Automatic testing method and system for keyboard input behavior
Through concurrent hardware stress testing and synchronous monitoring of internal signal parameters of the keyboard, comprehensive test correlation characteristics are extracted, and fault sources are adaptively diagnosed, which solves the problem of inefficient concurrent testing between multiple keyboards, and achieves efficient and accurate keyboard fault location and repair.
Patent Information
- Application Number
- CN202510583058.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-07
- Publication Date
- 2025-08-01
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
The prior art does not fully consider concurrent testing between multiple keyboards, and the lack of intelligent automation testing, resulting in inefficient keyboard repair.
By performing concurrent hardware stress tests, synchronously monitor the functional error responses and internal scanning matrix signal parameters of multiple keyboards to be tested, extract comprehensive test correlation characteristics, perform adaptive diagnostic tests based on potential hardware failures indicated by feature, aggregate benchmarks and concurrent hardware stress test characteristics, and determine the hardware failure type and location.
It realizes multi-dimensional and full-process fault positioning, improves the efficiency and accuracy of keyboard repairs, and solves the problems of inaccurate diagnosis and inefficiency in the existing technology.
Smart Images
Figure CN120407309A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of computer-aided equipment testing and repair, and particularly to an automated testing method and system for keyboard input behavior. Background Art
[0002] As a computer-aided device, a keyboard is tested and repaired before leaving the factory. Through a large number of tests of keyboard input behavior, a foundation is laid for specific keyboard repair. Currently, the testing method of keyboard input behavior does not fully consider the concurrent testing between multiple keyboards, and lacks intelligent automated testing, resulting in low keyboard repair efficiency.
[0003] Therefore, an automated testing method and system for keyboard input behavior are proposed. Summary of the Invention
[0004] The purpose of the present invention is to provide an automated testing method and system for keyboard input behavior, including: by executing a concurrent hardware stress test process, driving multiple keyboards to be tested simultaneously, and synchronously monitoring the functional error responses and internal scan matrix signal parameters of multiple keyboards to be tested, extracting the comprehensive test correlation features of the functional error responses and signal parameter changes, and adaptively executing a diagnostic test by the test control software based on the potential hardware faults indicated by the features; aggregating all the comprehensive test correlation features including benchmark tests and concurrent hardware stress tests, constructing multi-stage test features, and determining the hardware fault types and fault locations of multiple keyboards to be tested. The present invention can effectively improve the repair efficiency of keyboards.
[0005] To achieve the above purpose, the present invention provides the following technical solutions:
[0006] An automated testing method for keyboard input behavior, including:
[0007] S1. Execute a concurrent hardware stress test process, drive multiple keyboards to be tested simultaneously, and synchronously monitor the functional error responses and internal scan matrix signal parameters of multiple keyboards to be tested;
[0008] S2. Extract the comprehensive test correlation features including the functional error responses and the signal parameter changes, and adaptively execute a diagnostic test by the test control software based on the potential hardware faults indicated by the features for focusing on the fault source;
[0009] S3. Aggregate all the comprehensive test correlation features including benchmark tests and concurrent hardware stress tests, construct multi-stage test features, and determine the final hardware fault types and fault locations of multiple keyboards to be tested.
[0010] Preferably, the functional error responses include missed keys, wrong keys, double taps, sticky keys, excessive response delays, and combination key failures; the internal scan matrix signal parameters include the electrical signal monitoring parameters on multiple internal row and column scan lines of the keyboard under test.
[0011] Preferably, the comprehensive test correlation feature reflects the correlation between the functional error response and the internal scan matrix signal parameters. By constructing the comprehensive test correlation feature, the correlation feature is quantified by the correlation matrix between the functional error response and the internal scan matrix signal parameters.
[0012] Preferably, the test control software analyzes the comprehensive test correlation feature of the keyboard under test to obtain the potential hardware fault location and the occurrence probability of the hardware fault type of the keyboard under test.
[0013] Preferably, the occurrence probability is obtained by analyzing the historical correlation matrix corresponding to each historical fault type and historical fault location with the current correlation matrix respectively to obtain the first similarity and the second similarity, and finally obtaining the occurrence probability of each historical fault type and historical fault location; the process of obtaining the occurrence probability of each historical fault type includes: dividing the first similarity of each historical fault type by the sum of the first similarities of all historical fault types; the process of obtaining the occurrence probability of each historical fault location includes: dividing the second similarity of each historical fault location by the sum of the second similarities of all historical fault locations.
[0014] Preferably, for the keyboard fault area and fault type pointed to by the hardware fault type and hardware fault location with the highest current occurrence probability, a customized input behavior is applied to focus on the fault source.
[0015] An automated test system for keyboard input behavior, comprising:
[0016] An automated driving unit for performing a concurrent hardware stress test process, driving multiple keyboards under test simultaneously to simulate high-load conditions, and synchronously monitoring the functional error responses of each keyboard and the physical test parameters reflecting the load conditions;
[0017] A data collection and monitoring module that extracts the comprehensive test correlation feature including the functional error response and the physical parameter change, and adaptively performs diagnostic analysis based on the feature by the test control software to focus on the fault source;
[0018] A multi-stage test and analysis unit that aggregates all the comprehensive test correlation features including historical benchmark tests and concurrent hardware stress tests, constructs multi-stage test features, and forms a fault signature, and analyzes the fault signature using a pre-trained predictive diagnostic model to determine the hardware fault types and their fault locations of multiple keyboards under test;
[0019] A comprehensive repair unit repairs multiple keyboards to be tested based on the hardware failure type and its failure location.
[0020] Compared with the prior art, the beneficial effects of the present invention are as follows:
[0021] 1. By executing a concurrent hardware stress test process, the present invention simultaneously drives multiple keyboards to be tested, and synchronously monitors the functional error responses and internal scan matrix signal parameters of the multiple keyboards to be tested; extracts comprehensive test correlation features including the functional error responses and the changes in the signal parameters, and adaptively executes a diagnostic test based on the potential hardware failures indicated by the features for focusing on the fault source; by simulating a high-load concurrent test scenario, it can make multiple keyboards generate high-load input behaviors, real-time monitor the functional error responses and physical parameters related to keyboard testing, and fully extract the correlation features between the two, innovatively introducing the synchronous monitoring of the internal scan matrix signal parameters of the keyboard, so as to further determine potential hardware failures and adaptively execute a diagnostic test, which can effectively improve the repair efficiency of the keyboard.
[0022] 2. Based on the test control software analyzing the comprehensive test correlation features of the keyboard to be tested, the present invention obtains the occurrence probabilities of the potential hardware failure location and hardware failure type of the keyboard to be tested; the occurrence probability is used to determine the occurrence probabilities of the potential hardware failure location and hardware failure type of the keyboard to be tested. By quantifying the fault conditions under the comprehensive test correlation features, it can further achieve targeted testing, obtain the pointed fault area and fault type, and the present invention can comprehensively improve the repair efficiency of the keyboard.
[0023] 3. By comprehensively aggregating all the comprehensive test correlation features including the benchmark test and the concurrent hardware stress test, and performing targeted benchmark tests and concurrent hardware stress tests on the pointed fault area, and then obtaining the locked fault location within this area, diagnosing the fault type based on this fault location. If this fault type indeed exists, the final fault location and fault type are output. By comprehensively studying the performance of the keyboard under the benchmark test and the concurrent hardware stress test, multi-stage test features are constructed. This multi-dimensional and full-process fault location provides rich and detailed feature information. This complete intelligent diagnosis process of "global monitoring + correlation focusing + local verification + precise confirmation" can efficiently and accurately identify and locate various keyboard hardware failures, directly solving the core pain points of inaccurate diagnosis and low efficiency in the prior art, and thus can comprehensively improve the repair efficiency of the keyboard. Description of the Drawings
[0024] Figure 1 It is a schematic flow chart of a method for an automated test of keyboard input behavior provided by an embodiment of the present invention;
[0025] Figure 2 A schematic structural diagram of an automated testing system for keyboard input behavior provided by an embodiment of the present invention. DETAILED DESCRIPTION
[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.
[0027] Example 1: In order to improve the efficiency of keyboard repair when a keyboard manufacturer A faces keyboard failure before the keyboard leaves the factory, an automated testing method for keyboard input behavior is applied. Figure 1 A method flow diagram of an automated testing method for keyboard input behavior provided by an embodiment of the present invention includes:
[0028] An automated testing method for keyboard input behavior, comprising:
[0029] S1. Execute concurrent hardware stress testing, driving multiple keyboards under test simultaneously, and synchronously monitoring the functional error responses and internal scan matrix signal parameters of multiple keyboards under test;
[0030] Specifically, high-load input simulation is performed on 10 keyboards, including applying multiple input behaviors to these keyboards simultaneously, including single-key input and multi-key compound input; single-key input includes simulating rapid repeated pressing of a single key (such as the space bar) and simulating a 20-second press; multi-key compound input includes simulating rapid pressing (3 times / second) of commonly used standard combination keys (such as "CTRL" and "C") and simultaneous pressing of multiple keys (such as pressing the "W", "A", "Shift" and "Space" keys at the same time). Some input behaviors are shown in the following table;
[0031] Table 1 Partial input behavior table
[0032]
[0033]
[0034] Furthermore, functional error responses include missed keys, wrong keys, continuous keystrokes, sticky keys, excessive response delays, and failed combination keys; internal scan matrix signal parameters include electrical signal monitoring parameters on multiple row and column scan lines within the keyboard under test.
[0035] Furthermore, a missed key means that after a valid key is applied, the host does not receive the input, for example, the keyboard presses the "A" key, but the host does not receive the "A" key input; a wrong key means that after a valid key is applied, the host receives a discrepancy between the input and the keyboard input, for example, the keyboard presses the "B" key, but the host receives the "C" key input instead of the "B" key; a combo means that the keyboard inputs a key once, but the host receives two or more key presses, for example, the keyboard presses the "B" key once, but "BB" or "BBB" appears on the screen; a sticky key means that after a key is pressed and physically released, the keyboard continues to send the key to the host. Signals indicating a key has been pressed; for example, after releasing the "Shift" key, subsequent input letters remain uppercase. Excessive response latency indicates that the time interval between pressing a key and reaching the trigger point and the host actually receiving the key signal exceeds the preset acceptable threshold. Key combination failure means that when two or more key combinations for specific functions are pressed simultaneously in the correct manner (for example, "CTRL" + "C" for copying, "Shift" + "A" for entering a capital 'A', and "Alt" + "Tab" for switching windows), the host fails to correctly recognize these keyboard combinations.
[0036] The electrical signal monitoring parameters include high-level voltage, which indicates the actual voltage value in the logic high state; low-level voltage, which indicates the actual voltage value in the logic low state; signal rise time, which indicates the time required for the signal to jump from low level to high level; signal fall time, which indicates the time required for the flat jump signal to change from high level to low level; scan pulse width, which indicates the duration of the driving pulse; scan cycle, which indicates the time to complete a full matrix scan; scan sequence correctness, which indicates whether the row and column lines are driven and read in the predetermined order; (1 indicates yes), (0 indicates no);
[0037] S2. Extracting comprehensive test correlation features including the functional error response and the signal parameter change, and adaptively performing diagnostic analysis based on the features by the test control software to focus on the fault source; the process of the test control software obtaining the comprehensive test correlation features includes:
[0038] For each recorded “functional error response”, the corresponding electrical signal monitoring parameter value within the same time window is searched in the internal scanning matrix signal parameters according to its timestamp.
[0039] For example, if it is recorded at time T1 that the "G" key of keyboard 1 has a "key leakage", it is necessary to find the electro-signal monitoring parameter values within the same time window as time T1; and based on the preset thresholds of each electro-signal monitoring parameter value, determine each abnormal electro-signal monitoring parameter; and obtain the occurrence probabilities of each electro-signal monitoring parameter value under the occurrence of each functional error response, representing the correlation coefficient; further, the comprehensive test correlation feature reflects the correlation relationship between the functional error response and the internal scan matrix signal parameters;
[0040] By constructing a comprehensive test correlation feature to reflect the quantization of the correlation matrix between the functional error response and the internal scan matrix signal parameters; correlation matrix E ij Obtained through the correlation coefficient between the functional error response and the electro-signal monitoring parameter value; E 12 Represents the correlation coefficient between the first functional error response and the second electro-signal monitoring parameter value;
[0041] In this embodiment, by executing the concurrent hardware stress test process, multiple keyboards under test are driven simultaneously, and the functional error responses and internal scan matrix signal parameters of multiple keyboards under test are monitored synchronously; extract the comprehensive test correlation feature including the functional error response and the signal parameter change, and based on the potential hardware faults indicated by the feature, the test control software adaptively executes the diagnostic test for focusing on the fault source; by simulating a high-load concurrent test scenario, it is possible to make multiple keyboards generate high-load input behaviors, monitor the functional error responses and physical parameters related to the keyboard test in real time, and fully extract the correlation features between the two, so as to further determine the potential hardware faults and adaptively execute the diagnostic test, which can effectively improve the repair efficiency of the keyboard.
[0042] Further, the test control software obtains the occurrence probabilities of the potential hardware fault positions and hardware fault types of the keyboard under test by analyzing the comprehensive test correlation feature of the keyboard under test.
[0043] The occurrence probability is obtained by analyzing the historical correlation matrix corresponding to each historical fault type and historical fault position and the current correlation matrix respectively to obtain the first similarity and the second similarity, and finally obtaining the occurrence probabilities of each historical fault type and historical fault position; the process of obtaining the occurrence probability of each historical fault type includes: obtaining the quotient by dividing the first similarity of each historical fault type by the sum of the first similarities of all historical fault types; the process of obtaining the occurrence probability of each historical fault position includes: obtaining the quotient by dividing the second similarity of each historical fault position by the sum of the second similarities of all historical fault positions;
[0044] The calculation method of the first similarity includes: obtaining the row data of the historical correlation matrix of each historical fault type as the first multi-group of vectors, obtaining the corresponding row data of the current correlation matrix as the second multi-group of vectors, and based on the first multi-group of vectors and the second multi-group of vectors, respectively calculating the cosine similarity between each vector of the first multi-group of vectors and the corresponding vectors in the second multi-group of vectors to obtain a plurality of first cosine similarities, and then weighted summing the plurality of first cosine similarities to obtain the first similarity;
[0045] The calculation method of the second similarity includes: obtaining the row data of the historical correlation matrix of each historical fault location as the third multi-group of vectors, obtaining the corresponding row data of the current correlation matrix as the fourth multi-group of vectors, and based on the third multi-group of vectors and the fourth multi-group of vectors, respectively calculating the cosine similarity between each vector of the third multi-group of vectors and the corresponding vectors in the fourth multi-group of vectors to obtain a plurality of second cosine similarities, and then weighted summing the plurality of second cosine similarities to obtain the second similarity;
[0046] Further, for the keyboard fault area and fault type pointed to by the hardware fault type and hardware fault location with the highest current occurrence probability, the fault location includes row lines, column lines, etc.; the fault type includes line short circuit, switch failure, and excessive contact jitter, etc.;
[0047] Apply customized input behaviors to achieve fault source focusing; the customized input behaviors include performing corresponding targeted diagnoses based on the pointed keyboard fault area and fault type, and performing specific input behavior tests based on this location. The specific input behavior tests include a benchmark test and a concurrent hardware stress test;
[0048] The benchmark test includes performing several simple and non-high-speed presses on the keys in this area;
[0049] For the concurrent hardware stress test, only perform short-time high-frequency repeated presses on the keys in this area or apply specific multi-key combinations (simulating local concurrent stress);
[0050] S3. Aggregate all comprehensive test correlation features including the benchmark test and the concurrent hardware stress test, construct multi-stage test features, and determine the final hardware fault type and fault location of multiple keyboards to be tested.
[0051] All comprehensive test correlation features include the correlation matrix under the benchmark function test and the correlation matrix under the concurrent hardware stress test; based on the two correlation matrices, obtain the fault location with the highest occurrence probability in this area, and perform a diagnosis based on this fault location and the pointed fault type. If there is indeed this fault type at this location, then determine the final fault location and fault type.
[0052] In this embodiment, based on the test control software, the comprehensive test correlation features of the keyboard to be tested are analyzed to obtain the potential hardware fault locations of the keyboard to be tested and the occurrence probabilities of hardware fault types. The occurrence probabilities are used to determine the occurrence probabilities of the potential hardware fault locations and hardware fault types of the keyboard to be tested. By quantifying the fault conditions under the comprehensive test correlation features, targeted testing can be further realized, and the targeted fault areas and fault types can be obtained. The present invention can comprehensively improve the repair efficiency of the keyboard.
[0053] In this embodiment, all comprehensive test correlation features including benchmark tests and concurrent hardware stress tests are comprehensively aggregated, and targeted benchmark tests and concurrent hardware stress tests are performed on the targeted fault areas, and then the locked fault locations within these areas are obtained. Based on these fault locations, fault type diagnosis is carried out. If such a fault type indeed exists, the final fault location and fault type are output. By comprehensively studying the performance of the keyboard under benchmark tests and concurrent hardware stress tests, multi-stage test features are constructed. This multi-dimensional and full-process fault location provides rich and detailed feature information, thus being able to comprehensively improve the repair efficiency of the keyboard.
[0054] The present invention first performs a concurrent hardware stress test process on 10 keyboards of keyboard manufacturer A before the keyboards leave the factory, drives multiple keyboards to be tested simultaneously, and synchronously monitors the functional error responses and internal scan matrix signal parameters of the multiple keyboards to be tested; extracts the comprehensive test correlation features including the functional error responses and the changes in the signal parameters, and adaptively performs diagnostic analysis based on these features by the test control software for focusing on the fault sources. Traditional methods often only rely on the externally observable "functional error responses", which have a single information dimension and result in low diagnostic accuracy. This solution innovatively introduces the synchronous monitoring of the internal scan matrix signal parameters of the keyboard; it can improve the accuracy of keyboard fault diagnosis. Determine the targeted keyboard fault areas and fault types, and further perform targeted diagnostic tests, perform benchmark tests and concurrent hardware stress tests based on these areas, and then confirm more detailed fault locations, and confirm the fault types for these fault locations. If such a fault type is found during the test of this location, determine the final fault location and fault type. This complete intelligent diagnosis process of "global monitoring + correlation focusing + local verification + precise confirmation" can efficiently and accurately identify and locate various keyboard hardware faults, directly solving the core pain points of inaccurate diagnosis and low efficiency in the prior art, and ultimately will surely significantly improve the repair efficiency of the keyboard.
[0055] The object of the present invention is to provide an automated test method and system for keyboard input behavior, including: by executing a concurrent hardware stress test process, driving multiple keyboards to be tested simultaneously, and synchronously monitoring the functional error responses and internal scan matrix signal parameters of the multiple keyboards to be tested, extracting the comprehensive test correlation features of the functional error responses and signal parameter changes, and adaptively executing a diagnostic test by the test control software based on the potential hardware faults indicated by the features; aggregating all the comprehensive test correlation features including the benchmark test and the concurrent hardware stress test, constructing multi-stage test features, and determining the hardware fault types and fault locations of the multiple keyboards to be tested. The present invention can effectively improve the repair efficiency of keyboards.
[0056] Embodiment 2: In order to improve the keyboard repair efficiency of B keyboard manufacturers when facing keyboard failures before the keyboards leave the factory, an automated test system for keyboard input behavior is applied. Figure 2 As shown in the structural schematic diagram of an automated test system for keyboard input behavior provided by an embodiment of the present invention, it includes:
[0057] An automated test system for keyboard input behavior includes:
[0058] An automated driving unit, configured to execute a concurrent hardware stress test process, drive multiple keyboards to be tested simultaneously, and synchronously monitor the functional error responses and internal scan matrix signal parameters of the multiple keyboards to be tested;
[0059] Further, the functional error responses include missed keys, wrong keys, double clicks, sticky keys, excessive response delays, and combination key failures; the internal scan matrix signal parameters include the electrical signal monitoring parameters on the internal row and column scan lines of the multiple keyboards to be tested.
[0060] A data acquisition and monitoring module, which extracts the comprehensive test correlation features including the functional error responses and the signal parameter changes, and adaptively executes diagnostic analysis by the test control software based on the features, for focusing on the fault source;
[0061] Further, the comprehensive test correlation features reflect the correlation relationship between the functional error responses and the internal scan matrix signal parameters. By constructing the comprehensive test correlation features, the correlation features are quantified by the correlation matrix of the functional error responses and the internal scan matrix signal parameters.
[0062] Further, the test control software analyzes the comprehensive test correlation features of the keyboard to be tested, and obtains the occurrence probabilities of the potential hardware fault locations and hardware fault types of the keyboard to be tested.
[0063] Further, the occurrence probability is obtained by analyzing the historical correlation matrix corresponding to each historical fault type and historical fault location with the current correlation matrix respectively to obtain the first similarity and the second similarity, and finally obtaining the occurrence probability of each historical fault type and historical fault location; the process of obtaining the occurrence probability of each historical fault type includes: obtaining the quotient by dividing the first similarity of each historical fault type by the sum of the first similarities of all historical fault types; the process of obtaining the occurrence probability of each historical fault location includes: obtaining the quotient by dividing the second similarity of each historical fault location by the sum of the second similarities of all historical fault locations.
[0064] Further, for the keyboard fault area and fault type pointed to by the hardware fault type and hardware fault location with the highest current occurrence probability, the fault location includes row lines, column lines, etc.; the fault types include line short circuit, switch failure, and excessive contact jitter, etc.
[0065] The multi-stage test and analysis unit aggregates all comprehensive test correlation features including benchmark tests and concurrent hardware stress tests, constructs multi-stage test features, and determines the final hardware fault types and fault locations of multiple keyboards to be tested;
[0066] Although the embodiments of the present invention have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.
Claims
1. An automated test method for keyboard input behavior, characterized in that, Including: S1. Execute the concurrent hardware stress test process, drive multiple keyboards under test simultaneously, and synchronously monitor the functional error responses and internal scan matrix signal parameters of multiple keyboards under test; S2. Extract the comprehensive test correlation features including the functional error responses and the changes in the signal parameters, and adaptively perform diagnostic analysis based on these features by the test control software for focusing on the fault source; S3. Aggregate all the comprehensive test correlation features including the benchmark test and the concurrent hardware stress test, construct multi-stage test features, and determine the final hardware fault types and fault locations of multiple keyboards under test.
2. The automated test method for keyboard input behavior according to claim 1, characterized in that: The functional error responses include missed keys, wrong keys, double-clicking, sticky keys, excessive response delay, and combination key failure; the internal scan matrix signal parameters include the electrical signal monitoring parameters on the internal row and column scan lines of multiple keyboards under test.
3. The automated test method for keyboard input behavior according to claim 1, wherein The comprehensive test correlation features reflect the correlation between the functional error responses and the internal scan matrix signal parameters. By constructing the comprehensive test correlation features, the correlation features are quantified through the correlation matrix between the functional error responses and the internal scan matrix signal parameters.
4. The automated test method for keyboard input behavior according to claim 1, wherein: The test control software obtains the occurrence probabilities of the potential hardware fault locations and hardware fault types of the keyboards under test by analyzing the comprehensive test correlation features of the keyboards under test.
5. The automated test method for keyboard input behavior according to claim 1, characterized in that: The occurrence probabilities are obtained by analyzing the historical correlation matrices corresponding to each historical fault type and historical fault location respectively with the current correlation matrix to obtain the first similarity and the second similarity, and finally obtaining the occurrence probabilities of each historical fault type and historical fault location; The process of obtaining the occurrence probabilities of each historical fault type includes: obtaining the quotient by dividing the first similarity of each historical fault type by the sum of the first similarities of all historical fault types; the process of obtaining the occurrence probabilities of each historical fault location includes: obtaining the quotient by dividing the second similarity of each historical fault location by the sum of the second similarities of all historical fault locations.
6. The automated test method for keyboard input behavior according to claim 1, wherein: Apply customized input behaviors to the keyboard fault areas and fault types pointed to by the current hardware fault type and hardware fault location with the highest occurrence probability to achieve fault source focusing.
7. An automated test system for keyboard input behavior, characterized in that, Including: Automated drive unit, used to execute the concurrent hardware stress test process, drive multiple keyboards under test simultaneously, and synchronously monitor the functional error responses and internal scan matrix signal parameters of multiple keyboards under test; Data acquisition and monitoring module, extracts the comprehensive test correlation features including the functional error responses and the changes in the signal parameters, and adaptively performs diagnostic analysis based on these features by the test control software for focusing on the fault source; Multi-stage test and analysis unit, aggregates all the comprehensive test correlation features including the historical benchmark test and the concurrent hardware stress test, constructs multi-stage test features, and determines the final hardware fault types and fault locations of multiple keyboards under test; Comprehensive repair unit, repairs multiple keyboards under test based on the hardware fault types and their fault locations.