Product testing method, device and equipment based on graphical user interface

Abstract

The invention discloses a product testing method, device and equipment based on a graphical user interface. The method comprises the following steps: displaying image information and an operation interface of a to-be-tested product; reading test parameter information acquired by the operation interface; the test parameter information comprises input test parameter information and output parameter information; generating a test parameter control according to the input test parameter information; determining matching information of the image information and the test parameter control; obtaining input parameter interface information corresponding to the input test parameter information; and generating test flow information based on the input parameter interface information, the matching information and the output parameter information. The to-be-tested product and the test parameter control are displayed based on the graphical user interface, the test process information of the to-be-tested product is generated based on the image information and the matching information, the input parameters and the output parameters of the test parameter control, the design process of the test process is simplified, the test algorithm research and development process is optimized, and the test efficiency is improved. The problem of how to improve the product testing efficiency is solved.

Description

Technical Field

[0001] The present application relates to the field of product testing technology, and in particular to a product testing method, device and equipment based on a graphical user interface. Background Art

[0002] When testing semiconductor devices, power electronics, sensors, and other products, a wide range of instruments are used to measure and analyze characteristics such as voltage, current, impedance, and frequency. By selecting instruments appropriately, standardizing test procedures, and analyzing test results, product parameter measurement and diagnosis can be completed efficiently.

[0003] In existing technologies, test process algorithms are highly integrated with system software. However, different products often require different test algorithms. Adding or modifying algorithmic functions often requires updating the system code. Furthermore, the algorithm development process is lengthy and requires significant human and material resources, leading to low product testing efficiency. Therefore, a product testing method based on a graphical user interface (GUI) is urgently needed to improve testing efficiency and address these issues. Summary of the Invention

[0004] The present application provides a product testing method, apparatus and equipment based on a graphical user interface, which can display the product to be tested and test parameter controls based on the graphical user interface, generate test process information of the product to be tested based on the image information of the product to be tested and the matching information of the test parameter controls, as well as the information of the input parameters and output parameters, simplify the design process of the test process, optimize the test algorithm development process, improve the flexibility of responding to changes in product testing requirements, reduce labor costs, and solve the problem of how to improve product testing efficiency.

[0005] According to one aspect of the present application, a product testing method based on a graphical user interface is proposed, the method comprising:

[0006] Display image information and operation interface of the product to be tested;

[0007] Reading the test parameter information obtained from the operation interface; the test parameter information includes input test parameter information and output parameter information;

[0008] Generate a test parameter control according to the input test parameter information;

[0009] Determining matching information between the image information of the product to be tested and the test parameter control;

[0010] Obtaining input parameter interface information corresponding to the input test parameter information;

[0011] Based on the input parameter interface information, the matching information and the output parameter information, test process information of the product to be tested is generated.

[0012] In a possible implementation, the operation interface includes an input parameter setting interface and an output parameter setting interface.

[0013] The reading of the test parameter information obtained from the operation interface includes:

[0014] Acquiring the input test parameter information input based on the input parameter setting interface;

[0015] Acquiring the input output parameter information based on the output parameter setting interface;

[0016] The input test parameter information and the output parameter information are determined to be the test parameter information.

[0017] In a possible implementation, the input test parameter information includes test instrument information, test signal information, and test delay information.

[0018] Generating a test parameter control according to the input test parameter information includes:

[0019] generating the test parameter control based on the test instrument information, the test signal information and the test delay information;

[0020] The test parameter controls are displayed.

[0021] In a possible implementation, determining the matching information between the image information of the product to be tested and the test parameter control includes:

[0022] Obtaining a move operation on the test parameter control;

[0023] Based on the movement operation, controlling the test parameter control to move to a target matching position of the image information of the product to be tested, and generating a mapping relationship between the test parameter control and the image information of the product to be tested;

[0024] The mapping relationship is determined as the matching information.

[0025] In a possible implementation, the obtaining of input parameter interface information corresponding to the input test parameter information includes:

[0026] Based on the test instrument information, a preset instrument management interface library is queried to obtain a test instrument interface corresponding to the test instrument information; the preset instrument management interface library is constructed based on the interface information of the preset instrument;

[0027] querying the preset instrument management interface library based on the test signal information to obtain a test signal interface corresponding to the test signal information;

[0028] Querying the preset instrument management interface library based on the test delay information to obtain a test delay interface corresponding to the test delay information;

[0029] The test instrument interface, the test signal interface, and the test delay interface are determined as the input parameter interface information.

[0030] In a possible implementation, the preset instrument includes a plurality of source instruments for product testing.

[0031] The method for constructing the preset instrument management interface library includes:

[0032] Acquire management information of each source meter, where the management information is used to manage the operation of each source meter, and the management information includes an access interface, a signal interface, and a delay interface corresponding to each source meter;

[0033] The preset instrument management interface library is constructed based on the mapping relationship between each source instrument and the access interface, signal interface and delay interface corresponding to each source instrument.

[0034] In a possible implementation, the generating the test process information of the product to be tested based on the input parameter interface information, the matching information, and the output parameter information includes:

[0035] Perform fusion processing based on the input parameter interface information, the matching information and the output parameter information to generate initial process information;

[0036] Get custom process information;

[0037] The customized process information and the initial process information are combined to obtain the test process information of the product to be tested.

[0038] In a possible implementation, after generating the test process information of the product to be tested, the method further includes:

[0039] Testing the product to be tested based on the test process information to obtain test feedback information;

[0040] Assigning a value to the output parameter information based on the test feedback information;

[0041] Display the output parameter information after assignment.

[0042] In another aspect, a product testing device based on a graphical user interface is provided, the device comprising:

[0043] Display module, used to display image information and operation interface of the product to be tested;

[0044] A reading module, configured to read the test parameter information obtained from the operation interface; the test parameter information includes input test parameter information and output parameter information;

[0045] A control generation module, configured to generate a test parameter control according to the input test parameter information;

[0046] a matching information determination module, configured to determine matching information between the image information of the product to be tested and the test parameter control;

[0047] An interface information acquisition module is used to obtain input parameter interface information corresponding to the input test parameter information;

[0048] A test process generating module is used to generate test process information of the product to be tested based on the input parameter interface information, the matching information and the output parameter information.

[0049] In a possible implementation, the operation interface includes an input parameter setting interface and an output parameter setting interface, and the reading module is used to:

[0050] Acquiring the input test parameter information input based on the input parameter setting interface;

[0051] Acquiring the input output parameter information based on the output parameter setting interface;

[0052] The input test parameter information and the output parameter information are determined to be the test parameter information.

[0053] In a possible implementation, the input test parameter information includes test instrument information, test signal information, and test delay information, and the control generation module is configured to:

[0054] generating the test parameter control based on the test instrument information, the test signal information and the test delay information;

[0055] The test parameter controls are displayed.

[0056] In a possible implementation, the matching information determination module is configured to:

[0057] Obtaining a move operation on the test parameter control;

[0058] Based on the movement operation, controlling the test parameter control to move to a target matching position of the image information of the product to be tested, and generating a mapping relationship between the test parameter control and the image information of the product to be tested;

[0059] The mapping relationship is determined as the matching information.

[0060] In a possible implementation, the interface information acquisition module is configured to:

[0061] Based on the test instrument information, a preset instrument management interface library is queried to obtain a test instrument interface corresponding to the test instrument information; the preset instrument management interface library is constructed based on the interface information of the preset instrument;

[0062] querying the preset instrument management interface library based on the test signal information to obtain a test signal interface corresponding to the test signal information;

[0063] Querying the preset instrument management interface library based on the test delay information to obtain a test delay interface corresponding to the test delay information;

[0064] The test instrument interface, the test signal interface, and the test delay interface are determined as the input parameter interface information.

[0065] In a possible implementation, the preset instrument includes a plurality of source instruments for product testing, and the apparatus further includes a construction module, wherein the construction module is configured to:

[0066] Acquire management information of each source meter, where the management information is used to manage the operation of each source meter, and the management information includes an access interface, a signal interface, and a delay interface corresponding to each source meter;

[0067] The preset instrument management interface library is constructed based on the mapping relationship between each source instrument and the access interface, signal interface and delay interface corresponding to each source instrument.

[0068] In a possible implementation, the test process generation module is configured to:

[0069] Perform fusion processing based on the input parameter interface information, the matching information and the output parameter information to generate initial process information;

[0070] Get custom process information;

[0071] The customized process information and the initial process information are combined to obtain the test process information of the product to be tested.

[0072] In a possible implementation, the apparatus further includes a testing module, which, after generating the test process information of the product to be tested, is configured to:

[0073] Testing the product to be tested based on the test process information to obtain test feedback information;

[0074] Assigning a value to the output parameter information based on the test feedback information;

[0075] Display the output parameter information after assignment.

[0076] On the other hand, an electronic device is provided, including a processor and a memory, wherein the memory stores at least one instruction or at least one program, and the at least one instruction or the at least one program is loaded and executed by the processor to implement any of the above-mentioned aspects of the product testing method based on a graphical user interface.

[0077] On the other hand, a computer-readable storage medium is provided, in which at least one instruction or at least one program is stored. The at least one instruction or the at least one program is loaded and executed by a processor to implement a product testing method based on a graphical user interface as described in any of the above aspects.

[0078] In another aspect, a computer program product or computer program is provided, comprising computer instructions stored in a computer-readable storage medium. A processor of an electronic device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the electronic device to perform any of the aforementioned graphical user interface-based product testing methods.

[0079] The embodiment of the present application displays the image information and operation interface of the product to be tested; reads the test parameter information obtained from the operation interface; the test parameter information includes input test parameter information and output parameter information; generates a test parameter control according to the input test parameter information; determines the matching information between the image information of the product to be tested and the test parameter control; obtains the input parameter interface information corresponding to the input test parameter information; and generates the test process information of the product to be tested based on the input parameter interface information, the matching information and the output parameter information. The product to be tested and the test parameter control are displayed based on a graphical user interface, and the test process information of the product to be tested is generated based on the image information of the product to be tested and the matching information of the test parameter control, as well as the information of the input parameters and output parameters. This simplifies the design process of the test process, optimizes the test algorithm development process, improves the flexibility of responding to changes in product testing requirements, reduces labor costs, and solves the problem of how to improve product testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0080] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0081] Figure 1 This is a flowchart of a product testing method based on a graphical user interface provided in an embodiment of the present application;

[0082] Figure 2 This is a first schematic diagram of the operation interface provided in an embodiment of the present application;

[0083] Figure 3 is a schematic diagram of an output parameter setting interface provided in an embodiment of the present application;

[0084] Figure 4 This is a second schematic diagram of the operation interface provided in an embodiment of the present application;

[0085] Figure 5 This is a schematic block diagram of the debugging process of the product testing method based on the graphical user interface provided in an embodiment of the present application;

[0086] Figure 6 is a schematic block diagram of an instrument management module provided in an embodiment of the present application;

[0087] Figure 7 is a schematic block diagram of a product testing device based on a graphical user interface provided in an embodiment of the present application;

[0088] Among them, the reference numerals in the figure correspond to: 1-product to be tested, 2-test parameter control. DETAILED DESCRIPTION

[0089] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0090] When testing semiconductor devices, power electronics, and sensors, a variety of instrumentation is widely used to measure and analyze characteristics such as voltage, current, impedance, and frequency. However, test algorithms are typically integrated into system software. Adding or modifying algorithms requires updating the system code, which is complex and time-consuming, making it difficult to adapt to changing requirements.

[0091] The embodiment of the present application provides a product testing method based on a graphical user interface. The method displays the product to be tested and the test parameter control based on the graphical user interface. Based on the image information of the product to be tested and the matching information of the test parameter control, as well as the information of the input parameters and output parameters, the test process information of the product to be tested is generated. This method simplifies the design process of the test process, optimizes the test algorithm development process, improves the flexibility of responding to changes in product testing requirements, and reduces labor costs. Figure 1 The product testing method based on a graphical user interface includes steps S101 to S1011.

[0092] In step S101 , the image information and operation interface of the product to be tested are displayed.

[0093] In a possible implementation, the image information of the product to be tested is displayed by controlling a product testing system, which is used to implement the product testing method based on a graphical user interface.

[0094] In one possible implementation, the product testing system includes the operation interface, which is designed based on graphical user interface technology and is configured to receive instruction information from an object. Specifically, the object is a user of the operation interface, including testers and R&D personnel.

[0095] In one possible implementation, a graphical user interface (GUI), also known as a graphical user interface, refers to a computer user interface that uses graphics. A GUI is a medium for information exchange that uses graphical objects such as windows, buttons, and menus. Users send commands to computers and other electronic devices through graphical objects, and the computer receives the commands and provides graphical feedback on the results of its operations.

[0096] In a possible implementation, the object can be interactively operated through the operation interface, and the interactive operations include click, input, drag and drop, etc.

[0097] In a possible implementation, the operation interface is further used to display image information of the product to be tested.

[0098] In one possible implementation, the product to be tested is an electronic component that needs to be tested, including passive components, active components, semiconductor devices, sensors, etc. Specifically, the passive components include resistors, capacitors, inductors, and transformers, the active components include diodes, transistors, integrated circuits, and crystal oscillators, the semiconductor devices include optoelectronic devices and power devices, and the sensors include temperature sensors, accelerometers, and photosensors.

[0099] In one possible implementation, Figure 2 As shown, the product to be tested is a resistor R to be tested, and image information of the product to be tested is displayed on the operation interface.

[0100] In step S103, the test parameter information obtained from the operation interface is read; the test parameter information includes input test parameter information and output parameter information.

[0101] In a possible implementation, the operation interface includes an input parameter setting interface and an output parameter setting interface.

[0102] The reading of the test parameter information obtained from the operation interface includes:

[0103] Acquiring the input test parameter information input based on the input parameter setting interface;

[0104] Acquiring the input output parameter information based on the output parameter setting interface;

[0105] The input test parameter information and the output parameter information are determined to be the test parameter information.

[0106] In a possible implementation, the object may perform an input operation based on the input parameter setting interface to input the input test parameter information into an input area of the input parameter setting interface.

[0107] In one possible implementation, the input test parameter information includes test instrument information, test signal information, and test delay information, and the input parameter setting interface includes a first input area, a second input area, and a third input area. Specifically, the first input area is used to receive the test instrument information input by the subject, the second input area is used to receive the test signal information input by the subject, and the third input area is used to receive the test delay information input by the subject.

[0108] In one possible implementation, the test instrument information input is obtained based on the first input area; the test signal information input is obtained based on the second input area; the test delay information input is obtained based on the third input area; and the test instrument information, the test signal information, and the test delay information are determined to be the input test parameter information.

[0109] In one possible implementation, the test instrument information represents device information of a source instrument. The source instrument is an instrument used to accurately measure current and voltage and is used for electronic component testing. The source instrument can both output current / voltage (as a "source") and synchronously measure the response (e.g., voltage, current) of the electronic component being tested, such as a semiconductor or sensor.

[0110] In a possible implementation, the test signal information represents parameter information of the source instrument, and the parameter information includes a voltage value, a current value, and a number of scanning points of the output signal.

[0111] In a possible implementation, the test delay information represents the time delay from the start of scanning to the completion of scanning (or output of results) when the source instrument performs a scanning operation.

[0112] In one possible implementation, Figure 2 As shown, the operation interface includes an input parameter setting interface, through which the object can input the input test parameter information. Specifically, the operation interface includes multiple input boxes, and the multiple input boxes are used to input different input test parameter information.

[0113] In one possible implementation, Figure 2 As shown, the operation interface includes multiple input boxes for obtaining multiple input test parameter information. Specifically, the input boxes include a source box, a start box, a stop box, a point box, and an SDelay box.

[0114] In one possible implementation, Figure 2 As shown, the input test parameter information includes source (source instrument name), sync (synchronization information), start (start scanning voltage), stop (end scanning voltage) and point (scanning points) and the like.

[0115] In one possible implementation, Figure 2 As shown in the example, the user selects the source instrument named R_Source in the Source box and the type is Module. Specifically, the default value of the input parameter in the Source box is SMU1.

[0116] In one possible implementation, Figure 2 As shown, the user enters the start scan voltage (StartVoltage) in the start box, the type is floating point, and the unit is V. Specifically, the default value of the start box input parameter is 1V.

[0117] In one possible implementation, Figure 2 As shown, the user enters the end scan voltage (EndVoltage) in the stop box, the type is floating point, and the unit is V. Specifically, the default value of the stop box input parameter is 5V.

[0118] In one possible implementation, Figure 2 As shown in the figure, the user enters the number of sweep points (SweepPoint) in the point box. The type is integer and the unit is None. Specifically, the default value of the point box input parameter is 100.

[0119] In one possible implementation, Figure 2 As shown, the user enters the scan delay (DelayTime) in the SDelay box, the type is floating point, and the unit is S. Specifically, the default value of the SDelay box input parameter is 0.01S.

[0120] In one possible implementation, Figure 3 As shown, the object can perform input operations based on the output parameter setting interface, so that the product testing system can make parameter declarations based on the output parameter information.

[0121] In this implementation method, users can set input test parameter information based on the input parameter setting interface and set output parameter information based on the output parameter setting interface to quickly define the test parameter information required for product testing. The system automatically reads the test parameter information obtained from the operation interface, providing convenience for users to define input and output parameters.

[0122] In step S105, a test parameter control is generated according to the input test parameter information.

[0123] In a possible implementation, the input test parameter information includes test instrument information, test signal information, and test delay information.

[0124] Generating a test parameter control according to the input test parameter information includes:

[0125] generating the test parameter control based on the test instrument information, the test signal information and the test delay information;

[0126] The test parameter controls are displayed.

[0127] In a possible implementation, the test parameter control is generated based on the test instrument information, the test signal information, and the test delay information. The object can drag the test parameter control.

[0128] In a possible implementation, there may be multiple test parameter information inputs, and each time a test parameter information is input, a corresponding test parameter control will be generated.

[0129] In a possible implementation, after generating a test parameter control corresponding to the input test parameter information, the test parameter control is displayed on the product test interface.

[0130] In one possible implementation, Figure 2 As shown, based on the multiple input test parameter information obtained from the input box, the test parameter control is generated, so that the user can drag and drop the test parameter control to the corresponding pins or areas on the picture of the resistor R to be tested to establish a visual parameter component mapping relationship.

[0131] In one possible implementation, Figure 4 As shown, when the product to be tested is a MOS (Metal-Oxide-Semiconductor Field-Effect Transistor) to be tested, multiple test parameter controls are generated based on the multiple input test parameter information obtained in the input box. The user can drag and drop the test parameter controls to the corresponding pins or areas on the image of the MOS tube to be tested to establish a visual parameter-component mapping relationship.

[0132] In this implementation, a test parameter control is generated based on the input test parameter information, and the test parameter control is displayed on the operation interface, so that the input test parameter information essential for product testing is visualized, making it convenient for users to quickly design and deploy test algorithm processes.

[0133] In step S107, the matching information between the image information of the product to be tested and the test parameter control is determined.

[0134] In a possible implementation, determining the matching information between the image information of the product to be tested and the test parameter control includes:

[0135] Obtaining a move operation on the test parameter control;

[0136] Based on the movement operation, controlling the test parameter control to move to a target matching position of the image information of the product to be tested, and generating a mapping relationship between the test parameter control and the image information of the product to be tested;

[0137] The mapping relationship is determined as the matching information.

[0138] In a possible implementation manner, the object drags the image information of the product to be tested and the test parameter control to move the test parameter control to a target matching position of the image information of the product to be tested.

[0139] In a possible implementation, the target matching position represents a component of the product to be tested that needs to be tested. Specifically, when the product to be tested is a resistor, the target matching position is the position of a resistor pin.

[0140] In a possible implementation, it is determined that the test parameter control moves to the target matching position, that is, the test parameter control completes the matching task with the product to be tested, and image information of the product to be tested and matching information of the test parameter control are generated.

[0141] In one possible implementation, Figure 2 As shown, the user drags and drops the test parameter controls to corresponding pins or areas on the image of the resistor R to be tested to establish a visual parameter-component mapping relationship, and determines the mapping relationship as the matching information.

[0142] In one possible implementation, Figure 4 As shown, when the product to be tested is a MOS (Metal-Oxide-Semiconductor Field-Effect Transistor) to be tested, multiple test parameter controls are generated based on the multiple input test parameter information obtained in the input box. The user drags and drops the test parameter controls to corresponding pins or areas on the picture of the MOS tube to be tested to establish a visual parameter-component mapping relationship, and determines that the mapping relationship is the matching information.

[0143] In this implementation, by moving the image information of the product to be tested and the test parameter controls, a visual mapping relationship between test parameters and components is established, which lowers the algorithm development threshold, accelerates the test algorithm development cycle, helps users quickly complete test algorithm design and deployment, and improves development efficiency.

[0144] In step S109, the input parameter interface information corresponding to the input test parameter information is obtained.

[0145] In a possible implementation, the obtaining of input parameter interface information corresponding to the input test parameter information includes:

[0146] Based on the test instrument information, a preset instrument management interface library is queried to obtain a test instrument interface corresponding to the test instrument information; the preset instrument management interface library is constructed based on the interface information of the preset instrument;

[0147] querying the preset instrument management interface library based on the test signal information to obtain a test signal interface corresponding to the test signal information;

[0148] Querying the preset instrument management interface library based on the test delay information to obtain a test delay interface corresponding to the test delay information;

[0149] The test instrument interface, the test signal interface, and the test delay interface are determined as the input parameter interface information.

[0150] In a possible implementation, the preset instrument includes a plurality of source instruments for product testing.

[0151] The method for constructing the preset instrument management interface library includes:

[0152] Acquire management information of each source meter, where the management information is used to manage the operation of each source meter, and the management information includes an access interface, a signal interface, and a delay interface corresponding to each source meter;

[0153] The preset instrument management interface library is constructed based on the mapping relationship between each source instrument and the access interface, signal interface and delay interface corresponding to each source instrument.

[0154] In a possible implementation, the preset instrument management interface library is constructed based on a mapping relationship between each source instrument and the access interface, signal interface, and delay interface corresponding to each source instrument.

[0155] In one possible implementation, the preset instrument management interface library is a Python library file generated based on the mapping relationship between each source instrument and the access interface, signal interface and delay interface corresponding to each source instrument, as well as an interface description file for the library file, which is used to query the corresponding input parameter interface information based on the input test parameter information.

[0156] In a possible implementation, the preset instrument management interface library is added to a target location of the product testing system to facilitate acquisition of input parameter interface information corresponding to the input test parameter information.

[0157] In one possible implementation, source instruments used for product testing usually need to be accessed in a C++ environment. By encapsulating the source instrument management interface, a Python library file is obtained, and input parameter interface information that can be used for direct access is obtained.

[0158] In one possible implementation, Figure 5 As shown, the preset instrument management interface library is the Py instrument management module, which includes management modules such as SUM management, CMU management, scanning algorithm management, SPGU management, FMU management, DVM management, and matrix management. The Py instrument management module is used to realize the automatic generation of product test code.

[0159] In one possible implementation, Figure 6 The instrument class derivation and encapsulation structure of the Py instrument management module is shown, including the instrument management module, the built-in instrument DLL (Dynamic Link Library), and the extended instrument DLL (Dynamic Link Library). The built-in instrument DLL and the extended instrument DLL are used to enrich the functionality of the Py instrument management module and achieve unified management.

[0160] In this implementation, unified interface management is performed based on a preset instrument management interface library, which improves the convenience of obtaining input parameter interface information corresponding to input test parameter information, improves the accuracy and security of instrument access, and improves the degree of automation of algorithm design.

[0161] In step S1011, based on the input parameter interface information, the matching information and the output parameter information, the test process information of the product to be tested is generated.

[0162] In a possible implementation, the generating the test process information of the product to be tested based on the input parameter interface information, the matching information, and the output parameter information includes:

[0163] Perform fusion processing based on the input parameter interface information, the matching information and the output parameter information to generate initial process information;

[0164] Get custom process information;

[0165] The customized process information and the initial process information are combined to obtain the test process information of the product to be tested.

[0166] In one possible implementation, the input parameter interface information, the custom process information and the exception handling process information are obtained; based on the input parameter interface information, the exception handling process information and the custom process information, merge processing is performed to obtain merged test process information; the merged test process information is environmentally adapted to obtain the test process information of the product to be tested.

[0167] In a possible implementation, the exception handling process information represents parameter verification logic. Specifically, the exception handling process information includes try / catch logic, which is a core mechanism for handling exceptions (errors) in programming.

[0168] In a possible implementation, the customized process information represents the object customized code, which is used to generate the test result of the product to be tested required by the object.

[0169] In a possible implementation, the test product system communicates with a python code editor and an integrated development environment via an interface. Specifically, the test product system communicates with a PyCharm integrated development environment.

[0170] In a possible implementation, the input parameters of the main function are defined based on the input parameter interface information, the output parameters of the main function are defined based on the output parameter information, and a parameter verification module is added to obtain an initial algorithm framework.

[0171] In one possible implementation, in the PyCharm integrated development environment, code for custom process information is added to the initial algorithm framework to obtain the target test algorithm.

[0172] In one possible implementation, the target test algorithm is subjected to environmental adaptation. Specifically, the function body of the target test algorithm is debugged. When the function body of the test algorithm is a Python script, during the development and debugging phase, the code of the function body of the test algorithm is loaded into PyCharm (Python's integrated development environment) for debugging mode, and automatically switches to the RPC call mode to access the instrument resources, allowing the user to single-step debug and observe the execution status; in the deployment environment, an efficient local DLL call is used to schedule instrument resources in a high-performance manner for rapid execution. RPC (Remote Procedure Call) is a technology that allows a program to call a function or method of a remote service (another machine or process), making distributed systems as simple as local calls.

[0173] In a possible implementation, the target test algorithm after the environment adaptation process is the test process information of the product to be tested.

[0174] In one possible implementation, Figure 2 As shown, the user drags and drops the test parameter controls to corresponding pins or areas on the image of the resistor R to be tested, so as to establish a visual parameter-component mapping relationship.

[0175] In one possible implementation, Figure 2 As shown, after confirming that a parameter element mapping relationship has been established between the resistance R to be tested and the test parameter control, the product testing system automatically generates a Python code with the following structure, introduces the instrument management interface package (from PyInstrumentManager import*); defines the main function: def R_VI(R_Source:Module,StartVoltage:float,EndVoltage:float,SweepPoint:int,DelayTime:float); in the function body, adds parameter verification and try / catch logic; calls the above function in the main() function of the main function, and automatically fills in the input parameter interface information corresponding to the input test parameter information configured in the operation interface as the actual parameter.

[0176] In one possible implementation, try / catch logic is the core mechanism for handling exceptions (errors) in programming. The core idea is to try to execute code that may fail, and if an error occurs, catch and handle the exception to avoid program crashes.

[0177] In one possible implementation, Figure 5 As shown, before testing the product to be tested based on the test process information, the automatically generated Python code is loaded into PyCharm based on the product testing system for code debugging and code modification. After debugging is completed, the target python file that can be directly loaded by the system is encapsulated based on the Py instrument management module. The system saves the target python file to the target directory and generates an algorithm description file for marking parameter information. The format of the algorithm description file is YAML (YAML Ain't Markup Language), a human-friendly data serialization format. Specifically, when the system starts, the target directory is traversed and all algorithms are automatically loaded. The system automatically loads and executes the algorithms in the configuration order, uniformly collects test data and outputs results.

[0178] In this implementation, functions are improved based on the input parameter interface information, the matching information and the output parameter information, and environment configuration and debugging are automatically performed, which improves the flexibility of responding to changes in product testing requirements and significantly shortens the design and verification cycle of test scripts while ensuring readability.

[0179] In a possible implementation, after generating the test process information of the product to be tested, the method further includes:

[0180] Testing the product to be tested based on the test process information to obtain test feedback information;

[0181] Assigning a value to the output parameter information based on the test feedback information;

[0182] Display the output parameter information after assignment.

[0183] In a possible implementation, the function body file of the test process information is saved in the target directory of the product testing system, and an algorithm description file is generated for marking parameter information of the function body.

[0184] In a possible implementation, the input test parameter information is passed as an actual parameter to the main function of the test process information of the target directory, and the output parameter information after assignment is obtained and displayed.

[0185] In one possible implementation, a test circuit of the product to be tested is determined based on the image information of the product to be tested and the matching information of the test parameter control. The test circuit represents the communication connection or electrical connection relationship between the product to be tested and the source instrument corresponding to the test parameter control.

[0186] In one possible implementation, the product to be tested is tested based on the test circuit and the test process information. The object clicks the test confirmation control of the product testing system, and the product testing system traverses all files under the target directory and automatically loads all algorithms for testing. After the test circuit is connected, the product to be tested is tested to generate test results.

[0187] In one possible implementation, Figure 2As shown, when the product to be tested is the resistor to be tested R, the source instrument information R_Source is obtained through the get_smu_instance function, the SUM object instance is obtained, the IV_Sweep interface of the SUM management module is used, and the StartVoltage / EndVoltage / SweepPoint / DelayTime are passed in to perform voltage and current scanning. The getVoltage / getCurrent of the SUM management module is used to obtain voltage and current data, and the data is saved for IV (current and voltage) characteristic analysis to generate test results.

[0188] In this implementation, the product to be tested is tested based on the test process information, and the test results are displayed based on the output parameter information, so that the test results are visualized, the readability of the test results is improved, and the user experience is enhanced.

[0189] The above-mentioned embodiments of the present application have the following beneficial effects: the present application displays the image information and operation interface of the product to be tested; reads the test parameter information obtained from the operation interface; the test parameter information includes input test parameter information and output parameter information; generates a test parameter control according to the input test parameter information; determines the matching information between the image information of the product to be tested and the test parameter control; obtains the input parameter interface information corresponding to the input test parameter information; and generates the test process information of the product to be tested based on the input parameter interface information, the matching information and the output parameter information. The product to be tested and the test parameter control are displayed based on a graphical user interface, and the test process information of the product to be tested is generated based on the image information of the product to be tested and the matching information of the test parameter control, as well as the information of the input parameters and output parameters. This simplifies the design process of the test process, optimizes the test algorithm development process, improves the flexibility of responding to changes in product testing requirements, reduces labor costs, and solves the problem of how to improve product testing efficiency.

[0190] like Figure 7 As shown, the embodiment of the present application further discloses a product testing device 700 based on a graphical user interface, which is used to implement any of the product testing methods based on a graphical user interface in the above embodiments. The device includes:

[0191] Display module 701, used to display image information and operation interface of the product to be tested;

[0192] The reading module 702 is used to read the test parameter information obtained from the operation interface; the test parameter information includes input test parameter information and output parameter information;

[0193] A control generating module 703 is configured to generate a test parameter control according to the input test parameter information;

[0194] A matching information determination module 704 is configured to determine matching information between the image information of the product to be tested and the test parameter control;

[0195] The interface information acquisition module 705 is used to obtain the input parameter interface information corresponding to the input test parameter information;

[0196] The test process generating module 706 is configured to generate the test process information of the product to be tested based on the input parameter interface information, the matching information and the output parameter information.

[0197] In a possible implementation, the operation interface includes an input parameter setting interface and an output parameter setting interface, and the reading module 702 is used to:

[0198] Acquiring the input test parameter information input based on the input parameter setting interface;

[0199] Acquiring the input output parameter information based on the output parameter setting interface;

[0200] The input test parameter information and the output parameter information are determined to be the test parameter information.

[0201] In a possible implementation, the input test parameter information includes test instrument information, test signal information, and test delay information, and the control generation module 703 is configured to:

[0202] generating the test parameter control based on the test instrument information, the test signal information and the test delay information;

[0203] The test parameter controls are displayed.

[0204] In a possible implementation, the matching information determination module 704 is configured to:

[0205] Obtaining a move operation on the test parameter control;

[0206] Based on the movement operation, controlling the test parameter control to move to a target matching position of the image information of the product to be tested, and generating a mapping relationship between the test parameter control and the image information of the product to be tested;

[0207] The mapping relationship is determined as the matching information.

[0208] In a possible implementation, the interface information acquisition module 705 is configured to:

[0209] Based on the test instrument information, a preset instrument management interface library is queried to obtain a test instrument interface corresponding to the test instrument information; the preset instrument management interface library is constructed based on the interface information of the preset instrument;

[0210] querying the preset instrument management interface library based on the test signal information to obtain a test signal interface corresponding to the test signal information;

[0211] Querying the preset instrument management interface library based on the test delay information to obtain a test delay interface corresponding to the test delay information;

[0212] The test instrument interface, the test signal interface, and the test delay interface are determined as the input parameter interface information.

[0213] In a possible implementation, the preset instrument includes a plurality of source instruments for product testing, and the apparatus further includes a construction module 707, wherein the construction module 707 is configured to:

[0214] Acquire management information of each source meter, where the management information is used to manage the operation of each source meter, and the management information includes an access interface, a signal interface, and a delay interface corresponding to each source meter;

[0215] The preset instrument management interface library is constructed based on the mapping relationship between each source instrument and the access interface, signal interface and delay interface corresponding to each source instrument.

[0216] In a possible implementation, the test process generation module 706 is configured to:

[0217] Perform fusion processing based on the input parameter interface information, the matching information and the output parameter information to generate initial process information;

[0218] Get custom process information;

[0219] The customized process information and the initial process information are combined to obtain the test process information of the product to be tested.

[0220] In a possible implementation, the apparatus further includes a testing module 708. After generating the test process information of the product to be tested, the testing module 708 is configured to:

[0221] Testing the product to be tested based on the test process information to obtain test feedback information;

[0222] Assigning a value to the output parameter information based on the test feedback information;

[0223] Display the output parameter information after assignment.

[0224] It should be noted that the apparatus provided in the above embodiments, when implementing its functions, is only illustrated by the division of the above functional modules. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the apparatus and method embodiments provided in the above embodiments are based on the same concept. The specific implementation process is detailed in the method embodiment and will not be repeated here.

[0225] An embodiment of the present application provides an electronic device, which includes a processor and a memory, wherein the memory stores at least one instruction or at least one program, and the at least one instruction or the at least one program is loaded and executed by the processor to implement any one of the graphical user interface-based product testing methods provided in the above method embodiments.

[0226] The memory can be used to store software programs and modules. The processor executes various functional applications and data processing by running the software programs and modules stored in the memory. The memory can mainly include a program storage area and a data storage area. The program storage area can store the operating system, application programs required for the functions, etc.; the data storage area can store data created based on the use of the device, etc. In addition, the memory can include high-speed random access memory and non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device. Accordingly, the memory can also include a memory controller to provide the processor with access to the memory.

[0227] An embodiment of the present application also provides a computer-readable storage medium, which can be set in an electronic device to store at least one instruction or at least one program related to implementing a product testing method based on a graphical user interface. The at least one instruction or the at least one program is loaded and executed by the processor to implement any one of the product testing methods based on a graphical user interface provided by the above method embodiments.

[0228] Optionally, in this embodiment, the above-mentioned storage medium may include but is not limited to: a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk, and other media that can store program codes.

[0229] It should be noted that the order of the embodiments of the present application described above is for descriptive purposes only and does not represent the superiority or inferiority of the embodiments. The above description is of specific embodiments of this specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps described in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0230] The various embodiments in this specification are described in a progressive manner. Similar parts between the various embodiments can be referred to in conjunction with each other. Each embodiment focuses on the differences from other embodiments. In particular, the device embodiments are generally similar to the method embodiments, so the description is relatively simple. For relevant parts, refer to the description of the method embodiments.

[0231] Those skilled in the art will understand that all or part of the steps to implement the above embodiments may be accomplished by hardware, or by a program to instruct the relevant hardware, and the program may be stored in a computer-readable storage medium, which may be a read-only memory, a disk, or an optical disk, etc.

[0232] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A product testing method based on a graphical user interface, characterized in that: The method comprises: Display image information and operation interface of the product to be tested; Reading the test parameter information obtained from the operation interface; the test parameter information includes input test parameter information and output parameter information; Generate a test parameter control according to the input test parameter information; Determining matching information between the image information of the product to be tested and the test parameter control; Obtaining input parameter interface information corresponding to the input test parameter information; Based on the input parameter interface information, the matching information and the output parameter information, test process information of the product to be tested is generated.

2. The product testing method based on a graphical user interface according to claim 1, characterized in that: The operation interface includes an input parameter setting interface and an output parameter setting interface. The reading of the test parameter information obtained from the operation interface includes: Acquiring the input test parameter information input based on the input parameter setting interface; Acquiring the input output parameter information based on the output parameter setting interface; The input test parameter information and the output parameter information are determined to be the test parameter information.

3. The product testing method based on a graphical user interface according to claim 1, characterized in that: The input test parameter information includes test instrument information, test signal information and test delay information. Generating a test parameter control according to the input test parameter information includes: generating the test parameter control based on the test instrument information, the test signal information and the test delay information; The test parameter controls are displayed.

4. The product testing method based on a graphical user interface according to claim 1, characterized in that: The determining of the matching information between the image information of the product to be tested and the test parameter control includes: Obtaining a move operation on the test parameter control; Based on the movement operation, controlling the test parameter control to move to a target matching position of the image information of the product to be tested, and generating a mapping relationship between the test parameter control and the image information of the product to be tested; The mapping relationship is determined as the matching information.

5. The product testing method based on a graphical user interface according to claim 3, characterized in that: The obtaining of input parameter interface information corresponding to the input test parameter information includes: Based on the test instrument information, a preset instrument management interface library is queried to obtain a test instrument interface corresponding to the test instrument information; the preset instrument management interface library is constructed based on the interface information of the preset instrument; querying the preset instrument management interface library based on the test signal information to obtain a test signal interface corresponding to the test signal information; Querying the preset instrument management interface library based on the test delay information to obtain a test delay interface corresponding to the test delay information; The test instrument interface, the test signal interface, and the test delay interface are determined as the input parameter interface information.

6. The product testing method based on a graphical user interface according to claim 5, characterized in that: The preset instruments include multiple source instruments for product testing, The method for constructing the preset instrument management interface library includes: Acquire management information of each source meter, where the management information is used to manage the operation of each source meter, and the management information includes an access interface, a signal interface, and a delay interface corresponding to each source meter; The preset instrument management interface library is constructed based on the mapping relationship between each source instrument and the access interface, signal interface and delay interface corresponding to each source instrument.

7. The product testing method based on a graphical user interface according to claim 1, characterized in that: The generating the test process information of the product to be tested based on the input parameter interface information, the matching information and the output parameter information includes: Perform fusion processing based on the input parameter interface information, the matching information and the output parameter information to generate initial process information; Get custom process information; The customized process information and the initial process information are combined to obtain the test process information of the product to be tested.

8. The product testing method based on a graphical user interface according to claim 1, characterized in that: After generating the test process information of the product to be tested, the method further includes: Testing the product to be tested based on the test process information to obtain test feedback information; Assigning a value to the output parameter information based on the test feedback information; Display the output parameter information after assignment.

9. A product testing device based on a graphical user interface, characterized in that: The device comprises: Display module, used to display image information and operation interface of the product to be tested; A reading module, configured to read the test parameter information obtained from the operation interface; the test parameter information includes input test parameter information and output parameter information; A control generation module, configured to generate a test parameter control according to the input test parameter information; a matching information determination module, configured to determine matching information between the image information of the product to be tested and the test parameter control; An interface information acquisition module is used to obtain input parameter interface information corresponding to the input test parameter information; A test process generating module is used to generate test process information of the product to be tested based on the input parameter interface information, the matching information and the output parameter information.

10. An electronic device, characterized in that: It includes a processor and a memory, wherein the memory stores at least one instruction or at least one program, and the at least one instruction or the at least one program is loaded and executed by the processor to implement the product testing method based on a graphical user interface as described in any one of claims 1 to 8.

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