Spectroscopic device and light emission control method for light source unit in spectroscopic device

Abstract

[Problem] To provide a spectroscopic device capable of highly accurate wavelength correction in a short time, and a light emission control method for a light source unit in the spectroscopic device. [Solution] A spectroscopic device is provided with: spectroscopes (13, 34); a bright line light source unit (14, 32) that emits a bright line for wavelength correction; and a second light source unit (15, 33). The second light source section (15, 33) is configured so that direct light from the second light source section (15, 33) is irradiated to the bright light source section (14, 32).

Description

Technical Field

[0001] The present invention relates to a spectroscopic device such as a spectrocolorimeter and a method for controlling the light emission of a light source unit in the spectroscopic device. Background Art

[0002] As a spectroscopic device including a spectroscope, a bright line light source unit that emits bright lines for wavelength calibration, and a measurement light source unit, a spectroscopic device in which the bright line light source unit and the measurement light source unit are respectively arranged in a state covered by separate partition members is disclosed in Patent Document 1.

[0003] However, in the spectroscopic device described in Patent Document 1, there are the following problems.

[0004] Prior Art Documents

[0005] Patent Documents

[0006] Patent Document 1: WO 2019 / 039024 Summary of the Invention

[0007] That is, there are problems that the light emission of the bright line light source unit is unstable when starting wavelength calibration and the calibration accuracy is reduced.

[0008] In view of such problems, in order to improve the calibration accuracy, averaging processing based on multiple measurements is performed. However, due to the averaging processing, a new problem that it takes time to generate a calibration wavelength occurs.

[0009] An object of the present invention is to provide a spectroscopic device capable of performing high-precision wavelength calibration in a short time and a method for controlling the light emission of a light source unit in the spectroscopic device.

[0010] The inventors investigated the cause of the unstable light emission of the bright line light source unit when starting wavelength calibration, and as a result, found that the cause was a phenomenon called the dark effect. The dark effect refers to a phenomenon in which, when the bright line light source unit for wavelength calibration is placed in a dark part, it takes time from when voltage is applied until light emission occurs.

[0011] The present invention was completed based on such an understanding and achieves the above object by the following means.

[0012] (1) A spectroscopic device including:

[0013] A spectroscope;

[0014] A bright line light source unit that emits bright lines for wavelength calibration; and

[0015] A second light source unit,

[0016] The second light source unit is configured to irradiate the bright line light source unit with direct light from the second light source unit.

[0017] (2) A spectroscopic device, comprising:

[0018] A spectroscope;

[0019] A bright line light source unit that emits bright lines for wavelength correction; and

[0020] A second light source unit,

[0021] The second light source unit irradiates the bright line light source unit with light before starting to drive the bright line light source unit at a light intensity such that the time from starting to drive the bright line light source unit to starting to emit light is within 1 second.

[0022] (3) The spectroscopic device according to the previous item 1 or 2, wherein the spectroscopic device is a spectrocolorimeter having a diffuse reflection surface on the inner wall.

[0023] (4) The spectroscopic device according to the previous item 3, wherein the second light source unit is a measurement light source unit for the object to be measured or an observation light source unit for the surface of the object to be measured.

[0024] (5) The spectroscopic device according to the previous item 4, wherein the second light source unit is adjacent to the bright line light source unit.

[0025] (6) The spectroscopic device according to the previous item 3 citing the previous item 2, wherein the second light source unit is a measurement light source unit for the object to be measured or an observation light source unit for the surface of the object to be measured, and the second light source unit irradiates the bright line light source unit with light via the diffuse reflection surface.

[0026] (7) The spectroscopic device according to the previous item 1 or 2, wherein the spectroscopic device is a device for measuring the color of a light source.

[0027] (8) The spectroscopic device according to the previous item 7, wherein the second light source unit is adjacent to the bright line light source unit.

[0028] (9) The spectroscopic device according to the previous item 1 or 2, wherein a control unit is provided, and the control unit controls the lighting of the bright line light source unit and the second light source unit,

[0029] The control unit lights the second light source unit before performing wavelength correction.

[0030] (10) The spectroscopic device according to the previous item 1 or 2, wherein after white correction, wavelength correction using the bright line light source unit is performed.

[0031] (11)A method for controlling the light emission of a light source unit in a spectroscopic device, the spectroscopic device including a spectroscope, a bright line light source unit that emits bright lines for wavelength correction, and a second light source unit.

[0032] Before starting to drive the bright line light source unit, direct light from the second light source unit is made to irradiate the bright line light source unit.

[0033] (12)A method for controlling the light emission of a light source unit in a spectroscopic device, the spectroscopic device including a spectroscope, a bright line light source unit that emits bright lines for wavelength correction, and a second light source unit.

[0034] Before starting to drive the bright line light source, light from the second light source unit is made to irradiate the bright line light source unit at a light intensity such that the time from starting to drive the bright line light source unit to starting to emit light is within 1 second.

[0035] One spectroscopic device of the present invention includes a spectroscope, a bright line light source unit that emits bright lines for wavelength correction, and a second light source unit. The second light source unit is configured to make direct light from the second light source unit irradiate the bright line light source unit. Therefore, it is possible to make direct light from the second light source unit irradiate the bright line light source unit before starting wavelength correction. As a result, it is possible to prevent the occurrence of the dark effect. As a result, it is possible to make the bright line light source unit emit light stably in a short time when starting wavelength correction, and even without performing an averaging process, it is possible to improve the correction accuracy.

[0036] Another spectroscopic device of the present invention includes a spectroscope, a bright line light source unit that emits bright lines for wavelength correction, and a second light source unit. The second light source unit makes light irradiate the bright line light source unit before starting to drive the bright line light source at a light intensity such that the time from starting to drive the bright line light source to starting to emit light is within 1 second. By this light irradiation, it is possible to prevent the occurrence of the dark effect, and it is possible to make the bright line light source unit emit light stably within 1 second when starting wavelength correction. Even without performing an averaging process, it is possible to improve the correction accuracy.

[0037] Since the method for controlling the light emission of the light source unit in one spectroscopic device of the present invention makes direct light from the second light source unit irradiate the bright line light source unit before starting to drive the bright line light source unit, it is possible to prevent the occurrence of the dark effect. As a result, it is possible to make the bright line light source unit emit light stably in a short time when starting wavelength correction, and even without performing an averaging process, it is possible to improve the correction accuracy.

[0038] Another method for controlling the light emission of the light source unit in the spectroscopic device of the present invention uses a light intensity such that the time from the start of driving the bright line light source to the start of light emission is within 1 second. Before starting to drive the bright line light source, light from the second light source unit is irradiated onto the bright line light source unit. By this light irradiation, the occurrence of the dark effect can be prevented, and the bright line light source unit can stably emit light within 1 second when starting to correct the wavelength. Even without performing an averaging process, the calibration accuracy can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 FIG. is a cross-sectional view showing a schematic structure of a spectrocolorimeter as a spectroscopic device according to a first embodiment of the present invention.

[0040] Figure 2 FIG. shows a Figure 1 flowchart of a wavelength calibration sequence implemented by the spectrocolorimeter.

[0041] Figure 3 FIG. 3A shows a waveform diagram of the drive voltage of the bright line light source unit when light from the second light source unit is not irradiated onto the bright line light source unit. Figure 3 FIG. 3B is Figure 3 an enlarged view of the region between ba in FIG. 3A and its peripheral region.

[0042] Figure 4 FIG. 4A shows a waveform diagram of the drive voltage of the bright line light source unit when light from the second light source unit is irradiated onto the bright line light source unit. Figure 4 FIG. 4B is Figure 4 an enlarged view of the region between ba in FIG. 4A and its peripheral region.

[0043] Figure 5 FIG. is a graph showing the relationship between the dark chamber placement time of the bright line light source unit and the time from the start of driving the bright line light source unit to the start of dielectric breakdown (start of light emission).

[0044] Figure 6 FIGS. 6A - 6C show schematic structural diagrams of a spectrobrightness meter as a spectroscopic device according to a second embodiment of the present invention.

[0045] (Description of Reference Numerals)

[0046] 1: Spectrophotometer (spectroscopic device); 10: integrating sphere; 11: condenser lens; 12: entrance slit; 13: spectroscope; 101: measurement opening; 102: through-hole; 103: exit port; 131: dispersive element; 132: light receiving sensor; 14: neon lamp (bright line light source unit); 15: xenon lamp (measurement light source unit, second light source unit); 16: optical element; 17: control unit; 18: light source housing unit; 2: object to be measured; 3: spectroscopic luminance meter (spectroscopic device); 31: light receiving optical system; 32: bright line light source unit; 33: second light source unit; 34: spectroscope; 35: control unit; 36: reflecting member; 311, 312: lenses; 341: dispersive element; 342: light receiving sensor; 4: light source to be measured. Detailed Embodiment

[0047] Hereinafter, embodiments of the present invention will be described based on the drawings.

[0048] [First Embodiment]

[0049] Figure 1 It is a cross-sectional view showing a schematic structure of a spectrophotometer 1 which is a spectroscopic device according to an embodiment of the present invention.

[0050] The spectrophotometer 1 includes an integrating sphere 10, a condenser lens 11, an entrance slit 12, a spectroscope 13, a bright line light source unit 14, a measurement light source unit 15, an optical element 16, a control unit 17, etc.

[0051] The integrating sphere 10 has a diffuse reflection surface on its inner wall. A measurement opening 101 is formed at the lower part of the integrating sphere 10, and the object to be measured 2 and the measurement sample face the measurement opening 101 for measurement. On the integrating sphere 10, a through-hole 102 is formed at a position deviated by a specified angle from the central axis passing through the center of the integrating sphere 10 and the center of the measurement opening 101. A condenser lens 11 is disposed outside the through-hole 102, and an entrance slit 12 and a spectroscope 13 are also disposed outside the condenser lens 11. The spectroscope 13 includes: a dispersive element 131 such as a diffraction grating that disperses light by each wavelength; and a light receiving sensor 132 that receives light of each dispersed wavelength.

[0052] At an intermediate position in the height direction of the integrating sphere 10, a light source housing unit 18 is formed in a state of being in communication with the inside of the integrating sphere 10 via an exit port 103. The bright line light source unit 14 and the measurement light source unit (equivalent to the second light source unit) 15 are adjacently housed in the light source housing unit 18.

[0053] The bright line light source unit 14 is a light source for wavelength calibration. In this embodiment, a neon lamp is used. However, it is not limited to a neon lamp, and any light source that emits bright lines of known wavelengths for wavelength calibration can be used. Additionally, the measurement light source unit 15 is a light source for measuring the object 2 to be measured. In this embodiment, a xenon lamp is used. However, it is not limited to a xenon lamp. Furthermore, in the following description of the first embodiment, the bright line light source unit is also referred to as a neon lamp, and the measurement light source unit is also referred to as a xenon lamp.

[0054] The positional relationship between the xenon lamp 15 and the neon lamp 14 is set such that when the xenon lamp 15 emits light, the direct light from the xenon lamp 15 irradiates the neon lamp 14. Among them, the direct light includes light other than diffused light and also includes specular reflection light of the light from the xenon lamp 15. Therefore, although not shown in the figure, the positional relationship between the xenon lamp 15 and the neon lamp 14 can also be set such that the light from the xenon lamp 15 is specularly reflected by a mirror or the like, and its specular reflection light irradiates the neon lamp 14.

[0055] The optical element 16 is disposed at a position near the light exit 103 of the light source housing portion 18. Therefore, as Figure 1 indicated by the thick arrow, the light emitted from the xenon lamp 15 and the neon lamp 14 respectively passes through the optical element 16 and is emitted from the light exit 103 into the interior of the integrating sphere 10. This optical element 16 is, for example, a stray light filter.

[0056] The control unit 17 not only controls the overall spectrophotometer 1, but particularly, in this embodiment, also controls the emission of light from the xenon lamp 15 and the neon lamp 14.

[0057] To perform colorimetry on the object 2 to be measured using the Figure 1 shown spectrophotometer 1, the xenon lamp 15 is lit in a state where the object 2 to be measured faces the measurement opening 101 of the integrating sphere 10, and the light from the xenon lamp 15 is emitted from the light exit 103 into the interior of the integrating sphere 10 via the optical element 16. The emitted light is reflected and diffusely reflected multiple times on the inner wall of the integrating sphere 10. This diffusely reflected light is reflected by the surface of the object 2 to be measured. As Figure 1 indicated by the thin arrow, the reflected light from the object 2 to be measured enters the through hole 102, passes through the condenser lens 11, and then enters the spectroscope 13 via the entrance slit 12. After entering, it is dispersed into multiple wavelengths by the dispersion element 131 of the spectroscope 13. Each of the dispersed wavelengths is received by the light receiving sensor 132. Then, the measured value is calculated based on the light reception amount of the light receiving sensor 132.

[0058] Before measuring the object 2 to be measured, wavelength calibration is performed. When calibrating the wavelength, as a measurement sample, a white calibration plate is arranged at the measurement opening 101 of the integrating sphere 10 to replace the object 2 to be measured. In this state, the neon lamp 14 is lit, and the light from the neon lamp 14 is emitted into the interior of the integrating sphere 10 from the light exit 103 via the optical element 16. The emitted light is reflected multiple times on the inner wall of the integrating sphere 10 and diffusely reflected. Thereafter, the reflected light from the white calibration plate of the diffused light enters the spectroscope 13 along the same path as when measuring the object 2 to be measured, is dispersed into a specified wavelength by the dispersing element 131, and is received by the light receiving sensor 132. Then, wavelength calibration is performed by comparing the wavelength obtained by the light receiving sensor 132 with the wavelength of the bright line emitted from the neon lamp 14.

[0059] Next, referring to the flowchart showing the wavelength calibration sequence Figure 2 , the Figure 1 more detailed operation when calibrating the wavelength of the spectrocolorimeter 1 shown will be described.

[0060] After the control unit 17 lights the xenon lamp 15 as a measurement light source (step S1), white calibration is performed (step S2). The method of white calibration is well-known, so the description is omitted. During white calibration, the direct light from the xenon lamp 15 irradiates the neon lamp 14 located at an adjacent position.

[0061] Next, after the control unit 17 turns off the xenon lamp 15 (step S3), the control unit 17 starts the lighting drive of the neon lamp 14 as a bright line light source for wavelength calibration, and lights the neon lamp 14 (makes it emit light) (step S4). After lighting the neon lamp 14, wavelength calibration is performed (step S5).

[0062] In the present embodiment, as described above, before the control unit 17 starts the lighting drive of the neon lamp 14, the direct light from the xenon lamp 15 is irradiated onto the neon lamp 14. For the following reasons, the structure is provided such that the direct light from the xenon lamp 15 is irradiated onto the neon lamp 14.

[0063] That is, when the neon lamp 14 is placed in a dark part, a phenomenon called the dark effect occurs. The dark effect means that it takes time from when a voltage is applied to the neon lamp 14 until it starts to emit light, that is, from the start of the lighting drive until it starts to emit light. Due to this dark effect, the light emission of the neon lamp 14 is unstable, and the accuracy of wavelength calibration is reduced. In addition, if averaging processing based on multiple measurements is performed to compensate for the reduction in the accuracy of wavelength calibration, etc., it takes time to calibrate the wavelength.

[0064] Therefore, before the control unit 17 starts the lighting drive of the neon lamp 14, the xenon lamp 15 is made to emit light, and the direct light from the xenon lamp 15 is irradiated onto the neon lamp 14. Thereby, it is possible to prevent the neon lamp 14 from being started to be driven while being kept in a dark portion, and to prevent the dark effect. As a result, the light emission of the neon lamp 14 is stabilized earlier, and the accuracy of wavelength correction is improved. In addition, it is not necessary to perform an averaging process based on multiple measurements, and accordingly, wavelength correction can be performed in a short time.

[0065] Reference Figure 3 3A, 3B, and Figure 4 4A, 4B of are used to explain the effect when the direct light from the xenon lamp 15 is irradiated onto the neon lamp 14 before the control unit 17 starts the lighting drive of the neon lamp 14.

[0066] Figure 3 3A of is a waveform diagram of the drive voltage of the neon lamp 14 when the light from the xenon lamp 15 is not irradiated onto the neon lamp 14. Figure 3 3B of is Figure 3 an enlarged view of the region between ba and its peripheral region of 3A of. In these figures, the horizontal axis represents time, and the vertical axis represents voltage. In addition, the b line represents the timing of starting to apply the drive voltage to the neon lamp 14, that is, the timing of starting the drive. The a line represents the timing of starting to light the neon lamp 14 (make it emit light). In addition, "Xe" represents the drive voltage for the xenon lamp 15, and "Ne" represents the drive voltage for the neon lamp 14.

[0067] In Figure 3 the example shown in 3A and 3B of, it is assumed that the neon lamp 14 is driven after being placed in a dark room for 10 minutes. The xenon lamp 15 is not lit. In Figure 3 3A and 3B of, the time from the timing b to the timing a is 84.0 ms, the voltage difference (applied voltage) between ba is 160 V, and the time for applying the high voltage of 160 V is 40 ms. That is, by applying the high voltage of 160 V for 40 ms, the dielectric breakdown of the neon lamp 14 is started, and the lighting (light emission) is started.

[0068] Figure 4 4A of is a waveform diagram of the drive voltage of the neon lamp 14 when the direct light from the xenon lamp 15 is irradiated onto the neon lamp 14. Figure 4 4B of is Figure 4 an enlarged view of the region between ba and its peripheral region of 4A of. In these figures, the horizontal axis represents time, and the vertical axis represents voltage. In addition, the b line represents the timing of starting to apply the drive voltage to the neon lamp 14, that is, the timing of starting the drive. The a line represents the timing of starting to light the neon lamp 14 (make it emit light). In addition, "Xe" represents the drive voltage for the xenon lamp 15, and "Ne" represents the drive voltage for the neon lamp 14.

[0069] In Figure 4In the examples shown in FIGS. 4A and 4B, it is assumed that the neon lamp 14 is placed in a dark room for 2 hours and then driven. Before starting the drive, during the period described as "Xe lighting period" in Figure 4 of FIG. 4A, the xenon lamp 15 is lit, and the direct light from the xenon lamp 15 is irradiated onto the neon lamp 14. In Figure 4 of FIGS. 4A and 4B, the time from timing b to timing a is 36.6 ms, and the voltage difference (applied voltage) between b and a is 110 V.

[0070] By comparing Figure 3 of FIGS. 3A and 3B with Figure 4 of FIGS. 4A and 4B, the following can be known. That is, it can be known that by irradiating the direct light from the xenon lamp 15 onto the neon lamp 14 before starting to drive the neon lamp 14, the dielectric breakdown of the neon lamp 14 starts stably at a low voltage in a short time and starts to light up (emit light).

[0071] Figure 5 is a graph showing the relationship between the dark room placement time of the neon lamp 14 and the time from starting to drive the neon lamp 14 until dielectric breakdown (starting to emit light) occurs. The horizontal axis is the dark room placement time (Wait Time), and the vertical axis is the time from starting to drive until dielectric breakdown starts (Break Down Start Time). The unit of time is "s" in both cases.

[0072] Assuming that it is placed in a dark room for about 90 min (5400 s), as shown by the rightmost black dot, the result is that it takes about 1 s (1 second) from starting to drive until starting to emit light. As the placement time in the dark room becomes longer, the time until starting to emit light also becomes longer.

[0073] The light irradiation intensity and wavelength range of the neon lamp 14 can be set so that the time from starting to drive the neon lamp 14 until starting to emit light is 1 s or less. It is preferably set to 0.1 s or less, and in the case of performing wavelength correction at a higher speed, it can be set to 50 ms or less.

[0074] In this way, after the control unit 17 irradiates the light from the xenon lamp 15 onto the neon lamp 14 to suppress the occurrence of the dark effect, it starts to drive the neon lamp 14 to light up the neon lamp 14. After lighting, wavelength correction is performed.

[0075] As described above, one embodiment of the spectrophotometer 1 of the present invention has been described, but the structure of the spectrophotometer 1 is not limited to the above embodiment.

[0076] For example, the light from the neon lamp 14 and the xenon lamp 15 is made to exit from the same light exit port 103 into the interior of the integrating sphere 10, but different light exit ports may also be formed. However, the light leakage during multiple reflections inside the integrating sphere 10 is proportional to the area of the opening. Therefore, when multiple light exit ports are provided for each light source, the light leakage increases and the amount of light irradiated to the neon lamp 14 decreases. As Figure 1 shown, the neon lamp 14 and the xenon lamp 15 are arranged in one light source housing portion 18 so as to exit from one light exit port 103. Thereby, the light leakage of the light reflected multiple times inside the integrating sphere 10 can be suppressed, and the light of the xenon lamp 15 can be efficiently irradiated to the neon lamp 14.

[0077] In addition, the case where the direct light from the xenon lamp 15 is irradiated to the neon lamp 14 has been described, but the diffused light of the light from the xenon lamp 15 may also be irradiated to the neon lamp 14. However, compared with the case of irradiating diffused light, irradiating the direct light from the xenon lamp 15 to the neon lamp 14 can shorten the time until the neon lamp starts to emit light with a smaller amount of emitted light. In addition, the direct light and the diffused light may be irradiated to the neon lamp 14 simultaneously.

[0078] In addition, the second light source unit that irradiates light to the neon lamp 14 is not limited to Figure 1 the measurement light source unit 15 of the embodiment, and may also be an observation light source unit. The observation light source unit refers to the light source unit used when a viewfinder unit is provided in the spectrocolorimeter 1 and the position of the object to be measured 2 is confirmed through the viewfinder unit. The observation light source unit may be a dedicated light source unit. Or it may also be used in combination with the measurement light source unit 15. In addition, the second light source unit may also be an LED lamp or the like. <0000>

[0079] In addition, the second light source unit may not be adjacent to the bright line light source unit 14, but near the bright line light source unit 14. Or, the second light source unit may also be configured to irradiate light to the bright line light source unit 14 via a diffuse reflection surface. When the second light source unit is a light source with low directivity such as a lamp, the inner wall near each light source of the light source housing portion 18 including the vicinity of the light exit port 103 can be used as a diffuse reflection surface with a high reflectivity. In this case, the light from each of the light source units 14 and 15 can also efficiently pass into the integrating sphere 10, and the amount of light on the measurement surface of the object to be measured 2 can be increased.

[0080] In addition, in Figure 1 the spectrocolorimeter 1 shown, since the optical element 16 common to each of the light source units 14 and 15 is arranged near the light exit port 103, each of the light source units 14 and 15 can obtain the effect of the same optical element 16. As the optical element 16, in addition to a stray light prevention filter, an ultraviolet cut filter, and a neutral density (ND) filter for adjusting the light amount, a diffusion plate or the like that can obtain the effect of improving robustness can also be used.

[0081] [Second Embodiment]

[0082] Figure 6 Figs. 6A - 6C are schematic structural diagrams of a spectral radiance meter 3 of a spectral device according to the second embodiment of the present invention. This spectral radiance meter 3 is used to measure the luminance of a light source 4 to be measured such as a display.

[0083] Figure 6 The spectral radiance meter 3 shown in Figs. 6A - 6C includes a light receiving optical system 31 including a plurality of lenses 311 and 312 through which light emitted from the light source 4 to be measured passes, a bright line light source unit 32, a second light source unit 33, a spectroscope 34, a control unit 35, a reflection member 36, etc.

[0084] As the bright line light source unit 32, a neon lamp or the like is used, but not limited thereto. As the second light source unit 33, a xenon lamp, a neon lamp, an LED lamp or the like is used, but not limited thereto.

[0085] The bright line light source unit 32 and the second light source unit 33 are arranged adjacent to each other so that direct light from the second light source unit 33 irradiates the bright line light source unit 32 when the second light source unit 33 emits light. Among them, the direct light also includes specularly reflected light of the light from the second light source unit 33. Therefore, although not shown, the arrangement relationship between the second light source unit 33 and the bright line light source unit 32 can also be set such that the light from the second light source unit 33 is specularly reflected by a mirror or the like, and its specularly reflected light irradiates the bright line light source unit 32. In addition, it can also be configured such that diffused light of the light from the second light source unit 33 irradiates the bright line light source unit 32.

[0086] The spectroscope 34 includes: a dispersion element 341 such as a diffraction grating that disperses light by each wavelength; and a light receiving sensor 342 that receives light of each wavelength after dispersion. In addition, an entrance slit can also be provided on the upstream side of the spectroscope 34.

[0087] In addition to overall controlling the entire spectral radiance meter 3, the control unit 35 particularly controls the light emission of the second light source unit 33 and the bright line light source unit 32 in this embodiment.

[0088] The reflection member 36 is driven by a driving device (not shown) so as to move forward to or retreat from the optical axes of the lenses 311 and 312 at a position between the lenses 311 and 312. When measuring the color of the light source 4 to be measured, the reflection member 36 retreats from the optical axes of the lenses 311 and 312. When correcting the wavelength, the reflection member 36 moves forward to the optical axes of the lenses 311 and 312, reflects the light from the bright line light source unit 32, and guides it to the spectroscope 34.

[0089] Next, Figure 6 the operation of the spectral radiance meter 3 shown in Figs. 6A - 6C will be described.

[0090] When measuring the color of the light source 4 to be measured, as shown in Figure 6 6A, the reflection member 36 exits from the optical axes of the lenses 311 and 312. The light emitted from the light source 4 to be measured enters the spectroscope 34 through the lenses 311 and 312, and is dispersed into multiple wavelengths by the dispersion element 341 of the spectroscope 34. Each of the dispersed wavelengths is received by the light receiving sensor 342. Then, the measured value is calculated based on the light receiving amount of the light receiving sensor 342.

[0091] Before measuring the light source 4 to be measured, wavelength calibration is performed. The bright line light source unit 32 is lit for wavelength calibration, but as shown in Figure 6 6B, before starting to drive the bright line light source unit 32, the control unit 35 lights the second light source unit 33. By lighting the second light source unit 33, the direct light from the second light source unit 33 is irradiated onto the bright line light source unit 32. By the irradiation of the light from the second light source unit 33, the dark effect that occurs when the bright line light source unit 32 is placed in the dark is prevented.

[0092] The light irradiation intensity and wavelength range of the bright line light source unit 32 can be set so that the time from starting to drive the bright line light source unit 32 to starting to emit light is 1 s or less. It is preferably set to 0.1 s or less, and can be set to 50 ms or less when performing wavelength calibration at a higher speed.

[0093] In this way, after the control unit 35 irradiates the light from the second light source unit 33 onto the bright line light source unit 32 to suppress the occurrence of the dark effect, it starts to drive the bright line light source unit 32 and lights the bright line light source unit 32. After lighting, wavelength calibration is performed. When calibrating the wavelength, as shown in Figure 6 6C, the reflection member 36 advances onto the optical axes of the lenses 311 and 312, reflects the light from the bright line light source unit 32, and guides it to the spectroscope 34. The light from the bright line light source unit 32 incident on the spectroscope 34 is dispersed into a specified wavelength by the dispersion element 341 and received by the light receiving sensor 342. Then, wavelength calibration is performed by comparing the wavelength obtained by the light receiving sensor 342 with the wavelength of the bright line emitted from the bright line light source unit 32.

[0094] In the Figure 6 embodiment shown, the case where the spectroscopic device is a spectroscopic radiance meter is shown, but the spectroscopic device can also be a spectral illuminance meter that measures the illuminance of the light source 4 to be measured, etc.

Claims

1. A spectroscopic device, comprising: A spectroscope; A bright line light source unit that emits bright lines for wavelength calibration; and A second light source unit, The second light source unit is configured to irradiate direct light from the second light source unit onto the bright line light source unit.

2. A spectroscopic device, comprising: A spectroscope; A bright line light source unit that emits bright lines for wavelength calibration; and A second light source unit, The second light source unit irradiates light onto the bright line light source unit before starting to drive the bright line light source, with a light intensity such that the time from starting to drive the bright line light source unit to starting to emit light is within 1 second.

3. The spectroscopic device according to claim 1 or 2, wherein The spectroscopic device is a spectrocolorimeter having a diffuse reflection surface on its inner wall.

4. The spectroscopic device according to claim 3, wherein, The second light source unit is a measurement light source unit for the object to be measured or an observation light source unit for the surface of the object to be measured.

5. The spectroscopic device according to claim 4, wherein, The second light source unit is adjacent to the bright line light source unit.

6. The spectroscopic device according to claim 3, which cites claim 2, wherein, The second light source unit is a measurement light source unit for the object to be measured or an observation light source unit for the surface of the object to be measured, and the second light source unit irradiates light onto the bright line light source unit via the diffuse reflection surface.

7. The spectroscopic device according to claim 1 or 2, wherein The spectroscopic device is a device for measuring the color of a light source.

8. The spectroscopic device according to claim 7, wherein, The second light source unit is adjacent to the bright line light source unit.

9. The spectroscopic device according to claim 1 or 2, wherein It includes a control unit that controls the lighting of the bright line light source unit and the second light source unit, The control unit lights the second light source unit before performing wavelength calibration.

10. The spectroscopic device according to claim 1 or 2, wherein, After white calibration, wavelength calibration using the bright line light source unit is performed.

11. A method for controlling the light emission of a light source unit in a spectroscopic device, the spectroscopic device comprising a spectroscope, a bright line light source unit that emits bright lines for wavelength calibration, and a second light source unit, Before starting to drive the bright line light source unit, direct light from the second light source unit is irradiated onto the bright line light source unit.

12. A method for controlling the light emission of a light source unit in a spectroscopic device, the spectroscopic device comprising a spectroscope, a bright line light source unit that emits bright lines for wavelength calibration, and a second light source unit, Before starting to drive the bright line light source unit, light from the second light source unit is irradiated onto the bright line light source unit with a light intensity such that the time from starting to drive the bright line light source unit to starting to emit light is within 1 second.

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