Capacitor aging device and control method thereof
By designing multi-channel capacitor sophisticated circuits and movable power-up mechanisms, automated high-voltage sophisticated testing of capacitor products is solved, and the continuity and efficiency of sophisticated testing of capacitors is ensured, and the accuracy and safety of each capacitor product is reduced, thus reducing equipment maintenance costs.
Patent Information
- Application Number
- CN202510876714.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-27
- Publication Date
- 2025-08-08
AI Technical Summary
In the prior art, the continuousness of experienced testing of capacitor products is not high, the testing efficiency is low, and the traditional methods cannot accurately locate the sophisticated status of each capacitor product, making equipment maintenance troublesome.
Design multi-channel capacitor sophisticated circuits, and introduce movable power-up mechanisms, and control the electrical connection of the capacitor to be tested in each capacitor sophisticated circuit one by one through mechanical opening and closing methods. The charging, voltage holding and discharge test processes are adopted to achieve automatic sequence sophisticated testing.
It improves the continuity and efficiency of experienced capacitor testing, and can accurately monitor the sophisticated status of each capacitor product in real time, save costs and simplify equipment maintenance.
Smart Images
Figure CN120446652A_ABST
Abstract
Description
Technical Field
[0001] The present application belongs to the field of capacitor aging technology, and more specifically, relates to a capacitor aging device and a control method thereof. Background Art
[0002] During the capacitor production process, the capacitor products need to undergo high-voltage aging testing, that is, the products are allowed to operate in an applied high voltage environment for a period of time to stabilize their characteristics.
[0003] In the existing technology, the method of aging capacitor products on the capacitor production line mainly adopts manual operation. The products are manually taken off the line, the wiring and tray placement steps are completed, and then the products are manually placed in the aging equipment for aging testing. As a result, the continuity of the capacitor product aging test is not high and the product aging test efficiency is low.
[0004] Therefore, how to better implement capacitor high-voltage aging testing has become a technical problem that needs to be solved urgently in the industry. Summary of the Invention
[0005] In view of the defects of the existing technology, the purpose of this application is to better realize the high-voltage aging test of capacitors, aiming to solve the problems of low continuity and low efficiency of capacitor product aging test in the existing technology.
[0006] To achieve the above objectives, in a first aspect, the present application provides a capacitor aging device, comprising: Multi-channel capacitor aging circuit, movable power supply mechanism, charging power supply and voltage maintaining power supply; Each capacitor aging circuit includes a charging branch, a voltage-maintaining branch, a discharge branch, and an aging workpiece; the aging workpiece is used to install the capacitor to be tested; In each capacitor aging circuit, the input end of the charging branch is connected to the charging power supply, and the output end and the input end of the discharging branch are connected to one end of the movable power supply mechanism; the output end of the discharging branch is grounded; the input end of the pressure-maintaining branch is connected to the pressure-maintaining power supply, and the output end is connected to one end of the aging workpiece; the other end of the movable power supply mechanism is connected to the other end of the aging workpiece; The movable power supply mechanism is used to control the connection of the capacitors to be tested installed on the aged workpiece in each capacitor aging circuit to their respective charging branches and discharging branches one by one through mechanical opening and closing; The charging branch is used to perform a charging test on the connected capacitor to be tested; The voltage-maintaining branch is used to perform a voltage-maintaining test on the connected capacitor to be tested; The discharge branch is used to perform a discharge test on the connected capacitor to be tested.
[0007] Optionally, the movable power supply mechanism includes a terminal block, a pin conducting structure, a connecting plate, and a two-axis sliding module including a slider structure; the terminal block is arranged below the pin conducting structure; The pin conducting structure is connected to the slider structure of the two-axis sliding module through the connecting plate, and is used to drive the pin conducting structure to move in the horizontal direction or the vertical direction through the movement of the slider structure; A terminal block on one side of the terminal block serves as one end of the movable power-on mechanism, and a terminal block on the other side of the terminal block serves as the other end of the movable power-on mechanism; in each capacitor aging circuit, the output end of the charging branch and the input end of the discharging branch are connected to corresponding terminals on the terminal block on one side, and the other end of the capacitor to be measured is connected to a corresponding terminal on the terminal block on the other side; The pin conduction structure is used to control the connection between any terminal on the terminal row on one side and its corresponding terminal on the terminal row on the other side, so as to control the capacitor to be tested in the capacitor aging circuit connected to any terminal to connect to the corresponding charging branch and discharging branch.
[0008] Optionally, the slider structure includes a first slider structure that can move horizontally and a second slider structure that can move vertically; the second slider structure is fixed to the first slider structure to control the second slider structure to move in the horizontal direction; The second slider structure is connected to the pin conducting structure via the connecting plate, and is configured to drive the pin conducting structure to move in a horizontal direction or a vertical direction through the movement of the second slider structure.
[0009] Optionally, the charging branch includes a first relay and a first switch; One end of the first switch serves as the input end of the charging branch, and one end of the first relay serves as the output end of the charging branch; the other end of the first relay is connected to the other end of the first switch.
[0010] Optionally, the discharge branch includes a second switch and a discharge resistor; One end of the second switch serves as the input end of the discharge branch, and one end of the discharge resistor serves as the output end of the discharge branch; the other end of the second switch is connected to the other end of the discharge resistor.
[0011] Optionally, the pressure maintaining branch includes a second relay; The input end of the second relay serves as the input end of the pressure-maintaining branch, and the output end of the second relay serves as the output end of the pressure-maintaining branch.
[0012] Optionally, the second relay is a solid-state relay.
[0013] In a second aspect, the present application provides a control method for a capacitor aging device as described above, comprising: When the capacitor to be tested is installed in the aging workpiece in each capacitor aging circuit, the movable power supply mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit in the multi-channel capacitor aging circuit is connected to the charging branch and the discharging branch respectively; Controlling the charging branch in the target capacitor aging circuit to be turned on, so as to perform a charging test on the capacitor to be tested in the target capacitor aging circuit for a first preset time period; Disconnecting the charging branch in the target capacitor aging circuit and controlling the voltage holding branch in the target capacitor aging circuit to be turned on, so as to perform a voltage holding test for a second preset time period on the capacitor to be tested in the target capacitor aging circuit; Disconnecting the voltage-maintaining branch in the target capacitor aging circuit and controlling the discharge branch in the target capacitor aging circuit to be turned on, so as to perform a discharge test on the capacitor to be tested in the target capacitor aging circuit; The movable power-on mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit is disconnected from both the charging branch and the discharging branch, so as to perform an aging test on the capacitor to be tested in the next capacitor aging circuit of the target capacitor aging circuit.
[0014] Optionally, the movable power-on mechanism includes a terminal block, a pin-conducting structure, a connecting plate, and a two-axis sliding module including a slider structure; correspondingly, when the aging workpiece in each capacitor aging circuit is installed with a capacitor to be tested, the movable power-on mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit in the multi-channel capacitor aging circuit is connected to the charging branch and the discharging branch respectively, including: When the capacitor to be tested is installed on the aging workpiece in each capacitor aging circuit, the slider structure of the two-axis sliding module is controlled to move horizontally to move the connecting plate and move the pin conductive structure connected to the connecting plate to a target position above the terminal block; The slider structure is controlled to move downward to insert the pins on the pin conduction structure into corresponding terminals on the terminal block below the target position, so that the capacitor to be tested in the target capacitor aging circuit is connected to the charging branch and the discharging branch respectively.
[0015] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the existing technologies: The present application provides a capacitor aging device and a control method thereof. By designing a multi-channel capacitor aging circuit and introducing a movable power-on mechanism, a mechanical opening and closing method is used to control the electrical connection of the capacitor to be tested installed on the aging workpiece in each capacitor aging circuit to its respective charging branch and discharging branch one by one, so that only a single-channel capacitor aging circuit is in a connected state during each test, and the aging test is automatically performed on each capacitor to be tested in sequence. This can greatly improve the continuity of the capacitor product aging test and effectively improve the efficiency of the capacitor aging test. At the same time, it can also accurately monitor the aging status of each capacitor product in real time. Compared with the traditional method of opening and closing a circuit breaker, it can save a lot of costs and is easy to maintain. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 This is one of the structural diagrams of the capacitor aging device provided in the embodiment of the present application; Figure 2 It is a schematic structural diagram of a seasoned workpiece provided in an embodiment of the present application; Figure 3 This is one of the structural diagrams of the movable power-up mechanism provided in the embodiment of the present application; Figure 4 This is the second structural diagram of the movable power-up mechanism provided in the embodiment of the present application; Figure 5 This is the third structural diagram of the movable power-up mechanism provided in the embodiment of the present application; Figure 6 This is the second structural diagram of the capacitor aging device provided in the embodiment of the present application; Figure 7 1 is a flow chart of a capacitor aging device control method provided in an embodiment of the present application. DETAILED DESCRIPTION
[0017] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.
[0018] Throughout the specification and claims of this application, the terms "first" and "second" are used to distinguish between different objects, rather than to describe a specific order of objects. For example, a first slider structure and a second slider structure are used to distinguish between different slider structures, rather than to describe a specific order of slider structures.
[0019] In the embodiments of this application, words such as "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of this application should not be interpreted as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.
[0020] In the description of the embodiments of the present application, unless otherwise specified, "multiple" means two or more, for example, multiple processing units means two or more processing units, etc.; multiple elements means two or more elements, etc.
[0021] In the existing technology, there is also a method of using a segmented oven with segmented voltage to perform capacitor aging, and heating and pressurizing the product in segments for aging testing. However, this method can only measure the aging status of products in batches, and cannot accurately locate each capacitor product. In addition, repair and maintenance are cumbersome. Any equipment inspection and maintenance will affect the production operation of the entire aging test production line.
[0022] To this end, the present application provides a capacitor aging device and a control method thereof to address the above-mentioned defects in the prior art.
[0023] The embodiments of the present application are described below in conjunction with the drawings in the embodiments of the present application.
[0024] Figure 1 This is one of the structural diagrams of the capacitor aging device provided in the embodiment of the present application, such as Figure 1 As shown, the device includes: A multi-channel capacitor aging circuit 1, a movable power supply mechanism 2, a charging power supply 3 and a voltage-maintaining power supply 4; Each capacitor aging circuit 1 includes a charging branch 11, a voltage maintaining branch 12, a discharge branch 13 and an aging workpiece 14; the aging workpiece 14 is used to install the capacitor to be tested; In each capacitor aging circuit 1, the input end of the charging branch 11 is connected to the charging power supply, and the output end and the input end of the discharge branch 13 are connected to one end of the movable power supply mechanism 2; the output end of the discharge branch 13 is grounded; the input end of the pressure-maintaining branch 12 is connected to the pressure-maintaining power supply 4, and the output end is connected to one end of the aging workpiece 14; the other end of the movable power supply mechanism 2 is connected to the other end of the aging workpiece 14; The movable power supply mechanism 2 is used to control the connection of the capacitors to be tested installed on the aged workpiece 14 in each capacitor aged circuit 1 to their respective charging branches 11 and discharging branches 13 one by one through mechanical opening and closing; The charging branch 11 is used to perform charging test on the connected capacitor to be tested; The pressure-maintaining branch 12 is used to perform a pressure-maintaining test on the connected capacitor to be tested; The discharge branch 13 is used to perform a discharge test on the connected capacitor to be tested.
[0025] Specifically, in the embodiment of the present application, the capacitor aging device is mainly composed of a multi-channel capacitor aging circuit, a movable power supply mechanism, a charging power supply and a voltage maintaining power supply.
[0026] In an embodiment of the present application, in each capacitor burn-in circuit, the input of the charging branch is connected to a charging power supply, the output of the charging branch and the input of the discharging branch are connected to one end of a movable charging mechanism, and the output of the discharging branch is grounded. In this way, the charging power supply can provide a charging test for multiple capacitor burn-in circuits. Simultaneously, in each capacitor burn-in circuit, the input of the pressure-maintaining branch is connected to a pressure-maintaining power supply, and the output is connected to one end of the burn-in workpiece. In this way, the pressure-maintaining power supply can provide a pressure-maintaining test for multiple capacitor burn-in circuits, improving power supply utilization and saving costs.
[0027] In an embodiment of the present application, a seasoned workpiece is used to mount the capacitor to be tested. Figure 2 As shown, the aged workpiece 14 includes an aged tray 15, a workpiece support plate 16, an insulating plate 17 and a workpiece connection post 18. Among them, the workpiece support plate 16 is located below the aged tray 15, and the aged tray 15 is supported and placed by the workpiece support plate 16; an insulating plate 17 is placed between the workpiece support plate 16 and the aged tray 15, and the workpiece connection post 18 below the aged tray 15 is installed in conjunction with the connection post on the aged tray 15. The aged tray 15 includes a capacitor positioning plate 151, an aged tray insulating plate 152 and a product connection port 153. During operation, the capacitor to be tested is installed on the aged tray 15, and the capacitor product to be tested is positioned by the capacitor positioning plate 151; a cable with a banana head is used to connect the electrodes of the capacitor to be tested to the corresponding product connection port 153. The product connection port 153 is also used for connecting the output end of the voltage-maintaining branch and the terminal on the mobile power-on mechanism to access the test power supply.
[0028] In an embodiment of the present application, in each capacitor aging circuit, the output end of the charging branch and the input end of the discharging branch are connected to one end of the movable power-on mechanism, and the other end of the movable power-on mechanism is connected to the other end of the aging workpiece. In this way, the movable power-on mechanism can be electrically controlled to move one by one, and a mechanical opening and closing method can be performed to control the connection of the capacitors to be tested installed on the aging workpiece in each capacitor aging circuit to their respective charging branches and discharging branches one by one, ensuring that only a single capacitor aging circuit is in a connected state during each test, and only high-voltage aging testing is performed on the capacitors to be tested on one path. In this way, compared with the traditional manual operation method, the efficiency of the capacitor aging test can be greatly improved. At the same time, compared with the traditional batch measurement method, the aging parameters of each capacitor product, including leakage current, can be accurately monitored in real time to ensure the effective aging of each capacitor product. At the same time, only the problematic capacitor aging circuit needs to be maintained, which will not affect the production operation of the entire aging test production line. It can solve the defects of the traditional batch measurement method that cannot accurately locate each capacitor product and the equipment maintenance is troublesome. In addition, independent testing of single-channel burn-in circuits can better ensure safety in high-voltage burn-in environments.
[0029] In the embodiment of the present application, the main process flow for aging a capacitor product is to place the aging workpiece in a high temperature environment, and then power on the product and apply high voltage for aging. During operation, after the capacitor to be tested is installed at the designated position on the aging workpiece, the movable power-on mechanism moves to the corresponding position and contacts downward to close, so that the single-channel capacitor aging circuit that currently needs to be tested is in a connected state, that is, the charging branch, the pressure-maintaining branch, and the discharge branch can all be connected to the aging workpiece. Then, the charging power supply is controlled to start working, the charging branch is turned on, and the charging power supply only charges the capacitor to be tested on a single aging workpiece through the charging branch.
[0030] After the workpiece is fully charged, the charging branch is disconnected, the pressure-maintaining branch is connected, and the pressure-maintaining power supply is connected to the workpiece to begin maintaining pressure. The pressure-maintaining power supply maintains the pressure of the capacitor under test on the individual workpiece. After a specific time has passed, the pressure-maintaining process is complete, the pressure-maintaining branch is disconnected, and the discharge branch is connected, starting the discharge of the capacitor under test. When the discharge is complete, the discharge process of the capacitor under test is complete, and the entire high-voltage burn-in test process is concluded.
[0031] In another embodiment of the present application, multiple charging and voltage-maintaining power supplies can be incorporated into the device circuitry based on the voltage level of the capacitor being tested. For example, if two capacitors have different voltages, two charging and voltage-maintaining power supplies can be selected, each wired independently and without interfering with the other. In this manner, the movable power-up mechanism can be used to sequentially perform burn-in tests on capacitors of different voltage levels.
[0032] The capacitor aging device of the embodiment of the present application designs a multi-channel capacitor aging circuit and introduces a movable power-on mechanism. It uses a mechanical opening and closing method to control the electrical connection of the capacitor to be tested installed on the aging workpiece in each capacitor aging circuit to its respective charging branch and discharging branch one by one, so that only a single-channel capacitor aging circuit is in a connected state during each test, and the aging test is automatically performed on each capacitor to be tested in sequence. This can greatly improve the continuity of the capacitor product aging test and effectively improve the efficiency of the capacitor aging test. At the same time, it can also accurately monitor the aging status of each capacitor product in real time. Compared with the traditional method of opening and closing a circuit breaker, it can save a lot of costs and is easy to maintain.
[0033] like Figure 3 、 Figure 4 and Figure 5 , which are schematic diagrams of the structure of the movable power supply mechanism provided by the present application at three different viewing angles. As an optional embodiment, the movable power supply mechanism 2 includes a terminal block 21, a pin conductive structure 22, a connecting plate 23, and a two-axis sliding module 24 including a slider structure 241; the terminal block 21 is arranged below the pin conductive structure 22; The pin conducting structure 22 is connected to the slider structure 241 of the two-axis sliding module 24 through the connecting plate 23, and is used to drive the pin conducting structure 22 to move in the horizontal direction or the vertical direction through the movement of the slider structure 241; The terminal block on one side of the terminal block 21 serves as one end of the movable power supply mechanism 2, and the terminal block on the other side of the terminal block 21 serves as the other end of the movable power supply mechanism 2. In each capacitor aging circuit 1, the output end of the charging branch 11 and the input end of the discharging branch 13 are connected to corresponding terminals on one side of the terminal block 21, and the other end of the capacitor to be measured is connected to a corresponding terminal on the other side of the terminal block 21. The pin conduction structure 22 is used to control the connection between any terminal on one side of the terminal block 21 and its corresponding terminal on the other side of the terminal block 21, so as to control the capacitor to be tested in the capacitor aging circuit 1 connected to the any terminal to be connected to the corresponding charging branch 11 and discharging branch 13.
[0034] Specifically, in an embodiment of the present application, a movable power supply mechanism can be arranged on a substrate to control the charging and discharging of a capacitor product. The mechanism can be composed of a terminal block, a pin-conducting structure, a connecting plate, and a two-axis sliding module including a slider structure. The terminal block can be provided with n terminals based on the number n of workpieces being processed.
[0035] Among them, the pin conduction structure includes multiple spring-type pins and a fixing plate for fixing the pins. Each spring-type pin can be installed through the fixing plate, and the upper parts of each spring-type pin are connected to each other through cables to form a passage.
[0036] Here, it should be noted that the size of the spring-type pin can be adapted according to the actual high voltage level, and this application does not make any specific restrictions on this.
[0037] In an embodiment of the present application, in each capacitor aging circuit, the output end of the charging branch and the input end of the discharging branch are connected to corresponding terminals on a terminal block on one side of the terminal block, and the other end of the capacitor to be measured is connected to a corresponding terminal on a terminal block on the other side of the terminal block. A pin-conducting structure can be used to control the connection between any terminal on one side of the terminal block and its corresponding terminal on the other side of the terminal block. In other words, the pins on the pin-conducting structure can connect a group of terminals on the terminal block, one end of which can be connected to the corresponding capacitor to be measured, and the other end can be connected to the charging branch and the discharging branch, thereby correspondingly connecting to a capacitor aging circuit, so that the capacitor to be measured in the capacitor aging circuit is connected to the corresponding charging branch and the discharging branch.
[0038] Therefore, during the burn-in test, by controlling the operation of the motor of the two-axis sliding module on the movable power-on mechanism, the slider structure is moved in the horizontal or vertical direction, thereby driving the pin conduction structure connected to the slider structure to move, and each group of terminals on the terminal block is turned on in turn, thereby connecting each capacitor burn-in circuit connected to each group of terminals one by one, so that the capacitor to be tested in each capacitor burn-in circuit is connected to the corresponding charging branch and discharging branch for burn-in test.
[0039] The device of the embodiment of the present application constructs a movable power-on mechanism by introducing two terminal blocks, a pin conduction structure, a connecting plate, and a two-axis sliding module including a slider structure. The sliding structure on the two-axis sliding module drives the pin conduction structure to mechanically move and contact the terminal block to complete conduction. Since the charging time of the aging process is very short, this structure can functionally meet the aging charge and discharge switching control. The structure is simple and effective, and can save a lot of cost compared to the traditional circuit breaker switching control method.
[0040] Continue to refer to Figure 3 、 Figure 4 and Figure 5 In the embodiment of the present application, the slider structure 241 includes a first slider structure 2411 that can move horizontally and a second slider structure 2412 that can move vertically; the second slider structure 2412 is fixed to the first slider structure 2411 to control the movement of the second slider structure 2412 in the horizontal direction; The second slider structure 2412 is connected to the pin conducting structure 22 via the connecting plate 23 , and is configured to drive the pin conducting structure 22 to move in a horizontal direction or a vertical direction through the movement of the second slider structure 2412 .
[0041] Specifically, in an embodiment of the present application, the slider structure on the two-axis sliding module in the movable power supply mechanism may include a first slider structure that can be moved horizontally and a second slider structure that can be moved vertically, thereby completing the two-axis sliding of the slider structure in space.
[0042] The second slider structure is fixed to the first slider structure, thus controlling the movement of the first slider structure to enable the second slider structure to move horizontally. Thus, the second slider structure can move horizontally or vertically. By connecting the second slider structure to the pin conductive structure via a connecting plate, the movement of the second slider structure can drive the pin conductive structure to move horizontally or vertically.
[0043] The device of the embodiment of the present application combines a slider structure and a pin conduction structure to enable the pin conduction structure to be flexibly moved in the horizontal or vertical direction, thereby effectively realizing the switching function of the movable power-on mechanism and efficiently performing the on-off control of the aged charging and discharging of the capacitor product.
[0044] Figure 6 This is the second structural diagram of the capacitor aging device provided in the embodiment of the present application, such as Figure 6 As shown, in the embodiment of the present application, the charging branch 11 includes a first relay KA and a first switch KM1; One end of the first switch KM1 serves as an input end of the charging branch 11 , and one end of the first relay KA serves as an output end of the charging branch 11 ; the other end of the first relay KA is connected to the other end of the first switch KM1 .
[0045] Specifically, in an embodiment of the present application, the charging branch can be composed of a first relay KA and a first switch KM1, wherein the first switch KM1 can specifically be a contactor. One end of the first switch KM1 serves as the input end of the charging branch and is connected to the charging power supply; one end of the first relay KA serves as the output end of the charging branch and is connected to one end of the movable power-on mechanism; the other end of the first relay KA is connected to the other end of the first switch KM1. In this way, when the movable power-on mechanism controls the connection of a capacitor aging circuit, by controlling the first relay KA and the first switch KM1 in the capacitor aging circuit to be closed, the high voltage output by the charging power supply can be applied to the capacitor to be tested installed on the aging workpiece in the capacitor aging circuit for charging testing, thereby realizing effective control of the on-off of the charging test of the capacitor product, with a simple and efficient structure.
[0046] Continue to refer to Figure 6 Based on the above embodiment, as an optional embodiment, the pressure maintaining branch 12 includes a second relay 121; The input end of the second relay 121 serves as the input end of the pressure-maintaining branch 12 , and the output end of the second relay 121 serves as the output end of the pressure-maintaining branch 12 .
[0047] Specifically, in an embodiment of the present application, the voltage-maintaining branch includes a second relay, the input end of the second relay serving as the input end of the voltage-maintaining branch, connected to the voltage-maintaining power supply; the output end of the second relay serving as the output end of the voltage-maintaining branch, connected to one end of the aging workpiece. Thus, after the movable power supply mechanism controls the connection of a capacitor aging circuit, and the capacitor aging circuit completes the charging test, by controlling the closing of the second relay in the capacitor aging circuit, the high voltage output by the voltage-maintaining power supply can be applied to the capacitor to be tested, which is mounted on the aging workpiece in the capacitor aging circuit, for voltage-maintaining testing. This effectively controls the on-off state of the voltage-maintaining test of the capacitor product and ensures test safety.
[0048] Based on the content of the above embodiment, as an optional embodiment, the second relay 121 is a solid state relay (SSR).
[0049] Specifically, in the embodiments of this application, the voltage-maintaining power supply maintains a stable output voltage through feedback control. The contactless switching of the SSR can avoid voltage fluctuations and stabilize the output. Furthermore, the voltage-maintaining power supply can be used to quickly adjust the load current and achieve precise voltage control. The SSR is arc-free, which reduces interference with the voltage-maintaining power supply control circuit and improves the system's noise immunity.
[0050] Continue to refer to Figure 6 Based on the above embodiment, as an optional embodiment, the discharge branch 13 includes a second switch KM2 and a discharge resistor R; One end of the second switch KM2 serves as an input end of the discharge branch 13 , and one end of the discharge resistor R serves as an output end of the discharge branch 13 ; the other end of the second switch KM2 is connected to the other end of the discharge resistor R.
[0051] Specifically, in an embodiment of the present application, the discharge branch can be composed of a second switch KM2 and a discharge resistor R, wherein the second switch KM2 can also be specifically a contactor. One end of the second switch KM2 serves as the input end of the discharge branch and is connected to one end of the movable power-on mechanism; one end of the discharge resistor R serves as the output end of the discharge branch and is connected to the ground; the other end of the second switch KM2 is connected to the other end of the discharge resistor R. In this way, after the movable power-on mechanism controls the connection of a capacitor aging circuit, and the capacitor aging circuit completes the charging test and the voltage holding test, by controlling the second switch KM1 in the capacitor aging circuit to be closed, the capacitor to be tested installed on the aging workpiece in the capacitor aging circuit can be discharged, thereby achieving effective control of the on-off discharge test of the capacitor product and test safety.
[0052] The control method of the capacitor aging device provided in the present application is described below. The control method of the capacitor aging device described below and the capacitor aging device described above can be referenced to each other.
[0053] Figure 7 This is a flow chart of a method for controlling a capacitor aging device according to an embodiment of the present application. It is understood that it can be applied to any of the aforementioned capacitor aging devices, such as Figure 7 As shown, the method includes: Step S1, when the capacitor to be tested is installed on the aging workpiece in each capacitor aging circuit, the movable power supply mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit in the multi-channel capacitor aging circuit is connected to the charging branch and the discharging branch respectively; Step S2, controlling the charging branch in the target capacitor aging circuit to be turned on, so as to perform a charging test for a first preset time period on the capacitor to be tested in the target capacitor aging circuit; Step S3, disconnecting the charging branch in the target capacitor aging circuit and controlling the voltage holding branch in the target capacitor aging circuit to be turned on, so as to perform a voltage holding test on the capacitor to be tested in the target capacitor aging circuit for a second preset time period; Step S4, disconnecting the voltage-maintaining branch in the target capacitor aging circuit and controlling the discharge branch in the target capacitor aging circuit to be turned on, so as to perform a discharge test on the capacitor to be tested in the target capacitor aging circuit; Step S5 , controlling the movable power-on mechanism to operate, disconnecting the capacitor to be tested in the target capacitor aging circuit from both the charging branch and the discharging branch, so as to perform an aging test on the capacitor to be tested in the next capacitor aging circuit of the target capacitor aging circuit.
[0054] It is understandable that the specific implementation of each of the above method steps can refer to the introduction of the detailed functional implementation of each unit / module in the aforementioned capacitor aging device.
[0055] Specifically, in the embodiment of the present application, the target capacitor aging circuit can be any circuit in a multi-channel capacitor aging circuit. The main process flow for aging a capacitor product is as follows: when the aging workpiece in each capacitor aging circuit is installed with the capacitor to be tested, the aging workpiece is placed in a high-temperature environment, and then step S1 is executed to control the movement of the movable power-on mechanism, and the movable power-on mechanism moves to the corresponding position and contacts downward to close, so that the single-channel target capacitor aging circuit currently to be tested is in a connected state, that is, the charging branch, the voltage-maintaining branch, and the discharge branch in the target capacitor aging circuit can all be connected to the corresponding aging workpiece, so that the capacitor to be tested in the target capacitor aging circuit is connected to the charging branch and the discharge branch respectively.
[0056] Based on the contents of the above embodiment, as an optional embodiment, the movable power supply mechanism includes a terminal block, a pin conduction structure, a connecting plate, and a two-axis sliding module including a slider structure; correspondingly, when the aging workpiece in each capacitor aging circuit is installed with a capacitor to be tested, the movable power supply mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit in the multi-channel capacitor aging circuit is connected to the charging branch and the discharging branch respectively, including: When the capacitor to be tested is installed on the aging workpiece in each capacitor aging circuit, the slider structure of the two-axis sliding module is controlled to move horizontally to move the connecting plate and move the pin conductive structure connected to the connecting plate to the target position above the terminal block; The control slider structure moves downward to insert the pins on the pin conduction structure into the corresponding terminals on the terminal block below the target position, so that the capacitor to be tested in the target capacitor aging circuit is connected to the charging branch and the discharging branch respectively.
[0057] The method of the embodiment of the present application constructs a movable power-on mechanism by introducing two terminal blocks, a pin conduction structure, a connecting plate, and a two-axis sliding module including a slider structure. The sliding structure on the two-axis sliding module drives the pin conduction structure to mechanically move and contact the terminal block to complete conduction. Since the charging time of the aging process is very short, this structure can functionally meet the aging charge and discharge switching control. The structure is simple and effective, and can save a lot of cost compared to the traditional circuit breaker switching control method.
[0058] Then, step S2 is executed to control the charging branch in the target capacitor aging circuit to conduct, and perform a charging test on the capacitor under test in the target capacitor aging circuit for a first preset duration, thereby energizing and applying a high voltage to the capacitor under test product on the single aging workpiece for aging. Here, the first preset duration can be specifically set according to actual aging test requirements.
[0059] Next, step S3 is executed to disconnect the charging branch in the target capacitor burn-in circuit and connect the voltage-maintaining branch in the target capacitor burn-in circuit, connecting the voltage-maintaining power supply to the target capacitor burn-in circuit and performing a voltage-maintaining test on the capacitor under test in the circuit for a second preset duration. The second preset duration can also be set based on actual burn-in test requirements.
[0060] Further, step S4 is executed to disconnect the voltage-maintaining branch in the target capacitor aging circuit, that is, disconnect the access to the voltage-maintaining power supply. At this time, the discharge branch in the target capacitor aging circuit is controlled to be turned on, and the capacitor to be tested in the target capacitor aging circuit is subjected to the final discharge test. When the discharge is completed, the high-voltage aging test process of the capacitor to be tested is completed.
[0061] Finally, step S5 is executed to control the movable power mechanism. The sliding structure on the two-axis sliding module drives the pin contact structure to mechanically move, breaking contact with the terminal block and disconnecting the capacitor under test in the target capacitor burn-in circuit from both the charging branch and the discharging branch. Furthermore, the movable power mechanism is controlled to move to the next capacitor burn-in circuit after the target capacitor burn-in circuit, allowing the burn-in test to be performed on the capacitor under test in the next capacitor burn-in circuit. In this way, burn-in tests are completed sequentially and continuously for each capacitor under test.
[0062] The capacitor aging device control method of the embodiment of the present application designs a multi-channel capacitor aging circuit and introduces a movable power-on mechanism. It uses a mechanical opening and closing method to control the electrical connection of the capacitor to be tested installed on the aging workpiece in each capacitor aging circuit to its respective charging branch and discharging branch one by one, so that only a single-channel capacitor aging circuit is in a connected state during each test, and the aging test is automatically performed on each capacitor to be tested in sequence. This can greatly improve the continuity of the capacitor product aging test and effectively improve the efficiency of the capacitor aging test. At the same time, it can also accurately monitor the aging status of each capacitor product in real time. Compared with the traditional method of opening and closing a circuit breaker, it can save a lot of costs and is easy to maintain.
[0063] The method steps in the embodiments of the present application can be implemented by hardware or by a processor executing software instructions. The software instructions can be composed of corresponding software modules, which can be stored in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disks, mobile hard disks, CD-ROMs, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be an integral part of the processor. The processor and storage medium can be located in an ASIC.
[0064] The above embodiments can be implemented in whole or in part using software, hardware, firmware, or any combination thereof. When implemented using software, they can be implemented in whole or in part in the form of a computer program product. The computer program product comprises one or more computer instructions. When loaded and executed on a computer, the computer program instructions fully or partially produce the processes or functions described in the embodiments of this application. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted via the computer-readable storage medium. The computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium accessible by a computer or a data storage device such as a server or data center that integrates one or more available media. The available medium can be magnetic media (e.g., floppy disk, hard disk, tape), optical media (e.g., DVD), or semiconductor media (e.g., solid-state drive (SSD)).
[0065] It will be understood that the various numerical numbers involved in the embodiments of the present application are merely distinctions for the convenience of description and are not intended to limit the scope of the embodiments of the present application.
[0066] It should be understood that expressions such as "include" and "may include" used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as "include" and / or "have" may be interpreted as indicating specific characteristics, numbers, operations, constituent elements, components, or combinations thereof, but may not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.
[0067] In the description of the embodiments of the present application, it should be noted that, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, "connection" can be a detachable connection or a non-detachable connection; it can be a direct connection or an indirect connection through an intermediate medium. Among them, "fixed connection" means that the two are connected to each other and the relative position relationship after the connection remains unchanged. "Rotational connection" means that the two are connected to each other and can rotate relative to each other after the connection. "Sliding connection" means that the two are connected to each other and can slide relative to each other after the connection. The directional terms mentioned in the embodiments of the present application, such as "top", "bottom", "inside", "outside", "left", "right", etc., are only reference to the directions of the accompanying drawings. Therefore, the directional terms used are for better and clearer explanation and understanding of the embodiments of the present application, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the embodiments of the present application.
[0068] In addition, in the embodiments of the present application, the mathematical concepts mentioned include symmetry, equality, parallelism, and perpendicularity. These limitations are all for the current state of the art, rather than being absolutely strict definitions in a mathematical sense. A small amount of deviation is allowed, and it is possible to be approximately symmetric, approximately equal, approximately parallel, or approximately perpendicular. For example, A and B are parallel, which means that A and B are parallel or approximately parallel, and the angle between A and B can be between 0 and 10 degrees. A and B are perpendicular, which means that A and B are perpendicular or approximately perpendicular, and the angle between A and B can be between 80 and 100 degrees.
[0069] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.
Claims
1. A capacitor aging device, characterized in that: include: Multi-channel capacitor aging circuit, movable power supply mechanism, charging power supply and voltage maintaining power supply; Each capacitor aging circuit includes a charging branch, a voltage-maintaining branch, a discharge branch, and an aging workpiece; the aging workpiece is used to install the capacitor to be tested; In each capacitor aging circuit, the input end of the charging branch is connected to the charging power supply, and the output end and the input end of the discharging branch are connected to one end of the movable power supply mechanism; the output end of the discharging branch is grounded; the input end of the pressure-maintaining branch is connected to the pressure-maintaining power supply, and the output end is connected to one end of the aging workpiece; the other end of the movable power supply mechanism is connected to the other end of the aging workpiece; The movable power supply mechanism is used to control the connection of the capacitors to be tested installed on the aged workpiece in each capacitor aging circuit to their respective charging branches and discharging branches one by one through mechanical opening and closing; The charging branch is used to perform a charging test on the connected capacitor to be tested; The voltage-maintaining branch is used to perform a voltage-maintaining test on the connected capacitor to be tested; The discharge branch is used to perform a discharge test on the connected capacitor to be tested.
2. The capacitor aging device according to claim 1, characterized in that: The movable power supply mechanism includes a terminal block, a pin conducting structure, a connecting plate and a two-axis sliding module including a slider structure; the terminal block is arranged below the pin conducting structure; The pin conducting structure is connected to the slider structure of the two-axis sliding module through the connecting plate, and is used to drive the pin conducting structure to move in the horizontal direction or the vertical direction through the movement of the slider structure; A terminal block on one side of the terminal block serves as one end of the movable power-on mechanism, and a terminal block on the other side of the terminal block serves as the other end of the movable power-on mechanism; in each capacitor aging circuit, the output end of the charging branch and the input end of the discharging branch are connected to corresponding terminals on the terminal block on one side, and the other end of the capacitor to be measured is connected to a corresponding terminal on the terminal block on the other side; The pin conduction structure is used to control the connection between any terminal on the terminal row on one side and its corresponding terminal on the terminal row on the other side, so as to control the capacitor to be tested in the capacitor aging circuit connected to any terminal to connect to the corresponding charging branch and discharging branch.
3. The capacitor aging device according to claim 2, characterized in that: The slider structure includes a first slider structure that can move horizontally and a second slider structure that can move vertically; the second slider structure is fixed to the first slider structure to control the second slider structure to move in the horizontal direction; The second slider structure is connected to the pin conducting structure via the connecting plate, and is configured to drive the pin conducting structure to move in a horizontal direction or a vertical direction through the movement of the second slider structure.
4. The capacitor aging device according to claim 1, characterized in that: The charging branch includes a first relay and a first switch; One end of the first switch serves as the input end of the charging branch, and one end of the first relay serves as the output end of the charging branch; the other end of the first relay is connected to the other end of the first switch.
5. The capacitor aging device according to claim 1, characterized in that: The discharge branch includes a second switch and a discharge resistor; One end of the second switch serves as the input end of the discharge branch, and one end of the discharge resistor serves as the output end of the discharge branch; the other end of the second switch is connected to the other end of the discharge resistor.
6. The capacitor aging device according to claim 1, characterized in that: The pressure maintaining branch includes a second relay; The input end of the second relay serves as the input end of the pressure-maintaining branch, and the output end of the second relay serves as the output end of the pressure-maintaining branch.
7. The capacitor aging device according to claim 6, characterized in that: The second relay is a solid-state relay.
8. A control method for the capacitor aging device according to any one of claims 1 to 7, characterized in that: include: When the capacitor to be tested is installed in the aging workpiece in each capacitor aging circuit, the movable power supply mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit in the multi-channel capacitor aging circuit is connected to the charging branch and the discharging branch respectively; Controlling the charging branch in the target capacitor aging circuit to be turned on, so as to perform a charging test on the capacitor to be tested in the target capacitor aging circuit for a first preset time period; Disconnecting the charging branch in the target capacitor aging circuit and controlling the voltage holding branch in the target capacitor aging circuit to be turned on, so as to perform a voltage holding test for a second preset time period on the capacitor to be tested in the target capacitor aging circuit; Disconnecting the voltage-maintaining branch in the target capacitor aging circuit and controlling the discharge branch in the target capacitor aging circuit to be turned on, so as to perform a discharge test on the capacitor to be tested in the target capacitor aging circuit; The movable power-on mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit is disconnected from both the charging branch and the discharging branch, so as to perform an aging test on the capacitor to be tested in the next capacitor aging circuit of the target capacitor aging circuit.
9. The control method according to claim 8, characterized in that: The movable power supply mechanism includes a terminal block, a pin conduction structure, a connecting plate, and a two-axis sliding module including a slider structure; correspondingly, when the aging workpiece in each capacitor aging circuit is installed with a capacitor to be tested, the movable power supply mechanism is controlled to operate so that the capacitor to be tested in the target capacitor aging circuit in the multi-channel capacitor aging circuit is connected to the charging branch and the discharging branch respectively, including: When the capacitor to be tested is installed on the aging workpiece in each capacitor aging circuit, the slider structure of the two-axis sliding module is controlled to move horizontally to move the connecting plate and move the pin conductive structure connected to the connecting plate to a target position above the terminal block; The slider structure is controlled to move downward to insert the pins on the pin conduction structure into corresponding terminals on the terminal block below the target position, so that the capacitor to be tested in the target capacitor aging circuit is connected to the charging branch and the discharging branch respectively.