A nanocrystalline strip high-frequency magnetic property testing device and testing method
By introducing a multi-angle bending and cyclic cooling system into the nanocrystalline ribbon testing device, the problems of insufficient single bending detection and temperature monitoring in the existing technology are solved, realizing high-frequency magnetic performance testing of nanocrystalline ribbons under complex working conditions and improving the accuracy and reliability of test data.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- LONGFENG NEW MATERIALS (HEZE) CO LTD
- Filing Date
- 2025-07-02
- Publication Date
- 2026-05-22
Smart Images
Figure CN120446833B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the technical field of magnetic detection, and in particular to a high-frequency magnetic property testing device and method for nanocrystalline ribbons. Background Technology
[0002] Nanocrystalline ribbons, typically referring to iron-based nanocrystalline alloy ribbons, are soft magnetic materials with excellent properties. Due to their superior soft magnetic properties, nanocrystalline ribbons occupy an important position in high-frequency applications such as power electronics and new energy. Their high-frequency magnetic properties directly determine the performance and efficiency of related equipment; therefore, accurate testing of the high-frequency magnetic properties of nanocrystalline ribbons is crucial. However, current high-frequency magnetic property testing technology for nanocrystalline ribbons still faces many unresolved issues.
[0003] On the one hand, existing testing equipment often only performs bending tests on one location of the nanocrystalline ribbon sample, ignoring the multi-dimensional and complex stress environment that the ribbon may face during actual applications. This limitation leads to a significant discrepancy between laboratory data and actual service performance. On the other hand, when conducting repeated bending tests on nanocrystalline ribbons, existing testing equipment generally lacks an efficient temperature monitoring and control system. It cannot measure the ribbon temperature accurately and in a timely manner, and it is even more difficult to stabilize the temperature within a reasonable range through effective heat dissipation or temperature control methods. Ultimately, errors introduced by temperature changes interfere with the accuracy of the test data.
[0004] For example, Chinese patent CN118859054B discloses a magnetic testing device for nanocrystalline ribbons. Through the cooperation of friction wheels, friction plates and clamping rollers, the clamping rollers are made to actively rotate and feed the nanocrystalline ribbons towards the center, so as to minimize the pulling force on the nanocrystalline ribbons and thus reduce the influence of the pulling force on the magnetic properties, making the final test results more accurate.
[0005] However, the above-mentioned magnetic testing device for nanocrystalline ribbons has some shortcomings in practical use:
[0006] 1. The above-mentioned device uses the cooperation of friction wheel, friction plate and clamping roller to drive the nanocrystalline ribbon to bend, and detects the magnetic properties of the nanocrystalline ribbon at different bending angles. However, it can only detect the magnetic properties when there is only one bend, and it is difficult to capture the stress superposition effect that will occur at different bending points.
[0007] 2. The aforementioned device can detect the magnetic properties of nanocrystalline ribbons under bending conditions and can dynamically repeat bending. However, during repeated bending, heat is generated due to internal friction and stress concentration, causing the ribbon temperature to rise. Temperature changes significantly affect the magnetic properties of the nanocrystalline ribbon; excessively high temperatures may alter performance parameters such as permeability and loss, leading to errors introduced by temperature variations that interfere with the accuracy of the test data.
[0008] Therefore, based on the above-stated viewpoints, it is of great significance to improve and perfect the existing magnetic testing device for nanocrystalline ribbons. This device should not only be able to detect the magnetic properties of nanocrystalline ribbons when they are bent in multiple places, but also have an efficient temperature monitoring and control system. By using temperature control methods, the temperature can be stabilized within a reasonable range, reducing the error caused by temperature changes that could interfere with the accuracy of the test data. Summary of the Invention
[0009] To address the aforementioned problems, this invention provides a device and method for testing the high-frequency magnetic properties of nanocrystalline ribbons.
[0010] On the one hand, a high-frequency magnetic property testing device for nanocrystalline ribbon includes a shielded box, the inside of which is divided into a testing chamber and a working chamber by a partition.
[0011] The testing chamber is equipped with a fixture along its length. The fixture includes a roller assembly one and a roller assembly two. Roller assembly one is located on one side of the testing chamber along its length, and roller assembly two is slidably located on the other side of the testing chamber along its length.
[0012] Pushing components are provided on both sides of the testing chamber in the width direction. The pushing components include moving blocks. Slide grooves are opened on both sides of the testing chamber. Multiple moving blocks are slidably set in the slide grooves. An electric push rod is installed on the side of the moving block near the clamp. A pushing roller is installed on the telescopic end of the electric push rod.
[0013] Preferably, the working chamber is provided with a driving component that slides in the slide groove with a moving block. The driving component includes a driving screw symmetrically arranged inside the working chamber along the width direction of the detection chamber, and a connecting block is threaded on the driving screw.
[0014] Electromagnets are installed on the corresponding sides of the connecting block and the moving block, and the electromagnets on the connecting block and the moving block have opposite magnetic properties.
[0015] Preferably, roller assembly one includes a fixed block, and roller assembly two includes a sliding block. Both the fixed block and the sliding block are provided with control grooves. A bidirectional screw is installed in the control groove, and clamping rollers are symmetrically threaded on the bidirectional screw.
[0016] Preferably, the detection chamber is equipped with a linkage component that drives the second roller group to slide close to the first roller group.
[0017] The linkage includes a connecting rope, which is positioned between the fixed block and the sliding block. The telescopic end of the electric push rod is equipped with a special-shaped rod, and the end of the special-shaped rod away from the electric push rod has a snap-fit groove, which is in movable engagement with the connecting rope.
[0018] Preferably, the detection chamber is also equipped with a tensioning element that drives the roller assembly two back to its initial position.
[0019] The tensioning component includes a rotating shaft located at the bottom of the testing chamber via a torsion spring, with a tension rope wound around the shaft.
[0020] Preferably, friction discs are snapped onto both the upper and lower ends of the rotating shaft, and friction plates corresponding to the friction discs are inserted into the side wall of the shielding box.
[0021] Preferably, the push roller is equipped with a circulation system for cooling the bends of the nanocrystalline ribbon. The circulation system includes a cooling pipe. A working chamber is opened inside the push roller. The cooling pipe is spirally installed on the side wall of the working chamber. The cooling pipes on adjacent push rollers pass through the push rollers and are connected by spring tubes.
[0022] Preferably, a circulating water chamber is provided on the side of the working chamber away from the roller assembly through a partition. A water pump is installed in the shielded box. The inlet ends of the two spring tubes are connected to the bottom of the circulating water chamber, the outlet ends of the spring tubes are connected to the inlet ends of the water pump, and the outlet ends of the water pump are connected to the circulating water chamber.
[0023] Preferably, an electric telescopic rod is installed above the circulating water chamber, with the telescopic end of the electric telescopic rod extending into the circulating water chamber. A connecting plate is installed at one end of the two spring tubes located inside the circulating water chamber, and the telescopic end of the electric telescopic rod is connected to the connecting plate.
[0024] On the other hand, a method for testing the high-frequency magnetic properties of nanocrystalline ribbons is as follows:
[0025] During operation: S1, Sample clamping: Place the cut nanocrystalline ribbon sample inside the shielding box and clamp both ends of the nanocrystalline ribbon sample using clamps;
[0026] S2. Sample bending: The force points of the nanocrystalline ribbon sample are gradually bent using a pusher roller to perform a bending test.
[0027] S3. Sample cooling: When heat is generated at the bend of the nanocrystalline ribbon sample, the bend is cooled using a circulation system.
[0028] In summary, this application includes at least one of the following beneficial technical effects:
[0029] I. This invention installs multiple slidable moving blocks and sets retractable pushing rollers on the moving blocks, so that the pushing rollers can control the nanocrystalline ribbon sample to bend at multiple positions and angles. High-frequency magnetic performance tests are performed on the nanocrystalline ribbon under multiple bending conditions, which comprehensively reflects the actual performance evolution of the material under complex working conditions and provides key experimental basis for the reliability design of high-frequency magnetic devices.
[0030] Second, this invention uses a cooling circulation system to cool the bending point, avoiding magnetic parameter testing errors caused by temperature rise and ensuring the repeatability and comparability of test data.
[0031] Third, this invention addresses various situations in actual applications of nanocrystalline ribbons, including repeated bending and bending with fewer bending cycles. To simulate multiple bending scenarios, the invention employs two testing conditions: cooling the nanocrystalline ribbon sample and introducing temperature interference. This allows for the evaluation of the material's extreme performance under conditions of high temperature and high mechanical stress. Attached Figure Description
[0032] The present invention will be further described below with reference to the accompanying drawings and embodiments.
[0033] Figure 1 This is a schematic diagram of the overall structure of the present invention.
[0034] Figure 2 This is a schematic diagram of the internal structure of the shielding box of the present invention.
[0035] Figure 3 This is a schematic diagram of the fixture of the present invention.
[0036] Figure 4 This is a structural schematic diagram of the pushing component and the linkage component of the present invention.
[0037] Figure 5 This is a schematic diagram of the structure of the drive component of the present invention.
[0038] Figure 6 This is a schematic diagram of the internal structure of the pushing roller of the present invention.
[0039] Figure 7 This is a schematic diagram of the cyclic system of the present invention.
[0040] Figure 8 This is a schematic diagram of the synchronization component of the present invention.
[0041] Figure 9 This is the present invention. Figure 8 A schematic diagram of the structure at point A in the middle.
[0042] In the diagram: 1. Shielding box; 10. Testing chamber; 11. Working chamber; 2. Fixture; 20. Roller assembly one; 200. Fixing block; 21. Roller assembly two; 210. Sliding block; 22. Bidirectional screw; 23. Clamping roller; 3. Pushing component; 30. Moving block; 31. Electric push rod; 32. Pushing roller; 4. Driving component; 40. Drive screw; 41. Connecting block; 42. Electromagnet; 5. Linkage component; 50. Connecting rope; 51. Irregular rod; 6. Pulling component; 60. Rotating shaft; 61. Pull rope; 62. Friction disc; 63. Friction plate; 7. Circulation system; 70. Cooling pipe; 71. Bourdon tube; 72. Circulating water chamber; 73. Water pump; 74. Electric telescopic rod; 75. Connecting plate; 8. Synchronizing component; 80. Synchronizing pulley one; 81. Support rod; 82. Synchronizing pulley two; 83. Synchronizing belt; 84. Control rope. Detailed Implementation
[0043] The following combination Figures 1-9 The embodiments of the present invention will be described in detail below.
[0044] This application discloses a high-frequency magnetic property testing device and method for nanocrystalline ribbons. The invention is mainly applied in the process of magnetic detection. In terms of technical effect, it can avoid the problem that the existing technology can only perform bending and testing at a single position, making it difficult to capture the stress superposition effect generated when there are different bending points, resulting in incomplete detection data. Furthermore, the invention can also solve the problem that the existing technology ignores the problem that the temperature rises in local areas of nanocrystalline ribbons during repeated bending, which leads to the problem that the accuracy of the data is affected by the introduction of temperature changes.
[0045] Example 1:
[0046] Reference Figure 1 , Figure 2 and Figure 3 As shown, the system includes a shielded box 1, which contains a testing chamber 10 and a working chamber 11 separated by a partition. A sample of the cut nanocrystalline ribbon is placed inside the shielded box 1, which achieves electromagnetic isolation through a flexible conductive material and grounding design to prevent high-frequency testing from being interfered with by electromagnetic noise in the environment.
[0047] A clamp 2 is provided along the length of the detection chamber 10 to hold the nanocrystalline ribbon sample. The clamp 2 includes a first roller group 20 and a second roller group 21. The first roller group 20 is located on one side of the length of the detection chamber 10, and the second roller group 21 is slidably located on the other side of the length of the detection chamber 10.
[0048] During the testing process, roller assembly 20 and roller assembly 21 clamp both ends of the nanocrystalline ribbon sample. The reason for sliding roller assembly 21 is that when the nanocrystalline ribbon sample needs to be bent for testing, in order to prevent the roller assembly 21 from generating a pulling force when clamping the nanocrystalline ribbon sample, it is necessary to drive roller assembly 21 to slide along with the bending of the nanocrystalline ribbon sample. This ensures that the nanocrystalline ribbon sample remains straight without being pulled or damaged, which would affect the testing results.
[0049] Reference Figure 2 , Figure 3 and Figure 4 The diagram shows the structure that drives the sample to bend. Specifically, pushers 3 are provided on both sides of the width of the detection chamber 10. The pushers 3 push the nanocrystalline ribbon sample in the detection chamber 10 to bend. The bending test provides a multi-dimensional performance evaluation method for nanocrystalline ribbons used in high-frequency applications through the correlation analysis of physical deformation and magnetic properties.
[0050] The pusher 3 includes a movable block 30. The detection chamber 10 has grooves on both sides. Multiple movable blocks 30 are slidably disposed in the grooves. An electric push rod 31 is installed on the side of the movable block 30 near the clamp 2. A push roller 32 is installed on the telescopic end of the electric push rod 31.
[0051] The movement of the moving block 30 causes the electric push rod 31 to move along the length of the chute. When the electric push rod 31 moves to the designated position, it stops. Then, the telescopic end of the electric push rod 31 extends, and the pushing roller 32 on the telescopic end gradually approaches the nanocrystalline ribbon sample. Under the action of the external force of the pushing roller 32, the stress point of the nanocrystalline ribbon sample gradually bends. The bending angle of the nanocrystalline ribbon sample is different depending on the extension length of the telescopic end of the electric push rod 31. By setting bending tests with different gradients, the magnetic performance retention rate threshold of the material in a specific application scenario can be verified.
[0052] By installing multiple sliding movable blocks 30, multiple pushing rollers 32 on the movable blocks 30 can control the bending of the nanocrystalline ribbon sample at multiple positions and angles, comprehensively reflecting the actual performance evolution of the material under complex working conditions, and providing key experimental basis for the reliability design of high-frequency magnetic devices.
[0053] Reference Figure 4 and Figure 5 The diagram shows the structure that drives the pusher roller 32 to move. Specifically, the working chamber 11 is equipped with a drive component 4 that carries the moving block 30 to slide in the groove. The drive component 4 includes a drive screw 40 symmetrically arranged inside the working chamber 11 along the width direction of the detection chamber 10. A connecting block 41 is threaded on the drive screw 40.
[0054] Electromagnets 42 are installed on the corresponding sides of the connecting block 41 and the moving block 30, and the electromagnets 42 on the connecting block 41 and the moving block 30 have opposite magnetic properties.
[0055] The drive screw 40 is rotated by an external drive. When the drive screw 40 rotates in the forward direction, the electromagnet 42 on the connecting block 41 is always in the open state, while the electromagnets 42 on each moving block 30 are not always in the open state. When a single bending point test is required on the nanocrystalline ribbon sample, the electromagnet 42 on the moving block 30 near the roller group 20 is turned on. When the connecting block 41 approaches the moving block 30, the two electromagnets 42 attract each other. At this time, the connecting block 41 moves and slides, driving the electric push rod 31 on the moving block 30 to move the push roller 32 to the designated position for bending test.
[0056] Furthermore, when multiple bends need to be tested, the electromagnet 42 on the moving block 30 that has been moved to the designated position is turned off, and the electromagnet 42 on the next moving block 30 is turned on. At this time, the drive screw 40 rotates in the reverse direction, causing the connecting block 41 to move in the reverse direction until it approaches the next moving block 30. The electromagnet 42 on the connecting block 41 connects with the electromagnet 42 on the next moving block 30, moving the next moving block 30 to the designated position. Thus, by rotating the drive screw 40, the movement of the moving block 30 can be controlled, and by cooperating with the electromagnet 42 on the connecting block 41 and the moving block 30, the number of working push rollers 32 can be controlled to perform high-frequency magnetic performance tests at different numbers of bends.
[0057] Reference Figure 3 The diagram shows a schematic of the structure for clamping a nanocrystalline ribbon sample. Specifically, roller assembly 1 20 includes a fixing block 200, and roller assembly 21 includes a sliding block 210. Both the fixing block 200 and the sliding block 210 are provided with control grooves. A bidirectional screw 22 is installed in the control groove, and clamping rollers 23 are symmetrically threaded on the bidirectional screw 22.
[0058] The two ends of the nanocrystalline ribbon sample placed in the testing chamber 10 are placed between two clamping rollers 23. The two clamping rollers 23 are brought closer together by the bidirectional screw 22 to clamp and fix the two ends of the nanocrystalline ribbon sample.
[0059] Reference Figure 3 and Figure 4 The diagram shows the structure that drives the sliding block 210 to move; specifically, the detection chamber 10 is equipped with a linkage 5 that drives the second roller group 21 to slide close to the first roller group 20.
[0060] The linkage 5 includes a connecting rope 50, which is disposed between the fixed block 200 and the sliding block 210. The telescopic end of the electric push rod 31 is equipped with a special-shaped rod 51. The end of the special-shaped rod 51 away from the electric push rod 31 is provided with a snap-fit groove, which is in movable cooperation with the connecting rope 50.
[0061] When the electric push rod 31 brings the push roller 32 close to the nanocrystalline ribbon sample, it will simultaneously bring the shaped rod 51 close to the connecting rope 50. When the push roller 32 contacts the nanocrystalline ribbon sample and pushes it to bend, the shaped rod 51 simultaneously contacts the connecting rope 50 and pushes the connecting rope 50. At this time, the connecting rope 50 bends under the push of the shaped rod 51, which will pull the sliding block 210 to move towards the fixed block 200.
[0062] Reference Figure 8 and Figure 9 The diagram shows the structure of the sliding block 210 returning to its initial position. Specifically, the testing chamber 10 is also equipped with a tension member 6 that drives the roller assembly 21 to return to its initial position. The tension member 6 drives the sliding block 210 back to its initial position upon completion of the test, preparing it for the next test.
[0063] The tensioning component 6 includes a rotating shaft 60 rotatably mounted at the bottom of the testing chamber 10 via a torsion spring, with a pull rope 61 wound around the shaft 60. When the sliding block 210 slides closer to the fixed block 200 under the action of the connecting rope 50, the tension of the connecting rope 50 will drive the rotating shaft 60 to rotate in the opposite direction. At this time, the torsion spring will store force. After the test is completed, the sliding block 210 loses the tension of the connecting rope 50. At this time, the torsion spring will cause the rotating shaft 60 to rotate in the opposite direction, and the pull rope 61 on the rotating shaft 60 will pull the sliding block 210 in the opposite direction, bringing the sliding block 210 back to its initial state.
[0064] Friction discs 62 are snapped onto both the upper and lower ends of the rotating shaft 60, and friction plates 63 corresponding to the friction discs 62 are inserted into the side wall of the shielding box 1.
[0065] Since the rotating shaft 60 is set inside the detection chamber 10 via a torsion spring, after the sliding block 210 loses the tension of the connecting rope 50, the rotating shaft 60 will also lose the tension of the pull rope 61. Due to the instantaneous rebound characteristic of the torsion spring, in order to prevent the pull rope 61 from pulling the sliding block 210 instantaneously due to the instantaneous rebound of the torsion spring, which would cause damage to the nanocrystalline ribbon sample, a friction disk 62 and a friction plate 63 are set. The friction between the friction disk 62 and the friction plate 63 slows down the rotation speed of the rotating shaft 60, so that the pull rope 61 can slowly pull the sliding block 210 back without damaging the nanocrystalline ribbon sample.
[0066] Reference Figure 6 and Figure 7The diagram shows a structure for cooling the bent portion of the nanocrystalline ribbon sample; specifically, a circulation system 7 for cooling the bent portion of the nanocrystalline ribbon is installed inside the pusher roller 32.
[0067] Because the nanocrystalline ribbon samples need to be repeatedly bent for both static and dynamic bending tests, the dynamic bending process can generate heat due to internal friction and stress concentration, causing the ribbon temperature to rise. Temperature changes significantly affect the magnetic properties of the nanocrystalline ribbon; excessively high temperatures can alter performance parameters such as permeability and losses, leading to errors introduced by temperature variations that interfere with the accuracy of the test data. Therefore, a cooling circulation system 7 is needed to cool the bent areas, avoiding magnetic parameter testing errors caused by temperature rise and ensuring the repeatability and comparability of the test data.
[0068] The circulation system 7 includes a cooling pipe 70. A working chamber is provided inside the push roller 32. The cooling pipe 70 is spirally installed on the side wall of the working chamber. The cooling pipes 70 on adjacent push rollers 32 pass through the push rollers 32 and are connected by a spring tube 71.
[0069] The circulating water in the cooling pipe 70 keeps the push roller 32 at a constant temperature. When heat is generated at the bend of the nanocrystalline ribbon sample, the lower-temperature push roller 32 will cool down the bend.
[0070] Reference Figure 6 and Figure 7 As shown, this is a structural diagram to ensure that the water temperature in the cooling pipe 70 is kept at a low temperature. Specifically, a circulating water chamber 72 is provided on the side of the working chamber 11 away from the roller group 20 through a partition. A water pump 73 is installed in the shielding box 1. The water inlet ends of the two spring tubes 71 are connected to the bottom of the circulating water chamber 72, the water outlet ends of the spring tubes 71 are connected to the water inlet ends of the water pump 73, and the water outlet ends of the water pump 73 are connected to the circulating water chamber 72.
[0071] The water pump 73 can draw water from the circulating water chamber 72 into the spring tube 71, and then from the spring tube 71 into the cooling tube 70. After passing through the cooling tube 70, the water pump 73 will return to the circulating water chamber 72. By exchanging heat between the cooling tube 70 and the water in the circulating water chamber 72, the water in the cooling tube 70 can always maintain a low temperature.
[0072] Reference Figure 6 and Figure 7 The diagram shows a structural schematic of the water volume control in the cooling pipe 70. Specifically, an electric telescopic rod 74 is installed above the circulating water chamber 72. The telescopic end of the electric telescopic rod 74 extends into the circulating water chamber 72. A connecting plate 75 is installed at one end of the two spring tubes 71 located in the circulating water chamber 72. The telescopic end of the electric telescopic rod 74 is connected to the connecting plate 75.
[0073] The electric telescopic rod 74 moves the water inlet end of the spring tube 71 upward, so that the water in the circulating water chamber 72 will not be circulated by the water pump 73. After the water in the cooling tube 70 is extracted, no new water will enter the spring tube 71.
[0074] The design of the spring tube 71 allows it to adapt to the lifting and lowering of the connecting plate 75.
[0075] The purpose of this setting is to simulate the various situations that occur in actual applications of nanocrystalline ribbons, including repeated bending and bending with fewer bending cycles. In order to simulate repeated bending, the nanocrystalline ribbon samples are not cooled, and temperature interference is introduced to evaluate the material's extreme performance under high temperature and high mechanical stress coexisting environments.
[0076] Example 2:
[0077] Based on Example 1, in order to further improve the synchronization of the clamping of the nanocrystalline ribbon sample by roller group 1 20 and roller group 21, a synchronization element 8 is also proposed, which is conducive to the synchronous clamping of both ends of the nanocrystalline ribbon sample and ensures that the clamping tightness remains consistent.
[0078] Reference Figure 8 and Figure 9 The diagram shows the structure for controlling the synchronous rotation of the two bidirectional screws 22. Specifically, one end of the bidirectional screw 22 on the fixed block 200 and the sliding block 210 are respectively inserted through the fixed block 200 and the sliding block 210. Synchronous pulley 80 is installed on both bidirectional screws 22. A support rod 81 is installed at the bottom of the shielding box 1. A support block is slidably installed on the support rod 81. Synchronous pulley 82 is rotatably installed on the support block. Synchronous belt 83 is sleeved on both synchronous pulley 80 and synchronous pulley 82.
[0079] The two bidirectional screws 22 can rotate synchronously through the synchronous belt 83, synchronous pulley 1 80 and synchronous pulley 2 82, ensuring that the clamping roller 23 clamps the nanocrystalline ribbon sample synchronously, ensuring that the tension of the ribbon is consistent at all points during movement or testing, preventing uneven stretching caused by asynchronous roller speed, and reducing the risk of microcracks or lattice distortion inside the material.
[0080] A control rope 84 is connected between the support block and the sliding block 210.
[0081] When the sliding block 210 slides close to the fixed block 200 under the action of the connecting rope 50, the sliding block 210 will move downward on the support rod 81 with the support block through the control rope 84. At this time, the synchronous pulley 82 on the support block moves synchronously and always abuts against the synchronous belt 83 to ensure that the synchronous belt 83 is in a taut state and to ensure its working effect.
[0082] During operation: First, the cut nanocrystalline ribbon sample is placed inside the shielding box 1. Roller group 1 20 and roller group 21 will clamp the two ends of the nanocrystalline ribbon sample.
[0083] Step 2: The moving block 30 moves along the length of the slide groove with the electric push rod 31. The electric push rod 31 stops when it reaches the designated position. Then, the telescopic end of the electric push rod 31 extends, and the pushing roller 32 on the telescopic end gradually approaches the nanocrystalline ribbon sample. Under the external force of the pushing roller 32, the stress point of the nanocrystalline ribbon sample gradually bends. Different extension lengths of the telescopic end of the electric push rod 31 result in different bending angles of the nanocrystalline ribbon sample, allowing for bending tests at different gradients.
[0084] Step 3: When the electric push rod 31 brings the push roller 32 close to the nanocrystalline ribbon sample, it will simultaneously bring the shaped rod 51 close to the connecting rope 50. When the push roller 32 contacts the nanocrystalline ribbon sample and pushes it to bend, the shaped rod 51 simultaneously contacts the connecting rope 50 and pushes the connecting rope 50. At this time, the connecting rope 50 bends under the push of the shaped rod 51, which will pull the sliding block 210 to move towards the fixed block 200, preventing the roller group 21 on the sliding block 210 from generating a pulling force when clamping the nanocrystalline ribbon sample.
[0085] Step 4: When the sliding block 210 slides towards the fixed block 200 under the action of the connecting rope 50, the tension of the connecting rope 50 will drive the rotating shaft 60 to rotate in the opposite direction. At this time, the torsion spring will store force. When the test is completed, the sliding block 210 loses the tension of the connecting rope 50. At this time, the torsion spring will rotate the rotating shaft 60 in the opposite direction, and the pull rope 61 on the rotating shaft 60 will pull the sliding block 210 in the opposite direction, bringing the sliding block 210 back to the initial state.
[0086] Step 5: During the testing process, if it is necessary to cool down the bend of the sample, the water pump 73 can draw water from the circulating water chamber 72 into the spring tube 71, and then from the spring tube 71 into the cooling tube 70. After passing through the cooling tube 70, the water will be pumped back into the circulating water chamber 72. By exchanging heat between the cooling tube 70 and the water in the circulating water chamber 72, the water in the cooling tube 70 can be kept at a low temperature. When heat is generated at the bend of the nanocrystalline ribbon sample, the lower-temperature push roller 32 will cool down the bend.
[0087] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. Therefore, the embodiments should be regarded as exemplary and non-limiting in all respects.
[0088] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.
Claims
1. A high-frequency magnetic property testing device for nanocrystalline ribbons, comprising a shielded box, characterized in that: The interior of the shielded box is divided into a testing chamber and a working chamber by partitions. A fixture is provided along the length of the testing chamber. The fixture includes a roller assembly one and a roller assembly two. The roller assembly one is located on one side of the length of the testing chamber, and the roller assembly two is slidably located on the other side of the length of the testing chamber. Pushing components are provided on both sides of the width direction of the testing chamber. The pushing components include moving blocks. Slide grooves are opened on both sides of the testing chamber. Multiple moving blocks are slidably set in the slide grooves. An electric push rod is installed on the side of the moving block near the clamp. A pushing roller is installed on the telescopic end of the electric push rod. The working chamber is equipped with a drive component that slides in the slide groove with a moving block. The drive component includes a drive screw that is symmetrically arranged inside the working chamber along the width direction of the detection chamber, and a connecting block is threaded on the drive screw. Electromagnets are installed on the corresponding sides of the connecting block and the moving block, and the electromagnets on the connecting block and the moving block have opposite magnetic properties. Roller assembly one includes a fixed block, and roller assembly two includes a sliding block. Both the fixed block and the sliding block are provided with control grooves. A bidirectional screw is installed in the control groove, and clamping rollers are symmetrically threaded on the bidirectional screw. The testing chamber is equipped with a linkage component that drives the second roller assembly to slide close to the first roller assembly; The linkage includes a connecting rope, which is set between the fixed block and the sliding block. The telescopic end of the electric push rod is equipped with a special-shaped rod. The end of the special-shaped rod away from the electric push rod has a snap-fit groove, which is in movable cooperation with the connecting rope. The push roller is equipped with a circulation system to cool the bends of the nanocrystalline ribbon. The circulation system includes cooling pipes. A working chamber is opened inside the push roller. The cooling pipes are spirally installed on the side wall of the working chamber. The cooling pipes on adjacent push rollers pass through the push rollers and are connected by spring tubes.
2. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: The testing chamber is also equipped with a tension component that drives the second roller assembly back to its initial position; The tensioning component includes a rotating shaft located at the bottom of the testing chamber via a torsion spring, with a tension rope wound around the shaft.
3. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: Friction discs are snapped onto both the upper and lower ends of the shaft, and friction plates corresponding to the friction discs are inserted into the side wall of the shielding box.
4. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 1, characterized in that: A circulating water chamber is set up on the side of the working chamber away from the roller assembly one through a partition. A water pump is installed in the shielded box. The water inlet ends of the two spring tubes are connected to the bottom of the circulating water chamber, the water outlet ends of the spring tubes are connected to the water inlet ends of the water pump, and the water outlet ends of the water pump are connected to the circulating water chamber.
5. The high-frequency magnetic property testing device for nanocrystalline ribbons according to claim 4, characterized in that: An electric telescopic rod is installed above the circulating water chamber. The telescopic end of the electric telescopic rod extends into the circulating water chamber. Two spring tubes are located at one end of the circulating water chamber and are connected to a connecting plate. The telescopic end of the electric telescopic rod is connected to the connecting plate.
6. A method for testing the high-frequency magnetic properties of nanocrystalline ribbons, further comprising the high-frequency magnetic property testing device for nanocrystalline ribbons as described in any one of claims 1-5, characterized in that: The testing method is as follows: S1. Sample clamping: Place the cut nanocrystalline ribbon sample inside the shielding box and clamp both ends of the nanocrystalline ribbon sample using clamps. S2. Sample bending: The force points of the nanocrystalline ribbon sample are gradually bent using a pusher roller to conduct a bending test. S3. Sample cooling: When heat is generated at the bend of the nanocrystalline ribbon sample, the bend is cooled using a circulation system.