Image processing apparatus, image processing method, chip, and electronic device

Abstract

The invention discloses an image processing device, an image processing method, a chip and electronic equipment, and belongs to the technical field of testing. The image processing device comprises a mode test generator and a first storage module, and the first storage module is connected with the mode test generator. The first storage module is used for storing image configuration information, and the image configuration information is used for describing information that the multiple frames of test images change in at least one aspect of color or position in the process of generating the multiple frames of test images; and the mode test generator is used for reading the image configuration information from the first storage module and generating multiple frames of test images according to the image configuration information. The test image can be controlled to change automatically through the image configuration information, and the test efficiency is improved.

Description

Technical Field

[0001] Embodiments of the present application relate to the field of testing technologies, and particularly to an image processing device, an image processing method, a chip, and an electronic device. Background Art

[0002] In the field of testing technologies, testing based on test images is a common method. Optionally, a test image is generated by a Pattern Test Generator (PTG). During the testing process, testers often need to manually adjust the test images generated by the PTG, which affects the testing efficiency. Summary of the Invention

[0003] The present application provides an image processing device, an image processing method, a chip, and an electronic device, which can be used to solve the problems in the related technologies. The technical solutions include the following.

[0004] On the one hand, an image processing device is provided. The device includes a pattern test generator and a first storage module, and the first storage module is connected to the pattern test generator;

[0005] The first storage module is used to store image configuration information, and the image configuration information is used to describe information about at least one aspect of color or position changing in the process of generating multiple frames of test images;

[0006] The pattern test generator is used to read the image configuration information from the first storage module and generate the multiple frames of test images according to the image configuration information.

[0007] In a possible implementation manner, the device further includes a second storage module, and the second storage module is connected to the pattern test generator;

[0008] The second storage module is used to store enable information, and the enable information represents whether to enable the dynamic image mode;

[0009] The pattern test generator is used to read the enable information from the second storage module, and in the case where the enable information represents enabling the dynamic image mode, read the image configuration information from the first storage module.

[0010] In a possible implementation manner, the first storage module includes a color storage unit, the image configuration information includes color configuration information, and the color configuration information is used to describe information about color changing in the process of generating the multiple frames of test images;

[0011] The color storage unit is configured to store the color configuration information;

[0012] The pattern test generator is configured to read the color configuration information from the color storage unit and generate the multi-frame test images according to the color configuration information.

[0013] In a possible implementation, the color configuration information includes at least one of a first parameter, a second parameter, or a third parameter. The first parameter represents the number of frames of the test images through which a single change occurs in terms of color. The second parameter represents the number of cyclic changes that occur in terms of color. The third parameter represents the amount of color change that occurs for a single change in terms of color.

[0014] In a possible implementation, the first storage module includes a position storage unit, and the image configuration information includes position configuration information. The position configuration information is used to describe information about the change in the display position of the multi-frame test images on the display panel during the generation of the multi-frame test images;

[0015] The position storage unit is configured to store the position configuration information;

[0016] The pattern test generator is configured to read the position configuration information from the position storage unit and control the display of the multi-frame test images at the corresponding positions on the display panel according to the position configuration information.

[0017] In a possible implementation, the position configuration information includes at least one of a fourth parameter, a fifth parameter, a sixth parameter, or a seventh parameter. The fourth parameter represents the number of frames of the test images through which a single change occurs in terms of the display position on the display panel. The fifth parameter represents the number of frames of the test images through which a single cyclic change occurs in terms of position. The sixth parameter represents the amount of position change that occurs for a single change in terms of position. The seventh parameter represents at least one of the display position of the first frame of the test images or the display position of the last frame of the test images on the display panel when a cyclic change occurs in terms of position.

[0018] In a possible implementation, the device further includes a third storage module, and the third storage module is connected to the pattern test generator;

[0019] The third storage module is configured to store at least two type identifiers, and the type identifiers are used to indicate an image type;

[0020] The pattern test generator is configured to read the type identifier for indicating the image type of the test images from the third storage module and generate multi-frame test images of the image type indicated by the type identifier according to the image configuration information.

[0021] On the other hand, an image processing method is provided, and the method includes:

[0022] Reading image configuration information, where the image configuration information is used to describe information about at least one aspect of color or position that changes among multiple frames of test images during the generation of the multiple frames of test images;

[0023] Generating the multiple frames of test images according to the image configuration information.

[0024] In a possible implementation, the reading of the image configuration information includes:

[0025] Reading enable information, where the enable information indicates whether to enable the dynamic image mode;

[0026] When the enable information indicates that the dynamic image mode is enabled, reading the image configuration information.

[0027] In a possible implementation, the image configuration information includes color configuration information, where the color configuration information is used to describe information about color changes among the multiple frames of test images during the generation of the multiple frames of test images;

[0028] The reading of the image configuration information includes:

[0029] Reading the color configuration information;

[0030] The generating of the multiple frames of test images according to the image configuration information includes:

[0031] Generating the multiple frames of test images according to the color configuration information.

[0032] In a possible implementation, the color configuration information includes at least one of a first parameter, a second parameter, or a third parameter. The first parameter represents the number of frames of test images passed through for one color change, the second parameter represents the number of cycles of color change, and the third parameter represents the amount of color change for one color change.

[0033] In a possible implementation, the image configuration information includes position configuration information, where the position configuration information is used to describe information about changes in the display position of the multiple frames of test images on the display panel during the generation of the multiple frames of test images;

[0034] The reading of the image configuration information includes:

[0035] Reading the position configuration information;

[0036] Generating the multiple frames of test images according to the image configuration information includes:

[0037] Controlling the multiple frames of test images to be displayed at the corresponding positions on the display panel according to the position configuration information.

[0038] In a possible implementation manner, the position configuration information includes at least one of a fourth parameter, a fifth parameter, a sixth parameter, or a seventh parameter. The fourth parameter represents the number of frames of test images passed through when there is a change in the display position on the display panel. The fifth parameter represents the number of frames of test images passed through when there is a cyclic change in the position. The sixth parameter represents the amount of position change when there is a change in the position. The seventh parameter represents at least one of the display position of the first frame of test image or the display position of the last frame of test image on the display panel when there is a cyclic change in the position.

[0039] In a possible implementation manner, generating the multiple frames of test images according to the image configuration information includes:

[0040] Reading a type identifier for indicating the image type of the test image;

[0041] Generating multiple frames of test images of the image type indicated by the type identifier according to the image configuration information.

[0042] On the other hand, a chip is provided, and the chip includes the above-mentioned image processing device.

[0043] On the other hand, an electronic device is provided, and the electronic device includes the above-mentioned chip.

[0044] The technical solution provided by this application at least brings the following beneficial effects:

[0045] In the technical solution provided by this application, the pattern test generator can read the image configuration information from the first storage module and generate multiple frames of test images according to the image configuration information, so that the multiple frames of test images change in at least one of color or position. Controlling the test images to automatically change through the image configuration information without manual adjustment by the tester can greatly improve the test efficiency and can adapt to complex test scenarios, improving the flexibility of the test. Description of the Drawings

[0046] In order to more clearly illustrate the technical solutions in the embodiments of this application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of this application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0047] Figure 1 It is a schematic diagram of an image processing device provided by an embodiment of the present application;

[0048] Figure 2 It is a schematic diagram of a test image whose color has changed provided by an embodiment of the present application;

[0049] Figure 3 It is a schematic diagram of a test image whose position has changed provided by an embodiment of the present application;

[0050] Figure 4 It is a flowchart of an image processing method provided by an embodiment of the present application;

[0051] Figure 5 It is a schematic structural diagram of a chip provided by an embodiment of the present application;

[0052] Figure 6 It is a schematic structural diagram of an electronic device provided by an embodiment of the present application. Detailed implementation manners

[0053] To make the objectives, technical solutions, and advantages of the present application clearer, the following will further describe the embodiments of the present application in detail with reference to the accompanying drawings.

[0054] It should be noted that the terms "first", "second", etc. in the present application are used to distinguish similar objects, and do not necessarily need to describe a specific order or sequence. It should be understood that such terms can be interchanged under appropriate circumstances so that the embodiments of the present application described here can be implemented in an order other than those illustrated or described here. The implementation manners described in the following exemplary embodiments do not represent all implementation manners consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0055] An embodiment of the present application provides an image processing device. As Figure 1As shown in the figure, the image processing device 10 includes a Pattern Test Generator (PTG) 101 and a first storage module 102. The first storage module 102 is connected to the pattern test generator 101. Among them, the pattern test generator 101 is a device for generating test images. Generally, test images are standard images in the field of test technology. For example, solid color images, color bar images, checkerboard images, etc. all belong to standard images. In the field of test technology, the test images generated by the pattern test generator 101 can be displayed on a display panel to evaluate the quality of the display panel based on the display effect of the test images. The first storage module 102 is a device for storing data, and its type is not limited here. For example, the first storage module 102 includes at least one register, or the first storage module 102 is a storage space in a memory.

[0056] Among them, the first storage module 102 is used to store image configuration information, and the image configuration information is used to describe the information in which at least one of the color or position of multiple frames of test images changes during the generation of multiple frames of test images.

[0057] In the field of test technology, a configuration interface of the test image can be displayed on a display panel, so that testers can perform configuration operations on the test image on the configuration interface according to the requirements of the test scenario. In this example, the tester can configure the information in which at least one of the color or position of multiple frames of test images changes on the configuration interface to obtain the image configuration information. For example, when the test image is a solid color image, the tester can configure the information in which the color of multiple frames of test images changes on the configuration interface, so that the image configuration information can represent that when generating multiple frames of test images, the colors of these test images change in the order of red, blue, green, white, and black. The first storage module 102 can obtain and store the image configuration information.

[0058] The pattern test generator 101 is used to read the image configuration information from the first storage module 102 and generate multiple frames of test images according to the image configuration information.

[0059] Since the pattern test generator 101 is connected to the first storage module 102, the pattern test generator 101 can directly read the image configuration information from the first storage module 102 and generate multiple frames of test images according to the image configuration information. Since the image configuration information is used to describe the information in which at least one of the color or position of multiple frames of test images changes during the generation of multiple frames of test images, at least one of the color or position of the multiple frames of test images generated by the pattern test generator 101 will change, and the change mode of the generated test images conforms to the change mode described by the image configuration information.

[0060] In an exemplary embodiment, the image processing apparatus 10 further includes a third storage module, and the third storage module is connected to the pattern test generator 101. Among them, the third storage module is used to store at least two type identifiers, and the type identifier is used to indicate an image type; the pattern test generator 101 is used to read from the third storage module the type identifier indicating the image type of the test image, and generate multiple frames of test images of the image type indicated by the type identifier according to the image configuration information.

[0061] The third storage module is a device for storing data, and its type is not limited here. For example, the third storage module may include at least one register, or the third storage module may be a storage space in a memory.

[0062] In the embodiment of the present application, when there is at least one type of test image, each image type corresponds to a type identifier, and different image types correspond to different type identifiers, so that each type identifier can indicate a unique image type. The type identifier includes at least one of numbers, letters, symbols, etc. Exemplarily, the test images include five types of images: an image with gradually increasing brightness, an image with gradually decreasing brightness, a random image (the pixel value of each pixel point in the image is a randomly determined value), a checkerboard image, and a color bar image. Among them, the type identifier "0" indicates an image with gradually increasing brightness, the type identifier "1" indicates an image with gradually decreasing brightness, the type identifier "2" indicates a random image, the type identifier "3" indicates a checkerboard image, and the type identifier "4" indicates a color bar image.

[0063] The third storage module stores each type identifier. Since the third storage module is connected to the pattern test generator 101, the pattern test generator 101 can directly read a certain type identifier from the third storage module. Optionally, the pattern test generator 101 randomly reads a type identifier from the third storage module. Or, the pattern test generator 101 reads the default type identifier from the third storage module. Or, each type identifier is displayed through a display panel, and a tester selects a type identifier from each type identifier. Based on the selection operation of the tester, the pattern test generator 101 reads the category identifier selected by the selection operation from the third storage module. Then, the pattern test generator 101 generates multiple frames of test images, and the image type of each frame of test image is the image type indicated by the type identifier read by the pattern test generator 101.

[0064] For example, the third storage module may store type identifiers from "0" to "4". The pattern test generator 101 reads the type identifier "2" from the third storage module. Assuming that the type identifier "2" indicates a random image, the pattern test generator 101 generates multiple frames of random images.

[0065] By selecting a type identifier from various type identifiers stored in the third storage module through a pattern test generator and generating a test image corresponding to this type identifier, it is possible to flexibly generate different types of test images to adapt to complex test scenarios and improve the flexibility of testing.

[0066] In an exemplary embodiment, the image processing apparatus 10 further includes a second storage module, and the second storage module is connected to the pattern test generator 101. Among them, the second storage module is used to store enable information, and the enable information represents whether to enable the dynamic image mode; the pattern test generator 101 is used to read the enable information from the second storage module, and in the case where the enable information represents enabling the dynamic image mode, read the image configuration information from the first storage module.

[0067] The second storage module is a device for storing data, and its type is not limited here. For example, the second storage module may include at least one register, or the second storage module may be a storage space in a memory.

[0068] The second storage module stores enable information, and the enable information is used to represent whether to enable the dynamic image mode. Among them, if the enable information is a first value, the enable information represents enabling the dynamic image mode; if the enable information is a second value, the enable information represents not enabling the dynamic image mode. The first value and the second value are different values. For example, the first value is 1 and the second value is 0. In actual applications, the enable information may be a default value. For example, the default enable information is the second value. Or, an input box for configuring the enable information is displayed through a display panel, and a tester can input the enable information in the input box according to the requirements of the test scenario.

[0069] Since the second storage module is connected to the pattern test generator 101, the pattern test generator 101 can directly read the enable information from the second storage module. If the enable information is a first value, the enable information represents enabling the dynamic image mode. In this case, the pattern test generator 101 reads the image configuration information from the first storage module 102 and generates multiple frames of test images according to the image configuration information. Since the multiple frames of test images generated according to the image configuration information change in at least one aspect of color or position, the test images have the visual effect of dynamic images, thus meeting the requirement of enabling the dynamic image mode. If the enable information is a second value, the enable information represents not enabling the dynamic image mode. In this case, the pattern test generator 101 directly generates multiple frames of test images. Since the multiple frames of test images do not change, the test images have the visual effect of static images, thus meeting the requirement of not enabling the dynamic image mode.

[0070] By enabling information to control whether to enable the dynamic image mode, it is possible to flexibly select a static test image or a dynamic test image according to the test scenario to adapt to complex test scenarios and improve the flexibility of testing.

[0071] In a possible implementation manner, the first storage module 102 includes a color storage unit, the image configuration information includes color configuration information, and the color configuration information is used to describe information about color changes in multiple frames of test images during the generation of the multiple frames of test images. The color storage unit is used to store the color configuration information; the mode test generator 101 is used to read the color configuration information from the color storage unit and generate multiple frames of test images according to the color configuration information.

[0072] The color storage unit is a device for storing data, and its type is not limited here. For example, the color storage unit may include at least one register, or the color storage unit may be a storage space in a memory.

[0073] The color storage unit stores the color configuration information. In actual applications, a configuration interface for the test image may be displayed through a display panel, so that testers can perform configuration operations on the test image on the configuration interface according to the requirements of the test scenario. By configuring the information about color changes in multiple frames of test images by the tester on the configuration interface, the color configuration information is obtained. For example, the color configuration information may describe that when generating multiple frames of test images, the color of the test image changes in the order of red, blue, green, white, and black.

[0074] Optionally, the color configuration information includes at least one of a first parameter, a second parameter, or a third parameter. These parameters are introduced in detail below.

[0075] The first parameter represents the number of frames of test images passed through for one color change. The embodiments of the present application do not limit the value of the first parameter. The tester can flexibly configure the value of the first parameter according to the test scenario. Optionally, the value of the first parameter is N, where N is any positive integer. For example, N can take any value from 1 to 1023. When the value of the first parameter is N, it means that during the process of the mode test generator 101 generating multiple frames of test images, the color of the test image changes once every N frames. For example, when N = 3, the colors of the first - 3 frames of test images generated by the mode test generator 101 are all red, the colors of the 4 - 6 frames of test images generated are all green, and the colors of the 7 - 9 frames of test images generated are all blue.

[0076] The second parameter characterizes the number of cyclic changes in terms of color. Testers can flexibly configure the value of the second parameter according to the test scenario. Optionally, the value of the second parameter is M, where M is 0 or any positive integer. For example, the value of the second parameter is any one of 0 to 1023. The value of the second parameter being M indicates that during the process of the pattern test generator 101 generating multiple frames of test images, the color of the test images needs to undergo M cyclic changes. Among them, when M = 0, the color of the test images undergoes 0 cyclic changes, which is equivalent to the color of the test images not undergoing cyclic changes.

[0077] The third parameter characterizes the color change amount for one color change in terms of color. Since the test image corresponds to the horizontal direction (i.e., the x - direction) and the vertical direction (i.e., the y - direction), and the test image corresponds to at least one channel. For example, the test image corresponds to the R channel, the G channel, and the B channel, or the test image corresponds to the Y channel, the U channel, and the V channel. Therefore, the third parameter can include at least one parameter, and one parameter characterizes the color change amount on at least one item in one direction or one channel each time the test image undergoes a color change. It can be understood that different parameters correspond to different directions and / or different channels. For example, the third parameter includes two parameters, one parameter characterizes the color change amount on the horizontal direction and the R channel each time the test image undergoes a color change, and the other parameter characterizes the color change amount on the vertical direction each time the test image undergoes a color change.

[0078] In practical applications, different parameters can be stored in different registers. That is to say, the color storage unit includes at least one register, and each register is used to store one parameter in the color configuration information.

[0079] Since the pattern test generator 101 is connected to the color storage unit, the pattern test generator 101 can directly read the color configuration information from the color storage unit and generate multiple frames of test images according to the color configuration information. Since the color configuration information is used to describe the information about the color changes of multiple frames of test images, the multiple frames of test images generated by the pattern test generator 101 will change in terms of color, and the change manner is consistent with the change manner described by the color configuration information. For example, if the color configuration information describes that the color of the test image changes from red to blue and then to green, the pattern test generator 101 first generates a red test image, then generates a blue test image, and then generates a green test image.

[0080] A possible implementation is shown below. In this example, the third storage module includes a pattern_sel register for storing type identifiers from "0" to "4". The pattern test generator 101 can read a type identifier from the pattern_sel register and generate a test image of the image type indicated by the type identifier. The second storage module includes a dynamic_en register for storing enable information. The pattern test generator 101 can read the enable information from the dynamic_en register. If the enable information is 1 (indicating that the dynamic image mode is enabled), the pattern test generator 101 reads color configuration information from the color storage unit of the first storage module 102 and generates multiple frames of test images based on the color configuration information. If the enable information is 0 (indicating that the dynamic image mode is not enabled), the pattern test generator 101 directly generates multiple frames of test images.

[0081] The color storage unit includes a step_frame_num register, a loop_frame_num register, a vinc_inc_color_y register, a vinc_inc_color_u register, a vinc_inc_color_v register, a hinc_inc_color_y register, a hinc_inc_color_u register, and a hinc_inc_color_v register. Among them, the step_frame_num register is used to store the first parameter, that is, the number of frames passed when the test image changes in color once. The loop_frame_num register is used to store the second parameter, that is, the number of times the test image changes cyclically in color. The vinc_inc_color_y register, the vinc_inc_color_u register, the vinc_inc_color_v register, the hinc_inc_color_y register, the hinc_inc_color_u register, and the hinc_inc_color_v register are used to store the third parameter, that is, the color change amount when the test image changes in color once.

[0082] Among them, the vinc_inc_color_y register is used to store the color change amount of the test image in the vertical direction and the Y channel. The vinc_inc_color_u register is used to store the color change amount of the test image in the vertical direction and the U channel. The vinc_inc_color_v register is used to store the color change amount of the test image in the vertical direction and the V channel. The hinc_inc_color_y register is used to store the color change amount of the test image in the horizontal direction and the Y channel. The hinc_inc_color_u register is used to store the color change amount of the test image in the horizontal direction and the U channel. The hinc_inc_color_v register is used to store the color change amount of the test image in the horizontal direction and the V channel.

[0083] Assume that the first parameter is 2, that is, the color of the test image changes every two frames; the second parameter is 3, that is, the color of the test image changes cyclically 3 times. The pattern test generator 101 can generate multiple frames of test images based on the parameters in the vinc_inc_color_y register, vinc_inc_color_u register, vinc_inc_color_v register, hinc_inc_color_y register, hinc_inc_color_u register, and hinc_inc_color_v register, as well as the first parameter and the second parameter. Moreover, the multiple frames of test images change cyclically 3 times, and during each cyclic change, the color changes every two frames.

[0084] Optionally, the way the test image changes in color is as Figure 2 shown. Among them, A to E represent test images of different colors. It can be seen from Figure 2 that the color of the test image changes every two frames, and the color of the test image changes cyclically 3 times. Assume that the color of test image A is init_color_y, that is, A = init_color_y, and init_inc_color_y represents the color change amount of the test image when the color changes once. Then: the colors of test images B to E respectively satisfy: B = A + init_inc_color_y, C = A + 2×init_inc_color_y, D = A + 3×init_inc_color_y, E = A + 4×init_inc_color_y.

[0085] In another possible implementation, the first storage module 102 includes a position storage unit, the image configuration information includes position configuration information, and the position configuration information is used to describe the information about the change in the display position of multiple frames of test images on the display panel during the generation of the multiple frames of test images. The position storage unit is used to store the position configuration information; the mode test generator 101 is used to read the position configuration information from the position storage unit and control the display of multiple frames of test images at the corresponding positions on the display panel according to the position configuration information.

[0086] The position storage unit is a device for storing data, and its type is not limited herein. For example, the position storage unit may include at least one register, or the position storage unit may be a storage space in a memory.

[0087] The position storage unit stores the position configuration information. In practical applications, a configuration interface for test images may be displayed through the display panel, so that testers can perform configuration operations on the test images on the configuration interface according to the requirements of the test scenario. By configuring the information about the change in the display position of multiple frames of test images on the display panel by the tester on the configuration interface, the position configuration information is obtained. The position configuration information is used to describe the information about the change in the display position of multiple frames of test images on the display panel during the generation of the multiple frames of test images. For example, the position configuration information may describe that during the generation of multiple frames of test images, the display position of the multiple frames of test images on the display panel changes from the upper left corner to the center and then to the lower right corner.

[0088] Optionally, the position configuration information includes at least one of a fourth parameter, a fifth parameter, a sixth parameter, or a seventh parameter. Each parameter is described in detail below.

[0089] The fourth parameter represents the number of frames of test images passed through during a single change in the display position on the display panel. The embodiments of the present application do not limit the value of the fourth parameter. In practical applications, testers can flexibly configure the value of the fourth parameter according to the needs of the test scenario. Optionally, the value of the fourth parameter is N, where N is any positive integer. For example, N can take any value from 1 to 1023. The value of the fourth parameter being N means that during the generation of multiple frames of test images by the mode test generator 101, the display position of the test images changes once every N frames on the display panel. For example, if N is 2, then: the first - 2 frames of test images generated by the mode test generator 101 are in the upper left corner of the display panel, the 3 - 4 frames of test images generated are in the center of the display panel, and the 5 - 6 frames of test images generated are in the lower right corner of the display panel.

[0090] Since the display panel corresponds to the horizontal direction (i.e., the x-direction) and the vertical direction (i.e., the y-direction), the fourth parameter may include two parameters. One parameter characterizes the number of frames of the test image passed through when there is a change in the display position in the horizontal direction of the display panel, and the other parameter characterizes the number of frames of the test image passed through when there is a change in the display position in the vertical direction of the display panel.

[0091] The fifth parameter characterizes the number of frames of the test image passed through when there is a cyclic change in position. The value of the fifth parameter can be flexibly configured according to the test scenario. Optionally, the value of the fifth parameter is M, where M is any positive integer. For example, M can take any value from 1 to 1023. The value of the fifth parameter being M indicates that the test image undergoes a cyclic transformation after M frames in terms of position. Since the display panel corresponds to the horizontal direction (i.e., the x-direction) and the vertical direction (i.e., the y-direction), the fifth parameter may include two parameters. One parameter characterizes the number of frames of the test image passed through when there is a cyclic change in the position in the horizontal direction, and the other parameter characterizes the number of frames of the test image passed through when there is a cyclic change in the position in the vertical direction.

[0092] The sixth parameter characterizes the amount of position change when there is a change in position. The tester can flexibly configure the sixth parameter according to the test scenario. Since the display panel corresponds to the horizontal direction (i.e., the x-direction) and the vertical direction (i.e., the y-direction), the sixth parameter may include two parameters. One parameter characterizes the amount of position change when there is a change in the position in the horizontal direction, and the other parameter characterizes the amount of position change when there is a change in the position in the vertical direction.

[0093] The seventh parameter characterizes at least one of the display position of the first frame of the test image or the display position of the last frame of the test image on the display panel when there is a cyclic change in position. That is to say, the seventh parameter characterizes the display position of the first frame of the test image and / or the last frame of the test image on the display panel during a round of cyclic change. Optionally, the seventh parameter includes at least one of the starting position parameter or the ending position parameter. Among them, the starting position parameter characterizes the display position of the first frame of the test image on the display panel when there is a cyclic change in position. The ending position parameter characterizes the display position of the last frame of the test image on the display panel when there is a cyclic change in position.

[0094] Since the display panel corresponds to the horizontal direction (i.e., the x - direction) and the vertical direction (i.e., the y - direction), the starting position parameter can include two parameters. One parameter characterizes the display position of the first frame of the test image in the horizontal direction of the display panel when cyclic changes occur in terms of position, and the other parameter characterizes the display position of the first frame of the test image in the vertical direction of the display panel when cyclic changes occur in terms of position. The ending position parameter can also include two parameters. One parameter characterizes the display position of the last frame of the test image in the horizontal direction of the display panel when cyclic changes occur in terms of position, and the other parameter characterizes the display position of the last frame of the test image in the vertical direction of the display panel when cyclic changes occur in terms of position.

[0095] Generally, the test image is rectangular, and the display position of the test image on the display panel can be determined according to the display position of at least one vertex on the display panel and / or the display length of at least one side on the display panel. Based on this, the starting position parameter can include parameters of at least one vertex and / or parameters of at least one side. The parameter of the vertex characterizes the display position of the vertex on the display panel, and the parameter of the side characterizes the display length of the side on the display panel.

[0096] In practical applications, different parameters can be stored in different registers. That is to say, the position storage unit includes at least one register, and each register is used to store one parameter in the position configuration information.

[0097] Since the pattern test generator 101 is connected to the position storage unit, the pattern test generator 101 can directly read the position configuration information from the position storage unit and generate multiple frames of test images according to the position configuration information. Since the position configuration information is used to describe the information about the changes in the positions of multiple frames of test images, the multiple frames of test images generated by the pattern test generator 101 will change in terms of position, and the change mode is consistent with the change mode described by the position configuration information. For example, if the position configuration information describes that the display position of the test image on the display panel changes from the upper left corner to the center and then to the lower right corner, the pattern test generator 101 first generates a test image in the upper left corner of the display panel, then generates a test image in the center of the display panel, and then generates a test image in the lower right corner of the display panel.

[0098] A possible implementation is shown below. In this example, the third storage module includes a pattern_sel register for storing type identifiers from "0" to "4". The pattern test generator 101 can read a type identifier from the pattern_sel register and generate a test image of the image type indicated by the type identifier. The second storage module includes a dynamic_en register for storing enable information. The pattern test generator 101 can read the enable information from the dynamic_en register. If the enable information is 1 (indicating that the dynamic image mode is enabled), the pattern test generator 101 reads the position configuration information from the position storage unit of the first storage module 102 and generates multiple frames of test images according to the position configuration information. If the enable information is 0 (indicating that the dynamic image mode is not enabled), the pattern test generator 101 directly generates multiple frames of test images.

[0099] The position storage unit includes a start_position_x register, an end_position_x register, a start_position_y register, and an end_position_y register. Among them, the start_position_x register is used to store the start_position_x parameter, and the start_position_x parameter is used to characterize the display position of one vertex of the diagonal vertex of the first frame of test image in the horizontal direction of the display panel when a cyclic change occurs in terms of position. The end_position_x register is used to store the end_position_x parameter, and the end_position_x parameter is used to characterize the display position of the other vertex of the diagonal vertex of the first frame of test image in the horizontal direction of the display panel when a cyclic change occurs in terms of position. The start_position_y register is used to store the start_position_y parameter, and the start_position_y parameter is used to characterize the display position of one vertex of the diagonal vertex of the first frame of test image in the vertical direction of the display panel when a cyclic change occurs in terms of position. The end_position_y register is used to store the end_position_y parameter, and the end_position_y parameter is used to characterize the display position of the other vertex of the diagonal vertex of the first frame of test image in the vertical direction of the display panel when a cyclic change occurs in terms of position.

[0100] The position storage unit further includes a position_inc_x register, a position_inc_y register, a block_loop_v register, a block_loop_h register, a block_step_v register, and a block_step_h register. Among them, the position_inc_x register is used to store the position_inc_x parameter, and the position_inc_x parameter represents the amount of position change when the position of the test image changes once in the horizontal direction. The position_inc_y register is used to store the position_inc_y parameter, and the position_inc_y parameter represents the amount of position change when the position of the test image changes once in the vertical direction. The block_loop_v register is used to store the block_loop_v parameter, and the block_loop_v parameter represents the number of frames of the test image passed through during one cyclic change in the vertical position of the test image. The block_loop_h register is used to store the block_loop_h parameter, and the block_loop_h parameter represents the number of frames of the test image passed through during one cyclic change in the horizontal position of the test image. The block_step_v register is used to store the block_step_v parameter, and the block_step_v parameter represents the number of frames of the test image passed through when the display position of the test image changes once in the vertical direction of the display panel. The block_step_h register is used to store the block_step_h parameter, and the block_step_h parameter represents the number of frames of the test image passed through when the display position of the test image changes once in the horizontal direction of the display panel.

[0101] Assume that both the block_loop_v register and the block_loop_h register store the parameter 3, that is, the test image undergoes a cyclic change every 3 frames in the vertical and horizontal directions. Both the block_step_v register and the block_step_h register store the parameter 1, that is, the test image undergoes a position change every 1 frame in the horizontal and vertical directions. The pattern test generator 101 can generate multiple frames of test images based on the parameters in the start_position_x register, end_position_x register, start_position_y register, end_position_y register, position_inc_x register, position_inc_y register, block_loop_v register, block_loop_h register, block_step_v register, block_step_h register, as well as the first parameter and the second parameter. Moreover, the multiple frames of test images undergo a cyclic change every 3 frames, and during each cyclic change, the position changes every 1 frame.

[0102] Optionally, the way the test image changes in position is as Figure 3 shown. It can be seen from Figure 3 that the test image undergoes a cyclic change every three frames. Among them, the 0-2 frame test images belong to one cycle, and the 3rd frame test image belongs to another cycle. In one cycle, the position of the upper left vertex of the first frame test image (for example, the 0th frame test image) is determined based on the start_position_x parameter and the start_position_y parameter, and the position of the lower right vertex of the first frame test image is determined based on the end_position_x parameter and the end_position_y parameter. The upper left vertex and the lower right vertex of the test image form diagonal vertices. In one cycle, the test image undergoes a position change every 1 frame, where the amount of position change in the horizontal direction is position_inc_x, and the amount of position change in the vertical direction is position_inc_y.

[0103] The above has elaborated in detail that the pattern test generator 101 generates multiple frames of test images, and the multiple frames of test images change in color, or the multiple frames of test images change in position. In practical applications, the multiple frames of test images can change in both color and position. The implementation principle of the multiple frames of test images changing in both color and position is similar to the implementation principle of the multiple frames of test images changing in color or position, and will not be elaborated here.

[0104] In a possible implementation, the image processing device 10 further includes an image processing module (not shown in the figure), and the image processing module is connected to the pattern test generator 101. Among them, the image processing module is configured to process each frame of test image to obtain the processed test images of each frame, and the processed test images of each frame are used to determine whether there is a problem with the image processing module.

[0105] The image processing module is a circuit for processing images. The embodiments of the present application do not limit the functions of the image processing module. For example, the image processing module can be used for at least one of magnifying an image, reducing an image, copying an image, adjusting the color of an image, adjusting a local area in an image, etc. Optionally, there is at least one image processing module, and each image processing module is used to perform one kind of image processing. For example, there are four image processing modules. Among them, the first image processing module is used to magnify the image, the second image processing module is used to copy the image, the third image processing module is used to reduce the image, and the fourth image processing module is used to adjust the color of the image.

[0106] The image processing module is connected after the pattern test generator 101. Based on this, every time the pattern test generator 101 generates a frame of test image, the image processing module can process the frame of test image to obtain the processed test image. By determining whether the processed test image meets the requirements, it is determined whether there is a problem with the image processing module. That is: if the processed test image meets the requirements, it is determined that there is no problem with the image processing module; if the processed test image does not meet the requirements, it is determined that there is a problem with the image processing module. The embodiments of the present application do not limit that the processed test image meets the requirements. For example, the processed test image meeting the requirements includes: the color deviation between the processed test image and the test image before processing is within a preset range; compared with the test image before processing, the lines in the processed test image do not have a distortion phenomenon; the number of frames of the processed test image is the preset number of frames.

[0107] Optionally, the image processing module is connected to the display panel. After the image processing module obtains the processed test image, the processed test image is displayed through the display panel to facilitate manual evaluation of whether the processed test image meets the requirements.

[0108] For example, the image processing module is used to copy images. Every time the pattern test generator 101 generates a frame of test image, the image processing module is used to copy the frame of test image. Suppose that every time the pattern test generator 101 generates a frame of test image, the image processing module copies one frame of the test image. Then: when the pattern test generator 101 generates a frame of test image at position A, after being copied by the image processing module, two frames of test images are displayed at position A; similarly, when the pattern test generator 101 generates a frame of test image at position B, after being copied by the image processing module, two frames of test images are displayed at position B; when the pattern test generator 101 generates a frame of test image at position C, after being copied by the image processing module, two frames of test images are displayed at position C. If there are two frames of test images at positions A, B, and C, it indicates that there is no problem with the image processing module, while if there are two frames of test images at position A, one frame of test image at position B, and three frames of test images at position C, it indicates that there is a problem with the image processing module.

[0109] For another example, the image processing module is used to magnify images. Every time the pattern test generator 101 generates a frame of test image, the image processing module is used to magnify the frame of test image. Suppose the test image is a solid color image, then: when the pattern test generator 101 generates a red test image, after the image processing module magnifies the test image, the magnified test image is still red; similarly, when the pattern test generator 101 generates an orange test image, after the image processing module magnifies the test image, the magnified test image is still orange; when the pattern test generator 101 generates a yellow test image, after the image processing module magnifies the test image, the magnified test image is still yellow. If the magnified test images are red, orange, and yellow respectively, it indicates that there is no problem with the image processing module, while if the magnified test images are red, orange, and green respectively, it indicates that there is a problem with the image processing module. Suppose again that the test image is a checkerboard image, then: the pattern test generator 101 generates a checkerboard image, and the checkerboard image includes black squares and white squares. If after the image processing module magnifies the checkerboard image, the magnified test image still includes black squares and white squares, it indicates that there is no problem with the image processing module, while if the magnified test image has an elliptical shape, it indicates that there is a problem with the image processing module.

[0110] In this example, the image processing module and the pattern test generator 101 are integrated in the same image processing device 10, and the image processing device 10 can be encapsulated in a chip. Through this setting, the direct connection between the image processing module and the pattern test generator 101 is realized, without introducing additional devices, reducing the impact of additional devices on the test of the image processing module, and being beneficial to improving the accuracy of the test results of the image processing module.

[0111] It should be noted that the information involved in this application (including but not limited to user device information, user personal information, etc.), data (including but not limited to data for analysis, stored data, displayed data, etc.), and signals are all authorized by the user or fully authorized by all parties, and the collection, use, and processing of relevant data need to comply with the relevant laws, regulations, and standards of the relevant regions. For example, the test images involved in this application are all obtained under full authorization.

[0112] In the above device, the mode test generator can read the image configuration information from the first storage module and generate multiple frames of test images according to the image configuration information, so that at least one of the color or position of the multiple frames of test images changes. By controlling the test images to automatically change through the image configuration information without manual adjustment by the tester, the test efficiency can be greatly improved, and complex test scenarios can be adapted to improve the flexibility of the test.

[0113] The embodiment of the present application also provides an image processing method, which is executed by the image processing device mentioned above. Optionally, Figure 4 The following shows a flowchart of an image processing method provided by an embodiment of the present application, as Figure 4 shown, the method includes the following steps.

[0114] Step 401, read the image configuration information, where the image configuration information is used to describe the information that at least one of the color or position of multiple frames of test images changes during the generation of multiple frames of test images.

[0115] Step 402, generate multiple frames of test images according to the image configuration information.

[0116] In a possible implementation manner, step 401 includes: reading the enable information, where the enable information indicates whether the dynamic image mode is enabled; when the enable information indicates that the dynamic image mode is enabled, read the image configuration information.

[0117] In a possible implementation manner, the image configuration information includes color configuration information, where the color configuration information is used to describe the information that the color of multiple frames of test images changes during the generation of multiple frames of test images;

[0118] Step 401 includes: reading the color configuration information;

[0119] Step 402 includes: generating multiple frames of test images according to the color configuration information.

[0120] In a possible implementation, the color configuration information includes at least one of a first parameter, a second parameter, or a third parameter. The first parameter represents the number of frames of the test image that have passed through one change in terms of color. The second parameter represents the number of cyclic changes in terms of color. The third parameter represents the amount of color change that occurs in one change in terms of color.

[0121] In a possible implementation, the image configuration information includes position configuration information, and the position configuration information is used to describe the information about the change in the display position of multiple frames of test images on the display panel during the generation of multiple frames of test images;

[0122] Step 401 includes: reading the position configuration information;

[0123] Step 402 includes: controlling the display of multiple frames of test images at the corresponding positions on the display panel according to the position configuration information.

[0124] In a possible implementation, the position configuration information includes at least one of a fourth parameter, a fifth parameter, a sixth parameter, or a seventh parameter. The fourth parameter represents the number of frames of the test image that have passed through one change in terms of the display position on the display panel. The fifth parameter represents the number of frames of the test image that have passed through one cyclic change in terms of position. The sixth parameter represents the amount of position change that occurs in one change in terms of position. The seventh parameter represents at least one of the display position of the first frame of the test image or the display position of the last frame of the test image on the display panel when there is a cyclic change in terms of position.

[0125] In a possible implementation, Step 402 includes: reading a type identifier for indicating the image type of the test image; generating multiple frames of test images of the image type indicated by the type identifier according to the image configuration information.

[0126] In the above method, multiple frames of test images are generated according to the image configuration information, so that multiple frames of test images change in at least one of color or position. By controlling the automatic change of the test images through the image configuration information, without the need for testers to manually adjust, the test efficiency can be greatly improved, and complex test scenarios can be adapted, improving the flexibility of the test.

[0127] It should be understood that the above method embodiments and the embodiments of the image processing device belong to the same concept. For the specific implementation process, please refer to the device embodiments, which will not be elaborated here.

[0128] In an exemplary embodiment, a chip is further provided, as Figure 5 shown. The chip 500 includes the above-mentioned image processing device 10, and the image processing device 10 is used to execute the above-mentioned image processing method.

[0129] In an exemplary embodiment, an electronic device is further provided, such as Figure 6 shown, the electronic device 600 includes the chip 500 mentioned above.

[0130] It should be understood that "a plurality of" mentioned herein refers to two or more. "And / or" describes the association relationship of associated objects and indicates that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects before and after.

[0131] The serial numbers of the embodiments of the present application above are only for description and do not represent the advantages or disadvantages of the embodiments.

[0132] The above are only exemplary embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the principle of the present application shall be included in the protection scope of the present application.

Claims

1. An image processing apparatus, characterized in that, The device includes a pattern test generator and a first storage module, and the first storage module is connected to the pattern test generator; The first storage module is configured to store image configuration information, where the image configuration information is used to describe information about at least one of color or position changes of the multiple frames of test images during the generation of the multiple frames of test images; The pattern test generator is configured to read the image configuration information from the first storage module and generate the multiple frames of test images according to the image configuration information.

2. The device according to claim 1, characterized in that The device further includes a second storage module, and the second storage module is connected to the pattern test generator; The second storage module is configured to store enable information, where the enable information represents whether the dynamic image mode is enabled; The pattern test generator is configured to read the enable information from the second storage module, and when the enable information represents that the dynamic image mode is enabled, read the image configuration information from the first storage module.

3. The device according to claim 1, wherein The first storage module includes a color storage unit, the image configuration information includes color configuration information, and the color configuration information is used to describe information about color changes of the multiple frames of test images during the generation of the multiple frames of test images; The color storage unit is configured to store the color configuration information; The pattern test generator is configured to read the color configuration information from the color storage unit and generate the multiple frames of test images according to the color configuration information.

4. The device according to claim 3, characterized in that, The color configuration information includes at least one of a first parameter, a second parameter, or a third parameter. The first parameter represents the number of frames of test images passed through for one color change, the second parameter represents the number of cycles of color change, and the third parameter represents the amount of color change for one color change.

5. The device according to claim 1, characterized in that, The first storage module includes a position storage unit, the image configuration information includes position configuration information, and the position configuration information is used to describe information about changes in the display position of the multiple frames of test images on the display panel during the generation of the multiple frames of test images; The position storage unit is configured to store the position configuration information; The pattern test generator is configured to read the position configuration information from the position storage unit and control the multiple frames of test images to be displayed at the corresponding positions on the display panel according to the position configuration information.

6. The device according to claim 5, characterized in that, The position configuration information includes at least one of a fourth parameter, a fifth parameter, a sixth parameter, or a seventh parameter. The fourth parameter represents the number of frames of test images passed through for one change in the display position on the display panel, the fifth parameter represents the number of frames of test images passed through for one cycle of position change, the sixth parameter represents the amount of position change for one position change, and the seventh parameter represents at least one of the display position of the first frame of test image or the display position of the last frame of test image when there is a cyclic change in position.

7. The device according to any one of claims 1 to 6, characterized in that, The device further includes a third storage module, and the third storage module is connected to the pattern test generator; The third storage module is configured to store at least two type identifiers, where the type identifier is used to indicate an image type; The pattern test generator is configured to read, from the third storage module, a type identifier indicating the image type of the test image, and generate multiple frames of test images of the image type indicated by the type identifier according to the image configuration information.

8. An image processing method, characterized in that, The method includes: Reading image configuration information, where the image configuration information is used to describe information in which at least one of color or position of the multiple frames of test images changes during the generation of the multiple frames of test images; Generating the multiple frames of test images according to the image configuration information.

9. The method according to claim 8, characterized in that, The reading of the image configuration information includes: Reading enable information, where the enable information characterizes whether the dynamic image mode is enabled; When the enable information characterizes that the dynamic image mode is enabled, reading the image configuration information.

10. The method according to claim 8, wherein The image configuration information includes color configuration information, where the color configuration information is used to describe information in which the multiple frames of test images change in color during the generation of the multiple frames of test images; The reading of the image configuration information includes: Reading the color configuration information; The generating of the multiple frames of test images according to the image configuration information includes: Generating the multiple frames of test images according to the color configuration information.

11. The method according to claim 10, wherein The color configuration information includes at least one of a first parameter, a second parameter, or a third parameter. The first parameter characterizes the number of frames of test images passed through when a change occurs in color. The second parameter characterizes the number of cyclic changes in color. The third parameter characterizes the amount of color change when a change occurs in color once.

12. The method according to claim 8, wherein The image configuration information includes position configuration information, where the position configuration information is used to describe information in which the display positions of the multiple frames of test images on the display panel change during the generation of the multiple frames of test images; The reading of the image configuration information includes: Reading the position configuration information; The generating of the multiple frames of test images according to the image configuration information includes: Controlling the multiple frames of test images to be displayed at corresponding positions on the display panel according to the position configuration information.

13. The method according to claim 12, wherein The position configuration information includes at least one of a fourth parameter, a fifth parameter, a sixth parameter, or a seventh parameter. The fourth parameter characterizes the number of frames of test images passed through when a change occurs in the display position on the display panel. The fifth parameter characterizes the number of frames of test images passed through when a cyclic change occurs in position. The sixth parameter characterizes the amount of position change when a change occurs in position once. The seventh parameter characterizes at least one of the display position of the first frame of test image or the display position of the last frame of test image when a cyclic change occurs in position.

14. The method according to any one of claims 8 to 13, characterized in that, The generating of the multiple frames of test images according to the image configuration information includes: Reading a type identifier indicating the image type of the test image; Generating multiple frames of test images of the image type indicated by the type identifier according to the image configuration information.

15. A chip, characterized in that, The chip includes the image processing device according to any one of claims 1 to 7.

16. An electronic device, characterized in that, The electronic device includes the chip as described in claim 15.

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