Impedance parameter matrix generation method, device and equipment of transformer and readable storage medium

Abstract

The invention discloses a transformer impedance parameter matrix generation method, device and equipment and a readable storage medium, and the method comprises the steps: calculating the self-impedance of each port of a to-be-detected transformer based on the voltage and current of the port when other ports of the to-be-detected transformer are in an open-circuit state; any two ports in the to-be-tested transformer are combined, a plurality of port two-tuples are obtained after combination, and the to-be-tested transformer comprises more than four ports; calculating a gain coefficient corresponding to each port two-tuple, and calculating mutual impedance corresponding to each port two-tuple based on the gain coefficient of each port two-tuple and the self-impedance corresponding to the corresponding port two-tuple; and splicing the self-impedance of each port and all mutual impedances corresponding to each port two-tuple, and obtaining an impedance parameter matrix of the to-be-tested transformer after splicing. Therefore, the method can further simplify the determination difficulty of the impedance parameter matrix under the condition of ensuring the reliability of the impedance parameter matrix.

Description

Technical Field

[0001] The present application relates to the technical field of transformers, and more specifically, to a method, device, equipment and readable storage medium for generating an impedance parameter matrix of a transformer. Background Art

[0002] In the operation monitoring work of the power grid system, simulation is a very commonly used technical means. Due to its characteristic of being able to change the voltage level, the transformer has become a key component in the power grid system. The simulation of the transformer is generally completed by describing the input-output relationship between its various ports. Among them, the network parameters of the transformer, such as the impedance parameter Z parameter, can be effectively used to characterize the load characteristics between the ports of the transformer. Therefore, accurately obtaining the impedance parameters of the transformer is of great significance for realizing the simulation of the transformer and further understanding the operating state of the transformer in the power grid system. [[ID=IO]]

[0003] In the prior art, the impedance parameters of the transformer are calculated by a numerical calculation method based on finite element analysis, that is, a three-dimensional finite element model of the transformer is established, considering the structural and material characteristics of the iron core, winding, insulation, etc. of the transformer, as well as the distribution of the electromagnetic field. By solving Maxwell's equations and related boundary conditions, the distribution of the electromagnetic field and the current density distribution inside the transformer are calculated, and then the impedance parameters of the transformer are deduced. However, the above scheme is difficult, requires a large amount of data information such as the structural and material characteristics of the iron core, winding, insulation, etc. of the transformer, and the calculation is complex. Summary of the Invention

[0004] In view of this, the present application provides a method, device, equipment and readable storage medium for generating an impedance parameter matrix of a transformer, which is used to solve the problem of high technical difficulty in the existing technology for determining the impedance parameters of the transformer.

[0005] In order to achieve the above object, the following solutions are proposed:

[0006] A method for generating an impedance parameter matrix of a transformer includes:

[0007] For each port of the transformer to be measured, based on the voltage and current of the port when the remaining ports of the transformer to be measured except the port are in an open circuit state, calculate the self-impedance of the port;

[0008] Combine any two ports of the transformer to be measured, and after combination, obtain a plurality of port pairs. The transformer to be measured includes more than four ports;

[0009] Calculate the gain coefficient corresponding to each port pair, and based on the gain coefficient of each port pair and the self-impedance corresponding to the port pair, calculate the mutual impedance corresponding to each port pair;

[0010] Splice the self-impedances of each port and all the mutual impedances corresponding to the binary groups of each port, and after splicing, obtain the impedance parameter matrix of the transformer under test.

[0011] Optionally, calculating the self-impedance of the port based on the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state includes:

[0012] Collect the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state;

[0013] Take the ratio between the voltage and current of the port as the self-impedance of the port.

[0014] Optionally, collecting the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state includes:

[0015] When the remaining ports of the transformer under test except the port are in an open circuit state, at multiple sampling moments, use a frequency-domain loop analyzer to collect the voltage sampling values and current sampling values of the port;

[0016] Take the average value of each voltage sampling value of the port as the voltage of the port;

[0017] Take the average value of each current sampling value of the port as the current of the port.

[0018] Optionally, combining any two ports in the transformer under test, and after combination, obtaining multiple port binary groups includes:

[0019] Determine the port identifiers of all ports of the transformer under test;

[0020] Construct a column vector and a row vector, the column vector is composed of each port identifier, and the row vector is composed of each port identifier;

[0021] Combine each element in the row vector with each element in the column vector to form a two-dimensional matrix;

[0022] Remove the diagonal elements of the two-dimensional matrix, and remove duplicates from the non-diagonal elements of the two-dimensional matrix. After de-duplication, obtain multiple port binary groups.

[0023] Optionally, calculating the gain coefficient corresponding to each port binary group includes:

[0024] For each port pair, determine the target voltages corresponding to the two target ports when the remaining ports in the transformer under test are in an open - circuit state except for the two target ports; calculate the gain coefficient corresponding to the port pair based on the target voltages of the two target ports; where the two target ports are the two ports included in the port pair.

[0025] Optionally, calculating the gain coefficient corresponding to the port pair based on the target voltages of the two target ports includes:

[0026] Select one target port from the port pair as the first target port, and use the other target port in the port pair as the second target port;

[0027] Calculate the ratio between the target voltage of the first target port and the target voltage of the second target port, and use this ratio as the first gain coefficient of the first target port relative to the second target port;

[0028] Use the reciprocal of the first gain coefficient as the second gain coefficient of the second target port relative to the first target port.

[0029] Optionally, calculating the mutual impedance corresponding to the port pair based on the gain coefficient of the port pair and the self - impedance corresponding to the port pair includes:

[0030] Use the product of the first gain coefficient and the self - impedance of the second target port as the mutual impedance of the first target port relative to the second target port.

[0031] An impedance parameter matrix generation device for a transformer includes:

[0032] A calculation module, configured to calculate the self - impedance of each port of the transformer under test based on the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open - circuit state;

[0033] A combination module, configured to combine any two ports in the transformer under test, and after combination, obtain a plurality of port pairs, where the transformer under test includes more than four ports;

[0034] An operation module, configured to calculate the gain coefficient corresponding to each port pair, and calculate the mutual impedance corresponding to each port pair based on the gain coefficient of each port pair and the self - impedance corresponding to the corresponding port pair;

[0035] A splicing module, configured to splice the self - impedances of each port and all the mutual impedances corresponding to each port pair, and after splicing, obtain the impedance parameter matrix of the transformer under test.

[0036] An impedance parameter matrix generation device for a transformer, comprising a memory and a processor;

[0037] The memory is used for storing programs;

[0038] The processor is used for executing the programs to implement each step of the above-mentioned impedance parameter matrix generation method for the transformer.

[0039] A readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, each step of the above-mentioned impedance parameter matrix generation method for the transformer is implemented.

[0040] As can be seen from the above technical solutions, the method for generating the impedance parameter matrix of the transformer provided in this application can calculate the self-impedance of each port of the transformer to be measured based on the voltage and current of the port when the remaining ports of the transformer to be measured except the port are in an open circuit state. Based on this, this application can set other ports to an open circuit state, accurately measure the voltage-current relationship of this port under independent working conditions, avoid the interference of other ports, and make the self-impedance calculated in this application have a high accuracy, which can truly reflect the electrical characteristics of the corresponding port itself. In addition, this application can also combine any two ports in the transformer to be measured to obtain multiple port pairs. The transformer to be measured has more than four ports. Calculate the gain coefficient corresponding to each port pair, and calculate the mutual impedance corresponding to each port pair based on the gain coefficient of each port pair and the self-impedance corresponding to the port pair. Based on this, this application forms port pairs by arbitrarily combining ports, decomposes multiple ports of the transformer to be measured into combinations between multiple two-port devices, and quantifies the interaction between any two ports of the transformer to be measured by calculating the gain coefficient of the port pair, simplifies the determination process of the interaction between at least four ports into the determination process of the interaction between two ports, simplifies the complex into the simple, and reduces the difficulty of determining impedance parameters. Subsequently, the mutual impedance between two ports is calculated by combining the gain coefficient and the self-impedance, which can comprehensively consider the impedance characteristics composed of the characteristics of the port itself and its coupling characteristics with other ports to construct the mutual impedance, further ensuring the calculation accuracy of the mutual impedance. Finally, the self-impedance of each port and all the mutual impedances corresponding to each port pair can be spliced to obtain the impedance parameter matrix of the transformer to be measured. Based on this, this application can splice each self-impedance and each mutual impedance to obtain the impedance parameter matrix of the transformer to be measured. It can be seen that this application can decompose the construction process of the impedance parameter matrix of the transformer into the calculation processes of self-impedance and mutual impedance. In the process of calculating self-impedance, this application can calculate the self-impedance of each port while avoiding the coupling interference of multiple ports, improving the accuracy of this application. In the process of calculating self-impedance, this application can simplify the quantization process of the coupling characteristics between multiple ports into the quantization process of the coupling characteristics between two ports, simplifies the complex into the simple, reduces the difficulty of determining mutual impedance, and has strong operability. It can be seen that this application can further simplify the difficulty of determining the impedance parameter matrix while ensuring the reliability of the impedance parameter matrix. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only the embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can also be obtained based on the provided accompanying drawings.

[0042] Figure 1 Flowchart of a method for generating an impedance parameter matrix of a transformer disclosed in an embodiment of the present application;

[0043] Figure 2 Block diagram of a device for generating an impedance parameter matrix of a transformer disclosed in an embodiment of the present application;

[0044] Figure 3 Hardware block diagram of a device for generating an impedance parameter matrix of a transformer disclosed in an embodiment of the present application. Detailed implementation manners

[0045] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments of the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.

[0046] The embodiments of the present application provide a method for generating an impedance parameter matrix of a transformer. This method for generating an impedance parameter matrix of a transformer can be applied to various power grid simulation systems or transformer simulation systems, and can also be applied to various computer terminals or intelligent terminals. Its execution subject can be the processor or server of a computer terminal or an intelligent terminal.

[0047] Next, in combination with Figure 1 The method for generating an impedance parameter matrix of the transformer of the present application will be introduced in detail, including the following steps:

[0048] Step S1: For each port of the transformer to be measured, calculate the self-impedance of the port based on the voltage and current of the port when the remaining ports of the transformer to be measured except the port are in an open circuit state.

[0049] Specifically, the transformer that needs to be simulated can be used as the transformer to be measured.

[0050] Among them, the transformer to be measured can have more than four ports. For example, if the transformer to be measured is a three-phase transformer, the number of its ports is 6.

[0051] When any one port is in a conducting state and the other ports of the transformer under test are in an open state, the voltage and current of this port can be collected, and the ratio of this voltage to this current is used as the self-impedance of this port.

[0052] Step S2: Combine any two ports of the transformer under test to obtain multiple port pairs after combination.

[0053] Specifically, the transformer under test can be combined into two-port pairs, and port pairs are obtained after combination.

[0054] Each port pair contains any two ports of the transformer under test.

[0055] For example, if the transformer under test is a three-phase transformer, it has a high-voltage port of phase A, a low-voltage port of phase A, a high-voltage port of phase B, a low-voltage port of phase B, a high-voltage port of phase C, and a low-voltage port of phase C.

[0056] One port pair can contain the high-voltage port of phase A and the high-voltage port of phase B.

[0057] Another port pair can contain the high-voltage port of phase A and the low-voltage port of phase B.

[0058] All the ports represented by all the port pairs are consistent with all the ports included in the transformer under test.

[0059] There may be the same one port in different port pairs, but different port pairs have at least one different port.

[0060] For example, one port pair can contain the high-voltage port of phase A and the low-voltage port of phase B, while another port pair can contain the high-voltage port of phase A and the low-voltage port of phase C.

[0061] There may be various combination forms for the two ports included in each port pair.

[0062] For example, the two corresponding ports in each port pair can both belong to high-voltage ports, or both belong to low-voltage ports, or one high-voltage port and one low-voltage port.

[0063] Step S3: Calculate the gain coefficient corresponding to each port pair, and calculate the mutual impedance corresponding to each port pair based on the gain coefficient of each port pair and the self-impedance corresponding to the corresponding port pair.

[0064] Specifically, the voltage ratio of the two ports corresponding to each port pair can be used as the gain coefficient of the corresponding port pair.

[0065] The mutual impedance corresponding to the port pair can be calculated by combining the gain coefficient of the port pair and the self-impedance of the corresponding port pair.

[0066] Since a port pair contains two ports, the port pair can correspond to two gain coefficients, and the two gain coefficients are reciprocals of each other. Similarly, there is a corresponding self-impedance for each port in the port pair. Therefore, the port pair corresponds to two mutual impedances.

[0067] Step S4: Concatenate the self-impedances of each port and all the mutual impedances corresponding to each port pair. After concatenation, the impedance parameter matrix of the transformer under test is obtained.

[0068] Specifically, the self-impedances of each port can be used as diagonal elements, and all the mutual impedances of each port pair can be used as non-diagonal elements for concatenation. After concatenation, the impedance parameter matrix of the transformer under test is obtained.

[0069] The impedance parameter matrix can be an N-order matrix, where N is the number of ports of the transformer under test.

[0070] For example, if the transformer under test is a three-phase transformer, its number of ports is 6, and the form of the impedance parameter matrix can be as follows:

[0071]

[0072] In the formula, V i represents the voltage of port i, I i represents the current of port i, the diagonal element Z ii represents the self-impedance of port i, and the non-diagonal element Z ij represents the mutual impedance of port i with respect to port j.

[0073] Among them, the impedance parameter matrix can indicate the multi-port electrical characteristics of the transformer under test, such as reflecting the voltage and current relationship between the corresponding ports.

[0074] As can be seen from the above technical solutions, the method for generating the impedance parameter matrix of the transformer provided in this application can calculate the self-impedance of each port of the transformer to be measured based on the voltage and current of the port when the remaining ports of the transformer to be measured except the port are in an open circuit state. Based on this, this application can set other ports to an open circuit state, accurately measure the voltage-current relationship of this port under independent working conditions, avoid the interference of other ports, and make the self-impedance calculated in this application have a high accuracy, which can truly reflect the electrical characteristics of the corresponding port itself. In addition, this application can also combine any two ports in the transformer to be measured to obtain multiple port pairs. The transformer to be measured has more than four ports. Calculate the gain coefficient corresponding to each port pair, and calculate the mutual impedance corresponding to each port pair based on the gain coefficient of each port pair and the self-impedance corresponding to the port pair. Based on this, this application forms port pairs by arbitrarily combining ports, decomposes the multiple ports of the transformer to be measured into combinations between multiple two-port networks, and quantifies the interaction between any two ports in the transformer to be measured by calculating the gain coefficient of the port pair, simplifies the determination process of the interaction between at least four ports into the determination process of the interaction between two ports, simplifies the complex to the simple, and reduces the difficulty of determining the impedance parameters. Subsequently, the mutual impedance between two ports is calculated by combining the gain coefficient and the self-impedance, which can comprehensively consider the impedance characteristics composed of the characteristics of the port itself and its coupling characteristics with other ports to construct the mutual impedance, further ensuring the calculation accuracy of the mutual impedance. Finally, the self-impedance of each port and all the mutual impedances corresponding to each port pair can be spliced to obtain the impedance parameter matrix of the transformer to be measured. Based on this, this application can splice each self-impedance and each mutual impedance to obtain the impedance parameter matrix of the transformer to be measured. It can be seen that this application can decompose the construction process of the impedance parameter matrix of the transformer into the calculation processes of self-impedance and mutual impedance. In the process of calculating the self-impedance, this application can calculate the self-impedance of each port while avoiding the coupling interference of multiple ports, improving the accuracy of this application. In the process of calculating the self-impedance, this application can simplify the quantification process of the coupling characteristics between multiple ports into the quantification process of the coupling characteristics between two ports, simplify the complex to the simple, reduce the difficulty of determining the mutual impedance, and is highly operable. Thus, it can be known that this application can further simplify the difficulty of determining the impedance parameter matrix while ensuring the reliability of the impedance parameter matrix.

[0075] In some embodiments of this application, the process of calculating the self-impedance of the port based on the voltage and current of the port when the remaining ports of the transformer to be measured except the port are in an open circuit state in step S1 is described in detail as follows:

[0076] S10. Collect the voltage and current of the port when the other ports of the transformer under test are in an open state except for the said port.

[0077] Specifically, the voltage value and current value of the port can be collected continuously for multiple times when the other ports of the transformer under test are in an open state except for the said port, and the average value of the multiple voltage values is used as the voltage of the port, and the average value of the multiple current values is used as the current of the port.

[0078] S11. Use the ratio between the voltage and current of the port as the self - impedance of the port.

[0079] Specifically, calculate the quotient of the voltage and current of the port, and use the quotient as the self - impedance of the corresponding port.

[0080] The self - impedances of different ports may be the same or different.

[0081] As can be seen from the above technical solution, this embodiment provides an optional method for calculating the self - impedance of the port based on the voltage and current of the port when the other ports of the transformer under test are in an open state except for the said port. Through the above method, by setting the open state and the conducting state, the voltage and current of a specific port can be prevented from being affected by the impedance characteristics of other ports, further ensuring the accuracy of the self - impedance calculation.

[0082] In some embodiments of the present application, the process of step S10, collecting the voltage and current of the port when the other ports of the transformer under test are in an open state except for the said port, is described in detail as follows:

[0083] S100. When the other ports of the transformer under test are in an open state except for the said port, at multiple sampling moments, use a frequency - domain loop analyzer to collect the voltage sampling values and current sampling values of the port.

[0084] Specifically, multiple sampling moments can be determined, and at each sampling moment, obtain the voltage sampling values and current sampling values collected by the frequency - domain loop analyzer when the other ports of the transformer under test are in an open state except for the said port.

[0085] S101. Use the average value of each voltage sampling value of the port as the voltage of the port.

[0086] Specifically, the average value of each voltage sampling value of the port can be calculated, and the voltage of the port is obtained after calculation.

[0087] S102. Use the average value of each current sampling value of the port as the current of the port.

[0088] Specifically, the average value of each current sampling value of the port can be calculated, and the current of the port can be obtained after the calculation.

[0089] As can be seen from the above technical solution, the present application provides an optional method for collecting the voltage and current of the port when the other ports of the transformer to be measured are in an open state except for the port. By collecting multiple times and using a frequency-domain loop analyzer, the accuracy of the collection in the present application can be further improved. At the same time, the existing frequency-domain loop analyzer used for collection has strong operability.

[0090] In some embodiments of the present application, the process of step S2, combining any two ports of the transformer to be measured to obtain a plurality of port pairs, is described in detail as follows:

[0091] S20. Determine the port identifiers of all ports of the transformer to be measured.

[0092] Specifically, a unique port identifier corresponding to each port of the transformer to be measured can be generated.

[0093] S21. Construct a column vector and a row vector, where the column vector is composed of each port identifier, and the row vector is composed of each port identifier.

[0094] Specifically, the port identifiers can be constructed into a column vector in descending order, and the port identifiers can be constructed into a row vector in descending order.

[0095] S22. Combine each element in the row vector with each element in the column vector to form a two-dimensional matrix.

[0096] Specifically, the row vector and the column vector can be combined element by element to obtain a two-dimensional matrix after combination.

[0097] Each element in the two-dimensional matrix is composed of an element in the row vector and an element in the column vector.

[0098] S23. Remove the diagonal elements of the two-dimensional matrix, and remove duplicates from the non-diagonal elements of the two-dimensional matrix. After removing duplicates, a plurality of port pairs are obtained.

[0099] Specifically, the diagonal elements are elements composed of the same port identifier. Therefore, the diagonal elements of the two-dimensional matrix can be removed.

[0100] The non-diagonal elements of the two-dimensional matrix can be cleaned to obtain port pairs that are not exactly the same.

[0101] As can be seen from the above technical solution, this embodiment provides an optional way to combine any two ports in the transformer under test, and after combination, multiple port pairs are obtained. Through the above method, the present application can complete the generation of port pairs through matrix construction, avoiding any combination method of missing ports.

[0102] In some embodiments of the present application, the process of calculating the gain coefficient corresponding to each port pair in step S3 is described in detail as follows:

[0103] S30. For each port pair, determine the target voltages corresponding to the two target ports when the remaining ports in the transformer under test except the two target ports are in an open circuit state; based on the target voltages of the two target ports, calculate the gain coefficient corresponding to the port pair; wherein, the two target ports are the two ports included in the port pair.

[0104] Specifically, the target voltages corresponding to the two target ports can be obtained when the remaining ports in the transformer under test except the two target ports are in an open circuit state by a frequency-domain loop analyzer.

[0105] Wherein, the two target ports are the two ports represented by the port pair.

[0106] The gain coefficient corresponding to the port pair can be calculated based on a ratio calculation method.

[0107] As can be seen from the above technical solution, this embodiment provides an optional way to calculate the gain coefficient corresponding to each port pair. Through the above method, the present application can calculate the gain coefficient between different ports through the port voltages.

[0108] In some embodiments of the present application, the process of calculating the gain coefficient corresponding to the port pair based on the target voltages of the two target ports in step S30 is described in detail as follows:

[0109] S300. Select one target port from the port pair as the first target port, and use the other target port in the port pair as the second target port.

[0110] Specifically, one port of the port pair can be used as the first target port, and the other port can be used as the second target port.

[0111] It should be noted that the present application sets the first target port and the second target port only to distinguish the two ports of the port pair, which does not mean that the first target port must be greater than the second target port, nor does it mean that the first target port must be less than the second target port.

[0112] The first target port and the second target port in different port pairs can be converted into each other. For example, the first target port of one port pair can be the second target port in another port pair.

[0113] S301. Calculate the ratio between the target voltage of the first target port and the target voltage of the second target port, and use this ratio as the first gain coefficient of the first target port relative to the second target port.

[0114] Specifically, the ratio between the target voltage of the first target port and the second target port can be used as the first gain coefficient of the first target port relative to the second target port.

[0115] S302. Use the reciprocal of the first gain coefficient as the second gain coefficient of the second target port relative to the first target port.

[0116] Specifically, the reciprocal of the first gain coefficient can be calculated and used as the second gain coefficient of the second target port relative to the first target port.

[0117] Alternatively, the ratio between the target voltage of the second target port and the target voltage of the first target port can be used as the second gain coefficient of the second target port relative to the first target port.

[0118] It should be noted that the first gain coefficient and the second gain coefficient are set in this application only to distinguish the two gain coefficients corresponding to the port pair, which does not mean that the value of the first gain coefficient must be greater than the value of the second gain coefficient, nor does it mean that the value of the first target port must be less than the value of the second target port.

[0119] As can be seen from the above technical solution, this embodiment provides an optional method for calculating the gain coefficient corresponding to the port pair based on the target voltages of two target ports. Through the above method, this application can obtain the two gain coefficients corresponding to the port pair by ratio calculation, further reducing the calculation difficulty and accelerating the generation process of the impedance parameter matrix of this application.

[0120] In some embodiments of this application, the process of calculating the mutual impedance corresponding to each port pair based on the gain coefficient of each port pair and the self-impedance corresponding to the corresponding port pair in step S3 is described in detail as follows:

[0121] S303. Use the product of the first gain coefficient and the self-impedance of the second target port as the mutual impedance of the first target port relative to the second target port.

[0122] Specifically, the self-impedance of the second target port can be multiplied by the first gain coefficient to calculate the mutual impedance of the first target port relative to the second target port.

[0123] The self-impedance of the first target port can be multiplied by the second gain coefficient to calculate the mutual impedance of the second target port relative to the first target port.

[0124] The mutual impedance of the corresponding port pair can be calculated by combining the mutual impedance calculation function, the gain coefficients of each port pair, and the self-impedance.

[0125] The mutual impedance calculation function can be as follows:

[0126]

[0127] In the formula, Z ij represents the mutual impedance of port i relative to port j; Gain ij represents the voltage ratio of port i and port j, that is, the gain coefficient; Z jj represents the self-impedance of port j.

[0128] It can be seen from the above technical solution that this embodiment provides an optional method for calculating the mutual impedance of each port pair based on the gain coefficients of each port pair and the self-impedance corresponding to the corresponding port pair. Through the above method, the present application can convert the calculation process of the mutual impedance into a voltage comparison process and a self-impedance determination process, further reducing the calculation complexity.

[0129] Next, the impedance parameter matrix generation device of the transformer provided by the present application will be introduced in detail in combination with Figure 2 The impedance parameter matrix generation device of the transformer provided below can be compared with the impedance parameter matrix generation method of the transformer provided above.

[0130] Referring to Figure 2 It can be found that the impedance parameter matrix generation device of the transformer can include:

[0131] Calculation module 10, configured to calculate the self-impedance of each port of the transformer to be measured based on the voltage and current of the port when the remaining ports of the transformer to be measured except the port are in an open state;

[0132] Combination module 20, configured to combine any two ports of the transformer to be measured, and after combination, obtain a plurality of port pairs, and the transformer to be measured includes four or more ports;

[0133] An operation module 30 is configured to calculate the gain coefficient corresponding to each port pair, and calculate the mutual impedance corresponding to each port pair based on the gain coefficient of each port pair and the self-impedance corresponding to the corresponding port pair.

[0134] A splicing module 40 is configured to splice the self-impedances of all ports and all the mutual impedances corresponding to each port pair, and obtain the impedance parameter matrix of the transformer under test after splicing.

[0135] Furthermore, the calculation module 10 may include:

[0136] A current acquisition unit is configured to acquire the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open state.

[0137] A self-impedance calculation unit is configured to use the ratio between the voltage and current of the port as the self-impedance of the port.

[0138] Furthermore, the current acquisition unit may include:

[0139] A first current acquisition subunit is configured to acquire the voltage sampling value and current sampling value of the port at multiple sampling moments by using a frequency-domain loop analyzer when the remaining ports of the transformer under test except the port are in an open state.

[0140] A second current acquisition subunit is configured to use the average value of each voltage sampling value of the port as the voltage of the port.

[0141] A third current acquisition subunit is configured to use the average value of each current sampling value of the port as the current of the port.

[0142] Furthermore, the combination module 20 may include:

[0143] A port identification determination unit is configured to determine the port identifications of all ports of the transformer under test.

[0144] A column vector construction unit is configured to construct a column vector and a row vector, the column vector is composed of each port identification, and the row vector is composed of each port identification.

[0145] A two-dimensional matrix construction unit is configured to combine each element in the row vector with each element in the column vector to form a two-dimensional matrix.

[0146] A port pair generation unit is configured to remove the diagonal elements of the two-dimensional matrix, and remove duplicates from the non-diagonal elements of the two-dimensional matrix, and obtain multiple port pairs after removing duplicates.

[0147] Furthermore, the operation module 30 may include:

[0148] A gain coefficient calculation unit is configured to, for each port pair, determine the target voltages corresponding to two target ports when the remaining ports in the transformer under test are in an open - circuit state except for the two target ports; and calculate the gain coefficient corresponding to the port pair based on the target voltages of the two target ports, where the two target ports are the two ports included in the port pair.

[0149] Further, the gain coefficient calculation unit may include:

[0150] A first gain coefficient calculation sub - unit is configured to select one target port from the port pair as the first target port, and use the other target port in the port pair as the second target port;

[0151] A second gain coefficient calculation sub - unit is configured to calculate the ratio between the target voltage of the first target port and the target voltage of the second target port, and use this ratio as the first gain coefficient of the first target port relative to the second target port;

[0152] A third gain coefficient calculation sub - unit is configured to use the reciprocal of the first gain coefficient as the second gain coefficient of the second target port relative to the first target port.

[0153] Further, the operation module 30 may also include:

[0154] A mutual impedance calculation sub - unit is configured to use the product of the first gain coefficient and the self - impedance of the second target port as the mutual impedance of the first target port relative to the second target port.

[0155] The impedance parameter matrix generation device for a transformer provided in the embodiments of the present application can be applied to impedance parameter matrix generation devices for transformers, such as PC terminals, cloud platforms, servers, and server clusters, etc. Optionally, Figure 3 shows a hardware structure block diagram of the device. Referring to Figure 3 , the hardware structure of the impedance parameter matrix generation device for a transformer may include: at least one processor 1, at least one communication interface 2, at least one memory 3, and at least one communication bus 4;

[0156] In the embodiments of the present application, the number of the processor 1, the communication interface 2, the memory 3, and the communication bus 4 is at least one, and the processor 1, the communication interface 2, and the memory 3 complete communication with each other through the communication bus 4;

[0157] The processor 1 may be a central processing unit CPU, or a specific integrated circuit ASIC (Application Specific Integrated Circuit), or one or more integrated circuits configured to implement the embodiments of the present invention, etc.;

[0158] The memory 3 may include high-speed RAM memory and may also include non-volatile memory, etc., such as at least one disk memory;

[0159] Wherein, the memory stores a program, and the processor can call the program stored in the memory, and the program is used for:

[0160] For each port of the transformer under test, based on the voltage and current of the port when the other ports of the transformer under test except the port are in an open circuit state, calculate the self-impedance of the port;

[0161] Combine any two ports of the transformer under test, and after combination, obtain a plurality of port pairs. The transformer under test includes more than four ports;

[0162] Calculate the gain coefficient corresponding to each port pair, and based on the gain coefficient of each port pair and the self-impedance corresponding to the corresponding port pair, calculate the mutual impedance corresponding to each port pair;

[0163] Concatenate the self-impedances of each port and all the mutual impedances corresponding to each port pair, and after concatenation, obtain the impedance parameter matrix of the transformer under test.

[0164] Optionally, the refinement function and expansion function of the program can be referred to the above description.

[0165] The embodiment of the present application also provides a readable storage medium, which can store a program suitable for a processor to execute, and the program is used for:

[0166] For each port of the transformer under test, based on the voltage and current of the port when the other ports of the transformer under test except the port are in an open circuit state, calculate the self-impedance of the port;

[0167] Combine any two ports of the transformer under test, and after combination, obtain a plurality of port pairs. The transformer under test includes more than four ports;

[0168] Calculate the gain coefficient corresponding to each port pair, and based on the gain coefficient of each port pair and the self-impedance corresponding to the corresponding port pair, calculate the mutual impedance corresponding to each port pair;

[0169] Concatenate the self-impedances of each port and all the mutual impedances corresponding to each port pair, and after concatenation, obtain the impedance parameter matrix of the transformer under test.

[0170] Optionally, the refinement function and expansion function of the program can be referred to the above description.

[0171] Finally, it should also be noted that in this text, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, such that a process, method, article or device comprising a series of elements not only includes those elements but also includes other elements not expressly listed, or further includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the presence of additional identical elements in the process, method, article or device comprising said element.

[0172] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. For the same or similar parts among the various embodiments, reference may be made to each other.

[0173] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. The various embodiments of the present application can be combined with each other. Therefore, the present application will not be limited to these embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for generating an impedance parameter matrix of a transformer, characterized in that, Including: For each port of the transformer under test, based on the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state, calculate the self-impedance of the port; Combine any two ports in the transformer under test, and after combination, obtain multiple port pairs. The transformer under test includes more than four ports; Calculate the gain coefficient corresponding to each port pair. Based on the gain coefficient of each port pair and the self-impedance corresponding to the corresponding port pair, calculate the mutual impedance corresponding to each port pair; Concatenate the self-impedances of each port and all the mutual impedances corresponding to each port pair, and after concatenation, obtain the impedance parameter matrix of the transformer under test.

2. The method for generating the impedance parameter matrix of the transformer according to claim 1, characterized in that, The calculating the self-impedance of the port based on the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state includes: Collect the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state; Take the ratio between the voltage and current of the port as the self-impedance of the port.

3. The method for generating the impedance parameter matrix of a transformer according to claim 2, characterized in that, The collecting the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state includes: When the remaining ports of the transformer under test except the port are in an open circuit state, at multiple sampling moments, use a frequency-domain loop analyzer to collect the voltage sampling value and current sampling value of the port; Take the average value of each voltage sampling value of the port as the voltage of the port; Take the average value of each current sampling value of the port as the current of the port.

4. The method for generating the impedance parameter matrix of the transformer according to claim 1, wherein The combining any two ports in the transformer under test and obtaining multiple port pairs after combination includes: Determine the port identifiers of all ports of the transformer under test; Construct a column vector and a row vector. The column vector is composed of each port identifier, and the row vector is composed of each port identifier; Combine each element in the row vector with each element in the column vector to form a two-dimensional matrix; Remove the diagonal elements of the two-dimensional matrix, and remove duplicates from the non-diagonal elements of the two-dimensional matrix. After removing duplicates, obtain multiple port pairs.

5. The method for generating the impedance parameter matrix of the transformer according to claim 1, wherein The calculating the gain coefficient corresponding to each port pair includes: For each port pair, determine the target voltage corresponding to the two target ports when the remaining ports of the transformer under test except the two target ports are in an open circuit state; based on the target voltages of the two target ports, calculate the gain coefficient corresponding to the port pair; wherein, the two target ports are the two ports included in the port pair.

6. The method for generating the impedance parameter matrix of a transformer according to claim 5, wherein The calculating the gain coefficient corresponding to the port pair based on the target voltages of the two target ports includes: Select one target port from the port pair as the first target port, and use the other target port in the port pair as the second target port; Calculate the ratio between the target voltage of the first target port and the target voltage of the second target port, and take this ratio as the first gain coefficient of the first target port relative to the second target port; Take the reciprocal of the first gain coefficient as the second gain coefficient of the second target port relative to the first target port.

7. The method for generating an impedance parameter matrix of a transformer according to claim 6, characterized in that, Calculating the mutual impedance corresponding to the port pair based on the gain coefficient of the port pair and the self-impedance corresponding to the port pair includes: Based on the product of the first gain coefficient and the self-impedance of the second target port as the mutual impedance of the first target port relative to the second target port.

8. An impedance parameter matrix generation device for a transformer, characterized in that Includes: A calculation module, configured to calculate the self-impedance of each port of the transformer under test based on the voltage and current of the port when the remaining ports of the transformer under test except the port are in an open circuit state; A combination module, configured to combine any two ports in the transformer under test, and obtain a plurality of port pairs after combination, and the transformer under test includes more than four ports; An operation module, configured to calculate the gain coefficient corresponding to each port pair, and calculate the mutual impedance corresponding to each port pair based on the gain coefficient of each port pair and the self-impedance corresponding to the corresponding port pair; A splicing module, configured to splice the self-impedance of each port and all the mutual impedances corresponding to each port pair, and obtain the impedance parameter matrix of the transformer under test after splicing.

9. An impedance parameter matrix generation device for a transformer, characterized in that, Includes a memory and a processor; The memory is used to store programs; The processor is configured to execute the program to implement each step of the method for generating the impedance parameter matrix of the transformer according to any one of claims 1-7.

10. A readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, each step of the method for generating the impedance parameter matrix of the transformer according to any one of claims 1-7 is implemented.

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