test structure, reducing the damage of the needle head 10. And by using the separable outer tube 1 and the connection component 14, it is convenient to replace the internal structure of the outer tube 1, reducing the difficulty of replacing the test spring 18 in case of damage later.

[0069] The above are only the embodiments of the present invention, and do not limit the patent scope of the present invention accordingly. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, shall be equally included in the patent protection scope of the present invention.

Claims

1. A test probe, characterized in that, Comprising: Outer tube; Limit component, the limit component is fixedly connected to the top end of the outer tube, the limit component is used to fix the needle tail, the inner surface of the limit component is provided with the needle tail, the outer surface of the needle tail is provided with an adjustment disc, the bottom end of the needle tail is installed with a docking bolt through an installation component, the installation component includes a support disc, a clamping component and an insertion structure, the support disc is used to connect the clamping component with the needle tail, and the clamping component cooperates with the insertion structure to allow the docking bolt to be clamped. The bottom end of the docking bolt is fixedly connected with a test spring, the bottom end of the test spring is installed with a docking component through the docking bolt, the docking component is used for the connection between the needle head and the test spring, the bottom of the docking component is fixedly connected with a needle head, the bottom end of the needle head is provided with a socket, a plug is installed inside the socket, the bottom end of the plug is fixedly connected with a mounting disc, and the bottom end of the mounting disc is fixedly connected with a contact head through a connecting head; Connection port, the connection port is opened on the inner surface of the outer tube at the bottom position, and a connection component is arranged on the inner surface of the connection port. The connection component includes a docking disc, a docking component, a support component, a rotating component and a limiting component. The docking disc is used to install the docking component and the support component. The docking component is used to install the connection component on the inner surface of the outer tube. The support component is used to support the rotating component. The rotating component is used to allow the limiting component to rotate inside the outer tube.

2. The test probe according to claim 1, wherein A plurality of limiting strips are installed on the inner surface of the outer tube near the top, a plurality of card slots are opened on the outer surface of the adjustment disc, and a partition ring is installed at the bottom end of the adjustment disc.

3. The test probe according to claim 1, wherein A plurality of limiting holes are opened at the top end of the adjustment disc, and through holes are opened at the bottom ends of the adjustment disc and the limiting component.

4. The test probe according to claim 1, wherein A plurality of auxiliary components are installed at the bottom end of the adjustment disc, and the auxiliary components include an auxiliary part and a connecting part.

5. The test probe according to claim 4, wherein The connecting part is used to install the auxiliary part between the adjustment disc and the limiting component, and the auxiliary part is used to assist the expansion and contraction of the test spring.

6. The test probe according to claim 1, wherein The limit component includes a contact part and a fixing part. The contact part is used to sleeve on the outer surface of the needle tail, and the fixing part is installed on the outer surface of the contact part to fix the needle tail in the contact part.

7. The test probe according to claim 1, characterized in that, A fixing ring with a plurality of fixing pieces is installed on the outer surface of the outer tube, and mounting holes are opened at the top ends of the fixing pieces.

8. The test probe according to claim 1, characterized in that A monitoring component is installed on the outer surface of the needle tail. The monitoring component includes a mounting part and a monitoring part. The mounting part is used to install the monitoring part on the outer surface of the needle tail. The monitoring part is a sensor that can monitor the working state of the test probe.

9. The test probe according to claim 1, wherein The top end of the needle tail is fixedly connected with a connecting head, and a docking port is opened at the top end of the connecting head.

10. A manufacturing method of a test probe, characterized in that, Including the test probe according to any one of claims 1-9, the manufacturing method of the test probe is required during the manufacturing of the test probe, including the following steps: Step 1: First, select the materials for making the needle tail, test spring, needle tip in the test probe, the probe composed of a plug, mounting plate, connector and contact head, and some auxiliary structures according to the purpose of using the test probe. In this process, select appropriate materials according to the measurement principle. If it is a sensitive element material, the corresponding sensitive material can be selected. For example, when making a thermocouple for a temperature probe, materials such as copper, constantan, nickel-chromium, and nickel-silicon can be selected. When making a piezoresistive element for a pressure probe, semiconductor materials such as single-crystalline silicon can be used. If it is a mechanical structure material, materials with good mechanical strength, wear resistance and corrosion resistance are usually selected. For example, stainless steel and aluminum alloy are used to make the outer shell of the probe, and materials with good insulation performance such as ceramics and polytetrafluoroethylene are used as insulation components. For wires and connection materials, copper or silver-plated copper with good electrical conductivity is selected as the wire material, and metal plugs, sockets, etc. can be used for connection components to ensure the reliability of electrical connection; Step 2: According to different usage purposes, use 3D software to design the 3D model of the test probe, determine the external dimensions, internal structure layout, connection method, insulation design, etc. of the probe. After the design is completed, only need to use lithography and etching or cutting processing, precision grinding and 3D printing methods to make the needle tail, test spring, needle tip, the probe composed of a plug, mounting plate, connector and contact head, and auxiliary structures according to the requirements. In this process, lithography and etching are suitable for making test probes of sensitive elements, while cutting processing, precision grinding and 3D printing are suitable for processing test probes of mechanical structures; Step 3: Gold-plate the made needle tail, test spring, needle tip, the probe composed of a plug, mounting plate, connector and contact head, and some auxiliary structures through a decoration process to increase wear resistance and improve electrical conductivity. In this process, it is necessary to conduct a preliminary inspection on the appearance of the needle tail, test spring, needle tip, the probe composed of a plug, mounting plate, connector and contact head, and some auxiliary structures; Step 4: After completing the preliminary appearance inspection, only need to assemble the needle tail and the adjustment disc, connect the test spring to the needle tail through the mounting component, install the needle tip and the connection component at the same time, so that the needle tip can move up and down in the connection component, and connect the needle tip to the bottom end of the test spring through the docking component. After completion, only need to insert the needle tail into the limit component at the top end of the outer tube, and align the adjustment disc with the limit strip. Then, the connection component can be installed at the bottom end of the outer tube through the connection port. After the connection component is installed, the needle tail can be fixed through the limit component first, connect the corresponding type of probe and needle tip, and use the test equipment to test the assembled test probe. During the test, the position of the adjustment disc can be adjusted by loosening the limit component according to the requirements to improve the accuracy of the test data. After adjustment, the test probe can be used normally.

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