Gas concentration controlled interferometric imaging system for nozzle handle correction

Abstract

The present invention relates to the field of optical technology, and more particularly to a gas concentration controlled interferometric imaging system for nozzle handle correction. The system comprises a correction tool and a nozzle. The correction tool is provided with a downward pressing mechanism having a downward pressing telescopic column for correcting the nozzle handle. The correction tool is equipped with a displacement measuring interferometer system. The displacement measuring interferometer system also comprises a reflective mirror and a beam splitter, with the reflective mirror mounted on the downward pressing telescopic column. The displacement measuring interferometer system also comprises an interference optical path stroke difference fine-tuning system. The interference optical path stroke difference fine-tuning system comprises a glass container containing sulfur hexafluoride, with both ends of the glass container having flat and transparent end surfaces. The glass container is positioned in an optical path between the beam splitter and the reflective mirror, with the end surfaces of the glass container perpendicular to the laser beam on the optical path. The glass container is provided with an air supply port connected to an air pump connected to a sulfur hexafluoride gas source. The correction position of the nozzle handle is precisely controlled.

Description

Technical Field

[0001] The present invention relates to the field of optical technology, in particular to a laser interference system. Background Art

[0002] Jet engine nozzles are critical components. Typically made from high-temperature alloys, they must withstand extreme temperatures and pressures. During the manufacturing process, thermal deformation or mechanical stress can cause geometric deviations, necessitating corrective tooling to restore the designed dimensions.

[0003] The deformation of the nozzle handle is one of the important factors affecting the performance and structural integrity of the nozzle. The nozzle has thin-walled and multi-curvature characteristics. The correction of the nozzle handle after deformation requires precise control of the correction position to avoid excessive correction and damage to the nozzle handle. Summary of the Invention

[0004] The purpose of this section is to summarize some aspects of the embodiments of the present invention and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this section and the abstract of the specification and the title of the invention of this application to avoid blurring the purpose of this section, the abstract of the specification and the title of the invention, and such simplifications or omissions cannot be used to limit the scope of the invention.

[0005] In view of the above problems existing in the prior art, the present invention is proposed.

[0006] In order to solve the above technical problems, the present invention provides the following technical solutions:

[0007] A gas concentration control interference imaging system for nozzle handle correction is provided, wherein a correction tool and a nozzle are prepared. The nozzle includes a nozzle handle. The correction tool is provided with a downward pressing mechanism. The downward pressing mechanism has a downward pressing telescopic column for correcting the nozzle handle.

[0008] The orthopedic tool is equipped with a displacement measuring interferometer system;

[0009] Also included is a displacement measurement interferometer system having a reflective moving mirror and a beam splitter, wherein the reflective moving mirror is mounted on a downward-pressing telescopic column;

[0010] The optical path between the reflective mirror and the beam splitter is parallel to the extension direction of the downward-pressing telescopic column;

[0011] The displacement measurement interferometer system also includes an interference optical path travel difference fine-tuning system;

[0012] The interference optical path travel difference fine-tuning system includes a glass container containing sulfur hexafluoride, the end surfaces of both ends of the glass container are flat and transparent, and the glass container is arranged on the optical path between the beam splitter and the reflective moving mirror;

[0013] The end faces of both ends of the glass container are perpendicular to the laser on the optical path;

[0014] The glass container is provided with an air supply port;

[0015] The air supply port is connected to an air pump, which is connected to a sulfur hexafluoride gas source;

[0016] Nozzle handle correction process:

[0017] S1: A selected standard nozzle is installed in the orthopedic tool, and the pressing end of the pressing mechanism is pressed down to one end of the standard nozzle handle;

[0018] Mechanically adjusting the position of the reflective moving mirror on the downward telescopic column of the downward pressing mechanism to obtain a preliminary interference image;

[0019] S2: The concentration of sulfur hexafluoride in the glass container is adjusted by an air pump. By taking advantage of the physical property that the speed of light in air is greater than that in sulfur hexafluoride, the optical path difference is precisely adjusted to adjust the preliminary interference image and obtain a standard interference image.

[0020] S3: Remove the standard nozzle and install the nozzle that needs to be corrected into the correction tooling. The image of the displacement measurement interferometer system is the actual interference image. The downward pressing telescopic column is pressed down until the actual interference image is similar to the classical interference image. The downward pressing mechanism is stopped to complete the correction of the nozzle handle to be corrected.

[0021] The above-mentioned design and technical solution for nozzle handle correction significantly improve the correction accuracy of the correction tool's downward pressure mechanism by utilizing a displacement measurement interferometer system. The correction tool is driven by a microcontroller system. The displacement measurement interferometer system currently uses a MOS camera that receives interferometric images. Preliminary adjustments can be made by mechanically adjusting the position of the reflective mirror mounted on the downward pressure telescopic column to produce a preliminary interference image. Using this preliminary interference image to calibrate the downward pressure telescopic column's position improves correction accuracy.

[0022] Mechanically adjusting the position of the reflective moving mirror for preliminary adjustment, the accuracy of the preliminary interference image obtained is somewhat lacking. After introducing the interference optical path difference fine-tuning system, the concentration of sulfur hexafluoride in the glass container can be adjusted by an air pump. The concentration of sulfur hexafluoride affects the time required for light to pass through it, and the optical path difference is adjusted accordingly to improve the accuracy of adjusting the optical path difference. The end faces of the glass container are flat and transparent. The glass container is set on the optical path between the beam splitter and the reflective moving mirror. The end faces of the glass container are perpendicular to the laser on the optical path. By adjusting the sulfur hexafluoride gas source in the glass container, the optical path difference can be adjusted, thereby improving the adjustment accuracy. A larger amount of gas can be adjusted, which is equivalent to the effect of precisely adjusting the optical path difference between the reflective moving mirror and the beam splitter, so the adjustment accuracy is greatly improved.

[0023] The refractive index of air is about 1.0003, and the speed of light in air is generally 3×10 8 m / s.

[0024] The refractive index of sulfur hexafluoride in the gaseous state is approximately 1.00087 at 25°C, which is a commonly used typical value. At this time, the speed of light is approximately 2.9987×10 8 m / s. The actual value will vary slightly depending on pressure, purity, and specific temperature. In a fixed container, the higher the sulfur hexafluoride concentration, the higher the refractive index and the slower the speed of light.

[0025] When the concentration of sulfur hexafluoride gas is increased to 10 times, the refractive index of light is about 1.0087 and the speed of light is 2.973×10 8 m / s. The speed of light is 0.0257×10 8 m / s. If the distance between the two ends of the glass container is 10 cm, this corresponds to a displacement of the reflective mirror of 0.39 mm. This allows for large gas adjustments and small adjustments to the optical path difference between the beam splitter and the reflective mirror. This enables high-precision optical path difference adjustment, resulting in higher-precision standard interference images.

[0026] During calibration, the displacement measurement interferometer system's built-in structure is first used for preliminary calibration. In the subsequent adjustment process, the MOS camera calculates the displacement by observing the interference fringes. When it detects that the actual interference image at the calibration position is similar to the standard interference image, the microcontroller system stops the downward pressure mechanism to complete the correction. The standard interference image is obtained, and the precise adjustment accuracy of the interference optical path travel difference fine-tuning system is higher to meet the needs of jet engine nozzles.

[0027] The microprocessor system can also control the upper correction mechanism to perform detailed micro-corrections repeatedly after reaching the calibration position to cope with the correction rebound and improve the accuracy of the correction.

[0028] The positioning and assembly of the standard nozzle handle are used to determine the calibration position. Before calibration, the beam splitter and reflective mirror are first adjusted to or near the equal optical path using the interference optical path difference fine-tuning system. After the pressing mechanism contacts one end of the nozzle handle, a clear standard interference pattern is recorded with a MOS camera to calibrate the calibration position. The standard nozzle is then removed and the nozzle to be corrected is installed. The microprocessor and MOS camera implement closed-loop control of the pressing mechanism, driving it to press down on one end of the nozzle handle until the MOS camera again detects the recorded interference pattern, confirming that the calibration position has been reached. During this process, the microprocessor system records the total displacement L1. After reaching the calibration position, the pressing mechanism is fully withdrawn, and the nozzle handle partially rebounds. The nozzle is then lightly touched again without applying correction force. The microprocessor system measures the current position and compares it with the pre-correction reference position to obtain the residual displacement L2. The rebound amount is calculated by subtracting L2 from L1. After that, the upper correction mechanism is fine-tuned based on the rebound amount until the nozzle meets the requirements.

[0029] Preferably, the orthopedic tool further comprises a lower abutment and a clamping mechanism; the lower abutment abuts against the bottom of the nozzle handle, the downward-pressing telescopic column presses one end of the nozzle handle in the orthopedic tool, and the clamping mechanism clamps the other end of the nozzle handle in the orthopedic tool; the lower abutment is disposed between the downward-pressing mechanism and the clamping mechanism. By providing the lower abutment and the clamping mechanism, the lower abutment abuts against the bottom of the nozzle handle and the clamping mechanism clamps the other end of the nozzle handle, facilitating downward correction of one end of the nozzle handle by the downward-pressing telescopic column.

[0030] Preferably, the clamping mechanism includes two clamps and two cylinders, with the two clamps respectively clamping the other end of the nozzle handle from two sides above the other end of the nozzle handle; one clamp and one cylinder are provided in pairs, and each pair of clamps and cylinders are rotatably engaged, with a bidirectional ratchet mechanism provided between each pair of clamps and cylinders. A bidirectional ratchet mechanism is provided between the clamps and cylinders of the clamping mechanism to prevent the clamps from loosening, and the nozzle handle can also be loosened by reversing the ratchet mechanism to move the clamps.

[0031] Preferably, the lower stopper abuts between one-third and two-thirds of the nozzle stem's length; a cavity is provided above the lower stopper to fit the nozzle stem. This allows the lower portion of the nozzle stem to be supported by the lower stopper, while the cavity prevents additional deformation during correction, thereby improving the quality of nozzle stem correction.

[0032] Preferably, a support rod for mounting the reflective mirror is connected to the side of the downward telescopic column; the support rod is provided with a reinforcing rib structure. This allows the optical path between the beam splitter and the reflective mirror to avoid the nozzle structure. The reinforcing rib structure reduces vibration of the reflective mirror and improves the imaging quality of the displacement measurement interferometer system.

[0033] Preferably, the orthopedic tool is equipped with another displacement measuring interferometer system, comprising another reflective mirror and another beam splitter; the optical path between the other reflective mirror and the other beam splitter is parallel to the extension and retraction direction of the downward telescopic column; another support rod is connected to the side of the downward telescopic column to mount the other reflective mirror; the other support rod forms an angle of at least 90° with the other support rods. The two displacement measuring interferometer systems share a microprocessor system, capable of measuring the displacement of the downward telescopic column from two different positions, thereby forming two standard interference images. The two standard interference images can be compared and calibrated with each other to further improve accuracy and prevent unexpected deformation of thin-walled parts during multiple extrusions in different directions.

[0034] Preferably, a gas relief pipe is provided on the sidewall of the glass container, wherein a pressure relief valve is installed in the gas relief pipe. The gas relief pipe is connected to a gas recovery system. The gas relief pipe facilitates the pressure relief and exhaust of sulfur hexafluoride gas in the glass container, thereby facilitating the concentration adjustment of the glass container. The gas recovery system can recover sulfur hexafluoride, thus saving costs.

[0035] Preferably, the glass container is further provided with an air pressure sensor, the sensing end of which is disposed within the glass container. The interferometric optical path travel difference fine-tuning system also includes a temperature control system for controlling the temperature of the sulfur hexafluoride in the glass container. The temperature control system includes a semiconductor cooling element encased in the glass container. The temperature control system also includes an infrared thermal sensor, the sensing end of which points toward the interior of the glass container. The air pressure sensor measures the air pressure and calculates the sulfur hexafluoride gas concentration in the glass container, thereby improving the accuracy of controlling changes in gas concentration within the glass container. The pressure sensor measures the air pressure to obtain the sulfur hexafluoride concentration, but changes in the air pressure of the glass container vary with temperature. As the concentration of the glass container increases, the temperature increases. Based on the temperature measured by the infrared thermal sensor, the semiconductor cooling element can be used to lower the temperature of the glass container, adjusting the glass container to maintain a constant temperature of the sulfur hexafluoride in the glass container. This improves the measurement accuracy of the air pressure sensor, thereby improving the accuracy of adjusting the sulfur hexafluoride gas concentration and achieving higher measurement precision in the displacement measurement interferometer system.

[0036] Furthermore, the temperature control system includes an insulating layer wrapped around the glass container, the insulating layer enclosing the semiconductor cooling chip; the insulating layer avoids the ends of the glass container; and the glass at the ends of the glass container is vacuum-insulated glass. The insulating layer reduces the impact of external temperature on the temperature changes of the glass container, reduces temperature fluctuations of the glass container, and improves the accuracy of sulfur hexafluoride gas concentration adjustment.

[0037] Furthermore, the temperature control system includes a heating wire wrapped around the side wall of the glass container and encased in a heat-insulating layer. The heating wire can increase the temperature of the glass container, heating the glass container according to the temperature measured by the infrared heat sensor, thereby maintaining a constant temperature of the sulfur hexafluoride in the glass container.

[0038] Preferably, the inner cross-sectional area of ​​the glass container is greater than 5.5 square centimeters, and the inner length of the glass container is no less than 12 centimeters. By using a larger glass container, more gas can be added to change the gas concentration in the glass container. This allows for a less precise air pump to be used, allowing for precise gas concentration adjustment.

[0039] In summary, the present invention has the following beneficial effects:

[0040] The position of the compression and expansion end is obtained through the actual interference image of the displacement measurement interferometer system. After the actual interference image is approximated with the standard interference image, the correction position is determined to improve the correction quality of the nozzle handle.

[0041] The interferometric optical path difference fine-tuning system allows the glass container to adjust the sulfur hexafluoride gas concentration to achieve a smaller optical path difference between the beam splitter and the reflective mirror, while maintaining a relatively large gas concentration. This significantly improves the accuracy of optical path difference adjustment, resulting in a more precise standard interference pattern. Comparing the actual interference pattern with the standard interference pattern allows for more precise adjustment of the telescopic column, resulting in improved correction quality for the nozzle handle. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be derived from these drawings without inventive work. Among them:

[0043] Figure 1 Schematic diagram of the internal structure of the gas concentration control interference imaging system for nozzle handle correction of the present invention;

[0044] Figure 2 A schematic diagram showing the internal structure of the gas concentration control interference imaging system for nozzle handle correction according to the present invention from another perspective;

[0045] Figure 3 Schematic diagram of the complete structure of the gas concentration control interference imaging system for nozzle handle correction of the present invention;

[0046] Figure 4This is a schematic diagram from another perspective of the complete structure of the gas concentration control interference imaging system for nozzle handle correction of the present invention.

[0047] In the figure, 1. orthopedic tool; 2. nozzle handle; 3. downward pressing telescopic column; 31. support rod; 4. reflective dynamic mirror; 5. beam splitter; 6. glass container; 7. air pump; 81. chuck; 82. cylinder; 9. lower support block. DETAILED DESCRIPTION

[0048] In order to make the above-mentioned objects, features and advantages of the present invention more clearly understood, the specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0049] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0050] Next, the present invention is described in detail with reference to schematic diagrams. For ease of illustration, when describing embodiments of the present invention, cross-sectional views illustrating device structures may be partially enlarged and not to scale. Furthermore, these schematic diagrams are merely illustrative and should not limit the scope of protection of the present invention. Furthermore, in actual production, three-dimensional dimensions, including length, width, and depth, should be included.

[0051] Furthermore, the term "one embodiment" or "embodiment" herein refers to a specific feature, structure, or characteristic that may be included in less than one implementation of the present invention. The phrase "in one embodiment" appearing in various places throughout this specification does not necessarily refer to the same embodiment, nor does it necessarily refer to a single embodiment or a selective embodiment that is mutually exclusive of other embodiments.

[0052] Example 1, reference Figures 1-4 , a gas concentration control interference imaging system applied to nozzle handle correction, prepares a correction tool 1 and a nozzle, the nozzle includes a nozzle handle 2, the correction tool 1 is provided with a downward pressing mechanism, and the downward pressing mechanism has a downward pressing telescopic column 3 for correcting the nozzle handle 2.

[0053] The orthopedic tool 1 is equipped with a displacement measuring interferometer system;

[0054] It also includes a displacement measurement interferometer system having a reflective mirror 4 and a beam splitter 5, wherein the reflective mirror 4 is mounted on a downward-pressing telescopic column 3;

[0055] The optical path between the reflective mirror 4 and the beam splitter 5 is parallel to the extension direction of the downward-pressing telescopic column 3;

[0056] The displacement measurement interferometer system also includes an interference optical path travel difference fine-tuning system;

[0057] The interference optical path travel difference fine-tuning system includes a glass container 6 containing sulfur hexafluoride. The end surfaces of both ends of the glass container 6 are flat and transparent. The glass container 6 is arranged on the optical path between the beam splitter 5 and the reflective mirror 4.

[0058] The end faces of the glass container 6 are perpendicular to the laser light path;

[0059] The glass container 6 is provided with an air supply port;

[0060] The air supply port is connected to an air pump 7, and the air pump 7 is connected to a sulfur hexafluoride gas source;

[0061] Nozzle handle 2 correction process:

[0062] S1: A selected standard nozzle is installed in the orthopedic tool 1, and the pressing end of the pressing mechanism is pressed down to one end of the standard nozzle handle 2;

[0063] Mechanically adjust the reflective dynamic mirror 4 to the position of the downward pressing telescopic column 3 of the downward pressing mechanism to obtain a preliminary interference image;

[0064] S2: The concentration of sulfur hexafluoride in the glass container 6 is adjusted by the air pump 7. By utilizing the physical property that the speed of light in air is greater than that in sulfur hexafluoride, the optical path difference is precisely adjusted to adjust the preliminary interference image and obtain a standard interference image.

[0065] S3: Remove the standard nozzle and install the nozzle to be corrected into the correction tool 1. The image of the displacement measurement interferometer system is the actual interference image. The downward pressing telescopic column 3 is pressed down until the actual interference image is similar to the classical interference image. The downward pressing mechanism is stopped to complete the correction of the nozzle handle 2 to be corrected.

[0066] With the above design, the nozzle handle 2 can be corrected by adopting the above technical solution. The downward pressure mechanism of the correction tool 1 can significantly improve correction accuracy by utilizing a displacement measurement interferometer system. The correction tool 1 is driven by a microcontroller system. The displacement measurement interferometer system is equipped with a MOS camera for receiving interferometric images. The position of the reflective mirror 4 mounted on the downward pressure telescopic column 3 can be adjusted initially by mechanically adjusting the position to obtain a preliminary interference image. Calibration of the downward pressure telescopic column 3 using this preliminary interference image improves correction accuracy.

[0067] The position of the reflective moving mirror 4 is mechanically adjusted for preliminary adjustment, and the accuracy of the preliminary interference image obtained is somewhat lacking. After the interference optical path difference fine-tuning system is introduced, the concentration of sulfur hexafluoride in the glass container 6 can be adjusted by relying on the air pump 7. The concentration of sulfur hexafluoride affects the time required for light to pass through it, and the optical path difference is adjusted accordingly, thereby improving the accuracy of adjusting the optical path difference. The end faces of the glass container 6 are flat and transparent. The glass container 6 is set on the optical path between the beam splitter 5 and the reflective moving mirror 4. The end faces of the glass container 6 are perpendicular to the laser on the optical path. By adjusting the sulfur hexafluoride gas source in the glass container 6, the optical path difference can be adjusted, thereby improving the accuracy of the adjustment. A large amount of gas can be adjusted, which is equivalent to the effect of precisely adjusting the optical path difference between the reflective moving mirror 4 and the beam splitter 5, so the adjustment accuracy is greatly improved.

[0068] The refractive index of air is about 1.0003, and the speed of light in air is generally 3×10 8 m / s.

[0069] The refractive index of sulfur hexafluoride in the gaseous state is approximately 1.00087 at 25°C, which is a commonly used typical value. At this time, the speed of light is approximately 2.9987×10 8 m / s. The actual value will vary slightly depending on pressure, purity, and specific temperature. In a fixed container, the higher the sulfur hexafluoride concentration, the higher the refractive index and the slower the speed of light.

[0070] When the concentration of sulfur hexafluoride gas is increased to 10 times, the refractive index of light is about 1.0087 and the speed of light is 2.973×10 8 m / s. The speed of light is 0.0257×10 8 m / s. If the distance between the two ends of the glass container 6 is 10 cm, this is equivalent to a displacement of the reflective mirror 4 of 0.39 mm. This allows for relatively large gas adjustments and smaller adjustments to the optical path difference between the beam splitter 5 and the reflective mirror 4. This allows for highly precise optical path difference adjustment, resulting in a more accurate standard interference image.

[0071] During calibration, the displacement measurement interferometer system's built-in structure is first used for preliminary calibration. In the subsequent adjustment process, the MOS camera calculates the displacement by observing the interference fringes. When it detects that the actual interference image at the calibration position is similar to the standard interference image, the microcontroller system stops the downward pressure mechanism to complete the correction. The standard interference image is obtained, and the precise adjustment accuracy of the interference optical path travel difference fine-tuning system is higher to meet the needs of jet engine nozzles.

[0072] The microprocessor system can also control the upper correction mechanism to perform detailed micro-corrections repeatedly after reaching the calibration position to cope with the correction rebound and improve the accuracy of the correction.

[0073] The positioning and assembly of the standard nozzle handle 2 are used to determine the calibration position. Before calibration, the beam splitter 5 and the reflective mirror 4 are first adjusted to or near the equal optical path using the interference optical path difference fine-tuning system. After the pressing mechanism contacts one end of the nozzle handle 2, a clear standard interference pattern is recorded using the MOS camera to calibrate the calibration position. The standard nozzle is then removed and the nozzle to be corrected is installed. The microprocessor and MOS camera implement closed-loop control of the pressing mechanism, driving it to press down on one end of the nozzle handle 2 until the MOS camera again detects the recorded interference pattern, confirming that the calibration position has been reached. During this process, the microprocessor system records the total displacement L1. After reaching the calibration position, the pressing mechanism is fully withdrawn, and the nozzle handle 2 partially rebounds. The nozzle is then lightly touched again without applying correction force. The microprocessor system measures the current position and compares it with the pre-correction reference position to obtain the residual displacement L2. The rebound amount is calculated by subtracting L2 from L1. Afterwards, the upper correction mechanism is fine-tuned based on the rebound amount until the nozzle meets the requirements.

[0074] The orthopedic tool 1 is equipped with another displacement measuring interferometer system, which includes another reflective mirror 4 and another beam splitter 5. The optical path between the other reflective mirror 4 and the other beam splitter 5 is parallel to the extension and retraction direction of the downward telescopic column 3. The downward telescopic column 3 is connected to the side thereof with another support rod 31 on which the other reflective mirror 4 is mounted. The other support rod 31 forms an angle of at least 90° with the other support rods 31. The two displacement measuring interferometer systems share a microprocessor system, which can measure the displacement of the downward telescopic column 3 from two different positions, thereby forming two standard interference images. The two standard interference images can be compared and calibrated with each other to further improve accuracy and prevent unexpected deformation of thin-walled parts during multiple extrusions in different directions.

[0075] The sidewall of the glass container 6 is provided with a gas relief conduit, which is equipped with a pressure relief valve and connected to a gas recovery system. This conduit facilitates the decompression and exhaust of sulfur hexafluoride gas in the glass container 6, facilitating concentration adjustment in the glass container 6. The gas recovery system recycles sulfur hexafluoride, saving costs.

[0076] The glass container 6 is also equipped with a pressure sensor, the sensing end of which is located within the glass container 6. The interference optical path travel difference fine-tuning system also includes a temperature control system for controlling the temperature of the sulfur hexafluoride in the glass container 6. The temperature control system includes a semiconductor cooling chip encased in the glass container 6. The temperature control system also includes an infrared thermal sensor, the sensing end of which points toward the interior of the glass container 6. The pressure sensor measures the air pressure and calculates the sulfur hexafluoride gas concentration in the glass container 6, thereby improving the accuracy of controlling changes in gas concentration within the glass container 6. The pressure sensor measures the air pressure to obtain the sulfur hexafluoride concentration, but the pressure change in the glass container 6 varies with temperature. As the concentration increases, the temperature of the glass container 6 increases. Based on the temperature measured by the infrared thermal sensor, the semiconductor cooling chip can be used to lower the temperature of the glass container 6, adjusting the glass container 6 to maintain a constant temperature of the sulfur hexafluoride in the glass container 6. This improves the measurement accuracy of the pressure sensor, thereby improving the accuracy of the sulfur hexafluoride gas concentration adjustment and enhancing the measurement precision of the displacement measurement interferometer system.

[0077] Furthermore, the temperature control system includes an insulating layer wrapped around the glass container 6, which surrounds the semiconductor cooling chip. The insulating layer avoids the ends of the glass container 6, and the glass at both ends of the glass container 6 is vacuum-insulated glass. The insulating layer reduces the impact of external temperature on the temperature of the glass container 6, reduces temperature fluctuations of the glass container 6, and improves the accuracy of sulfur hexafluoride gas concentration adjustment.

[0078] Furthermore, the temperature control system includes a heating wire wrapped around the sidewall of the glass container 6 and encased in a heat-insulating layer. The heating wire can increase the temperature of the glass container 6, heating the glass container 6 according to the temperature measured by the infrared heat sensor, thereby maintaining a constant temperature of the sulfur hexafluoride in the glass container 6.

[0079] The inner cross-sectional area of ​​the glass container 6 is greater than 5.5 square centimeters; the inner length of the glass container 6 is no less than 12 centimeters. By providing a larger volume of the glass container 6, more gas is required to change the gas concentration in the glass container 6. This allows for the use of a less precise air pump 7 to achieve precise gas concentration adjustment.

[0080] During use, a selected standard nozzle is loaded into the orthopedic tooling 1 before the nozzle handle 2 is orthopedic. The pressing end of the pressing mechanism is pressed down onto one end of the standard nozzle handle 2, and the position of the reflective dynamic mirror 4 is mechanically adjusted for preliminary adjustment to obtain a preliminary interference image. The temperature of the glass container 6 is lowered by a semiconductor refrigeration plate or increased by heating the glass container 6 with a heating wire, and the temperature of the sulfur hexafluoride in the glass container 6 is adjusted to maintain at approximately 25°C. The air pump 7 is adjusted to increase the concentration of sulfur hexafluoride in the glass container 6, and the pressure relief valve is adjusted to reduce the concentration of sulfur hexafluoride in the glass container 6, thereby achieving precise adjustment of the optical path difference between the reflective dynamic mirror 4 and the beam splitter 5, greatly improving the adjustment accuracy. This thereby improves the accuracy of the standard interference image captured by the MOS camera.

[0081] Remove the standard nozzle and install the nozzle stem 2 to be corrected into the correction tool 1. The microprocessor and MOS camera implement closed-loop control of the downward pressure mechanism, driving it to squeeze the nozzle until the MOS camera detects the recorded interference pattern again. This allows for more precise correction of the nozzle stem 2 without overcorrection and the introduction of new defects or changes.

[0082] Example 2, reference Figure 1 and Figure 3 , which is the second embodiment of the present invention, and this embodiment is based on the previous embodiment.

[0083] The orthopedic tool 1 further includes a lower abutment 9 and a clamping mechanism. The lower abutment 9 abuts against the bottom of the nozzle handle 2. The downward-pressing telescopic column 3 compresses one end of the nozzle handle 2 in the orthopedic tool 1, and the clamping mechanism clamps the other end of the nozzle handle 2 in the orthopedic tool 1. The lower abutment 9 is disposed between the downward-pressing and clamping mechanisms. By providing the lower abutment 9 and the clamping mechanism, the lower abutment 9 abuts against the bottom of the nozzle handle 2 and the clamping mechanism can clamp the other end of the nozzle handle 2, facilitating downward correction of one end of the nozzle handle 2 by the downward-pressing telescopic column 3.

[0084] Preferably, the clamping mechanism includes two clamping heads 81 and two cylinders 82. The two clamping heads 81 clamp the other end of the nozzle handle 2 from both sides above the other end of the nozzle handle 2. One clamping head 81 and one cylinder 82 are arranged in pairs. Each pair of clamping heads 81 and cylinders 82 rotates together, and a bidirectional ratchet mechanism is provided between each pair of clamping heads 81 and cylinders 82. A bidirectional ratchet mechanism is provided between the clamping heads 81 and cylinders 82 of the clamping mechanism to prevent the clamping heads 81 from loosening. The clamping heads 81 can also be loosened by reversing the ratchet mechanism to move the clamping heads 81.

[0085] Preferably, the lower stop 9 abuts between one-third and two-thirds of the length of the nozzle stem 2. A cavity is provided above the lower stop 9 to fit the nozzle stem 2. The lower portion of the nozzle stem 2 is supported by the lower stop 9, and the cavity prevents additional deformation of the nozzle stem 2 during correction, thereby improving the correction quality of the nozzle stem 2.

[0086] Preferably, a support rod 31 for mounting the reflective mirror 4 is attached to the side of the downward telescopic column 3. A reinforcing rib structure is provided on the support rod 31. This allows the optical path between the beam splitter 5 and the reflective mirror 4 to avoid the nozzle structure. The reinforcing rib structure reduces vibration of the reflective mirror 4 and improves the imaging quality of the displacement measurement interferometer system.

[0087] During use, after the nozzle is placed in the correction tool 1, the lower support block 9 is supported by the mold cavity between one-third and two-thirds of the length of the nozzle handle 2. The two-way ratchet mechanism of the clamping mechanism controls the clamping head 81 to rotate toward the other end of the nozzle handle 2, thereby clamping the other end of the nozzle handle 2, making it easier to press down and correct one end of the nozzle handle 2 by pressing the telescopic column 3 downward. In this way, when pressing the telescopic column 3 downward to correct the nozzle handle 2, the nozzle will not slip and cause the nozzle handle 2 to be corrected incorrectly, thereby improving the quality of the correction of the nozzle handle 2.

[0088] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

Claims

1. A gas concentration control interferometric imaging system for nozzle handle correction, comprising a correction tool (1) and a nozzle, wherein the nozzle has a nozzle handle (2), the correction tool (1) is provided with a downward pressing mechanism, and the downward pressing mechanism has a downward pressing telescopic column (3) for correcting the nozzle handle (2), characterized in that: The orthopedic tool (1) is equipped with a displacement measuring interferometer system; The displacement measurement interferometer system comprises a reflective mirror (4) and a beam splitter (5), wherein the reflective mirror (4) is mounted on a downward-pressing telescopic column (3); The optical path between the reflective dynamic mirror (4) and the beam splitter (5) is parallel to the telescopic direction of the downward telescopic column (3); The displacement measurement interferometer system also includes an interference optical path travel difference fine-tuning system; The interference optical path travel difference fine-tuning system comprises a glass container (6) containing sulfur hexafluoride, wherein the end surfaces of both ends of the glass container (6) are flat and transparent, and the glass container (6) is arranged on the optical path between the beam splitter (5) and the reflective moving mirror (4); The end surfaces of both ends of the glass container (6) are perpendicular to the laser light path; The glass container (6) is provided with an air supply port; The air supply port is connected to an air pump (7), and the air pump (7) is connected to a sulfur hexafluoride gas source; Nozzle handle (2) correction process: S1: A selected standard nozzle is installed in the orthopedic tool (1), and the pressing end of the pressing mechanism is pressed down to one end of the standard nozzle handle (2); Mechanically adjusting the reflective moving mirror (4) at the position of the downward pressing telescopic column (3) of the downward pressing mechanism to obtain a preliminary interference image; S2: The concentration of sulfur hexafluoride in the glass container (6) is adjusted by an air pump (7), and the optical path difference is precisely adjusted by utilizing the physical property that the speed of light in air is greater than the speed in sulfur hexafluoride to adjust the preliminary interference image and obtain a standard interference image; S3: Remove the standard nozzle and install the nozzle to be corrected into the correction tool (1). The image of the displacement measurement interferometer system is the actual interference image. The downward pressing telescopic column (3) is pressed down until the actual interference image is similar to the standard interference image. The downward pressing mechanism is stopped, and the correction of the nozzle handle (2) to be corrected is completed.

2. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 1, characterized in that: The orthopedic tool (1) further includes a lower support block (9) and a clamping mechanism; The lower support block (9) is supported below the nozzle handle (2), the downward-pressing telescopic column (3) presses one end of the nozzle handle (2) in the orthopedic tool (1), and the clamping mechanism clamps the other end of the nozzle handle (2) in the orthopedic tool (1); The lower support block (9) is arranged between the pressing mechanism and the clamping mechanism.

3. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 2, characterized in that: The clamping mechanism comprises two clamping heads (81) and two cylinders (82), and the two clamping heads (81) respectively clamp the other end of the nozzle handle (2) from two sides above the other end of the nozzle handle (2); A clamping head (81) and a cylinder (82) are arranged in pairs, each pair of the clamping heads (81) and the cylinder (82) are rotatably matched, and a bidirectional ratchet mechanism is provided between each pair of the clamping heads (81) and the cylinder (82).

4. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 3, characterized in that: The lower abutment block (9) abuts between one third and two thirds of the length of the nozzle handle (2); A cavity for fitting the nozzle handle (2) is provided above the lower support block (9).

5. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 1, characterized in that: The side of the downward telescopic column (3) is connected to a support rod (31) for mounting a reflective dynamic mirror (4); A reinforcing rib structure is provided on the support rod (31).

6. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 5, characterized in that: The orthopedic tool (1) is equipped with another displacement measuring interferometer system, and the another displacement measuring interferometer system has another reflective mirror and another beam splitter; The optical path between the other reflective dynamic mirror and the other beam splitter is parallel to the telescopic direction of the downward telescopic column (3); The side of the downward telescopic column (3) is connected to another support rod (31) on which another reflective dynamic mirror is installed. The other support rod (31) has an included angle of at least 90° with the support rod (31).

7. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 1, characterized in that: The side wall of the glass container (6) is provided with a gas relief pipe, a pressure relief valve is provided in the gas relief pipe, and the gas relief pipe is connected to a gas recovery system.

8. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 1, characterized in that: The glass container (6) is further provided with an air pressure sensor, wherein the sensing end of the air pressure sensor is provided in the glass container (6); The interference optical path travel difference fine-tuning system also includes a temperature control system for controlling the temperature of sulfur hexafluoride in the glass container (6); The temperature control system includes a semiconductor refrigeration sheet wrapped outside the glass container (6); The temperature control system also includes an infrared heat sensor, the sensing end of which points to the inner cavity of the glass container (6).

9. The gas concentration controlled interferometric imaging system for nozzle handle correction according to claim 1, characterized in that: The inner cross-sectional area of ​​the glass container (6) is greater than 5.5 square centimeters; The inner cavity length of the glass container (6) is not less than 12 centimeters.

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