Method, device and equipment for measuring and calculating intrinsic contact angle of material and storage medium

By measuring and calculating the surface contact angle in the superhydrophobic state, the intrinsic contact angle of the material is reversed, which solves the limitations of the measurement methods in the prior art and realizes a widely applicable intrinsic contact angle calculation.

CN120388645APending Publication Date: 2025-07-29CHONGQING UNIV
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Patent Information

Application Number
CN202510603043.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-05-08
Publication Date
2025-07-29

AI Technical Summary

Technical Problem

In the prior art, the measurement methods of intrinsic contact angle of materials are relatively single, and most of them are limited to specific liquids and specific materials, and cannot be widely used.

Method used

By obtaining the material structure with a superhydrophobic microstructure on the surface, measuring the surface contact angle of its superhydrophobic state, and determining the intrinsic contact angle of the material based on the formula of the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state.

Benefits of technology

The limitations of intrinsic contact angle calculation are eliminated, the applicability of calculation is broadened, and the accuracy and convenience of calculation are improved.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses a method, device and equipment for measuring and calculating an intrinsic contact angle of a material and a storage medium, the method is applied to the field of material detection, and the method comprises the following steps: acquiring a material structure with a super-hydrophobic microstructure on the surface as a material structure to be measured and calculated; measuring the surface contact angle of the to-be-measured material structure in the super-hydrophobic state; and based on the surface contact angle, determining the intrinsic contact angle of the material structure to be measured and calculated according to a formula of the relationship between the surface contact angle and the intrinsic contact angle in the super-hydrophobic state. According to the method, the material structure with the super-hydrophobic microstructure serves as the material structure to be measured and calculated, the surface contact angle of the material structure in the super-hydrophobic state is calculated, then the intrinsic contact angle of the material is reversely deduced on the basis of the surface contact angle in the super-hydrophobic state, and therefore a mode for calculating the intrinsic contact angle of the material is provided; the problem that specific liquid and specific materials need to be limited when the intrinsic contact angle is calculated at present is solved, and the limitation of measurement and calculation of the intrinsic contact angle is eliminated.
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Description

Technical Field

[0001] The present invention relates to the field of material detection, and particularly to a method, device, equipment and storage medium for calculating the intrinsic contact angle of a material. Background Art

[0002] Since the Young's equation was proposed in the 19th century, the research on the wettability between liquids and solids has had an important theoretical basis. Usually, the surface contact angle is used to measure the wettability between liquids and solids. According to the different wettabilities between liquids and solids, solid materials are also divided into hydrophobic materials and hydrophilic materials. In recent years, more and more hydrophobic materials and hydrophilic materials have been applied in various fields, such as anti-corrosion, self-cleaning, anti-icing and de-icing, oil-water separation, etc. However, in the actual process, the uneven chemical properties, roughness, adsorbed impurities on the solid surface, as well as environmental factors such as humidity, temperature, and pressure will all cause interference, making the intrinsic contact angle different from the surface contact angle.

[0003] Taking the preparation of superhydrophobic materials as an example, it mainly builds rough structures on the material surface physically and modifies low-surface-energy substances on the material surface chemically. When constructing a suitable micro-nano rough structure, if the intrinsic contact angle of the material is known, the size of the required micro-nano structure can be determined quickly and effectively, so as to more effectively construct the required superhydrophobic structure on the material surface. However, at present, the measurement methods for the intrinsic contact angle of materials are relatively single, and most of the measurement methods are for specific liquids and specific materials, which have limitations and cannot be widely applied.

[0004] Therefore, in order to more conveniently prepare superhydrophobic and superhydrophilic rough structures on the material surface, there is an urgent need for a method for calculating the intrinsic contact angle of each solid material. Summary of the Invention

[0005] In view of this, the purpose of the present invention is to provide a method, device, equipment and storage medium for calculating the intrinsic contact angle of a material, which solves the problem that the measurement methods for the intrinsic contact angle of materials in the prior art are relatively single, and most of the measurement methods are for specific liquids and specific materials, which have limitations and cannot be widely applied.

[0006] To solve the above technical problems, the present invention provides a method for calculating the intrinsic contact angle of a material, including:

[0007] Obtain a material structure with a superhydrophobic microstructure on its surface as the material structure to be calculated;

[0008] Measure the surface contact angle of the material structure to be calculated in the superhydrophobic state;

[0009] Based on the surface contact angle, determine the intrinsic contact angle of the material structure to be measured according to the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state.

[0010] Optionally, obtaining a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured includes:

[0011] Select a material structure to be prepared;

[0012] Based on the material structure to be prepared, determine the size of the superhydrophobic microstructure to be prepared;

[0013] Based on the size, prepare the superhydrophobic microstructure on the surface of the material structure to be prepared as the material structure to be measured.

[0014] Optionally, based on the size, preparing the superhydrophobic microstructure on the surface of the material structure to be prepared as the material structure to be measured includes:

[0015] Based on the size, prepare a superhydrophobic microstructure with a grid-like structure on the surface of the material structure to be prepared as the material structure to be measured;

[0016] Correspondingly, based on the surface contact angle, determining the intrinsic contact angle of the material structure to be measured according to the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state includes:

[0017] Substitute the surface contact angle into the formula:

[0018] , to determine the intrinsic contact angle of the material structure to be measured; where is the surface contact angle, is the intrinsic contact angle, is the contact area fraction of the liquid droplet with the solid surface.

[0019] Optionally, before determining the size of the superhydrophobic microstructure to be prepared based on the material structure to be prepared, it further includes:

[0020] According to the hydrophobicity of the material to be prepared, determine the preset range of the intrinsic contact angle of the material to be prepared;

[0021] Correspondingly, based on the material structure to be prepared, determining the size of the superhydrophobic microstructure to be prepared includes:

[0022] Based on the material structure to be prepared and the preset range of the intrinsic contact angle, determine the size of the superhydrophobic microstructure to be prepared.

[0023] Optionally, based on the material structure to be prepared, determining the size of the superhydrophobic microstructure to be prepared includes:

[0024] Determine the size of the microstructure when the surface contact angle of the material structure to be prepared is greater than 150 degrees and the rolling angle is less than 10 degrees, and use it as the size of the superhydrophobic microstructure.

[0025] Optionally, prepare the superhydrophobic microstructure on the surface of the material structure to be prepared based on the size, as the material structure to be measured, including:

[0026] Based on the size, use the plasma etching method to prepare the superhydrophobic microstructure on the surface of the material structure to be prepared, and obtain the material structure to be measured.

[0027] Optionally, obtaining a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured includes:

[0028] Obtain a specified material structure;

[0029] If there is a superhydrophobic microstructure with a grating structure, or a superhydrophobic microstructure with a papilla structure, or a superhydrophobic microstructure with a dot matrix structure on the surface of the specified material structure, then use the specified material structure as the material structure to be measured.

[0030] The present invention also provides a device for measuring the intrinsic contact angle of a material, including:

[0031] An acquisition module for acquiring a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured;

[0032] A measurement module for measuring the surface contact angle of the material structure to be measured in the superhydrophobic state;

[0033] A determination module for determining the intrinsic contact angle of the material structure to be measured based on the surface contact angle according to the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state.

[0034] The present invention also provides a device for measuring the intrinsic contact angle of a material, including:

[0035] A memory for storing a computer program;

[0036] A processor for executing the computer program to implement the steps of the above-mentioned method for measuring the intrinsic contact angle of a material.

[0037] The present invention also provides a storage medium for storing a computer program, wherein the computer program, when executed by a processor, implements the steps of the above-mentioned method for measuring the intrinsic contact angle of a material.

[0038] It can be seen that the method for calculating the intrinsic contact angle of the material provided by the present invention includes obtaining a material structure with a superhydrophobic microstructure on the surface as the material structure to be measured; measuring the surface contact angle of the material structure to be measured in the superhydrophobic state; and determining the intrinsic contact angle of the material structure to be measured based on the surface contact angle according to the formula of the relationship between the surface contact angle in the superhydrophobic state and the intrinsic contact angle. By using the material structure with a superhydrophobic microstructure on the surface as the material structure to be measured, calculating the surface contact angle in its superhydrophobic state, and then inversely deducing the intrinsic contact angle of the material based on the surface contact angle in the superhydrophobic state, the present invention provides a method for calculating the intrinsic contact angle of the material, solves the problem that specific liquids and specific materials need to be specified for calculating the intrinsic contact angle at present, and eliminates the limitations of measuring the intrinsic contact angle.

[0039] In addition, the present invention also provides a device, equipment and storage medium for measuring the intrinsic contact angle of the material, which also have the above beneficial effects. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on the provided drawings without creative efforts.

[0041] Figure 1 It is a flowchart of a method for measuring the intrinsic contact angle of a material provided by an embodiment of the present invention;

[0042] Figure 2 It is a flowchart for determining a material structure to be measured provided by an embodiment of the present invention;

[0043] Figure 3 It is a schematic structural diagram of a device for measuring the intrinsic contact angle of a material provided by an embodiment of the present invention;

[0044] Figure 4 It is a schematic structural diagram of a device for measuring the intrinsic contact angle of a material provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0045] To make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0046] Since the Young's equation was proposed in the 19th century, the research on the wettability between liquids and solids has had an important theoretical basis. Currently, the surface contact angle is usually used to measure the wettability between liquids and solids. According to the different wettabilities between liquids and solids, solid materials are also divided into hydrophobic materials and hydrophilic materials. In recent years, more and more hydrophobic and hydrophilic materials have been applied in various fields, such as anti-corrosion, self-cleaning, anti-icing and de-icing, oil-water separation, etc. Nowadays, new methods are urgently needed in many fields to solve problems. For example, in the electrical field, making the transmission lines and the surfaces of insulators have superhydrophobicity can achieve the effects of anti-icing, anti-fouling, and anti-corrosion; superhydrophilic materials can develop self-cleaning, self-sterilizing, and self-dusting textiles; using superhydrophobic materials in automobile manufacturing can achieve the effects of waterproofing and anti-fogging. Therefore, exploring the relationship between the wettability of liquids and solids and then quickly, efficiently, and accurately preparing superhydrophobic and superhydrophilic materials is of great significance.

[0047] The intrinsic contact angle is different from the surface contact angle and is used to characterize the contact angle of a liquid on an ideally smooth solid surface, which is crucial for studying the wettability of a solid surface to a certain liquid. However, in the actual process, the uneven chemical properties, roughness, adsorbed impurities of the solid surface, as well as environmental factors such as humidity, temperature, and pressure will all cause interference. Therefore, it is extremely difficult to measure the intrinsic contact angle corresponding to a solid by conventional methods. The methods for preparing superhydrophobic materials mainly include physically constructing a rough structure on the material surface and chemically modifying low-surface-energy substances on the material surface. When constructing a suitable rough structure, if the intrinsic contact angle of the material is known, the size of the required micro-nano structure can be quickly and effectively determined, so as to more effectively construct the required superhydrophobic structure on the material surface. However, the current measurement methods for the intrinsic contact angle of materials are relatively single. Most of the measurement methods are for specific liquids and specific materials, which have limitations and cannot be widely applied.

[0048] The present invention provides a method for calculating the intrinsic contact angle of a material by using the material structure with a superhydrophobic micro-structure on the surface as the material structure to be measured, calculating the surface contact angle in the superhydrophobic state, and then inversely deducing the intrinsic contact angle of the material based on the surface contact angle in the superhydrophobic state. This solves the problem that the current calculation of the intrinsic contact angle requires specifying specific liquids and specific materials, and eliminates the limitations of the measurement of the intrinsic contact angle. For specific reference, see the following embodiments:

[0049] Please refer to Figure 1 , Figure 1 which is a flowchart of a method for measuring the intrinsic contact angle of a material provided by an embodiment of the present invention. The method may include:

[0050] S101: Obtain a material structure with a superhydrophobic micro-structure on the surface as the material structure to be measured.

[0051] The execution subject of this embodiment is a measurement device. In this embodiment, the specific method for obtaining a material structure with a superhydrophobic microstructure on its surface may include that the surface of the processed material structure itself has a superhydrophobic microstructure. At this time, if the superhydrophobic microstructure on the surface of the material structure can be directly used to measure the intrinsic contact angle of the material, then this material structure can be used as the material structure to be measured; correspondingly, the specific method for obtaining a material structure with a superhydrophobic microstructure on its surface may also include preparing a superhydrophobic microstructure according to the hydrophobicity of the material itself, and using the material structure with the prepared superhydrophobic microstructure as the material structure to be measured for measuring the intrinsic contact angle of the material. Specifically, in this embodiment, the material structure with a superhydrophobic microstructure on its surface can be such that the contact angle of the surface of the material structure is greater than 150 degrees, and at this time it is in a superhydrophobic state.

[0052] Further, in a feasible implementation manner, in order to ensure the applicability of the material structure for measuring the intrinsic contact angle and avoid the problem of only being applicable to measuring the intrinsic contact angle of some materials, reference can be made to Figure 2 , Figure 2 FIG. is a flowchart for determining a material structure to be measured provided by an embodiment of the present invention. The above-mentioned obtaining a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured may include the following steps:

[0053] S201: Select a material structure to be prepared.

[0054] In this embodiment, there is no limitation on the selected material structure to be prepared, as long as it is necessary to measure the intrinsic contact angle.

[0055] S202: Determine the size of the superhydrophobic microstructure to be prepared based on the material structure to be prepared.

[0056] In this embodiment, this step can be executed by referring to the method in the prior art for determining the size of the superhydrophobic microstructure to be prepared based on the material properties. Specifically, experimental optimization can be used to select a suitable size of the superhydrophobic microstructure according to the material properties. Further, the superhydrophobic microstructure may include a superhydrophobic microstructure with a grid structure. At this time, the size of the superhydrophobic microstructure with a grid structure includes the groove width of the grid structure, the groove depth of the grid structure, and the protrusion width of the grid structure; the superhydrophobic microstructure may also include a superhydrophobic microstructure with a papilla structure. At this time, the size of the superhydrophobic microstructure with a papilla structure includes the depth of the papilla structure and the distance between the papilla structures; the superhydrophobic microstructure may further include a superhydrophobic microstructure with a dot matrix structure. At this time, the size of the superhydrophobic microstructure with a dot matrix structure includes the depth of the dot matrix structure, the size of the dot matrix structure, and the distance between the dot matrix structures.

[0057] Further, in order to improve the efficiency of determining the size of the superhydrophobic microstructure to be prepared based on the material properties and enhance the convenience of determination, before determining the size of the superhydrophobic microstructure to be prepared based on the structure of the material to be prepared, the following steps may also be included:

[0058] Determine the preset range of the intrinsic contact angle of the material to be prepared according to the hydrophobicity of the material to be prepared;

[0059] Correspondingly, determining the size of the superhydrophobic microstructure to be prepared based on the structure of the material to be prepared may include:

[0060] Determine the size of the superhydrophobic microstructure to be prepared based on the structure of the material to be prepared and the preset range of the intrinsic contact angle.

[0061] It should be noted that in this embodiment, based on the hydrophobicity of the material to be prepared, the preset range of the intrinsic contact angle of the material to be prepared can be determined. For example, if the material structure itself has hydrophobicity, then the intrinsic contact angle must be greater than 90 degrees. After determining the range of the intrinsic contact angle, the size of the superhydrophobic microstructure can be better set, improving the preparation efficiency.

[0062] Further, in order to ensure the successful preparation of the size of the superhydrophobic microstructure, determining the size of the superhydrophobic microstructure to be prepared based on the structure of the material to be prepared may include:

[0063] Determine the size of the microstructure when the surface contact angle of the structure of the material to be prepared is greater than 150 degrees and the rolling angle is less than 10 degrees as the size of the superhydrophobic microstructure.

[0064] It should be noted that taking the superhydrophobic material structure as an example, the key to preparing the superhydrophobic material structure is to make its surface contact angle greater than 150 degrees and the rolling angle less than 10 degrees. At this time, the size of the superhydrophobic microstructure formed on the surface of the superhydrophobic material structure is the corresponding size of the superhydrophobic microstructure to be prepared. To ensure the accuracy of size determination, the average value of the surface contact angle and the average value of the rolling angle can be calculated based on multiple points on the surface of the structure of the material to be prepared, and the size of the microstructure when the average value of the surface contact angle of the structure of the material to be prepared is greater than 150 degrees and the average value of the rolling angle is less than 10 degrees is used as the size of the superhydrophobic microstructure to improve the accuracy of the determined size of the superhydrophobic microstructure.

[0065] S203: Prepare a superhydrophobic microstructure on the surface of the structure of the material to be prepared based on the size as the material structure to be measured.

[0066] In this embodiment, there is no limitation on the specific method for preparing the superhydrophobic microstructure on the surface of the material structure to be prepared. For example, methods such as the template method, sol-gel method, immersion method, 3D printing technology, phase separation method, electrospinning method, laser etching method, layer-by-layer assembly method, plasma etching method, chemical etching method, etc. can be used to prepare the superhydrophobic microstructure on the surface of the material structure to be prepared.

[0067] Further, in order to ensure the accuracy of preparing the superhydrophobic microstructure and reduce the preparation cost, the above-mentioned preparation of the superhydrophobic microstructure on the surface of the material structure to be prepared based on the size, as the material structure to be measured, may include:

[0068] Based on the size, use the plasma etching method to prepare the superhydrophobic microstructure on the surface of the material structure to be prepared, and obtain the material structure to be measured.

[0069] In this embodiment, by using the plasma etching method to prepare the superhydrophobic microstructure on the surface of the material structure to be prepared, the preparation accuracy, preparation efficiency, and preparation flexibility of the superhydrophobic microstructure can be improved, thereby ensuring the accuracy of measuring the intrinsic contact angle of the material structure. The specific plasma etching device used in this embodiment mainly consists of a vacuum control component, a plasma generation component, a gas supply component, an electrode spacing control component, and an etching sample placement component.

[0070] Further, in order to facilitate the subsequent preparation of the superhydrophobic microstructure on the surface of the material structure to be prepared and improve the preparation efficiency, before determining the size of the superhydrophobic microstructure to be prepared based on the material structure to be prepared, it may further include:

[0071] Determine the physical and chemical properties of the material structure to be prepared;

[0072] Correspondingly, the above-mentioned preparation of the superhydrophobic microstructure on the surface of the material structure to be prepared based on the size, as the material structure to be measured, includes:

[0073] Based on the size of the superhydrophobic microstructure and the physical and chemical properties of the material structure to be prepared, prepare the superhydrophobic microstructure on the surface of the material structure to be prepared, as the material structure to be measured.

[0074] It should be noted that the physical and chemical properties of the material structure to be prepared in this embodiment include the physical properties and chemical properties that affect the processing parameters when preparing the superhydrophobic microstructure, such as the material hardness of the material structure to be prepared. Specifically, when using the plasma etching method to prepare the superhydrophobic microstructure, the parameters during etching are determined by the physical properties and chemical properties of the material structure to be prepared, such as which plasma is easy to etch this kind of material structure and the etching time used.

[0075] Further, in another feasible implementation, in order to improve the convenience of measuring the intrinsic contact angle, the above-mentioned material structure with a superhydrophobic microstructure on the surface, as the material structure to be measured, may include the following steps:

[0076] Step S11: Obtain a specified material structure;

[0077] Step S12: If the surface of the specified material structure has a superhydrophobic microstructure of a grating structure, or a superhydrophobic microstructure of a papilla structure, or a superhydrophobic microstructure of a lattice structure, then use the specified material structure as the material structure to be measured.

[0078] It should be noted that if the surface of the obtained specified material structure itself has superhydrophobicity, and the superhydrophobic microstructure on its surface is a structure that can be used to measure the intrinsic contact angle, then the current specified material structure can be used as the material structure to be measured. The above-mentioned structure that can be used to measure the intrinsic contact angle may specifically include at least a superhydrophobic microstructure of a grating structure, a superhydrophobic microstructure of a papilla structure, and a superhydrophobic microstructure of a lattice structure. If the surface of the specified material structure itself has superhydrophobicity, but the superhydrophobic microstructure on its surface is complex and inaccurate and not suitable for measuring the intrinsic contact angle, then the specified material structure cannot be directly used as the material structure to be measured. A superhydrophobic microstructure that can be used to measure the intrinsic contact angle can be processed and prepared on the surface of the specified material structure.

[0079] S102: Measure the surface contact angle of the material structure to be measured in the superhydrophobic state.

[0080] It should be noted that in this embodiment, when measuring the surface contact angle of the above-mentioned material structure to be measured, since the surface of the material structure to be measured has a superhydrophobic microstructure, the surface contact angle of the material structure to be measured measured at this time is the surface contact angle in the superhydrophobic state. This embodiment does not limit the specific method of measuring the surface contact angle of the material structure to be measured in the superhydrophobic state, as long as the surface contact angle can be accurately measured. For example, a contact angle measuring instrument can be used to measure the surface contact angle of the material, or other methods can also be used to measure the surface contact angle of the material. Further, in this embodiment, multiple points can be selected on the surface of the material structure to be measured, and the surface contact angle in the superhydrophobic state is measured, and the average value of the surface contact angles at multiple points is taken. The average value of the surface contact angles is substituted into the formula for the relationship between the surface contact angle in the superhydrophobic state and the intrinsic contact angle to determine the intrinsic contact angle of the material structure to be measured, so as to improve the accuracy of measuring the intrinsic contact angle.

[0081] S103: Based on the surface contact angle, determine the intrinsic contact angle of the material structure to be measured according to the formula for the relationship between the surface contact angle in the superhydrophobic state and the intrinsic contact angle.

[0082] In this embodiment, after measuring the surface contact angle of the material structure to be measured in the superhydrophobic state, the surface contact angle is substituted into the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state. At this time, in the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state, the surface contact angle term is a definite value, and then the intrinsic contact angle of the material structure to be measured can be determined. Specifically, the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state in this embodiment can be specifically set as the formula for the relationship between the surface contact angle and the intrinsic contact angle in the Cassie - Baxter state.

[0083] Further, in order to improve the convenience of inversely calculating the intrinsic contact angle based on the intrinsic contact angle and the simplicity of preparing the superhydrophobic microstructure on the surface of the material structure, preparing the superhydrophobic microstructure on the surface of the material structure to be prepared based on the size, as the material structure to be measured, may include:

[0084] Preparing a superhydrophobic microstructure with a grating structure on the surface of the material structure to be prepared based on the size, as the material structure to be measured;

[0085] Correspondingly, determining the intrinsic contact angle of the material structure to be measured based on the surface contact angle according to the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state may include:

[0086] Substitute the surface contact angle into the formula:

[0087] , to determine the intrinsic contact angle of the material structure to be measured; where is the surface contact angle, is the intrinsic contact angle, is the contact area fraction between the liquid droplet and the solid surface.

[0088] In this embodiment, by preparing a superhydrophobic microstructure with a grating structure on the surface of the material structure and using the superhydrophobic microstructure with the grating structure to measure the intrinsic contact angle of the material, the simplicity of the measurement can be improved and the measurement difficulty can be reduced. Further, in this embodiment, the surface contact angle of the material with the superhydrophobic microstructure with the above - mentioned grating structure is measured and substituted into the above formula in the surface contact angle is known, the contact area fraction between the liquid droplet and the solid surface can be measured, and at this time, the intrinsic contact angle can be calculated.

[0089] It should be further noted that the above formula is the formula for the relationship between the surface contact angle and the intrinsic contact angle of a superhydrophobic surface in the Cassie - Baxter state when the superhydrophobic microstructure is a grating structure. Among them Specifically, it is the surface contact angle in the Cassie - Baxter state, that is, the contact angle actually measured for the liquid droplet on the superhydrophobic surface Specifically, it is the contact angle of the liquid droplet on an ideally smooth surface, which is determined by the surface energy of the material and the surface tension of the liquid Specifically, it is the proportion of the actual contact area between the liquid droplet and the solid surface. The smaller A is, the larger the proportion of air under the liquid droplet. This formula describes that in the Cassie - Baxter state, the liquid droplet does not completely wet the solid surface but is partially suspended on the microstructure of the surface, with an air layer below. At this time, the surface contact angle and the intrinsic contact angle and the contact area fraction satisfy the formula:

[0090] ;

[0091] When equals 1, the liquid droplet is in full contact with the solid surface, and the Cassie - Baxter state degenerates into the Wenzel state. The formula simplifies to:

[0092] ;

[0093] When approaches 1, the liquid droplet is almost completely suspended on the air layer, approaches - 1, that is, approaches 180 degrees, showing an ideal superhydrophobic state.

[0094] In addition, it should be further noted that when the superhydrophobic microstructure is a superhydrophobic microstructure of a dot matrix structure, substitute the surface contact angle into the formula:

[0095] Among them, is the surface contact angle, is the intrinsic contact angle, is the contact area fraction between the liquid droplet and the solid surface.

[0096] It should be noted that the above formula When the superhydrophobic microstructure is a lattice structure in the Cassie - Baxter state, the formula for the relationship between the surface contact angle and the intrinsic contact angle. This formula describes the situation in the Cassie - Baxter state where the liquid droplet does not fully wet the solid surface but is partially suspended on the surface microstructure with an air layer below. At this time, the surface contact angle and the intrinsic contact angle and the contact area fraction satisfy the formula:

[0097] ;

[0098] When approaches 1, the liquid droplet fully contacts the solid surface, and the Cassie - Baxter state degenerates into the Wenzel state. The formula simplifies to:

[0099] ;

[0100] When approaches 0, the liquid droplet is almost completely suspended on the air layer, approaches - 1, that is, approaches 180 degrees, showing an ideal superhydrophobic state.

[0101] When the superhydrophobic microstructure is a papillary - structure superhydrophobic microstructure, substitute the surface contact angle into the formula:

[0102] where, is the surface contact angle, is the intrinsic contact angle, is the contact area fraction of the liquid droplet with the solid surface.

[0103] It should be noted that the above formula is the formula for the relationship between the surface contact angle and the intrinsic contact angle when the superhydrophobic microstructure is a papillary - structure superhydrophobic microstructure in the Cassie - Baxter state. This formula describes the situation in the Cassie - Baxter state where the liquid droplet does not fully wet the solid surface but is partially suspended on the surface microstructure with an air layer below. At this time, the relationship between the surface contact angle, the intrinsic contact angle, and the contact area fraction satisfies the formula:

[0104] ;

[0105] When approaches 1, the liquid droplet fully contacts the solid surface, and the Cassie - Baxter state degenerates into the Wenzel state. The formula simplifies to:

[0106] ;

[0107] When approaches 0, the droplet is almost completely suspended on the air layer, approaches -1, that is, approaches 180 degrees, showing an ideal superhydrophobic state.

[0108] Applying the method for calculating the intrinsic contact angle of the material provided by the embodiment of the present invention includes obtaining a material structure with a superhydrophobic microstructure on the surface as the material structure to be measured; measuring the surface contact angle of the material structure to be measured in the superhydrophobic state; and determining the intrinsic contact angle of the material structure to be measured based on the surface contact angle according to the formula of the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state. The present invention provides a way to calculate the intrinsic contact angle of a material by using a material structure with a superhydrophobic microstructure on the surface as the material structure to be measured, calculating its surface contact angle in the superhydrophobic state, and then inversely deducing the intrinsic contact angle of the material based on the surface contact angle in the superhydrophobic state, thus solving the problem that specific liquids and specific materials need to be specified for calculating the intrinsic contact angle at present and eliminating the limitations of measuring the intrinsic contact angle.

[0109] In addition, the embodiment of the present invention determines the size of the superhydrophobic microstructure to be prepared based on the material structure to be prepared, and prepares the superhydrophobic microstructure on the surface of the material structure to be prepared based on the size as the material structure to be measured, broadening the applicability of the material structure for measuring the intrinsic contact angle; before determining the size of the superhydrophobic microstructure to be prepared based on the material structure to be prepared, determining the preset range of the intrinsic contact angle of the material to be prepared according to the hydrophobicity of the material to be prepared, improving the efficiency of determining the size of the superhydrophobic microstructure to be prepared based on the material properties and the convenience of determining the size; using the size of the microstructure when the surface contact angle of the material structure to be prepared is greater than 150 degrees and the rolling angle is less than 10 degrees as the size of the superhydrophobic microstructure, improving the accuracy of selecting the size of the superhydrophobic microstructure; using the plasma etching method to prepare the superhydrophobic microstructure, ensuring the precision of preparing the superhydrophobic microstructure and reducing the preparation cost; being able to determine the physical and chemical properties of the material structure to be prepared before preparing the superhydrophobic microstructure, facilitating the determination of preparation parameters and improving the preparation efficiency; in another feasible embodiment, if a specified material structure with a superhydrophobic microstructure having a grid structure, or a papilla structure, or a dot matrix structure on the surface is obtained, directly using the specified material structure as the material structure to be measured, improving the convenience of measuring the intrinsic contact angle; setting the superhydrophobic microstructure as a superhydrophobic microstructure with a grid structure and substituting the surface contact angle into the formula Determine the intrinsic contact angle, improve the convenience of inversely calculating the intrinsic contact angle based on the intrinsic contact angle, and improve the simplicity of preparing the superhydrophobic microstructure.

[0110] The following introduces the device for measuring the intrinsic contact angle of the material provided by the embodiments of the present invention. The device for measuring the intrinsic contact angle of the material described below can be correspondingly referred to the method for measuring the intrinsic contact angle of the material described above.

[0111] Specifically, please refer to Figure 3 , Figure 3 is a schematic structural diagram of a device for measuring the intrinsic contact angle of a material provided by an embodiment of the present invention, and may include:

[0112] An acquisition module 100, configured to acquire a material structure with a superhydrophobic microstructure on the surface as a material structure to be measured;

[0113] A measurement module 200, configured to measure the surface contact angle of the material structure to be measured in a superhydrophobic state;

[0114] A determination module 300, configured to determine the intrinsic contact angle of the material structure to be measured based on the surface contact angle according to the formula of the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state.

[0115] Further, based on any of the above embodiments, the above acquisition module 100 may include:

[0116] A material selection unit, configured to select a material structure to be prepared;

[0117] A size determination unit, configured to determine the size of the superhydrophobic microstructure to be prepared based on the material structure to be prepared;

[0118] A superhydrophobic microstructure preparation unit, configured to prepare the superhydrophobic microstructure on the surface of the material structure to be prepared based on the size as the material structure to be measured.

[0119] Further, based on any of the above embodiments, the above superhydrophobic microstructure preparation unit may include:

[0120] A grid-shaped superhydrophobic microstructure preparation subunit, configured to prepare a grid-shaped superhydrophobic microstructure on the surface of the material structure to be prepared based on the size as the material structure to be measured;

[0121] Correspondingly, the above determination module 300 may include:

[0122] A formula calculation unit, configured to substitute the surface contact angle into the formula:

[0123] , determine the intrinsic contact angle of the material structure to be measured; wherein, is the surface contact angle, is the intrinsic contact angle, is the contact area fraction between the liquid droplet and the solid surface.

[0124] Furthermore, based on any of the above embodiments, it may further include:

[0125] The intrinsic contact angle preset range determination module is used to determine the preset range of the intrinsic contact angle of the material to be prepared according to the hydrophobicity of the material to be prepared;

[0126] Correspondingly, the above-mentioned size determination unit may include:

[0127] The first size determination subunit is used to determine the size of the superhydrophobic microstructure to be prepared based on the structure of the material to be prepared and the preset range of the intrinsic contact angle.

[0128] Furthermore, based on any of the above embodiments, the above-mentioned size determination unit may include:

[0129] The second size determination subunit is used to determine the size of the microstructure when the surface contact angle of the material structure to be prepared is greater than 150 degrees and the rolling angle is less than 10 degrees as the size of the superhydrophobic microstructure.

[0130] Furthermore, based on any of the above embodiments, the above-mentioned superhydrophobic microstructure preparation unit may include:

[0131] The superhydrophobic microstructure preparation subunit is used to prepare the superhydrophobic microstructure on the surface of the material structure to be prepared based on the size by using the plasma etching method to obtain the material structure to be measured.

[0132] Furthermore, based on any of the above embodiments, the above-mentioned acquisition module 100 may include:

[0133] The material acquisition unit is used to acquire a specified material structure;

[0134] The material structure to be measured determination unit is used to use the specified material structure as the material structure to be measured if there is a superhydrophobic microstructure with a grid structure, or a superhydrophobic microstructure with a papilla structure, or a superhydrophobic microstructure with a dot matrix structure on the surface of the specified material structure.

[0135] It should be noted that the modules, units, and units in the above-mentioned material intrinsic contact angle measurement device can be changed in order before and after without affecting the logic.

[0136] Applying the measuring device for the intrinsic contact angle of the material provided by the embodiment of the present invention, which includes an acquisition module 100 for acquiring a material structure with a superhydrophobic microstructure on the surface as the material structure to be measured; a measurement module 200 for measuring the surface contact angle of the material structure to be measured in the superhydrophobic state; and a determination module 300 for determining the intrinsic contact angle of the material structure to be measured based on the surface contact angle according to the formula of the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state. The present invention provides a method for calculating the intrinsic contact angle of a material by using a material structure with a superhydrophobic microstructure on the surface as the material structure to be measured, calculating the surface contact angle in its superhydrophobic state, and then inversely deducing the intrinsic contact angle of the material based on the surface contact angle in the superhydrophobic state, thus solving the problem that specific liquids and specific materials need to be specified for calculating the intrinsic contact angle at present and eliminating the limitations of measuring the intrinsic contact angle.

[0137] The measuring device for the intrinsic contact angle of the material provided by the embodiment of the present invention will be introduced below. The measuring device for the intrinsic contact angle of the material described below can be correspondingly referred to the measuring method for the intrinsic contact angle of the material described above.

[0138] Please refer to Figure 4 , Figure 4 which is a schematic structural diagram of a measuring device for the intrinsic contact angle of a material provided by the embodiment of the present invention, and may include:

[0139] A memory 10 for storing computer programs;

[0140] A processor 20 for executing the computer program to implement the steps of the measuring method for the intrinsic contact angle of the material described above.

[0141] The memory 10, the processor 20, and the communication interface 31 all complete communication with each other through the communication bus 32.

[0142] In the embodiment of the present invention, the memory 10 is used to store one or more programs, and the program may include program codes, and the program codes include computer operation instructions. In the embodiment of the present application, the memory 10 may store programs for implementing the following functions:

[0143] Acquiring a material structure with a superhydrophobic microstructure on the surface as the material structure to be measured;

[0144] Measuring the surface contact angle of the material structure to be measured in the superhydrophobic state;

[0145] Based on the surface contact angle, determining the intrinsic contact angle of the material structure to be measured according to the formula of the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state.

[0146] In a possible implementation, the memory 10 may include a program storage area and a data storage area. The program storage area may store an operating system and application programs required for at least one function, etc.; the data storage area may store data created during use.

[0147] In addition, the memory 10 may include a read-only memory and a random access memory, and provide instructions and data to the processor. A part of the memory may also include NVRAM. The memory stores an operating system and operation instructions, executable modules or data structures, or subsets thereof, or extended sets thereof. The operation instructions may include various operation instructions for implementing various operations. The operating system may include various system programs for implementing various basic tasks and processing hardware-based tasks.

[0148] The processor 20 may be a central processing unit (CPU), an application-specific integrated circuit, a digital signal processor, a field programmable gate array or other programmable logic devices. The processor 20 may be a microprocessor or any conventional processor, etc. The processor 20 may call the program stored in the memory 10.

[0149] The communication interface 31 may be an interface of a communication module for connecting to other devices or systems.

[0150] Of course, it should be noted that Figure 4 The structure shown does not limit the device for measuring the intrinsic contact angle of materials in the embodiments of the present application. In practical applications, the device for measuring the intrinsic contact angle of materials may include more or fewer components than Figure 4 shown, or combine certain components.

[0151] Next, the storage medium provided by the embodiments of the present invention will be introduced. The storage medium described below can be mutually corresponding and referred to the method for measuring the intrinsic contact angle of materials described above.

[0152] The present invention also provides a storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the method for measuring the intrinsic contact angle of materials described above are implemented.

[0153] The storage medium may include various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks or optical discs.

[0154] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the embodiments, reference can be made to each other. For the devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple. For the relevant parts, reference can be made to the description in the method section.

[0155] Those skilled in the art can further realize that the units and algorithm steps of each example described in combination with the embodiments disclosed in this article can be implemented by electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of each example have been generally described according to functions in the above description. Whether these functions are executed in the form of hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0156] Finally, it should also be noted that in this article, relationships such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the term "including", "comprising", or any other variant is intended to cover non-exclusive inclusion, so that a process, method, article, or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or further includes elements inherent to such process, method, article, or device.

[0157] The above has introduced in detail a method, device, equipment, and storage medium for measuring the intrinsic contact angle of a material provided by the present invention. Specific examples are used in this article to elaborate on the principle and implementation manner of the present invention. The description of the above embodiments is only used to help understand the method and its core idea of the present invention; at the same time, for those of ordinary skill in the art, there will be changes in the specific implementation manner and application scope according to the idea of the present invention. In summary, the content of this specification should not be construed as a limitation to the present invention.

Claims

1. A method for measuring the intrinsic contact angle of a material, characterized in that, including: Obtain a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured; Measure the surface contact angle of the material structure to be measured in the superhydrophobic state; Based on the surface contact angle, determine the intrinsic contact angle of the material structure to be measured according to the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state.

2. The method for measuring the intrinsic contact angle of the material according to claim 1, wherein The obtaining of a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured includes: Select a material structure to be prepared; Based on the material structure to be prepared, determine the size of the superhydrophobic microstructure to be prepared; Based on the size, prepare the superhydrophobic microstructure on the surface of the material structure to be prepared as the material structure to be measured.

3. The method for measuring the intrinsic contact angle of the material according to claim 2, characterized in that, Based on the size, preparing the superhydrophobic microstructure on the surface of the material structure to be prepared as the material structure to be measured includes: Based on the size, prepare a superhydrophobic microstructure with a grating structure on the surface of the material structure to be prepared as the material structure to be measured; Correspondingly, based on the surface contact angle, determining the intrinsic contact angle of the material structure to be measured according to the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state includes: Substitute the surface contact angle into the formula: , determine the intrinsic contact angle of the material structure to be measured; wherein, is the surface contact angle, is the intrinsic contact angle, is the contact area fraction of the liquid droplet and the solid surface.

4. The method for measuring the intrinsic contact angle of the material according to claim 2, characterized in that, Before determining the size of the superhydrophobic microstructure to be prepared based on the material structure to be prepared, it further includes: According to the hydrophobicity of the material to be prepared, determine the preset range of the intrinsic contact angle of the material to be prepared; Correspondingly, based on the material structure to be prepared, determining the size of the superhydrophobic microstructure to be prepared includes: Based on the material structure to be prepared and the preset range of the intrinsic contact angle, determine the size of the superhydrophobic microstructure to be prepared.

5. The method for measuring the intrinsic contact angle of the material according to claim 2, wherein Based on the material structure to be prepared, determining the size of the superhydrophobic microstructure to be prepared includes: Determine the size of the microstructure when the surface contact angle of the material structure to be prepared is greater than 150 degrees and the rolling angle is less than 10 degrees as the size of the superhydrophobic microstructure.

6. The method for measuring the intrinsic contact angle of the material according to claim 2, wherein Based on the size, preparing the superhydrophobic microstructure on the surface of the material structure to be prepared as the material structure to be measured includes: Based on the size, use plasma etching to prepare the superhydrophobic microstructure on the surface of the material structure to be prepared to obtain the material structure to be measured.

7. The method for measuring the intrinsic contact angle of the material according to claim 1, characterized in that, The obtaining of a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured includes: Obtain a specified material structure; If there is a superhydrophobic microstructure with a grating structure, or a superhydrophobic microstructure with a papilla structure, or a superhydrophobic microstructure with a dot matrix structure on the surface of the specified material structure, then use the specified material structure as the material structure to be measured.

8. A measuring device for the intrinsic contact angle of a material, characterized in that, including: An obtaining module for obtaining a material structure with a superhydrophobic microstructure on its surface as the material structure to be measured; A measuring module for measuring the surface contact angle of the material structure to be measured in the superhydrophobic state; A determining module for determining the intrinsic contact angle of the material structure to be measured based on the surface contact angle according to the formula for the relationship between the surface contact angle and the intrinsic contact angle in the superhydrophobic state.

9. An apparatus for measuring the intrinsic contact angle of a material, characterized in that, including: A memory for storing a computer program; A processor for implementing the steps of the method for measuring the intrinsic contact angle of a material according to any one of claims 1 to 7 when executing the computer program.

10. A storage medium, characterized in that, A computer program is stored on the storage medium, and when the computer program is executed by a processor, the steps of the method for measuring the intrinsic contact angle of a material according to any one of claims 1 to 7 are implemented.